TWI609989B - Gas distributing injector applied in mocvd reactor - Google Patents

Gas distributing injector applied in mocvd reactor Download PDF

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TWI609989B
TWI609989B TW105133227A TW105133227A TWI609989B TW I609989 B TWI609989 B TW I609989B TW 105133227 A TW105133227 A TW 105133227A TW 105133227 A TW105133227 A TW 105133227A TW I609989 B TWI609989 B TW I609989B
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gas
passage
passages
shaped body
gas passage
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TW105133227A
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TW201738408A (en
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林伯融
陳哲霖
蔡長達
鍾步青
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漢民科技股份有限公司
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Abstract

本發明相關於一種應用於化學氣相沈積裝置的氣體分流噴頭,該氣體分流噴頭包含至少一單層結構的氣體分流層,用以對各種氣體進行分流。此氣體分流層包含一圓盤狀主體、複數條第一氣體通道、複數條第二氣體通道、以及複數條第三氣體通道,其中,第一氣體通道、第二氣體通道、以及第三氣體通道以放射狀排列於圓盤狀主體中的同一水平面,用以供不同的氣體通過,而將不同的氣體經由不同的氣體通道於同一平面橫向注入化學氣相沈積裝置。藉此,本發明之氣體分流噴頭可以單層結構進行氣體分流。The present invention relates to a gas split nozzle for use in a chemical vapor deposition apparatus, the gas split nozzle comprising at least one gas layer of a single layer structure for splitting various gases. The gas distribution layer comprises a disk-shaped body, a plurality of first gas channels, a plurality of second gas channels, and a plurality of third gas channels, wherein the first gas channel, the second gas channel, and the third gas channel Radially arranged in the same horizontal plane in the disc-shaped body for different gases to pass, and different gases are injected laterally into the chemical vapor deposition apparatus in the same plane via different gas passages. Thereby, the gas splitting nozzle of the present invention can perform gas splitting in a single layer structure.

Description

應用於化學氣相沈積裝置的氣體分流噴頭Gas split nozzle for chemical vapor deposition equipment

本發明相關於一種應用於化學氣相沈積裝置的氣體分流噴頭,特別是有關一種其內每一單層都具有氣體分流與側向注氣功能的氣體分流噴頭。The present invention relates to a gas split nozzle for use in a chemical vapor deposition apparatus, and more particularly to a gas split nozzle having a gas split and a side gas injection function for each single layer therein.

在電子元件與光電元Z件的製程中,經常需要以有機金屬化學氣相沈積(MOCVD)技術於基板或晶圓上製作薄膜,通常藉由一噴頭(injector)將Ⅲ族氣體與Ⅴ族氣體通入一行星式有機金屬化學氣相沈積反應器(planetary MOCVD reactor)中,而製作Ⅲ族-Ⅴ族化合物半導體薄膜(例如GaN、AlN等)。在進行此一Ⅲ族-Ⅴ族化合物半導體薄膜製作時,行星式有機金屬化學氣相沈積反應器(planetary MOCVD reactor)所使用的氣體噴頭通常採用一三重噴頭(triple injector)的設計。參照第一圖,其為習知採用三重噴頭(triple injector)設計的噴頭10的側視圖。噴頭10主要由上管12、中管14、以及下管16等三個不同水平的氣體管道由上至下排列而組成,氫氣(H 2)或氮氣(N 2)為三個通道的運載氣體(carrier gas)。其中,Ⅴ族氣體(例如氨氣(NH 3))由上管12與下管16射出,Ⅲ族氣體(例如三甲基鎵(TMGa)、三甲基鋁(TMAl))則由中管14射出,Ⅲ族氣體與Ⅴ族氣體則在基板(或晶圓)18放置的區域相遇並產生化學反應,而沈積出一Ⅲ族-Ⅴ族化合物半導體薄膜於基板(或晶圓)18的表面上。 In the process of electronic components and photovoltaic elements, it is often necessary to fabricate thin films on substrates or wafers by metalorganic chemical vapor deposition (MOCVD) techniques, usually by using an injector to inject a group III gas with a group V gas. A group III-V compound semiconductor thin film (for example, GaN, AlN, etc.) is formed by being introduced into a planetary organic metal chemical vapor deposition reactor (planetary MOCVD reactor). In the fabrication of such a Group III-V compound semiconductor thin film, a gas nozzle used in a planetary organic metal chemical vapor deposition reactor (planetary MOCVD reactor) is usually designed with a triple injector. Referring to the first figure, it is a side view of a conventional dispensing head 10 designed with a triple injector. The nozzle 10 is mainly composed of three different levels of gas pipes, such as the upper tube 12, the middle tube 14, and the lower tube 16, which are arranged from top to bottom. Hydrogen (H 2 ) or nitrogen (N 2 ) is a carrier gas of three channels. (carrier gas). Wherein, the group V gas (for example, ammonia gas (NH 3 )) is emitted from the upper tube 12 and the lower tube 16, and the group III gas (for example, trimethylgallium (TMGa), trimethylaluminum (TMAl)) is taken from the middle tube 14 The III group gas and the group V gas meet at a region where the substrate (or wafer) 18 is placed and chemically react, and a group III-V compound semiconductor film is deposited on the surface of the substrate (or wafer) 18. .

由於習知噴頭10由於要對不同的氣體進行分流,所以必需要採取將上管12、中管14、以及下管16垂直堆疊的多層結構設計,才能將不同的氣體進行縱向的分流,而由不同高度的水平面噴入有機金屬化學氣相沈積反應器(MOCVD reactor)中,所以在體積上無法進一步縮減,並且由於不同的反應氣體由不同的高度(或水平面)噴出,導致各種反應氣體除了需要經過一定時間橫向擴散之外,同時還需要經過一定時間的縱向擴散,才能使各個反應氣體均勻地分佈於反應室中而產生反應,而沈積形成一均勻的Ⅲ族-Ⅴ族化合物半導體薄膜。Since the conventional nozzle 10 is required to split different gases, it is necessary to adopt a multi-layer structure design in which the upper tube 12, the middle tube 14, and the lower tube 16 are vertically stacked, so that different gases can be longitudinally shunted. The horizontal planes of different heights are injected into the organic metal chemical vapor deposition reactor (MOCVD reactor), so they cannot be further reduced in volume, and since different reaction gases are ejected from different heights (or horizontal planes), various reaction gases are required in addition to In addition to the lateral diffusion for a certain period of time, it is also necessary to perform longitudinal diffusion for a certain period of time, so that each reaction gas is uniformly distributed in the reaction chamber to generate a reaction, and a uniform III-V compound semiconductor thin film is deposited.

有鑑於此,亟需要一種可以在單層結構內進行氣體分流而讓各種反應氣體由同一水平面噴出並擴散混合的噴頭,而可以縮減噴頭體積與反應氣體擴散的時間。In view of this, there is a need for a nozzle that can perform gas splitting in a single-layer structure to allow various reaction gases to be ejected and diffused and mixed from the same horizontal plane, thereby reducing the volume of the nozzle and the time during which the reaction gas diffuses.

本發明之一目的為解決機金屬化學氣相沈積(MOCVD)反應器的習知噴頭的缺點,而提供一種應用於化學氣相沈積裝置的氣體分流噴頭,該氣體分流噴頭經由單層結構即可以對各種不同的反應氣體進行分流,而由同一水平面側向噴出,而縮短各種反應氣體於反應室內均勻擴散所需的時間,並進一步縮減噴頭的體積,特別是縮減縱向的長度或體積。One of the objects of the present invention is to solve the disadvantages of the conventional showerhead of a metal-metal chemical vapor deposition (MOCVD) reactor, and to provide a gas split nozzle for a chemical vapor deposition apparatus, which can be passed through a single-layer structure. The different reaction gases are split and sprayed laterally from the same horizontal plane to shorten the time required for the various reaction gases to uniformly diffuse in the reaction chamber, and further reduce the volume of the nozzle, especially the length or volume in the longitudinal direction.

根據本發明之一目的,本發明提供一種應用於化學氣相沈積裝置的氣體分流噴頭,該氣體分流噴頭由一單層的氣體分流層所組成,而該氣體分流層用以分流不同的氣體而將其由同一水平面側向噴出,該氣體分流層包含一圓盤狀主體、複數條第一氣體通道、複數條第二氣體通道、以及複數條第三氣體通道。圓盤狀主體的中心位置具有一圓形開孔而做為一中央供氣道,用以容置一佈氣裝置以及供氣體通行,經由該佈氣裝置將不同的(反應)氣體分別分配到第一氣體通道、第二氣體通道、以及第三氣體通道中以進行氣體分流。無論是第一(反應)氣體、第二(反應)氣體、第三(反應)氣體都可以採取適當的運載氣體,例如氫氣(H 2)、氮氣(N 2)等等,而運載不同的(反應)氣體通行第一氣體通道、第二氣體通道、及第三氣體通道而進入反應室中。第一氣體通道由圓盤狀主體的中心位置向圓盤狀主體的周邊(或圓周方向)延伸而呈放射狀排列,用以將第一氣體(即Ⅲ族氣體)由圓盤狀主體的中心位置向圓盤狀主體的周邊輸送,而橫向噴出。第二氣體通道由圓盤狀主體的中心位置向圓盤狀主體的周邊(或圓周方向)延伸而呈放射狀排列,用以將第二氣體(即Ⅴ族氣體)由圓盤狀主體的中心位置向圓盤狀主體的周邊輸送,而橫向噴出。第三氣體通道由圓盤狀主體的中心位置向圓盤狀主體的周邊(或圓周方向)延伸而呈放射狀排列,用以將第三氣體(即Ⅴ族氣體)由圓盤狀主體的中心位置向圓盤狀主體的周邊輸送,而橫向噴出。該等第一氣體通道、該等第二氣體通道、以及該等第三氣體通道皆對稱分佈於圓盤狀主體內的同一水平面上。藉由第一氣體通道、該等第二氣體通道、以及該等第三氣體通道,可以單層結構取代習知的多層結構(即三重噴頭的設計)而對不同的(反應)氣體進行分流,即可以經由不同氣體通道於同一水平面上輸送不同的(反應)氣體而橫向由噴頭(或氣體分流層)噴出,以縮短各種反應氣體於反應室內均勻擴散所需的時間以及噴頭的體積(特別是縮減縱向的長度或體積)。 According to one aspect of the present invention, there is provided a gas split nozzle for use in a chemical vapor deposition apparatus, the gas split nozzle comprising a single layer of gas split layer for diverting different gases. It is laterally ejected from the same horizontal plane. The gas split layer comprises a disc-shaped body, a plurality of first gas passages, a plurality of second gas passages, and a plurality of third gas passages. The central position of the disc-shaped body has a circular opening as a central air supply passage for accommodating a gas distribution device and for gas passage, through which different (reaction) gases are respectively distributed to the first A gas passage, a second gas passage, and a third gas passage are used to perform gas splitting. Either the first (reaction) gas, the second (reaction) gas, and the third (reaction) gas may take appropriate carrier gases, such as hydrogen (H 2 ), nitrogen (N 2 ), etc., and carry different ( The reaction gas passes through the first gas passage, the second gas passage, and the third gas passage into the reaction chamber. The first gas passage is radially arranged from a central position of the disc-shaped body toward a periphery (or a circumferential direction) of the disc-shaped body for arranging the first gas (ie, the group III gas) from the center of the disc-shaped body The position is conveyed to the periphery of the disc-shaped body and is ejected laterally. The second gas passage is radially arranged from a central position of the disc-shaped body toward a periphery (or a circumferential direction) of the disc-shaped body for arranging the second gas (ie, the group V gas) from the center of the disc-shaped body The position is conveyed to the periphery of the disc-shaped body and is ejected laterally. The third gas passage is radially arranged from a central position of the disc-shaped body toward a periphery (or a circumferential direction) of the disc-shaped body for using a third gas (ie, a group V gas) from the center of the disc-shaped body The position is conveyed to the periphery of the disc-shaped body and is ejected laterally. The first gas passages, the second gas passages, and the third gas passages are symmetrically distributed on the same horizontal plane within the disc-shaped body. By the first gas passage, the second gas passages, and the third gas passages, a single layer structure can be used to replace the different (reacted) gas by substituting a conventional multilayer structure (ie, a triple nozzle design). That is, different (reaction) gases can be transported on the same horizontal plane through different gas passages and sprayed laterally by the spray head (or gas split layer) to shorten the time required for the uniform diffusion of various reaction gases in the reaction chamber and the volume of the nozzle (especially Reduce the length or volume of the portrait).

因此,本發明提供了一種應用於化學氣相沈積裝置的氣體分流噴頭,其以單層結構即可以進行(反應)氣體分流而將其由同一水平面側向噴出,而不需以多層結構(即三重噴頭設計)進行氣體流,從而可以縮短各種反應氣體於反應室內均勻擴散所需的時間與縮減噴頭的體積(特別是縮減縱向的長度或體積)。Accordingly, the present invention provides a gas splitting nozzle for use in a chemical vapor deposition apparatus which can perform a (reaction) gas splitting and laterally ejecting it from the same horizontal plane without a multi-layer structure (ie, The triple nozzle design) performs a gas flow, thereby shortening the time required for the uniform diffusion of various reaction gases in the reaction chamber and reducing the volume of the nozzle (especially reducing the length or volume in the longitudinal direction).

本發明的一些實施例詳細描述如下。然而,除了該詳細描述外,本發明還可以廣泛地在其他的實施例施行。亦即,本發明的範圍不受已提出之實施例的限制,而以本發明提出之申請專利範圍為準。其次,當本發明之實施例圖示所示之應用於化學氣相沈積裝置的氣體分流噴頭中的各種組成元件(例如氣體分流層、氣體通道)以單一元件描述說明時,不應以此作為有限定的認知,即如下之說明未特別強調數目上的限制時,本發明之精神與應用範圍可推及多數個組成元件並存的結構上。再者,在本說明書中,實施例圖示所示之應用於化學氣相沈積裝置的氣體分流噴頭中的各種組成元件元件(例如氣體分流層、氣體通道)之不同部分並沒有完全依照尺寸繪圖,某些尺度與其他相關尺度相比或有被誇張或是簡化,以提供更清楚的描述以增進對本發明的理解。而本發明所沿用的現有技藝,在此僅做重點式的引用,以助本發明的闡述。Some embodiments of the invention are described in detail below. However, the present invention may be widely practiced in other embodiments in addition to the detailed description. That is, the scope of the present invention is not limited by the embodiments of the present invention, and the scope of the patent application proposed by the present invention shall prevail. Secondly, when the various constituent elements (for example, the gas split layer, the gas passage) in the gas splitting nozzle of the chemical vapor deposition apparatus shown in the embodiment of the present invention are described by a single element, they should not be used as There is a limited recognition that the spirit and scope of the present invention can be applied to a structure in which a plurality of constituent elements coexist when the following description does not particularly emphasize the limitation of the number. Furthermore, in the present specification, different parts of various constituent element elements (for example, gas split layers, gas passages) used in the gas splitting nozzle of the chemical vapor deposition apparatus shown in the embodiment are not completely drawn according to the size. Certain scales may be exaggerated or simplified as compared to other related scales to provide a clearer description to enhance the understanding of the invention. The prior art of the present invention, which is used in the prior art, is only referred to herein by reference.

參照第二圖,其為本發明之一實施例之應用於化學氣相沈積裝置的氣體分流噴頭100之俯視圖與側視圖,左圖(即靠近讀者左手邊的圖示)為俯視圖,而右圖(即靠近讀者右手邊的圖示)為側視圖。氣體分流噴頭100包含一氣體分流層102,而由該氣體分流層102所組成。氣體分流層102為一可以分流不同的(反應)氣體而將所有經分流的(反應)氣體由同一水平面側向噴出的單層結構。氣體分流層102包含一圓盤狀主體104(或是氣體分流層102本身即為一圓盤狀主體104)、數條用以分流與輸送第一(反應)氣體的第一氣體通道108、數條用以分流與輸送第二(反應)氣體的第二氣體通道110、以及數條用以分流與輸送第三(反應)氣體的第三氣體通道112。圓盤狀主體104(或是氣體分流層102)的中央位置具有一圓形開孔106做為一中央供氣道,用以容置一佈氣裝置(圖中未示)以及供各種(反應)氣體(例如第一(反應)氣體、第二(反應)氣體、第三(反應)氣體等等)通行,其中,藉由佈氣裝置可將不同的(反應)氣體佈氣或輸送至特定的氣體通道中,例如第一氣體通道、第二氣體通道、及第三氣體通道。由於佈氣裝置並非為本發明的重點,因此於本文中並不對其詳加說明與限定,任何可以達成氣體分流的佈氣裝置皆可以應用於本發明氣體分流噴頭。Referring to the second drawing, which is a top view and a side view of a gas splitting nozzle 100 applied to a chemical vapor deposition apparatus according to an embodiment of the present invention, the left drawing (ie, the drawing near the left hand side of the reader) is a top view, and the right drawing is shown. (ie, close to the right hand side of the reader) is a side view. The gas split nozzle 100 includes a gas split layer 102 and is comprised of the gas split layer 102. The gas distribution layer 102 is a single layer structure that can split different (reaction) gases and laterally eject all of the split (reaction) gases from the same horizontal plane. The gas distribution layer 102 includes a disk-shaped body 104 (or the gas distribution layer 102 itself is a disk-shaped body 104), and a plurality of first gas passages 108 for dividing and delivering the first (reaction) gas. A second gas passage 110 for diverting and transporting the second (reaction) gas, and a plurality of third gas passages 112 for diverting and transporting the third (reaction) gas. The central position of the disc-shaped body 104 (or the gas distribution layer 102) has a circular opening 106 as a central air supply passage for accommodating a gas distribution device (not shown) and for various (reaction) A gas (for example, a first (reaction) gas, a second (reaction) gas, a third (reaction) gas, etc.) is passed through, wherein a different (reactive) gas can be gas or transported to a specific one by means of a gas distribution device In the gas passage, for example, the first gas passage, the second gas passage, and the third gas passage. Since the air distribution device is not the focus of the present invention, it is not specifically described and limited herein, and any gas distribution device that can achieve gas splitting can be applied to the gas split nozzle of the present invention.

這些第一氣體通道108以圓盤狀主體104的中心位置做為中心,而由圓盤狀主體104的中心位置向圓盤狀主體104的周邊(即圓盤狀主體104的圓周方向)放射狀延伸,而橫向貫通圓盤狀主體104(或氣體分流層102),而以圓盤狀主體104的中心位置做為中心呈一放射狀排列。每一第一氣體通道108在圓盤狀主體104的中心位置具有一氣體入口,而在圓盤狀主體104的周邊(即圓盤狀主體104的圓周或側邊)具有一氣體出口。第一氣體通道108係用以供第一(反應)氣體通行於其中,由氣體入口進入,而由氣體出口噴出,藉此,將第一(反應)氣體由圓盤狀主體104的中心位置向圓盤狀主體104的周邊輸送,並由圓盤狀主體104的周邊橫向(或側向)噴出,而以一放射狀噴射的方式將第一(反應)氣體提供給有機金屬化學氣相反應器。第二氣體通道110同樣以圓盤狀主體104的中心位置做為中心,而由圓盤狀主體104的中心位置向圓盤狀主體104的周邊(即圓盤狀主體104的圓周方向)放射狀延伸,而橫向貫通圓盤狀主體104(或氣體分流層102),而以圓盤狀主體104的中心位置做為中心呈一放射狀排列。每一第二氣體通道110在圓盤狀主體104的中心位置具有一氣體入口,而在圓盤狀主體104的周邊(即圓盤狀主體104的圓周或側邊)具有一氣體出口。第二氣體通道110係用以供第二(反應)氣體通行於其中,由氣體入口進入,而由氣體出口噴出,藉此,將第二(反應)氣體由圓盤狀主體104的中心位置向圓盤狀主體104的周邊輸送,並由圓盤狀主體104的周邊橫向(或側向)噴出,而以一放射狀噴射的方式將第二(反應)氣體提供給有機金屬化學氣相反應器。第三氣體通道112也以圓盤狀主體104的中心位置做為中心,而由圓盤狀主體104的中心位置向圓盤狀主體104的周邊(即圓盤狀主體104的圓周方向)放射狀延伸,而橫向貫通圓盤狀主體104(或氣體分流層102),而以圓盤狀主體104的中心位置做為中心呈一放射狀排列。每一第三氣體通道112在圓盤狀主體104的中心位置具有一氣體入口,而在圓盤狀主體104的周邊(即圓盤狀主體104的圓周或側邊)具有一氣體出口。第三氣體通道112係用以供第三(反應)氣體通行於其中,由氣體入口進入,而由氣體出口噴出,藉此,將第三(反應)氣體由圓盤狀主體104的中心位置向圓盤狀主體104的周邊輸送,並由圓盤狀主體104的周邊橫向(或側向)噴出,而以一放射狀噴射的方式將第三(反應)氣體提供給有機金屬化學氣相反應器。These first gas passages 108 are centered on the center position of the disk-shaped body 104, and are radially displaced from the center position of the disk-shaped body 104 toward the periphery of the disk-shaped body 104 (i.e., the circumferential direction of the disk-shaped body 104). The disk extends through the disk-shaped body 104 (or the gas distribution layer 102) in a radial direction and is arranged radially around the center of the disk-shaped body 104. Each of the first gas passages 108 has a gas inlet at a central position of the disc-shaped body 104, and has a gas outlet at the periphery of the disc-shaped body 104 (i.e., the circumference or side of the disc-shaped body 104). The first gas passage 108 is configured to allow the first (reaction) gas to pass therethrough, enter from the gas inlet, and be ejected from the gas outlet, whereby the first (reactive) gas is directed from the center of the disc-shaped body 104 The periphery of the disc-shaped body 104 is transported and ejected laterally (or laterally) by the periphery of the disc-shaped body 104, and the first (reaction) gas is supplied to the organometallic chemical vapor phase reactor in a radial spray manner. . The second gas passage 110 is also centered on the center position of the disk-shaped body 104, and is radially displaced from the center position of the disk-shaped body 104 toward the periphery of the disk-shaped body 104 (i.e., the circumferential direction of the disk-shaped body 104). The disk extends through the disk-shaped body 104 (or the gas distribution layer 102) in a radial direction and is arranged radially around the center of the disk-shaped body 104. Each of the second gas passages 110 has a gas inlet at a central position of the disc-shaped body 104, and has a gas outlet at the periphery of the disc-shaped body 104 (i.e., the circumference or side of the disc-shaped body 104). The second gas passage 110 is configured to allow the second (reaction) gas to pass therethrough, enter from the gas inlet, and be ejected from the gas outlet, whereby the second (reaction) gas is directed from the center of the disc-shaped body 104 The periphery of the disc-shaped body 104 is conveyed and ejected laterally (or laterally) from the periphery of the disc-shaped body 104, and the second (reaction) gas is supplied to the organometallic chemical vapor phase reactor in a radial spray manner. . The third gas passage 112 is also centered on the center position of the disk-shaped body 104, and is radially displaced from the center position of the disk-shaped body 104 toward the periphery of the disk-shaped body 104 (i.e., the circumferential direction of the disk-shaped body 104). The disk extends through the disk-shaped body 104 (or the gas distribution layer 102) in a radial direction and is arranged radially around the center of the disk-shaped body 104. Each of the third gas passages 112 has a gas inlet at a center position of the disc-shaped body 104, and has a gas outlet at the periphery of the disc-shaped body 104 (i.e., the circumference or side of the disc-shaped body 104). The third gas passage 112 is configured to allow a third (reaction) gas to pass therethrough, enter from the gas inlet, and be ejected from the gas outlet, whereby the third (reaction) gas is directed from the center of the disc-shaped body 104 The periphery of the disc-shaped body 104 is conveyed and ejected laterally (or laterally) by the periphery of the disc-shaped body 104, and the third (reaction) gas is supplied to the organometallic chemical vapor phase reactor in a radial spray manner. .

這些第一氣體通道108、第二氣體通道110、以及第三氣體通道112不但皆成放射狀排列於圓盤狀主體104(或氣體分流層102)中,並且都以對稱排列的方式設置於圓盤狀主體104內的同一水平面上,所以這些氣體通道都呈現一放射狀的對稱分佈排列同一水平面,而使得圓盤狀主體104(或氣體分流層102)維持在一單層結構。其中,第一(反應)氣體為Ⅲ族氣體,例如例如三甲基鎵(TMGa)、三甲基鋁(TMAl)等,而第二(反應)氣體與第三(反應)氣體皆為Ⅴ族氣體(例如氨氣(NH 3))。在製作Ⅲ族-Ⅴ族化合物半導體薄膜時,依照製程的需求與條件,第二(反應)氣體與第三(反應)氣體可以為不同的Ⅴ族氣體,即第二氣體通道與第三氣體通道可以通行或輸送不同的Ⅴ族氣體進入反應室中,或是,第二(反應)氣體與第三(反應)氣體可以為相同的Ⅴ族氣體,即第二氣體通道與第三氣體通道可以通行或輸送相同的Ⅴ族氣體進入反應室中。此外,第二(反應)氣體與第三(反應)氣體可以為不同流量的Ⅴ族氣體,即第二氣體通道與第三氣體通道可以通行或輸送不同流量的Ⅴ族氣體進入反應室中,或是,第二(反應)氣體與第三(反應)氣體可以為相同流量的Ⅴ族氣體,即第二氣體通道與第三氣體通道可以通行或輸送相同流量的Ⅴ族氣體進入反應室中。無論是第一(反應)氣體、第二(反應)氣體、第三(反應)氣體都可以採取適當的運載氣體,例如氫氣(H 2)、氮氣(N 2)等等,而運載各種不同的(反應)氣體通行第一氣體通道、第二氣體通道、及第三氣體通道而進入反應室中。 The first gas passage 108, the second gas passage 110, and the third gas passage 112 are not only radially arranged in the disc-shaped body 104 (or the gas split layer 102), but are arranged in a circular arrangement in a circular manner. The disk-shaped body 104 is on the same horizontal plane, so that the gas passages are arranged in a radial symmetrical distribution on the same horizontal plane, so that the disk-shaped body 104 (or the gas-split layer 102) is maintained in a single-layer structure. Wherein, the first (reaction) gas is a group III gas, such as, for example, trimethylgallium (TMGa), trimethylaluminum (TMAl), etc., and the second (reaction) gas and the third (reaction) gas are both V groups. Gas (eg ammonia (NH 3 )). When the III-V compound semiconductor film is fabricated, the second (reaction) gas and the third (reaction) gas may be different V group gases, that is, the second gas channel and the third gas channel, according to the requirements and conditions of the process. It is possible to pass or transport different Group V gases into the reaction chamber, or the second (reaction) gas and the third (reaction) gas may be the same Group V gas, that is, the second gas passage and the third gas passage may pass. Or deliver the same Group V gas into the reaction chamber. In addition, the second (reaction) gas and the third (reaction) gas may be different flow rate of the group V gas, that is, the second gas channel and the third gas channel may pass or transport different amounts of the group V gas into the reaction chamber, or Yes, the second (reaction) gas and the third (reaction) gas may be the same flow rate of the group V gas, that is, the second gas passage and the third gas passage may pass or deliver the same amount of the group V gas into the reaction chamber. Either the first (reaction) gas, the second (reaction) gas, and the third (reaction) gas may take appropriate carrier gases, such as hydrogen (H 2 ), nitrogen (N 2 ), etc., and carry various The (reaction) gas passes through the first gas passage, the second gas passage, and the third gas passage into the reaction chamber.

參照第二圖,在氣體分流噴頭100中,每一第二氣體通道110皆被夾於兩相鄰的第一氣體通道108中,而每一第三氣體通道112也被夾於兩相鄰的第一氣體通道108中,亦即每兩相鄰的第一氣體通道都會夾有一個第二氣體通道110或是一第三氣體通道112。再者,在氣體分流噴頭100(或氣體分流層102)中的氣體通道排列係以第一氣體通道108、第二氣體通道110、第一氣體通道108、第三氣體通道112此一排列順序為一週期,而循環排列於氣體分流層102中,或者也可以第一氣體通道108、第三氣體通道112、第一氣體通道108、第二氣體通道110此一排列順序為一週期而循環排列。雖然,第二圖所示之氣體分流噴頭100僅畫出12條第一氣體通道108、6條第二氣體通道110、以及6條第三氣體通道112,但是並不以此為限,而是可以依照需求而增減,而這些氣體通道的增減都屬於本發明之簡單變化,所以應屬於本發明專利保護之範疇。再者,雖然在氣體分流噴頭100中,兩相鄰的第一氣體通道都會夾有一個第二氣體通道110或是一第三氣體通道112,但是並不以此為限,而是可以依照需求增加兩相鄰的第一氣體通道108所夾的第二氣體通道110數量或第三氣體通道112數量,只要符合兩相鄰的第一氣體通道夾有至少一第二氣體通道或至少一第三氣體通道此一原則,即符合第二圖所示之實施例所展的設計原理,就屬於本發明第二圖所示之實施例的簡單變化,而應屬於本發明之專利範圍。Referring to the second figure, in the gas splitting nozzle 100, each of the second gas passages 110 is sandwiched between two adjacent first gas passages 108, and each of the third gas passages 112 is also sandwiched between two adjacent ones. A second gas passage 110 or a third gas passage 112 is sandwiched between the first gas passages 108, that is, every two adjacent first gas passages. Furthermore, the gas passages in the gas splitting nozzle 100 (or the gas splitting layer 102) are arranged in the order of the first gas passage 108, the second gas passage 110, the first gas passage 108, and the third gas passage 112. One cycle is circulated in the gas distribution layer 102, or the first gas channel 108, the third gas channel 112, the first gas channel 108, and the second gas channel 110 may be arranged in a cycle in a cycle. Although the gas splitting nozzle 100 shown in the second figure only draws 12 first gas passages 108, 6 second gas passages 110, and 6 third gas passages 112, it is not limited thereto, but It can be increased or decreased according to the demand, and the increase or decrease of these gas passages is a simple change of the present invention, and therefore belongs to the scope of patent protection of the present invention. Furthermore, in the gas splitting nozzle 100, two adjacent first gas passages may have a second gas passage 110 or a third gas passage 112, but not limited thereto, but may be required according to requirements. Increasing the number of the second gas passages 110 or the third gas passages 112 sandwiched between the two adjacent first gas passages 108 as long as the two adjacent first gas passages are sandwiched by at least one second gas passage or at least a third The principle of the gas passage, that is, the design principle exhibited by the embodiment shown in the second drawing, is a simple change of the embodiment shown in the second drawing of the present invention, and should fall within the scope of the patent of the present invention.

當各種(反應)氣體,例如第一(反應)氣體、第二(反應)氣體、第三(反應)氣體,通入氣體分流噴頭100時,佈氣裝置(圖中未示)會將不同種類的(反應)氣體分別佈氣或輸送至氣體分流噴頭100(或氣體分流層102)中不同種類的氣體通道中,並依照所需要的流量與流速,分別調整各個不同種類的氣體通道中通行的(反應)氣體的流量與流速,甚至分別調節不同氣體通道中通行的(反應)氣體的流量與流速,例如調整同一種類的氣體通道中的(反應)氣體以相同的流量與流速通行,或是調整同一種類的氣體通道中的(反應)氣體以不同的流量與流速通行。舉例來說,佈氣裝置會將第一(反應)氣體佈氣(或輸送)至各個第一氣體通道108,並依照製程需求調整其流量與流速,將第二(反應)氣體佈氣(或輸送)至各個第二氣體通道110,並依照製程需求調整其流量與流速,而將第三(反應)氣體佈氣(或輸送)至各個第三氣體通道112,並依照製程需求調整其流量與流速。由於所有的氣體通道(包含第一氣體通道108、第二氣體通道110、及第三氣體通道112)在氣體分流層102(或圓盤狀主體)104中並不相互連通,所以各種不同的(反應)氣體在氣體分流層102(或圓盤狀主體104)並不會彼此混雜,即未由氣體分流噴頭100噴出時並不會彼此混雜。由於第一氣體通道108、第二氣體通道110、及第三氣體通道112都設置在氣體分流層102(或圓盤狀主體104)此一單層結構的同一平面上,所以第一(反應)氣體、第二(反應)氣體、以及第三(反應)氣體都會以氣體分流噴頭100(氣體分流層102)為中心,於同一平面以放射狀方式由氣體分流噴頭100(氣體分流層102)的周邊(或側邊)噴出,而進入反應室中,並於反應室中橫向擴散後,各個(反應)氣體會相遇產生反應而進行化合物半導體薄膜沈積。藉此,氣體分流噴頭100以一單層結構取代傳習知噴頭的多層結構(即三重噴頭設計)即可以達成氣體分流的功能,所以不需採取多層結構,仍然可以有效地進行氣體分流,且由於經過分流的各種(反應)氣體由同一層(即氣體分流層102或圓盤狀主體104)的側邊(或周邊)噴出,亦即經過分流的各種(反應)氣體由同一平面橫向(或側向)噴出,所以各種(反應)氣體僅需要在同一平面上經過一段時間的擴散即可以相遇而產生反應,而不需要還要進行縱向的擴散才能相遇,所以可以縮減製程的時間。When various (reactive) gases, such as a first (reaction) gas, a second (reaction) gas, and a third (reaction) gas, are introduced into the gas splitting nozzle 100, the gas distribution device (not shown) will be of different kinds. The (reaction) gases are separately vented or transported to different types of gas passages in the gas splitting nozzle 100 (or gas splitting layer 102), and the respective different types of gas passages are respectively adjusted according to the required flow rate and flow rate. (reaction) the flow rate and flow rate of the gas, and even adjust the flow rate and flow rate of the (reaction) gas passing through the different gas passages, for example, adjusting the (reaction) gas in the same type of gas passage to pass the same flow rate and flow rate, or The (reaction) gas in the same type of gas passage is adjusted to pass at different flow rates and flow rates. For example, the gas distribution device will gas (or transport) the first (reaction) gas to each of the first gas passages 108, and adjust the flow rate and flow rate according to the process requirements, and distribute the second (reaction) gas (or Conveying) to each of the second gas passages 110, and adjusting the flow rate and flow rate according to the process requirements, and distributing (or conveying) the third (reaction) gas to each of the third gas passages 112, and adjusting the flow rate according to the process requirements. Flow rate. Since all of the gas passages (including the first gas passage 108, the second gas passage 110, and the third gas passage 112) are not in communication with each other in the gas distribution layer 102 (or the disc-shaped body) 104, various ( The reaction gas is not mixed with each other in the gas split layer 102 (or the disk-shaped body 104), that is, it is not mixed with each other when it is not ejected by the gas splitting head 100. Since the first gas passage 108, the second gas passage 110, and the third gas passage 112 are all disposed on the same plane of the gas distribution layer 102 (or the disc-shaped body 104) of the single-layer structure, the first (reaction) The gas, the second (reaction) gas, and the third (reaction) gas are all centered on the gas splitting nozzle 100 (gas splitting layer 102) and radially from the gas shunting head 100 (gas shunt layer 102) on the same plane. After the periphery (or side) is ejected and enters the reaction chamber and is laterally diffused in the reaction chamber, each (reaction) gas will react to form a compound semiconductor thin film deposition. Thereby, the gas splitting nozzle 100 can replace the multi-layer structure of the conventional nozzle (ie, the triple nozzle design) with a single layer structure, that is, the gas shunting function can be achieved, so that the gas shunting can still be effectively performed without using a multi-layer structure, and The various (reaction) gases that are split are ejected from the side (or periphery) of the same layer (ie, the gas split layer 102 or the disc-shaped body 104), that is, the various (reactive) gases that are split are laterally (or laterally) from the same plane. It is sprayed out, so that various (reaction) gases need only be diffused over the same plane for a period of time to react, and there is no need to perform longitudinal diffusion to meet, so the process time can be reduced.

然而,本發明之氣體分流噴頭中的第一氣體通道、第二氣體通道、以及第三氣體通道的排列組合,除了採用兩相鄰第一氣體通道夾有至少一第二氣體通道或至少一第三氣體通道此一設計(例如第二圖所示之實施例)之外,也可以採用每相鄰兩第一氣體通道間同時夾有至少一第二氣體通道與至少一第三氣體通道此一設計。第三A圖為本發明採用每相鄰兩第一氣體通道間夾有至少一第二氣體通道與至少一第三氣體通道此一設計的氣體分流噴頭之一實施例的俯視圖與側視圖。參照第三A圖,氣體分流噴頭100A與第二圖所示之氣體分流噴頭100由相同的組成元件(即氣體分流層102、圓盤狀主體104、第一氣體通道108、第二氣體通道110、以及第三氣體通道112等)所組成,這些組成元件已於前文詳述,於此不再贅述。在氣體分流噴頭100A的氣體分流層102中,各種氣體通道的排列是以第一氣體通道108、第二氣體通道110、第三氣體通道112此一順序循環排列。換言之,在氣體分流噴頭100A的氣體分流層102中,每兩相鄰兩第一氣體通道108間夾有一第二氣體通道110與一第三氣體通道112,並且以此做為一單元循環排列於氣體分流層102(或圓盤狀主體104)中,並且如同第三A圖所示,每一第一氣體通道108皆為相鄰兩單元所共有,且每相鄰兩第一氣體通道108間的第二氣體通道110與第三氣體通道112是彼此輪替的方式排列,亦即以第二氣體通道110在前,第三氣體通道112在後的順序(循環)排列。換言之,在第三A圖所示之氣體分流噴頭100A中各種氣體通道的排列是以第一氣體通道108、第二氣體通道110、第三氣體通道112此一順序循環排列於氣體分流層102(或圓盤狀主體104)中。However, the arrangement of the first gas passage, the second gas passage, and the third gas passage in the gas split nozzle of the present invention comprises, in addition to using at least one second gas passage or at least one of the two adjacent first gas passages. In addition to the three gas passages, such as the embodiment shown in FIG. 2, at least one second gas passage and at least one third gas passage may be simultaneously sandwiched between each adjacent first gas passage. design. The third A is a top view and a side view of an embodiment of a gas splitting nozzle of the present invention in which at least one second gas passage and at least one third gas passage are sandwiched between two adjacent first gas passages. Referring to FIG. 3A, the gas splitting nozzle 100A and the gas splitting nozzle 100 shown in FIG. 2 are composed of the same constituent elements (ie, the gas split layer 102, the disk-shaped body 104, the first gas passage 108, and the second gas passage 110). And the third gas channel 112, etc., these constituent elements have been previously described in detail, and will not be described herein. In the gas distribution layer 102 of the gas splitting nozzle 100A, the arrangement of the various gas passages is cyclically arranged in the order of the first gas passage 108, the second gas passage 110, and the third gas passage 112. In other words, in the gas distribution layer 102 of the gas splitting nozzle 100A, a second gas passage 110 and a third gas passage 112 are interposed between each two adjacent first gas passages 108, and are arranged in a unit as a unit. In the gas distribution layer 102 (or the disk-shaped body 104), and as shown in FIG. 3A, each of the first gas passages 108 is shared by two adjacent units, and between each adjacent two first gas passages 108 The second gas passages 110 and the third gas passages 112 are arranged alternately with each other, that is, the second gas passages 110 are in front and the third gas passages 112 are arranged in a subsequent sequence (cycle). In other words, the arrangement of the various gas passages in the gas splitting nozzle 100A shown in FIG. 3A is cyclically arranged in the gas distribution layer 102 in the order of the first gas passage 108, the second gas passage 110, and the third gas passage 112. Or in the disc-shaped body 104).

當然,也可以採取將第三A圖中的第二氣體通道110與第三氣體通道112交換的排列方式,如第三B圖所示。參照第三B圖,在氣體分流噴頭100B的氣體分流層102中,相鄰兩第一氣體通道108間的第二氣體通道110與第三氣體通道112雖然是彼此輪替的方式排列,但是卻是以第三氣體通道112在前,第二氣體通道110在後的順序(循環)排列。換言之,在第三B圖所示之氣體分流噴頭100B中各種氣體通道的排列是以第一氣體通道108、第三氣體通道112、第二氣體通道110此一順序循環排列於氣體分流層102(或圓盤狀主體104)中。雖然在第三A圖與第三B圖所示之實施例中,每相鄰第一氣體通道108間僅有一第二氣體通道110與一第三氣體通道112,但是並不以此為限,而是可以視需求而增加。舉例來說,參照第四A圖,在第四A圖所示之氣體分流噴頭100C中,每相鄰第一氣體通道108間夾有2個第二氣體通道110與2個第三氣體通道112,且相鄰兩第一氣體通道108中的第二氣體通道110與第三氣體通道112是採取彼此輪替的方式排列,而以第一氣體通道108、第二氣體通道110、第三氣體通道112、第二氣體通道110、第三氣體通道112此一順序循環排列於氣體分流層102(或圓盤狀主體104)中。參照第四B圖,在第四B圖所示之氣體分流噴頭100D中,每相鄰第一氣體通道108間夾有2個第二氣體通道110與2個第三氣體通道112,且相鄰兩第一氣體通道108中的第二氣體通道110與第三氣體通道112是採取彼此輪替的方式排列,但是以第一氣體通道108、第三氣體通道112、第二氣體通道110、第三氣體通道112、第二氣體通道110、此一順序循環排列於氣體分流層102(或圓盤狀主體104)中。因此,由上述第三A圖、第三B圖、第四A圖、及第四B圖所示之實施例,可以清楚地知道只要符合本發明上述實施例所採用的每相鄰兩第一氣體通道間夾有至少一第二氣體通道與至少一第三氣體通道此一設計原理,且相鄰兩第一氣體通道中的第二氣體通道與第三氣體通道是採取彼此輪替的方式排列,皆應屬於上述實施例的簡單變化,而應屬於本發明之專利範圍。Of course, it is also possible to adopt an arrangement in which the second gas passage 110 in the third A diagram is exchanged with the third gas passage 112, as shown in FIG. Referring to FIG. 3B, in the gas distribution layer 102 of the gas splitting nozzle 100B, the second gas passage 110 and the third gas passage 112 between the adjacent first gas passages 108 are arranged in a mutually alternate manner, but The third gas passages 112 are in front and the second gas passages 110 are arranged in a rear (cycle) sequence. In other words, the arrangement of the various gas passages in the gas splitting nozzle 100B shown in FIG. B is arranged in the gas shunt layer 102 in the order of the first gas passage 108, the third gas passage 112, and the second gas passage 110. Or in the disc-shaped body 104). In the embodiment shown in FIG. 3A and FIG. 3B, there is only one second gas channel 110 and one third gas channel 112 between each adjacent first gas channel 108, but not limited thereto. Instead, it can be increased as needed. For example, referring to FIG. 4A, in the gas splitting nozzle 100C shown in FIG. 4A, two second gas passages 110 and two third gas passages 112 are sandwiched between each adjacent first gas passage 108. And the second gas channel 110 and the third gas channel 112 of the adjacent two first gas channels 108 are arranged in a manner of being alternately rotated, and the first gas channel 108, the second gas channel 110, and the third gas channel are arranged. 112. The second gas passage 110 and the third gas passage 112 are sequentially arranged in the gas distribution layer 102 (or the disc-shaped body 104). Referring to FIG. 4B, in the gas splitting nozzle 100D shown in FIG. 4B, two second gas channels 110 and two third gas channels 112 are sandwiched between adjacent first gas channels 108, and adjacent thereto. The second gas passage 110 and the third gas passage 112 of the two first gas passages 108 are arranged in a manner of being alternately rotated with each other, but with the first gas passage 108, the third gas passage 112, the second gas passage 110, and the third The gas passage 112, the second gas passage 110, and the sequence are sequentially arranged in the gas split layer 102 (or the disc-shaped body 104). Therefore, from the embodiments shown in the third A diagram, the third B diagram, the fourth A diagram, and the fourth B diagram, it can be clearly understood that each adjacent two firsts used in accordance with the above embodiment of the present invention is clearly known. The design principle of the at least one second gas passage and the at least one third gas passage is sandwiched between the gas passages, and the second gas passage and the third gas passage of the adjacent two first gas passages are arranged in a manner of alternate rotation. All should belong to the simple variations of the above embodiments, and should fall within the scope of the patent of the present invention.

再者,前述實施例中,除了相鄰兩第一氣體通道中的第二氣體通道與第三氣體通道採取彼此輪替的方式排列之外,更可以採取其他方式排列,其舉例說明如下:參照第五A圖,在氣體分流噴頭100E的氣體分流層102(或圓盤狀主體104)中,兩相鄰的第一氣體通道108之間夾有2個第二氣體通道110與1個第三氣體通道112,這些第二氣體通道110與第三氣體通道112以相鄰兩個第二氣體通道110之間夾有一個第三氣體通道112的方式排列於其中。參照第五B圖,在氣體分流噴頭100F的氣體分流層102(或圓盤狀主體104)中,兩相鄰的第一氣體通道108之間夾有1個第二氣體通道110與2個第三氣體通道112,這些第二氣體通道110與第三氣體通道112以相鄰兩個第三氣體通道112之間夾有一個第二氣體通道110的方式排列於其中。由第五A圖與第五B圖所示之實施例,可以清楚地得知只要符合本發明上述實施例所採用的每相鄰兩第一氣體通道間夾有至少一第二氣體通道與至少一第三氣體通道此一設計原理,且以相鄰兩第二氣體通道夾有一第三氣體通道的方式,或是相鄰兩第三氣體通道夾有一第二氣體通道的方式等方式排列,無論相鄰兩第一氣體通道間夾有多少個第二氣體通道與第三氣體通道,相鄰第二氣體通道夾有多少第三氣體通道、或是相鄰第三氣體通道夾有多少第二氣體通道,皆應屬於上述實施例的簡單變化,而應屬於本發明之專利範圍。Furthermore, in the foregoing embodiment, in addition to the arrangement of the second gas passage and the third gas passage in the adjacent two first gas passages in a mutually alternate manner, other manners may be adopted, which are exemplified as follows: In the fifth A diagram, in the gas distribution layer 102 (or the disk-shaped body 104) of the gas splitting nozzle 100E, two second gas passages 110 and one third are sandwiched between two adjacent first gas passages 108. The gas passages 112, the second gas passages 110 and the third gas passages 112 are arranged in such a manner that a third gas passage 112 is sandwiched between the adjacent two second gas passages 110. Referring to FIG. 5B, in the gas distribution layer 102 (or the disk-shaped body 104) of the gas splitting nozzle 100F, a second gas passage 110 and two first sections are sandwiched between two adjacent first gas passages 108. The three gas passages 112 are arranged in such a manner that the second gas passages 110 and the third gas passages 112 are sandwiched by a second gas passage 110 between the adjacent two third gas passages 112. From the embodiments shown in FIGS. 5A and 5B, it can be clearly seen that at least one second gas passage is sandwiched between each adjacent two first gas passages as long as it is used in accordance with the above embodiment of the present invention. a design principle of a third gas passage, and arranged in such a manner that a second gas passage is sandwiched between two adjacent second gas passages, or a second gas passage is sandwiched between two adjacent third gas passages, regardless of How many second gas passages and third gas passages are sandwiched between two adjacent first gas passages, how many third gas passages are sandwiched between adjacent second gas passages, or how many second gases are sandwiched between adjacent third gas passages The passages are all subject to the simple variations of the above embodiments and are within the scope of the invention.

在本發明之氣體分流噴頭中,更可以設置數個氣體通道隔塊,用以分隔氣體分流層中的氣體通道,做為散熱塊與控制各個不同(反應)氣體的混合反應時間。參照第六圖,其為本發明之一具有氣體通道隔塊的氣體分流噴頭的實施例的俯視圖與側視圖。參照第六圖,氣體分流噴頭200同樣由一為單層結構的氣體分流層102所組成,而氣體分流層102同樣包含一圓盤狀主體104(或是氣體分流層102本身即為圓盤狀主體104)、數個第一氣體通道108、數個第二氣體通道110、以及數個第三氣體通道112所組成,但是其更包含有數個氣體通道隔塊114。如第六圖所示,在氣體分流噴頭200中,每一第一氣體通道108都被相夾於相鄰兩氣體通道隔塊114之間,每一第二氣體通道110也被相夾於相鄰兩氣體通道隔塊114之間,而每一第三氣體通道110同樣被相夾於相鄰兩氣體通道隔塊114之間,意即在氣體分流噴頭200中,任一氣體通道與鄰近的其他氣體通道皆相隔一氣體通道隔塊114。換言之,在氣體分流噴頭200中,各種氣體通道與氣體通道隔塊是以氣體通道隔塊114、第一氣體通道108、氣體通道隔塊114、第二氣體通道110、氣體通道隔塊114、第三氣體通道112此一順序循環排列氣體分流層102(或圓盤狀主體104)中。由於第一氣體通道108、第二氣體通道110、第三氣體通道112、以及氣體通道隔塊114皆設置於氣體分流層102(或圓盤狀主體104)中的同一平面上,所以既使氣體分流層102(或圓盤狀主體104)中設置了氣體通道隔塊114,氣體分流層102(或圓盤狀主體104)仍然保持其單層結構。再者,第一氣體通道108、第二氣體通道110、第三氣體通道112、以及氣體通道隔塊114於於氣體分流層102(或圓盤狀主體104)中的排列,也如同前述實施例都成一對稱的分佈。In the gas splitting nozzle of the present invention, a plurality of gas passage spacers may be provided for separating the gas passages in the gas split layer as a mixing reaction time of the heat radiating block and controlling different (reactive) gases. Referring to a sixth diagram, there is shown a plan view and a side view of an embodiment of a gas split nozzle having a gas passage spacer. Referring to the sixth drawing, the gas splitting nozzle 200 is also composed of a gas split layer 102 of a single layer structure, and the gas split layer 102 also includes a disk-shaped body 104 (or the gas split layer 102 itself is a disk shape) The main body 104), the plurality of first gas passages 108, the plurality of second gas passages 110, and the plurality of third gas passages 112 are formed, but further include a plurality of gas passage spacers 114. As shown in the sixth diagram, in the gas splitting nozzle 200, each of the first gas passages 108 is sandwiched between adjacent two gas passage spacers 114, and each of the second gas passages 110 is also sandwiched between the phases. Adjacent to the two gas passage spacers 114, each third gas passage 110 is also sandwiched between adjacent two gas passage spacers 114, that is, in the gas splitting nozzle 200, any gas passage and adjacent ones The other gas passages are separated by a gas passage spacer 114. In other words, in the gas splitting nozzle 200, the various gas passages and the gas passage spacers are a gas passage spacer 114, a first gas passage 108, a gas passage spacer 114, a second gas passage 110, a gas passage spacer 114, and a The three gas passages 112 are sequentially arranged in the gas split layer 102 (or the disk-shaped body 104). Since the first gas passage 108, the second gas passage 110, the third gas passage 112, and the gas passage spacer 114 are all disposed on the same plane in the gas distribution layer 102 (or the disk-shaped body 104), even the gas A gas passage spacer 114 is disposed in the flow dividing layer 102 (or the disk-shaped body 104), and the gas distribution layer 102 (or the disk-shaped body 104) still maintains its single-layer structure. Furthermore, the arrangement of the first gas channel 108, the second gas channel 110, the third gas channel 112, and the gas channel spacer 114 in the gas distribution layer 102 (or the disk-shaped body 104) is also the same as the foregoing embodiment. They all become a symmetric distribution.

藉此,各種不同的(反應)氣體進入氣體分流噴頭200,且經過佈氣裝置(圖中未示)將不同的(反應)氣體佈氣或輸送至相對應的氣體通道(即第一氣體通道108、第二氣體通道110、與第三氣體通道112)後,各種不同的(反應)氣體會通過相應的氣體通道,而從氣體分流噴頭200的周邊或側邊由同一水平面橫向(或是側向)噴出,其以氣體分流噴頭200為中心而成一放射狀的橫向(或是側向)噴發。相較於第二圖-第五B圖所示之體分流噴頭,由於各個氣體通道都被氣體通道隔塊114隔開,所以由氣體分流噴頭200所噴出的(反應)氣體不會馬上相遇,且需要經過比較長的時間擴散才會相遇,因此可以藉由氣體通道隔塊114的設置而控制各種(反應)氣體的相遇時間,進而控制各種(反應)氣體開始反應的時間。雖然,在氣體分流噴頭200中,設置有6個第一氣體通道108、3個第二氣體通道110、3個第三氣體通道112、以及12個氣體通道隔塊114,但是並不以此為限,而是可以依照需求增減,這些數量上的變化為上述實施例(即第六圖所示之實施例)的簡單變化,並且第一氣體通道、第二氣體通道、以及第三氣體通道的相對排列位置也為上述實施例(即第六圖所示之實施例)的簡單變化,而皆應屬於本發明之專利範圍。Thereby, various (reactive) gases enter the gas splitting nozzle 200, and the different (reactive) gases are gas or transported to the corresponding gas passages through the air distribution device (not shown) (ie, the first gas passage) 108. After the second gas passage 110 and the third gas passage 112), various (reactive) gases pass through the corresponding gas passages, and are laterally (or laterally) from the periphery or sides of the gas splitting nozzle 200 from the same horizontal plane. It is ejected to form a radial lateral (or lateral) ejection centering on the gas splitting nozzle 200. Compared with the body splitting nozzles shown in the second to fifth panels, since the respective gas passages are separated by the gas passage spacers 114, the (reaction) gases ejected by the gas splitting nozzles 200 do not immediately meet. Moreover, it takes a relatively long time for the diffusion to meet, so that the time of encountering various (reactive) gases can be controlled by the arrangement of the gas passage spacers 114, thereby controlling the time at which various (reaction) gases start to react. Although, in the gas splitting nozzle 200, six first gas passages 108, three second gas passages 110, three third gas passages 112, and twelve gas passage spacers 114 are provided, but this is not Limit, but can be increased or decreased according to requirements, these quantitative changes are simple changes of the above embodiment (ie, the embodiment shown in FIG. 6), and the first gas channel, the second gas channel, and the third gas channel The relative arrangement position is also a simple change of the above embodiment (i.e., the embodiment shown in Fig. 6), and all of them belong to the patent scope of the present invention.

然而,本發明之氣體分流噴頭中的第一氣體通道、第二氣體通道、第三氣體通道、以及氣體通道隔塊的排列組合,除了採用每一氣體通道都被相夾於相鄰兩氣體通道隔塊之間此一設計(例如第六圖所示之實施例)之外,也可以採用其他排列組合,其舉例說明如下:參照第七圖,氣體分流噴頭200A與第六圖所示之氣體分流噴頭200由相同的組成元件(即氣體分流層102、圓盤狀主體104、第一氣體通道108、第二氣體通道110、第三氣體通道112、以及氣體通道隔塊114等)所組成,這些組成元件已於前文詳述,於此不再贅述。在氣體分流噴頭200A中,以兩相鄰氣體通道隔塊114夾有2個第一氣體通道108與1個第二氣體通道110做為第一氣體通道組合A,而以兩相鄰氣體通道隔塊114夾有2個第一氣體通道108與1個第三氣體通道112做為第二氣體通道組合B,並以第一氣體通道組合A與第二氣體通道組合B交替排列的方式設置於氣體分流噴頭200A(或氣體分流層102)中,其中每一氣體通道隔塊114為相鄰的第一氣體通道組合A與第二氣體通道組合B所共用。第七圖為本發明採取兩相鄰之氣體通道隔塊之間夾有至少一第一氣體通道與至少一第二氣體通道做為第一氣體通道組合,而以兩相鄰之氣體通道隔塊之間夾有至少一第三氣體通道做為第二氣體通道組合,而以第一氣體通道組合與第二氣體通道組合交替排列的方式排列於該氣體分流層中此一設計原理的其中一實施例,所以在符合此一設計原則下的任何改變都屬於第七圖所示實施例的簡單變化,而應屬於本發明之範疇與專利範圍。However, the arrangement of the first gas passage, the second gas passage, the third gas passage, and the gas passage spacer in the gas split nozzle of the present invention is sandwiched between adjacent gas passages except for each gas passage. In addition to this design between the spacers (for example, the embodiment shown in FIG. 6), other arrangement combinations may be employed, which are exemplified as follows: Referring to the seventh figure, the gas distribution nozzle 200A and the gas shown in FIG. The split nozzle 200 is composed of the same constituent elements (ie, the gas split layer 102, the disk-shaped body 104, the first gas passage 108, the second gas passage 110, the third gas passage 112, and the gas passage spacer 114, etc.). These constituent elements have been described in detail above and will not be described herein. In the gas splitting nozzle 200A, two first gas passages 108 and one second gas passage 110 are sandwiched by two adjacent gas passage blocks 114 as a first gas passage combination A, and separated by two adjacent gas passages. The block 114 has two first gas passages 108 and one third gas passage 112 as a second gas passage combination B, and is disposed on the gas in such a manner that the first gas passage combination A and the second gas passage combination B are alternately arranged. In the split nozzle 200A (or gas split layer 102), each gas channel spacer 114 is shared by the adjacent first gas channel combination A and the second gas channel combination B. The seventh figure is a combination of at least one first gas channel and at least one second gas channel sandwiched between two adjacent gas channel spacers as a first gas channel, and two adjacent gas channel spacers. Arranging at least one third gas passage as a second gas passage combination, and arranging the first gas passage combination and the second gas passage combination alternately in the gas split layer, one of the implementation principles of the design principle For example, any changes in conformity with this design principle belong to the simple variations of the embodiment shown in the seventh figure, and should fall within the scope and patent scope of the present invention.

舉例來說,雖然第一氣體組合A中的兩相鄰第一氣體通道108之間僅夾有一個第二氣體通道110,但是並不以此為限,而是可以視需求增加第二氣體通道110的數量(例如2個、3個、或更多),此一數量上的改變為第七圖所示之實施例的簡單變化,而應屬於本發明之專利範圍。雖然第二氣體組合B中的兩相鄰第一氣體通道108之間僅夾有一個第三氣體通道112,但是並不以此為限,而是可以視需求增加第三氣體通道112的數量(例如2個、3個、或更多),此一數量上的改變為第七圖所示之實施例的簡單變化,而應屬於本發明之專利範圍。再者,雖然第一氣體組合A中的兩相鄰氣體通道隔塊114之間夾有2個第一氣體通道108與一個第二氣體通道110,但是並不以此為限,而是可以視需求而減少第一氣體通道的數量,即兩相鄰氣體通道隔塊之間僅夾有一個第一氣體通道與一個第二氣體通道,或是視需求而增加第一氣體通道的數量(3個、4個或更多個)與第二氣體通道的數量(2個、3個或更多個),並且這些第一氣體通道與第二氣體通道可以採取各種不同的排列組合,例如第一氣體通道與第二氣體通道交替排列、多個第二氣體通道排列於兩第一氣體通道之間等等,由於這些數量上與排列組合上的改變都符合第七圖所採取的兩相鄰之氣體通道隔塊之間夾有至少一第一氣體通道與至少一第二氣體通道做為第一氣體通道組合此一設計原則,所以皆為第七圖所示之實施例的簡單變化,而應屬於本發明之專利範圍。雖然第二氣體組合B中的兩相鄰氣體通道隔塊114之間夾有2個第一氣體通道108與一個第三氣體通道112,但是並不以此為限,而是可以視需求而減少第一氣體通道的數量,即兩相鄰氣體通道隔塊之間僅夾有一個第一氣體通道與一個第三氣體通道,或是視需求而增加第一氣體通道的數量(3個、4個或更多個)與第三氣體通道的數量(2個、3個或更多個),並且這些第一氣體通道與第三氣體通道可以採取各種不同的排列組合,例如第一氣體通道與第三氣體通道交替排列、多個第三氣體通道排列於兩第一氣體通道之間等等,由於這些數量上與排列組合上的改變都符合第七圖所採取的兩相鄰之氣體通道隔塊之間夾有至少一第一氣體通道與至少一第三氣體通道做為第二氣體通道組合此一設計原則,所以皆為第七圖所示之實施例的簡單變化,而應屬於本發明之專利範圍。For example, although only one second gas channel 110 is sandwiched between two adjacent first gas channels 108 in the first gas combination A, it is not limited thereto, and the second gas channel may be added as needed. The number of 110s (e.g., 2, 3, or more), which is a simple change in the embodiment shown in the seventh figure, is within the scope of the patent of the present invention. Although only one third gas passage 112 is sandwiched between two adjacent first gas passages 108 in the second gas combination B, it is not limited thereto, and the number of the third gas passages 112 may be increased as needed ( For example, 2, 3, or more, this number change is a simple change of the embodiment shown in the seventh figure, and should fall within the scope of the patent of the present invention. Furthermore, although two first gas channels 108 and one second gas channel 110 are sandwiched between two adjacent gas channel spacers 114 in the first gas combination A, it is not limited thereto, but may be regarded as Reducing the number of first gas passages, that is, only one first gas passage and one second gas passage are sandwiched between two adjacent gas passage spacers, or the number of first gas passages is increased as required (3 , 4 or more) and the number of second gas passages (2, 3 or more), and these first gas passages and second gas passages may take various combinations of arrangements, such as the first gas The channels are alternately arranged with the second gas passages, the plurality of second gas passages are arranged between the two first gas passages, etc., because the changes in the combination of the number and the arrangement are in accordance with the two adjacent gases taken in the seventh figure. A design principle is adopted in which at least one first gas passage and at least one second gas passage are combined as a first gas passage between the passage blocks, so that they are simple changes of the embodiment shown in FIG. 7 and belong to Patent model of the invention Wai. Although two first gas passages 108 and one third gas passage 112 are sandwiched between two adjacent gas passage spacers 114 in the second gas combination B, they are not limited thereto, but may be reduced as needed. The number of first gas passages, that is, only one first gas passage and one third gas passage are sandwiched between two adjacent gas passage spacers, or the number of first gas passages is increased as required (3, 4 Or more than the number of the third gas passages (2, 3 or more), and the first gas passages and the third gas passages may take various combinations of arrangements, such as the first gas passage and the first The three gas channels are alternately arranged, the plurality of third gas channels are arranged between the two first gas channels, and the like, and the changes in the combination of the number and the arrangement are in accordance with the two adjacent gas channel spacers taken in the seventh figure. The design principle is combined between at least one first gas passage and at least one third gas passage as a second gas passage, so that they are simple changes of the embodiment shown in the seventh figure, and should belong to the present invention. Patent scope.

另外,將第七圖所示之氣體分流噴頭200A中的第一氣體通道組合中的第一氣體通道與第二氣體通道互換,即改以兩相鄰第二氣體通道之間夾有(至少)一第一氣體通道,並將第二氣體通道組合中的第一氣體通道與第三氣體通道互換,即改以兩相鄰第三氣體通道之間夾有(至少)一第一氣體通道,則同樣符合第七圖所採取兩相鄰之氣體通道隔塊之間夾有至少一第一氣體通道與至少一第二氣體通道做為第一氣體通道組合,而以兩相鄰之氣體通道隔塊之間夾有至少一第三氣體通道做為第二氣體通道組合此一設計原理,而為第七圖所示之實施例的簡單變化,而應屬於本發明之專利範圍。In addition, the first gas channel and the second gas channel in the first gas channel combination in the gas splitting nozzle 200A shown in FIG. 7 are interchanged, that is, the two adjacent gas channels are sandwiched between (at least) a first gas passage, and the first gas passage in the second gas passage combination is interchanged with the third gas passage, that is, the (at least) first gas passage is sandwiched between the two adjacent third gas passages, Also corresponding to the seventh figure, two adjacent gas passage blocks are sandwiched between at least one first gas passage and at least one second gas passage as a first gas passage combination, and two adjacent gas passage spacers. The design principle is combined with at least one third gas passage as the second gas passage, and is a simple variation of the embodiment shown in the seventh embodiment, and is within the scope of the patent of the present invention.

參照第八A圖,氣體分流噴頭200B與第六圖所示之氣體分流噴頭200由相同的組成元件(即氣體分流層102、圓盤狀主體104、第一氣體通道108、第二氣體通道110、第三氣體通道112、以及氣體通道隔塊114等)所組成,這些組成元件已於前文詳述,於此不再贅述。第八A圖所示之氣體分流噴頭200B係採取兩相鄰氣體通道隔塊之間夾有至少一第一氣體通道、至少一第二氣體通道、以及至少一第三氣體通道此一排列方式而循環排列於氣體分流噴頭200B (或氣體分流層102)中此一設計。在氣體分流噴頭200B中,兩相鄰氣體通道隔塊114之間夾有一第一氣體通道108、第二氣體通道110、以及第三氣體通道112,並且以此為一單元,而循環排列於氣體分流層102 (或圓盤狀主體104)中,且每一氣體通道隔塊114皆相鄰兩單元所共有。兩相鄰氣體通道隔塊114之間的第一氣體通道108、第二氣體通道110、以及第三氣體通道112之間的排列則採取第一氣體通道108被夾於第二氣體通道110與該第三氣體通道112之間的設計。如同第八A圖所示,兩相鄰氣體通道隔塊114之間以第二氣體通道110、第一氣體通道108、第三氣體通道112此一順序排列,但是並不以此為限,可以依照需求採取相反的順序排列,即第三氣體通道112、第一氣體通道108、第二氣體通道110此一順序排列,如第八B圖所示之氣體分流噴頭200C,其同樣採取與第八A圖相同設計原理,所以同屬於本發明之範疇。在第八A圖所示之氣體分流噴頭200B與第八B圖所示之氣體分流噴頭200C中,雖然兩相鄰氣體通道隔塊114之間僅夾有一第一氣體通道108、第二氣體通道110、以及第三氣體通道112,但是並不以此為限,而是可以依照需求增加第一氣體通道的數量、第二氣體通道的數量、以及第三氣體通道的數量,例如兩相鄰氣體通道隔塊之間夾有2個或多個第一氣體通道、2個或多個第二氣體通道、以及2個或多個第三氣體通道,並以第二氣體通道、第一氣體通道、第三氣體通道此一順序,或是第三氣體通道、第一氣體通道、第二氣體通道此一順序,或是其他順序排列方式,而循環排列於兩相鄰氣體通道隔塊之間,此一數量上的改變為第八A圖與第八B圖所示之實施例的簡單變化,而應屬於本發明之專利範圍。Referring to FIG. 8A, the gas splitting nozzle 200B and the gas splitting nozzle 200 shown in FIG. 6 are composed of the same constituent elements (ie, the gas split layer 102, the disk-shaped body 104, the first gas passage 108, and the second gas passage 110). The third gas passage 112, and the gas passage spacer 114, etc., are composed of these components, which are not described in detail herein. The gas splitting nozzle 200B shown in FIG. 8A adopts an arrangement in which at least one first gas passage, at least one second gas passage, and at least one third gas passage are sandwiched between two adjacent gas passage spacers. This design is circulated in the gas splitting nozzle 200B (or the gas splitting layer 102). In the gas splitting nozzle 200B, a first gas passage 108, a second gas passage 110, and a third gas passage 112 are sandwiched between two adjacent gas passage spacers 114, and are arranged as a unit, and are circulated in the gas. In the diversion layer 102 (or the disc-shaped body 104), and each gas passage spacer 114 is shared by two adjacent units. The arrangement between the first gas channel 108, the second gas channel 110, and the third gas channel 112 between the two adjacent gas channel spacers 114 is such that the first gas channel 108 is sandwiched between the second gas channel 110 and the The design between the third gas passages 112. As shown in FIG. 8A, the two adjacent gas passage spacers 114 are arranged in the order of the second gas passage 110, the first gas passage 108, and the third gas passage 112, but are not limited thereto. Arranged in reverse order according to requirements, that is, the third gas passage 112, the first gas passage 108, and the second gas passage 110 are arranged in this order, as shown in the eighth embodiment, the gas splitting nozzle 200C, which is also taken with the eighth A is the same design principle and therefore belongs to the scope of the present invention. In the gas splitting nozzle 200B shown in FIG. 8A and the gas splitting nozzle 200C shown in FIG. 8B, although only the first gas passage 108 and the second gas passage are sandwiched between the two adjacent gas passage spacers 114. 110, and the third gas passage 112, but not limited thereto, but the number of the first gas passages, the number of the second gas passages, and the number of the third gas passages, for example, two adjacent gases, may be increased as needed. Between the channel spacers, two or more first gas channels, two or more second gas channels, and two or more third gas channels are sandwiched, and the second gas channel, the first gas channel, The third gas passage is in the order of the third gas passage, the first gas passage, the second gas passage, or other sequential arrangement, and is cyclically arranged between the two adjacent gas passage spacers. A quantitative change is a simple change of the embodiment shown in Figs. 8A and 8B, and should fall within the scope of the patent of the present invention.

當然前述第八A圖與第八B圖所示的實施例中兩相鄰氣體通道隔塊之間的各種不同的氣體通道的數量,可以如第八A圖與第八B圖一樣採取兩相鄰氣體通道隔塊之間的各種不同的氣體通道具有相同數量的設計,或採取兩相鄰氣體通道隔塊之間的各種不同的氣體通道具有不同數量的設計,參照第九A圖,氣體分流噴頭200D同樣採取兩相鄰氣體通道隔塊之間夾有至少一第一氣體通道、至少一第二氣體通道、以及至少一第三氣體通道此一排列方式而循環排列於氣體分流噴頭200D (或氣體分流層102)中此一設計,但是兩相鄰氣體通道隔塊之間卻是採取各種不同的氣體通道具有不同數量此一設計。在氣體分流噴頭200D中,兩相鄰氣體通道隔塊114之間夾有1個第一氣體通道108、2個第二氣體通道110、以及2個第三氣體通道112,其中,第一氣體通道108被夾於兩相鄰的第三氣體通道112之間,並同時被夾於兩相鄰的第二氣體通道110之間的方式排列,但是並不以此為限,而是如第九B圖所示,可以依照需求採取第一氣體通道108被夾於兩相鄰的第二氣體通道110之間,並同時被夾於兩相鄰的第三氣體通道112之間的方式排列。或者,在採取兩相鄰氣體通道隔塊之間夾有至少一第一氣體通道、至少一第二氣體通道、以及至少一第三氣體通道,但是兩相鄰氣體通道隔塊之間卻是採取各種不同的氣體通道具有不同數量此一設計,兩相鄰氣體通道隔塊之間的各種氣體通道的排列,也可以採取兩相鄰的第一氣體通道之間夾有至少一第二氣體通道與至少一第三氣體通道的方式排列。然而,上述實施例中所展現的兩相鄰氣體通道隔塊之間的各種不同的氣體通道的數量,都可依照需求增加,此一數量上的改變為上述實施例的簡單變化,而應屬於本發明之專利範圍。Of course, the number of different gas passages between the two adjacent gas passage spacers in the foregoing embodiments shown in the eighth and eighth embodiments can be two-phase as in the eighth and eighth panels. The various gas passages between adjacent gas passage spacers have the same number of designs, or different gas passages between two adjacent gas passage spacers have different numbers of designs, see Figure 9A, gas splitting The showerhead 200D also adopts an arrangement in which at least one first gas passage, at least one second gas passage, and at least one third gas passage are interposed between two adjacent gas passage spacers to be circulated in the gas splitting nozzle 200D (or This design is in the gas splitting layer 102), but the two adjacent gas passage blocks are of different designs with different numbers of gas passages. In the gas splitting nozzle 200D, a first gas channel 108, two second gas channels 110, and two third gas channels 112 are sandwiched between two adjacent gas channel spacers 114, wherein the first gas channel 108 is sandwiched between two adjacent third gas passages 112 and is simultaneously sandwiched between two adjacent second gas passages 110, but not limited thereto, but as ninth B As shown, the first gas passage 108 can be sandwiched between two adjacent second gas passages 110 as desired, and simultaneously sandwiched between two adjacent third gas passages 112. Alternatively, at least one first gas channel, at least one second gas channel, and at least one third gas channel are sandwiched between the two adjacent gas channel spacers, but the two adjacent gas channel spacers are taken between The different gas passages have different numbers of the design, and the arrangement of the various gas passages between the two adjacent gas passage spacers may also adopt at least one second gas passage between the two adjacent first gas passages. At least one third gas channel is arranged in a manner. However, the number of different gas passages between two adjacent gas passage spacers exhibited in the above embodiments may be increased according to requirements, and this amount change is a simple change of the above embodiment, but belongs to The patent scope of the present invention.

另外,由上述第二圖至第九B圖所示之實施例,可以清楚得知第一氣體通道108、第二氣體通道110、以及第三氣體通道112都是由圓盤狀主體104中心位置向圓盤狀主體104的周邊位置逐漸變大的氣體通道,而氣體通道隔塊114則是由圓盤狀主體104中心位置向圓盤狀主體104的周邊位置逐漸變大的隔塊。上述實施例所展示氣體分流噴頭的側視圖都是以由該氣體分流噴頭的側視圖的上側看向該氣體分流噴頭的視角呈現。由上述實施例所展示氣體分流噴頭的側視圖,可以看出前述實施例之氣體分流噴頭的各種氣體通道(即第一氣體通道、第二氣體通道、及第三氣體通道)都是垂直設置於氣體分流層(或圓盤狀主體)中,即垂直於氣體分流層(或圓盤狀主體)的頂面與底面而設置於氣體分流層(或圓盤狀主體)中,但是如同第十圖所示之氣體分流噴頭300,各種氣體通道(即第一氣體通道、第二氣體通道、及第三氣體通道)可以歪斜的方式設置於氣體分流層(或圓盤狀主體)設置,即以不垂直於氣體分流層102A(或圓盤狀主體)的頂面與底面的方式設置於氣體分流層102A(或圓盤狀主體)中。In addition, from the embodiments shown in the above second to ninth B, it is clear that the first gas passage 108, the second gas passage 110, and the third gas passage 112 are both centered by the disc-shaped main body 104. The gas passage that gradually becomes larger toward the peripheral position of the disc-shaped main body 104, and the gas passage spacer 114 is a spacer that gradually becomes larger from the center position of the disc-shaped main body 104 toward the peripheral position of the disc-shaped main body 104. The side views of the gas splitting nozzles shown in the above embodiments are all viewed from the upper side of the side view of the gas splitting nozzle toward the gas splitting nozzle. From the side view of the gas splitting nozzle shown in the above embodiment, it can be seen that the various gas passages of the gas splitting nozzle of the foregoing embodiment (ie, the first gas passage, the second gas passage, and the third gas passage) are vertically disposed at The gas distribution layer (or disk-shaped body), that is, perpendicular to the top surface and the bottom surface of the gas distribution layer (or the disk-shaped body), is disposed in the gas distribution layer (or the disk-shaped body), but like the tenth figure In the gas splitting nozzle 300 shown, various gas passages (ie, the first gas passage, the second gas passage, and the third gas passage) may be disposed in a skewed manner on the gas distribution layer (or the disc-shaped body), that is, The gas split layer 102A (or the disk-shaped body) is disposed perpendicular to the top and bottom surfaces of the gas split layer 102A (or the disk-shaped body).

本發明之氣體分流噴頭也可以採取由前述各種實施例所揭示具有單層結構的氣體分流層堆疊組成一具有多層結構的氣體分流噴頭的設計,由於這樣每一單層皆能進行氣體分流的多層結構氣體分流噴頭,可以對更多氣體進行分流,而使有機金屬器相沈積製程更多元化與更具彈性。在這樣一個多層結構的氣體分流噴頭的設計,係採取該氣體分流噴頭包含至少一第二氣體分流層堆疊於一(第一)氣體分流層(即前述實施例中所示的氣體分流層102、102A)上此一原理進行設計。參照第十一A圖,其為本發明之具有單層結構的氣體分流層堆疊組成的多層結構氣體分流噴頭400的側視圖。在氣體分流噴頭400包含了兩個具有單層結構的氣體分流層,即(第一)氣體分流層1021與第二氣體分流層1022,而由(第一)氣體分流層1021與第二氣體分流層1022堆疊而形成,雖然在第十一A圖中,氣體分流噴頭400是由是(第一)氣體分流層1021堆疊於第二氣體分流層1022上而組成,但是並不以此為限,也可以是由第二氣體分流層1022堆疊於(第一)氣體分流層1021上而組成。如同前述實施例所示之單層結構的體分流層102 、102A,(第一)氣體分流層1021與第二氣體分流層1022皆包含一圓盤狀主體、複數條第一氣體通道108、複數條第二氣體通道110、以及複數條第三氣體通道112,這單層結構的組成以於前文詳述,於此不再贅述。另外,雖然在第十一A圖中,第二氣體分流層1022中的第一氣體通道、第二氣體通道、第三氣體通道的排列與(第一)氣體分流層1021中的第一氣體通道、第二氣體通道、第三氣體通道的排列相同,即(第一)氣體分流層1021與第二氣體分流層1022皆採用前述第二圖所示之氣體分流層102中的氣體通道排列,但是並不以此為限,而是可以依照需求採取前述任何實施例之氣體通道排列與經過對其簡單變化的氣體通道排列。另外,雖然在第十一A圖所示之氣體分流噴頭400中,僅具有兩層單層結構的氣體分流層,但是並不以此為限,而是可以依照需求增加氣體分流層的數量,此一數量上的變化為第十一A圖所示之實施例的簡單變化,所以應屬於本發明之範疇與專利範圍。The gas splitting nozzle of the present invention can also adopt a gas shunting nozzle having a single layer structure disclosed in the foregoing various embodiments to form a gas shunting head having a multi-layer structure, since each single layer can perform gas shunting multiple layers. The structured gas splitting nozzle can split more gases, making the organometallic phase deposition process more diversified and more flexible. In the design of such a multi-layer gas split nozzle, the gas split nozzle comprises at least one second gas split layer stacked on a (first) gas split layer (ie, the gas split layer 102 shown in the foregoing embodiment, 102A) Designed on this principle. Referring to Fig. 11A, there is shown a side view of a multi-layer structure gas splitting nozzle 400 comprising a single-layered gas split layer stack. The gas splitting nozzle 400 comprises two gas split layers having a single layer structure, namely a (first) gas split layer 1021 and a second gas split layer 1022, and a (first) gas split layer 1021 and a second gas split. The layer 1022 is formed by stacking, although in the eleventh A, the gas splitting nozzle 400 is composed of a (first) gas split layer 1021 stacked on the second gas split layer 1022, but is not limited thereto. It may also be composed of a second gas split layer 1022 stacked on the (first) gas split layer 1021. As with the single-layered body split layer 102, 102A shown in the previous embodiment, the (first) gas split layer 1021 and the second gas split layer 1022 each comprise a disk-shaped body, a plurality of first gas channels 108, and a plurality The second gas channel 110 and the plurality of third gas channels 112, the composition of the single layer structure is as detailed in the foregoing, and will not be further described herein. In addition, although in FIG. 11A, the arrangement of the first gas passage, the second gas passage, and the third gas passage in the second gas split layer 1022 and the first gas passage in the (first) gas split layer 1021 The arrangement of the second gas passage and the third gas passage is the same, that is, the (first) gas split layer 1021 and the second gas split layer 1022 are all arranged by the gas passages in the gas split layer 102 shown in the second figure, but Rather than being limited thereto, the gas channel arrangement of any of the foregoing embodiments may be employed as desired, and the gas channel arrangement through which it is simply varied may be employed. In addition, although the gas splitting nozzle 400 shown in FIG. 11A has only two gas layer split layers of a single layer structure, it is not limited thereto, and the number of gas split layers can be increased according to requirements. This change in quantity is a simple change of the embodiment shown in Fig. 11A, and therefore should fall within the scope and patent scope of the present invention.

其次,本發明之多層結構氣體分流噴頭也可採取由具有不同氣體通道排列的單層結構氣體分流層堆疊而成的設計。參照第十一B圖,氣體分流噴頭400A同樣由一(第一)氣體分流層1021與第二氣體分流層1023堆疊而成,但是與第十一A圖所示之氣體分流噴頭400不同的是,第二氣體分流層1023中的第一氣體通道、第二氣體通道、第三氣體通道的排列與(第一)氣體分流層1021中的第一氣體通道、第二氣體通道、第三氣體通道的排列不相同,即(第一)氣體分流層1021採用前述第二圖所示之氣體分流層102中的氣體通道排列,而第二氣體分流層1023皆採用前述第六圖所示之氣體分流層102中的氣體通道排列,但是並不以此為限,而是可以依照需求採取前述任何實施例之氣體通道排列與經過對其簡單變化的氣體通道排列進行組合。雖然在第十一B圖中,氣體分流噴頭400是由是(第一)氣體分流層1021堆疊於第二氣體分流層1023上而組成,但是並不以此為限,也可以是由第二氣體分流層1023堆疊於(第一)氣體分流層1021上而組成,並且雖然氣體分流噴頭400中僅具有兩層單層結構的氣體分流層,但是並不以此為限,而是可以依照需求增加氣體分流層的數量,此一數量上的變化為第十一B圖所示之實施例的簡單變化,所以應屬於本發明之範疇與專利範圍。Secondly, the multi-layer structure gas split nozzle of the present invention can also adopt a design in which a single-layer structure gas split layer having different gas passages is stacked. Referring to FIG. 11B, the gas split nozzle 400A is also formed by stacking a (first) gas split layer 1021 and a second gas split layer 1023, but differs from the gas split nozzle 400 shown in FIG. The arrangement of the first gas channel, the second gas channel, and the third gas channel in the second gas distribution layer 1023 and the first gas channel, the second gas channel, and the third gas channel in the (first) gas distribution layer 1021. The arrangement is different, that is, the (first) gas split layer 1021 is arranged by the gas passages in the gas split layer 102 shown in the second figure, and the second gas split layer 1023 is formed by the gas split shown in the sixth figure. The gas passages in layer 102 are arranged, but not limited thereto, and the gas passage arrangement of any of the foregoing embodiments may be combined with the gas passage arrangement for which it is simply varied, as desired. Although in FIG. 11B, the gas splitting nozzle 400 is composed of a (first) gas split layer 1021 stacked on the second gas split layer 1023, but not limited thereto, or may be a second The gas distribution layer 1023 is stacked on the (first) gas distribution layer 1021, and although the gas distribution nozzle 400 has only two layers of a single-layer gas distribution layer, it is not limited thereto, but may be required according to requirements. Increasing the number of gas split layers, which is a simple change of the embodiment shown in Fig. 11B, should fall within the scope and patent scope of the present invention.

有鑑於上述實施例,本發明提供了一種應用於化學氣相沈積裝置的氣體分流噴頭,其以單層結構即可以進行(反應)氣體分流而將其由同一水平面側向噴出,而不需以多層結構(即三重噴頭設計)進行氣體流,從而可以短各種反應氣體於反應室內均勻擴散所需的時間與縮減噴頭的體積(特別是縮減縱向的長度或體積)。In view of the above embodiments, the present invention provides a gas splitting nozzle applied to a chemical vapor deposition apparatus, which can perform a (reaction) gas splitting and laterally ejecting it from the same horizontal plane in a single layer structure without The multi-layer structure (i.e., the triple nozzle design) performs a gas flow so that the time required for the uniform diffusion of various reaction gases in the reaction chamber can be shortened and the volume of the nozzle can be reduced (especially by reducing the length or volume in the longitudinal direction).

10 習知噴頭 12 上管 14 中管 16 下管 18 基板 100、100A、100B、100C、100D 氣體分流噴頭 102、102A 氣體分流層 104圓盤狀主體 106 圓形開孔 108 第一氣體通道 110 第二氣體通道 112 第三氣體通道 114 氣體通道隔塊 200、200A、200B、200C、200D、200E氣體分流噴頭 300 氣體分流噴頭 400、400A 氣體分流噴頭 1021 氣體分流層 1022、1023 第二氣體分流層 A 第一氣體通道組合 B 第二氣體通道組合10 Conventional nozzle 12 Upper tube 14 Middle tube 16 Lower tube 18 Substrate 100, 100A, 100B, 100C, 100D Gas splitting nozzle 102, 102A Gas split layer 104 Disc-shaped body 106 Circular opening 108 First gas channel 110 Two gas channels 112 third gas channels 114 gas channel spacers 200, 200A, 200B, 200C, 200D, 200E gas splitting nozzles 300 gas splitting nozzles 400, 400A gas splitting nozzles 1021 gas splitting layers 1022, 1023 second gas splitting layer A First gas channel combination B second gas channel combination

第一圖為應用於有機金屬化學氣相沈積反應器的習知噴頭之側視圖。 第二圖為本發明之一實施例之應用於化學氣相沈積裝置的氣體分流噴頭之俯視圖與側視圖。 第三A圖與第三B圖為本發明之另一實施例之應用於化學氣相沈積裝置的氣體分流噴頭之俯視圖與側視圖。 第四A圖與第四B圖為本發明之又一實施例之應用於化學氣相沈積裝置的氣體分流噴頭之俯視圖與側視圖。 第五A圖與第五B圖為本發明之又一實施例之應用於化學氣相沈積裝置的氣體分流噴頭之俯視圖與側視圖。 第六圖為本發明之一實施例之應用於化學氣相沈積裝置且具有氣體通道隔塊的氣體分流噴頭之俯視圖與側視圖。 第七圖為本發明之另一實施例之應用於化學氣相沈積裝置且具有氣體通道隔塊的氣體分流噴頭之俯視圖與側視圖。 第八A圖與第八B圖為本發明之又一實施例之應用於化學氣相沈積裝置且具有氣體通道隔塊的氣體分流噴頭之俯視圖與側視圖。 第九A圖與第九B圖為本發明之又一實施例之應用於化學氣相沈積裝置且具有氣體通道隔塊的氣體分流噴頭之俯視圖與側視圖。 第十圖為本發明之一實施例之應用於化學氣相沈積裝置且其內氣體通道為歪斜的氣體分流噴頭之側視圖。 第十一A圖與第十一B圖為本發明之又一實施例之應用於化學氣相沈積裝置氣體分流噴頭之俯視圖與側視圖,其多個可以進行氣體分流得單層結構所組成。The first figure is a side view of a conventional spray head applied to an organometallic chemical vapor deposition reactor. The second figure is a plan view and a side view of a gas splitting nozzle applied to a chemical vapor deposition apparatus according to an embodiment of the present invention. 3A and 3B are top and side views of a gas splitting nozzle applied to a chemical vapor deposition apparatus according to another embodiment of the present invention. 4A and 4B are top and side views of a gas splitting nozzle applied to a chemical vapor deposition apparatus according to still another embodiment of the present invention. 5A and 5B are top and side views of a gas splitting nozzle applied to a chemical vapor deposition apparatus according to still another embodiment of the present invention. Figure 6 is a plan view and a side view of a gas split nozzle having a gas passage spacer applied to a chemical vapor deposition apparatus according to an embodiment of the present invention. Figure 7 is a plan view and a side view of a gas split nozzle having a gas passage spacer applied to a chemical vapor deposition apparatus according to another embodiment of the present invention. 8A and 8B are top and side views of a gas splitting nozzle for a chemical vapor deposition apparatus having a gas passage spacer according to still another embodiment of the present invention. 9A and 9B are top and side views of a gas split nozzle having a gas passage spacer applied to a chemical vapor deposition apparatus according to still another embodiment of the present invention. Figure 11 is a side elevational view of a gas splitting nozzle for use in a chemical vapor deposition apparatus having a gas channel that is skewed in accordance with an embodiment of the present invention. 11A and 11B are top and side views of a gas splitting nozzle applied to a chemical vapor deposition apparatus according to still another embodiment of the present invention, wherein a plurality of gas-flowing single-layer structures are formed.

100 氣體分流噴頭 102 氣體分流層 104圓盤狀主體 106 圓形開孔 108 第一氣體通道 110 第二氣體通道 112 第三氣體通道100 gas split nozzle 102 gas split layer 104 disc-shaped body 106 circular opening 108 first gas passage 110 second gas passage 112 third gas passage

Claims (8)

一種應用於化學氣相沈積裝置的氣體分流噴頭,包含: 一氣體分流層,用以分流不同的氣體而將其由同一水平面側向噴出,該氣體分流層包含: 一圓盤狀主體,其中心位置具有一圓形開孔,用以容置一佈氣裝置以及供其氣體通行; 複數條第一氣體通道,由該圓盤狀主體的中心位置向該圓盤狀主體的周邊延伸而呈放射狀排列,用以將第一氣體由該圓盤狀主體的中心位置向該圓盤狀主體的周邊輸送,而橫向噴出; 複數條第二氣體通道,由該圓盤狀主體的中心位置向該圓盤狀主體的周邊延伸而呈放射狀排列,用以將第二氣體由該圓盤狀主體的中心位置向該圓盤狀主體的周邊輸送,而橫向噴出;以及 複數條第三氣體通道,由該圓盤狀主體的中心位置向該圓盤狀主體的周邊延伸而呈放射狀排列,用以將第三氣體由該圓盤狀主體的中心位置向該圓盤狀主體的周邊輸送,而橫向噴出; 其中,該等第一氣體通道、該等第二氣體通道、以及該等第三氣體通道皆設置於該圓盤狀主體內的同一水平面上且成對稱分佈,藉此,不同的氣體可以經由不同氣體通道與同一水平面上橫向噴出。A gas split nozzle for a chemical vapor deposition apparatus, comprising: a gas split layer for splitting different gases and laterally ejecting them from the same horizontal plane, the gas split layer comprising: a disc-shaped body, the center thereof The position has a circular opening for accommodating a gas distribution device and for allowing gas to pass therethrough; a plurality of first gas passages extending from a central position of the disk-shaped body toward the periphery of the disk-shaped body Arranging the first gas from the central position of the disc-shaped body to the periphery of the disc-shaped body and laterally ejecting; a plurality of second gas passages from the center position of the disc-shaped body The periphery of the disc-shaped body extends radially and is arranged to transport the second gas from the central position of the disc-shaped body to the periphery of the disc-shaped body to be laterally ejected; and a plurality of third gas passages, Arranging radially from a center position of the disc-shaped body toward a periphery of the disc-shaped body for guiding a third gas from a center position of the disc-shaped body toward a circumference of the disc-shaped body The first gas passage, the second gas passages, and the third gas passages are disposed on the same horizontal plane in the disc-shaped body and are symmetrically distributed. Different gases can be ejected laterally on the same level via different gas channels. 根據申請專利範圍第1項所述之應用於化學氣相沈積裝置的氣體分流噴頭,其中該第一氣體為Ⅲ族氣體,該第二氣體與該第三氣體皆為Ⅴ族氣體,並以氫氣(H 2)或氮氣(N 2)做為運載氣體(carrier gas)。 The gas splitting nozzle applied to the chemical vapor deposition apparatus according to claim 1, wherein the first gas is a group III gas, and the second gas and the third gas are both a group V gas and hydrogen gas. (H 2 ) or nitrogen (N 2 ) is used as a carrier gas. 根據申請專利範圍第1項所述之應用於化學氣相沈積裝置的氣體分流噴頭,其中該等第一氣體通道、該等第二氣體通道、以及該等第三氣體通道以每相鄰兩第一氣體通道間至少夾有一第二氣體通道或第三氣體通道的方式,而排列於該氣體分流層中。A gas splitting nozzle for use in a chemical vapor deposition apparatus according to claim 1, wherein the first gas passage, the second gas passage, and the third gas passage are each adjacent to each other A gas channel or a third gas channel is interposed between at least one gas channel, and is arranged in the gas distribution layer. 根據申請專利範圍第3項所述之應用於化學氣相沈積裝置的氣體分流噴頭,其中該等第一氣體通道、該等第二氣體通道、以及該等第三氣體通道以第一氣體通道、第二氣體通道、第一氣體通道、第三氣體通道此一排列順序為一週期,而循環排列於該氣體分流層中。A gas split nozzle for use in a chemical vapor deposition apparatus according to claim 3, wherein the first gas passages, the second gas passages, and the third gas passages are in a first gas passage, The second gas passage, the first gas passage, and the third gas passage are arranged in a cycle in a cycle and are arranged in the gas distribution layer. 根據申請專利範圍第1項所述之應用於化學氣相沈積裝置的氣體分流噴頭,其中該等第一氣體通道、該等第二氣體通道、以及該等第三氣體通道以每相鄰兩第一氣體通道間夾有至少一第二氣體通道與至少一第三氣體通道的方式,而循環排列於該氣體分流層中。A gas splitting nozzle for use in a chemical vapor deposition apparatus according to claim 1, wherein the first gas passage, the second gas passage, and the third gas passage are each adjacent to each other A gas channel is sandwiched between at least one second gas channel and at least one third gas channel, and is cyclically arranged in the gas distribution layer. 根據申請專利範圍第5項所述之應用於化學氣相沈積裝置的氣體分流噴頭,其中每相鄰兩第一氣體通道間的第二氣體通道與該第三氣體通道係以彼此輪替的方式排列。A gas splitting nozzle applied to a chemical vapor deposition apparatus according to claim 5, wherein the second gas passage and the third gas passage between each adjacent two first gas passages are alternated with each other arrangement. 根據申請專利範圍第5項所述之應用於化學氣相沈積裝置的氣體分流噴頭,其中每相鄰兩第一氣體通道間的第二氣體通道與該第三氣體通道係以每兩相鄰之第二氣體通道之間夾有至少一第三氣體通道的方式而排列於其中。The gas splitting nozzle applied to the chemical vapor deposition apparatus according to claim 5, wherein the second gas passage and the third gas passage between each adjacent two first gas passages are adjacent to each other. The second gas passages are arranged in such a manner that at least one third gas passage is sandwiched between them. 根據申請專利範圍第5項所述之應用於化學氣相沈積裝置的氣體分流噴頭,其中每相鄰兩第一氣體通道間的第二氣體通道與該第三氣體通道係以每兩相鄰之第三氣體通道之間夾有至少一第二氣體通道第一氣體通道的方式而排列於其中。The gas splitting nozzle applied to the chemical vapor deposition apparatus according to claim 5, wherein the second gas passage and the third gas passage between each adjacent two first gas passages are adjacent to each other. The third gas passages are arranged with the at least one second gas passage first gas passage interposed therebetween.
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