TWI643534B - Circuit board structure and manufacturing method thereof - Google Patents
Circuit board structure and manufacturing method thereof Download PDFInfo
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Abstract
一種線路板結構,包括一絕緣基材、一第一線路層、一電容介電層、一第一介電層與一第二線路層。絕緣基材具有多個第一通孔以及一第二通孔。第一線路層包括一第一電容電極、一電感線路、多個第一導電通孔以及一第二導電通孔。電感線路與第一導電通孔以螺旋形式貫穿絕緣基材而定義出一立體電感。第一介電層的一第三通孔貫穿第一介電層且位於第二導電通孔內。第二導電通孔與一第三導電通孔定義出一同軸通孔。第一電容電極、電容介電層以及第二線路層的一第二電容電極定義出一電容。A circuit board structure includes an insulating substrate, a first circuit layer, a capacitor dielectric layer, a first dielectric layer and a second circuit layer. The insulating substrate has a plurality of first through holes and a second through hole. The first circuit layer includes a first capacitor electrode, an inductor line, a plurality of first conductive vias, and a second conductive via. The inductor line and the first conductive via define a three-dimensional inductance in a spiral form through the insulating substrate. A third via of the first dielectric layer penetrates the first dielectric layer and is located within the second conductive via. The second conductive via defines a coaxial via with a third conductive via. The first capacitor electrode, the capacitor dielectric layer, and a second capacitor electrode of the second circuit layer define a capacitor.
Description
本發明是有關於一種線路板結構及其製作方法,且特別是有關於一種具有多元化應用的線路板結構及其製作方法。 The present invention relates to a circuit board structure and a method of fabricating the same, and more particularly to a circuit board structure having a plurality of applications and a method of fabricating the same.
現今具有至少二層線路層的多層線路板通常具有導電通孔結構,以使這些線路層可以電性導通。目前形成導電通孔結構的方法大多是先採用機械鑽孔或雷射鑽孔來形成通孔,而後再透過通孔電鍍製程來完成導電通孔結構。然而,通孔內的空間均為無效區,除了易導致空間上的浪費外,也無法提升佈線密度及提供較佳的設計靈活性。 Multilayer circuit boards having at least two wiring layers today typically have conductive via structures to allow these circuit layers to be electrically conductive. At present, most methods for forming a conductive via structure are first to form a via hole by mechanical drilling or laser drilling, and then through a via plating process to complete the conductive via structure. However, the space in the through hole is an ineffective area. In addition to being easy to cause space waste, it cannot increase the wiring density and provide better design flexibility.
本發明提供一種線路板結構,其具有較佳的設計靈活性,整體厚度較薄,且可多元化應用。 The present invention provides a circuit board structure which has better design flexibility, a thin overall thickness, and can be used in various applications.
本發明還提供一種線路板結構的製作方法,用以製作上 述的線路板結構。 The invention also provides a method for manufacturing a circuit board structure, which is used for making The circuit board structure described.
本發明的線路板結構,其包括一絕緣基材、一第一線路層、一電容介電層、一第一介電層以及一第二線路層。絕緣基材具有彼此相對的一第一表面與一第二表面以及連接第一表面與第二表面的多個第一通孔與一第二通孔。第一線路層配置於絕緣基材上,且暴露出部分第一表面與第二表面。第一線路層包括一第一電容電極、一電感線路、多個第一導電通孔與一第二導電通孔。第一電容電極位於第一表面上。電感線路位於第一表面與第二表面上。第一導電通孔覆蓋第一通孔的內壁。第二導電通孔覆蓋第二通孔的內壁。電感線路與第一導電通孔以螺旋形式貫穿絕緣基材而定義出一立體電感。電容介電層配置於第一電容電極的一部分上。第一介電層覆蓋第一線路層以及第一線路層所暴露出的絕緣基材的第一表面與第二表面,且填滿第一導電通孔與第二導電通孔。第一介電層具有一第三通孔、一第一盲孔以及一第一開口。第三通孔貫穿第一介電層且位於第二導電通孔內。第一開口暴露出電容介電層。第一盲孔暴露出第一線路層的一部分。第二線路層配置於第一介電層上,且包括一第二線路、一第三導電通孔、一第一導電盲孔與一第二電容電極。第二線路配置於部分第一介電層上。第三導電通孔覆蓋第三通孔的內壁。第一導電盲孔填滿第一盲孔且連接第一線路層與第二線路層。第二電容電極填滿第一開口。第二導電通孔與第三導電通孔定義出一同軸通孔。第一電容電極、電容介電層與第二電容電極定義出一電容。 The circuit board structure of the present invention comprises an insulating substrate, a first circuit layer, a capacitor dielectric layer, a first dielectric layer and a second circuit layer. The insulating substrate has a first surface and a second surface opposite to each other and a plurality of first through holes and a second through hole connecting the first surface and the second surface. The first circuit layer is disposed on the insulating substrate and exposes a portion of the first surface and the second surface. The first circuit layer includes a first capacitor electrode, an inductor line, a plurality of first conductive vias and a second conductive via. The first capacitor electrode is located on the first surface. The inductor line is located on the first surface and the second surface. The first conductive via covers the inner wall of the first via. The second conductive via covers the inner wall of the second via. The inductor line and the first conductive via define a three-dimensional inductance in a spiral form through the insulating substrate. The capacitor dielectric layer is disposed on a portion of the first capacitor electrode. The first dielectric layer covers the first circuit layer and the first surface and the second surface of the insulating substrate exposed by the first circuit layer, and fills the first conductive via and the second conductive via. The first dielectric layer has a third through hole, a first blind hole and a first opening. The third via hole penetrates through the first dielectric layer and is located in the second conductive via. The first opening exposes a capacitive dielectric layer. The first blind via exposes a portion of the first wiring layer. The second circuit layer is disposed on the first dielectric layer and includes a second line, a third conductive via, a first conductive via and a second capacitor. The second line is disposed on a portion of the first dielectric layer. The third conductive via covers the inner wall of the third via. The first conductive blind via fills the first blind via and connects the first wiring layer and the second wiring layer. The second capacitor electrode fills the first opening. The second conductive via defines a coaxial via with the third conductive via. The first capacitor electrode, the capacitor dielectric layer and the second capacitor electrode define a capacitor.
在本發明的一實施例中,上述的線路板結構更包括一第二介電層以及一第三線路層。第二介電層配置於第二線路層上,覆蓋第二線路層且填滿第三導電通孔。第二介電層具有多個第二盲孔,且第二盲孔暴露出部分第二線路層。第三線路層配置於部分第二介電層上且填滿第二盲孔,其中第三線路層與第二線路層電性連接。 In an embodiment of the invention, the circuit board structure further includes a second dielectric layer and a third circuit layer. The second dielectric layer is disposed on the second circuit layer, covers the second circuit layer, and fills the third conductive via. The second dielectric layer has a plurality of second blind vias and the second blind vias expose a portion of the second trace layer. The third circuit layer is disposed on a portion of the second dielectric layer and fills the second blind via, wherein the third circuit layer is electrically connected to the second circuit layer.
在本發明的一實施例中,上述的線路板結構更包括一防焊層,配置於第二介電層上,覆蓋第二介電層,且暴露出部分第三線路層,而定義出至少一接墊。 In an embodiment of the invention, the circuit board structure further includes a solder resist layer disposed on the second dielectric layer, covering the second dielectric layer, and exposing a portion of the third circuit layer, and defining at least A pad.
在本發明的一實施例中,上述的線路板結構更包括一種子層,配置於第三線路層與第二介電層之間。 In an embodiment of the invention, the circuit board structure further includes a sub-layer disposed between the third circuit layer and the second dielectric layer.
在本發明的一實施例中,上述的線路板結構更包括一種子層,配置於第二線路層與第一介電層之間。 In an embodiment of the invention, the circuit board structure further includes a sub-layer disposed between the second circuit layer and the first dielectric layer.
本發明的線路板結構的製作方法,其包括以下步驟。提供一絕緣基材。絕緣基材具有彼此相對的一第一表面與一第二表面以及連接第一表面與第二表面的多個第一通孔與一第二通孔。形成一第一線路層於絕緣基材上。第一線路層暴露出部分第一表面與第二表面,且包括一第一電容電極、一電感線路、多個第一導電通孔與一第二導電通孔。第一電容電極位於第一表面上。電感線路位於第一表面與第二表面上。第一導電通孔覆蓋第一通孔的內壁。第二導電通孔覆蓋第二通孔的內壁。電感線路與第一導電通孔以螺旋形式貫穿絕緣基材而定義出一立體電感。形成一電 容介電層於第一電容電極的一部分上。壓合一第一介電層於第一線路層上。第一介電層覆蓋第一線路層以及第一線路層所暴露出的絕緣基材的第一表面與第二表面,且填滿第一通孔與第二通孔。形成一第三通孔、一第一盲孔以及一第一開口於第一介電層內。第三通孔貫穿第一介電層且位於第二導電通孔內。第一開口暴露出電容介電層。第一盲孔暴露出第一線路層的一部分。形成一第二線路層於第一介電層上。第二線路層覆蓋部分第一介電層與第三通孔的內壁且填滿第一盲孔與第一開口。第二線路層包括一第二線路、一第三導電通孔、一第一導電盲孔與一第二電容電極。第二線路配置於部分第一介電層上。第三導電通孔覆蓋第三通孔的內壁。第一導電盲孔填滿第一盲孔且連接第一線路層與第二線路層。第二電容電極填滿第一開口。第二導電通孔與第三導電通孔定義出一同軸通孔。第一電容電極、電容介電層與第二電容電極定義出一電容。 The manufacturing method of the circuit board structure of the present invention comprises the following steps. An insulating substrate is provided. The insulating substrate has a first surface and a second surface opposite to each other and a plurality of first through holes and a second through hole connecting the first surface and the second surface. A first wiring layer is formed on the insulating substrate. The first circuit layer exposes a portion of the first surface and the second surface, and includes a first capacitor electrode, an inductor line, a plurality of first conductive vias and a second conductive via. The first capacitor electrode is located on the first surface. The inductor line is located on the first surface and the second surface. The first conductive via covers the inner wall of the first via. The second conductive via covers the inner wall of the second via. The inductor line and the first conductive via define a three-dimensional inductance in a spiral form through the insulating substrate. Form an electric The dielectric layer is on a portion of the first capacitor electrode. Pressing a first dielectric layer on the first circuit layer. The first dielectric layer covers the first circuit layer and the first surface and the second surface of the insulating substrate exposed by the first circuit layer, and fills the first through hole and the second through hole. Forming a third via, a first via, and a first opening in the first dielectric layer. The third via hole penetrates through the first dielectric layer and is located in the second conductive via. The first opening exposes a capacitive dielectric layer. The first blind via exposes a portion of the first wiring layer. Forming a second wiring layer on the first dielectric layer. The second circuit layer covers a portion of the first dielectric layer and the inner wall of the third via hole and fills the first blind via and the first opening. The second circuit layer includes a second line, a third conductive via, a first conductive via and a second capacitor. The second line is disposed on a portion of the first dielectric layer. The third conductive via covers the inner wall of the third via. The first conductive blind via fills the first blind via and connects the first wiring layer and the second wiring layer. The second capacitor electrode fills the first opening. The second conductive via defines a coaxial via with the third conductive via. The first capacitor electrode, the capacitor dielectric layer and the second capacitor electrode define a capacitor.
在本發明的一實施例中,上述的線路板結構的製作方法,更包括:形成一第二介電層於第二線路層上。第二介電層覆蓋第二線路層且填滿第三通孔。形成多個第二盲孔於第二介電層上,其中第二盲孔暴露出部分第二線路層。形成一第三線路層於部分第二介電層上且填滿第二盲孔,其中第三線路層與第二線路層電性連接。 In an embodiment of the invention, the method for fabricating the circuit board structure further includes: forming a second dielectric layer on the second circuit layer. The second dielectric layer covers the second wiring layer and fills the third via. A plurality of second blind vias are formed on the second dielectric layer, wherein the second blind vias expose a portion of the second wiring layer. Forming a third circuit layer on a portion of the second dielectric layer and filling the second blind via, wherein the third circuit layer is electrically connected to the second circuit layer.
在本發明的一實施例中,上述的線路板結構的製作方法,更包括形成一防焊層於第二介電層上。防焊層覆蓋第二介電 層,且暴露出第三線路層,而定義出至少一接墊。 In an embodiment of the invention, the method for fabricating the circuit board structure further includes forming a solder resist layer on the second dielectric layer. The solder mask covers the second dielectric The layer, and exposing the third circuit layer, defines at least one pad.
在本發明的一實施例中,上述的線路板結構的製作方法,更包括形成一種子層於第三線路層與第二介電層之間。 In an embodiment of the invention, the method for fabricating the circuit board structure further includes forming a sub-layer between the third circuit layer and the second dielectric layer.
在本發明的一實施例中,上述的線路板結構的製作方法,更包括形成一種子層於第二線路層與第一介電層之間。 In an embodiment of the invention, the method for fabricating the circuit board structure further includes forming a sub-layer between the second circuit layer and the first dielectric layer.
基於上述,在本發明的線路板結構的設計中,第二導電通孔覆蓋第二通孔的內壁,而第三通孔貫穿第一介電層且位於第二導電通孔內,且第三導電通孔覆蓋第三通孔的內壁,其中第二導電通孔與第三導電通孔定義出同軸通孔。也就是說,本發明的線路板結構可有效地利用第二通孔內的空間,來製作適用於高頻通訊的同軸通孔,可具有較佳的設計靈活度。再者,本發明的線路板結構同時具有立體電感、同軸通孔以及電容等三種不同特性的結構元件,可多元化應用且整體厚度較薄。此外,本發明的線路板結構的製作方法中,在形成第二線路層時,同時定義出了同軸通孔以及電容。也就是說,在同一製程步驟中,同時完成同軸通孔以及電容的製作,可有效地減少製程時間及生產成本。 Based on the above, in the design of the circuit board structure of the present invention, the second conductive via covers the inner wall of the second via, and the third via penetrates the first dielectric layer and is located in the second conductive via, and The three conductive vias cover the inner wall of the third via, wherein the second conductive via defines a coaxial via with the third conductive via. That is to say, the circuit board structure of the present invention can effectively utilize the space in the second through hole to make a coaxial through hole suitable for high frequency communication, and can have better design flexibility. Furthermore, the circuit board structure of the present invention has three structural components of three different characteristics, such as a three-dimensional inductor, a coaxial through hole, and a capacitor, which can be diversified and have a thin overall thickness. Further, in the method of fabricating the wiring board structure of the present invention, the coaxial via hole and the capacitor are simultaneously defined when the second wiring layer is formed. That is to say, in the same process step, the coaxial via hole and the capacitor are completed at the same time, which can effectively reduce the process time and the production cost.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。 The above described features and advantages of the invention will be apparent from the following description.
10‧‧‧立體電感 10‧‧‧Three-dimensional inductance
20‧‧‧同軸通孔 20‧‧‧Coaxial through hole
30‧‧‧電容 30‧‧‧ Capacitance
100‧‧‧線路板結構 100‧‧‧Circuit board structure
110‧‧‧絕緣基材 110‧‧‧Insulating substrate
112‧‧‧第一表面 112‧‧‧ first surface
114‧‧‧第二表面 114‧‧‧ second surface
116‧‧‧第一通孔 116‧‧‧First through hole
118‧‧‧第二通孔 118‧‧‧Second through hole
120‧‧‧第一線路層 120‧‧‧First line layer
122‧‧‧第一電容電極 122‧‧‧First Capacitance Electrode
124‧‧‧電感線路 124‧‧‧Inductance line
126‧‧‧第一導電通孔 126‧‧‧First conductive via
128‧‧‧第二導電通孔 128‧‧‧Second conductive via
130‧‧‧電容介電層 130‧‧‧Capacitive dielectric layer
140‧‧‧第一介電層 140‧‧‧First dielectric layer
142‧‧‧第三通孔 142‧‧‧ third through hole
144‧‧‧第一開口 144‧‧‧ first opening
146‧‧‧第一盲孔 146‧‧‧First blind hole
150‧‧‧第二線路層 150‧‧‧second circuit layer
152‧‧‧第二線路 152‧‧‧second line
154‧‧‧第三導電通孔 154‧‧‧ Third conductive via
156‧‧‧第一導電盲孔 156‧‧‧First conductive blind hole
158‧‧‧第二電容電極 158‧‧‧Second capacitor electrode
160‧‧‧第二介電層 160‧‧‧Second dielectric layer
162‧‧‧第二盲孔 162‧‧‧ second blind hole
170‧‧‧第三線路層 170‧‧‧ third circuit layer
172‧‧‧第三線路 172‧‧‧ third line
174‧‧‧第二導電柱 174‧‧‧Second conductive column
180‧‧‧防焊層 180‧‧‧ solder mask
S1、S2‧‧‧種子層 S1, S2‧‧‧ seed layer
P‧‧‧接墊 P‧‧‧ pads
圖1A至圖1J繪示為本發明的一實施例的一種線路板結構的 製作方法的剖面示意圖。 1A to 1J illustrate a circuit board structure according to an embodiment of the present invention. A schematic cross-sectional view of the fabrication process.
圖2A繪示為圖1B的線路板結構的立體電感的俯視示意圖。 2A is a top plan view showing the three-dimensional inductor of the circuit board structure of FIG. 1B.
圖2B繪示為圖2A的立體電感的立體示意圖。 2B is a perspective view of the three-dimensional inductor of FIG. 2A.
圖1A至圖1J繪示為本發明的一實施例的一種線路板結構的製作方法的剖面示意圖。圖2A繪示為圖1B的線路板結構的立體電感的俯視示意圖。圖2B繪示為圖2A的立體電感的立體示意圖。關於本實施例的線路板結構的製作方法,首先,請同時參考圖1A與圖2A,提供一絕緣基材110,其中絕緣基材110例如是玻璃基板、陶瓷基板、高分子玻璃纖維複合材料基板、聚醯亞胺(Polyimide;PI)玻璃纖維複合基板、具有單層或多層介電材質的介電層、外層具有介電材質且內層埋有線路的單層或多層線路板,但本發明不限於此。此處,絕緣基材110具有彼此相對的一第一表面112與一第二表面114以及連接第一表面112與第二表面114的多個第一通孔116與一第二通孔118。 1A to 1J are schematic cross-sectional views showing a method of fabricating a circuit board structure according to an embodiment of the invention. 2A is a top plan view showing the three-dimensional inductor of the circuit board structure of FIG. 1B. 2B is a perspective view of the three-dimensional inductor of FIG. 2A. Regarding the manufacturing method of the circuit board structure of the present embodiment, first, referring to FIG. 1A and FIG. 2A, an insulating substrate 110 is provided, wherein the insulating substrate 110 is, for example, a glass substrate, a ceramic substrate, or a polymer glass fiber composite substrate. , a polyimide (PI) glass fiber composite substrate, a dielectric layer having a single layer or a plurality of dielectric materials, a single layer or a multilayer circuit board having a dielectric material and an inner layer buried with an inner layer, but the present invention Not limited to this. Here, the insulating substrate 110 has a first surface 112 and a second surface 114 opposite to each other and a plurality of first through holes 116 and a second through holes 118 connecting the first surface 112 and the second surface 114 .
接著,請參考圖1B、圖2A以及圖2B,形成一第一線路層120於絕緣基材110上。第一線路層120暴露出絕緣基材110的部分第一表面112以及部分第二表面114,且包括一第一電容電極122、一電感線路124、多個第一導電通孔126與一第二導電通孔128。意即,第一線路層120為一圖案化的線路層。第一電容電極122位於第一表面112上,而電感線路124位於第一表面112 與第二表面114上。第一導電通孔126覆蓋第一通孔116的內壁,而第二導電通孔128覆蓋第二通孔118的內壁。特別是,電感線路124與第一導電通孔126以螺旋形式貫穿絕緣基材110而定義出一立體電感10。此處,採用絕緣基材110可對立體電感10的維持較佳。 Next, referring to FIG. 1B, FIG. 2A and FIG. 2B, a first wiring layer 120 is formed on the insulating substrate 110. The first circuit layer 120 exposes a portion of the first surface 112 and a portion of the second surface 114 of the insulating substrate 110, and includes a first capacitor electrode 122, an inductor line 124, a plurality of first conductive vias 126 and a second Conductive through hole 128. That is, the first circuit layer 120 is a patterned circuit layer. The first capacitor electrode 122 is located on the first surface 112, and the inductor line 124 is located on the first surface 112. With the second surface 114. The first conductive via 126 covers the inner wall of the first via 116 while the second conductive via 128 covers the inner wall of the second via 118. In particular, the inductor circuit 124 and the first conductive via 126 extend through the insulating substrate 110 in a spiral form to define a three-dimensional inductor 10. Here, the maintenance of the three-dimensional inductor 10 can be preferably performed by using the insulating substrate 110.
接著,請參考圖1C,形成一電容介電層130於第一電容電極122的一部分上。此處,電容介電層130只覆蓋在第一線路層120的一部分上,其中電容介電層130的材質包括氧化鋁(Aluminium oxide;Al2O3)、氮化鋁(Aluminium nitride;AlN)、氧化矽(Silicon oxide;SiO2)、氮化矽(Silicon nitride;Si3N4)、氧化鉿(Hafnium dioxide;HfO2)、氧化鋯(Zirconium dioxide;ZrO2)、氧化鑭(Lanthanum oxide;La2O3)、其他類似的金屬氧化物材料、金屬氮化物材料或其他適宜的高介電材料(high-K material)。 Next, referring to FIG. 1C, a capacitor dielectric layer 130 is formed on a portion of the first capacitor electrode 122. Here, the capacitor dielectric layer 130 covers only a portion of the first circuit layer 120. The material of the capacitor dielectric layer 130 includes aluminum oxide (Al 2 O 3 ), aluminum nitride (AlN). , samarium oxide (SiO 2 ), tantalum nitride (Si 3 N 4 ), hafnium dioxide (HfO 2 ), zirconium dioxide (ZrO 2 ), lanthanum oxide (Lanthanum oxide; La 2 O 3 ), other similar metal oxide materials, metal nitride materials or other suitable high-k materials.
接著,請參考圖1D,以上下熱壓合的方式,壓合一第一介電層140於第一線路層120上。此處,第一介電層140覆蓋第一線路層120以及第一線路層120所暴露出的絕緣基材110的第一表面112與第二表面114,且填滿第一通孔116與第二通孔118。 Next, referring to FIG. 1D, a first dielectric layer 140 is pressed onto the first circuit layer 120 by thermal compression bonding. Here, the first dielectric layer 140 covers the first surface 112 and the first surface 112 and the second surface 114 of the insulating substrate 110 exposed by the first circuit layer 120 and the first circuit layer 120, and fills the first through holes 116 and the first Two through holes 118.
請再參考圖1D,緊接著,透過雷射鑽孔,以形成一第三通孔142、一第一開口144以及一第一盲孔146於第一介電層140上。第三通孔142貫穿第一介電層140且位於第二導電通孔128內,而第一開口144暴露出電容介電層130,且第一盲孔146暴露 出第一線路層120的一部分。此處,如圖1D所示,第三通孔142的孔徑是由絕緣基材110的第一表面112往第二表面114逐漸減小,但並不以此為限。於其他未繪示的實施例中,第三通孔142的孔徑亦可以由絕緣基材110的第二表面114往第一表面112逐漸減小;或者是,從絕緣基材110的第一表面112至第二表面114皆維持一定值,此仍屬於本發明所欲保護的範圍。 Referring to FIG. 1D again, a third through hole 142, a first opening 144 and a first blind hole 146 are formed on the first dielectric layer 140 by laser drilling. The third via 142 extends through the first dielectric layer 140 and is located in the second conductive via 128, and the first opening 144 exposes the capacitor dielectric layer 130 and the first blind via 146 is exposed. A portion of the first circuit layer 120 is exited. Here, as shown in FIG. 1D , the aperture of the third through hole 142 is gradually reduced from the first surface 112 of the insulating substrate 110 to the second surface 114 , but is not limited thereto. In other embodiments not shown, the aperture of the third through hole 142 may also be gradually reduced from the second surface 114 of the insulating substrate 110 toward the first surface 112; or, from the first surface of the insulating substrate 110. Both 112 and second surface 114 maintain a certain value, which is still within the scope of the present invention.
接著,請參考圖1E,藉由無電鍍或其他方式,形成一種子層S1於第一介電層140上,其中種子層S1的材料例如是銅。此處,種子層S1完全覆蓋第一介電層140、第三通孔142的內壁、第一開口144的內壁以及第一盲孔146的內壁,且直接接觸第一開口144所暴露出的電容介電層130以及第一盲孔146所暴露出的第一線路層120的另一部分。 Next, referring to FIG. 1E, a sub-layer S1 is formed on the first dielectric layer 140 by electroless plating or other means, wherein the material of the seed layer S1 is, for example, copper. Here, the seed layer S1 completely covers the first dielectric layer 140, the inner wall of the third through hole 142, the inner wall of the first opening 144, and the inner wall of the first blind hole 146, and is directly exposed to the first opening 144. The capacitor dielectric layer 130 and the other portion of the first circuit layer 120 exposed by the first blind via 146.
接著,請參考圖1F,例如以半加成法(Semi-additive Process,SAP)形成一第二線路層150於第一介電層140上,其中種子層S1可作為一電鍍種子層。第二線路層150覆蓋部分第一介電層140與第三通孔142的內壁且填滿第一開口144與第一盲孔146。更進一步來說,第二線路層150包括一第二線路152、一第三導電通孔154、一第一導電盲孔156與一第二電容電極158。第二線路152配置於部分第一介電層140上,而第三導電通孔154覆蓋第三通孔142的內壁。第一導電盲孔156填滿第一盲孔146且連接第一線路層120與第二線路層150。第二電容電極158填滿第一開口144。特別是,第二導電通孔128與第三導電通孔154 定義出一同軸通孔20,而第一電容電極122、電容介電層130與第二電容電極158定義出一電容30。 Next, referring to FIG. 1F, a second wiring layer 150 is formed on the first dielectric layer 140 by, for example, a semi-additive process (SAP), wherein the seed layer S1 can serve as a plating seed layer. The second circuit layer 150 covers a portion of the first dielectric layer 140 and the inner wall of the third through hole 142 and fills the first opening 144 and the first blind hole 146. Furthermore, the second circuit layer 150 includes a second line 152, a third conductive via 154, a first conductive via 156 and a second capacitor electrode 158. The second line 152 is disposed on a portion of the first dielectric layer 140, and the third conductive via 154 covers the inner wall of the third via 142. The first conductive via 156 fills the first blind via 146 and connects the first wiring layer 120 and the second wiring layer 150. The second capacitor electrode 158 fills the first opening 144. In particular, the second conductive vias 128 and the third conductive vias 154 A coaxial via 20 is defined, and the first capacitor electrode 122, the capacitor dielectric layer 130 and the second capacitor electrode 158 define a capacitor 30.
由於本實施例的第二導電通孔128覆蓋第二通孔118的內壁,而第三通孔142貫穿第一介電層140且位於第二導電通孔128內,且第三導電通孔154覆蓋第三通孔142的內壁,其中第二導電通孔128與第三導電通孔154定義出同軸通孔20。也就是說,本實施例可有效地利用第二通孔118內的空間,來製作適用於高頻(例如至少大於等於90GHz)通訊的同軸通孔20,可具有較佳的設計靈活度。此外,在形成第二線路層150時,同時定義出了同軸通孔20以及電容30。也就是說,在同一製程步驟中,同時完成同軸通孔20以及電容30的製作,可有效地減少製程時間及生產成本。 The second conductive via 128 of the present embodiment covers the inner wall of the second via 118, and the third via 142 penetrates the first dielectric layer 140 and is located in the second conductive via 128, and the third conductive via 154 covers the inner wall of the third through hole 142 , wherein the second conductive through hole 128 and the third conductive through hole 154 define a coaxial through hole 20 . That is to say, the present embodiment can effectively utilize the space in the second through hole 118 to fabricate the coaxial through hole 20 suitable for high frequency communication (for example, at least 90 GHz or more), which can have better design flexibility. Further, when the second wiring layer 150 is formed, the coaxial via 20 and the capacitor 30 are simultaneously defined. That is to say, in the same process step, the fabrication of the coaxial via 20 and the capacitor 30 is completed at the same time, which can effectively reduce the processing time and the production cost.
接著,請參考圖1G,以上下熱壓合的方式,形成一第二介電層160於第二線路層150上。此處,第二介電層160覆蓋第二線路層150的第二線路152以及第一介電層140且填滿第三通孔142。 Next, referring to FIG. 1G, a second dielectric layer 160 is formed on the second circuit layer 150 by thermal compression. Here, the second dielectric layer 160 covers the second line 152 of the second circuit layer 150 and the first dielectric layer 140 and fills the third via 142.
接著,請參考圖1H,透過雷射鑽孔,以形成多個第二盲孔162於第二介電層160上,其中第二盲孔162暴露出部分第二線路層150,即暴露出第二線路層150的部分第二線路152。 Next, referring to FIG. 1H, a plurality of second blind vias 162 are formed on the second dielectric layer 160 by laser drilling, wherein the second blind vias 162 expose a portion of the second wiring layer 150, that is, the exposed A portion of the second line 152 of the second circuit layer 150.
之後,請同時參考圖1H與圖1I,形成一種子層S2於第二介電層160上,緊接著,例如以半加成法形成一第三線路層170於第二介電層160上且填滿第二盲孔162。此處,第三線路層170 包括一第三線路172以及多個第二導電柱174,其中第三線路172配置於第二介電層160上,而第二導電柱174填滿第二盲孔162,且第三線路層170的第三線路172透過第二導電柱174與第二線路層150被第二介電層160的第二盲孔162所暴露出的第二線路層152電性連接。種子層S2位於於第三線路層的第三線路172與第二介電層160之間以及位於第二導電柱與第二介電層160之間。 Thereafter, referring to FIG. 1H and FIG. 1I, a sub-layer S2 is formed on the second dielectric layer 160, and then a third wiring layer 170 is formed on the second dielectric layer 160, for example, by a semi-additive method. Fill the second blind hole 162. Here, the third circuit layer 170 A third line 172 and a plurality of second conductive pillars 174 are disposed, wherein the third line 172 is disposed on the second dielectric layer 160, and the second conductive pillars 174 fill the second blind vias 162, and the third wiring layer 170 The third line 172 is electrically connected to the second circuit layer 150 via the second conductive pillar 174 and the second wiring layer 152 exposed by the second blind via 162 of the second dielectric layer 160. The seed layer S2 is located between the third line 172 and the second dielectric layer 160 of the third circuit layer and between the second conductive pillar and the second dielectric layer 160.
最後,請參考圖1J,形成一防焊層180於第二介電層160上。防焊層180覆蓋第二介電層160,且暴露出第三線路層170的部分第三線路172,而定義出至少一接墊P(圖1J中示意地繪示二個)。至此,已完成線路板結構100的製作。 Finally, referring to FIG. 1J, a solder resist layer 180 is formed on the second dielectric layer 160. The solder resist layer 180 covers the second dielectric layer 160 and exposes a portion of the third line 172 of the third circuit layer 170, and defines at least one pad P (two are schematically depicted in FIG. 1J). So far, the fabrication of the circuit board structure 100 has been completed.
在結構上,請再參考圖1J,線路板結構100包括絕緣基材110、第一線路層120、電容介電層130、第一介電層140以及第二線路層150。絕緣基材110具有彼此相對的第一表面112與第二表面114以及連接第一表面112與第二表面114的第一通孔116與第二通孔118。第一線路層120配置於絕緣基材110上,且暴露出部分第一表面112與第二表面114。第一線路層120包括第一電容電極122、電感線路124、第一導電通孔126與第二導電通孔128。第一電容電極122位於第一表面112上,電感線路124位於第一表面112與第二表面114上。第一導電通孔126覆蓋第一通孔116的內壁,而第二導電通孔128覆蓋第二通孔118的內壁。電感線路124與第一導電通孔126以螺旋形式貫穿絕緣基材110而定義出立體電感10。電容介電層130配置於第一電容電極122 的一部分上。第一介電層140覆蓋第一線路層120以及第一線路層120所暴露出的絕緣基材110的第一表面112與第二表面114,且填滿第一導電通孔126與第二導電通孔128。第一介電層140具有一第三通孔142、一第一開口144以及一第一盲孔146。第三通孔142貫穿第一介電層140且位於第二導電通孔128內。第一開口144暴露出電容介電層130。第一盲孔146暴露出第一線路層120的一部分。第二線路層150配置於第一介電層140上,且包括第二線路152、第三導電通孔154、第一導電盲孔156與第二電容電極158。第二線路152配置於部分第一介電層140上。第三導電通孔154覆蓋第三通孔142的內壁。第一導電盲孔156填滿第一盲孔146且連接第一線路層120與第二線路層150。第二電容電極158填滿第一開口144。第二導電通孔128與第三導電通孔154定義出同軸通孔20。第一電容電極122、電容介電層130與第二電容電極158定義出電容30。也就是說,本實施例的線路板結構100可有效地利用第二通孔118內的空間,來製作適用於高頻通訊的同軸通孔20,可具有較佳的設計靈活度。此外,本實施例的線路板結構100同時具有立體電感10、同軸通孔20以及電容30等三種不同特性的結構元件,可多元化應用且整體厚度較薄。 Structurally, referring again to FIG. 1J, the circuit board structure 100 includes an insulating substrate 110, a first wiring layer 120, a capacitor dielectric layer 130, a first dielectric layer 140, and a second wiring layer 150. The insulating substrate 110 has a first surface 112 and a second surface 114 opposite to each other and a first through hole 116 and a second through hole 118 that connect the first surface 112 and the second surface 114. The first circuit layer 120 is disposed on the insulating substrate 110 and exposes a portion of the first surface 112 and the second surface 114. The first circuit layer 120 includes a first capacitor electrode 122, an inductor line 124, a first conductive via 126 and a second conductive via 128. The first capacitor electrode 122 is located on the first surface 112, and the inductor line 124 is located on the first surface 112 and the second surface 114. The first conductive via 126 covers the inner wall of the first via 116 while the second conductive via 128 covers the inner wall of the second via 118. The inductor line 124 and the first conductive via 126 extend through the insulating substrate 110 in a spiral form to define a three-dimensional inductor 10. The capacitor dielectric layer 130 is disposed on the first capacitor electrode 122 Part of it. The first dielectric layer 140 covers the first surface 112 and the second surface 114 of the insulating substrate 110 exposed by the first circuit layer 120 and the first circuit layer 120, and fills the first conductive via 126 and the second conductive Through hole 128. The first dielectric layer 140 has a third through hole 142 , a first opening 144 , and a first blind hole 146 . The third via 142 extends through the first dielectric layer 140 and is located within the second conductive via 128. The first opening 144 exposes the capacitive dielectric layer 130. The first blind via 146 exposes a portion of the first wiring layer 120. The second circuit layer 150 is disposed on the first dielectric layer 140 and includes a second line 152 , a third conductive via 154 , a first conductive via 156 and a second capacitor electrode 158 . The second line 152 is disposed on a portion of the first dielectric layer 140. The third conductive via 154 covers the inner wall of the third via 142. The first conductive via 156 fills the first blind via 146 and connects the first wiring layer 120 and the second wiring layer 150. The second capacitor electrode 158 fills the first opening 144. The second conductive vias 128 and the third conductive vias 154 define a coaxial via 20 . The first capacitor electrode 122, the capacitor dielectric layer 130 and the second capacitor electrode 158 define a capacitor 30. That is to say, the circuit board structure 100 of the present embodiment can effectively utilize the space in the second through hole 118 to fabricate the coaxial through hole 20 suitable for high frequency communication, which can have better design flexibility. In addition, the circuit board structure 100 of the embodiment has three structural components of three different characteristics, such as a three-dimensional inductor 10, a coaxial through hole 20, and a capacitor 30, which can be diversified and have a thin overall thickness.
此外,本實施例的線路板結構100還包括第二介電層160以及第三線路層170。第二介電層160配置於第二線路層150上,覆蓋第二線路層150且填滿第三導電通孔154。第二介電層160具有多個第二盲孔162,且第二盲孔162暴露出部分第二線路層 150。第三線路層170配置於部分第二介電層160上且填滿第二盲孔162,其中第三線路層170與第二線路層150電性連接。 In addition, the circuit board structure 100 of the present embodiment further includes a second dielectric layer 160 and a third circuit layer 170. The second dielectric layer 160 is disposed on the second circuit layer 150 , covers the second circuit layer 150 and fills the third conductive via 154 . The second dielectric layer 160 has a plurality of second blind vias 162, and the second blind vias 162 expose a portion of the second trace layer 150. The third circuit layer 170 is disposed on the portion of the second dielectric layer 160 and fills the second via hole 162 , wherein the third circuit layer 170 is electrically connected to the second circuit layer 150 .
另外,本實施例的線路板結構100更包括防焊層180,配置於第二介電層160上,覆蓋第二介電層160,且暴露出部分第三線路層170,而定義出接墊P,用以與外部電路(未繪示)電性連接。請再參考圖1J,為了增加線路板結構100的結構可靠度,本實施例的線路板結構100還包括種子層S1、S2,其中種子層S1配置於第二線路層150與第一介電層140之間以增加第二線路層150的附著性,而種子層S2配置於第三線路層170與第二介電層160之間以增加第三線路層170的附著性。 In addition, the circuit board structure 100 of the present embodiment further includes a solder resist layer 180 disposed on the second dielectric layer 160, covering the second dielectric layer 160, and exposing a portion of the third circuit layer 170, and defining a pad. P, for electrically connecting with an external circuit (not shown). Referring to FIG. 1J again, in order to increase the structural reliability of the circuit board structure 100, the circuit board structure 100 of the present embodiment further includes seed layers S1 and S2, wherein the seed layer S1 is disposed on the second circuit layer 150 and the first dielectric layer. The adhesion between the second wiring layer 150 is increased between the 140 layers, and the seed layer S2 is disposed between the third wiring layer 170 and the second dielectric layer 160 to increase the adhesion of the third wiring layer 170.
簡言之,本實施例的線路板結構100同時具有立體電感10、同軸通孔20以及電容30等三種不同特性的結構元件,可多元化應用且整體厚度較薄。當後續將線路板結構100作為一封裝載板之用時,可具有較薄的封裝厚度,可符合現今對封裝結構薄型化及輕量化的需求。此外,線路板結構100亦可以視為一中介層,可與外部電路(未繪示)電性連接。 In short, the circuit board structure 100 of the present embodiment has three structural components of three different characteristics, such as a three-dimensional inductor 10, a coaxial through hole 20, and a capacitor 30, which can be diversified and have a thin overall thickness. When the circuit board structure 100 is used as a loading board, it can have a thin package thickness, which can meet the requirements of thinning and lightening of the package structure. In addition, the circuit board structure 100 can also be regarded as an interposer, and can be electrically connected to an external circuit (not shown).
綜上所述,在本發明的線路板結構的設計中,第二導電通孔覆蓋第二通孔的內壁,而第三通孔貫穿第一介電層且位於第二導電通孔內,且第三導電通孔覆蓋第三通孔的內壁,其中第二導電通孔與第三導電通孔定義出同軸通孔。也就是說,本發明的線路板結構可有效地利用第二通孔內的空間,來製作適用於高頻通訊的同軸通孔,可具有較佳的設計靈活度。再者,本發明的線 路板結構同時具有立體電感、同軸通孔以及電容等三種不同特性的結構元件,可多元化應用且整體厚度較薄。此外,本發明的線路板結構的製作方法中,在形成第二線路層時,同時定義出了同軸通孔以及電容。也就是說,在同一製程步驟中,同時完成同軸通孔以及電容的製作,可有效地減少製程時間及生產成本。 In summary, in the design of the circuit board structure of the present invention, the second conductive via covers the inner wall of the second via, and the third via penetrates the first dielectric layer and is located in the second conductive via. And the third conductive via covers the inner wall of the third via, wherein the second conductive via defines a coaxial via with the third conductive via. That is to say, the circuit board structure of the present invention can effectively utilize the space in the second through hole to make a coaxial through hole suitable for high frequency communication, and can have better design flexibility. Furthermore, the line of the present invention The road board structure has three structural components of three different characteristics: three-dimensional inductance, coaxial through hole and capacitor, which can be diversified and the overall thickness is thin. Further, in the method of fabricating the wiring board structure of the present invention, the coaxial via hole and the capacitor are simultaneously defined when the second wiring layer is formed. That is to say, in the same process step, the coaxial via hole and the capacitor are completed at the same time, which can effectively reduce the process time and the production cost.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.
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