TWI671713B - Surface inspection method - Google Patents
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Abstract
本發明之表面檢測方法,係首先建立至少一超音波圖像模型及至少一光學影像模型,並且在擷取被測物之被測物超音波圖像及被測物光學影像之後,透過比對被測物超音波圖像及被測物光學影像兩種結果的方式達到表面檢測目的,不但可以獲得準確的檢測結果,更可大幅縮短檢測時間,尤適合應用自動化連續加工製程,以相對更為積極、可靠之手段,避免問題產品連續性產出,以及監控生產線設備之妥善率。The surface detection method of the present invention firstly establishes at least one ultrasonic image model and at least one optical image model, and after capturing the ultrasonic image of the measured object and the optical image of the measured object, it is transmitted through comparison. The two methods of the ultrasonic image of the measured object and the optical image of the measured object achieve the purpose of surface inspection. Not only can accurate detection results be obtained, but also the detection time can be greatly shortened. It is particularly suitable for the application of automated continuous processing processes, and is relatively more Proactive and reliable means to avoid problematic product continuity output and to monitor the proper rate of production line equipment.
Description
本發明係有關一種檢測技術,特別是指一種可以縮短檢測時間,尤適合應用自動化連續加工製程需求的表面檢測方法。The invention relates to a detection technology, in particular to a surface detection method which can shorten the detection time and is particularly suitable for the application of an automated continuous processing process.
在現今的加工製造領域中,對於產品表面質量檢測極為重要,除可藉以檢測產品之加工完成度,藉以維護產品之加工品質外,更可藉由產品表面所產生之瑕疵,進一步發現相關的加工設備是否發生異常或耗損。In today's processing and manufacturing field, it is extremely important to inspect the quality of the product surface. In addition to detecting the processing completion of the product to maintain the processing quality of the product, it is also possible to further discover related processing by using defects on the product surface. Whether the equipment is abnormal or worn.
傳統對於產品之表面檢測方法多採目視檢測方式,一般情況下,質檢人員在以目測方式檢查產品上、下表面之表面狀態之後,即需做出相關的檢測判斷,其檢測結果往往因人而異,且偶有因為落檢而無法即時反映產品加工質量的全貌。Traditionally, the surface inspection methods of products are mostly visual inspection methods. Generally, after inspecting the surface state of the upper and lower surfaces of the product by visual inspection, the quality inspection personnel need to make relevant inspection judgments. It varies, and occasionally because of the unsuccessful inspection, it can not immediately reflect the full picture of product processing quality.
隨著科技的演進,數位影像辨視能力越來越進步,相關的自動表面檢測系統孕育而生,已知透過光學儀器(如紅外線掃描器)掃描的方式,檢測產品表面瑕疵;由於光學掃描係以點構成線再構成面的方式達到檢驗目的,必須耗費較長的時間,相對拉長隨機採樣的間隔,相對較不符合現今自動化連續加工製程需求。With the evolution of science and technology, the ability to recognize digital images has become more and more advanced, and related automatic surface detection systems have emerged. It is known to detect defects on the surface of products by scanning using optical instruments (such as infrared scanners). In order to achieve the inspection purpose by forming a point and a line to form a surface, it must take a long time. Relatively long random sampling intervals are relatively inconsistent with the requirements of today's automated continuous processing processes.
有鑑於此,本發明即在提供一種可以縮短檢測時間,尤適合應用自動化連續加工製程需求的表面檢測方法。In view of this, the present invention is to provide a surface detection method which can shorten the detection time, and is particularly suitable for the application of an automated continuous processing process.
本發明之表面檢測方法,基本上包括下列步驟:(a)建立至少一超音波圖像模型及至少一 光學影像模型;(b)設定檢測項目之範圍及比對值,係依照所需的檢測項目,透過軟體於該至少一超音波圖像模型當中設定至少一與檢測項目對應的超音波圖像檢測範圍及超音波比對值,以及利用軟體於該至少一光學影像模型當中設定至少一與檢測項目對應的光學影像檢測範圍及光學比對值;(c)提供一被測物;(d)擷取該被測物之被測物超音波圖像及被測物光學影像,利用至少一超音波成像設備擷取該被測物之被測物超音波圖像,以及利用至少一數位相機擷取該被測物之被測物光學影像;(e)比對被測物超音波圖像及被測物光學影像,係透過軟體依照所設定之超音波圖像檢測範圍及超音波比對值,將該被測物超音波圖像之數位圖像資訊與該至少一超音波圖像模型之數位圖像資訊進行比對,以及透過軟體依照所設定之光學影像檢測範圍及光學比對值,將該被測物光學影像之數位影像資訊與該至少一光學影像模型之數位影像資訊進行比對;(f)輸出比對結果。The surface detection method of the present invention basically includes the following steps: (a) establishing at least one ultrasonic image model and at least one optical image model; (b) setting the range and comparison value of the detection items according to the required detection Project, using software to set at least one ultrasonic image detection range and ultrasonic comparison value corresponding to the detection item in the at least one ultrasonic image model, and using software to set at least one and The detection range and optical comparison value of the optical image corresponding to the test item; (c) providing a test object; (d) capturing the ultrasonic image of the test object and the optical image of the test object, using at least one The ultrasonic imaging device captures the ultrasonic image of the measured object, and uses at least one digital camera to capture the optical image of the measured object; (e) compares the ultrasonic image of the measured object And the optical image of the object to be tested, the digital image information of the ultrasonic image of the object to be tested and the at least one ultrasonic image model according to the set ultrasonic image detection range and the ultrasonic comparison value through the software Digit Comparing the image information, and comparing the digital image information of the optical image of the measured object with the digital image information of the at least one optical image model through software according to the set optical image detection range and optical comparison value; (f) Output the comparison result.
據以,本發明之表面檢測方法,可透過比對被測物超音波圖像及被測物光學影像兩種結果的方式完達到表面檢測之目的,不但可以獲得準確的檢測結果,更可大幅縮短檢測時間,尤適合應用自動化連續加工製程。According to this, the surface detection method of the present invention can achieve the purpose of surface detection by comparing the two results of the ultrasonic image of the measured object and the optical image of the measured object, which can not only obtain accurate detection results, but also greatly Reduce the inspection time, especially suitable for the application of automatic continuous processing.
依據上述技術特徵,該至少一超音波圖像模型或該至少一光學影像模型係可以透過軟體建置而成;該超音波圖像模型及該光學影像模型係相對應於該被測物。According to the above technical features, the at least one ultrasonic image model or the at least one optical image model can be constructed by software; the ultrasonic image model and the optical image model are corresponding to the measured object.
依據上述技術特徵,該表面檢測方法,係在完成一對應於被測物之實體模型之後,利用至少一超音波成像設備擷取該實體模型之超音波圖像之後,完成該至少一超音波圖像模型。According to the above technical features, the surface detection method is to complete the at least one ultrasonic map after completing a solid model corresponding to the measured object, and using at least one ultrasonic imaging device to capture an ultrasonic image of the solid model. Like models.
依據上述技術特徵,該表面檢測方法,係在完成一對應於被測物之實體模型之後,利用至少一數位相機擷取該實體模型之光學影像之後,完成該至少一光學影像模型。According to the above technical features, the surface detection method is to complete the at least one optical image model after completing a physical model corresponding to the measured object, and using at least one digital camera to capture an optical image of the physical model.
依據上述技術特徵,該表面檢測方法,係在完成一對應於被測物之實體模型之後,利用至少一超音波成像設備擷取該實體模型之超音波圖像,透過軟體修飾完成該至少一超音波圖像模型。According to the above technical features, the surface detection method is to complete at least one ultrasound image of the solid model by using at least one ultrasonic imaging device after completing a solid model corresponding to the measured object, and modifying the at least one ultrasound by software. Sonic image model.
依據上述技術特徵,該表面檢測方法,係在完成一對應於被測物之實體模型之後,利用至少一數位相機擷取該實體模型之光學影像,透過軟體修飾完成該至少一光學影像模型。According to the above technical features, the surface detection method is to complete the at least one optical image model by using at least one digital camera to capture an optical image of the solid model after completing a solid model corresponding to the measured object, and modifying the software by software.
該表面檢測方法,在比對被測物超音波圖像及被測物光學影像時,係進一步將該至少一超音波圖像模型與被測物光學影像重疊的方式,以及將該至少一光學影像模型與被測物超音波圖像重疊的方式,進行交叉比對。The surface detection method, when comparing the ultrasonic image of the measured object and the optical image of the measured object, further superimposes the at least one ultrasonic image model and the optical image of the measured object, and the at least one optical The image model and the ultrasonic image of the test object are superimposed for cross-comparison.
該被測物係可為一停滯於一加工生產線上的產品或半成品。The object to be tested can be a product or a semi-finished product that is stuck on a processing line.
該被測物係為一於一加工生產線上移動的產品或半成品。The test object is a product or a semi-finished product moving on a processing production line.
該被測物係為一自一加工生產線上移出的產品或半成品。The test object is a product or a semi-finished product removed from a processing production line.
該表面檢測方法,透過至少一傳輸介面,將被測物超音波圖像比對結果及被測物光學影像比對結果輸出至該至少一傳輸介面所連接的至少一顯示裝置。In the surface detection method, the comparison result of the ultrasonic image of the measured object and the comparison result of the optical image of the measured object are output to at least one display device connected to the at least one transmission interface through at least one transmission interface.
該表面檢測方法,透過至少一傳輸介面,將被測物超音波圖像比對結果及被測物光學影像比對結果輸出至該至少一傳輸介面所連接的至少一控制裝置。In the surface detection method, the comparison result of the ultrasonic image of the measured object and the comparison result of the optical image of the measured object are output to at least one control device connected to the at least one transmission interface through at least one transmission interface.
該表面檢測方法,透過至少一傳輸介面,將被測物超音波圖像比對結果及被測物光學影像比對結果輸出至該至少一傳輸介面所連接的至少一顯示裝置及至少一控制裝置。In the surface detection method, the comparison result of the ultrasonic image of the measured object and the comparison result of the optical image of the measured object are output to at least one display device and at least one control device connected to the at least one transmission interface through at least one transmission interface. .
本發明所揭露的表面檢測方法,主要透過比對被測物超音波圖像及被測物光學影像兩種結果的方式完達到表面檢測目的,不但可以獲得準確的檢測結果,更可大幅縮短檢測時間,尤適合應用自動化連續加工製程,以相對更為積極、可靠之手段,避免問題產品連續性產出,以及監控生產線設備之妥善率。The surface detection method disclosed by the present invention mainly achieves the purpose of surface detection by comparing the two results of the ultrasonic image of the measured object and the optical image of the measured object, which not only can obtain accurate detection results, but also greatly shortens the detection. Time is particularly suitable for the application of automated continuous processing processes, in a relatively more active and reliable way, to avoid problematic product continuous output, and to monitor the proper rate of production line equipment.
本發明主要提供一種可以縮短檢測時間,尤適合應用自動化連續加工製程需求的表面檢測方法,請同時配合參照第1圖及第2圖所示,本發明之表面檢測方法,基本上至少包括下列步驟:The present invention mainly provides a surface detection method which can shorten the detection time and is particularly suitable for the requirements of an automated continuous processing process. Please refer to FIG. 1 and FIG. 2 at the same time. The surface detection method of the present invention basically includes at least the following steps :
(a)步驟S1係建立至少一超音波圖像模型及至少一光學影像模型;原則上,該至少一超音波圖像模型或該至少一光學影像模型係可以透過軟體建置而成;該超音波圖像模型及該光學影像模型係相對應於該被測物。(a) Step S1 is to establish at least one ultrasonic image model and at least one optical image model; in principle, the at least one ultrasonic image model or the at least one optical image model can be constructed by software; the ultrasound The sonic image model and the optical image model correspond to the measured object.
(b)步驟S2係設定檢測項目之範圍及比對值,係依照所需的檢測項目,透過軟體於該至少一超音波圖像模型當中設定至少一與檢測項目對應的超音波圖像檢測範圍及超音波比對值;利用軟體於該至少一光學影像模型當中設定至少一與檢測項目對應的光學影像檢測範圍及光學比對值。(b) Step S2 is to set the range and comparison value of the detection items. According to the required detection items, set at least one ultrasonic image detection range corresponding to the detection items in the at least one ultrasonic image model through software. And ultrasonic comparison value; using software to set at least one optical image detection range and optical comparison value corresponding to a detection item in the at least one optical image model.
(c)步驟S3係提供一被測物10;於實施時,該被測物係可以為一停滯於一加工生產線上的產品或半成品;該被測物10亦可以如圖所示,為一於一加工生產線20上移動的產品或半成品;當然,該被測物係可以為一自一加工生產線上移出的產品或半成品。(c) Step S3 provides a test object 10; when implemented, the test object may be a product or a semi-finished product that is stagnated on a processing production line; the test object 10 may also be a The product or semi-finished product moving on a processing production line 20; of course, the measured object can be a product or semi-finished product removed from a processing production line.
(d)步驟S4係擷取該被測物10之被測物超音波圖像及被測物光學影像;係可如圖所示,利用至少一超音波成像設備30擷取該被測物10之被測物超音波圖像,以及利用至少一數位相機40擷取該被測物10之被測物光學影像。(d) Step S4 is to capture the ultrasonic image of the measured object 10 and the optical image of the measured object; as shown in the figure, at least one ultrasonic imaging device 30 may be used to capture the measured object 10 An ultrasonic image of the object under test, and an optical image of the object under test 10 captured by at least one digital camera 40.
(e)步驟S5係比對被測物超音波圖像及被測物光學影像,係透過軟體50依照所設定之超音波圖像檢測範圍及超音波比對值,將該被測物超音波圖像之數位圖像資訊與該至少一超音波圖像模型之數位圖像資訊進行比對;以及,透過軟體50依照所設定之光學影像檢測範圍及光學比對值,將該被測物光學影像之數位影像資訊與該至少一光學影像模型之數位影像資訊進行比對。(e) Step S5 is to compare the ultrasonic image of the measured object and the optical image of the measured object. The software 50 uses the software 50 to detect the ultrasonic image according to the set ultrasonic image detection range and the ultrasonic comparison value. The digital image information of the image is compared with the digital image information of the at least one ultrasonic image model; and the software 50 is used to optically measure the object according to the set optical image detection range and optical comparison value through the software 50 The digital image information of the image is compared with the digital image information of the at least one optical image model.
(f)步驟S6係輸出比對結果;係可透過至少一傳輸介面60將被測物超音波圖像比對結果及被測物光學影像比對結果輸出至該至少一傳輸介面60所連接的裝置;於實施時,係可透過該至少一傳輸介面60連接至少一顯示裝置71,或者透過該至少一傳輸介面60連接至少一控制裝置72;當然,亦可如圖所示,透過該至少一傳輸介面60連接至少一顯示裝置71及至少一控制裝置72,除可利用顯示裝置71即時呈現比對結果之外,更可利用控制裝置72依照比對結果,即時對檢測有瑕疵的被測物10加以處置(例如移出生產線或加以剃除)。(f) Step S6 is to output the comparison result; it is possible to output the comparison result of the ultrasonic image of the test object and the comparison result of the optical image of the test object to at least one transmission interface 60 through at least one transmission interface 60. Device; during implementation, it can be connected to at least one display device 71 through the at least one transmission interface 60, or at least one control device 72 through the at least one transmission interface 60; of course, as shown in the figure, the at least one The transmission interface 60 is connected to at least one display device 71 and at least one control device 72. In addition to using the display device 71 to present the comparison result in real time, the control device 72 can also use the control device 72 to perform real-time detection of the flawed detected object according to the comparison result. 10 Disposal (such as removal from the production line or shaving).
本發明之表面檢測方法,在比對被測物超音波圖像時,係可如第3圖所示,透過軟體將該至少一超音波圖像模型A1(圖中以實線表示者)與被測物超音波圖像A2(圖中以虛線表示者)重疊的方式,比對出該至少一超音波圖像模型A1與被測物超音波圖像A2之差異;同樣的,在比對被測物光學影像像時,亦可透過軟體將該至少一光學影像模型與被測物光學影像重疊的方式,比對該至少一出光學影像模型與被測物光學影像之差異;當然,亦進一步將該至少一超音波圖像模型與被測物光學影像重疊的方式,以及將該至少一光學影像模型與被測物超音波圖像重疊的方式,進行交叉比對。In the surface detection method of the present invention, when comparing the ultrasonic image of the measured object, as shown in FIG. 3, the at least one ultrasonic image model A1 (represented by a solid line in the figure) and the The ultrasonic image A2 of the test object (indicated by a dashed line in the figure) is overlapped to compare the difference between the at least one ultrasonic image model A1 and the ultrasonic image A2 of the test object; similarly, in comparison When measuring the optical image of the test object, the software can also overlap the at least one optical image model with the optical image of the test object by comparing the difference between the at least one optical image model and the optical image of the test object; of course, also Further, a cross-comparison is performed on a manner in which the at least one ultrasonic image model is overlapped with the optical image of the measured object, and a manner in which the at least one optical image model is overlapped with the ultrasonic image of the measured object.
據以,本發明之表面檢測方法,可透過比對被測物超音波圖像及被測物光學影像兩種結果的方式完達到表面檢測之目的,不但可以獲得準確的檢測結果,更可大幅縮短檢測時間,進而能夠有效縮短隨機採樣間隔,甚至可逐一對產品或半成品進行檢測。尤適合應用於板材沖壓加工或無人工廠等自動化連續加工製程,以相對更為積極、可靠之手段,避免問題產品連續性產出,以及監控生產線設備之妥善率。According to this, the surface detection method of the present invention can achieve the purpose of surface detection by comparing the two results of the ultrasonic image of the measured object and the optical image of the measured object, which can not only obtain accurate detection results, but also greatly Shorten the detection time, which can effectively shorten the random sampling interval, and even detect one pair of products or semi-finished products. It is particularly suitable for automatic continuous processing processes such as sheet metal stamping or unmanned factories. It uses relatively more active and reliable means to avoid problematic product continuous output and monitors the availability of production line equipment.
再者,本發明之表面檢測方法,於實施時,係可在完成一對應於被測物之實體模型之後,利用至少一超音波成像設備擷取該實體模型之超音波圖像之後,完成該至少一超音波圖像模型;以及,在完成一對應於被測物之實體模型之後,利用至少一數位相機擷取該實體模型之光學影像之後,完成該至少一光學影像模型。Furthermore, the surface detection method of the present invention can be implemented after completing a solid model corresponding to the measured object, and then acquiring the ultrasonic image of the solid model by using at least one ultrasonic imaging device. At least one ultrasonic image model; and after completing a physical model corresponding to the measured object, using at least one digital camera to capture the optical image of the physical model, the at least one optical image model is completed.
本發明之表面檢測方法,亦可在完成一對應於被測物之實體模型之後,利用至少一超音波成像設備擷取該實體模型之超音波圖像,透過軟體修飾完成該至少一超音波圖像模型;以及,在完成一對應於被測物之實體模型之後,利用至少一數位相機擷取該實體模型之光學影像,透過軟體修飾完成該至少一光學影像模型。According to the surface detection method of the present invention, after completing a solid model corresponding to the measured object, at least one ultrasonic imaging device is used to capture an ultrasonic image of the solid model, and the at least one ultrasonic image is completed by software modification. An image model; and after completing a solid model corresponding to the measured object, at least one digital camera is used to capture the optical image of the solid model, and the at least one optical image model is completed by software modification.
值得一提的是,本發明表面檢測方法,在完成比對被測物超音波圖像及被測物光學影像之後,可進一步以建立資料庫之方式,紀錄所有比對結果,並且將比對所得之缺陷特徵加以命名,有助於進一步建立有效的缺陷判斷法則。It is worth mentioning that, after the surface detection method of the present invention completes the comparison between the ultrasonic image of the measured object and the optical image of the measured object, it can further establish a database to record all comparison results, and compare the results. The resulting defect features are named to help further establish an effective defect judgment rule.
具體而言,本發明所揭露的表面檢測方法,主要透過比對被測物超音波圖像及被測物光學影像兩種結果的方式完達到表面檢測目的,不但可以獲得準確的檢測結果,更可大幅縮短檢測時間,尤適合應用自動化連續加工製程,以相對更為積極、可靠之手段,避免問題產品連續性產出,以及監控生產線設備之妥善率。Specifically, the surface detection method disclosed in the present invention mainly achieves the purpose of surface detection by comparing the two results of the ultrasonic image of the measured object and the optical image of the measured object, which not only can obtain accurate detection results, but also It can greatly shorten the testing time, and is especially suitable for the application of automated continuous processing processes. By using relatively more positive and reliable methods, it can avoid problematic product continuous output and monitor the production line equipment's proper rate.
以上所述之實施例僅係為說明本發明之技術思想及特點,其目的在使熟習此項技藝之人士能夠瞭解本發明之內容並據以實施,當不能以之限定本發明之專利範圍,即大凡依本發明所揭示之精神所作之均等變化或修飾,仍應涵蓋在本發明之專利範圍內。The above-mentioned embodiments are only for explaining the technical ideas and characteristics of the present invention. The purpose is to enable those skilled in the art to understand the contents of the present invention and implement them accordingly. When the scope of the patent of the present invention cannot be limited, That is, any equivalent changes or modifications made in accordance with the spirit disclosed in the present invention should still be covered by the patent scope of the present invention.
S1‧‧‧(a)步驟S1‧‧‧ (a) Step
S2‧‧‧(b)步驟S2‧‧‧ (b) Step
S3‧‧‧(c)步驟S3‧‧‧ (c)
S4‧‧‧(d)步驟S4‧‧‧ (d) Step
S5‧‧‧(e)步驟S5‧‧‧ (e) Step
S6‧‧‧(f)步驟S6‧‧‧ (f) Step
A1‧‧‧超音波圖像模型A1‧‧‧ Ultrasonic Image Model
A2‧‧‧被測物超音波圖像A2‧‧‧ Ultrasonic image of the test object
10‧‧‧被測物10‧‧‧ Test object
20‧‧‧生產線20‧‧‧ Production Line
30‧‧‧超音波成像設備30‧‧‧ Ultrasonic imaging equipment
40‧‧‧數位相機40‧‧‧ digital camera
50‧‧‧軟體50‧‧‧Software
60‧‧‧傳輸介面60‧‧‧Transport interface
71‧‧‧顯示裝置71‧‧‧display device
72‧‧‧控制裝置72‧‧‧Control
第1圖係為本發明之基本流程圖。 第2圖係為本發明可能實施之被測物超音波圖像擷取方式及被測物光學影像擷取方式示意圖。 第3圖係為本發明當中被測物超音波圖像與超音波圖像模型之比對狀態示意圖。Fig. 1 is a basic flowchart of the present invention. FIG. 2 is a schematic diagram of a method of capturing an ultrasonic image of a measured object and a method of capturing an optical image of the measured object that may be implemented by the present invention. FIG. 3 is a schematic diagram of a comparison state between the ultrasonic image of the measured object and the ultrasonic image model in the present invention.
Claims (11)
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101251495A (en) * | 2007-11-19 | 2008-08-27 | 长春理工大学 | Method and apparatus for detecting internal surface of dry hollow reactor |
CN104614379A (en) * | 2013-11-04 | 2015-05-13 | 北京兆维电子(集团)有限责任公司 | Plate surface defect detection system and method |
CN106982550A (en) * | 2015-11-13 | 2017-07-25 | 韩国电气研究院 | The stereopsis generation method and system with optical image are imaged using multiple energies x-ray |
-
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101251495A (en) * | 2007-11-19 | 2008-08-27 | 长春理工大学 | Method and apparatus for detecting internal surface of dry hollow reactor |
CN104614379A (en) * | 2013-11-04 | 2015-05-13 | 北京兆维电子(集团)有限责任公司 | Plate surface defect detection system and method |
CN106982550A (en) * | 2015-11-13 | 2017-07-25 | 韩国电气研究院 | The stereopsis generation method and system with optical image are imaged using multiple energies x-ray |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113063789A (en) * | 2021-03-18 | 2021-07-02 | 山东建筑大学 | Shield tunnel segment interior micro-damage detection device and method |
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