TWI595001B - 高發光性半導體奈米晶體 - Google Patents
高發光性半導體奈米晶體 Download PDFInfo
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- TWI595001B TWI595001B TW101133712A TW101133712A TWI595001B TW I595001 B TWI595001 B TW I595001B TW 101133712 A TW101133712 A TW 101133712A TW 101133712 A TW101133712 A TW 101133712A TW I595001 B TWI595001 B TW I595001B
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- Taiwan
- Prior art keywords
- tris
- group
- nanocrystal
- trimethyltin
- metal
- Prior art date
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- 239000004054 semiconductor nanocrystal Substances 0.000 title claims description 20
- 239000007983 Tris buffer Substances 0.000 claims description 60
- 150000001875 compounds Chemical class 0.000 claims description 34
- 238000000034 method Methods 0.000 claims description 32
- 125000000217 alkyl group Chemical group 0.000 claims description 28
- -1 tris(trimethyltin) hydrazine Chemical compound 0.000 claims description 24
- 150000003839 salts Chemical class 0.000 claims description 21
- 125000000753 cycloalkyl group Chemical group 0.000 claims description 19
- 229910052751 metal Inorganic materials 0.000 claims description 17
- 239000002184 metal Substances 0.000 claims description 17
- 125000003118 aryl group Chemical group 0.000 claims description 16
- LYRCQNDYYRPFMF-UHFFFAOYSA-N trimethyltin Chemical compound C[Sn](C)C LYRCQNDYYRPFMF-UHFFFAOYSA-N 0.000 claims description 16
- NIIPNAJXERMYOG-UHFFFAOYSA-N 1,1,2-trimethylhydrazine Chemical compound CNN(C)C NIIPNAJXERMYOG-UHFFFAOYSA-N 0.000 claims description 15
- NRZWQKGABZFFKE-UHFFFAOYSA-N trimethylsulfonium Chemical compound C[S+](C)C NRZWQKGABZFFKE-UHFFFAOYSA-N 0.000 claims description 14
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 claims description 13
- 229910052785 arsenic Inorganic materials 0.000 claims description 12
- 125000000392 cycloalkenyl group Chemical group 0.000 claims description 12
- 239000012433 hydrogen halide Substances 0.000 claims description 12
- 229910000039 hydrogen halide Inorganic materials 0.000 claims description 12
- WKZSIFJHJCVUPZ-UHFFFAOYSA-N trimethyllead Chemical compound C[Pb](C)C WKZSIFJHJCVUPZ-UHFFFAOYSA-N 0.000 claims description 11
- 125000001072 heteroaryl group Chemical group 0.000 claims description 10
- 229910052739 hydrogen Inorganic materials 0.000 claims description 9
- 239000001257 hydrogen Substances 0.000 claims description 9
- 150000004767 nitrides Chemical class 0.000 claims description 9
- 125000003342 alkenyl group Chemical group 0.000 claims description 8
- 125000000304 alkynyl group Chemical group 0.000 claims description 8
- 229910052787 antimony Inorganic materials 0.000 claims description 8
- 125000000623 heterocyclic group Chemical group 0.000 claims description 8
- 229910052718 tin Inorganic materials 0.000 claims description 8
- 229910052732 germanium Inorganic materials 0.000 claims description 7
- 150000002431 hydrogen Chemical group 0.000 claims description 7
- 238000004519 manufacturing process Methods 0.000 claims description 7
- 229910052757 nitrogen Inorganic materials 0.000 claims description 6
- 229910052745 lead Inorganic materials 0.000 claims description 5
- 125000001424 substituent group Chemical group 0.000 claims description 5
- 229910021478 group 5 element Inorganic materials 0.000 claims description 4
- 229910052736 halogen Inorganic materials 0.000 claims description 4
- 150000002367 halogens Chemical group 0.000 claims description 4
- RNIXSZHNJLUJGC-UHFFFAOYSA-N hydroxy(nitro)cyanamide Chemical group N#CN(O)[N+]([O-])=O RNIXSZHNJLUJGC-UHFFFAOYSA-N 0.000 claims description 4
- 125000000446 sulfanediyl group Chemical group *S* 0.000 claims description 4
- XSOKHXFFCGXDJZ-UHFFFAOYSA-N telluride(2-) Chemical compound [Te-2] XSOKHXFFCGXDJZ-UHFFFAOYSA-N 0.000 claims description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 3
- AOBCZAZQBJBZMQ-UHFFFAOYSA-N [Ru].CNN(C)C.CNN(C)C.CNN(C)C Chemical compound [Ru].CNN(C)C.CNN(C)C.CNN(C)C AOBCZAZQBJBZMQ-UHFFFAOYSA-N 0.000 claims description 3
- ILGRBBGDYRKSQF-UHFFFAOYSA-N [Ru].C[Pb](C)C.C[Pb](C)C.C[Pb](C)C Chemical compound [Ru].C[Pb](C)C.C[Pb](C)C.C[Pb](C)C ILGRBBGDYRKSQF-UHFFFAOYSA-N 0.000 claims description 3
- 125000003545 alkoxy group Chemical group 0.000 claims description 3
- 125000003983 fluorenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3CC12)* 0.000 claims description 3
- 125000004001 thioalkyl group Chemical group 0.000 claims description 3
- 125000005842 heteroatom Chemical group 0.000 claims description 2
- WUGIHIDKVSDYPA-UHFFFAOYSA-N CNN(C)C.NN Chemical compound CNN(C)C.NN WUGIHIDKVSDYPA-UHFFFAOYSA-N 0.000 claims 1
- 239000002159 nanocrystal Substances 0.000 description 74
- 239000002245 particle Substances 0.000 description 29
- 239000000463 material Substances 0.000 description 25
- 239000011162 core material Substances 0.000 description 24
- 230000015572 biosynthetic process Effects 0.000 description 23
- 238000003786 synthesis reaction Methods 0.000 description 20
- 238000006243 chemical reaction Methods 0.000 description 19
- 239000004065 semiconductor Substances 0.000 description 19
- 238000009826 distribution Methods 0.000 description 15
- 239000002243 precursor Substances 0.000 description 13
- 239000000243 solution Substances 0.000 description 13
- 239000002904 solvent Substances 0.000 description 13
- 239000011257 shell material Substances 0.000 description 12
- 150000001412 amines Chemical class 0.000 description 11
- RMBPEFMHABBEKP-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2C3=C[CH]C=CC3=CC2=C1 RMBPEFMHABBEKP-UHFFFAOYSA-N 0.000 description 11
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 10
- 239000000178 monomer Substances 0.000 description 10
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 9
- 239000013078 crystal Substances 0.000 description 9
- 239000003446 ligand Substances 0.000 description 9
- 229910052698 phosphorus Inorganic materials 0.000 description 9
- 238000006862 quantum yield reaction Methods 0.000 description 9
- 229910000673 Indium arsenide Inorganic materials 0.000 description 8
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 8
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 8
- 239000000203 mixture Substances 0.000 description 8
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 8
- 150000000180 1,2-diols Chemical class 0.000 description 7
- 125000000524 functional group Chemical group 0.000 description 7
- 150000002923 oximes Chemical class 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 6
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 6
- UBBBBDRNCIWFPL-UHFFFAOYSA-N [Ru].C[Sn](C)C.C[Sn](C)C.C[Sn](C)C Chemical compound [Ru].C[Sn](C)C.C[Sn](C)C.C[Sn](C)C UBBBBDRNCIWFPL-UHFFFAOYSA-N 0.000 description 6
- 238000010521 absorption reaction Methods 0.000 description 6
- 150000001299 aldehydes Chemical class 0.000 description 6
- 239000003153 chemical reaction reagent Substances 0.000 description 6
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- 239000010410 layer Substances 0.000 description 6
- 238000006116 polymerization reaction Methods 0.000 description 6
- 230000009257 reactivity Effects 0.000 description 6
- 229910052717 sulfur Inorganic materials 0.000 description 6
- RMZAYIKUYWXQPB-UHFFFAOYSA-N trioctylphosphane Chemical compound CCCCCCCCP(CCCCCCCC)CCCCCCCC RMZAYIKUYWXQPB-UHFFFAOYSA-N 0.000 description 6
- 229910004613 CdTe Inorganic materials 0.000 description 5
- 238000005481 NMR spectroscopy Methods 0.000 description 5
- 229910052786 argon Inorganic materials 0.000 description 5
- 125000004432 carbon atom Chemical group C* 0.000 description 5
- 230000006911 nucleation Effects 0.000 description 5
- 238000010899 nucleation Methods 0.000 description 5
- 229910052760 oxygen Inorganic materials 0.000 description 5
- 230000001443 photoexcitation Effects 0.000 description 5
- 239000011593 sulfur Substances 0.000 description 5
- ZMBHCYHQLYEYDV-UHFFFAOYSA-N trioctylphosphine oxide Chemical compound CCCCCCCCP(=O)(CCCCCCCC)CCCCCCCC ZMBHCYHQLYEYDV-UHFFFAOYSA-N 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 4
- 229910007709 ZnTe Inorganic materials 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 4
- 239000002585 base Substances 0.000 description 4
- 229910052793 cadmium Inorganic materials 0.000 description 4
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 4
- 150000007942 carboxylates Chemical class 0.000 description 4
- 229910052733 gallium Inorganic materials 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- XYFCBTPGUUZFHI-UHFFFAOYSA-O phosphonium Chemical compound [PH4+] XYFCBTPGUUZFHI-UHFFFAOYSA-O 0.000 description 4
- 239000000047 product Substances 0.000 description 4
- BBEAQIROQSPTKN-UHFFFAOYSA-N pyrene Chemical compound C1=CC=C2C=CC3=CC=CC4=CC=C1C2=C43 BBEAQIROQSPTKN-UHFFFAOYSA-N 0.000 description 4
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 3
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- VTFNBNXKLVLRDF-UHFFFAOYSA-N NN.CNN(C)C.CNN(C)C.CNN(C)C Chemical compound NN.CNN(C)C.CNN(C)C.CNN(C)C VTFNBNXKLVLRDF-UHFFFAOYSA-N 0.000 description 3
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Natural products P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 3
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 3
- 238000000862 absorption spectrum Methods 0.000 description 3
- YRKCREAYFQTBPV-UHFFFAOYSA-N acetylacetone Chemical compound CC(=O)CC(C)=O YRKCREAYFQTBPV-UHFFFAOYSA-N 0.000 description 3
- 150000003973 alkyl amines Chemical class 0.000 description 3
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 3
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 3
- 150000004770 chalcogenides Chemical class 0.000 description 3
- 125000004122 cyclic group Chemical group 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- ZDVNRCXYPSVYNN-UHFFFAOYSA-K di(tetradecanoyloxy)indiganyl tetradecanoate Chemical compound [In+3].CCCCCCCCCCCCCC([O-])=O.CCCCCCCCCCCCCC([O-])=O.CCCCCCCCCCCCCC([O-])=O ZDVNRCXYPSVYNN-UHFFFAOYSA-K 0.000 description 3
- 230000005281 excited state Effects 0.000 description 3
- 229910052749 magnesium Inorganic materials 0.000 description 3
- 239000011777 magnesium Substances 0.000 description 3
- 150000002902 organometallic compounds Chemical class 0.000 description 3
- 125000002524 organometallic group Chemical group 0.000 description 3
- 239000011574 phosphorus Substances 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- 238000000425 proton nuclear magnetic resonance spectrum Methods 0.000 description 3
- 239000011541 reaction mixture Substances 0.000 description 3
- 238000010992 reflux Methods 0.000 description 3
- 229910052707 ruthenium Inorganic materials 0.000 description 3
- 239000011669 selenium Substances 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- YWWDBCBWQNCYNR-UHFFFAOYSA-O trimethylphosphanium Chemical compound C[PH+](C)C YWWDBCBWQNCYNR-UHFFFAOYSA-O 0.000 description 3
- 229930195735 unsaturated hydrocarbon Natural products 0.000 description 3
- YBJHBAHKTGYVGT-ZKWXMUAHSA-N (+)-Biotin Chemical compound N1C(=O)N[C@@H]2[C@H](CCCCC(=O)O)SC[C@@H]21 YBJHBAHKTGYVGT-ZKWXMUAHSA-N 0.000 description 2
- YBNMDCCMCLUHBL-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 4-pyren-1-ylbutanoate Chemical compound C=1C=C(C2=C34)C=CC3=CC=CC4=CC=C2C=1CCCC(=O)ON1C(=O)CCC1=O YBNMDCCMCLUHBL-UHFFFAOYSA-N 0.000 description 2
- OYHQOLUKZRVURQ-NTGFUMLPSA-N (9Z,12Z)-9,10,12,13-tetratritiooctadeca-9,12-dienoic acid Chemical compound C(CCCCCCC\C(=C(/C\C(=C(/CCCCC)\[3H])\[3H])\[3H])\[3H])(=O)O OYHQOLUKZRVURQ-NTGFUMLPSA-N 0.000 description 2
- AZQWKYJCGOJGHM-UHFFFAOYSA-N 1,4-benzoquinone Chemical compound O=C1C=CC(=O)C=C1 AZQWKYJCGOJGHM-UHFFFAOYSA-N 0.000 description 2
- BWLBGMIXKSTLSX-UHFFFAOYSA-N 2-hydroxyisobutyric acid Chemical compound CC(C)(O)C(O)=O BWLBGMIXKSTLSX-UHFFFAOYSA-N 0.000 description 2
- 229910017115 AlSb Inorganic materials 0.000 description 2
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 2
- ROSDSFDQCJNGOL-UHFFFAOYSA-N Dimethylamine Chemical compound CNC ROSDSFDQCJNGOL-UHFFFAOYSA-N 0.000 description 2
- YLQBMQCUIZJEEH-UHFFFAOYSA-N Furan Chemical compound C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 2
- 229910002601 GaN Inorganic materials 0.000 description 2
- 229910005540 GaP Inorganic materials 0.000 description 2
- 229910005542 GaSb Inorganic materials 0.000 description 2
- 229910005543 GaSe Inorganic materials 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 229910004262 HgTe Inorganic materials 0.000 description 2
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 2
- TWRXJAOTZQYOKJ-UHFFFAOYSA-L Magnesium chloride Chemical compound [Mg+2].[Cl-].[Cl-] TWRXJAOTZQYOKJ-UHFFFAOYSA-L 0.000 description 2
- 229910002665 PbTe Inorganic materials 0.000 description 2
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- 230000002776 aggregation Effects 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- VSCWAEJMTAWNJL-UHFFFAOYSA-K aluminium trichloride Chemical compound Cl[Al](Cl)Cl VSCWAEJMTAWNJL-UHFFFAOYSA-K 0.000 description 2
- 150000003863 ammonium salts Chemical class 0.000 description 2
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 2
- YZXBAPSDXZZRGB-DOFZRALJSA-N arachidonic acid Chemical compound CCCCC\C=C/C\C=C/C\C=C/C\C=C/CCCC(O)=O YZXBAPSDXZZRGB-DOFZRALJSA-N 0.000 description 2
- KPWJBEFBFLRCLH-UHFFFAOYSA-L cadmium bromide Chemical compound Br[Cd]Br KPWJBEFBFLRCLH-UHFFFAOYSA-L 0.000 description 2
- YKYOUMDCQGMQQO-UHFFFAOYSA-L cadmium dichloride Chemical compound Cl[Cd]Cl YKYOUMDCQGMQQO-UHFFFAOYSA-L 0.000 description 2
- OKIIEJOIXGHUKX-UHFFFAOYSA-L cadmium iodide Chemical compound [Cd+2].[I-].[I-] OKIIEJOIXGHUKX-UHFFFAOYSA-L 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000002800 charge carrier Substances 0.000 description 2
- KWTSZCJMWHGPOS-UHFFFAOYSA-M chloro(trimethyl)stannane Chemical compound C[Sn](C)(C)Cl KWTSZCJMWHGPOS-UHFFFAOYSA-M 0.000 description 2
- 239000011258 core-shell material Substances 0.000 description 2
- PPQREHKVAOVYBT-UHFFFAOYSA-H dialuminum;tricarbonate Chemical compound [Al+3].[Al+3].[O-]C([O-])=O.[O-]C([O-])=O.[O-]C([O-])=O PPQREHKVAOVYBT-UHFFFAOYSA-H 0.000 description 2
- 238000004821 distillation Methods 0.000 description 2
- HFJRKMMYBMWEAD-UHFFFAOYSA-N dodecanal Chemical group CCCCCCCCCCCC=O HFJRKMMYBMWEAD-UHFFFAOYSA-N 0.000 description 2
- POULHZVOKOAJMA-UHFFFAOYSA-N dodecanoic acid Chemical compound CCCCCCCCCCCC(O)=O POULHZVOKOAJMA-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- GVEPBJHOBDJJJI-UHFFFAOYSA-N fluoranthrene Natural products C1=CC(C2=CC=CC=C22)=C3C2=CC=CC3=C1 GVEPBJHOBDJJJI-UHFFFAOYSA-N 0.000 description 2
- IPCSVZSSVZVIGE-UHFFFAOYSA-N hexadecanoic acid Chemical compound CCCCCCCCCCCCCCCC(O)=O IPCSVZSSVZVIGE-UHFFFAOYSA-N 0.000 description 2
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical class [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 description 2
- VKOBVWXKNCXXDE-UHFFFAOYSA-N icosanoic acid Chemical compound CCCCCCCCCCCCCCCCCCCC(O)=O VKOBVWXKNCXXDE-UHFFFAOYSA-N 0.000 description 2
- 229910052738 indium Inorganic materials 0.000 description 2
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 2
- 238000004020 luminiscence type Methods 0.000 description 2
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 2
- 229910052753 mercury Inorganic materials 0.000 description 2
- 239000002105 nanoparticle Substances 0.000 description 2
- 125000006574 non-aromatic ring group Chemical group 0.000 description 2
- CCCMONHAUSKTEQ-UHFFFAOYSA-N octadec-1-ene Chemical compound CCCCCCCCCCCCCCCCC=C CCCMONHAUSKTEQ-UHFFFAOYSA-N 0.000 description 2
- 239000003921 oil Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- SECPZKHBENQXJG-FPLPWBNLSA-N palmitoleic acid Chemical compound CCCCCC\C=C/CCCCCCCC(O)=O SECPZKHBENQXJG-FPLPWBNLSA-N 0.000 description 2
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 239000002244 precipitate Substances 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000000746 purification Methods 0.000 description 2
- 150000003254 radicals Chemical class 0.000 description 2
- 229920005604 random copolymer Polymers 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- 229930195734 saturated hydrocarbon Natural products 0.000 description 2
- 229910052711 selenium Inorganic materials 0.000 description 2
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- OCGWQDWYSQAFTO-UHFFFAOYSA-N tellanylidenelead Chemical compound [Pb]=[Te] OCGWQDWYSQAFTO-UHFFFAOYSA-N 0.000 description 2
- 150000003573 thiols Chemical class 0.000 description 2
- QMGCGMCWRCSEPP-UHFFFAOYSA-N trimethylphosphane;hydrochloride Chemical compound [Cl-].C[PH+](C)C QMGCGMCWRCSEPP-UHFFFAOYSA-N 0.000 description 2
- GOTIICCWNAPLMN-UHFFFAOYSA-M trimethylsulfanium;bromide Chemical compound [Br-].C[S+](C)C GOTIICCWNAPLMN-UHFFFAOYSA-M 0.000 description 2
- OWUGVJBQKGQQKJ-UHFFFAOYSA-M trimethylsulfanium;chloride Chemical compound [Cl-].C[S+](C)C OWUGVJBQKGQQKJ-UHFFFAOYSA-M 0.000 description 2
- 238000005292 vacuum distillation Methods 0.000 description 2
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- VNDYJBBGRKZCSX-UHFFFAOYSA-L zinc bromide Chemical compound Br[Zn]Br VNDYJBBGRKZCSX-UHFFFAOYSA-L 0.000 description 2
- JIAARYAFYJHUJI-UHFFFAOYSA-L zinc dichloride Chemical compound [Cl-].[Cl-].[Zn+2] JIAARYAFYJHUJI-UHFFFAOYSA-L 0.000 description 2
- UAYWVJHJZHQCIE-UHFFFAOYSA-L zinc iodide Chemical compound I[Zn]I UAYWVJHJZHQCIE-UHFFFAOYSA-L 0.000 description 2
- 125000004209 (C1-C8) alkyl group Chemical group 0.000 description 1
- WRIDQFICGBMAFQ-UHFFFAOYSA-N (E)-8-Octadecenoic acid Natural products CCCCCCCCCC=CCCCCCCC(O)=O WRIDQFICGBMAFQ-UHFFFAOYSA-N 0.000 description 1
- ZVYYAYJIGYODSD-LNTINUHCSA-K (z)-4-bis[[(z)-4-oxopent-2-en-2-yl]oxy]gallanyloxypent-3-en-2-one Chemical compound [Ga+3].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O ZVYYAYJIGYODSD-LNTINUHCSA-K 0.000 description 1
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Description
本發明係在國防部高等研究計畫署所授予的補助金編號HR0011-10-C-0081下由政府資助所製造。美國政府具有本發明的某些權利。
本發明係關於高發光性半導體奈米晶體及製造與使用其等之方法。
半導體奈米晶體係一強大的奈米結構類,該者相較於典型的分子螢光體展現高的光激發光量子產率、大的莫耳消光係數、高的耐光性,並展現可調式(size-tunable)發射波長其可以延伸橫跨可見光與近紅外光譜範圍。這些性質使得半導體奈米晶體在包括生物螢光標記與發光裝置還有其他應用中變得有用的。
具有小尺寸的奈米晶體可以具有介於分子與大塊形式物質(bulk forms of matter)之間的中間性質。舉例而言,具有足夠小尺寸的半導體材料奈米晶體可以在所有三維展現激子(激發態的電子-電洞對)的量子侷限。量子侷限導致隨著晶粒粒徑的下降在該材料有效能帶間隙中的提高。因此,當該奈米晶體的大小下降時,該等奈米晶體之光學吸收與發射兩者皆偏移至藍色(意即,更高的能量)。
源自具有一第一半導體材料核心之該奈米晶體的發射量子效率可以藉由施加一第二半導體材料之外套層(overcoating)提昇的,藉由此,該第二半導體材料之傳導能帶(conduction band)較諸該第一半導體材料者具有較高的能量,且該第二半導體材料之價能帶(valence band)較諸該第一半導體材料者具有較低的能量。所以,激子之電荷載子兩者,意即電子與電洞,係侷限於該奈米晶體之核心中。
半導體奈米晶體具有取決於粒徑之光學與電子性質。特別的,一特定半導體材料之半導體奈米晶體的能帶間隙能量隨著該晶體的直徑變化。一般而言,一半導體奈米晶體係為具有粒徑分佈之一奈米晶體群之一份子。當該分佈係集中於一單一值且係為狹窄時,該族群可以描述為單一分散。單一分散顆粒可以界定為具有至少60%的顆粒落在一具體指定的顆粒粒徑範圍之內。單一分散顆粒在其直徑中之偏差可以小於10% rms,且較佳地小於5% rms。
半導體奈米晶體的許多應用取決於其等的光激發光性質。因此,半導體奈米晶體其具有狹窄的發射線寬(舉例而言,以半高寬(full width at half max)表示)與高量子產率者係為所欲的。
含有磷族化物(第V組元素)之半導體奈米晶體的合成係為最具挑戰性。不過,含磷族化物的奈米晶體對發射可見光波長的無鎘奈米晶體及對在紅外光中發射的奈米
晶體而言係為具濃厚興趣的一區域。發射紅外光的奈米晶體在諸如太陽能電池及光偵測計等裝置中可以為有用的。對III-V族奈米晶體(例如,砷化銦奈米晶體)而言,一長期存在的挑戰係為大顆粒的合成,特別是具有狹窄粒徑分佈者。
在一觀點中,一種製成一半導體奈米晶體之方法,該方法包括將一含M化合物與一X供體接觸,其中該X供體具有化學式(I):X(Y(R)3)3 (I)其中X係為第V族元素;Y係為Ge、Sn或Pb;且R每一者獨立地為烷基、烯基、炔基、環烷基、環烯基、雜環基、芳基或雜芳基,其中R每一者獨立地,可選由1至6個取代基取代,該等取代基獨立地選自氫、鹵素、羥基、硝基、氰基、胺基、烷基、環烷基、環烯基、烷氧基、醯基、硫基、硫烷基、烯基、炔基、環烯基、雜環基、芳基或雜芳基。
在一些實施例中,X可以為N、P、As或Sb。Y可以為Ge。R每一者獨立地可以為烷基或環烷基。R每一者獨立地可以為未取代烷基或未取代環烷基。該含M化合物可以為一含M鹽類。M可以為第三族元素。M可以為In。
化學式(I)之化合物可以為三(三甲基鍺)氮化物[tris(trimethylgermyl)nitride];三(三甲基錫)氮化物;三(三甲基鉛)氮化物;三(三甲基鍺)磷化物[tris(trimethylgermyl)phosphide];三(三甲基錫)磷化物;三(三甲基鉛)磷化物;三(三甲基鍺)胂[tris(trimethylgermyl)arsine];三(三甲基錫)
胂;三(三甲基鉛)胂;三(三甲基鍺)銻化氫[tris(trimethylgermyl)stibine];三(三甲基錫)銻化氫;或三(三甲基鉛)銻化氫。
在另一觀點中,一種製成一半導體奈米晶體之方法,該方法包括將一含M鹽類與一X供體接觸,其中該X供體具有化學式(I):X(Y(R)3)3 (I)其中X係為P、As或Sb;Y係為Ge、Sn或Pb;R每一者獨立地為未取代烷基或未取代環烷基;且M係為第III族元素。
在一些實施例中,X可以為As或Sb。Y可以為Ge。M可以為In。化學式(I)之化合物可以為三(三甲基鍺)胂;三(三甲基錫)胂;三(三甲基鉛)胂;三(三甲基鍺)銻化氫;三(三甲基錫)銻化氫;或三(三甲基鉛)銻化氫。
在一些實施例中,X係為P或As;Y係為Ge;M係為In;且R每一者獨立地為未取代的烷基。
其它觀點、實施例及特徵從下列說明、該等圖式及該等訴求項將為顯而易見的。
圖1顯示了胂奈米晶體前驅物的1H NMR光譜。
圖2顯示了銻化氫奈米晶體前驅物的1H NMR光譜。
圖3A-3C顯示了以三(三甲基矽)胂(圖3A);三(三甲基鍺)胂(圖3B);或三(三甲基錫)胂(圖3C)製備的InAs奈米
晶體吸收光譜。
圖4顯示了1H NMR光譜的時間序列。
圖5係為一圖形其例示該三種不同的三(三甲基)-IV族化合物與肉荳蔻酸銦(III)的反應動力學。
半導體奈米晶體在其發光性性質中證實了量子侷限效應。當半導體奈米晶體以一初級能量源(primary energy source)發光時,一次級能量發射發生在一頻率,該頻率係相關於在該奈米晶體中使用之半導體材料的能帶間隙。在一量子侷限顆粒中,該頻率亦相關於該奈米晶體的粒徑。
核心-外殼(Core-shell)異質結構做為調整半導體奈米晶體之光物理性質之一手段已被廣泛地探討,可以使用做為螢光體以在兩種方式中提高其亮度:(1)最大化該光激發光(PL)量子產率(QY),該者係透過電子與化學隔離該核心與該表面關聯的重組中心(recombination centers);及(2)提高該激發速率(吸收橫截面),該者係藉由建立一高密度電子態其在該外殼之能帶間隙能量之上。就外殼材料方面而論,這兩個角色對該外殼而言存在一潛在的權衡。一寬的能帶間隙外殼對載子接近該表面施加一大的電子屏障,但將較不能夠幫助吸收,而一較窄間隙之外殼可以參與光收割(light harvesting),但可能使得實現高QY變得更難的。
一般的,製造一奈米晶體的方法係為一種膠體生
長製程(colloidal growth process)。舉例而言,參閱美國專利第6,322,901與6,576,291號,及參閱於2010年8月24日提申之美國專利申請案第12/862,195號,該等者每一者係以其整體併入於此以做為參考。當一含M化合物與一X供體迅速注入一熱配位溶劑時,膠體生長可以引致的。該配位溶劑可以包括胺類。該含M化合物可以為一金屬、一含M鹽類或一含M有機金屬化合物。該注入產生一晶核,該者在控制方式下可以生長以形成一奈米晶體。該反應混合物可以和緩地加熱以使該奈米晶體生長並退火。樣本中該奈米晶體之平均粒徑與粒徑分佈兩者皆取決於生長溫度。隨著平均晶體粒徑的提高,維持穩定成長所必需的生長溫度跟著提高。該奈米晶體係為一奈米晶體群(population of nanocrystals)之一份子。由於離散式成核作用(discrete nucleation)與經控制的生長,該所獲得之奈米晶體群具有一狹窄、單一分散(monodisperse)分佈的直徑。直徑的單一散度分佈亦可以意指粒徑的單一分散分佈。繼之成核作用,在該配位溶劑中該奈米晶體經控制的生長與退火製程亦可引致一均勻的表面衍生與規則的核心結構。當該粒徑分佈尖銳化時,該溫度可以被昇高以維持穩定生長。藉由添加更多的含M化合物或X供體,該生長週期可以被縮短。
該含M鹽類可以為一非-有機金屬化合物,例如,無金屬-碳鍵之一化合物。M可以為鎘、鋅、鎂、汞、鋁、鎵、銦、鉈或鉛。該含M鹽類可以為一金屬鹵化物、金屬羧酸鹽、金屬碳酸鹽、金屬氫氧化物、金屬氧化物或
金屬二酮,諸如金屬乙醯丙酮。該含M鹽類較諸有機金屬化合物,諸如一金屬烷基,係為較不昂貴且使用更安全的。舉例而言,該含M鹽類在空氣中係穩定的,而金屬烷基在空氣中一般係不穩定的。含M鹽類,諸如2,4-戊二酮(意即,乙醯丙酮(acac))、鹵化物、羧酸鹽、氫氧化物、氧化物或碳酸鹽在空氣中係穩定的,且較諸相應的金屬烷基,允許奈米晶體在較不嚴格的條件下製造。在一些事例中,該含M鹽類可以為一長鏈的羧酸鹽,例如,C8或更高(諸如C8至C20、或C12至C18),直鏈或分支的,飽和或不飽和羧酸鹽。此種鹽類包括,舉例而言,月桂酸、肉荳蔻酸、棕櫚酸、硬脂酸、花生酸、棕櫚油酸、油酸、亞油酸、亞麻油酸(linoleic acid)、蘇子油酸(linolenic acid)或花生四烯酸的含M鹽類。
適合的含M鹽類包括乙醯丙酮鎘、碘化鎘、溴化鎘、氯化鎘、氫氧化鎘、碳酸鎘、乙酸鎘、肉荳蔻酸鎘、氧化鎘、乙醯丙酮鋅、碘化鋅、溴化鋅、氯化鋅、氫氧化鋅、碳酸鋅、乙酸鋅、肉荳蔻酸鋅、氧化鋅、乙醯丙酮鎂、碘化鎂、溴化鎂、氯化鎂、氫氧化鎂、碳酸鎂、乙酸鎂、肉荳蔻酸鎂、氧化鎂、乙醯丙酮汞、碘化汞、溴化汞、氯化汞、氫氧化汞、碳酸汞、乙酸汞、肉荳蔻酸汞、乙醯丙酮鋁、碘化鋁、溴化鋁、氯化鋁、氫氧化鋁、碳酸鋁、乙酸鋁、肉荳蔻酸鋁、乙醯丙酮鎵、碘化鎵、溴化鎵、氯化鎵、氫氧化鎵、碳酸鎵、乙酸鎵、肉荳蔻酸鎵、乙醯丙酮銦、碘化銦、溴化銦、氯化銦、氫氧化銦、碳酸銦、乙酸銦、肉荳蔻酸銦、乙醯丙酮鉈、碘化鉈、溴化鉈、氯化鉈、
氫氧化鉈、碳酸鉈、乙酸鉈或肉荳蔻酸鉈。
先於將該含M鹽類與X供體結合之前,該含M鹽類可以與一配位溶劑接觸,以形成一含M前驅物。典型的配位溶劑包括烷基膦、烷基氧化膦、烷基膦酸或烷基次膦酸;然而,其他配位溶劑,諸如吡啶、呋喃及胺類亦可能適合用於奈米晶體生產。適合的配位溶劑之例子包括吡啶、三正辛基膦(TOP)及三正辛基氧化膦(TOPO)。工業級TOPO可以使用的。該配位溶劑可以包括1,2-二醇或一醛類。該1,2-二醇或醛類可以促進該含M鹽類與該X供體之間的反應,並改良在此製程中獲得的該奈米晶體的生長製程與品質。該1,2-二醇或醛類可以為一C6-C20之1,2-二醇或一C6-C20醛類。一適合的1,2-二醇係為1,2-十六烷二醇或十四碳醯基(myristol),而一適合的醛類係為十二醛或肉荳蔻醛。
該X供體係為一種化合物,該者能夠與含M鹽類反應,以形成具該一般化學式MX之一材料。典型地,該X供體係為一硫族化物(chalcogenide)供體或磷族化物(pnictide)供體,諸如硫族化膦(phosphine chalcogenide)、雙(矽基)硫族化物、氧氣、銨鹽或三(矽基)磷族化物。適合的供體包括氧氣、元素硫、硒化雙(三甲基矽)((TMS)2Se)、硒化三烷基膦諸如硒化(三正辛基膦)(TOPSe)或硒化(三正丁基膦)(TBPSe)、碲化三烷基膦諸如碲化(三正辛基膦)(TOPTe)或碲化六丙基三胺化磷(hexapropylphosphorustriamide telluride)(HPPTTe)、碲化雙(三甲基矽)((TMS)2Te)、硫、硫化雙(三甲基矽)((TMS)2S)、
硫化三烷基膦諸如硫化(三正辛基膦)(TOPS)、胂化三(二甲基胺)、銨鹽諸如鹵化銨(例如,NH4Cl)、磷化三(三甲基矽)((TMS)3P)、砷化三(三甲基矽)((TMS)3As)或銻化三(三甲基矽)((TMS)3Sb)。在某些實施例中,該M供體與該X供體可以為在同一分子內的主體。
該X供體可以為化學式(I)之一化合物:X(Y(R)3)3 (I)其中X係為第V族元素,Y係為第IV族元素,且R每一者獨立地為烷基、烯基、炔基、環烷基、環烯基、雜環基、芳基或雜芳基,其中R每一者獨立地,可選由1至6個取代基取代,該等取代基獨立地選自氫、鹵素、羥基、硝基、氰基、胺基、烷基、環烷基、環烯基、烷氧基、醯基、硫基、硫烷基、烯基、炔基、環烯基、雜環基、芳基、或雜芳基。
在一些實施例中,X可以為N、P、As或Sb。Y可以為C、Si、Ge、Sn或Pb。R每一者獨立地可以為烷基或環烷基。在一些事例中,R每一者獨立地可以為未取代烷基或未取代環烷基,舉例而言,一C1至C8未取代烷基或一C3至C8未取代環烷基。在一些實施例中,X可以為P、As或Sb。在一些實施例中,Y可以為Ge、Sn或Pb。
在一些實施例,X可以為P、As或Sb,Y可以為Ge、Sn或Pb,且R每一者獨立地可以為未取代烷基或未取代環烷基,舉例而言,一C1至C8未取代烷基或一C3至C8未取代環烷基。R每一者獨立地可以為未取代烷基,舉例而言,一C1至C6未取代烷基。
烷基係為1至30個碳原子之分支或未分支的飽和烴基,諸如甲基、乙基、正丙基、異丙基、正丁基、異丁基、叔丁基、辛基、癸基、十四烷基、十六烷基、二十烷基,二十四基及之類。可選地,一烷基可以由1至6個取代基取代,該等取代基獨立地選自氫、鹵素、羥基、硝基、氰基、胺基、烷基、環烷基、環烯基、烷氧基、醯基、硫基、硫烷基、烯基、炔基、環烯基、雜環基、芳基、或雜芳基。可選地,一烷基可以含有1至6個選自-O-、-S-、-M-及-NR-之鏈結,其中R係為氫或C1-C8烷基或低級烯基。環烷基係為3至10個碳原子之一環狀飽和烴基,諸如環丙基、環丁基、環戊基、環己基、環庚基、環辛基及之類。一環烷基可以可選地被取代,或如一烷基般含有鏈結。
烯基係為2至20個碳原子之一分支或未分支的不飽和烴基其含有至少一個雙鍵者,諸如乙烯基、丙烯基、丁烯基及之類。環烯基係為3至10個碳原子之一環狀不飽和烴基其包括至少一個雙鍵者。一烯基或環烯基可以可選地被取代,或如一烷基般含有鏈結。
炔基係為2至20個碳原子之一分支或未分支的不飽和烴基其含有至少一個三鍵者,諸如乙炔基、丙炔基、丁炔基及之類。一炔基可以可選地被取代,或如一烷基般含有鏈結。
雜環基係為一3-至10-元飽和或不飽和的環狀基團其包括至少一個選自O、N或S的環雜原子。一雜環基可以可選地被取代,或如一烷基般含有鏈結。
芳基係為一6-至14-元碳環芳族基,該者可能具有一或多個可能為融和或未融合的環。在一些事例中,芳基可以包括融合至一非芳族環的一芳族環者。示範性芳基團包括苯基、萘基或蒽基。雜芳基係為6-至14-元芳族基,該者可能具有一或多個可能融合或未融合的環。在一些事例中,一雜芳基可以包括融合至一非芳族環的一芳族環。一芳基或雜芳基可以可選地被取代,或如一烷基般含有鏈結。
化學式(I)之X供體的例子包括:三(三甲基鍺)氮化物,N(Ge(CH3)3)3;三(三甲基錫)氮化物,N(Sn(CH3)3)3;三(三甲基鉛)氮化物,N(Pb(CH3)3)3;三(三甲基鍺)磷化物,P(Ge(CH3)3)3;三(三甲基錫)磷化物,P(Sn(CH3)3)3;三(三甲基鉛)磷化物,P(Pb(CH3)3)3;三(三甲基鍺)胂,As(Ge(CH3)3)3;三(三甲基錫)胂,As(Sn(CH3)3)3;三(三甲基鉛)胂,As(Pb(CH3)3)3;三(三甲基鍺)銻化氫,Sb(Ge(CH3)3)3;三(三甲基錫)銻化氫,Sb(Sn(CH3)3)3;及三(三甲基鉛)銻化氫,Sb(Pb(CH3)3)3。
對於給定的X與R值,各式各樣的Y可以產生具有各式各樣反應性的X供體,例如,在該半導體奈米晶體形成中不同的反應動力學。因此,在奈米晶體形成中,在一其他方面類似的反應中,三(三甲基矽)胂的反應性可以不同於三(三甲基錫)胂或三(三甲基鉛)胂的反應性。同樣地,對於給定的X與Y值,在R中的變化可以產生反應性的變化。在奈米晶體形成中,反應性(特別是反應動力學)可以影響該所
得到的奈米晶體群的粒徑與粒徑分佈。因此,選擇具有適當反應性的前驅物可以協助形成具有所欲性質的奈米晶體群,諸如一特別所欲的粒徑及/或一狹窄的粒徑分佈。
從一含M鹽類製造的奈米晶體可以在一經控制方式中生長,當該配位溶劑包括一胺類時。在該配位溶劑中之該胺類可以有助於從該含M鹽類與X供體獲得之該奈米晶體的品質。較佳地,該配位溶劑係為該胺類與一烷基氧化膦的混合物。該組合的溶劑可以減少粒徑分散,並且可以改良該奈米晶體的光激發光量子產率。該較佳胺類係為一初級烷基胺或一初級烯基胺,諸如C2-C20烷基胺、C2-C20烯基胺,較佳地,C8-C18烷基胺或C8-C18烯基胺。舉例而言,用於與三辛基氧化膦(TOPO)組合的適合胺類包括1-十六烷基胺或油胺(oleylamine)。當該1,2-二醇或醛類及該胺類係與該含M鹽類組合使用以形成一奈米晶體群時,該光激發光量子效率及奈米晶體之粒徑分佈係改良的,相較於在無1,2-二醇或醛類或胺類中生產的奈米晶體。
該奈米晶體可以為具有一狹窄粒徑分佈的奈米晶體群之一份子。該奈米晶體可以為球狀、柱狀、圓盤狀或其他形狀。該奈米晶體可以包括一半導體材料核心。該奈米晶體可以包括具有化學式MX之一核心,其中M係為鎘、鋅、鎂、汞、鋁、鎵、銦、鉈、或其等之混合物,且X係為氧、硫、硒、碲、氮、磷、砷、銻,或其等之混合物。
源自該奈米晶體之該發射可以為一狹窄的高斯發射能帶,該者可以藉由變化該奈米晶體粒之粒徑、該奈
米晶體之組成物或兩者,而貫穿該光譜之紫外光、可見光或紅外光之整個波長範圍微調的。舉例而言,CdSe與CdS兩者可以在可見光區中微調,而InAs可以在紅外光區中微調。
奈米晶體群可以具有一狹窄的粒徑分佈。該族群可以為單一分散,且在奈米晶體直徑中可以展現小於15%的均方根偏差(rms deviation),較佳地小於10%,更佳地小於5%。介於10與100 nm之間半高寬(full width at half max;FWHM)之一狹窄範圍中的光譜發射可以觀察到的。半導體奈米晶體可以具有大於2%、5%、10%、20%、40%、60%、70%、80%或90%的發射量子效率(意即量子產率,QY)。半導體奈米晶體可以具有至少90%、至少91%、至少92%、至少93%、至少94%、至少95%、至少96%、至少97%、至少97%、至少98%或至少99%之一QY。
形成該奈米晶體核心之半導體可以包括II-VI族化合物、II-V族化合物、III-VI族化合物、III-V族化合物、IV-VI族化合物、I-III-VI族化合物、II-IV-VI族化合物及II-IV-V族化合物。舉例而言,ZnS、ZnSe、ZnTe、CdS、CdSe、CdTe、HgS、HgSe、HgTe、AlN、AlP、AlAs、AlSb、GaN、GaP、GaAs、GaSb、GaSe、InN、InP、InAs、InSb、TlN、TlP、TlAs、TlSb、PbS、PbSe、PbTe或其等之混合物。
源自具有一第一半導體材料核心之該奈米晶體的發射量子效率可以藉由施加一第二半導體材料之外套層提昇的,藉由此,該第二半導體材料之傳導能帶較諸該第
一半導體材料者具有較高的能量,且該第二半導體材料之價能帶較諸該第一半導體材料者具有較低的能量。所以,當在一激發態時,電荷載子,意即電子與電洞,係侷限於該奈米晶體之核心中。或者,該外套層材料之傳導能帶或價能帶可以具有一能量其居於該核心材料之傳導能帶與價能帶能量之中者。在此事例中,當在一激發態中時,一載子可以侷限於該核心,而另一者係侷限於該外套層材料。舉例而言,參閱美國專利第7,390,568號,該者係以其整體併入以做為參考。該核心可以在該核心表面上具有一外套層。該核心與外套層之能帶間隙可以具有一所欲的能帶補償(band offset)。在CdTe/CdSe(核心/外殼)奈米晶體中,該外殼之傳導能帶係居於該核心之價能帶與傳導能帶的能量之間。CdTe/CdSe(核心/外殼)奈米晶體對在該核心中的電洞與在該殼中的電子具有較低的電位。所以,該等電洞可以大多數侷限於該CdTe核心,而該等電子可以大多數侷限於該CdSe外殼。CdSe/ZnTe(核心/外殼)奈米晶體具有外殼價能帶其居於該核心之價能帶與傳導能帶能量之間者。所以,該等電子大多數駐留在該CdSe核心中,而該等電洞大多數駐留在該ZnTe外殼中。該外套層可以為一半導體材料其具有不同於該核心組成物之一組成物者,且可以具有一能帶間隙其大於該核心之能帶間隙者。該奈米晶體表面上之一半導體材料外套層可以包括一II-VI族化合物、II-V族化合物、III-VI族化合物、III-V族化合物、IV-VI族化合物、I-III-VI族化合物、II-IV-VI族化合物及II-IV-V族化合物,舉例而
言,ZnS、ZnSe、ZnTe、CdS、CdSe、CdTe、HgS、HgSe、HgTe、AlN、AlP、AlAs、AlSb、GaN、GaP、GaAs、GaSb、GaSe、InN、InP、InAs、InSb、TlN、TlP、TlAs、TlSb、PbS、PbSe、PbTe或其等之混合物。
外殼係藉由引入外殼前驅物材料而在奈米晶體上形成,該者係於一溫度其中材料添加至現存奈米晶體之表面,但新顆粒之成核作用將被拒絕。為了幫助抑制該奈米晶體的成核作用與非均向性修飾(anisotropic elaboration),選擇性離子層附著與反應(SILAR)生長技術可以施用的。參閱,例如,美國專利第7,767,260號,該者係以其整體併入以做為參考。在該SILAR方法中,金屬與硫族化物前驅物係分開加入地,在一交替方式中,以計算可以飽和該奈米晶體表面上可用的結合位點的一劑量,從而伴隨每一劑量增加一半單層。這種方法的目的為:(1)在每半個週期中飽和表面的結合位點,以強迫均向性的外殼生長;及(2)避免兩種前驅物在溶液中的同時存在,以為了最小化該外殼材料新的奈米粒子的均質成核作用速率。
在該SILAR方法中,選擇在每一步驟反應乾淨並完成的試劑可以為有利的。換言之,該所選擇的試劑應產生很少的反應副產物或不產生反應副產物,且基本上所有添加的試劑應反應以添加外殼材料至該奈米晶體。藉由添加幾近化學計量數量的該試劑,反應的完成可以為偏愛的。換言之,當小於1當量之試劑係添加時,任何剩餘未反應的起始材料的可能性係下降的。
此外,該所產製之核心-外殼奈米晶體的品質(例如,就粒徑的單分散性與QY而言)可以藉由使用一恆定且較低的外殼生長溫度而提高的,較諸在過去典型使用的溫度而言。或者,高溫亦可能使用的。於此描述之該技術係順應於一寬的溫度範圍,不像早期只有在非常高溫下作用的SILAR方法。此外,先於外殼生長之前,一“保持”低溫或室溫的步驟可以在核心材料合成或純化期間使用的。
該奈米晶體之外表面可以包括一層化合物其衍自於在該生長製程期間所使用的該配位劑。該表面可以藉由反覆地曝露於過量的競爭配位基團以形成一被覆層而改質。舉例而言,該封端(capped)奈米晶體之分散可以以一配位有機化合物處理,諸如吡啶,以生成在吡啶、甲醇及芳香族中係容易分散,但不再分散於脂族溶劑的晶體者。此一表面交換製程可以用任何能夠與該奈米晶體外表面配位或鍵結的化合物實行,包括,舉例而言,膦類、硫醇、胺類及磷酸鹽。該奈米晶體可以曝露至短鏈聚合物,該短鏈聚合物對該表面展現親和性且端接一主體其對懸浮或分散介質具有親和性者。此種親和力改良了該懸浮液的安定性,並阻礙了該奈米晶體的結團。
單牙(Monodentate)烷基膦類(及膦氧化物;下文該術語膦將意指兩者)可以有效地鈍化奈米晶體。當具傳統單牙配位體的奈米晶體係於一非鈍化的環境(意即,沒有多餘的配位體存在)中稀釋或嵌入時,它們往往會失去其等的高發光。典型地係為係為一突然的發光衰減、聚集、及/或
相分離。為了克服這些限制,多牙配位體可以使用的,諸如多牙寡聚膦配位體一族。該等多牙配位體在該配位體與奈米晶體表面之間顯示一高親和力。換言之,他們係為強配位體,如從它們多牙特徵之螯合效應預期的。
一般地,針對奈米晶體之配位體可以包括一第一單體單元,該第一單體單元包括對該奈米晶體表面具有親和性之一第一主體;一第二單體單元,該第二單體單元包括具有高水溶性之一第二主體;及一第三單體單元,該第三單體單元包括具有一選擇性反應官能基或選擇性鍵結官能基團之一第三主體。在此上下文中,一“單體單元”係為衍自一單分子單體的聚合物之一部分。舉例而言,聚(乙烯)的單體單元係為-CH2CH2-,而聚(丙烯)的單體單元係為-CH2CH(CH3)-。一“單體”意指該化合物本身,先於聚合之前,例如,乙烯係為聚(乙烯)且丙烯係為聚(丙烯)的單體。
一選擇性反應官能基團係為可以在一選定條件下,與一選定的試劑形成一共價鍵者。選擇性反應官能基團之一例子係為初級胺,該者可以反應的,舉例而言,在水中與一琥珀醯亞胺酯以形成醯胺鍵。一選擇性鍵結官能基團係為可以與一選擇性鍵結對應體形成一非共價鍵複合物的官能基團者。一些眾所周知選擇性鍵結的官能基團及其等對應體的例子包括生物素(biotin)與卵白素(streptavidin);核酸與序列互補的核酸;FK506與FKBP;或一抗體及其相應的抗原。
具有高水溶性之一主體典型地包括一或多個離
子化、可離子化、或氫鍵合基團,諸如,舉例而言,胺、醇、羧酸、醯胺、烷基醚、硫醇、或其他在該技藝中所知悉的基團。不具有高水溶性之主體包括,舉例而言,烴基基團諸如烷基基團或芳基基團、鹵代烷基基團、及之類。高水溶性可以藉由使用稍微可溶基團的多個實例而實現:舉例而言,二乙醚係非高水溶性的,但具有多個實例-CH2-O-CH2-烷基醚基團的聚(乙二醇)可以為高度水溶性的。
舉例而言,該配位體可以包括聚合物其包括一隨機共聚物者。該隨機共聚物可以使用任何聚合方法製成的,包括陽離子、陰離子、自由基、置換(metathesis)或縮合聚合,舉例而言,活性陽離子聚合、活性陰離子聚合、開環置換聚合、基團轉移聚合、自由基活性聚合、活性齊格勒-納塔(Ziegler-Natta)聚合、或可逆的加成-斷裂鏈轉移(RAFT)聚合。
歸因於該等反應物中許多的高度反應性與毒性天性,從該反應混合物排除氧與水應該且係需格外小心的;所有的程序係於一史蘭克管(Schlenk line)上執行的。
三(三甲基矽)胂之製備係描述於,舉例而言,R.L.Wells等人之“Inorganic Syntheses,31:150-158,1997”,該者係以其整體併入以做為參考。三(三甲基鍺)銻化氫與三(三甲基錫)銻化氫之製備係描述於,舉例而言,M.Atesa等人之“Phosphorus,Sulfur,and Silicon and the Related Elements,102:287-289,1995”,該者係以其整體併入以做為參考。
三(三甲基鍺)胂與三(三甲基錫)胂可以在類似於三(三甲基矽)胂之一方式中合成的(參閱,例如,E.Amberger及G Salazar之“Journal of Organometallic Chemistry,8:111-114,1967”,該者係以其整體併入以做為參考),但合成大量的三(三甲基矽)胂且然後執行隨後的三甲基-IV族交換係為較不昂貴、更快且更安全的。
三(三甲基矽)胂之合成係根據下列方案執行:
(NaK)3As+3Si(CH3)3Cl → As(Si(CH3)3)3+(NaK)Cl
繼之三(三甲基矽)胂之分離與純化,三(三甲基鍺)胂之合成係藉由三甲基-IV族之交換:As(Si(CH3)3)3+3Ge(CH3)3Cl → As(Ge(CH3)3)3+3Si(CH3)3Cl且一類似地三(三甲基錫)胂合成:As(Si(CH3)3)3+3Sn(CH3)3Cl → As(Sn(CH3)3)3+3Si(CH3)3Cl
砷化銦奈米晶體之合成係遵照報導的程序,參閱Peter M.Allen等人之“J.Am.Chem.Soc.,132(2):470-471,2010”,該者係以其整體併入以做為參考。該砷化物來源係為三(三甲基矽)胂、三(三甲基鍺)胂、或三(三甲基錫)胂。
合成三(三甲基矽)胂。使用從R.L.Wells等人之“Inorganic Syntheses,31:150-158,1997”改編之一程序,該者係以其整體併入以做為參考,220 mL的1,2-二甲氧基乙烷(在鈉-二苯甲酮上蒸餾)、10 g的鈉-鉀合金及7 g的砷係於
一500 mL三頸燒瓶中、在一氮氣手套箱中混合。在劇烈氬氣驅淨下,一機械攪拌器與冷凝器係附加至該三頸燒瓶。該溶液然後係加熱以回流且劇烈攪拌達24小時。在這段時間內,該溶液變成黑色。
該溶液係冷卻至室溫,且在一劇烈氬氣流下,一加料漏斗係附加至該三頸燒瓶。然後,38 g的三甲基矽氯(在CaH2上蒸餾)係經由套管加入到該加料漏斗,並隨後逐滴加入到該溶液中。在該添加完成後,該溶液係加熱以回流另外16小時。在此期間,該溶液從黑色轉變為灰色,伴隨清晰可見的沈澱。
在室溫下靜置達8小時後,該冷凝器與攪拌棒係移除並以塞子及具一500 mL史蘭克接受燒瓶之一史蘭克過濾器替換。該裝置係反轉的且真空係定期施用至該接受燒瓶以迫使液體通經由該過濾器。
該接受燒瓶係從該過濾器移除的,且該DME係藉由真空於室溫下移除的。此留下20 mL的黃色/棕色油狀液體。該者然後係藉由真空下蒸餾而純化;產生作為一透明液體的12 g之三(三甲基矽)胂(46%產率)。參閱圖1。
三(三甲基鍺)胂與三(三甲基錫)胂之合成。為了合成三(三甲基鍺)胂與三(三甲基錫)砷,下列程序係從M.Atesa等人之“Phosphorus,Sulfur,and Silicon and the Related Elements,102:287-289,1995”及H.Schumann等人之“J.Organometallic Chem.222(2):217-225,1981”中改編的,該等者每一者係以其整體併入以做為參考。
為了製備三(三甲基鍺)胂,2.36 g的三(三甲基矽)胂(8 mmol)係與5.7 g的三甲基鍺溴(29 mmol)混合。該溶液係於氬氣下、在室溫中攪拌達3小時。然後該溶液係於150℃溫度油浴中加熱,以蒸餾掉該三甲基鍺溴並驅動反應的完成。在這一點上,該反應混合物係為一油狀的棕色液體,伴隨黑色固體沈澱在燒瓶的一側上。該產物係藉由在真空下蒸餾而純化。1H NMR顯示參照於甲苯在0.47 ppm之一單峰。參閱圖1。
為了製備三(三甲基錫)胂,2.95 g的三(三甲基矽)胂與6.98 g的三甲基錫氯係在氬氣下於一圓底燒瓶中混合。該溶液係攪拌達3小時,且然後在真空蒸餾該產物之前抽氣以移除三甲基錫氯。1H NMR顯示參照於甲苯在0.34 ppm之一三峰(歸因於與Sn耦合)。參閱圖1。
合成三(三甲基矽)銻化氫。此合成係改編自Becker等人之“In WA Herrmann and HH Karsch,eds.,Synthetic Methods of Organometallic and Inorganic Chemistry,Thieme”,該者係以其整體併入以做為參考。該者之進行係一致於上文所描述之該三(三甲基矽)胂合成,伴隨下列修正:
1.該所涉及的數量係為19g的NaK、22 g的銻粉、67 g的三甲基矽氯及800 mL的DME。
2.該NaK係緩慢地加入(以最大化小液滴的形成,從而最大化表面積)。
3.該NaK與銻係允許回流達4天。
4.在藉由真空移除大部分的DME後,該產物不立刻蒸餾,以最小化熱分解的風險。取而代之的,當需要時,少量係於一希克曼蒸餾器(Hickmann still)中蒸餾的。
1H NMR顯示0.392 ppm的單峰。參閱圖2。
合成三(三甲基鍺)銻化氫。此合成係改編自M.Atesa等人之“Phosphorus,Sulfur, and Silicon and the Related Elements,102:287-289,1995”,該者係以其整體併入以做為參考。5 g的三甲基鍺氯與3.7 g不純的三(三甲基矽)銻化氫(65%wt在DME中)係在氬氣下於一圓底燒瓶中混合。該溶液係攪拌達20分鐘,且然後在一油浴中加熱(浴溫係逐漸提高至135℃),以在真空蒸餾該產物前移除三甲基鍺氯。1H NMR顯示0.550 ppm的單峰。參閱圖2。
合成InAs奈米晶體。在一典型合成中,在正三辛基膦(TOP)中之一三(三甲基矽)砷、三(三甲基鍺)胂或三(三甲基錫)胂溶液係很快地注射至肉荳蔻酸銦(III)(indium(III)myristate)在150℃ 1-十八碳烯中之一溶液。該溫度隨後為了奈米晶體的生長係升高至250℃。
從不同前驅物製備的該等奈米晶體具有明顯不同的光譜(圖3A-3C)。一個更接近單一分散的樣品較諸一更多分散的樣品具有較好界定的吸收特徵,歸因於非均勻擴大程度的下降。相應地,吸收峰的界定可以使用做為一奈米晶體群粒徑分佈的指標。光譜審視顯示的是,從三(三甲基鍺)胂合成的奈米晶體較諸從三(三甲基矽)胂合成者係較小且具有一狹窄的粒徑分佈兩者。其係明顯的是,使用不
同前驅物的生長動力學係不同的,基於該吸收峰特徵的位置及此特徵的界定。參閱(圖3A-3C),該等圖顯示從三個使用相同條件伴隨不同砷前驅物之反應的吸收光譜。圖3A,三(三甲基矽)胂;圖3B,三(三甲基鍺)胂;圖3C,三(三甲基錫)胂。插圖(c)顯示InAs奈米晶體的吸收光譜,該者係從三(三甲基錫)胂合成3小時後藉由過濾以移除不溶的沈澱物。
該快速、高溫反應使得直接研究反應動力學變得困難。然而,該生長動力學可以使用變溫NMR在一系列溫度中監測。在此方式中,關聯於該化學反應的熱動力學性質(例如,△H與△S)可以確定的。藉由以時間的函數追踪該峰值強度(或積分面積)(參閱圖4),該反應可以在NMR管中監測的,且該反應速率係定量測定。
三(三甲基鍺)胂及三(三甲基矽)胂與肉荳蔻酸銦(III)(InMy3)的反應結果係顯示於圖5中。這些數據顯示的是,於室溫下,與三(三甲基矽)胂之反應係快非常多的。假若該反應在奈米晶體合成中所使用的溫度下對該矽烷基前驅物較諸該對該鍺前驅物亦較快的,然後在圖3中顯示之該兩個樣品的粒徑反駁特定於硒化鎘奈米晶體合成關於前驅物轉化速率在粒徑上影響的一般理論預測與觀察。參閱,例如Jane Y Rempelet等人之“J.Am.Chem.Soc.,131(12):4479-89,2009”;Flurin Hänseler.之“PhD thesis,MIT & ETH Zurich,2011”;及Jonathan S.Owen等人之“J.Am.Chem.Soc.,132(51):18206-13,2010”;該等者每一者係以其整體
併入以做為參考。
其他實施例係於下列訴求項之發明範圍內。
Claims (13)
- 一種製成一半導體奈米晶體之方法,該方法包含:將一含金屬化合物與一X供體接觸,其中該X供體具有化學式(I):X(Y(R)3)3 (I)其中X係為第V族元素,其中X不為P;Y係為Ge、Sn或Pb;且R每一者獨立地為烷基、烯基、炔基、環烷基、環烯基、雜環基、芳基或雜芳基,其中R每一者獨立地,可選地由1至6個取代基取代,該等取代基獨立地選自氫、鹵素、羥基、硝基、氰基、胺基、烷基、環烷基、環烯基、烷氧基、醯基、硫基、硫烷基、烯基、炔基、環烯基、雜環基、芳基、或雜芳基。
- 如申請專利範圍第1項之方法,其中X係為N、As或Sb。
- 如申請專利範圍第2項之方法,其中Y係為Ge。
- 如申請專利範圍第2項之方法,其中R每一者係獨立地為烷基或環烷基。
- 如申請專利範圍第4項之方法,其中R每一者係獨立地為未取代烷基或未取代環烷基。
- 如申請專利範圍第1項之方法,其中該含金屬化合物係為一含金屬鹽類。
- 如申請專利範圍第1項之方法,其中該金屬係為一第III族元素。
- 如申請專利範圍第7項之方法,其中該金屬係為In。
- 如申請專利範圍第1項之方法,其中化學式(I)之化合物係為三(三甲基鍺)氮化物;三(三甲基錫)氮化物;三(三甲基鉛)氮化物;三(三甲基鍺)胂;三(三甲基錫)胂;三(三甲基鉛)胂;三(三甲基鍺)銻化氫;三(三甲基錫)銻化氫;或三(三甲基鉛)銻化氫。
- 一種製成一半導體奈米晶體之方法,該方法包含:將一含金屬鹽類與一X供體接觸,其中該X供體具有化學式(I):X(Y(R)3)3 (I)其中X係為As或Sb;Y係為Ge、Sn或Pb;R每一者獨立地係為未取代烷基或未取代環烷基;且該金屬係為第III族元素。
- 如申請專利範圍第10項之方法,其中Y係為Ge。
- 如申請專利範圍第10項之方法,其中該金屬係為In。
- 如申請專利範圍第10項之方法,其中化學式(I)之化合物係為三(三甲基鍺)胂;三(三甲基錫)胂;三(三甲基鉛)胂;三(三甲基鍺)銻化氫;三(三甲基錫)銻化氫;或三(三甲基鉛)銻化氫。
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