TWI596318B - Optical inspection system and optical imaging system - Google Patents

Optical inspection system and optical imaging system Download PDF

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Publication number
TWI596318B
TWI596318B TW105100922A TW105100922A TWI596318B TW I596318 B TWI596318 B TW I596318B TW 105100922 A TW105100922 A TW 105100922A TW 105100922 A TW105100922 A TW 105100922A TW I596318 B TWI596318 B TW I596318B
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Taiwan
Prior art keywords
light source
light
lens
opening
source module
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TW105100922A
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Chinese (zh)
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TW201725356A (en
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王湧鋒
余良彬
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德律科技股份有限公司
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Priority to TW105100922A priority Critical patent/TWI596318B/en
Priority to JP2016121142A priority patent/JP6444945B2/en
Priority to KR1020160078474A priority patent/KR101895593B1/en
Publication of TW201725356A publication Critical patent/TW201725356A/en
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Publication of TWI596318B publication Critical patent/TWI596318B/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0414Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using plane or convex mirrors, parallel phase plates, or plane beam-splitters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/08Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/021Mountings, adjusting means, or light-tight connections, for optical elements for lenses for more than one lens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G01J2001/4252Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's

Description

光學測量系統以及光學成像系統 Optical measurement system and optical imaging system

本發明是關於一種光學測量系統以及光學成像系統。 The present invention relates to an optical measurement system and an optical imaging system.

近年來由於元件尺寸縮小,發展出許多自動化高精度檢測設備,用來檢測各種微小零件甚至是各種樣品。這些檢測設備藉由檢測待測樣品反射的光線,來取得待測樣品的資訊。其中,如何將光源與感光元件皆設置於檢測設備的光路上是重要的課題。 In recent years, due to the reduction in component size, many automated high-precision testing devices have been developed to detect various small parts and even various samples. These detecting devices obtain information of the sample to be tested by detecting the light reflected by the sample to be tested. Among them, how to set the light source and the photosensitive element on the optical path of the detecting device is an important issue.

在一部分檢測設備中,往往設置有分光鏡,藉以耦合光源的光線傳送路徑與感光元件的接收光線的傳送路徑,以使反射光線能夠有效地被感光元件擷取。然而,分光鏡的設置往往會降低光線強度,致使光源的能量耗損嚴重。此外,由於光線傳送路徑的耦合過程中光源往往直接設置於光軸上,光源內的發光二極體晶粒可能產生影像,而可能在偵測過程中觀察到鬼影。 In some of the detecting devices, a beam splitter is often provided to couple the light transmitting path of the light source with the light receiving path of the photosensitive element so that the reflected light can be efficiently captured by the photosensitive element. However, the setting of the beam splitter tends to reduce the light intensity, resulting in a serious energy loss of the light source. In addition, since the light source is often directly disposed on the optical axis during the coupling process of the light transmission path, the light-emitting diode dies in the light source may generate images, and ghosts may be observed during the detection process.

在另一部分檢測設備中,將光源設置於檢測設備的最前端,以就近地照射待測樣品,並設置光源離軸以免遮擋 待測樣品反射光線。然而,此設計可能會導致光源的光線過斜而使反射光線落在感光元件的接收範圍之外,造成無法感測的情況。 In another part of the detecting device, the light source is disposed at the foremost end of the detecting device to illuminate the sample to be tested in close proximity, and the light source is disposed off-axis to prevent occlusion The sample to be tested reflects light. However, this design may cause the light of the light source to be too oblique and cause the reflected light to fall outside the receiving range of the photosensitive element, resulting in an unsensible condition.

本發明之部分實施方式提供一種光學測量系統,其設計光源模組具有開口,並將此光源模組設置於光學測量系統的孔徑光欄的位置,使光源模組可以在不影響待測樣品反射光線的情況下盡量靠近光學測量系統的光軸。如此一來,光源模組可以提供接近正向入射的光線,而使反射光線能落在感光元件的接收範圍之內,且不會因為分光鏡的使用而使能量耗損嚴重,也可避免因為光源直接設置於光軸上而產生鬼影的問題。此外,在部分情況下,待測樣品表面不甚平整時,相較於完全正向入射的光線,此接近正向入射的光線其反射光線較容易落在感光元件的接收範圍之內,有利於光學測量系統的偵測。 Some embodiments of the present invention provide an optical measuring system, wherein the light source module has an opening, and the light source module is disposed at the position of the aperture diaphragm of the optical measuring system, so that the light source module can not affect the reflection of the sample to be tested. In the case of light, try to be as close as possible to the optical axis of the optical measurement system. In this way, the light source module can provide light near the forward incidence, so that the reflected light can fall within the receiving range of the photosensitive element, and the energy consumption is not seriously caused by the use of the beam splitter, and the light source can be avoided. The problem of ghosting occurs directly on the optical axis. In addition, in some cases, when the surface of the sample to be tested is not flat, compared with the light that is completely positively incident, the light that is close to the forward incidence is more likely to fall within the receiving range of the photosensitive element, which is beneficial to Detection of optical measurement systems.

本發明之部分實施方式提供一種光學成像系統,其設計光源模組具有開口,光源模組可以提供接近正向入射的光線,光源模組可透過透鏡成像於待測物上。在部分情況下,待測樣品表面過於不平整時,相較於完全正向入射的光線,此接近正向入射的光線所形成的辨識圖案,有利於識別。 Some embodiments of the present invention provide an optical imaging system, wherein the light source module has an opening, and the light source module can provide light that is near normal incidence, and the light source module can be imaged on the object to be tested through the lens. In some cases, when the surface of the sample to be tested is too uneven, the identification pattern formed by the near-positive light is advantageous for recognition compared to the light that is completely incident.

本發明之部分實施方式中,光學測量系統包含透鏡模組、光源模組以及感光元件。透鏡模組包含第一透鏡組件以及第二透鏡組件。第一透鏡組件設置於第二透鏡組件與物側 之間,且第一透鏡組件與第二透鏡組件共同具有光軸。光源模組設置於第一透鏡組件與第二透鏡組件之間,其中光源模組具有開口,光軸穿過開口,光源模組用以經第一透鏡組件朝向物側發出光線。感光元件位於透鏡模組相對物側的一側,其中感光元件用以接收來自物側經透鏡模組與光源模組之開口之物體光線。 In some embodiments of the present invention, an optical measurement system includes a lens module, a light source module, and a photosensitive element. The lens module includes a first lens assembly and a second lens assembly. The first lens assembly is disposed on the second lens assembly and the object side Between, and the first lens assembly and the second lens assembly have an optical axis in common. The light source module is disposed between the first lens component and the second lens component, wherein the light source module has an opening, and the light axis passes through the opening, and the light source module is configured to emit light toward the object side through the first lens component. The photosensitive element is located on a side opposite to the object side of the lens module, wherein the photosensitive element is configured to receive light from the object side through the opening of the lens module and the light source module.

本發明之部分實施方式中,光學成像系統包含透鏡模組以及光源模組。透鏡模組設置於一待測物與一感光側之間且具有光軸。光源模組設置於該透鏡模組與該感光側之間,光源模組具有開口,透鏡模組之光軸穿過開口,光源模組用以將圖像經透鏡模組成像於待測物上,以使待測物將圖像反射至感光側。 In some embodiments of the present invention, an optical imaging system includes a lens module and a light source module. The lens module is disposed between a test object and a photosensitive side and has an optical axis. The light source module is disposed between the lens module and the photosensitive side, the light source module has an opening, the optical axis of the lens module passes through the opening, and the light source module is configured to image the image on the object to be tested through the lens module So that the object to be tested reflects the image to the photosensitive side.

100‧‧‧光學測量系統 100‧‧‧Optical measuring system

110‧‧‧透鏡模組 110‧‧‧ lens module

112‧‧‧第一透鏡組件 112‧‧‧First lens assembly

114‧‧‧第二透鏡組件 114‧‧‧Second lens assembly

120‧‧‧光源模組 120‧‧‧Light source module

122‧‧‧開口 122‧‧‧ openings

310‧‧‧透鏡模組 310‧‧‧Lens module

320‧‧‧光源模組 320‧‧‧Light source module

322‧‧‧開口 322‧‧‧ openings

324‧‧‧光源 324‧‧‧Light source

326‧‧‧鏡體 326‧‧‧Mirror body

326a‧‧‧開口 326a‧‧‧ openings

124‧‧‧光源 124‧‧‧Light source

124a‧‧‧光源 124a‧‧‧Light source

124b‧‧‧光源 124b‧‧‧Light source

126‧‧‧載體 126‧‧‧ Carrier

126a‧‧‧開口 126a‧‧‧ openings

126b‧‧‧凹槽 126b‧‧‧ Groove

126c‧‧‧底面 126c‧‧‧ bottom

126d‧‧‧壁面 126d‧‧‧ wall

127‧‧‧反射層 127‧‧‧reflective layer

128‧‧‧光學膜 128‧‧‧Optical film

129‧‧‧鏡體 129‧‧‧Mirror body

129a‧‧‧開口 129a‧‧‧ openings

129b‧‧‧表面 129b‧‧‧ surface

130‧‧‧感光元件 130‧‧‧Photosensitive elements

200‧‧‧物側 200‧‧‧ object side

300‧‧‧光學成像系統 300‧‧‧Optical imaging system

328‧‧‧光源透鏡件 328‧‧‧Light source lens

400‧‧‧待測物 400‧‧‧Test objects

500‧‧‧感光側 500‧‧‧Photosensitive side

O1‧‧‧光軸 O1‧‧‧ optical axis

O2‧‧‧光軸 O2‧‧‧ optical axis

P1‧‧‧第一部分 P1‧‧‧Part 1

P2‧‧‧第二部分 P2‧‧‧ Part II

P3‧‧‧第三部分 P3‧‧‧Part III

P4‧‧‧第四部分 P4‧‧‧Part IV

SL‧‧‧光線 SL‧‧‧Light

PL‧‧‧光線 PL‧‧‧Light

OL‧‧‧物體光線 OL‧‧‧ object light

SL1‧‧‧光線 SL1‧‧‧Light

SL2‧‧‧光線 SL2‧‧‧Light

RA‧‧‧表面區域 RA‧‧‧Surface area

RB‧‧‧表面區域 RB‧‧‧ surface area

第1A圖為根據本發明之一實施方式之光學測量系統之示意圖。 1A is a schematic illustration of an optical measurement system in accordance with an embodiment of the present invention.

第1B圖為第1A圖之光學測量系統之光源模組之正視圖。 Figure 1B is a front elevational view of the light source module of the optical measurement system of Figure 1A.

第1C圖為第1B圖之光學測量系統之光源模組之剖面圖。 Figure 1C is a cross-sectional view of the light source module of the optical measurement system of Figure 1B.

第1D圖為根據本發明之另一實施方式之光學測量系統之光源模組之剖面圖。 1D is a cross-sectional view of a light source module of an optical measuring system in accordance with another embodiment of the present invention.

第2A圖為根據本發明之又一實施方式之光學測量系統之光源模組之正視圖。 2A is a front elevational view of a light source module of an optical measurement system in accordance with yet another embodiment of the present invention.

第2B圖為第2A圖之光學測量系統之光源模組之操作示意圖。 Figure 2B is a schematic diagram of the operation of the light source module of the optical measuring system of Figure 2A.

第2C圖為根據本發明之再一實施方式之光學測量系統之光源模組之正視圖。 2C is a front elevational view of a light source module of an optical measuring system in accordance with still another embodiment of the present invention.

第3A圖為根據本發明之另一實施方式之光學測量系統之示意圖。 Figure 3A is a schematic illustration of an optical measurement system in accordance with another embodiment of the present invention.

第3B圖為根據本發明之又一實施方式之光學測量系統之示意圖。 Figure 3B is a schematic illustration of an optical measurement system in accordance with yet another embodiment of the present invention.

第3C圖為根據本發明之另一實施方式之光學測量系統之光源模組之示意圖。 3C is a schematic diagram of a light source module of an optical measurement system in accordance with another embodiment of the present invention.

第4A圖為根據本發明之再一實施方式之光學測量系統之示意圖。 Figure 4A is a schematic illustration of an optical measurement system in accordance with yet another embodiment of the present invention.

第4B圖為根據本發明之另一實施方式之光學測量系統之示意圖。 Figure 4B is a schematic illustration of an optical measurement system in accordance with another embodiment of the present invention.

第4C圖為根據本發明之又一實施方式之光學測量系統之示意圖。 Figure 4C is a schematic illustration of an optical measurement system in accordance with yet another embodiment of the present invention.

第5A圖為根據本發明之一實施方式之光學成像系統之示意圖。 Figure 5A is a schematic illustration of an optical imaging system in accordance with an embodiment of the present invention.

第5B圖為根據本發明之另一實施方式之光學成像系統之示意圖。 Figure 5B is a schematic illustration of an optical imaging system in accordance with another embodiment of the present invention.

以下將以圖式揭露本發明之多個實施方式,為明確說明起見,許多實務上的細節將在以下敘述中一併說明。然 而,應瞭解到,這些實務上的細節不應用以限制本發明。也就是說,在本發明部分實施方式中,這些實務上的細節是非必要的。此外,為簡化圖式起見,一些習知慣用的結構與元件在圖式中將以簡單示意的方式為之。 The various embodiments of the present invention are disclosed in the drawings, and in the claims Of course However, it should be understood that these practical details are not intended to limit the invention. That is, in some embodiments of the invention, these practical details are not necessary. In addition, some of the conventional structures and elements are shown in the drawings in a simplified manner.

第1A圖為根據本發明之一實施方式之光學測量系統100之示意圖。光學測量系統100包含透鏡模組110、光源模組120以及感光元件130。透鏡模組110包含第一透鏡組件112以及第二透鏡組件114。第一透鏡組件112設置於第二透鏡組件114與物側200之間,且第一透鏡組件112與第二透鏡組件114共同具有光軸O1。光源模組120設置於第一透鏡組件112與第二透鏡組件114之間,其中光源模組120具有開口122,光軸O1穿過開口122,光源模組120用以經第一透鏡組件112朝向物側200發出光線SL。感光元件130位於透鏡模組110相對物側200的一側,其中感光元件130用以接收來自物側200經透鏡模組110與光源模組120之開口122之物體光線OL。 1A is a schematic illustration of an optical measurement system 100 in accordance with an embodiment of the present invention. The optical measurement system 100 includes a lens module 110, a light source module 120, and a photosensitive element 130. The lens module 110 includes a first lens assembly 112 and a second lens assembly 114. The first lens assembly 112 is disposed between the second lens assembly 114 and the object side 200, and the first lens assembly 112 and the second lens assembly 114 have an optical axis O1 in common. The light source module 120 is disposed between the first lens assembly 112 and the second lens assembly 114. The light source module 120 has an opening 122. The optical axis O1 passes through the opening 122. The light source module 120 is configured to face the first lens assembly 112. The object side 200 emits light SL. The photosensitive element 130 is located on a side opposite to the object side 200 of the lens module 110. The photosensitive element 130 is configured to receive the object light OL from the object side 200 through the lens module 110 and the opening 122 of the light source module 120.

光學測量系統100中設有孔徑光欄(Aperture Stop)於光學測量系統100中光束直徑最小的位置,以限制經過透鏡模組110的直徑大小。於本實施方式中,第一透鏡組件112與第二透鏡組件114共焦,而形成共焦系統。孔徑光欄(Aperture Stop)即設置於第一透鏡組件112與第二透鏡組件114的共焦位置。於本發明之一或多個實施方式中,光源模組120置於光學測量系統100之孔徑光欄(Aperture Stop)位置。更精確而言,光源模組120的開口122的最窄部分是為孔徑光欄。換句話說,光源模組120之開孔可作為光學測量系統100 之光圈。在此,僅以雙遠心鏡系統為例,但不應以此限制本發明之範圍,光源模組120可以於其他系統中的孔徑光欄的位置,同時達到照明與限制光路大小的功效。 The optical measurement system 100 is provided with an aperture stop in the optical measurement system 100 where the beam diameter is the smallest to limit the diameter of the lens module 110. In the present embodiment, the first lens assembly 112 is confocal with the second lens assembly 114 to form a confocal system. An aperture stop is disposed at a confocal position of the first lens assembly 112 and the second lens assembly 114. In one or more embodiments of the present invention, the light source module 120 is placed in an Aperture Stop position of the optical measurement system 100. More precisely, the narrowest portion of the opening 122 of the light source module 120 is an aperture stop. In other words, the opening of the light source module 120 can be used as the optical measurement system 100. The aperture. Here, the dual telecentric system is taken as an example, but the scope of the present invention should not be limited thereto. The light source module 120 can achieve the effect of illuminating and limiting the size of the optical path at the same position of the aperture diaphragm in other systems.

在偵測物側200的待測物時,光源模組120提供光線SL給物側200,光線SL經過第一透鏡組件112而傳到物側200的待測樣品上,經待測樣品反射後,物體光線OL經過第一透鏡組件112、光源模組120的開口122以及第二透鏡組件114而傳送至感光元件130,其中待測樣品的表面資訊可以透過透鏡模組110而成像於感光元件130上,藉以使感光元件130取得待測樣品的資訊。 When detecting the object to be tested on the object side 200, the light source module 120 provides the light beam SL to the object side 200, and the light beam SL passes through the first lens assembly 112 and is transmitted to the sample to be tested on the object side 200, after being reflected by the sample to be tested. The object light OL is transmitted to the photosensitive element 130 through the first lens assembly 112, the opening 122 of the light source module 120, and the second lens assembly 114. The surface information of the sample to be tested can be imaged by the lens module 110 to the photosensitive element 130. In the above, the photosensitive element 130 obtains information of the sample to be tested.

詳細而言,於本發明之多個實施方式中,待測樣品(位於物側200)、透鏡模組110、感光元件130的位置以及透鏡模組110的內部元件設置可符合成像公式。在此,以薄透鏡為例,將透鏡模組110視為焦距為f的薄透鏡,則為了達到成像的目的,待測樣品以及感光元件130的配置滿足薄透鏡成像公式:u-1+v-1=f-1。其中u為待測樣品至此薄透鏡的距離,v為感光元件130至此薄透鏡的距離。實際應用上,由於透鏡具有一定的厚度,且需考慮透鏡組的厚度,因此不應以該薄透鏡成像公式為限。 In detail, in various embodiments of the present invention, the sample to be tested (located on the object side 200), the position of the lens module 110, the photosensitive element 130, and the internal component arrangement of the lens module 110 may conform to an imaging formula. Here, taking the thin lens as an example, the lens module 110 is regarded as a thin lens with a focal length f, and in order to achieve the purpose of imaging, the sample to be tested and the configuration of the photosensitive element 130 satisfy the thin lens imaging formula: u -1 + v -1 =f -1 . Where u is the distance from the sample to be tested to the thin lens, and v is the distance from the photosensitive element 130 to the thin lens. In practical applications, since the lens has a certain thickness and the thickness of the lens group needs to be considered, it should not be limited to the thin lens imaging formula.

本發明之多個實施方式中,一方面,藉由設置具有開口122的光源模組120,使光源模組120的光線SL傳送路徑可以與感光元件130的接收物體光線OL的傳送路徑位在同一光路上,即光束的中心大致重合,光學測量系統100不會因為分光鏡的使用而使能量耗損嚴重,也可避免因為光源直接設 置於光軸O1上而產生鬼影的問題。另一方面,藉由將光源模組120設置於光學測量系統100之孔徑光欄的位置,光源模組120可以在不影響或阻擋物體光線OL的情況下盡量靠近光學測量系統100的光軸O1,而使光源模組120可以提供接近正向入射物側200的光線(例如:光線SL經過第一透鏡組件112後的前進方向與光軸O1的夾角在±0.1度至±10度的範圍內、±0.1度至±5度角的範圍內、±0.1度至±3度的範圍內等等)。於部分實施方式中,經過第一透鏡組件112後的光線可約略地排除完全正向入射的光線(光線前進方向與光軸O1的夾角在0度的光線)。於此,F/8之光學量測系統(鏡頭)可小於±3度角。 In one embodiment of the present invention, on one hand, by providing the light source module 120 having the opening 122, the light beam SL transmission path of the light source module 120 can be in the same direction as the transmission path of the receiving object light OL of the photosensitive element 130. On the optical path, that is, the center of the light beam substantially coincides, the optical measuring system 100 does not cause serious energy loss due to the use of the beam splitter, and can also be avoided because the light source is directly set. A problem of ghosting placed on the optical axis O1. On the other hand, by arranging the light source module 120 at the position of the aperture stop of the optical measurement system 100, the light source module 120 can be as close as possible to the optical axis O1 of the optical measurement system 100 without affecting or blocking the object light OL. The light source module 120 can provide light near the positive incident object side 200 (for example, the angle between the advancing direction of the light beam SL after passing through the first lens assembly 112 and the optical axis O1 is within a range of ±0.1 degrees to ±10 degrees. , within the range of ±0.1 degrees to ±5 degrees, within the range of ±0.1 degrees to ±3 degrees, etc.). In some embodiments, the light passing through the first lens assembly 112 can approximately exclude the light that is completely incident (the light whose direction of advancement is at an angle of 0 degrees with respect to the optical axis O1). Here, the F/8 optical measurement system (lens) can be less than ±3 degrees.

本發明之多個實施方式中,光源模組120是為環形,可以稱為環形光源模組120,但不應以此限制本發明之範圍,光源模組120可以是方形、橢圓形、三角形等但仍具有開口122於其中的其他形狀,或者,光源模組120可以由多個不連續或不互相連接的光源組件組成。 In various embodiments of the present invention, the light source module 120 is annular, and may be referred to as an annular light source module 120. However, the scope of the present invention should not be limited thereto. The light source module 120 may be square, elliptical, triangular, or the like. However, there are still other shapes in which the opening 122 is located, or the light source module 120 may be composed of a plurality of light source components that are discontinuous or not connected to each other.

第1B圖為第1A圖之光學測量系統100之光源模組120之正視圖。第1C圖為第1B圖之光學測量系統100之光源模組120之剖面圖。同時參照第1B圖與第1C圖。於本發明之一或多個實施方式中,光源模組120包含多個光源124以及載體126。光源124朝向物側200(參照第1A圖)發出光線,載體126用以承載光源124,其中載體126具有開口126a供該光軸O1(參照第1A圖)穿過,以形成光源模組120的開口122。 Figure 1B is a front elevational view of the light source module 120 of the optical measurement system 100 of Figure 1A. 1C is a cross-sectional view of the light source module 120 of the optical measurement system 100 of FIG. 1B. Refer to both FIG. 1B and FIG. 1C. In one or more embodiments of the present invention, the light source module 120 includes a plurality of light sources 124 and a carrier 126. The light source 124 emits light toward the object side 200 (refer to FIG. 1A), and the carrier 126 is configured to carry the light source 124. The carrier 126 has an opening 126a for the optical axis O1 (refer to FIG. 1A) to pass through to form the light source module 120. Opening 122.

於本實施方式中,光源模組120之載體126具有凹槽126b,設置於載體126之開口126a之至少一側,凹槽126b 的開口126a朝向物側200(參照第1A圖),光源124至少部分設置於凹槽126b中,以向物側200(參照第1A圖)發出光線。於此,光源124可設置於載體126之底面126c與壁面126d。於其他實施方式中,因製程難度考量,光源124可僅設置於載體126之底面126c而不設置於壁面126d上。於本實施方式中,凹槽126b環繞載體126之開口126a,而使光源124亦環繞開口126a。實際應用上並不限於此,可以視光學測量系統100之空間需求配置光源124以及載體126。 In this embodiment, the carrier 126 of the light source module 120 has a recess 126b disposed on at least one side of the opening 126a of the carrier 126, and the recess 126b The opening 126a faces the object side 200 (see FIG. 1A), and the light source 124 is at least partially disposed in the recess 126b to emit light toward the object side 200 (refer to FIG. 1A). Here, the light source 124 can be disposed on the bottom surface 126c and the wall surface 126d of the carrier 126. In other embodiments, the light source 124 may be disposed only on the bottom surface 126c of the carrier 126 and not on the wall surface 126d due to process difficulty. In the present embodiment, the recess 126b surrounds the opening 126a of the carrier 126 such that the light source 124 also surrounds the opening 126a. The practical application is not limited thereto, and the light source 124 and the carrier 126 can be configured according to the space requirement of the optical measurement system 100.

於部分實施方式中,光源模組120可包含反射層127,反射層127設置於載體126與光源124之間。於此,反射層127可以設置於凹槽126b內,以構成反射杯,用以增強輸出光線。於部分實施方式中,凹槽126b具有傾斜的側壁,這些傾斜的側壁一方面有利於設置於其上的反射層127反射光線,另一方面,可以使開口126a有最窄部分,例如於第1A圖中此最窄部分靠近物側200,以確定光學測量系統100的孔徑光欄的位置。 In some embodiments, the light source module 120 can include a reflective layer 127 disposed between the carrier 126 and the light source 124. Here, the reflective layer 127 may be disposed in the recess 126b to form a reflective cup for enhancing the output light. In some embodiments, the recess 126b has inclined side walls that facilitate the reflective layer 127 disposed thereon to reflect light on the one hand and the narrowest portion of the opening 126a on the other hand, for example, the first portion This narrowest portion of the figure is adjacent the object side 200 to determine the position of the aperture stop of the optical measurement system 100.

此外,光源模組120還可包含光學膜128,例如擴散膜、菲涅爾透鏡薄膜等,設置於光源124與物側200之間,用以使光源124的輸出光線分布均勻。 In addition, the light source module 120 may further include an optical film 128, such as a diffusion film, a Fresnel lens film, or the like, disposed between the light source 124 and the object side 200 for uniformly distributing the output light of the light source 124.

於此,光源124可以是鹵素燈、發光二極體、有機發光二極體等發光元件。載體126的材料可以是玻璃、塑膠、金屬等,具有適當的剛性以支撐光源124以及其線路。於部分實施方式中,載體126還可以阻擋來自物側200(參照第1A圖)的光線,載體126在光學測量系統適用的頻譜範圍內具有較低 的穿透率。反射層127的材料可以是在光學測量系統適用的頻譜範圍內反射率大於80%的材料,例如銀、鋁、銅、硫酸鋇或二氧化鈦等高反射率的材料。光學膜128的材料可以是丙乙烯酸聚酯。感光元件130可以是電荷耦合元件(Charge-coupled Device;CCD)或其他具有感光特性的元件。 Here, the light source 124 may be a light-emitting element such as a halogen lamp, a light-emitting diode, or an organic light-emitting diode. The material of the carrier 126 may be glass, plastic, metal, etc., with suitable rigidity to support the light source 124 and its circuitry. In some embodiments, the carrier 126 can also block light from the object side 200 (see FIG. 1A), which has a lower spectral range within the applicable optical measurement system. The penetration rate. The material of the reflective layer 127 may be a material having a reflectance greater than 80% within the spectral range to which the optical measurement system is applicable, such as high reflectivity materials such as silver, aluminum, copper, barium sulfate or titanium dioxide. The material of the optical film 128 may be a vinyl acetate polyester. The photosensitive element 130 may be a Charge-coupled Device (CCD) or other element having a photosensitive property.

於本發明的部分實施方式中,光源124可以是可見光光源或不可見光光源。隨著光線頻譜的不同,可對應地調整反射層127、光學膜128、第一透鏡組件112以及第二透鏡組件114的材料。舉例而言,在可見光到紅外光區的頻譜範圍內,銀具備高反射率,但在波長小於340奈米的頻譜範圍內,銀的反射率較低;鋁在紫外光區到紅外光區的頻譜範圍內具有高反射率。當光源124為可見光光源時,可以採用含銀量較高的材料作為反射層127,以反射可見光。相對地,當光源124為紫外光光源時,可以採用含鋁量較高的材料作為反射層127,以反射紫外光。 In some embodiments of the invention, the light source 124 can be a visible light source or an invisible light source. The materials of the reflective layer 127, the optical film 128, the first lens assembly 112, and the second lens assembly 114 can be adjusted correspondingly as the light spectrum is different. For example, in the spectral range of the visible to infrared region, silver has a high reflectivity, but in the spectral range where the wavelength is less than 340 nm, the reflectance of silver is low; aluminum in the ultraviolet to infrared region High reflectivity in the spectrum. When the light source 124 is a visible light source, a material having a high silver content may be used as the reflective layer 127 to reflect visible light. In contrast, when the light source 124 is an ultraviolet light source, a material having a higher aluminum content may be used as the reflective layer 127 to reflect ultraviolet light.

此外,第一透鏡組件112以及第二透鏡組件114的材料應避免大幅吸收光源124的光線,且其材料性質不易被光源124的光線破壞(紫外光劣化、膠合處受紅外光熱輻射分離)。 In addition, the materials of the first lens assembly 112 and the second lens assembly 114 should avoid greatly absorbing the light of the light source 124, and the material properties thereof are not easily broken by the light of the light source 124 (the ultraviolet light is deteriorated, and the glue is separated by the infrared light heat radiation).

第1D圖為根據本發明之另一實施方式之光學測量系統100之光源模組120之剖面圖。本實施方式與第1C圖的實施方式相似,差別在於:本實施方式的光源模組120之載體126不具有凹槽126b,光源124直接設置於平面的載體126朝向物側200的一側。 1D is a cross-sectional view of a light source module 120 of an optical measurement system 100 in accordance with another embodiment of the present invention. This embodiment is similar to the embodiment of FIG. 1C except that the carrier 126 of the light source module 120 of the present embodiment does not have the recess 126b, and the light source 124 is directly disposed on the side of the planar carrier 126 facing the object side 200.

同樣地,光源模組120可包含反射層127,反射層127設置於載體126與光源124之間,以增強輸出光線。 Similarly, the light source module 120 can include a reflective layer 127 disposed between the carrier 126 and the light source 124 to enhance the output light.

本實施方式的其他細節大致上如第1C圖的實施方式所述,在此不再贅述。實際應用上,可以依照光學測量系統100之空間而適當配置光源模組120的結構,不應以圖中所繪而限制本發明之範圍。 Other details of the present embodiment are substantially as described in the embodiment of FIG. 1C, and are not described herein again. In practical applications, the structure of the light source module 120 may be appropriately configured according to the space of the optical measurement system 100, and the scope of the present invention should not be limited by the drawings.

第2A圖為根據本發明之又一實施方式之光學測量系統之光源模組120之正視圖。於本發明之一或多個實施方式中,光源124環狀排列於載體126上,而露出載體126之開口126a。於部分實施方式中,光源124可以透過單一的控制系統,而一同開關。於部分實施方式中,光源124可以多個控制系統分別控制不同部分的光源124的開關,這些不同部分的光源124可具有不同的發光角度。於此,介紹以多個控制系統控制光源模組120的光源124的方式。 2A is a front elevational view of a light source module 120 of an optical measurement system in accordance with yet another embodiment of the present invention. In one or more embodiments of the present invention, the light source 124 is annularly arranged on the carrier 126 to expose the opening 126a of the carrier 126. In some embodiments, the light source 124 can be switched together through a single control system. In some embodiments, the light source 124 can control the switches of the different portions of the light source 124 by a plurality of control systems, each of which can have a different illumination angle. Here, a manner of controlling the light source 124 of the light source module 120 by a plurality of control systems will be described.

詳細而言,於本實施方式中,可以設計第一部分P1之光源124a環狀排列且鄰近載體126之開口126a,第二部分P2之光源124b環狀排列且遠離載體126之開口126a。第一部分P1之光源124a與第二部分P2之光源124b分別具有不同的發光角度。舉例而言,針對物側200(參照第1A圖),第一部分P1之光源124a的光線相較於第二部分P2的光源124b的光線較接近正向入射。 In detail, in the present embodiment, the light source 124a of the first portion P1 may be designed to be annularly arranged and adjacent to the opening 126a of the carrier 126. The light source 124b of the second portion P2 is annularly arranged and away from the opening 126a of the carrier 126. The light source 124a of the first portion P1 and the light source 124b of the second portion P2 have different illumination angles, respectively. For example, for the object side 200 (see FIG. 1A), the light of the light source 124a of the first portion P1 is closer to the normal incidence than the light of the light source 124b of the second portion P2.

第2B圖為第2A圖之光學測量系統之光源模組120之操作示意圖。在此,為了方便說明起見,僅繪示感光元件130與位於物側的待測物,省略了光學測量系統中的光源模 組以及相關透鏡模組。同時參照第2A圖與第2B圖。在偵測待測物時,可以先以第一部分P1之光源124a對待測物提供光線SL1,之後再以第二部分P2之光源124b對待測物提供光線SL2,待測物可先後接收到不同照射角度的光線SL1、SL2。 FIG. 2B is a schematic diagram of the operation of the light source module 120 of the optical measuring system of FIG. 2A. Here, for convenience of explanation, only the photosensitive element 130 and the object to be tested on the object side are shown, and the light source mode in the optical measuring system is omitted. Group and related lens modules. Refer to both Figures 2A and 2B. When detecting the object to be tested, the light source SL1 may be provided by the light source 124a of the first portion P1, and then the light source SL2 may be provided by the light source 124b of the second portion P2, and the object to be tested may receive different illuminations in sequence. Angles of light SL1, SL2.

於部分實施方式中,可以同時以第一部分P1之光源124a與第二部分P2之光源124b對待測物提供光線SL1、SL2。如此一來,較平坦的表面區域RA可以反射光線SL1與光線SL2至感光元件130,而較不平坦的表面區域RB僅能反射光線光線SL2至感光元件130。此時,可以配置光源124a與光源124b所產生的光線波長不同,以增加辨別效果。例如光源124a為藍光光源,光源124b為紅光光源,表面區域RA呈現紫色(藍光與紅光混合),表面區域RB呈現紅色。透過不同照射角度的光源124a與光源124b,可以分層地檢測待測物的表面,以詳細地獲得待測物表面輪廓的資訊。 In some embodiments, the light sources SL1, SL2 can be simultaneously supplied with the light source 124a of the first portion P1 and the light source 124b of the second portion P2. In this way, the flatter surface area RA can reflect the light ray SL1 and the light ray SL2 to the photosensitive element 130, while the less flat surface area RB can only reflect the light ray SL2 to the photosensitive element 130. At this time, the wavelength of the light generated by the light source 124a and the light source 124b can be configured to increase the discrimination effect. For example, the light source 124a is a blue light source, the light source 124b is a red light source, the surface area RA is purple (blue light is mixed with red light), and the surface area RB is red. The light source 124a and the light source 124b of different illumination angles can detect the surface of the object to be tested hierarchically to obtain detailed information of the surface contour of the object to be tested.

於此,圖中將光線SL1繪示為完全豎直的以方便說明光線SL1相較於光線SL2更接近平行於光軸,但實際配置上,光線SL1不是完全豎直的。第2B圖僅用於說明此設計,不應以圖所繪示的光線角度、待測物表面等而限制本發明之範圍。 Here, the light SL1 is shown as being completely vertical to facilitate the explanation that the light SL1 is closer to the optical axis than the light SL2, but in actual configuration, the light SL1 is not completely vertical. FIG. 2B is only for explaining this design, and the scope of the present invention should not be limited by the angle of the light, the surface of the object to be tested, and the like.

第2C圖為根據本發明之再一實施方式之光學測量系統之光源模組120之正視圖。本實施方式與第2A圖的實施方式相似,差別在於:本實施方式中,光源124包含第一部分P1、第二部分P2、第三部分P3以及第四部分P4。在偵測待測物時,可以控制第一部分P1與第四部分P4同時照光,或第二 部分P2與第三部分P3同時照光,而使光源124的光照圖形並非完全對稱。 2C is a front elevational view of the light source module 120 of the optical measurement system in accordance with yet another embodiment of the present invention. This embodiment is similar to the embodiment of FIG. 2A except that in the present embodiment, the light source 124 includes the first portion P1, the second portion P2, the third portion P3, and the fourth portion P4. When detecting the object to be tested, the first part P1 and the fourth part P4 may be controlled to simultaneously illuminate, or the second The portion P2 and the third portion P3 illuminate simultaneously, and the illumination pattern of the light source 124 is not completely symmetrical.

同樣地,這些部分的光源124可具有不同的發光角度以及顏色,以達到分層檢測的功效。 Likewise, the light sources 124 of these portions can have different illumination angles and colors to achieve the efficacy of layered detection.

於此,不應以第2A圖與第2C圖中所繪而限制本發明之範圍,實際應用上仍許多種光源124排列的設計。舉例而言,光源124可以不環狀排列但仍包含多個部分以達到分層檢測的功效。 Here, the scope of the present invention should not be limited by the drawings in FIGS. 2A and 2C, and there are still many designs in which the light sources 124 are arranged in practice. For example, light source 124 may not be annularly arranged but still contain multiple portions to achieve the efficacy of delamination detection.

第3A圖為根據本發明之另一實施方式之光學測量系統100之示意圖。本實施方式與第1A圖的實施方式相似,差別在於:本實施方式中,光源模組120包含至少一光源124以及鏡體129。光源124用以發出光線。鏡體129用以反射來自光源124的光線以使光線朝向該物側前進,其中鏡體129具有開口129a供光軸O1穿過,以形成光源模組120的開口。 3A is a schematic illustration of an optical measurement system 100 in accordance with another embodiment of the present invention. This embodiment is similar to the embodiment of FIG. 1A except that in the present embodiment, the light source module 120 includes at least one light source 124 and a mirror body 129. Light source 124 is used to emit light. The mirror body 129 is configured to reflect light from the light source 124 to advance the light toward the object side, wherein the mirror body 129 has an opening 129a through which the optical axis O1 passes to form an opening of the light source module 120.

於本實施方式中,鏡體129為平面鏡,其包含具有高反射率的反射層體,其材料可以是銀、鋁、銅、硫酸鋇或二氧化鈦等高反射率的材料,以供反射光線。反射層體可具有平坦的表面。更進一步而言,鏡體129的表面之中心線平均粗糙度(arithmetical mean deviation;Ra)可以設置在特定的粗糙度以下,具有此特定的粗糙度的鏡體129可以視為完全鏡面(perfect mirror)或具有勻化功能的平面鏡。於部分實施方式中,可以依序光學測量系統100的需求而設置此特定的粗糙度,舉例而言,此特定的粗糙度可以是大約1.6微米以下。當然,不應以此粗糙度數值限制本發明之範圍,於其他的實施方 式中,此特定的粗糙度可以是大約1微米至大約1.6微米範圍內的任意數值。 In the present embodiment, the mirror body 129 is a plane mirror comprising a reflective layer body having high reflectivity, and the material thereof may be a high reflectivity material such as silver, aluminum, copper, barium sulfate or titanium dioxide for reflecting light. The reflective layer body can have a flat surface. Furthermore, the center line average roughness (Ra) of the surface of the mirror body 129 can be set below a specific roughness, and the mirror body 129 having this specific roughness can be regarded as a perfect mirror (perfect mirror) ) or a flat mirror with a homogenizing function. In some embodiments, this particular roughness can be set in accordance with the requirements of the optical measurement system 100. For example, the particular roughness can be less than about 1.6 microns. Of course, the scope of the invention should not be limited by this roughness value, and other embodiments Wherein, the particular roughness can be any value in the range of from about 1 micron to about 1.6 microns.

於本實施方式中,光源124的光線前進方向與平面鏡(鏡體129)的法線方向夾角大致上等於平面鏡(鏡體129)的法線方向與光軸O1的夾角。舉例而言,該夾角大約為45度,但不應以此限制本發明之範圍,實際應用上可以視光學測量系統100的空間配置來決定此夾角。 In the present embodiment, the angle between the light traveling direction of the light source 124 and the normal direction of the plane mirror (mirror body 129) is substantially equal to the angle between the normal direction of the plane mirror (mirror body 129) and the optical axis O1. For example, the included angle is approximately 45 degrees, but should not limit the scope of the present invention. In practice, the angle can be determined by the spatial configuration of the optical measurement system 100.

在偵測物側200的待測物時,光源124經鏡體129反射提供光線SL給物側200,光線SL經過第一透鏡組件112而傳到物側200的待測樣品上,經待測樣品反射後,物體光線OL經過第一透鏡組件112、光源模組120的鏡體129的開口129a以及第二透鏡組件114而傳送至感光元件130,藉以使感光元件130取得待測樣品的資訊。本實施方式的其他細節大致上如第1A圖之實施方式所述,在此不再贅述。 When detecting the object to be tested on the object side 200, the light source 124 is reflected by the mirror body 129 to provide the light beam SL to the object side 200, and the light beam SL is transmitted to the sample to be tested on the object side 200 through the first lens assembly 112, and is tested. After the sample is reflected, the object light OL is transmitted to the photosensitive element 130 through the first lens assembly 112, the opening 129a of the mirror body 129 of the light source module 120, and the second lens assembly 114, so that the photosensitive element 130 acquires information of the sample to be tested. Other details of the present embodiment are substantially as described in the embodiment of FIG. 1A, and are not described herein again.

第3B圖為根據本發明之又一實施方式之光學測量系統100之示意圖。本實施方式與第3A圖的實施方式相似,差別在於:本實施方式中,鏡體129由二個平面鏡組成,光源124的數量為二,這些些平面鏡分別設置於該光軸O1之相對兩側且共同具有開口129a。 Figure 3B is a schematic illustration of an optical measurement system 100 in accordance with yet another embodiment of the present invention. This embodiment is similar to the embodiment of FIG. 3A. The difference is that in the embodiment, the mirror body 129 is composed of two plane mirrors, and the number of the light sources 124 is two, and the plane mirrors are respectively disposed on opposite sides of the optical axis O1. And together have an opening 129a.

相同地,於本實施方式中,每一光源124的光線前進方向與每一平面鏡(鏡體129)的法線方向夾角大致上等於每一平面鏡(鏡體129)的法線方向與光軸O1的夾角。本實施方式的其他細節大致上如前述實施方式所述,在此不再贅述。 Similarly, in the present embodiment, the angle of the light advancing direction of each light source 124 and the normal direction of each plane mirror (mirror body 129) is substantially equal to the normal direction of each plane mirror (mirror body 129) and the optical axis O1. The angle of the. Other details of the present embodiment are substantially as described in the foregoing embodiments, and are not described herein again.

應了解到,除了第3A圖與第3B圖的配置方式外,還可以以其他方式設計鏡體129與光源124。第3C圖為根據本發明之另一實施方式之光學測量系統之光源模組120之示意圖。光源模組120的結構配置中,鏡體129在朝向物側的一側可具有粗糙的反射表面129b。換句話說,鏡體129可以不是前述的平面鏡。當來自光源124的光線輸送表面129b上時,表面129b使光線漫反射至物側,以產生較為均勻的光強度分佈,相較於前述的平面鏡,本實施方式的鏡體129具有較強的勻化功能。具體而言,於本實施方式中,鏡體129的表面129b的中心線平均粗糙度Ra可大於前述的特定的粗糙度,例如1.6微米。 It should be understood that in addition to the configurations of FIGS. 3A and 3B, the mirror body 129 and the light source 124 may be otherwise designed. 3C is a schematic diagram of a light source module 120 of an optical measurement system in accordance with another embodiment of the present invention. In the structural configuration of the light source module 120, the mirror body 129 may have a rough reflective surface 129b on the side facing the object side. In other words, the mirror body 129 may not be the aforementioned plane mirror. When the light is transmitted from the light source 124 to the surface 129b, the surface 129b diffuses the light to the object side to produce a relatively uniform light intensity distribution. The mirror body 129 of the present embodiment has a stronger uniformity than the plane mirror described above. Function. Specifically, in the present embodiment, the center line average roughness Ra of the surface 129b of the mirror body 129 may be larger than the aforementioned specific roughness, for example, 1.6 μm.

以上介紹鏡體129的多種配置方式,應了解到,雖然在此並未繪示鏡體129的上視圖,但熟知該領域之技術人員應可了解到鏡體129可以是圓形、方形、橢圓形、三角形等但具有開口於其中的形狀。鏡體129可以是一完整連續的結構,或者,鏡體129可以由多個不連續或不互相連接的反射組件組成的結構,不應以圖式中所繪的鏡體129結構而限制本發明之範圍。 The various configurations of the mirror body 129 are described above. It should be understood that although the top view of the mirror body 129 is not illustrated herein, those skilled in the art will appreciate that the mirror body 129 may be circular, square, or elliptical. Shape, triangle, etc. but with a shape that opens in it. The mirror body 129 may be a complete continuous structure, or the mirror body 129 may be composed of a plurality of discrete or non-connected reflective components, and the present invention should not be limited by the structure of the mirror body 129 depicted in the drawings. The scope.

第4A圖為根據本發明之再一實施方式之光學測量系統100之示意圖。本實施方式與第1A圖的實施方式相似,差別在於:本實施方式中,第一透鏡組件112與第二透鏡組件114共同形成雙高斯鏡組(Double Gauss Lens)。於此,光源模組120位於雙高斯鏡組之孔徑光欄位置,更精確而言,光源模組120的開口122的最窄部分是為孔徑光欄。雙高斯鏡組是 以孔徑光欄為對稱而形成的鏡組,其中以負透鏡環繞孔徑光欄,再以正透鏡與彎月形透鏡作為外圍,其中正透鏡與彎月形透鏡間隔適當的距離。 4A is a schematic diagram of an optical measurement system 100 in accordance with yet another embodiment of the present invention. This embodiment is similar to the embodiment of FIG. 1A except that in the present embodiment, the first lens assembly 112 and the second lens assembly 114 together form a double Gauss lens group (Double Gauss Lens). Here, the light source module 120 is located at the aperture diaphragm position of the double Gaussian mirror group. More precisely, the narrowest portion of the opening 122 of the light source module 120 is an aperture diaphragm. Double Gaussian mirror is A lens group formed by symmetry of an aperture diaphragm, wherein a negative lens surrounds the aperture stop, and a positive lens and a meniscus lens are used as a periphery, wherein the positive lens is spaced apart from the meniscus lens by an appropriate distance.

換句話說,本實施方式中,第一透鏡組件112與第二透鏡組件114大致相同,分別包含負透鏡、正透鏡與彎月形透鏡,且以光源模組120的開口122的最窄部分為中央對稱設置。 In other words, in the present embodiment, the first lens assembly 112 is substantially the same as the second lens assembly 114, and includes a negative lens, a positive lens, and a meniscus lens, respectively, and the narrowest portion of the opening 122 of the light source module 120 is Centrally symmetric setting.

本實施方式的其他細節大致上如第1A圖之實施方式所述,在此不再贅述。 Other details of the present embodiment are substantially as described in the embodiment of FIG. 1A, and are not described herein again.

第4B圖為根據本發明之另一實施方式之光學測量系統100之示意圖。本實施方式與第1A圖的實施方式相似,差別在於:本實施方式中,第一透鏡組件112與第二透鏡組件114共同形成庫克三片式鏡組(Cooke Triplet)。光源模組120為庫克三片式鏡組之孔徑光欄。 Figure 4B is a schematic illustration of an optical measurement system 100 in accordance with another embodiment of the present invention. This embodiment is similar to the embodiment of FIG. 1A except that in the present embodiment, the first lens assembly 112 and the second lens assembly 114 together form a Cooke Triplet. The light source module 120 is an aperture diaphragm of the Cook three-piece lens set.

詳細而言,第一透鏡組件112包含凸透鏡與凹透鏡,第二透鏡組件114包含凸透鏡。第一透鏡組件112的凸透鏡與第二透鏡組件114的凸透鏡分別設置於第一透鏡組件112的凹透鏡前後一定距離,形成大體對稱式的設計。光源模組120位於孔徑光欄位置,而位於第一透鏡組件112的凹透鏡與第二透鏡組件114的凸透鏡之間。 In detail, the first lens assembly 112 includes a convex lens and a concave lens, and the second lens assembly 114 includes a convex lens. The convex lens of the first lens assembly 112 and the convex lens of the second lens assembly 114 are respectively disposed at a distance from the concave lens of the first lens assembly 112 to form a substantially symmetrical design. The light source module 120 is located at the aperture stop position between the concave lens of the first lens assembly 112 and the convex lens of the second lens assembly 114.

本實施方式的其他細節大致上如第1A圖之實施方式所述,在此不再贅述。 Other details of the present embodiment are substantially as described in the embodiment of FIG. 1A, and are not described herein again.

第4C圖為根據本發明之又一實施方式之光學測量系統100之示意圖。本實施方式與第1A圖的實施方式相似, 差別在於:本實施方式中,第一透鏡組件112與第二透鏡組件114共同形成天塞鏡組(Tessar)。光源模組120位於天塞鏡組之孔徑光欄位置。 Figure 4C is a schematic illustration of an optical measurement system 100 in accordance with yet another embodiment of the present invention. This embodiment is similar to the embodiment of FIG. 1A. The difference is that in the present embodiment, the first lens assembly 112 and the second lens assembly 114 together form a celestial mirror group (Tessar). The light source module 120 is located at the aperture diaphragm position of the celestial mirror group.

詳細而言,第一透鏡組件112包含凸透鏡與凹透鏡,第二透鏡組件114包含複合透鏡組。第一透鏡組件112的凸透鏡與第二透鏡組件114的複合透鏡組分別設置於第一透鏡組件112的凹透鏡前後一定距離。光源模組120作為孔徑光欄設置於第一透鏡組件112的凹透鏡與第二透鏡組件114的複合透鏡組之間。 In detail, the first lens assembly 112 includes a convex lens and a concave lens, and the second lens assembly 114 includes a composite lens group. The convex lens of the first lens assembly 112 and the composite lens group of the second lens assembly 114 are respectively disposed at a certain distance before and after the concave lens of the first lens assembly 112. The light source module 120 is disposed as an aperture stop between the concave lens of the first lens assembly 112 and the composite lens group of the second lens assembly 114.

本實施方式的其他細節大致上如第1A圖之實施方式所述,在此不再贅述。 Other details of the present embodiment are substantially as described in the embodiment of FIG. 1A, and are not described herein again.

第5A圖為根據本發明之一實施方式之光學成像系統300之示意圖。光學成像系統300包含透鏡模組310以及光源模組320。透鏡模組310設置於待測物400與感光側500之間,且具有光軸O2。光源模組320設置於透鏡模組310與感光側500之間。光源模組320具有開口322,透鏡模組310之光軸O2穿過開口322,光源模組320用以將圖像經透鏡模組310成像於待測物400上,以使待測物400將該圖像反射至感光側500。 Figure 5A is a schematic illustration of an optical imaging system 300 in accordance with an embodiment of the present invention. The optical imaging system 300 includes a lens module 310 and a light source module 320. The lens module 310 is disposed between the object to be tested 400 and the photosensitive side 500 and has an optical axis O2. The light source module 320 is disposed between the lens module 310 and the photosensitive side 500. The light source module 320 has an opening 322. The optical axis O2 of the lens module 310 passes through the opening 322. The light source module 320 is used to image the image on the object to be tested 400 through the lens module 310, so that the object to be tested 400 will be This image is reflected to the photosensitive side 500.

於本實施方式中,光源模組320包含至少一光源324、至少一鏡體326以及至少一光源透鏡件328。鏡體326用以反射來自光源324的光線以使光線PL朝向待測物400前進,其中鏡體326具有開口326a供光軸O2穿過,以形成光源模組320的開口322。於此,如同前述實施方式的鏡體129(參照第 3A圖),鏡體326為平面鏡,光源324的光線前進方向的與平面鏡的法線方向夾角大致上等於平面鏡的法線方向與光軸O2的夾角。光源透鏡件328設置於光源324與鏡體326之間,用以協助光源324所發出的圖樣順利成像至待測物400上。 In this embodiment, the light source module 320 includes at least one light source 324, at least one mirror body 326, and at least one light source lens member 328. The mirror body 326 is configured to reflect the light from the light source 324 to advance the light PL toward the object to be tested 400. The mirror body 326 has an opening 326a for the optical axis O2 to pass through to form the opening 322 of the light source module 320. Here, the mirror body 129 like the foregoing embodiment (see the 3A), the mirror body 326 is a plane mirror, and the angle between the forward direction of the light source 324 and the normal direction of the plane mirror is substantially equal to the angle between the normal direction of the plane mirror and the optical axis O2. The light source lens member 328 is disposed between the light source 324 and the mirror body 326 to assist the smooth imaging of the pattern emitted by the light source 324 onto the object to be tested 400.

於本發明之多個實施方式中,光源324所發出的光線本身可帶有特定圖樣。或者,可以在均勻光源324前放置帶有特定圖形開口(例如狹縫、方孔)的遮光片,以使光源324發出的光線經過遮光片後帶有特定圖樣。於本發明之多個實施方式中,透過調整光源324、光源透鏡件328、透鏡模組310以及待測物400的配置,使其符合成像公式,此光源324的圖樣可以成像到待測物400上。為了方便說明起見,在此,以薄透鏡為例,將光源透鏡件328與透鏡模組310一起視為焦距為f的薄透鏡,則為了達到成像的目的,光源324、光源透鏡件328、透鏡模組310以及待測物400的配置滿足薄透鏡成像公式:u-1+v-1=f-1。其中u為光源324至此薄透鏡的距離,v為待測物400至此薄透鏡的距離。實際應用上,由於透鏡具有一定的厚度,且需考慮透鏡組的厚度,因此不應以該薄透鏡成像公式為限。 In various embodiments of the invention, the light emitted by source 324 may itself carry a particular pattern. Alternatively, a light-shielding sheet with a specific pattern opening (e.g., a slit, a square hole) may be placed in front of the uniform light source 324 such that the light from the light source 324 passes through the light-shielding sheet with a specific pattern. In various embodiments of the present invention, by adjusting the configuration of the light source 324, the light source lens member 328, the lens module 310, and the object to be tested 400 to conform to an imaging formula, the pattern of the light source 324 can be imaged to the object to be tested 400. on. For convenience of explanation, here, taking a thin lens as an example, the light source lens member 328 and the lens module 310 together are regarded as a thin lens having a focal length f, and for the purpose of imaging, the light source 324, the light source lens member 328, The configuration of the lens module 310 and the object to be tested 400 satisfies the thin lens imaging formula: u -1 + v -1 = f -1 . Where u is the distance from the light source 324 to the thin lens, and v is the distance from the object 400 to the thin lens. In practical applications, since the lens has a certain thickness and the thickness of the lens group needs to be considered, it should not be limited to the thin lens imaging formula.

如此一來,光源模組320可以成像於待測物400上。藉由設計光源模組320的鏡體326具有開口326a,光源模組320可以提供接近正向入射的光線PL。於部分實施方式中,光源模組320提供的光線PL並未包含完全正向入射的光線。在部分情況下,待測物400表面過於不平整時,相較於完全正向 入射的光線,此接近正向入射的光線所形成的辨識圖案,有利於正向地反射辨識圖案,以達到後續的識別。 In this way, the light source module 320 can be imaged on the object to be tested 400. By designing the mirror body 326 of the light source module 320 to have an opening 326a, the light source module 320 can provide light PL that is near normal incidence. In some embodiments, the light source PL provided by the light source module 320 does not include light that is completely incident. In some cases, when the surface of the object to be tested 400 is too uneven, it is more completely positive. The incident light, which is close to the positively incident light, is advantageous for positively reflecting the identification pattern for subsequent recognition.

於此,待測物400可將圖像經開口322反射至感光側500。詳細而言,感光側500可以設置如前述實施方式中的感光元件,感光元件設置於光軸O2上,以接收來自待測物400的圖樣。如同前述第1A圖的實施方式,可以再配置其他透鏡於感光元件與透鏡模組310之間,以使待測物400、感光元件、其他透鏡與透鏡模組310的配置符合成像公式,讓待測物400反射的圖樣順利成像在感光元件上。但應了解到,這些感光元件並不限於設置於光軸O2上,感光元件可以從側面偵測待測物400上的圖樣,而不透過開口322。實際應用上,光學成像系統300可以不包含感光元件,而直接以肉眼側面地觀察待測物400上的圖樣。 Here, the object to be tested 400 can reflect the image to the photosensitive side 500 through the opening 322. In detail, the photosensitive side 500 may be provided with a photosensitive element as in the foregoing embodiment, and the photosensitive element is disposed on the optical axis O2 to receive a pattern from the object to be tested 400. As in the foregoing embodiment of FIG. 1A, other lenses may be disposed between the photosensitive element and the lens module 310, so that the configuration of the object to be tested 400, the photosensitive element, the other lens, and the lens module 310 conform to the imaging formula, and The pattern reflected by the object 400 is smoothly imaged on the photosensitive element. However, it should be understood that these photosensitive elements are not limited to being disposed on the optical axis O2, and the photosensitive element can detect the pattern on the object to be tested 400 from the side without passing through the opening 322. In practical applications, the optical imaging system 300 may not include the photosensitive element, but directly observe the pattern on the object to be tested 400 with the naked eye.

雖然於圖中僅繪示單一個平面鏡,但實際應用上並不應以此為限。於部分實施方式中,如同前述,鏡體326可由二個平面鏡組成,光源324的數量為二,平面鏡分別設置於光軸O2之相對兩側且共同具有開口,其中每一光源324的光線前進方向與每一平面鏡的法線方向夾角大致上等於每一平面鏡的法線方向與光軸O2的夾角。或者,鏡體326可具有粗糙的表面(例如中心線平均粗糙度大於1.6微米),以使光線漫反射至待測物400。 Although only a single plane mirror is shown in the figure, the practical application should not be limited thereto. In some embodiments, as described above, the mirror body 326 can be composed of two plane mirrors, and the number of the light sources 324 is two. The plane mirrors are respectively disposed on opposite sides of the optical axis O2 and have openings together, wherein the light source of each light source 324 advances. The angle with the normal direction of each plane mirror is substantially equal to the angle between the normal direction of each plane mirror and the optical axis O2. Alternatively, the mirror body 326 may have a rough surface (eg, a centerline average roughness greater than 1.6 microns) to diffuse light to the object to be tested 400.

於本實施方式中,光源透鏡件328可以是雙膠合鏡片,如圖所示由凹透鏡與凸透鏡所組成,但不應以圖中所繪而限制本發明之範圍。此外,本實施方式的光源模組320可含 有多種設計,相關設計可參考前述實施方式的光源模組120,其相關細節大致不再贅述。 In the present embodiment, the light source lens member 328 may be a double-glued lens, which is composed of a concave lens and a convex lens as shown in the drawings, but the scope of the present invention should not be limited by the drawings. In addition, the light source module 320 of the embodiment may include There are a variety of designs. For related designs, reference may be made to the light source module 120 of the foregoing embodiment, and details thereof will not be described in detail.

第5B圖為根據本發明之另一實施方式之光學成像系統300之示意圖。本實施方式與第5A圖之實施方式相似,差別在於:本實施方式之光源模組320包含多個光源與載體。 Figure 5B is a schematic illustration of an optical imaging system 300 in accordance with another embodiment of the present invention. This embodiment is similar to the embodiment of FIG. 5A except that the light source module 320 of the present embodiment includes a plurality of light sources and a carrier.

本實施方式中,光源模組320所發出的光線可以經過設計而帶有圖樣資訊,該圖樣資訊經過透鏡模組310轉換後會在待測物400上形成圖樣。在此,透鏡模組310的配置僅為示意之用,不應以圖中所繪而限制本發明之範圍。 In this embodiment, the light emitted by the light source module 320 can be designed with pattern information, and the pattern information is converted by the lens module 310 to form a pattern on the object to be tested 400. Here, the configuration of the lens module 310 is for illustrative purposes only, and the scope of the present invention should not be limited by the drawings.

本實施方式的光源模組320的結構可以參考前述第1B圖至第1D圖的實施方式的光源模組120的設計。同樣地,光源朝向該待測物發出光線,載體用以承載光源,其中載體具有開口供光軸穿過,以形成光源模組的開口。於部分實施方式中,光源環狀排列於載體上,而露出載體之開口。其前方可以設置有具有開口的光學膜,例如擴散膜、菲涅爾透鏡薄膜等,以使光源的輸出光線分布均勻或與透鏡模組310搭配作為成像系統中的透鏡。 For the configuration of the light source module 320 of the present embodiment, reference may be made to the design of the light source module 120 of the first embodiment to the first embodiment. Similarly, the light source emits light toward the object to be tested, and the carrier is used to carry the light source, wherein the carrier has an opening for the optical axis to pass through to form an opening of the light source module. In some embodiments, the light source is annularly arranged on the carrier to expose the opening of the carrier. An optical film having an opening, such as a diffusion film, a Fresnel lens film, or the like, may be disposed in front of the lens to uniformly distribute the output light of the light source or be combined with the lens module 310 as a lens in the imaging system.

本實施方式的其他細節大致上如第5A圖的實施方式所述,在此不在贅述。 Other details of the present embodiment are substantially as described in the embodiment of FIG. 5A, and are not described herein.

本發明之部分實施方式提供一種光學測量系統,其設計光源模組具有開口,並將此光源模組設置於光學測量系統的孔徑光欄的位置,使光源模組可以在不影響待測樣品反射光線的情況下盡量靠近光學測量系統的光軸。如此一來,光源模組可以提供接近正向入射的光線,而使反射光線能落在感光 元件的接收範圍之內,且不會因為分光鏡的使用而使能量耗損嚴重,也可避免因為光源直接設置於光軸上而產生鬼影的問題。此外,在部分情況下,待測樣品表面不甚平整時,相較於完全正向入射的光線,此接近正向入射的光線其反射光線較容易落在感光元件的接收範圍之內,有利於光學測量系統的偵測。 Some embodiments of the present invention provide an optical measuring system, wherein the light source module has an opening, and the light source module is disposed at the position of the aperture diaphragm of the optical measuring system, so that the light source module can not affect the reflection of the sample to be tested. In the case of light, try to be as close as possible to the optical axis of the optical measurement system. In this way, the light source module can provide light that is close to the normal incidence, so that the reflected light can fall on the photosensitive Within the receiving range of the component, the energy consumption is not severe due to the use of the beam splitter, and the problem of ghosting due to the direct arrangement of the light source on the optical axis can be avoided. In addition, in some cases, when the surface of the sample to be tested is not flat, compared with the light that is completely positively incident, the light that is close to the forward incidence is more likely to fall within the receiving range of the photosensitive element, which is beneficial to Detection of optical measurement systems.

本發明之部分實施方式提供一種光學成像系統,其設計光源模組具有開口,光源模組可以提供接近正向入射的光線,光源模組可透過透鏡成像於待測物上。在部分情況下,待測樣品表面過於不平整時,相較於完全正向入射的光線,此接近正向入射的光線所形成的辨識圖案,有利於識別。 Some embodiments of the present invention provide an optical imaging system, wherein the light source module has an opening, and the light source module can provide light that is near normal incidence, and the light source module can be imaged on the object to be tested through the lens. In some cases, when the surface of the sample to be tested is too uneven, the identification pattern formed by the near-positive light is advantageous for recognition compared to the light that is completely incident.

雖然本發明已以多種實施方式揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 While the invention has been described above in terms of various embodiments, it is not intended to limit the invention, and the invention may be modified and modified without departing from the spirit and scope of the invention. The scope of protection is subject to the definition of the scope of the patent application attached.

100‧‧‧光學測量系統 100‧‧‧Optical measuring system

110‧‧‧透鏡模組 110‧‧‧ lens module

112‧‧‧第一透鏡組件 112‧‧‧First lens assembly

114‧‧‧第二透鏡組件 114‧‧‧Second lens assembly

120‧‧‧光源模組 120‧‧‧Light source module

122‧‧‧開口 122‧‧‧ openings

130‧‧‧感光元件 130‧‧‧Photosensitive elements

200‧‧‧物側 200‧‧‧ object side

O1‧‧‧光軸 O1‧‧‧ optical axis

SL‧‧‧光線 SL‧‧‧Light

OL‧‧‧物體光線 OL‧‧‧ object light

Claims (20)

一種光學測量系統,包含:一透鏡模組,包含:一第一透鏡組件;以及一第二透鏡組件,其中該第一透鏡組件與該第二透鏡組件共同具有一光軸,該第一透鏡組件較該第二透鏡組件鄰近一物側;一光源模組,設置於該第一透鏡組件與該第二透鏡組件之間,其中該光源模組具有一開口,該光軸穿過該開口,該光源模組用以經該第一透鏡組件朝向該物側發出一光線;以及一感光元件,位於該透鏡模組相對該物側的一側,其中該感光元件用以接收來自該物側經該透鏡模組與該光源模組之該開口之一物體光線。 An optical measuring system comprising: a lens module comprising: a first lens assembly; and a second lens assembly, wherein the first lens assembly and the second lens assembly together have an optical axis, the first lens assembly a light source module is disposed between the first lens component and the second lens component, wherein the light source module has an opening through which the optical axis passes. The light source module is configured to emit a light toward the object side through the first lens component; and a photosensitive element is located on a side of the lens module opposite to the object side, wherein the photosensitive element is configured to receive the object from the object side The lens module and one of the openings of the light source module are light rays. 如請求項1所述之光學測量系統,其中該第一透鏡組件與該第二透鏡組件共焦,而形成一共焦系統。 The optical measurement system of claim 1, wherein the first lens assembly is confocal with the second lens assembly to form a confocal system. 如請求項1所述之光學測量系統,其中該第一透鏡組件與該第二透鏡組件共同形成一雙高斯鏡組(Double Gauss Lens)、一庫克三片式鏡組(Cooke Triplet)或一天塞鏡組(Tessar)。 The optical measuring system of claim 1, wherein the first lens component and the second lens component together form a double Gauss Lens, a Cook Threet, or a day. The mirror group (Tessar). 如請求項1所述之光學測量系統,其中該光源模組設置於該光學測量系統之一孔徑光欄的位置。 The optical measuring system of claim 1, wherein the light source module is disposed at a position of an aperture stop of the optical measuring system. 如請求項1所述之光學測量系統,其中該光源模組包含:複數個光源,其中該些光源朝向該物側發出光線;以及一載體,用以承載該些光源,其中該載體具有一開口供該光軸穿過,以形成該光源模組的該開口。 The optical measurement system of claim 1, wherein the light source module comprises: a plurality of light sources, wherein the light sources emit light toward the object side; and a carrier for carrying the light sources, wherein the carrier has an opening The optical axis is passed through to form the opening of the light source module. 如請求項5所述之光學測量系統,其中該些光源環狀排列於該載體上,而露出該載體之該開口。 The optical measuring system of claim 5, wherein the light sources are annularly arranged on the carrier to expose the opening of the carrier. 如請求項5所述之光學測量系統,其中一第一部分之該些光源與一第二部分之該些光源具有不同的發光角度。 The optical measuring system of claim 5, wherein the first portions of the light sources and the second portions of the light sources have different illumination angles. 如請求項7所述之光學測量系統,其中該第一部分之該些光源環狀排列且鄰近該載體之該開口,該第二部分之該些光源環狀排列且遠離該載體之該開口。 The optical measuring system of claim 7, wherein the first portions of the light sources are annularly arranged adjacent to the opening of the carrier, and the light sources of the second portion are annularly arranged and away from the opening of the carrier. 如請求項5所述之光學測量系統,其中該光源模組之該載體具有一凹槽,設置於該載體之該開口之至少一側,該凹槽的開口朝向該物側,該些光源至少部分設置於該凹槽中。 The optical measuring system of claim 5, wherein the carrier of the light source module has a recess disposed on at least one side of the opening of the carrier, the opening of the recess facing the object side, the light sources being at least Partially disposed in the groove. 如請求項9所述之光學測量系統,其中該凹槽環繞該載體之該開口。 The optical measurement system of claim 9, wherein the groove surrounds the opening of the carrier. 如請求項5所述之光學測量系統,其中該光源模組包含一反射層,設置於該載體與該些光源之間。 The optical measuring system of claim 5, wherein the light source module comprises a reflective layer disposed between the carrier and the light sources. 如請求項1所述之光學測量系統,其中該光源模組包含:至少一光源,用以發出該光線;以及一鏡體,用以反射來自該光源的該光線以使該光線朝向該物側前進,其中該鏡體具有一開口供該光軸穿過,以形成該光源模組的該開口。 The optical measurement system of claim 1, wherein the light source module comprises: at least one light source for emitting the light; and a mirror body for reflecting the light from the light source to direct the light toward the object side Advancing, wherein the mirror body has an opening for the optical axis to pass through to form the opening of the light source module. 如請求項12所述之光學測量系統,其中該鏡體為一平面鏡,該光源的光線前進方向與該平面鏡的法線方向夾角大致上等於該平面鏡的法線方向與該光軸的夾角。 The optical measuring system of claim 12, wherein the mirror body is a plane mirror, and an angle between a light traveling direction of the light source and a normal direction of the plane mirror is substantially equal to an angle between a normal direction of the plane mirror and the optical axis. 如請求項12所述之光學測量系統,其中該鏡體由二個平面鏡組成,該光源的數量為二,該些平面鏡分別設置於該光軸之相對兩側且共同具有該鏡體之該開口,其中每一該些光源的光線前進方向與每一該些平面鏡的法線方向夾角大致上等於每一該些平面鏡的法線方向與該光軸的夾角。 The optical measuring system of claim 12, wherein the mirror body is composed of two plane mirrors, the number of the light sources is two, and the plane mirrors are respectively disposed on opposite sides of the optical axis and have the opening of the mirror body The angle between the forward direction of the light of each of the light sources and the normal direction of each of the planar mirrors is substantially equal to the angle between the normal direction of each of the planar mirrors and the optical axis. 一種光學成像系統,包含:一透鏡模組,設置於一待測物與一感光側之間,具有一光軸;以及 一光源模組,設置於該透鏡模組與該感光側之間,其中該光源模組具有一開口以及環繞該開口的一發光部,該透鏡模組之該光軸穿過該開口,該光源模組的該發光部用以將一圖像經該透鏡模組成像於該待測物上,以使該待測物將該圖像反射至該感光側。 An optical imaging system comprising: a lens module disposed between an object to be tested and a photosensitive side, having an optical axis; a light source module is disposed between the lens module and the photosensitive side, wherein the light source module has an opening and a light emitting portion surrounding the opening, the optical axis of the lens module passes through the opening, the light source The light emitting portion of the module is configured to image an image on the object to be tested through the lens module, so that the object to be tested reflects the image to the photosensitive side. 如請求項15所述之光學成像系統,其中該光源模組包含:複數個光源,其中該些光源朝向該待測物發出光線;以及一載體,用以承載該些光源,其中該載體具有一開口供該光軸穿過,以形成該光源模組的該開口。 The optical imaging system of claim 15, wherein the light source module comprises: a plurality of light sources, wherein the light sources emit light toward the object to be tested; and a carrier for carrying the light sources, wherein the carrier has a An opening is provided through the optical axis to form the opening of the light source module. 如請求項16所述之光學成像系統,其中該些光源環狀排列於該載體上,而露出該載體之該開口。 The optical imaging system of claim 16, wherein the light sources are annularly arranged on the carrier to expose the opening of the carrier. 如請求項15所述之光學成像系統,其中該光源模組包含:至少一光源,用以發出一光線;至少一鏡體,用以反射來自該光源的該光線以使該光線朝向該待測物前進,其中該鏡體具有一開口供該光軸穿過,以形成該光源模組的該開口;以及至少一光源透鏡件,設置於該光源與該鏡體之間。 The optical imaging system of claim 15, wherein the light source module comprises: at least one light source for emitting a light; and at least one mirror body for reflecting the light from the light source to direct the light toward the test Moving forward, wherein the mirror body has an opening for the optical axis to pass through to form the opening of the light source module; and at least one light source lens member disposed between the light source and the mirror body. 如請求項18所述之光學成像系統,其中該鏡體為一平面鏡,該光源的光線前進方向與該平面鏡的法線方向夾角大致上等於該平面鏡的法線方向與該光軸的夾角。 The optical imaging system of claim 18, wherein the mirror body is a plane mirror, and an angle between a light traveling direction of the light source and a normal direction of the plane mirror is substantially equal to an angle between a normal direction of the plane mirror and the optical axis. 如請求項18所述之光學成像系統,其中該鏡體由二個平面鏡組成,該光源的數量為二,該些平面鏡分別設置於該光軸之相對兩側且共同具有該鏡體之該開口,每一該些光源的光線前進方向與每一該些平面鏡的法線方向夾角大致上等於每一該些平面鏡的法線方向與該光軸的夾角。 The optical imaging system of claim 18, wherein the mirror body is composed of two plane mirrors, the number of the light sources is two, and the plane mirrors are respectively disposed on opposite sides of the optical axis and have the opening of the mirror body The angle between the direction of the light of each of the light sources and the normal direction of each of the plane mirrors is substantially equal to the angle between the normal direction of each of the plane mirrors and the optical axis.
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