TWI628141B - 坩埚 release agent material - Google Patents
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Abstract
本發明提供一種坩堝脫模劑材料,主要是由氮化矽所組成,所述氮化矽成分中具有重量百分比介於0.5~30%,粒徑小於100nm之奈米氮化矽。本發明中奈米級之氮化矽粉末可以包覆於一般較大粒徑的氮化矽及填入一般較大粒徑的氮化矽堆疊排列的空隙之間的特性,使在長晶過程中,奈米氮化矽可以產生微燒結而提升了坩堝脫模劑之氮化矽間之結合力,以解決現有技術中坩堝脫模劑在使用時產生剝落或掉粉之問題,並且免除加入黏著劑所造成之工序與成本之增加及產生污染的問題。 The present invention provides a bismuth release agent material, which is mainly composed of tantalum nitride having a weight percentage of 0.5 to 30% and a particle size of less than 100 nm. In the present invention, the nanometer-sized tantalum nitride powder can be coated between a generally larger particle size tantalum nitride and a void which is filled in a generally larger particle size tantalum nitride stack, so that the crystal growth process In the middle, the nano-cerium nitride can produce micro-sintering and enhance the bonding force between the tantalum nitrides of the bismuth release agent, so as to solve the problem that the bismuth release agent in the prior art is peeled off or powdered during use, and is not added. The increase in the process and cost caused by the adhesive and the problem of pollution.
Description
本發明提供一種坩堝脫模劑材料,尤其是指一種包含一定比例之奈米級氮化矽顆粒之坩堝脫模劑材料。 The present invention provides a bismuth release agent material, and more particularly to a bismuth release agent material comprising a proportion of nano-sized cerium nitride particles.
隨著綠能的發展,多晶矽是目前最廣泛使用在太陽能電池上的材料,在製備多晶矽錠,首先將純度較高的多晶矽的原料塊,放置耐高溫的石英坩堝中熔融、長晶,退火冷卻後將多晶矽錠從石英坩堝中取出,在進行切割的動作。 With the development of green energy, polycrystalline germanium is the most widely used material on solar cells. In the preparation of polycrystalline germanium ingots, the raw material blocks of higher purity polycrystalline germanium are first placed in high temperature resistant quartz crucibles for melting, crystal growth, annealing and cooling. After that, the polycrystalline germanium ingot is taken out from the quartz crucible and the cutting operation is performed.
然而在多晶矽原料塊熔融的過程中,與石英坩堝長時間接觸,兩者會相互反應,石英坩堝中的雜質也會熔入多晶矽中,造成汙染,不僅導致所鑄成的多晶矽錠的品質降低,也會產生黏滯情況,而在冷卻時,由於兩者的膨脹係數不同,進而導致多晶矽錠破裂的情況增加,也因應力的殘留,後續的切片破裂機會也相對增加。為解決這類問題,一般是將氮化矽塗布在石英坩堝內部表面作為阻隔材料,以隔絕多晶矽原料塊在熔融過程中直接與坩堝表面接觸,不僅降低黏滯狀況,更減少雜質汙染機會。 However, in the process of melting the polycrystalline germanium material block, the quartz crucible is in contact with each other for a long time, and the two will react with each other, and the impurities in the quartz crucible will also melt into the polycrystalline crucible, causing pollution, which not only leads to a decrease in the quality of the cast polycrystalline ingot, The viscous condition also occurs, and when cooling, the expansion coefficients of the polycrystalline bismuth ingot are increased due to the different expansion coefficients of the two, and the residual rupture chance is also relatively increased due to the residual stress. In order to solve such problems, tantalum nitride is generally coated on the inner surface of the quartz crucible as a barrier material to isolate the polycrystalline germanium material block from directly contacting the crucible surface during the melting process, thereby not only reducing the viscosity state but also reducing the chance of impurity contamination.
圖1為現有技術中無額外添加黏著劑之氮化矽塗布於石英坩堝內部表面時氮化矽顆粒之結合及分布示意圖,現有用於塗布於坩堝內表面之氮化矽11,其粒徑D10一般是介於0.7~1.5μm之間,D50一般是介於1.0~3.5μm之間,D90一般是介於3.5~6.5μm之間,當塗布於石英坩堝內部表 面時是以機械咬合的自然堆疊,物理吸附的方式,吸附在石英坩堝內部表面,若是只有氮化矽加水混合而成的塗層,其燒結溫度仍大於長晶過程中的最高溫度,在長晶過程中容易出現剝落或掉粉情況,而導致矽熔湯受氮化矽顆粒汙染並影響其阻隔雜質的效果。因此,為解決此一問題,現有技術中會以添加有機或無機的黏著劑,增加氮化矽顆粒間的結合強度。但添加黏著劑,不僅增加製程上的成本和工序時間,且在高溫下,黏著劑會釋放出氧原子,造成氧擴散至矽熔湯中,而造成汙染,影響多晶矽錠的品質,因此這些問題仍是我們目前迫切需要改善與解決。 1 is a schematic view showing the combination and distribution of tantalum nitride particles coated with tantalum nitride on the inner surface of a quartz crucible without additional adhesive added in the prior art. The conventional tantalum nitride 11 coated on the inner surface of the crucible has a particle diameter D10. Generally it is between 0.7~1.5μm, D50 is generally between 1.0~3.5μm, D90 is generally between 3.5~6.5μm, when applied to quartz crucible internal table The surface is a natural stack of mechanical occlusion, physically adsorbed on the inner surface of the quartz crucible. If the coating is only mixed with tantalum nitride and water, the sintering temperature is still greater than the highest temperature during the growth of the crystal growth. In the crystal process, peeling or falling powder is prone to occur, which causes the tantalum melted soup to be contaminated by the tantalum nitride particles and affects the effect of blocking impurities. Therefore, in order to solve this problem, in the prior art, an organic or inorganic adhesive is added to increase the bonding strength between the tantalum nitride particles. However, the addition of an adhesive not only increases the cost and process time of the process, but at high temperatures, the adhesive releases oxygen atoms, causing oxygen to diffuse into the molten soup, causing pollution and affecting the quality of the polycrystalline ingot, so these problems It is still our urgent need to improve and solve.
為解決上述問題,本發明提供一種具有一定比例之奈米氮化矽之坩堝脫模劑材料。 In order to solve the above problems, the present invention provides a bismuth release agent material having a certain proportion of nano cerium nitride.
本發明所提供之坩堝脫模劑材料,主要是由氮化矽所組成,所述氮化矽成分中具有重量百分比介於0.5~30%,粒徑小於100nm之奈米氮化矽。 The ruthenium release agent material provided by the present invention is mainly composed of tantalum nitride having a weight percentage of 0.5 to 30% and a particle size of less than 100 nm.
脫模劑材料所具有之奈米氮化矽之較佳粒徑是介於10~50nm之間。 The preferred particle size of the nanonitride lanthanum of the release agent material is between 10 and 50 nm.
所述氮化矽所佔坩堝脫模劑材料之重量百分比為99%以上。 The tantalum nitride accounts for 99% by weight of the release agent material.
所述氮化矽之D50介於1.0~3.5μm之間,其β相或α相所佔的比例是介於51~99%之間。 The D50 of the tantalum nitride is between 1.0 and 3.5 μm, and the ratio of the β phase or the α phase is between 51 and 99%.
本發明提供具有一定比例之奈米氮化矽之坩堝脫模劑材料,透過奈米氮化矽燒結溫度較一般較大粒徑的氮化矽低及奈米氮化矽可以包覆於一般較大粒徑的氮化矽及填入一般較大粒徑的氮化矽堆疊排列的 空隙之間的特性,使在長晶過程中,奈米氮化矽可以產生微燒結而提升了坩堝脫模劑之氮化矽間之結合力,以解決現有技術中坩堝脫模劑在使用時產生剝落或掉粉之問題,並且免除加入黏著劑所造成之工序與成本之增加及產生污染的問題。 The invention provides a bismuth release agent material with a certain proportion of nanometer cerium nitride. The sintering temperature of the nano cerium nitride through the nano cerium nitride is lower than that of the generally larger cerium nitride and the nano cerium nitride can be coated in the general Large particle size tantalum nitride and filled with a generally larger particle size tantalum nitride stack The characteristics between the voids enable the nano-sintering of the nano-cerium nitride to increase the bonding force between the tantalum nitrides of the bismuth release agent during the crystal growth process, so as to solve the prior art hydrazine release agent during use. The problem of spalling or falling off is caused, and the increase in the number of processes and costs caused by the addition of the adhesive and the problem of contamination are eliminated.
11‧‧‧較大粒徑之氮化矽 11‧‧‧larger size tantalum nitride
12‧‧‧奈米氮化矽 12‧‧‧Nano-nitride
圖1是一般氮化矽自然堆積排列之示意圖。 Fig. 1 is a schematic view showing a natural packing arrangement of general tantalum nitride.
圖2是本發明在SEM拍攝之照片。 Figure 2 is a photograph of the present invention taken at SEM.
圖3是奈米氮化矽以最密堆積方式排列包覆一般氮化矽之示意圖。 Fig. 3 is a schematic view showing that nano-rhenium nitride is coated in a most densely packed manner to coat a general tantalum nitride.
圖4是奈米氮化矽填充在一般氮化矽間之示意圖。 Fig. 4 is a schematic view showing the filling of nanometer tantalum nitride in a general tantalum nitride.
圖5是現有一般氮化矽塗層經刮痕實驗後拍攝之照片。 Fig. 5 is a photograph taken after a scratch test of a conventional general tantalum nitride coating.
圖6是本發明具奈米顆粒氮化矽塗層經刮痕實驗後拍攝之照片。 Figure 6 is a photograph taken after the scratch test of the nanoparticle-coated tantalum nitride coating of the present invention.
以下配合圖示對本發明坩堝脫模劑材料的具體實施方式做說明。 The specific embodiment of the release agent material of the present invention will be described below with reference to the drawings.
請參閱圖2至圖4,圖2是本發明在SEM下拍攝之照片,可以看到奈米氮化矽12隨機填充及包覆在一般顆粒較大的氮化矽11間之縫隙及表面上;圖3是奈米氮化矽12以最密堆積排列方式,包覆一般較大顆粒氮化矽11之示意圖;圖4是奈米氮化矽12填充在一般較大顆粒氮化矽11間的示意圖。本發明之脫模劑材料包含99wt%以上氮化矽(Si3N4)及其他小於1wt%如鐵(Fe),鈣(Ca),鎳(Ni),銅(Cu),釔(Y),鈦(T),鉻(Cr),鎢(W)或錳(Mn) 等物質所組成,其中氮化矽(Si3N4)中β相所佔的比例為51~99%之間,其他為α相或γ相的其中一種或兩種。在其他實施方式中,氮化矽(Si3N4)之α相所佔的比例為51~99%之間,其他則為β相或γ相的其中一種或兩種。 Please refer to FIG. 2 to FIG. 4 . FIG. 2 is a photograph taken by the SEM according to the present invention. It can be seen that the nano-rhenium nitride 12 is randomly filled and coated on the gap and surface between the generally larger particles of tantalum nitride 11 . Figure 3 is a schematic diagram of the nano-tantalum nitride 12 in the most densely packed arrangement, which is coated with a generally larger particle size of tantalum nitride 11; Figure 4 is a nano-tantalum nitride 12 filled in a generally larger particle size tantalum nitride 11 Schematic diagram. The release agent material of the present invention comprises 99% by weight or more of lanthanum nitride (Si 3 N 4 ) and other less than 1% by weight such as iron (Fe), calcium (Ca), nickel (Ni), copper (Cu), yttrium (Y) , titanium (T), chromium (Cr), tungsten (W) or manganese (Mn) and other substances, wherein the proportion of β in the tantalum nitride (Si 3 N 4 ) is between 51% and 99%, Others are one or both of the alpha phase or the gamma phase. In other embodiments, the ratio of the α phase of tantalum nitride (Si3N4) is between 51% and 99%, and the others are one or both of the β phase or the γ phase.
本發明所提供之坩堝脫模劑材料之氮化矽粒徑範圍大致呈常態分布,並含有一定比例的奈米氮化矽顆粒,在脫模劑塗布於坩堝內表面時,該些奈米氮化矽顆粒可以包覆於一般較大尺寸的氮化矽顆粒,同時也可以填入較大尺寸的氮化矽顆粒間所形成的間隙中,由於奈米級氮化矽顆粒其燒結溫度較低,因此長晶時在矽原料熔融溫度下,即可產生燒結效果,透過產生燒結效果可以強化塗層中氮化矽顆粒間的結合力,形成穩固的結構,有效地避免塗層出現剝落或掉粉情況,隔絕坩堝和矽熔湯的接觸並能有效降低與鑄錠間之黏滯情況,同時使多晶矽錠破裂的情況獲得良好的改善。 The cerium nitride particle size range of the bismuth release agent material provided by the invention is substantially normal distribution, and contains a certain proportion of nano cerium nitride particles, and the nano nitrogen is applied when the release agent is coated on the inner surface of the crucible. The bismuth-removing granules can be coated on the generally larger-sized cerium nitride particles, and can also be filled in the gap formed between the larger-sized cerium nitride particles, because the nano-sized cerium nitride particles have a lower sintering temperature. Therefore, when the crystal is grown, the sintering effect can be produced at the melting temperature of the raw material, and the sintering effect can be strengthened to strengthen the bonding force between the tantalum nitride particles in the coating to form a stable structure, thereby effectively preventing the coating from peeling off or falling off. In the case of powder, the contact between the enamel and the enamel soup can be effectively reduced and the viscous condition between the ingot and the ingot can be effectively improved, and the rupture of the polycrystalline bismuth ingot is well improved.
本發明之脫模劑材料,其主要特徵在於,其氮化矽成分中具有一定範圍比例之粒徑小於100nm的奈米氮化矽顆粒。為了使脫模劑塗層的結合力最佳化,所述一定範圍比例,本發明是以最密堆積排列方式進行計算,最密堆積排列是指在一定範圍內放入最多不重疊球體的方式來達到最好堆疊的效果,而算出奈米氮化矽的重量百分比範圍,並經實驗驗證其具體效果。 The release agent material of the present invention is mainly characterized in that the cerium nitride component has a certain proportion of nanometer cerium nitride particles having a particle diameter of less than 100 nm. In order to optimize the bonding force of the release agent coating, the present invention is calculated in the most densely packed arrangement, and the closest packed arrangement refers to the manner in which the most overlapping spheres are placed within a certain range. To achieve the best stacking effect, calculate the weight percentage range of nano-nitride, and verify the specific effect by experiment.
由於奈米氮化矽12包覆較大顆粒氮化矽11的數量會比奈米氮化矽12填入較大顆粒氮化矽11間空隙的數量要多,因此將最密堆積包覆較大顆粒氮化矽的數量做為最大範圍之依據,以填充於較大顆粒氮化矽間空隙的數量做最小範圍的依據。計算奈米氮化矽將較大顆粒氮化矽表面包 覆之數量,是利用奈米氮化矽12以最密堆積方式排列其投影面積與較大顆粒氮化矽11表面積之比值,可得方程式,其中N為包覆較大顆粒氮化矽11所需之奈米氮化矽12的數量,R為較大顆粒氮化矽的半徑,r為奈米氮化矽的半徑,奈米氮化矽的含量,會因所包覆之較大顆粒氮化矽的粒徑大小而改變。例如:用50nm的奈米氮化矽以最密堆積排列,將D50為3μm的較大顆粒氮化矽完全包覆,根據上述方程式計算,求得N=14884為奈米氮化矽的顆粒數,再乘上體積與密度,就可以求得奈米氮化矽重量,其最大重量百分比為6.45wt%。 Since the number of nano-sized cerium nitride 11 coated with nano-cerium nitride 12 is larger than that of nano-sized cerium nitride 12 filled with larger particles of tantalum nitride 11, the densest packing is larger. The amount of barium nitride nitride is used as the basis for the maximum range, and the basis for filling the gap between the larger particles of tantalum nitride is the minimum range. Calculating the amount of nano-cerium nitride coating on the surface of the larger particle tantalum nitride is the ratio of the projected area of the nano-sized tantalum nitride 12 in the most densely packed manner to the surface area of the larger particle size of the tantalum nitride. equation , where N is the number of nano-cerium nitrides 12 required to coat the larger particles of tantalum nitride 11, R is the radius of the larger particles of tantalum nitride, r is the radius of the nano-cerium nitride, nanonitriding The content of cerium varies depending on the particle size of the larger particle cerium nitride coated. For example, a 50 nm nano-n-nitride is arranged in the closest packing, and a larger particle of cerium nitride having a D50 of 3 μm is completely coated. According to the above equation, the number of particles of N=14884 is determined. Then, by multiplying the volume and the density, the weight of the nanometer tantalum nitride can be obtained, and the maximum weight percentage is 6.45 wt%.
一般粉末的燒結溫度為在熔點溫度以下,約為熔點的0.9倍,而一般顆粒大小之氮化矽其燒結溫度在2073K以上,高於長晶過程中的最高溫度,因此在長晶過程中氮化矽無法產生燒結,在現有技術中為強化氮化矽塗層之結合力,一般是添加其他添加劑,但這會使長晶製程的成本提高,工序增加,以及加大氧擴散機會,因而對多晶矽錠的品質會造成嚴重不利的影響。本發明是在脫模劑材料中利用奈米氮化矽12其奈米尺寸的熱學性質,根據表體比效應,使奈米氮化矽12燒結溫度比一般大小之氮化矽11燒結溫度低約300~400K左右,因此在長晶過程中塗布在坩堝內表面之氮化矽脫模塗層中之奈米氮化矽12就會產生微熔融狀態,而有燒結效果,使氮化矽塗層的結合力明顯增加。 Generally, the sintering temperature of the powder is below the melting point temperature, about 0.9 times the melting point, and the general particle size of the tantalum nitride has a sintering temperature of more than 2073 K, which is higher than the highest temperature in the crystal growth process, so the nitrogen in the crystal growth process Huayu can not produce sintering. In the prior art, in order to strengthen the bonding force of the tantalum nitride coating, generally other additives are added, but this will increase the cost of the crystal growth process, increase the process, and increase the oxygen diffusion opportunity, thus the polycrystalline silicon. The quality of the ingot can have serious adverse effects. The invention utilizes the thermal properties of the nanometer size of nano-n-nitride 12 in the release agent material, and the sintering temperature of the nano-cerium nitride 12 is lower than the sintering temperature of the general-purpose tantalum nitride 11 according to the surface specific effect. About 300~400K, so the nano-melting layer 12 coated in the tantalum nitride release coating on the inner surface of the crucible during the crystal growth process will have a micro-melting state, and has a sintering effect, so that the tantalum nitride coating The bonding strength of the layer is significantly increased.
表體比效應促使氮化矽的燒結溫度,於奈米尺寸時,燒結溫度會下降300~400K,原因為固體材料於奈米尺寸會改變光學、力學、熱學及電學性質,當總體積固定時,粒徑越小數量越多,總表面積相對越大, 曝露於外層的原子佔總比例變大,促使其達到燒結與熔化所需內能變小,降低燒結溫度與熔點,而當氮化矽於奈米尺寸小於100nm,表體比效應對燒結溫度有明顯的影響。不同材料的效果亦會不同,例如:黃金粒子粒徑10nm則熔點會下降約27K,2nm會降低300K左右。 The body-to-body ratio effect causes the sintering temperature of tantalum nitride. At the nanometer size, the sintering temperature drops by 300-400K because the solid material changes optical, mechanical, thermal and electrical properties at the nanometer size, when the total volume is fixed. The smaller the particle size, the larger the total surface area and the larger the total surface area. The proportion of atoms exposed to the outer layer becomes larger, which causes the internal energy required for sintering and melting to become smaller, lowering the sintering temperature and melting point, and when the tantalum nitride is less than 100 nm in nanometer size, the surface specific effect has a sintering temperature. Obvious influence. The effect of different materials will also be different. For example, if the particle size of gold particles is 10 nm, the melting point will decrease by about 27K, and 2nm will decrease by about 300K.
根據文獻[Semicond.Sci.Technol.16(2001)L33-L35]所述,得到奈米粒子對熔點影響之模擬公式:,r與r0為粒子直徑,Tr與T0分別為粒徑為r與r0時之熔點,σr與σ0分別為粒徑為r時之均方位移與r0時之均方位移,α為粒子表面均方位移與內部均方位移比例。根據上述公式推算,溫度達1773K時,當氮化矽顆粒小於100nm時會有燒結效果,而在100nm以上燒結效果較不明顯。 According to the literature [Semicond. Sci. Technol. 16 (2001) L33-L35], a simulation formula for the influence of nanoparticle on the melting point is obtained: r and r0 are the particle diameters, Tr and T0 are the melting points of the particle diameters r and r0, respectively, and σr and σ0 are the mean square displacement of the particle size r and the mean square displacement of r0, respectively, and α is the particle surface. The ratio of the square displacement to the internal mean square displacement. According to the above formula, when the temperature reaches 1773K, the sintering effect is obtained when the tantalum nitride particles are less than 100 nm, and the sintering effect is less obvious when the temperature is above 100 nm.
本發明是以最密堆積排列方式,一般氮化矽與氮化矽11間空隙較大,因奈米氮化矽12的填入,使空隙減至最少,且奈米氮化矽12燒結溫度降低,因此當溫度到1673~1773K時,可達到燒結效果,將促使氮化矽塗層形成較穩固的阻隔層,強化氮化矽與氮化矽間黏著強度,因此,可不必再使用添加劑,就達到加強氮化矽的結合強度,這不僅降低氮化矽剝落或掉粉的機會,也避免坩堝於長晶過程中,因與矽熔湯反應造成沾黏而導致破裂,更大幅度降低因添加黏著劑,而導致氧擴散的汙染。 The invention adopts the most dense packing arrangement, generally the gap between the tantalum nitride and the tantalum nitride 11 is large, and the voids are minimized due to the filling of the nanometer tantalum nitride 12, and the sintering temperature of the nanometer tantalum nitride 12 Reduced, so when the temperature reaches 1673 ~ 1773K, the sintering effect can be achieved, which will promote the formation of a more stable barrier layer and strengthen the adhesion strength between tantalum nitride and tantalum nitride. Therefore, it is no longer necessary to use additives. In order to achieve the strengthening of the bonding strength of tantalum nitride, this not only reduces the chance of bismuth nitride flaking or falling powder, but also avoids the rutting caused by the reaction with bismuth melt in the process of crystal growth, which greatly reduces the cause. Adhesive is added, which causes contamination of oxygen diffusion.
以下以具體實施方式說明本發明所包含的奈米氮化矽較佳重量百分比。 The preferred weight percentage of nano-cerium nitride contained in the present invention is described below in the detailed description.
當奈米氮化矽平均粒徑為90nm,以最密堆積方式包覆D50為1μm之氮化矽時,可以算出奈米氮化矽重量百分比約為30%。 When the average particle diameter of the nanometer niobium nitride is 90 nm, and the tantalum nitride having a D50 of 1 μm is coated in the closest packing manner, the weight percentage of the nanometer niobium nitride can be calculated to be about 30%.
當奈米氮化矽平均粒徑為50nm,以最密堆積方式包覆D50為1μm之氮化矽時,可以算出奈米氮化矽重量百分比約為18%。 When the average particle diameter of the nanometer niobium nitride is 50 nm, and the tantalum nitride having a D50 of 1 μm is coated in the closest packing manner, the weight percentage of the nanometer niobium nitride can be calculated to be about 18%.
當奈米氮化矽平均粒徑為10nm,以最密堆積方式包覆D50為3.5μm之氮化矽時,可以算出奈米氮化矽重量百分比約為0.5%。 When the average particle diameter of the nanometer tantalum nitride is 10 nm, and the tantalum nitride having a D50 of 3.5 μm is coated in the closest packing manner, the weight percentage of the nanometer tantalum nitride can be calculated to be about 0.5%.
奈米氮化矽之重量百分比會隨著奈米氮化矽平均粒徑及所包覆的一般氮化矽粒徑之間的關係而有比例上範圍的變化,但由於奈米氮化矽不易生產,當奈米氮化矽所佔之比例越高時成本也會增加,因此奈米氮化矽較理想粒徑範圍是介於10~50nm之間,其佔脫模劑材料中之氮化矽重量百分比較佳之範圍是介於1~20wt%之間。 The weight percentage of nano-cerium nitride will vary proportionally with the relationship between the average particle diameter of nano-cerium nitride and the particle size of the general tantalum nitride coated, but it is not easy to be nitrided by nano-nitride. Production, when the proportion of nano-nitride is higher, the cost will increase. Therefore, the ideal particle size range of nano-cerium nitride is between 10 and 50 nm, which accounts for nitriding in the release agent material. The preferred range of weight percentage is between 1 and 20% by weight.
圖5是含一般氮化矽之脫模劑材料,塗佈於坩堝經過長晶過程後之塗層,經過刮除後,可以看出仍是呈粉狀結構;圖6則是本發明具有一定比例之奈米氮化矽之脫模劑材料,塗佈於坩堝經過長晶過程後之塗層,經過刮除後,產生具片狀之結構,表示具有奈米氮化矽之脫模劑在長晶過程後,確實產生燒結效果,並明顯增強了氮化矽塗層的結合強度。 Figure 5 is a release agent material containing general tantalum nitride, which is applied to the coating after the crystallization of the ruthenium. After scraping, it can be seen that it is still in a powdery structure; Figure 6 shows that the invention has certain The ratio of the nano-tantalum nitride release agent material is coated on the coating after the crystallization process of the ruthenium, and after scraping, a sheet-like structure is formed, indicating that the release agent having nano-rhenium nitride is After the crystal growth process, the sintering effect is indeed produced, and the bonding strength of the tantalum nitride coating is remarkably enhanced.
本發明藉由氮化矽在奈米尺寸的特性,有效強化氮化矽間的結合強度,與現有技術相比,可明顯減少晶錠與坩堝沾黏的情況,避免沾黏造成的坩堝破裂,減少因沾黏造成晶錠產生應力缺陷,因不必使用黏著劑而降低製程成本,減少工序,降低長晶過程中氧擴散機率,大幅度提升晶錠良率。以上所述者僅為用以解釋本發明之較佳實施例,並非企圖據以對本發明做任何形式上之限制,凡在相同發明精神下所作有關本發明之任何修飾或變更,皆仍應包括在本發明意圖保護之範疇。 The invention effectively strengthens the bonding strength between the tantalum nitrides by the characteristics of the tantalum nitride in the nanometer size, and can significantly reduce the sticking of the ingot and the crucible compared with the prior art, and avoid the flaw of the crucible caused by the sticking. Reducing the stress defects caused by sticking in the ingot, reducing the process cost, reducing the number of processes, reducing the oxygen diffusion rate in the crystal growth process, and greatly increasing the yield of the ingot by eliminating the need for an adhesive. The above is only a preferred embodiment for explaining the present invention, and is not intended to limit the invention in any way. Any modifications or alterations to the present invention in the spirit of the same invention should still be included. It is intended to be within the scope of the invention.
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