TWI676979B - Display panel and testing method of display panel - Google Patents
Display panel and testing method of display panel Download PDFInfo
- Publication number
- TWI676979B TWI676979B TW107141309A TW107141309A TWI676979B TW I676979 B TWI676979 B TW I676979B TW 107141309 A TW107141309 A TW 107141309A TW 107141309 A TW107141309 A TW 107141309A TW I676979 B TWI676979 B TW I676979B
- Authority
- TW
- Taiwan
- Prior art keywords
- terminal
- detection
- transistor
- signal
- driving
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Control Of El Displays (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
一種顯示面板包含複數個像素。像素之任一者包含補償電路、驅動電晶體以及檢測電路。補償電路包含第一節點,用以提供驅動訊號。驅動電晶體用於接收系統高電壓,自第一節點接收驅動訊號,並依據驅動訊號輸出驅動電流至發光元件。檢測電路用以提供檢測訊號至補償電路。當補償電路接收到檢測訊號時,補償電路將檢測訊號作為驅動訊號輸出。當補償電路接收到資料訊號時,補償電路依據資料訊號產生驅動訊號,其中驅動訊號的資料電壓準位負相關於驅動電晶體的臨界電壓的絕對值。 A display panel includes a plurality of pixels. Each of the pixels includes a compensation circuit, a driving transistor, and a detection circuit. The compensation circuit includes a first node for providing a driving signal. The driving transistor is used for receiving the high voltage of the system, receiving a driving signal from the first node, and outputting a driving current to the light emitting element according to the driving signal. The detection circuit is used to provide a detection signal to the compensation circuit. When the compensation circuit receives the detection signal, the compensation circuit outputs the detection signal as a driving signal. When the compensation circuit receives the data signal, the compensation circuit generates a driving signal according to the data signal, wherein the data voltage level of the driving signal is negatively related to the absolute value of the threshold voltage of the driving transistor.
Description
本揭示內容係關於一種顯示面板及檢測方法,且特別是有關於一種具有檢測功能的顯示面板及其檢測方法。 The present disclosure relates to a display panel and a detection method, and particularly to a display panel with a detection function and a detection method thereof.
近年來,隨著顯示技術的發展,顯示面板已被應用至各式的電子裝置,例如:智慧型手機、平板電腦或各種螢幕。 In recent years, with the development of display technology, display panels have been applied to various electronic devices, such as smart phones, tablet computers, or various screens.
由於若要補償電路正常操作或檢測,需要提供多個訊號,因而需佔用顯示面板的周邊區域,限制了面取數,使得成本增加。 Since it is necessary to provide multiple signals to compensate for the normal operation or detection of the circuit, the peripheral area of the display panel needs to be occupied, limiting the number of surface accesses and increasing the cost.
本揭示內容之一態樣係關於一種顯示面板。顯示面板包含複數個像素。像素之任一者包含補償電路、驅動電晶體以及檢測電路。補償電路包含第一節點,用以提供驅動訊號。驅動電晶體用於接收系統高電壓,自第一節點接收驅動訊號,並依據驅動訊號輸出驅動電流至發光元件。檢測電路用以提供檢測訊號至補償電路。當補償電路接收到檢測訊號時,補 償電路將檢測訊號作為驅動訊號輸出。當補償電路接收到資料訊號時,補償電路依據資料訊號產生驅動訊號,其中驅動訊號的資料電壓準位負相關於驅動電晶體的臨界電壓的絕對值。 One aspect of the present disclosure relates to a display panel. The display panel contains a plurality of pixels. Each of the pixels includes a compensation circuit, a driving transistor, and a detection circuit. The compensation circuit includes a first node for providing a driving signal. The driving transistor is used for receiving the high voltage of the system, receiving a driving signal from the first node, and outputting a driving current to the light emitting element according to the driving signal. The detection circuit is used to provide a detection signal to the compensation circuit. When the compensation circuit receives the detection signal, the compensation circuit The compensation circuit outputs the detection signal as a driving signal. When the compensation circuit receives the data signal, the compensation circuit generates a driving signal according to the data signal, wherein the data voltage level of the driving signal is negatively related to the absolute value of the threshold voltage of the driving transistor.
本揭示內容之另一態樣係關於一種顯示面板的檢測方法,包含:根據檢測控制訊號導通複數個像素中的複數個檢測電路;利用檢測電路之各者提供檢測訊號至像素中相應的補償電路;若補償電路接收到檢測訊號,則利用補償電路將檢測訊號作為驅動訊號輸出至像素中相應的驅動電晶體;若補償電路接收到資料訊號,則利用補償電路依據資料訊號產生驅動訊號,其中驅動訊號的資料電壓準位負相關於驅動電晶體的臨界電壓的絕對值;以及利用驅動電晶體依據驅動訊號輸出驅動電流至像素中相應的發光元件。 Another aspect of the present disclosure relates to a method for detecting a display panel, including: turning on a plurality of detection circuits in a plurality of pixels according to a detection control signal; each of the detection circuits providing a detection signal to a corresponding compensation circuit in the pixel ; If the compensation circuit receives the detection signal, it uses the compensation circuit to output the detection signal as a driving signal to the corresponding driving transistor in the pixel; if the compensation circuit receives the data signal, it uses the compensation circuit to generate a driving signal based on the data signal, where the driving The data voltage level of the signal is negatively related to the absolute value of the threshold voltage of the driving transistor; and the driving transistor is used to output the driving current to the corresponding light-emitting element in the pixel according to the driving signal.
100、100a、100b‧‧‧像素 100, 100a, 100b ‧‧‧ pixels
120‧‧‧寫入電路 120‧‧‧write circuit
140‧‧‧發光元件 140‧‧‧Light-emitting element
160‧‧‧補償電路 160‧‧‧Compensation circuit
180‧‧‧檢測電路 180‧‧‧ Detection circuit
Td‧‧‧驅動電晶體 Td‧‧‧Drive Transistor
Tct‧‧‧檢測電晶體 Tct‧‧‧ Detection Transistor
T1、T2、T3、T4、T5、T6、T7‧‧‧電晶體 T1, T2, T3, T4, T5, T6, T7‧‧‧Transistors
Cst‧‧‧電容 Cst‧‧‧Capacitor
N1‧‧‧節點 N1‧‧‧node
Vg‧‧‧驅動訊號 Vg‧‧‧Drive signal
I1‧‧‧驅動電流 I1‧‧‧Drive current
VDATA‧‧‧資料訊號 V DATA ‧‧‧ data signal
VREF‧‧‧參考電壓準位 V REF ‧‧‧ Reference Voltage Level
CT、CTr、CTg、CTb‧‧‧檢測訊號 CT, CTr, CTg, CTb ‧‧‧ detection signals
S1[N]、S1[N+1]、S2‧‧‧掃描控制訊號 S1 [N], S1 [N + 1], S2‧‧‧scan control signal
CS‧‧‧檢測控制訊號 CS‧‧‧ Detection control signal
EM‧‧‧發光控制訊號 EM‧‧‧light control signal
OVDD‧‧‧系統高電壓 OVDD‧‧‧System high voltage
OVSS‧‧‧系統低電壓 OVSS‧‧‧System Low Voltage
Ptest、Pnormal‧‧‧期間 During P test and P normal ‧‧‧
Pr、Pg、Pb‧‧‧色像素 Pr, Pg, Pb ‧‧‧ color pixels
Ldr、Ldg、Ldb‧‧‧檢測訊號線 L dr , L dg , L db ‧‧‧ detection signal line
Lcs‧‧‧檢測控制訊號線 L cs ‧‧‧ Detection control signal line
900‧‧‧顯示面板檢測方法 900‧‧‧ display panel detection method
S910~S970‧‧‧操作 S910 ~ S970‧‧‧ Operation
第1圖係依據本揭示內容之部分實施例所繪示的一種顯示面板中像素的示意圖;第2圖係依據本揭示內容之部分實施例所繪示的一種像素的詳細示意圖;第3圖係依據本揭示內容之部分實施例所繪示第2圖之像素的訊號時序示意圖;第4A、4B圖係依據本揭示內容之部分實施例所繪示第2圖之像素中各電晶體之狀態示意圖;第5圖係依據本揭示內容之其他部分實施例所繪示的另一 種像素的詳細示意圖;第6圖係依據本揭示內容之部分實施例所繪示第5圖之像素的訊號時序示意圖;第7圖係依據本揭示內容之部分實施例所繪示第5圖之像素中各電晶體之狀態示意圖;第8圖係依據本揭示內容之部分實施例所繪示的一種顯示面板的示意圖;第9圖係依據本揭示內容之部分實施例所繪示的一種顯示面板的檢測方法的流程圖。 FIG. 1 is a schematic diagram of a pixel in a display panel according to some embodiments of the present disclosure; FIG. 2 is a detailed schematic diagram of a pixel according to some embodiments of the present disclosure; FIG. 3 is a Signal timing diagrams of the pixels in Figure 2 shown in some embodiments according to this disclosure; Figures 4A and 4B are schematic diagrams of states of transistors in pixels in Figure 2 according to some embodiments of this disclosure. Figure 5 is another drawing shown in accordance with other embodiments of the present disclosure Figure 6 is a detailed schematic diagram of a pixel; Figure 6 is a timing diagram of the pixel of Figure 5 according to some embodiments of the present disclosure; Figure 7 is a diagram of Figure 5 according to some embodiments of the present disclosure. A schematic diagram of the states of the transistors in the pixel; FIG. 8 is a schematic diagram of a display panel according to some embodiments of the present disclosure; and FIG. 9 is a display panel according to some embodiments of the present disclosure. Flow chart of the detection method.
下文係舉實施例配合所附圖式作詳細說明,但所提供之實施例並非用以限制本揭示所涵蓋的範圍,而結構運作之描述非用以限制其執行之順序,任何由元件重新組合之結構,所產生具有均等功效的裝置,皆為本揭示所涵蓋的範圍。另外,圖式僅以說明為目的,並未依照原尺寸作圖。為使便於理解,下述說明中相同元件或相似元件將以相同之符號標示來說明。 The following is a detailed description with examples and the accompanying drawings, but the examples provided are not intended to limit the scope covered by this disclosure, and the description of the structure operation is not intended to limit the order of its execution, and any recombination of components The structure of the device and the device with the same effect are all covered by the present disclosure. In addition, the drawings are for illustrative purposes only, and are not drawn to the original dimensions. In order to facilitate understanding, the same elements or similar elements in the following description will be described with the same symbols.
在全篇說明書與申請專利範圍所使用之用詞(terms),除有特別註明外,通常具有每個用詞使用在此領域中、在此揭示之內容中與特殊內容中的平常意義。 The terms used throughout the specification and the scope of patent applications, unless otherwise specified, usually have the ordinary meaning of each term used in this field, in the content disclosed herein, and in special content.
關於本文中所使用之『第一』、『第二』、『第三』...等,並非特別指稱次序或順位的意思,亦非用以限定本揭示,其僅僅是為了區別以相同技術用語描述的元件或操作而 已。 Regarding the "first", "second", "third", etc. used in this article, they do not specifically refer to the order or order, nor are they used to limit the present disclosure. They are only used to distinguish the same technology. Term or element Already.
另外,關於本文中所使用之『耦接』或『連接』,均可指二或多個元件相互直接作實體或電性接觸,或是相互間接作實體或電性接觸,亦可指二或多個元件相互操作或動作。 In addition, as used in this document, "coupling" or "connection" can mean that two or more components make direct physical or electrical contact with each other, or indirectly make physical or electrical contact with each other. Multiple elements operate or act on each other.
請參考第1圖。第1圖係依據本揭示內容之部分實施例所繪示的一種顯示面板中像素100的示意圖。如第1圖所示,像素100包含寫入電路120、補償電路160、檢測電路180、驅動電晶體Td和發光元件140。 Please refer to Figure 1. FIG. 1 is a schematic diagram of a pixel 100 in a display panel according to some embodiments of the present disclosure. As shown in FIG. 1, the pixel 100 includes a writing circuit 120, a compensation circuit 160, a detection circuit 180, a driving transistor Td, and a light emitting element 140.
結構上,寫入電路120耦接補償電路160。檢測電路180耦接補償電路160。補償電路160耦接驅動電晶體Td。發光元件140耦接驅動電晶體Td。具體而言,補償電路160耦接驅動電晶體Td的控制端和第二端。 Structurally, the write circuit 120 is coupled to the compensation circuit 160. The detection circuit 180 is coupled to the compensation circuit 160. The compensation circuit 160 is coupled to the driving transistor Td. The light emitting element 140 is coupled to the driving transistor Td. Specifically, the compensation circuit 160 is coupled to the control terminal and the second terminal of the driving transistor Td.
操作上,寫入電路120用以接收資料訊號VDATA,並提供資料訊號VDATA至補償電路160。檢測電路180用以接收檢測訊號CT,並提供檢測訊號CT至補償電路160。補償電路160用以接收資料訊號VDATA或檢測訊號CT,並提供驅動訊號Vg至驅動電晶體Td。驅動電晶體Td用以接收系統高電壓OVDD和驅動訊號Vg,並依據驅動訊號Vg輸出驅動電流I1至發光元件140。 In operation, the write circuit 120 is used to receive the data signal V DATA and provide the data signal V DATA to the compensation circuit 160. The detection circuit 180 is configured to receive the detection signal CT and provide the detection signal CT to the compensation circuit 160. The compensation circuit 160 is configured to receive a data signal V DATA or a detection signal CT, and provide a driving signal Vg to the driving transistor Td. The driving transistor Td is used to receive the system high voltage OVDD and the driving signal Vg, and output the driving current I1 to the light emitting element 140 according to the driving signal Vg.
具體而言,當補償電路160接收到檢測訊號CT時,補償電路160將檢測訊號CT作為驅動訊號Vg輸出。當補償電路160接收到資料訊號VDATA時,補償電路160依據資料訊號VDATA產生驅動訊號Vg。驅動訊號Vg的資料電壓準位負相關於驅動電晶體Td的臨界電壓的絕對值。 Specifically, when the compensation circuit 160 receives the detection signal CT, the compensation circuit 160 outputs the detection signal CT as the driving signal Vg. When the compensation circuit 160 receives the data signal V DATA , the compensation circuit 160 generates a driving signal Vg according to the data signal V DATA . The data voltage level of the driving signal Vg is negatively related to the absolute value of the threshold voltage of the driving transistor Td.
請參考第2圖。第2圖係依據本揭示內容之部分實施例所繪示的一種像素100a的詳細示意圖。如第2圖所示,像素100a中的寫入電路120包含電晶體T1和電晶體T2。像素100a中的補償電路160包含電容Cst、電晶體T3、電晶體T4、電晶體T5、電晶體T6和電晶體T7。像素100a中的檢測電路180包含檢測電晶體Tct。 Please refer to Figure 2. FIG. 2 is a detailed schematic diagram of a pixel 100a according to some embodiments of the present disclosure. As shown in FIG. 2, the writing circuit 120 in the pixel 100 a includes a transistor T1 and a transistor T2. The compensation circuit 160 in the pixel 100a includes a capacitor Cst, a transistor T3, a transistor T4, a transistor T5, a transistor T6, and a transistor T7. The detection circuit 180 in the pixel 100a includes a detection transistor Tct.
結構上,電晶體T1之第二端和電晶體T2之第一端耦接電容Cst之第一端。電容Cst之第二端透過第一節點N1耦接驅動電晶體Td之控制端和電晶體T3之第二端。檢測電晶體Tct之第二端耦接於第一節點N1。電晶體T3之第一端和電晶體T4之第一端皆耦接於電晶體T7之第二端。電晶體T4之第二端耦接電晶體T5之第一端和驅動電晶體Td之第二端。電晶體T5之第二端和電晶體T6之第二端耦接發光元件140之第一端。電晶體T6之第一端耦接電晶體T6之控制端。 Structurally, the second terminal of the transistor T1 and the first terminal of the transistor T2 are coupled to the first terminal of the capacitor Cst. The second terminal of the capacitor Cst is coupled to the control terminal of the driving transistor Td and the second terminal of the transistor T3 through the first node N1. The second terminal of the detection transistor Tct is coupled to the first node N1. The first terminal of transistor T3 and the first terminal of transistor T4 are both coupled to the second terminal of transistor T7. The second terminal of the transistor T4 is coupled to the first terminal of the transistor T5 and the second terminal of the driving transistor Td. The second terminal of the transistor T5 and the second terminal of the transistor T6 are coupled to the first terminal of the light emitting element 140. A first terminal of the transistor T6 is coupled to a control terminal of the transistor T6.
操作上,電晶體T1用以根據發光控制訊號EM選擇性導通以輸出參考電壓準位VREF。具體而言,電晶體T1之第一端用以接收參考電壓準位VREF。電晶體T1之控制端用以接收發光控制訊號EM。電晶體T1之第二端用以輸出參考電壓準位VREF。 In operation, the transistor T1 is used to selectively turn on according to the light-emitting control signal EM to output the reference voltage level V REF . Specifically, the first terminal of the transistor T1 is used to receive the reference voltage level V REF . The control terminal of the transistor T1 is used to receive the light-emitting control signal EM. The second terminal of the transistor T1 is used to output a reference voltage level V REF .
電晶體T2用以根據掃描控制訊號S2選擇性導通以輸出資料訊號VDATA。具體而言,電晶體T2之第一端用以接收資料訊號VDATA。電晶體T2之控制端用以接收掃描控制訊號S2。電晶體T2之第二端用以輸出資料訊號VDATA。 The transistor T2 is used to selectively turn on according to the scan control signal S2 to output a data signal V DATA . Specifically, the first end of the transistor T2 is used to receive a data signal V DATA . The control terminal of the transistor T2 is used to receive the scanning control signal S2. The second terminal of the transistor T2 is used to output a data signal V DATA .
電晶體T3用以根據掃描控制訊號S2選擇性導 通。具體而言,電晶體T3之第一端用以透過檢測電晶體Tct接收參考電壓準位VREF或檢測訊號CT。電晶體T3之控制端用以接收掃描控制訊號S2。 Transistor T3 is used to selectively turn on according to the scan control signal S2. Specifically, the first terminal of the transistor T3 is used to receive the reference voltage level V REF or the detection signal CT through the detection transistor Tct. The control terminal of the transistor T3 is used to receive the scanning control signal S2.
電晶體T4用以根據掃描控制訊號S2選擇性導通。具體而言,電晶體T4之第一端用以透過檢測電晶體Tct接收參考電壓準位VREF或檢測訊號CT。電晶體T4之控制端用以接收掃描控制訊號S2。 Transistor T4 is used to selectively turn on according to the scan control signal S2. Specifically, the first terminal of the transistor T4 is used to receive the reference voltage level V REF or the detection signal CT through the detection transistor Tct. The control terminal of the transistor T4 is used to receive the scanning control signal S2.
電晶體T5用以根據電晶體T5之控制端接收的發光控制訊號EM選擇性導通以輸出驅動電流I1。電晶體T6用以根據電晶體T6之第一端接收的掃描控制訊號S1[N+1]選擇性導通。 The transistor T5 is used for selectively conducting the light-emitting control signal EM received by the control terminal of the transistor T5 to output the driving current I1. Transistor T6 is used to selectively turn on according to the scan control signal S1 [N + 1] received by the first end of transistor T6.
電晶體T7用以根據掃描控制訊號S1[N]選擇性導通以進行補償。具體而言,電晶體T7之第一端用以接收參考電壓準位VREF。電晶體T7之控制端用以接收掃描控制訊號S1[N]。電晶體T7之第二端用以輸出參考電壓準位VREF至電晶體T3之第一端和電晶體T4之第一端。 Transistor T7 is used to selectively turn on for compensation according to the scanning control signal S1 [N]. Specifically, the first terminal of the transistor T7 is used to receive the reference voltage level V REF . The control terminal of the transistor T7 is used to receive the scanning control signal S1 [N]. The second terminal of the transistor T7 is used to output the reference voltage level V REF to the first terminal of the transistor T3 and the first terminal of the transistor T4.
檢測電晶體Tct用以根據檢測控制訊號CS選擇性的導通以進行檢測。檢測電晶體Tct之第一端用以接收參考電壓準位VREF。檢測電晶體Tct之控制端用以接收檢測控制訊號CS。檢測電晶體Tct之第二端用以輸出檢測控制訊號CS至第一節點N1。 The detection transistor Tct is used to selectively conduct the detection according to the detection control signal CS. The first terminal of the detection transistor Tct is used to receive a reference voltage level V REF . The control terminal of the detection transistor Tct is used to receive a detection control signal CS. The second terminal of the detection transistor Tct is used to output a detection control signal CS to the first node N1.
驅動電晶體Td用以接收系統高電壓OVDD和驅動訊號Vg,並依據驅動訊號Vg輸出驅動電流I1至發光元件140。驅動電晶體Td之第一端用以接收系統高電壓OVDD。驅 動電晶體Td之控制端用以自第一節點N1接收驅動訊號Vg。驅動電晶體Td之第二端用以依據驅動訊號Vg輸出驅動電流I1至發光元件140。 The driving transistor Td is used to receive the system high voltage OVDD and the driving signal Vg, and output the driving current I1 to the light emitting element 140 according to the driving signal Vg. The first terminal of the driving transistor Td is used to receive the system high voltage OVDD. drive The control terminal of the power transistor Td is used to receive a driving signal Vg from the first node N1. The second terminal of the driving transistor Td is used to output a driving current I1 to the light emitting element 140 according to the driving signal Vg.
為便於說明起見,像素100a當中各個元件的具體操作將於以下段落中搭配圖式進行說明。請一併參考第3圖和第4A、4B圖。第3圖係依據本揭示內容之部分實施例所繪示第2圖之像素100a的訊號時序示意圖。第4A、4B圖係依據本揭示內容之部分實施例所繪示第2圖之像素100a中各電晶體之狀態示意圖 For the convenience of description, the specific operations of each element in the pixel 100a will be described in conjunction with the drawings in the following paragraphs. Please refer to Figure 3 and Figures 4A and 4B together. FIG. 3 is a schematic timing diagram of the signal of the pixel 100a in FIG. 2 according to some embodiments of the present disclosure. Figures 4A and 4B are schematic diagrams showing the states of the transistors in the pixel 100a of Figure 2 according to some embodiments of the present disclosure.
在部分實施例中,如第3圖所示,在檢測期間Ptest,掃描控制訊號S1[N]、S2[N]和S1[N+1]位於高電壓準位。發光控制訊號EM位於低電壓準位。檢測控制訊號CS轉為低電壓準位以進行檢測。在此時段中,如第4A圖所示,電晶體T2、T3、T4、T6和T7根據高電壓準位的掃描控制訊號S1[N]、S2[N]和S1[N+1]而關斷。電晶體T1和T5根據低電壓準位的發光控制訊號EM而導通。檢測電晶體Tct根據低電壓準位的檢測控制訊號CS而導通。 In some embodiments, as shown in FIG. 3, during the test period P test , the scan control signals S1 [N], S2 [N], and S1 [N + 1] are at a high voltage level. The light emission control signal EM is at a low voltage level. The detection control signal CS is turned to a low voltage level for detection. During this period, as shown in Figure 4A, the transistors T2, T3, T4, T6, and T7 are turned off according to the scan control signals S1 [N], S2 [N], and S1 [N + 1] of the high voltage level. Off. The transistors T1 and T5 are turned on according to the light-emitting control signal EM at a low voltage level. The detection transistor Tct is turned on according to the detection control signal CS of the low voltage level.
換言之,在檢測期間Ptest,檢測電路180中的檢測電晶體Tct根據檢測控制訊號CS導通,接收檢測訊號CT並輸出檢測訊號CT至第一節點N1以作為驅動訊號Vg。驅動電晶體Td根據驅動訊號Vg輸出驅動電流I1至發光元件140,以點亮發光元件140進行檢測。 In other words, during the test period P test , the detection transistor Tct in the detection circuit 180 is turned on according to the detection control signal CS, receives the detection signal CT, and outputs the detection signal CT to the first node N1 as the driving signal Vg. The driving transistor Td outputs a driving current I1 to the light emitting element 140 according to the driving signal Vg, so as to light up the light emitting element 140 for detection.
接著,在一般顯示期間Pnormal,如第3圖所示,掃描控制訊號S1[N]、S2[N]、S1[N+1]和發光控制訊號EM依序 作動以進行資料訊號VDATA的寫入和補償。檢測控制訊號CS位於高電壓準位使得檢測電晶體Tct維持關斷。 Next, during the normal display period P normal , as shown in FIG. 3, the scan control signals S1 [N], S2 [N], S1 [N + 1] and the light emission control signal EM are sequentially operated to perform the data signal V DATA . Write and compensate. The detection control signal CS is at a high voltage level so that the detection transistor Tct remains off.
具體而言,電晶體T7之控制端接收低電壓準位的掃描控制訊號S1[N]使得電晶體T7導通。低電壓準位的掃描控制訊號S2[N]導通電晶體T3、T4,使得驅動電晶體Td的控制端被重置到參考電壓準位VREF。接著,低電壓準位的掃描控制訊號S2[N]導通電晶體T2,透過電晶體T2將資料訊號VDATA寫入電容Cst的第一端。同時,系統高電壓OVDD透過電晶體T3、T4對驅動電晶體Td的控制端充電,直到驅動電晶體Td的第一端和控制端的壓差為OVDD-|Vth|,其中|Vth|為驅動電晶體Td的臨界電壓。 Specifically, the control terminal of the transistor T7 receives the scanning control signal S1 [N] at a low voltage level, so that the transistor T7 is turned on. The scan control signal S2 [N] of the low voltage level turns on the transistors T3 and T4, so that the control terminal of the driving transistor Td is reset to the reference voltage level V REF . Then, the scan control signal S2 [N] at the low voltage level turns on the transistor T2, and the data signal V DATA is written into the first terminal of the capacitor Cst through the transistor T2. At the same time, the system high voltage OVDD charges the control terminal of the driving transistor Td through the transistors T3 and T4 until the voltage difference between the first terminal and the control terminal of the driving transistor Td is OVDD- | Vth |, where | Vth | The critical voltage of the crystal Td.
之後,低電壓準位的掃描控制訊號S1[N+1]重置發光元件OLED的陽極電壓準位。低電壓準位的發光控制訊號EM導通電晶體T1和T5。電容Cst的第一端透過電晶體T1接收參考電壓準位VREF。因此,電容Cst的第二端的電壓準位由OVDD-|Vth|轉變為OVDD-|Vth|-VDATA+VREF。如此一來,驅動電流I1如下式所示:I1=k(VSG-|Vth|)2=k[0VDD-(0VDD-|Vth|-VDATA+VREF)-|Vth|]2=k(VDATA-VREF)2 After that, the scan control signal S1 [N + 1] of the low voltage level resets the anode voltage level of the light emitting element OLED. The low-level light-emitting control signal EM turns on the crystals T1 and T5. The first terminal of the capacitor Cst receives the reference voltage level V REF through the transistor T1. Therefore, the voltage level of the second terminal of the capacitor Cst is changed from OVDD- | Vth | to OVDD- | Vth | -V DATA + V REF . In this way, the driving current I1 is as follows: I1 = k (V SG- | Vth |) 2 = k [0VDD- (0VDD- | Vth | -V DATA + V REF )-| Vth |] 2 = k (V DATA -V REF ) 2
此外,如第4B圖所示,在一般顯示期間Pnormal,檢測電路180中的檢測電晶體Tct根據檢測控制訊號CS維持關 斷,以使得驅動訊號Vg和檢測電路180的輸入訊號(例如:檢測訊號CT、定電壓訊號或接地訊號等等)互相獨立。 In addition, as shown in FIG. 4B, during the normal display period P normal , the detection transistor Tct in the detection circuit 180 is kept off according to the detection control signal CS, so that the driving signal Vg and the input signal of the detection circuit 180 (for example: detection Signal CT, constant voltage signal or ground signal, etc.) are independent of each other.
請參考第5圖。第5圖係依據本揭示內容之其他部分實施例所繪示的另一種像素100b的詳細示意圖。在第5圖所示實施例中,與第2圖的實施例中相似的元件係以相同的元件符號表示,其操作已於先前段落說明者,於此不再贅述。和第2圖所示實施例相比,在本實施例中,在檢測期間Ptest,由補償電路160中的電晶體T7作為檢測電路180進行檢測。 Please refer to Figure 5. FIG. 5 is a detailed schematic diagram of another pixel 100b according to other embodiments of the present disclosure. In the embodiment shown in FIG. 5, components similar to those in the embodiment shown in FIG. 2 are represented by the same component symbols, and their operations have been described in the previous paragraph, and will not be repeated here. Compared with the embodiment shown in FIG. 2, in this embodiment, during the test period P test , the transistor T7 in the compensation circuit 160 is used as the detection circuit 180 for detection.
具體而言,在一般顯示期間Pnormal,電晶體T7用以根據掃描控制訊號S1[N]選擇性的導通以進行補償。在檢測期間Ptest,電晶體T7用以根據檢測控制訊號CS選擇性的導通以進行檢測。 Specifically, during the normal display period P normal , the transistor T7 is used to selectively turn on according to the scan control signal S1 [N] for compensation. During the test period P test , the transistor T7 is used to selectively conduct conduction according to the detection control signal CS for detection.
為便於說明起見,像素100b當中各個元件的具體操作將於以下段落中搭配圖式進行說明。請一併參考第6圖和第7圖。第6圖係依據本揭示內容之部分實施例所繪示第5圖之像素100b的訊號時序示意圖。第7圖係依據本揭示內容之部分實施例所繪示第5圖之像素100b中各電晶體之狀態示意圖。 For the convenience of description, the specific operations of each element in the pixel 100b will be described in conjunction with the drawings in the following paragraphs. Please refer to Figure 6 and Figure 7 together. FIG. 6 is a schematic timing diagram of signals of the pixel 100b of FIG. 5 according to some embodiments of the present disclosure. FIG. 7 is a schematic diagram showing states of the transistors in the pixel 100b of FIG. 5 according to some embodiments of the present disclosure.
在第6圖所示實施例中,與第3圖的實施例相似,分為檢測期間Ptest和一般顯示期間Pnormal。一般顯示期間Pnormal的操作已於先前段落說明,於此不再贅述。在檢測期間Ptest,掃描控制訊號S1[N]、S2[N]和發光控制訊號EM依序轉為低電壓準位,而掃描控制訊號S1[N]作為檢測控制訊號CS由高電壓準位分別轉為低電壓準位。 The embodiment shown in FIG. 6 is similar to the embodiment shown in FIG. 3 and is divided into a detection period P test and a normal display period P normal . The operation of P normal during the normal display has been described in the previous paragraph, and is not repeated here. During the test period P test , the scan control signals S1 [N], S2 [N] and the light emission control signal EM are sequentially turned to a low voltage level, and the scan control signal S1 [N] is used as a detection control signal CS by a high voltage level Turn to low voltage levels respectively.
具體而言,如第7圖所示,在檢測期間Ptest,轉為 低電壓準位的掃描控制訊號S1[N]作為檢測控制訊號CS,使得電晶體T7導通以接收檢測訊號CT。低電壓準位的掃描控制訊號S2[N]使得電晶體T3導通,以將檢測訊號CT傳送至驅動電晶體Td之控制端。而低電壓準位的發光控制訊號EM使得電晶體T5導通以進行檢測。 Specifically, as shown in FIG. 7, during the test period P test , the scan control signal S1 [N] turned to a low voltage level is used as the detection control signal CS, so that the transistor T7 is turned on to receive the detection signal CT. The scan control signal S2 [N] of the low voltage level causes the transistor T3 to be turned on to transmit the detection signal CT to the control terminal of the driving transistor Td. The low-voltage light-emitting control signal EM causes the transistor T5 to be turned on for detection.
此外,在檢測期間Ptest,參考電壓準位VREF係為檢測訊號CT。換言之,參考電壓準位VREF的電壓準位即為要給予驅動電晶體Td之控制端的電壓準位。資料訊號VDATA之電壓準位可為任一固定直流電壓值。 In addition, during the test period P test , the reference voltage level V REF is the detection signal CT. In other words, the voltage level of the reference voltage level V REF is the voltage level to be given to the control terminal of the driving transistor Td. The voltage level of the data signal V DATA can be any fixed DC voltage value.
如此一來,在檢測期間Ptest,檢測電路180中的電晶體T7根據檢測控制訊號CS導通,接收檢測訊號CT並輸出檢測訊號CT至第一節點N1以作為驅動訊號Vg。驅動電晶體Td根據驅動訊號Vg輸出驅動電流I1至發光元件140,以點亮發光元件140進行檢測。 In this way, during the test period P test , the transistor T7 in the detection circuit 180 is turned on according to the detection control signal CS, receives the detection signal CT and outputs the detection signal CT to the first node N1 as the driving signal Vg. The driving transistor Td outputs a driving current I1 to the light emitting element 140 according to the driving signal Vg, so as to light up the light emitting element 140 for detection.
請參考第8圖。第8圖係依據本揭示內容之部分實施例所繪示的一種顯示面板的示意圖。如第8圖所示,顯示面板包含第一色像素Pr[1,1]~Pr[n,n]、第二色像素Pg[1,1]~Pg[n,n]和第三色像素Pb[1,1]~Pb[n,n]。 Please refer to Figure 8. FIG. 8 is a schematic diagram of a display panel according to some embodiments of the present disclosure. As shown in FIG. 8, the display panel includes first color pixels Pr [1,1] ~ Pr [n, n], second color pixels Pg [1,1] ~ Pg [n, n], and third color pixels Pb [1,1] ~ Pb [n, n].
在部分實施例中,像素Pr[1,1]~Pr[n,n]、Pg[1,1]~Pg[n,n]和Pb[1,1]~Pb[n,n]可由第2圖中的像素100a來實施。如第8圖所示,第一色像素Pr[1,1]~Pr[n,n]中的檢測電路180相互耦接。具體而言,第一色像素Pr[1,1]~Pr[n,n]中的各個檢測電路180的檢測電晶體Tct的第一端透過檢測訊號線Ldr相互耦接。相似地,第二色像素Pg[1,1]~Pg[n,n]中的檢 測電路180透過檢測訊號線Ldg相互耦接。第三色像素Pb[1,1]~Pb[n,n]中的檢測電路180透過檢測訊號線Ldb相互耦接。 In some embodiments, the pixels Pr [1,1] ~ Pr [n, n], Pg [1,1] ~ Pg [n, n], and Pb [1,1] ~ Pb [n, n] can be The pixel 100a in FIG. 2 is implemented. As shown in FIG. 8, the detection circuits 180 in the first color pixels Pr [1,1] to Pr [n, n] are coupled to each other. Specifically, the first ends of the detection transistors Tct of the respective detection circuits 180 in the first color pixels Pr [1,1] to Pr [n, n] are coupled to each other through the detection signal line L dr . Similarly, the detection circuits 180 in the second color pixels Pg [1,1] ~ Pg [n, n] are coupled to each other through the detection signal line L dg . The detection circuits 180 in the third color pixels Pb [1,1] ~ Pb [n, n] are coupled to each other through the detection signal line L db .
在其他部分實施例中,像素Pr[1,1]~Pr[n,n]、Pg[1,1]~Pg[n,n]和Pb[1,1]~Pb[n,n]可由第5圖中的像素100b來實施。具體而言,第一色像素Pr[1,1]~Pr[n,n]中的各個檢測電路180的電晶體T7的第一端透過檢測訊號線Ldr相互耦接。為方便說明起見,下述段落將以像素100a為例進行描述。 In other embodiments, the pixels Pr [1,1] ~ Pr [n, n], Pg [1,1] ~ Pg [n, n], and Pb [1,1] ~ Pb [n, n] can be determined by The pixel 100b in FIG. 5 is implemented. Specifically, the first ends of the transistors T7 of the detection circuits 180 in the first color pixels Pr [1,1] to Pr [n, n] are coupled to each other through the detection signal line L dr . For convenience of description, the following paragraphs will be described using the pixel 100a as an example.
操作上,第一色像素Pr[1,1]~Pr[n,n]的各個檢測電晶體Tct透過檢測訊號線Ldr接收第一檢測訊號CTr。第二色像素Pg[1,1]~Pg[n,n]的各個檢測電晶體Tct透過檢測訊號線Ldg接收第二檢測訊號CTg。第三色像素Pb[1,1]~Pb[n,n]的各個檢測電晶體Tct透過檢測訊號線Ldb接收第三檢測訊號CTb。在部分實施例中,第一檢測訊號CTr位於第一電壓準位,而第二檢測訊號CTg位於第二電壓準位。第一電壓準位可不同於第二電壓準位。 In operation, each detection transistor Tct of the first color pixels Pr [1,1] ~ Pr [n, n] receives the first detection signal CTr through the detection signal line L dr . Each detection transistor Tct of the second color pixels Pg [1,1] ~ Pg [n, n] receives the second detection signal CTg through the detection signal line L dg . Each detection transistor Tct of the third color pixel Pb [1,1] ~ Pb [n, n] receives the third detection signal CTb through the detection signal line L db . In some embodiments, the first detection signal CTr is at a first voltage level, and the second detection signal CTg is at a second voltage level. The first voltage level may be different from the second voltage level.
在部分實施例中,檢測期間包含第一檢測期間、第二檢測期間和第三檢測期間。在第一檢測期間,由像素100中的第一色像素Pr[1,1]~Pr[n,n]的檢測電路180之各者提供第一檢測訊號CTr至相應的補償電路160。在第二檢測期間,由像素100中的第二色像素Pg的檢測電路180之各者提供第二檢測訊號CTg至相應的補償電路160。在第三檢測期間,由像素100中的第三色像素Pb的檢測電路180之各者提供第三檢測訊號CTb至相應的補償電路160。 In some embodiments, the detection period includes a first detection period, a second detection period, and a third detection period. During the first detection period, each of the detection circuits 180 of the first color pixels Pr [1,1] to Pr [n, n] in the pixel 100 provides the first detection signal CTr to the corresponding compensation circuit 160. During the second detection period, each of the detection circuits 180 of the second color pixel Pg in the pixels 100 provides a second detection signal CTg to the corresponding compensation circuit 160. During the third detection period, each of the detection circuits 180 of the third color pixel Pb in the pixels 100 provides a third detection signal CTb to the corresponding compensation circuit 160.
值得注意的是,上述各種色像素的檢測訊號的電 壓準位的高低或期間長短僅為方便說明起見之示例,並分用以限制本揭示內容。本領域具有通常知識者可依據實際需求調整檢測訊號的電壓準位。 It is worth noting that the electrical signals of the detection signals of the above-mentioned various color pixels are The level of the pressure level or the length of the period is only an example for convenience of explanation, and is used to limit the disclosure. Those skilled in the art can adjust the voltage level of the detection signal according to actual needs.
換言之,不同顏色之色像素的檢測訊號CTr、CTg和CTb相互獨立。不同檢測訊號CTr、CTg和CTb的電壓準位可不相同。在其他部分實施例中,檢測期間可包含其他檢測期間。在同一檢測期間,不同色像素的檢測訊號可給予相同或不同的電壓準位。 In other words, the detection signals CTr, CTg, and CTb of color pixels of different colors are independent of each other. The voltage levels of different detection signals CTr, CTg, and CTb may be different. In other embodiments, the detection period may include other detection periods. During the same detection period, the detection signals of different color pixels can be given the same or different voltage levels.
如此一來,在部分實施例中,藉由不同電壓準位的檢測訊號CTr、CTg和CTb得以顯示出紅色、綠色、藍色、黑色或白色等等測試圖樣。 As a result, in some embodiments, the test signals CTr, CTg, and CTb of different voltage levels can display test patterns such as red, green, blue, black, or white.
另外,在部分實施例中,如第6圖所示,顯示面板中的像素的檢測電晶體Tct的控制端相互連接。換言之,像素Pr[1,1]~Pr[n,n]、Pg[1,1]~Pg[n,n]和Pb[1,1]~Pb[n,n]透過檢測控制訊號線Lcs相互連接。具體而言,像素Pr[1,1]~Pr[n,n]、Pg[1,1]~Pg[n,n]和Pb[1,1]~Pb[n,n]中的各個檢測電晶體Tct的控制端透過檢測控制訊號線Lcs相互連接。 In addition, in some embodiments, as shown in FIG. 6, the control terminals of the detection transistors Tct of the pixels in the display panel are connected to each other. In other words, the pixels Pr [1,1] ~ Pr [n, n], Pg [1,1] ~ Pg [n, n], and Pb [1,1] ~ Pb [n, n] pass through the detection control signal line L cs are interconnected. Specifically, each of the pixels Pr [1,1] ~ Pr [n, n], Pg [1,1] ~ Pg [n, n], and Pb [1,1] ~ Pb [n, n] is detected The control terminals of the transistor Tct are connected to each other through a detection control signal line L cs .
如此一來,藉由顯示面板中像素共用檢測控制訊號CS,以及不同顏色之像素各自共用檢測訊號CTr、CTg或CTb,使得能夠減少輸入訊號的總數。由於顯示面板周邊檢測區域的減少,使得面取數得以增加,而降低成本。 In this way, the detection control signal CS is shared by the pixels in the display panel, and the detection signals CTr, CTg, or CTb are shared by the pixels of different colors, so that the total number of input signals can be reduced. Due to the reduction of the detection area around the display panel, the number of surface accesses can be increased, and the cost can be reduced.
請參考第9圖。第9圖係依據本揭示內容之部分實施例所繪示的一種顯示面板的檢測方法的流程圖。為方便及清楚說明起見,下述顯示面板的檢測方法900是配合第1圖~第8 圖所示實施例進行說明,但不以此為限,任何熟習此技藝者,在不脫離本案之精神和範圍內,當可對作各種更動與潤飾。如第9圖所示,顯示面板的檢測方法900包含操作S910~S970。 Please refer to Figure 9. FIG. 9 is a flowchart of a method for detecting a display panel according to some embodiments of the present disclosure. For the sake of convenience and clear description, the detection method 900 of the display panel described below is in cooperation with FIGS. 1 to 8 The embodiment shown in the figure is described, but is not limited thereto. Any person skilled in the art can make various modifications and retouching without departing from the spirit and scope of this case. As shown in FIG. 9, the method 900 for detecting a display panel includes operations S910 to S970.
首先,在操作S910中,在檢測期間,根據檢測控制訊號CS相應導通複數個像素100中的複數個檢測電路180。 First, in operation S910, during the detection period, the plurality of detection circuits 180 in the plurality of pixels 100 are turned on correspondingly according to the detection control signal CS.
接著,在操作S920中,由檢測電路180提供檢測訊號CT至像素100中相應的補償電路160。 Next, in operation S920, the detection signal CT is provided by the detection circuit 180 to the corresponding compensation circuit 160 in the pixel 100.
接著,在操作S930中,由補償電路160接收到檢測訊號CT,並將檢測訊號CT作為驅動訊號Vg輸出至像素100中相應的驅動電晶體Td。 Next, in operation S930, the detection signal CT is received by the compensation circuit 160, and the detection signal CT is output as the driving signal Vg to the corresponding driving transistor Td in the pixel 100.
接著,在操作S940中,驅動電晶體Td依據驅動訊號Vg輸出驅動電流I1至像素100中相應的發光元件140以進行檢測。 Next, in operation S940, the driving transistor Td outputs a driving current I1 to the corresponding light emitting element 140 in the pixel 100 for detection according to the driving signal Vg.
接著,在操作S950中,在顯示期間,由寫入電路120提供資料訊號VDATA至補償電路160。 Then, in operation S950, the data signal V DATA is provided by the writing circuit 120 to the compensation circuit 160 during the display period.
接著,在操作S960中,由補償電路160依據資料訊號VDATA產生驅動訊號Vg。 Then, in operation S960, the compensation signal 160 generates a driving signal Vg according to the data signal V DATA .
最後,在操作S970中,由驅動電晶體Td依據驅動訊號Vg輸出驅動電流I1至像素100中相應的發光元件140以進行顯示。 Finally, in operation S970, the driving transistor Td outputs the driving current I1 to the corresponding light emitting element 140 in the pixel 100 for display according to the driving signal Vg.
所屬技術領域具有通常知識者可直接瞭解此顯示面板的檢測方法900如何基於上述多個不同實施例中的顯示面板及像素100、100a、100b以執行該等操作及功能,故不在此贅述。 Those skilled in the art can directly understand how the detection method 900 of the display panel performs the operations and functions based on the display panel and the pixels 100, 100a, and 100b in the various embodiments described above, and therefore will not be described in detail here.
綜上所述,在本揭示內容的顯示面板和顯示面板的檢測方法中,藉由簡化檢測期間的訊號數量,以及利用共用檢測訊號和訊號傳輸線,使得能夠減少顯示面板周邊區域的需求,因而得以增加面取數,達到成本的降低。 To sum up, in the display panel and the display panel detection method of the present disclosure, by simplifying the number of signals during the detection period, and by using a shared detection signal and a signal transmission line, it is possible to reduce the demand for the peripheral area of the display panel, thereby enabling Increase the number of noodles to reduce costs.
雖然本揭示已以實施方式揭示如上,然其並非用以限定本揭示,任何本領域具通常知識者,在不脫離本揭示之精神和範圍內,當可作各種之更動與潤飾,因此本揭示之保護範圍當視後附之申請專利範圍所界定者為準。 Although the present disclosure has been disclosed as above in the form of implementation, it is not intended to limit the present disclosure. Any person with ordinary knowledge in the field can make various changes and modifications without departing from the spirit and scope of the present disclosure. The scope of protection shall be determined by the scope of the attached patent application.
Claims (11)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW107141309A TWI676979B (en) | 2018-11-20 | 2018-11-20 | Display panel and testing method of display panel |
CN201811631942.4A CN109389923B (en) | 2018-11-20 | 2018-12-29 | Display panel and detection method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW107141309A TWI676979B (en) | 2018-11-20 | 2018-11-20 | Display panel and testing method of display panel |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI676979B true TWI676979B (en) | 2019-11-11 |
TW202020846A TW202020846A (en) | 2020-06-01 |
Family
ID=65430950
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW107141309A TWI676979B (en) | 2018-11-20 | 2018-11-20 | Display panel and testing method of display panel |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN109389923B (en) |
TW (1) | TWI676979B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115588411A (en) * | 2022-11-07 | 2023-01-10 | 厦门天马显示科技有限公司 | Pixel circuit, display panel and display device |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005321433A (en) * | 2004-05-06 | 2005-11-17 | Mitsubishi Electric Corp | Image display apparatus and method for inspecting same |
CN104751793A (en) * | 2013-12-26 | 2015-07-01 | 乐金显示有限公司 | Organic light emitting diode display and method for sensing driving characteristics thereof |
CN107808635A (en) * | 2016-09-08 | 2018-03-16 | 联咏科技股份有限公司 | The sensing device further and method for sensing of display panel |
CN108230974A (en) * | 2018-01-26 | 2018-06-29 | 京东方科技集团股份有限公司 | A kind of luminescent device defect detection circuit and method, display drive apparatus, display device and its detection method |
CN108615491A (en) * | 2018-05-16 | 2018-10-02 | 京东方科技集团股份有限公司 | Burn-in test circuit, compensation of ageing module and display panel |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101903933B (en) * | 2008-01-07 | 2013-03-27 | 松下电器产业株式会社 | Display device, electronic device, and driving method |
CN104240639B (en) * | 2014-08-22 | 2016-07-06 | 京东方科技集团股份有限公司 | A kind of image element circuit, organic EL display panel and display device |
TWI518658B (en) * | 2014-10-01 | 2016-01-21 | 友達光電股份有限公司 | Pixel driving circuit |
KR102411075B1 (en) * | 2015-08-24 | 2022-06-21 | 삼성디스플레이 주식회사 | Pixel and organic light emitting display device having the same |
CN106531084B (en) * | 2017-01-05 | 2019-02-05 | 上海天马有机发光显示技术有限公司 | Organic light emitting display panel and its driving method, organic light-emitting display device |
CN106847187B (en) * | 2017-03-01 | 2019-04-05 | 上海天马有机发光显示技术有限公司 | A kind of electric current detecting method of pixel circuit, display panel and display device |
EP3389039A1 (en) * | 2017-04-13 | 2018-10-17 | Samsung Electronics Co., Ltd. | Display panel and driving method of display panel |
CN106940978B (en) * | 2017-05-15 | 2019-10-25 | 上海天马有机发光显示技术有限公司 | Organic light emitting display panel and its driving method, organic light-emitting display device |
TWI635474B (en) * | 2018-02-09 | 2018-09-11 | 友達光電股份有限公司 | Display apparatus and pixel detection method thereof |
-
2018
- 2018-11-20 TW TW107141309A patent/TWI676979B/en active
- 2018-12-29 CN CN201811631942.4A patent/CN109389923B/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005321433A (en) * | 2004-05-06 | 2005-11-17 | Mitsubishi Electric Corp | Image display apparatus and method for inspecting same |
CN104751793A (en) * | 2013-12-26 | 2015-07-01 | 乐金显示有限公司 | Organic light emitting diode display and method for sensing driving characteristics thereof |
CN107808635A (en) * | 2016-09-08 | 2018-03-16 | 联咏科技股份有限公司 | The sensing device further and method for sensing of display panel |
CN108230974A (en) * | 2018-01-26 | 2018-06-29 | 京东方科技集团股份有限公司 | A kind of luminescent device defect detection circuit and method, display drive apparatus, display device and its detection method |
CN108615491A (en) * | 2018-05-16 | 2018-10-02 | 京东方科技集团股份有限公司 | Burn-in test circuit, compensation of ageing module and display panel |
Also Published As
Publication number | Publication date |
---|---|
CN109389923A (en) | 2019-02-26 |
TW202020846A (en) | 2020-06-01 |
CN109389923B (en) | 2022-03-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US11043168B2 (en) | Shift register and method for driving the same, gate driving circuit and display apparatus | |
JP7001805B2 (en) | Shift register and its drive method, gate drive circuit and display device | |
TWI639149B (en) | Pixel circuit | |
CN108154844B (en) | A kind of pixel circuit, its driving method and display panel | |
US12002414B2 (en) | Display panel and display device | |
WO2020155895A1 (en) | Gate drive circuit and driving method therefor, and display apparatus and control method therefor | |
US20170162118A1 (en) | Pixel circuit and driving method thereof | |
WO2018171137A1 (en) | Goa unit and driving method thereof, goa circuit, and display device | |
TWI688943B (en) | Pixel circuit and driving method thereof | |
CN109509433A (en) | Pixel circuit, display device and image element driving method | |
CN112908258B (en) | Pixel driving circuit, driving method, display panel and display device | |
EP3159879A1 (en) | Pixel circuit and display device | |
US11605360B2 (en) | Circuit and method for preventing screen flickering, drive circuit for display panel, and display apparatus | |
TWI471844B (en) | Display panels, pixel driving circuits, pixel driving methods and electronic devices | |
WO2021083155A1 (en) | Pixel driving circuit and driving method therefor, display panel, and display device | |
KR20190132525A (en) | Scan Driver, Scan Driver and Display Device | |
US20220076622A1 (en) | Pixel driving circuit and driving method therefor, display panel and display apparatus | |
CN110867162B (en) | Pixel driving circuit, driving method thereof and display panel | |
CN108877646B (en) | Display circuit and display | |
CN111402809A (en) | Display panel and display device | |
TWI676979B (en) | Display panel and testing method of display panel | |
CN112967654B (en) | GIP circuit and driving method | |
TWI708230B (en) | Display panel | |
US10643533B2 (en) | Emission control driving circuit, emission control driver and organic light emitting display device | |
TWI680448B (en) | Pixel circuit |