TWI571342B - Laser welding device - Google Patents

Laser welding device Download PDF

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TWI571342B
TWI571342B TW103139207A TW103139207A TWI571342B TW I571342 B TWI571342 B TW I571342B TW 103139207 A TW103139207 A TW 103139207A TW 103139207 A TW103139207 A TW 103139207A TW I571342 B TWI571342 B TW I571342B
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laser
laser welding
welding apparatus
workpiece
light collecting
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TW103139207A
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TW201617157A (en
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黃光瑤
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財團法人工業技術研究院
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Description

雷射銲接裝置 Laser welding device

本發明是有關於一種雷射銲接技術,且特別是有關於一種雷射銲接裝置。 This invention relates to a laser welding technique and, more particularly, to a laser welding apparatus.

雷射加工應用於近二十年來蓬勃發展,其中雷射加工由於精準度高、速度快,熱效應較低,逐漸被廣泛取代傳統機械加工。由於加工的機制是使用雷射光源,而不同材料對於雷射波長有不同的吸收率,例如有些金屬(如銅或鋁)對於雷射源的反射率很高,且導熱快,不容易加工。而且,因為這樣的材料吸收率偏低,使大量的雷射能量被反射,容易反射打壞雷射加工頭。 Laser processing has been flourishing in the past two decades. Among them, laser processing has been widely replaced by traditional machining because of its high precision, high speed and low thermal effect. Since the processing mechanism uses a laser source, and different materials have different absorption rates for the laser wavelength, for example, some metals (such as copper or aluminum) have high reflectivity to the laser source and have fast heat conduction, which is not easy to process. Moreover, because such a material absorption rate is low, a large amount of laser energy is reflected, and it is easy to reflect and damage the laser processing head.

因此已經衍生出許多輔助雷射銲接之方法,如鎢極惰性氣體(tungsten inert gas,TIG)輔助雷射銲接技術、或者綠光雷射輔助IR雷射(1064nm)銲接技術,其輔助熱源主要的功能有(1)提升材料本身的溫度,以增加加工雷射源的吸收率,(2)提供額外的能量予材料吸收,以幫助加工效率。 Therefore, many methods of assisting laser welding have been derived, such as tungsten inert gas (TIG)-assisted laser welding technology or green laser-assisted IR laser (1064 nm) welding technology, and the auxiliary heat source is mainly Functions include (1) increasing the temperature of the material itself to increase the absorption rate of the processed laser source, and (2) providing additional energy to the material absorption to aid in processing efficiency.

以綠光雷射輔助IR雷射銲接技術為例,是以IR 1064nm之1000W雷射源進行銅板銲接製程,並使用70W的綠光雷射為輔 助光源,由於銅對IR 1064nm的波長吸收率很低,於常溫時只有約3%,因此使用高吸收率的綠光雷射作為輔助,雖能提升銅板的溫度,藉此提升銅板對IR 1064nm的吸收率。然而,這樣的架構需要兩種雷射源,會增加成本負擔,且有大量的的雷射能量被浪費掉,而大量的雷射反射也容易造成工安問題。 Taking the green laser-assisted IR laser welding technology as an example, the copper plate welding process is performed with an IR 1064nm 1000W laser source, supplemented by a 70W green laser. The light source, because the absorption rate of copper to IR 1064nm is very low, only about 3% at normal temperature, so the use of high-absorption green laser as an aid, although the temperature of the copper plate can be increased, thereby enhancing the copper plate to IR 1064nm Absorption rate. However, such an architecture requires two kinds of laser sources, which increases the cost burden, and a large amount of laser energy is wasted, and a large amount of laser reflection is also likely to cause work safety problems.

本發明提供一種雷射銲接裝置,能回收雷射散射反射光再入射至工件,以便充分利用雷射源能量。 The present invention provides a laser welding apparatus capable of recovering laser scattered reflected light and then incident on a workpiece to fully utilize the laser source energy.

本發明的雷射銲接裝置包括雷射加工頭以及集光裝置。雷射加工頭的入射光斑與工件之被照射部位的法線有一夾角,且所述工件對入射光斑有大於20%的反射率。所述集光裝置則對應工件而配置於與所述雷射加工頭同側,用以收集自工件的上述被照射部位反射之雷射散射反射光,並以大於上述夾角的再入射角度再次入射於工件的所述被照射部位。 The laser welding apparatus of the present invention includes a laser processing head and a light collecting means. The incident spot of the laser processing head has an angle with the normal to the illuminated portion of the workpiece, and the workpiece has a reflectivity greater than 20% for the incident spot. The light collecting device is disposed on the same side of the laser processing head as the workpiece, and collects the laser scattered reflected light reflected from the irradiated portion of the workpiece, and is incident again at a re-incidence angle greater than the angle The irradiated portion of the workpiece.

基於上述,本發明藉由將加工時,反射浪費掉的雷射源,利用集光裝置加以回收雷射散射反射光再入射至加工材料上,可以提升材料吸收率,進而提升整體雷射能量被吸收比例,所以能充分利用雷射源能量,同時也可以減少工安問題發生。 Based on the above, the present invention can improve the absorption rate of the material by using a laser source that is wasted by reflection during processing, and recovering the laser-scattered reflected light by the light collecting device, thereby increasing the absorption rate of the material, thereby improving the overall laser energy. The absorption ratio can make full use of the energy of the laser source, and it can also reduce the safety of the work.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。 The above described features and advantages of the invention will be apparent from the following description.

100‧‧‧雷射銲接裝置 100‧‧‧Laser welding device

102‧‧‧雷射加工頭 102‧‧‧Laser processing head

104‧‧‧集光裝置 104‧‧‧Light collecting device

106‧‧‧入射光斑 106‧‧‧ incident spot

108‧‧‧工件 108‧‧‧Workpiece

108a、402‧‧‧被照射部位 108a, 402‧‧‧ irradiated parts

110‧‧‧法線 110‧‧‧ normal

112‧‧‧雷射散射反射光 112‧‧‧Laser scattered reflected light

114、116、202、214、400、404、406、408‧‧‧球面反射鏡 114, 116, 202, 214, 400, 404, 406, 408‧‧‧ spherical mirrors

200、206、208、212‧‧‧平面反射鏡 200, 206, 208, 212‧‧ ‧ flat mirrors

204、210、216‧‧‧聚焦透鏡 204, 210, 216‧‧ ‧ focusing lens

θ‧‧‧夾角 θ ‧‧‧ angle

γ‧‧‧再入射角度 Γ‧‧‧re-incidence angle

圖1是依照本發明的一實施例的一種雷射銲接裝置的示意圖。 1 is a schematic view of a laser welding apparatus in accordance with an embodiment of the present invention.

圖2A至圖2F是圖1之雷射銲接裝置的各種集光裝置之變形例的示意圖。 2A to 2F are schematic views of a modification of various light collecting devices of the laser welding apparatus of Fig. 1.

圖3A是所述實施例的雷射銲接裝置之入射光斑與工件之被照射部位的法線夾角15度的模擬圖。 Fig. 3A is a simulation diagram of the angle between the incident spot of the laser welding apparatus of the embodiment and the normal of the irradiated portion of the workpiece.

圖3B是所述實施例的雷射銲接裝置之入射光斑與工件之被照射部位的法線夾角30度的模擬圖。 Fig. 3B is a simulation diagram showing an angle between the incident spot of the laser welding apparatus of the embodiment and the normal line of the irradiated portion of the workpiece.

圖4A是圖3A的集光裝置位置與曲率半徑之關係示意圖。 4A is a schematic view showing the relationship between the position of the light collecting means of FIG. 3A and the radius of curvature.

圖4B是圖3B的集光裝置位置與曲率半徑之關係示意圖。 4B is a schematic view showing the relationship between the position of the light collecting means of FIG. 3B and the radius of curvature.

圖5是模擬雷射入射光打在曲面上對於集光百分比之變化曲線圖。 Figure 5 is a graph plotting the variation of the percentage of collected light on a curved surface simulated by laser incident light.

圖6是實驗例一之再入射功率與銲寬的曲線圖。 Fig. 6 is a graph showing the re-incidence power and the welding width of Experimental Example 1.

圖7是實驗例二之再入射功率與銲寬的曲線圖。 Fig. 7 is a graph showing re-incidence power and weld width of Experimental Example 2.

圖1是依照本發明的一實施例的一種雷射銲接裝置的示意圖。 1 is a schematic view of a laser welding apparatus in accordance with an embodiment of the present invention.

請參照圖1,本實施例的雷射銲接裝置100至少包括雷射加工頭102與集光裝置104。雷射加工頭102的入射光斑106與工 件108之被照射部位108a的法線110有一夾角θ,其中工件108對入射光斑106有大於20%的反射率,如銅、鋁等高反射率的金屬材料,但本發明並不限於此。至於集光裝置104是對應工件108而配置於與雷射加工頭102同側,用以收集自工件108的被照射部位108a反射之雷射散射反射光112,並以大於夾角θ的再入射角度γ再次入射於工件108的被照射部位108a。雖然圖1中僅繪示一個集光裝置104,但是可預期在雷射加工頭102的同一側額外設置集光裝置,以收集如圖中虛線箭頭標示的反射光。而且經由設計,集光裝置104所造成的收集次數可為1次或多次。 Referring to FIG. 1, the laser welding apparatus 100 of the present embodiment includes at least a laser processing head 102 and a light collecting device 104. The incident spot 106 of the laser processing head 102 has an angle θ with the normal 110 of the illuminated portion 108a of the workpiece 108, wherein the workpiece 108 has a reflectivity greater than 20% for the incident spot 106, such as a high reflectivity metal such as copper or aluminum. Materials, but the invention is not limited thereto. The light collecting device 104 is disposed on the same side of the laser processing head 102 as the workpiece 108 for collecting the laser scattered reflected light 112 reflected from the irradiated portion 108a of the workpiece 108, and at a re-incidence angle larger than the angle θ . γ is again incident on the irradiated portion 108a of the workpiece 108. Although only one light collecting device 104 is illustrated in FIG. 1, it is contemplated that an additional light collecting device may be provided on the same side of the laser processing head 102 to collect reflected light as indicated by the dashed arrows in the figure. Moreover, by design, the number of collections caused by the light collecting means 104 can be one or more times.

在圖1中,集光裝置104包括多個集光元件,如兩個球面反射鏡114和116。因此,當雷射加工頭102的入射光斑106入射至工件108時,球面反射鏡114可以先將反射之雷射散射反射光112收斂成平行光束,再以一角度反射至另一球面反射鏡116,球面反射鏡116再以大於夾角θ的再入射角度γ入射至工件108上,以再次被工件108吸收,如此可以達成材料吸收率提升以及整體雷射能量被吸收比例提升等之功效。 In FIG. 1, light collecting device 104 includes a plurality of light collecting elements, such as two spherical mirrors 114 and 116. Therefore, when the incident spot 106 of the laser processing head 102 is incident on the workpiece 108, the spherical mirror 114 can first converge the reflected laser scattered reflected light 112 into a parallel beam and then reflect at an angle to the other spherical mirror 116. The spherical mirror 116 is incident on the workpiece 108 at a re-incidence angle γ greater than the angle θ to be absorbed by the workpiece 108 again, so that the material absorption rate is improved and the overall laser energy is increased by the absorption ratio.

根據設計需求,集光裝置104也可以有多種變形例,請參照圖2A至圖2F。 According to the design requirements, the light collecting device 104 can also have various modifications. Please refer to FIG. 2A to FIG. 2F.

在圖2A與圖2B中,集光元件包括至少一平面反射鏡200以及至少一球面反射鏡202。圖2A的球面反射鏡202是接收入射光斑106自工件108反射的雷射散射反射光112,圖2B則是平面反射鏡200接收入射光斑106自工件108反射的雷射散射反射光 112。 In FIGS. 2A and 2B, the light collecting element includes at least one planar mirror 200 and at least one spherical mirror 202. The spherical mirror 202 of FIG. 2A is the laser-scattered reflected light 112 that receives the incident spot 106 from the workpiece 108, and FIG. 2B is the laser-reflected reflected light that the planar mirror 200 receives from the workpiece 108 by the incident spot 106. 112.

在圖2C與圖2D中,集光元件包括至少一聚焦透鏡204以及多個平面反射鏡206和208。圖2C之集光元件具有單聚焦透鏡204配合雙平面反射鏡206和208的架構,聚焦透鏡204放置處稍遠於工件108,可讓反射的雷射散射反射光112通過聚焦透鏡204後,呈收斂聚焦狀況,再以平面反射鏡206和208導到與工件108的被照射部位108a重疊。圖2D之集光元件具有大直徑之單片聚焦透鏡204,左右各收集一部分反射光,經兩面共軛的平面反射鏡206和208,分成兩道再入射光照射被照射部位108a。 In Figures 2C and 2D, the light collecting element includes at least one focusing lens 204 and a plurality of planar mirrors 206 and 208. The light collecting element of FIG. 2C has a single focusing lens 204 that cooperates with the dual plane mirrors 206 and 208. The focusing lens 204 is placed slightly away from the workpiece 108, allowing the reflected laser scattered reflected light 112 to pass through the focusing lens 204. The focus condition is converged, and the plane mirrors 206 and 208 are again guided to overlap the illuminated portion 108a of the workpiece 108. The light collecting element of Fig. 2D has a large-diameter single-piece focusing lens 204, and a part of the reflected light is collected on the left and right sides, and the two-sided conjugated plane mirrors 206 and 208 are divided into two re-incident light to illuminate the irradiated portion 108a.

圖2E所示的集光元件則包括雙聚焦透鏡204、210與雙平面反射鏡206、208的組合,利用聚焦透鏡204將雷射散射反射光112聚成平行光並經由雙平面反射鏡206和208回到再入射的角度後,經聚焦透鏡210聚焦照射被照射部位108a。 The light collecting element shown in FIG. 2E then includes a combination of dual focusing lenses 204, 210 and biplanar mirrors 206, 208, which utilizes focusing lens 204 to concentrate the laser scattered reflected light 112 into parallel light and via biplanar mirror 206 and After returning to the angle of re-injection 208, the irradiated portion 108a is focused by the focusing lens 210.

在圖2F中,集光元件包括一平面反射鏡212、一球面反射鏡214以及一聚焦透鏡216,先以單片聚焦透鏡216將雷射散射反射光112聚成平行光,反射後以球面反射鏡214聚焦再入射。 In FIG. 2F, the light collecting element includes a plane mirror 212, a spherical mirror 214, and a focusing lens 216. The laser scattered reflected light 112 is first collected into parallel light by a single focusing lens 216, and reflected by a spherical surface. The mirror 214 is focused and re-incident.

在本實施例中,集光裝置104只要可以收集散射反射光,達到再聚焦入射,可以有各種架構組合,不限於上述記載。如以精簡體積與抑制熱透鏡效應的觀點來看,可採用數個金屬的球面反射鏡。 In the present embodiment, the light collecting means 104 may have various combinations of structures as long as it can collect the scattered reflected light and achieve refocusing incidence, and is not limited to the above description. A plurality of metal spherical mirrors can be employed from the viewpoint of reducing the volume and suppressing the thermal lens effect.

此外,雷射加工頭102的入射光斑106與工件108之被照射部位108a的法線110間的夾角θ經ZEMAX模擬,較佳在15 度~30度之間。圖3A與圖3B分別是入射光斑與工件之被照射部位的法線夾角15度與30度的模擬圖。在圖3A中顯示的是經集光裝置(兩個球面反射鏡114、116)再入射後,其聚焦光斑之路徑;而聚焦光斑的尺寸與能量分佈經ZEMAX光學模擬,可以觀察到經過集光裝置104再入射至工件108上之光斑,可以達到初始入射光斑約略相同之尺寸,不會因為光斑擴大而光強度降低,導致效果不佳的現象。 Further, the angle θ between the incident spot 106 of the laser processing head 102 and the normal 110 of the irradiated portion 108a of the workpiece 108 is simulated by ZEMAX, preferably between 15 and 30 degrees. 3A and 3B are simulation diagrams of the incident spot and the normal angle of the irradiated portion of the workpiece at 15 degrees and 30 degrees, respectively. Shown in Figure 3A is the path of the focused spot after re-incidence by the concentrating device (two spherical mirrors 114, 116); and the size and energy distribution of the focused spot are optically simulated by ZEMAX, and it is observed that the light is collected. The spot that is incident on the workpiece 108 by the device 104 can reach an approximately the same size as the initial incident spot, and the light intensity is not lowered due to the expansion of the spot, resulting in a poor effect.

在圖3B中顯示的是夾角θ達30度之聚焦光斑的模擬路徑,且經ZEMAX光學模擬可以觀察到經過集光裝置104再入射至工件108上之光斑尺寸大於初始入射光斑,且形狀略呈扁長形。因此,再次入射的再入射角度γ較佳是在45度以下。 Shown in Figure 3B is the simulated path of the focused spot with an angle θ of 30 degrees, and the ZEMAX optical simulation can observe that the spot size incident on the workpiece 108 through the light collecting device 104 is larger than the initial incident spot, and the shape is slightly Flat long. Therefore, the re-incidence angle γ incident again is preferably 45 degrees or less.

至於集光裝置的集光元件(如為圖3A與圖3B所示的兩個球面反射鏡)的曲率半徑,根據散射光角度與強度分佈,即能量為正比cos(θ)關係,可知球面反射鏡的尺寸及其離散射光源的距離會決定收集到多少角度之能量。也就是說,聚焦鏡(如球面反射鏡)的尺寸與離散射光源的距離會決定集光能量百分比;譬如球面反射鏡的曲率半徑為球面反射鏡的中心與被照射部位的距離的兩倍。 As for the radius of curvature of the light collecting elements of the light collecting device (such as the two spherical mirrors shown in FIGS. 3A and 3B), the spherical reflection is known according to the relationship between the scattered light angle and the intensity distribution, that is, the energy is proportional to cos(θ). The size of the mirror and its distance from the scattered light source determine how much energy is collected. That is, the size of the focusing mirror (such as a spherical mirror) and the distance from the scattered light source determine the percentage of the collected light energy; for example, the radius of curvature of the spherical mirror is twice the distance between the center of the spherical mirror and the illuminated portion.

舉例來說,圖4A是圖3A之集光裝置位置與曲率半徑之關係示意圖。在圖4A中,球面反射鏡400的中心與被照射部位402的距離為50mm,所以經設置的第一面球面反射鏡400的曲率半徑可為100mm、尺寸則例如2英吋。球面反射鏡400經過計算 約可以收到±20度散射角的散射光。若順時針旋轉第一面球面反射鏡400,可以增加接收散射光的散射角,但是也會增加再入射的角度,並可以依此數據做等比例放大。然後,待光線經第二面球面反射鏡404再入射被照射部位402時,其中心與被照射部位402的距離為103mm,所以第二面球面反射鏡404的曲率半徑可為206mm、尺寸則例如2英吋。 For example, FIG. 4A is a schematic diagram showing the relationship between the position of the light collecting device of FIG. 3A and the radius of curvature. In FIG. 4A, the distance between the center of the spherical mirror 400 and the portion to be irradiated 402 is 50 mm, so that the first spherical mirror 400 provided may have a radius of curvature of 100 mm and a size of, for example, 2 inches. Spherical mirror 400 is calculated Approximately ±20 degrees of scattered light can be received. If the first spherical mirror 400 is rotated clockwise, the scattering angle of the received scattered light can be increased, but the angle of re-incidence is also increased, and the data can be scaled up according to the data. Then, when the light is incident on the irradiated portion 402 through the second spherical mirror 404, the distance between the center and the irradiated portion 402 is 103 mm, so the radius of curvature of the second spherical mirror 404 can be 206 mm, and the size is, for example, 2 miles.

圖4B是圖4A之集光裝置位置與曲率半徑之關係示意圖。在圖4B中,第一面球面反射鏡406的中心與被照射部位402的距離為50mm,所以經設置的第一面球面反射鏡406的曲率半徑可為100mm、尺寸則例如1英吋。因為球面反射鏡與光軸有一夾角,經過計算,約可以收到±25度散射角的散射光。若順時針旋轉第一面球面反射鏡406,可以增加接收散射光的散射角,但是也會增加再入射的角度,並可以依此數據做等比例放大。待光線經第二面球面反射鏡408再入射被照射部位402時,其中心與被照射部位402的距離為46mm,所以第二面球面反射鏡408的曲率半徑可為92mm、尺寸則例如1英吋。 4B is a schematic view showing the relationship between the position of the light collecting device of FIG. 4A and the radius of curvature. In FIG. 4B, the distance between the center of the first face spherical mirror 406 and the portion to be irradiated 402 is 50 mm, so that the first face spherical mirror 406 provided may have a radius of curvature of 100 mm and a size of, for example, 1 inch. Because the spherical mirror has an angle with the optical axis, it is calculated that it can receive about ±25 degrees of scattered light. If the first spherical mirror 406 is rotated clockwise, the scattering angle of the received scattered light can be increased, but the angle of re-incidence is also increased, and the data can be scaled up according to the data. When the light is incident on the illuminated portion 402 through the second spherical mirror 408, the distance between the center and the illuminated portion 402 is 46 mm, so the radius of curvature of the second spherical mirror 408 can be 92 mm, and the size is, for example, 1 inch. Inches.

以上述雙球面反射鏡架構而言,每一種入射角會對應一較適合的架構參數,包含曲率半徑、球面鏡尺寸、球面鏡間距、再入射角等。入射角度(即圖1之夾角θ)越大,則使用的球面反射鏡尺寸要越大,再入射角(即圖1之再入射角度γ)也要越大,兩個球面反射鏡的間距也要越大,模組尺寸也越大。放大可以增加模組與工件的距離,有利於加入如吹氣裝置或測高模組等雷射焊 接裝置具備的其他設備。 In the above double spherical mirror architecture, each incident angle corresponds to a suitable structural parameter, including a radius of curvature, a spherical mirror size, a spherical mirror spacing, a re-incidence angle, and the like. The larger the angle of incidence (ie, the angle θ of Figure 1), the larger the size of the spherical mirror used, and the larger the angle of re-injection (ie, the re-incidence angle γ of Figure 1), the spacing between the two spherical mirrors. The larger the size, the larger the module size. Amplification can increase the distance between the module and the workpiece, and is beneficial for adding other devices such as a blower or a height measuring module.

另外,如果集光裝置的集光元件是如圖2A與圖2B的一平面反射鏡以及一球面反射鏡的架構,則球面反射鏡的曲率半徑可依成像公式修改,以滿足下式: In addition, if the light collecting elements of the light collecting device are the structures of a plane mirror and a spherical mirror as shown in FIGS. 2A and 2B, the radius of curvature of the spherical mirror can be modified according to an imaging formula to satisfy the following formula:

其中p為球面反射鏡的中心與被照射部位的距離、q為平面反射鏡的中心與被照射部位的距離,且球面反射鏡的曲率半徑R為2倍的f,其中f為焦距。 Where p is the distance between the center of the spherical mirror and the illuminated portion, q is the distance between the center of the planar mirror and the illuminated portion, and the radius of curvature R of the spherical mirror is twice, where f is the focal length.

以上實施例均假設工件的表面為平面,但是本發明並不限於此。經使用ZEMAX模擬入射光打在曲面上,並觀察曲面對於集光比率的變化,可得到圖5的曲線圖。因此,圖1的工件108的表面如具有大於30mm的曲率半徑,則仍可保有高度集光效率。 The above embodiments all assume that the surface of the workpiece is a flat surface, but the present invention is not limited thereto. The graph of Figure 5 can be obtained by simulating incident light on a curved surface using ZEMAX and observing the change in the ratio of the surface to the collected light. Thus, if the surface of the workpiece 108 of Figure 1 has a radius of curvature greater than 30 mm, a high collection efficiency can still be maintained.

以下列舉實驗來驗證本發明的功效,但本發明之範圍並不侷限於以下實驗。 The experiments are enumerated below to verify the efficacy of the present invention, but the scope of the present invention is not limited to the following experiments.

實驗例一 Experimental example one

取一銅試片作為工件,以輸入雷射功率為137W的能量以及加熱速率為200mm/min進行照射,發現使用無集光裝置只有雷射加工頭的裝置,在銅試片表面無明顯焊道。反之,具有如圖2D的集光裝置之雷射銲接裝置且入射角度(即夾角θ)約為30度左右,會在銅試片表面留下明顯焊道,並以高功率光功率計(廠牌Ophir,Detector:Thmeral sensor-L1500W;Powermeter:NOVA II)紀 錄其再入射雷射功率,可製得圖6所示的再入射功率與銲寬的曲線圖。 Taking a copper test piece as a workpiece, the input laser power of 137W and the heating rate of 200mm/min were used to illuminate. It was found that the device with only the laser processing head without the light collecting device had no obvious bead on the surface of the copper test piece. . On the contrary, the laser welding device with the light collecting device of Fig. 2D and the incident angle (i.e., the angle θ ) is about 30 degrees, which will leave a clear bead on the surface of the copper test piece and be used as a high power optical power meter. The brand Ophir, Detector: Thmeral sensor-L1500W; Powermeter: NOVA II) records its re-incident laser power, and can obtain the graph of re-incidence power and welding width as shown in Fig. 6.

在圖6中,因為銅試片本身導熱快,會導致溫度不穩定,因此從雷射照射10mm的焊道處開始記錄其變化。由圖6可知,焊寬變化率在-7%~9%之間、再入射雷射功率的變化率在-5%~8%之間。再入射雷射功率的平均值除以輸入雷射功率,得到再入射雷射功率比例約為38%。 In Fig. 6, since the copper test piece itself conducts heat quickly, it causes temperature instability, so the change is recorded from the laser-welded 10 mm weld bead. It can be seen from Fig. 6 that the rate of change of the welding width is between -7% and 9%, and the rate of change of the re-incident laser power is between -5% and 8%. The average value of the re-incident laser power is divided by the input laser power to obtain a re-incident laser power ratio of approximately 38%.

實驗例二 Experimental example 2

取一鋁試片作為工件,分別以輸入雷射功率為405W與426W的能量以及加熱速率為200mm/min進行照射,發現使用無集光裝置只有雷射加工頭的裝置,在鋁試片表面無明顯焊道。反之,具有如圖4B的集光裝置之雷射銲接裝置,無論是405W與426W的能量,都會在鋁試片表面留下明顯焊道,並以儀器紀錄其再入射雷射功率,可製得圖7所示的再入射功率與銲寬的曲線圖。 An aluminum test piece was taken as a workpiece, and the input laser power was 405 W and 426 W, respectively, and the heating rate was 200 mm/min. It was found that the device using only the laser processing head without the light collecting device had no surface on the aluminum test piece. Obvious weld bead. Conversely, a laser welding device having a light collecting device as shown in FIG. 4B, regardless of the energy of 405 W and 426 W, will leave an obvious weld bead on the surface of the aluminum test piece, and the device can record its re-incident laser power. A graph of re-incidence power and weld width shown in FIG.

由圖7可知,焊寬變化率在-5%~5%之間、再入射雷射功率的變化率在-4%~5%之間。再入射雷射功率的平均值除以輸入雷射功率的再入射雷射功率比例為61%。 It can be seen from Fig. 7 that the rate of change of the welding width is between -5% and 5%, and the rate of change of the re-incident laser power is between -4% and 5%. The ratio of the re-incident laser power of the average of the re-incident laser power divided by the input laser power is 61%.

由上述實驗例可證明,集光裝置可以收集散射反射光源約38%(銅)和61%(鋁),與無集光裝置比較,可以有效產生熔融區。再入射功率與焊寬均穩定,且成本低、架構簡單並且易與雷射加工頭整合。 It can be proved from the above experimental examples that the light collecting device can collect about 38% (copper) and 61% (aluminum) of the scattered reflection light source, and can effectively generate the melting zone as compared with the non-light collecting device. The re-incidence power and the welding width are both stable, low in cost, simple in structure, and easy to integrate with the laser processing head.

實驗例三 Experimental example three

為比較本發明與綠光雷射輔助IR雷射銲接,先估算綠光雷射輔助IR雷射銲接的總吸收能量。 In order to compare the invention with green laser assisted IR laser welding, the total absorbed energy of the green laser assisted IR laser welding is first estimated.

首先,IR雷射入射能量假設有1000W,因為銅對IR雷射的吸收率只有13%,所以吸收能量只有(1000×13%=)130W。綠光雷射則提供70W的入射能量,而銅對綠光雷射的吸收率為40%,所以吸收能量為(70×40%=)28W。所以,綠光雷射輔助IR雷射銲接的總吸收能量為158W。 First, the incident energy of the IR laser is assumed to be 1000 W. Since the absorption rate of copper to the IR laser is only 13%, the absorbed energy is only (1000 × 13% =) 130 W. The green laser provides 70W of incident energy, while the copper absorbs 40% of the green laser, so the absorbed energy is (70 × 40% =) 28W. Therefore, the total absorbed energy of the green laser-assisted IR laser welding is 158W.

若以實施例一的方式集光再入射,則使用IR雷射入射的吸收能量同樣是130W。但是,經由集光裝置收集的雷射能量約有(1000-130=)870W,再入射雷射功率比例實測為38%(請見實施例一),所以再入射至銅試片的吸收能量有(870×38%×13%=)43W,因此總吸收能量可提升至173W,比綠光輔助銲接的總吸收能量高出9.5%。 If the light is collected and incident again in the first embodiment, the absorbed energy incident using the IR laser is also 130 W. However, the laser energy collected by the light collecting device is about (1000-130=) 870 W, and the ratio of re-incident laser power is 38% (see Example 1), so the absorbed energy incident on the copper test piece is (870 × 38% × 13% =) 43W, so the total absorbed energy can be increased to 173W, which is 9.5% higher than the total absorbed energy of green-light assisted welding.

綜上所述,本發明藉由集光裝置能將加工時散射反射的雷射源加以回收再入射至工件,以提升材料吸收率,進而提升整體雷射能量被吸收比例,不但能充分利用雷射源能量,同時也可以減少工安問題發生。 In summary, the present invention can recover the laser source scattered and reflected during processing by the light collecting device and then inject it into the workpiece to improve the absorption rate of the material, thereby improving the absorption ratio of the overall laser energy, and not only fully utilizing the lightning. The source energy can also reduce the safety of the work.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.

100‧‧‧雷射銲接裝置 100‧‧‧Laser welding device

102‧‧‧雷射加工頭 102‧‧‧Laser processing head

104‧‧‧集光裝置 104‧‧‧Light collecting device

106‧‧‧入射光斑 106‧‧‧ incident spot

108‧‧‧工件 108‧‧‧Workpiece

108a‧‧‧被照射部位 108a‧‧‧Immediated area

110‧‧‧法線 110‧‧‧ normal

112‧‧‧雷射散射反射光 112‧‧‧Laser scattered reflected light

114、116‧‧‧球面反射鏡 114, 116‧‧‧ spherical mirror

θ‧‧‧夾角 θ ‧‧‧ angle

γ‧‧‧再入射角度 Γ‧‧‧re-incidence angle

Claims (13)

一種雷射銲接裝置,包括:雷射加工頭,其入射光斑與工件之被照射部位的法線有一夾角,該工件對該入射光斑有大於20%的反射率;以及集光裝置,對應該工件而配置於與該雷射加工頭同側,用以收集自該工件的該被照射部位反射之雷射散射反射光,並以大於該夾角的再入射角度再次入射於該工件的該被照射部位。 A laser welding apparatus comprising: a laser processing head having an incident spot at an angle to a normal of a portion to be irradiated of the workpiece, the workpiece having a reflectance greater than 20% of the incident spot; and a light collecting device corresponding to the workpiece And disposed on the same side of the laser processing head for collecting the laser scattered reflected light reflected from the irradiated portion of the workpiece, and incident on the irradiated portion of the workpiece again at a re-incidence angle greater than the angle . 如申請專利範圍第1項所述之雷射銲接裝置,其中該夾角在15度~30度之間。 The laser welding apparatus of claim 1, wherein the angle is between 15 degrees and 30 degrees. 如申請專利範圍第1項所述之雷射銲接裝置,其中該再入射角度在45度以下。 The laser welding apparatus of claim 1, wherein the re-incidence angle is 45 degrees or less. 如申請專利範圍第1項所述之雷射銲接裝置,其中該集光裝置所造成的收集次數至少為1次。 The laser welding apparatus of claim 1, wherein the collecting means causes the number of collections to be at least one. 如申請專利範圍第1項所述之雷射銲接裝置,其中該集光裝置包括多數個集光元件。 The laser welding apparatus of claim 1, wherein the light collecting means comprises a plurality of light collecting elements. 如申請專利範圍第5項所述之雷射銲接裝置,其中該些集光元件包括多數個球面反射鏡。 The laser welding apparatus of claim 5, wherein the light collecting elements comprise a plurality of spherical mirrors. 如申請專利範圍第6項所述之雷射銲接裝置,其中各該球面反射鏡的曲率半徑為該球面反射鏡的中心與該被照射部位的距離的兩倍。 The laser welding apparatus of claim 6, wherein each of the spherical mirrors has a radius of curvature that is twice the distance between a center of the spherical mirror and the irradiated portion. 如申請專利範圍第5項所述之雷射銲接裝置,其中該些集光元件包括至少一平面反射鏡以及至少一球面反射鏡。 The laser welding apparatus of claim 5, wherein the light collecting elements comprise at least one planar mirror and at least one spherical mirror. 如申請專利範圍第8項所述之雷射銲接裝置,其中該球面反射鏡的曲率半徑滿足下式: 其中p為該球面反射鏡的中心與該被照射部位的距離、以及q為該平面反射鏡的中心與該被照射部位的距離,且該球面反射鏡的該曲率半徑為2倍的f。 The laser welding apparatus of claim 8, wherein the radius of curvature of the spherical mirror satisfies the following formula: Where p is the distance between the center of the spherical mirror and the illuminated portion, and q is the distance between the center of the planar mirror and the illuminated portion, and the radius of curvature of the spherical mirror is twice the f. 如申請專利範圍第5項所述之雷射銲接裝置,其中該些集光元件包括多數個平面反射鏡以及至少一聚焦透鏡。 The laser welding apparatus of claim 5, wherein the light collecting elements comprise a plurality of planar mirrors and at least one focusing lens. 如申請專利範圍第5項所述之雷射銲接裝置,其中該些集光元件包括至少一平面反射鏡、至少一球面反射鏡以及至少一聚焦透鏡。 The laser welding apparatus of claim 5, wherein the light collecting elements comprise at least one planar mirror, at least one spherical mirror, and at least one focusing lens. 如申請專利範圍第1項所述之雷射銲接裝置,其中該工件的表面具有大於30mm的曲率半徑。 The laser welding apparatus of claim 1, wherein the surface of the workpiece has a radius of curvature greater than 30 mm. 如申請專利範圍第1項所述之雷射銲接裝置,其中該工件的表面為平面。 The laser welding apparatus of claim 1, wherein the surface of the workpiece is a flat surface.
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