TWI595015B - Photo-curable and thermo-curable resin composition and dry film solder resist - Google Patents

Photo-curable and thermo-curable resin composition and dry film solder resist Download PDF

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TWI595015B
TWI595015B TW105109374A TW105109374A TWI595015B TW I595015 B TWI595015 B TW I595015B TW 105109374 A TW105109374 A TW 105109374A TW 105109374 A TW105109374 A TW 105109374A TW I595015 B TWI595015 B TW I595015B
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acid
resin composition
thermosetting resin
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TW201634511A (en
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慶有眞
崔炳柱
鄭遇載
崔寶允
李光珠
鄭珉壽
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Lg化學股份有限公司
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L69/00Compositions of polycarbonates; Compositions of derivatives of polycarbonates
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G64/00Macromolecular compounds obtained by reactions forming a carbonic ester link in the main chain of the macromolecule
    • C08G64/04Aromatic polycarbonates
    • C08G64/06Aromatic polycarbonates not containing aliphatic unsaturation
    • C08G64/14Aromatic polycarbonates not containing aliphatic unsaturation containing a chain-terminating or -crosslinking agent
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/34Silicon-containing compounds
    • C08K3/36Silica
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/032Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/075Silicon-containing compounds
    • G03F7/0752Silicon-containing compounds in non photosensitive layers or as additives, e.g. for dry lithography

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  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
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Description

光硬化與熱硬化樹脂組成物及乾膜式防焊劑Photohardening and thermosetting resin composition and dry film solder resist

本發明有關於一種光硬化與熱硬化樹脂組成物及乾膜式防焊劑。更具體地,本發明有關於一種用於提供具有高顯影性而可以更容易實現微細間距且具有低α粒子放射率、低介電常數、低熱膨脹系數及優秀耐熱可靠度等性質之乾膜式防焊劑之光硬化與熱硬化樹脂組成物以及具有上述特性之乾膜式防焊劑。 The present invention relates to a photohardening and thermosetting resin composition and a dry film solder resist. More particularly, the present invention relates to a dry film type for providing properties having high developability, which can more easily achieve fine pitch and having low alpha particle emissivity, low dielectric constant, low thermal expansion coefficient, and excellent heat resistance reliability. A photocurable and thermosetting resin composition of a solder resist and a dry film solder resist having the above characteristics.

隨著多種電子裝置之微型化及輕量化趨勢,可形成微細開口圖案之光敏防焊劑被用於印刷電路板、半導體封裝板、可撓式電路板等。 With the trend toward miniaturization and weight reduction of various electronic devices, photosensitive solder resists which can form fine opening patterns are used for printed circuit boards, semiconductor package boards, flexible circuit boards, and the like.

半導體封裝產物為一種複雜的材料組合,其是由如環氧鑄模或防焊劑之非導體、如晶片之半導體及如電路板圖案(board circuit pattern)之導體所組成,且為了製備半導體封裝產物,應進行眾多伴隨著嚴重熱衝擊條件的程序。然而,由於非導體、半導體、及導體之熱膨脹係數(coefficient of thermal expansion,CTE)不同,產生尺寸不穩定性及翹曲(warpage)現象之問題。此現象可能會在經由錫球或金線連接晶片和半導體板時,引起晶片和板間 的錯誤位置配對;以及因切應力(shear stress)造成產品的裂痕或破裂,進而影響產品壽命。 The semiconductor package product is a complex material combination composed of a non-conductor such as an epoxy mold or solder resist, a semiconductor such as a wafer, and a conductor such as a board circuit pattern, and in order to prepare a semiconductor package product, There should be a number of procedures that are accompanied by severe thermal shock conditions. However, due to the difference in coefficient of thermal expansion (CTE) of non-conductors, semiconductors, and conductors, dimensional instability and warpage are caused. This phenomenon may cause the wafer and the board between the wafer and the semiconductor board via solder balls or gold wires. Mismatched positional alignment; and cracking or cracking of the product due to shear stress, which in turn affects product life.

近年來隨著板體變薄,如尺寸不穩定性和翹曲現象之問題變得越嚴重。為了解決上述問題,材料的研發是針對將材料間的CTE不匹配最小化而進行。並且同時需要發展具有低熱膨脹係數之防焊劑。 In recent years, as the plate body becomes thinner, problems such as dimensional instability and warpage become more serious. In order to solve the above problems, the development of materials is directed to minimizing CTE mismatch between materials. At the same time, it is necessary to develop a solder resist having a low coefficient of thermal expansion.

目前已知的乾膜式防焊劑之熱膨脹係數,其在溫度低於玻璃轉換溫度(Tg)時之熱膨脹係數(α1)為45至70ppm;而在溫度高於玻璃轉換溫度(Tg)時之熱膨脹係數(α2)為140至170ppm。 The thermal expansion coefficient of the dry film type solder resist currently known is a thermal expansion coefficient (α1) of 45 to 70 ppm at a temperature lower than the glass transition temperature (Tg); and thermal expansion at a temperature higher than the glass transition temperature (Tg). The coefficient (α2) is 140 to 170 ppm.

做為用於現今板體材料間的核芯,已有研究發展具有10ppm以下甚至5ppm以下熱膨脹係數之材料。然而,尚未有研究發展可伴隨核芯使用之用於防焊劑之材料。 As a core for use between today's plate materials, materials having a thermal expansion coefficient of 10 ppm or less and even 5 ppm or less have been studied. However, there has not been research to develop materials for solder resists that can be used with cores.

曾試圖藉由增加使用之填充劑含量以降低防焊劑之熱膨脹係數。然而,若填充劑增加到超過一定程度,可能會因填充劑內聚力而造成難以塗佈,且可能會降低塗佈後及硬化前的延展性,導致操作性劣化。 Attempts have been made to reduce the coefficient of thermal expansion of the solder resist by increasing the amount of filler used. However, if the filler is increased beyond a certain level, it may be difficult to apply due to the cohesive force of the filler, and the ductility after coating and before hardening may be lowered, resulting in deterioration of workability.

一般對防焊劑需求的特性如:顯影性、高解析度、絕緣性、黏附性、焊接時的耐熱性、對金塗覆之耐受性等。具體而言,除了上述的性質外,如對抗從-65℃至150℃之溫度循環測試(temperature cycle test,TCT)之抗裂痕性;或對微細打線之高加速應力試驗(highly accelerated stress test,HAST)特性,皆為對用於半導體封裝板之防焊劑之需求。 Generally, the characteristics required for the solder resist are: developability, high resolution, insulation, adhesion, heat resistance at the time of soldering, resistance to gold coating, and the like. Specifically, in addition to the above properties, such as resistance to cracking from a temperature cycle test (TCT) from -65 ° C to 150 ° C; or a highly accelerated stress test (for a highly accelerated stress test, HAST) properties are all requirements for solder resists for semiconductor package boards.

最近,在防焊劑方面,具有利於膜厚均勻性、表面光滑度及薄膜形成性之乾膜式防焊劑已受到重視。除了上述特性,此種乾膜式防焊劑可具有簡化形成光阻程序、在形成光阻程序中減少溶劑置換之優點。 Recently, in the case of solder resists, dry film solder resists which contribute to uniformity of film thickness, surface smoothness, and film formability have been paid attention to. In addition to the above characteristics, such a dry film solder resist can have the advantages of simplifying the formation of a photoresist process and reducing solvent replacement in forming a photoresist process.

早期,連同酸性改質寡聚物、光起始劑及熱硬化黏結劑一同包含光聚合性單體(如多官能基丙烯酸酯)之光硬化與熱硬化樹脂組成物是用於形成防焊劑。然而,由此種樹脂組成物形成之防焊劑無法展現高玻璃轉換溫度或足夠的耐熱可靠度。因此,對半導體裝置之封裝板材料之需求,所述組成物具有無法滿足PCT耐受性、TCT耐熱性、對微細打線之HAST耐受性等缺點。 In the early stage, a photohardenable and thermosetting resin composition containing a photopolymerizable monomer (e.g., a polyfunctional acrylate) together with an acid-modified oligomer, a photoinitiator, and a thermosetting binder was used to form a solder resist. However, the solder resist formed of such a resin composition cannot exhibit a high glass transition temperature or sufficient heat resistance reliability. Therefore, the composition has a drawback that it cannot satisfy the PCT tolerance, the TCT heat resistance, the HAST resistance to fine wire bonding, and the like for the material of the package material of the semiconductor device.

本發明提供一種光硬化與熱硬化樹脂組成物,其用於提供具有高顯影性而可以更容易實現微細間距(fine pitch)且具有低α粒子放射率、低介電常數、低熱膨脹系數及優秀耐熱可靠度等性質之乾膜式防焊劑。 The present invention provides a photohardenable and thermosetting resin composition for providing high developability, which can more easily achieve fine pitch and has low alpha particle emissivity, low dielectric constant, low thermal expansion coefficient, and excellent Dry film solder resist with properties such as heat resistance reliability.

再者,本發明提供一種具有高顯影性而可以更容易實現微細間距且具有低α粒子放射率、低介電常數、低熱膨脹系數及優秀耐熱可靠度等性質之乾膜式防焊劑(dryfilmsolder resist,DFSR)。 Furthermore, the present invention provides a dry film solder resist having high developability and which can more easily realize fine pitch and has low α particle emissivity, low dielectric constant, low thermal expansion coefficient, and excellent heat resistance reliability (dry film solder resist) , DFSR).

本發明所提供之光硬化與熱硬化樹脂組成物,包含:第一酸性改質寡聚物,其包含具有羧基且酸值為100至180mgKOH/g 之亞氨基碳酸酯系化合物;光聚合性單體,其具有兩個以上之光硬化性不飽和官能基;熱硬化黏結劑,其具有熱硬化性官能基;無機填充劑,其包含50至90重量百分比之二氧化矽;以及光起始劑。 The photohardening and thermosetting resin composition provided by the present invention comprises: a first acidic modified oligomer comprising a carboxyl group and having an acid value of 100 to 180 mgKOH/g An iminocarbonate-based compound; a photopolymerizable monomer having two or more photocurable unsaturated functional groups; a thermosetting binder having a thermosetting functional group; and an inorganic filler comprising 50 to 90 Percent by weight of cerium oxide; and a photoinitiator.

所述光硬化與熱硬化樹脂組成物還可以包含具有羧基及光硬化性不飽和官能基之第二酸性改質寡聚物。上述“第二”是用於區分兩種酸性改質寡聚物的術語,不應被解釋為是用於限制順序或重要度等。 The photohardenable and thermosetting resin composition may further comprise a second acidic modified oligomer having a carboxyl group and a photocurable unsaturated functional group. The above "second" is a term used to distinguish between two acidic modified oligomers, and should not be construed as limiting the order or importance or the like.

所述無機填充劑可包含50至90重量百分比之二氧化矽和10至50重量百分比之一種或多種選自由硫酸鋇、鈦酸鋇、滑石、黏土、碳酸鎂、碳酸鈣、氧化鋁、氫氧化鋁及雲母所組成之群組的化合物。 The inorganic filler may comprise 50 to 90% by weight of cerium oxide and 10 to 50% by weight of one or more selected from the group consisting of barium sulfate, barium titanate, talc, clay, magnesium carbonate, calcium carbonate, aluminum oxide, and hydroxide. a compound of the group consisting of aluminum and mica.

所述光硬化與熱硬化樹脂組成物可包含5至50重量百分比之所述無機填充劑。 The photohardenable and thermosetting resin composition may contain 5 to 50% by weight of the inorganic filler.

所述亞氨基碳酸酯系化合物可以是使氰酸酯系化合物和二羧酸化合物反應而形成的化合物。 The imino carbonate-based compound may be a compound formed by reacting a cyanate-based compound and a dicarboxylic acid compound.

所述二羧酸化合物可為脂肪族(aliphatic)二羧酸化合物、脂環族(alicyclic)二羧酸化合物或芳香族(aromatic)二羧酸化合物。 The dicarboxylic acid compound may be an aliphatic dicarboxylic acid compound, an alicyclic dicarboxylic acid compound or an aromatic dicarboxylic acid compound.

所述脂肪族二羧酸化合物可包含草酸(oxalic acid)、丙二酸(malonic acid)、琥珀酸(succinic acid)、戊二酸(glutaric acid)、己二酸(adipic acid)、庚二酸(pimelic acid)、辛二酸(suberic acid)、壬二酸(azelaic acid)、癸二酸(sebacic acid)、降冰片烯二羧酸 (norbornene dicarboxylic acid)、C5-C10環烷烴二羧酸(C5-C10 cycloalkane dicarboxylic acid)、其酸酐(acid anhydrides)、或其兩種以上之混合。 The aliphatic dicarboxylic acid compound may comprise oxalic acid, malonic acid, succinic acid, glutaric acid, adipic acid, pimelic acid (pimelic acid), suberic acid, azelaic acid, sebacic acid, norbornene dicarboxylic acid (norbornene dicarboxylic acid), C5-C10 cycloalkane dicarboxylic acid, acid anhydrides, or a mixture of two or more thereof.

所述芳香族二羧酸化合物可包含鄰苯二甲酸(phthalic acid)、降冰片烯二羧酸、四氫鄰苯二甲酸(tetrahydrophthalic acid)、琥珀酸、咪唑二羧酸(imidazole dicarboxylic acid)、吡啶二羧酸(pyridine dicarboxylic acid)、其酸酐、或其兩種以上之混合。 The aromatic dicarboxylic acid compound may include phthalic acid, norbornene dicarboxylic acid, tetrahydrophthalic acid, succinic acid, imidazole dicarboxylic acid, A pyridine dicarboxylic acid, an acid anhydride thereof, or a mixture of two or more thereof.

所述氰酸酯系化合物可包含具有氰化物基團(-OCN)之雙酚系(bisphenol-based)或酚醛清漆系(novolak-based)化合物。 The cyanate ester compound may include a bisphenol-based or novolak-based compound having a cyanide group (-OCN).

所述具有羧基且酸值為100至180mgKOH/g的亞氨基碳酸酯系化合物可包含下述式1之亞氨基碳酸酯系化合物: The iminocarbonate-based compound having a carboxyl group and having an acid value of from 100 to 180 mgKOH/g may comprise an iminocarbonate-based compound of the following formula 1:

在上述式1中,n為0至100之整數,R1為一衍生自所述二羧酸化合物之官能基。 In the above formula 1, n is an integer of 0 to 100, and R 1 is a functional group derived from the dicarboxylic acid compound.

具體地,在上述式1中,所述R1可為在一種選自由C6-C20 芳香環、C4-C20伸環烷基環(cycloalkylene ring)以及C4-C20伸環烯基環(cycloalkenylene ring)所組成之群組之核心基團上結合有醯基及羧基之官能基。 Specifically, in the above formula 1, the R 1 may be selected from the group consisting of a C6-C20 aromatic ring, a C4-C20 cycloalkylene ring, and a C4-C20 cycloalkenylene ring. The functional groups of the thiol group and the carboxyl group are bonded to the core group of the group formed.

在上述式1中,R1可為,上述「*」表示結合點。 In the above formula 1, R 1 may be , or The above "*" indicates the point of integration.

基於所述樹脂組成物之總重,包含之所述第一酸性改質寡聚物之含量可為5至75重量百分比或10至50重量百分比。另外,基於所述樹脂組成物之總量,可選擇性地包含5至75重量百分比或10至50重量百分比之所述第一酸性改質寡聚物及具有羧基及光硬化性不飽和官能基之所述第二酸性改質寡聚物。 The content of the first acidic modified oligomer contained may be 5 to 75 weight percent or 10 to 50 weight percent based on the total weight of the resin composition. Further, the first acidic modified oligomer and the carboxyl group and the photocurable unsaturated functional group may be optionally contained in an amount of 5 to 75 weight percent or 10 to 50 weight percent based on the total amount of the resin composition. The second acidic modified oligomer.

所述光聚合性單體可包含具有兩個以上之光硬化性不飽和官能基之丙烯酸酯系化合物。 The photopolymerizable monomer may include an acrylate-based compound having two or more photocurable unsaturated functional groups.

所述光聚合性單體可包含:具羥基之丙烯酸酯系化合物、水溶性丙烯酸酯系化合物、聚酯丙烯酸酯系化合物、聚氨酯(polyurethane)丙烯酸酯系化合物、環氧丙烯酸酯系化合物、己內酯(caprolactone)改性之丙烯酸酯系 化合物、或其兩種以上之混合物。 The photopolymerizable monomer may include an acrylate-based compound having a hydroxyl group, a water-soluble acrylate-based compound, a polyester acrylate-based compound, a urethane acrylate-based compound, an epoxy acrylate-based compound, or the like. Caprolactone modified acrylate a compound, or a mixture of two or more thereof.

基於所述樹脂組成物之總重,包含之所述光聚合性單體之含量可為1至30重量百分比或2至20重量百分比。 The photopolymerizable monomer may be included in an amount of 1 to 30% by weight or 2 to 20% by weight based on the total mass of the resin composition.

所述光起始劑可包含一種或多種選自由:苯偶姻(benzoins)及其烷基醚(alkylethers)、苯乙酮(acetophenones)、蒽醌(anthraquinones)、噻噸酮(thioxanthones)、縮酮(ketals)、二苯甲酮(benzophenones)、α-氨基苯乙酮(α-aminoacetophenones)、醯基氧化膦(acylphosphine oxides)、肟酯(oxime esters)所組成之群組的化合物。 The photoinitiator may comprise one or more selected from the group consisting of: benzoins and their alkylethers, acetophenones, anthraquinones, thioxanthones, condensed A compound of the group consisting of ketals, benzophenones, alpha-aminoacetophenones, acylphosphine oxides, and oxime esters.

基於所述樹脂組成物之總重,包含之所述光起始劑之含量可為0.5至20重量百分比。 The photoinitiator may be included in an amount of from 0.5 to 20% by weight based on the total mass of the resin composition.

所述熱硬化性官能基可為一種或多種選自由:環氧基、氧雜環丁烷基(oxetanyl group)、環醚基(cyclic ether group)、及環狀硫醚基(cyclic thioether group)所組成之群組的官能基。 The thermosetting functional group may be one or more selected from the group consisting of: an epoxy group, an oxetanyl group, a cyclic ether group, and a cyclic thioether group. The functional groups of the group formed.

相對於1當量之所述第一酸性改質寡聚物之羧基,所包含之所述熱硬化黏結劑之含量可相當於0.5至2.0當量。例如,所述光硬化與熱硬化樹脂組成物可包含1至30重量百分比或2至25重量百分比之所述熱硬化粘合劑。 The content of the thermosetting binder contained may be equivalent to 0.5 to 2.0 equivalents with respect to 1 equivalent of the carboxyl group of the first acid-modified oligomer. For example, the photohardenable and thermosetting resin composition may contain 1 to 30% by weight or 2 to 25% by weight of the thermosetting adhesive.

光硬化與熱硬化樹脂組成物,可更包含:溶劑;以及一種或多種選自由熱硬化黏結劑催化劑、填充劑、顏料、及添加劑所組成之群組的物質。所述光硬化與熱硬化樹脂組成物例如可包含1至50重量百分比之溶劑。 The photohardenable and thermosetting resin composition may further comprise: a solvent; and one or more substances selected from the group consisting of thermosetting binder catalysts, fillers, pigments, and additives. The photohardenable and thermosetting resin composition may, for example, contain 1 to 50% by weight of a solvent.

此外,本發明可提供一種乾膜式防焊劑,包含:第一酸性改質寡聚物、光聚合性單體和熱硬化黏結劑之硬化產物以及無機填充劑,其中所 述第一酸性改質寡聚物包含具有羧基且酸值為100至180mgKOH/g之亞氨基碳酸酯系化合物,所述光聚合性單體具有兩個以上之光硬化性不飽和官能基,所述熱硬化黏結劑具有熱硬化性官能基,所述無機填充劑散布於所述硬化產物中且包含50至90重量百分比之二氧化矽。 In addition, the present invention can provide a dry film solder resist comprising: a first acid modified oligomer, a photopolymerizable monomer, and a hardening product of a thermosetting binder, and an inorganic filler, wherein The first acidic modified oligomer comprises an imino carbonate-based compound having a carboxyl group and having an acid value of from 100 to 180 mgKOH/g, wherein the photopolymerizable monomer has two or more photocurable unsaturated functional groups. The thermosetting bonding agent has a thermosetting functional group dispersed in the hardened product and containing 50 to 90% by weight of cerium oxide.

所述乾膜式防焊劑之α粒子放射率可為0.010alphas/cm2/hr以下(或者0.010c/hr/cm2)。 The dry film type solder resist may have an alpha particle emissivity of 0.010 alphas/cm 2 /hr or less (or 0.010 c/hr/cm 2 ).

所述硬化產物可包含:所述亞氨基碳酸酯系化合物之羧基與所述熱硬化性官能基交聯之交聯結構;具有羧基及光硬化性不飽和官能基之所述第二酸性改質寡聚物之羧基與所述熱硬化性官能基交聯之交聯結構;衍生自所述亞氨基碳酸酯系化合物之交聯三嗪結構;以及具有羧基及光硬化性不飽和官能基之所述第二酸性改質寡聚物和光聚合性單體各自的不飽和官能基彼此交聯之交聯結構。 The hardened product may include: a crosslinked structure in which a carboxyl group of the imino carbonate-based compound is crosslinked with the thermosetting functional group; and the second acidic modified group having a carboxyl group and a photocurable unsaturated functional group a crosslinked structure in which a carboxyl group of the oligomer is crosslinked with the thermosetting functional group; a crosslinked triazine structure derived from the imino carbonate compound; and a group having a carboxyl group and a photocurable unsaturated functional group A crosslinked structure in which the unsaturated functional groups of the second acidic modified oligomer and the photopolymerizable monomer are crosslinked with each other.

所述乾膜式防焊劑可具有低於40ppm/K之熱膨脹係數。 The dry film solder resist may have a coefficient of thermal expansion of less than 40 ppm/K.

所述乾膜式防焊劑可具有120至180℃之玻璃轉換溫度(Tg)。 The dry film solder resist may have a glass transition temperature (Tg) of 120 to 180 °C.

所述無機填充劑包含50至90重量百分比之二氧化矽和10至50重量百分比之一種或多種選自由硫酸鋇、鈦酸鋇、滑石、黏土、碳酸鎂、碳酸鈣、氧化鋁、氫氧化鋁及雲母所組成之群組的化合物。 The inorganic filler comprises 50 to 90% by weight of cerium oxide and 10 to 50% by weight of one or more selected from the group consisting of barium sulfate, barium titanate, talc, clay, magnesium carbonate, calcium carbonate, aluminum oxide, and aluminum hydroxide. And a group of compounds composed of mica.

所述乾膜式防焊劑可包含5至50重量百分比之所述無機填充劑。 The dry film solder resist may contain 5 to 50% by weight of the inorganic filler.

因為具有由式2等表示之交聯三嗪結構,所以由所述樹脂組成物提供的乾膜式防焊劑(DFSR)與使用基於酚醛(novolac)結構之酸性改質環氧丙烯酸酯之常規結構相比可具有更高的玻璃轉換溫度(Tg)以及更低的熱膨脹係數,因而可以具有提升之耐熱可靠度。 Since the crosslinked triazine structure represented by Formula 2 or the like, the dry film type solder resist (DFSR) provided by the resin composition and the conventional structure using an acid modified epoxy acrylate based on a novolac structure Compared with a higher glass transition temperature (Tg) and a lower coefficient of thermal expansion, it can have improved heat resistance reliability.

而且,使用包含使氰酸酯系化合物和二羧酸化合物反應而形成的化合物之酸性改質寡聚物來製備的乾膜式防焊劑,由於其顯影性大大提升,從而可以更容易實現微細間距(fine pitch)。 Further, a dry film type solder resist prepared by using an acid-modified oligomer having a compound formed by reacting a cyanate-based compound and a dicarboxylic acid compound is greatly improved in developability, so that fine pitch can be more easily realized. (fine pitch).

因此,所述DFSR可滿足半導體裝置之封裝板材料之所有需求:例如,PCT耐受性、TCT耐熱性、對微細打線之HAST耐受性,而且減少了翹曲現象,從而可以減少缺陷以及延長產品之壽命。 Therefore, the DFSR can satisfy all the requirements of the packaging material of the semiconductor device: for example, PCT resistance, TCT heat resistance, HAST resistance to fine wire bonding, and reduction of warpage, thereby reducing defects and prolonging The life of the product.

所述乾膜式防焊劑可更包含散布於所述硬化產物中之光起始劑。 The dry film solder resist may further comprise a photoinitiator dispersed in the hardened product.

所述乾膜式防焊劑可用於製造半導體裝置之封裝板。 The dry film solder resist can be used to manufacture a package board for a semiconductor device.

根據本發明,可提供一種具有高顯影性而可以更容易實現微細間距且具有低α粒子放射率、低介電常數、低熱膨脹係數及優秀耐熱可靠度等性質之乾膜式防焊劑。 According to the present invention, it is possible to provide a dry film solder resist which has high developability and can more easily realize fine pitch and has properties such as low α particle emissivity, low dielectric constant, low thermal expansion coefficient, and excellent heat resistance reliability.

在下文中,根據本發明實施態樣,將詳述光硬化與熱硬化樹脂組成物以及DFSR。 Hereinafter, according to an embodiment of the present invention, a photohardening and thermosetting resin composition and a DFSR will be described in detail.

在本發明一實施態樣中,提供之光硬化與熱硬化樹脂組成物包含:酸性改質寡聚物,其包含具有羧基且酸值為100至180mgKOH/g之亞氨基碳酸酯系化合物;光聚合性單體,其具有兩個以上之光硬化性不飽和官能基;熱硬化黏結劑,其具有熱硬化性官能基;無機填充劑,其包含50至90重量百分比之二氧化矽;以及光起始劑。 In an embodiment of the invention, the photohardenable and thermosetting resin composition comprises: an acid-modified oligomer comprising an imino carbonate-based compound having a carboxyl group and having an acid value of from 100 to 180 mgKOH/g; a polymerizable monomer having two or more photocurable unsaturated functional groups; a thermosetting binder having a thermosetting functional group; an inorganic filler comprising 50 to 90% by weight of cerium oxide; and light Starting agent.

光硬化與熱硬化樹脂組成物包含上述特定酸性改質寡聚物、光聚 合性單體、光起始劑、包含50至90重量百分比之二氧化矽之無機填充劑及熱硬化黏結劑,且尤其是包含具有羧基之亞氨基碳酸酯系化合物作為酸性改質寡聚物。 The photohardenable and thermosetting resin composition comprises the above specific acid-modified oligomer, photopolymerization a conjugate monomer, a photoinitiator, an inorganic filler containing 50 to 90% by weight of cerium oxide, and a thermosetting binder, and particularly an iminocarbonate compound having a carboxyl group as an acidic modified oligomer .

DFSR可利用上述實施態樣之樹脂組成物,經由以下步驟而形成之。首先,利用樹脂組成物形成一膜,並將膜層疊於提供之板體上;接著選擇性地將樹脂組成物中預計形成DFSR之部分曝光。接著,利用鹼溶液進行顯影,則保留在板體上的僅有樹脂組成物中的曝光部分(形成交聯結構之部分),而其他樹脂組成物中的未曝光部分溶在顯影液中而被移除。 The DFSR can be formed by the following steps using the resin composition of the above embodiment. First, a film is formed using a resin composition, and a film is laminated on a supplied plate; and then a portion of the resin composition where DFSR is expected to be formed is selectively exposed. Next, development with an alkali solution leaves the exposed portion of the resin composition only on the plate body (the portion where the crosslinked structure is formed), and the unexposed portion of the other resin composition is dissolved in the developer to be Remove.

接著,對保留在板體上的樹脂組成物以熱處理進行熱硬化,進而使包含在酸性改質寡聚物中(例如:亞氨基碳酸酯系化合物)的羧基,與包含在熱硬化黏結劑中的熱硬化性官能基進行反應,以形成交聯。因此,因熱硬化可形成交聯結構,可於板體上所需部分中形成DFSR。 Next, the resin composition remaining on the plate body is thermally hardened by heat treatment, and further, the carboxyl group contained in the acid-modified oligomer (for example, an imino carbonate-based compound) is contained in the heat-curing adhesive. The thermosetting functional group reacts to form a crosslink. Therefore, a crosslinked structure can be formed by thermal hardening, and a DFSR can be formed in a desired portion on the plate.

由於樹脂組成物包含亞氨基碳酸酯系化合物作為酸性改質寡聚物,在熱硬化過程中可形成交聯結構,例如,由下述式1之亞氨基碳酸酯系化合物形成由下述式2之交聯三嗪結構。其是由於包含在亞氨基碳酸酯系化合物之主鏈中的氮原子,經熱處理後互相鍵結而得到三嗪環。 Since the resin composition contains an imino carbonate-based compound as an acidic modified oligomer, a crosslinked structure can be formed during thermal hardening, for example, an iminocarbonate-based compound of the following formula 1 is formed by the following formula 2 Cross-linking triazine structure. This is because a nitrogen atom contained in the main chain of the imino carbonate-based compound is bonded to each other by heat treatment to obtain a triazine ring.

[式1] [Formula 1]

在上式1中,n為0至100之整數,R1為衍生自二羧酸化合物之官能基。 In the above formula 1, n is an integer of 0 to 100, and R 1 is a functional group derived from a dicarboxylic acid compound.

上述R1可為衍生自二羧酸化合物之官能基,例如,衍生自一種或多種選自由:草酸(oxalic acid)、丙二酸(malonic acid)、琥珀酸(succinic acid)、戊二酸(glutaric acid)、己二酸(adipic acid)、庚二酸(pimelic acid)、辛二酸(suberic acid)、壬二酸(azelaic acid)、癸二酸(sebacic acid)、降冰片烯二 羧酸(norbornene dicarboxylic acid)、環烷烴二羧酸(cycloalkane dicarboxylic acid)、和其酸酐(acid anhydrides)所組成之群組的化合物;或者,一種或多種選自由:鄰苯二甲酸(phthalic acid)、降冰片烯二羧酸、四氫鄰苯二甲酸(tetrahydrophthalic acid)、琥珀酸、咪唑二羧酸(imidazole dicarboxylic acid)、吡啶二羧酸(pyridine dicarboxylic acid)、和其酸酐所組成之群組的化合物。 The above R 1 may be a functional group derived from a dicarboxylic acid compound, for example, derived from one or more selected from the group consisting of: oxalic acid, malonic acid, succinic acid, glutaric acid ( Glutaric acid), adipic acid, pimelic acid, suberic acid, azelaic acid, sebacic acid, norbornene dicarboxylic acid a compound of the group consisting of: norbornene dicarboxylic acid, cycloalkane dicarboxylic acid, and acid anhydrides; or one or more selected from the group consisting of: phthalic acid, a compound of the group consisting of borneol dicarboxylic acid, tetrahydrophthalic acid, succinic acid, imidazole dicarboxylic acid, pyridine dicarboxylic acid, and anhydride thereof .

具體地,上述R1可為在一種選自由C6-C20芳香環、C4-C20伸環烷基環以及C4-C20伸環烯基環所組成之群組之核心基團上結合有醯基及羧基之官能基。 Specifically, the above R 1 may be a thiol group bonded to a core group selected from the group consisting of a C6-C20 aromatic ring, a C4-C20 cycloalkylene ring, and a C4-C20 cycloalkenyl ring. a functional group of a carboxyl group.

上述R1具體範例可為衍生自鄰苯二甲酸之官能基、衍生自四氫鄰苯二甲酸之官能基或衍生自環己烷之官能基The above specific example of R 1 may be a functional group derived from phthalic acid a functional group derived from tetrahydrophthalic acid Or a functional group derived from cyclohexane .

換言之,當使用樹脂組成物形成DFSR時,形成DFSR的樹脂組成物之硬化產物中包含交聯三嗪結構,隨著其他殘留化合物的量減少到最低,可以確保更高的顯影性,因此更容易實現微細間距。而且,使用光硬 化與熱硬化樹脂組成物可以提供具有低α粒子放射率、低介電常數、低熱膨脹係數及優秀耐熱可靠度等性質之乾膜式防焊劑。 In other words, when the DFSR is formed using the resin composition, the hardened product of the resin composition forming the DFSR contains a crosslinked triazine structure, and as the amount of other residual compounds is minimized, higher developability can be ensured, and thus it is easier Achieve fine pitch. Moreover, using light hard The chemically and thermally hardened resin composition can provide a dry film solder resist having low alpha particle emissivity, low dielectric constant, low thermal expansion coefficient, and excellent heat resistance reliability.

光硬化與熱硬化樹脂組成物可包含無機填充劑,其包含50至90重量百分比之二氧化矽。藉由將包含於光硬化與熱硬化樹脂組成物之無機填充劑中的二氧化矽控制為50至90重量百分比,可以大大降低由樹脂組成物形成的DFSR之α粒子放射率和介電常數,還可以確保所形成的DFSR具有足夠的硬度且對常用基板保持較高的附著力。 The photohardenable and thermosetting resin composition may comprise an inorganic filler comprising 50 to 90% by weight of cerium oxide. By controlling the cerium oxide contained in the inorganic filler of the photohardenable and thermosetting resin composition to 50 to 90% by weight, the α-particle emissivity and dielectric constant of the DFSR formed by the resin composition can be greatly reduced. It is also ensured that the formed DFSR has sufficient hardness and maintains high adhesion to a common substrate.

無機填充劑可包含50至90重量百分比之二氧化矽及其他無機填充劑。若無機填充劑中二氧化矽的含量低於50重量百分比,則上述實施態樣之樹脂組成物之硬化產物或由此形成的乾膜式防焊劑的硬度可能會降低或者介電常數可能會大大上升,而且乾膜式防焊劑的α粒子放射率可能會大大增加。 The inorganic filler may contain from 50 to 90% by weight of cerium oxide and other inorganic fillers. If the content of cerium oxide in the inorganic filler is less than 50% by weight, the hardness of the hardened product of the resin composition of the above embodiment or the dry film solder resist formed therefrom may be lowered or the dielectric constant may be greatly increased Rising, and the alpha particle emissivity of the dry film solder resist may increase greatly.

另外,若無機填充劑中二氧化矽的含量超出90重量百分比,則有可能因所述二氧化矽的高折射率而導致上述實施態樣之光硬化與熱硬化樹脂組成物的顯影性降低,而且樹脂組成物的顯影後與基板之附著力可能會降低。 In addition, when the content of cerium oxide in the inorganic filler exceeds 90% by weight, the photocuring of the above-described embodiment and the developability of the thermosetting resin composition may be lowered due to the high refractive index of the cerium oxide. Further, the adhesion of the resin composition to the substrate after development may be lowered.

所述二氧化矽可具有50nm至500nm之平均直徑。 The cerium oxide may have an average diameter of 50 nm to 500 nm.

具體地,無機填充劑可包含50至90重量百分比之二氧化矽和10至50重量百分比之一種或多種選自由硫酸鋇、鈦酸鋇、滑石、黏土、碳酸鎂、碳酸鈣、氧化鋁、氫氧化鋁及雲母所組成之群組的化合物。 Specifically, the inorganic filler may comprise 50 to 90% by weight of cerium oxide and 10 to 50% by weight of one or more selected from the group consisting of barium sulfate, barium titanate, talc, clay, magnesium carbonate, calcium carbonate, aluminum oxide, hydrogen a compound of the group consisting of alumina and mica.

上述實施態樣之光硬化與熱硬化樹脂組成物可包含5至50重量百分比之無機填充劑。若無機填充劑之含量過低,則有可能無法確保最終 形成的DFSR具有足夠的硬度和剛性(stiffness)而導致可操作性降低,而且不能充分地展現添加無機填充劑引起之效果。另外,若無機填充劑之含量過高,則無機填充劑不易散布到上述實施態樣之光硬化與熱硬化樹脂組成物中,還有樹脂組成物之黏性會大大提高導致不易塗布在基板上,因此可能不易形成乾膜式防焊劑,而且最終形成的乾膜式防焊劑之延展性等可能會降低。 The photohardenable and thermosetting resin composition of the above embodiment may contain 5 to 50% by weight of an inorganic filler. If the content of the inorganic filler is too low, it may not be possible to ensure the final The formed DFSR has sufficient hardness and stiffness to cause a decrease in operability, and does not sufficiently exhibit the effect caused by the addition of the inorganic filler. Further, if the content of the inorganic filler is too high, the inorganic filler is not easily dispersed in the photohardenable and thermosetting resin composition of the above embodiment, and the viscosity of the resin composition is greatly enhanced to cause coating on the substrate. Therefore, it may be difficult to form a dry film solder resist, and the ductility of the finally formed dry film solder resist may be lowered.

在下文中,根據本發明之實施態樣,樹脂組成物之各組份將更仔細地描述。 Hereinafter, the components of the resin composition will be described more carefully according to an embodiment of the present invention.

酸性改質寡聚物 Acid modified oligomer

根據本發明一實施態樣,樹脂組成物包含具有羧基且酸值為100至180mgKOH/g之亞氨基碳酸酯系化合物作為酸性改質寡聚物。酸性改質寡聚物由於具有羧基使得樹脂組成物之未曝光部分具有更高之鹼顯影性。 According to an embodiment of the present invention, the resin composition contains an iminocarbonate-based compound having a carboxyl group and having an acid value of from 100 to 180 mgKOH/g as an acidic modified oligomer. The acid-modified oligomer has a higher alkali developability due to the carboxyl group so that the unexposed portion of the resin composition.

詳述之,當樹脂組成物包含亞氨基碳酸酯系化合物作為酸性改質寡聚物,在形成DFSR之樹脂組成物之硬化產物中可形成式2之交聯之三嗪結構。因此,一實施態樣之樹脂組成物是能夠製備及提供DFSR,其具有較高的玻璃轉換溫度及提升之耐熱可靠度。 In detail, when the resin composition contains an imino carbonate-based compound as an acidic modified oligomer, a crosslinked triazine structure of Formula 2 can be formed in the hardened product of the resin composition forming DFSR. Therefore, an embodiment of the resin composition is capable of preparing and providing a DFSR having a high glass transition temperature and improved heat resistance reliability.

如上所述,亞氨基碳酸酯系化合物之酸值可為100至180mgKOH/g或120至160mgKOH/g,由於具有羧基之亞氨基碳酸酯系化合物具有上述範圍之酸值,光硬化與熱硬化樹脂組成物可具有更高之顯影性,而且在由此製造之乾膜式防焊劑上可以更容易實現微細之間距。 As described above, the iminocarbonate-based compound may have an acid value of from 100 to 180 mgKOH/g or from 120 to 160 mgKOH/g, and that the iminoaminocarbonate compound having a carboxyl group has an acid value in the above range, photohardening and thermosetting resin The composition can have higher developability, and the fine pitch can be more easily realized on the dry film solder resist thus manufactured.

此外,若亞氨基碳酸酯系化合物之酸值低於100mgKOH/g,則在由光硬化與熱硬化樹脂組成物形成之乾膜上不易控制圖案之厚度或者難以 實現較高之縱橫比(aspect ratio)。而且,若亞氨基碳酸酯系化合物之酸值超出180mgKOH/g,則有可能光硬化與熱硬化樹脂組成物之顯影性變得過高而導致曝光後顯影時連曝光部分也會一起顯影。 Further, when the acid value of the iminocarbonate-based compound is less than 100 mgKOH/g, it is difficult to control the thickness of the pattern or the difficulty on the dry film formed of the photocurable and thermosetting resin composition. Achieve a higher aspect ratio. Further, when the acid value of the iminocarbonate-based compound exceeds 180 mgKOH/g, there is a possibility that the developability of the photohardenable and thermosetting resin composition becomes too high, and the exposed portions are also developed together after development after exposure.

亞氨基碳酸酯系化合物可經由反應一氰酸酯系化合物與一二羧酸化合物所形成。根據此種亞氨基碳酸酯系化合物之用途,交聯之三嗪結構較佳可在熱硬化過程中形成,且可提供展現更佳耐熱可靠度之DFSR。 The iminocarbonate-based compound can be formed by reacting a monocyanate compound with a monocarboxylic acid compound. According to the use of such an imino carbonate-based compound, the crosslinked triazine structure is preferably formed during the thermosetting process, and provides a DFSR exhibiting better heat resistance reliability.

作為氰酸酯系化合物,可使用具有氰化物基團(-OCN)之雙酚系(bisphenol-based)或酚醛清漆系(noyolak-based)化合物,例如下述式1a之化合物。 As the cyanate ester compound, a bisphenol-based or noyolak-based compound having a cyanide group (-OCN), for example, a compound of the following formula 1a can be used.

在上述式1a中,n為1至100之整數。 In the above formula 1a, n is an integer of from 1 to 100.

再者,與氰酸酯系化合物反應之二羧酸化合物可為脂肪族二羧酸化合物、脂環族二羧酸化合物、或芳香族二羧酸化合物。 Further, the dicarboxylic acid compound which is reacted with the cyanate ester compound may be an aliphatic dicarboxylic acid compound, an alicyclic dicarboxylic acid compound or an aromatic dicarboxylic acid compound.

具體而言,所述二羧酸化合物可包括:草酸(oxalic acid)、丙二酸(malonic acid)、琥珀酸(succinic acid)、戊二酸(glutaric acid)、己二酸(adipic acid)、庚二酸(pimelic acid)、辛二酸(suberic acid)、壬二酸(azelaic acid)、癸二酸(sebacic acid)、降冰片烯二羧酸(norbornene dicarboxylic acid)、C5-C10環烷烴二羧酸(C5-C10 cycloalkane dicarboxylic acid)、其酸酐(acid anhydrides)、或其兩種以上之混合。 Specifically, the dicarboxylic acid compound may include: oxalic acid, malonic acid, succinic acid, glutaric acid, adipic acid, Pimelic acid, suberic acid, azelaic acid, sebacic acid, norbornene dicarboxylic acid, C5-C10 cycloalkane Carboxylic acid (C5-C10 cycloalkane dicarboxylic acid), its acid anhydride (acid Anhydrides), or a mixture of two or more thereof.

並且,所述二羧酸化合物可包括:鄰苯二甲酸(phthalic acid)、降冰片烯二羧酸、四氫鄰苯二甲酸(tetrahydrophthalic acid)、琥珀酸、咪唑二羧酸(imidazole dicarboxylic acid)、吡啶二羧酸(pyridine dicarboxylic acid)、其酸酐、或其兩種以上之混合。 Also, the dicarboxylic acid compound may include: phthalic acid, norbornene dicarboxylic acid, tetrahydrophthalic acid, succinic acid, imidazole dicarboxylic acid And a pyridine dicarboxylic acid, an acid anhydride thereof, or a mixture of two or more thereof.

透過使所述氰酸酯系化合物與所述二羧酸化合物進行反應,可以得到適當地導入羧基之亞氨基碳酸酯系化合物作為酸性改質寡聚物。並且,所得之亞氨基碳酸酯系化合物因而可在熱硬化過程中適當地形成交聯之三嗪結構,從而可以形成及提供具有更提升之耐熱可靠度之DFSR。 By reacting the cyanate-based compound with the dicarboxylic acid compound, an iminocarbonate-based compound in which a carboxyl group is appropriately introduced can be obtained as an acid-modified oligomer. Further, the obtained imino carbonate-based compound can be appropriately formed into a crosslinked triazine structure during the heat hardening process, so that a DFSR having improved heat resistance reliability can be formed and provided.

作為一個更具體之範例,具有羧基且酸值為100至180mg KOH/g或120至160mg KOH/g的亞氨基碳酸酯系化合物,特別是使所述氰酸酯系化合物與二羧酸化合物反應而形成之化合物可為下述式1之亞氨基碳酸酯系化合物。 As a more specific example, an imino carbonate-based compound having a carboxyl group and having an acid value of 100 to 180 mg KOH/g or 120 to 160 mg KOH/g, particularly reacting the cyanate-based compound with a dicarboxylic acid compound The compound formed may be an imino carbonate-based compound of the following formula 1.

在上述式1中,n為0至100之整數,R1為衍生自二羧酸化合物 之官能基。 In the above formula 1, n is an integer of 0 to 100, and R 1 is a functional group derived from a dicarboxylic acid compound.

上述R1可為衍生自二羧酸化合物之官能基,例如,衍生自一種或多種選自由:草酸(oxalic acid)、丙二酸(malonic acid)、琥珀酸(succinic acid)、戊二酸(glutaric acid)、己二酸(adipic acid)、庚二酸(pimelic acid)、辛二酸(suberic acid)、壬二酸(azelaic acid)、癸二酸(sebacic acid)、降冰片烯二羧酸(norbornene dicarboxylic acid)、環烷烴二羧酸(cycloalkane dicarboxylic acid)、和其酸酐(acid anhydrides)所組成之群組的化合物;或者,一種或多種選自由:鄰苯二甲酸(phthalic acid)、降冰片烯二羧酸、四氫鄰苯二甲酸(tetrahydrophthalic acid)、琥珀酸、咪唑二羧酸(imidazole dicarboxylic acid)、吡啶二羧酸(pyridine dicarboxylic acid)、和其酸酐所組成之群組的化合物。 The above R 1 may be a functional group derived from a dicarboxylic acid compound, for example, derived from one or more selected from the group consisting of: oxalic acid, malonic acid, succinic acid, glutaric acid ( Glutaric acid), adipic acid, pimelic acid, suberic acid, azelaic acid, sebacic acid, norbornene dicarboxylic acid a compound of the group consisting of: norbornene dicarboxylic acid, cycloalkane dicarboxylic acid, and acid anhydrides; or one or more selected from the group consisting of: phthalic acid, a compound of the group consisting of borneol dicarboxylic acid, tetrahydrophthalic acid, succinic acid, imidazole dicarboxylic acid, pyridine dicarboxylic acid, and anhydride thereof .

具體地,上述R1可為在一種選自由C6-C20芳香環、C4-C20伸環烷基環以及C4-C20伸環烯基環所組成之群組之核心基團上結合有醯基及羧基之官能基。 Specifically, the above R 1 may be a thiol group bonded to a core group selected from the group consisting of a C6-C20 aromatic ring, a C4-C20 cycloalkylene ring, and a C4-C20 cycloalkenyl ring. a functional group of a carboxyl group.

上述R1具體範例可為衍生自鄰苯二甲酸之官能基、衍生自四氫鄰苯二甲酸之官能基或衍生自 環己烷之官能基The above specific example of R 1 may be a functional group derived from phthalic acid a functional group derived from tetrahydrophthalic acid Or a functional group derived from cyclohexane .

例如,式1之化合物可藉由式1a之化合物與二羧酸化合物(例如鄰苯二甲酸、環己烷二羧酸、四氫鄰苯二甲酸等)反應而獲得。所述化合物可適於作為酸性改質寡聚物,並可有效形成交聯之三嗪結構,從而可以形成展現更加提升之耐熱可靠度之DFSR。 For example, a compound of Formula 1 can be obtained by reacting a compound of Formula 1a with a dicarboxylic acid compound such as phthalic acid, cyclohexanedicarboxylic acid, tetrahydrophthalic acid, and the like. The compound can be suitably used as an acidic modified oligomer, and can effectively form a crosslinked triazine structure, thereby forming a DFSR exhibiting more improved heat resistance reliability.

同時,根據一實施態樣,除了上述亞氨基碳酸酯系化合物,樹脂組成物可更包括已知之第二酸性改質寡聚物。 Meanwhile, according to an embodiment, in addition to the above iminocarbonate-based compound, the resin composition may further include a known second acid-modified oligomer.

額外的第二酸性改質寡聚物為具有羧基及光硬化性官能基之寡聚物,例如,在一分子中具有不飽和雙鍵之光硬化性官能基或丙烯酸酯基及羧基,任何用於形成DFSR之樹脂組成物之已知成分皆可無限制地使用。例如,此額外的第二酸性改質寡聚物之主鏈可為酚醛清漆環氧、聚氨酯等,且其中有羧基、丙烯酸酯基等導入主鏈之成分可用作為額外的第二酸性改質寡聚物。光硬化性官能基較佳可為丙烯酸酯基,其中第二酸性改質寡聚物可為藉由共聚具有羧基之聚合性單體及包含丙烯酸酯系化合物之單體所形成之寡聚物。 The additional second acidic modified oligomer is an oligomer having a carboxyl group and a photocurable functional group, for example, a photocurable functional group having an unsaturated double bond in one molecule or an acrylate group and a carboxyl group, and any The known components of the resin composition forming the DFSR can be used without limitation. For example, the main chain of the additional second acidic modified oligomer may be a novolac epoxy, a polyurethane or the like, and a component having a carboxyl group, an acrylate group or the like introduced into the main chain may be used as an additional second acidic modified oligomer. Polymer. The photocurable functional group may preferably be an acrylate group, and the second acidic modified oligomer may be an oligomer formed by copolymerizing a polymerizable monomer having a carboxyl group and a monomer containing an acrylate compound.

更具體地,可用於樹脂組成物中的額外的第二酸性改質寡聚物範例如下列:(1)含羧基樹脂,其是藉由共聚一如(甲基)丙烯酸等之不飽和羧酸 (a);及具有如苯乙烯(styrene)、α-甲基苯乙烯(α-methylstyrene)、低碳烷基(甲基)丙烯酸酯(lower alkyl(meth)acrylate)、或異丁烯(iso-butylene)之不飽和雙鍵之化合物(b)所得;(2)含羧基之光敏樹脂,其是藉由反應具有如乙烯基(vinyl group)、丙烯基(allyl group)、(甲基)丙烯醯基((meth)acryloyl group)等之乙烯性不飽和基,以及如環氧基、酸氯化物(acid chloride)等反應性基之化合物;與不飽和羧酸(a)和具有不飽和雙鍵之化合物(b)之共聚物之部分所得,且更添加作為掛接點(pendant)之乙烯性不飽和基;(3)含羧基之光敏性樹脂,其是由反應未飽和羧酸(a)、與具有環氧基和未飽和雙鍵之化合物(c)(例如縮水甘油基(甲基)丙烯酸酯、α-甲基縮水甘油基(甲基)丙烯酸酯等)及具有未飽和雙鍵之化合物(b)之共聚物,再將所形成之第二羥基與一飽和或不飽和多元酸酐(d)(例如鄰苯二甲酸酸酐、四氫鄰苯二甲酸酸酐、六氫鄰苯二甲酸酸酐等)進行反應所得;(4)含羧基之光敏性樹脂,其是由反應具有一羥基和一個以上乙烯性不飽和雙鍵之化合物(f)(例如羥烷基(甲基)丙烯酸酯等)、與具有不飽和雙鍵之酸酐(e)(順丁烯二酸酸酐、伊康酸酸酐)和具有不飽和雙鍵之化合物(b)之共聚物而得;(5)含羧基之光敏性化合物,其是由進行:一分子中具有兩個以上環氧基之多官能基環氧基化合物(g)之環氧基間之酯化反應(全部酯化或部分酯化,較佳為全部酯化)所得,如下所述;或者為多官能基環氧樹脂,其是由進一步環氧化多官能基環氧化合物之羥基與氯環丙烷(epichlorohydrin)、以及未飽和單羧酸(h)(例如(甲基)丙烯酸等)之羧基後,再 進一步反應所得羥基與飽和或未飽和多元酸酐(d)所得;(6)含羧基之樹脂,其是由反應在一分子中具有一羧基而不具有乙烯性不飽和鍵之有機酸(i)(例如C2-C17烷基羧酸、含芳香基之烷基羧酸等)、與具有不飽和雙鍵之化合物(b)和縮水甘油基(甲基)丙烯酸酯之共聚物之環氧基後,再更進一步將所形成之第二羥基與飽和或未飽和多元酸酐(d)進行反應所得;(7)含羧基之氨酯樹脂,其是由二異氰酸酯(j)(例如:脂肪族二異氰酸酯、支鏈脂肪族二異氰酸酯、脂環族二異氰酸酯、芳香族二異氰酸酯等)、含羧基之二醇類(dialcohol)化合物(k)(例如:二羥甲基丙酸、二羥甲基丁酸等)、以及二元醇(diol)化合物(m)(例如聚碳酸酯系多元醇、聚醚系多元醇、聚酯系多元醇、聚烯烴系多元醇、丙烯酸系多元醇、雙酚A型氧化烯加成二醇(a bisphenol A type alkylene oxide adduct diol)、具有酚羥基和醇羥基之化合物)之加成聚合反應所得;(8)含羧基之光敏性氨酯樹脂,其是由異氰酸酯(j)、雙官能基環氧樹脂(如雙酚A型環氧樹脂、氫化雙酚A型環氧樹脂、溴化雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙二甲酚(bixyienol)型環氧樹脂、二苯酚(biphenol)型環氧樹脂等)之(甲基)丙烯酸酯或部分酸酐改性化合物(n)、含羧基之二醇類化合物(k)、以及二元醇化合物(m)之加成反應而得;(9)含羧基之氨酯樹脂,其是由在所述(7)或(8)反應過程中,加入具有一羥基和一個以上乙烯性不飽和雙鍵之化合物(f)(例如羥烷基(甲基)丙烯酸酯等),以使在末端導入不飽和雙鍵而得;(10)含羧基之氨酯樹脂,其是由在所述(7)或(8)反應過程中,加入 一分子中包含一異氰酸酯基及一個以上(甲基)丙烯醯基之化合物(例如異佛爾酮(isophorone)二異氰酸酯及季戊四醇三丙烯酸酯(pentaerythritol triacrylate)之等莫耳反應(equimolar reaction)產物,並(甲基)丙烯酸酯化末端而得;(11)含羧基之光敏性樹脂,其是由反應飽和或不飽和多元酸酐(d)與一改性環氧丙烷(oxetane)之主要羥基而得;其中改性環氧丙烷是由反應未飽和單羧酸(h)與在一分子中具有兩個以上四元氧環(oxetane rings)之多官能基環氧丙烷化合物而得;(12)含羧基之光敏性樹脂,其是由將未飽和雙鍵導入至雙環氧化合物及雙酚化合物之反應產物,接著再將其與飽和或不飽和多元酸酐(d)反應而得;(13)含羧基之光敏性樹脂,其是由反應飽和或不飽和多元酸酐(d)、與由反應未飽和單羧酸(h)及酚醛清漆酚樹脂、亞烷基氧化物(例如乙烯氧化物(ethylene oxide)、丙烯氧化物(propylene oxide)、丁烯氧化物(butylene oxide)、三亞甲基氧化物(trimethylene oxide)、四氫呋喃(tetrahydrofuran)、四氫吡喃(tetrahydropyran)等)、及/或環碳酸酯(例如乙烯碳酸酯、丙烯碳酸酯、丁烯碳酸酯、2,3-碳酸酯丙基甲基丙烯酸酯(2,3-carbonate propylmethacrylate)等)之反應產物所得之反應產物而得。 More specifically, an additional second acidic modified oligomer which can be used in the resin composition is, for example, the following: (1) a carboxyl group-containing resin which is copolymerized by an unsaturated carboxylic acid such as (meth)acrylic acid or the like. (a); and have, for example, styrene, α-methylstyrene, lower alkyl (meth)acrylate, or isobutylene (iso-butylene) a compound of the unsaturated double bond (b); (2) a carboxyl group-containing photosensitive resin which has a reaction such as a vinyl group, an allyl group, or a (meth) acrylonitrile group. (meth) acryloyl group), such as an ethylenically unsaturated group, and a compound such as an epoxy group, an acid chloride or the like; and an unsaturated carboxylic acid (a) and having an unsaturated double bond a part of the copolymer of the compound (b), and further an ethylenically unsaturated group as a pendant; (3) a photosensitive resin containing a carboxyl group, which is a reaction of the unsaturated carboxylic acid (a), And a compound (c) having an epoxy group and an unsaturated double bond (for example, glycidyl (meth) acrylate, α-methyl glycidyl (meth) acrylate, etc.) and a compound having an unsaturated double bond a copolymer of (b), and a second hydroxyl group formed with a saturated or unsaturated polybasic acid anhydride (d) (for example, phthalic anhydride, tetrahydroortylene) a reaction product obtained by reacting formic acid anhydride, hexahydrophthalic anhydride or the like; (4) a photosensitive resin containing a carboxyl group, which is a compound (f) having a monohydroxy group and one or more ethylenically unsaturated double bonds (for example, hydroxy group) a copolymer of an alkyl (meth) acrylate or the like, an acid anhydride (e) having an unsaturated double bond (maleic acid anhydride, itaconic acid anhydride), and a compound (b) having an unsaturated double bond (5) a photosensitive compound containing a carboxyl group which is subjected to an esterification reaction between epoxy groups of a polyfunctional epoxy group (g) having two or more epoxy groups in one molecule (all esters) Or partially esterified, preferably fully esterified), as described below; or a polyfunctional epoxy resin which is further epoxidized with a hydroxyl group of a polyfunctional epoxy compound and epichlorohydrin, And after the carboxyl group of the unsaturated monocarboxylic acid (h) (for example, (meth)acrylic acid, etc.), Further reacting the obtained hydroxyl group with a saturated or unsaturated polybasic acid anhydride (d); (6) a carboxyl group-containing resin which is an organic acid (i) having a carboxyl group in one molecule and having no ethylenic unsaturated bond ( For example, after the epoxy group of a copolymer of a C2-C17 alkyl carboxylic acid, an aromatic alkyl group-containing carboxylic acid, or the like, and a compound having an unsaturated double bond (b) and a glycidyl (meth) acrylate, Further, the obtained second hydroxyl group is reacted with a saturated or unsaturated polybasic acid anhydride (d); (7) a carboxyl group-containing urethane resin which is composed of a diisocyanate (j) (for example, an aliphatic diisocyanate, a branched aliphatic diisocyanate, an alicyclic diisocyanate, an aromatic diisocyanate or the like, a carboxyl group-containing diol (dialcohol) compound (k) (for example, dimethylolpropionic acid, dimethylolbutanoic acid, etc.) And a diol compound (m) (for example, a polycarbonate-based polyol, a polyether-based polyol, a polyester-based polyol, a polyolefin-based polyol, an acrylic polyol, and a bisphenol A-type oxidation) a bisphenol A type alkylene oxide adduct diol, having a phenolic hydroxyl group and (8) a carboxyl group-containing photosensitive urethane resin which is composed of an isocyanate (j), a difunctional epoxy resin (such as a bisphenol A type epoxy resin, a hydrogenated bisphenol) A type epoxy resin, brominated bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bixyienol type epoxy resin, biphenol type (9) epoxy resin or the like (meth) acrylate or partial acid anhydride modified compound (n), carboxyl group-containing diol compound (k), and diol compound (m) addition reaction; (9 a carboxyl group-containing urethane resin which is obtained by adding a compound (f) having a hydroxyl group and one or more ethylenically unsaturated double bonds during the reaction of (7) or (8) (for example, a hydroxyalkyl group (A) a acrylate or the like to give an unsaturated double bond at the terminal; (10) a carboxyl group-containing urethane resin which is added during the reaction of the (7) or (8) a compound containing one isocyanate group and one or more (meth) acrylonitrile groups in one molecule (for example, isophorone diisocyanate and pentaerythritol triacrylate), etc. And (meth) acrylated terminal; (11) a carboxyl group-containing photosensitive resin obtained by reacting a saturated or unsaturated polybasic acid anhydride (d) with a main hydroxy group of a modified oxetane Wherein the modified propylene oxide is obtained by reacting an unsaturated monocarboxylic acid (h) with a polyfunctional propylene oxide compound having two or more oxetane rings in one molecule; (12) a photosensitive resin of a carboxyl group obtained by introducing an unsaturated double bond to a reaction product of a diepoxy compound and a bisphenol compound, followed by reacting it with a saturated or unsaturated polybasic acid anhydride (d); (13) a photosensitive resin of a carboxyl group which is a reaction-saturated or unsaturated polybasic acid anhydride (d), a reactive monocarboxylic acid (h) and a novolak phenol resin, an alkylene oxide (for example, an ethylene oxide) ), propylene oxide (propylene) Oxide), butylene oxide, trimethylene oxide, tetrahydrofuran, tetrahydropyran, etc., and/or cyclic carbonates (eg ethylene carbonate, propylene) A reaction product obtained from a reaction product of a carbonate, a butylene carbonate, a 2,3-carbonate propylmethacrylate, or the like.

在所述成份中,在用於合成(7)至(10)樹脂之具有異氰酸酯基之化合物不包含苯環之情況下,以及在用於合成(5)至(8)樹脂之多官能基及雙官能基環氧樹脂為具有雙酚A骨架、雙酚F骨架、雙酚骨架、或雙二甲酚骨架之線性化合物、或其氫化化合物之情況下,酸性改質寡聚物較佳為可得 到DFSR的可撓性點。再者,另一方面,在其主鍊具有氨酯鍵之改性樹脂(7)至(10)其彎折點(point of bending)為較佳。 Among the components, in the case where the compound having an isocyanate group for synthesizing (7) to (10) resin does not contain a benzene ring, and the polyfunctional group for synthesizing (5) to (8) resin and When the bifunctional epoxy resin is a linear compound having a bisphenol A skeleton, a bisphenol F skeleton, a bisphenol skeleton, or a bisxylenol skeleton, or a hydrogenated compound thereof, the acidic modified oligomer is preferably Got To the flexible point of the DFSR. Further, on the other hand, the modified resin (7) to (10) having a urethane bond in its main chain is preferably a point of bending.

再者,市購之成份亦可作為所述額外的第二酸性改質寡聚物,且其具體範例可為ZAR-2000、CCR-1235、ZFR-1122、CCR-1291H等(Nippon Kayaku Co.,Ltd.)。 Further, commercially available ingredients may also be used as the additional second acidic modified oligomer, and specific examples thereof may be ZAR-2000, CCR-1235, ZFR-1122, CCR-1291H, etc. (Nippon Kayaku Co. , Ltd.).

基於樹脂組成物之總重,所包含之酸性改質寡聚物之含量可為約5至75重量百分比、或約10至50重量百分比。而且,光硬化與熱硬化樹脂組成物可選擇性地包含酸性改質和具有羧基及光硬化性不飽和官能基之第二酸性改質寡聚物,其含量基於總量為5至75重量百分比、或10至50重量百分比。 The acid-modified oligomer may be included in an amount of from about 5 to 75 weight percent, or from about 10 to 50 weight percent, based on the total weight of the resin composition. Moreover, the photohardenable and thermosetting resin composition may optionally comprise an acid modified and a second acidic modified oligomer having a carboxyl group and a photocurable unsaturated functional group in an amount of from 5 to 75 weight percent based on the total amount. , or 10 to 50 weight percent.

當酸性改質寡聚物之含量太低,樹脂組成物之顯影性會下降且可能會劣化DFSR之強度。相反地,當酸性改質寡聚物含量太高,樹脂組成物會過度顯影且塗佈時的均勻性可能會下降。 When the content of the acid-modified oligomer is too low, the developability of the resin composition may decrease and the strength of the DFSR may be deteriorated. Conversely, when the content of the acid-modified oligomer is too high, the resin composition is excessively developed and the uniformity at the time of coating may be lowered.

再者,酸性改質寡聚物之酸值(acid value)可為約40至200mgKOH/g、或約50至150mgKOH/g、或約60至120mgKOH/g。當酸值過低,可能會劣化鹼顯影性;而過高時,可能難以形成正常的DFSR圖案,其是因為甚至連光硬化部分(例如曝光部分)都可能被顯影液溶解。 Further, the acid-modified oligomer may have an acid value of about 40 to 200 mgKOH/g, or about 50 to 150 mgKOH/g, or about 60 to 120 mgKOH/g. When the acid value is too low, alkali developability may be deteriorated; and when it is too high, it may be difficult to form a normal DFSR pattern because even a photohardenable portion (for example, an exposed portion) may be dissolved by the developer.

光聚合性單體 Photopolymerizable monomer

根據一實施態樣,樹脂組成物包含光聚合性單體。光聚合性單體可為具有光硬化性不飽和官能基(例如,兩個以上多官能乙烯基等)之化合物,且其可於光硬化時曝光而與上述酸性改質寡聚物之不飽和官能基交聯以形成交聯結構。因此,對應至形成有DFSR部分之暴露部分之樹脂組成 物可能不具有鹼顯影性,且會留在板體上。 According to an embodiment, the resin composition contains a photopolymerizable monomer. The photopolymerizable monomer may be a compound having a photocurable unsaturated functional group (for example, two or more polyfunctional vinyl groups, etc.), and which may be exposed upon photohardening and unsaturated with the above-described acidic modified oligomer. The functional groups are crosslinked to form a crosslinked structure. Therefore, the composition of the resin corresponding to the exposed portion where the DFSR portion is formed The material may not have alkali developability and will remain on the board.

可使用在室溫下為液態之光聚合性單體,且因此一實施態樣之樹脂組成物之黏性可依應用方法而控制,或可更加提升未暴露部分之鹼顯影性。 A photopolymerizable monomer which is liquid at room temperature can be used, and therefore the viscosity of the resin composition of an embodiment can be controlled according to the application method, or the alkali developability of the unexposed portion can be further enhanced.

作為光聚合性單體,可使用具有兩個以上光硬化性不飽和官能基之丙烯酸酯系化合物,例如,一種或多種選自由:具有羥基之丙烯酸酯化合物(例如季戊四醇三丙烯酸酯、二季戊四醇五丙烯酸酯等);水溶性丙烯酸酯化合物(例如聚乙二醇二丙烯酸酯、聚丙二醇二丙烯酸酯等);多元醇(polyhydric alcohol)之多官能基聚酯丙烯酸酯化合物(例如三羥甲基丙烷三丙烯酸酯、季戊四醇四丙烯酸酯、二季戊四醇六丙烯酸酯等);多官能醇(例如三羥甲基丙烷、氫化雙酚A等)或聚酚(例如雙酚A、雙酚等)之乙烯氧化物加成物及/或丙烯氧化物加成物之丙烯酸酯化合物;多官能基或單官能基丙烯酸酯化合物,其為所述具有羥基之丙烯酸酯之異氰酸酯改性化合物;環氧丙烯酸酯化合物,其為雙酚A二縮水甘油基醚、氫化雙酚A二縮水甘油基醚、或酚醛清漆環氧樹脂之(甲基)丙烯酸加成物;以及己內酯改性之丙烯酸酯化合物(例如己內酯改性之二三羥甲基丙烷四丙烯酸酯、ε-己內酯改性之二季戊四醇丙烯酸酯、或己內酯改性之羥基新戊酸新戊二醇二丙烯酸酯(hydroxypivalic acid neopentylglycol ester diacrylate)等);以及對應至所述丙烯酸酯化合物之光敏(甲基)丙烯酸酯化合物所組成之群組的化合物,且所述化合物可單獨使用或以兩種以上之混合物使用。 As the photopolymerizable monomer, an acrylate-based compound having two or more photocurable unsaturated functional groups can be used, for example, one or more selected from the group consisting of: an acrylate compound having a hydroxyl group (for example, pentaerythritol triacrylate, dipentaerythritol Acrylates, etc.; water-soluble acrylate compounds (eg, polyethylene glycol diacrylate, polypropylene glycol diacrylate, etc.); polyhydric alcohol polyfunctional polyester acrylate compounds (eg, trimethylolpropane) Ethylene oxidation of triacrylate, pentaerythritol tetraacrylate, dipentaerythritol hexaacrylate, etc.; polyfunctional alcohols (such as trimethylolpropane, hydrogenated bisphenol A, etc.) or polyphenols (such as bisphenol A, bisphenol, etc.) An acrylate compound of an adduct and/or a propylene oxide adduct; a polyfunctional or monofunctional acrylate compound which is an isocyanate-modified compound of the hydroxy group-containing acrylate; an epoxy acrylate compound, It is a bisphenol A diglycidyl ether, a hydrogenated bisphenol A diglycidyl ether, or a (meth)acrylic acid addition of a novolac epoxy resin. And a caprolactone-modified acrylate compound (for example, caprolactone-modified ditrimethylolpropane tetraacrylate, ε-caprolactone-modified dipentaerythritol acrylate, or caprolactone modified a hydroxypivalic acid neopentylglycol ester diacrylate or the like; and a compound corresponding to the group consisting of photosensitive (meth) acrylate compounds of the acrylate compound, and the compound They may be used singly or in combination of two or more.

在這些化合物中,使用在一分子中具有兩種以上(甲基)丙烯醯基之多官能(甲基)丙烯酸酯化合物作為光聚合性單體為較佳,尤其適合使用季 戊四醇三丙烯酸酯、三羥甲基丙烷三丙烯酸酯、二季戊四醇六丙烯酸酯、或己內酯改性的二三羥甲基丙烷四丙烯酸酯(ditrimethylolpropane tetraacrylate)等。再者,也可使用市售的DPEA-12(Kayarad Co.,Ltd.)等作為光聚合性單體。 Among these compounds, a polyfunctional (meth) acrylate compound having two or more (meth) acryl fluorenyl groups in one molecule is preferably used as the photopolymerizable monomer, and it is particularly suitable for use in the season. Pentaerythritol triacrylate, trimethylolpropane triacrylate, dipentaerythritol hexaacrylate, or caprolactone-modified ditrimethylolpropane tetraacrylate. Further, commercially available DPEA-12 (Kayarad Co., Ltd.) or the like can also be used as the photopolymerizable monomer.

基於樹脂組成物之總重,光聚合性單體的含量可為1至30重量百分比、或2至20重量百分比。當光聚合性單體的含量過低時,光硬化可能會不足,而當含量過高時,DFSR的乾燥性質會劣化且性質可能會受損。 The content of the photopolymerizable monomer may be from 1 to 30% by weight, or from 2 to 20% by weight, based on the total mass of the resin composition. When the content of the photopolymerizable monomer is too low, photohardening may be insufficient, and when the content is too high, the drying property of DFSR may be deteriorated and properties may be impaired.

光起始劑 Photoinitiator

樹脂組成物之一實施態樣中是包含光起始劑。光起始劑所扮演的角色是例如在樹脂組成物中的曝光部分中,引發酸性改質寡聚物及光聚合性單體間的自由基之光硬化。 In one embodiment of the resin composition, a photoinitiator is included. The role of the photoinitiator is, for example, photohardening of a radical between the acid-modified oligomer and the photopolymerizable monomer in the exposed portion of the resin composition.

作為光起始劑,可使用習知化合物,且可使用苯偶姻和其烷基醚化合物,例如苯偶姻甲醚、苯偶姻乙醚等;苯乙酮化合物,例如苯乙酮、2,2-二甲氧基-2-苯基苯乙酮、1,1-二氯苯乙酮、4-(1-叔丁基二氧基-1-甲基乙基)苯乙酮等;蒽醌化合物,例如2-甲基蒽醌、2-戊基蒽醌、2-叔丁基蒽醌、1-氯蒽醌等;噻噸酮化合物,例如2,4-二甲基噻噸酮、2,4-二異丙基噻噸酮、2-氯噻噸酮等;縮酮化合物,例如苯乙酮二甲基縮酮、苯甲基二甲基縮酮等;二苯甲酮化合物,例如二苯甲酮、4-(1-叔丁基二氧基-1-甲基乙基)二苯甲酮、3,3’,4,4’-四(叔丁基二氧基羰基)二苯甲酮(3,3’,4,4’-tetrakis(t-butyldioxycarbonyl)benzophenone)等。 As the photoinitiator, a conventional compound can be used, and benzoin and an alkyl ether compound thereof such as benzoin methyl ether, benzoin ethyl ether and the like; acetophenone compound such as acetophenone, 2, can be used. 2-dimethoxy-2-phenylacetophenone, 1,1-dichloroacetophenone, 4-(1-tert-butyldioxy-1-methylethyl)acetophenone, etc.; a hydrazine compound, such as 2-methyl hydrazine, 2-pentyl hydrazine, 2-tert-butyl fluorene, 1-chloroindole, etc.; a thioxanthone compound, such as 2,4-dimethylthioxanthone, 2,4-diisopropylthioxanthone, 2-chlorothioxanthone, etc.; ketal compounds, such as acetophenone dimethyl ketal, benzyl dimethyl ketal, etc.; benzophenone compounds, For example, benzophenone, 4-(1-tert-butyldioxy-1-methylethyl)benzophenone, 3,3',4,4'-tetrakis(tert-butyldioxycarbonyl) Benzophenone (3,3',4,4'-tetrakis (t-butyldioxycarbonyl) benzophenone) and the like.

再者,較佳可使用α-氨基苯乙酮,例如2-甲基-1-[4-(甲硫基)苯基]-2-嗎啉基丙酮-1,2-苯甲基-2-二甲基胺-1-(4-嗎啉基苯基)-丁-1-酮、2-(二 甲基胺)-2-[(4-甲基苯基)甲基]-1-[4-(4-嗎啉基)苯基]-1-丁酮、N,N-二甲基胺苯乙酮(Chiba Speciality化學股份有限公司(現今Chiba Japan股份有限公司)販售的Irgacure® 907、Irgacure® 369、Irgacure® 379等產品);或醯基氧化膦,例如2,4,6-三甲基苯甲醯基二苯基氧化膦、雙(2,4,6-三甲基苯甲醯基)-苯基氧化膦、雙(2,6-二甲氧基苯甲醯基)-2,4,4-三甲基-戊基氧化膦(Lucirin® TPO of BASF股份有限公司、Irgacure® 819 of Chiba Speciality化學股份有限公司等市售產品)作為光起始劑。 Further, α-aminoacetophenone such as 2-methyl-1-[4-(methylthio)phenyl]-2-morpholinylacetone-1,2-benzyl-2 is preferably used. -Dimethylamine-1-(4-morpholinylphenyl)-butan-1-one, 2-(two Methylamine)-2-[(4-methylphenyl)methyl]-1-[4-(4-morpholinyl)phenyl]-1-butanone, N,N-dimethylamine benzene Ethyl ketone (Irgacure® 907, Irgacure® 369, Irgacure® 379, etc. sold by Chiba Speciality Chemical Co., Ltd. (now Chiba Japan Co., Ltd.); or fluorenylphosphine oxide, such as 2,4,6-trimethyl Benzobenzyldiphenylphosphine oxide, bis(2,4,6-trimethylbenzylidene)-phenylphosphine oxide, bis(2,6-dimethoxybenzylidene)-2 4,4-Trimethyl-pentylphosphine oxide (commercially available from Lucirin® TPO of BASF Co., Ltd., Irgacure® 819 of Chiba Speciality Chemical Co., Ltd.) as a photoinitiator.

再者,較佳可使用肟酯作為光起始劑。作為光起始劑之肟酯範例可為2-(乙醯基氧基亞氨基甲基)噻噸-9-酮、(1,2-辛烷二酮、1-[4-(苯硫基)苯基]-、2-(O-苯甲醯基肟))、(乙酮、1-[9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基]-、1-(O-乙醯基肟))等。以市售產品來看,可為Chiba Speciality化學股份有限公司的GGI-325、Irgacure® OXE01及Irgacure® OXE02、ADEKA股份有限公司的N-1919、及化學股份有限公司的Darocur TPO。 Further, it is preferred to use an oxime ester as a photoinitiator. An example of an oxime ester as a photoinitiator may be 2-(ethylideneoxyiminomethyl)thioxan-9-one, (1,2-octanedione, 1-[4-(phenylthio) Phenyl]-, 2-(O-benzylidene fluorenyl)), (ethanone, 1-[9-ethyl-6-(2-methylbenzylidene)-9H-carbazole-3 -Based on -, 1-(O-ethylindenyl)) and the like. In terms of commercially available products, it may be GGI-325, Irgacure® OXE01 and Irgacure® OXE02 of Chiba Speciality Chemical Co., Ltd., N-1919 of ADEKA Co., Ltd., and Darocur TPO of Chemical Co., Ltd.

基於樹脂組成物之總重,使用的光起始劑含量可為約0.5至20重量百分比、或約1至10重量百分比、或約1至5重量百分比。當所述光起始劑含量過低時,可能無法適當地引發光硬化,而當含量過高時,會損害樹脂組成物之解析度或DFSR的可靠度可能會不足。 The photoinitiator content may be from about 0.5 to 20 weight percent, or from about 1 to 10 weight percent, or from about 1 to 5 weight percent, based on the total weight of the resin composition. When the content of the photoinitiator is too low, photohardening may not be appropriately caused, and when the content is too high, the resolution of the resin composition or the reliability of the DFSR may be insufficient.

熱硬化黏結劑 Heat hardening adhesive

樹脂組成物之一實施態樣是包括具有熱硬化性官能基之熱硬化黏結劑,熱硬化性官能基例如為一種或多種選自由:環氧基、氧雜環丁烷基、環醚基、及環硫醚基的官能基。熱硬化黏結劑是藉由在熱硬化過程中與酸性改質寡聚物等進行交聯,可確保DFSR的耐熱性和機械性質。 One embodiment of the resin composition is a thermosetting binder comprising a thermosetting functional group, for example, one or more selected from the group consisting of: an epoxy group, an oxetanyl group, a cyclic ether group, And a functional group of a thioether group. The heat-curing adhesive is crosslinked by an acid-modified oligomer or the like during thermal hardening to ensure heat resistance and mechanical properties of the DFSR.

作為熱硬化黏結劑,可使用在一分子中包含兩種以上環醚基及/或環硫醚基(以下為「環(硫)醚基」)之樹脂,且亦可使用雙官能基環氧樹脂。除此之外,亦可使用二異氰酸酯或其雙官能基嵌段異氰酸酯。 As the thermosetting binder, a resin containing two or more kinds of cyclic ether groups and/or cyclic sulfide groups (hereinafter referred to as "cyclo(thio)ether groups") in one molecule can be used, and a difunctional epoxy group can also be used. Resin. In addition to this, diisocyanates or their bifunctional block isocyanates can also be used.

在一分子中包含兩種以上環(硫)醚基之熱硬化黏結劑可為在一分子中具有兩種以上基團之化合物,所述基團可為選自由3員環、4員環或5員環醚基及環硫醚基的任一種或兩種基團。再者,熱硬化黏結劑可為在一分子中包含兩種以上環氧基之多官能基環氧化合物、在一分子中包含兩種以上氧雜環丁烷基之多官能基環氧丙烷化合物、在一分子中包含兩種以上硫醚基之環硫樹脂等。 The thermosetting adhesive containing two or more cyclic (thio)ether groups in one molecule may be a compound having two or more groups in one molecule, and the group may be selected from a 3-membered ring, a 4-membered ring or The 5-membered ring has one or both of an ether group and a cyclosulfide group. Further, the thermosetting binder may be a polyfunctional epoxy compound containing two or more epoxy groups in one molecule, and a polyfunctional propylene oxide compound containing two or more oxetanyl groups in one molecule. An episulfide resin containing two or more thioether groups in one molecule.

多官能基環氧化合物之具體範例可為:雙酚A型環氧樹脂、氫化雙酚A型環氧樹脂、溴化雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、酚醛清漆型環氧樹脂、苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型環氧樹脂、N-縮水甘油基型環氧樹脂、雙酚A之酚醛清漆型環氧樹脂、雙二甲酚型環氧樹脂、雙酚型環氧樹脂、螯合型環氧樹脂、乙二醛型環氧樹脂、含胺基之環氧樹脂、橡膠改性(rubber-modified)環氧樹脂、雙環戊二烯酚型環氧樹脂、二縮水甘油基鄰苯二甲酸酯樹脂、雜環環氧樹脂、四縮水甘油基二甲酚乙烷樹脂(tetraglycidyl xylenoyl ethane)、矽氧烷改性之環氧樹脂、及ε-己內酯改性之環氧樹脂等。再者,在結構中引入磷原子等者,亦可被用以獲得阻燃性。此環氧樹脂提升經熱硬化後之硬化膜之附著性、焊接耐熱性、對無電電鍍之抗性等。 Specific examples of the polyfunctional epoxy compound may be: bisphenol A type epoxy resin, hydrogenated bisphenol A type epoxy resin, brominated bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S Type epoxy resin, novolak type epoxy resin, phenol novolak type epoxy resin, cresol novolac type epoxy resin, N-glycidyl type epoxy resin, bisphenol A novolak type epoxy resin, Bis-xylenol type epoxy resin, bisphenol type epoxy resin, chelating type epoxy resin, glyoxal type epoxy resin, amine group-containing epoxy resin, rubber-modified epoxy resin , dicyclopentadiene phenol type epoxy resin, diglycidyl phthalate resin, heterocyclic epoxy resin, tetraglycidyl xylenoyl ethane, decane modification Epoxy resin and epoxy resin modified with ε-caprolactone. Further, a phosphorus atom or the like may be introduced into the structure to obtain flame retardancy. The epoxy resin improves adhesion of the cured film after heat curing, solder heat resistance, resistance to electroless plating, and the like.

作為多官能基環氧丙烷化合物,可為環氧丙烷醇類及具有羥基之樹脂之醚化產物(如酚醛清漆樹脂、聚(p-羥基苯乙烯)、咔哚型雙酚、杯芳烴 (calixarenes)、間苯二酚杯芳烴(calixresorcinarenes)、半矽氧烷(silsesquioxanes)等)。除此多官能基環氧丙烷之外,可為雙[(3-甲基-3-氧雜環丁烷基甲氧基)甲基]醚、雙[(3-乙基-3-氧雜環丁烷基甲氧基)甲基]醚、1,4-雙[(3-甲基-3-氧雜環丁烷基甲氧基)甲基]苯、1,4-雙[(3-乙基-3-氧雜環丁烷基甲氧基)甲基]苯、(3-甲基-3-氧雜環丁烷基)甲基丙烯酸酯、(3-乙基-3-氧雜環丁烷基)甲基丙烯酸酯、(3-甲基-3-氧雜環丁烷基)甲基丙烯酸甲酯、(3-乙基-3-氧雜環丁烷基)甲基丙烯酸甲酯、及其寡聚物或共聚物。此外,可為具有四元氧環之不飽和單體及烷基(甲基)丙烯酸酯之共聚物。 As the polyfunctional propylene oxide compound, it may be an etherified product of a propylene oxide alcohol and a resin having a hydroxyl group (such as a novolak resin, a poly(p-hydroxystyrene), a bismuth bisphenol, a calixarene) (calixarenes), resorcinol calixarenes, silsesquioxanes, and the like. In addition to the polyfunctional propylene oxide, it may be bis[(3-methyl-3-oxetanylmethoxy)methyl]ether, bis[(3-ethyl-3-oxa) Cyclobutane methoxy)methyl]ether, 1,4-bis[(3-methyl-3-oxetanylmethoxy)methyl]benzene, 1,4-bis[(3) -ethyl-3-oxetanylmethoxy)methyl]benzene, (3-methyl-3-oxetanyl)methacrylate, (3-ethyl-3-oxo Heterocyclobutane)methacrylate, (3-methyl-3-oxetanyl)methyl methacrylate, (3-ethyl-3-oxetanyl)methacrylic acid Methyl ester, and oligomers or copolymers thereof. Further, it may be a copolymer of an unsaturated monomer having a four-membered oxygen ring and an alkyl (meth) acrylate.

作為一分子中具有兩個以上環硫醚基之化合物,可例如為由日本環氧樹脂股份有限公司所製造之雙酚A型環硫樹脂YL7000。再者,亦可使用藉由用硫原子置換酚醛清漆型環氧樹脂之環氧基中之氧原子所得到之環硫樹脂。 The compound having two or more episulfide groups in one molecule may, for example, be a bisphenol A type episulfide resin YL7000 manufactured by Nippon Epoxy Resin Co., Ltd. Further, an episulfide resin obtained by replacing an oxygen atom in an epoxy group of a novolac type epoxy resin with a sulfur atom can also be used.

再者,可使用購自市面上的Kukdo化學股份有限公司之YDCN-500-80P。 Further, YDCN-500-80P available from Kukdo Chemical Co., Ltd. on the market can be used.

相對於每1當量之酸性改質寡聚物中之羧基,包含之熱硬化黏結劑之含量可相當於0.5至2.0當量。例如,光硬化與熱硬化樹脂組成物可包含1至30重量百分比或2至25重量百分比之熱硬化黏結劑。當熱硬化黏結劑之含量過低時,即使在硬化後,羧基仍留在DFSR中,可能會破壞耐熱性、耐鹼性、電絕緣性等。相反地,若含量過高,則因留在乾膜中之低分子量環(硫)醚基劣化膜之強度,故不宜使用。 The content of the thermosetting binder contained may be equivalent to 0.5 to 2.0 equivalents per 1 equivalent of the carboxyl group in the acid-modified oligomer. For example, the photohardenable and thermosetting resin composition may contain 1 to 30% by weight or 2 to 25% by weight of a heat-curing adhesive. When the content of the thermosetting binder is too low, the carboxyl group remains in the DFSR even after hardening, which may deteriorate heat resistance, alkali resistance, electrical insulation, and the like. On the other hand, if the content is too high, the strength of the low molecular weight cyclic (thio)ether group-degrading film remaining in the dry film is not suitable.

除了上述成分外,樹脂組成物之一實施態樣可更包括溶劑、以及一種或多種選自由熱硬化黏結劑催化劑、填充劑、顏料及添加劑所組成之 群組的物質。 In addition to the above components, one embodiment of the resin composition may further comprise a solvent, and one or more selected from the group consisting of a thermosetting binder catalyst, a filler, a pigment, and an additive. Group of substances.

熱硬化黏結劑催化劑 Thermal hardening binder catalyst

熱硬化黏結劑催化劑扮演了加速熱硬化黏劑硬化的角色。 The heat hardening binder catalyst plays a role in accelerating the hardening of the heat hardening adhesive.

作為熱硬化黏結劑催化劑,例如可為咪唑衍生物,如咪唑、2-甲基咪唑、2-乙基咪唑、2-乙基-4-甲基咪唑、2-苯基咪唑、4-苯基咪唑、1-氰乙基-2-苯基咪唑、1-(2-氰乙基)-2-乙基-4-甲基咪唑等;胺類化合物,例如雙氰二胺、苯甲基二甲基胺、4-(二甲基胺)-N,N-二甲基苯甲胺、4-甲氧基-N,N-二甲基苯甲胺、4-甲基-N,N-二甲基苯甲胺等;聯氨化合物,例如己二酸二醯肼(adipic acid dihydrazide)、癸二酸二醯肼(sebacic acid dihydrazide)等;以及磷化合物,例如三苯基膦等。再者,以市售催化劑來看,可使用Sikoku Kasei Kogyo股份有限公司製造的2MZ-A、2MZ-OK、2PHZ、2P4BHZ、及2P4MHZ(咪唑類化合物的產品名);San Apro股份有限公司製造的U-CAT3503N和UCAT3502T(二甲基胺之嵌段異氰酸酯化合物的產品名)、以及DBU、DBN、U-CATSA102和U-CAT5002(雙環脒化合物及其鹽類)。然而,所述催化劑並非受限於此,且亦可為用於環氧樹脂或環氧丙烷化合物之熱硬化催化劑,或為加速環氧基及/或氧雜環丁烷基與羧基之反應之化合物。所述催化劑可單獨使用或以兩種以上之混合物使用。再者,可使用S-三嗪衍生物,例如胍胺(guanamine)、乙醯胍胺(acetoguanamine)、苯並胍胺(benzoguanamine)、蜜胺(melamine)、2,4-二胺-6-甲基丙烯醯氧基乙基-S-三嗪、2-乙烯基-4,6-二胺-S-三嗪、一2-乙烯基-4,6-二胺-S-三嗪與異三聚氰酸之加成物、一2,4-二胺-6-甲基丙烯醯氧基乙基-S-三嗪與異三聚氰酸之加成物。較佳地,可將具有增黏劑功能之化合物與熱硬化黏著劑催化劑合併 使用。 As the thermosetting binder catalyst, for example, it may be an imidazole derivative such as imidazole, 2-methylimidazole, 2-ethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 4-phenyl group. Imidazole, 1-cyanoethyl-2-phenylimidazole, 1-(2-cyanoethyl)-2-ethyl-4-methylimidazole, etc.; amine compounds such as dicyandiamide, benzyl di Methylamine, 4-(dimethylamine)-N,N-dimethylbenzylamine, 4-methoxy-N,N-dimethylbenzylamine, 4-methyl-N,N- Dimethylbenzylamine or the like; a hydrazine compound such as adipic acid dihydrazide, sebacic acid dihydrazide or the like; and a phosphorus compound such as triphenylphosphine. Further, in view of a commercially available catalyst, 2MZ-A, 2MZ-OK, 2PHZ, 2P4BHZ, and 2P4MHZ (product name of imidazole compound) manufactured by Sikoku Kasei Kogyo Co., Ltd. can be used; manufactured by San Apro Co., Ltd. U-CAT3503N and UCAT3502T (product names of block isocyanate compounds of dimethylamine), and DBU, DBN, U-CATSA102 and U-CAT5002 (bicyclic guanidine compounds and salts thereof). However, the catalyst is not limited thereto, and may be a thermosetting catalyst for an epoxy resin or a propylene oxide compound, or may accelerate the reaction of an epoxy group and/or an oxetane group with a carboxyl group. Compound. The catalyst may be used singly or in combination of two or more. Further, S-triazine derivatives such as guanamine, acetoguanamine, benzoguanamine, melamine, 2,4-diamine-6- can be used. Methyl propylene oxiranyl ethyl-S-triazine, 2-vinyl-4,6-diamine-S-triazine, 1-vinyl-4,6-diamine-S-triazine and different An adduct of cyanuric acid, an adduct of 2,4-diamine-6-methylpropenyloxyethyl-S-triazine and iso-cyanuric acid. Preferably, the compound having the tackifier function is combined with the heat hardening adhesive catalyst use.

就適當的熱硬化性而言,以樹脂組成物之總重為基準,熱硬化黏著劑催化劑之含量可為約0.3至15重量百分比。 In terms of appropriate thermosetting property, the content of the heat-curing adhesive catalyst may be from about 0.3 to 15% by weight based on the total weight of the resin composition.

顏料 pigment

藉由提供可視性及遮蓋力,顏料扮演了掩蓋如刮痕之電路線之角色。 By providing visibility and hiding power, the pigment acts as a circuit line that masks scratches.

作為顏料,可使用紅色、藍色、綠色、黃色及黑色顏料。作為藍色顏料,可使用酞菁藍、藍色顏料15:1、藍色顏料15:2、藍色顏料15:3、藍色顏料15:4、藍色顏料15:6、藍色顏料60等。作為綠色顏料,可使用綠色顏料7、綠色顏料36、綠色溶劑3、綠色溶劑5、綠色溶劑20、綠色溶劑28等。作為黃色顏料,可使用蒽醌系、異吲哚啉系、縮合偶氮系、苯並咪唑酮系等,例如黃色顏料108、黃色顏料147、黃色顏料151、黃色顏料166、黃色顏料181、黃色顏料193等。 As the pigment, red, blue, green, yellow, and black pigments can be used. As the blue pigment, phthalocyanine blue, blue pigment 15:1, blue pigment 15:2, blue pigment 15:3, blue pigment 15:4, blue pigment 15:6, blue pigment 60 can be used. Wait. As the green pigment, green pigment 7, green pigment 36, green solvent 3, green solvent 5, green solvent 20, green solvent 28, or the like can be used. As the yellow pigment, an anthraquinone, an isoporphyrin-based, a condensed azo-based, a benzimidazolone-based or the like, for example, a yellow pigment 108, a yellow pigment 147, a yellow pigment 151, a yellow pigment 166, a yellow pigment 181, and a yellow color can be used. Pigment 193 and the like.

以樹脂組成物之總重為基準,顏料的含量較佳為約0.5至3重量百分比,當使用之顏料含量少於0.5重量百分比時,可視性及遮蓋力會衰減,而當使用之顏料含量超過3重量百分比時,其耐熱性會下降。 The pigment content is preferably from about 0.5 to 3% by weight based on the total weight of the resin composition, and when the pigment content is less than 0.5% by weight, the visibility and hiding power are attenuated, and when the pigment content is exceeded, At 3 weight percent, its heat resistance will decrease.

添加劑 additive

包含添加劑可用於消除樹脂組成物中的氣泡、消除在塗佈過程產生之爆裂(popping)或膜表面之坑洞(crater)、賦予阻燃性及控制黏性,且亦可包含作為催化劑。 The inclusion of an additive can be used to eliminate bubbles in the resin composition, to eliminate popping or crater on the surface of the film, impart flame retardancy and control viscosity, and can also be included as a catalyst.

詳述之,可合併使用習知傳統添加劑,例如:習知之增稠劑,如微二氧化矽粉末、有機膨潤土、蒙脫石等;消泡劑及/或均勻劑(leveling agent),例如矽系化合物、氟系化合物、聚合化合物等;矽烷偶合劑,例如咪唑系化合物、噻唑系化合物、三唑系化合物等;以及阻燃劑,例如磷系阻燃劑、銻系阻燃劑等。 In detail, conventional conventional additives may be used in combination, for example, conventional thickeners such as micro cerium oxide powder, organic bentonite, montmorillonite, etc.; antifoaming agent and/or homogenizing agent (leveling) An agent), for example, an oxime compound, a fluorine compound, a polymer compound, etc.; a decane coupling agent such as an imidazole compound, a thiazole compound, a triazole compound, etc.; and a flame retardant such as a phosphorus flame retardant or a lanthanum resistance Burning agent, etc.

其中,均勻劑扮演了消除在塗佈過程產生之爆裂或膜表面之坑洞之角色,均勻劑之範例可使用BYK-Chemie GmbH製造之BYK-380N、BYK-307、BYK-378、BYK-350等。 Among them, the homogenizer plays the role of eliminating the crack generated in the coating process or the pit on the surface of the film. The example of the homogenizer can be BYK-380N, BYK-307, BYK-378, BYK-350 manufactured by BYK-Chemie GmbH. Wait.

以樹脂組成物之總重為基準,添加劑之含量較佳為約0.01至10重量百分比。 The content of the additive is preferably from about 0.01 to 10% by weight based on the total weight of the resin composition.

溶劑 Solvent

可一併使用一種或多種溶劑,以溶解樹脂組成物或賦予其適當黏性。 One or more solvents may be used together to dissolve the resin composition or impart appropriate viscosity.

作為溶劑,可為酮類,如甲基乙基酮、環己酮等;芳香烴類,如甲苯、二甲苯、四甲基苯等;甘醇醚(溶纖劑),如乙二醇單乙基醚、乙二醇單甲基醚、乙二醇單丁基醚、二甘醇單乙基醚、二甘醇單甲基醚、二甘醇單丁基醚、丙二醇單甲基醚、丙二醇單乙基醚、二丙二醇二甲基醚、三乙二醇單乙基醚等;乙酸酯類,如乙酸乙酯、乙酸丁酯、乙二醇單乙醚乙酸酯、乙二醇單丁基醚乙酸酯、二甘醇單乙基醚乙酸酯、二甘醇單丁基醚乙酸酯、丙二醇單甲基醚乙酸酯、二丙二醇單甲基醚乙酸酯等;醇類,如乙醇、丙醇、乙二醇、丙二醇、卡必醇(carbitol)等;脂族烴類,如辛烷、癸烷等;石油類溶劑,例如石油醚、石腦油(petroleum naphtha)、氫化石腦油、溶劑石腦油等;以及醯胺類如二甲基乙醯胺,二甲基甲醯胺(DMF)等。所述溶劑可單獨使用或以兩種以上之混合物使用。 As the solvent, it may be a ketone such as methyl ethyl ketone or cyclohexanone; an aromatic hydrocarbon such as toluene, xylene, tetramethylbenzene or the like; a glycol ether (cellosolve) such as an ethylene glycol single Ethyl ether, ethylene glycol monomethyl ether, ethylene glycol monobutyl ether, diethylene glycol monoethyl ether, diethylene glycol monomethyl ether, diethylene glycol monobutyl ether, propylene glycol monomethyl ether, Propylene glycol monoethyl ether, dipropylene glycol dimethyl ether, triethylene glycol monoethyl ether, etc.; acetates such as ethyl acetate, butyl acetate, ethylene glycol monoethyl ether acetate, ethylene glycol monobutyl Ethyl acetate, diethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, propylene glycol monomethyl ether acetate, dipropylene glycol monomethyl ether acetate, etc.; alcohol Such as ethanol, propanol, ethylene glycol, propylene glycol, carbitol, etc.; aliphatic hydrocarbons such as octane, decane, etc.; petroleum solvents such as petroleum ether, petroleum naphtha, Hydrogenated naphtha, solvent naphtha, etc.; and guanamines such as dimethylacetamide, dimethylformamide (DMF), and the like. The solvent may be used singly or in combination of two or more.

以樹脂組成物之總重為基準,溶劑之含量可為約1至50重量百分比。當溶劑的含量少於11重量百分比時,其黏性會過高且塗佈性會衰減,而當含量超過50重量百分比時,其乾燥性會變差且黏性會增加。 The solvent may be included in an amount of from about 1 to 50% by weight based on the total mass of the resin composition. When the content of the solvent is less than 11% by weight, the viscosity is too high and the coatability is attenuated, and when the content exceeds 50% by weight, the drying property is deteriorated and the viscosity is increased.

另一方面,根據本發明另一實施態樣,可提供一種乾膜式防焊劑,包含:酸性改質寡聚物、光聚合性單體和熱硬化黏結劑之硬化產物以及無機填充劑,其中所述酸性改質寡聚物包含具有羧基且酸值為100至180mgKOH/g之亞氨基碳酸酯系化合物,所述光聚合性單體具有兩個以上之光硬化性不飽和官能基,所述熱硬化黏結劑具有熱硬化性官能基,所述無機填充劑散布於所述硬化產物中且包含50至90重量百分比之二氧化矽。 On the other hand, according to another embodiment of the present invention, a dry film solder resist may be provided, comprising: an acid modified oligomer, a photopolymerizable monomer, and a hardening product of a thermosetting binder, and an inorganic filler, wherein The acidic modified oligomer comprises an imino carbonate-based compound having a carboxyl group and having an acid value of from 100 to 180 mgKOH/g, the photopolymerizable monomer having two or more photocurable unsaturated functional groups, The heat-curing adhesive has a thermosetting functional group dispersed in the hardened product and containing 50 to 90% by weight of cerium oxide.

製備乾膜式防焊劑(DFSR)是利用根據一實施態樣之光硬化與熱硬化樹脂組成物,簡述如下:首先,使用點塗佈機(comma coater)、刮刀塗佈機、唇式塗佈機、棒式塗佈機、擠壓塗佈機、反向塗佈機、轉印輥式塗佈機、凹版塗佈機、噴塗機等,將根據一實施態樣之樹脂組成物塗佈至載體膜上作為光敏塗佈材料,接著將所述膜通過50至130℃之烘箱1至30分鐘以乾燥之,然後將離型膜疊合至其上,以製備出乾膜(由底部往上依序為載體膜、光敏膜、及離型膜)。 The preparation of a dry film solder resist (DFSR) is a photohardening and thermosetting resin composition according to an embodiment, which is briefly described as follows: First, a comma coater, a knife coater, and a lip coater are used. A cloth coating machine, a bar coater, an extrusion coater, a reverse coater, a transfer roll coater, a gravure coater, a spray coater, etc., coating a resin composition according to an embodiment Applying to the carrier film as a photosensitive coating material, then passing the film through an oven at 50 to 130 ° C for 1 to 30 minutes to dry, and then laminating the release film thereon to prepare a dry film (from the bottom to the bottom) The order is a carrier film, a photosensitive film, and a release film).

光敏膜之厚度可為約5至100μm,此時,可使用塑料薄膜作為載體膜,例如聚對苯二甲酸乙二醇酯(PET)膜、聚酯膜、聚醯亞胺膜、聚醯胺膜、聚丙烯膜、聚苯乙烯膜;且可使用聚乙烯(PE)膜、聚四氟乙烯膜、聚丙烯膜、經表面處理的紙等作為離型膜。當離型膜剝離時,較佳為光敏膜和離型膜間之附著力低於光敏膜和載體膜間之附著力。 The thickness of the photosensitive film may be about 5 to 100 μm. In this case, a plastic film may be used as a carrier film, such as a polyethylene terephthalate (PET) film, a polyester film, a polyimide film, and a polyamide. A film, a polypropylene film, a polystyrene film; and a polyethylene (PE) film, a polytetrafluoroethylene film, a polypropylene film, a surface-treated paper, or the like can be used as the release film. When the release film is peeled off, it is preferred that the adhesion between the photosensitive film and the release film is lower than the adhesion between the photosensitive film and the carrier film.

接著,在離型膜剝離後,藉由真空層壓機、熱輥層壓機、真空機等將所述光敏膜附著至形成有電路之板體上。 Next, after the release film is peeled off, the photosensitive film is attached to the board on which the circuit is formed by a vacuum laminator, a hot roll laminator, a vacuum machine or the like.

然後,將基板暴露至具有特定波長範圍之光線(UV等),可藉由光罩選擇性暴露所述基板,或利用直接雷射曝光裝置(laser direct exposure device)直接曝光圖案。曝光後剝離所述載體膜。曝光強度可依照膜厚度而定,較佳為0至1000mJ/cm2。在進行曝光時,例如,曝光部份發生光硬化,以在酸性改質寡聚物(如上述亞氨基碳酸酯系化合物)、光聚合性單體等包含之不飽和官能基間形成交聯,接著在顯影過程後不移除曝光部分。另一方面,上述交聯及接續交聯之結構並未形成在未曝光部分,且羧基維持原樣,故因此可能被鹼顯影。 The substrate is then exposed to light (UV or the like) having a specific wavelength range, the substrate can be selectively exposed by a photomask, or the pattern can be directly exposed using a laser direct exposure device. The carrier film was peeled off after exposure. The exposure intensity may vary depending on the film thickness, and is preferably from 0 to 1000 mJ/cm 2 . At the time of exposure, for example, photohardening occurs in the exposed portion to form a crosslink between the acidic modified oligomer (such as the above imino carbonate-based compound), the photopolymerizable monomer, and the like, and the unsaturated functional group is contained. The exposed portion is then removed after the development process. On the other hand, the above-mentioned cross-linking and subsequent cross-linking structure is not formed in the unexposed portion, and the carboxyl group remains as it is, so that it may be developed by alkali.

之後,利用鹼溶液將所述基板顯影。可使用鹼性水溶液作為鹼溶液,包括氫氧化鉀、氫氧化鈉、碳酸鈉、碳酸鉀、磷酸鈉、矽酸鈉、氨、胺等。根據顯影程序,僅可保留膜的曝光部分。 Thereafter, the substrate is developed using an alkali solution. An alkaline aqueous solution can be used as the alkali solution, including potassium hydroxide, sodium hydroxide, sodium carbonate, potassium carbonate, sodium phosphate, sodium citrate, ammonia, amine, and the like. According to the development procedure, only the exposed portion of the film can be retained.

最後,藉由熱硬化(後硬化),完成包含防焊劑之印刷電路板,其中防焊劑是由光敏膜所形成。藉此,較佳的熱硬化溫度為100℃以上。 Finally, a printed circuit board containing a solder resist is formed by thermal hardening (post hardening) in which a solder resist is formed of a photosensitive film. Thereby, a preferable heat hardening temperature is 100 ° C or more.

根據上述方法,可提供DFSR及包含其之印刷電路板。由於DFSR是由光硬化及熱硬化樹脂組成物所製備,所述DFSR可包含硬化產物,所述硬化產物是下述成分之硬化產物:酸性改質寡聚物,其包含具有羧基且酸值為100至180mgKOH/g或120至160mgKOH/g之亞氨基碳酸酯系化合物;光聚合性單體,其具有兩個以上之光硬化性不飽和官能基;以及熱硬化黏結劑,其具有熱硬化性官能基。此外,乾膜式防焊劑還可包含無機填充劑,其散布於硬化產物且包含50至90重量百分比之二氧化矽。 According to the above method, a DFSR and a printed circuit board containing the same can be provided. Since the DFSR is prepared from a photohardenable and thermosetting resin composition, the DFSR may comprise a hardened product which is a hardened product of an acidic modified oligomer comprising a carboxyl group and an acid value 100 to 180 mg KOH/g or 120 to 160 mg KOH/g of an imino carbonate-based compound; a photopolymerizable monomer having two or more photocurable unsaturated functional groups; and a thermosetting adhesive having thermosetting property Functional group. Further, the dry film solder resist may further contain an inorganic filler dispersed in the hardened product and containing 50 to 90% by weight of cerium oxide.

更具體地,所述硬化產物可包含:所述亞氨基碳酸酯系化合物之羧基與所述熱硬化性官能基交聯之交聯結構;以及一衍生自所述亞氨基碳酸酯系化合物之交聯三嗪結構。 More specifically, the hardened product may include: a crosslinked structure in which a carboxyl group of the imino carbonate-based compound is crosslinked with the thermosetting functional group; and a cross derived from the iminocarbonate-based compound Bis-triazine structure.

再者,由於上述實施態樣之用於製備乾膜式防焊劑之光硬化與熱硬化樹脂組成物還包含具有羧基及光硬化性不飽和官能基之第二酸性改質寡聚物,因此包含於DFSR之硬化產物可包含以下物質之硬化產物:酸性改質寡聚物,其包含具有羧基且酸值為100至180mgKOH/g或120至160mgKOH/g之亞氨基碳酸酯系化合物;第二酸性改質寡聚物,其具有羧基及光硬化性不飽和官能基;光聚合性單體,其具有兩個以上之光硬化性不飽和官能基;以及熱硬化黏結劑,其具有熱硬化性官能基。 Furthermore, since the photohardenable and thermosetting resin composition for preparing a dry film solder resist of the above embodiment further comprises a second acidic modified oligomer having a carboxyl group and a photocurable unsaturated functional group, The hardened product of DFSR may comprise a hardened product of an acidic modified oligomer comprising an imino carbonate-based compound having a carboxyl group and having an acid value of from 100 to 180 mgKOH/g or from 120 to 160 mgKOH/g; a modified oligomer having a carboxyl group and a photocurable unsaturated functional group; a photopolymerizable monomer having two or more photocurable unsaturated functional groups; and a thermosetting binder having thermosetting functionality base.

上述實施態樣之乾膜式防焊劑包含具有交聯三嗪結構之交聯物且其他殘留化合物之量降到最低,從而可以確保更高的顯影性,進而可以更容易實現微細間距。 The dry film type solder resist of the above embodiment contains a crosslinked product having a crosslinked triazine structure and the amount of other residual compounds is minimized, so that higher developability can be ensured, and fine pitch can be more easily realized.

特別是,由於所述硬化產物中包含具有衍生自亞氨基碳酸酯系化合物之交聯三嗪結構之交聯物和上述的無機填充劑,因此所述乾膜式防焊劑可具有相對低的α粒子放射率,例如0.010alphas/cm2/hr以下的α粒子放射率,而且具有較低的介電常數,例如在10GHz區域介電常數為3.5以下或3.4以下。 In particular, since the hardened product contains a crosslinked product having a crosslinked triazine structure derived from an imino carbonate compound and the above inorganic filler, the dry film solder resist may have a relatively low α particle emissivity, e.g. 0.010alphas / cm 2 / hr or less of α particle radiation, and having a low dielectric constant, for example, a dielectric constant of 3.5 or less in the region of 10GHz or less 3.4.

此外,所述DFSR可顯示較高的玻璃轉換溫度,即約120至180℃或約140至170℃,並可以提升耐熱可靠度。因此,所述DFSR可滿足各種物理性質,例如對半導體裝置之封裝板材料之需求:PCT耐受性、TCT耐熱性、對微細打線之HAST耐受性等,故可利於作為半導體裝置之封裝 板材料。 In addition, the DFSR can exhibit a higher glass transition temperature, i.e., about 120 to 180 ° C or about 140 to 170 ° C, and can improve heat resistance reliability. Therefore, the DFSR can satisfy various physical properties, such as requirements for packaging board materials of semiconductor devices: PCT resistance, TCT heat resistance, HAST resistance to fine wire bonding, etc., so that it can be used as a package for a semiconductor device. Board material.

所述乾膜式防焊劑可具有低於40ppm/K之熱膨脹係數。 The dry film solder resist may have a coefficient of thermal expansion of less than 40 ppm/K.

此外,DFSR可更包括小量的光起始劑,其在光硬化程序後保留並散布在硬化產物中。 In addition, the DFSR may further comprise a small amount of a photoinitiator which remains after the photohardening process and is dispersed in the hardened product.

如上所述,所述乾膜式防焊劑包含散布於所述硬化產物中之無機填充劑,所述無機填充劑包含50至90重量百分比之二氧化矽,因此可以大大降低所述DFSR之α粒子放射率和介電常數,還可以確保所形成之DFSR具有足夠的硬度且對常用基板保持較高的附著力。 As described above, the dry film solder resist contains an inorganic filler dispersed in the hardened product, and the inorganic filler contains 50 to 90% by weight of cerium oxide, so that the α particles of the DFSR can be greatly reduced. The emissivity and dielectric constant also ensure that the formed DFSR has sufficient hardness and maintains high adhesion to common substrates.

所述無機填充劑可包含50至90重量百分比之二氧化矽及其他無機填充劑。若所述無機填充劑中二氧化矽之含量低於50重量百分比,則所述乾膜式防焊劑之硬度可能會降低或者介電常數可能會大大上升,而且所述乾膜式防焊劑之α粒子放射率可能會大大增加。另外,若所述無機填充劑中二氧化矽之含量超出90重量百分比,則有可能因所述二氧化矽之高折射率而導致所述DFSR之顯影性降低,而且所述DFSR所具有的對基板之附著力可能會降低。 The inorganic filler may contain 50 to 90% by weight of cerium oxide and other inorganic fillers. If the content of the cerium oxide in the inorganic filler is less than 50% by weight, the hardness of the dry film solder resist may be lowered or the dielectric constant may be greatly increased, and the dry film solder resist may be α. The rate of particle emissivity may increase significantly. In addition, if the content of cerium oxide in the inorganic filler exceeds 90% by weight, there is a possibility that the developability of the DFSR is lowered due to the high refractive index of the cerium oxide, and the pair of the DFSR is The adhesion of the substrate may be reduced.

所述二氧化矽可具有50nm至500nm之平均直徑。 The cerium oxide may have an average diameter of 50 nm to 500 nm.

具體地,所述無機填充劑可包含50至90重量百分比的二氧化矽和10至50重量百分比之一種或多種選自由硫酸鋇、鈦酸鋇、滑石、黏土、碳酸鎂、碳酸鈣、氧化鋁、氫氧化鋁及雲母所組成之群組的化合物。 Specifically, the inorganic filler may comprise 50 to 90% by weight of cerium oxide and 10 to 50% by weight of one or more selected from the group consisting of barium sulfate, barium titanate, talc, clay, magnesium carbonate, calcium carbonate, and aluminum oxide. a compound of the group consisting of aluminum hydroxide and mica.

上述實施態樣之乾膜式防焊劑可包含5至50重量百分比之所述無機填充劑。若所述無機填充劑之含量過低,則有可能無法確保所述DFSR具有足之硬度和剛性(stiffness)而導致可操作性降低,而且不能充分地展現 添加所述無機填充劑引起之效果。另外,若所述無機填充劑之含量過高,則所述無機填充劑不會均勻地散布到所述DFSR中,而且所述乾膜式防焊劑之延展性等可能會降低。 The dry film solder resist of the above embodiment may contain 5 to 50% by weight of the inorganic filler. If the content of the inorganic filler is too low, there is a possibility that the DFSR cannot have sufficient hardness and rigidity to cause operability to be lowered, and the operability cannot be sufficiently exhibited. The effect caused by the addition of the inorganic filler is added. Further, if the content of the inorganic filler is too high, the inorganic filler is not uniformly dispersed in the DFSR, and the ductility of the dry film solder resist may be lowered.

在所述乾膜式防焊劑中所包含之組分的詳細內容包括上文中對實施態樣之光硬化和熱硬化樹脂組成物之描述。 The details of the components contained in the dry film solder resist include the above description of the photohardenable and thermosetting resin compositions of the embodiment.

之後,本發明將由以下實施例加以詳述。然而,下述實施例僅用以說明本發明,而本發明之範圍並未受到該些實施例之限制。 Hereinafter, the present invention will be described in detail by the following examples. However, the following examples are only intended to illustrate the invention, and the scope of the invention is not limited by the examples.

[實施例及比較例:製備樹脂組成物、乾膜及印刷電路板][Examples and Comparative Examples: Preparation of Resin Composition, Dry Film, and Printed Circuit Board]

實施例1Example 1

藉由將雙酚系氰酸酯化合物BA-230(Lonza股份有限公司)之氰酸酯基與1,2,5,6-四氫鄰苯二甲酸(4-環己烯-1,2-二羧酸)以莫耳比1:1反應,以製備作為酸性改質寡聚物之亞氨基碳酸酯系化合物1。 By the cyanate group of the bisphenol cyanate compound BA-230 (Lonza Co., Ltd.) and 1,2,5,6-tetrahydrophthalic acid (4-cyclohexene-1,2- The dicarboxylic acid) was reacted at a molar ratio of 1:1 to prepare an imino carbonate-based compound 1 as an acidic modified oligomer.

所製備的亞氨基碳酸酯系化合物1之酸值為145mgKOH/g。此時,所製備的亞氨基碳酸酯系化合物1之酸值是藉由將約0.1g之樣品溶解於二甲苯和異丙醇之1:1混合物中而測定的,具體採用了根據ASTM D1639之方法。 The acid value of the produced imino carbonate-based compound 1 was 145 mgKOH/g. At this time, the acid value of the prepared imino carbonate-based compound 1 was determined by dissolving about 0.1 g of the sample in a 1:1 mixture of xylene and isopropyl alcohol, specifically according to ASTM D1639. method.

使用10重量百分比之上述亞氨基碳酸酯系化合物1,將其與作為額外的酸性改質寡聚物之15重量百分比之ZAR-2000和8重量百分比之CCR-1171H(Nippon Kayaku股份有限公司)、作為光聚合性單體之5重量百分比之DPHA(SK Cytec股份有限公司)、作為光起始劑之2.5重量百分比之TPO、作為熱硬化黏結劑之10重量百分比之YDCN-500-80P(Nippon Kayaku股份有限公司)、作為熱硬化黏結劑催化劑之0.95重量百分比之2-PI、作為 填充劑之平均直徑為300nm的20重量百分比之熔融二氧化矽(Denka公司,SFP-120MC)和8重量百分比之BaSO4、作為顏料之0.25重量百分比之酞菁藍、作為添加劑之0.3重量百分比之BYK-110、以及作為溶劑之20重量百分比之DMF進行混合,以製備樹脂組成物。 10% by weight of the above iminocarbonate-based compound 1 was used, together with 15% by weight of ZAR-2000 as an additional acidic modified oligomer and 85% by weight of CCR-1171H (Nippon Kayaku Co., Ltd.), 55% by weight of DPHA (SK Cytec Co., Ltd.) as photopolymerizable monomer, 2.5% by weight of TPO as photoinitiator, and 10% by weight of YDCN-500-80P (Nippon Kayaku as thermosetting binder) Co., Ltd.), 0.95 weight percent 2-PI as a thermosetting binder catalyst, 20 weight percent molten cerium oxide (Denka Corporation, SFP-120MC) having an average diameter of 300 nm as a filler, and 8 weight percent BaSO 4 , 0.25 weight percent of phthalocyanine blue as a pigment, 0.3 weight percent of BYK-110 as an additive, and 20 weight percent of DMF as a solvent were mixed to prepare a resin composition.

藉由塗佈樹脂組成物於PET膜(載體膜)上,經由通過75℃烘箱以乾燥之,並層疊PE膜(離型膜)至其上,以製備出由底部往上依序為載體膜、光敏膜(厚度20μm)及離型膜組成之乾膜。 By coating a resin composition on a PET film (carrier film), drying it through an oven at 75 ° C, and laminating a PE film (release film) thereon, to prepare a carrier film from bottom to top. , a photosensitive film (thickness 20 μm) and a dry film composed of a release film.

在將製備之乾膜之覆蓋膜剝離後,將光敏膜層真空疊合至形成有電路之板體上,再將對應於電路圖案之光罩設置在光敏膜層上,接著於UV光下曝光。曝光是在波長為365nm之UV光,且光強度為400mJ/cm2下進行。接著,移除PET膜,並亦藉由在1重量百分比之Na2CO3鹼溶液中,於31℃下進行一段時間顯影,以移除不需要的部分形成所需圖案。然後,於光強度為1500mJ/cm2的情況下進行光硬化,最後在160至170℃下進行1小時熱硬化,以得到包含由光敏膜形成之保護膜(防焊劑)之印刷電路板。 After the prepared cover film of the dry film is peeled off, the photosensitive film layer is vacuum-laminated onto the board on which the circuit is formed, and the photomask corresponding to the circuit pattern is placed on the photosensitive film layer, followed by exposure under UV light. . The exposure was carried out at a UV light having a wavelength of 365 nm and a light intensity of 400 mJ/cm 2 . Next, the PET film was removed, and development was also carried out at 31 ° C for a period of time in a 1 wt% Na 2 CO 3 alkali solution to remove unnecessary portions to form a desired pattern. Then, photohardening was carried out at a light intensity of 1500 mJ/cm 2 , and finally heat hardening was performed at 160 to 170 ° C for 1 hour to obtain a printed circuit board comprising a protective film (solder resist) formed of a photosensitive film.

實施例2Example 2

除了使用15重量百分比之亞氨基碳酸酯系化合物1,並且依照亞氨基碳酸酯系化合物之含量增減溶劑之含量以外,其是根據實施例1之相同步驟以製備乾膜及印刷電路板。 The dry film and the printed circuit board were prepared according to the same procedure as in Example 1 except that 15% by weight of the iminocarbonate-based compound 1 was used, and the content of the solvent was increased or decreased depending on the content of the iminocarbonate-based compound.

實施例3Example 3

如下表1所示,除了使用25重量百分比之上述CCR-117H、作為上述光聚合性單體使用5重量百分比之TMPA(SK Cytec股份有限公司)、作為上述熱硬化黏結劑使用8重量百分比之YDCN-500-8P(Nippon Kayaku股 份有限公司)以外,其是根據實施例1之相同步驟製備乾膜及印刷電路板。 As shown in the following Table 1, except that 25 wt% of the above CCR-117H was used, 5 wt% of TMPA (SK Cytec Co., Ltd.) was used as the photopolymerizable monomer, and 8 wt% of YDCN was used as the above thermosetting binder. -500-8P (Nippon Kayaku shares) In addition to the company, it was prepared according to the same procedure as in Example 1 to prepare a dry film and a printed circuit board.

實施例4Example 4

如下表1所示,除了作為上述熱硬化黏結劑使用5重量百分比之YDCN-500-8P(Nippon Kayaku股份有限公司)和5重量百分比之NC-3000H(Nippon Kayaku股份有限公司)以外,其是根據實施例1之相同步驟製備乾膜及印刷電路板。 As shown in the following Table 1, except that 5 wt% of YDCN-500-8P (Nippon Kayaku Co., Ltd.) and 5 wt% of NC-3000H (Nippon Kayaku Co., Ltd.) were used as the above-mentioned thermosetting binder, it was based on The dry film and printed circuit board were prepared in the same manner as in Example 1.

實施例1至4之樹脂組成物之特定成分整理於下表1中。 The specific components of the resin compositions of Examples 1 to 4 were summarized in Table 1 below.

比較例1Comparative example 1

如表2所示,除了不使用亞氨基碳酸酯系化合物,而使用20重量百分比之ZAR-2000和13重量百分比之CCR-1171H(Nippon Kayaku股份有限公司)以外,其是根據實施例1相同步驟製備乾膜及印刷電路板。 As shown in Table 2, except that 20% by weight of ZAR-2000 and 13% by weight of CCR-1171H (Nippon Kayaku Co., Ltd.) were used without using an imino carbonate-based compound, it was the same procedure as in Example 1. Dry film and printed circuit boards are prepared.

比較例2Comparative example 2

藉由將雙酚系氰酸酯化合物BA-230(Lonza股份有限公司)之氰酸酯基與丙烯酸及1,2,5,6-四氫鄰苯二甲酸(4-環己烯-1,2-二羧酸)以莫耳比1:1反應,以製備作為酸性改質寡聚物之亞氨基碳酸酯系化合物2。 By using a cyanate group of a bisphenol cyanate compound BA-230 (Lonza Co., Ltd.) with acrylic acid and 1,2,5,6-tetrahydrophthalic acid (4-cyclohexene-1, 2-Dicarboxylic acid) was reacted at a molar ratio of 1:1 to prepare an imino carbonate-based compound 2 as an acidic modified oligomer.

所製備的亞氨基碳酸酯系化合物2之酸值為76mgKOH/g。此時,所製備的亞氨基碳酸酯系化合物2之酸值是藉由將約0.1g之樣品溶解於二甲苯和異丙醇之1:1混合物中而測定的,具體採用了根據ASTM D1639之方法。 The acid value of the produced imino carbonate-based compound 2 was 76 mgKOH/g. At this time, the acid value of the prepared imino carbonate-based compound 2 was determined by dissolving about 0.1 g of the sample in a 1:1 mixture of xylene and isopropyl alcohol, specifically according to ASTM D1639. method.

除了使用作為酸性改質寡聚物之亞氨基碳酸酯系化合物2以外,其是根據實施例1相同之步驟製備乾膜及印刷電路板。 A dry film and a printed circuit board were prepared in the same manner as in Example 1 except that the iminocarbonate-based compound 2 was used as the acidic modified oligomer.

比較例3Comparative example 3

除了使用如下表2所示之成分(特別是,使用亞氨基碳酸酯系化合物2及28%之硫酸鋇)以外,其是根據實施例1相同步驟製備乾膜及印刷電路板。 A dry film and a printed circuit board were prepared in accordance with the same procedure as in Example 1 except that the components shown in Table 2 below (in particular, iminocarbonate-based compound 2 and 28% barium sulfate) were used.

比較例4Comparative example 4

如下表2所示,除了使用作為酸性改質寡聚物之亞氨基碳酸酯系化合物2,且不使用熱硬化黏結劑而增加溶劑含量以外,其是根據實施例1相同步驟製備乾膜及印刷電路板。 As shown in the following Table 2, in addition to the use of the iminocarbonate-based compound 2 as the acid-modified oligomer, and the solvent content was increased without using a thermosetting binder, it was prepared by the same procedure as in Example 1 to prepare a dry film and printing. Circuit board.

比較例1至4之樹脂組成物之特定成分是整理於下表2中。 The specific components of the resin compositions of Comparative Examples 1 to 4 were as shown in Table 2 below.

[測試例][Test example]

將實施例及比較例中所製備之乾膜及印刷電路板進行以下測試。 The dry film and the printed circuit board prepared in the examples and the comparative examples were subjected to the following tests.

測試例1:吸濕耐熱性測試Test Example 1: Hygroscopic heat resistance test

取LG化學股份有限公司之LG-T-500GA,即具有0.1mm厚度及12μm銅厚之銅箔疊層板,將其裁切為長寬5cm×5cm,且藉由化學蝕刻在 銅表面上形成微粗糙度。將實施例及比較例中所製備的乾膜的離型膜剝離以製備成樣品,利用真空壓合機(MV LP-500,Meiki Seisakusho股份有限公司)真空壓合膜層至形成粗糙度之銅箔疊層板(板體)上,隨後將其暴露至400mJ/cm2之365nm波長UV光下。然後,移除PET膜,並浸漬於1重量百分比之Na2CO3鹼溶液,於31℃下顯影一段特定時間,接著在約1000mJ/cm2之曝光強度下進行光硬化。最後,在約170℃下進行熱硬化1小時以製備樣品。 Take LG-T-500GA of LG Chemical Co., Ltd., a copper foil laminate with a thickness of 0.1 mm and a copper thickness of 12 μm, cut into a length and width of 5 cm × 5 cm, and formed on the copper surface by chemical etching. Micro-roughness. The release film of the dry film prepared in the examples and the comparative examples was peeled off to prepare a sample, and the film layer was vacuum-compressed by a vacuum press machine (MV LP-500, Meiki Seisakusho Co., Ltd.) to form copper of roughness. The foil laminate (plate) was then exposed to 400 mJ/cm 2 of 365 nm wavelength UV light. Then, the PET film was removed, and immersed in a 1 wt% Na 2 CO 3 alkali solution, developed at 31 ° C for a specific period of time, and then photohardened at an exposure intensity of about 1000 mJ/cm 2 . Finally, heat hardening was performed at about 170 ° C for 1 hour to prepare a sample.

利用PCT裝置(HAST System TPC-412MD,ESPEC公司),在溫度121℃、100%飽和濕度、及2atm壓力下處理所述樣品24小時,接著觀察塗膜的狀態後,以基板面朝下的方式浮置(floating)在288℃的鉛浴中1分鐘,再觀察塗膜的狀態。觀察結果是根據下列準則判斷。 The sample was treated with a PCT apparatus (HAST System TPC-412MD, ESPEC) at a temperature of 121 ° C, 100% saturated humidity, and a pressure of 2 atm for 24 hours, and then the state of the coating film was observed, with the substrate facing downward. The film was floated in a lead bath at 288 ° C for 1 minute, and the state of the coating film was observed. The observations are judged according to the following criteria.

1:浮置(floating)後,DFSR沒有剝離、爆裂或顏色改變的情形。 1: After floating, the DFSR has no peeling, bursting or color change.

2:吸濕後,DFSR有剝離、爆裂或顏色改變的情形,但浮置(floating)後有剝離、爆裂或顏色改變的情形。 2: After moisture absorption, the DFSR may be peeled, bursted, or changed in color, but there is a case of peeling, bursting, or color change after floating.

3:吸濕後,DFSR有剝離、爆裂或顏色改變的情形。 3: After moisture absorption, the DFSR has a peeling, bursting or color change.

測試例2:玻璃轉換溫度(Tg)測試Test Example 2: Glass transition temperature (Tg) test

如同製備用於測量PCT耐熱性之樣品,將膜層疊合在3EC-M3-VLP(Mitsui Mining & Smelting Co.,Ltd.)之12μm光亮銅表面上;DFSR樣品之製備,其中除了將可得到5mm寬及5mm間隔之條紋圖案之負型光罩置放於樣品表面,再將樣品暴露至光線以外,是進行與製備用於測量PCT耐熱性之樣品之相同步驟到熱硬化步驟。最後,覆銅層是由所述樣品剝離,以得到具有5mm條紋形狀之樣品,用於評估TMA(thermal mechanical analysis,熱機械分析儀,METTLER TOLEDO,TMA/SDTA 840)。 The film was laminated on a 12 μm bright copper surface of 3EC-M3-VLP (Mitsui Mining & Smelting Co., Ltd.) as prepared for the sample for measuring PCT heat resistance; preparation of DFSR sample, except that 5 mm would be obtained A negative reticle with a stripe pattern of 5 mm spacing and 5 mm spacing is placed on the surface of the sample, and the sample is exposed to light other than the same steps as the preparation of the sample for measuring PCT heat resistance to the thermal hardening step. Finally, the copper-clad layer was peeled off from the sample to obtain a sample having a 5 mm stripe shape for evaluation of TMA (thermal Mechanical analysis, thermomechanical analyzer, METTLER TOLEDO, TMA/SDTA 840).

如下測量玻璃轉換溫度(Tg)。首先,將所述樣品裝置於支架上且長度為10mm,當提供0.05N應力至所述樣品兩端並以每分鐘10℃將溫度從50℃上升至250℃時,測量所述樣品延伸的長度多寡。在溫度上升中顯示之反曲點(inflection point)是表示Tg,且根據以下準則進行評估。 The glass transition temperature (Tg) was measured as follows. First, the sample was mounted on a stent and had a length of 10 mm. When 0.05 N stress was applied to both ends of the sample and the temperature was raised from 50 ° C to 250 ° C at 10 ° C per minute, the length of the sample extension was measured. How many. The inflection point displayed in the temperature rise is indicative of Tg and is evaluated according to the following criteria.

1:Tg為150℃以上;2:Tg為120℃以上並低於150℃;3:Tg低於120℃。 1: Tg is 150 ° C or higher; 2: Tg is 120 ° C or higher and lower than 150 ° C; 3: Tg is lower than 120 ° C.

在測量Tg期間同時得到熱膨脹係數(CTE)並比較之。首先,熱膨脹係數是根據從50℃至80℃時延伸樣品之斜率計算的。該計算結果根據下列準則進行評估。 The coefficient of thermal expansion (CTE) was simultaneously obtained during the measurement of Tg and compared. First, the coefficient of thermal expansion is calculated from the slope of the extended sample from 50 ° C to 80 ° C. The calculation results are evaluated according to the following criteria.

(熱膨脹係數) (Thermal expansion coefficient)

1:低於25ppm/K;2:25ppm/K以上並低於40ppm/K;3:40ppm/K以上並低於50ppm/K;4:50ppm/K以上。 1: less than 25 ppm/K; 2: 25 ppm/K or more and less than 40 ppm/K; 3: 40 ppm/K or more and less than 50 ppm/K; 4: 50 ppm/K or more.

測試例3:評估顯影性Test Example 3: Evaluation of developability

取三井金屬礦業公司(Mitsui Mining & Smelting Co.,Ltd.)之3EC-M3-VLP,即具有12μm厚度之銅箔疊層板,將其裁切為長寬5cm×5cm,且藉由化學蝕刻在銅表面上形成微粗糙度。將實施例及比較例中所製備的乾膜的離型膜剝離以製備成樣品;利用真空壓合機(MV LP-500,Meiki Seisakusho股份有限公司)真空壓合膜層至銅箔疊層板(板體)上,其中銅箔疊 層板之表面上形成粗糙度。 Take 3EC-M3-VLP of Mitsui Mining & Smelting Co., Ltd., a copper foil laminate with a thickness of 12 μm, cut it into a length and width of 5 cm × 5 cm, and chemically etch it. A microroughness is formed on the copper surface. The release film of the dry film prepared in the examples and the comparative examples was peeled off to prepare a sample; the film layer was vacuum-bonded to a copper foil laminate using a vacuum press machine (MV LP-500, Meiki Seisakusho Co., Ltd.) (plate body) on which the copper foil stack A roughness is formed on the surface of the laminate.

然後,緊密粘附具有直徑為100μm至10μm(單位直徑為10μm)之孔形狀之負型光罩,隨後暴露於400mJ/cm2之365nm波長UV光下。接著,移除PET膜,並在1重量百分比之Na2CO3鹼溶液中,於31℃下顯影一段特定時間以形成圖案。然後,用SEM觀察所形成的圖案形狀,並根據下列準則進行評估。 Then, a negative mask having a hole shape having a diameter of 100 μm to 10 μm (10 μm per unit diameter) was closely adhered, and then exposed to 400 mJ/cm 2 of 365 nm wavelength UV light. Next, the PET film was removed and developed in a 1 wt% Na 2 CO 3 alkali solution at 31 ° C for a specific period of time to form a pattern. Then, the shape of the formed pattern was observed by SEM and evaluated according to the following criteria.

1:孔直徑為30μm或其以下可顯影 1: Developable with a hole diameter of 30 μm or less

2:孔直徑為40至50μm可顯影 2: The hole diameter is 40 to 50 μm and can be developed

3:只有孔直徑為60μm以上可顯影或者未顯影 3: Only the hole diameter of 60μm or more can be developed or not developed

測試例4:介電常數測試Test Example 4: Dielectric constant test

除了將實施例及比較例中得到的長寬為15cm×15cm的乾膜式防焊劑疊合在大小為16cm×16cm的銅箔上後,不使用光罩於400mJ/cm2曝光強度下對整個面積進行曝光以外,其是根據測試例1之製備用於測試吸濕耐熱性等樣品之相同步驟進行熱硬化,並僅對銅箔進行蝕刻而製備DFSR樣品(硬化膜)。 Except that the dry film solder resist having a length and width of 15 cm × 15 cm obtained in the examples and the comparative examples was laminated on a copper foil having a size of 16 cm × 16 cm, the entire mask was not used at a exposure intensity of 400 mJ/cm 2 . In addition to the area exposure, it was thermally hardened according to the same procedure as that for preparing a sample for testing moisture absorption heat resistance of Test Example 1, and only a copper foil was etched to prepare a DFSR sample (cured film).

對於所述硬化膜,以向量網路分析儀(Vector Network Analyzer),(安捷倫科技公司,Agilent Technologies)作為測試儀器且以分離介電諧振器(Split Post Dieletrci Resonator,QWED公司)作為測試夾具測試了10GHz下之介電常數。 For the cured film, a Vector Network Analyzer, (Agilent Technologies, Agilent Technologies) was used as a test instrument and a separate dielectric resonator (Split Post Dieletrci Resonator, QWED) was used as a test fixture. Dielectric constant at 10 GHz.

測試例5:α粒子放射率測試Test Example 5: Alpha particle emissivity test

利用ORDELA公司之Large Area Propotional Counter(型號:8600A-LB)測試了實施例及比較例中得到的乾膜的α粒子放射率。 The α-particle emissivity of the dry film obtained in the examples and the comparative examples was tested using a Large Area Propotional Counter (model: 8600A-LB) of ORDELA.

具體地,將各乾膜(900cm2,30cm×30cm)放入測試儀後,在25±2℃的溫度及60±20RH%的相對濕度下通入高純度的P-10氣體(10體積百分率的甲烷及90體積百分率的氬)並測量48小時內放射出的α粒子數量。 Specifically, after placing each dry film (900 cm 2 , 30 cm × 30 cm) into the tester, high-purity P-10 gas (10 volume percent) was introduced at a temperature of 25 ± 2 ° C and a relative humidity of 60 ± 20 RH %. Methane and 90 volume percent argon) and measured the amount of alpha particles emitted within 48 hours.

測試例1至5之測試及評估之結果整理於下表3中。 The results of the tests and evaluations of Test Examples 1 to 5 are summarized in Table 3 below.

如上表3之測量及評估結果所示,實施例之DFSR顯影性大大提高,因而可以更容易實現微細間距,而且在耐熱性、玻璃轉換溫度、熱膨脹係數、介電常數及α粒子放射率等各種性質上,與比較例的DFSR相比顯示出優秀的性質。因此,實施例適合於形成具有高溫耐熱可靠度的DFSR。 As shown in the measurement and evaluation results of Table 3 above, the DFSR developability of the examples was greatly improved, so that fine pitches were more easily realized, and various heat resistance, glass transition temperature, thermal expansion coefficient, dielectric constant, and alpha particle emissivity were various. In nature, it exhibits excellent properties compared to the DFSR of the comparative example. Therefore, the embodiment is suitable for forming a DFSR having high temperature heat resistance reliability.

no

Claims (29)

一種光硬化與熱硬化樹脂組成物,包含:第一酸性改質寡聚物,其包含具有羧基且酸值為100至180mgKOH/g之下述式1之亞氨基碳酸酯系化合物;光聚合性單體,其具有兩個以上之光硬化性不飽和官能基;熱硬化黏結劑,其具有熱硬化性官能基;無機填充劑,其包含50至90重量百分比之二氧化矽;以及光起始劑; 在上述式1中,n為0至100之整數,R1為衍生自二羧酸化合物之官能基。 A photohardenable and thermosetting resin composition comprising: a first acid-modified oligomer comprising an iminocarbonate compound of the following formula 1 having a carboxyl group and having an acid value of from 100 to 180 mgKOH/g; photopolymerizability a monomer having two or more photocurable unsaturated functional groups; a thermosetting binder having a thermosetting functional group; an inorganic filler comprising 50 to 90% by weight of cerium oxide; and a light initiation Agent In the above formula 1, n is an integer of 0 to 100, and R 1 is a functional group derived from a dicarboxylic acid compound. 如申請專利範圍第1項所述的光硬化與熱硬化樹脂組成物,更包含第二酸性改質寡聚物,其具有羧基及光硬化性不飽和官能基。 The photocuring and thermosetting resin composition according to claim 1, further comprising a second acidic modified oligomer having a carboxyl group and a photocurable unsaturated functional group. 如申請專利範圍第1項所述的光硬化與熱硬化樹脂組成物,其中,所述無機填充劑包含50至90重量百分比之二氧化矽和10至50重量百分比之一種或多種選自由硫酸鋇、鈦酸鋇、滑石、黏土、碳酸鎂、碳酸鈣、氧化鋁、氫氧化鋁及雲母所組成之群組的化合物。 The photohardening and thermosetting resin composition according to claim 1, wherein the inorganic filler comprises 50 to 90% by weight of cerium oxide and 10 to 50% by weight of one or more selected from the group consisting of barium sulfate a compound of the group consisting of barium titanate, talc, clay, magnesium carbonate, calcium carbonate, aluminum oxide, aluminum hydroxide, and mica. 如申請專利範圍第1項所述的光硬化與熱硬化樹脂組成物,其中,所述無機填充劑的含量為5至50重量百分比。 The photohardening and thermosetting resin composition according to claim 1, wherein the inorganic filler is contained in an amount of from 5 to 50% by weight. 如申請專利範圍第1項所述的光硬化與熱硬化樹脂組成物,其中,所述亞氨基碳酸酯系化合物是使氰酸酯系化合物和二羧酸化合物反應而形成的化合物。 The photocuring and thermosetting resin composition according to claim 1, wherein the iminocarbonate-based compound is a compound formed by reacting a cyanate-based compound and a dicarboxylic acid compound. 如申請專利範圍第5項所述的光硬化與熱硬化樹脂組成物,其中,所述二羧酸化合物為脂肪族二羧酸化合物、脂環族二羧酸化合物或芳香族二羧酸化合物。 The photocuring and thermosetting resin composition according to claim 5, wherein the dicarboxylic acid compound is an aliphatic dicarboxylic acid compound, an alicyclic dicarboxylic acid compound or an aromatic dicarboxylic acid compound. 如申請專利範圍第6項所述的光硬化與熱硬化樹脂組成物,其中,所述脂肪族二羧酸化合物包含一種或多種選自由草酸、丙二酸、琥珀酸、戊二酸、己二酸、庚二酸、辛二酸、壬二酸、癸二酸、降冰片烯二羧酸,C5-C10環烷烴二羧酸及其酸酐所組成之群組的化合物。 The photohardening and thermosetting resin composition according to claim 6, wherein the aliphatic dicarboxylic acid compound comprises one or more selected from the group consisting of oxalic acid, malonic acid, succinic acid, glutaric acid, and hexanic acid. A compound of the group consisting of acid, pimelic acid, suberic acid, azelaic acid, sebacic acid, norbornene dicarboxylic acid, C5-C10 cycloalkane dicarboxylic acid and anhydride thereof. 如申請專利範圍第6項所述的光硬化與熱硬化樹脂組成物,其中,所述芳香族二羧酸化合物包含一種或多種選自由鄰苯二甲酸、降冰片烯二羧酸、四氫鄰苯二甲酸、琥珀酸、咪唑二羧酸、吡啶二羧酸及其酸酐所組成之群組的化合物。 The photohardening and thermosetting resin composition according to claim 6, wherein the aromatic dicarboxylic acid compound comprises one or more selected from the group consisting of phthalic acid, norbornene dicarboxylic acid, and tetrahydrogen A compound of the group consisting of phthalic acid, succinic acid, imidazole dicarboxylic acid, dipicolinic acid, and anhydride thereof. 如申請專利範圍第5項所述之光硬化與熱硬化樹脂組成物,其中,所述氰酸酯系化合物包含具有氰化物基團之雙酚系或酚醛清漆系化合物。 The photocuring and thermosetting resin composition according to claim 5, wherein the cyanate-based compound comprises a bisphenol-based or novolak-based compound having a cyanide group. 如申請專利範圍第1項所述之光硬化與熱硬化樹脂組成物,其中,在式1中,所述R1為在一種選自由C6-C20芳香環、C4-C20伸環烷基環以及C4-C20伸環烯基環所組成之群組之核心基團上結合有醯基及羧基之官能基。 The photohardening and thermosetting resin composition according to claim 1 , wherein in Formula 1, R 1 is in a ring selected from a C6-C20 aromatic ring, a C4-C20 cycloalkylene ring, and A functional group of a thiol group and a carboxyl group is bonded to a core group of the group consisting of a C4-C20 cycloalkenyl ring. 如申請專利範圍第1項所述之光硬化與熱硬化樹脂組成物,其中,在式1中,所述R1,且「*」表示一結合點。 The photohardening and thermosetting resin composition according to claim 1 , wherein in Formula 1, the R 1 is , or And "*" indicates a joint point. 如申請專利範圍第1項所述之光硬化與熱硬化樹脂組成物,其中,基於所述光硬化與熱硬化樹脂組成物之總重,包含之所述第一酸性改質寡聚物之含量為5至75重量百分比。 The photohardening and thermosetting resin composition according to claim 1, wherein the content of the first acidic modified oligomer is included based on the total weight of the photohardening and thermosetting resin composition. It is 5 to 75 weight percent. 如申請專利範圍第1項所述之光硬化與熱硬化樹脂組成物,其中,所述光聚合性單體包含丙烯酸酯系化合物,其具有兩個以上之光硬化性不飽和官能基。 The photocurable and thermosetting resin composition according to the above aspect of the invention, wherein the photopolymerizable monomer comprises an acrylate-based compound having two or more photocurable unsaturated functional groups. 如申請專利範圍第1項所述之光硬化與熱硬化樹脂組成物,其中,所述光聚合性單體包括一種或多種選自由:具羥基之丙烯酸酯系化合物、水溶性丙烯酸酯系化合物、聚酯丙烯酸酯系化合物、聚氨酯丙烯酸酯系化合物、環氧丙烯酸酯系化合物、及己內酯改性之丙烯酸酯系化合物所組成之群組的化合物。 The photocurable and thermosetting resin composition according to claim 1, wherein the photopolymerizable monomer comprises one or more selected from the group consisting of: an acrylate compound having a hydroxyl group, a water-soluble acrylate compound, A compound composed of a polyester acrylate compound, a urethane acrylate compound, an epoxy acrylate compound, and a caprolactone-modified acrylate compound. 如申請專利範圍第1項所述之光硬化與熱硬化樹脂組成物,其中,基於所述光硬化與熱硬化樹脂組成物之總重,包含之所述光聚合性單體之含量為1至30重量百分比。 The photohardenable and thermosetting resin composition according to claim 1, wherein the content of the photopolymerizable monomer is 1 to 1 based on the total weight of the photocuring and thermosetting resin composition. 30 weight percent. 如申請專利範圍第1項所述之光硬化與熱硬化樹脂組成物,其中,所述光起始劑包含一種或多種選自由:苯偶姻及其烷基醚、苯乙酮、蒽醌、噻噸酮、縮酮、二苯甲酮、α-氨基苯乙酮、醯基氧化膦及肟酯所組成之群組的化合物。 The photohardening and thermosetting resin composition according to claim 1, wherein the photoinitiator comprises one or more selected from the group consisting of: benzoin and its alkyl ether, acetophenone, anthracene, A compound of the group consisting of thioxanthone, ketal, benzophenone, alpha-aminoacetophenone, decylphosphine oxide and decyl ester. 如申請專利範圍第1項所述之光硬化與熱硬化樹脂組成物,其中,基於所述光硬化與熱硬化樹脂組成物之總重,包含之所述光起始劑之含量為0.5至20重量百分比。 The photohardening and thermosetting resin composition according to claim 1, wherein the photoinitiator is contained in an amount of 0.5 to 20 based on the total weight of the photohardenable and thermosetting resin composition. Weight percentage. 如申請專利範圍第1項所述之光硬化與熱硬化樹脂組成物,其中,所述熱硬化性官能基為一種或多種選自由:環氧基、氧雜環丁烷基、環醚基及環狀硫醚基所組成之群組的官能基。 The photohardenable and thermosetting resin composition according to claim 1, wherein the thermosetting functional group is one or more selected from the group consisting of epoxy groups, oxetane groups, and cyclic ether groups. A functional group of a group consisting of cyclic thioether groups. 如申請專利範圍第1項所述之光硬化與熱硬化樹脂組成物,其中,相對於1當量之所述第一酸性改質寡聚物中之所述羧基,包含之所述熱硬化黏結劑之含量相當於0.5至2.0當量。 The photohardenable and thermosetting resin composition according to claim 1, wherein the thermosetting binder is contained in an amount of one equivalent of the carboxyl group in the first acid-modified oligomer. The content is equivalent to 0.5 to 2.0 equivalents. 如申請專利範圍第1項所述之光硬化與熱硬化樹脂組成物,更包含:溶劑以及一種或多種選自由熱硬化黏結劑催化劑、填充劑、顏料及添加劑所組成之群組的物質。 The photohardening and thermosetting resin composition according to claim 1, further comprising: a solvent and one or more substances selected from the group consisting of thermosetting binder catalysts, fillers, pigments and additives. 一種乾膜式防焊劑,包含:第一酸性改質寡聚物、光聚合性單體和熱硬化黏結劑之硬化產物以及無機填充劑,其中所述第一酸性改質寡聚物包含具有羧基且酸值為100至180mgKOH/g之下述式1之亞氨基碳酸酯系化合物,所述光聚合性單體具有兩個以上之光硬化性不飽和官能基,所述熱硬化黏結劑具有熱硬化性官能基,所述無機填充劑散布於所述硬化產物中且包含50至90重量百分比之二氧化矽; 在上述式1中,n為0至100之整數,R1為衍生自二羧酸化合物之官能基。 A dry film solder resist comprising: a first acid-modified oligomer, a photopolymerizable monomer, and a hardening product of a thermosetting binder, and an inorganic filler, wherein the first acid-modified oligomer comprises a carboxyl group And an iminocarbonate-based compound of the following formula 1 having an acid value of from 100 to 180 mgKOH/g, the photopolymerizable monomer having two or more photocurable unsaturated functional groups, the thermosetting bonding agent having heat a hardening functional group, the inorganic filler being dispersed in the hardened product and comprising 50 to 90% by weight of cerium oxide; In the above formula 1, n is an integer of 0 to 100, and R 1 is a functional group derived from a dicarboxylic acid compound. 如申請專利範圍第21項所述之乾膜式防焊劑,其中,所述硬化產物包含:所述亞氨基碳酸酯系化合物之羧基與所述熱硬化性官能基交聯之交聯結構;以及衍生自所述亞氨基碳酸酯系化合物之交聯三嗪結構。 The dry film solder resist according to claim 21, wherein the hardened product comprises: a crosslinked structure in which a carboxyl group of the imino carbonate-based compound is crosslinked with the thermosetting functional group; A crosslinked triazine structure derived from the iminocarbonate-based compound. 如申請專利範圍第21項所述之乾膜式防焊劑,其中,所述硬化產物更包含第二酸性改質寡聚物,所述第二酸性改質寡聚物具有羧基及光硬化性不飽和官能基。 The dry film solder resist according to claim 21, wherein the hardened product further comprises a second acidic modified oligomer, wherein the second acidic modified oligomer has a carboxyl group and photocurability Saturated functional group. 如申請專利範圍第23項所述之乾膜式防焊劑,其中,所述硬化產物包含;所述亞氨基碳酸酯系化合物之羧基與所述熱硬化性官能基交聯之交聯結構;具有羧基及光硬化性不飽和官能基之所述第二酸性改質寡聚物之羧基與所述熱硬化性官能基交聯之交聯結構;衍生自所述亞氨基碳酸酯系化合物之交聯三嗪結構;以及具有羧基及光硬化性不飽和官能基之所述第二酸性改質寡聚物和所述光聚合性單體各自的不飽和官能基彼此交聯之交聯結構。 The dry film solder resist according to claim 23, wherein the hardened product comprises: a crosslinked structure in which a carboxyl group of the imino carbonate compound is crosslinked with the thermosetting functional group; a crosslinked structure in which a carboxyl group of the second acidic modified oligomer of the carboxyl group and the photocurable unsaturated functional group is crosslinked with the thermosetting functional group; cross-linking derived from the imino carbonate-based compound a triazine structure; and a crosslinked structure in which the second acidic modified oligomer having a carboxyl group and a photocurable unsaturated functional group and each of the unsaturated functional groups of the photopolymerizable monomer are crosslinked with each other. 如申請專利範圍第21項所述之乾膜式防焊劑,其α粒子放射率為0.010alphas/cm2/hr以下。 The dry film solder resist according to claim 21, wherein the α particle emissivity is 0.010 alphas/cm 2 /hr or less. 如申請專利範圍第21項所述之乾膜式防焊劑,其具有低於40ppm/K之熱膨脹係數。 The dry film solder resist of claim 21, which has a thermal expansion coefficient of less than 40 ppm/K. 如申請專利範圍第21項所述之乾膜式防焊劑,其玻璃轉換溫度(Tg)為120℃至180℃。 The dry film solder resist according to claim 21, which has a glass transition temperature (Tg) of from 120 ° C to 180 ° C. 如申請專利範圍第21項所述之乾膜式防焊劑,其中,所述無機填充劑包含50至90重量百分比之二氧化矽和10至50重量百分比之一種或 多種選自由硫酸鋇、鈦酸鋇、滑石、黏土、碳酸鎂、碳酸鈣、氧化鋁、氫氧化鋁及雲母所組成之群組的化合物。 The dry film solder resist according to claim 21, wherein the inorganic filler contains 50 to 90% by weight of cerium oxide and 10 to 50% by weight or A plurality of compounds selected from the group consisting of barium sulfate, barium titanate, talc, clay, magnesium carbonate, calcium carbonate, aluminum oxide, aluminum hydroxide, and mica. 如申請專利範圍第21項所述之乾膜式防焊劑,其中,所述無機填充劑的含量為5至50重量百分比。 The dry film solder resist according to claim 21, wherein the inorganic filler is contained in an amount of 5 to 50% by weight.
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