TWI679732B - Magnetic field reliability testing device, magnetic field generating board and testing method of magnetic field reliability - Google Patents

Abstract

A magnetic field reliability test device, a magnetic field generation board, and a magnetic field reliability test method. The magnetic field reliability test device includes a tester and a magnetic field generation board. The tester includes multiple slots for the object to be tested and a power supply terminal. The tester uses the DUT slot to test the functions of multiple DUTs. The magnetic field generating board includes a plurality of electromagnets and a power receiving end. The power receiving end is coupled to the power supply end of the tester to obtain the power of the electromagnet from the tester. The position of each electromagnet is set to the corresponding position of each slot of the object to be tested. Each electromagnet receives power to provide a magnetic field to each corresponding DUT slot. The tester tests whether the function of the object to be tested is complete under the condition of the magnetic field provided by the electromagnet.

Description

Magnetic field reliability test device, magnetic field generation board, and magnetic field reliability test method

The disclosed embodiments relate to a reliability test technology, and more particularly to a magnetic field reliability test device, a magnetic field generation board, and a magnetic field reliability test method.

In order to know whether the products to be sold can operate normally, manufacturers usually design test equipment to check whether the functions of the products are complete. For example, a test machine is used to detect whether the magnetoresistive random access memory (MRAM) can perform read / write operations normally. In general, MRAM test machines are equipped with MRAM read / write operation tests, but will not increase the external magnetic field to affect the operation of MRAM. From another perspective, MRAM uses the effect of magnetic fields to access data, and there may be a strong magnetic field in the surrounding environment where MRAM is used, which may affect the operation of MRAM, but the current test equipment has not MRAM performs reliability tests under the influence of magnetic fields.

The magnetic field reliability test device of the present disclosure includes a tester and a magnetic field generating board. The tester includes multiple slots for the object to be tested and a power supply terminal. The tester uses the DUT slot to test the functions of multiple DUTs. The magnetic field generating board includes a plurality of electromagnets and a power receiving end. The power receiving end is coupled to the power supply end of the tester to obtain the power of the electromagnet from the tester. The position of each electromagnet is set to the corresponding position of each slot of the object to be tested. Each electromagnet receives power to provide a magnetic field to each corresponding DUT slot. The tester tests whether the function of the object to be tested is complete under the condition of the magnetic field provided by the electromagnet.

The magnetic field generating board of the present disclosure includes a plurality of electromagnets and a power receiving end. The electromagnets are connected to each other in a specific form to form an electromagnet string. The power receiving end is coupled to the electromagnet string. The power receiving end is coupled to the power supply end of the tester to obtain the power of the electromagnet. The electromagnet obtains power to provide a magnetic field to the DUT slot in the tester. The tester tests whether the function of the test object located in the test object slot is complete under the condition of the magnetic field provided by the electromagnet.

The method for testing the magnetic field reliability of the embodiment of the disclosure includes the following steps. A tester is provided. The tester includes a plurality of test object slots and a power supply end, and the tester uses the test object slots to test the functions of the plurality of test objects. A magnetic field generating board is provided, wherein the magnetic field generating board includes a plurality of electromagnets and a power receiving end. The power receiving end is coupled to the power supply end of the tester so that the electromagnet obtains the power of the electromagnet from the tester, wherein the position of each electromagnet is set to the corresponding position of each slot of the object to be tested, and each electromagnet The electric power is obtained to provide a magnetic field to each slot of the object under test. And, in the case of the magnetic field provided by the electromagnet, the tester is used to test whether the function of the object to be tested is perfect.

In order to make the above features and advantages of the present invention more comprehensible, embodiments are hereinafter described in detail with reference to the accompanying drawings.

FIG. 1 is a schematic diagram of a magnetic field reliability test apparatus according to an embodiment of the disclosure. The magnetic field reliability test device can be used to perform a reliability test on an object to be tested (eg, the object to be tested 116 in FIG. 1). For example, the object under test in this embodiment is a packaged magnetoresistive random access memory (MRAM) circuit. Because magnetoresistive random access memory circuits use magnetic field effects to access data, many manufacturers or users may think that when magnetoresistive random access memory (MRAM) circuits operate in an external environment, The magnetic field will affect the reliability of its operation (such as data read / write operations). Therefore, this disclosure is based on a test machine, and an additional magnetic field generating board is additionally designed to provide an additional magnetic field to each slot of the object under test in the test machine, and this magnetic field can be controlled by the test machine. In this way, the test machine can perform a reliability test of related functions for each object under test while actively controlling the magnetic field of the magnetic field generating board.

In this way, the magnetic field reliability test device disclosed in the present disclosure can provide magnetic field reliability test data of the magnetoresistive random access memory circuit, so that the test data can be referred to when designing the magnetoresistive random access memory circuit. As evidence. In addition, the test machine can also easily control the magnetic field generating board through its power supply end, without the need to additionally set control circuits, control instructions and related processes for the magnetic field generating board, reducing the cost of the test machine. In other words, if the control machine is already provided, the magnetic field reliability board of the magnetoresistive random access memory circuit can be tested by purchasing the magnetic field generating board proposed in this disclosure separately.

The function of each element in the magnetic field reliability test device is explained here. The magnetic field reliability test apparatus includes a tester 110 and a magnetic field generation board 120. The tester 110 mainly includes a plurality of test object slots 112 and a power supply terminal 114. The tester 110 may further include a processor to perform a reliability test of the function of the object under test 116 using a specific process. In other words, if it is desired to perform a magnetic field reliability test on the object under test 116, the object under test 116 may be placed in the object test socket 116 in the tester 110. The tester 110 can use the DUT slot 114 to test whether the functions of the DUT 116 are complete and reliable.

The magnetic field generating board 120 mainly includes a plurality of electromagnets 122 and a power receiving end 125. The power receiving terminal 125 is coupled to the power supply terminal 114 of the tester 110 to obtain power from the electromagnet 122 from the tester 110. The position of each of the electromagnets 122 is set to a corresponding position of each of the object insertion slots 112. The electromagnets 122 are connected to each other in series to form an electromagnet string. Each electromagnet 122 obtains power from the power receiving end 125 to provide a magnetic field B to each corresponding DUT slot 112. In this way, the tester 110 can test whether the function of the test object 116 is complete through the test object slot 112 under the condition that the magnetic field B is provided by the electromagnet 122. In addition, since these electromagnets 122 are connected to each other in series, as long as the same current flows, each electromagnet 122 will generate a magnetic field of the same magnitude.

In particular, since the tester 110 usually has a power supply terminal capable of adjusting power to supply power to external devices, the present disclosure also designs a magnetic field generating board 120 that can be externally connected to the tester 110. The tester 110 can change the power of the power supply terminal 114 (for example, change the magnitude and direction of the current flowing through the power supply terminal 114) to adjust the magnetic field B provided by each electromagnet 122 at the same time. In addition, in order to make the magnetic field B of the electromagnet 122 function better, the distance D between each electromagnet 122 and the corresponding slot 112 of each DUT can be set below 0.5 mm, so that the DUT can be tested. 116 can be affected by a larger magnetic field B.

FIG. 2 is a detailed schematic diagram of the magnetic field generating plate 120 in FIG. 1. The left side of FIG. 2 illustrates a top view of the magnetic field generating plate 120 (that is, a diagram on the X-axis and Y-axis planes). The magnetic field generating board 120 is implemented by a burn-in board. The plurality of electromagnets 122 on the magnetic field generating board 120 are connected to each other in series to form an electromagnet string. Two ends of the electromagnet string are electrically coupled to two power receiving ends 125 of the magnetic field generating board 120. The magnetic field generating board 120 is further provided with a handle 128 for the user to conveniently take it. The right side of FIG. 2 shows an electromagnet implemented in a columnar shape (an electromagnet located on the Y-axis and X-axis planes). Each electromagnet 122 is implemented as a columnar electromagnet. The height of the columnar electromagnet is 11 mm, and the diameter of the cross section (that is, the circular cross section) of the columnar electromagnet is 14 mm. Those applying this embodiment can also use different shapes of electromagnets 122 to implement the magnetic field generating board 120, as long as a stable magnetic field can be provided to each of the test object slots 112 of the tester 110 in FIG.

FIG. 3 is a relationship diagram between the distance D and the magnetic field B between the electromagnet 122 and the corresponding slot 112 of each DUT in FIG. 1. The horizontal axis in FIG. 3 represents a distance D in millimeters, and the vertical axis in FIG. 3 represents a magnetic field B with Tesla (Ts) as a unit of magnetic flux. It can be seen from FIG. 3 that when the distance D is larger, the magnitude of the magnetic field B will decrease sharply. Therefore, the person applying this embodiment can try to place the electromagnet as close as possible to the corresponding slot of the object to be tested, thereby saving power. A better magnetic field B is obtained.

FIG. 4 is a flowchart of a magnetic field reliability testing method according to an embodiment of the disclosure. Please refer to FIG. 1 and FIG. 4 at the same time. In step S410, a tester 110 is provided. The tester 110 includes a plurality of test object slots 112 and a power supply terminal 114. The tester 110 uses the DUT slot 112 to test the functions of multiple DUTs 116. In step S420, a magnetic field generating board 120 is provided. The magnetic field generating board 120 includes a plurality of electromagnets 122 and a power receiving end 125. In step S430, the power receiving end 125 is coupled to the power supply end 114 of the tester 110, so that the electromagnet 122 obtains the power of the electromagnet 122 from the tester 110. The position of each electromagnet 122 is set to a corresponding position of each slot of the object under test 112, and each electromagnet 122 receives power to provide a magnetic field B to the corresponding slot 112 of each of the object under test. In step S430, when the magnetic field B is provided by the electromagnet 122, the tester 110 tests whether the function of the object 116 to be tested is complete. For a detailed description of the related steps, please refer to the embodiments of the present disclosure.

The disclosed embodiment discloses a magnetic field reliability testing device, which includes a tester and a magnetic field generating board. The tester includes multiple slots for the object to be tested and a power supply terminal. The tester uses the DUT slot to test the functions of multiple DUTs. The magnetic field generating board includes a plurality of electromagnets and a power receiving end. The power receiving end is coupled to the power supply end of the tester to obtain the power of the electromagnet from the tester. The position of each electromagnet is set to the corresponding position of each slot of the object to be tested. Each electromagnet receives power to provide a magnetic field to each corresponding DUT slot. The tester tests whether the function of the object to be tested is complete under the condition of the magnetic field provided by the electromagnet.

In some embodiments, the tester changes the power at the power supply to adjust the magnetic field provided by each electromagnet.

In some embodiments, the object under test is a packaged magnetoresistive random access memory (MRAM) circuit.

In some embodiments, the electromagnets are connected to each other in series.

In some embodiments, the distance between each electromagnet and the corresponding slot of each object under test is less than 0.5 mm

In some embodiments, each electromagnet is implemented as a cylindrical electromagnet. The height of the columnar electromagnet is 14 mm, and the cross-sectional diameter of the columnar electromagnet is 11 mm.

In some embodiments, the magnetic field generating board is a burn-in board.

The disclosed embodiment discloses a magnetic field generating board, which includes a plurality of electromagnets and a power receiving end. The electromagnets are connected to each other in a specific form to form an electromagnet string. The power receiving end is coupled to the electromagnet string. The power receiving end is coupled to the power supply end of the tester to obtain the power of the electromagnet. The electromagnet obtains power to provide a magnetic field to the DUT slot in the tester. The tester tests whether the function of the test object located in the test object slot is complete under the condition of the magnetic field provided by the electromagnet.

In some embodiments, the magnetic field provided by each electromagnet is adjusted by the tester changing the power at the power supply end.

In some embodiments, the object under test is a packaged magnetoresistive random access memory circuit.

In some embodiments, the electromagnets are connected to each other in series to form an electromagnet string.

In some embodiments, the distance between each electromagnet and the corresponding slot of each object under test is less than 0.5 mm.

In some embodiments, each electromagnet is realized by a columnar electromagnet. The height of the columnar electromagnet is 14 mm, and the cross-sectional diameter of the columnar electromagnet is 11 mm.

In some embodiments, the magnetic field generating board is a burn-in board.

The disclosed embodiment discloses a method for testing the reliability of a magnetic field, which includes the following steps. A tester is provided. The tester includes a plurality of test object slots and a power supply end, and the tester uses the test object slots to test the functions of the plurality of test objects. A magnetic field generating board is provided, wherein the magnetic field generating board includes a plurality of electromagnets and a power receiving end. The power receiving end is coupled to the power supply end of the tester so that the electromagnet obtains the power of the electromagnet from the tester, wherein the position of each electromagnet is set to the corresponding position of each slot of the object to be tested, and each electromagnet The electric power is obtained to provide a magnetic field to each slot of the object under test. And, in the case of the magnetic field provided by the electromagnet, the tester is used to test whether the function of the object to be tested is perfect.

In some embodiments, the object under test is a packaged magnetoresistive random access memory circuit.

In some embodiments, the electromagnets are connected to each other in series.

In some embodiments, the distance between each electromagnet and the corresponding slot of each object under test is less than 0.5 mm.

In some embodiments, each electromagnet is implemented by a columnar electromagnet. The height of the columnar electromagnet is 14 mm, the cross-sectional diameter of the columnar electromagnet is 11 mm, and the magnetic field generating plate is a burn-in plate.

Although the present invention has been disclosed as above with the examples, it is not intended to limit the present invention. Any person with ordinary knowledge in the technical field can make some modifications and retouching without departing from the spirit and scope of the present invention. The protection scope of the present invention shall be determined by the scope of the attached patent application.

110‧‧‧Tester

112‧‧‧ Object to be tested slot

114‧‧‧Power supply side

116‧‧‧ Object to be tested

120‧‧‧ Magnetic field generating board

122‧‧‧Electromagnet

125‧‧‧Power receiving end

128‧‧‧Handle

B‧‧‧ Magnetic Field

D‧‧‧distance

X‧‧‧X axis

Y‧‧‧Y axis

Z‧‧‧Z axis

FIG. 1 is a schematic diagram of a magnetic field reliability test apparatus according to an embodiment of the disclosure. FIG. 2 is a detailed schematic diagram of the magnetic field generating plate in FIG. 1. FIG. 3 is a relationship diagram between the distance D and the magnetic field B between the electromagnet and the corresponding slot of each DUT in FIG. 1. FIG. 4 is a flowchart of a magnetic field reliability testing method according to an embodiment of the disclosure.

Claims (9)

A magnetic field reliability test device includes: a tester including a plurality of test object slots and a power supply end, the tester uses the test object slots to test the functions of a plurality of test objects; and a magnetic field generation board Comprising a plurality of electromagnets and a power receiving end, the power receiving end being coupled to the power supply end of the tester to obtain the power of the electromagnet from the tester, wherein the position of each electromagnet is set To the corresponding position of each DUT slot, each electromagnet obtains the power to provide a magnetic field to the corresponding DUT slot, and the tester is under the condition that the electromagnet provides the magnetic field It is tested whether the function of the object under test is perfect, and the distance between each electromagnet and the corresponding slot of each object under test is less than 0.5 mm. The magnetic field reliability testing device according to item 1 of the patent application scope, wherein the tester changes the electric power at the power supply end to adjust the magnetic field provided by each electromagnet. The magnetic field reliability test device according to item 1 of the scope of patent application, wherein the object to be tested is a packaged magnetoresistive random access memory circuit. The magnetic field reliability test device according to item 1 of the scope of patent application, wherein each electromagnet is implemented by a columnar electromagnet, the height of the columnar electromagnet is 11 mm, and the cross-sectional diameter of the columnar electromagnet It is 14 mm. A magnetic field generating board includes: a plurality of electromagnets, the electromagnets are connected to each other to form an electromagnet string in a specific form; and a power receiving end coupled to the electromagnet string, and the power receiving end is coupled to a tester The power supply end obtains the electric power of the electromagnet, and the electromagnet obtains the electric power to respectively provide a magnetic field to the test object slot in the tester, and the tester provides In the case of the magnetic field described above, it is tested whether the function of the test object located in the test object slot is perfect, wherein the distance between each electromagnet and the corresponding test object slot is less than 0.5 mm. The magnetic field generating board according to item 5 of the scope of patent application, wherein the magnetic field provided by each electromagnet is adjusted by the tester by changing the electric power at the power supply end. The magnetic field generating board according to item 5 of the scope of patent application, wherein the object to be tested is a packaged magnetoresistive random access memory circuit. The magnetic field generating board according to item 5 of the scope of patent application, wherein each electromagnet is realized by a columnar electromagnet, the height of the columnar electromagnet is 11 mm, and the diameter of the cross section of the columnar electromagnet is 14 Mm. A method for testing the reliability of a magnetic field includes: providing a tester, the tester comprising a plurality of test object slots and a power supply end, and the tester using the test object slots to test a plurality of test objects Function: Provide a magnetic field generating board, the magnetic field generating board includes a plurality of electromagnets and a power receiving end; and the power receiving end is coupled to the power supply end of the tester so that the electromagnet is removed from the The tester obtains the electric power of the electromagnet, wherein the position of each electromagnet is set to a corresponding position of each slot of the object to be tested, and each electromagnet obtains the power to provide a magnetic field to each of the corresponding objects to be tested And the distance between each electromagnet and the corresponding slot of each object under test is less than 0.5 mm; and in the case where the electromagnetic field provides the magnetic field, the test is tested by the tester Whether the function of the object is perfect.