TWI578059B - A mother substrate including detecting wires on array and a method for detecting the same - Google Patents

Description

Mother substrate for detecting array winding and detection method thereof

The invention relates to a mother substrate and a method for detecting a Wire On Array (WOA) in a liquid crystal panel thereon, in particular to extract an array winding group in a liquid crystal panel to a test line group arranged around the periphery (shorting) Bar) The mother substrate and its method of detecting the array winding group using an observational detection system.

In the increasingly mature environment of liquid crystal display (LCD) technology, LCD panel manufacturers all over the world are undoubtedly guaranteeing the development of more updated display technologies in order to enhance their competitiveness in this field. The most basic panel yield.

In the process of the liquid crystal panel, a plurality of liquid crystal panels (Unit Cells) are generally formed on a large glass substrate, also referred to as a mother substrate, and the liquid crystal panels are arranged in an array. Then, it is divided by a later cutting process to obtain a plurality of independent liquid crystal panels. The number of liquid crystal panels obtained from a mother substrate is usually related to the size of the mother substrate. As the production algebra of modern liquid crystal panels increases, the size of the mother substrate has become larger and larger, and the number of liquid crystal panels that are made at one time is higher. The more you come. Therefore, the cost of the liquid crystal panel is relatively lowered, so that the liquid crystal display technology is more involved in people's daily lives. In addition, the application of the liquid crystal panel is also diversified, and the current liquid crystal display and mobile phone display screen Application is already a household name.

Please refer to FIG. 1 , which is a plan view of a conventional mother substrate. A liquid crystal panel array 11 and a test area 12 are disposed on the mother substrate 10. A plurality of liquid crystal panels 110 are disposed in the liquid crystal panel array 11, and the liquid crystal panels 110 are distributed in m rows and n columns, so the number is m×n. A plurality of test pad sets 120 are disposed in the test zone 12, and each test pad set 120 further includes a test pad 120a, a test pad 120b, a test pad 120c, a test pad 120d, and a test pad 120e. A plurality of test line groups 13 are inserted between the liquid crystal panel array 11 and the test area 12 and the plurality of liquid crystal panels in the liquid crystal panel array 11 and are electrically connected to the test pad group 120, respectively. Please refer to Figure 1a for details.

In Fig. 2, Fig. 2 is an enlarged view of the liquid crystal panel in Fig. 1. A display area 111, a gate driving area 121, a source driving area 131, and an array winding group 141 are disposed in the liquid crystal panel 110. At the periphery of the liquid crystal panel 110, the test line group 130 includes a test line 130a, a test line 130b, a test line 130c, a test line 130d, and a test line 130e. In order to make the whole mother substrate 10 externally connected to the test pad group 130, the test line 130a is electrically connected to the test pad 120a, the test line 130b is electrically connected to the test pad 120b, and the test line 130c is electrically connected to the test pad. 120c, the test line 130c is electrically connected to the test pad 120d, and the test line 130e is electrically connected to the test pad 120e.

In a common liquid crystal panel, there are mainly three types of work areas, namely, a peripheral line area, a drive circuit area, and a display area. The peripheral line area includes a plurality of positions, such as a trace between the drive circuit area and the display area, a trace between the plurality of drive circuits, and a Flexible Printed Circuit (FPC). There is an inevitable connection between the working areas: first, the FPC is connected to the external port, and the external signal voltage is transmitted to the driving circuit, and then the driving circuit performs the display of the desired image through the routing control display area between the driving circuit and the display area. Therefore, these three types of work areas are in liquid crystal In the normal operation of the panel, mutual dependence and indispensability are necessary for strict line detection.

In the entire process of a liquid crystal panel, the detection of the display area is more mature than the peripheral line according to the current detection means. The FPC in the peripheral line is attached to the corresponding drive circuit area in the module stage, so before the cutting process, more is to test the line directly on the substrate. Therefore, in the conventional detection of the line in this aspect, it is more in the Module Process that the relevant chip is placed in the corresponding driving area before the detection is performed. Such detection has unpredictable consequences. If the peripheral line is detected at this time, the driver chip on the previous placement will be scrapped, resulting in waste of cost. If you want to perform corresponding laser repair on the surrounding lines of the problem later, it will also increase the manufacturing cost. Therefore, if the peripheral lines can be tested in the early stage of panel production, better results will be achieved.

The invention designs a mother substrate, which effectively utilizes the test line set, additionally increases the lead line group to lead the array winding group in the liquid crystal panel to the test line set disposed at the periphery thereof, and then passes through an observation detection system such as Phototronics, Accurate reliability testing of array winding groups to avoid laser repair later, reducing unnecessary cost waste and increasing production yield.

The invention provides a mother substrate for detecting array windings in a liquid crystal panel, comprising a liquid crystal panel array, a test area and a lead line set. The liquid crystal panel array is further composed of a liquid crystal panel including a display area, a gate driving area, a source driving area and an array of winding groups. The test area is disposed at a periphery of the liquid crystal panel array, and further includes a test line set and a test pad set electrically connected to each other, and the test line set runs through The area between the test area and the liquid crystal panel array or the area between the liquid crystal panels of the liquid crystal panel array. The test line set includes a plurality of test lines, and the test pad set includes a plurality of test pads. The lead wire group is disposed between the array winding group and the test wire group of the liquid crystal panel, one end is electrically connected to the array winding group, and the other end is electrically connected to the test wire group. The leader group includes a plurality of leader lines.

In an embodiment of the invention, the test line set in the liquid crystal panel array is electrically connected to the test pad set in the test area.

In an embodiment of the invention, the array windings are each electrically connected to one end of the lead line, wherein the array windings are connected to different lead lines and are not repeated.

In an embodiment of the present invention, the other ends of the lead wires are electrically connected to the test lines in the test line group, wherein the lead lines are connected to the plurality of test lines and are not repeated.

In an embodiment of the present invention, the other ends of the lead wires are electrically connected to the test lines in the test line group, wherein the lead lines are connected to the plurality of test lines by sequentially connecting.

In an embodiment of the invention, the other ends of the lead wires are electrically connected to the test lines in the test line group, wherein the lead lines are connected to the same test line.

In one embodiment of the present invention, the other ends of the lead wires are electrically connected to the test lines in the test line group, wherein the lead lines are connected to the plurality of test lines and partially repeated.

In an embodiment of the invention, in the liquid crystal panel array, one set of test line sets is electrically connected to a set of test pads.

In an embodiment of the invention, in the liquid crystal panel array, a plurality of sets of test line sets are electrically connected to the same set of test pads.

The invention further provides a method for detecting an array winding group in a liquid crystal panel of a mother substrate, comprising first providing the mother substrate and a detecting system; secondly, testing the probe frame of the detecting system on the mother substrate Pad group, and open the display; then selectively turn on the voltage on the test pad group; in turn, turn on the voltage on the regulator; then, turn on the light source of the detector of the detection system, scan the liquid crystal panel with the regulator, and finally pass the detection The system's display analyzes and determines the condition of the array winding group in the LCD panel.

According to the above, the inspector can directly observe the condition of the array winding group in the liquid crystal panel of the mother substrate through the detecting system, and can further detect the short circuit state or the open state of the array winding. A more important advantage is that with this detection method, the inspector can pinpoint the exact location of the array winding.

The above described features and advantages of the invention will be apparent from the following description.

10, 20‧‧‧ mother substrate

11, 21‧‧‧ LCD panel array

110, 210‧‧‧ LCD panel

111, 211‧‧‧ display area

12, 22‧‧‧ test area

120, 220‧‧‧ test pad set

120a, 120b, 120c, 120d, 120e‧‧‧ test pads

220a, 220b, 220c, 220d, 220e‧‧‧ test pads

121, 221‧‧ ‧ gate drive area

131, 231‧‧‧ source drive area

141, 250‧‧‧Array winding group

130, 230‧‧‧ test line set

130a, 130b, 130c, 130d, 130e‧‧‧ test lines

230a, 230b, 230c, 230d, 230e‧‧‧ test leads

240, 340, 440‧‧‧ lead line group

240a, 240b, 240c, 240d, 240e‧‧‧ lead wires

340a, 340b, 340c, 340d, 340e‧‧‧ lead lines

440a, 440b, 440c, 440d, 440e‧‧‧ lead lines

250‧‧‧Array Winding Group

250a, 250b, 250c, 250d, 250e‧‧‧ test line sets

30‧‧‧Detection system

31‧‧‧Detection frame

32‧‧‧Regulator

321‧‧‧reflective layer

322‧‧‧Liquid layer

33‧‧‧ detector

1 is a plan view of a mother substrate of the prior art; FIG. 2 is an enlarged view of the liquid crystal panel; FIG. 3 is a plan view of the mother substrate of the present invention; and FIG. 4 is a first embodiment of the lead wire connection structure of the present invention. Figure 5 is a schematic view showing a second embodiment of the lead wire connecting structure of the present invention; Figure 6 is a schematic view showing a third embodiment of the lead wire connecting structure of the present invention; and Figure 7 is a view showing the use of the present invention. a side view of the detection system for detecting; FIG. 8 is a schematic flow chart of the detection method of the present invention; Figure 9 is a schematic view showing a first embodiment of the detecting method of the present invention; and Figure 10 is a view showing a second embodiment of the detecting method of the present invention.

The content of the specification does not limit the scope of the invention. First, m and n in the liquid crystal panel array having the m×n structure can take any value, because in actual production, m and n can be mutually converted under certain value conditions; then, it is mentioned in the specification. The term "sequential" is not limited to the electrical connection made by the same letter number in this embodiment, but may also refer to the electrical connection made in a certain regular order; secondly, it is referred to in this specification. The number of test pads included in the test pad set, the number of test leads included in the test line group, the number of array windings included in the array winding group, and the number of lead wires included in the lead wire group are not limited to the number shown in the drawings, which is based on Actual production depends on the needs.

First embodiment

First, please refer to FIG. 3 and refer to FIG. 4 at the same time. FIG. 3 is a schematic plan view of the mother substrate of the present invention, and FIG. 4 is a schematic view of the first embodiment of the connection structure of the lead wire and the test wire of the present invention, and is visible at the same time. An enlarged view of a single liquid crystal panel on the mother substrate. In FIG. 3, a liquid crystal panel array 21 and a test area 22 are disposed on the mother substrate 20. The liquid crystal panel array 21 is provided with a plurality of liquid crystal panels 210, and the liquid crystal panels 210 are arranged in m rows and n rows in the liquid crystal panel array 21, so the number is m×n. A plurality of test pad sets 220 are disposed in the test area 22, and each test pad set 220 further includes a test pad 220a, a test pad 220b, a test pad 220c, a test pad 220d, and a test pad 220e. The plurality of test line sets 230 extend through an area between the liquid crystal panel 210 and the test area 22, or an area between the plurality of liquid crystal panels 210 in the liquid crystal panel array 21, and are electrically connected to the test pad set 220. Please refer to Figure 4 for details.

In FIG. 4, there is a test line set 230 outside the liquid crystal panel 210. The test line set 230 includes a test line 230a, a test line 230b, a test line 230c, a test line 230d, and a test line 230e, and at the same time, the mother board 20 is tested. The test group 230 is electrically connected to the test pad set 220. Specifically, the test wire 230a is electrically connected to the test pad 220a, and the test wire 230b is electrically connected to the test pad 220b and the test line 230c. Electrically connected to the test pad 220c, the test line 230d is electrically connected to the test pad 220d, and the test line 230e is electrically connected to the test pad 220e. Inside the liquid crystal panel 210, there are a display region 211, a gate driving region 221, a source driving region 231, and an array winding group as a peripheral line. The array winding group 250, as illustrated in FIG. 4, is electrically connected to the gate driving region 221 and the source driving region 231. In order to detect the array winding group 250 shown in FIG. 4, the present invention is provided with a lead wire group 240 on the mother substrate 20, one end of which is electrically connected to the array winding group 250, and the other end is electrically connected to the test wire group 230. . The lead line group 240 includes a lead line 240a, a lead line 240b, a lead line 240c, a lead line 240d, and a lead line 240e. In FIG. 4, a connection structure of the lead wires is illustrated. One end of the lead wire group 240 electrically connected to the test wire group 230 has the following connection structure: the array wire 250a is electrically led out through the lead wire 240a to The test lead 230a; the array winding 250b is electrically led out to the test line 230b through the lead line 240b; the array winding 250c is electrically led out to the test line 230c through the lead line 240c; the array winding 250d is electrically led out to the test line through the lead line 240d. 230d; the array winding 250e is electrically led out to the test line 230e through the lead line 240e. Of course, it is within the scope of the present invention for the same concept of the present embodiment, that is, the lead wires are electrically connected to the test leads in a one-to-one relationship.

Next, the present invention needs to detect the array winding group in the liquid crystal panel by means of a detection system Phototronics. Please refer to FIG. 7, which is a side view of the present invention for detecting with a required detection system. In Fig. 7, the detection system 30 has a function element from bottom to top. The device includes a probe frame 31, a modulator 32, a detector 33, and a display (not shown). In addition, the regulator 32 further includes a reflective layer 321 and a liquid crystal layer 322; the detector 33 further includes a light source (not shown) and a receiving unit (not shown); and a display (not shown) signal Connected to the detector 330. By borrowing the mother substrate shown in FIG. 3, the working mechanism of the detecting system 30 will be briefly described herein: by selectively turning on the voltage of the test pad group 220 on the mother substrate 20 (as shown in FIG. 7 by the test pad 220a, test) The test pad set 220) composed of the pad 220b, the test pad 220c, the test pad 220d and the test pad 220e, supplies voltage to the detected liquid crystal panel 210, and drives the regulator by using a voltage difference between the measured liquid crystal panel 210 and the regulator 32. The liquid crystal layer 321 in 32 is deflected, and then the light emitted from the light source of the detector 33 is reflected by the reflective layer 322 on the regulator 32, and the reflected light passes through the deflected liquid crystal layer 322, and is then detected by the detector 33. The receiving unit accepts and finally displays the image through the display. The detection system 30 has the advantage of performing line detection, that is, only the voltage is supplied on the line, and the line is formed without corresponding lines, so that the image of the corresponding line can be correspondingly presented by the detection system 30, so the inspector can Intuitively, find the location of the abnormal circuit more accurately.

Referring again to FIG. 8, FIG. 8 is a schematic flow chart of the detection method of the present invention. First, the S41 is performed, and the probe frame 31 is electrically pressed against the test pad group 220 around the periphery of the mother substrate 20 to open the display; then, S42 is performed according to the detection requirement, and the test pad group 220 is selectively opened by the probe frame 31, At this time, the external voltage passes through the test pad set 220, the test line set 230 and the lead line set 240, and is finally sent to the array winding group 214 in the liquid crystal panel 210; then, step S43 is performed to turn on the voltage on the regulator 32. At this time, there is a voltage difference between the liquid crystal panel 210 and the regulator 32 to be measured, and the liquid crystal layer 321 in the regulator 32 is deflected by the voltage difference; finally, by step S44 The detector light source on the detector 33 is turned on to scan the regulator 32, and the line image of the array winding in the liquid crystal panel 210 is displayed on the display. At this time, the inspector can directly observe the image and do Analyze S45. Through the above steps, the detection of one liquid crystal panel is completed, and then the next liquid crystal panel 210 to be tested is tested by step S46 until the final detection is completed.

Second embodiment

Referring again to FIG. 3, this embodiment differs in the connection structure between the lead wire and the test wire. Please refer to FIG.

Fig. 5 is a schematic view showing a second embodiment of the connection structure of the lead wire and the test wire of the present invention. In FIG. 5, there is a test line group 230 outside the liquid crystal panel 210. The test line group 230 includes a test line 230a, a test line 230b, a test line 230c, a test line 230d, and a test line 230e. At the same time, in order to achieve external voltage connection of the mother substrate 20 through the test pad group 220, the test wire group 230 is electrically connected to the test wire group 220. Specifically, the test wire 230a is electrically connected to the test pad 220a and the test wire 230b. Connected to the test pad 220b, the test line 230c is electrically connected to the test pad 220c, the test line 230d is electrically connected to the test pad 220d, and the test line 230e is electrically connected to the test pad 220e. Within the liquid crystal panel 210 are an array winding group 250, a gate driving region 221 and a source driving region 231, and an array winding group as a peripheral line. The array winding group 250, as illustrated in FIG. 5, is electrically connected to the gate driving region 221 and the source driving region 231. In order to detect the array winding group 250 shown in FIG. 5, the present invention is provided with a lead wire group 340 on the mother substrate 20, one end of which is electrically connected to the array winding group 250, and the other end is electrically connected to the test wire group 230. . The lead line group 340 includes a lead line 340a, a lead line 340b, a lead line 340c, a lead line 340d, and a lead line 340e. In FIG. 5, another connection structure of the lead wire and the test wire and the lead wire electrically connected to the test wire group 230 are illustrated. One end of the group 340 has the following connection structure: the array winding 250a is electrically led out to the test line 230c through the lead line 340a; the array winding 250b is electrically led out to the test line 230d through the lead line 340b; the array winding 250c passes through the lead line 340c Electrically drawn to the test line 230e; the array winding 250d is electrically led to the test line 230e through the lead line 340d; the array winding 250e is electrically connected to the test line 230e through the lead line 340e. Of course, for the same concept of the embodiment, that is, a part of the lead wires are electrically connected to the test line in a many-to-one relationship, and some of the lead wires are electrically connected to the test line in a one-to-one relationship. It is within the scope of the invention.

Then, when the liquid crystal panel 210 having the structure shown in FIG. 5 is detected, the detection system 30 shown in FIG. 7 is used, and the detection is performed in the procedure shown in FIG. 8. The description is the same as that of the first embodiment, so that reference is made to The first embodiment is implemented and will not be described again.

Third embodiment

Referring again to FIG. 3, this embodiment differs in the connection structure between the lead wire and the test wire. Please refer to FIG.

Fig. 6 is a schematic view showing a third embodiment of the connection structure of the lead wire and the test wire of the present invention. In FIG. 6, there is a test line group 230 outside the liquid crystal panel 210, and the test line group 230 includes a test line 230a, a test line 230b, a test line 230c, a test line 230d, and a test line 230e. At the same time, in order to make the whole mother substrate 20 externally pass the test pad group 214, the test line 230a is electrically connected to the test pad 220a, the test line 230b is electrically connected to the test pad 220b, and the test line 230c is electrically connected to the test pad 220c. The test line 230d is electrically connected to the test pad 220d, and the test line 230e is electrically connected to the test pad 220e. Inside the liquid crystal panel 210, there are an array winding group 250, a gate driving region 221, a source driving region 231, and an array winding group as a peripheral line. The array winding group 250 as shown in FIG. 6 is electrically connected to the gate driving region 221 and the source driving region 231. . In order to detect the array winding group 250 shown in FIG. 6, the present invention is provided with a lead wire group 440 on the mother substrate 20, one end of which is electrically connected to the array winding group 250, and the other end is electrically connected to the test wire group 230. . The lead line group 440 includes a lead line 440a, a lead line 440b, a lead line 440c, a lead line 440d, and a lead line 440e. In FIG. 2c, another connection structure of the lead wire and the test wire is illustrated. One end of the lead wire group 440 electrically connected to the test wire group 230 has the following connection structure: the array wire 250a is electrically connected through the lead wire 440a. The array is wound out to the test line 230e; the array winding 250b is electrically led out to the test line 230e through the lead line 440b; the array winding 250c is electrically led out to the test line 230e through the lead line 440c; and the array winding 250d is electrically led out through the lead line 440d. To the test line 230e; the array winding 250e is electrically led out to the test line 230e through the lead line 440e. Of course, it is within the scope of the present invention for the same concept of the present embodiment, that is, the lead wires are electrically connected to the test leads in a many-to-one relationship.

Then, when detecting the liquid crystal panel 210 of the structure shown in Fig. 6, the detection system 30 shown in Fig. 7 is used, and the detection is performed in the procedure shown in Fig. 8. The description is the same as that of the first embodiment, so that reference is made. The first embodiment is implemented and will not be described again.

In the present invention, a high-efficiency detection method is further provided, and several methods for performing high-efficiency detection are further demonstrated.

As shown in Fig. 3, the mother substrate 20 on which the liquid crystal panel 210 is arranged is arranged in m rows and n rows, wherein m and n are positive integers. In order to achieve higher detection efficiency, we perform sub-column detection on the mother substrate 20. For details, refer to FIG. 9, which is a schematic diagram of the first embodiment of the detection method of the present invention. In FIG. 9, each test line group 230 on the mother substrate 20 is electrically connected to a test pad group 220, and one column of the liquid crystal panel 210 corresponding to one of the test line groups 230 is connected to the test leads by the three types of lead wires and test leads. One of the connection structures is electrically connected. So, we can selectively open by controlling the detection frame 31. The voltage on one of the test pad sets 220 achieves the purpose of performing one inspection of the liquid crystal panel 210 once on the mother substrate 20. Of course, for the above detection method, we can also selectively turn on the voltages on the plurality of test pad sets 220 to detect the multi-column liquid crystal panel 210.

Further, as shown in FIG. 3, the test substrate group 230 and the test pad group 220 have another connection structure. Referring to FIG. 10, FIG. 10 is a schematic view showing a second embodiment of the detection method of the present invention. In the initial stage of the mother substrate design, we can electrically connect a test pad set 220 to two test line sets 230 at the same time, and place the liquid crystal panel 210 corresponding to the respective test line set 230 according to the above three lead lines and test lines. One of the connection structures is electrically connected, so that half of the test pad set 220 can be used to detect all of the liquid crystal panels 210 in the entire liquid crystal panel array 21. Of course, for similar considerations, a test pad set 220 can be electrically connected to three or more sets of test line sets 23 at the same time according to actual detection requirements, so that less test pad sets 220 can be opened. The voltage reaches the purpose of detecting more columns of the liquid crystal panel 210, and also plays a role in energy saving.

Finally, it is worth mentioning that the set of lead wires designed on the mother substrate of the present invention will be cut off during the cutting process after the completion of the detecting step, and will not be used for other purposes, and will not be used for subsequent processes and products. Have an impact.

The preferred embodiments of the present invention have been disclosed as above, and are not intended to limit the present invention. Any one skilled in the art can make some modifications and retouchings without departing from the spirit and scope of the present invention. The scope is subject to the definition of the scope of the claims.

211‧‧‧ display area

220‧‧‧Test pad set

220a, 220b, 220c, 220d, 220e‧‧‧ test pads

221‧‧ ‧ gate drive area

231‧‧‧Source Drive Area

230‧‧‧Test line set

230a, 230b, 230c, 230d, 230e‧‧‧ test leads

240‧‧‧ lead line group

240a, 240b, 240c, 240d, 240e‧‧‧ lead wires

250‧‧‧Array Winding Group

250a, 250b, 250c, 250d, 250e‧‧‧ array winding

Claims (8)

A mother substrate for detecting an array of windings in a liquid crystal panel, the mother substrate comprising: a liquid crystal panel array comprising a plurality of liquid crystal panels, the liquid crystal panel comprising: a display area, a gate driving area, and a a source driving region and an array of winding groups, wherein the display region includes adjacent first and second sides, the gate driving region is disposed on a side of the first side of the display region, and the source driver is disposed at The second side of the display area is located on the side, and the array winding group is composed of a plurality of array windings, the array winding group is disposed between the gate driving region and the source driving region, and one end of the array wire winding Connecting the gate driving region, the other end is connected to the source driving region; a test region is disposed at the periphery of the liquid crystal panel array, the testing region includes: a test line group and a test pad group, wherein the test line group And the test pad group is electrically connected to each other, and the test wire group is penetrated between the test area and the area between the liquid crystal panel array or the liquid crystal panel of the liquid crystal panel array, and the test line group is composed of a plurality of test lines. Composition, the test The pad set is composed of a plurality of test pads; and a lead wire group is disposed between the array winding group of the liquid crystal panel and the test line group, and one end of the lead wire group is directly connected to the array winding group. The other end is electrically connected to the test line set, wherein the lead line set is composed of a plurality of lead lines, and the other ends of the lead lines are electrically connected to the test lines in the test line set, wherein the lead lines Connect to multiple test leads and do not repeat. The mother substrate for detecting the array winding group in the liquid crystal panel, wherein the array windings are electrically connected to one ends of the lead wires, wherein the array wires are connected to different lead wires. And do not repeat. The mother substrate for detecting the array winding group in the liquid crystal panel, as described in claim 1, wherein: The other end of the outgoing line is electrically connected to the test lines in the order of sequential connection. The mother substrate for detecting the array winding group in the liquid crystal panel according to claim 1, wherein: in the liquid crystal panel array, each group of test line groups respectively corresponding to each row of liquid crystal panels is electrically connected to a test pad group . The mother substrate for detecting the array winding group in the liquid crystal panel according to claim 1, wherein: in the liquid crystal panel array, the plurality of sets of test line groups corresponding to the respective rows of liquid crystal panels are electrically connected to the same test pad group. A method for detecting an array of windings in a liquid crystal panel of a mother substrate, wherein the other ends of the plurality of lead wires of the mother substrate are electrically connected to test lines in the test line group, wherein the lead lines are connected to the plurality of test lines And not repeating, comprising the steps of: providing a mother substrate and a detecting system; electrically applying the probe frame of the detecting system to the test pad set on the mother substrate, and opening the display; selectively through the detecting frame Turning on the voltage on the test pad group; turning on the voltage on the regulator; turning on the light source of the detector of the detection system, and scanning the liquid crystal panel with the regulator, the regulator comprising a reflective layer and a liquid crystal layer, the detector further Included as a receiving unit, when the circuit of the mother substrate is normal, a voltage difference between the regulator and the mother substrate drives the liquid crystal layer in the regulator to be deflected, and the light emitted by the light source is reflected by the reflective layer. The reflected light passes through the deflected liquid crystal layer and is received by the receiving unit of the detector, and then is displayed by the display of the detection system; the detection system is Shown, a status determination and analysis of the liquid crystal panel array of coils. The method for detecting an array winding group in a liquid crystal panel of a mother substrate according to claim 6, wherein: the test line group of the liquid crystal panel of the same column in the mother substrate is electrically connected to the same group of test pads to the same group of test pads. The group can simultaneously test the array winding condition of the same column of liquid crystal panels. The method for detecting an array winding group in a liquid crystal panel of a mother substrate according to claim 6, wherein: the test line group of the plurality of liquid crystal panels in the mother substrate is electrically connected to the same group of test pads, and can be simultaneously tested. Array winding condition of a multi-column liquid crystal panel.