TWI567951B - Active device array substrate - Google Patents

Description

Active device array substrate

The present invention relates to an active device array substrate, and more particularly to an active device array substrate having a repair line.

In recent years, although the flat panel display technology has matured, the components of the display panel, such as the active device array substrate, inevitably produce some defects during the manufacturing process. When an open circuit is generated for the signal line for transmitting the signal to the pixel, the pixel located on the other side of the open circuit may not receive the signal and form a line defect, thereby causing the display panel to exhibit an abnormal picture. In the case of considering the manufacturing cost, the line defect is generally repaired by repairing the repair signal from the other end of the signal line by a single repair line to solve the pixel located on the other side of the open circuit. The unit was unable to receive the signal.

However, the open circuit may occur on any signal line, and the position of each signal line on the active device array substrate is different, so the transmission path of the repair signal will be different according to the open position, that is, the repaired The impedance value of the repair line will be different. When the repaired line has a resistance value that is too large or too small, the repair signal is transmitted to the other end of the signal line and does not match the original signal. The display panel will have an abnormal display of light lines.

The present invention provides an active device array substrate that provides a good repair signal to avoid the problem of impedance mismatch.

The active device array substrate of the present invention comprises a substrate, a pixel array, a plurality of signal lines, a driving device, a first repairing line, a plurality of second repairing lines, and a third repairing line. The substrate has a display area and a peripheral circuit area. The pixel array is disposed in the display area. The plurality of signal lines are electrically connected to the pixel array, and each of the signal lines extends from the display area to the peripheral circuit area. The driving device is disposed in the peripheral circuit region and electrically connected to the signal line. The first repairing line is disposed in the peripheral circuit area and electrically connected to the driving device, wherein the first repairing line overlaps with one end of the signal line to form a plurality of first pre-patching points. A plurality of second repair lines are disposed in the peripheral circuit region, wherein the first repair line overlaps with one end of the second repair line to form a plurality of second pre-patching points. The third repairing line is disposed in the peripheral circuit region, wherein the third repairing line overlaps with one end of the signal line to form a plurality of third pre-patching points. The third repair line overlaps one end of the second repair line to form a plurality of fourth pre-patching points.

The active device array substrate of the present invention comprises a substrate, a pixel array, a plurality of signal lines, a driving device, a first repairing line, a plurality of second repairing lines, and a third repairing line. The substrate has a display area and a peripheral circuit area. The pixel array is disposed in the display area. The plurality of signal lines are electrically connected to the pixel array, and each of the signal lines extends from the display area to the peripheral circuit area, wherein one of the signal lines has an open circuit. Drive configuration In the peripheral circuit area, and electrically connected to the signal line. The first repairing line is disposed in the peripheral circuit region and electrically connected to the driving device, wherein the first repairing line overlaps with one end of the signal line, and the first repairing line and the signal line having the open circuit have an intersection A fusion joint. A plurality of second repairing lines are disposed in the peripheral circuit region, wherein the first repairing line overlaps with one end of the second repairing line, and the intersection of the first repairing line and the second repairing line has at least one second welding point. The third repairing line is disposed in the peripheral circuit area, wherein the third repairing line overlaps with one end of the signal line, and the third repairing line has a third welding point at the intersection of the signal line having the open circuit. The third repairing line overlaps with one end of the second repairing line, and the intersection of the third repairing line and the second repairing line has at least one fourth welded joint, so that at least one of the first repairing line and the second repairing line A second repair line and a third repair line are electrically connected to the signal line having an open circuit.

Based on the above, the active device array substrate of the present invention is provided with a repairing line. When the repair signal line is open, the signal line, the first repairing line, the second repairing line, and the third repairing line, which are open, can be welded to each other. So that the repair signal can be provided to the pixel electrode through the other end of the signal line where the open circuit is generated, wherein the number of the second repair line can be determined according to the position of the open circuit on the active device array substrate, and can be as needed The impedance value adjusts the number of the second repair lines to be matched to match the impedance values of the signal lines in the active device array substrate. In this way, the active device array substrate of the present invention can provide a good repair signal, so that the active device array substrate has a good display quality after being assembled into a display panel.

In order to make the above features and advantages of the present invention more apparent, the following is a special The embodiments are described in detail below in conjunction with the drawings.

10, 20‧‧‧Active component array substrate

100‧‧‧Substrate

102‧‧‧ display area

104‧‧‧ peripheral circuit area

120‧‧‧ pixel array

132‧‧‧Information line

134‧‧‧ scan line

140‧‧‧Data line drive

142‧‧‧Scan line driver

151, 251‧‧‧ first repair line

152, 252‧‧‧ second repair line

153, 253‧‧‧ third repair line

161, 261‧‧‧ first pre-repair point

162, 262‧‧‧ second pre-repair point

163, 263‧‧‧ third pre-repair point

164, 264‧‧‧ fourth pre-repair point

I, II, III, IV‧‧‧ areas

D‧‧‧汲

E‧‧‧ pixel electrodes

G‧‧‧ gate

L1, W1‧‧‧ first fusion joint

L2, W2‧‧‧ second fusion joint

L3, W3‧‧‧ third welding joint

L4, W4‧‧‧ fourth welding joint

P1, P2, P3, P4‧‧‧ open circuit

S‧‧‧ source

T‧‧‧ active components

U‧‧‧ pixel unit

1 is a schematic view showing the structure of an active device array substrate according to a first embodiment of the present invention.

FIG. 2 and FIG. 3 are schematic diagrams showing the structure of the active device array substrate of FIG. 1 when repaired under different data lines.

4 is a schematic structural view of an active device array substrate according to a second embodiment of the present invention.

FIG. 5 and FIG. 6 are schematic diagrams showing the architecture of the active device array substrate of FIG. 4 when repaired under different data lines.

1 is a schematic view showing the structure of an active device array substrate according to a first embodiment of the present invention. Referring to FIG. 1, the active device array substrate 10 includes a substrate 100, a pixel array 120, a plurality of signal lines (here, the signal lines are data lines 132), a plurality of scanning lines 134, and a driving device (here, the driving device is The data line driving device 140), the scanning line driving device 142, the first repairing line 151, the plurality of second repairing lines 152, and the third repairing line 153.

In detail, the substrate 100 has a display area 102 and a peripheral circuit area 104. Each data line 132 and each scan line 134 extend from the display area 102 to the peripheral power Road area 104. The data line driving device 140 is disposed in the peripheral circuit region 104 and electrically connected to the data line 132. The scan driving device 142 is disposed in the peripheral circuit region 104 and electrically connected to the scan line 134. The first repairing line 151 is disposed in the peripheral circuit area 104 and electrically connected to the data line driving device 140. The first repairing line 151 overlaps with one end of each data line 132 to form a plurality of first pre-patching points 161. . A plurality of second repair lines 152 are disposed in the peripheral circuit region 104, wherein the first repair lines 151 overlap one end of each of the second repair lines 152 to form a plurality of second pre-fix points 162. The third repairing line 153 is disposed in the peripheral circuit region 104, wherein the third repairing line 153 overlaps with one end of each data line 132 to form a plurality of third pre-patching points 163, and a third repairing line 153 and each One ends of the two repair lines 152 overlap to form a plurality of fourth pre-patching points 164. At this time, the data line 132, the first repairing line 151, the second repairing line 152, and the third repairing line 153 are electrically connected to each other.

As shown in FIG. 1, the first repairing line 151 and the third repairing line 153 are exemplified by a single number. In this way, a first repair line 151 and a third repair line 153 can be repaired corresponding to one data line 132. Of course, the invention is not limited thereto. In other embodiments, the first repairing line 151 and the third repairing line 153 may be two, three, or other possible numbers. When both the first repairing line 151 and the third repairing line 153 are two, the two data lines 132 can be repaired. When the first repairing line 151 and the third repairing line 153 are both three, the three data lines 132 can be repaired. In other words, the number of repairable data lines 132 can be determined by the number of first repair lines 151 and third repair lines 153. Further, as shown in FIG. 1, the second repair line 152 of the present embodiment is The number of four strips is taken as an example, and the four second repairing lines 152 correspond to one first repairing line 151 and one third repairing line 153. Of course, the invention is not limited thereto. In other embodiments, the second repair line 152 can be two, three, five, or other possible quantities.

In addition to the above, the pixel array 120 is disposed in the display area 102, and the data line 132 and the scan line 134 are electrically connected to the pixel array 120. In detail, the pixel array 120 includes a plurality of pixel units U, each of which includes an active element T and a pixel electrode E electrically connected to the active element T. The active device T includes a gate G, a source S, and a drain D, and the pixel electrode E is electrically connected to the active device T through the drain D. Each pixel unit U is connected to a data line 132 and a scan line 134, wherein the gate G is connected to the scan line 134, and the data line 132 is connected to the source S. For one of the data lines 132, when the data line driving device 140 provides a data signal to one end of the data line 132, the data signal is sequentially transmitted to the other end of the same data line 132, and is provided through the matching scanning line 134. The scanning signal, the data signal is sequentially transmitted to the pixel unit U arranged on the same data line 132, and the data signal can be transmitted to the pixel electrode E via the active element T. In this way, when the active device array substrate 10 is subsequently assembled into a display panel, the screen can be displayed.

The plurality of second repair lines 152 are formed of a single metal material, and may be, for example, the same metal material as the data line 132. In this way, a plurality of second repair lines 152 can be realized on the substrate 100 while the data line 132 is being fabricated without adding a new process step. On the other hand, the first repair line 151 and the first The three repair lines 153 can be selected from the same metal material as the scan lines 134. In this way, the first repairing line 151 and the third repairing line 153 can be realized on the substrate 100 while the scanning line 134 is being formed without adding a new processing step.

The repair method for the damaged data line 132 is exemplified as follows by applying the active element array substrate 10 described above. FIG. 2 and FIG. 3 are schematic diagrams showing the structure of the active device array substrate of FIG. 1 when repaired under different data lines.

First, referring to FIG. 2, when the data line 132 of the active device array substrate 10 is opened, the data line 132, the first repairing line 151, the second repairing line 152, and the third repairing of the open circuit P1 are generated. The wires 153 are electrically connected to each other to form a complete repair signal transmission path (as indicated by a thick arrow) so that the data signal can be transmitted to the pixel unit U located on the other side of the open circuit P1.

In detail, as shown in FIG. 2, the data line 132, the first repairing line 151, the second repairing line 152, and the third repairing line 153 in which the open circuit P1 is generated are electrically connected to each other, and the data of the open circuit P1 can be generated by welding. The first pre-patching point 161, the second pre-patching point 162, the third pre-patching point 163, and the fourth pre-patching point 164 corresponding to the line 132 are implemented. In more detail, the first pre-patching point 161 at the intersection of the first repairing line 151 and the data line 132 having the open path P1 may be welded to form the first welding point L1 such that the first repairing line 151 has The data line 132 of the open circuit P1 is electrically connected; the second pre-fixed point 162 at the intersection of the first repairing line 151 and the second repairing line 152 is welded to form a second welding point L2, so that the first repairing line 151 is electrically connected to the second repairing line 152; and welding the third pre-fixed point 163 at the intersection of the third repairing line 153 and the data line 132 having the open path P1 to form a first The third bonding point L3 is electrically connected to the data line 132 having the open circuit P1; and the fourth pre-fixing point 164 at the intersection of the third repairing line 153 and the second repairing line 152 is performed. The welding can form a fourth welding point L4 to electrically connect the third repairing line 153 with the second repairing line 152. In this way, the data signal is transmitted to all the pixel units U corresponding to the data line 132 having the open circuit P1 to drive the pixel units U to operate normally.

In the embodiment, the active device array substrate 10 has a plurality of second repairing lines 152, so that the number of the second repairing lines 152 can be adjusted according to the position of the data line 132 where the open circuit P1 is generated to adjust the whole. The impedance value of the second repair line 152, whereby the active device array substrate 10 can provide a good repair signal and achieve an effective repair effect. In detail, as shown in FIG. 2, the number of the second repairing lines 152 is four, so the area of the pixel array 120 distributed in the display area 102 can be divided into four areas: area I, area II, area III, and area IV. The area, in which the division of the regions I, II, III, and IV is determined by the length of the transmission path of the repair signal, that is, the magnitude of the impedance required for the repaired repair line.

In more detail, compared with the area II, the area III, and the area IV, when the open circuit occurs in the area I, the transmission path of the repair signal is short, so that a second repair line 152 is fused (ie, a corresponding one is formed). The second fusion splice point L2 and the fourth fusion splice point L4) are such that the data line 132 of the open circuit P1 after repair has an impedance value matching the other data lines 132. In this way, the repair signal is transmitted to the other end of the data line 132 where the open circuit P1 is generated, and can be matched with the original signal without generating line defects. Compared to Zone I, Zone II, and Zone III, when When the path occurs in the area IV, the transmission path of the repair signal is long, so that the four second repair lines 152 (ie, the corresponding four second weld points L2 and the fourth fourth weld points L4) can be reduced by welding. The impedance value of the overall second repair line 152. In this way, the data line 132 of the open circuit P1 after the repair can have impedance values matched with the other data lines 132, thereby avoiding line defects. Similarly, compared with the area I, when the open circuit occurs in the area II, the transmission path of the repair signal is long, so that the two second repair lines 152 can be welded (ie, the corresponding two second fusion points L2 are formed and Two fourth splice points L4) to obtain a good repair signal. Similarly, compared with the area II, when the open circuit occurs in the area III, the transmission path of the repair signal is long, so that the three second repair lines 152 can be welded (ie, the corresponding three second welded points L2 and three are formed). A fourth welding point L4) to obtain a good repair signal.

Specifically, referring again to FIG. 2, when the open circuit P1 occurs in the area IV, a first pre-fixed point 161 and four second pre-fixed points 162 corresponding to the data line 132 of the open circuit P1 are generated by welding. a third pre-repair point 163 and four fourth pre-repair points 164 to form a first splice point L1, four second splice points L2, a third splice point L3, and four fourth splice points L4. The repair signal can be transmitted to the other end of the data line 132 where the open circuit P1 occurs and matched with the original signal. That is, after the damaged data line 132 is repaired by using a first repair line 151, four second repair lines 152, and a third repair line 153 to be connected to the data line 132, the first repair line 151 can be avoided. The second repairing line 152 and the third repairing line 153 affect the transmission of the repair signal due to an excessive impedance value. In this way, when the active device array substrate 10 is subsequently assembled into a display panel, it can provide good Display screen.

In addition, referring to FIG. 3, when the open path P2 occurs in the area I, a first pre-fixed point 161, a second pre-fixed point 162, and a third corresponding to the data line 132 of the open circuit P2 are generated by welding. The pre-repairing point 163 and a fourth pre-repairing point 164 are formed to form a first splice point L1, a second splice point L2, a third splice point L3 and a fourth splice point L4, so that the repair signal can be transmitted to the occurrence. The other end of the data line 132 of the open circuit P2 is matched with the original signal. That is, after the damaged data line 132 is repaired by using a first repair line 151, a second repair line 152, and a third repair line 153 to be connected to the data line 132, the first repair line 151 can be avoided. The second repairing line 152 and the third repairing line 153 affect the transmission of the repair signal because the impedance value is too small. In this way, when the active device array substrate 10 is subsequently assembled into a display panel, a good display screen can be provided.

Of course, the present invention is not limited to those illustrated in FIG. 2 and FIG. 3, that is, the present invention does not limit the number of regions and the manner in which regions are divided. In other embodiments, the area of the pixel array 120 divided in the display area 102 can be selected according to the number of the second repair lines 152 and the length of the repair signal transmission path.

In addition, since the active device array substrate 10 can adjust the number of the second repair wires 152 to be welded according to the required impedance value to effectively achieve the repair effect, the active device array substrate 10 can be adapted to be susceptible to impedance during repair. On average, it causes line defects in large-size display panels.

According to the first embodiment, when the data line 132 in the active device array substrate 10 is opened, the data line of the open circuit can be generated. 132. The first repairing line 151, the second repairing line 152, and the third repairing line 153 are electrically connected to each other, so that the data signal is transmitted to the pixel unit U on the other side of the open circuit. Furthermore, since one first repairing line 151 and one third repairing line 153 overlap corresponding to the plurality of second repairing lines 152, the welded second repairing line 152 can be adjusted according to the impedance value required for the repaired repaired line. The number of strips is such that the impedance values of the data lines 132 in the active device array substrate 10 match. As a result, the active device array substrate 10 has a good display quality after being assembled into a display panel.

In addition, in the first embodiment of FIG. 1 to FIG. 3, the signal line is the data line 132, and the driving device electrically connected to the signal line is the data line driving device 140, but the present invention is not limited thereto. In other embodiments, the signal line can also be a scan line, and the drive device can be a scan line drive. Hereinafter, a detailed description will be given with reference to FIGS. 4 to 6.

4 is a schematic structural view of an active device array substrate according to a second embodiment of the present invention. Referring to FIG. 4 and FIG. 1 , the active device array substrate 20 of the present embodiment is similar to the active device array substrate 10 of the first embodiment. The main difference between the two is that the repair lines are arranged differently. Therefore, in the active device array substrate 20 of FIG. 4 and the active device array substrate 10 of FIG. 1, the same or similar reference numerals are used to designate the same or similar elements, and the related description can refer to the foregoing. Hereinafter, only the main differences between the two will be described.

The first repairing line 251 is disposed in the peripheral circuit area 104 and electrically connected to the scan line driving device 142. The first repairing line 251 overlaps with one end of each of the scan lines 134 to form a plurality of first pre-patching points 261. . Multiple second repair lines 252 The first repair line 251 overlaps with one end of each second repair line 252 to form a plurality of second pre-patching points 262. The third repair line 253 is disposed in the peripheral circuit region 104, wherein the third repair line 253 overlaps with one end of each scan line 134 to form a plurality of third pre-patching points 263, and a third repair line 253 and each One end of the second repair line 252 overlaps to form a plurality of fourth pre-patching points 264. At this time, the scan line 134, the first repair line 251, the second repair line 252, and the third repair line 253 are electrically connected to each other.

As shown in FIG. 4, the first repairing line 251 and the third repairing line 253 are described by taking one of the numbers as an example. In this way, a first repair line 251 and a third repair line 253 can be repaired corresponding to one scan line 134. Of course, the invention is not limited thereto. In other embodiments, the first repair line 251 and the third repair line 253 may be two, three, or other possible numbers. When both the first repairing line 251 and the third repairing line 253 are two, the two scanning lines 134 can be repaired. When the first repair line 251 and the third repair line 253 are both three, the repair may be performed corresponding to the three scan lines 134. In other words, the number of repairable scan lines 134 can be determined by the number of first repair lines 251 and third repair lines 253. In addition, as shown in FIG. 4, the second repairing line 252 of the present embodiment is illustrated by the number of four strips, and the four second repairing lines 252 correspond to one first repairing line 251 and one third repairing line 253. . Of course, the invention is not limited thereto. In other embodiments, the second repair line 252 can be two, three, five, or other possible quantities.

The plurality of second repair lines 252 are formed of a single metal material, and for example The same metal material is selected as the scan line 134, so that the plurality of second repair lines 252 can be realized on the substrate 100 while the scan line 134 is being formed without adding a new process step. On the other hand, the first repairing line 251 and the third repairing line 253 can be selected from the same metal material as the data line 132. In this way, the first repairing line 251 and the third repairing line 253 can be realized on the substrate 100 while the data line 132 is being fabricated without adding a new processing step.

The repair method for the damaged scan line 134 is exemplified as follows by applying the active element array substrate 20 described above. FIG. 5 and FIG. 6 are schematic diagrams showing the structure of the active device array substrate of FIG. 4 when repaired under different scan lines.

First, referring to FIG. 5, when the scanning line 134 of the active device array substrate 20 is opened, the scanning line 134, the first repairing line 251, the second repairing line 252, and the third repairing of the open circuit P3 are generated. The lines 253 are electrically connected to each other to form a complete repair signal transmission path (as indicated by a thick line arrow) so that the scan signal is transmitted to the pixel unit U located on the other side of the open path P3.

In detail, as shown in FIG. 5, the scan line 134, the first repair line 251, the second repair line 252, and the third repair line 253 in which the open circuit P3 is generated are electrically connected to each other, and the scan of the open circuit P3 can be performed by welding. The first pre-patching point 261, the second pre-patching point 262, the third pre-patching point 263, and the fourth pre-patching point 264 corresponding to the line 134 are implemented. In more detail, the first pre-patching point 261 at the intersection of the first repairing line 251 and the scanning line 134 having the open path P3 may be welded to form the first welding point W1 such that the first repairing line 251 has The scan line 134 of the open circuit P3 is electrically connected; the second at the intersection of the first repair line 251 and the second repair line 252 The pre-fixing point 262 is welded to form a second fusion splice point W2 such that the first repairing line 251 is electrically connected to the second repairing line 252; and the intersection of the third repairing line 253 and the scanning line 134 having the open path P3 The third pre-repairing point 263 is fused to form a third fusing point W3 such that the third repairing line 253 is electrically connected to the data line 132 having the open path P3; and the third repairing line 253 and the second repairing line 252 are The fourth pre-fixing point 264 at the overlap may be welded to form a fourth welding point W4 to electrically connect the third repairing line 253 with the second repairing line 252. In this way, the scanning signal is transmitted to all the pixel units U corresponding to the scanning line 134 having the open circuit P3 to drive the pixel units U to operate normally.

In this embodiment, the active device array substrate 20 has a plurality of second repair lines 252 so that the number of the second repair lines 252 can be adjusted according to the position of the scan line 134 where the open circuit P3 occurs to adjust the overall The impedance value of the second repair line 252, whereby the active device array substrate 20 can provide a good repair signal and achieve an effective repair effect. In detail, as shown in FIG. 5, the number of the second repair lines 252 is four, so the area of the pixel array 120 distributed in the display area 102 can be divided into four areas: area I, area II, area III, and area IV. The area, in which the division of the regions I, II, III, and IV is determined by the length of the transmission path of the repair signal, that is, the magnitude of the impedance required for the repaired repair line.

In more detail, compared with the area II, the area III, and the area IV, when the open circuit occurs in the area I, the transmission path of the repair signal is short, so that a second repair line 252 is fused (ie, a corresponding one is formed). The second fusion splice point W2 and the fourth fusion splice point W4) can cause the scan line of the open circuit P3 to occur after the repair 134 has an impedance value that matches other scan lines 134. In this way, the repair signal is transmitted to the other end of the scan line 134 where the open circuit P3 is generated, and can be matched with the original signal without generating line defects. Compared with the area I, the area II, and the area III, when the open circuit occurs in the area IV, the transmission path of the repair signal is long, so that the four second repair lines 252 can be fused (ie, the corresponding four second lines are formed). The fusion point W2 and the four fourth fusion points W4) reduce the impedance value of the entire second repair line 252. As a result, the scan line 134 of the open circuit P3 after the repair can have impedance values matched with the other scan lines 134 to avoid line defects. Similarly, compared with the area I, when the open circuit occurs in the area II, the transmission path of the repair signal is long, so that the two second repair lines 252 can be welded (ie, the corresponding two second fusion points W2 are formed and Two fourth fusion splices W4) to obtain a good repair signal. Similarly, compared with the area II, when the open circuit occurs in the area III, the transmission path of the repair signal is long, so the three second repair lines 252 can be welded (ie, the corresponding three second fusion points W2 and three are formed). A fourth fusion joint W4) to obtain a good repair signal.

Specifically, referring again to FIG. 5, when the open path P3 occurs in the area IV, a first pre-patching point 261 and four second pre-patching points 262 corresponding to the scan line 134 of the open circuit P3 are generated by welding. a third pre-repair point 263 and four fourth pre-repair points 264 to form a first splice point W1, four second splice points W2, a third splice point W3, and four fourth splice points W4. The repair signal can be transmitted to the other end of the scan line 134 where the open circuit P3 occurs and matched with the original signal. That is, the damaged scan line 134 is repaired by using a first repair line 251, four second repair lines 252, and a third repair line 253. After being connected to the scanning line 134, the first repairing line 251, the second repairing line 252, and the third repairing line 253 can be prevented from affecting the transmission of the repair signal due to an excessive impedance value. In this way, when the active device array substrate 20 is subsequently assembled into a display panel, a good display screen can be provided.

In addition, referring to FIG. 6, when the open path P4 occurs in the area I, a first pre-patching point 261, a second pre-patching point 262, and a third corresponding to the scan line 134 of the open circuit P4 are generated by welding. The pre-patching point 263 and a fourth pre-repairing point 264 are formed to form a first welding point W1, a second welding point W2, a third welding point W3 and a fourth welding point W4, so that the repair signal can be transmitted to the occurrence. The other end of the scan line 134 of the open circuit P4 is matched with the original signal. That is, after the damaged scan line 134 is repaired by using a first repair line 251, a second repair line 252, and a third repair line 253 to be connected to the scan line 134, the first repair line 251 can be avoided. The second repairing line 252 and the third repairing line 253 affect the transmission of the repair signal because the impedance value is too small. In this way, when the active device array substrate 20 is subsequently assembled into a display panel, a good display screen can be provided.

Of course, the present invention is not limited to those depicted in FIG. 5 and FIG. 6, that is, the present invention does not limit the number of regions and the manner in which regions are divided. In other embodiments, the area of the pixel array 120 divided in the display area 102 can be selected according to the number of the second repair lines 252 and the length of the repair signal transmission path.

In addition, since the active device array substrate 20 can adjust the number of the second repair wires 252 to be welded according to the required impedance value to effectively achieve the repair effect, the active device array substrate 20 can be adapted to be susceptible to impedance during repair. Average build A large-size display panel with line defects.

According to the second embodiment, when the scan line 134 in the active device array substrate 20 is open, the scan line 134, the first repair line 251, the second repair line 252, and the third The repair lines 253 are electrically connected to each other so that the scan signal is transmitted to the other pixel unit U at the open side. Moreover, since one first repairing line 251 and one third repairing line 253 overlap corresponding to the plurality of second repairing lines 252, the welded second repairing line 252 can be adjusted according to the required impedance value of the repaired repaired line. The number of strips is such that the impedance values of the scan lines 134 in the active device array substrate 20 match. As a result, the active device array substrate 20 has a good display quality after being assembled into a display panel.

In addition, the foregoing first embodiment only shows a set of repair lines (ie, a first repair line 251, a plurality of second repair lines 252, and a third repair line 253) and the second embodiment. Only one set of repair lines (i.e., one first repair line 251, a plurality of second repair lines 252, and one third repair line 253) are illustrated, but the present invention is not limited thereto. In other embodiments, after referring to the foregoing first and second embodiments, those skilled in the art can understand that more than two sets of repair lines can be simultaneously disposed in the active device array substrate, so that the active device array substrate Any signal line can still provide a good repair signal when an open circuit occurs.

In summary, the active device array substrate of the present invention can normally display a picture without an open circuit. On the other hand, when an open circuit is generated on the signal line, since the signal line having the open circuit, the first repair line, the second repair line, and the third repair line overlap each other, it can be required according to the repaired repair line. Resistance The value of the resistance is adjusted to match the number of the second repair lines to match the impedance values of the signal lines in the active device array substrate. In this way, the active device array substrate has a good display quality after being assembled into a display panel.

Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.

10‧‧‧Active component array substrate

100‧‧‧Substrate

102‧‧‧ display area

104‧‧‧ peripheral circuit area

120‧‧‧ pixel array

132‧‧‧Information line

134‧‧‧ scan line

140‧‧‧Data line drive

142‧‧‧Scan line driver

151‧‧‧First repair line

152‧‧‧Second repair line

153‧‧‧ third repair line

161‧‧‧First pre-repair point

162‧‧‧second pre-repair point

163‧‧‧ Third pre-repair point

164‧‧‧ Fourth pre-repair point

D‧‧‧汲

E‧‧‧ pixel electrodes

G‧‧‧ gate

S‧‧‧ source

T‧‧‧ active components

U‧‧‧ pixel unit

Claims (9)

An active device array substrate includes: a substrate having a display area and a peripheral circuit area; a pixel array disposed in the display area; and a plurality of signal lines electrically connected to the pixel array, and each The signal line extends from the display area to the peripheral circuit area; a driving device is disposed in the peripheral circuit area and electrically connected to the signal lines; a first repair line is disposed in the peripheral circuit area, and Electrically connecting with the driving device, wherein the first repairing line overlaps with one end of the signal lines to form a plurality of first pre-patching points; and a plurality of second repairing lines are disposed in the peripheral circuit area, wherein the The first repairing line overlaps with one end of the second repairing lines to form a plurality of second pre-patching points; and a third repairing line is disposed in the peripheral circuit area, wherein the third repairing line and the signals are One end of the line overlaps to form a plurality of third pre-patching points, and the third repair line overlaps one end of the second repair lines to form a plurality of fourth pre-patching points. The active device array substrate according to claim 1, wherein the second repairing wires are formed of a single metal material. The active device array substrate according to claim 1, wherein the driving device is a data line driver, and the signal lines are data lines. The active device array substrate according to claim 1, wherein the driving device is a scanning line driver, and the signal lines are scanning lines. An active device array substrate includes: a substrate having a display area and a peripheral circuit area; a pixel array disposed in the display area; and a plurality of signal lines electrically connected to the pixel array, and each The signal line extends from the display area to the peripheral circuit area, wherein one of the signal lines has an open circuit; a driving device is disposed in the peripheral circuit area and electrically connected to the signal lines; a first repairing line is disposed in the peripheral circuit area and electrically connected to the driving device, wherein the first repairing line overlaps with one end of the signal lines, and the first repairing line and the open circuit The intersection of the signal lines has a first fusion point; the plurality of second repair lines are disposed in the peripheral circuit area, wherein the first repair line overlaps with one end of the second repair lines, and the first The intersection of the repairing line and the second repairing lines has at least one second welding point; and a third repairing line disposed in the peripheral circuit area, wherein the third repairing line intersects one end of the signal lines Stack, and the third repair line The intersection of the signal lines having the open circuit has a third fusion point, and the third repair line overlaps with one end of the second repair lines, and the third repair line and the second repair line The intersection has at least one fourth welding point, such that the first repairing line, the at least one second repairing line of the second repairing lines, and the third repairing line are electrically connected to the signal line having the open circuit . The active device array substrate according to claim 5, wherein the These second repair lines are formed from a single metal material. The active device array substrate according to claim 5, wherein the driving device is a data line driver, and the signal lines are data lines. The active device array substrate according to claim 5, wherein the driving device is a scan line driver, and the signal lines are scan lines. The active device array substrate according to claim 5, wherein the intersection of the first repairing line and the second repairing lines has a plurality of second welding points, and the third repairing line and the plurality of The overlap of the two repair lines has a plurality of fourth splice points.