TWI614764B - Memory apparatus and an operating method using the same - Google Patents

Memory apparatus and an operating method using the same Download PDF

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TWI614764B
TWI614764B TW105120690A TW105120690A TWI614764B TW I614764 B TWI614764 B TW I614764B TW 105120690 A TW105120690 A TW 105120690A TW 105120690 A TW105120690 A TW 105120690A TW I614764 B TWI614764 B TW I614764B
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information
memory
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memory device
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TW201801072A (en
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張智翔
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華邦電子股份有限公司
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Abstract

一種記憶體裝置,包括記憶胞陣列、暫存單元以及指令產生器。記憶胞陣列包括多個記憶胞。暫存單元用以記錄多個自定義資訊。指令產生器耦接於暫存單元以及記憶胞陣列。指令產生器接收自定義命令,並且依據所接收的自定義命令以及自定義資訊對記憶胞陣列執行至少兩個記憶體操作。自定義資訊是依據所述的至少兩個記憶體操作來產生。此外,一種記憶體裝置操作方法亦被提出。A memory device includes a memory cell array, a temporary storage unit, and a command generator. The memory cell array includes a plurality of memory cells. The temporary storage unit is used to record multiple customized information. The instruction generator is coupled to the temporary storage unit and the memory cell array. The instruction generator receives the custom command and performs at least two memory operations on the memory cell array according to the received custom command and the customized information. Custom information is generated based on the at least two memory operations described. In addition, a method of operating a memory device has also been proposed.

Description

記憶體裝置及其操作方法Memory device and method of operating same

本發明是有關於一種記憶體裝置及其操作方法,且特別是有關於一種可自定義記憶體命令的記憶體裝置及其操作方法。The present invention relates to a memory device and a method of operating the same, and more particularly to a memory device capable of customizing memory commands and a method of operating the same.

同步動態隨機存取記憶體(synchronous dynamic random-access memory,SDRAM)是具有一個同步接口的動態隨機存取記憶體,藉由時脈訊號來與電腦的匯流排達成同步。隨著記憶體技術的進步,雙倍資料率同步動態隨機存取記憶體(Double Data Rate Synchronous Dynamic Random Access Memory,DDR SDRAM)也被發展出來。DDR SDRAM是具有雙倍傳輸率的SDRAM,其在系統時鐘的上升沿和下降沿都可以進行資料的傳輸,因而其傳輸速率為系統時脈的兩倍,具有較高的工作效率。Synchronous dynamic random-access memory (SDRAM) is a dynamic random access memory with a synchronous interface that synchronizes with the bus of the computer by means of a clock signal. With the advancement of memory technology, Double Data Rate Synchronous Dynamic Random Access Memory (DDR SDRAM) has also been developed. DDR SDRAM is a SDRAM with double transfer rate. It can transmit data on both the rising and falling edges of the system clock. Therefore, its transfer rate is twice that of the system clock and it has high efficiency.

為了進一步提升工作效率,第二代、第三代以及第四代的DDR SDRAM都已經發展出來。然而,由於JEDEC固態技術協會(JEDEC Solid State Technology Association)對DRAM所訂定的標準,DRAM在執行動作時需要從記憶體控制器陸續接收多個記憶體命令,並且分別對逐個記憶體命令執行對應的記憶體操作才能完成動作。舉例而言,當欲寫入一筆資料時,記憶體控制器會對DRAM陸續下達對應於記憶體操作:激活(Activate)列位址、讀取(Read)行位址以及預充電(Precharge)的三個記憶體命令,並且由DRAM陸續完成上述的三個記憶體操作。在另一個例子中,當欲連續寫入多筆資料時,記憶體控制器不僅需要多次對DRAM下達RD命令,還必須傳輸多個記憶體位址給DRAM。因此,倘若能夠減少記憶體控制器與DRAM之間過多的傳輸,包括記憶體命令或位址等,將能夠提升系統的效率,並降低系統的功耗。In order to further improve work efficiency, second, third and fourth generation DDR SDRAM has been developed. However, due to the standards set by the JEDEC Solid State Technology Association for DRAM, the DRAM needs to receive multiple memory commands from the memory controller in succession, and perform corresponding operations on memory-by-memory commands. The memory operation can complete the action. For example, when a piece of data is to be written, the memory controller successively issues DRAM corresponding operations to the memory: Activate column address, Read row address, and Precharge. Three memory commands are executed, and the above three memory operations are successively completed by the DRAM. In another example, when multiple data pieces are to be continuously written, the memory controller not only needs to issue RD commands to the DRAM multiple times, but also must transfer multiple memory addresses to the DRAM. Therefore, if you can reduce the excessive transfer between the memory controller and the DRAM, including memory commands or address, etc., it will improve the efficiency of the system and reduce the power consumption of the system.

本發明提供一種記憶體裝置及其操作方法,可減少記憶體命令的傳輸次數,以提升記憶體裝置的效率並減少功耗。The invention provides a memory device and an operation method thereof, which can reduce the number of transmissions of memory commands, thereby improving the efficiency of the memory device and reducing power consumption.

本發明的記憶體裝置包括記憶胞陣列、暫存單元以及指令產生器。記憶胞陣列包括多個記憶胞。暫存單元用以記錄多個自定義資訊。指令產生器耦接於暫存單元以及記憶胞陣列。指令產生器接收自定義命令,並且依據所接收的自定義命令以及自定義資訊對記憶胞陣列執行至少兩個記憶體操作。自定義資訊是依據所述的至少兩個記憶體操作來產生。The memory device of the present invention includes a memory cell array, a temporary storage unit, and a command generator. The memory cell array includes a plurality of memory cells. The temporary storage unit is used to record multiple customized information. The instruction generator is coupled to the temporary storage unit and the memory cell array. The instruction generator receives the custom command and performs at least two memory operations on the memory cell array according to the received custom command and the customized information. Custom information is generated based on the at least two memory operations described.

本發明的記憶體裝置操作方法適用於包括記憶胞陣列以及暫存單元的記憶體裝置。此記憶體裝置操作方法包括以下步驟。寫入多個自定義資訊至暫存單元。接收自定義命令。依據所接收的自定義命令以及自定義資訊對記憶胞陣列執行至少兩個記憶體操作。自定義資訊是依據所述的至少兩個記憶體操作來產生。The memory device operating method of the present invention is applicable to a memory device including a memory cell array and a temporary storage unit. The method of operating the memory device includes the following steps. Write multiple custom messages to the scratchpad unit. Receive custom commands. Perform at least two memory operations on the memory cell array based on the received custom commands and custom information. Custom information is generated based on the at least two memory operations described.

基於上述,在本發明的實施例中,在記憶體裝置的暫存單元中記錄多個自定義資訊,此種記憶體裝置操作方法可在記憶體裝置接收到一個自定義命令時,依據自定義命令以及自定義資訊來執行至少兩個記憶體操作。據此,可提升記憶體裝置的存取效率並降低功耗。Based on the above, in the embodiment of the present invention, a plurality of customized information is recorded in a temporary storage unit of the memory device, and the memory device operation method can be customized according to the memory device when receiving a custom command. Commands and custom information to perform at least two memory operations. According to this, the access efficiency of the memory device can be improved and the power consumption can be reduced.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the invention will be apparent from the following description.

圖1繪示本發明一實施例之記憶體裝置的概要方塊圖。請參考圖1,本實施例之記憶體裝置100包括暫存單元110、指令產生器120以及記憶胞陣列130。在本實施例中,暫存單元110例如為模式暫存器(Mode Register,MR),其中記錄有多個自定義資訊UD_INFO。指令產生器120例如為狀態機(state machine),藉由系統的時脈來驅動,以依據所接收到的自定義命令UD_CMD以及暫存單元110中所記錄的自定義資訊UD_INFO來對記憶胞陣列130進行至少兩個記憶體操作。1 is a schematic block diagram of a memory device in accordance with an embodiment of the present invention. Referring to FIG. 1 , the memory device 100 of the embodiment includes a temporary storage unit 110 , an instruction generator 120 , and a memory cell array 130 . In this embodiment, the temporary storage unit 110 is, for example, a mode register (MR) in which a plurality of custom information UD_INFO are recorded. The command generator 120 is, for example, a state machine, driven by the clock of the system to access the memory cell array according to the received custom command UD_CMD and the custom information UD_INFO recorded in the temporary storage unit 110. 130 performs at least two memory operations.

舉例而言,在記憶體裝置100啟動(Power On)後,例如可經歷包括初始化(Initialization)、閒置(Idle)、激活(Activate)或預充電(Precharge)等狀態,其中在閒置狀態中可進入模式暫存器設置(Mode Register Set,MRS)狀態。在一實施例中,上述自定義資訊UD_INFO可例如是於此MRS狀態中寫入暫存單元110。倘若指令產生器120接收到自定義命令UD_CMD,則可依據暫存單元110中的自定義資訊UD_INFO來對記憶胞陣列130執行至少兩個記憶體操作。以下利用圖1的記憶體裝置100來舉例說明本發明的記憶體裝置操作方法。For example, after the memory device 100 is powered on, for example, a state including initialization, idle, activation, or precharge may be experienced, wherein the idle state may enter. Mode Register Set (MRS) status. In an embodiment, the customized information UD_INFO may be written to the temporary storage unit 110 in this MRS state, for example. If the instruction generator 120 receives the custom command UD_CMD, at least two memory operations can be performed on the memory cell array 130 according to the custom information UD_INFO in the temporary storage unit 110. Hereinafter, the memory device 100 of the present invention will be exemplified by the memory device 100 of FIG.

圖2繪示本發明一實施例之自定義資訊的示意圖。請參考圖2,本實施例之自定義資訊UD_INFO為使用者可自行定義以讓記憶體裝置100對應執行記憶體操作的資訊,記錄於暫存單元110中。在本實施例中,自定義資訊UD_INFO包括命令流程資訊210、位址遞增資訊220、起始位址資訊230以及迴圈資訊240。然而,本發明並不限於此。在其他實施例中,所屬領域具備通常知識者可依不同的需求來調整自定義資訊UD_INFO中所包括的資訊,使記憶體裝置100接收到自定義命令UD_CMD時,可依據自定義資訊UD_INFO來執行所需的至少兩個記憶體操作。2 is a schematic diagram of customized information according to an embodiment of the present invention. Referring to FIG. 2, the customized information UD_INFO of the embodiment is recorded in the temporary storage unit 110 by the user to define information for the memory device 100 to perform the memory operation. In this embodiment, the customized information UD_INFO includes command flow information 210, address increment information 220, start address information 230, and loop information 240. However, the invention is not limited thereto. In other embodiments, the information included in the custom information UD_INFO can be adjusted according to different requirements, so that when the memory device 100 receives the custom command UD_CMD, the memory device 100 can execute according to the customized information UD_INFO. At least two memory operations are required.

在本實施例中,命令流程資訊210包括命令資訊CMD1至CMD3以及延遲資訊DL1至DL3,用以提供對記憶體陣列130執行操作的操作資訊。例如,命令資訊CMD1至CMD3分別為1、3與4,分別對應激活(ACT)、讀取(RD)以及預充電(PRE)三個記憶體操作。延遲資訊DL1至DL3皆對應於0個時脈週期(CK),分別代表執行完對應命令資訊CMD1至CMD3的記憶體操作後,除記憶體本身規範所須延遲的時間外,使用者所自訂額外延遲的時間。詳細來說,命令資訊CMD1與CMD2例如分別是對應激活與讀取的記憶體操作。通常在記憶體裝置100執行激活操作後,至少須經過列控制器至行控制器傳輸延遲(RAS# to CAS# Delay,T­­­ RCD)才能繼續接收讀取命令以執行讀取操作。而本實施例之自定義資訊UD_INFO更定義延遲資訊DL1,使記憶體裝置100在執行對應激活操作的命令資訊CMD1後,經過T­­­ RCD以及自定義的DL1的延遲,才繼續執行對應讀取操作的命令資訊CMD2,以增加記憶體裝置的穩定性。 In the present embodiment, the command flow information 210 includes command information CMD1 to CMD3 and delay information DL1 to DL3 for providing operation information for performing operations on the memory array 130. For example, the command information CMD1 to CMD3 are 1, 3, and 4, respectively, corresponding to three memory operations of activation (ACT), reading (RD), and pre-charging (PRE). The delay information DL1 to DL3 correspond to 0 clock cycles (CK), which respectively represent the time required to delay the memory specification itself after the memory operation of the corresponding command information CMD1 to CMD3 is executed. Extra delay time. In detail, the command information CMD1 and CMD2 are, for example, memory operations corresponding to activation and reading, respectively. Usually, after the memory device 100 performs the activation operation, at least the column controller to row controller transmission delay (RAS# to CAS# Delay, T RCD ) is required to continue receiving the read command to perform the read operation. The custom information UD_INFO of the embodiment further defines the delay information DL1, so that the memory device 100 continues to perform the corresponding read operation after the delay of the T RCD and the customized DL1 after executing the command information CMD1 corresponding to the activation operation. Command information CMD2 to increase the stability of the memory device.

在本實施例中,起始位址資訊230包括起始列位址RA_INI、起始行位址CA_INI以及起始區塊位址BA_INI。起始位址資訊230用以指向記憶胞陣列130的多個記憶胞中的其中之一。當指令產生器120接收到自定義命令UD_CMD後,依據自定義命令UD_CMD以及記錄於暫存單元110中的自定義資訊UD_INFO,對記憶胞陣列130或起始位址資訊230所指向的記憶胞開始執行命令流程資訊210所對應的至少兩個記憶體操作。為方便說明,以下將起始位址資訊230所對應的記憶胞稱作第一記憶胞。In this embodiment, the start address information 230 includes a start column address RA_INI, a start row address CA_INI, and a start block address BA_INI. The start address information 230 is used to point to one of a plurality of memory cells of the memory cell array 130. After the command generator 120 receives the custom command UD_CMD, the memory cell pointed to by the memory cell array 130 or the start address information 230 is started according to the custom command UD_CMD and the custom information UD_INFO recorded in the temporary storage unit 110. At least two memory operations corresponding to the command flow information 210 are executed. For convenience of explanation, the memory cell corresponding to the start address information 230 is hereinafter referred to as a first memory cell.

圖3繪示習知的記憶體裝置操作方法的示意圖。請參考圖3。一般來說,在記憶體裝置欲寫入一筆資料至列位址、行位址以及區塊位址分別為RA_INI、CA_INI以及BA_INI的第一記憶胞時,例如於時脈週期T1,先從記憶體控制器接收激活(ACT)的記憶體命令,並提供區塊位址BA_INI與列位址RA_INI。在接收到激活記憶體命令後,至少經過列控制器至行控制器傳輸延遲T­ RCD,再於時脈週期T6從記憶體控制器接收另提供有行位址CA_INI的讀取(READ)記憶體命令。接收到讀取記憶體命令後,至少經過讀取延遲(Read Latency,RL),便於時脈週期T11開始從第一記憶胞讀取資料D1至D8。另一方面,接收到讀取記憶體命令後,至少經過內部讀取到預充電命令延遲(Read to Precharge Time,T­ RTP),再於時脈週期T10從記憶體控制器接收預充電(PRE)命令以執行預充電操作。如此一來,在上述圖3的實例中記憶體裝置至少包括3次的記憶體命令傳輸。 3 is a schematic diagram of a conventional method of operating a memory device. Please refer to Figure 3. Generally, when the memory device wants to write a data to the column address, the row address, and the block address of the first memory cell of RA_INI, CA_INI, and BA_INI, for example, the clock cycle T1, first from the memory The body controller receives the active (ACT) memory command and provides the block address BA_INI and the column address RA_INI. After receiving the activation memory command, at least the column controller to the row controller transmits the delay T RCD , and then receives the read (READ) memory provided with the row address CA_INI from the memory controller at the clock cycle T6. command. After receiving the read memory command, at least the read delay (Read Latency, RL) is passed, so that the clock period T11 starts to read the data D1 to D8 from the first memory cell. On the other hand, after receiving the read memory command, at least the internal read to precharge command delay (Read to Precharge Time, T RTP ), and then receive the precharge (PRE) from the memory controller at the clock cycle T10. Command to perform a precharge operation. As such, in the example of FIG. 3 above, the memory device includes at least three memory command transmissions.

圖4繪示本發明一實施例之記憶體裝置操作方法的示意圖。請參考圖4,本發明實施例將包括命令流程資訊210以及起始位址資訊230的自定義資訊UD_INFO定義於記憶體裝置100的暫存單元110中,其中自定義資訊UD_INFO是依據激活、讀取以及預充電三個記憶體操作來產生。據此,在本實施例中,當指令產生器120於時脈週期T1自外部(例如,記憶體控制器)接收到自定義命令UD_CMD後,依據命令流程資訊210,首先會執行對應命令資訊CMD1的激活記憶體操作。隨後,經過列控制器至行控制器傳輸延遲T­ RCD、延遲資訊DL1所對應的延遲時間以及讀取延遲RL後,指令產生器120開始對第一記憶胞執行讀取操作。另一方面,在接收到自定義命令UD_CMD後,經過列控制器至行控制器傳輸延遲T­ RCD、延遲資訊DL1所對應的延遲時間(在本實施例中為0)、內部讀取到預充電命令延遲T RTP以及延遲資訊DL2(在本實施例中為0)所對應的延遲時間後,指令產生器120開始對記憶胞陣列130執行預充電操作。 4 is a schematic diagram of a method of operating a memory device according to an embodiment of the invention. Referring to FIG. 4, the embodiment of the present invention defines a custom information UD_INFO including command flow information 210 and start address information 230 in the temporary storage unit 110 of the memory device 100, wherein the customized information UD_INFO is activated and read. Take and precharge three memory operations to generate. Accordingly, in the present embodiment, after the command generator 120 receives the custom command UD_CMD from the external (for example, the memory controller) after the clock cycle T1, according to the command flow information 210, the corresponding command information CMD1 is first executed. Activate memory operation. Subsequently, after the column controller to row controller transmission delay T RCD , the delay time corresponding to the delay information DL1, and the read delay RL, the instruction generator 120 starts performing a read operation on the first memory cell. On the other hand, after receiving the custom command UD_CMD, the delay time corresponding to the column controller to the row controller transmission delay T RCD , the delay information DL1 (0 in this embodiment), and the internal read precharge After the delay time corresponding to the command delay T RTP and the delay information DL2 (0 in this embodiment), the instruction generator 120 starts performing a precharge operation on the memory cell array 130.

相比於圖3中的記憶體裝置操作方法,在圖4實施例中的記憶體裝置100僅包括一次的自定義命令UD_CMD傳輸,便可從第一記憶胞中讀取D1至D8的資料,並執行完如圖3實例中的所有記憶體操作。此外,在本實施例中,指令產生器120對記憶胞陣列130執行預充電操作後,再經過列位址預充電時間(Row Precharge Time,T RP)以及延遲資訊DL3所對應的延遲時間便能夠再次執行下一個記憶體操作。 Compared with the memory device operating method in FIG. 3, the memory device 100 in the embodiment of FIG. 4 includes only one custom command UD_CMD transmission, and the data of D1 to D8 can be read from the first memory cell. And all the memory operations in the example of Figure 3 are executed. In addition, in the embodiment, after the pre-charging operation is performed on the memory cell array 130, the instruction generator 120 can pass the column pre-charge time (T RP ) and the delay time corresponding to the delay information DL3. Perform the next memory operation again.

利用本發明實施例的記憶體裝置操作方法,藉由將上述的命令流程資訊210以及起始位址資訊230定義在自定義資訊UD_INFO並記錄於暫存單元110中,指令產生器120在接收到自定義命令UD_CMD後,便能夠依其對記憶胞陣列130執行至少兩個記憶體操作。值得一提的是,在一些情況中,使用者更例如是希望重複執行命令流程資訊210中所對應的記憶體操作。因此,在本實施例中更將位址遞增資訊220以及迴圈資訊240定義於自定義資訊UD_INFO當中。By using the memory device operating method of the embodiment of the present invention, the command flow information 210 and the start address information 230 are defined in the custom information UD_INFO and recorded in the temporary storage unit 110, and the command generator 120 receives the After the custom command UD_CMD, it is possible to perform at least two memory operations on the memory cell array 130. It is worth mentioning that, in some cases, the user is more likely to repeatedly perform the memory operation corresponding to the command flow information 210. Therefore, in the embodiment, the address increment information 220 and the loop information 240 are further defined in the custom information UD_INFO.

請再參考圖2。在本實施例中,位址遞增資訊220包括列遞增資訊RS、行遞增資訊CS以及區塊遞增資訊BS,迴圈資訊240包括迴圈數LP。迴圈數LP用以表示依據命令流程資訊210來對記憶胞陣列130進行記憶體操作的重複次數,並且位址遞增資訊220用以決定重複進行記憶體操作時作為操作對象的記憶胞。舉例而言,迴圈數LP所對應的重複次數例如為2次,列遞增資訊RS、行遞增資訊CS以及區塊遞增資訊BS皆對應於N=N+1。據此,指令產生器120在依據起始位址資訊230對列位址、行位址以及區塊位址分別為RA_INI、CA_INI以及BA_INI的第一記憶胞,依據命令流程資訊210進行至少兩個記憶體操作後,會接著對列位址、行位址以及區塊位址分別為RA_INI+1、CA_INI+1以及BA_INI+1的記憶胞,再次依據命令流程資訊210進行至少兩個記憶體操作。Please refer to Figure 2 again. In this embodiment, the address increment information 220 includes a column increment information RS, a row increment information CS, and a block increment information BS, and the loop information 240 includes a loop number LP. The loop number LP is used to indicate the number of repetitions of the memory operation performed on the memory cell array 130 in accordance with the command flow information 210, and the address increment information 220 is used to determine the memory cell to be operated as the operation object when the memory operation is repeated. For example, the number of repetitions corresponding to the number of loops LP is, for example, two times, and the column increment information RS, the row increment information CS, and the block increment information BS all correspond to N=N+1. Accordingly, the instruction generator 120 performs at least two of the first memory cells of the RA_INI, CA_INI, and BA_INI for the column address, the row address, and the block address according to the start address information 230, according to the command flow information 210. After the memory operation, the memory cells of the column address, the row address, and the block address are RA_INI+1, CA_INI+1, and BA_INI+1, respectively, and at least two memory operations are performed according to the command flow information 210 again. .

在本實施例中,藉由進一步將位址遞增資訊220以及迴圈資訊240定義於自定義資訊UD_INFO當中,指令產生器120在接收自定義命令UD_CMD後,可依據起始位址資訊230、位址遞增資訊220以及迴圈資訊240來依序對記憶胞陣列130中的至少一個記憶胞重複執行命令流程資訊210中所對應的至少兩個記憶體操作。In this embodiment, by further defining the address increment information 220 and the loop information 240 in the custom information UD_INFO, the command generator 120 may receive the custom command UD_CMD according to the start address information 230, the bit. The address increment information 220 and the loop information 240 are used to sequentially execute at least two memory operations corresponding to the command flow information 210 for at least one of the memory cells 130.

值得一提的是,圖2實施例之自定義資訊UD_INFO中的命令對照表、延遲對照表、位址遞增對照表以及迴圈對照表是用以方便對應命令流程資訊210、位址遞增資訊220以及迴圈資訊240中的各數字所代表的內容,但本發明並不加以限制自定義資訊UD_INFO的表示方法。除了使用上述的各對照表外,在其他實施例中,所屬領域具備通常知識者可依不同的需求以其他的方式記錄自定義資訊UD_INFO。It is worth mentioning that the command comparison table, the delay comparison table, the address increment comparison table, and the loop comparison table in the customized information UD_INFO of the embodiment of FIG. 2 are used to facilitate the corresponding command flow information 210 and the address increment information 220. And the content represented by each digit in the loop information 240, but the present invention does not limit the representation of the custom information UD_INFO. In addition to using the above-mentioned comparison tables, in other embodiments, those having ordinary knowledge in the art can record the customized information UD_INFO in other manners according to different needs.

在本實施例中,記憶體操作例如包括激活、讀取以及預充電,但本發明並不限於此。在其他實施例中,記憶體操作可例如為無操作(NO OPERATION)、激活(ACTIVATE)、讀取(READ)、寫入(WRITE)、預充電(PRECHARGE)以及省電(POWER DOWN)等記憶體操作的其中之一。In the present embodiment, the memory operation includes, for example, activation, reading, and pre-charging, but the present invention is not limited thereto. In other embodiments, the memory operation may be, for example, a memory such as NO OPERATION, ACTIVATE, READ, WRITE, PRECHARGE, and POWER DOWN. One of the body operations.

另一方面,在本實施例中,命令資訊CMD1至CMD3例如是分別對應於不同的記憶體操作。然而,本發明並不限於此,在另一實施例中,命令資訊CMD1至CMD3可例如是對應於相同的記憶體操作。以下將舉本發明的另一實施例,詳述本發明實施例的記憶體裝置操作方法。On the other hand, in the present embodiment, the command information CMD1 to CMD3 correspond to, for example, different memory operations, respectively. However, the present invention is not limited thereto, and in another embodiment, the command information CMD1 to CMD3 may, for example, correspond to the same memory operation. Hereinafter, another embodiment of the present invention will be described, detailing a method of operating a memory device according to an embodiment of the present invention.

圖5繪示本發明一實施例之記憶體裝置的架構示意圖。圖6繪示本發明一實施例之記憶體裝置操作方法的流程圖。請參考圖5,本實施例的記憶體裝置100包括暫存單元110、指令產生器120以及記憶胞陣列130外,還包括偵測單元140、訊號解碼器150以及多個多工器161、163。值得一提的是,本實施例的指令產生器120包括自定義命令產生器121以及自定義位址產生器123,訊號解碼器150包括命令解碼器151以及位址解碼器153。FIG. 5 is a schematic structural diagram of a memory device according to an embodiment of the invention. FIG. 6 is a flow chart showing a method of operating a memory device according to an embodiment of the invention. Referring to FIG. 5 , the memory device 100 of the embodiment includes a temporary storage unit 110 , an instruction generator 120 , and a memory cell array 130 , and further includes a detecting unit 140 , a signal decoder 150 , and a plurality of multiplexers 161 and 163 . . It is worth mentioning that the instruction generator 120 of the present embodiment includes a custom command generator 121 and a custom address generator 123. The signal decoder 150 includes a command decoder 151 and an address decoder 153.

請同時參考圖5與圖6。在步驟S610中,記憶體裝置100會在暫存單元110中寫入多個自定義資訊UD_INFO。在本實施例中,寫入自定義資訊UD_INFO至暫存單元110的步驟又包括步驟S611至S615。在步驟S611中,記憶體裝置100可例如自外部接收訊號。在步驟S613中,偵測單元140會偵測所接收的訊號是否為對應於自定義資訊UD_INFO的至少其中之一的寫入訊號。若所接收的訊號是對應於自定義資訊UD_INFO的至少其中之一的寫入訊號,則於步驟S615中,依據此寫入訊號將其所對應的至少一個自定義資訊UD_INFO記錄於暫存單元110中。在本實施例中,對應於自定義資訊UD_INFO的至少其中之一的寫入訊號可例如是來自使用者自行定義的寫入訊號。因此,步驟S611至S615可例如是重複執行數次以記錄所有使用者所需的自定義資訊UD_INFO。Please refer to FIG. 5 and FIG. 6 at the same time. In step S610, the memory device 100 writes a plurality of pieces of custom information UD_INFO in the temporary storage unit 110. In this embodiment, the step of writing the custom information UD_INFO to the temporary storage unit 110 further includes steps S611 to S615. In step S611, the memory device 100 can receive a signal, for example, from the outside. In step S613, the detecting unit 140 detects whether the received signal is a write signal corresponding to at least one of the custom information UD_INFO. If the received signal is a write signal corresponding to at least one of the custom information UD_INFO, in step S615, at least one custom information UD_INFO corresponding to the write signal is recorded in the temporary storage unit 110 according to the write signal. in. In this embodiment, the write signal corresponding to at least one of the custom information UD_INFO may be, for example, a write signal defined by the user. Therefore, steps S611 to S615 can be performed, for example, several times to record the custom information UD_INFO required by all users.

舉例而言,記憶體裝置100可例如自外部接收對應於命令流程資訊210的寫入訊號,且命令流程資訊210包括至少兩個命令資訊以及至少一個延遲資訊。在偵測單元140偵測所接收的寫入訊號是對應於命令流程資訊210後,便可依據此寫入訊號將命令流程資訊210寫入暫存單元110中。除此之外,記憶體裝置100可例如自外部接收對應於迴圈資訊240的另一個寫入訊號。在偵測單元140偵測所接收的寫入訊號是對應於迴圈資訊240後,便可依據此寫入訊號將迴圈資訊240寫入暫存單元110中。然而,本發明並不在此限制寫入訊號所對應的自定義資訊UD_INFO的內容。也就是說,本實施例中的寫入訊號可例如是對應於命令流程資訊、起始位址資訊、位址遞增資訊以及迴圈資訊的其中之一或其組合。在其他實施例中,所屬領域具備通常知識者可依其需求來定義對應於不同的自定義資訊的寫入訊號。For example, the memory device 100 can receive a write signal corresponding to the command flow information 210, for example, from the outside, and the command flow information 210 includes at least two command information and at least one delay information. After the detecting unit 140 detects that the received write signal corresponds to the command flow information 210, the command flow information 210 can be written into the temporary storage unit 110 according to the write signal. In addition to this, the memory device 100 can receive another write signal corresponding to the loop information 240, for example, from the outside. After the detecting unit 140 detects that the received write signal corresponds to the loop information 240, the loop information 240 can be written into the temporary storage unit 110 according to the write signal. However, the present invention does not limit the content of the custom information UD_INFO corresponding to the write signal. That is to say, the write signal in this embodiment may be, for example, one or a combination of command flow information, start address information, address increment information, and loop information. In other embodiments, those skilled in the art can define a write signal corresponding to different customized information according to their needs.

在自定義資訊UD_INFO被記錄至暫存單元110後,於步驟S620中,指令產生器120會接收自定義命令UD_CMD。在本實施例中,自定義命令UD_CMD例如是由使用者藉由至少一熱鍵來產生,並透過記憶體控制器傳遞至指令產生器120,但本發明並不限於此。在其他實施例中,自定義命令UD_CMD也可例如是定義為其他任意型式的觸發訊號。After the custom information UD_INFO is recorded to the temporary storage unit 110, the instruction generator 120 receives the custom command UD_CMD in step S620. In the present embodiment, the custom command UD_CMD is generated by the user by at least one hot key and transmitted to the command generator 120 through the memory controller, but the present invention is not limited thereto. In other embodiments, the custom command UD_CMD may also be, for example, a trigger signal defined as any other type.

一旦指令產生器120接收到自定義命令UD_CMD,則進入步驟S630。在步驟S630中,指令產生器120會依據所接收的自定義命令UD_CMD以及暫存單元110中的自定義資訊UD_INFO來對記憶胞陣列130執行至少兩個記憶體操作。在本實施例中,多工器161是耦接於自定義命令產生器121與命令解碼器151,且多工器163是耦接於自定義位址產生器123與位址解碼器153。當指令產生器120接收到自定義命令UD_INFO時,多工器161會切換以使自定義命令產生器121依據命令流程資訊210來對記憶胞陣列130下達命令,並且多工器163會切換以使自定義位址產生器121依據位址遞增資訊220、起始位址資訊230以及迴圈資訊240來對記憶胞陣列130提供位址資訊。在本實施例中,指令產生器120依據所接收的自定義命令UD_CMD以及暫存單元110中的自定義資訊UD_INFO來對記憶胞陣列130執行至少兩個記憶體操作的方式已於前述實施例中詳細說明,在此不再贅述。Once the instruction generator 120 receives the custom command UD_CMD, it proceeds to step S630. In step S630, the instruction generator 120 performs at least two memory operations on the memory cell array 130 according to the received custom command UD_CMD and the custom information UD_INFO in the temporary storage unit 110. In the embodiment, the multiplexer 161 is coupled to the custom command generator 121 and the command decoder 151, and the multiplexer 163 is coupled to the custom address generator 123 and the address decoder 153. When the instruction generator 120 receives the custom command UD_INFO, the multiplexer 161 switches to cause the custom command generator 121 to issue a command to the memory cell array 130 according to the command flow information 210, and the multiplexer 163 switches to enable The custom address generator 121 provides address information to the memory cell array 130 based on the address increment information 220, the start address information 230, and the loop information 240. In this embodiment, the manner in which the instruction generator 120 performs at least two memory operations on the memory cell array 130 according to the received custom command UD_CMD and the custom information UD_INFO in the temporary storage unit 110 is in the foregoing embodiment. Detailed description will not be repeated here.

回到步驟S613,若所接收的訊號並非對應於自定義資訊UD_INFO的至少其中之一的寫入訊號,則進入步驟S640。在步驟S640中,訊號解碼器150會解碼所接收的訊號以得到解碼結果。隨後,在步驟S650中,依據解碼結果對記憶胞陣列130執行所接收的訊號所對應的單一記憶體操作。在本實施例中,被訊號解碼器150所解碼的訊號可例如是包括對應單一記憶體操作的外部訊號,解碼結果包括記憶體命令以及位址資訊。命令解碼器151會解碼此外部訊號以得到其所對應的記憶體命令。多工器161會切換以使命令解碼器151依據此記憶體命令來對記憶胞陣列130執行對應的單一記憶體操作。另一方面,位址解碼器153會解碼此外部訊號以得到其所對應的位址資訊。多工器163會切換以使位址解碼器153依據此位址資訊來提供給記憶胞陣列130,以配合執行上述的單一記憶體操作。Returning to step S613, if the received signal is not a write signal corresponding to at least one of the custom information UD_INFO, then step S640 is reached. In step S640, the signal decoder 150 decodes the received signal to obtain a decoding result. Then, in step S650, a single memory operation corresponding to the received signal is performed on the memory cell array 130 according to the decoding result. In this embodiment, the signal decoded by the signal decoder 150 may be, for example, an external signal including a single memory operation, and the decoding result includes a memory command and address information. The command decoder 151 decodes the external signal to obtain its corresponding memory command. The multiplexer 161 switches to cause the command decoder 151 to perform a corresponding single memory operation on the memory cell array 130 in accordance with the memory command. On the other hand, the address decoder 153 decodes the external signal to obtain the address information corresponding thereto. The multiplexer 163 switches to cause the address decoder 153 to provide the memory cell array 130 in accordance with the address information to cooperate with the single memory operation described above.

換言之,在本實施例中,多個自定義資訊UD_INFO會被記錄在暫存單元110中。倘若記憶體裝置100接收到對應於單一記憶體操作的外部訊號,而未接收到作為觸發訊號的自定義命令UD_CMD,則會依據對外部訊號解碼後的解碼結果來對記憶胞陣列130執行對應的單一記憶體操作。特別是,倘若記憶體裝置100的指令產生器120接收到自定義命令UD_CMD作為觸發訊號,則會依據自定義命令UD_CMD以及記錄於暫存單元110中的自定義資訊UD_INFO來對記憶胞陣列130執行至少兩個記憶體操作。In other words, in the present embodiment, a plurality of custom information UD_INFOs are recorded in the temporary storage unit 110. If the memory device 100 receives the external signal corresponding to the operation of the single memory and does not receive the custom command UD_CMD as the trigger signal, the memory cell array 130 is executed according to the decoded result decoded by the external signal. Single memory operation. In particular, if the command generator 120 of the memory device 100 receives the custom command UD_CMD as the trigger signal, the memory cell array 130 is executed according to the custom command UD_CMD and the custom information UD_INFO recorded in the temporary storage unit 110. At least two memory operations.

值得一提的是,以第三代雙倍資料率同步動態隨機存取記憶體(DDR3 SDRAM)來說,當從記憶體控制器接收到對應一個讀取操作的外部訊號時,可讀取的資料長度為8個位元,即突發長度(Burst Length,BL)為8。然而,在本實施例中的命令流程資訊210所包含的三個命令資訊CMD1至CMD3皆是對應於讀取操作RD。因此,當使用者欲從記憶體裝置100中讀取24個位元的資料時,僅需將一個自定義命令UD_CMD傳遞至記憶體裝置100的指令產生器120,便能夠依序執行三個讀取操作,以讀取24個位元的資料。換言之,藉由本發明實施例的自定義命令UD_CMD可依序對記憶胞陣列130執行兩個以上相同的記憶體操作。It is worth mentioning that, in the third generation double data rate synchronous dynamic random access memory (DDR3 SDRAM), when receiving an external signal corresponding to a read operation from the memory controller, it is readable. The data length is 8 bits, that is, the Burst Length (BL) is 8. However, the three command information CMD1 to CMD3 included in the command flow information 210 in this embodiment correspond to the read operation RD. Therefore, when the user wants to read 24 bits of data from the memory device 100, only one custom command UD_CMD needs to be transferred to the command generator 120 of the memory device 100, so that three readings can be performed in sequence. Take the operation to read the data of 24 bits. In other words, the custom command UD_CMD of the embodiment of the present invention can perform two or more identical memory operations on the memory cell array 130 in sequence.

此外,本發明實施例的自定義命令是對應於自定義資訊,而本發明並不限制自定義命令的數量。在其他實施例中,暫存單元也可例如是記錄包括多組的自定義資訊,其中各組自定義資訊皆包括命令流程資訊、位址遞增資訊、起始位址資訊以及迴圈資訊等,並且依據所接收到的自定義命令種類來選擇其中一組自定義資訊作為依據,來對記憶胞陣列執行至少兩個記憶體操作。舉例來說,暫存單元例如記錄有第一自定義資訊以及第二自定義資訊。當使用者藉由輸入熱鍵組合來產生第一自定義命令,並且指令產生器接收到此第一自定義命令時,便依據暫存單元中所記錄的第一自定義資訊來對記憶胞陣列執行第一自定義資訊所對應的至少兩個記憶體操作。另一方面,當指令產生器接收到來自主機系統的第二自定義命令時,便依據暫存單元中所記錄的第二自定義資訊來對記憶胞陣列執行第二自定義資訊所對應的至少兩個記憶體操作。In addition, the custom command of the embodiment of the present invention corresponds to custom information, and the present invention does not limit the number of custom commands. In other embodiments, the temporary storage unit may also record, for example, a plurality of sets of customized information, wherein each group of customized information includes command flow information, address increment information, start address information, and loop information. And performing at least two memory operations on the memory cell array according to the received custom command type as a basis for selecting one of the customized information. For example, the temporary storage unit records, for example, the first customized information and the second customized information. When the user generates the first custom command by inputting the hotkey combination, and the command generator receives the first custom command, the memory cell array is determined according to the first custom information recorded in the temporary storage unit. Perform at least two memory operations corresponding to the first custom information. On the other hand, when the command generator receives the second custom command from the host system, performing at least the second custom information corresponding to the memory cell array according to the second custom information recorded in the temporary storage unit. Two memory operations.

綜上所述,本發明實施例所提供的記憶體裝置以及記憶體裝置操作方法,將自定義資訊記錄於記憶體裝置的暫存單元中,並且在接收到自定義命令時,觸發記憶體裝置依據所接收的自定義命令以及記錄於暫存單元中的自定義資訊,對記憶體裝置的記憶胞陣列執行至少兩個記憶體操作。據此,可節省指令傳輸的次數,以減少系統的功耗。In summary, the memory device and the memory device operating method provided by the embodiments of the present invention record the customized information in the temporary storage unit of the memory device, and trigger the memory device when receiving the custom command. At least two memory operations are performed on the memory cell array of the memory device based on the received custom command and the custom information recorded in the temporary storage unit. According to this, the number of instruction transmissions can be saved to reduce the power consumption of the system.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.

100:記憶體裝置 110:暫存單元 120:指令產生器 121:自定義命令產生器 123:自定義位址產生器 130:記憶胞陣列 140:偵測單元 150:訊號解碼器 151:命令解碼器 153:位址解碼器 161、163:多工器 210:命令流程資訊 220:位址遞增資訊 230:起始位址資訊 240:迴圈資訊 ACT、WR、RD、PRE、PREA、PD、PRE:記憶體命令 BA_INI:區塊起始資訊 BS:區塊遞增資訊 CA_INI:行起始資訊 CK:時脈週期 CMD1、CMD2、CMD3:命令資訊 CS:行遞增資訊 D1、D2、D3、D4、D5、D6、D7、D8:資料 DL1、DL2、DL3:延遲資訊 LP:迴圈數 RA、CA、BNK:位址資訊 RA_INI:列起始資訊 RL:讀取延遲 RS:列遞增資訊 S610、S611、S613、S615、S620、S630、S640、S650:記憶體裝置操作方法的步驟 T1、T2、T3、T4、T5、T6、T7、T8、T9、T10、T11、T12、T13、T14、T15:時脈週期 t RCD:列控制器至行控制器傳輸延遲 t RTP:內部讀取到預充電命令延遲 UD_CMD:自定義命令 UD_INFO:自定義資訊 100: memory device 110: temporary storage unit 120: command generator 121: custom command generator 123: custom address generator 130: memory cell array 140: detection unit 150: signal decoder 151: command decoder 153: address decoder 161, 163: multiplexer 210: command flow information 220: address increment information 230: start address information 240: loop information ACT, WR, RD, PRE, PREA, PD, PRE: Memory command BA_INI: Block start information BS: Block increment information CA_INI: Line start information CK: Clock cycle CMD1, CMD2, CMD3: Command information CS: Line increment information D1, D2, D3, D4, D5, D6, D7, D8: Data DL1, DL2, DL3: Delay information LP: Number of loops RA, CA, BNK: Address information RA_INI: Column start information RL: Read delay RS: Column increment information S610, S611, S613 , S615, S620, S630, S640, S650: steps of the memory device operation method T1, T2, T3, T4, T5, T6, T7, T8, T9, T10, T11, T12, T13, T14, T15: clock period t RCD: to row controller column controller propagation delay t RTP: internal read command to precharge delay UD_CMD: Custom Command UD_INFO: Custom Information

圖1繪示本發明一實施例之記憶體裝置的概要方塊圖。 圖2繪示本發明一實施例之自定義資訊的示意圖。 圖3繪示習知的記憶體裝置操作方法的示意圖。 圖4繪示本發明一實施例之記憶體裝置操作方法的示意圖。 圖5繪示本發明一實施例之記憶體裝置的架構示意圖。 圖6繪示本發明一實施例之記憶體裝置操作方法的流程圖。1 is a schematic block diagram of a memory device in accordance with an embodiment of the present invention. 2 is a schematic diagram of customized information according to an embodiment of the present invention. 3 is a schematic diagram of a conventional method of operating a memory device. 4 is a schematic diagram of a method of operating a memory device according to an embodiment of the invention. FIG. 5 is a schematic structural diagram of a memory device according to an embodiment of the invention. FIG. 6 is a flow chart showing a method of operating a memory device according to an embodiment of the invention.

S610、S611、S613、S615、S620、S630、S640、S650:記憶體裝置操作方法的步驟。S610, S611, S613, S615, S620, S630, S640, S650: steps of the method of operating the memory device.

Claims (20)

一種記憶體裝置,包括:一記憶胞陣列,包括多個記憶胞;一暫存單元,用以記錄多個自定義資訊;以及一指令產生器,耦接於該暫存單元以及該記憶胞陣列,其中該指令產生器接收一自定義命令,並且依據該自定義命令以及該些自定義資訊對該記憶胞陣列執行至少兩個記憶體操作,其中各該些自定義資訊分別是依據至少兩個記憶體操作來產生。 A memory device includes: a memory cell array including a plurality of memory cells; a temporary storage unit for recording a plurality of custom information; and an instruction generator coupled to the temporary storage unit and the memory cell array The instruction generator receives a custom command, and performs at least two memory operations on the memory cell array according to the custom command and the customized information, wherein each of the customized information is based on at least two Memory operations are produced. 如申請專利範圍第1項所述的記憶體裝置,更包括:一偵測單元,用以接收一寫入訊號,並偵測該寫入訊號是否對應於該些自定義資訊的至少其中之一,其中若該寫入訊號對應於該些自定義資訊的至少其中之一,依據該寫入訊號記錄對應的該至少一自定義資訊於該暫存單元。 The memory device of claim 1, further comprising: a detecting unit configured to receive a write signal and detect whether the write signal corresponds to at least one of the customized information If the write signal corresponds to at least one of the customized information, the corresponding at least one custom information is recorded in the temporary storage unit according to the write signal. 如申請專利範圍第1項所述的記憶體裝置,更包括:一訊號解碼器,用以接收並解碼一外部訊號,並依據該訊號解碼器的一解碼結果對該記憶胞陣列執行該外部訊號對應的單一記憶體操作。 The memory device of claim 1, further comprising: a signal decoder for receiving and decoding an external signal, and performing the external signal on the memory cell array according to a decoding result of the signal decoder Corresponding single memory operation. 如申請專利範圍第1項所述的記憶體裝置,其中該暫存單元為一模式暫存器,並且該些自定義資訊的至少其中之一在該記憶體裝置的一模式暫存器設置狀態寫入該模式暫存器。 The memory device of claim 1, wherein the temporary storage unit is a mode register, and at least one of the customized information is in a mode register setting state of the memory device. Write to this mode register. 如申請專利範圍第1項所述的記憶體裝置,其中該些自定義資訊包括至少兩個命令資訊以及至少一延遲資訊,其中各該些命令資訊對應於一個記憶體操作。 The memory device of claim 1, wherein the customized information comprises at least two command information and at least one delay information, wherein each of the command information corresponds to a memory operation. 如申請專利範圍第5項所述的記憶體裝置,其中該些自定義資訊更包括一迴圈資訊,其中該指令產生器依據該迴圈資訊重複對該記憶胞陣列執行該些命令資訊所對應的該些記憶體操作。 The memory device of claim 5, wherein the custom information further includes a loop information, wherein the command generator repeatedly performs the command information corresponding to the memory cell array according to the loop information. The memory operations. 如申請專利範圍第6項所述的記憶體裝置,其中該些自定義資訊更包括一起始位址資訊以及一位址遞增資訊,其中該指令產生器依據該起始位址資訊、該位址遞增資訊以及該迴圈資訊依序操作該記憶胞陣列中的至少一該記憶胞。 The memory device of claim 6, wherein the customized information further includes a start address information and an address increment information, wherein the command generator is based on the start address information, the address The incremental information and the loop information sequentially operate at least one of the memory cells in the memory cell array. 如申請專利範圍第1項所述的記憶體裝置,其中所執行的該至少兩個記憶體操作包括一第一記憶體操作以及一第二記憶體操作,且該第一記憶體操作相同於該第二記憶體操作。 The memory device of claim 1, wherein the at least two memory operations performed include a first memory operation and a second memory operation, and the first memory operation is the same as the The second memory operates. 如申請專利範圍第1項所述的記憶體裝置,其中該記憶體操作為無操作、激活、讀取、寫入、預充電以及省電的其中之一。 The memory device of claim 1, wherein the memory gymnastics is one of no operation, activation, reading, writing, pre-charging, and power saving. 如申請專利範圍第1項所述的記憶體裝置,其中該自定義命令係由至少一熱鍵來產生。 The memory device of claim 1, wherein the custom command is generated by at least one hot key. 一種記憶體裝置操作方法,適用於一記憶體裝置,其中該記憶體裝置包括一記憶胞陣列以及一暫存單元,該記憶體裝置操作方法包括: 寫入多個自定義資訊至該暫存單元;接收一自定義命令;以及依據該自定義命令以及該些自定義資訊對該記憶胞陣列執行至少兩個記憶體操作,其中各該自定義資訊分別是依據至少兩個記憶體操作來產生。 A memory device operating method is applicable to a memory device, wherein the memory device includes a memory cell array and a temporary storage unit, and the memory device operating method includes: Writing a plurality of customized information to the temporary storage unit; receiving a custom command; and performing at least two memory operations on the memory cell array according to the custom command and the customized information, wherein each of the customized information They are generated based on at least two memory operations, respectively. 如申請專利範圍第11項所述的記憶體裝置操作方法,其中寫入該些自定義資訊至該暫存單元的步驟包括:接收一寫入訊號;偵測該寫入訊號是否對應於該些自定義資訊的至少其中之一;以及若該寫入訊號對應於該些自定義資訊的至少其中之一,依據該寫入訊號記錄對應的該至少一自定義資訊於該暫存單元。 The method for operating a memory device according to claim 11, wherein the step of writing the customized information to the temporary storage unit comprises: receiving a write signal; detecting whether the write signal corresponds to the At least one of the custom information; and if the write signal corresponds to at least one of the custom information, the at least one custom information corresponding to the write signal record is recorded in the temporary storage unit. 如申請專利範圍第11項所述的記憶體裝置操作方法,更包括:接收並解碼一外部訊號以得到一解碼結果;以及依據該解碼結果對該記憶胞陣列執行該外部訊號所對應的單一記憶體操作。 The method for operating a memory device according to claim 11, further comprising: receiving and decoding an external signal to obtain a decoding result; and performing a single memory corresponding to the external signal to the memory cell array according to the decoding result. Body operation. 如申請專利範圍第11項所述的記憶體裝置操作方法,其該暫存單元為一模式暫存器,並且該些自定義資訊的至少其中之一在該記憶體裝置的一模式暫存器設置狀態寫入該模式暫存器。 The method for operating a memory device according to claim 11, wherein the temporary storage unit is a mode register, and at least one of the customized information is in a mode register of the memory device. The setup status is written to this mode register. 如申請專利範圍第11項所述的記憶體裝置操作方法,其中寫入該些自定義資訊至該暫存單元的步驟包括:寫入至少兩個命令資訊以及至少一延遲資訊至該暫存單元,其中各該些命令資訊對應於一個記憶體操作。 The method for operating a memory device according to claim 11, wherein the step of writing the customized information to the temporary storage unit comprises: writing at least two command information and at least one delay information to the temporary storage unit , wherein each of the command information corresponds to a memory operation. 如申請專利範圍第15項所述的記憶體裝置操作方法,其中寫入該些自定義資訊至該暫存單元的步驟更包括:寫入一迴圈資訊至該暫存單元,其中依據該自定義命令以及該些自定義資訊對該記憶胞陣列執行該至少兩個記憶體操作的步驟包括:依據該迴圈資訊重複對該記憶胞陣列執行該至少兩個命令資訊所對應的該至少兩個記憶體操作。 The method for operating a memory device according to claim 15, wherein the step of writing the customized information to the temporary storage unit further comprises: writing a loop information to the temporary storage unit, wherein Defining the command and the custom information to perform the at least two memory operations on the memory cell array, comprising: repeating, by the loop information, the at least two corresponding to the at least two command information of the memory cell array Memory operation. 如申請專利範圍第16項所述的記憶體裝置操作方法,其中寫入該些自定義資訊至該暫存單元的步驟更包括:寫入一起始位址資訊以及一位址遞增資訊至該暫存單元,其中依據該自定義命令以及該些自定義資訊對該記憶胞陣列執行該至少兩個記憶體操作的步驟包括:依據該起始位址資訊、該位址遞增資訊以及該迴圈資訊依序對該記憶胞陣列中的至少一記憶胞執行該至少兩個記憶體操作。 The method for operating a memory device according to claim 16, wherein the step of writing the customized information to the temporary storage unit further comprises: writing a start address information and an address increment information to the temporary And the storing unit, wherein the performing the at least two memory operations on the memory cell array according to the custom command and the customized information comprises: updating the information according to the start address information, the address, and the loop information The at least two memory operations are performed on the at least one memory cell in the memory cell array in sequence. 如申請專利範圍第11項所述的記憶體裝置操作方法,其中依據該自定義命令以及該些自定義資訊對該記憶胞陣列執行該至少兩個記憶體操作的步驟包括:依據該自定義命令以及該些自定義資訊,依序對該記憶胞陣 列執行一第一記憶體操作以及一第二記憶體操作,其中該第一記憶體操作相同於該第二記憶體操作。 The method for operating a memory device according to claim 11, wherein the step of performing the at least two memory operations on the memory cell array according to the custom command and the customized information comprises: according to the custom command And the custom information, sequentially the memory cell array The column performs a first memory operation and a second memory operation, wherein the first memory operation is the same as the second memory operation. 如申請專利範圍第11項所述的記憶體裝置操作方法,其中該記憶體操作為無操作、激活、讀取、寫入、預充電以及省電的其中之一。 The memory device operating method according to claim 11, wherein the memory gymnastics is one of no operation, activation, reading, writing, pre-charging, and power saving. 如申請專利範圍第11項所述的記憶體裝置操作方法,其中該自定義命令係由至少一熱鍵來產生。 The method of operating a memory device according to claim 11, wherein the custom command is generated by at least one hot key.
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