TWI647682B - Detection method and display panel - Google Patents

Detection method and display panel Download PDF

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TWI647682B
TWI647682B TW106130673A TW106130673A TWI647682B TW I647682 B TWI647682 B TW I647682B TW 106130673 A TW106130673 A TW 106130673A TW 106130673 A TW106130673 A TW 106130673A TW I647682 B TWI647682 B TW I647682B
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sensing
sensing electrodes
test pad
switches
electrodes
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TW106130673A
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TW201913620A (en
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陳志成
蕭舜仁
劉貴文
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友達光電股份有限公司
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Priority to CN201711138738.4A priority patent/CN107942186B/en
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Publication of TW201913620A publication Critical patent/TW201913620A/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)

Abstract

一種檢測方法,用以檢測顯示面板。檢測方法包含以下步驟:開啟第一開關以導通第一感測電極中的至少一者;經由第一測試墊以及第二測試墊量測第一阻抗值;開啟第二開關以導通第二感測電極中的至少一者;經由第三測試墊以及第四測試墊量測第二阻抗值;依據第一阻抗值與第二阻抗值判斷第一感測電極中的至少一者與第二感測電極中的至少一者是否為開路狀態;經由第二測試墊以及第三測試墊,量測第三阻抗值;以及依據第三阻抗值判斷第一感測電極中的至少一者與第二感測電極中的至少一者是否為短路狀態。 A detection method for detecting a display panel. The detection method includes the following steps: turning on the first switch to turn on at least one of the first sensing electrodes; measuring the first impedance value through the first test pad and the second test pad; turning on the second switch to turn on the second sensing At least one of the electrodes; measuring the second impedance value through the third test pad and the fourth test pad; judging at least one of the first sensing electrode and the second sensing according to the first impedance value and the second impedance value Whether at least one of the electrodes is in an open circuit state; measuring a third impedance value through the second test pad and the third test pad; and judging at least one of the first sensing electrode and the second sense electrode according to the third impedance value It is measured whether at least one of the electrodes is in a short-circuit state.

Description

檢測方法及顯示面板 Detection method and display panel

本案是有關於一種檢測方法及顯示面板,且特別是有關於檢測感測電極的檢測方法及顯示面板。 This case relates to a detection method and a display panel, and more particularly to a detection method and a display panel for detecting a sensing electrode.

隨著資訊技術、無線行動通訊和資訊家電的快速發展與應用,為了達到攜帶便利、體積輕巧化以及操作人性化的目的,許多資訊產品已由傳統之鍵盤或滑鼠等輸入裝置,轉變為使用觸控面板作為輸入裝置。 With the rapid development and application of information technology, wireless mobile communications, and information appliances, in order to achieve the purposes of portability, lightness, and user-friendliness, many information products have been transformed from traditional keyboard or mouse input devices to use The touch panel is used as an input device.

目前,觸控面板大致可區分為電阻式、電容式、紅外線式及超音波式等觸控面板,其中以電阻式觸控面板與電容式觸控面板為最常見的產品。就電容式觸控面板而言,多點觸控的特性提供更人性化的操作模式而使得電容式觸控面板受到市場青睞。 At present, touch panels can be roughly divided into touch panels such as resistive, capacitive, infrared, and ultrasonic. Among them, resistive touch panels and capacitive touch panels are the most common products. As far as capacitive touch panels are concerned, the characteristics of multi-touch provide a more user-friendly operation mode and make capacitive touch panels popular in the market.

一般而言,觸控顯示面板具有主動區以及周邊區,其中主動區會設置有多個感測電極以感測觸控事件的發生,而周邊區中會設置有與感測電極連接的多條訊號傳遞線。若是在觸控顯示面板的生產過程中,先檢查出多個感測電極之間是否有短路或開路的問題,能夠降低觸控顯示面板 的生產成本。 Generally speaking, a touch display panel has an active area and a peripheral area. The active area is provided with a plurality of sensing electrodes to sense the occurrence of a touch event, and the peripheral area is provided with a plurality of connected to the sensing electrodes Signal transmission line. If it is in the production process of the touch display panel, it is first checked whether there is a short circuit or an open circuit between the plurality of sensing electrodes, which can reduce the touch display panel. Production costs.

因此,如何在觸控顯示面板的生產過程中,檢查多個感測電極之間是否有短路或開路,為本領域待改進的問題之一。 Therefore, how to check whether there is a short circuit or an open circuit between the plurality of sensing electrodes in the production process of the touch display panel is one of the problems to be improved in this field.

本案之一態樣是在提供一種檢測方法。此檢測方法用以檢測顯示面板。顯示面板包含多個第一感測電極、多個第二感測電極、第一測試墊、第二測試墊、第三測試墊、第四測試墊、多個第一開關以及多個第二開關。第一感測電極與第二感測電極交錯配置。第一感測電極分別透過第一開關與第一測試墊以及第二測試墊電性連接。第二感測電極分別透過第二開關與第三測試墊以及第四測試墊電性連接。檢測方法包含以下步驟:開啟第一開關以導通第一感測電極中的至少一者;經由第一測試墊以及第二測試墊量測第一阻抗值;開啟第二開關以導通第二感測電極中的至少一者;經由第三測試墊以及第四測試墊量測第二阻抗值;依據第一阻抗值與第二阻抗值判斷第一感測電極中的至少一者與第二感測電極中的至少一者是否為開路狀態;經由第二測試墊以及第三測試墊,量測第三阻抗值;以及依據第三阻抗值判斷第一感測電極中的至少一者與第二感測電極中的至少一者是否為短路狀態。 One aspect of this case is to provide a detection method. This detection method is used to detect the display panel. The display panel includes a plurality of first sensing electrodes, a plurality of second sensing electrodes, a first test pad, a second test pad, a third test pad, a fourth test pad, a plurality of first switches, and a plurality of second switches. . The first sensing electrodes and the second sensing electrodes are staggered. The first sensing electrode is electrically connected to the first test pad and the second test pad through a first switch, respectively. The second sensing electrode is electrically connected to the third test pad and the fourth test pad through the second switch, respectively. The detection method includes the following steps: turning on the first switch to turn on at least one of the first sensing electrodes; measuring the first impedance value through the first test pad and the second test pad; turning on the second switch to turn on the second sensing At least one of the electrodes; measuring the second impedance value through the third test pad and the fourth test pad; judging at least one of the first sensing electrode and the second sensing according to the first impedance value and the second impedance value Whether at least one of the electrodes is in an open circuit state; measuring a third impedance value through the second test pad and the third test pad; and judging at least one of the first sensing electrode and the second sense electrode according to the third impedance value It is measured whether at least one of the electrodes is in a short-circuit state.

本案之另一態樣是在提供一種顯示面板。此顯示面板包含基板、多個第一感測電極、多個第二感測電極、 第一測試墊與第二測試墊、第三測試墊與第四測試墊、多個晶片凸塊、多條第一傳輸走線、多條第二傳輸走線、多條第一周邊走線、多條第二周邊走線、多條第一連接走線以及多條第二連接走線。基板具有主動區與周邊區,其中周邊區鄰接於主動區。多個第一感測電極設置於主動區。多個第二感測電極設置於主動區,且多個第一感測電極與多個第二感測電極彼此交錯配置。第一測試墊與第二測試墊分別設置於周邊區,且第一測試墊與第二測試墊分別電性連接於多個第一感測電極。第三測試墊與第四測試墊,分別設置於周邊區,且第三測試墊與第四測試墊分別電性連接於多個第二感測電極。多個晶片凸塊,分別包含第一連接墊與第二連接墊,而多個第一連接墊分別電性連接多個第一感測電極中之一者,多個第二連接墊分別電性連接多個第二感測電極中之一者。多條第一傳輸走線分別耦接多個第一感測電極中之一者與多個第一連接墊中之一者。多條第二傳輸走線分別耦接多個第二感測電極中之一者與多個第二連接墊中之一者。多條第一周邊走線分別耦接多個第一連接墊中之一者與第一測試墊之間以及多個第一連接墊中之一者與第二測試墊之間。多條第二周邊走線分別耦接於多個第二連接墊中之一者與第三測試墊之間以及多個第二連接墊中之一者與第四測試墊之間。多條第一連接走線分別耦接於多個第一連接墊之二者之間以及多個第一感測電極之二者之間。多條第二連接走線分別耦接於多個第二連接墊之二者之間以及多個第二感測電極之二者之間。 Another aspect of the present case is to provide a display panel. The display panel includes a substrate, a plurality of first sensing electrodes, a plurality of second sensing electrodes, First and second test pads, third and fourth test pads, multiple wafer bumps, multiple first transmission traces, multiple second transmission traces, multiple first peripheral traces, Multiple second peripheral traces, multiple first connection traces, and multiple second connection traces. The substrate has an active area and a peripheral area, wherein the peripheral area is adjacent to the active area. The plurality of first sensing electrodes are disposed in the active area. The plurality of second sensing electrodes are disposed in the active area, and the plurality of first sensing electrodes and the plurality of second sensing electrodes are alternately arranged with each other. The first test pad and the second test pad are respectively disposed in a peripheral area, and the first test pad and the second test pad are electrically connected to a plurality of first sensing electrodes, respectively. The third test pad and the fourth test pad are respectively disposed in the peripheral area, and the third test pad and the fourth test pad are electrically connected to a plurality of second sensing electrodes, respectively. The plurality of wafer bumps each include a first connection pad and a second connection pad, and each of the plurality of first connection pads is electrically connected to one of the plurality of first sensing electrodes, and each of the plurality of second connection pads is electrically connected. One of the plurality of second sensing electrodes is connected. The plurality of first transmission lines are respectively coupled to one of the plurality of first sensing electrodes and one of the plurality of first connection pads. The plurality of second transmission lines are respectively coupled to one of the plurality of second sensing electrodes and one of the plurality of second connection pads. The plurality of first peripheral traces are respectively coupled between one of the plurality of first connection pads and the first test pad, and between one of the plurality of first connection pads and the second test pad. The plurality of second peripheral traces are respectively coupled between one of the plurality of second connection pads and the third test pad, and between one of the plurality of second connection pads and the fourth test pad. The plurality of first connection traces are respectively coupled between the plurality of first connection pads and between the plurality of first sensing electrodes. The plurality of second connection traces are respectively coupled between the plurality of second connection pads and between the plurality of second sensing electrodes.

因此,根據本案之技術態樣,本案之實施例藉由提供一種檢測方法及顯示面板,藉以在顯示面板的生產過程中,檢查多個感測電極之間是否有短路或開路的問題。 Therefore, according to the technical aspect of the present case, the embodiments of the present case provide a detection method and a display panel to check whether there is a short circuit or an open circuit between the plurality of sensing electrodes during the production process of the display panel.

100、200A、200B、300‧‧‧顯示面板 100, 200A, 200B, 300‧‧‧ display panels

110‧‧‧基板 110‧‧‧ substrate

112‧‧‧主動區 112‧‧‧Active Zone

114‧‧‧周邊區 114‧‧‧Peripheral area

120A-120H‧‧‧感測電極 120A-120H‧‧‧Sensor

125A-125H‧‧‧感測電極 125A-125H‧‧‧sensing electrode

130、135‧‧‧連接墊 130, 135‧‧‧Connecting pads

140、145‧‧‧傳輸走線 140, 145‧‧‧ transmission line

150A、150B、155A、155B‧‧‧連接走線 150A, 150B, 155A, 155B‧‧‧

160A、160B、165A、165B‧‧‧周邊走線 160A, 160B, 165A, 165B

170A、170B、170C、170D‧‧‧開關 170A, 170B, 170C, 170D‧‧‧ Switches

175A、175B、175C、175D‧‧‧開關 175A, 175B, 175C, 175D‧‧‧ Switches

190、192、194、196‧‧‧測試墊 190, 192, 194, 196‧‧‧ test pads

310A、310B、310C、310D‧‧‧感測區 310A, 310B, 310C, 310D

400‧‧‧檢測方法 400‧‧‧Test method

S410、S420、S430、S440‧‧‧步驟 S410, S420, S430, S440‧‧‧ steps

S450、S460、S470、S452、S454‧‧‧步驟 S450, S460, S470, S452, S454 ‧‧‧ steps

為讓本發明之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之說明如下:第1圖係根據本案之一些實施例所繪示之一種顯示面板的示意圖;第2A圖係根據本案之一些實施例所繪示之一種顯示面板的示意圖;第2B圖係根據本案之一些實施例所繪示之一種顯示面板的示意圖;第3圖係根據本案之一些實施例所繪示之一種顯示面板的示意圖;第4圖係根據本案之一些實施例所繪示之一種檢測方法的流程圖;以及第5圖係根據本案之一些實施例所繪示之一種第4圖中的其中一步驟的流程圖。 In order to make the above and other objects, features, advantages, and embodiments of the present invention more comprehensible, the description of the drawings is as follows: FIG. 1 is a schematic diagram of a display panel according to some embodiments of the present invention; FIG. 2A is a schematic diagram of a display panel according to some embodiments of the present case; FIG. 2B is a schematic diagram of a display panel according to some embodiments of the present case; FIG. 3 is a diagram of some embodiments according to the present case FIG. 4 is a schematic diagram of a display panel; FIG. 4 is a flowchart of a detection method according to some embodiments of the present invention; and FIG. 5 is a 4th diagram of a detection method according to some embodiments of the present invention. A flowchart of one of the steps in.

以下揭示提供許多不同實施例或例證用以實施本發明的不同特徵。特殊例證中的元件及配置在以下討論中被用來簡化本揭示。所討論的任何例證只用來作解說的用 途,並不會以任何方式限制本發明或其例證之範圍和意義。此外,本揭示在不同例證中可能重複引用數字符號且/或字母,這些重複皆為了簡化及闡述,其本身並未指定以下討論中不同實施例且/或配置之間的關係。 The following disclosure provides many different embodiments or illustrations to implement different features of the invention. The elements and configurations in the particular example are used in the following discussion to simplify the present disclosure. Any examples discussed are for illustrative purposes only. It is not intended to limit the scope and meaning of the invention or its illustrations in any way. In addition, the present disclosure may repeatedly refer to numerical symbols and / or letters in different examples, and these repetitions are for simplification and explanation, and do not themselves specify the relationship between different embodiments and / or configurations in the following discussion.

在全篇說明書與申請專利範圍所使用之用詞(terms),除有特別註明外,通常具有每個用詞使用在此領域中、在此揭露之內容中與特殊內容中的平常意義。某些用以描述本揭露之用詞將於下或在此說明書的別處討論,以提供本領域技術人員在有關本揭露之描述上額外的引導。 The terms used throughout the specification and the scope of patent applications, unless otherwise specified, usually have the ordinary meaning of each term used in this field, in the content disclosed here, and in special content. Certain terms used to describe this disclosure are discussed below or elsewhere in this specification to provide additional guidance to those skilled in the art on the description of this disclosure.

關於本文中所使用之『耦接』或『連接』,均可指二或多個元件互相直接作實體或電性接觸,或是互相間接作實體或電性接觸,而『耦接』或『連接』還可指二或多個元件互相操作或動作。 As used herein, "coupling" or "connection" can mean that two or more components make direct physical or electrical contact with each other, or indirectly make physical or electrical contact with each other, and "coupling" or " "Connected" may also mean that two or more elements operate or act on each other.

在本文中,使用第一、第二與第三等等之詞彙,是用於描述各種元件、組件、區域、層與/或區塊是可以被理解的。但是這些元件、組件、區域、層與/或區塊不應該被這些術語所限制。這些詞彙只限於用來辨別單一元件、組件、區域、層與/或區塊。因此,在下文中的一第一元件、組件、區域、層與/或區塊也可被稱為第二元件、組件、區域、層與/或區塊,而不脫離本發明的本意。如本文所用,詞彙『與/或』包含了列出的關聯項目中的一個或多個的任何組合。本案文件中提到的「及/或」是指表列元件的任一者、全部或至少一者的任意組合。 In this article, the terms first, second, third, etc. are used to describe various elements, components, regions, layers, and / or blocks that are understandable. However, these elements, components, regions, layers and / or blocks should not be limited by these terms. These terms are limited to identifying single elements, components, regions, layers, and / or blocks. Therefore, a first element, component, region, layer, and / or block in the following may also be referred to as a second element, component, region, layer, and / or block without departing from the intention of the present invention. As used herein, the term "and / or" includes any combination of one or more of the associated listed items. The "and / or" mentioned in this document refers to any, all or any combination of at least one of the listed elements.

請參閱第1圖。第1圖係根據本案之一些實施例 所繪示之一種顯示面板100的示意圖。如第1圖所繪示,顯示面板100包含基板110。基板110包含主動區112與周邊區114。周邊區114鄰接於主動區112。於本實施例中,周邊區114係位於主動區112的相對兩側,但本發明不以此為限。多個第一感測電極120A-120H與多個第二感測電極125A-125H設置於主動區112,且多個第一感測電極120A-120H與多個第二感測電極125A-125H彼此交錯配置。第一測試墊190、第二測試墊192、第三測試墊194與第四測試墊196分別設置於周邊區114。於第1圖之實施例中,第一測試墊190與第二測試墊192分別電性連接於多個第一感測電極120A-120H,而第三測試墊194與第四測試墊196分別電性連接於多個第二感測電極125A-125H。 See Figure 1. Figure 1 shows some embodiments according to the present case. A schematic diagram of a display panel 100 is shown. As shown in FIG. 1, the display panel 100 includes a substrate 110. The substrate 110 includes an active region 112 and a peripheral region 114. The peripheral region 114 is adjacent to the active region 112. In this embodiment, the peripheral region 114 is located on two opposite sides of the active region 112, but the present invention is not limited thereto. The plurality of first sensing electrodes 120A-120H and the plurality of second sensing electrodes 125A-125H are disposed in the active area 112, and the plurality of first sensing electrodes 120A-120H and the plurality of second sensing electrodes 125A-125H are each other Staggered configuration. The first test pad 190, the second test pad 192, the third test pad 194, and the fourth test pad 196 are respectively disposed in the peripheral region 114. In the embodiment of FIG. 1, the first test pad 190 and the second test pad 192 are electrically connected to the plurality of first sensing electrodes 120A-120H, respectively, and the third test pad 194 and the fourth test pad 196 are respectively electrically connected. It is sexually connected to a plurality of second sensing electrodes 125A-125H.

於本實施例中,顯示面板100包含多個第一連接墊130與多個第二連接墊135,其中多個第一連接墊130與多個第二連接墊135設置於周邊區114。在一些實施例中,多個第一連接墊130與多個第二連接墊135可視為晶片凸塊(IC bump),以電性連接晶片(IC)。舉例來說,晶片可透過焊料來固定於晶片凸塊,同時焊料也可作為電性連接的媒介。多個第一連接墊130分別電性連接多個第一感測電極120A-120H中之一者,多個第二連接墊135分別電性連接多個第二感測電極125A-125H中之一者。於本實施例中,顯示面板100包含多條第一傳輸走線140與多條第二傳輸走線145。多條第一傳輸走線140分別耦接多個第一感測電極120A-120H中之一者與多個第一連接墊130中之一者,而 多條第二傳輸走線145分別耦接多個第二感測電極125A-125H中之一者與多個第二連接墊135中之一者。換言之,多條第一傳輸走線140與多條第二傳輸走線145分別從周邊區114延伸至主動區112,以作為各連接墊與其對應之感測電極之間的電性傳遞。 In this embodiment, the display panel 100 includes a plurality of first connection pads 130 and a plurality of second connection pads 135, wherein the plurality of first connection pads 130 and the plurality of second connection pads 135 are disposed in the peripheral region 114. In some embodiments, the plurality of first connection pads 130 and the plurality of second connection pads 135 may be regarded as IC bumps for electrically connecting the ICs. For example, the wafer can be fixed to the wafer bump by solder, and the solder can also be used as a medium for electrical connection. The plurality of first connection pads 130 are electrically connected to one of the plurality of first sensing electrodes 120A-120H, and the plurality of second connection pads 135 are electrically connected to one of the plurality of second sensing electrodes 125A-125H. By. In this embodiment, the display panel 100 includes a plurality of first transmission lines 140 and a plurality of second transmission lines 145. The plurality of first transmission lines 140 are respectively coupled to one of the plurality of first sensing electrodes 120A-120H and one of the plurality of first connection pads 130, and The plurality of second transmission lines 145 are respectively coupled to one of the plurality of second sensing electrodes 125A-125H and one of the plurality of second connection pads 135. In other words, the plurality of first transmission lines 140 and the plurality of second transmission lines 145 respectively extend from the peripheral area 114 to the active area 112 to serve as electrical transmission between each connection pad and its corresponding sensing electrode.

在一些實施例中,顯示面板100包含多條第一周邊走線160A、160B與多條第二周邊走線165A、165B,其中多條第一周邊走線160A、160B與多條第二周邊走線165A、165B位於周邊區114。多條第一周邊走線160A、160B,分別耦接多個第一連接墊130中之一者與第一測試墊190之間以及多個第一連接墊130中之一者與第二測試墊192之間。舉例來說,第一周邊走線160A耦接於多個第一連接墊130中之一者與第一測試墊190之間,而第一周邊走線160B耦接於多個第一連接墊130中之一者與第二測試墊192之間。於第1圖之實施例中,多條第二周邊走線165A、165B,分別耦接多個第二連接墊135中之一者與第三測試墊194之間以及多個第二連接墊135中之一者與第四測試墊196之間。舉例來說,第二周邊走線165A耦接於多個第二連接墊135中之一者與第三測試墊194之間,而第二周邊走線165B耦接於多個第二連接墊135中之一者與第四測試墊196之間。換言之,第一周邊走線160A是作為第一連接墊與第一測試墊190之間的電性傳遞,以及第一周邊走線160B是作為第一連接墊與第二測試墊192之間的電性傳遞。相似地,第二周邊走線165A是作為第二連接墊與第三 測試墊194之間的電性傳遞,以及第二周邊走線165B是作為第二連接墊與第四測試墊196之間的電性傳遞。 In some embodiments, the display panel 100 includes a plurality of first peripheral traces 160A, 160B and a plurality of second peripheral traces 165A, 165B, wherein the plurality of first peripheral traces 160A, 160B and a plurality of second peripheral traces The lines 165A, 165B are located in the peripheral area 114. The plurality of first peripheral traces 160A and 160B are respectively coupled between one of the plurality of first connection pads 130 and the first test pad 190 and one of the plurality of first connection pads 130 and the second test pad. Between 192. For example, the first peripheral trace 160A is coupled between one of the plurality of first connection pads 130 and the first test pad 190, and the first peripheral trace 160B is coupled to the plurality of first connection pads 130. One of them is between the second test pad 192. In the embodiment of FIG. 1, a plurality of second peripheral traces 165A and 165B are respectively coupled between one of the plurality of second connection pads 135 and the third test pad 194 and the plurality of second connection pads 135. Between one of them and the fourth test pad 196. For example, the second peripheral trace 165A is coupled between one of the plurality of second connection pads 135 and the third test pad 194, and the second peripheral trace 165B is coupled to the plurality of second connection pads 135. Between one of them and the fourth test pad 196. In other words, the first peripheral trace 160A serves as the electrical transfer between the first connection pad and the first test pad 190, and the first peripheral trace 160B serves as the electrical connection between the first connection pad and the second test pad 192. Sexuality. Similarly, the second peripheral trace 165A is used as the second connection pad and the third The electrical transmission between the test pads 194 and the second peripheral trace 165B serves as the electrical transmission between the second connection pad and the fourth test pad 196.

在一些實施例中,顯示面板100包含多條第一連接走線150A、150B以及多條第二連接走線155A、155B。多條第一連接走線150A、150B,分別耦接於多個第一連接墊130之二者之間以及多個第一感測電極120A-120H之二者之間。舉例來說,第一連接走線150B耦接於多個第一連接墊130之二者之間,而第一連接走線150A耦接於多個第一感測電極120A-120H之二者之間。換言之,多條第一連接走線可分別位於周邊區114以及主動區112。以多條第一連接走線150A來說,其作為兩兩第一感測電極120A-120H之間的電性傳遞,因此可設置於主動區112或從周邊區114延伸至主動區112。以多條第一連接走線150B來說,其可作為兩兩第一連接墊130之間的電性傳遞,且設置於周邊區114。於本實施例中,多條第二連接走線155A、155B,分別耦接於多個第二連接墊135之二者之間以及多個第二感測電極125A-125H之二者之間。舉例來說,第二連接走線155B耦接於多個第二連接墊135之二者之間,第二連接走線155A耦接於多個第二感測電極125A-125H之二者之間。具體而言,多條第二連接走線可分別位於周邊區114以及主動區112。以多條第二連接走線155A來說,其作為兩兩第二感測電極125A-125H之間的電性傳遞,因此可設置於主動區112或從周邊區114延伸至主動區112。以多條第二連接走線150B來說,其可作為兩兩 第二連接墊135之間的電性傳遞,且設置於周邊區114。為了方便說明,於第1圖中僅繪示8個第一感測電極120與8個第二感測電極125,然而,本案並不以此為限。在一些實施例中,周邊區114可包含晶片(未繪示),且晶片可對應於第一連接墊130與第二連接墊135而設置,以透過連接墊使得晶片與第一感測電極120A-120H與第二感測電極125A-125H能彼此電性傳遞。 In some embodiments, the display panel 100 includes a plurality of first connection tracks 150A and 150B and a plurality of second connection tracks 155A and 155B. The plurality of first connection tracks 150A and 150B are respectively coupled between the plurality of first connection pads 130 and between the plurality of first sensing electrodes 120A-120H. For example, the first connection trace 150B is coupled between two of the plurality of first connection pads 130, and the first connection trace 150A is coupled between two of the plurality of first sensing electrodes 120A-120H. between. In other words, the plurality of first connection tracks may be located in the peripheral area 114 and the active area 112, respectively. Taking the plurality of first connection traces 150A as electrical transmissions between the pair of first sensing electrodes 120A-120H, they can be disposed in the active region 112 or extended from the peripheral region 114 to the active region 112. Taking the plurality of first connection traces 150B as an example, the first connection traces 150B can be used as electrical transmission between the pair of first connection pads 130 and disposed in the peripheral region 114. In this embodiment, a plurality of second connection traces 155A, 155B are respectively coupled between the plurality of second connection pads 135 and between the plurality of second sensing electrodes 125A-125H. For example, the second connection trace 155B is coupled between the two second connection pads 135, and the second connection trace 155A is coupled between the two second sensing electrodes 125A-125H. . Specifically, the plurality of second connection traces may be located in the peripheral area 114 and the active area 112, respectively. Taking the plurality of second connection traces 155A as electrical transmission between the pair of second sensing electrodes 125A-125H, the second connection traces 155A may be disposed in the active region 112 or extended from the peripheral region 114 to the active region 112. For multiple second connection traces 150B, they can be used as two pairs The second connection pads 135 are electrically transferred and are disposed in the peripheral region 114. For the convenience of description, only eight first sensing electrodes 120 and eight second sensing electrodes 125 are shown in the first figure. However, this case is not limited thereto. In some embodiments, the peripheral region 114 may include a chip (not shown), and the chip may be disposed corresponding to the first connection pad 130 and the second connection pad 135 to allow the chip and the first sensing electrode 120A to pass through the connection pad. -120H and the second sensing electrodes 125A-125H can be electrically transferred to each other.

在一些實施例中,顯示面板100更包含多個第一開關170A、170B、170C、170D與多個第二開關175A、175B、175C、175D。多個第一開關170A、170B、170C、170D與多個第二開關175A、175B、175C、175D分別設置於周邊區114。多個第一開關170A、170B、170C、170D分別透過第一周邊走線160A、160B而耦接於多個第一連接墊130之一者與第一測試墊190之間、多個第一連接墊130之一者與第二測試墊192之間,以及透過第一連接走線150A、150B而耦接於多個第一連接墊130之二者之間、多個第一感測電極120A-1210H之二者之間。具體而言,第一開關170A耦接於多個第一連接墊130之一者與第一測試墊190之間,以作為控制第一連接墊130與第一測試墊190之間是否電性連接。第一開關170B耦接於多個第一連接墊130之一者與第二測試墊192之間,以作為控制第一連接墊130與第二測試墊192之間是否電性連接。相似地,第一開關170C透過第一連接走線150A、150B而耦接於多個第一連接墊130之二者之間,以作為控制兩兩第一連接墊130之 間是否電性連接。第一開關170D透過第一連接走線150A、150B而耦接於多個第一感測電極120A-120H之二者之間,以作為控制兩兩第一感測電極120之間是否電性連接。於本實施例中,第一開關170A、170B、170C與170D是位於周邊區114,其中第一開關170是位於主動區112之一側邊,而其他第一開關170A、170B與170C則位於主動區112之另一側邊,使得第一開關170A、170B、170C、第一測試墊190、第二測試墊192、第三測試墊194與第四測試墊196設置於相同側邊。但本發明不以此為限,於其他實施例中,可依走線設計、測試墊、周邊區布局不同,而調整第一開關的位置,能達到控制第一感測電極、第一連接墊、第一測試墊與第二測試墊之間的電性導通關係即可。 In some embodiments, the display panel 100 further includes a plurality of first switches 170A, 170B, 170C, and 170D and a plurality of second switches 175A, 175B, 175C, and 175D. The plurality of first switches 170A, 170B, 170C, and 170D and the plurality of second switches 175A, 175B, 175C, and 175D are respectively disposed in the peripheral region 114. The plurality of first switches 170A, 170B, 170C, and 170D are respectively coupled to one of the plurality of first connection pads 130 and the first test pad 190 through the first peripheral wirings 160A and 160B. One of the plurality of first sensing electrodes 120A- between one of the pads 130 and the second test pad 192 and coupled between two of the plurality of first connection pads 130 through the first connection traces 150A and 150B. 1210H in between. Specifically, the first switch 170A is coupled between one of the plurality of first connection pads 130 and the first test pad 190 to control whether the first connection pad 130 and the first test pad 190 are electrically connected. . The first switch 170B is coupled between one of the first connection pads 130 and the second test pad 192 to control whether the first connection pad 130 and the second test pad 192 are electrically connected. Similarly, the first switch 170C is coupled between two of the plurality of first connection pads 130 through the first connection wires 150A and 150B to control the pair of first connection pads 130. Whether it is electrically connected. The first switch 170D is coupled between the plurality of first sensing electrodes 120A-120H through the first connection wires 150A and 150B to control whether the two first sensing electrodes 120 are electrically connected. . In this embodiment, the first switches 170A, 170B, 170C, and 170D are located in the peripheral area 114. The first switch 170 is located on one side of the active area 112, and the other first switches 170A, 170B, and 170C are located in the active area. The other side of the region 112 is such that the first switches 170A, 170B, 170C, the first test pad 190, the second test pad 192, the third test pad 194, and the fourth test pad 196 are disposed on the same side. However, the present invention is not limited to this. In other embodiments, the position of the first switch can be adjusted according to different wiring designs, test pads, and layout of the peripheral area, and the first sensing electrode and the first connection pad can be controlled. The electrical conduction relationship between the first test pad and the second test pad is sufficient.

在一些實施例中,多個第二開關175A、175B、175C、175D分別透過第二周邊走線165A、165B而耦接於多個第二連接墊135之一者與第三測試墊194之間、多個第二連接墊135之一者與第四測試墊196之間,以及透過第二連接走線155A、155B而耦接於多個第二連接墊135之二者之間、多個第二感測電極125之二者之間。具體而言,第二開關175A耦接於多個第二連接墊135之一者與第三測試墊194之間,以作為控制第二連接墊135與第三測試墊194之間是否電性連接。第二開關175B耦接於多個第二連接墊135之一者與第四測試墊196之間,以作為控制第二連接墊135與第四測試墊196之間是否電性連接。相似地,第二開關175C透過第二連接走線155A、155B而耦接於多個第二 連接墊135之二者之間,以作為控制兩兩第二連接墊135之間是否電性連接。第二開關175D透過第二連接走線155A、155B而耦接於多個第二感測電極125A-125H之二者之間,以作為控制兩兩第二感測電極125A-125H之間是否電性連接。於本實施例中,第二開關180A、180B、180C與180D是位於周邊區114,其中第二開關180是位於主動區112之一側邊,而其他第二開關180A、180B與180C則位於主動區112之另一側邊,使得第二開關180A、180B、180C、第一測試墊190、第二測試墊192、第三測試墊194與第四測試墊196設置於相同側邊。但本發明不以此為限,於其他實施例中,可依走線設計、測試墊、周邊區布局不同,而調整第二開關的位置,能達到控制第二感測電極、第二連接墊、第三測試墊與第四測試墊之間的電性導通關係即可。在一些實施例中,多個第一開關170A、170B、170C、170D與多個第二開關175A、175B、175C、175D可為薄膜電晶體(TFT),但本案不以此為限。 In some embodiments, the plurality of second switches 175A, 175B, 175C, and 175D are respectively coupled between one of the plurality of second connection pads 135 and the third test pad 194 through the second peripheral wiring 165A, 165B. Between one of the plurality of second connection pads 135 and the fourth test pad 196, and between two of the plurality of second connection pads 135 through the second connection traces 155A, 155B, a plurality of first Between the two sensing electrodes 125. Specifically, the second switch 175A is coupled between one of the plurality of second connection pads 135 and the third test pad 194 to control whether the second connection pad 135 and the third test pad 194 are electrically connected. . The second switch 175B is coupled between one of the plurality of second connection pads 135 and the fourth test pad 196 to control whether the second connection pad 135 and the fourth test pad 196 are electrically connected. Similarly, the second switch 175C is coupled to a plurality of second switches through the second connection wires 155A and 155B. The two connection pads 135 are used to control whether the two second connection pads 135 are electrically connected. The second switch 175D is coupled between two of the plurality of second sensing electrodes 125A-125H through the second connection wires 155A and 155B to control whether the two second sensing electrodes 125A-125H are electrically connected. Sexual connection. In this embodiment, the second switches 180A, 180B, 180C, and 180D are located in the peripheral area 114. The second switch 180 is located on one side of the active area 112, and the other second switches 180A, 180B, and 180C are located in the active area. The other side of the region 112 is such that the second switches 180A, 180B, 180C, the first test pad 190, the second test pad 192, the third test pad 194, and the fourth test pad 196 are disposed on the same side. However, the present invention is not limited to this. In other embodiments, the position of the second switch can be adjusted according to the layout design, the test pad, and the layout of the peripheral area, and the second sensing electrode and the second connection pad can be controlled. 3. The electrical conduction relationship between the third test pad and the fourth test pad is sufficient. In some embodiments, the plurality of first switches 170A, 170B, 170C, and 170D and the plurality of second switches 175A, 175B, 175C, and 175D may be thin film transistors (TFTs), but the present invention is not limited thereto.

請參閱第2A圖。第2A圖係根據本案之一些實施例所繪示之一種顯示面板200A的示意圖。顯示面板200A與第1圖中的顯示面板100相同,但為了方便說明與理解,顯示面板200A僅繪示第1圖中的顯示面板100的部分元件與走線,用以表達各元件與第一測試墊190、第二測試墊192的連接關係。如第2A圖所繪示,第一感測電極120A、120B、120C、120D互相串聯而形成第一感測電極串,第一感測電極120E、120F、120G、120H互相串聯而形成第 一感測電極串。詳言之,由第一測試墊190起始,經由第一周邊走線160A、第一開關170A、第一傳輸走線140、第一連接墊130連接至第一感測電極120A,第一感測電極120A經由第一連接走線150A、第一開關170D連接至第一感測電極120B,第一感測電極120B經由第一傳輸走線140、第一連接墊130、第一連接走線150B、第一開關170C連接至第一感測電極120C,第一感測電極120C經由第一連接走線150A、第一開關170D連接至第一感測電極120D,第一感測電極120D經由第一傳輸走線140、第一連接墊130、第一開關170B、第一周邊走線160B連接至第二測試墊192,以形成第一感測電極串。由第一測試墊190起始,經由第一周邊走線160A、第一開關170A、第一傳輸走線140、第一連接墊130連接至感測電極120E,感測電極120E經由連接走線150A、第一開關170D連接至第一感測電極120F,第一感測電極120F經由第一傳輸走線140、第一連接墊130、第一連接走線150B、第一開關170C連接至第一感測電極120G,第一感測電極120G經由第一連接走線150A、第一開關170D連接至第一感測電極120H,第一感測電極120H經由第一傳輸走線140、第一連接墊130、第一開關170B、第一周邊走線160B連接至第二測試墊192,以形成另一個第一感測電極串。第一感測電極120A、120B、120C、120D的第一感測電極串與第一感測電極120E、120F、120G、120H的另一第一感測電極串彼此互相並聯。換言之,從第一測試墊190透過多個第一感測電極而電性連接至第二測 試墊192的導通路徑中,可形成第一感測電極串。如此一來,顯示面板則可形成多個第一感測電極串,且這些第一感測電極串則呈現並聯關係。如以第2A圖之實施例來看,顯示面板200A則設有兩個第一感測電極串,其一為第一測試墊190、第一感測電極120A、第一感測電極120B、第一感測電極120C、第一感測電極120D與第二測試墊192所形成的導通路徑;另一為第一測試墊190、第一感測電極120E、第一感測電極120F、第一感測電極120G、第一感測電極120H與第二測試墊192所形成的導通路徑。 See Figure 2A. FIG. 2A is a schematic diagram of a display panel 200A according to some embodiments of the present invention. The display panel 200A is the same as the display panel 100 in FIG. 1, but for the convenience of explanation and understanding, the display panel 200A only shows a part of components and traces of the display panel 100 in FIG. 1 to express each component and the first The connection relationship between the test pad 190 and the second test pad 192. As shown in Figure 2A, the first sensing electrodes 120A, 120B, 120C, and 120D are connected in series with each other to form a first sensing electrode string, and the first sensing electrodes 120E, 120F, 120G, and 120H are connected in series with each other to form a first sensing electrode string. A sensing electrode string. In detail, starting from the first test pad 190, the first sensing pad 120A is connected to the first sensing electrode 120A via the first peripheral wiring 160A, the first switch 170A, the first transmission wiring 140, and the first connection pad 130. The test electrode 120A is connected to the first sensing electrode 120B through the first connection wiring 150A and the first switch 170D. The first sensing electrode 120B is connected to the first transmission wiring 140, the first connection pad 130, and the first connection wiring 150B. 1. The first switch 170C is connected to the first sensing electrode 120C, the first sensing electrode 120C is connected to the first sensing electrode 120D via the first connection trace 150A, the first switch 170D is connected to the first sensing electrode 120D, and the first sensing electrode 120D is connected via the first The transmission trace 140, the first connection pad 130, the first switch 170B, and the first peripheral trace 160B are connected to the second test pad 192 to form a first sensing electrode string. Starting from the first test pad 190, it is connected to the sensing electrode 120E through the first peripheral wiring 160A, the first switch 170A, the first transmission wiring 140, and the first connection pad 130, and the sensing electrode 120E is connected to the 150A The first switch 170D is connected to the first sensing electrode 120F. The first sensing electrode 120F is connected to the first sensor via the first transmission line 140, the first connection pad 130, the first connection line 150B, and the first switch 170C. The measuring electrode 120G, the first sensing electrode 120G is connected to the first sensing electrode 120H via the first connection wiring 150A and the first switch 170D, and the first sensing electrode 120H is connected via the first transmission wiring 140 and the first connection pad 130 The first switch 170B and the first peripheral trace 160B are connected to the second test pad 192 to form another first sensing electrode string. The first sensing electrode string of the first sensing electrodes 120A, 120B, 120C, and 120D and another first sensing electrode string of the first sensing electrodes 120E, 120F, 120G, and 120H are connected to each other in parallel. In other words, the first test pad 190 is electrically connected to the second test pad through a plurality of first sensing electrodes. In the conducting path of the test pad 192, a first sensing electrode string may be formed. In this way, the display panel can form a plurality of first sensing electrode strings, and these first sensing electrode strings are in a parallel relationship. As shown in the embodiment of FIG. 2A, the display panel 200A is provided with two first sensing electrode strings, one of which is a first test pad 190, a first sensing electrode 120A, a first sensing electrode 120B, A conductive path formed by a sensing electrode 120C, a first sensing electrode 120D, and a second test pad 192; the other is a first test pad 190, a first sensing electrode 120E, a first sensing electrode 120F, and a first sensing pad. The conductive paths formed by the test electrodes 120G, the first sensing electrodes 120H, and the second test pad 192.

在一些實施例中,第一感測電極120A-120H透過多條第一傳輸走線140、多條第一周邊走線160A、160B與多條第一連接走線150A、150B而互相串聯及/或並聯。如第2A圖所繪示之第一感測電極120A-120H的串聯與並聯數目僅作為例示,本案不以此為限。 In some embodiments, the first sensing electrodes 120A-120H are connected in series with each other through a plurality of first transmission lines 140, a plurality of first peripheral lines 160A, 160B and a plurality of first connection lines 150A, 150B and / Or in parallel. The number of series and parallel connections of the first sensing electrodes 120A-120H as shown in FIG. 2A is only an example, and this case is not limited thereto.

請參閱第2B圖。第2B圖係根據本案之一些實施例所繪示之一種顯示面板200B的示意圖。顯示面板200B與第1圖中的顯示面板100相同,但為了方便說明與理解,顯示面板200B僅繪示第1圖中的顯示面板100的部分元件與走線。如第2B圖所繪示,第二感測電極125A、125B、125C、125D互相串聯而形成第二感測電極串,第二感測電極125E、125F、125G、125H互相串聯而形成第二感測電極串。詳言之,由第三測試墊194起始,經由第二周邊走線165A、第二開關175A、第二傳輸走線145、第二連接墊135連接至第二感測電極125A,第二感測電極125A經由第二連 接走線155A、第二開關175D連接至第二感測電極125B,第二感測電極125B經由第二傳輸走線145、第二連接墊135、第二連接走線155B、第二開關175C連接至第二感測電極125C,第二感測電極125C經由第二連接走線155A、第二開關175D連接至第二感測電極125D,第二感測電極125D經由第二傳輸走線145、第二連接墊135、第二開關175B、第二周邊走線165B連接至第四測試墊196,以形成第二感測電極串。由第三測試墊194起始,經由第二周邊走線165A、第二開關175A、第二傳輸走線145、第二連接墊135連接至第二感測電極125E,第二感測電極125E經由第二連接走線155A、第二開關175D連接至第二感測電極125F,第二感測電極125F經由第二傳輸走線145、第二連接墊135、第二連接走線155B、第二開關175C連接至第二感測電極125G,第二感測電極125G經由第二連接走線155A、第二開關175D連接至第二感測電極125H,第二感測電極125H經由第二傳輸走線145、第二連接墊135、第二開關175B、第二周邊走線165B連接至第四測試墊196,以形成另一個第二感測電極串。由第二感測電極125A、125B、125C、125D互相串聯而形成的第二感測電極串與由第二感測電極125E、125F、125G、125H互相串聯而形成的第二感測電極串彼此互相並聯。換言之,從第三測試墊194透過多個第二感測電極而電性連接至第四測試墊196的導通路徑中,可形成第二感測電極串。如此一來,顯示面板則可形成多個第二感測電極串,且這些第二感測電極串則呈 現並聯關係。如以第2B圖之實施例來看,顯示面板200B則設有兩個第二感測電極串,其一為第三測試墊194、第二感測電極125A、第二感測電極125B、第二感測電極125C、第二感測電極125D與第四測試墊196所形成的導通路徑;另一為第三測試墊194、第二感測電極125E、第二感測電極125F、第二感測電極125G、第二感測電極125H與第四測試墊196所形成的導通路徑。 See Figure 2B. FIG. 2B is a schematic diagram of a display panel 200B according to some embodiments of the present invention. The display panel 200B is the same as the display panel 100 in FIG. 1, but for the convenience of explanation and understanding, the display panel 200B only shows a part of the elements and wirings of the display panel 100 in FIG. 1. As shown in FIG. 2B, the second sensing electrodes 125A, 125B, 125C, and 125D are connected in series with each other to form a second sensing electrode string, and the second sensing electrodes 125E, 125F, 125G, and 125H are connected in series with each other to form a second sensing electrode. Test electrode string. In detail, starting from the third test pad 194, it is connected to the second sensing electrode 125A via the second peripheral wiring 165A, the second switch 175A, the second transmission wiring 145, and the second connection pad 135. 125A electrode The wiring 155A and the second switch 175D are connected to the second sensing electrode 125B. The second sensing electrode 125B is connected through the second transmission wiring 145, the second connection pad 135, the second connection wiring 155B, and the second switch 175C. To the second sensing electrode 125C, the second sensing electrode 125C is connected to the second sensing electrode 125D through the second connection wiring 155A and the second switch 175D, and the second sensing electrode 125D is connected through the second transmission wiring 145, the first The two connection pads 135, the second switch 175B, and the second peripheral wiring 165B are connected to the fourth test pad 196 to form a second sensing electrode string. Starting from the third test pad 194, the second sensing electrode 125E is connected to the second sensing electrode 125E through the second peripheral wiring 165A, the second switch 175A, the second transmission wiring 145, and the second connection pad 135. The second connection wiring 155A and the second switch 175D are connected to the second sensing electrode 125F. The second sensing electrode 125F passes through the second transmission wiring 145, the second connection pad 135, the second connection wiring 155B, and the second switch. 175C is connected to the second sensing electrode 125G, the second sensing electrode 125G is connected to the second sensing electrode 125H through the second connection wiring 155A, the second switch 175D, and the second sensing electrode 125H is connected to the second transmission wiring 145 The second connection pad 135, the second switch 175B, and the second peripheral trace 165B are connected to the fourth test pad 196 to form another second sensing electrode string. A second sensing electrode string formed by the second sensing electrodes 125A, 125B, 125C, 125D connected in series with each other and a second sensing electrode string formed by the second sensing electrodes 125E, 125F, 125G, 125H connected in series with each other Parallel to each other. In other words, a second sensing electrode string may be formed in a conducting path electrically connected from the third test pad 194 to the fourth test pad 196 through the plurality of second sensing electrodes. In this way, the display panel can form a plurality of second sensing electrode strings, and these second sensing electrode strings are Now in parallel relationship. As shown in the embodiment of FIG. 2B, the display panel 200B is provided with two second sensing electrode strings, one of which is a third test pad 194, a second sensing electrode 125A, a second sensing electrode 125B, a first Conduction paths formed by the two sensing electrodes 125C, the second sensing electrode 125D, and the fourth test pad 196; the other is the third test pad 194, the second sensing electrode 125E, the second sensing electrode 125F, and the second sensing pad. Conducting paths formed by the test electrodes 125G, the second sensing electrodes 125H, and the fourth test pad 196.

在一些實施例中,第二感測電極125A-125H透過多條第二傳輸走線145、多條第二周邊走線165A、165B與多條第二連接走線155A、155B而互相串聯及/或並聯。如第2B圖所繪示之第二感測電極125A-125H的串聯與並聯數目僅作為例示,本案不以此為限。 In some embodiments, the second sensing electrodes 125A-125H are connected in series with each other through a plurality of second transmission lines 145, a plurality of second peripheral lines 165A, 165B and a plurality of second connection lines 155A, 155B and / Or in parallel. The number of series and parallel connections of the second sensing electrodes 125A-125H as shown in FIG. 2B is only an example, and this case is not limited thereto.

請參閱第3圖。第3圖係根據本案之一些實施例所繪示之一種顯示面板300的示意圖。如第3圖所繪示,多個第一感測電極120A-120H與多個第二感測電極125A-125H設置於主動區112。主動區112包含多個感測區310A-310D。感測區310A包含第一感測電極120A-120D與第二感測電極125A-125D。感測區310B包含第一感測電極120E-120H與第二感測電極125E-125H。感測區310A中的第一感測電極120A-120D與第二感測電極125A-125D連接方式如第1圖、第2A圖或第2B圖所繪示。感測區310B中的第一感測電極120E-120H與第二感測電極125E-125H連接方式如第1圖、第2A圖或第2B圖所繪示。為了方便解釋,每一感測區中的連接方式並未於第3圖 繪示,而第3圖則表示出各感測區之間與其外部元件的連接關係。 See Figure 3. FIG. 3 is a schematic diagram of a display panel 300 according to some embodiments of the present invention. As shown in FIG. 3, a plurality of first sensing electrodes 120A-120H and a plurality of second sensing electrodes 125A-125H are disposed in the active region 112. The active area 112 includes a plurality of sensing areas 310A-310D. The sensing area 310A includes first sensing electrodes 120A-120D and second sensing electrodes 125A-125D. The sensing area 310B includes a first sensing electrode 120E-120H and a second sensing electrode 125E-125H. The connection manner of the first sensing electrodes 120A-120D and the second sensing electrodes 125A-125D in the sensing area 310A is as shown in FIG. 1, FIG. 2A, or FIG. 2B. The connection manner of the first sensing electrodes 120E-120H and the second sensing electrodes 125E-125H in the sensing area 310B is as shown in FIG. 1, FIG. 2A, or FIG. 2B. For the convenience of explanation, the connection method in each sensing area is not shown in Figure 3. Figure 3 shows the connection relationship between each sensing area and its external components.

舉例來說,如第1圖所繪示,同一感測區中的第一感測電極120透過多個第一開關170A、170B、170C與170D中的至少一者而耦接,以形成第一感測電極串。同一感測區中的第二感測電極125透過多個第二開關175A、175B、175C與175D中的至少一者而耦接,以形成第二感測電極串。第3圖中的顯示面板300為第1圖中的顯示面板100的另一種實施例。 For example, as shown in FIG. 1, the first sensing electrodes 120 in the same sensing area are coupled through at least one of the plurality of first switches 170A, 170B, 170C, and 170D to form a first Sense electrode string. The second sensing electrodes 125 in the same sensing area are coupled through at least one of the plurality of second switches 175A, 175B, 175C, and 175D to form a second sensing electrode string. The display panel 300 in FIG. 3 is another embodiment of the display panel 100 in FIG. 1.

為了方便說明與理解,第3圖中僅繪示第1圖中的部分元件與走線,然而,第3圖中的顯示面板300的各個元件之間的連接方式與第1圖中的顯示面板100的各個元件之間的連接方式相類似。 For the convenience of explanation and understanding, FIG. 3 only shows some of the components and traces in FIG. 1. However, the connection methods between the components of the display panel 300 in FIG. 3 and the display panel in FIG. 1 The connections between the various components of the 100 are similar.

請再參閱第3圖,位於不同感測區的多個第一感測電極串以並聯方式耦接於第一測試墊190與第二測試墊192。位於不同感測區的多個第二感測電極串以並聯方式耦接於第三測試墊194與第四測試墊196。例如,位於感測區310A中的第一感測電極串與位於感測區310B中的第一感測電極串以並聯方式耦接於第一測試墊190與第二測試墊192。詳細而言,由第一測試墊190、第一感測電極120A、第一感測電極120B、第一感測電極120C、第一感測電極120D與第二測試墊192所形成的導通路徑,與由第一測試墊190、第一感測電極120E、第一感測電極120F、第一感測電極120G、第一感測電極120H與第二測試墊192所形成 的導通路徑互相並聯。位於感測區310A中的第二感測電極串與位於感測區310B中的第二感測電極串以並聯方式耦接於第三測試墊194與第四測試墊196。詳細而言,由第三測試墊194、第二感測電極125A、第二感測電極125B、第二感測電極125C、第二感測電極125D與第四測試墊196所形成的導通路徑,與由第三測試墊194、第二感測電極125E、第二感測電極125F、第二感測電極125G、第二感測電極125H與第四測試墊196所形成的導通路徑彼此並聯。 Please refer to FIG. 3 again, a plurality of first sensing electrode strings located in different sensing regions are coupled in parallel to the first test pad 190 and the second test pad 192. A plurality of second sensing electrode strings located in different sensing regions are coupled in parallel to the third test pad 194 and the fourth test pad 196. For example, the first sensing electrode string located in the sensing area 310A and the first sensing electrode string located in the sensing area 310B are coupled in parallel to the first test pad 190 and the second test pad 192. In detail, the conduction path formed by the first test pad 190, the first sensing electrode 120A, the first sensing electrode 120B, the first sensing electrode 120C, the first sensing electrode 120D, and the second test pad 192, Formed with the first test pad 190, the first sensing electrode 120E, the first sensing electrode 120F, the first sensing electrode 120G, the first sensing electrode 120H, and the second test pad 192 The conduction paths are parallel to each other. The second sensing electrode string located in the sensing area 310A and the second sensing electrode string located in the sensing area 310B are coupled in parallel to the third test pad 194 and the fourth test pad 196. In detail, the conduction path formed by the third test pad 194, the second sensing electrode 125A, the second sensing electrode 125B, the second sensing electrode 125C, the second sensing electrode 125D, and the fourth test pad 196, The conductive paths formed by the third test pad 194, the second sensing electrode 125E, the second sensing electrode 125F, the second sensing electrode 125G, the second sensing electrode 125H, and the fourth test pad 196 are connected in parallel with each other.

為了方便說明與理解,關於第1圖、第2A圖、第2B圖以及第3圖的詳細檢測方法,將於以下配合第4圖一併說明。 For the convenience of explanation and understanding, the detailed detection methods of FIG. 1, FIG. 2A, FIG. 2B, and FIG. 3 will be described below in conjunction with FIG. 4.

請參閱第4圖。第4圖係根據本案之一些實施例所繪示之一種檢測方法400的流程圖。檢測方法400包含以下步驟:S410:開啟多個第一開關中的至少一者以導通多個第一感測電極中的至少一者;S420:經由第一測試墊以及第二測試墊,量測第一阻抗值;S430:開啟多個第二開關中的至少一者以導通多個第二感測電極中的至少一者;S440:經由第三測試墊以及第四測試墊,量測第二阻抗值;S450:依據第一阻抗值與第二阻抗值判斷多個第一感測電極中的至少一者與多個第二感測電極中的至少 一者是否為開路狀態;S460:經由第二測試墊以及第三測試墊,量測第三阻抗值;以及S470:依據第三阻抗值判斷多個第一感測電極中的至少一者與多個第二感測電極中的至少一者是否為短路狀態。 See Figure 4. FIG. 4 is a flowchart of a detection method 400 according to some embodiments of the present invention. The detection method 400 includes the following steps: S410: Turn on at least one of the plurality of first switches to turn on at least one of the plurality of first sensing electrodes; S420: Measure through the first test pad and the second test pad First impedance value; S430: turning on at least one of the plurality of second switches to turn on at least one of the plurality of second sensing electrodes; S440: measuring the second through the third test pad and the fourth test pad Impedance value; S450: judging at least one of the plurality of first sensing electrodes and at least one of the plurality of second sensing electrodes according to the first impedance value and the second impedance value Whether one is in an open circuit state; S460: Measure the third impedance value via the second test pad and the third test pad; and S470: Determine at least one of the plurality of first sensing electrodes and more according to the third impedance value. Whether at least one of the second sensing electrodes is in a short-circuit state.

步驟S410:開啟多個第一開關中的至少一者以導通多個第一感測電極中的至少一者。請一併參閱第4圖與第2A圖。在一些實施例中,開啟耦接於第一感測電極120A與第一感測電極120B之間的第一開關170D,開啟耦接於第一感測電極120A與第一感測電極120C之間的第一開關170D,開啟透過多個第一連接墊130中的至少一者而耦接於第一感測電極120B與第一感測電極120C之間的第一開關170C,開啟透過多個第一連接墊130中的至少一者而耦接於第一感測電極120B與第一測試墊190之間的第一開關170A,並開啟透過多個第一連接墊130中的至少一者而耦接於第一感測電極120D與第二測試墊192之間的第一開關170B,以導通第一感測電極120A、120B、120C、120D。 Step S410: Turn on at least one of the plurality of first switches to turn on at least one of the plurality of first sensing electrodes. Please refer to Figure 4 and Figure 2A together. In some embodiments, the first switch 170D coupled between the first sensing electrode 120A and the first sensing electrode 120B is turned on, and the coupling between the first sensing electrode 120A and the first sensing electrode 120C is turned on. The first switch 170D is turned on, and the first switch 170C coupled between the first sensing electrode 120B and the first sensing electrode 120C through at least one of the plurality of first connection pads 130 is turned on. A connection pad 130 is coupled to at least one of the first switches 170A between the first sensing electrode 120B and the first test pad 190, and is coupled through at least one of the plurality of first connection pads 130. The first switch 170B is connected between the first sensing electrode 120D and the second test pad 192 to turn on the first sensing electrodes 120A, 120B, 120C, and 120D.

上述的示例為僅導通一個第一感測電極串的情況,於本案中,亦可同時導通多個第一感測電極串,本案不以此為限。在一些實施例中,步驟S410可由周邊區114的晶片所執行。具體而言,步驟S410係控制第一開關來達到各第一感測電極可電性連接於第一測試墊190與第二測試墊192,意即使第一感測電極串能夠形成電性導通的路徑。 The above example is a case where only one first sensing electrode string is turned on. In this case, multiple first sensing electrode strings may be turned on at the same time, which is not limited in this case. In some embodiments, step S410 may be performed by a wafer in the peripheral region 114. Specifically, step S410 is to control the first switch so that each first sensing electrode can be electrically connected to the first test pad 190 and the second test pad 192, which means that even if the first sensing electrode string can form an electrically conductive path.

步驟S420:經由第一測試墊以及第二測試墊,量測第一阻抗值。舉例來說,在一些實施例中,若是於步驟S410中,導通第一感測電極120A-120D,於步驟S420中,可經由第一測試墊190與第二測試墊192量測第一感測電極120A-120D的第一阻抗值。若是於步驟S410中,導通第一感測電極120A-120H,於步驟S420中,可經由第一測試墊190與第二測試墊192量測第一感測電極120A-120H的第一阻抗值。在一些實施例中,步驟S420可由三用電表執行。在一些實施例中,步驟S420可由周邊區114的晶片所執行。 Step S420: Measure the first impedance value via the first test pad and the second test pad. For example, in some embodiments, if the first sensing electrodes 120A-120D are turned on in step S410, in step S420, the first sensing can be measured via the first test pad 190 and the second test pad 192. The first impedance value of the electrodes 120A-120D. If the first sensing electrodes 120A-120H are turned on in step S410, the first impedance values of the first sensing electrodes 120A-120H can be measured through the first test pad 190 and the second test pad 192 in step S420. In some embodiments, step S420 may be performed by a tri-meter. In some embodiments, step S420 may be performed by a wafer in the peripheral region 114.

步驟S430:開啟多個第二開關中的至少一者以導通多個第二感測電極中的至少一者。請一併參閱第4圖與第2B圖。在一些實施例中,開啟耦接於第二感測電極125A與第二感測電極125B之間的第二開關175D,開啟耦接於第二感測電極125A與第二感測電極125C之間的第二開關175D,開啟透過多個第二連接墊135中的至少一者而耦接於第二感測電極125B與第二感測電極125C之間的第二開關175C,開啟透過多個第二連接墊135中的至少一者而耦接於第二感測電極125B與第三測試墊194之間的第二開關175A,並開啟透過多個第二連接墊135中的至少一者而耦接於第二感測電極125D與第四測試墊196之間的第二開關175B,以導通第二感測電極125A、125B、125C、125D。 Step S430: Turn on at least one of the plurality of second switches to turn on at least one of the plurality of second sensing electrodes. Please refer to Figure 4 and Figure 2B together. In some embodiments, the second switch 175D coupled between the second sensing electrode 125A and the second sensing electrode 125B is turned on, and the second switch 175D is coupled between the second sensing electrode 125A and the second sensing electrode 125C. The second switch 175D is turned on, and the second switch 175C coupled between the second sensing electrode 125B and the second sensing electrode 125C through at least one of the plurality of second connection pads 135 is turned on. At least one of the two connection pads 135 is coupled to the second switch 175A between the second sensing electrode 125B and the third test pad 194, and is coupled through at least one of the plurality of second connection pads 135. A second switch 175B is connected between the second sensing electrode 125D and the fourth test pad 196 to turn on the second sensing electrodes 125A, 125B, 125C, and 125D.

上述的示例為僅導通一個第二感測電極串的情況,於本案中,亦可同時導通多個第二感測電極串,本案不以此為限。在一些實施例中,步驟S430可由周邊區114的晶 片所執行。具體而言,步驟S430係控制第二開關來達到各第二感測電極可電性連接於第三測試墊194與第四測試墊196,意即使第二感測電極串能夠形成電性導通的路徑。 The above example is a case where only one second sensing electrode string is turned on. In this case, multiple second sensing electrode strings may be turned on at the same time, which is not limited in this case. In some embodiments, step S430 may be performed by the crystal of the peripheral region 114. Film. Specifically, step S430 controls the second switch so that each second sensing electrode can be electrically connected to the third test pad 194 and the fourth test pad 196, which means that even if the second sensing electrode string can form an electrically conductive path.

步驟S440:經由第三測試墊以及第四測試墊,量測第二阻抗值。舉例來說,在一些實施例中,若是於步驟S430中,導通第二感測電極125A-125D,於步驟S440中,可經由第三測試墊194與第四測試墊196量測第二感測電極125A-125D的第一阻抗值。若是於步驟S430中,導通第二感測電極125A-125J,於步驟S440中,可經由第三測試墊194與第四測試墊196量測第二感測電極125A-125H的第一阻抗值。在一些實施例中,步驟S440可由三用電表執行。在一些實施例中,步驟S440可由周邊區114的晶片所執行。 Step S440: Measure the second impedance value via the third test pad and the fourth test pad. For example, in some embodiments, if the second sensing electrodes 125A-125D are turned on in step S430, the second sensing can be measured through the third test pad 194 and the fourth test pad 196 in step S440. The first impedance value of the electrodes 125A-125D. If it is in step S430 that the second sensing electrodes 125A-125J are turned on, in step S440, the first impedance value of the second sensing electrodes 125A-125H can be measured through the third test pad 194 and the fourth test pad 196. In some embodiments, step S440 may be performed by a tri-meter. In some embodiments, step S440 may be performed by the wafer of the peripheral region 114.

S450:依據第一阻抗值與第二阻抗值判斷多個第一感測電極中的至少一者與多個第二感測電極中的至少一者是否為開路狀態。舉例來說,可依據第一感測電極120A-120D的第一阻抗值與第二感測電極125A-125D的第二阻抗值判斷第一感測電極120A-120D與第二感測電極125A-125D是否為開路狀態。舉例來說,量測位於第一感測區310A中的第一感測電極120A-120D的第一阻抗值以及位於第一感測區310A中的第二感測電極125A-125D的第二阻抗值。判斷所量測之第一阻抗值與第二阻抗值之間的阻抗差值是否大於阻抗差閾值。若是判定阻抗差值大於阻抗差閾值,則判定第一感測電極120A-120D與第二感測電極125A-125D為開路狀態。在一些實施例中,步驟S450可由 周邊區114的晶片所執行。 S450: Determine whether at least one of the plurality of first sensing electrodes and at least one of the plurality of second sensing electrodes are in an open state according to the first impedance value and the second impedance value. For example, the first sensing electrodes 120A-120D and the second sensing electrodes 125A- 120D can be determined based on the first impedance values of the first sensing electrodes 120A-120D and the second impedance values of the second sensing electrodes 125A-125D. Whether 125D is open. For example, a first impedance value of the first sensing electrodes 120A-120D located in the first sensing area 310A and a second impedance of the second sensing electrodes 125A-125D located in the first sensing area 310A are measured. value. Determine whether the measured impedance difference between the first impedance value and the second impedance value is greater than the impedance difference threshold. If it is determined that the impedance difference value is greater than the impedance difference threshold, it is determined that the first sensing electrodes 120A-120D and the second sensing electrodes 125A-125D are in an open state. In some embodiments, step S450 may be performed by Performed by the wafer of the peripheral region 114.

在一些實施例中,步驟S410與步驟S430更包含於第一時間,開啟多個第一開關中之部分,以導通位於第一感測區之第一感測電極,開啟該些第二開關之部分,以導通位於第一感測區之第二感測電極,以及於第二時間,開啟多個第一開關之部分,以導通位於第二感測區之第一感測電極,開啟多個第二開關之部分,以導通位於第二感測區之第二感測電極。 In some embodiments, steps S410 and S430 are further included in the first time, turning on a part of the plurality of first switches to turn on the first sensing electrodes located in the first sensing area, and turning on the second switches. Partly to turn on the second sensing electrode located in the first sensing area, and to turn on part of the plurality of first switches at the second time to turn on the first sensing electrode located in the second sensing area, to turn on a plurality of A part of the second switch is used to turn on the second sensing electrode located in the second sensing area.

請一併參閱第1圖、第3圖與第4圖。舉例來說,在一些實施例中,於第一時間,執行步驟S410,開啟多個第一開關中170A-170D之部分,以導通位於第一感測區310A之第一感測電極120,執行步驟S420,透過第一測試墊190與第二測試墊192量測位於第一感測區310A之第一感測電極120的第一阻抗值,執行步驟S430,開啟多個第二開關175A-175D中之部分,以導通位於第一感測區310A中的第二感測電極125,執行步驟S440,透過第三測試墊194與第四測試墊196量測位於第一感測區310A之第二感測電極125的第二阻抗值。 Please refer to Figure 1, Figure 3 and Figure 4 together. For example, in some embodiments, step S410 is performed at the first time to turn on parts of 170A-170D of the plurality of first switches to turn on the first sensing electrode 120 located in the first sensing area 310A and execute Step S420, measuring the first impedance value of the first sensing electrode 120 located in the first sensing area 310A through the first test pad 190 and the second test pad 192, and performing step S430, turning on a plurality of second switches 175A-175D Part of the method is to turn on the second sensing electrode 125 located in the first sensing area 310A, execute step S440, and measure the second located in the first sensing area 310A through the third test pad 194 and the fourth test pad 196. The second impedance value of the sensing electrode 125.

於第二時間,執行步驟S410,開啟多個第一開關中170A-170D之部分,以導通位於第二感測區310B之第一感測電極120,執行步驟S420,透過第一測試墊190與第二測試墊192量測位於第二感測區310B之第一感測電極120的第一阻抗值,執行步驟S430,開啟多個第二開關175A-175D中之部分,以導通位於第二感測區310B中的第 二感測電極125,執行步驟S440,透過第三測試墊194與第四測試墊196量測位於第二感測區310B之第二感測電極125的第二阻抗值。其餘依此類推。在一些實施例中,步驟S450可由周邊區114的晶片所執行。 At the second time, step S410 is executed to turn on parts of 170A-170D of the plurality of first switches to turn on the first sensing electrode 120 located in the second sensing area 310B, and then step S420 is performed through the first test pad 190 and The second test pad 192 measures a first impedance value of the first sensing electrode 120 located in the second sensing area 310B, and executes step S430 to turn on a part of the plurality of second switches 175A-175D to turn on the second sensing Zone 310B The two sensing electrodes 125 execute step S440 to measure the second impedance value of the second sensing electrode 125 located in the second sensing region 310B through the third test pad 194 and the fourth test pad 196. The rest and so on. In some embodiments, step S450 may be performed by a wafer in the peripheral region 114.

請參閱第5圖。第5圖係根據本案之一些實施例所繪示之一種步驟S450的流程圖。步驟S450包含以下步驟:S452:判斷所量測之第一阻抗值與第二阻抗值之間的阻抗差值是否大於阻抗差閾值;以及S454:當阻抗差值大於阻抗差閾值時,判定位於第一感測區中之第一感測電極與第二感測電極中的至少一者為開路。 See Figure 5. FIG. 5 is a flowchart of a step S450 according to some embodiments of the present invention. Step S450 includes the following steps: S452: judging whether the measured impedance difference between the first impedance value and the second impedance value is greater than the impedance difference threshold; and S454: when the impedance difference is greater than the impedance difference threshold, determining that the At least one of the first sensing electrode and the second sensing electrode in a sensing area is open.

步驟S452:判斷所量測之第一阻抗值與第二阻抗值之間的阻抗差值是否大於阻抗差閾值。舉例來說,若是於步驟S410-S440中,量測位於第一感測區310A中的第一阻抗值以及位於第一感測區310A中的第二阻抗值。於步驟S452中,判斷於第一時間所量測之第一阻抗值與第二阻抗值之間的阻抗差值是否大於阻抗差閾值。再舉例來說,若是於步驟S410-S440中,量測位於第二感測區310B中的第一阻抗值以及位於第二感測區310B中的第二阻抗值,於步驟S452中,判斷於第二時間所量測之第一阻抗值與第二阻抗值之間的阻抗差值是否大於阻抗差閾值。 Step S452: Determine whether the measured impedance difference between the first impedance value and the second impedance value is greater than an impedance difference threshold. For example, in steps S410-S440, the first impedance value in the first sensing area 310A and the second impedance value in the first sensing area 310A are measured. In step S452, it is determined whether the impedance difference between the first impedance value and the second impedance value measured at the first time is greater than the impedance difference threshold. For another example, if the first impedance value in the second sensing area 310B and the second impedance value in the second sensing area 310B are measured in steps S410-S440, in step S452, determine in Whether the impedance difference between the first impedance value and the second impedance value measured at the second time is greater than the impedance difference threshold.

步驟S454:當阻抗差值大於阻抗差閾值時,判定第一感測電極與第二感測電極中的至少一者為開路。舉例 來說,於第一時間來判斷第一感測區310A中,第一阻抗值與第二阻抗值之間的差值。如果差值大於阻抗差閾值時,則表示於第一感測區310A的第一感測電極120A-120D或第二感測電極125A-125D有開路情況。具體而言,透過比較相同區域中同數量的第一感測電極的阻抗值與第二感測電極的阻抗值以判斷是否有開路狀態。 Step S454: When the impedance difference value is greater than the impedance difference threshold, it is determined that at least one of the first sensing electrode and the second sensing electrode is an open circuit. For example In other words, the difference between the first impedance value and the second impedance value in the first sensing area 310A is determined at the first time. If the difference is greater than the impedance difference threshold, the first sensing electrodes 120A-120D or the second sensing electrodes 125A-125D indicated in the first sensing area 310A have an open circuit condition. Specifically, by comparing the impedance values of the same number of first sensing electrodes and the impedance values of the second sensing electrodes in the same region to determine whether there is an open circuit state.

再舉例來說,於第一時間來判斷第一感測區310A中的第一阻抗值,與第二感測區310B中的第二阻抗值之間的差值。如果差值大於阻抗差閾值時,則表示於第一感測區310A的第一感測電極120A-120D或第二感測區310B中的第二感測電極125E-125H有開路情況。具體而言,透過比較相對應區域中同數量的第一感測電極的阻抗值與第二感測電極的阻抗值以判斷是否有開路狀態。舉例來說,第一感測區310A與第二感測區310B於顯示面板300上為左右對稱,且第一感測區310A與第二感測區310B於顯示面板300上相對於周邊區114的晶片的距離相同。 For another example, the difference between the first impedance value in the first sensing area 310A and the second impedance value in the second sensing area 310B is determined at the first time. If the difference is greater than the impedance difference threshold, the first sensing electrodes 120A-120D in the first sensing area 310A or the second sensing electrodes 125E-125H in the second sensing area 310B have an open circuit condition. Specifically, the impedance value of the same number of first sensing electrodes and the impedance value of the second sensing electrodes in the corresponding region are compared to determine whether there is an open circuit state. For example, the first sensing area 310A and the second sensing area 310B are symmetrical on the display panel 300, and the first sensing area 310A and the second sensing area 310B are opposite to the peripheral area 114 on the display panel 300. The distance of the wafers is the same.

請回頭參閱第4圖。步驟S460:經由第二測試墊以及第三測試墊,量測第三阻抗值。請一併參閱第4圖與第1圖。舉例來說,同時導通多個第一感測電極120中的至少一者以及多個第二感測電極125中的至少一者,並經由第二測試墊192以及第三測試墊194,量測第三阻抗值。具體而言,請參閱第1圖,在一些實施例中,由第一感測電極120A起始,經由第一連接走線150A、第一開關170D連至第一感測電極120B,由第一感測電極120B經由第一傳輸走線 140、第一連接墊130、第一開關170C、第一連接走線150B連至第一感測電極120C,由第一感測電極120C經由第一連接走線150A、第一開關170D連至第一感測電極120D,由第一感測電極120D經由第一周邊走線160B、第一開關170B、第一連接走線150B與第一連接墊130連至第二測試墊192。再由第二感測電極125A起始,經由第二連接走線155A、第二開關175D連至第二感測電極125B,由第二感測電極125B經由第二傳輸走線145、第二連接墊135、第二開關175C、第二連接走線155B連至第二感測電極125C,由第二感測電極125C經由第二連接走線155A、第二開關175D連至第二感測電極125D,由第二感測電極125D經由第二周邊走線165B、第二開關175B、第二連接走線155B與第二連接墊135連至第三測試墊194。透過開啟部分之第一開關170A、170B、170C、170D以及部分之第二開關175A、175B、175C、175D,可將第一感測電極120A-120D與第二感測電極125A-125D導通,並經由第二測試墊192以及第三測試墊194,量測第三阻抗值。在一些實施例中,步驟S460可由三用電表所執行。在一些實施例中,步驟S460可由周邊區114的晶片所執行。 Please refer back to Figure 4. Step S460: Measure the third impedance value via the second test pad and the third test pad. Please refer to Figure 4 and Figure 1 together. For example, at least one of the plurality of first sensing electrodes 120 and at least one of the plurality of second sensing electrodes 125 are simultaneously turned on, and measured through the second test pad 192 and the third test pad 194. The third impedance value. Specifically, please refer to FIG. 1. In some embodiments, starting from the first sensing electrode 120A, connected to the first sensing electrode 120B via the first connection trace 150A and the first switch 170D, The sensing electrode 120B is routed through the first transmission line. 140. The first connection pad 130, the first switch 170C, and the first connection wiring 150B are connected to the first sensing electrode 120C. The first sensing electrode 120C is connected to the first sensing electrode 120C through the first connection wiring 150A and the first switch 170D. A sensing electrode 120D is connected from the first sensing electrode 120D to the second test pad 192 through the first peripheral wiring 160B, the first switch 170B, the first connection wiring 150B, and the first connection pad 130. Starting from the second sensing electrode 125A, it is connected to the second sensing electrode 125B via the second connection wiring 155A and the second switch 175D, and the second sensing electrode 125B is connected via the second transmission wiring 145 and the second connection. The pad 135, the second switch 175C, and the second connection wiring 155B are connected to the second sensing electrode 125C. The second sensing electrode 125C is connected to the second sensing electrode 125D through the second connection wiring 155A and the second switch 175D. The second sensing electrode 125D is connected to the third test pad 194 through the second peripheral wiring 165B, the second switch 175B, the second connection wiring 155B, and the second connection pad 135. By turning on the first switches 170A, 170B, 170C, and 170D and the second switches 175A, 175B, 175C, and 175D, the first sensing electrodes 120A-120D and the second sensing electrodes 125A-125D can be turned on, and Through the second test pad 192 and the third test pad 194, a third impedance value is measured. In some embodiments, step S460 may be performed by a tri-meter. In some embodiments, step S460 may be performed by the wafer of the peripheral region 114.

S470:依據第三阻抗值判斷多個第一感測電極中的至少一者與多個第二感測電極中的至少一者是否為短路狀態。舉例來說,若是判斷於步驟S460所量測的第三阻抗值過大,使三用電表發出一警示聲,於S470中可判定多個第一感測電極中的至少一者與多個第二感測電極中的至 少一者為短路狀態。在一些實施例中,若是第一感測電極中的至少一者與多個第二感測電極中的至少一者為短路狀態,三用電表會偵測並顯示出存在有短路的感測電極,例如發出警示聲。而若是第一感測電極中的至少一者與多個第二感測電極中的至少一者皆非短路狀態,三用電表不會發出警示有短路存在的警示聲。在一些實施例中,步驟S470可由周邊區114的晶片所執行。 S470: Determine whether at least one of the plurality of first sensing electrodes and at least one of the plurality of second sensing electrodes are in a short-circuit state according to the third impedance value. For example, if it is determined that the third impedance value measured in step S460 is too large, the three-meter meter emits a warning sound. In S470, it can be determined that at least one of the plurality of first sensing electrodes and the plurality of first sensing electrodes To in two sensing electrodes One of them is short-circuited. In some embodiments, if at least one of the first sensing electrodes and at least one of the plurality of second sensing electrodes are in a short-circuit state, the three-meter meter will detect and display the presence of the short-circuited sensing. The electrode, for example, emits a warning sound. If at least one of the first sensing electrodes and at least one of the plurality of second sensing electrodes are not in a short-circuit state, the tri-meter will not issue a warning sound to warn of the presence of a short-circuit. In some embodiments, step S470 may be performed by the wafer in the peripheral region 114.

如第4圖所繪示之檢測方法400僅作為例示說明使用。以不同順序執行步驟S410-S470皆在本揭示內容的考量範圍內。 The detection method 400 shown in FIG. 4 is used for illustration only. It is within the scope of this disclosure to perform steps S410-S470 in different orders.

綜上所述,如第1圖所示,第一感測電極120A-120H以及第二感測電極125A-125H可分為一大區域進行檢測。或者如第3圖所示,第一感測電極120A-120H以及第二感測電極125A-125H亦可分成多個區域,分區比較阻抗檢測。將第一感測電極120A-120H以及第二感測電極125A-125H分為一大區域進行檢測可一次檢測所有的感測電極,且透過將感測電極串聯以及並聯,可選擇性的檢測部分的感測電極串,以避免當串聯太多的感測電極時,阻抗值過大而難以量測的問題。另一方面,由於不同的感測電極距離測試墊190-196的距離不同,且因應不同的距離會有不同的阻抗值,因此若是如第3圖所示,將第一感測電極120A-120H以及第二感測電極125A-125H分成多個區域,分區比較阻抗檢測,可有效降低由於不同的感測電極距離測試墊190-196的距離不同所造成的量測誤差。 In summary, as shown in FIG. 1, the first sensing electrodes 120A-120H and the second sensing electrodes 125A-125H can be divided into a large area for detection. Alternatively, as shown in FIG. 3, the first sensing electrodes 120A-120H and the second sensing electrodes 125A-125H can also be divided into a plurality of regions, and the impedance detection can be compared by partitions. Dividing the first sensing electrodes 120A-120H and the second sensing electrodes 125A-125H into a large area for detection can detect all the sensing electrodes at one time, and by connecting the sensing electrodes in series and in parallel, the selective detection portion To avoid the problem that the impedance value is too large and difficult to measure when too many sensing electrodes are connected in series. On the other hand, because different sensing electrodes are at different distances from the test pads 190-196, and have different impedance values according to different distances, if shown in Figure 3, the first sensing electrodes 120A-120H And the second sensing electrodes 125A-125H are divided into a plurality of regions, and the impedance detection is compared in sections, which can effectively reduce the measurement error caused by the different distances of the different sensing electrodes from the test pads 190-196.

如上所述的傳輸走線140、145、連接走線150A、150B、155A、155B、周邊走線160A、160B、165A、165B可形成於第二層金屬、第三層金屬或兩層金屬之間的跨線。 As mentioned above, the transmission lines 140 and 145, the connection lines 150A, 150B, 155A, 155B, and the peripheral lines 160A, 160B, 165A, and 165B may be formed between the second metal layer, the third metal layer, or between the two metal layers. Cross line.

由上述本案之實施方式可知,本案之實施例藉由提供一種檢測方法及顯示面板,且特別是有關於檢測感測電極的檢測方法及顯示面板,藉以有效在觸控顯示面板的生產過程中,檢查多個感測電極之間是否有短路或開路。 It can be known from the implementation of the above-mentioned case that the embodiment of the present case provides a detection method and a display panel, and particularly relates to a detection method and a display panel for detecting a sensing electrode, so as to be effective in the production process of a touch display panel. Check for shorts or open circuits between multiple sensing electrodes.

另外,上述例示包含依序的示範步驟,但該些步驟不必依所顯示的順序被執行。以不同順序執行該些步驟皆在本揭示內容的考量範圍內。在本揭示內容之實施例的精神與範圍內,可視情況增加、取代、變更順序及/或省略該些步驟。 In addition, the above-mentioned illustration includes sequential exemplary steps, but the steps need not be performed in the order shown. It is within the scope of this disclosure to perform these steps in different orders. Within the spirit and scope of the embodiments of the present disclosure, these steps may be added, replaced, changed, and / or omitted as appropriate.

雖然本案已以實施方式揭示如上,然其並非用以限定本案,任何熟習此技藝者,在不脫離本案之精神和範圍內,當可作各種之更動與潤飾,因此本案之保護範圍當視後附之申請專利範圍所界定者為準。 Although this case has been disclosed as above in the form of implementation, it is not intended to limit the case. Any person skilled in this art can make various modifications and retouches without departing from the spirit and scope of the case. Therefore, the scope of protection of this case should be considered after The attached application patent shall prevail.

Claims (10)

一種檢測方法,用以檢測一顯示面板,該顯示面板包含複數個第一感測電極、複數個第二感測電極、一第一測試墊、一第二測試墊、一第三測試墊與一第四測試墊、複數個第一開關以及複數個第二開關,該些第一感測電極與該些第二感測電極交錯配置,該些第一感測電極分別透過該些第一開關與該第一測試墊以及該第二測試墊電性連接,該些第二感測電極分別透過該些第二開關與該第三測試墊以及該第四測試墊電性連接,該檢測方法包含:開啟該些第一開關中的至少一者以導通該些第一感測電極中的至少一者;經由該第一測試墊以及該第二測試墊,量測一第一阻抗值;開啟該些第二開關中的至少一者以導通該些第二感測電極中的至少一者;經由該第三測試墊以及該第四測試墊,量測一第二阻抗值;依據該第一阻抗值與該第二阻抗值判斷該些第一感測電極中的至少一者與該些第二感測電極中的至少一者是否為開路狀態;經由該第二測試墊以及該第三測試墊,量測一第三阻抗值;以及依據該第三阻抗值判斷該些第一感測電極中的至少一者與該些第二感測電極中的至少一者是否為短路狀態。A detection method for detecting a display panel including a plurality of first sensing electrodes, a plurality of second sensing electrodes, a first test pad, a second test pad, a third test pad, and a A fourth test pad, a plurality of first switches, and a plurality of second switches, the first sensing electrodes and the second sensing electrodes are staggered, and the first sensing electrodes respectively pass through the first switches and The first test pad and the second test pad are electrically connected, and the second sensing electrodes are electrically connected to the third test pad and the fourth test pad through the second switches, respectively. The detection method includes: Turn on at least one of the first switches to turn on at least one of the first sensing electrodes; measure a first impedance value through the first test pad and the second test pad; turn on the At least one of the second switches to turn on at least one of the second sensing electrodes; measure a second impedance value through the third test pad and the fourth test pad; according to the first impedance value Judging the first senses with the second impedance value Whether at least one of the electrodes and at least one of the second sensing electrodes are in an open circuit state; a third impedance value is measured via the second test pad and the third test pad; and according to the third The impedance value determines whether at least one of the first sensing electrodes and at least one of the second sensing electrodes are in a short circuit state. 如請求項1所述之檢測方法,其中該顯示面板更包含一第一感測區與一第二感測區,該第一感測區與該第二感測區分別包含該些第一感測電極中的至少一者以及該些第二感測電極中的至少一者,其中開啟該些第一開關中的至少一者以導通該些第一感測電極中的至少一者與開啟該些第二開關中的至少一者以導通該些第二感測電極中的至少一者更包含:於一第一時間,開啟該些第一開關之部分,以導通位於該第一感測區之該些第一感測電極,以及開啟該些第二開關之部分,以導通位於該第一感測區之該些第二感測電極;以及於一第二時間,開啟該些第一開關之部分,以導通位於該第二感測區之該些第一感測電極,以及開啟該些第二開關之部分,以導通位於該第二感測區之該些第二感測電極。The detection method according to claim 1, wherein the display panel further includes a first sensing area and a second sensing area, and the first sensing area and the second sensing area respectively include the first sensing areas. At least one of the sensing electrodes and at least one of the second sensing electrodes, wherein at least one of the first switches is turned on to turn on at least one of the first sensing electrodes and turn on the At least one of the second switches to turn on at least one of the second sensing electrodes further includes: at a first time, turning on a part of the first switches to turn on the first sensing area The first sensing electrodes and a portion of the second switches that are turned on to turn on the second sensing electrodes that are located in the first sensing area; and that the first switches are turned on at a second time Part of it is to turn on the first sensing electrodes located in the second sensing area, and to turn on part of the second switches to turn on the second sensing electrodes located in the second sensing area. 如請求項2所述之檢測方法,其中依據該第一阻抗值與該第二阻抗值判斷該些第一感測電極中的至少一者與該些第二感測電極中的至少一者是否為開路更進一步包含:判斷於該第一時間所量測之該第一阻抗值與該第二阻抗值之間的一阻抗差值是否大於一阻抗差閾值;以及當該阻抗差值大於該阻抗差閾值時,判定位於該第一感測區中之該些第一感測電極與該些第二感測電極的至少一者為開路。The detection method according to claim 2, wherein whether at least one of the first sensing electrodes and at least one of the second sensing electrodes are determined according to the first impedance value and the second impedance value. Opening the circuit further includes: determining whether an impedance difference between the first impedance value and the second impedance value measured at the first time is greater than an impedance difference threshold; and when the impedance difference is greater than the impedance When the difference threshold value is determined, it is determined that at least one of the first sensing electrodes and the second sensing electrodes located in the first sensing area is an open circuit. 如請求項3所述之檢測方法,其中依據該第一阻抗值與該第二阻抗值判斷該些第一感測電極中的至少一者與該些第二感測電極中的至少一者是否為開路更進一步包含:判斷於該第二時間所量測之該第一阻抗值與該第二阻抗值之間的一阻抗差值是否大於一阻抗差閾值;以及當該阻抗差值大於該阻抗差閾值時,判定位於該第二感測區中之該些第一感測電極與該些第二感測電極的至少一者為開路。The detection method according to claim 3, wherein whether at least one of the first sensing electrodes and at least one of the second sensing electrodes are determined according to the first impedance value and the second impedance value. Opening the circuit further includes: determining whether an impedance difference between the first impedance value and the second impedance value measured at the second time is greater than an impedance difference threshold; and when the impedance difference is greater than the impedance When the difference threshold value is determined, it is determined that at least one of the first sensing electrodes and the second sensing electrodes located in the second sensing area is an open circuit. 一種顯示面板,包含:一基板,具有一主動區與一周邊區,其中該周邊區鄰接於該主動區;複數個第一感測電極,設置於該主動區;複數個第二感測電極,設置於該主動區,且該些第一感測電極與該些第二感測電極彼此交錯配置;複數個第一開關與複數個第二開關;一第一測試墊與一第二測試墊,分別設置於該周邊區,且該第一測試墊與該第二測試墊分別透過該些第一開關電性連接於該些第一感測電極;一第三測試墊與一第四測試墊,分別設置於該周邊區,且該第三測試墊與該第四測試墊分別透過該些第二開關電性連接於該些第二感測電極;複數個第一連接墊與複數個第二連接墊,而該些第一連接墊分別電性連接該些第一感測電極中之一者,該些第二連接墊分別電性連接該些第二感測電極中之一者;複數條第一傳輸走線,分別耦接該些第一感測電極中之一者與該些第一連接墊中之一者;複數條第二傳輸走線,分別耦接該些第二感測電極中之一者與該些第二連接墊中之一者;複數條第一周邊走線,分別耦接該些第一連接墊中之一者與該第一測試墊之間以及該些第一連接墊中之一者與該第二測試墊之間;複數條第二周邊走線,分別耦接於該些第二連接墊中之一者與該第三測試墊之間以及該些第二連接墊中之一者與該第四測試墊之間;複數條第一連接走線,分別耦接於該些第一連接墊之二者之間以及該些第一感測電極之二者之間;以及複數條第二連接走線,分別耦接於該些第二連接墊之二者之間以及該些第二感測電極之二者之間。A display panel includes: a substrate having an active area and a peripheral area, wherein the peripheral area is adjacent to the active area; a plurality of first sensing electrodes are disposed in the active area; a plurality of second sensing electrodes are disposed In the active area, and the first sensing electrodes and the second sensing electrodes are staggered with each other; a plurality of first switches and a plurality of second switches; a first test pad and a second test pad, respectively The first test pad and the second test pad are respectively connected to the first sensing electrodes through the first switches; a third test pad and a fourth test pad, respectively; And the third test pad and the fourth test pad are electrically connected to the second sensing electrodes through the second switches, respectively; the plurality of first connection pads and the plurality of second connection pads And the first connection pads are electrically connected to one of the first sensing electrodes, and the second connection pads are electrically connected to one of the second sensing electrodes; Transmission lines, which are respectively coupled to the first sensing circuits One of the first connection pads and one of the first connection pads; the plurality of second transmission lines are respectively coupled to one of the second sensing electrodes and one of the second connection pads; A plurality of first peripheral traces respectively coupled between one of the first connection pads and the first test pad and between one of the first connection pads and the second test pad; A second peripheral trace, respectively coupled between one of the second connection pads and the third test pad, and between one of the second connection pads and the fourth test pad; First connection traces are respectively coupled between the first connection pads and between the first sensing electrodes; and a plurality of second connection traces are respectively connected to the first connection pads. Between the second connection pads and between the second sensing electrodes. 如請求項5所述之顯示面板,其中部分之該些第一感測電極互相串聯而形成一第一感測電極串,使得該些第一感測電極可形成複數個第一感測電極串,且該些第一感測電極串彼此互相並聯。The display panel according to claim 5, wherein some of the first sensing electrodes are connected in series with each other to form a first sensing electrode string, so that the first sensing electrodes can form a plurality of first sensing electrode strings. And the first sensing electrode strings are connected in parallel with each other. 如請求項6所述之顯示面板,其中部分之該些第二感測電極互相串聯而形成一第二感測電極串,使得該些第二感測電極可形成複數個第二感測電極串,且該些第二感測電極串彼此互相並聯。The display panel according to claim 6, wherein some of the second sensing electrodes are connected in series with each other to form a second sensing electrode string, so that the second sensing electrodes can form a plurality of second sensing electrode strings. And the second sensing electrode strings are connected in parallel with each other. 如請求項7所述之顯示面板,其中該些第一感測電極透過該些第一傳輸走線該些第一周邊走線與該些第一連接走線而互相串聯及/或並聯,其中該些第二感測電極透過該些第二傳輸走線、該些第二周邊走線與該些第二連接走線而互相串聯及/或並聯。The display panel according to claim 7, wherein the first sensing electrodes are connected in series and / or in parallel with each other through the first transmission wires, the first peripheral wires, and the first connection wires, wherein The second sensing electrodes are connected in series and / or in parallel with each other through the second transmission traces, the second peripheral traces and the second connection traces. 如請求項5所述之顯示面板,其中:該些第一開關分別設置於該周邊區,其中該些第一開關分別透過該些第一周邊走線而耦接於該些第一連接墊之一者與該第一測試墊之間、該些第一連接墊之一者與該第二測試墊之間,以及透過該些第一連接走線而耦接於該些第一連接墊之二者之間、該些第一感測電極之二者之間;以及該些第二開關分別設置於該周邊區,其中該些第二開關分別透過該些第二周邊走線而耦接於該些第二連接墊之一者與該第三測試墊之間、該些第二連接墊之一者與該第四測試墊之間,以及透過該些第二連接走線而耦接該些第二連接墊之二者之間、該些第二感測電極之二者之間。The display panel according to claim 5, wherein the first switches are respectively disposed in the peripheral area, and the first switches are respectively coupled to the first connection pads through the first peripheral wires. One is connected to the first test pad, one of the first connection pads and the second test pad, and is coupled to two of the first connection pads through the first connection traces Between the two, between the first sensing electrodes; and the second switches are respectively disposed in the peripheral region, wherein the second switches are respectively coupled to the second peripheral wires through the second peripheral wires. One of the second connection pads and the third test pad, one of the second connection pads and the fourth test pad, and the first connection pads are coupled to the first connection pads through the second connection traces. Between the two connection pads and between the second sensing electrodes. 如請求項9所述之顯示面板,更包含:一第一感測區,包含該些第一感測電極中的部分以及該些第二感測電極中的部分,其中該些第一感測電極的部分可透過該些第一開關中的至少一者而耦接,以形成一第一感測電極串,該些第二感測電極的部分可透過該些第二開關中的至少一者而耦接,以形成一第二感測電極串;以及一第二感測區,包含該些第一感測電極中的另一部分以及該些第二感測電極中的另一部分,其中該些第二感測電極的另一部分可透過該些第一開關中的至少一者而耦接,以形成另一之該第一感測電極串,該些第二感測電極的另一部分可透過該些第二開關中的至少一者而耦接,以形成另一之該第二感測電極串;其中位於該第一感測區與該第二感測區的該些第一感測電極串則以並聯方式耦接於該第一測試墊與該第二測試墊,位於該第一感測區與該第二感測區之該些第二感測電極串則以並聯方式耦接於該第三測試墊與該第四測試墊。The display panel according to claim 9, further comprising: a first sensing area including a part of the first sensing electrodes and a part of the second sensing electrodes, wherein the first sensing areas Parts of the electrodes may be coupled through at least one of the first switches to form a first sensing electrode string, and parts of the second sensing electrodes may be through at least one of the second switches. And coupled to form a second sensing electrode string; and a second sensing region including another part of the first sensing electrodes and another part of the second sensing electrodes, wherein Another part of the second sensing electrodes may be coupled through at least one of the first switches to form another first sensing electrode string, and another part of the second sensing electrodes may be transmitted through the At least one of the second switches is coupled to form another second sensing electrode string; wherein the first sensing electrode strings located in the first sensing area and the second sensing area Then coupled in parallel to the first test pad and the second test pad, located at the first sensing pad The second sensing electrode strings of the area and the second sensing area are coupled in parallel to the third test pad and the fourth test pad.
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