TWI613334B - Automatic crystal growth method with high success rate - Google Patents

Automatic crystal growth method with high success rate Download PDF

Info

Publication number
TWI613334B
TWI613334B TW105111429A TW105111429A TWI613334B TW I613334 B TWI613334 B TW I613334B TW 105111429 A TW105111429 A TW 105111429A TW 105111429 A TW105111429 A TW 105111429A TW I613334 B TWI613334 B TW I613334B
Authority
TW
Taiwan
Prior art keywords
diameter
temperature
liquid surface
preset
crystal growth
Prior art date
Application number
TW105111429A
Other languages
Chinese (zh)
Other versions
TW201736649A (en
Inventor
劉建成
中西正美
呂建興
施英汝
林欽山
Original Assignee
環球晶圓股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 環球晶圓股份有限公司 filed Critical 環球晶圓股份有限公司
Priority to TW105111429A priority Critical patent/TWI613334B/en
Publication of TW201736649A publication Critical patent/TW201736649A/en
Application granted granted Critical
Publication of TWI613334B publication Critical patent/TWI613334B/en

Links

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

一種提高長晶成功率的自動長晶方法,包括下列步驟。調整一坩堝內的一熔湯的一液面的溫度到達預設的一目標溫度。接著,使用一晶種接觸坩堝內的熔湯的液面。然後,進行預拉,使晶種以設定的速度往上移動而離開液面,同時監測晶種與液面之間所形成的一預拉段於液面處的一直徑。當直徑大於一預設直徑時提高熔湯的溫度。當直徑小於預設直徑時降低熔湯的溫度。當預拉段於液面處的直徑保持於預設直徑時,於預拉段下方依長晶程序形成一頸部、一肩部與一本體。An automatic crystal growth method for improving the success rate of crystal growth includes the following steps. The temperature of a liquid surface of a molten soup in a crucible is adjusted to reach a preset target temperature. Next, a seed crystal was used to contact the liquid surface of the molten soup in the crucible. Then, pre-pulling is performed to move the seed crystal upward at a set speed to leave the liquid surface, and at the same time, monitor a diameter of a pre-pulling section formed between the seed crystal and the liquid surface at the liquid surface. When the diameter is greater than a preset diameter, the temperature of the molten soup is increased. When the diameter is smaller than the preset diameter, lower the temperature of the molten soup. When the diameter of the pre-stretching section at the liquid surface is maintained at the preset diameter, a neck, a shoulder, and a body are formed under the pre-stretching section according to the crystal growth procedure.

Description

提高長晶成功率的自動長晶方法Automatic crystal growth method for improving crystal growth success rate

本發明是有關於一種長晶方法。The invention relates to a method for growing crystals.

近年來,半導體產業蓬勃發展,其中矽晶圓為半導體產業最基本的必需品。矽晶圓成長的方式包括浮熔帶長晶法(Floating Zone Method)、雷射加熱提拉長晶法(Laser Heated Pedestal Growth)以及柴氏長晶法(Czochralski Method,簡稱CZ method)等。其中柴氏長晶法因具有較佳的經濟效益,故成為目前大尺寸晶圓的主要生長方式。矽熔融液溫度的控制-尤其指液態矽熔湯表面溫度極為重要,其溫度對於長晶晶體的品質與長晶的成功率會有很大的影響。但是一般長晶爐內的熱場會因為使用時間的增長,而導致保溫效果不斷的變化,進而導致每次生長時液面溫度會改變,一般溫度量測方法有熱電偶式量測、紅外線測溫儀等。但礙於儀器在爐內環境下的精確度考量,初步的微調多靠人為或設定一經驗值來控制加熱器輸出功率大小,來達成初步適當的長晶溫度。In recent years, the semiconductor industry has been booming, and silicon wafers are the most basic necessities of the semiconductor industry. The growth methods of silicon wafers include the Floating Zone Method, Laser Heated Pedestal Growth, and Czochralski Method (CZ method for short). Among them, the Chai's growth method has better economic benefits, so it has become the main growth method for large-size wafers. The control of the temperature of the silicon melt-especially the surface temperature of the liquid silicon soup is extremely important, and its temperature will have a great influence on the quality of the crystal growth and the success rate of the crystal growth. However, the thermal field in the general crystal growth furnace will continue to change due to the increase of use time, which will cause the liquid surface temperature to change every time. The general temperature measurement methods include thermocouple measurement and infrared measurement. Wen Yi and so on. However, due to the accuracy of the instrument in the furnace environment, the initial fine-tuning mostly relies on artificial or setting an empirical value to control the heater output power to achieve a preliminary suitable crystal growth temperature.

而在CZ法的單晶生長(growth of single crystal)中,在維持呈減壓下的惰性氣體環境的腔室內,將晶種(seed crystal)浸漬於坩堝(crucible)內所積存的矽的原料熔湯中。待操作人員判斷晶種與熔湯接觸處所產生的亮點的尺寸到達經驗值時,便操作長晶裝置將所浸漬的晶種緩慢提拉,以於晶種的下方依序生長出單晶矽棒的頸部、肩部與本體。實際上,晶種與熔湯接觸處所產生的亮點的尺寸在某種程度上與熔湯的溫度正相關,因此才會以此作為判斷是否可開始提拉晶種的依據。In the growth of single crystal of the CZ method, in a chamber maintained under an inert gas atmosphere under reduced pressure, seed crystals are immersed in the raw materials of silicon accumulated in a crucible In the soup. When the operator judges that the size of the bright spot generated by the contact between the seed crystal and the molten soup reaches the empirical value, the crystal growing device is operated to slowly pull the impregnated seed crystal to sequentially grow a single crystal silicon rod under the seed crystal Neck, shoulders and body. In fact, the size of the bright spot produced by the contact between the seed crystal and the molten soup is to a certain extent positively related to the temperature of the molten soup, so this will be used as the basis for judging whether it is possible to start pulling the seed crystal.

但是,這樣的判斷動作交由操作者以個人經驗做人為判斷,會導致每次長晶的初始溫度差異較大,易在形成頸部時產生斷裂或是晶格缺陷的去除效果不佳,導致晶體成晶率較差。而且,當操作人更換時,更存在每個人的主觀標準不一的問題,造成初始溫度的差異,最後使得長成的晶體的品質不一。目前,另一種判斷是否可開始提拉晶種的方式是利用高溫測溫計量測熔湯的溫度。但是,因為長晶裝置的空間限制,高溫測溫計無法量測到熔湯實際與晶種接觸的區域的溫度,而僅能量測到附近區域的溫度,仍有誤差值存在。因此,如何準確判斷出可開始提拉晶種的時機,以提升晶體成晶率以及晶體品質的一致性,就成為值得研究的課題。However, such judgment is left to the operator to make judgment based on personal experience, which will lead to a large difference in the initial temperature of each crystal growth, and it is easy to produce fractures when forming the neck or poor removal of lattice defects, resulting in crystals The crystallization rate is poor. Moreover, when the operator is replaced, there is also the problem of different subjective standards for each person, resulting in a difference in initial temperature, and finally the quality of the grown crystal is different. At present, another way to judge whether it is possible to start pulling the seed crystal is to use a high-temperature temperature measurement to measure the temperature of the molten soup. However, due to the space limitation of the crystal growth device, the high temperature thermometer cannot measure the temperature of the area where the melt actually contacts the seed crystal, but only the energy can measure the temperature of the nearby area, and there are still error values. Therefore, how to accurately determine the timing of starting to pull the seed crystal to improve the crystal crystallization rate and the consistency of the crystal quality has become a subject worth studying.

本發明提供一種長晶方法,可解決習知技術中晶體的成晶率以及品質一致性不佳的問題。The invention provides a method for growing crystals, which can solve the problems of poor crystallization rate and quality consistency of crystals in the conventional technology.

本發明的提高長晶成功率的自動長晶方法包括下列步驟。調整一坩堝內的一熔湯的一液面的溫度到達預設的一目標溫度。接著,使用一晶種接觸坩堝內的熔湯的液面。然後,進行預拉,使晶種以設定的速度往上移動而離開液面,同時監測晶種與液面之間所形成的一預拉段於液面處的一直徑。當直徑大於一預設直徑時提高熔湯的溫度。當直徑小於預設直徑時降低熔湯的溫度。當預拉段於液面處的直徑保持於預設直徑時,於預拉段下方依長晶程序形成一頸部、一肩部與一本體。The automatic crystal growth method for improving the success rate of crystal growth of the present invention includes the following steps. The temperature of a liquid surface of a molten soup in a crucible is adjusted to reach a preset target temperature. Next, a seed crystal was used to contact the liquid surface of the molten soup in the crucible. Then, pre-pulling is performed to move the seed crystal upward at a set speed to leave the liquid surface, and at the same time, monitor a diameter of a pre-pulling section formed between the seed crystal and the liquid surface at the liquid surface. When the diameter is greater than a preset diameter, the temperature of the molten soup is increased. When the diameter is smaller than the preset diameter, lower the temperature of the molten soup. When the diameter of the pre-stretching section at the liquid surface is maintained at the preset diameter, a neck, a shoulder, and a body are formed under the pre-stretching section according to the crystal growth procedure.

在本發明的一實施例中,預設直徑為10 mm。In an embodiment of the invention, the preset diameter is 10 mm.

在本發明的一實施例中,直徑為預拉段於液面起算高26mm處的直徑。In an embodiment of the invention, the diameter is the diameter of the pre-stretching section at a height of 26 mm from the liquid level.

在本發明的一實施例中,直徑是以影像擷取方式測得。In an embodiment of the invention, the diameter is measured by image capture.

在本發明的一實施例中,長晶方法更包括以高溫計(Pyrometer)測量液面的溫度到達一預設溫度後,才使晶種接觸液面。In an embodiment of the invention, the method of growing crystals further includes measuring the temperature of the liquid surface with a pyrometer (Pyrometer) to reach a preset temperature before contacting the seed crystal with the liquid surface.

在本發明的一實施例中,預設溫度為1450°C。In an embodiment of the invention, the preset temperature is 1450 ° C.

在本發明的一實施例中,直徑與預設直徑的差值相對熔湯的溫度的調整值成正比。In an embodiment of the present invention, the difference between the diameter and the preset diameter is proportional to the adjustment value of the temperature of the molten soup.

在本發明的一實施例中,晶種為單晶種。In an embodiment of the invention, the seed crystal is a single seed crystal.

在本發明的一實施例中,判斷直徑與預設直徑的大小關係的方法是由電腦自動判斷。In an embodiment of the invention, the method for determining the relationship between the diameter and the preset diameter is automatically determined by the computer.

基於上述,在本發明的長晶方法中,藉由預拉段的直徑來判斷時否需升溫或降溫,以取得一致的形成頸部的時機,進而提升晶體成晶率以及晶體品質的一致性。Based on the above, in the crystal growth method of the present invention, whether the temperature needs to be increased or decreased by the diameter of the pre-stretched segment is used to obtain a uniform timing for forming the neck, thereby improving the crystal crystallization rate and the consistency of the crystal quality .

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more obvious and understandable, the embodiments are specifically described below and described in detail in conjunction with the accompanying drawings.

圖1是依照本發明一實施例的長晶方法的流程圖。圖2A至圖2D是依照本發明一實施例的長晶方法的剖面示意圖。請參照圖1與圖2A,在本實施例的不需人員介入操作且可提高長晶成功率的自動長晶方法中,用以執行此自動長晶方法的設備例如包括一基本長晶系統、一紅外線測溫儀、一高解析度光學量測系統與一個可控制晶體上升速度(直徑控制迴圈)與融湯溫度(溫度控制迴圈)之軟體。FIG. 1 is a flowchart of a method for growing crystals according to an embodiment of the invention. 2A to 2D are schematic cross-sectional views of a method of growing crystals according to an embodiment of the invention. Please refer to FIGS. 1 and 2A. In the automatic crystal growth method of this embodiment that does not require human intervention and can improve the success rate of the crystal growth, the equipment for performing the automatic crystal growth method includes, for example, a basic crystal growth system, An infrared thermometer, a high-resolution optical measurement system and a software that can control the crystal rise speed (diameter control loop) and the melting temperature (temperature control loop).

首先,調整一坩堝60內的一熔湯70的一液面72的溫度到達預設的一目標溫度,此為步驟S120。調整液面72的溫度例如是使用前述的軟體進行溫度控制迴圈而達成。接著,會使一晶種50接觸坩堝60內的熔湯70的液面72,此為步驟S130。另外,在進行步驟S120之前,也可選擇性地先以高溫計80測量液面72的溫度,以便於設定調整溫度時所使用的功率及所需時間,此為步驟S110。舉例而言,晶種50可以是單晶種,但在其他實施例中晶種也可以是多晶種或其他晶種。坩堝60內的熔湯70例如是多晶矽的半導體材料及例如是硼、磷的摻雜物經高溫熔融成液態所構成,但本發明不侷限熔湯70的材料。在將用以形成熔湯70的材料放入坩堝60內之後,可設定加熱器(未繪示)以例如80KW的功率對坩堝60加熱,並設定加熱器的目標溫度例如介於1250°C至1350°C之間。然後,開啟融湯溫度的自動控制迴圈,當高溫計80測量液面72的溫度到達例如1450°C的預設的目標溫度後,才將吊線40上所吊掛的晶種50下降至接觸液面72的位置。高溫計80可以是紅外線測溫儀或其他高溫計。First, the temperature of a liquid surface 72 of a molten soup 70 in a crucible 60 is adjusted to reach a preset target temperature, which is step S120. The adjustment of the temperature of the liquid surface 72 is achieved, for example, by performing the temperature control loop using the aforementioned software. Next, a seed crystal 50 is brought into contact with the liquid surface 72 of the molten soup 70 in the crucible 60, which is step S130. In addition, before step S120 is performed, the temperature of the liquid surface 72 may be selectively measured with the pyrometer 80, so as to set the power and time required for adjusting the temperature. This is step S110. For example, the seed crystal 50 may be a single seed crystal, but in other embodiments, the seed crystal may also be a poly seed crystal or other seed crystals. The molten soup 70 in the crucible 60 is made of a semiconductor material such as polycrystalline silicon and a dopant such as boron and phosphorus is melted into a liquid at a high temperature, but the present invention is not limited to the material of the molten soup 70. After putting the material used to form the molten soup 70 into the crucible 60, a heater (not shown) can be set to heat the crucible 60 at a power of, for example, 80 KW, and the target temperature of the heater is set at, for example, 1250 ° C to Between 1350 ° C. Then, the automatic control loop of the melting temperature is turned on, and the temperature of the liquid surface 72 measured by the pyrometer 80 reaches a preset target temperature of, for example, 1450 ° C, and then the seed crystal 50 hung on the suspension wire 40 is lowered to contact The position of the liquid level 72. The pyrometer 80 may be an infrared thermometer or other pyrometer.

接著請參照圖1與圖2B,不同於習知技術的作法是在晶種50接觸液面72後就開始拉高晶種50以形成頸部,本實施例的長晶方法接著是進行一個自動抓溫的控制迴圈控制(預拉一段),使晶種50以設定的速度往上移動而離開液面72,以於晶種50與液面72之間形成一預拉段110,同時例如使用高解析度的光學影像量測系統監測預拉段110於液面72處的一直徑D10,此為步驟S140。當直徑D10大於一預設直徑時,表示熔湯70的溫度低於理想的溫度,因此需提高熔湯70的溫度,而此升溫的動作可由溫度控制迴圈軟體控制設備自動執行。當直徑D10小於預設直徑時,則表示熔湯70的溫度高於理想的溫度,因此需降低熔湯70的溫度,而此降溫的動作可由溫度控制迴圈軟體控制設備自動執行。Next, please refer to FIGS. 1 and 2B. Unlike the conventional technique, after the seed crystal 50 contacts the liquid surface 72, the seed crystal 50 starts to be raised to form a neck. The method of growing crystal in this embodiment is followed by an automatic Temperature control loop control (pre-stretching), so that the seed crystal 50 moves up at a set speed away from the liquid surface 72 to form a pre-stretching segment 110 between the seed crystal 50 and the liquid surface 72, and for example A high-resolution optical image measuring system is used to monitor a diameter D10 of the pre-stretching section 110 at the liquid surface 72. This is step S140. When the diameter D10 is greater than a preset diameter, it means that the temperature of the molten soup 70 is lower than the ideal temperature, so the temperature of the molten soup 70 needs to be increased, and this temperature increase can be automatically performed by the temperature control loop software control device. When the diameter D10 is smaller than the preset diameter, it means that the temperature of the molten soup 70 is higher than the ideal temperature, so the temperature of the molten soup 70 needs to be lowered, and this temperature-lowering action can be automatically performed by the temperature control loop software control device.

舉例來說,預設直徑可以是10 mm。當監測到預拉段110於液面72處的直徑D10為8.1 mm時,表示晶種50旁的液面72的溫度高於理想的溫度,加熱器的溫度高約6°C,因此必須調整加熱器的設定溫度或是採用其他方式讓加熱器的溫度降低6°C。當監測到預拉段110於液面72處的直徑D10為11.3 mm時,表示晶種50旁的液面72的溫度低於理想的溫度,加熱器的溫度高約4°C,因此必須調整加熱器的設定溫度或是採用其他方式讓加熱器的溫度提高4°C。當監測到預拉段110於液面72處的直徑D10為14.5 mm時,表示晶種50旁的液面72的溫度低於理想的溫度,加熱器的溫度低約14°C,因此必須調整加熱器的設定溫度或是採用其他方式讓加熱器的溫度提高14°C。當監測到預拉段110於液面72處的直徑D10為17.3 mm時,表示晶種50旁的液面72的溫度低於理想的溫度,加熱器的溫度低約24°C,因此必須調整加熱器的設定溫度或是採用其他方式讓加熱器的溫度提高24°C。當監測到預拉段110於液面72處的直徑D10為21.5 mm時,表示晶種50旁的液面72的溫度低於理想的溫度,加熱器的溫度低約34°C,因此必須調整加熱器的設定溫度或是採用其他方式讓加熱器的溫度提高34°C。在本實施例中,預拉段110於液面72處的直徑D10與預設直徑的差值相對熔湯70的溫度的調整值成正比。也就是說,只要監視預拉段110於液面72處的直徑D10,即可大約得知熔湯70的溫度。取得上述數值的實驗參數包括:後續將形成的晶棒的本體的直徑為6英吋;形成的單晶矽的晶格方向為100;熔湯70的摻雜物為硼;坩堝60的直徑為18英吋。For example, the preset diameter may be 10 mm. When the diameter D10 of the pre-stretching section 110 at the liquid surface 72 is monitored to be 8.1 mm, it means that the temperature of the liquid surface 72 beside the seed crystal 50 is higher than the ideal temperature, and the temperature of the heater is about 6 ° C higher, so it must be adjusted Set the heater temperature or use other methods to reduce the heater temperature by 6 ° C. When the diameter D10 of the pre-stretching section 110 at the liquid surface 72 is 11.3 mm, it means that the temperature of the liquid surface 72 next to the seed crystal 50 is lower than the ideal temperature, and the heater temperature is about 4 ° C higher, so it must be adjusted The heater's set temperature or other methods are used to increase the heater's temperature by 4 ° C. When the diameter D10 of the pre-stretching section 110 at the liquid surface 72 is 14.5 mm, it means that the temperature of the liquid surface 72 beside the seed crystal 50 is lower than the ideal temperature, and the temperature of the heater is about 14 ° C lower, so it must be adjusted The heater's set temperature or other methods are used to increase the heater's temperature by 14 ° C. When the diameter D10 of the pre-stretching section 110 at the liquid surface 72 is 17.3 mm, it means that the temperature of the liquid surface 72 next to the seed crystal 50 is lower than the ideal temperature, and the temperature of the heater is about 24 ° C lower, so it must be adjusted The heater's set temperature or other methods are used to increase the heater's temperature by 24 ° C. When the diameter D10 of the pre-stretching section 110 at the liquid surface 72 is 21.5 mm, it means that the temperature of the liquid surface 72 next to the seed crystal 50 is lower than the ideal temperature, and the temperature of the heater is about 34 ° C lower, so it must be adjusted The heater's set temperature or other methods are used to increase the heater's temperature by 34 ° C. In this embodiment, the difference between the diameter D10 of the pre-stretching section 110 at the liquid surface 72 and the preset diameter is proportional to the adjustment value of the temperature of the molten soup 70. In other words, as long as the diameter D10 of the pre-stretching section 110 at the liquid surface 72 is monitored, the temperature of the molten soup 70 can be known approximately. The experimental parameters for obtaining the above values include: the diameter of the body of the formed ingot is 6 inches; the lattice direction of the formed single crystal silicon is 100; the dopant of the molten soup 70 is boron; and the diameter of the crucible 60 is 18 inches.

在本實施例中,直徑D10例如是預拉段110於液面72起算高26mm處的直徑。監視以取得直徑D10的方式例如是以影像擷取方式測得,也就是利用CCD或其他元件取得預拉段110於液面72處的影像,並由電腦軟體對影像進行判讀以得出直徑D10的值。另外,判斷直徑D10與預設直徑的大小關係的方法例如是由電腦自動判斷,藉此避免人為的主觀判斷誤差。當電腦自動判斷直徑D10大於或小於預設直徑時,便可自動對加熱器加熱功率作相應的調整,而調整量可以是預先載入於電腦的資料庫中的。In this embodiment, the diameter D10 is, for example, the diameter of the pre-stretching section 110 at a height of 26 mm from the liquid surface 72. The method of monitoring to obtain the diameter D10 is, for example, the image capture method, that is, using the CCD or other components to obtain the image of the pre-stretching section 110 at the liquid surface 72, and the computer software interprets the image to obtain the diameter D10 Value. In addition, the method for determining the relationship between the diameter D10 and the preset diameter is, for example, automatically determined by a computer, thereby avoiding artificial subjective judgment errors. When the computer automatically determines that the diameter D10 is larger or smaller than the preset diameter, it can automatically adjust the heater heating power accordingly, and the adjustment amount can be pre-loaded in the database of the computer.

當監控確認預拉段110於液面72處的直徑D10保持於預設直徑時,設備就會自動地進行下一階段的動作,也就是於預拉段110下方依長晶程序形成一頸部120、一肩部130與一本體140,此為步驟S150。另外,本體140下方還可形成尾部150。根據上述可知,以本實施例的長晶方法所形成的晶棒與採用習知技術所形成的晶棒的差異在於,本實施例的長晶方法所形成的晶棒在晶種50與頸部120之間還存在預拉段110。在大部分狀況下,預拉段110的直徑在長度方向上的變化量較小,且預拉段110的直徑遠大於頸部120的直徑。由於本實施例的長晶方法包括了預拉段110的形成,因此可藉由監測預拉段110的直徑而確實掌握熔湯70與預拉段110的交界處的液面72的溫度,進而在每次長晶的過程中都控制開始形成頸部120時的液面72的溫度一致。如此一來,不僅可以提高形成頸部120時的成功率,整個晶棒的成晶率也可以提高,且每個晶棒形成時的啟始溫度一致也可獲得品質一致的晶棒,不會受到操作者的人為判斷誤差的影響。在形成頸部120時的參數例如是:晶種50的轉速為14 rpm;坩堝60的轉速為-8 rpm;頸部120的成長速度為200 mm/hr;頸部120的直徑為6 mm;頸部的長度為200 mm。When monitoring confirms that the diameter D10 of the pre-stretching section 110 at the liquid surface 72 remains at the preset diameter, the device will automatically perform the next stage of action, that is, forming a neck under the pre-stretching section 110 according to the crystal growth process 120. A shoulder 130 and a body 140. This is step S150. In addition, a tail 150 may be formed under the body 140. According to the above, the difference between the ingot formed by the growth method of this embodiment and the ingot formed by the conventional technique is that the ingot formed by the growth method of this embodiment is between the seed 50 and the neck There is also a pre-tension section 110 between 120. In most cases, the diameter of the pre-stretching section 110 changes little in the length direction, and the diameter of the pre-stretching section 110 is much larger than the diameter of the neck 120. Since the crystal growth method of this embodiment includes the formation of the pre-stretching section 110, the temperature of the liquid surface 72 at the junction of the molten soup 70 and the pre-stretching section 110 can be accurately grasped by monitoring the diameter of the pre-stretching section 110, and During each crystal growth process, the temperature of the liquid surface 72 at the time when the neck 120 starts to form is controlled to be consistent. In this way, not only can the success rate when forming the neck 120 be improved, but also the crystallization rate of the entire ingot can be increased, and the initiation temperature when each ingot is formed is the same, and the ingot with consistent quality can be obtained, not It is affected by the human judgment error of the operator. The parameters when forming the neck 120 are, for example: the rotation speed of the seed crystal 50 is 14 rpm; the rotation speed of the crucible 60 is -8 rpm; the growth speed of the neck 120 is 200 mm / hr; the diameter of the neck 120 is 6 mm; The length of the neck is 200 mm.

綜上所述,在本發明的長晶方法中,在形成頸部之前進行了預拉的步驟,因此可從預拉段的直徑準確判斷開始形成頸部的時機,進而提升晶體成晶率以及晶體品質的一致性。In summary, in the method for growing crystals of the present invention, the pre-stretching step is performed before forming the neck, so the timing of starting the neck formation can be accurately judged from the diameter of the pre-stretching section, thereby improving the crystal crystallization rate and Consistency of crystal quality.

另外,本發明的長晶方法是自動熔湯溫度控制與自動預拉調整的結合,可以達到無須人為判斷與調整溫度的自動長晶方法,並具有高的引晶成功率及穩定度。In addition, the crystal growth method of the present invention is a combination of automatic melt temperature control and automatic pre-pull adjustment, which can achieve an automatic crystal growth method without artificial judgment and temperature adjustment, and has a high success rate and stability of seeding.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed as above with examples, it is not intended to limit the present invention. Any person with ordinary knowledge in the technical field can make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention shall be subject to the scope defined in the appended patent application.

S110~S150‧‧‧步驟
40‧‧‧吊線
50‧‧‧晶種
60‧‧‧坩堝
70‧‧‧熔湯
72‧‧‧液面
80‧‧‧高溫計
110‧‧‧預拉段
120‧‧‧頸部
130‧‧‧肩部
140‧‧‧本體
150‧‧‧尾部
D10‧‧‧直徑
S110 ~ S150‧‧‧Step
40‧‧‧Suspended wire
50‧‧‧ Seed
60‧‧‧Crucible
70‧‧‧Melting soup
72‧‧‧Liquid
80‧‧‧ pyrometer
110‧‧‧Pre-stretch
120‧‧‧ Neck
130‧‧‧Shoulder
140‧‧‧Body
150‧‧‧tail
D10‧‧‧Diameter

圖1是依照本發明一實施例的長晶方法的流程圖。 圖2A至圖2D是依照本發明一實施例的長晶方法的剖面示意圖。FIG. 1 is a flowchart of a method for growing crystals according to an embodiment of the invention. 2A to 2D are schematic cross-sectional views of a method of growing crystals according to an embodiment of the invention.

S110~S150‧‧‧步驟 S110 ~ S150‧‧‧Step

Claims (8)

一種長晶方法,包括:調整一坩堝內的一熔湯的一液面的溫度到達預設的一目標溫度;使用一晶種接觸該坩堝內的該熔湯的該液面;進行預拉,使該晶種以設定的速度往上移動而離開該液面,同時監測該晶種與該液面之間所形成的一預拉段於該液面處的一直徑,當該直徑大於一預設直徑時提高該熔湯的溫度,當該直徑小於該預設直徑時降低該熔湯的溫度;以及當該預拉段於該液面處的該直徑保持於該預設直徑時,於該預拉段下方依長晶程序形成一頸部、一肩部與一本體,其中該預拉段的直徑大於該頸部的直徑。 A method for growing crystals, comprising: adjusting the temperature of a liquid surface of a molten soup in a crucible to reach a preset target temperature; using a seed crystal to contact the liquid surface of the molten soup in the crucible; performing pre-drawing, The seed crystal is moved upward at a set speed to leave the liquid surface, while monitoring a diameter of a pre-stretched section formed between the seed crystal and the liquid surface at the liquid surface, when the diameter is greater than a pre When the diameter is set, the temperature of the molten soup is increased, and when the diameter is smaller than the preset diameter, the temperature of the molten soup is lowered; and when the diameter of the pre-stretching section at the liquid surface is maintained at the preset diameter, the A neck, a shoulder and a body are formed under the pre-stretching section according to the crystal growth procedure, wherein the diameter of the pre-stretching section is larger than the diameter of the neck. 如申請專利範圍第1項所述的長晶方法,其中該預設直徑為10mm。 The crystal growth method as described in item 1 of the patent application scope, wherein the preset diameter is 10 mm. 如申請專利範圍第1項所述的長晶方法,其中該直徑是以影像擷取方式測得。 The crystal growth method as described in item 1 of the patent application, wherein the diameter is measured by image capture. 如申請專利範圍第1項所述的長晶方法,更包括以高溫計測量該液面的溫度到達一預設溫度後,才使該晶種接觸該液面。 The method of growing crystals as described in item 1 of the patent application scope further includes measuring the temperature of the liquid surface with a pyrometer to reach a preset temperature before bringing the seed crystal into contact with the liquid surface. 如申請專利範圍第4項所述的長晶方法,其中該預設溫度為1450℃。 The crystal growth method as described in item 4 of the patent application range, wherein the preset temperature is 1450 ° C. 如申請專利範圍第1項所述的長晶方法,其中該直徑與該預設直徑的差值相對該熔湯的溫度的調整值成正比。 The crystal growth method as described in item 1 of the patent application range, wherein the difference between the diameter and the preset diameter is proportional to the adjustment value of the temperature of the molten soup. 如申請專利範圍第1項所述的長晶方法,其中該晶種為單晶種。 The method of growing crystals as described in item 1 of the patent application, wherein the seed crystal is a single crystal seed. 如申請專利範圍第1項所述的長晶方法,其中判斷該直徑與該預設直徑的大小關係的方法是由電腦自動判斷。 The crystal growth method as described in item 1 of the patent application scope, wherein the method for determining the relationship between the diameter and the preset diameter is automatically determined by a computer.
TW105111429A 2016-04-13 2016-04-13 Automatic crystal growth method with high success rate TWI613334B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW105111429A TWI613334B (en) 2016-04-13 2016-04-13 Automatic crystal growth method with high success rate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW105111429A TWI613334B (en) 2016-04-13 2016-04-13 Automatic crystal growth method with high success rate

Publications (2)

Publication Number Publication Date
TW201736649A TW201736649A (en) 2017-10-16
TWI613334B true TWI613334B (en) 2018-02-01

Family

ID=61021764

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105111429A TWI613334B (en) 2016-04-13 2016-04-13 Automatic crystal growth method with high success rate

Country Status (1)

Country Link
TW (1) TWI613334B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109576780A (en) * 2018-12-28 2019-04-05 宁夏隆基硅材料有限公司 A kind of seed crystal welding process and equipment
CN110363398B (en) * 2019-06-24 2022-05-24 内蒙古中环协鑫光伏材料有限公司 Automatic overheating process

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100319612A1 (en) * 2009-06-22 2010-12-23 Sumco Corporation Method of producing silicon single crystal

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100319612A1 (en) * 2009-06-22 2010-12-23 Sumco Corporation Method of producing silicon single crystal

Also Published As

Publication number Publication date
TW201736649A (en) 2017-10-16

Similar Documents

Publication Publication Date Title
JP6583142B2 (en) Method and apparatus for producing silicon single crystal
CN104278321B (en) Silicon single crystal and method for manufacture thereof
JP4929817B2 (en) Method for measuring distance between reference reflector and melt surface, method for controlling melt surface position using the same, and apparatus for producing silicon single crystal
TW202016366A (en) Control method, device and system for growing crystal and computer storage medium
JP4380537B2 (en) Method for producing silicon single crystal
CN107109687A (en) The crystal growth system and method for ingot interface shape can be controlled
JP6015634B2 (en) Method for producing silicon single crystal
TWI613334B (en) Automatic crystal growth method with high success rate
JP5145721B2 (en) Method and apparatus for producing silicon single crystal
KR101862157B1 (en) Method and apparatus for manufacturing silicon monocrystalline ingot
JP5088338B2 (en) Method of pulling silicon single crystal
TW202113167A (en) Scalmgo4 single crystal, preparation method for same, and free-standing substrate
KR101540863B1 (en) Apparatus for controlling diameter of single crystal ingot and Ingot growing apparatus having the same and method thereof
TWI785889B (en) Method for estimating oxygen concentration of silicon single crystal, method for manufacturing silicon single crystal, and device for manufacturing silicon single crystal
JP5716689B2 (en) Silicon single crystal manufacturing method and silicon single crystal manufacturing apparatus
KR101277396B1 (en) A Ingot Growing Controller
JP5293625B2 (en) Silicon single crystal manufacturing method and silicon single crystal manufacturing apparatus
JP2007308335A (en) Method for pulling single crystal
JP2016013957A (en) Point defect concentration calculation method, grown-in defect calculation method, grow-in defect in-plane distribution calculation method, and silicon single crystal manufacturing method using said methods
KR101540235B1 (en) Apparutus and Method for Manufacturing Single Crystal Ingot
JP2021042095A (en) Method for manufacturing silicon single crystal
JP5182234B2 (en) Method for producing silicon single crystal
KR20140023517A (en) Apparatus and method for growing single crystal silicon ingots
JP6390502B2 (en) Single crystal cooling method and manufacturing method
JP6354643B2 (en) Method for producing silicon single crystal