TWI623359B - Substrate cleaning method and cleaning device - Google Patents

Substrate cleaning method and cleaning device Download PDF

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Publication number
TWI623359B
TWI623359B TW106108967A TW106108967A TWI623359B TW I623359 B TWI623359 B TW I623359B TW 106108967 A TW106108967 A TW 106108967A TW 106108967 A TW106108967 A TW 106108967A TW I623359 B TWI623359 B TW I623359B
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Taiwan
Prior art keywords
substrate
moving
chamber
receiving element
cleaning
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TW106108967A
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Chinese (zh)
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TW201834756A (en
Inventor
黃建凱
丁啓民
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亞智科技股份有限公司
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Priority to TW106108967A priority Critical patent/TWI623359B/en
Priority to CN201710418550.9A priority patent/CN108620371B/en
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Publication of TWI623359B publication Critical patent/TWI623359B/en
Publication of TW201834756A publication Critical patent/TW201834756A/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02Cleaning by the force of jets or sprays
    • B08B3/022Cleaning travelling work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B13/00Accessories or details of general applicability for machines or apparatus for cleaning
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning By Liquid Or Steam (AREA)

Abstract

一種清洗設備,包括第一腔室、移動元件、滾輪組、承接元件及噴管元件。移動元件位於第一腔室內。滾輪組容置於第一腔室,承接元件位於第一腔室內,承接元件用以承接移動元件所傳送的基板。噴管元件位於第一腔室內,且噴管元件位於承接元件之下,噴管元件用以朝承接元件的簍空部內的基板的下表面噴灑液體。此外,一種基板清洗方法亦被提出。 A cleaning device includes a first chamber, a moving element, a roller group, a receiving element, and a nozzle element. The moving element is located in the first chamber. The roller assembly is accommodated in the first cavity, and the receiving element is located in the first cavity. The receiving element is used for receiving the substrate transferred by the moving element. The nozzle element is located in the first chamber, and the nozzle element is located under the receiving element. The nozzle element is used to spray liquid onto the lower surface of the substrate in the basket of the receiving element. In addition, a substrate cleaning method is also proposed.

Description

基板清洗方法與清洗設備 Substrate cleaning method and cleaning equipment

本發明是有關於一種製程方法與製程設備,且特別是有關於一種基板清洗方法與清洗設備。 The invention relates to a manufacturing method and manufacturing equipment, and more particularly to a substrate cleaning method and washing equipment.

於現代高科技產業的製造的過程中,基板經過如清洗、蝕刻、塗佈、顯影、乾燥等多道工序來製造,所述各製造工序中均設有輸送裝置,如此便可藉由輸送裝置將基板輸送至各道製造工序的位置,並進行相關製程加工。 In the manufacturing process of the modern high-tech industry, the substrate is manufactured through multiple processes such as cleaning, etching, coating, development, and drying. Each of the manufacturing processes is provided with a conveying device, so that the conveying device can be used. The substrate is transported to the position of each manufacturing process, and related process processing is performed.

在製程基板之前,需先經過清洗基板的動作,為因應製程所需,必須防止基板的某一面(用來製程的製程面)被清洗,故只能清洗基板的另一面(非製程面),然現有機制中均為清洗基板的相對兩面。 Before manufacturing the substrate, you need to clean the substrate first. In order to meet the needs of the process, you must prevent one side of the substrate (the process side used for the process) from being cleaned. Therefore, you can only clean the other side (the non-process side) of the substrate. However, in the existing mechanism, two opposite sides of the substrate are cleaned.

因此,如何達到上述清洗基板的單一表面,為目前業界的重要課題。 Therefore, how to achieve the single surface cleaning of the substrate is an important issue in the industry.

本發明的一目的在於,能達到清洗基板的單一表面。 It is an object of the present invention to enable a single surface of a substrate to be cleaned.

本發明的一實施例提出一種基板清洗方法,基板清洗方法適 用於一清洗設備,清洗設備包含一滾輪組、至少一噴管元件、至少一移動元件以及一承接元件,滾輪組於一輸送位置上輸送一基板,輸送位置為滾輪組位於移動元件的一移動行程的一第一位置上,移出位置為滾輪組離開移動行程,移動元件沿移動行程將基板於第一位置、一第二位置及一第三位置之間移動,第二位置高於第一位置,第三位置低於第一位置,承接元件設於第三位置,且承接元件具有一簍空部,基板清洗方法包括以下步驟。藉由移動元件將基板沿著移動行程由第一位置上移至第二位置。滾輪組由輸送位置移動至移出位置。藉由移動元件將基板沿著移動行程由第二位置下移至第三位置中的承接元件。噴管元件朝承接元件的簍空部內的基板的一下表面噴灑液體。 An embodiment of the present invention provides a substrate cleaning method. The substrate cleaning method is suitable. For a cleaning device, the cleaning device includes a roller set, at least one nozzle element, at least one moving element, and a receiving element. The roller set conveys a substrate at a conveying position, and the conveying position is a movement of the roller set at the moving element. In a first position of the stroke, the moving position is the roller group leaving the moving stroke. The moving element moves the substrate between the first position, a second position, and a third position along the moving stroke, and the second position is higher than the first position. The third position is lower than the first position, the receiving element is disposed in the third position, and the receiving element has a basket portion. The substrate cleaning method includes the following steps. The substrate is moved from the first position to the second position along the moving stroke by the moving element. The roller group is moved from the conveying position to the removing position. The moving element moves the substrate along the moving stroke from the second position to the receiving element in the third position. The nozzle element sprays liquid on the lower surface of the substrate in the basket receiving part.

本發明的一實施例提出一種清洗設備,清洗設備包括一第一腔室、一移動元件、一滾輪組、一承接元件以及至少一噴管元件。移動元件位於第一腔室內,移動元件沿一移動行程將基板於一第一位置、一第二位置及一第三位置之間移動中,其中第二位置高於第一位置,第三位置低於第一位置。滾輪組容置於第一腔室,滾輪組具有一輸送位置及一移出位置,輸送位置為滾輪組位於移動行程的第一位置上,移出位置為滾輪組離開移動行程。承接元件位於第一腔室內,且承接元件設於第三位置,承接元件具有一簍空部,承接元件用以承接移動元件所傳送的基板。噴管元件位於第一腔室內,且噴管元件位於承接元件之下,噴管元件用以朝承接元件的簍空部內的基板的一下表面噴灑液體。 An embodiment of the present invention provides a cleaning device. The cleaning device includes a first chamber, a moving element, a roller set, a receiving element, and at least one nozzle element. The moving element is located in the first cavity, and the moving element moves the substrate between a first position, a second position, and a third position along a moving stroke, wherein the second position is higher than the first position and the third position is low In the first position. The roller group is accommodated in the first chamber. The roller group has a conveying position and a moving position. The conveying position is that the roller group is located at the first position of the moving stroke, and the moving position is that the roller group leaves the moving stroke. The receiving element is located in the first cavity, and the receiving element is disposed in the third position. The receiving element has a basket, and the receiving element is used for receiving the substrate transferred by the moving element. The nozzle element is located in the first chamber, and the nozzle element is located under the receiving element. The nozzle element is used to spray liquid onto the lower surface of the substrate in the basket of the receiving element.

基於上述,在本發明的基板清洗方法與清洗設備中,藉由移動元件將基板由滾輪組移動至承接元件,使得基板的下表面暴露於承接元 件的簍空部。如此配置之下,噴管元件所噴灑的液體通過承接元件的簍空部後而噴灑至基板的下表面,以達到清洗基板的單一表面的目的。 Based on the above, in the substrate cleaning method and cleaning equipment of the present invention, the substrate is moved from the roller set to the receiving element by the moving element, so that the lower surface of the substrate is exposed to the receiving element. Empty parts of the pieces. With this configuration, the liquid sprayed by the nozzle element is sprayed to the lower surface of the substrate after passing through the empty part of the receiving element, so as to achieve the purpose of cleaning a single surface of the substrate.

50‧‧‧基板 50‧‧‧ substrate

52‧‧‧上表面 52‧‧‧ Top surface

54‧‧‧下表面 54‧‧‧ lower surface

100‧‧‧清洗設備 100‧‧‧cleaning equipment

110‧‧‧第一腔室 110‧‧‧First Chamber

120‧‧‧滾輪組 120‧‧‧roller set

122‧‧‧傳動元件 122‧‧‧ Transmission element

124‧‧‧滾輪 124‧‧‧roller

130‧‧‧移轉元件 130‧‧‧ transfer components

132‧‧‧連接件 132‧‧‧Connector

134‧‧‧滑座 134‧‧‧slide

136‧‧‧滑軌 136‧‧‧Slide

140‧‧‧移動元件 140‧‧‧mobile components

142‧‧‧頂銷 142‧‧‧ Top pin

144‧‧‧齒輪排 144‧‧‧Gear

146‧‧‧齒輪 146‧‧‧Gear

150‧‧‧承接元件 150‧‧‧Accepting components

152‧‧‧簍空部 152‧‧‧ Basket empty department

154‧‧‧承靠部 154‧‧‧bearing department

160‧‧‧噴管元件 160‧‧‧ Nozzle element

162‧‧‧噴嘴 162‧‧‧Nozzle

170‧‧‧清洗元件 170‧‧‧Cleaning elements

172‧‧‧噴嘴 172‧‧‧Nozzle

180‧‧‧蓋體 180‧‧‧ Cover

182‧‧‧移動件 182‧‧‧moving parts

190‧‧‧氣流元件 190‧‧‧Airflow element

192‧‧‧噴嘴 192‧‧‧Nozzle

112‧‧‧第二腔室 112‧‧‧Second Chamber

112A‧‧‧滾輪組 112A‧‧‧roller set

114‧‧‧第三腔室 114‧‧‧ Third Chamber

114A‧‧‧滾輪組 114A‧‧‧roller set

G1‧‧‧清洗液 G1‧‧‧Cleaning liquid

G2‧‧‧液體 G2‧‧‧Liquid

G3‧‧‧氣流 G3‧‧‧Airflow

L1‧‧‧移動行程 L1‧‧‧moving stroke

P1‧‧‧輸送位置 P1‧‧‧Conveying position

P2‧‧‧移出位置 P2‧‧‧moved out

P3‧‧‧第一位置 P3‧‧‧First position

P4‧‧‧第二位置 P4‧‧‧Second position

P5‧‧‧第三位置 P5‧‧‧Third position

S10‧‧‧基板清洗方法 S10‧‧‧Substrate cleaning method

S110~S220‧‧‧步驟 S110 ~ S220‧‧‧step

圖1為本發明的清洗設備的示意圖。 FIG. 1 is a schematic diagram of a cleaning device of the present invention.

圖2為本發明的基板清洗方法的流程圖。 FIG. 2 is a flowchart of a substrate cleaning method according to the present invention.

圖3至圖11為本發明的清洗設備對應圖2的流程示意圖。 FIG. 3 to FIG. 11 are schematic flowcharts of the cleaning device corresponding to FIG. 2 according to the present invention.

圖12為圖2基板清洗方法一實施例的流程圖。 FIG. 12 is a flowchart of an embodiment of the substrate cleaning method of FIG. 2.

圖13為圖2基板清洗方法一實施例的流程圖。 FIG. 13 is a flowchart of an embodiment of the substrate cleaning method of FIG. 2.

以下結合附圖和實施例,對本發明的具體實施方式作進一步描述。以下實施例僅用於更加清楚地說明本發明的技術方案,而不能以此限制本發明的保護範圍。 The specific embodiments of the present invention will be further described below with reference to the accompanying drawings and embodiments. The following embodiments are only used to more clearly illustrate the technical solution of the present invention, but cannot limit the protection scope of the present invention.

圖1為本發明的清洗設備的示意圖。請參閱圖1,本實施例的清洗設備100包括一第一腔室110、一滾輪組120、一移轉元件130、一移動元件140、一承接元件150、至少一噴管元件160(圖1繪示一個噴管元件160)、一清洗元件170、一蓋體180以及至少一氣流元件190(圖1繪示一個氣流元件190)。 FIG. 1 is a schematic diagram of a cleaning device of the present invention. Referring to FIG. 1, the cleaning device 100 of this embodiment includes a first chamber 110, a roller set 120, a transfer element 130, a moving element 140, a receiving element 150, and at least one nozzle element 160 (FIG. 1 A nozzle element 160), a cleaning element 170, a cover 180, and at least one airflow element 190 are shown (FIG. 1 shows an airflow element 190).

滾輪組120容置於第一腔室110。具體而言,滾輪組120包括一傳動元件122以及複數滾輪124,複數滾輪124連接於傳動元件122,傳動 元件122用以帶動滾輪124轉動,藉由滾輪124轉動以達到傳送基板的目的。在本實施例中,傳動元件122例如為齒輪與馬達的組合,然本發明不對此加以限制。 The roller set 120 is accommodated in the first chamber 110. Specifically, the roller set 120 includes a transmission element 122 and a plurality of rollers 124. The plurality of rollers 124 are connected to the transmission element 122, and the transmission The element 122 is used to drive the roller 124 to rotate, and the roller 124 is rotated to achieve the purpose of transferring the substrate. In this embodiment, the transmission element 122 is, for example, a combination of a gear and a motor, but the present invention is not limited thereto.

移轉元件130位於第一腔室110內,且移轉元件130位於滾輪組120的外側邊。具體而言,移轉元件130包括一連接件132、一滑座134以及一滑軌136,其中連接件132連接於滾輪組120,連接件132連接於滑座134,滑座134可滑動地連接於滑軌136。在本實施例中,移轉元件130耦接於一動力元件(未繪示),動力元件例如為一汽缸,藉此能以汽缸為動力來使得滑座134在滑軌136上移動。 The transfer element 130 is located in the first chamber 110, and the transfer element 130 is located on the outer side of the roller set 120. Specifically, the transfer element 130 includes a connecting piece 132, a slide base 134, and a slide rail 136. The connecting piece 132 is connected to the roller set 120, the connecting piece 132 is connected to the slide base 134, and the slide base 134 is slidably connected.于 滑杆 136. In this embodiment, the transfer element 130 is coupled to a power element (not shown). The power element is, for example, a cylinder, so that the slide 134 can be moved on the slide rail 136 by using the cylinder as power.

移動元件140位於第一腔室110內,且移動元件140位於滾輪組120的下方。移動元件140具有一移動行程L1。具體而言,移動元件140包括一頂銷(pin)142、一齒輪排144以及複數齒輪146,複數齒輪146連接於齒輪排144,頂銷142耦接於複數齒輪146,如此一來,藉由齒輪146與齒輪排144的相互作動,以驅動頂銷142能沿移動行程L1移動。 The moving element 140 is located in the first chamber 110, and the moving element 140 is located below the roller set 120. The moving element 140 has a moving stroke L1. Specifically, the moving element 140 includes a pin 142, a gear row 144, and a plurality of gears 146. The plurality of gears 146 is connected to the gear row 144, and the pin 142 is coupled to the plurality of gears 146. In this way, by The gear 146 and the gear row 144 interact with each other to drive the ejector pin 142 to move along the moving stroke L1.

承接元件150位於第一腔室110內,承接元件150位於滾輪組120之下。在本實施例中,承接元件150例如為一容置槽體。承接元件150具有一簍空部152,簍空部152為一孔洞,本實施例是在承接元件150底部開孔而形成簍空部152。承接元件150頂面兩側係設有一承靠部154。承接元件150的承靠部154用以承接移動元件140所輸送的基板。 The receiving element 150 is located in the first chamber 110, and the receiving element 150 is located below the roller set 120. In this embodiment, the receiving element 150 is, for example, a receiving groove body. The receiving element 150 has a basket 152, and the basket 152 is a hole. In this embodiment, a hole is formed in the bottom of the receiving element 150 to form the basket 152. A supporting portion 154 is provided on both sides of the top surface of the receiving element 150. The supporting portion 154 of the receiving element 150 is used to receive the substrate conveyed by the moving element 140.

噴管元件160位於第一腔室110內,且噴管元件160位於承接元件150之下,即承接元件150位於滾輪組120與噴管元件160之間。噴管元件160設有噴嘴162,噴嘴162用以朝承接元件150的簍空部152內噴灑一液 體。需說明的是,為了避免噴管元件160所噴灑的液體流入至移動元件140,可將噴管元件160與移動元件140係分別設置在第一腔室內不同區域(未繪示),以隔離噴管元件160與移動元件140,藉此達到乾溼分離的目的。清洗元件170位於第一腔室110內,且清洗元件170位於移轉元件130之下,清洗元件170的噴嘴172用以提供一清洗液,以清洗滾輪組120。 The nozzle element 160 is located in the first chamber 110, and the nozzle element 160 is located below the receiving element 150, that is, the receiving element 150 is located between the roller group 120 and the nozzle element 160. The nozzle element 160 is provided with a nozzle 162 for spraying a liquid into the basket 152 of the receiving element 150 body. It should be noted that, in order to prevent the liquid sprayed by the nozzle element 160 from flowing into the moving element 140, the nozzle element 160 and the moving element 140 may be respectively disposed in different regions (not shown) in the first chamber to isolate the spray. The tube element 160 and the moving element 140 achieve the purpose of dry and wet separation. The cleaning element 170 is located in the first chamber 110, and the cleaning element 170 is located below the transfer element 130. The nozzle 172 of the cleaning element 170 is used to provide a cleaning liquid to clean the roller set 120.

蓋體180位於第一腔室110內,蓋體180位於滾輪組120之上。蓋體180包含一移動件182,移動件182設於第一腔室110。當基板被移動元件140輸送至承接元件150時,移動件182用以將蓋體180沿著移動行程L1移動,以達到蓋體180遮蓋住基板的上表面的目的。氣流元件190位於蓋體180內,當蓋體180遮蓋住基板的上表面時,氣流元件190的噴嘴192用以提供一氣流至基板的上表面。 The cover 180 is located in the first chamber 110, and the cover 180 is located above the roller group 120. The cover 180 includes a moving member 182, and the moving member 182 is disposed in the first chamber 110. When the substrate is transported by the moving element 140 to the receiving element 150, the moving member 182 is used to move the cover 180 along the moving stroke L1, so as to achieve the purpose that the cover 180 covers the upper surface of the substrate. The airflow element 190 is located in the cover 180. When the cover 180 covers the upper surface of the substrate, the nozzle 192 of the airflow element 190 is used to provide an airflow to the upper surface of the substrate.

圖2為本發明的基板清洗方法的流程圖。圖3至圖11為本發明的清洗設備對應圖2的流程示意圖。需說明的是,圖3至圖10與圖1相似,其中相同的元件以相同的標號表示且具有相同的功效而不再重複說明。而圖11則示意繪製出清洗設備100中其他腔室。請先參閱圖2。本實施例的基板清洗方法S10適用於如圖1所示的清洗設備100。基板清洗方法S10包括以下步驟S110至步驟S220。 FIG. 2 is a flowchart of a substrate cleaning method according to the present invention. FIG. 3 to FIG. 11 are schematic flowcharts of the cleaning device corresponding to FIG. 2 according to the present invention. It should be noted that FIG. 3 to FIG. 10 are similar to FIG. 1, in which the same elements are denoted by the same reference numerals and have the same effects, and will not be described repeatedly. FIG. 11 schematically illustrates other chambers in the cleaning apparatus 100. Please refer to Figure 2 first. The substrate cleaning method S10 of this embodiment is applicable to the cleaning apparatus 100 shown in FIG. 1. The substrate cleaning method S10 includes the following steps S110 to S220.

進行步驟S110,藉由滾輪組120將基板50移動至第一位置P3。如圖3所示,滾輪組120於一輸送位置P1上輸送基板50,藉由複數滾輪124來將基板50輸送至第一位置P3,其中輸送位置P1為滾輪組120位於移動元件140的移動行程L1的第一位置P3上,而承接元件150設於第三位置P5,第三位置P5低於第一位置P3。 Step S110 is performed to move the substrate 50 to the first position P3 by the roller group 120. As shown in FIG. 3, the roller set 120 conveys the substrate 50 at a conveying position P1, and the substrate 50 is conveyed to the first position P3 by a plurality of rollers 124, wherein the conveying position P1 is the moving stroke of the roller set 120 at the moving element 140 L1 is at the first position P3, and the receiving element 150 is disposed at the third position P5, and the third position P5 is lower than the first position P3.

請復參閱圖2,進行步驟S120,藉由移動元件140將基板50沿著移動行程L1由第一位置P3上移至第二位置P4。如圖4所示,藉由齒輪146與齒輪排144的相互作動,以驅動頂銷142能沿移動行程L1接觸至基板50,接著頂銷142繼續向上以將基板50由第一位置P3上移至第二位置P4,其中第二位置P4高於第一位置P3。 Referring to FIG. 2 again, step S120 is performed, and the substrate 50 is moved from the first position P3 to the second position P4 along the moving stroke L1 by the moving element 140. As shown in FIG. 4, by the mutual action of the gear 146 and the gear row 144, the driving pin 142 can contact the substrate 50 along the moving stroke L1, and then the driving pin 142 continues upward to move the substrate 50 from the first position P3. To the second position P4, where the second position P4 is higher than the first position P3.

請復參閱圖2,進行步驟S130,滾輪組120由輸送位置P1移動至移出位置P2,其中移出位置P2為滾輪組120離開移動行程L1。如圖5所示,移轉元件130中的滑座134在滑軌136上移動,連接件132帶動部分被連接件132連接的滾輪124朝移動行程L1的左右兩側邊移動,以分離滾輪組120。需說明的是,此部分被連接件132連接的滾輪124分離時,與滾輪124連接的傳動元件122(如齒輪與馬達)也跟著分離。 Referring to FIG. 2 again, step S130 is performed, and the roller group 120 is moved from the conveying position P1 to the removing position P2, where the removing position P2 is the moving distance L1 of the roller group 120. As shown in FIG. 5, the slide base 134 in the transfer element 130 moves on the slide rail 136, and the connecting piece 132 drives the rollers 124 connected by the connecting piece 132 to the left and right sides of the moving stroke L1 to separate the roller group. 120. It should be noted that when this part is separated by the roller 124 connected by the connecting member 132, the transmission element 122 (such as a gear and a motor) connected to the roller 124 is also separated.

請參閱圖12,圖12為圖2基板清洗方法一實施例的流程圖。進行滾輪組120由輸送位置P1移動至移出位置P2的步驟S130後,接著進行步驟S132,清洗滾輪組120。如圖6所示,清洗元件170的噴嘴172朝滾輪組120中的滾輪124噴灑一清洗液G1,以清洗滾輪124。如此,由於受汙染的基板50於輸送過程中也會污染到滾輪組120上的滾輪124,藉由步驟S132來清洗滾輪組120,因此,基板50被清洗後再被移回至滾輪組120時,清洗後的基板50不會被滾輪組120再次汙染,故此舉能確保清洗基板的效果。 Please refer to FIG. 12, which is a flowchart of an embodiment of the substrate cleaning method of FIG. 2. After step S130 of moving the roller group 120 from the conveying position P1 to the removing position P2 is performed, then step S132 is performed to clean the roller group 120. As shown in FIG. 6, the nozzle 172 of the cleaning element 170 sprays a cleaning liquid G1 toward the rollers 124 in the roller group 120 to clean the rollers 124. In this way, since the contaminated substrate 50 will also contaminate the roller 124 on the roller group 120 during the transportation process, the roller group 120 is cleaned in step S132. Therefore, when the substrate 50 is cleaned and then moved back to the roller group 120 The substrate 50 after cleaning will not be contaminated again by the roller set 120, so this can ensure the effect of cleaning the substrate.

請復參閱圖2,進行步驟S140,藉由移動元件140將基板50沿著移動行程L1由第二位置P4下移至第三位置P5中的承接元件150,換言之,本實施例移動元件140能沿移動行程L1將基板50於第一位置P3、第二位置P4以及第三位置P5之間移動。如圖7所示,藉由移動元件140以帶動基板 50由第二位置P4下移至第三位置P5,使承接元件150的承靠部154承接移動元件140所傳送的基板50。當基板50位於承接元件150時,基板50的下表面54兩側承靠於承靠部154,並使基板的下表面54暴露於簍空部152。需說明的是,在此基板50的上表面52為用來製程的製程面,而基板50的下表面為非製程面。 Referring to FIG. 2 again, step S140 is performed. The moving element 140 moves the substrate 50 along the moving stroke L1 from the second position P4 to the receiving element 150 in the third position P5. In other words, the moving element 140 in this embodiment can The substrate 50 is moved between the first position P3, the second position P4, and the third position P5 along the moving stroke L1. As shown in FIG. 7, the substrate is driven by the moving element 140 50 is moved down from the second position P4 to the third position P5, so that the supporting portion 154 of the receiving element 150 receives the substrate 50 transferred by the moving element 140. When the substrate 50 is located on the receiving element 150, both sides of the lower surface 54 of the substrate 50 abut against the abutting portion 154, and the lower surface 54 of the substrate is exposed to the basket portion 152. It should be noted that the upper surface 52 of the substrate 50 is a process surface for manufacturing, and the lower surface of the substrate 50 is a non-process surface.

請復參閱圖2,進行步驟S150,一蓋體180遮蓋基板50的上表面52。如圖8所示,移動件182將蓋體180沿著移動行程L1移動,使蓋體180遮蓋基板50的上表面52。 Referring to FIG. 2 again, step S150 is performed. A cover 180 covers the upper surface 52 of the substrate 50. As shown in FIG. 8, the moving member 182 moves the cover 180 along the moving stroke L1 so that the cover 180 covers the upper surface 52 of the substrate 50.

請復參閱圖2,進行步驟S160,噴管元件160朝承接元件150的簍空部152內的基板50的下表面54噴灑液體G2,如圖9所示,噴管元件160朝承接元件150的簍空部152內噴灑液體G2,使得液體G2通過承接元件150的簍空部152,進而能噴灑至基板50的下表面54,其中所述液體G2例如為一清洗液。藉由上述的步驟流程(S110~S160)而可達到清洗基板50的下表面54(非用來作為基板製程的製程面)的目的。 Referring to FIG. 2 again, step S160 is performed. The nozzle element 160 sprays the liquid G2 toward the lower surface 54 of the substrate 50 in the empty portion 152 of the receiving element 150. As shown in FIG. 9, the nozzle element 160 faces the receiving element 150. The liquid G2 is sprayed into the basket 152, so that the liquid G2 can be sprayed onto the lower surface 54 of the substrate 50 through the basket 152 of the receiving member 150, where the liquid G2 is, for example, a cleaning liquid. Through the above steps (S110-S160), the purpose of cleaning the lower surface 54 of the substrate 50 (not used as the process surface of the substrate manufacturing process) can be achieved.

需說明的是,在一實施例中,可在前述步驟S140將基板50移動至承接元件150之後,接著進行步驟S160,換言之,可視情況而選擇性地進行上述步驟S150,同樣也可達成清洗基板50的下表面54的目的。當然,若選擇進行上述步驟S150,除了上述清洗基板50的下表面54的功效以外,如圖13所示,圖13為圖2基板清洗方法一實施例的流程圖。進行步驟S150後,本實施例包括以下步驟S152。進行步驟S152,如圖10所示,於蓋體180內朝基板50的上表面52提供一氣流G3,氣流G3吹至基板50的上表面52,步驟S152的功效在於,由於氣流G3吹至基板50的上表面52,藉此避免噴管元 件160噴灑出的液體G2噴往至基板50的上表面52,進而弄濕基板50的上表面52。 It should be noted that, in an embodiment, after the substrate S50 is moved to the receiving element 150 in the foregoing step S140, step S160 is performed. In other words, the foregoing step S150 may be selectively performed as appropriate, and the substrate cleaning may also be achieved. The purpose of the lower surface 54 of 50. Of course, if step S150 is selected to be performed, in addition to the effect of cleaning the lower surface 54 of the substrate 50 described above, as shown in FIG. 13, FIG. 13 is a flowchart of an embodiment of the substrate cleaning method of FIG. 2. After step S150 is performed, this embodiment includes the following step S152. Step S152 is performed. As shown in FIG. 10, an airflow G3 is provided in the cover 180 toward the upper surface 52 of the substrate 50, and the airflow G3 is blown to the upper surface 52 of the substrate 50. The effect of step S152 is that the airflow G3 is blown to the substrate. 50 the upper surface 52, thereby avoiding the nozzle element The liquid G2 sprayed from the member 160 is sprayed onto the upper surface 52 of the substrate 50, and the upper surface 52 of the substrate 50 is wetted.

請復參閱圖2,進行步驟S170,蓋體180脫離基板50的上表面52。換言之,移動件182將蓋體180沿著移動行程L1移離承接元件150,進而將蓋體180復位(如圖8至圖7的過程)。進行步驟S180,藉由移動元件140將基板50沿移動行程L1由第三位置P5上移至第二位置P4。藉由齒輪146帶動頂銷142,使頂銷142能沿移動行程L1繼續向上以將基板50由如圖7所示的第三位置P5上移至第二位置P4(如圖5或圖6所示)。進行步驟S190,如圖5至圖4的過程所示,滾輪組120由移出位置P2移動至輸送位置P1。移轉元件130中的滑座134在滑軌136上移動,連接件132帶動部分被連接件132連接的滾輪124移動,以將滾輪組120復位。進行步驟S210,藉由移動元件140將基板50沿移動行程L1由第二位置P4下移至第一位置P3,使基板50位於滾輪組120的滾輪124上。在本實施例中,藉由齒輪146與齒輪排144相互作動之下,帶動頂銷142使頂銷142能沿移動行程L1繼續向下以將基板50由如圖4所示的第二位置P4下移至如圖3所示的第一位置P3。 Referring to FIG. 2 again, step S170 is performed, and the cover 180 is separated from the upper surface 52 of the substrate 50. In other words, the moving member 182 moves the cover body 180 away from the receiving element 150 along the moving stroke L1, and then resets the cover body 180 (as shown in the process of FIGS. 8 to 7). Step S180 is performed to move the substrate 50 from the third position P5 to the second position P4 along the moving stroke L1 by the moving element 140. The ejector pin 142 is driven by the gear 146, so that the ejector pin 142 can continue upward along the moving stroke L1 to move the substrate 50 from the third position P5 to the second position P4 (as shown in FIG. 5 or FIG. 6).示). Step S190 is performed. As shown in the process of FIGS. 5 to 4, the roller group 120 is moved from the removal position P2 to the conveyance position P1. The slide base 134 in the transfer element 130 moves on the slide rail 136, and the connecting piece 132 drives a part of the roller 124 connected by the connecting piece 132 to move to reset the roller group 120. Step S210 is performed, and the substrate 50 is moved from the second position P4 to the first position P3 along the moving stroke L1 by the moving element 140, so that the substrate 50 is located on the roller 124 of the roller group 120. In this embodiment, under the mutual action of the gear 146 and the gear row 144, the ejector pin 142 is driven so that the ejector pin 142 can continue downward along the moving stroke L1 to move the substrate 50 from the second position P4 as shown in FIG. 4 Move down to the first position P3 as shown in FIG. 3.

進行步驟S220,基板50藉由滾輪組120輸送至第一位置P3的下游。在一實施例中,所述第一位置P3的下游為第二腔室112(如圖11所示),即基板50從第一腔室110傳送至第二腔室112。在另一實施例中,所述第一位置P3的下游為基板50自滾輪組120中的某一段滾輪輸送至下一段滾輪,本發明不對此加以限制,端視實際設備而可設計。 Step S220 is performed, and the substrate 50 is conveyed downstream of the first position P3 by the roller group 120. In an embodiment, the second chamber 112 (as shown in FIG. 11) is downstream of the first position P3, that is, the substrate 50 is transferred from the first chamber 110 to the second chamber 112. In another embodiment, the downstream of the first position P3 is that the substrate 50 is conveyed from a certain stage of the roller set 120 to the next stage of the roller, which is not limited in the present invention, and can be designed depending on the actual equipment.

如圖11所示,本實施例的清洗設備100包含一第二腔室112以及一第三腔室114。第二腔室112中的滾輪組112A承接並清洗來自第一腔 室110所輸送的基板50。此外,第二腔室112同樣具有如第一腔室110的配置及步驟方法,差異僅在於第二腔室112是採用水來清洗基板。接著,第三腔室114中的滾輪組114A承接來自第二腔室112中的滾輪組112A所輸送的基板,第三腔室114用以提供一氣流以吹乾基板50。 As shown in FIG. 11, the cleaning device 100 of this embodiment includes a second chamber 112 and a third chamber 114. The roller set 112A in the second chamber 112 receives and cleans the rollers from the first chamber. The substrate 50 is transported by the chamber 110. In addition, the second chamber 112 also has the same configuration and method as the first chamber 110. The only difference is that the second chamber 112 uses water to clean the substrate. Next, the roller set 114A in the third chamber 114 receives the substrate conveyed from the roller set 112A in the second chamber 112, and the third chamber 114 is used to provide an airflow to dry the substrate 50.

當然,上述圖11的內容僅為舉例說明,並非用於限制本發明,清洗設備100內所配置的腔室及功能均可依實際需求改變,本發明並不以此為限。 Of course, the content of the above FIG. 11 is merely an example, and is not intended to limit the present invention. The chambers and functions configured in the cleaning device 100 can be changed according to actual needs, and the present invention is not limited thereto.

綜上所述,在本發明的基板清洗方法與清洗設備中,藉由移動元件將基板由滾輪組移動至承接元件,使得基板的下表面暴露於承接元件的簍空部。如此配置之下,噴管元件所噴灑的液體通過承接元件的簍空部後而噴灑至基板的下表面(非用來作為基板製程的製程面),而不會清洗到基板的上表面(用來作為基板製程的製程面),以達到清洗基板的單一表面的目的。 In summary, in the substrate cleaning method and cleaning equipment of the present invention, the substrate is moved from the roller set to the receiving element by the moving element, so that the lower surface of the substrate is exposed to the empty part of the receiving element. With this configuration, the liquid sprayed by the nozzle element is sprayed onto the lower surface of the substrate (not used as the process surface of the substrate process) after passing through the empty part of the receiving element, without cleaning the upper surface of the substrate (using As the process surface of the substrate process) to achieve the purpose of cleaning a single surface of the substrate.

再者,當基板被移動至承接元件時,蓋板由基板上方遮蓋基板的上表面,使得承接元件與蓋體構成一清洗空間,液體通過承接元件的簍空部內而不會溢出於清洗空間外,進而避免影響到外部機制(如滾輪組),藉此能達到輸送與清洗分離的目的。 Furthermore, when the substrate is moved to the receiving element, the cover plate covers the upper surface of the substrate from above the substrate, so that the receiving element and the cover constitute a cleaning space, and the liquid passes through the empty portion of the receiving element without overflowing the cleaning space. In order to avoid affecting the external mechanism (such as the roller set), the purpose of separation between transportation and cleaning can be achieved.

進一步地,當前述蓋體遮蓋基板的上表面時,透過朝基板的上表面提供氣流,使得氣流吹至基板的上表面,藉此避免噴管元件噴灑出的液體噴往至基板的上表面,此舉不僅能避免弄濕基板的上表面以外,藉由上述氣流的導引,確保液體能在基板的下表面清洗,以達到清洗基板單一面的目的。 Further, when the cover covers the upper surface of the substrate, the airflow is provided to the upper surface of the substrate so that the airflow is blown to the upper surface of the substrate, thereby preventing the liquid sprayed by the nozzle element from being sprayed onto the upper surface of the substrate. This can not only avoid wetting the upper surface of the substrate, but also ensure that the liquid can be cleaned on the lower surface of the substrate by the above-mentioned airflow guidance, so as to achieve the purpose of cleaning the single surface of the substrate.

此外,在移出位置時會清洗滾輪組,因此,當基板的下表面(接觸滾輪組的表面)被清洗而被移回至滾輪組時,基板的下表面不會被滾輪組再次汙染,而能確保清洗基板的下表面的效果。 In addition, the roller set will be cleaned when moving out of the position. Therefore, when the lower surface of the substrate (the surface contacting the roller set) is cleaned and moved back to the roller set, the lower surface of the substrate will not be contaminated by the roller set again. Ensure the effect of cleaning the lower surface of the substrate.

以上所述,乃僅記載本發明為呈現解決問題所採用的技術手段的較佳實施方式或實施例而已,並非用來限定本發明專利實施的範圍。即凡與本發明專利申請範圍文義相符,或依本發明專利範圍所做的均等變化與修飾,皆為本發明專利範圍所涵蓋。 The above description only describes the preferred embodiments or examples of the technical means adopted by the present invention to solve the problem, and is not intended to limit the scope of patent implementation of the present invention. That is, all changes and modifications that are consistent with the meaning of the scope of patent application of the present invention, or made according to the scope of patent of the present invention, are covered by the scope of patent of the present invention.

Claims (12)

一種基板清洗方法,該基板清洗方法適用於一清洗設備,該清洗設備包含一滾輪組、至少一噴管元件、至少一移動元件以及一承接元件,該滾輪組於一輸送位置上輸送一基板,該輸送位置為該滾輪組位於該移動元件的一移動行程的一第一位置上,該移出位置為該滾輪組離開該移動行程,該移動元件沿該移動行程將該基板於該第一位置、一第二位置及一第三位置之間移動,該第二位置高於該第一位置,該第三位置低於該第一位置,該承接元件設於該第三位置,且該承接元件具有一簍空部,該基板清洗方法包括以下步驟:藉由該移動元件將該基板沿著該移動行程由該第一位置上移至該第二位置;該滾輪組由該輸送位置移動至該移出位置;藉由該移動元件將該基板沿著該移動行程由該第二位置下移至該第三位置中的該承接元件;以及該噴管元件朝該承接元件的該簍空部內的該基板的一下表面噴灑液體。A substrate cleaning method. The substrate cleaning method is suitable for a cleaning device. The cleaning device includes a roller set, at least one nozzle element, at least one moving element, and a receiving element. The roller set conveys a substrate at a conveying position. The conveying position is a first position where the roller group is located on a moving stroke of the moving element, the moving position is when the roller group leaves the moving stroke, the moving element holds the substrate at the first position along the moving stroke, Moving between a second position and a third position, the second position is higher than the first position, the third position is lower than the first position, the receiving element is disposed in the third position, and the receiving element has A basket, the substrate cleaning method includes the following steps: moving the substrate from the first position to the second position along the moving stroke by the moving element; moving the roller set from the conveying position to the moving out Position; moving the substrate along the moving stroke from the second position to the receiving element in the third position; and the nozzle element toward the receiving Spraying the liquid at the surface of the substrate within the empty basket member. 如申請專利範圍第1項所述之基板清洗方法,其中進行該噴管元件朝該承接元件的該簍空部內的該基板該下表面噴灑液體的步驟後,包括以下步驟:藉由該移動元件將該基板沿該移動行程由該第三位置上移至該第二位置;該滾輪組由該移出位置移動至該輸送位置;以及藉由該移動元件將該基板沿該移動行程由該第二位置下移至該第一位置,使該基板位於該滾輪組上。The substrate cleaning method according to item 1 of the scope of patent application, wherein the step of spraying the nozzle element with the liquid on the lower surface of the substrate in the basket of the receiving element includes the following steps: by moving the element Moving the substrate from the third position to the second position along the moving stroke; moving the roller set from the moving position to the conveying position; and moving the substrate from the second position along the moving stroke by the moving element The position is moved down to the first position, so that the substrate is located on the roller set. 如申請專利範圍第1項所述之基板清洗方法,其中進行該滾輪組由該輸送位置移動至該移出位置的步驟後,包括以下步驟:清洗該滾輪組。The substrate cleaning method according to item 1 of the scope of patent application, wherein the step of moving the roller set from the conveying position to the moving position includes the following steps: cleaning the roller set. 如申請專利範圍第1項所述之基板清洗方法,其中進行該噴管元件朝該承接元件的該簍空部內的該基板的該下表面噴灑液體的步驟之前,包括以下步驟:一蓋體遮蓋該基板的一上表面。The substrate cleaning method according to item 1 of the scope of patent application, wherein before the step of spraying the nozzle element toward the lower surface of the substrate in the basket of the receiving element, the method includes the following steps: a cover covers An upper surface of the substrate. 如申請專利範圍第4項所述之基板清洗方法,其中進行該噴管元件朝該承接元件的該簍空部內的該基板的該下表面噴灑液體的步驟後,包括以下步驟:該蓋體脫離該基板的該上表面。The substrate cleaning method according to item 4 of the scope of patent application, wherein the step of spraying the nozzle element with the liquid on the lower surface of the substrate in the basket of the receiving element includes the following steps: the cover is detached The upper surface of the substrate. 如申請專利範圍第4項所述之基板清洗方法,其中進行該蓋體遮蓋該基板的該上表面的步驟後,包括以下步驟:於該蓋體內朝該基板的該上表面提供一氣流。The substrate cleaning method according to item 4 of the scope of patent application, wherein after the step of covering the upper surface of the substrate by the cover body, the method includes the following steps: providing an air flow to the upper surface of the substrate in the cover body. 如申請專利範圍第1項所述之基板清洗方法,其中進行藉由該移動元件將該基板沿著該移動行程由該第一位置上移至該第二位置之前,包括以下步驟:藉由該滾輪組將該基板移動至該第一位置。The substrate cleaning method according to item 1 of the scope of patent application, wherein before moving the substrate from the first position to the second position along the moving stroke by the moving element, the method includes the following steps: The roller set moves the substrate to the first position. 一種清洗設備,包括:一第一腔室;一移動元件,位於該第一腔室內,該移動元件沿一移動行程將該基板於一第一位置、一第二位置及一第三位置之間移動,其中該第二位置高於該第一位置,該第三位置低於該第一位置;一滾輪組,容置於該第一腔室,該滾輪組具有一輸送位置及一移出位置,該輸送位置為該滾輪組位於該移動行程的該第一位置上,該移出位置為該滾輪組離開該移動行程;一承接元件,位於該第一腔室內,且該承接元件設於該第三位置,該承接元件具有一簍空部,該承接元件用以承接該移動元件所傳送的該基板;以及至少一噴管元件,位於該第一腔室內,且該至少一噴管元件位於該承接元件之下,該噴管元件用以朝該承接元件的該簍空部內的該基板的一下表面噴灑液體。A cleaning device includes: a first chamber; a moving element located in the first chamber; the moving element moves the substrate between a first position, a second position, and a third position along a moving stroke; Moving, wherein the second position is higher than the first position and the third position is lower than the first position; a roller set is accommodated in the first chamber, and the roller set has a conveying position and a moving position, The conveying position is that the roller group is located at the first position of the moving stroke, and the moving position is that the roller group leaves the moving stroke; a receiving element is located in the first chamber, and the receiving element is provided in the third Position, the receiving element has a basket, the receiving element is used to receive the substrate transferred by the moving element; and at least one nozzle element is located in the first chamber, and the at least one nozzle element is located in the receiving Below the element, the nozzle element is used to spray liquid onto the lower surface of the substrate in the basket portion of the receiving element. 如申請專利範圍第8項所述之清洗設備,包括:一清洗元件,位於該第一腔室內,該清洗元件用以清洗該滾輪組。The cleaning device according to item 8 of the scope of patent application, includes: a cleaning element is located in the first chamber, and the cleaning element is used to clean the roller set. 如申請專利範圍第8項所述之清洗設備,包括:一蓋體,位於該第一腔室內,該蓋體用以遮蓋該基板的一上表面;The cleaning device according to item 8 of the scope of patent application, comprising: a cover body located in the first chamber, the cover body being used to cover an upper surface of the substrate; 如申請專利範圍第10項所述之清洗設備,包括:一氣流元件,位於該蓋體內,該氣流元件於該蓋體內朝該基板的該上表面提供一氣流。The cleaning device according to item 10 of the scope of patent application, includes: an airflow element located in the cover, and the airflow element provides an airflow to the upper surface of the substrate in the cover. 如申請專利範圍第8項所述之清洗設備,包括:一第二腔室,承接並清洗來自該第一腔室所輸送的該基板;以及一第三腔室,承接來自該第二腔室所輸送的該基板,該第三腔室用以提供一氣流以吹乾該基板。The cleaning device according to item 8 of the scope of patent application, comprising: a second chamber to receive and clean the substrate transported from the first chamber; and a third chamber to receive the second chamber When the substrate is transported, the third chamber is used to provide an airflow to dry the substrate.
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