TWI663828B - Sticky crystal device and manufacturing method of semiconductor device - Google Patents

Sticky crystal device and manufacturing method of semiconductor device Download PDF

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TWI663828B
TWI663828B TW106136621A TW106136621A TWI663828B TW I663828 B TWI663828 B TW I663828B TW 106136621 A TW106136621 A TW 106136621A TW 106136621 A TW106136621 A TW 106136621A TW I663828 B TWI663828 B TW I663828B
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waveform
command
jerk
acceleration
differential value
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TW201836258A (en
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楯充明
Mitsuaki Tate
小高峯裕司
Yuji Kodakamine
滝村康孝
Yasutaka Takimura
青木佑介
Yusuke Aoki
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日商捷進科技有限公司
Fasford Technology Co., Ltd.
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/18Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
    • G05B19/416Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by control of velocity, acceleration or deceleration
    • G05B19/4163Adaptive control of feed or cutting velocity
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67132Apparatus for placing on an insulating substrate, e.g. tape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67144Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67712Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrate being handled substantially vertically
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/36Nc in input of data, input key till input tape
    • G05B2219/36521Select by combination of detected force, acceleration, speed, work rate

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Human Computer Interaction (AREA)
  • Control Of Electric Motors In General (AREA)
  • Control Of Position Or Direction (AREA)
  • Die Bonding (AREA)

Abstract

本發明的課題是在於提供一種藉由抑制對於動作中的行進方向之振動或偏差,可縮短整定時間之馬達控制裝置及馬達控制方法。   其解決手段為:   黏晶裝置是具備:   馬達,其係驅動被驅動體,將實位置設為編碼訊號輸出;及   馬達控制裝置,其係控制前述馬達,將前述被驅動體控制至目標位置,把晶粒安裝於基板。   前述馬達控制裝置是具備:   理想波形產生部,其係產生加加速度微分值、加加速度、加速度、速度及位置的理想的指令波形;   指令波形產生部,其係讀出前述理想的指令波形,再產生目標指令位置、和加加速度微分值、加加速度、加速度、速度及位置的指令波形,將被再產生的速度的指令波形輸出;及   DAC,其係將前述被再產生的速度的指令波形變換成類比資料。An object of the present invention is to provide a motor control device and a motor control method capable of shortening a setting time by suppressing vibration or deviation in a traveling direction during operation. The solution is: The sticky crystal device is equipped with: Motor, which drives the driven body and sets the real position as the coded signal output; and a motor control device, which controls the motor and controls the driven body to the target position, Mount the die on the substrate. The aforementioned motor control device is provided with: an ideal waveform generating section which generates ideal command waveforms of jerk differential value, jerk, acceleration, speed and position; a command waveform generating section which reads the aforementioned ideal command waveform, and then Generate the target command position, and the jerk differential value, jerk, acceleration, speed and position command waveform, and output the command waveform of the reproduced speed; and DAC, which converts the aforementioned command waveform of the reproduced speed Analogy.

Description

黏晶裝置及半導體裝置的製造方法Sticky crystal device and manufacturing method of semiconductor device

[0001] 本案是有關黏晶裝置,例如可適用於具備馬達控制裝置的黏晶裝置。[0001] This case relates to a die attach device, which can be applied to, for example, a die attach device provided with a motor control device.

[0002] 在半導體裝置的製造工程的一部分,有將半導體晶片(以下簡稱晶粒)搭載於配線基板或導線架等(以下簡稱基板)而組合封裝的工程,在組合封裝的工程的一部分,有從半導體晶圓(以下簡稱晶圓)分割晶粒的工程,及將分割後的晶粒搭載於基板上的接合工程。被使用於接合工程的製造裝置有黏晶機等的黏晶裝置。   [0003] 黏晶機是以焊錫、鍍金、樹脂作為接合材料,將晶粒接合(搭載黏著)於基板或已被接合的晶粒上的裝置。在將晶粒例如接合於基板的表面之黏晶機中,利用被稱為夾頭的吸附噴嘴來從晶圓吸附晶粒而拾取,搬送至基板上,賦予推壓力,且加熱接合材,藉此進行接合的動作(作業)會被重複進行。夾頭是被安裝於接合頭的前端。接合頭是以ZY驅動軸等的驅動部(伺服馬達)來驅動,伺服馬達是藉由馬達控制裝置來控制。   在伺服馬達控制中,需要以不會使工件或支撐工件的單元承受機械性衝撃的方式順暢地加減速,移動工件。   [先前技術文獻]   [專利文獻]   [0004] [專利文獻1] 日本特開2012-175768號公報[0002] A part of a manufacturing process of a semiconductor device includes a process of mounting a semiconductor wafer (hereinafter referred to as a die) on a wiring substrate or a lead frame (hereinafter referred to as a substrate) and combining the packaging, and a part of the process of combining packaging includes A process of dividing a die from a semiconductor wafer (hereinafter referred to as a wafer) and a bonding process of mounting the divided die on a substrate. As a manufacturing apparatus used for the bonding process, there is a die attaching device such as a die attaching machine. [0003] A die bonder is a device that uses solder, gold plating, and resin as bonding materials to bond (attach) the crystals to the substrate or the bonded crystals. In a die-bonding machine that bonds crystal grains to the surface of a substrate, for example, a suction nozzle called a chuck is used to pick up the crystal grains from a wafer, pick them up, transfer them to the substrate, apply a pressing force, and heat the bonding material. This joining operation (work) is repeated. The chuck is attached to the front end of the joint head. The joint head is driven by a drive unit (servo motor) such as a ZY drive shaft, and the servo motor is controlled by a motor control device.伺服 In servo motor control, it is necessary to smoothly accelerate and decelerate the workpiece so that it does not subject the workpiece or the unit supporting the workpiece to mechanical shock. [Prior Art Document] [Patent Document] [0004] [Patent Document 1] Japanese Patent Laid-Open No. 2012-175768

(發明所欲解決的課題)   [0005] 專利文獻1是產生加加速度、加速度、速度及位置的理想的指令波形,以限制加加速度的指令波形來實現低振動的馬達控制,但在黏晶裝置等的半導體製造裝置是被要求更高精度的馬達控制。   [0006] 本案的課題是在於提供一種可更抑制振動的黏晶裝置。   其他的課題及新穎的特徵可由本說明書的記述及附圖明確得知。   (用以解決課題的手段)   [0007] 本案之中代表性者的概要簡單說明如下。   亦即,黏晶裝置是具備:   馬達,其係驅動被驅動體,將實位置設為編碼訊號輸出;及   馬達控制裝置,其係控制前述馬達,將前述被驅動體控制至目標位置,把晶粒安裝於基板。   前述馬達控制裝置是具備:   理想波形產生部,其係產生加加速度微分值、加加速度、加速度、速度及位置的理想的指令波形;   指令波形產生部,其係讀出前述理想的指令波形,再產生目標指令位置、和加加速度微分值、加加速度、加速度、速度及位置的指令波形,將被再產生的速度的指令波形輸出;及   DAC,其係將前述被再產生的速度的指令波形變換成類比資料。   [發明的效果]   [0008] 若根據上述黏晶裝置,則可減低振動。(Problems to be Solved by the Invention) [0005] Patent Document 1 is an ideal command waveform that generates jerk, acceleration, speed, and position, and realizes low-vibration motor control by limiting the command waveform of jerk. Other semiconductor manufacturing devices are required to have higher precision motor control. [0006] The object of the present invention is to provide a sticky crystal device which can further suppress vibration. Other problems and novel features can be clearly understood from the description of this specification and the drawings. (Means to Solve the Problem) [0007] The outline of the representative in this case is briefly explained as follows. That is, the crystal sticking device is provided with: a motor that drives the driven body and sets the real position as a coded signal output; and a motor control device that controls the motor, controls the driven body to the target position, and The particles are mounted on a substrate. The aforementioned motor control device is provided with: an ideal waveform generating section which generates ideal command waveforms of jerk differential value, jerk, acceleration, speed and position; a command waveform generating section which reads the aforementioned ideal command waveform, and then Generate the target command position, and the jerk differential value, jerk, acceleration, speed and position command waveform, and output the command waveform of the reproduced speed; and DAC, which converts the aforementioned command waveform of the reproduced speed Analogy. [Effects of the Invention] [0008] According to the above-mentioned sticky crystal device, vibration can be reduced.

[0010] 本案發明者為了抑制振動,不僅加加速度、加速度、速度及位置的理想的指令波形,還以加加速度的微分值最為指令值,檢討了抑制每單位時間的變化量之控制。但,為了產生上述般的指令波形,需要產生位置・速度・加速度・加加速度及更加上加加速度的微分波形的合計5種類的理想的指令波形,由於成為複雜的計算式,因此需要龐大的算出時間。   [0011] 實施形態的黏晶裝置是產生加加速度的指令波形,從加加速度的指令波形依序產生加速度・速度・位置的各指令波形。將被產生的位置的指令波形藉由移動平均法(規定一定的時間,一邊錯開範圍,一邊取平均)來產生移動平均後的位置的指令波形。從移動平均後的位置的指令波形依序產生速度・加速度・加加速度・加加速度微分值的移動平均後的各指令波形。   [0012] 藉由使用上述取得的移動平均後的指令波形來控制馬達,可實現更低振動的馬達驅動。   [0013] 另外,藉由指令波形的移動平均處理,全體的指令波形長會伸展,動作時間會變長,因此按照循環時間、接合精度等裝置的要求規格來調整移動平均時間為理想。例如,在高精度接合是擴大設定移動平均時間,順暢地使動作而低振動驅動。在高速接合是縮小設定移動平均時間,縮短動作時間,藉此高速驅動。   [0014] 若根據實施形態,則可抑制對於馬達高速動作時的行進方向之振動或偏差,實現整定時間縮短。並且,能以理想的軌跡來使馬達動作,而且,可經常監視現在的位置,因此容易使複數的軸同步而使動作。   [0015] 以下,利用圖面來說明有關實施例及變形例。但,在以下的說明中,有對於同一構成要素附上同一符號且省略重複說明的情形。另外,圖面為了使說明更明確,而相較於實際的形態,有時模式性地表示各部的寬度、厚度、形狀等,但終究只是其一例,並非限定本發明的解釋者。   [實施例]   [0016] 圖1是表示實施例的黏晶機的概略的上面圖。圖2是在圖1中由箭號A方向來看時,說明拾取頭及接合頭的動作的圖。   [0017] 黏晶機10是大致區分具有晶粒供給部1、拾取部2、中間平台部3、接合部4、搬送部5、基板供給部6、基板搬出部7及監視控制各部的動作的控制部8。Y軸方向為黏晶機10的前後方向,X軸方向為左右方向。晶粒供給部1會被配置於黏晶機10的前側,接合部4會被配置於後側。   [0018] 首先,晶粒供給部1是供給安裝於基板P的晶粒D。晶粒供給部1是具有:保持晶圓11的晶圓保持台12,及從晶圓11頂起晶粒D之以虛線所示的頂起單元13。晶粒供給部1是藉由未圖示的驅動手段來移動於XY方向,使拾取的晶粒D移動至頂起單元13的位置。   [0019] 拾取部2是具有:拾取晶粒D的拾取頭21,使拾取頭21移動於Y方向的拾取頭的Y驅動部23,及使夾頭22昇降、旋轉及X方向移動之未圖示的各驅動部。拾取頭21是具有將被頂起的晶粒D吸附保持於前端的夾頭22(圖2也參照),從晶粒供給部1拾取晶粒D,載置於中間平台31。拾取頭21是具有使夾頭22昇降、旋轉及X方向移動之未圖示的各驅動部。   [0020] 中間平台部3是具有:暫時性載置晶粒D的中間平台31,及用以識別中間平台31上的晶粒D的平台識別攝影機32。   [0021] 接合部4是從中間平台31拾取晶粒D,接合至被搬送而來的基板P上,或以在已被接合於基板P上的晶粒上層疊的形式接合。   接合部4是具有:   接合頭41,其係具備與拾取頭21同樣將晶粒D吸附保持於前端的夾頭42(圖2也參照);   Y驅動部43,其係使接合頭41移動於Y方向;   Z驅動部(未圖示),其係使接合頭41昇降(移動於Z方向);及   基板識別攝影機44,其係攝取基板P的位置識別標記(未圖示),識別接合位置。   藉由如此的構成,接合頭41是根據平台識別攝影機32的攝像資料來修正拾取位置・姿勢,從中間平台31拾取晶粒D,根據基板識別攝影機44的攝像資料來將晶粒D接合於基板P。   [0022] 搬送部5是具備:載置一片或複數片的基板P(在圖1是4片)的基板搬送托盤51,及基板搬送托盤51移動的托盤軌道52,具有並行而設的同一構造的第1、第2搬送部。基板搬送托盤51是以沿著托盤軌道52而設之未圖示的滾珠螺桿來驅動被設在基板搬送托盤51之未圖示的螺帽,藉此移動。   藉由如此的構成,基板搬送托盤51是在基板供給部6載置基板P,沿著托盤軌道52來移動至接合位置,接合後,移動至基板搬出部7,將基板P交給基板搬出部7。第1、第2搬送部是互相獨立驅動,在被載置於一方的基板搬送托盤51的基板P接合晶粒D中,另一方的基板搬送托盤51是將基板P搬出,返回至基板供給部6,進行載置新的基板P等的準備。   [0023] 利用圖3來說明有關控制系。圖3是表示圖1的黏晶機的控制系的概略構成的方塊圖。控制系80是具備控制部8,驅動部86,訊號部87及光學系88。控制部8是大致區分具有主要以CPU(Central Processor Unit)所構成的控制・運算裝置81,記憶裝置82,輸出入裝置83,匯流線84及電源部85。記憶裝置82是具有:以記憶處理程式等的RAM所構成的主記憶裝置82a,及以記憶控制所必要的控制資料或畫像資料等的HDD所構成的輔助記憶裝置82b。輸出入裝置83是具有:顯示裝置狀態或資訊等的監視器83a,輸入操作員的指示之觸控面板83b,操作監視器的滑鼠83c,及取入來自光學系88的畫像資料之畫像取入裝置83d。又,輸出入裝置83是具有:控制晶粒供給部1的XY平台(未圖示)或接合頭平台的Y驅動部43、Z軸驅動部等的驅動部86之馬達控制裝置83e,及從各種的感測器訊號或照明裝置等的開關等的訊號部87取入訊號或控制的I/O訊號控制裝置83f。在光學系88是含有晶圓識別攝影機24,平台識別攝影機32及基板識別攝影機44。控制・運算裝置81是經由匯流線84來取入必要的資料且運算,將資訊傳送至拾取頭21等的控制或監視器83a等。   [0024] 圖4是用以說明圖3的馬達控制裝置的基本的原理的方塊構成圖。馬達控制裝置83e是具備動作控制器210及伺服放大器220,控制伺服馬達130。動作控制器210是具備:進行理想的指令波形的產生處理之理想波形產生部211,指令波形產生部212及DAC(Digital to Analog Converter)213。伺服放大器220是具備速度迴路控制部221。理想波形產生部211是具備:第一波形產生部214,進行移動平均處理的移動平均處理部215及第二波形產生部216。   [0025] 如圖4所示般,馬達控制裝置83e是動作控制器210與伺服放大器220會成為閉環控制。因此,使用現在的指令位置與從伺服馬達130取得的實位置及實速度,以伺服放大器220的速度迴路控制部221來進行速度控制。但,速度迴路控制部221是一邊動作控制器210會取得來自伺服馬達130的實速度及實位置而限制加加速度微分值及加加速度,一邊再產生指令波形,藉此進行其速度控制。另外,理想波形產生部211及指令波形產生部212是例如以CPU(Central Processing Unit)及儲存CPU所實行的程式的記憶體來構成。   [0026] 例如,在圖4中,目標位置、目標速度、目標加速度、目標加加速度及移動平均時間是被給予動作控制器210。然後,在指令波形產生部212是實位置及實速度會作為編碼器訊號經由伺服放大器220或從伺服馬達130直接逐次輸入。   [0027] 動作控制器210的理想波形產生部211的第一波形產生部214是由從控制・運算裝置81輸入的加加速度、加速度、速度及位置的目標值來分別產生(a)指令加加速度波形(加加速度的第一指令波形),(b)指令加速度波形(加速度的第一指令波形),(c)指令速度波形(速度的第一指令波形),(d)指令位置波形(位置的第一指令波形),且將(d)指令位置波形輸出至移動平均處理部215。   [0028] 移動平均處理部215是將從第一波形產生部214輸出的指令位置波形予以移動平均處理,且將(d')移動平均後的指令位置波形(理想的位置的指令波形)輸出至第二波形產生部216。   [0029] 第二波形產生部216是由(d')理想的位置的指令波形來依序產生(c')移動平均後的指令速度波形(理想的指令速度波形),(b')移動平均後的指令加速度波形(理想的加速度的指令波形),(a')移動平均後的指令加加速度波形(理想的加加速度的指令波形),(e')移動平均後的指令加加速度微分值波形(理想的加加速度微分值的指令波形)而輸出至指令波形產生部212。所謂「理想的」是使用在意味一邊限制加加速度微分值,一邊抑制被控制對象的振動,以預定的處理時間來順暢地控制被控制對象。   [0030] 指令波形產生部212是根據從第二波形產生部216輸出的輸出訊號波形(從理想的位置的指令波形取得的現在的指令位置)及從伺服馬達130輸入的編碼器訊號(實位置),一邊限制加加速度微分值,一邊逐次再產生今後的指令速度波形,逐次輸出至DAC213。例如,指令波形產生部212是進行(1)指令波形輸出入處理,(2)編碼器訊號計數處理及(3)指令波形再生處理。   [0031] DAC213是將被輸入的數位的指令值變換成類比訊號的速度指令值,輸出至伺服放大器220的速度迴路控制部221。另外,編碼器訊號是在編碼器訊號計數器(後述的圖13等)以位置偏差量作為脈衝積蓄。   [0032] 伺服放大器220的速度迴路控制部221是按照從動作控制器210輸入的速度指令值及從伺服馬達130輸入的編碼器訊號來控制伺服馬達130的旋轉速度。   [0033] 伺服馬達130是以對應於從伺服放大器220的速度迴路控制部221輸入的旋轉速度的控制之旋轉速度來旋轉,將實位置及實速度設為編碼器訊號,輸出至伺服放大器220的速度迴路控制部221及動作控制器210的指令波形產生部212。   [0034] 另外,在圖4的實施例中,由伺服馬達130的計數值(旋轉次數及旋轉角度)算出接合頭等的被驅動體的實位置,根據被算出的實位置來算出實速度。但,亦可具備直接檢測出被驅動體的位置的位置檢測裝置,以該位置檢測裝置所檢測出的位置作為實位置。   [0035] 以下,詳細說明有關理想波形產生部、指令波形產生部。如上述般,理想波形產生部211是由加加速度、加速度、速度及位置的振幅值之目標加加速度(Jobj)、目標加速度(Aobj)、目標速度(Vobj)及目標位置(Pobj)來產生理想的指令波形。指令波形產生部212是進行指令輸出處理及指令波形再產生處理。此時,對指令波形(例如,加加速度微分值的指令波形)加算加進了偏差量的加加速度微分值加算波形,進行指令波形再產生處理。   [0036] 首先,利用圖5來說明有關理想波形產生部。圖5是用以說明在圖4的理想波形產生部的第一波形產生部所產生的指令波形的圖。圖5(a)是指令加加速度波形,圖5(b)是由指令加加速度波形產生的指令加速度波形,圖5(c)是由指令加速度波形產生的指令速度波形,圖5(d)是由指令加速度波形產生的指令位置。所謂指令位置是被驅動體的移動去處的位置。另外,橫軸是時間。   [0037] 第一波形產生部214是由目標加加速度(Jobj)產生指令加加速度波形(JDR)。由目標加速度(Aobj)及指令加加速度波形(JDR)的積分產生指令加速度波形(ADR)。由目標速度(Vobj)及指令加速度波形(ADR)的積分產生指令速度波形(VDR)。由目標位置(Pobj)及指令速度波形(VDR)的積分產生指令位置波形(PDR)。   [0038] 在圖5(a)中,n是輸出1脈衝的指令波形的指令輸出週期的次數,為8的倍數。如圖5所示般,驅動被移動體的馬達是被加加速度控制成為:從移動開始在最初的期間(T1)慢慢地被加速,在中央部的期間(T2)為定速度,在接近最終移動位置的期間(T3)慢慢地減速而停止。   [0039] 在本實施例中設為8的倍數,但當目標位置為正方向時,亦可設為加加速度指令值變化成正值、負值、負值、正值的波形,或當目標位置為正方向時,亦可設為加加速度指令值變化成正值、負值、正值的波形。這是因為當目標移動距離短時,變無加加速度指令值為0的區間。如此,若在加加速度波形不設加加速度成為0的部分,則n是亦可設為4的倍數。   [0040] 其次,在移動平均處理部的說明之前,以求取移動平均後的指令速度波形的程序為例,利用圖6~9來說明有關移動平均法。圖6~9是用以求取指令速度波形的移動平均的程序的圖。   [0041] 將指令波形的指定時間內的m個的指令的平均設為指令值,錯開n個來將其次的m個的指令的平均設為指令值,更錯開n個來將其次的m個的指令的平均設為指令值。予以在指令波形全體進行,結合被平均化的指令值而產生最終的指令波形。在圖6~9是m=8,n=1的例子。如圖6所示般,將移動平均前的指令速度波形的8個的指令速度VR1平均,算出移動平均後的速度指令值VA1。其次,如圖7所示般,錯開1個來將移動平均前的指令速度波形的8個的指令速度VR2平均,算出移動平均後的速度指令值VA2。其次,如圖8所示般,錯開1個來將移動平均前的指令速度波形的8個的指令速度VR3平均,算出移動平均後的速度指令值VA3。予以在指令速度波形VR的全體進行,結合被平均化的速度指令值而產生最終的指令速度波形VA。   [0042] 利用圖10來說明有關移動平均時間與指令波形形狀的關係。圖10是表示使移動平均時間變化時的各指令波形的形狀的圖。   [0043] 藉由指令波形的移動平均處理,全體的指令波形長會伸展,動作時間會變長,因此指定時間(移動平均時間)越長(m變大),動作時間越長。   [0044] 一旦移動平均時間變大,則各指令波形變遲鈍。另一方面,當移動平均時間為0秒時,加加速度微分值成移無限大,因此圖示不可能,無法求取加加速度微分波形。移動平均時間是例如可按照被黏晶機要求的接合精度或循環時間來設定。   [0045] 移動平均處理部215是如上述般藉由移動平均法(規定一定的時間,一邊錯開範圍,一邊取平均)來移動平均處理在第一波形產生部214所產生的指令位置波形(位置的指令波形),而產生移動平均後的指令位置波形(理想的位置的指令波形)。   [0046] 其次,利用圖11來說明有關第二波形產生部。圖11是用以說明在第二波形產生部產生的指令波形的圖。第二波形產生部216是藉由微分在移動平均處理部215產生的移動平均後的指令位置波形(理想的位置的指令波形(PD))來產生移動平均後的指令速度波形(理想的速度的指令波形(VD)。藉由微分指令速度波形(VD)來產生移動平均後的指令加速度波形(理想的加速度的指令波形(AD))。藉由微分指令加速度波形(AD)來產生移動平均後的指令加加速度波形(理想的加加速度的指令波形(JD))。藉由微分指令加加速度波形(JD)來產生移動平均後的加加速度微分值波形(理想的加加速度微分值的指令波形(ΔJD))。   [0047] 在圖11(e')中,n是輸出1脈衝的指令波形的指令輸出週期的次數,16的倍數。如圖11所示般,驅動被移動體的馬達是被加加速度微分值控制成為:從移動開始在最初的期間(T1)慢慢地被加速,在中央部的期間(T2)以定速度在接近最終移動位置的期間(T3)慢慢地減速而停止。   [0048] 在本實施例是設為16的倍數,但當目標位置為正方向時,亦可設為加加速度微分值的指令值變化成正值、負值、負值、正值、負值、正值、正值、負值的波形,或當目標位置為正方向時,亦可設為加加速度微分值的指令值變化成正值、負值、正值、負值、正值、負值的波形。這是因為目標移動距離短時,變無加加速度微分值的指令值為0的區間。如此,若在加加速度微分值波形不設加加速度微分值成為0的部分,則n是亦可設為8的倍數。   [0049] 其次,利用圖12~17來說明有關指令波形產生部。圖12是表示圖4的指令波形產生部的構成及往指令波形產生部的輸出入訊號的方塊圖。圖13是圖12的指令波形輸出入部及指令波形再產生處理部的控制方塊圖。圖14是用以說明加加速度微分值加算波形的圖。圖15是表示偏差量為1脈衝、2脈衝、4脈衝、8脈衝及16脈衝時各個被加算於補償用的加加速度微分值波形、加加速度波形、加速度波形及速度波形的圖。圖16是用以說明加加速度上限下限確認處理動作的圖。圖17是表示補償用的加加速度微分值波形算出後被再產生的指令波形的一例圖。橫軸是時間,縱軸是分別表示脈衝高度。   [0050] 如圖12所示般,指令波形產生部212是具備指令波形輸出入部410,指令波形再產生處理部420及編碼器訊號計數器430。   [0051] 其次,在圖13中,動作控制器210的第二波形產生部216是將指令加加速度微分值波形(ΔJD)、指令加加速度波形(JD)、指令加速度波形(AD)、指令速度波形(VD)及指令位置波形(PD)的脈衝輸出至指令波形產生部212的指令波形輸出入部410。   [0052] 另外,指令波形輸出入部410是保存在前回的指令輸出時序再產生的指令加加速度微分值波形(ΔJD'1 ~ΔJD'n )、指令加加速度波形(JD'1 ~JD'n )、在前回的指令輸出時序所被再產生的指令波形之中來自指令輸出週期1回部分前的指令加速度波形(AD'0 ~AD'n )、指令速度波形(VD'0 ~VD'n )及指令位置波形(PD'0 ~PD'n )。指令波形輸出入部410是將目標指令位置(PD'0 )及分別在前回的時序再產生的指令加加速度微分值波形(ΔJD'1 ~ΔJD'n )、指令加加速度波形(JD'1 ~JD'n )、來自指令輸出週期1回部分前的指令加速度波形(AD'0 ~AD'n-1 )、來自指令輸出週期1回部分前的指令速度波形(VD'0 ~VD'n-1 )及來自指令輸出週期1回部分前的指令位置波形(PD'0 ~PD'n-1 )輸出至指令波形產生部212的指令波形再產生處理部420的減算器421及加算器423~427。   [0053] 此時,指令波形產生部212的編碼器訊號計數器430是如圖12所示般,從伺服馬達130的編碼器計數值取得現在的實位置(PA0 ),輸出至減算器421。   [0054] 減算器421是從現在的目標指令位置(PD'0 )減去現在的實位置(PA0 )而算出偏差量(Perr),輸出至加加速度微分值加算波形產生部422。   [0055] 如圖14所示般,加加速度微分值加算波形產生部422是取樣間隔(TS)內,亦即以持有指令輸出週期(TC)的n回的指令來產生偏差量(Perr)將來會變成"0"之類的加加速度微分值波形(ΔC1 ~ΔCn )。在圖14中,K是脈衝寬,ΔJC是脈衝高度,n(自然數)是取樣間隔(TS)的指令次數,x(自然數)是n個的指令次數的指令位置(脈衝號碼(1≦x≦n))。   [0056] 例如,加加速度微分值波形(ΔC1 ~ΔCn )是在其次般的程序(1)~(3)產生。另外,在以下中,將位置偏差目標補償量設為P(以Perr作為P原封不動使用),將指令輸出週期設為TC,將偏差量補償目標時間設為TN,將偏差量補償目標指令輸出週期設為n回,將加加速度微分值波形的寬度設為K,將加加速度微分值加算波形的大小設為ΔJC進行說明。   [0057]   {程序(1)}   首先,如以下般,算出加加速度微分值波形的寬度(K)。   因為由TN>(TC×n)來固定加加速度微分值加算波形的形狀,所以n是設為16的倍數。   亦即,TN>(TC×16×K),加加速度微分值波形的寬度(K)是 K<(TN/(TC×16))。   [0058]   {程序(2)}   其次,由以下的式子來算出加加速度微分值加算波形的大小(ΔJC)。{程序(3)}   其次,產生加加速度微分值加算波形(ΔC1 ~ΔCn )。   用以補償偏差量的加加速度微分值加算波形(ΔC1 ~ΔCn )是形成如下記般。另外,在此,x是意思1~n的第x個的波形。   x/K≦1時,ΔCx =ΔJC   x/K≦2時,ΔCx =0   x/K≦3時,ΔCx =-ΔJC   x/K≦4時,ΔCx =0   x/K≦5時,ΔCx =-ΔJC   x/K≦6時,ΔCx =0   x/K≦7時,ΔCx =ΔJC   x/K≦8時,ΔCx =0   x/K≦9時,ΔCx =-ΔJC   x/K≦10時,ΔCx =0   x/K≦11時,ΔCx =ΔJC   x/K≦12時,ΔCx =0   x/K≦13時,ΔCx =-ΔJC   x/K≦14時,ΔCx =0   x/K≦15時,ΔCx =-ΔJC   x/K≦16時,ΔCx =0   例如,K=1時,加加速度微分值加算波形(ΔC1 ~ΔCn )是形成如以下般。   ΔC1 ~ΔCn ={ΔJC,0,-ΔJC,0,-ΔJC,0,ΔJC,0,-ΔJC,0,ΔJC,0,ΔJC,0,-ΔJC,0}   亦即,ΔC1 =ΔJC、ΔC2 =0、ΔC3 =-ΔJC、ΔC4 =0、ΔC5 =-ΔJC、ΔC6 =0、ΔC7 =ΔJC、ΔC8 =0、ΔC9 =-ΔJC、ΔC10 =0、ΔC11 =ΔJC、ΔC12 =0、ΔC13 =ΔJC、ΔC14 =0、ΔC15 =-ΔJC、ΔC16 =0。   [0059] 如圖15所示般,偏差量(P)越大,則用以補償偏差量(P)的加加速度微分值波形的高度(ΔJC)越大。   [0060] 其次,在圖13中,加加速度微分值加算波形產生部422是將加加速度微分值加算波形(ΔC1 ~ΔCn )輸出至加算器423。加算器423是加算加加速度微分值加算波形(ΔC1 ~ΔCn )與在前回的指令輸出時序產生的指令加加速度微分值波形(ΔJD'1 ~ΔJD'n ),而再產生指令輸出週期n回部分的所有指令加加速度微分值波形(JD''1 ~JD''n ),輸出至加加速度微分值限制部428及加算器424。   [0061] 例如,加算器423的輸出是成為ΔJD"1 =ΔJD'1 +ΔC1 ,ΔJD"2 =ΔJD'2 +ΔC2 ,ΔJD"3 =ΔJD'3 + ΔC3 ,~,ΔJD"n =ΔJD'n +ΔCn 。   [0062] 加算器424是加算被再產生的指令加加速度微分值波形(ΔJD"1 ~ΔJD"n )與在前回的指令輸出時序產生的指令加加速度波形(JD'1 ~JD'n ),而再產生指令輸出週期n回部分的所有指令加加速度波形(JD"1 ~JD"n ),輸出至加加速度微分值限制部428及加算器425。   [0063] 例如,加算器424的輸出是成為JD"1 =JD'1 + ΔJD'1 ,JD"2 =JD'2 +ΔJD'2 ,JD"3 =JD'3 +ΔJD'3 ,~,JD"n = JD'n +ΔJD'n 。   [0064] 加算器425是加算被再產生的指令加加速度波形(JD"1 ~JD"n )與在前回的指令輸出時序產生之來自指令輸出週期1回部分前的指令加速度波形(AD'0 ~AD'n-1 ),而再產生指令輸出週期n回部分的所有指令加速度波形(AD"1 ~AD"n ),輸出至加算器426及加加速度微分值限制部428。   [0065] 例如,加算器425的輸出是成為AD"1 =AD'0 +JD"1 ,AD"2 =AD'1 +JD"2 ,AD"3 =AD'2 +JD"3 ,~,AD"n =AD'(n-1) +JD"n 。   [0066] 加算器426是加算被再產生的指令加速度波形(AD"1 ~AD"n )與在前回的指令輸出時序產生之來自指令輸出週期1回部分前的指令速度波形(VD'0 ~VD'n-1 ),再產生指令輸出週期n回部分的所有指令加速度波形(VD"1 ~VD"n ),輸出至加算器427及加加速度微分值限制部428。   [0067] 例如,加算器426的輸出是成為VD"1 =VD'0 +AD"1 ,VD"2 =VD'1 +AD"2 ,VD"3 =VD'2 +AD"3 ,~,VD"n =VD'(n-1) +AD"n 。   [0068] 加算器427是加算被再產生的指令速度波形(VD"1 ~VD"n )與在前回的指令輸出時序產生之來自指令輸出週期1回部分前的指令位置波形(PD'0 ~PD'n-1 ),再產生指令輸出週期n回部分的所有指令位置波形(PD"1 ~PD"n ),輸出至加加速度微分值限制部428。   [0069] 例如,加算器427的輸出是成為PD"1 =PD'0 + VD"1 ,PD"2 =PD'1 +VD"2 ,PD"3=PD'2 +VD"3 ,~,PD"n = PD'(n-1) +VD"n 。   [0070] 而且,指令波形再產生處理部420是確認在加算器423~427所取得的各指令波形是否為範圍內。   加加速度微分值限制部428是利用圖16來確認有關被再產生的指令加加速度微分值波形(ΔJD"1 ~ΔJD"n )是否不超過上限(或下限)。在圖16中,加加速度微分值上限(ΔJmax)及加加速度微分值下限(-ΔJmax)是被預定。   [0071] 在圖16中,加算器423是將虛線圓701內的加加速度微分值加算波形加算於在前回的指令輸出時序產生的指令加加速度微分值波形(ΔJD'1 ~ΔJD'n )。亦即,加算波形脈衝(ΔC1 、ΔC2 、ΔC3 、ΔC4 、ΔC5 、ΔC6 、ΔC7 及ΔC8 )會被加算於以粗線所示的加加速度微分值波形(指令加加速度微分值波形(ΔJD"1 ~ΔJD"n ))。在前回修正的時序有修正,若再被加以修正,則有可能脈衝波形會低於加加速度微分值下限值(-ΔJmax)。   [0072] 此情況,加加速度微分值限制部428是檢測在現在時刻的脈衝波形(ΔC1 、ΔC2 、ΔC3 、ΔC4 、ΔC5 、ΔC6 、ΔC7 及ΔC8 )是(OK)否(NG)為處於上限(ΔJmax)與下限(-ΔJmax)之間,判定OK或NG,分歧輸出。例如,檢測在現在時刻是否波形(ΔC2 )為未滿上限(ΔJmax)(ΔJD"1 ~ΔJD"n < ΔJmax)。然後,若為否(NG),則將NG資訊輸出至指令波形復原部42C。又,若為OK,則檢測在現在時刻的波形(ΔC2 )是否超過下限(ΔJmax)(-ΔJmax<ΔJD"1 ~ΔJD"n )。然後,若為否(NG),則將NG資訊輸出至指令波形復原部42C。又,若為OK,則將指令加加速度微分值波形(ΔJD"1 ~ΔJD"n )、指令加加速度波形(JD"1 ~JD"n )、指令加速度波形(AD"1 ~AD"n )、指令速度波形(VD"1 ~VD"n )、及指令位置波形(PD"1 ~PD"n )輸出至加加速度限制部429。   [0073] 其次,在圖13中,加加速度限制部429是與加加速度微分值限制部428同樣,檢測在現在時刻的加加速度波形是否未滿上限(Jmax)(JD"1 ~JD"n <Jmax)。然後,若為否(NG),則將NG資訊輸出至指令波形復原部42C。又,若為OK,則檢測在現在時刻的波形是否為超過下限Jmax(-Jmax<JD"1 ~JD"n )。然後,若為否(NG),則將NG資訊輸出至指令波形復原部42C。又,若為OK,則將指令加加速度微分值波形(ΔJD"1 ~ΔJD"n )、指令加加速度波形(JD"1 ~JD"n )、指令加速度波形(AD"1 ~AD"n )、指令速度波形(VD"1 ~VD"n )及指令位置波形(PD"1 ~PD"n )輸出至加速度限制部42A。   [0074] 其次,在圖13中,加速度限制部42A是與加加速度微分值限制部428同樣,檢測在現在時刻的加速度波形是否為未滿上限(Amax) (AD"1 ~AD"n <Amax)。然後,若為否(NG),則將NG資訊輸出至指令波形復原部42C。又,若為OK,則檢測在現在時刻的波形是否超過下限(Amax) (-Amax<AD"1 ~AD"n )。然後,若為否(NG),則將NG資訊輸出至指令波形復原部42C。又,若為OK,則將指令加加速度微分值波形(ΔJD"1 ~ΔJD"n )、指令加加速度波形(JD"1 ~JD"n )、指令加速度波形(AD"1 ~AD"n )、指令速度波形(VD"1 ~VD"n )及指令位置波形(PD"1 ~PD"n )輸出至速度限制部42B。   [0075] 更在圖13中,速度限制部42B是與加加速度微分值限制部428同樣,檢測在現在時刻的速度波形是否未滿上限(Vmax) (VD"1 ~VD"n <Vmax)。然後,若為否(NG),則將NG資訊輸出至指令波形復原部42C。又,若為OK,則檢測在現在時刻的波形是否超過下限(Vmax) (-Vmax<VD"1 ~VD"n )。然後,若為否(NG),則將NG資訊輸出至指令波形復原部42C。又,若為OK,則將指令加加速度微分值波形(ΔJD"1 ~ΔJD"n )、指令加加速度波形(JD"1 ~JD"n )、指令加速度波形(AD"1 ~AD"n )、指令速度波形(VD"1 ~VD"n )及指令位置波形(PD"1 ~PD"n )輸出至指令波形輸出入部410。   [0076] 指令波形復原部42C是在NG資訊從加加速度微分值限制部428、加加速度限制部429、加速度限制部42A或速度限制部42B的任一個輸入時,復原前回的指令輸出時的指令波形,將全偏差量的修正留待至次回指令輸出時(上限與下限的確認處理)。亦即將復原後的前回的指令輸出時的指令波形輸出至指令波形輸出入部410。   [0077] 此後,在圖13中,以再產生的指令波形的ΔJD"1 ~ΔJD"n 、JD"1 ~JD"n 、AD"1 ~AD"n 、VD"1 ~VD"n 、及PD"1 ~PD"n 作為新的指令波形保存。   [0078] 指令波形的速度指令值(VD"1 ~VD"n )是如圖12所示般,從指令波形輸出入部410依序輸出至DAC213,DAC213是將依序類比變換後的速度指令值輸出至伺服放大器220。   [0079] 在圖12中,DAC213是將被輸入的速度指令值(VD"1 )變換成類比值而輸出至伺服放大器220。伺服放大器220是按照被輸入的類比資料來旋轉驅動伺服馬達130,且將伺服馬達130的旋轉位置(及旋轉速度)設為編碼器訊號,輸出至指令波形產生部212。   [0080] 從伺服馬達130輸出的編碼器訊號是被輸入至指令波形產生部212的編碼器訊號計數器430。   [0081] 編碼器訊號計數器430是將以預定的週期所計數的計數值(PA0 )輸出至指令波形再產生處理部420。   [0082] 在指令波形再產生處理部420中,減算器421會在其減算輸入端子輸入編碼器訊號計數器430所輸出的計數值(PA0 )。   [0083] 伺服放大器220是按照被輸入的速度指令值(VD"1 )來控制伺服馬達130。   [0084] 將全部的指令波形所被再產生的樣子顯示於圖17。細的實線是分別補償前的波形,從現在時刻起在指令加加速度微分值中加算補償用的加加速度微分值波形的期間之間,以粗的實線所示的波形來控制伺服馬達130。   [0085] 此結果,伺服馬達130會旋轉,藉由其旋轉,馬達以高速旋轉動作時,可抑制對於被驅動體的行進方向之振動或偏差,實現整定時間縮短。並且,能以理想的軌跡來使馬達動作,而且,可經常地監視現在的位置,因此可容易使複數的軸同步而使動作。   [0086] 另外,在圖17中,實位置波形可見比現在時刻更之前起偏差。這表示對於指令的波形,到現在時刻為止的偏差(位置偏差)。實際,以非常短的指令輸出週期的間隔來持續修正,因此無圖17程度顯著產生偏差的情形。在圖17中,為了強調表現位置被修正的樣子,而使現在時刻的實位置形成稍微偏離指令波形的位置。   [0087] 其次,利用圖18、19來說明有關馬達控制方法。圖18、19是用以說明馬達控制方法的動作的一例的程序的流程圖。   依據圖18、19來說明在指令輸出週期時序作成指令加加速度微分值波形(JD")、指令加加速度波形(JD")、指令加速度波形(AD")、指令速度波形(VD")、及指令位置波形(PD")的程序。   在步驟S601中,從編碼器計數值取得現在的實位置(PA0 )。   在步驟S602中,從實位置(PA0 )及現在的指令位置(PD'0 )算出偏差量(Perr)。   在步驟S603中,在指令輸出週期n回,產生偏差量(Perr)將來會變成"0"之類的加加速度微分值加算波形(ΔC1 ~ΔCn )。   [0088] 在步驟S604中,將加加速度微分值加算波形(ΔC1 ~ΔCn )加算於指令加加速度微分值波形(ΔJD'1 ~ΔJD'n ),再產生指令輸出週期n回部分的所有指令加加速度微分值波形(ΔJD"1 ~ΔJD"n )。   在步驟S605中,將再產生的指令加加速度微分值波形(ΔJD"1 ~ΔJD"n )加算於指令加加速度波形(JD'1 ~JD'n ),再產生指令輸出週期n回部分的所有指令加加速度波形(JD"1 ~JD"n )。   在步驟S606中,從來自指令輸出週期1回部分前的指令加速度波形(AD'0 ~AD'n-1 )及再產生的指令加加速度波形(JD"1~JD"n )來再產生指令輸出週期n回部分的所有指令加速度波形(AD"1 ~AD"n )。   在步驟S607中,以和指令加速度波形(AD"1 ~AD"n )的再產生(步驟S606)同樣的方法來再產生指令速度波形(VD"1 ~VD"n )。   在步驟S608中,以和指令加速度波形(AD"1 ~AD"n )的再產生(步驟S606)或指令速度波形(VD"1 ~VD"n )的再產生(步驟S607)同樣的方法來再產生指令位置波形(PD"1 ~PD"n )。   [0089] 在步驟S609中,確認再產生的加加速度微分值波形(ΔJD"1 ~ΔJD"n )是否未滿上限(ΔJmax)。超過上限(ΔJmax)時是將處理移行至步驟S614,未滿上限時是將處理移行至步驟S610。   在步驟S610中,確認再產生的加加速度波形(JD"1 ~JD"n )是否未滿上限(Jmax)。超過上限(Jmax)時是將處理移行至步驟S614,未滿上限時是將處理移行至步驟S611。   在步驟S611中,確認再產生的加速度波形(AD"1 ~AD"n )是否未滿上限(Amax)。超過上限(Amax)時是將處理移行至步驟S614,未滿上限時是將處理移行至步驟S612。   在步驟S612中,確認再產生的速度波形(VD"1 ~VD"n )是否未滿上限(Vmax)。超過上限(Vmax)時是將處理移行至步驟S614,未滿上限時是將處理移行至步驟S613。   [0090] 在步驟S613中,以再產生的指令加加速度微分值波形(ΔJD"1 ~ΔJD"n )、指令加加速度波形(JD"1 ~JD"n )、指令加速度波形(AD"1 ~AD"n )、指令速度波形(VD"1 ~VD"n )及指令位置波形(PD"1 ~PD"n )作為新的指令波形保存。   在步驟S615中,使次回的速度指令值(VD"1 ~VD"n )從DAC312輸出,終了圖17,18的處理,移行至其次的指令輸出週期時序的動作。   [0091] 在步驟S614中,將再產生指令波形以前回的指令波形來復原,將處理移行至步驟S615。亦即,使用前回的指令加加速度微分值波形(ΔJD'1 ~ΔJD'n )作為指令加加速度微分值波形(ΔJD"1 ~ΔJD"n )。使用前回的指令加加速度波形(JD'1 ~JD'n )作為指令加加速度波形(JD"1 ~JD"n )。又,使用前回的指令加速度波形(AD'1 ~AD'n )作為指令加速度波形(AD"1 ~AD"n )。又,亦使用前回的指令速度波形(VD'1 ~VD'n )作為指令速度波形(VD"1 ~VD"n )。又,使用前回的指令位置波形(PD'1 ~PD'n )作為指令位置波形(PD"1 ~PD"n )。   [0092] 其次,利用圖20來說明有關使用實施例的黏晶機之半導體裝置的製造方法。圖20是表示半導體裝置的製造方法的流程圖。   步驟S11:將保持貼附有從晶圓11分割的晶粒D的切割膠帶16之晶圓環14儲存於晶圓盒(未圖示),搬入至黏晶機10。控制部8是從充填有晶圓環14的晶圓盒供給晶圓環14至晶粒供給部1。並且,準備基板P,搬入至黏晶機10。控制部8是在基板供給部6將基板P載置於基板搬送托盤51。   [0093] 步驟S12:   控制部8是從晶圓拾取分割後的晶粒。   步驟S13:控制部8是將拾取後的晶粒搭載於基板P上或層疊於已接合的晶粒上。控制部8是將從晶圓11拾取後的晶粒D載置於中間平台31,以接合頭41從中間平台31再度拾取晶粒D,接合於被搬送來的基板P。   [0094] 步驟S14:控制部8是在基板搬出部7從基板搬送托盤51取出接合有晶粒D的基板P。從黏晶機10搬出基板P。   [0095]   <變形例>   以下,有關代表性的變形例是舉幾個例子。在以下的變形例的說明中,對於具有與在上述的實施例說明者同樣的構成及機能的部分是可使用與上述的實施例同樣的符號。然後,有關如此的部分的說明是可在技術上不矛盾的範圍內適當援用上述的實施例的說明。並且,上述的實施例的一部分及複數的變形例的全部或一部分可在技術上不矛盾的範圍內適當地複合適用。   [0096]   (變形例1)   圖21是表示變形例1的指令波形輸出入部及指令波形再產生處理部的構成的方塊圖。   在上述實施例中,指令波形復原部42C會將前回的指令波形復原,但亦可如圖21所示般,在變形例1中,指令波形再產生處理部420輸出NG資訊,指令波形輸出入部410按照NG資訊,以保存的前回的指令波形作為現在的指令波形復原。   [0097]   (變形例2)   在實施例中說明有關旋轉的馬達(伺服馬達),但在旋轉的馬達以外的線性馬達也可適用。具體而言,在圖4中,將伺服馬達130置換成線性馬達(以下稱為變形例2的馬達控制裝置)。伺服放大器220的速度迴路控制部221是按照從動作控制器210輸入的速度指令值及從線性馬達輸入的編碼器訊號來控制線性馬達的移動速度。   [0098] 線性馬達是以對應於從伺服放大器220的速度迴路控制部221輸入的移動速度的控制之移動速度來移動,將實位置及實速度設為編碼器訊號來輸出至伺服放大器220的速度迴路控制部221及動作控制器210的指令波形產生部212。   [0099] 另外,在變形例2的馬達控制裝置中,從線性馬達的計數值算出被驅動體的實位置,根據被算出的實位置來算出實速度。但,亦可具備直接檢測出被驅動體的位置的位置檢測裝置,以該位置檢測裝置所檢測出的位置作為實位置。   [0100] 例如,在變形例2的馬達控制裝置中,DAC213是將被輸入的速度指令值(VD"1 )變換成類比值而輸出至伺服放大器220。伺服放大器220是按照被輸入的類比資料來驅動線性馬達,且以線性馬達的移動位置(及移動速度)作為編碼器訊號,輸出至指令波形產生部212。   [0101] 從線性馬達輸出的編碼器訊號是被輸入至指令波形產生部212的編碼器訊號計數器430。   [0102] 編碼器訊號計數器430是將以預定的週期所計數的計數值PA0 輸出至指令波形再產生處理部420。   [0103] 在指令波形再產生處理部420中,減算器421會將編碼器訊號計數器430所輸出的計數值(PA0 )輸入至其減算輸入端子。全部的指令波形被再產生的樣子是與圖17同樣。   [0104] 此結果,線性馬達移動,藉由其移動,線性馬達以高速移動動作時,可抑制對於被驅動體的行進方向之振動或偏差,實現整定時間縮短。並且,可以理想的軌跡來使線性馬達動作,而且,可經常地監視現在的位置,因此容易使複數的軸同步而使動作。   進一步,在具有編碼器計數機能的馬達等馬達全體也可適用。   [0105] 以上,根據實施形態、實施例及變形例來具體說明本發明者所研發的發明,但本發明是不限於上述實施形態、實施例及變形例,當然可實施各種變更。   例如,在實施例中,指令波形輸出入部是輸出速度指令值來控制馬達。但,亦可取代速度指令值,輸出加速度指令值來控制馬達。其結果,不僅位置的控制,荷重控制也成為可能。   又,實施例是分別具備1個拾取頭及接合頭,但分別為2個以上。又,實施例是具備中間平台,但亦可無中間平台。此情況,拾取頭及接合頭是亦可兼用。   又,實施例是以晶粒的表面為上進行接合,但亦可拾取晶粒後使晶粒的表背反轉,以晶粒的背面為上進行接合。此情況,中間平台是亦可不設。此裝置是稱為覆晶焊接器(Flip Chip Bonder)。[0010] In order to suppress vibration, not only the ideal command waveform of jerk, acceleration, speed, and position, but also the differential value of jerk as the command value, reviewed the control to suppress the amount of change per unit time. However, in order to generate the above-mentioned command waveform, it is necessary to generate a total of five types of ideal command waveforms including position, velocity, acceleration, jerk and differential waveforms with higher jerk. Since it is a complex calculation formula, it requires a huge calculation time. [0011] The sticky crystal device according to the embodiment generates a command waveform of jerk, and sequentially generates command waveforms of acceleration, velocity, and position from the command waveform of jerk. The command waveform of the generated position is generated by a moving average method (predetermining a certain period of time and averaging while shifting the range). From the command waveform of the position after moving average, each command waveform after moving average of velocity, acceleration, jerk, and acceleration differential value is sequentially generated. [0012] By controlling the motor using the command waveform obtained by the moving average obtained as described above, motor driving with lower vibration can be realized. [0013] In addition, with the moving average processing of the command waveform, the overall command waveform length is extended, and the operation time becomes longer. Therefore, it is desirable to adjust the moving average time in accordance with the required specifications of the device such as cycle time and joining accuracy. For example, in high-precision joining, the moving average time is set to be extended, and the operation is smoothly performed with low vibration driving. In high-speed engagement, the moving average time is shortened and the operating time is shortened, thereby driving at high speed. [0014] According to the embodiment, it is possible to suppress vibration or deviation in the traveling direction during high-speed operation of the motor, and to shorten the setting time. In addition, since the motor can be operated with an ideal trajectory and the current position can be constantly monitored, it is easy to synchronize a plurality of axes to operate. [0015] Hereinafter, the embodiments and modifications will be described using drawings. However, in the following description, the same components are denoted by the same reference numerals, and redundant descriptions may be omitted. In addition, in order to make the description clearer, the width, thickness, shape, and the like of each part may be schematically shown in comparison with the actual form in the drawings. However, it is only an example and does not limit the interpreter of the present invention. [Embodiment] [0016] FIG. 1 is a top view showing an outline of a die attacher of an embodiment. FIG. 2 is a diagram illustrating the operation of the pickup head and the bonding head when viewed from the direction of arrow A in FIG. 1. [0017] The die sticking machine 10 roughly distinguishes operations including the die supply section 1, the picking section 2, the intermediate stage section 3, the joint section 4, the transfer section 5, the substrate supply section 6, the substrate carry-out section 7, and the monitoring and control sections. Control section 8. The Y-axis direction is the front-back direction of the die attach machine 10, and the X-axis direction is the left-right direction. The die supply section 1 is arranged on the front side of the die attacher 10, and the bonding section 4 is arranged on the rear side. [0018] First, the crystal grain supply unit 1 supplies the crystal grains D mounted on the substrate P. The die supply unit 1 includes a wafer holding table 12 that holds a wafer 11, and an ejection unit 13 shown by a broken line in which the die D is ejected from the wafer 11. The die supply unit 1 is moved in the XY direction by a driving means (not shown), and the picked-up die D is moved to the position of the jack unit 13. [0019] The picking section 2 is a Y driving section 23 having a picking head 21 that picks up the die D, a picking head 21 that moves the picking head 21 in the Y direction, and lifting, rotating, and moving the chuck 22 in the X direction. Shown each drive section. The pick-up head 21 is a chuck 22 (see also FIG. 2) that holds and holds the jacked-up crystal grains D at the front end, picks up the crystal grains D from the crystal grain supply unit 1, and places them on the intermediate stage 31. The pick-up head 21 includes drive units (not shown) for raising, lowering, rotating, and moving the chuck 22 in the X direction. [0020] The intermediate stage unit 3 includes an intermediate stage 31 on which the die D is temporarily placed, and a stage identification camera 32 for identifying the die D on the intermediate stage 31. [0021] The bonding portion 4 picks up the die D from the intermediate platform 31, and joins it to the transferred substrate P, or joins it in a laminated form on the die that has been bonded to the substrate P. The joint portion 4 includes a joint head 41 including a chuck 42 (also referred to in FIG. 2) that holds and holds the crystal grain D on the front end in the same manner as the pickup head 21; and a Y driving portion 43 that moves the joint head 41 to Y direction; Z drive unit (not shown) for raising and lowering the bonding head 41 (moving in the Z direction); and a substrate recognition camera 44 for picking up the position identification mark (not shown) of the substrate P to recognize the bonding position . With this configuration, the bonding head 41 corrects the pickup position and posture based on the imaging data of the platform recognition camera 32, picks up the die D from the intermediate platform 31, and bonds the die D to the substrate based on the imaging data of the substrate recognition camera 44. P. [0022] The transfer unit 5 includes a substrate transfer tray 51 on which one or a plurality of substrates P (four in FIG. 1) are placed, and a tray rail 52 in which the substrate transfer tray 51 is moved, and has the same structure provided in parallel. The first and second transfer sections. The substrate transfer tray 51 is moved by driving a nut (not shown) provided on the substrate transfer tray 51 with a ball screw (not shown) provided along the tray rail 52. With this configuration, the substrate transfer tray 51 mounts the substrate P on the substrate supply unit 6 and moves to the bonding position along the tray rail 52. After the bonding, the substrate transfer tray 51 is moved to the substrate transfer unit 7 and the substrate P is transferred to the substrate transfer unit. 7. The first and second transfer units are driven independently of each other, and among the substrate P bonding die D placed on one substrate transfer tray 51, the other substrate transfer tray 51 carries the substrate P out and returns to the substrate supply unit. 6. Prepare for placing a new substrate P and the like. [0023] The control system will be described using FIG. 3. FIG. 3 is a block diagram showing a schematic configuration of a control system of the die bonder of FIG. 1. The control system 80 includes a control unit 8, a driving unit 86, a signal unit 87, and an optical system 88. The control unit 8 is roughly divided into a control unit 81 including a CPU (Central Processor Unit), a memory device 82, an input / output device 83, a bus 84, and a power supply unit 85. The memory device 82 includes a main memory device 82a constituted by a RAM such as a memory processing program, and an auxiliary memory device 82b constituted by an HDD such as control data or image data necessary for memory control. The input / output device 83 includes a monitor 83a for displaying device status or information, a touch panel 83b for inputting an operator's instruction, a mouse 83c for operating the monitor, and an image acquisition for acquiring image data from the optical system 88.入 装置 83d. The input / output device 83 is a motor control device 83e including a drive section 86 that controls an XY stage (not shown) of the die supply unit 1 or a Y drive section 43 and a Z-axis drive section of the bonding head stage, and a slave The signal unit 87 such as various sensor signals or switches such as lighting devices takes in signals or an I / O signal control device 83f to be controlled. The optical system 88 includes a wafer identification camera 24, a stage identification camera 32, and a substrate identification camera 44. The control / calculation device 81 fetches necessary data via the bus line 84 and performs calculation, and transmits the information to the control of the pickup head 21 or the like or the monitor 83a or the like. [0024] FIG. 4 is a block configuration diagram for explaining a basic principle of the motor control device of FIG. 3. The motor control device 83e includes an operation controller 210 and a servo amplifier 220, and controls the servomotor 130. The motion controller 210 includes an ideal waveform generation unit 211 that performs an ideal command waveform generation process, an instruction waveform generation unit 212, and a DAC (Digital to Analog Converter) 213. The servo amplifier 220 includes a speed loop control unit 221. The ideal waveform generating unit 211 includes a first waveform generating unit 214, a moving average processing unit 215 that performs moving average processing, and a second waveform generating unit 216. [0025] As shown in FIG. 4, the motor control device 83e is such that the motion controller 210 and the servo amplifier 220 become closed-loop control. Therefore, the speed control is performed by the speed loop control unit 221 of the servo amplifier 220 using the current commanded position and the real position and real speed obtained from the servo motor 130. However, the speed loop control unit 221 controls the speed by generating a command waveform while the motion controller 210 obtains the real speed and the real position from the servo motor 130 and limits the jerk differential value and jerk, and then generates a command waveform. The ideal waveform generation unit 211 and the instruction waveform generation unit 212 are configured by, for example, a CPU (Central Processing Unit) and a memory storing a program executed by the CPU. [0026] For example, in FIG. 4, the target position, the target speed, the target acceleration, the target jerk, and the moving average time are given to the motion controller 210. Then, the real position and the real speed in the command waveform generation unit 212 are directly input as the encoder signals through the servo amplifier 220 or the servo motor 130 one by one. [0027] The first waveform generation unit 214 of the ideal waveform generation unit 211 of the motion controller 210 generates (a) commanded acceleration from target values of jerk, acceleration, velocity, and position input from the control unit 81. Waveform (first command waveform of acceleration), (b) command acceleration waveform (first command waveform of acceleration), (c) command speed waveform (first command waveform of speed), (d) command position waveform (position of (First command waveform), and output the (d) command position waveform to the moving average processing unit 215. [0028] The moving average processing unit 215 performs moving average processing on the command position waveform output from the first waveform generating unit 214, and outputs the command position waveform (command waveform of an ideal position) after (d ') moving average to The second waveform generating section 216. [0029] The second waveform generating unit 216 sequentially generates (c ') a command speed waveform (ideal command speed waveform) after moving average from the command waveform at the ideal position (d'), and (b ') the moving average. Command acceleration waveform (ideal acceleration command waveform), (a ') command jerk waveform (ideal acceleration command waveform) after moving average, (e') command jerk differential value waveform after moving average (Command waveform of an ideal jerk differential value) is output to the command waveform generation unit 212. The so-called "ideal" is to restrict the vibration of the controlled object while limiting the jerk differential value, and smoothly control the controlled object with a predetermined processing time. [0030] The command waveform generation unit 212 is based on the output signal waveform (the current command position obtained from the ideal position command waveform) output from the second waveform generation unit 216 and the encoder signal (real position) input from the servo motor 130. ), While limiting the jerk differential value, it will generate the future command speed waveform one by one and output it to the DAC213 one by one. For example, the instruction waveform generation unit 212 performs (1) instruction waveform input / output processing, (2) encoder signal count processing, and (3) instruction waveform reproduction processing. [0031] The DAC 213 is a speed command value that converts an input digital command value into an analog signal, and outputs the speed command value to the servo amplifier 220. The encoder signal is accumulated in the encoder signal counter (refer to FIG. 13 and the like described later) using a position deviation amount as a pulse. [0032] The speed loop control unit 221 of the servo amplifier 220 controls the rotation speed of the servo motor 130 in accordance with a speed command value input from the motion controller 210 and an encoder signal input from the servo motor 130. [0033] The servo motor 130 rotates at a rotation speed corresponding to the control of the rotation speed input from the speed loop control section 221 of the servo amplifier 220, sets the real position and the real speed as encoder signals, and outputs the signals to the servo amplifier 220. The speed loop control unit 221 and the command waveform generation unit 212 of the motion controller 210. [0034] In the embodiment of FIG. 4, the real position of the driven body such as the joint head is calculated from the count value (the number of rotations and the rotation angle) of the servo motor 130, and the real speed is calculated from the calculated real position. However, a position detection device that directly detects the position of the driven body may be provided, and the position detected by the position detection device may be used as the real position. [0035] Hereinafter, the ideal waveform generation unit and the command waveform generation unit will be described in detail. As described above, the ideal waveform generating unit 211 generates ideals from the target jerk (Jobj), target acceleration (Aobj), target speed (Vobj), and target position (Pobj) of the jerk, acceleration, velocity, and position amplitude values. Command waveform. The instruction waveform generation unit 212 performs instruction output processing and instruction waveform reproduction processing. At this time, the command waveform (for example, the command waveform of the jerk differential value) is added to the jerk differential value addition waveform added with the deviation amount, and the command waveform regeneration processing is performed. [0036] First, the ideal waveform generation unit will be described using FIG. 5. FIG. 5 is a diagram for explaining a command waveform generated by a first waveform generating section of the ideal waveform generating section of FIG. 4. Figure 5 (a) is the command jerk waveform, Figure 5 (b) is the command acceleration waveform generated by the command jerk waveform, Figure 5 (c) is the command speed waveform generated by the command acceleration waveform, and Figure 5 (d) is The command position generated by the command acceleration waveform. The command position is a position where the driven body moves. The horizontal axis is time. [0037] The first waveform generating section 214 generates a commanded jerk waveform (JDR) from the target jerk (Jobj). The command acceleration waveform (ADR) is generated by integrating the target acceleration (Aobj) and the command jerk waveform (JDR). The command speed waveform (VDR) is generated by integrating the target speed (Vobj) and the command acceleration waveform (ADR). The command position waveform (PDR) is generated by integrating the target position (Pobj) and the command speed waveform (VDR). [0038] In FIG. 5 (a), n is the number of command output cycles for outputting a command waveform of one pulse, which is a multiple of eight. As shown in FIG. 5, the motor that drives the moving body is controlled by jerk: it is gradually accelerated in the initial period (T1) from the beginning of the movement, and the period (T2) in the center is a constant speed and is approaching The period (T3) of the final movement position is slowly decelerated and stopped. [0039] In this embodiment, it is set to a multiple of 8, but when the target position is in the positive direction, it can also be set to a waveform in which the jerk command value changes to a positive value, a negative value, a negative value, a positive value, or when the target When the position is in the positive direction, a waveform in which the jerk command value changes to a positive value, a negative value, or a positive value can also be set. This is because when the target moving distance is short, the zone without the jerk command value becomes 0. In this way, if the portion where the jerk becomes 0 is not provided in the jerk waveform, n is a multiple of four. [0040] Next, before the description of the moving average processing unit, a moving average method will be described using a program for obtaining a command speed waveform after moving average as an example, using FIGS. 6 to 9. 6 to 9 are diagrams of a program for obtaining a moving average of a command speed waveform. [0041] Let the average of m instructions within a specified time of the instruction waveform be the instruction value, stagger n to set the average of the next m instructions to be the instruction value, and stagger n to make the next m The average of the commands is set to the command value. This is performed on the entire command waveform, and the averaged command value is combined to generate a final command waveform. Examples of m = 8 and n = 1 are shown in Figures 6-9. As shown in FIG. 6, the eight command speeds VR1 of the command speed waveform before the moving average are averaged, and the speed command value VA1 after the moving average is calculated. Next, as shown in FIG. 7, one command is shifted to average eight command speeds VR2 of the command speed waveform before the moving average, and the speed command value VA2 after the moving average is calculated. Next, as shown in FIG. 8, one command is shifted to average eight command speeds VR3 of the command speed waveform before the moving average, and the speed command value VA3 after the moving average is calculated. This is performed over the entire command speed waveform VR, and the averaged speed command value is combined to generate the final command speed waveform VA. [0042] The relationship between the moving average time and the shape of the command waveform will be described using FIG. 10. FIG. 10 is a diagram showing the shape of each command waveform when the moving average time is changed. [0043] By moving average processing of the command waveform, the overall command waveform length is extended, and the operation time becomes longer. Therefore, the longer the specified time (moving average time) (m becomes larger), the longer the operation time. [0044] When the moving average time becomes larger, each command waveform becomes dull. On the other hand, when the moving average time is 0 seconds, the jerk differential value becomes infinitely large, so the illustration is impossible, and the jerk differential waveform cannot be obtained. The moving average time can be set, for example, according to the joining accuracy or cycle time required by the die attacher. [0045] As described above, the moving average processing unit 215 uses the moving average method (predetermines a certain time, and shifts the range while averaging) to perform moving average processing on the command position waveform (position) generated by the first waveform generation unit 214. Command waveform), and a moving average command position waveform (the ideal position command waveform) is generated. [0046] Next, the second waveform generation unit will be described with reference to FIG. 11. FIG. 11 is a diagram for explaining a command waveform generated by a second waveform generating unit. The second waveform generating unit 216 generates a moving average command speed waveform (ideal speed of the desired speed) by differentiating the moving average command position waveform (the ideal position command waveform (PD)) generated by the moving average processing unit 215. Command waveform (VD). The differential command speed waveform (VD) is used to generate a moving average command acceleration waveform (the ideal acceleration command waveform (AD)). The differential command acceleration waveform (AD) is used to generate the moving average. Command jerk waveform (ideal jerk command waveform (JD)). The differential command jerk waveform (JD) is used to generate a moving average jerk differential value waveform (ideal jerk command value waveform ( ΔJD)). [0047] In FIG. 11 (e '), n is the number of command output cycles for outputting a command waveform of 1 pulse, a multiple of 16. As shown in FIG. 11, the motor that drives the moving object is The jerk differential value control is gradually accelerated in the first period (T1) from the beginning of the movement, and gradually decelerated and stopped at a constant speed (T3) during the period near the final movement position in the central portion (T2). [0 048] In this embodiment, it is set to a multiple of 16, but when the target position is in the positive direction, the command value of the jerk differential value may be changed to a positive value, a negative value, a negative value, a positive value, a negative value, Positive, positive, and negative waveforms, or when the target position is in the positive direction, can also be set to change the command value of the jerk differential value to positive, negative, positive, negative, positive, or negative This is because when the target moving distance is short, the command value with no jerk differential value becomes the interval of 0. Thus, if the jerk differential value waveform does not set the part where the jerk differential value becomes 0, then n is also It can be set to a multiple of 8. [0049] Next, the instruction waveform generation unit will be described with reference to FIGS. 12 to 17. FIG. 12 is a block diagram showing the configuration of the instruction waveform generation unit in FIG. 4 and the input and output signals to the instruction waveform generation unit. Fig. 13 is a control block diagram of the command waveform input / output unit and the command waveform regeneration processing unit of Fig. 12. Fig. 14 is a diagram for explaining the acceleration acceleration value addition waveform. Fig. 15 shows the deviation amount of 1 pulse, 2 Pulse, 4 pulse, 8 pulse and 16 pulse each Figures of the jerk differential value waveform, jerk waveform, acceleration waveform, and velocity waveform added to the compensation. Figure 16 is a diagram for explaining the jerk upper limit lower limit confirmation processing operation. Figure 17 shows the jerk for compensation An example of a command waveform that is reproduced after the differential value waveform is calculated. The horizontal axis is time, and the vertical axis is the pulse height. [0050] As shown in FIG. 12, the command waveform generation unit 212 is provided with a command waveform input / output unit 410. The command waveform reproduction processing unit 420 and the encoder signal counter 430. [0051] Next, in FIG. 13, the second waveform generation unit 216 of the motion controller 210 is to add the command acceleration acceleration differential value waveform (ΔJD) and the command add Pulses of the acceleration waveform (JD), the command acceleration waveform (AD), the command speed waveform (VD), and the command position waveform (PD) are output to the command waveform output / input section 410 of the command waveform generating section 212. [0052] In addition, the command waveform input / output unit 410 is a command jerk differential value waveform (ΔJD ' 1 ~ ΔJD ' n ), Command jerk waveform (JD ' 1 ~ JD ' n ) Among the instruction waveforms regenerated from the previous instruction output timing, the instruction acceleration waveform (AD ' 0 ~ AD ' n ), Command speed waveform (VD ' 0 ~ VD ' n ) And command position waveform (PD ' 0 ~ PD ' n ). The command waveform input / output unit 410 sets the target command position (PD ' 0 ) And the instruction jerk differential value waveform (ΔJD ' 1 ~ ΔJD ' n ), Command jerk waveform (JD ' 1 ~ JD ' n ), From the command acceleration waveform (AD ') 0 ~ AD ' n-1 ), From the command speed waveform (VD ' 0 ~ VD ' n-1 ) And the command position waveform (PD ' 0 ~ PD ' n-1 ) The subtractor 421 and adders 423 to 427 of the instruction waveform reproduction processing section 420 output to the instruction waveform generation section 212. [0053] At this time, the encoder signal counter 430 of the command waveform generation unit 212 obtains the current real position (PA from the encoder count value of the servo motor 130 as shown in FIG. 12). 0 ) And output to the subtractor 421. [0054] The subtractor 421 is from the current target instruction position (PD ' 0 ) Minus the current real position (PA 0 ) To calculate the amount of deviation (Perr) and output it to the jerk differential value addition waveform generator 422. [0055] As shown in FIG. 14, the jerk differential value addition waveform generation unit 422 is within the sampling interval (TS), that is, the deviation (Perr) is generated by n times of instructions holding the instruction output cycle (TC). In the future, it will become a jerk differential value waveform such as "0" (ΔC 1 ~ ΔC n ). In FIG. 14, K is the pulse width, ΔJC is the pulse height, n (natural number) is the number of instruction times of the sampling interval (TS), and x (natural number) is the command position of the n number of instructions (pulse number (1 ≦ x ≦ n)). [0056] For example, the jerk differential value waveform (ΔC 1 ~ ΔC n ) Is generated in the following general procedures (1) to (3). In the following, the position deviation target compensation amount is set to P (perr is used as P as it is), the command output cycle is set to TC, the deviation compensation target time is set to TN, and the deviation compensation target command output The period is set to n times, the width of the jerk differential value waveform is set to K, and the magnitude of the jerk differential value addition waveform is set to ΔJC. [0057] {Program (1)} First, the width (K) of the jerk differential value waveform is calculated as follows. Since the shape of the jerk differential value addition waveform is fixed by TN> (TC × n), n is a multiple of 16. That is, TN> (TC × 16 × K), and the width (K) of the jerk differential value waveform is K <(TN / (TC × 16)). [0058] {Procedure (2)} Next, the magnitude (ΔJC) of the jerk differential value addition waveform is calculated from the following formula. {Procedure (3)} Second, generate the acceleration acceleration differential value addition waveform (ΔC 1 ~ ΔC n ). The jerk differential value addition waveform (ΔC 1 ~ ΔC n ) Is formed as follows. Here, x means the x-th waveform of 1 to n. When x / K ≦ 1, ΔC x = ΔJC x / K ≦ 2, ΔC x When = 0 x / K ≦ 3, ΔC x = -ΔJC x / K ≦ 4, ΔC x When = 0 x / K ≦ 5, ΔC x = -ΔJC x / K ≦ 6, ΔC x When = 0 x / K ≦ 7, ΔC x = ΔJC x / K ≦ 8, ΔC x When = 0 x / K ≦ 9, ΔC x = -ΔJC x / K ≦ 10, ΔC x = 0 x / K ≦ 11, ΔC x = ΔJC x / K ≦ 12, ΔC x = 0 x / K ≦ 13, ΔC x = -ΔJC x / K ≦ 14, ΔC x = 0 x / K ≦ 15, ΔC x = -ΔJC x / K ≦ 16, ΔC x = 0 For example, when K = 1, the jerk differential value addition waveform (ΔC 1 ~ ΔC n ) Is formed as follows. ΔC 1 ~ ΔC n = {ΔJC, 0, -ΔJC, 0, -ΔJC, 0, ΔJC, 0, -ΔJC, 0, ΔJC, 0, ΔJC, 0, -ΔJC, 0}, that is, ΔC 1 = ΔJC, ΔC 2 = 0, ΔC 3 = -ΔJC, ΔC 4 = 0, ΔC 5 = -ΔJC, ΔC 6 = 0, ΔC 7 = ΔJC, ΔC 8 = 0, ΔC 9 = -ΔJC, ΔC 10 = 0, ΔC 11 = ΔJC, ΔC 12 = 0, ΔC 13 = ΔJC, ΔC 14 = 0, ΔC 15 = -ΔJC, ΔC 16 = 0. [0059] As shown in FIG. 15, the larger the deviation (P), the greater the height (ΔJC) of the jerk differential value waveform to compensate for the deviation (P). [0060] Next, in FIG. 13, the jerk differential value addition waveform generation unit 422 adds the jerk differential value addition waveform (ΔC 1 ~ ΔC n ) Is output to the adder 423. The adder 423 is an addition acceleration acceleration differential value addition waveform (ΔC 1 ~ ΔC n ) And the instruction jerk differential value waveform (ΔJD 'generated from the previous instruction output timing 1 ~ ΔJD ' n ), And then generate all instruction jerk differential value waveforms (JD '' 1 ~ JD ''n ) And output to the jerk differential value limiter 428 and the adder 424. [0061] For example, the output of the adder 423 becomes ΔJD " 1 = ΔJD ' 1 + ΔC 1 , ΔJD " 2 = ΔJD ' 2 + ΔC 2 , ΔJD " 3 = ΔJD ' 3 + ΔC 3 , ~, ΔJD " n = ΔJD ' n + ΔC n . [0062] The adder 424 is an instruction jerk differential value waveform (ΔJD " 1 ~ ΔJD " n ) And the instruction jerk waveform (JD ' 1 ~ JD ' n ), And then generate all instruction jerk waveforms (JD " 1 ~ JD " n ) To the jerk differential value limiter 428 and the adder 425. [0063] For example, the output of adder 424 becomes JD " 1 = JD ' 1 + ΔJD ' 1 , JD " 2 = JD ' 2 + ΔJD ' 2 , JD " 3 = JD ' 3 + ΔJD ' 3 , ~, JD " n = JD ' n + ΔJD ' n . [0064] The adder 425 is an instruction jerk waveform (JD " 1 ~ JD " n ) And the instruction acceleration waveform (AD ') from the previous instruction output sequence from the instruction output cycle 1 part before 0 ~ AD ' n-1 ), And then generate all instruction acceleration waveforms (AD " 1 ~ AD " n ) To the adder 426 and the jerk differential value limiter 428. [0065] For example, the output of the adder 425 becomes AD " 1 = AD ' 0 + JD " 1 , AD " 2 = AD ' 1 + JD " 2 , AD " 3 = AD ' 2 + JD " 3 , ~, AD " n = AD ' (n-1) + JD " n . [0066] The adder 426 is an instruction acceleration waveform (AD " 1 ~ AD " n ) And the instruction speed waveform (VD ' 0 ~ VD ' n-1 ), Then generate all instruction acceleration waveforms (VD " 1 ~ VD " n ) To the adder 427 and the jerk differential value limiter 428. [0067] For example, the output of the adder 426 becomes VD " 1 = VD ' 0 + AD " 1 , VD " 2 = VD ' 1 + AD " 2 , VD " 3 = VD ' 2 + AD " 3 , ~, VD " n = VD ' (n-1) + AD " n . [0068] The adder 427 is a command speed waveform (VD " 1 ~ VD " n ) And the command position waveform (PD ' 0 ~ PD ' n-1 ) To generate all instruction position waveforms (PD " 1 ~ PD " n ) And output to the jerk differential value limiter 428. [0069] For example, the output of adder 427 becomes PD " 1 = PD ' 0 + VD " 1 , PD " 2 = PD ' 1 + VD " 2 , PD "3 = PD ' 2 + VD " 3 , ~, PD " n = PD ' (n-1) + VD " n . [0070] In addition, the command waveform regeneration processing unit 420 confirms whether or not each of the command waveforms acquired by the adders 423 to 427 is within a range. The jerk differential value limiting unit 428 uses FIG. 16 to confirm the command jerk differential value waveform (ΔJD " 1 ~ ΔJD " n ) Does not exceed the upper limit (or lower limit). In FIG. 16, the upper limit of the jerk differential value (ΔJmax) and the lower limit of the jerk differential value (−ΔJmax) are predetermined. [0071] In FIG. 16, the adder 423 adds a jerk differential value addition waveform in a dotted circle 701 to a command jerk differential value waveform (ΔJD 'generated in the previous command output timing) 1 ~ ΔJD ' n ). That is, the waveform pulse (ΔC 1 , ΔC 2 , ΔC 3 , ΔC 4 , ΔC 5 , ΔC 6 , ΔC 7 And ΔC 8 ) Will be added to the jerk differential value waveform (command jerk differential value waveform (ΔJD " 1 ~ ΔJD " n )). The timing of the previous correction was corrected. If it is corrected again, the pulse waveform may be lower than the lower limit value of the jerk (-ΔJmax). [0072] In this case, the jerk differential value limiting unit 428 detects a pulse waveform (ΔC at the current time). 1 , ΔC 2 , ΔC 3 , ΔC 4 , ΔC 5 , ΔC 6 , ΔC 7 And ΔC 8 ) Yes (OK) No (NG) is between the upper limit (ΔJmax) and the lower limit (-ΔJmax), it is determined OK or NG, and the output is divergent. For example, detect whether the waveform (ΔC 2 ) Is the upper limit (ΔJmax) (ΔJD " 1 ~ ΔJD " n <ΔJmax). If NO (NG), the NG information is output to the command waveform restoration unit 42C. If it is OK, the waveform (ΔC at the current time) is detected. 2 ) Whether it exceeds the lower limit (ΔJmax) (-ΔJmax <ΔJD " 1 ~ ΔJD " n ). If NO (NG), the NG information is output to the command waveform restoration unit 42C. If it is OK, the command jerk differential value waveform (ΔJD " 1 ~ ΔJD " n ), Command jerk waveform (JD " 1 ~ JD " n ), Command acceleration waveform (AD " 1 ~ AD " n ), Command speed waveform (VD " 1 ~ VD " n ), And the command position waveform (PD " 1 ~ PD " n ) Is output to the jerk limiting unit 429. [0073] Next, in FIG. 13, the jerk limitation unit 429 detects whether the jerk waveform at the current time does not reach the upper limit (Jmax) (JD "), similarly to the jerk differential value limitation unit 428. 1 ~ JD " n <Jmax). If NO (NG), the NG information is output to the command waveform restoration unit 42C. If it is OK, it is detected whether the waveform at the current time exceeds the lower limit Jmax (-Jmax <JD " 1 ~ JD " n ). If NO (NG), the NG information is output to the command waveform restoration unit 42C. If it is OK, the command jerk differential value waveform (ΔJD " 1 ~ ΔJD " n ), Command jerk waveform (JD " 1 ~ JD " n ), Command acceleration waveform (AD " 1 ~ AD " n ), Command speed waveform (VD " 1 ~ VD " n ) And command position waveform (PD " 1 ~ PD " n ) Is output to the acceleration limiter 42A. [0074] Next, in FIG. 13, the acceleration limiting unit 42A detects whether the acceleration waveform at the current time is the upper limit (Amax) (AD ", similarly to the jerk differential value limiting unit 428. 1 ~ AD " n <Amax). If NO (NG), the NG information is output to the command waveform restoration unit 42C. If it is OK, it is detected whether the waveform at the current time exceeds the lower limit (Amax) (-Amax <AD " 1 ~ AD " n ). If NO (NG), the NG information is output to the command waveform restoration unit 42C. If it is OK, the command jerk differential value waveform (ΔJD " 1 ~ ΔJD " n ), Command jerk waveform (JD " 1 ~ JD " n ), Command acceleration waveform (AD " 1 ~ AD " n ), Command speed waveform (VD " 1 ~ VD " n ) And command position waveform (PD " 1 ~ PD " n ) Is output to the speed limiter 42B. [0075] Furthermore, in FIG. 13, the speed limiter 42B detects whether the speed waveform at the current time does not reach the upper limit (Vmax) (VD ", similarly to the jerk differential value limiter 428. 1 ~ VD " n <Vmax). If NO (NG), the NG information is output to the command waveform restoration unit 42C. If it is OK, it is detected whether the waveform at the current time exceeds the lower limit (Vmax) (-Vmax <VD " 1 ~ VD " n ). If NO (NG), the NG information is output to the command waveform restoration unit 42C. If it is OK, the command jerk differential value waveform (ΔJD " 1 ~ ΔJD " n ), Command jerk waveform (JD " 1 ~ JD " n ), Command acceleration waveform (AD " 1 ~ AD " n ), Command speed waveform (VD " 1 ~ VD " n ) And command position waveform (PD " 1 ~ PD " n ) Is output to the command waveform input / output unit 410. [0076] The command waveform restoration unit 42C is a command for restoring the previous command output when NG information is input from any of the jerk differential value restriction unit 428, jerk restriction unit 429, acceleration restriction unit 42A, or speed restriction unit 42B Waveform, leaving the correction of the total deviation until the next command output (confirmation processing of upper and lower limits). The command waveform at the time of the previous command output after the restoration is also output to the command waveform input / output unit 410. [0077] Thereafter, in FIG. 1 ~ ΔJD " n , JD " 1 ~ JD " n , AD " 1 ~ AD " n , VD " 1 ~ VD " n , And PD " 1 ~ PD " n Saved as a new command waveform. [0078] Speed command value (VD "of the command waveform 1 ~ VD " n As shown in FIG. 12, the command waveform input / output unit 410 sequentially outputs to the DAC 213, and the DAC 213 outputs the speed command value after the sequential analog conversion to the servo amplifier 220. [0079] In FIG. 12, DAC213 is a speed command value (VD "to be input 1 ) Is converted to an analog value and output to the servo amplifier 220. The servo amplifier 220 rotates and drives the servo motor 130 according to the inputted analog data, sets the rotation position (and rotation speed) of the servo motor 130 as an encoder signal, and outputs it to the command waveform generation unit 212. [0080] The encoder signal output from the servo motor 130 is an encoder signal counter 430 input to the command waveform generation unit 212. [0081] The encoder signal counter 430 is a count value (PA 0 ) Is output to the command waveform reproduction processing unit 420. [0082] In the instruction waveform reproduction processing unit 420, the subtracter 421 inputs the count value (PA 0 ). [0083] The servo amplifier 220 is in accordance with the input speed command value (VD " 1 ) To control the servo motor 130. [0084] FIG. 17 shows how all the command waveforms are reproduced. The thin solid lines are the waveforms before the compensation. From now on, the servo motor 130 is controlled with the waveform shown by the thick solid line between the commanded acceleration acceleration value and the acceleration acceleration differential value waveform for compensation. . [0085] As a result, the servo motor 130 rotates, and when the motor rotates at a high speed, the vibration or deviation in the traveling direction of the driven body can be suppressed, and the setting time can be shortened. In addition, since the motor can be operated with an ideal trajectory and the current position can be constantly monitored, it is possible to easily synchronize and operate a plurality of axes. [0086] In addition, in FIG. 17, the real position waveform can be seen to deviate more than before. This indicates the deviation (positional deviation) of the command waveform up to the present time. Actually, the correction is continuously performed at an interval of a very short command output period, so there is no case where a deviation significantly occurs as shown in FIG. 17. In FIG. 17, in order to emphasize the state where the expression position is corrected, the real position at the current time is formed at a position slightly deviating from the command waveform. [0087] Next, a motor control method will be described using FIGS. 18 and 19. 18 and 19 are flowcharts of a program for explaining an example of the operation of the motor control method. Creating the instruction jerk differential value waveform (JD "), the instruction jerk waveform (JD"), the instruction acceleration waveform (AD "), the instruction speed waveform (VD"), and the instruction output cycle timing according to FIGS. 18 and 19, and Program for commanding the position waveform (PD "). In step S601, the current real position (PA) is obtained from the encoder count value. 0 ). In step S602, from the real position (PA 0 ) And the current command position (PD ' 0 ) Calculate the deviation (Perr). In step S603, in the command output cycle n times, a jerk differential value addition waveform (ΔC) such that a deviation amount (Perr) will become "0" in the future is generated. 1 ~ ΔC n ). [0088] In step S604, the jerk differential value addition waveform (ΔC 1 ~ ΔC n ) Added to the command jerk differential value waveform (ΔJD ' 1 ~ ΔJD ' n ), And then generate all instruction jerk differential value waveforms (ΔJD " 1 ~ ΔJD " n ). In step S605, the regenerated command jerk differential value waveform (ΔJD " 1 ~ ΔJD " n ) Added to the commanded jerk waveform (JD ' 1 ~ JD ' n ), And then generate all instruction jerk waveforms (JD " 1 ~ JD " n ). In step S606, a command acceleration waveform (AD ' 0 ~ AD ' n-1 ) And the regenerated command acceleration waveform (JD "1 ~ JD" n ) To regenerate all instruction acceleration waveforms (AD " 1 ~ AD " n ). In step S607, the sum command acceleration waveform (AD " 1 ~ AD " n ) (Step S606) the same method to regenerate the command speed waveform (VD " 1 ~ VD " n ). In step S608, the acceleration waveform (AD " 1 ~ AD " n ) (Step S606) or command speed waveform (VD " 1 ~ VD " n ) (Step S607) the same method to regenerate the command position waveform (PD " 1 ~ PD " n ). [0089] In step S609, the regenerated jerk differential value waveform (ΔJD " 1 ~ ΔJD " n ) Whether the upper limit (ΔJmax) is not reached. When the upper limit (ΔJmax) is exceeded, the process is shifted to step S614, and when the upper limit is not reached, the process is shifted to step S610. In step S610, the regenerated jerk waveform (JD " 1 ~ JD " n ) Whether the upper limit (Jmax) is not reached. When the upper limit (Jmax) is exceeded, the process is shifted to step S614, and when the upper limit is not reached, the process is shifted to step S611. In step S611, the reproduced acceleration waveform (AD "is confirmed 1 ~ AD " n ) Whether the upper limit (Amax) is not reached. When the upper limit (Amax) is exceeded, the process is shifted to step S614, and when the upper limit is not reached, the process is shifted to step S612. In step S612, the reproduced velocity waveform (VD " 1 ~ VD " n ) Whether the upper limit (Vmax) is not reached. When the upper limit (Vmax) is exceeded, the process is shifted to step S614, and when the upper limit is not reached, the process is shifted to step S613. [0090] In step S613, the regenerated command jerk differential value waveform (ΔJD " 1 ~ ΔJD " n ), Command jerk waveform (JD " 1 ~ JD " n ), Command acceleration waveform (AD " 1 ~ AD " n ), Command speed waveform (VD " 1 ~ VD " n ) And command position waveform (PD " 1 ~ PD " n ) Save as a new command waveform. In step S615, the speed command value (VD " 1 ~ VD " n ) Output from the DAC312, ending the processing of FIGS. 17 and 18, and proceeding to the next command output cycle timing operation. [0091] In step S614, the command waveform returned before the command waveform is regenerated is restored, and the process proceeds to step S615. That is, using the previous instruction jerk differential value waveform (ΔJD ' 1 ~ ΔJD ' n ) As the command jerk differential value waveform (ΔJD " 1 ~ ΔJD " n ). Use previous instruction jerk waveform (JD ' 1 ~ JD ' n ) As the command jerk waveform (JD " 1 ~ JD " n ). In addition, the previous command acceleration waveform (AD ' 1 ~ AD ' n ) As the command acceleration waveform (AD " 1 ~ AD " n ). In addition, the previous command speed waveform (VD ' 1 ~ VD ' n ) As command speed waveform (VD " 1 ~ VD " n ). In addition, the previous command position waveform (PD ' 1 ~ PD ' n ) As the command position waveform (PD " 1 ~ PD " n ). [0092] Next, a method for manufacturing a semiconductor device using the die attacher of the embodiment will be described with reference to FIG. 20. FIG. 20 is a flowchart showing a method of manufacturing a semiconductor device. Step S11: The wafer ring 14 holding the dicing tape 16 to which the die D divided from the wafer 11 is attached is stored in a wafer cassette (not shown), and is transferred to the die attacher 10. The control unit 8 supplies the wafer ring 14 from the wafer cassette filled with the wafer ring 14 to the die supply unit 1. Then, the substrate P is prepared and carried into the die attacher 10. The control unit 8 loads the substrate P on the substrate transfer tray 51 in the substrate supply unit 6. [0093] Step S12: The control unit 8 picks up the divided dies from the wafer. Step S13: The control unit 8 mounts the picked-up dies on the substrate P or laminates the bonded dies. The control unit 8 mounts the die D picked up from the wafer 11 on the intermediate stage 31, and the bonding head 41 picks up the die D again from the intermediate stage 31 and joins the transferred substrate P. [0094] Step S14: The control unit 8 removes the substrate P to which the die D is bonded from the substrate transfer tray 51 in the substrate transfer unit 7. The substrate P is carried out from the die attacher 10. [0095] <Modifications> Hereinafter, representative modifications will be given as examples. In the following description of the modification, the same reference numerals as those of the above-mentioned embodiment may be used for portions having the same configuration and function as those described in the above-mentioned embodiment. It should be noted that the description of such a part can appropriately refer to the description of the embodiment described above within a technically inconsistent range. In addition, a part of the above-mentioned embodiment and all or a part of the plural modifications can be appropriately combined and applied within a range that is not technically contradictory. [0096] (Modification 1) FIG. 21 is a block diagram showing a configuration of a command waveform input / output unit and a command waveform regeneration processing unit according to Modification 1. In the above embodiment, the command waveform restoration unit 42C restores the previous command waveform. However, as shown in FIG. 21, in Modification 1, the command waveform regeneration processing unit 420 outputs NG information, and the command waveform output input unit 410 According to the NG information, the saved previous command waveform is restored as the current command waveform. [0097] (Modification 2) In the embodiment, a motor (servo motor) related to rotation is described. However, a linear motor other than a motor that rotates may be applied. Specifically, in FIG. 4, the servo motor 130 is replaced with a linear motor (hereinafter referred to as a motor control device according to Modification 2). The speed loop control unit 221 of the servo amplifier 220 controls the moving speed of the linear motor in accordance with a speed command value input from the motion controller 210 and an encoder signal input from the linear motor. [0098] The linear motor moves at a moving speed controlled by the moving speed input from the speed loop control section 221 of the servo amplifier 220, and sets the real position and the real speed as encoder signals to output the speed to the servo amplifier 220. The loop control unit 221 and the command waveform generation unit 212 of the motion controller 210. [0099] In the motor control device according to Modification 2, the real position of the driven body is calculated from the count value of the linear motor, and the real speed is calculated based on the calculated real position. However, a position detection device that directly detects the position of the driven body may be provided, and the position detected by the position detection device may be used as the real position. [0100] For example, in the motor control device according to Modification 2, the DAC213 is a speed command value (VD "to be input. 1 ) Is converted to an analog value and output to the servo amplifier 220. The servo amplifier 220 drives the linear motor according to the inputted analog data, and uses the moving position (and moving speed) of the linear motor as an encoder signal to output to the command waveform generating unit 212. [0101] The encoder signal output from the linear motor is input to the encoder signal counter 430 of the command waveform generation unit 212. [0102] The encoder signal counter 430 is a count value PA to be counted in a predetermined cycle. 0 It is output to the command waveform reproduction processing unit 420. [0103] In the instruction waveform reproduction processing unit 420, the subtractor 421 outputs the count value (PA 0 ) To its subtraction input terminal. The manner in which all command waveforms are reproduced is the same as that shown in FIG. 17. [0104] As a result, when the linear motor moves, and when the linear motor moves at high speed, vibration or deviation in the traveling direction of the driven body can be suppressed, and the setting time can be shortened. In addition, since the linear motor can be operated with an ideal trajectory and the current position can be constantly monitored, it is easy to synchronize a plurality of axes to operate. Furthermore, the present invention is also applicable to the entire motor such as a motor having an encoder counting function. [0105] The inventions developed by the present inventors have been specifically described based on the embodiments, examples, and modifications, but the present invention is not limited to the above-mentioned embodiments, examples, and modifications, and various modifications can be implemented. For example, in the embodiment, the command waveform input / output unit outputs a speed command value to control the motor. However, instead of the speed command value, the acceleration command value can be output to control the motor. As a result, not only position control but also load control becomes possible. In the embodiment, one pickup head and one bonding head are provided, but the number is two or more. In the embodiment, the intermediate platform is provided, but the intermediate platform may not be provided. In this case, the pickup head and the bonding head may be used in combination. In the embodiment, the surfaces of the crystal grains are bonded together, but the surface of the crystal grains may be reversed after picking up the crystal grains, and the back surface of the crystal grains may be bonded together. In this case, the intermediate platform is optional. This device is called a flip chip bonder.

[0106][0106]

130‧‧‧伺服馬達130‧‧‧Servo motor

83e‧‧‧馬達控制裝置83e‧‧‧Motor control device

210‧‧‧動作控制器210‧‧‧ Motion Controller

211‧‧‧理想波形產生部211‧‧‧ideal waveform generator

212‧‧‧指令波形產生部212‧‧‧Command waveform generation unit

213‧‧‧DAC213‧‧‧DAC

220‧‧‧伺服放大器220‧‧‧Servo amplifier

221‧‧‧速度迴路控制部221‧‧‧Speed loop control section

410‧‧‧指令波形輸出入部410‧‧‧Command waveform input / output section

420‧‧‧指令波形再產生處理部420‧‧‧Instruction waveform reproduction processing unit

421‧‧‧減算器421‧‧‧Subtractor

422‧‧‧加加速度微分值加算波形產生部422‧‧‧Acceleration differential value addition waveform generation unit

423~427‧‧‧加算器423 ~ 427‧‧‧ Adder

428‧‧‧加加速度微分值限制部428‧‧‧Jerk acceleration differential value limitation unit

429‧‧‧加加速度限制部429‧‧‧Jerk limiter

42A‧‧‧加速度限制部42A‧‧‧Acceleration limiting section

42B‧‧‧速度限制部42B‧‧‧Speed limit section

42C‧‧‧指令波形復原部42C‧‧‧Command waveform restoration unit

430‧‧‧編碼器訊號計數器430‧‧‧ encoder signal counter

[0009]   圖1是表示實施例的黏晶機的構成的概略上面圖。   圖2是說明圖1的黏晶機的概略構成及其動作的圖。   圖3是表示圖1的黏晶機的控制系的概略構成的方塊圖。   圖4是用以說明圖3的馬達控制裝置的基本的原理的方塊構成圖。   圖5是用以說明在圖4的理想波形產生部的第一波形產生部所產生的指令波形的圖。   圖6是用以說明移動平均處理的圖。   圖7是用以說明移動平均處理的圖。   圖8是用以說明移動平均處理的圖。   圖9是用以說明移動平均處理的圖。   圖10是表示使移動平均時間變化時的各指令波形的形狀的圖。   圖11是用以說明在圖4的理想波形產生部的第二波形產生部所產生的理想的指令波形的圖。   圖12是表示圖4的指令控制部的構成及往指令波形產生部的輸出入訊號的方塊圖。   圖13是表示圖12的指令波形輸出入部及指令波形再產生處理部的構成的方塊圖。   圖14是用以說明在圖13的加加速度微分值加算波形產生部所產生的加加速度微分值加算波形的圖。   圖15是表示偏差量為1脈衝、2脈衝、4脈衝、8脈衝及16脈衝時各個被加算於補償用的加加速度微分值波形、加加速度波形、加速度波形及速度波形的圖。   圖16是用以說明實施例的馬達控制裝置的加加速度微分值上限下限確認處理動作的圖。   圖17是表示實施例的馬達控制裝置的補償用的加加速度微分值波形算出後被再產生的指令波形的圖。   圖18是用以說明實施例的馬達控制方法的動作的程序的流程圖。   圖19是用以說明實施例的馬達控制方法的動作的程序的流程圖。   圖20是用以說明使用實施例的黏晶裝置的半導體裝置的製造方法的流程圖。   圖21是表示變形例1的指令波形輸出入部及指令波形再產生處理部的構成的方塊圖。[0009] FIG. 1 is a schematic top view showing the configuration of a die bonder of an embodiment. FIG. 2 is a diagram illustrating a schematic configuration and operation of the die attacher of FIG. 1. FIG. 3 is a block diagram showing a schematic configuration of a control system of the die bonder of FIG. 1. FIG. 4 is a block configuration diagram for explaining a basic principle of the motor control device of FIG. 3. FIG. 5 is a diagram for explaining a command waveform generated by the first waveform generating section of the ideal waveform generating section of FIG. 4. FIG. 6 is a diagram for explaining moving average processing. FIG. 7 is a diagram for explaining moving average processing. 8 is a diagram for explaining moving average processing. FIG. 9 is a diagram for explaining moving average processing. 10 is a diagram showing the shape of each command waveform when the moving average time is changed. FIG. 11 is a diagram for explaining an ideal command waveform generated by the second waveform generating section of the ideal waveform generating section of FIG. 4. FIG. 12 is a block diagram showing the configuration of the command control unit and the input / output signals to the command waveform generation unit in FIG. 4. FIG. 13 is a block diagram showing the configuration of the command waveform input / output section and the command waveform regeneration processing section of FIG. 12. FIG. 14 is a diagram for explaining a jerk differential value addition waveform generated by the jerk differential value addition waveform generation unit of FIG. 13. FIG. 15 is a diagram showing jerk differential value waveforms, jerk waveforms, acceleration waveforms, and velocity waveforms added to the compensation when the deviation amounts are 1 pulse, 2 pulses, 4 pulses, 8 pulses, and 16 pulses. FIG. 16 is a diagram for explaining the operation of confirming the upper limit and lower limit of the jerk differential value of the motor control device according to the embodiment. FIG. 17 is a diagram showing a command waveform that is reproduced after calculation of a jerk differential value waveform for compensation of the motor control device of the embodiment. FIG. 18 is a flowchart illustrating a routine of an operation of the motor control method according to the embodiment. FIG. 19 is a flowchart illustrating a routine of an operation of the motor control method according to the embodiment. FIG. 20 is a flowchart illustrating a method of manufacturing a semiconductor device using the die attach device of the embodiment. FIG. 21 is a block diagram showing a configuration of a command waveform input / output unit and a command waveform regeneration processing unit according to the first modification.

Claims (11)

一種黏晶裝置,其特徵係具備:馬達,其係驅動被驅動體,將實位置設為編碼器訊號輸出;馬達控制裝置,其係控制前述馬達,將前述被驅動體控制至目標位置,把晶粒安裝於基板,前述馬達控制裝置係具備:理想波形產生部,其係產生加加速度微分值、加加速度、加速度、速度及位置的理想的指令波形;指令波形產生部,其係讀出前述理想的指令波形,再產生目標指令位置、和加加速度微分值、加加速度、加速度、速度及位置的指令波形,將被再產生的速度的指令波形輸出;DAC,其係將前述被再產生的速度的指令波形變換成類比資料,前述理想波形產生部係具備:第一波形產生部,其係由加加速度、加速度、速度及位置的目標值來依序積分加加速度、加速度、速度及位置的第一指令波形而產生;移動平均處理部,其係藉由規定一定的時間,一邊錯開範圍,一邊取平均的移動平均法,由在前述第一波形產生部被產生的位置的第一指令波形來產生位置的理想的指令波形;及第二波形產生部,其係由前述位置的理想的指令波形來依序微分而產生速度、加速度、加加速度及加加速度微分值的理想的指令波形,前述指令波形產生部係具備:指令波形再產生處理部,其係根據依據前述編碼器訊號之實位置及前述目標指令位置來產生加加速度微分值的加算波形,將前述被產生的加加速度微分值的加算波形加算於在前回的指令輸出時序所被再產生的加加速度微分值的指令波形,而再產生加加速度微分值的指令波形,更再產生加加速度、加速度、速度及位置的指令波形;及指令波形輸出入部,其係保存前述被產生的位置、速度、加速度、加加速度及加加速度微分值的理想的指令波形、和前述被再產生的加加速度微分值、加加速度、加速度、速度及位置的指令波形。A sticky crystal device is characterized by: a motor that drives a driven body and sets the real position as an encoder signal output; a motor control device that controls the motor, controls the driven body to a target position, and The die is mounted on a substrate. The motor control device includes: an ideal waveform generating unit that generates ideal command waveforms of jerk differential value, jerk, acceleration, speed, and position; and a command waveform generating unit that reads the aforementioned The ideal command waveform, the target command position, and the jerk differential value, jerk, acceleration, velocity, and position command waveforms will be re-generated speed command waveform output; DAC, which is the previously regenerated The command waveform of speed is converted into analog data. The aforementioned ideal waveform generating unit is provided with a first waveform generating unit that integrates the target values of jerk, acceleration, velocity, and position in order to integrate the jerk, acceleration, velocity, and position. The first command waveform is generated; the moving average processing unit In the open range, the moving average method taking an average while generating an ideal command waveform for the position from the first command waveform at the position where the first waveform generation part is generated; and a second waveform generation part which is based on the position The ideal command waveform is sequentially differentiated to generate an ideal command waveform of speed, acceleration, jerk, and jerk differential value. The aforementioned command waveform generation unit is provided with a command waveform regeneration processing unit, which is based on the encoder signal according to the aforementioned encoder signal. The actual position and the target command position are used to generate the acceleration waveform of the jerk differential value, and the generated waveform of the jerk differential value is added to the command waveform of the jerk differential value regenerated in the previous command output timing. , And then generate the command waveform of the jerk differential value, and then generate the command waveform of jerk, acceleration, speed, and position; and the command waveform input / output unit, which stores the position, speed, acceleration, jerk, and jerk generated as described above The ideal command waveform of the acceleration differential value and the previously added Speed differential value, the command jerk, acceleration, velocity and position waveforms. 如申請專利範圍第1項之黏晶裝置,其中,前述指令波形產生部為:將前述被再產生的加加速度微分值的指令波形加算於在前回的指令輸出時序被再產生的加加速度的指令波形,而再產生加加速度的指令波形,將前述被再產生的加加速度的指令波形加算於在前回的指令輸出時序所被再產生的加速度的指令波形,而再產生加速度的指令波形,將前述被再產生的加速度的指令波形加算於在前回的指令輸出時序所被再產生的加速度的指令波形,而再產生加速度的指令波形,將前述被再產生的速度的指令波形加算於在前回的指令輸出時序所被再產生的速度的指令波形,而再產生速度的指令波形,將前述被再產生的速度的指令波形加算於在前回的指令輸出時序所被再產生的位置的指令波形,而再產生位置的指令波形。For example, the crystal sticking device according to the first scope of the patent application, wherein the command waveform generating unit is: adding the command waveform of the regenerated jerk differential value to the command of the jerk which was regenerated in the previous command output timing. Waveform, and then generate the acceleration acceleration command waveform, add the previously generated acceleration acceleration command waveform to the acceleration instruction waveform that was regenerated in the previous command output timing, and generate the acceleration instruction waveform again. The regenerated acceleration command waveform is added to the regenerated command waveform of the previous command output timing, and the regenerated acceleration command waveform is added to the previously regenerated command waveform. The speed command waveform that is regenerated at the output timing is output, and the speed command waveform that is regenerated is added to the command waveform at the position that was regenerated at the previous command output timing. Generate a command waveform for the position. 如申請專利範圍第2項之黏晶裝置,其中,前述指令波形再產生處理部,係具有:由依據前述編碼器訊號之實位置與前述目標指令位置的差之偏差量來產生加加速度微分值的加算波形之加加速度微分值加算波形產生部。For example, the crystal sticking device of the second scope of the patent application, wherein the aforementioned command waveform regenerating processing unit has: a jerk differential value generated by a deviation amount according to a difference between the actual position of the encoder signal and the target command position. The acceleration waveform differential value of the added waveform is added to the waveform generation unit. 如申請專利範圍第3項之黏晶裝置,其中,前述指令波形再產生處理部,係更具有加加速度微分值限制部,前述加加速度微分值限制部,係前述被再產生的加加速度微分值的指令波形為超過預定的加加速度微分值上限值或未滿加加速度微分值下限值時,將NG資訊輸出至前述指令波形輸出入部,前述指令波形輸出入部,係被輸入前述NG資訊時,將在前述前回的指令輸出時序所被再產生的加加速度微分值、加加速度、加速度、速度及位置的指令波形復原,以被復原的加加速度微分值、加加速度、加速度、速度及位置的指令波形作為再產生的加加速度微分值、加加速度、加速度、速度及位置的指令波形,將被再產生的速度的指令波形輸出至前述DAC。For example, the crystal sticky device of the third scope of the application for a patent, wherein the command waveform regenerating processing section further includes a jerk differential value limiting section, and the jerk differential value limiting section is the regenerated jerk differential value. When the command waveform exceeds the predetermined upper limit value of the jerk differential value or does not reach the lower limit value of the jerk differential value, the NG information is output to the aforementioned command waveform input / output section, and the aforementioned command waveform output / input section is used when the aforementioned NG information is input. , Restore the jerk differential value, jerk, acceleration, speed, and position command waveforms that were regenerated in the previous command output timing, and use the restored jerk differential value, jerk, acceleration, speed, and position. The command waveform is a regenerated jerk differential value, jerk, acceleration, speed, and position command waveform, and the regenerated command waveform of the speed is output to the aforementioned DAC. 如申請專利範圍第3項之黏晶裝置,其中,前述指令波形再產生處理部,係更具備:加加速度微分值限制部,其係前述被再產生的加加速度微分值的指令波形為超過預定的加加速度微分值上限值或未滿加加速度微分值下限值時,輸出NG資訊;及指令波形復原部,其係被輸入前述NG資訊時,將在前述前回的指令輸出時序所被再產生的加加速度微分值、加加速度、加速度、速度及位置的指令波形復原,輸出至前述指令波形輸出入部,前述指令波形輸出入部,係以被復原的加加速度微分值、加加速度、加速度、速度及位置的指令波形作為再產生的加加速度微分值、加加速度、加速度、速度及位置的指令波形,將被再產生的速度的指令波形輸出至前述DAC。For example, the crystal sticky device of the third scope of the patent application, wherein the aforementioned command waveform regenerating processing section further includes: a jerk differential value limiting section, which is that the command waveform of the regenerated jerk differential value exceeds a predetermined value. When the upper limit value of the jerk differential value or the lower limit value of the jerk differential value is not reached, the NG information is output; and when the NG information is input, the NG information is inputted, and it will be restored at the previous command output timing. The generated jerk differential value, jerk, acceleration, speed, and position command waveforms are restored and output to the aforementioned command waveform input / output section. The aforementioned command waveform output / input section is based on the restored jerk differential value, jerk, acceleration, and speed. The command waveform of the position is used as the regenerated jerk differential value, jerk, acceleration, speed, and position command waveform, and the regenerated command waveform of the speed is output to the aforementioned DAC. 如申請專利範圍第1~5項中的任一項所記載之黏晶裝置,其中,前述指令波形產生部,係以被再產生的加加速度微分值、加加速度、加速度、速度及位置的指令波形作為在前回的指令輸出時序所被再產生的指令波形保存。According to the crystal sticking device described in any one of claims 1 to 5, the aforementioned command waveform generation unit is a command that reproduces the jerk differential value, jerk, acceleration, speed, and position. The waveform is saved as the command waveform regenerated in the previous command output timing. 如申請專利範圍第1項之黏晶裝置,其中,前述馬達為伺服馬達。For example, the crystal sticking device according to item 1 of the patent application scope, wherein the aforementioned motor is a servo motor. 如申請專利範圍第1項之黏晶裝置,其中,前述被驅動體為接合頭及拾取頭之其中的至少一個。For example, the crystal sticking device according to the first patent application range, wherein the driven body is at least one of a bonding head and a pickup head. 一種半導體裝置的製造方法,其特徵係具備:(a)準備如申請專利範圍第1~5項中的任一項的黏晶裝置之工程;(b)將保持貼附有晶粒的切割膠帶的晶圓環搬入之工程;(c)準備搬入基板之工程;(d)拾取晶粒之工程;及(e)將前述拾取後的晶粒接合於前述基板或已被接合的晶粒上之工程。A method for manufacturing a semiconductor device, comprising: (a) a process for preparing a die-bonding device such as any one of items 1 to 5 of the scope of patent application; (b) a dicing tape to which a die is attached The project of moving wafer rings into; (c) the process of preparing to move into the substrate; (d) the process of picking up the dies; and (e) the process of bonding the picked up dies to the aforementioned substrate or the bonded dies engineering. 如申請專利範圍第9項之半導體裝置的製造方法,其中,前述(d)工程係以身為前述被驅動體的接合頭來拾取前述切割膠帶上的晶粒,前述(e)工程係以前述接合頭來將前述拾取後的晶粒接合於前述基板或已被接合的晶粒上。For example, the method for manufacturing a semiconductor device according to item 9 of the application, wherein the (d) process is to pick up the crystal grains on the dicing tape by using the bonding head as the driven body, and the (e) process is to A bonding head is used to bond the picked-up dies to the substrate or the dies that have been bonded. 如申請專利範圍第9項之半導體裝置的製造方法,其中,前述(d)工程係具有:(d1)以前述身為被驅動體的拾取頭來拾取前述切割膠帶上的晶粒之工程;及(d2)將以前述拾取頭拾取後的晶粒載置於中間平台之工程,前述(e)工程係具備:(e1)以前述身為被驅動體的接合頭來拾取被載置於前述中間平台的晶粒之工程;及(e2)將以前述接合頭拾取後的晶粒載置於前述基板之工程。For example, the method for manufacturing a semiconductor device according to item 9 of the application, wherein the (d) process includes: (d1) a process of picking up the crystal grains on the dicing tape by using the pickup head as the driven body; and (d2) a process of placing the grains picked up by the picking head on an intermediate platform, the aforementioned (e) project includes: (e1) picking up and placing the intermediate head by using the bonding head as the driven body; The process of die of the platform; and (e2) the process of placing the die picked up by the aforementioned bonding head on the aforementioned substrate.
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