TWI571710B - Method and system for monitoring module actuation of alignment light source device in exposure apparatus - Google Patents

Method and system for monitoring module actuation of alignment light source device in exposure apparatus Download PDF

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TWI571710B
TWI571710B TW103146260A TW103146260A TWI571710B TW I571710 B TWI571710 B TW I571710B TW 103146260 A TW103146260 A TW 103146260A TW 103146260 A TW103146260 A TW 103146260A TW I571710 B TWI571710 B TW I571710B
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light
module
light source
source device
offset value
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TW103146260A
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TW201624154A (en
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楊詠智
李啟志
鄭毅
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力晶科技股份有限公司
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Priority to CN201510021681.4A priority patent/CN105843181B/en
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
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Description

曝光機台對準光源裝置內的模組作動監控方法及監控系統 Exposure machine aligns module operation monitoring method and monitoring system in light source device

本發明是有關於一種半導體製程機台模組作動的監控方法及監控系統,且特別是有關於一種曝光機台對準光源裝置內的模組作動監控方法及監控系統。 The invention relates to a monitoring method and a monitoring system for a semiconductor process machine module actuation, and in particular to a module operation monitoring method and a monitoring system in an exposure machine alignment light source device.

在微影製程時,晶圓上圖案的形成是需要依靠穩定且均勻的曝光,而曝光前精準的對準系統對圖案的形成有著絕對的影響。 In the lithography process, the formation of the pattern on the wafer is dependent on a stable and uniform exposure, and the precise alignment system before exposure has an absolute influence on the pattern formation.

由於曝光機台內的對準光源系統在長期使用後,傳動裝置會產生異常(如,齒輪的磨損或累積塵屑),而使得對準光源系統中的模組在工作時無法處於正確的位置,而直接影響對準光源的光量。如此一來,會降低對準操作的可靠度,進而導致產品良率的損失。因此,如何即時察覺曝光機台內的對準系統中模組的位置偏移是一個重要的課題。 Due to the long-term use of the alignment light source system in the exposure machine, the transmission will generate abnormalities (such as gear wear or accumulated dust), so that the modules in the alignment light source system cannot be in the correct position during operation. And directly affects the amount of light that is directed at the light source. As a result, the reliability of the alignment operation is reduced, resulting in loss of product yield. Therefore, how to immediately detect the positional deviation of the module in the alignment system in the exposure machine is an important issue.

本發明提供一種曝光機台對準光源裝置內的模組作動監控方法及監控系統,可即時監控對準光源裝置中的模組位置是否產生偏移。 The invention provides a module operation monitoring method and a monitoring system in an exposure machine alignment light source device, which can instantly monitor whether the position of the module in the alignment light source device is offset.

本發明提出一種曝光機台對準光源裝置內的模組作動監控方法,包括下列步驟。提供對準光源裝置。對準光源裝置包括至少一個模組。藉由非接觸式位置量測法量測模組的絕對偏移值。判斷此絕對偏移值是否超過容許範圍。當所量測的絕對偏移值超過容許範圍時,產生異常訊號。 The invention provides a module operation monitoring method in an exposure machine alignment light source device, which comprises the following steps. An alignment light source device is provided. The alignment light source device includes at least one module. The absolute offset value of the module is measured by a non-contact position measurement method. Determine if this absolute offset value exceeds the allowable range. An abnormal signal is generated when the measured absolute offset value exceeds the allowable range.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控方法中,非接觸式位置量測法包括光學式位置量測法或磁力式位置量測法。 According to an embodiment of the present invention, in the module operation monitoring method in the above-mentioned exposure machine alignment light source device, the non-contact position measurement method includes an optical position measurement method or a magnetic position measurement method. .

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控方法中,光學式位置量測法包括光遮斷式量測法。光遮斷式量測法包括下列步驟。利用光產生器發射光線,而光線預定通過模組的定位孔。藉由光接收器接收光線,且根據光線的光量變化來計算出絕對偏移值。 According to an embodiment of the invention, in the method for monitoring the module actuation in the exposure machine alignment light source device, the optical position measurement method comprises a light interruption type measurement method. The light interruption type measurement method includes the following steps. Light is emitted by the light generator, and the light is intended to pass through the positioning holes of the module. The light is received by the light receiver, and the absolute offset value is calculated according to the change in the amount of light of the light.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控方法中,光學式位置量測法包括光反射式量測法。光反射式量測法包括下列步驟。將光刻度構件連接至模組,且光刻度構件與模組連動。藉由光學編碼器發射光線至光 刻度構件,並藉由光學編碼器接收由光刻度構件所反射的帶有位置資訊的光線。藉由光學編碼器解讀光線中的位置資訊而計算出絕對偏移值。 According to an embodiment of the invention, in the method for monitoring the module actuation in the exposure machine alignment light source device, the optical position measurement method comprises a light reflection type measurement method. The light reflection measurement method includes the following steps. The light scale member is coupled to the module and the light scale member is coupled to the module. Optical light to light by optical encoder The scale member receives the light with position information reflected by the light scale member by the optical encoder. The absolute offset value is calculated by interpreting the position information in the light by the optical encoder.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控方法中,上述磁力式位置量測法包括下列步驟。將磁力構件連接至模組,且磁力構件與模組連動。藉由磁力編碼器感測磁力構件的運動而計算出絕對偏移值。 According to an embodiment of the present invention, in the module operation monitoring method in the exposure machine aligning light source device, the magnetic position measurement method includes the following steps. The magnetic member is coupled to the module and the magnetic member is coupled to the module. The absolute offset value is calculated by sensing the motion of the magnetic member by the magnetic encoder.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控方法中,更包括將異常訊號傳送到對準光源裝置,使對準光源裝置停止運作。 According to an embodiment of the present invention, in the module operation monitoring method in the exposure machine illuminating the light source device, the method further includes transmitting the abnormal signal to the alignment light source device to stop the operation of the alignment light source device.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控方法中,更包括將異常訊號傳送到警示裝置,使警示裝置發出警示訊號。 According to an embodiment of the present invention, in the method for monitoring the operation of the module in the light source device, the method further includes transmitting an abnormal signal to the warning device to cause the warning device to send a warning signal.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控方法中,警示裝置包括發光裝置、聲響裝置、電子顯示裝置或訊號源控制器。 According to an embodiment of the present invention, in the module operation monitoring method in the exposure machine alignment light source device, the warning device comprises a light emitting device, an acoustic device, an electronic display device or a signal source controller.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控方法中,模組包括至少一個中性密度濾光器(neutral density filter,NDF)模組。 According to an embodiment of the present invention, in the module operation monitoring method in the exposure machine alignment light source device, the module includes at least one neutral density filter (NDF) module.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控方法中,當上述絕對偏移值在容許範圍內時,使對準光源裝置繼續運作。 According to an embodiment of the present invention, in the module operation monitoring method in the exposure machine alignment light source device, when the absolute offset value is within an allowable range, the alignment light source device continues to operate.

本發明提出一種曝光機台對準光源裝置內的模組作動監控系統,可用以監控對準光源裝置內的至少一個模組,且包括非接觸式位置量測裝置以及監控裝置。非接觸式位置量測裝置用以量測模組的絕對偏移值。監控裝置耦接至非接觸式位置量測裝置,且判斷絕對偏移值是否超過容許範圍。當所量測的絕對偏移值超過容許範圍時,產生異常訊號。 The invention provides a module actuation monitoring system in an exposure machine alignment light source device, which can be used to monitor at least one module in the alignment light source device, and includes a non-contact position measuring device and a monitoring device. The non-contact position measuring device is used to measure the absolute offset value of the module. The monitoring device is coupled to the non-contact position measuring device and determines whether the absolute offset value exceeds an allowable range. An abnormal signal is generated when the measured absolute offset value exceeds the allowable range.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控系統中,非接觸式位置量測裝置包括光學式位置量測裝置或磁力式位置量測裝置。 According to an embodiment of the present invention, in the module actuation monitoring system in the exposure machine alignment light source device, the non-contact position measuring device comprises an optical position measuring device or a magnetic position measuring device. .

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控系統中,光學式位置量測裝置包括光遮斷式位置量測裝置。光遮斷式位置量測裝置包括光產生器、光接收器以及光資訊處理器。光產生器發射光線,上述光線預定通過所述模組的定位孔。光接收器接收上述光線。光資訊處理器計算光接收器所接收到的光線的光量變化而獲得絕對偏移值。 According to an embodiment of the invention, in the module actuation monitoring system in the exposure machine alignment light source device, the optical position measuring device comprises a light blocking position measuring device. The light-interrupting position measuring device includes a light generator, a light receiver, and an optical information processor. The light generator emits light that is predetermined to pass through the positioning aperture of the module. The light receiver receives the above light. The optical information processor calculates a change in the amount of light received by the optical receiver to obtain an absolute offset value.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控系統中,光學式位置量測裝置包括光反射式位置量測裝置。光反射式位置量測裝置包括光刻度構件以及光學編碼器。光刻度構件連接至模組,且光刻度構件與模組連動。光學編碼器發射光線至光刻度構件,接收由光刻度構件所反射的帶有位置資訊的光線,且藉由解讀光線中的位置資訊而計算出絕對偏移值。 According to an embodiment of the invention, in the module actuation monitoring system in the exposure machine alignment light source device, the optical position measuring device comprises a light reflection type position measuring device. The light reflective position measuring device includes a light graduation member and an optical encoder. The light scale member is coupled to the module, and the light scale member is coupled to the module. The optical encoder emits light to the light scale member, receives light with position information reflected by the light scale member, and calculates an absolute offset value by interpreting position information in the light.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控系統中,磁力式位置量測裝置包括磁力構件以及磁力編碼器。其中,磁力構件連接至模組,且磁力構件與模組連動。磁力編碼器感測磁力構件的運動而計算出絕對偏移值。 According to an embodiment of the invention, in the module operation monitoring system in the exposure machine alignment light source device, the magnetic position measuring device comprises a magnetic member and a magnetic encoder. Wherein, the magnetic member is connected to the module, and the magnetic member is interlocked with the module. The magnetic encoder senses the motion of the magnetic member to calculate an absolute offset value.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控系統中,更包括將異常訊號傳送到對準光源裝置,使對準光源裝置停止運作。 According to an embodiment of the present invention, in the module actuation monitoring system in the exposure machine alignment light source device, the method further includes transmitting an abnormal signal to the alignment light source device to stop the alignment light source device from operating.

依照本發明的一實施例所述,在上述之曝光機台對準光源裝置內的模組作動監控系統中,更包括警示裝置,耦接至監控裝置。監控裝置可將異常訊號傳送到警示裝置,使警示裝置發出警示訊號。 According to an embodiment of the present invention, in the module actuation monitoring system in the exposure machine alignment light source device, the warning device is further included and coupled to the monitoring device. The monitoring device can transmit an abnormal signal to the warning device to cause the warning device to send a warning signal.

在本發明的一實施例中,上述警示裝置包括發光裝置、聲響裝置、電子顯示裝置或訊號源控制器。 In an embodiment of the invention, the warning device comprises a light emitting device, an acoustic device, an electronic display device or a signal source controller.

在本發明的一實施例中,上述模組包括至少一個中性密度濾光器模組。 In an embodiment of the invention, the module includes at least one neutral density filter module.

在本發明的一實施例中,當絕對偏移值在容許範圍內時,使對準光源裝置繼續運作。 In an embodiment of the invention, the alignment light source device continues to operate when the absolute offset value is within the tolerance range.

基於上述,在本發明的曝光機台對準光源裝置內的模組作動監控方法及監控系統中,由於可藉由非接觸式位置量測法量測模組的絕對偏移值,所以可即時監控對準光源裝置中的模組位置是否產生偏移,以提高對準操作的可靠度,進而提升產品的良 率。 Based on the above, in the module operation monitoring method and the monitoring system in the exposure machine alignment light source device of the present invention, since the absolute offset value of the module can be measured by the non-contact position measurement method, it can be instantly Monitor whether the position of the module in the illuminating device is offset, so as to improve the reliability of the alignment operation, thereby improving the product quality. rate.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。 The above described features and advantages of the invention will be apparent from the following description.

200‧‧‧對準光源裝置 200‧‧‧Aligning light source device

210、220‧‧‧濾光器模組 210, 220‧‧‧ filter module

230‧‧‧光源 230‧‧‧Light source

212、222‧‧‧濾鏡 212, 222‧‧‧ filter

214、224‧‧‧轉盤 214, 224‧‧ ‧ turntable

216、226‧‧‧驅動裝置 216, 226‧‧‧ drive

2160‧‧‧馬達裝置 2160‧‧‧Motor device

2162‧‧‧轉動軸 2162‧‧‧Rotary axis

2164、2166‧‧‧齒輪 2164, 2166‧‧‧ gears

2168‧‧‧連接構件 2168‧‧‧Connecting members

218‧‧‧定位孔 218‧‧‧Positioning holes

300‧‧‧監控系統 300‧‧‧Monitoring system

310‧‧‧非接觸式位置量測裝置 310‧‧‧ Non-contact position measuring device

320‧‧‧監控裝置 320‧‧‧Monitor

330‧‧‧警示裝置 330‧‧‧Warning device

400‧‧‧光遮斷式位置量測裝置 400‧‧‧Light occlusion position measuring device

410‧‧‧光產生器 410‧‧‧Light generator

420‧‧‧光接收器 420‧‧‧Light Receiver

430‧‧‧光資訊處理器 430‧‧‧Light Information Processor

500‧‧‧光反射式位置量測裝置 500‧‧‧Light reflective position measuring device

510‧‧‧光刻度構件 510‧‧‧Light scale components

520‧‧‧光學編碼器 520‧‧‧Optical encoder

600‧‧‧磁力式位置量測裝置 600‧‧‧Magnetic position measuring device

610‧‧‧磁力構件 610‧‧‧ magnetic components

620‧‧‧磁力編碼器 620‧‧‧Magnetic encoder

L1、L2、L3‧‧‧光線 L1, L2, L3‧‧‧ rays

S100~S112‧‧‧步驟 S100~S112‧‧‧Steps

圖1是本發明一實施例的曝光機台對準光源裝置內的模組作動監控流程圖。 BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a flow chart showing the operation monitoring of a module in an exposure machine alignment light source device according to an embodiment of the present invention.

圖2是本發明一實施例的曝光機台對準光源裝置的示意圖。 2 is a schematic view of an exposure machine aligning light source device according to an embodiment of the present invention.

圖3是曝光機台對準光源裝置內的模組作動監控系統的示意圖。 3 is a schematic diagram of a module actuation monitoring system in an exposure machine aligned with a light source device.

圖4A是本發明一實施例中利用光遮斷式位置量測裝置監控對準光源裝置的示意圖。 4A is a schematic diagram of a device for monitoring an alignment light source using a light-blocking position measuring device according to an embodiment of the invention.

圖4B、4C是圖4A中的光線與定位孔的位置關係的示意圖。 4B and 4C are schematic views showing the positional relationship between the light and the positioning hole in Fig. 4A.

圖5是本發明一實施例中利用光反射式位置量測裝置監控對準光源裝置的示意圖。 FIG. 5 is a schematic diagram of a device for monitoring an alignment light source using a light reflective position measuring device according to an embodiment of the invention.

圖6是本發明一實施例中利用磁力式位置量測裝置監控對準光源裝置的示意圖。 6 is a schematic diagram of a device for monitoring an alignment light source using a magnetic position measuring device according to an embodiment of the invention.

圖1是本發明一實施例的曝光機台對準光源裝置內的模組作動監控流程圖。 BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a flow chart showing the operation monitoring of a module in an exposure machine alignment light source device according to an embodiment of the present invention.

請參考圖1,首先,進行步驟S100,提供對準光源裝置,且對準光源裝置包括至少一個模組。對準光源裝置例如是曝光機台中的對準光源。模組包括中性密度濾光器模組,但本發明不以此為限。 Referring to FIG. 1, first, step S100 is performed to provide an alignment light source device, and the alignment light source device includes at least one module. The alignment light source device is, for example, an alignment light source in the exposure machine. The module includes a neutral density filter module, but the invention is not limited thereto.

接著,進行步驟S102,藉由非接觸式位置量測法量測模組的絕對偏移值。非接觸式位置量測法包括光學式位置量測法或磁力式位置量測法。光學式位置量測法包括光遮斷式量測法以及光反射式量測法。 Next, in step S102, the absolute offset value of the module is measured by the non-contact position measurement method. Non-contact position measurement methods include optical position measurement or magnetic position measurement. Optical position measurement methods include light interception measurement and light reflection measurement.

光遮斷式量測法包括下列步驟。首先,利用光產生器發射光線,而光線預定通過模組的定位孔。接著,藉由光接收器接收上述光線,且根據光線的光量變化來計算出絕對偏移值。 The light interruption type measurement method includes the following steps. First, the light is emitted by the light generator, and the light is intended to pass through the positioning holes of the module. Then, the light is received by the light receiver, and the absolute offset value is calculated according to the change in the light amount of the light.

光反射式量測法包括下列步驟。首先,將光刻度構件連接至模組,且光刻度構件與模組連動。接著,藉由光學編碼器發射光線至光刻度構件。然後,藉由光學編碼器接收由光刻度構件所反射的帶有位置資訊的光線。接下來,藉由光學編碼器解讀光線中的位置資訊而計算出絕對偏移值。 The light reflection measurement method includes the following steps. First, the light scale member is coupled to the module, and the light scale member is coupled to the module. The light is then emitted by the optical encoder to the light scale member. Light with positional information reflected by the light scale member is then received by the optical encoder. Next, the absolute offset value is calculated by interpreting the position information in the light by the optical encoder.

磁力式位置量測法包括下列步驟。首先,將磁力構件連接至模組,且磁力構件與模組連動。接著,藉由磁力編碼器感測磁力構件的運動而計算出絕對偏移值。 The magnetic position measurement method includes the following steps. First, the magnetic member is coupled to the module, and the magnetic member is coupled to the module. Next, the absolute offset value is calculated by sensing the motion of the magnetic member by the magnetic encoder.

然後,進行步驟S104,判斷絕對偏移值是否超過容許範圍。當所量測的絕對偏移值超過容許範圍時,進行步驟S106,產生異常訊號。所屬技術領域具有通常知識者可依照製程需求來對 絕對偏移值的容許範圍進行設定與調整。 Then, step S104 is performed to determine whether the absolute offset value exceeds the allowable range. When the measured absolute offset value exceeds the allowable range, step S106 is performed to generate an abnormal signal. Those skilled in the art can follow the process requirements The allowable range of the absolute offset value is set and adjusted.

接著,監控方法更可選擇性地進行步驟S108與步驟S100中的至少一者。步驟S108是將異常訊號傳送至對準光源裝置,使對準光源裝置停止運作。步驟S110是將異常訊號傳送到警示裝置,使警示裝置發出警示訊號。警示裝置包括發光裝置、聲響裝置、電子顯示裝置或訊號源控制器。其中,當訊號源控制器偵測到異常訊號時,其可提供斷路功能,使對準光源裝置停止運作。 Next, the monitoring method can selectively perform at least one of step S108 and step S100. Step S108 is to transmit the abnormal signal to the alignment light source device to stop the alignment light source device from operating. In step S110, the abnormal signal is transmitted to the warning device, so that the warning device sends a warning signal. The warning device includes a lighting device, an acoustic device, an electronic display device or a signal source controller. Wherein, when the signal source controller detects the abnormal signal, it can provide an open circuit function to stop the illuminating device.

在步驟S104中,當判斷絕對偏移值並未超過容許範圍時,進行步驟S112。步驟S112為使對準光源裝置繼續運作。 In step S104, when it is determined that the absolute offset value does not exceed the allowable range, step S112 is performed. Step S112 is to continue the operation of the illuminating light source device.

基於上述實施例可知,在上述曝光機台對準光源裝置內的模組作動監控方法中,可藉由非接觸式位置量測法量測模組的絕對偏移值,所以可即時監控對準光源裝置中的模組位置是否產生偏移。如此一來,當對準光源裝置內的模組位置產生位置偏移時,使用者能即時解決問題,因此可提高對準操作的可靠度,進而提升產品的良率。 According to the above embodiment, in the module operation monitoring method in the exposure machine alignment light source device, the absolute offset value of the module can be measured by the non-contact position measurement method, so that the alignment can be monitored immediately. Whether the position of the module in the light source device is offset. In this way, when the position of the module in the light source device is displaced, the user can solve the problem immediately, thereby improving the reliability of the alignment operation and improving the yield of the product.

圖2是本發明一實施例的曝光機台對準光源裝置的示意圖。 2 is a schematic view of an exposure machine aligning light source device according to an embodiment of the present invention.

請參照圖2,本實施例所要監控的對象例如是曝光機台的對準光源裝置200。對準光源裝置200包括至少一個模組。在此實施例中,模組是以濾光器模組210、220為例進行說明。對準光源裝置200更包括光源230。濾光器模組210以及濾光器模組220例如是分別為中性密度濾光器模組。在此實施例中,對準光源裝 置200是以具有濾光器模組210、220等兩個模組為例進行說明,然而本發明不以此限。在其他實施例中,對準光源裝置200所具有的模組數量亦可為一個或是三個以上,所屬技術領域具有通常知識者,可依照機台設計需求而對模組數量進行調整。 Referring to FIG. 2, the object to be monitored in this embodiment is, for example, an alignment light source device 200 of an exposure machine. The alignment light source device 200 includes at least one module. In this embodiment, the module is described by taking the filter modules 210 and 220 as an example. The alignment light source device 200 further includes a light source 230. The filter module 210 and the filter module 220 are, for example, neutral density filter modules. In this embodiment, the alignment light source is mounted The setting 200 is exemplified by two modules having the filter modules 210 and 220, but the present invention is not limited thereto. In other embodiments, the number of modules of the illuminating device 200 may be one or more. Those skilled in the art may adjust the number of modules according to the design requirements of the machine.

濾光器模組210包括濾鏡212、轉盤214與驅動裝置216。濾鏡212位於轉盤214上。驅動裝置216連接於轉盤214,且用以驅動轉盤214。濾光器模組220包括濾鏡222、轉盤224與驅動裝置226。濾鏡222位於轉盤224上。驅動裝置226連接於轉盤224,且用以驅動轉盤224。 The filter module 210 includes a filter 212, a turntable 214, and a driving device 216. Filter 212 is located on turntable 214. The driving device 216 is connected to the turntable 214 and is used to drive the turntable 214. The filter module 220 includes a filter 222, a turntable 224, and a driving device 226. Filter 222 is located on turntable 224. The driving device 226 is connected to the turntable 224 and is used to drive the turntable 224.

光源230用以發射光線L1。光線L1預定通過濾光器模組210的濾鏡212以及濾光器模組220中的濾鏡222。當濾光器模組210或濾光器模組220產生偏移時,部分的光線L1會被轉盤214或轉盤224所遮蔽。因此,光線L1的光量會降低,進而影響到後續的曝光操作以及產品的品質。在本實施例中,光源230例如是鹵素燈光源。此外,光源230例如是偏光光源,其與曝光機台的曝光光源不同。 The light source 230 is used to emit light L1. Light L1 is intended to pass through filter 212 of filter module 210 and filter 222 in filter module 220. When the filter module 210 or the filter module 220 is offset, part of the light L1 is blocked by the turntable 214 or the turntable 224. Therefore, the amount of light of the light L1 is lowered, which in turn affects the subsequent exposure operation and the quality of the product. In the present embodiment, the light source 230 is, for example, a halogen light source. Further, the light source 230 is, for example, a polarized light source that is different from the exposure light source of the exposure machine.

圖3是曝光機台對準光源裝置內的模組作動監控系統的示意圖。 3 is a schematic diagram of a module actuation monitoring system in an exposure machine aligned with a light source device.

請參照圖3,監控系統300是用以監控如圖2中的對準光源裝置200內的模組,如濾光器模組210與濾光器模組220中的至少一者。監控系統300包括非接觸式位置量測裝置310與監控裝置320。 Referring to FIG. 3, the monitoring system 300 is configured to monitor at least one of the modules in the alignment light source device 200 as in FIG. 2, such as the filter module 210 and the filter module 220. The monitoring system 300 includes a non-contact position measuring device 310 and a monitoring device 320.

非接觸式位置量測裝置310量測濾光器模組210與濾光器模組220中的至少一者的絕對偏移值。非接觸式位置量測裝置310包括光學式位置量測裝置或磁力式位置量測裝置(請參照圖6)。光學式位置量測裝置包括光遮斷式位置量測裝置(請參照圖4A)或光反射式位置量測裝置(請參照圖5)。 The non-contact position measuring device 310 measures the absolute offset value of at least one of the filter module 210 and the filter module 220. The non-contact position measuring device 310 includes an optical position measuring device or a magnetic position measuring device (please refer to FIG. 6). The optical position measuring device includes a light blocking type position measuring device (please refer to FIG. 4A) or a light reflecting type position measuring device (refer to FIG. 5).

監控裝置320耦接至非接觸式位置量測裝置310,且判斷絕對偏移值是否超過容許範圍。舉例來說,當濾光器模組210或濾光器模組220中的齒輪崩壞或累積塵屑時,會造成濾光器模組210中的轉盤214或濾光器模組220中的轉盤224的位置產生偏移。在此情況下,容許範圍可依下列方式進行設定。當驅動裝置216或驅動裝置226的齒輪為48齒的齒輪時,每一齒所轉動的角度為7.5度(360度/48齒)。若以齒輪偏移半齒所造成的轉盤214或轉盤224的偏移量設為容許範圍,則可將容許範圍的角度偏移量設為±3.75度,但本發明不以此為限。所屬技術領域具有通常知識者可依照製程需求來對絕對偏移值的容許範圍進行設定與調整。 The monitoring device 320 is coupled to the non-contact position measuring device 310 and determines whether the absolute offset value exceeds the allowable range. For example, when the gears in the filter module 210 or the filter module 220 collapse or accumulate dust, the turntable 214 or the filter module 220 in the filter module 210 may be caused. The position of the turntable 224 is offset. In this case, the allowable range can be set in the following manner. When the gear of the driving device 216 or the driving device 226 is a 48-toothed gear, the angle at which each tooth rotates is 7.5 degrees (360 degrees / 48 teeth). If the offset amount of the turntable 214 or the turntable 224 caused by the gear offset half tooth is set as the allowable range, the angular shift amount of the allowable range can be set to ±3.75 degrees, but the present invention is not limited thereto. Those skilled in the art can set and adjust the allowable range of the absolute offset value according to the process requirements.

當監控裝置320判斷絕對偏移值超過容許範圍時,監控裝置320會產生異常訊號。監控裝置320可將異常訊號傳送到對準光源裝置200,使對準光源裝置200停止運作。 When the monitoring device 320 determines that the absolute offset value exceeds the allowable range, the monitoring device 320 generates an abnormal signal. The monitoring device 320 can transmit the abnormal signal to the alignment light source device 200 to stop the alignment light source device 200 from operating.

此外,監控系統300更可選擇性地包括警示裝置330。警示裝置330耦接至監控裝置320。監控裝置320可將異常訊號傳送到警示裝置330,使警示裝置330發出警示訊號,以警示使用者對 準光源裝置200中的模組發生偏移的情況。警示裝置330包括發光裝置、聲響裝置、電子顯示裝置或訊號源控制器。其中,當訊號源控制器偵測到異常訊號時,其可提供斷路功能,使對準光源裝置200停止運作。 Additionally, the monitoring system 300 more selectively includes an alerting device 330. The alert device 330 is coupled to the monitoring device 320. The monitoring device 320 can transmit the abnormal signal to the alert device 330, and cause the alert device 330 to send a warning signal to alert the user to The module in the quasi-light source device 200 is shifted. The alert device 330 includes a light emitting device, an acoustic device, an electronic display device, or a signal source controller. Wherein, when the signal source controller detects the abnormal signal, it can provide an open circuit function to stop the illuminating device 200 from operating.

監控裝置320與警示裝置330可分別為獨立的構件,亦可為整合到對準光源裝置200中的構件,所屬技術領域具有通常知識者可依照機台設計需求而對監控裝置320與警示裝置330的設置方式進行調整。 The monitoring device 320 and the warning device 330 can be separate components, respectively, or can be integrated into the illuminating device 200. The person skilled in the art can monitor the device 320 and the warning device 330 according to the design requirements of the machine. The setting method is adjusted.

此外,監控裝置320、警示裝置330與對準光源裝置200之間的連接關係只要可使得監控裝置320將異常訊號傳送到警示裝置330與對準光源裝置200即可。舉例而言,監控裝置320可同時將異常訊號傳送到警示裝置330與對準光源裝置200,使警示裝置330發出警示訊號,同時使對準光源裝置200而停止運作。在另一實施例中,可先由監控裝置320將異常訊號會傳送到對準光源裝置200而使對準光源裝置200停止運作,再由對準光源裝置200將異常訊號傳送到警示裝置330而使警示裝置330發出警示訊號。 In addition, the connection relationship between the monitoring device 320, the alerting device 330, and the illuminating device 200 can be such that the monitoring device 320 can transmit the abnormal signal to the alerting device 330 and the illuminating device 200. For example, the monitoring device 320 can simultaneously transmit the abnormal signal to the warning device 330 and the alignment light source device 200, so that the warning device 330 emits an alarm signal while causing the light source device 200 to be aligned and stopped. In another embodiment, the abnormality signal may be transmitted from the monitoring device 320 to the alignment light source device 200 to stop the operation of the alignment light source device 200, and then the abnormal light signal is transmitted to the warning device 330 by the alignment light source device 200. The warning device 330 is caused to emit an alert signal.

基於上述實施例可知,在監控系統300中,可藉由非接觸式位置量測裝置310量測模組的絕對偏移值,所以可即時監控對準光源裝置200中的濾光器模組210與濾光器模組220的位置是否產生偏移,以提高對準操作的可靠度,進而提升產品的良率。 Based on the above embodiment, in the monitoring system 300, the absolute offset value of the module can be measured by the non-contact position measuring device 310, so that the filter module 210 in the illuminating device 200 can be monitored in real time. Whether the position of the filter module 220 is offset to improve the reliability of the alignment operation, thereby improving the yield of the product.

以下,藉由圖4A至圖4C、圖5與圖6來舉例說明監控 系統300中的非接觸式位置量測裝置310的實施態樣。 Hereinafter, monitoring is exemplified by FIGS. 4A to 4C, 5, and 6. An embodiment of the non-contact position measuring device 310 in system 300.

圖4A是本發明一實施例中利用光遮斷式位置量測裝置監控對準光源裝置的示意圖。圖4B、4C是圖4A中的光線與定位孔的位置關係的示意圖。 4A is a schematic diagram of a device for monitoring an alignment light source using a light-blocking position measuring device according to an embodiment of the invention. 4B and 4C are schematic views showing the positional relationship between the light and the positioning hole in Fig. 4A.

請同時參照圖2、圖3及圖4A至圖4C,在此實施例中,光遮斷式位置量測裝置400是以量測圖2中濾光器模組210作動的絕對偏移值為例進行說明。濾光器模組210中的轉盤214更包括多個定位孔218。定位孔218對應於濾鏡212的位置進行設置,可協助判斷轉盤214是否轉到預定位置。此外,關於濾光器模組210的其他構件已於前文中進行詳盡地描述,故使用相同的符號表示且不再進行贅述。 Referring to FIG. 2, FIG. 3 and FIG. 4A to FIG. 4C, in this embodiment, the optical occlusion type position measuring device 400 is an absolute offset value measured by the filter module 210 of FIG. The example is explained. The turntable 214 in the filter module 210 further includes a plurality of positioning holes 218. The positioning hole 218 is disposed corresponding to the position of the filter 212, and can assist in determining whether the turntable 214 is turned to a predetermined position. In addition, other components of the filter module 210 have been described in detail in the foregoing, and are denoted by the same reference numerals and will not be described again.

光遮斷式位置量測裝置400包括光產生器410、光接收器420與光資訊處理器430。濾光器模組210設置在光產生器410與光接收器420之間。 The light-interrupting position measuring device 400 includes a light generator 410, a light receiver 420, and a light information processor 430. The filter module 210 is disposed between the light generator 410 and the light receiver 420.

光產生器410發射光線L2。光線L2預定通過轉盤214上的定位孔218。光產生器410例如是帶狀雷射光產生器。光接收器420接收光線L2。光資訊處理器430耦接於光接收器420,用以計算光接收器420所接收到的光線L2的光量變化而獲得絕對偏移值。在此實施例中,光資訊處理器430只要能與光接收器420耦接而接收到光接收器420傳送的光資訊即可,光資訊處理器430的設置方式並沒有特別的限制。在此實施例中,光資訊處理器430例如是設置於光接收器420上,但本發明不以此為限。在其他實 施例中,光資訊處理器430也可設置在光接收器420內部。 The light generator 410 emits light L2. Light ray L2 is intended to pass through a locating aperture 218 in turntable 214. The light generator 410 is, for example, a strip laser light generator. The light receiver 420 receives the light L2. The optical information processor 430 is coupled to the light receiver 420 for calculating a change in the amount of light of the light L2 received by the light receiver 420 to obtain an absolute offset value. In this embodiment, the optical information processor 430 is configured to receive the light information transmitted by the optical receiver 420 as long as it can be coupled to the optical receiver 420. The manner in which the optical information processor 430 is disposed is not particularly limited. In this embodiment, the optical information processor 430 is disposed on the optical receiver 420, for example, but the invention is not limited thereto. In other real In an embodiment, the optical information processor 430 can also be disposed inside the light receiver 420.

請參照圖4B,在正常的情況下,濾光器模組210的轉盤214會轉到預定位置,使光線L2通過。請參照圖4C,當濾光器模組210的轉盤214產生定位偏移時,會使得轉盤214無法到達預定位置。此時,部分光線L2會被轉盤214所遮蔽,而使得通過定位孔218的光線L2的光量減少,因此光接收器420所接收到的光線L2的光量也會減少。因此,光資訊處理器430可根據光接收器420所接收到光線L2的光量變化來計算轉盤214的絕對偏移值。 Referring to FIG. 4B, under normal circumstances, the turntable 214 of the filter module 210 is turned to a predetermined position to pass the light L2. Referring to FIG. 4C, when the turntable 214 of the filter module 210 generates a positioning offset, the turntable 214 may not be able to reach the predetermined position. At this time, part of the light ray L2 is shielded by the turntable 214, so that the amount of light L2 passing through the positioning hole 218 is reduced, and thus the amount of light received by the light receiver 420 is also reduced. Therefore, the optical information processor 430 can calculate the absolute offset value of the turntable 214 according to the change in the amount of light received by the light receiver 420.

圖5是本發明一實施例的利用光反射式位置量測裝置監控對準光源裝置的示意圖。在圖5中,省略繪示驅動裝置216的外殼,以利於說明驅動裝置216內部的各構件的關係。 FIG. 5 is a schematic diagram of a device for monitoring an alignment light source using a light reflective position measuring device according to an embodiment of the invention. In FIG. 5, the outer casing of the driving device 216 is omitted to facilitate the description of the relationship of the various components inside the driving device 216.

請同時參照圖2、圖3及圖5,在此實施例中,光反射式位置量測裝置500是以量測圖2中的濾光器模組210作動的絕對偏移值為例進行說明。濾光器模組210中的驅動裝置216包括馬達裝置2160、轉動軸2162、齒輪2164、齒輪2166與連接構件2168。馬達裝置2160經由轉動軸2162、齒輪2164、齒輪2166與連接構件2168而帶動濾光器模組210中的轉盤214,以使轉盤214旋轉至預定位置。此外,關於濾光器模組210的其他構件已於前文中進行詳盡地描述,故使用相同的符號表示且不再進行贅述。 Referring to FIG. 2, FIG. 3 and FIG. 5 simultaneously, in this embodiment, the light reflection type position measuring device 500 is an example of measuring the absolute offset value of the filter module 210 in FIG. . The driving device 216 in the filter module 210 includes a motor device 2160, a rotating shaft 2162, a gear 2164, a gear 2166, and a connecting member 2168. The motor unit 2160 drives the turntable 214 in the filter module 210 via the rotating shaft 2162, the gear 2164, the gear 2166, and the connecting member 2168 to rotate the turntable 214 to a predetermined position. In addition, other components of the filter module 210 have been described in detail in the foregoing, and are denoted by the same reference numerals and will not be described again.

光反射式位置量測裝置500包括光刻度構件510與光學編碼器520。光刻度構件510連接至齒輪2166,且光刻度構件510與轉盤214連動。光學編碼器520發射光線L3至光刻度構件510 上。由於光刻度構件510是經由齒輪2166以及連接構件2168而與轉盤214連動旋轉,因此光刻度構件510可以反映出轉盤214的位置。光學編碼器520接收由光刻度構件510所反射的帶有位置資訊的光線L3。光學編碼器520藉由解讀光線L3中的位置資訊而計算出轉盤214的絕對偏移值。具體而言,由光刻度構件510上的每個位置所反射的光線L3的光特性並不相同,因此藉由光學編碼器520對於光線L3的光特性的解讀,可得知光刻度構件510的位置資訊(如,旋轉的角度),所以可得知與光刻度構件510連動的轉盤214的位置資訊,進而計算出轉盤214的絕對偏移值。 The light reflective position measuring device 500 includes a light scale member 510 and an optical encoder 520. The light scale member 510 is coupled to the gear 2166, and the light scale member 510 is coupled to the turntable 214. Optical encoder 520 emits light L3 to light scale member 510 on. Since the light scale member 510 is rotated in conjunction with the turntable 214 via the gear 2166 and the connecting member 2168, the light scale member 510 can reflect the position of the turntable 214. The optical encoder 520 receives the light L3 with position information reflected by the light scale member 510. The optical encoder 520 calculates the absolute offset value of the dial 214 by interpreting the position information in the light L3. Specifically, the light characteristics of the light ray L3 reflected by each position on the light scale member 510 are not the same, so that the optical encoder 520 can understand the light characteristics of the light ray L3 by the optical encoder 520. The position information (e.g., the angle of rotation) is such that the position information of the turntable 214 in conjunction with the light scale member 510 can be known, and the absolute offset value of the turntable 214 can be calculated.

圖6是本發明的一實施例的利用磁力式位置量測裝置監控對準光源裝置的示意圖。在圖6中,驅動裝置216中各構件的說明可參考圖5,於此不再贅述。 6 is a schematic diagram of a device for monitoring an alignment light source using a magnetic position measuring device according to an embodiment of the present invention. In FIG. 6, the description of each component in the driving device 216 can be referred to FIG. 5, and details are not described herein again.

請同時參照圖2、圖3及圖6,在此實施例中,磁力式位置量測裝置600是以量測圖2中的濾光器模組210作動的絕對偏移值為例進行說明。此外,關於濾光器模組210的其他構件已於前文中進行詳盡地描述,故使用相同的符號表示且不再進行贅述。 Referring to FIG. 2, FIG. 3 and FIG. 6, in this embodiment, the magnetic position measuring device 600 is an example of measuring the absolute offset value of the filter module 210 in FIG. In addition, other components of the filter module 210 have been described in detail in the foregoing, and are denoted by the same reference numerals and will not be described again.

磁力式位置量測裝置600包括磁力構件610與磁力編碼器620。磁力構件610連接至齒輪2166,且磁力構件610與轉盤214連動。磁力編碼器620感測磁力構件610的運動而計算出絕對偏移值。具體而言,由於磁力構件610是經由齒輪2166以及連接構件2168而與轉盤214連動旋轉,因此藉由磁力編碼器620感測磁力構件610所產生的位置資訊(如,旋轉的角度),而可得知與磁 力構件610連動的轉盤214的位置資訊,進而計算出轉盤214的絕對偏移值。 The magnetic position measuring device 600 includes a magnetic member 610 and a magnetic encoder 620. The magnetic member 610 is coupled to the gear 2166 and the magnetic member 610 is coupled to the turntable 214. The magnetic encoder 620 senses the motion of the magnetic member 610 to calculate an absolute offset value. Specifically, since the magnetic member 610 is rotated in conjunction with the turntable 214 via the gear 2166 and the connecting member 2168, the position information (eg, the angle of rotation) generated by the magnetic member 610 is sensed by the magnetic encoder 620. Know and magnetic The position information of the turntable 214 that the force member 610 is interlocked to calculate the absolute offset value of the turntable 214.

在上述實施例中,雖然圖4A所示的光遮斷式位置量測裝置400、圖5所示的光反射式位置量測裝置500與圖6所示的磁力式位置量測裝置600是以量測圖2中的濾光器模組210作動的絕對偏移值為例進行說明,然而於此技術領域具有通常知識者可參照上述實施例而將光遮斷式位置量測裝置400、光反射式位置量測裝置500或磁力式位置量測裝置600用於量測濾光器模組220作動的絕對偏移值。 In the above embodiment, the light-blocking position measuring device 400 shown in FIG. 4A, the light-reflecting position measuring device 500 shown in FIG. 5, and the magnetic-type position measuring device 600 shown in FIG. 6 are The absolute offset value of the filter module 210 in FIG. 2 is measured as an example. However, those skilled in the art can refer to the above embodiment to use the light-interrupting position measuring device 400 and light. The reflective position measuring device 500 or the magnetic position measuring device 600 is used to measure the absolute offset value of the filter module 220 actuation.

此外,光遮斷式位置量測裝置400、光反射式位置量測裝置500與磁力式位置量測裝置600均可適用於圖3的監控系統300。舉例而言,光遮斷式位置量測裝置400、光反射式位置量測裝置500或磁力式位置量測裝置600可與監控裝置320進行耦接。監控裝置320可用以判斷光遮斷式位置量測裝置400、光反射式位置量測裝置500或磁力式位置量測裝置600所計算出的絕對偏移值是否超過容許範圍。當絕對偏移值超過容許範圍時,監控裝置320會產生異常訊號,以即時監控對準光源裝置中的模組位置是否產生偏移。 Further, the light-interrupting position measuring device 400, the light-reflecting position measuring device 500, and the magnetic-type position measuring device 600 can be applied to the monitoring system 300 of FIG. For example, the light blocking position measuring device 400, the light reflective position measuring device 500 or the magnetic position measuring device 600 can be coupled to the monitoring device 320. The monitoring device 320 can be used to determine whether the absolute offset value calculated by the light blocking position measuring device 400, the light reflective position measuring device 500, or the magnetic position measuring device 600 exceeds the allowable range. When the absolute offset value exceeds the allowable range, the monitoring device 320 generates an abnormal signal to instantly monitor whether the position of the module in the alignment light source device is offset.

綜上所述,藉由上述實施例的曝光機台對準光源裝置內的模組作動監控方法及監控系統,可藉由非接觸式位置量測法量測模組的絕對偏移值,所以可即時監控對準光源裝置中的模組位置是否產生偏移,以提高對準操作的可靠度,進而提升產品的良 率。 In summary, the exposure mechanism of the above embodiment is used to align the module operation monitoring method and the monitoring system in the light source device, and the absolute offset value of the module can be measured by the non-contact position measurement method. It can instantly monitor whether the position of the module in the illuminating device is offset, so as to improve the reliability of the alignment operation, thereby improving the product quality. rate.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.

S100~S112‧‧‧步驟標號 S100~S112‧‧‧ step label

Claims (20)

一種曝光機台對準光源裝置內的模組作動監控方法,包括:提供一對準光源裝置,其中該對準光源裝置包括至少一模組;藉由一非接觸式位置量測法量測該至少一模組的一絕對偏移值;以及判斷該絕對偏移值是否超過一容許範圍,當該絕對偏移值超過該容許範圍時,產生一異常訊號。 A method for monitoring the operation of a module in an exposure machine aligned with a light source device, comprising: providing an alignment light source device, wherein the alignment light source device comprises at least one module; and measuring by a non-contact position measurement method An absolute offset value of the at least one module; and determining whether the absolute offset value exceeds an allowable range, and when the absolute offset value exceeds the allowable range, generating an abnormal signal. 如申請專利範圍第1項所述的曝光機台對準光源裝置內的模組作動監控方法,其中該非接觸式位置量測法包括一光學式位置量測法或一磁力式位置量測法。 The method according to claim 1, wherein the non-contact position measurement method comprises an optical position measurement method or a magnetic position measurement method. 如申請專利範圍第2項所述的曝光機台對準光源裝置內的模組作動監控方法,其中該光學式位置量測法包括一光遮斷式量測法,該光遮斷式量測法包括:利用一光產生器發射一光線,該光線預定通過該至少一模組的一定位孔;以及藉由一光接收器所接收到的該光線的光量變化而計算出該絕對偏移值。 The method for monitoring the operation of the module in the light source device according to the second aspect of the invention, wherein the optical position measurement method comprises a light interception measurement method, and the light interception measurement method The method includes: transmitting, by a light generator, a light that is predetermined to pass through a positioning hole of the at least one module; and calculating the absolute offset value by a change in the amount of light of the light received by the light receiver . 如申請專利範圍第2項所述的曝光機台對準光源裝置內的模組作動監控方法,其中該光學式位置量測法包括一光反射式量測法,該光反射式量測法包括:將一光刻度構件連接至該至少一模組,且該光刻度構件與該至少一模組連動;藉由一光學編碼器發射一光線至該光刻度構件; 藉由該光學編碼器接收由該光刻度構件所反射的帶有一位置資訊的該光線;以及藉由該光學編碼器解讀該光線中的該位置資訊而計算出該絕對偏移值。 The method for monitoring the operation of a module in an exposure machine according to claim 2, wherein the optical position measurement method comprises a light reflection type measurement method, and the light reflection type measurement method comprises Connecting a light scale member to the at least one module, and the light scale member is coupled to the at least one module; emitting a light to the light scale member by an optical encoder; Receiving, by the optical encoder, the light with a position information reflected by the optical scale member; and calculating the absolute offset value by interpreting the position information in the light by the optical encoder. 如申請專利範圍第2項所述的曝光機台對準光源裝置內的模組作動監控方法,其中該磁力式位置量測法包括:將一磁力構件連接至該至少一模組,且該磁力構件與該至少一模組連動;以及藉由一磁力編碼器感測該磁力構件的運動而計算出該絕對偏移值。 The method for monitoring the operation of the module in the light source device according to the second aspect of the invention, wherein the magnetic position measurement method comprises: connecting a magnetic member to the at least one module, and the magnetic force The member is coupled to the at least one module; and the absolute offset value is calculated by sensing a motion of the magnetic member by a magnetic encoder. 如申請專利範圍第1項所述的曝光機台對準光源裝置內的模組作動監控方法,更包括:將該異常訊號傳送到該對準光源裝置,使該對準光源裝置停止運作。 The method for monitoring the operation of the module in the light source device according to the first aspect of the invention, further comprising: transmitting the abnormal signal to the alignment light source device to stop the operation of the alignment light source device. 如申請專利範圍第1項所述的曝光機台對準光源裝置內的模組作動監控方法,更包括:將該異常訊號傳送到一警示裝置,使該警示裝置發出警示訊號。 The method for monitoring the operation of the module in the light source device according to the first aspect of the invention, further comprising: transmitting the abnormal signal to a warning device, so that the warning device sends a warning signal. 如申請專利範圍第7項所述的曝光機台對準光源裝置內的模組作動監控方法,其中該警示裝置包括發光裝置、聲響裝置、電子顯示裝置或訊號源控制器。 The method for monitoring the operation of the module in the light source device according to the invention of claim 7, wherein the warning device comprises a light emitting device, an acoustic device, an electronic display device or a signal source controller. 如申請專利範圍第1項所述的曝光機台對準光源裝置內的模組作動監控方法,其中該至少一模組包括至少一中性密度濾光器模組。 The method according to claim 1, wherein the at least one module comprises at least one neutral density filter module. 如申請專利範圍第1項所述的曝光機台對準光源裝置內的模組作動監控方法,其中當該絕對偏移值在該容許範圍內時,使該對準光源裝置繼續運作。 The method for monitoring the operation of the module in the exposure apparatus according to claim 1, wherein the alignment light source device continues to operate when the absolute offset value is within the allowable range. 一種曝光機台對準光源裝置內的模組作動監控系統,用以監控一對準光源裝置內的至少一模組,且包括:一非接觸式位置量測裝置,量測該至少一模組的一絕對偏移值;以及一監控裝置,耦接至該非接觸式位置量測裝置,且判斷該絕對偏移值是否超過一容許範圍,當該絕對偏移值超過該容許範圍時,產生一異常訊號。 An exposure monitoring system for aligning a module in a light source device for monitoring at least one module in an illuminating device, and comprising: a non-contact position measuring device for measuring the at least one module And an absolute offset value; and a monitoring device coupled to the non-contact position measuring device, and determining whether the absolute offset value exceeds an allowable range, and when the absolute offset value exceeds the allowable range, generating a Abnormal signal. 如申請專利範圍第11項所述的曝光機台對準光源裝置內的模組作動監控系統,其中該非接觸式位置量測裝置包括一光學式位置量測裝置或一磁力式位置量測裝置。 The exposure machine of claim 11, wherein the non-contact position measuring device comprises an optical position measuring device or a magnetic position measuring device. 如申請專利範圍第12項所述的曝光機台對準光源裝置內的模組作動監控系統,其中該光學式位置量測裝置包括一光遮斷式位置量測裝置,該光遮斷式位置量測裝置包括:一光產生器,發射一光線,該光線預定通過該至少一模組的一定位孔;一光接收器,接收該光線;以及一光資訊處理器,計算該光接收器所接收到的該光線的光量變化而獲得該絕對偏移值。 The exposure machine of claim 12, wherein the optical position measuring device comprises a light blocking position measuring device, the light blocking position. The measuring device comprises: a light generator that emits a light, the light is intended to pass through a positioning hole of the at least one module; an optical receiver receives the light; and an optical information processor calculates the optical receiver The received light amount of the light changes to obtain the absolute offset value. 如申請專利範圍第12項所述的曝光機台對準光源裝置內的模組作動監控系統,其中該光學式位置量測裝置包括一光反射式位置量測裝置,該光反射式位置量測裝置包括: 一光刻度構件,連接至該至少一模組,且該光刻度構件與該至少一模組連動;以及一光學編碼器,發射一光線至該光刻度構件,接收由該光刻度構件所反射的帶有一位置資訊的該光線,且藉由解讀該光線中的該位置資訊而計算出該絕對偏移值。 The exposure machine of claim 12 is directed to the module actuation monitoring system in the light source device, wherein the optical position measuring device comprises a light reflective position measuring device, and the light reflective position measuring device The device includes: An optical scale member coupled to the at least one module, wherein the light scale member is coupled to the at least one module; and an optical encoder that emits a light to the light scale member for receiving reflection by the light scale member The light with a positional information is calculated by interpreting the position information in the light. 如申請專利範圍第12項所述的曝光機台對準光源裝置內的模組作動監控系統,其中該磁力式位置量測裝置包括:一磁力構件,連接至該至少一模組,且該磁力構件與該至少一模組連動;以及一磁力編碼器,感測該磁力構件的運動而計算出該絕對偏移值。 The exposure machine of claim 12 is directed to the module actuation monitoring system in the light source device, wherein the magnetic position measuring device comprises: a magnetic member connected to the at least one module, and the magnetic force The member is coupled to the at least one module; and a magnetic encoder that senses the motion of the magnetic member to calculate the absolute offset value. 如申請專利範圍第11項所述的曝光機台對準光源裝置內的模組作動監控系統,更包括將該異常訊號傳送到該對準光源裝置,使該對準光源裝置停止運作。 For example, the exposure machine of claim 11 is directed to the module actuation monitoring system in the light source device, and further includes transmitting the abnormal signal to the alignment light source device to stop the alignment light source device from operating. 如申請專利範圍第11項所述的曝光機台對準光源裝置內的模組作動監控系統,更包括一警示裝置,耦接至該監控裝置,更包括將該異常訊號傳送到該警示裝置,使該警示裝置發出警示訊號。 The module operation monitoring system in the illuminating device of the illuminating device according to claim 11 further includes a warning device coupled to the monitoring device, and further comprising transmitting the abnormal signal to the warning device. The warning device is caused to give a warning signal. 如申請專利範圍第17項所述的曝光機台對準光源裝置內的模組作動監控系統,其中該警示裝置包括發光裝置、聲響裝置、電子顯示裝置或訊號源控制器。 The exposure machine according to claim 17 is directed to the module actuation monitoring system in the light source device, wherein the warning device comprises a lighting device, an acoustic device, an electronic display device or a signal source controller. 如申請專利範圍第11項所述的曝光機台對準光源裝置內的模組作動監控系統,其中該至少一模組包括至少一中性密度濾光器模組。 The exposure machine of claim 11, wherein the at least one module comprises at least one neutral density filter module. 如申請專利範圍第11項所述的曝光機台對準光源裝置內的模組作動監控系統,其中當該絕對偏移值在該容許範圍內時,使該對準光源裝置繼續運作。 The exposure machine according to claim 11 is directed to the module actuation monitoring system in the light source device, wherein the alignment light source device continues to operate when the absolute offset value is within the allowable range.
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