TWI678766B - A method for making a system on an active-controllable substrate - Google Patents

A method for making a system on an active-controllable substrate Download PDF

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TWI678766B
TWI678766B TW107114188A TW107114188A TWI678766B TW I678766 B TWI678766 B TW I678766B TW 107114188 A TW107114188 A TW 107114188A TW 107114188 A TW107114188 A TW 107114188A TW I678766 B TWI678766 B TW I678766B
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sensor
substrate
actively controllable
manufacturing
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TW107114188A
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TW201946222A (en
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傅宗民
Chung-Min Fu
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沅顧科技有限公司
Yuan Consulting Co., Ltd
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Abstract

本發明乃揭示製造一系統於一可主動控制基板上的方法,其步驟包括:提供一可主動控制基板,該可主動控制基板具有相對的上、下表面,且該可主動控制基板包括至少一主動控制單元以及一與該主動控制單元電性連接的內連結構;形成一第一、第二重佈線層於該可主動控制基板的該上、下表面分別,且該第一、第二重佈線層分別與該內連結構電性連接;分別形成複數第一、第二導電接合結構於該第一、第二重佈線層上;提供一功能性裸晶片及一感測器,並使該功能性裸晶片及該感測器分別藉由該第一、第二導電接合結構而與該第一、第二重佈線層接合,進而透過該第一重佈線層及該內連結構而使該功能性裸晶片與該主動控制單元電性連接,且透過該第二重佈線層及該內連結構而使該感測器與該主動控制單元電性連接。The present invention discloses a method for manufacturing a system on an actively controllable substrate. The steps include: providing an actively controllable substrate having opposite upper and lower surfaces, and the actively controllable substrate includes at least one An active control unit and an interconnect structure electrically connected to the active control unit; forming a first and a second rewiring layer on the upper and lower surfaces of the actively controllable substrate respectively, and the first and second rewiring layers The wiring layer is electrically connected to the interconnect structure; a plurality of first and second conductive bonding structures are respectively formed on the first and second rewiring layers; a functional bare chip and a sensor are provided, and the The functional bare chip and the sensor are bonded to the first and second redistribution layers by the first and second conductive bonding structures, respectively, and the first redistribution layer and the interconnect structure are used to make the sensor The functional bare chip is electrically connected to the active control unit, and the sensor is electrically connected to the active control unit through the second redistribution layer and the interconnect structure.

Description

一種製造一系統於一可主動控制基板上的方法Method for manufacturing a system on an actively controllable substrate

本發明是關於一種製造一系統於一可主動控制基板上的方法,且特別是關於一種製造一功能性系統於一可主動控制基板上的方法。The invention relates to a method for manufacturing a system on an actively controllable substrate, and more particularly to a method for manufacturing a functional system on an actively controllable substrate.

物聯網(Internet of Things;IoT) 的應用包括各式各樣的使用狀況,故需要藉由不同集成電路(ICs)、晶片的連接來整合各種軟、硬體,賦予提供多重功能,例如邏輯集成電路(Logic IC)加上射頻集成電路(RF IC)再加上感測器等。然而,不同功能感側器,例如電流感測器、電壓感測器、光學感測器、磁感測器、溫度感測器、熱感測器、溼度感測器、氣體感測器、壓力感測器、液位感測器、浸水感測器、照度感測器、重量感測器、超音波感測器、圖像感測器、線位移感測器、傾斜感測器、加速度感測器、碰撞感測器、震動感側器、生物特徵辨識感測器等,通常具有不同的結構,且均是利用獨特的集成電路製程所製備,故該等感測器很難以系統單晶片(System-on-Chip;SOC)模式製造。The application of the Internet of Things (IoT) includes a variety of usage conditions, so it is necessary to integrate various software and hardware through the connection of different integrated circuits (ICs) and chips, and provide multiple functions, such as logic integration. Circuit (Logic IC) plus radio frequency integrated circuit (RF IC) plus sensor. However, different functional sensors such as current sensors, voltage sensors, optical sensors, magnetic sensors, temperature sensors, thermal sensors, humidity sensors, gas sensors, pressure Sensors, level sensors, immersion sensors, illuminance sensors, weight sensors, ultrasonic sensors, image sensors, linear displacement sensors, tilt sensors, acceleration sensors Sensors, collision sensors, vibration sensors, biometric sensors, etc. usually have different structures and are manufactured using a unique integrated circuit process, so it is difficult for these sensors to be system-on-a-chip (System-on-Chip; SOC) mode manufacturing.

有鑑於此,因此,對於實際用途需要多重/同步的感測器數據以利使用者或人工智慧(AI)作出正確的判斷者,較佳的是整合於一小面積的單一基板上,以提供較佳的效率、較佳的能源規劃、較小的尺寸以及數據同步化,故一種可將不同功能性的晶片以及各種感應器整合成一系統單晶片者乃業界所殷切期盼。In view of this, therefore, for practical applications that require multiple / synchronized sensor data to facilitate users or artificial intelligence (AI) to make a correct judgment, it is better to integrate it on a single substrate with a small area to provide Better efficiency, better energy planning, smaller size, and data synchronization. Therefore, a person who can integrate different functional chips and various sensors into a single system chip is eagerly expected by the industry.

本發明之一特徵是揭示一種製造一系統於一可主動控制基板上的方法,其步驟包括:提供一可主動控制基板,該可主動控制基板具有相對的上、下表面,且該可主動控制基板包括至少一主動控制單元以及一與該主動控制單元電性連接的內連結構;形成一第一、第二重佈線層於該可主動控制基板的該上、下表面分別,且該第一、第二重佈線層分別與該內連結構電性連接;分別形成複數第一、第二導電接合結構於該第一、第二重佈線層上;提供一功能性裸晶片及一感測器,並使該功能性裸晶片及該感測器分別藉由該第一、第二導電接合結構而與該第一、第二重佈線層接合,進而透過該第一重佈線層及該內連結構而使該功能性裸晶片與該主動控制單元電性連接,且透過該第二重佈線層及該內連結構而使該感測器與該主動控制單元電性連接。One feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate. The steps include: providing an actively controllable substrate having opposite upper and lower surfaces, and the actively controllable substrate The substrate includes at least one active control unit and an interconnect structure electrically connected to the active control unit; forming a first and a second redistribution layer on the upper and lower surfaces of the actively controllable substrate respectively, and the first The second redistribution layer is electrically connected to the interconnect structure; a plurality of first and second conductive bonding structures are formed on the first and second redistribution layers respectively; a functional bare chip and a sensor are provided; And enable the functional bare chip and the sensor to be bonded to the first and second redistribution layers through the first and second conductive bonding structures, respectively, and then through the first redistribution layer and the interconnect The structure enables the functional bare chip to be electrically connected with the active control unit, and the sensor and the active control unit are electrically connected through the second redistribution layer and the interconnect structure.

本發明之另一特徵是揭示一種如上所述製造一系統於一可主動控制基板上的方法,其中該可主動控制基板為絕緣基板或半導體基板。Another feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate as described above, wherein the actively controllable substrate is an insulating substrate or a semiconductor substrate.

本發明之另一特徵是揭示一種如上所述製造一系統於一可主動控制基板上的方法,其中該半導體基板為矽基板、碳化矽基板、藍寶石基板、(II)-(VI)族基板或(III)-(V)族基板。Another feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate as described above, wherein the semiconductor substrate is a silicon substrate, a silicon carbide substrate, a sapphire substrate, a (II)-(VI) substrate or (III)-(V) substrates.

本發明之另一特徵是揭示一種如上所述製造一系統於一可主動控制基板上的方法,其中該內連結構包括至少一導線及至少一穿孔(via)。Another feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate as described above, wherein the interconnect structure includes at least one wire and at least one via.

本發明之另一特徵是揭示一種如上所述製造一系統於一可主動控制基板上的方法,其中該主動控制單元包括一主動元件及/或一多工器。Another feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate as described above, wherein the active control unit includes an active element and / or a multiplexer.

本發明之另一特徵是揭示一種如上所述製造一系統於一可主動控制基板上的方法,其中該主動元件包括電晶體、主動開關(active switch)、調變器(modulator)、可程式邏輯控制器(programmable logic)、開關陣列(switch array)其中之一或其組合。Another feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate as described above, wherein the active element includes a transistor, an active switch, a modulator, and programmable logic. One of a programmable logic, a switch array, or a combination thereof.

本發明之另一特徵是揭示一種如上所述製造一系統於一可主動控制基板上的方法,其中該電晶體可為金氧半場效電晶體(MOS)或雙載子接面電晶體(BJT)。Another feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate as described above, wherein the transistor can be a metal-oxide-semiconductor field-effect transistor (MOS) or a bipolar junction transistor (BJT ).

本發明之另一特徵是揭示一種如上所述製造一系統於一可主動控制基板上的方法,其中該功能性裸晶片包括微型控制器(MCU)、邏輯集成電路(Logic IC)、驅動集成電路(Driving IC)或射頻集成電路(RF IC)其中之一或其組合。Another feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate as described above, wherein the functional bare chip includes a microcontroller (MCU), a logic integrated circuit (Logic IC), and a driving integrated circuit. (Driving IC) or radio frequency integrated circuit (RF IC) or a combination thereof.

本發明之另一特徵是揭示一種如上所述製造一系統於一可主動控制基板上的方法,其中該感測器包括電流感測器、電壓感測器、光學感測器、磁感測器、溫度感測器、熱感測器、溼度感測器、氣體感測器、壓力感測器、液位感測器、浸水感測器、照度感測器、重量感測器、超音波感測器、圖像感測器、線位移感測器、傾斜感測器、加速度感測器、碰撞感測器、震動感側器、生物特徵辨識感測器其中之一或其組合。Another feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate as described above, wherein the sensor includes a current sensor, a voltage sensor, an optical sensor, and a magnetic sensor. , Temperature sensor, thermal sensor, humidity sensor, gas sensor, pressure sensor, liquid level sensor, immersion sensor, illuminance sensor, weight sensor, ultrasonic sensor One or a combination of a sensor, an image sensor, a linear displacement sensor, a tilt sensor, an acceleration sensor, a collision sensor, a vibration sensor, a biometric sensor.

本發明之另一特徵是揭示一種如上所述製造一系統於一可主動控制基板上的方法,其中該第一、第二導電接合結構包括焊球、導電凸塊、導電柱其中之一或其組合。Another feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate as described above, wherein the first and second conductive bonding structures include one of a solder ball, a conductive bump, a conductive pillar, or one of them. combination.

本發明之另一特徵是揭示一種如上所述製造一系統於一可主動控制基板上的方法,其中該基板更包括至少一被動元件。Another feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate as described above, wherein the substrate further includes at least one passive element.

本發明之另一特徵是揭示一種如上所述製造一系統於一可主動控制基板上的方法,其中該被動元件包括電阻、電容、電感、憶阻器(memristor)、天線(antenna)、散熱器(heat-spreader)、二極體(Diode)、發光二極體(LED) 、波導器(waveguide)、濾波器(filter)其中之一或其組合。Another feature of the present invention is to disclose a method for manufacturing a system on an actively controllable substrate as described above, wherein the passive component includes a resistor, a capacitor, an inductor, a memristor, an antenna, and a heat sink. (heat-spreader), diode (diode), light-emitting diode (LED), waveguide (waveguide), filter (filter) one or a combination thereof.

以下將詳細說明本發明實施例之製作與使用方式。然應注意的是,本發明提供許多可供應用的發明概念,其可以多種特定型式實施。文中所舉例討論之特定實施例僅為製造與使用本發明之特定方式,非用以限制本發明之範圍。The following will explain in detail the manufacturing and using methods of the embodiments of the present invention. It should be noted, however, that the invention provides many applicable inventive concepts that can be embodied in a number of specific forms. The specific embodiments discussed by way of example are merely specific ways of making and using the invention, and are not intended to limit the scope of the invention.

首先,請參照第1A圖,提供一如第1A圖所示的可主動控制基板100。該可主動控制基板100具有相對的上、下表面100A、100B,且該可主動控制基板包括一主動控制單元110、120以及一與該主動控制單元110、120電性連接的內連結構(未繪示)。First, please refer to FIG. 1A and provide an actively controllable substrate 100 as shown in FIG. 1A. The actively controllable substrate 100 has opposite upper and lower surfaces 100A and 100B, and the actively controllable substrate includes an active control unit 110 and 120 and an interconnect structure (not shown) electrically connected to the active control unit 110 and 120. Drawing).

上述之可主動控制基板100可為絕緣基板,例如但不限於玻璃基板或塑料基板,或半、導體基板,例如但不限於矽基板、碳化矽基板、藍寶石基板、(II)-(VI)族基板或(III)-(V)族基板。The aforementioned actively controllable substrate 100 may be an insulating substrate, such as, but not limited to, a glass substrate or a plastic substrate, or a semi-conductive substrate, such as, but not limited to, a silicon substrate, a silicon carbide substrate, a sapphire substrate, and (II)-(VI) families Substrate or (III)-(V) substrate.

上述之主動控制單元110、120可為具有相同或相異功能的主動控制單元,且每一個主動控制單元110、120可分別包括一主動元件及/或一多工器(Multiplexer;MUX)。主動元件可包括電晶體、主動開關(active switch)、調變器(modulator)、可程式邏輯控制器(programmable logic)、開關陣列(switch array)其中之一或其組合,且該電晶體例如但不限於金氧半場效電晶體(MOS)或雙載子接面電晶體(BJT),或者。The above active control units 110 and 120 may be active control units having the same or different functions, and each of the active control units 110 and 120 may include an active element and / or a multiplexer (MUX), respectively. The active element may include one or a combination of a transistor, an active switch, a modulator, a programmable logic controller, a switch array, and the transistor such as but Not limited to Metal Oxide Half Field Effect Transistor (MOS) or BJT, or.

上述之內連結構(未繪示)包括至少一導線(未繪示)及至少一穿孔(via) (未繪示)。該導線(未繪示)可由具有高導電係數之材料所構成,例如但不限於為半導體業常用的金線、銀線或銅線等,且該穿孔(via) (未繪示)可藉由例如但不限於鑲嵌(damascene)、貫通矽穿孔(through silicon via;TSV)或金屬插栓(Metal Plug)等製程製備,在此不再贅述。The above-mentioned interconnect structure (not shown) includes at least one wire (not shown) and at least one via (not shown). The wire (not shown) may be made of a material having a high electrical conductivity, such as, but not limited to, gold, silver or copper wires commonly used in the semiconductor industry, and the via (not shown) may be formed by For example, but not limited to, damascene, through silicon via (TSV), or metal plug (Metal Plug) and other manufacturing processes, will not be repeated here.

接著,請參照第1B圖,利用習知的重佈線製程(re-distribution layer process;RDL process),分別形成一第一、第二重佈線層(re-distribution layer ;RDL)140A、140B於該可主動控制基板100的該上、下表面100A、100B,且該第一、第二重佈線層140A、140B分別與該內連結構(未繪示)電性連接。然後,再分別形成複數第一、第二導電接合結構150A、150B於該第一、第二重佈線層140A、140B上。上述的第一、第二導電接合結構150A、150B可為例如但不限於焊球、導電凸塊、導電柱其中之一或其組合。Next, referring to FIG. 1B, a conventional re-distribution layer process (RDL process) is used to form a first and a second re-distribution layer (RDL) 140A and 140B respectively. The upper and lower surfaces 100A and 100B of the substrate 100 can be actively controlled, and the first and second redistribution layers 140A and 140B are electrically connected to the interconnect structure (not shown), respectively. Then, a plurality of first and second conductive bonding structures 150A and 150B are formed on the first and second redistribution wiring layers 140A and 140B, respectively. The above-mentioned first and second conductive bonding structures 150A, 150B may be, for example, but not limited to, one of a solder ball, a conductive bump, a conductive pillar, or a combination thereof.

最後,請參照第1C圖,提供一功能性裸晶片200及一感測器300,並使該功能性裸晶片200及該感測器300分別藉由該第一、第二導電接合結構150A、150B與該第一、第二重佈線層140A、140B接合,進而透過該第一重佈線層140A及該內連結構(未繪示)而使該功能性裸晶片200與該主動控制單元110、120電性連接,且透過該第二重佈線層140B及該內連結構(未繪示)而使該感測器300與該主動控制單元110、120電性連接,形成一功能整合系統。根據本發明的其他實施例,可選擇一個以上具有不同功能的上述功能性裸晶片200及一個以上具有不同功能的感測器300並且分別透過該第一重佈線層140A及該內連結構(未繪示)而使該等具有不同功能的功能性裸晶片200與該等具有不同功能的主動控制單元110、120電性連接,且透過該第二重佈線層140B及該內連結構(未繪示)而使該等具有不同功能的感測器300與該主動控制單元110、120電性連接,形成一多重功能整合系統1000。Finally, referring to FIG. 1C, a functional bare chip 200 and a sensor 300 are provided, and the functional bare chip 200 and the sensor 300 are respectively passed through the first and second conductive bonding structures 150A, 150B is bonded to the first and second redistribution layers 140A and 140B, and then the functional bare chip 200 and the active control unit 110, through the first redistribution layer 140A and the interconnect structure (not shown), 120 is electrically connected, and the sensor 300 is electrically connected to the active control units 110 and 120 through the second redistribution layer 140B and the interconnect structure (not shown) to form a function integration system. According to other embodiments of the present invention, more than one functional bare chip 200 having different functions and more than one sensor 300 having different functions may be selected and passed through the first redistribution layer 140A and the interconnect structure (not shown). (Illustrated) and the functional bare chips 200 having different functions are electrically connected to the active control units 110 and 120 having different functions, and through the second redistribution layer 140B and the interconnect structure (not shown) The sensors 300 with different functions are electrically connected to the active control units 110 and 120 to form a multi-function integration system 1000.

上述該功能性裸晶片200可為例如但不限於微型控制器(MCU)、邏輯集成電路(Logic IC)、驅動集成電路(Driving IC)或射頻集成電路(RF IC)其中之一或其組合。The functional bare chip 200 described above may be, for example, but not limited to, one or a combination of a microcontroller (MCU), a logic integrated circuit (Logic IC), a driving integrated circuit (Driving IC), or a radio frequency integrated circuit (RF IC).

上述感測器300可為例如但不限於電流感測器、電壓感測器、光學感測器、磁感測器、溫度感測器、熱感測器、溼度感測器、氣體感測器、壓力感測器、液位感測器、浸水感測器、照度感測器、重量感測器、超音波感測器、圖像感測器、線位移感測器、傾斜感測器、加速度感測器、碰撞感測器、震動感側器、生物特徵辨識感測器等。The sensor 300 may be, for example, but not limited to, a current sensor, a voltage sensor, an optical sensor, a magnetic sensor, a temperature sensor, a thermal sensor, a humidity sensor, and a gas sensor. , Pressure sensor, liquid level sensor, immersion sensor, illuminance sensor, weight sensor, ultrasonic sensor, image sensor, linear displacement sensor, tilt sensor, Acceleration sensors, collision sensors, vibration sensors, biometric sensors, etc.

此外,上述之可主動控制基板100更可包括至少一被動元件,該被動元件可為例如但不限於電阻、電容、電感、憶阻器(memristor)、天線(antenna)、散熱器(heat-spreader)、二極體(Diode)、發光二極體(LED)、波導器(waveguide)、濾波器(filter)其中之一或其組合。如第1C圖所示,上述之可主動控制基板100更包括一電容130以及一天線330,且其中一功能性裸晶片200乃藉由第一、第二重佈線層140A、140B及第二導電接合結構150B與該電容130及該天線330電性連接。上述之天線330可應用於無線通訊,例如但不限於近場無線通訊(NFC)。In addition, the above-mentioned actively controllable substrate 100 may further include at least one passive element, which may be, for example, but not limited to, a resistor, a capacitor, an inductor, a memristor, an antenna, and a heat-spreader. ), A diode (LED), a light emitting diode (LED), a waveguide (waveguide), a filter (filter), or a combination thereof. As shown in FIG. 1C, the above-mentioned actively controllable substrate 100 further includes a capacitor 130 and an antenna 330, and one of the functional bare chips 200 is conducted through the first and second redistribution layers 140A, 140B, and the second conductive layer. The bonding structure 150B is electrically connected to the capacitor 130 and the antenna 330. The above-mentioned antenna 330 can be applied to wireless communication, such as but not limited to near field wireless communication (NFC).

如上所述,根據本發明所揭示之一種製造一系統於一可主動控制基板上的方法,可視需要選擇一個以上具有不同功能的功能性裸晶片以及一個或一個以上的感測器,將該等功能性裸晶片及該等感測器分別接合於一含有主動控制單元的基板,並藉由該基板內的重佈線層及內連線結構,使該等功能性裸晶片及該等感測器與該主動控制單元電性連接整合於一小面積的單一基板上,形成一可以提供較佳的效率、較佳的能源規劃、較小面積以及數據同步化的多重功能整合的系統。As described above, according to a method for manufacturing a system on an actively controllable substrate disclosed in the present invention, one or more functional bare chips with different functions and one or more sensors may be selected as required, and the like. The functional bare chip and the sensors are respectively bonded to a substrate containing an active control unit, and the functional bare chip and the sensors are made by a redistribution layer and an interconnect structure in the substrate. It is electrically connected to the active control unit and integrated on a single substrate with a small area to form a multiple function integration system that can provide better efficiency, better energy planning, smaller area, and data synchronization.

綜上所述,雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明。本發明所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾。因此,本發明之保護範圍當視後附之申請專利範圍所界定者為準。In summary, although the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. Those with ordinary knowledge in the technical field to which the present invention pertains can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be determined by the scope of the attached patent application.

100  100 可主動控制基板  Active control of substrate 150A  150A 第一導電接合結構  First conductive bonding structure 100A  100A 上表面  Upper surface 150B  150B 第二導電接合結構  Second conductive bonding structure 100B  100B 下表面  lower surface 200  200 功能性裸晶片  Functional bare chip 110、120  110, 120 主動控制單元  Active control unit 300  300 感測器  Sensor 130  130 電容  Capacitance 330  330 天線  Antenna 140A  140A 第一重佈線層  First rewiring layer 1000  1000 多重功能整合系統  Multiple function integration system 140B  140B 第二重佈線層  Second wiring layer

第1A~1C圖所繪示者是根據本發明一實施例所揭示的製造一系統於一可主動控制基板上的剖面製程。Figures 1A to 1C show a cross-sectional process of manufacturing a system on a substrate that can be actively controlled according to an embodiment of the present invention.

Claims (11)

一種製造一系統於一可主動控制基板上的方法,其步驟包括:步驟(1):提供一可主動控制基板,該可主動控制基板具有相對的上、下表面,且該可主動控制基板包括至少一主動控制單元以及一與該主動控制單元電性連接的內連結構;步驟(2):分別形成一第一、第二重佈線層於該可主動控制基板的該上、下表面,且該第一、第二重佈線層分別與該內連結構電性連接;步驟(3):分別形成複數第一、第二導電接合結構於該第一、第二重佈線層上;以及步驟(4):提供一功能性裸晶片及一感測器,並使該功能性裸晶片及該感測器分別藉由該第一、第二導電接合結構而與該第一、第二重佈線層接合,進而透過該第一重佈線層及該內連結構而使該功能性裸晶片與該主動控制單元電性連接,且透過該第二重佈線層及該內連結構而使該感測器與該主動控制單元電性連接;其中,該功能性裸晶片包括微型控制器(MCU)、邏輯集成電路(Logic IC)、驅動集成電路(Driving IC)或射頻集成電路(RF IC)其中之一或其組合。A method for manufacturing a system on an actively controllable substrate includes the following steps: step (1): providing an actively controllable substrate having opposite upper and lower surfaces, and the actively controllable substrate includes At least one active control unit and an interconnect structure electrically connected to the active control unit; step (2): forming a first and a second redistribution layer on the upper and lower surfaces of the actively controllable substrate, respectively; and The first and second redistribution layers are electrically connected to the interconnect structure respectively; step (3): forming a plurality of first and second conductive bonding structures on the first and second redistribution layers respectively; and step ( 4): Provide a functional bare chip and a sensor, and enable the functional bare chip and the sensor to communicate with the first and second rewiring layers through the first and second conductive bonding structures, respectively. Bonding, further electrically connecting the functional bare chip with the active control unit through the first rewiring layer and the interconnect structure, and enabling the sensor through the second rewiring layer and the interconnect structure Electrically connected to the active control unit ; Wherein the functionality of the microcontroller comprising a bare wafer (the MCU), wherein the logic one integrated circuit (Logic IC), a driving integrated circuit (Driving IC) or radio frequency integrated circuit (RF IC), or a combination thereof. 如申請專利範圍第1項所述之製造一系統於一可主動控制基板上的方法,該可主動控制基板為絕緣基板或半導體基板。The method for manufacturing a system on an actively controllable substrate as described in item 1 of the scope of patent application, the actively controllable substrate is an insulating substrate or a semiconductor substrate. 如申請專利範圍第2項所述之製造一系統於一可主動控制基板上的方法,該半導體基板為矽基板、碳化矽基板、藍寶石基板、(II)-(VI)族基板或(III)-(V)族基板。The method for manufacturing a system on an actively controllable substrate as described in item 2 of the scope of the patent application, the semiconductor substrate is a silicon substrate, a silicon carbide substrate, a sapphire substrate, a (II)-(VI) substrate or (III) -(V) Group substrate. 如申請專利範圍第1項所述之製造一系統於一可主動控制基板上的方法,該內連結構包括至少一導線及至少一穿孔(via)。According to the method for manufacturing a system on an actively controllable substrate as described in item 1 of the scope of patent application, the interconnect structure includes at least one wire and at least one via. 如申請專利範圍第1項所述之製造一系統於一可主動控制基板上的方法,該主動控制單元包括一主動元件及/或一多工器(MUX)。The method for manufacturing a system on an actively controllable substrate as described in item 1 of the scope of patent application, the active control unit includes an active element and / or a multiplexer (MUX). 如申請專利範圍第5項所述之製造一系統於一可主動控制基板上的方法,該主動元件包括電晶體、主動開關(active switch)、調變器(modulator)、可程式邏輯控制器(programmable logic)、開關陣列(switch array)其中之一或其組合。The method for manufacturing a system on an actively controllable substrate as described in item 5 of the scope of patent application, the active element includes a transistor, an active switch, a modulator, and a programmable logic controller ( programmable logic), switch array, or a combination thereof. 如申請專利範圍第6項所述之製造一系統於一可主動控制基板上的方法,該電晶體可為金氧半場效電晶體(MOS)或雙載子接面電晶體(BJT)。According to the method for manufacturing a system on an actively controllable substrate as described in item 6 of the scope of patent application, the transistor may be a metal-oxide-semiconductor field-effect transistor (MOS) or a bipolar junction transistor (BJT). 如申請專利範圍第1項所述之製造一系統於一可主動控制基板上的方法,該感測器包括電流感測器、電壓感測器、光學感測器、磁感測器、溫度感測器、熱感測器、溼度感測器、氣體感測器、壓力感測器、液位感測器、浸水感測器、照度感測器、重量感測器、超音波感測器、圖像感測器、線位移感測器、傾斜感測器、加速度感測器、碰撞感測器、震動感側器、生物特徵辨識感測器其中之一或其組合。The method for manufacturing a system on a substrate that can be actively controlled as described in item 1 of the scope of patent application, the sensor includes a current sensor, a voltage sensor, an optical sensor, a magnetic sensor, and a temperature sensor. Sensor, thermal sensor, humidity sensor, gas sensor, pressure sensor, liquid level sensor, immersion sensor, illuminance sensor, weight sensor, ultrasonic sensor, One or a combination of an image sensor, a linear displacement sensor, a tilt sensor, an acceleration sensor, a collision sensor, a vibration sensor, a biometric sensor. 如申請專利範圍第1項所述之製造一系統於一可主動控制基板上的方法,該第一、第二導電接合結構可為焊球、導電凸塊或導電柱。According to the method for manufacturing a system on a substrate that can be actively controlled as described in item 1 of the scope of patent application, the first and second conductive bonding structures may be solder balls, conductive bumps, or conductive pillars. 如申請專利範圍第1至9項中任一項所述之製造一系統於一可主動控制基板上的方法,該可主動控制基板更包括至少一被動元件。The method for manufacturing a system on an actively controllable substrate as described in any one of claims 1 to 9 of the scope of patent application, the actively controllable substrate further includes at least one passive element. 如申請專利範圍第10項所述之製造一系統於一可主動控制基板上的方法,該被動元件包括電阻、電容、電感、憶阻器(memristor)、天線(antenna)、散熱器(heat-spreader)、二極體(Diode)、發光二極體(LED)、波導器(waveguide)、濾波器(filter)其中之一或其組合。The method for manufacturing a system on a substrate that can be actively controlled as described in item 10 of the scope of patent application, the passive component includes a resistor, a capacitor, an inductor, a memristor, an antenna, and a heat-sink one of a spreader), a diode, a light emitting diode (LED), a waveguide, a filter, or a combination thereof.
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