TWI564093B - Cleaning apparatus - Google Patents

Cleaning apparatus Download PDF

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Publication number
TWI564093B
TWI564093B TW104141939A TW104141939A TWI564093B TW I564093 B TWI564093 B TW I564093B TW 104141939 A TW104141939 A TW 104141939A TW 104141939 A TW104141939 A TW 104141939A TW I564093 B TWI564093 B TW I564093B
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Taiwan
Prior art keywords
stitches
cleaning device
links
telescopic mechanism
pins
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TW104141939A
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Chinese (zh)
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TW201720536A (en
Inventor
施昱廷
吳浚銘
高嘉人
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創意電子股份有限公司
台灣積體電路製造股份有限公司
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Priority to TW104141939A priority Critical patent/TWI564093B/en
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Publication of TWI564093B publication Critical patent/TWI564093B/en
Publication of TW201720536A publication Critical patent/TW201720536A/en

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  • Cleaning Implements For Floors, Carpets, Furniture, Walls, And The Like (AREA)

Description

清潔裝置 Cleaning device

本發明有關於一種清潔裝置,尤指一種對半導體產品進行清潔之清潔裝置。 The present invention relates to a cleaning device, and more particularly to a cleaning device for cleaning a semiconductor product.

傳統半導體產品包含一基板與間隔排列於基板上之複數個導電端子。半導體產品透過導電端子焊接至另一電路產品之焊墊,半導體產品得以對另一電路產品交換訊號。然而,在焊接或解焊過程中,經常在導電端子之間的間隔沾黏有髒汙或異物,導致導電端子之間發生短路或接觸不良。 A conventional semiconductor product includes a substrate and a plurality of conductive terminals spaced apart from each other on the substrate. Semiconductor products are soldered to the pads of another circuit product through conductive terminals, and semiconductor products can exchange signals for another circuit product. However, during soldering or soldering, the gap between the conductive terminals is often contaminated with dirt or foreign matter, resulting in a short circuit or poor contact between the conductive terminals.

操作人員通常只能利用手邊物品(如刀片或螺絲起子)一次次地刮除每個間隔的髒汙或異物,不僅耗費大量時間,更可能損壞半導體產品之導電端子或基板上之線路,進而影響半導體產品原有的電氣性能。 Operators can only use the items at hand (such as blades or screwdrivers) to scrape off any dirt or foreign matter in each interval, which not only takes a lot of time, but also damages the conductive terminals of the semiconductor products or the lines on the substrate, thus affecting The original electrical properties of semiconductor products.

為此,若能提供一種解決方案的設計,可解決上述需求,讓業者於競爭中脫穎而出,即成為亟待解決之一重要課題。 To this end, if we can provide a solution design that can solve the above requirements and let the industry stand out from the competition, it becomes an important issue to be solved urgently.

有鑑於此,本發明之一目的在於提供一種清潔裝置,用以解決以上先前技術所提到的困難。 In view of the above, it is an object of the present invention to provide a cleaning apparatus for solving the difficulties mentioned in the prior art.

為了達到上述目的,依據本發明之一實施方式,此種清潔裝置適於對一半導體產品進行清潔。半導體產品具有複數個間隔排列之導電端子,且這些導電端子之間分別形成複數個間隙。清潔裝置包含一殼體與一清潔頭。清潔頭包含一本體及複數個針腳。本體位於殼體上。針腳間隔地並排於本體上,用以分別伸入導電端子彼此間的間隙內,以對半導體產品進行清潔。任二相鄰之針腳之間的空間恰容納單個導電端子。 In order to achieve the above object, in accordance with an embodiment of the present invention, such a cleaning device is adapted to clean a semiconductor product. The semiconductor product has a plurality of spaced-apart conductive terminals, and a plurality of gaps are formed between the conductive terminals. The cleaning device includes a housing and a cleaning head. The cleaning head includes a body and a plurality of pins. The body is located on the housing. The pins are spaced side by side on the body for respectively extending into the gaps between the conductive terminals to clean the semiconductor product. The space between any two adjacent pins accommodates a single conductive terminal.

如此,透過此清潔裝置,本實施方式不僅能夠快速清除半導體產品上每個間隔的髒汙或異物,也不致損壞半導體產品之導電端子或基板上之線路,進而避免影響半導體產品原有的電氣性能。 Thus, through the cleaning device, the embodiment can not only quickly remove the dirt or foreign matter at every interval on the semiconductor product, but also damage the conductive terminals of the semiconductor product or the circuits on the substrate, thereby avoiding affecting the original electrical performance of the semiconductor product. .

在本發明一或複數個實施方式中,這些針腳可移動地位於本體上,使得這些針腳彼此間的複數個間距為可調整的。 In one or more embodiments of the invention, the stitches are movably located on the body such that the plurality of pitches of the stitches are adjustable relative to one another.

在本發明一或複數個實施方式中,本體包含一伸縮機構與一調整部。伸縮機構可伸縮地位於殼體內,並沿一軸向伸縮,且這些針腳沿此軸向並排於伸縮機構之一側,使得這些針腳彼此間的複數個間距得以隨著伸縮機構的伸縮進行相應之調整。調整部活動地位於殼體上,且連接伸縮機構,用以控制伸縮機構的伸縮。 In one or more embodiments of the present invention, the body includes a telescoping mechanism and an adjustment portion. The telescopic mechanism is telescopically located in the housing and is extended and contracted along an axial direction, and the stitches are arranged side by side on one side of the telescopic mechanism, so that the plurality of pitches of the stitches are corresponding to the expansion and contraction of the telescopic mechanism. Adjustment. The adjustment portion is movably disposed on the housing and is connected to the telescopic mechanism for controlling the expansion and contraction of the telescopic mechanism.

在本發明一或複數個實施方式中,伸縮機構包含 複數個第一連桿、複數個第二連桿、複數個第三連桿與複數個第四連桿。這些軸桿分別連接這些針腳,且每一針腳之一長軸與每一軸桿之一長軸至少相交。每一第二連桿的一端透過其中一軸桿樞接每一第一連桿的一端。每一第三連桿的一中間區域樞接每一第一連桿的一中間區域。每一第四連桿的一端樞接每一第三連桿的一端,且每一第四連桿的一中間區域樞接每一第二連桿的一中間區域。調整部連接其中一第一連桿的另端與其中一第三連桿的另端。當調整部轉動這些第一連桿、第二連桿、第三連桿與第四連桿,使得第一連桿的中間區域與第四連桿的中間區域彼此接近時,伸縮機構縮小針腳的間距。 In one or more embodiments of the invention, the telescoping mechanism comprises a plurality of first links, a plurality of second links, a plurality of third links, and a plurality of fourth links. The shafts are connected to the pins, respectively, and one of the long axes of each of the pins intersects at least one of the major axes of each of the shafts. One end of each second link is pivotally connected to one end of each of the first links through one of the shafts. An intermediate region of each of the third links is pivotally coupled to an intermediate region of each of the first links. One end of each fourth link is pivotally connected to one end of each third link, and an intermediate portion of each fourth link is pivotally connected to an intermediate portion of each second link. The adjusting portion connects the other end of one of the first links with the other end of one of the third links. When the adjusting portion rotates the first link, the second link, the third link, and the fourth link such that the intermediate portion of the first link and the intermediate portion of the fourth link approach each other, the telescopic mechanism reduces the stitch spacing.

在本發明一或複數個實施方式中,伸縮機構包含一Z型對折彈片。Z型對折彈片具有複數個第一片體部與複數個第二片體部。這些第一片體部與這些第二片體部相互鄰接,每一第一片體部與其鄰接之第二片體部之間具有一鄰接側緣。針腳分別連接鄰接側緣,且每一針腳之一長軸與每一鄰接側緣之一長軸至少相交。調整部連接Z型對折彈片之一端。如此,當調整部壓縮Z型對折彈片,使得這些第一片體部與這些第二片體部彼此接近時,伸縮機構縮小這些針腳的這些間距。 In one or more embodiments of the invention, the telescoping mechanism includes a Z-folded elastic sheet. The Z-folded elastic piece has a plurality of first body portions and a plurality of second body portions. The first body portions and the second body portions are adjacent to each other, and each of the first body portions has an adjacent side edge between the adjacent second body portions. The stitches are respectively coupled to the adjacent side edges, and one of the long axes of each of the pins intersects at least one of the major axes of each of the adjacent side edges. The adjustment portion is connected to one end of the Z-shaped folded elastic piece. In this manner, when the adjustment portion compresses the Z-folded flaps such that the first sheet portions and the second sheet portions approach each other, the telescopic mechanism reduces the pitch of the stitches.

在本發明一或複數個實施方式中,調整部為一滑塊,滑塊可滑動地位於殼體上,且連接伸縮機構之一端,用以藉由控制伸縮機構的伸縮,調整這些針腳的這些間距。 In one or more embodiments of the present invention, the adjusting portion is a slider, the slider is slidably located on the housing, and one end of the telescopic mechanism is connected to adjust the stitches of the telescopic mechanism to adjust the stitches. spacing.

在本發明一或複數個實施方式中,這些針腳等距地並排於本體上,其中這些針腳的這些間隔彼此相同。殼體表面鄰近滑塊之位置具有一刻度表。刻度表具有複數個刻度值。 這些刻度值分別對應表示這些針腳的這些間距。 In one or more embodiments of the invention, the stitches are juxtaposed side by side on the body, wherein the spacing of the stitches is identical to one another. The surface of the housing has a scale adjacent to the position of the slider. The scale has a plurality of scale values. These scale values correspond to these spacings for these pins, respectively.

在本發明一或複數個實施方式中,伸縮機構具回復彈性,調整部為一旋轉螺栓,旋轉螺栓螺接於殼體上,且旋轉螺栓抵靠伸縮機構之一端,用以藉由控制伸縮機構的伸縮,調整這些針腳的這些間距。 In one or more embodiments of the present invention, the telescopic mechanism has a resilient elasticity, the adjusting portion is a rotating bolt, the rotating bolt is screwed to the housing, and the rotating bolt abuts against one end of the telescopic mechanism for controlling the telescopic mechanism The telescopic, adjust these spacing of these pins.

在本發明一或複數個實施方式中,這些針腳等距地並排於本體上,其中這些針腳的這些間距彼此相同。旋轉螺栓表面具有一刻度表,刻度表具有複數個刻度值,這些刻度值分別對應表示這些針腳的這些間距。 In one or more embodiments of the invention, the stitches are juxtaposed side by side to the body, wherein the spacing of the stitches is identical to one another. The surface of the rotating bolt has a scale, and the scale has a plurality of scale values, which respectively correspond to the spacing of the stitches.

在本發明一或複數個實施方式中,這些針腳固定地位於本體上,其中這些針腳的這些間距為不變的。 In one or more embodiments of the invention, the pins are fixedly located on the body, wherein the spacing of the pins is constant.

在本發明一或複數個實施方式中,清潔頭可拆卸地位於位於殼體上。 In one or more embodiments of the invention, the cleaning head is removably located on the housing.

在本發明一或複數個實施方式中,這些針腳等距地並排於本體上,其中這些針腳的這些間距彼此相同。 In one or more embodiments of the invention, the stitches are juxtaposed side by side to the body, wherein the spacing of the stitches is identical to one another.

在本發明一或複數個實施方式中,這些針腳包含抗靜電材質。 In one or more embodiments of the invention, the pins comprise an antistatic material.

在本發明一或複數個實施方式中,這些針腳分別呈直線狀、勾狀、L狀或尖針狀。 In one or more embodiments of the present invention, the stitches are linear, hooked, L-shaped or pointed.

在本發明一或複數個實施方式中,每一針腳之一端具有尖銳部或平面。 In one or more embodiments of the invention, one end of each of the pins has a sharp portion or plane.

以上所述僅係用以闡述本發明所欲解決的問題、解決問題的技術手段、及其產生的功效等等,本發明之具體細節將在下文的實施方式及相關圖式中詳細介紹。 The above description is only for explaining the problems to be solved by the present invention, the technical means for solving the problems, the effects thereof, and the like, and the specific details of the present invention will be described in detail in the following embodiments and related drawings.

10、11、12、13‧‧‧清潔裝置 10, 11, 12, 13‧‧‧ cleaning devices

100、101、102、103‧‧‧殼體 100, 101, 102, 103‧‧‧ shells

110‧‧‧容置槽 110‧‧‧ accommodating slots

111‧‧‧殼體內壁 111‧‧‧ housing inner wall

120‧‧‧第一開口 120‧‧‧ first opening

130‧‧‧第二開口 130‧‧‧second opening

140‧‧‧第三開口 140‧‧‧ third opening

150‧‧‧滑槽部 150‧‧‧Slot section

160‧‧‧第二套接部 160‧‧‧Second socket

170‧‧‧刻度表 170‧‧‧scale

200、201、202‧‧‧清潔頭 200, 201, 202‧‧‧ cleaning head

210‧‧‧本體 210‧‧‧ body

211‧‧‧第一套接部 211‧‧‧First set of joints

220‧‧‧交叉伸縮柵欄 220‧‧‧cross telescopic fence

221‧‧‧第一連桿 221‧‧‧ first link

222‧‧‧第二連桿 222‧‧‧second link

223‧‧‧第三連桿 223‧‧‧third link

224‧‧‧第四連桿 224‧‧‧fourth link

225‧‧‧軸桿 225‧‧‧ shaft

226‧‧‧樞軸 226‧‧‧ pivot

230‧‧‧Z型對折彈片 230‧‧‧Z-fold folding spring

231‧‧‧第一片體部 231‧‧‧ first body

232‧‧‧第二片體部 232‧‧‧Second body

233‧‧‧鄰接側緣 233‧‧‧ adjacent side edges

240‧‧‧調整部 240‧‧‧Adjustment Department

250‧‧‧滑塊 250‧‧‧ Slider

251‧‧‧滑軌部 251‧‧‧Sliding track

252‧‧‧操作件 252‧‧‧Operating parts

260‧‧‧旋轉螺栓 260‧‧‧Rotating bolt

261‧‧‧圓周表面 261‧‧‧circular surface

262‧‧‧刻度表 262‧‧‧ scale

300、300A~300D‧‧‧針腳 300, 300A~300D‧‧‧ pins

301‧‧‧平面 301‧‧‧ plane

302‧‧‧端面 302‧‧‧ end face

303‧‧‧尖銳部 303‧‧‧ Sharp Department

400‧‧‧封裝單元 400‧‧‧Package unit

410‧‧‧導電端子 410‧‧‧Electrical terminals

C1‧‧‧第一時針方向 C1‧‧‧first hour hand direction

C2‧‧‧第二時針方向 C2‧‧‧second hour direction

D1‧‧‧第一方向 D1‧‧‧ first direction

D2‧‧‧第二方向 D2‧‧‧ second direction

G1‧‧‧間距 G1‧‧‧ spacing

G2‧‧‧間隙 G2‧‧‧ gap

X~Z‧‧‧軸 X~Z‧‧‧ axis

為讓本發明之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之說明如下:第1圖繪示依照本發明一實施方式之清潔裝置與一待清潔之半導體產品的示意圖;第2圖繪示第1圖之清潔裝置的分解圖;第3圖繪示第2圖的清潔頭的局部放大圖;第4圖繪示第1圖之清潔裝置的操作示意圖;第5圖~第6圖繪示依照本發明另一實施方式之清潔裝置的示意圖;第7圖繪示依照本發明又一實施方式之清潔裝置的示意圖;第8圖繪示依照本發明又一實施方式之清潔裝置的示意圖;以及第9A圖~第9D圖繪示依照本發明其他實施方式之清潔裝置的針腳的示意圖。 The above and other objects, features, advantages and embodiments of the present invention will become more <RTIgt; <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; FIG. 2 is an exploded view of the cleaning device of FIG. 1; FIG. 3 is a partially enlarged view of the cleaning head of FIG. 2; and FIG. 4 is a schematic view showing the operation of the cleaning device of FIG. 1; 5 to 6 are schematic views showing a cleaning device according to another embodiment of the present invention; FIG. 7 is a schematic view showing a cleaning device according to another embodiment of the present invention; and FIG. 8 is a view showing still another embodiment of the present invention; A schematic view of a cleaning device of an embodiment; and FIGS. 9A-9D illustrate schematic views of stitches of a cleaning device in accordance with other embodiments of the present invention.

以下將以圖式揭露本發明之複數個實施方式,為明確說明起見,許多實務上的細節將在以下敘述中一併說明。然而,應瞭解到,這些實務上的細節不應用以限制本發明。也就是說,在本發明部分實施方式中,這些實務上的細節是非必要的。此外,為簡化圖式起見,一些習知慣用的結構與元件在 圖式中將以簡單示意的方式繪示之。 The embodiments of the present invention are disclosed in the following drawings, and the details of However, it should be understood that these practical details are not intended to limit the invention. That is, in some embodiments of the invention, these practical details are not necessary. In addition, some conventional structures and components are used to simplify the drawing. The drawings will be illustrated in a simple schematic manner.

第1圖繪示依照本發明一實施方式之清潔裝置10與一待清潔之半導體產品的示意圖。第2圖繪示第1圖之清潔裝置10的分解圖。如第1圖與第2圖所示,此種清潔裝置10用以對一待清潔之半導體產品進行清潔。此清潔裝置10包含一殼體100與一清潔頭200。清潔頭200包含一本體210及複數個針腳300。本體210位於殼體100上。針腳300間隔地並排於本體210上,故,任二相鄰之針腳300之間具有一間距G1。在本實施方式中,這些針腳300單列地並排於本體210上,且這些針腳300等距地並排於本體210上,意即,這些針腳300彼此間的這些間距G1彼此相同。然而,本發明不限於此,其他實施方式中,針腳不必等距地並排於本體上,且不必單列地並排於本體上。 1 is a schematic view of a cleaning device 10 and a semiconductor product to be cleaned in accordance with an embodiment of the present invention. Fig. 2 is an exploded view of the cleaning device 10 of Fig. 1. As shown in Figures 1 and 2, such a cleaning device 10 is used to clean a semiconductor product to be cleaned. The cleaning device 10 includes a housing 100 and a cleaning head 200. The cleaning head 200 includes a body 210 and a plurality of pins 300. The body 210 is located on the housing 100. The pins 300 are spaced side by side on the body 210, so that there is a gap G1 between any two adjacent pins 300. In the present embodiment, the pins 300 are arranged side by side on the body 210 in a single row, and the pins 300 are equally spaced on the body 210, that is, the pitches G1 of the pins 300 are identical to each other. However, the present invention is not limited thereto. In other embodiments, the pins need not be equidistantly arranged side by side on the body, and need not be arranged side by side on the body.

在本實施方式中,半導體產品例如為一封裝單元400。封裝單元400具有複數個導電端子410。導電端子410間隔排列於封裝單元400上,故,任二相鄰之導電端子410之間具有一間隙G2。舉例來說,導電端子410之間隙G2一般為0.2~1.27mm之間。針腳300的這些間距G1一般為0.2~3mm。 In the present embodiment, the semiconductor product is, for example, a package unit 400. The package unit 400 has a plurality of conductive terminals 410. The conductive terminals 410 are spaced apart from each other on the package unit 400. Therefore, there is a gap G2 between any two adjacent conductive terminals 410. For example, the gap G2 of the conductive terminals 410 is generally between 0.2 and 1.27 mm. These pitches G1 of the stitches 300 are generally 0.2 to 3 mm.

如此,當清潔裝置10之這些針腳300分別一一伸入並清潔封裝單元400之這些間隙G2時,這些針腳300不僅能夠快速清除封裝單元400之這些間隙G2內的髒汙或異物,也不致損壞封裝單元400之導電端子410或其上之表面線路,進而避免影響封裝單元400原有的電氣性能。 Thus, when the pins 300 of the cleaning device 10 respectively protrude into and clean the gaps G2 of the package unit 400, the pins 300 can not only quickly remove the dirt or foreign matter in the gaps G2 of the package unit 400, nor damage them. The conductive terminals 410 of the package unit 400 or the surface lines thereon, thereby avoiding affecting the original electrical performance of the package unit 400.

需瞭解到,當這些針腳300分別一一伸入封裝單元400之這些間隙G2時,任二相鄰之針腳300彼此間的空間(參 考間距G1)恰可容納封裝單元400之一個導電端子410。然而,本發明不限於此,其他實施方式中,任二相鄰之導電端子之間隙不必只容納封裝單元之單一導電端子。 It should be understood that when the pins 300 are respectively protruded into the gaps G2 of the package unit 400, the space between any two adjacent pins 300 is The test spacing G1) can accommodate one of the conductive terminals 410 of the package unit 400. However, the present invention is not limited thereto. In other embodiments, the gap between any two adjacent conductive terminals does not have to accommodate only a single conductive terminal of the package unit.

然而,本發明不限於此,其他實施方式中,半導體產品也可以為一電路板(圖中未示)。 However, the present invention is not limited thereto. In other embodiments, the semiconductor product may also be a circuit board (not shown).

在本實施方式中,這些針腳300可移動地位於本體210上,以致這些針腳300彼此間的這些間距G1為可調整的。更具體地,舉例來說,這些針腳300可橫向移動地位於本體210上。當這些針腳300橫向地移動時,這些針腳300的這些間距G1能夠因此同步增大或縮小。 In the present embodiment, the pins 300 are movably located on the body 210 such that the spacing G1 of the pins 300 relative to one another is adjustable. More specifically, for example, the stitches 300 can be located on the body 210 in a laterally movable manner. When these stitches 300 are moved laterally, these pitches G1 of the stitches 300 can thus be increased or decreased in synchronization.

第3圖繪示第2圖的清潔頭200的局部放大圖。第3圖繪示第1圖之清潔裝置10的操作示意圖。如第2圖與第3圖所示,殼體100具有一容置槽110、第一開口120與第二開口130。容置槽110位於殼體100內。第一開口120位於殼體100之一側面,且接通容置槽110。第二開口130位於殼體100之另一側面,且接通容置槽110。本體210包含一調整部240與一伸縮機構(如交叉伸縮柵欄220)。伸縮機構可伸縮地位於殼體100之容置槽110內,並沿一軸向(如Y軸)伸縮,且這些針腳300沿軸向(如Y軸)並排於伸縮機構之一側,使得這些針腳300的間距G1隨著伸縮機構的伸縮進行相應之調整。調整部240活動地位於殼體100上,且連接伸縮機構,用以控制伸縮機構的伸縮。 Fig. 3 is a partial enlarged view of the cleaning head 200 of Fig. 2. FIG. 3 is a schematic view showing the operation of the cleaning device 10 of FIG. 1. As shown in FIGS. 2 and 3 , the housing 100 has a receiving groove 110 , a first opening 120 and a second opening 130 . The accommodating groove 110 is located inside the housing 100. The first opening 120 is located at one side of the housing 100 and is connected to the receiving slot 110. The second opening 130 is located on the other side of the housing 100 and is connected to the receiving slot 110. The body 210 includes an adjustment portion 240 and a telescopic mechanism (such as a cross telescopic fence 220). The telescopic mechanism is telescopically located in the receiving groove 110 of the housing 100 and is stretched and contracted in an axial direction (such as the Y-axis), and the pins 300 are axially aligned (such as the Y-axis) on one side of the telescopic mechanism, so that these The pitch G1 of the stitch 300 is adjusted correspondingly with the expansion and contraction of the telescopic mechanism. The adjusting portion 240 is movably disposed on the housing 100 and is connected with a telescopic mechanism for controlling the expansion and contraction of the telescopic mechanism.

舉例來說,伸縮機構為一交叉伸縮柵欄220,可伸縮地位於殼體100之容置槽110內,且交叉伸縮柵欄220之二相對端分別連接調整部240與殼體內壁111。這些針腳300並排 地連接於交叉伸縮柵欄220之一側,且從容置槽110經由第一開口120伸出殼體100之外。調整部240活動地連接殼體100與交叉伸縮柵欄220,用以動態控制伸縮機構的伸縮,進而調整這些針腳300的這些間距G1。 For example, the telescopic mechanism is a cross-retractable barrier 220 that is telescopically located in the receiving slot 110 of the housing 100, and the opposite ends of the cross-retracting barrier 220 are connected to the adjusting portion 240 and the housing inner wall 111, respectively. These pins 300 side by side The ground is connected to one side of the cross-retractable barrier 220 and extends out of the housing 100 from the accommodating slot 110 via the first opening 120. The adjustment unit 240 movably connects the housing 100 and the cross-retracting barrier 220 for dynamically controlling the expansion and contraction of the telescopic mechanism, thereby adjusting the pitch G1 of the pins 300.

更具體地,如第3圖所示,調整部240為一滑塊250,滑塊250可滑動地位於殼體100上,且連接交叉伸縮柵欄220之一端,用以藉由控制交叉伸縮柵欄220的伸縮,調整這些針腳300的這些間距G1。舉例來說,滑塊250可滑動地連接殼體100與交叉伸縮柵欄220。滑塊250具有至少一滑軌部251與一操作件252,殼體100具有至少一滑槽部150,透過滑塊250之滑軌部251與殼體100之滑槽部150相互接合,滑塊250能夠於容置槽110內進行往返地滑動,進而動態控制交叉伸縮柵欄220之伸縮。滑塊250之操作件252經由第二開口130伸出殼體100之外,以供使用者操作滑動。 More specifically, as shown in FIG. 3 , the adjusting portion 240 is a slider 250 , and the slider 250 is slidably disposed on the housing 100 and connected to one end of the cross telescopic barrier 220 for controlling the cross telescopic fence 220 . The telescoping adjusts these spacings G1 of these pins 300. For example, the slider 250 slidably connects the housing 100 with the cross telescoping fence 220. The slider 250 has at least one sliding rail portion 251 and an operating member 252. The housing 100 has at least one sliding groove portion 150. The sliding rail portion 251 of the sliding block 250 and the sliding groove portion 150 of the housing 100 are engaged with each other. The 250 can slide back and forth in the accommodating groove 110 to dynamically control the expansion and contraction of the cross-retracting fence 220. The operating member 252 of the slider 250 extends out of the housing 100 via the second opening 130 for the user to slide.

如此,無論封裝單元400的這些針腳300之間隙規格有所不同,都可以透過控制伸縮機構(如交叉伸縮柵欄220)之伸縮而增大或縮小這些針腳300的這些間距G1,從而方便使用者得以立即對不同間隙規格之封裝單元400進行清潔。 In this way, regardless of the gap specifications of the pins 300 of the package unit 400, the pitch G1 of the pins 300 can be increased or decreased by controlling the expansion and contraction of the telescopic mechanism (such as the cross telescopic barrier 220), thereby facilitating the user. The package unit 400 of different gap specifications is immediately cleaned.

在本實施方式中,交叉伸縮柵欄220包含複數個第一連桿221、複數個第二連桿222、複數個第三連桿223與複數個第四連桿224。第一連桿221至第四連桿224彼此透過樞軸226相互樞接。更具體地,調整部240分別連接首位第一連桿221遠離第二連桿222的一端與首位第三連桿223遠離第四連桿224的一端。殼體內壁111分別連接末位第二連桿222遠離第 一連桿221的一端與末位第四連桿224遠離第三連桿223的一端連接。其餘的第一連桿221至第四連桿224中,第一連桿221的二端分別樞接其中二個第二連桿222的一端、第二連桿222的二端分別樞接其中二個第一連桿221的一端、第三連桿223的二端分別樞接其中二個第四連桿224的一端,以及第四連桿224的二端分別樞接其中二個第三連桿223的一端。此外,第三連桿223的一中間區域透過樞軸226樞接第一連桿221的一中間區域。第四連桿224的一中間區域透過樞軸226樞接第二連桿222的一中間區域。特別地,第二連桿222透過一軸桿225樞接第一連桿221,第四連桿224透過另一軸桿225樞接第三連桿221,軸桿225較長於樞軸226,且軸桿225連接其中之一針腳300,且針腳300之一長軸(如X軸)與軸桿225之一長軸(如Z軸)至少相交。 In the present embodiment, the cross-telescopic fence 220 includes a plurality of first links 221, a plurality of second links 222, a plurality of third links 223, and a plurality of fourth links 224. The first link 221 to the fourth link 224 are pivotally connected to each other through the pivot 226. More specifically, the adjusting portion 240 connects one end of the first first link 221 away from the second link 222 and one end of the first third link 223 away from the fourth link 224, respectively. The inner wall 111 of the housing is respectively connected to the last second link 222 away from the first One end of a link 221 is connected to an end of the last fourth link 224 away from the third link 223. In the remaining first link 221 to fourth link 224, the two ends of the first link 221 are respectively pivotally connected to one end of the two second links 222, and the two ends of the second link 222 are pivotally connected to the two ends respectively. One end of the first link 221 and the two ends of the third link 223 are respectively pivotally connected to one ends of the two fourth links 224, and the two ends of the fourth link 224 are respectively pivotally connected to the two third links. One end of 223. In addition, an intermediate portion of the third link 223 is pivotally connected to an intermediate portion of the first link 221 via a pivot 226. An intermediate portion of the fourth link 224 is pivotally coupled to an intermediate region of the second link 222 via a pivot 226. In particular, the second link 222 is pivotally connected to the first link 221 through a shaft 225, and the fourth link 224 is pivotally connected to the third link 221 through the other shaft 225. The shaft 225 is longer than the pivot 226, and the shaft One of the pins 300 is coupled to one of the pins 300, and one of the long axes of the pins 300 (e.g., the X-axis) intersects at least one of the major axes of the shaft 225 (e.g., the Z-axis).

如此,第4圖繪示第1圖之清潔裝置10的操作示意圖,如第3圖與第4圖所示,當使用者朝第一方向D1移動操作件252時,使用者使滑塊250朝第一方向D1推動交叉伸縮柵欄220並轉動這些第一至第四連桿221至224,使得第一連桿221的中間區域(參考樞軸226於第一連桿221的位置)與第四連桿224的中間區域(參考樞軸226於第四連桿224的位置)漸漸彼此接近,進而讓交叉伸縮柵欄220縮小這些針腳300的間距G1;反之,當使用者朝第二方向D2移動操作件252時,同理便可增大這些針腳300的這些間距G1(第1圖)。 Thus, FIG. 4 is a schematic view showing the operation of the cleaning device 10 of FIG. 1. As shown in FIGS. 3 and 4, when the user moves the operating member 252 toward the first direction D1, the user causes the slider 250 to face. The first direction D1 pushes the cross-retracting fence 220 and rotates the first to fourth links 221 to 224 such that the intermediate portion of the first link 221 (the position of the reference pivot 226 at the first link 221) is connected to the fourth The intermediate portion of the rod 224 (the position of the reference pivot 226 at the fourth link 224) gradually approaches each other, thereby allowing the cross-retracting barrier 220 to reduce the pitch G1 of the stitches 300; conversely, when the user moves the operating member toward the second direction D2 At 252, the same spacing G1 of these pins 300 can be increased (Fig. 1).

然而,本發明不限於此,當伸縮機構為交叉伸縮柵欄時,調整部不限必須為滑塊,其他實施方式中,調整部也 可以是旋轉螺栓,透過正轉或反轉旋轉螺栓而控制伸縮機構之伸縮,以達成增大或縮小這些針腳的這些間距。 However, the present invention is not limited thereto. When the telescopic mechanism is a cross-retractable fence, the adjustment portion is not limited to a slider, and in other embodiments, the adjustment portion is also It may be a rotating bolt that controls the expansion and contraction of the telescopic mechanism by rotating or reversing the rotating bolt to achieve the increase or decrease of these pitches of the stitches.

此外,如第1圖所示,殼體100表面鄰近滑塊250之位置具有一刻度表170,刻度表170具有複數個刻度值,這些刻度值分別對應表示這些針腳的這些間距G1種類。例如當滑塊250指向其中一刻度值時,則表示這些針腳的這些間距G1恰屬於刻度值所對應之尺寸大小。 Further, as shown in FIG. 1, the surface of the casing 100 adjacent to the slider 250 has a scale 170 having a plurality of scale values corresponding to the pitches G1 of the stitches. For example, when the slider 250 points to one of the scale values, it means that the pitches G1 of the stitches belong to the size corresponding to the scale value.

第5圖~第6圖繪示依照本發明另一實施方式之清潔裝置12的示意圖。如第5圖所示,在另一實施方式中,伸縮機構例如為一Z型對折彈片230。Z型對折彈片230之二相對端分別連接殼體100與調整部240。Z型對折彈片230具有複數個第一片體部231與複數個第二片體部232。這些第一片體部231與這些第二片體部232兩兩相互鄰接,每一第一片體部231與其鄰接之第二片體部232之間具有一鄰接側緣233。針腳300分別連接位於Z型對折彈片230同側的這些鄰接側緣233。針腳300之一長軸(如X軸)與鄰接側緣233之一長軸(如Z軸)至少相交,調整部240連接Z型對折彈片230之一端。 5 to 6 illustrate schematic views of a cleaning device 12 in accordance with another embodiment of the present invention. As shown in FIG. 5, in another embodiment, the telescopic mechanism is, for example, a Z-folded elastic piece 230. The opposite ends of the Z-folding elastic piece 230 are respectively connected to the housing 100 and the adjusting portion 240. The Z-folded elastic piece 230 has a plurality of first body portions 231 and a plurality of second body portions 232. The first body portion 231 and the second body portions 232 are adjacent to each other, and each of the first body portions 231 has an adjacent side edge 233 between the adjacent second body portions 232. The pins 300 are respectively connected to the adjacent side edges 233 on the same side of the Z-folded elastic piece 230. One of the long axes of the pins 300 (such as the X-axis) intersects at least one of the long axes (such as the Z-axis) of the adjacent side edges 233, and the adjustment portion 240 connects one end of the Z-folded elastic piece 230.

更具體地,如第5圖所示,除了容置槽110與第一開口120,殼體101更具有一第三開口140。第三開口140位於殼體101之又一側面,且接通容置槽110。調整部240為一旋轉螺栓260,旋轉螺栓260螺接於殼體101上,且旋轉螺栓260之一端抵靠Z型對折彈片230,旋轉螺栓260之另端經由第三開口140伸出殼體101之外,以供使用者操作轉動。如此,無論封裝單元的針腳間隙的規格有所不同,都可以透過控制Z型對折 彈片230之伸縮,以增大或縮小這些針腳300的這些間距G1,從而方便使用者得以立即對不同間隙規格之封裝單元進行清潔。 More specifically, as shown in FIG. 5, in addition to the receiving groove 110 and the first opening 120, the housing 101 further has a third opening 140. The third opening 140 is located on the other side of the housing 101 and is connected to the receiving slot 110. The adjusting portion 240 is a rotating bolt 260. The rotating bolt 260 is screwed onto the casing 101, and one end of the rotating bolt 260 abuts against the Z-folding elastic piece 230, and the other end of the rotating bolt 260 extends out of the casing 101 via the third opening 140. In addition, for the user to operate the rotation. In this way, regardless of the specifications of the pin gap of the package unit, the Z-fold can be controlled by the control. The expansion and contraction of the elastic pieces 230 to increase or decrease the spacing G1 of the pins 300 allows the user to immediately clean the package units of different gap specifications.

如此,如第6圖所示,當使用者朝第一時針方向C1將旋轉螺栓260逐漸轉入容置槽110時,旋轉螺栓260壓縮Z型對折彈片230,使得這些第一片體部231與這些第二片體部232得以彼此接近,進而縮小這些針腳300的這些間距G1;反之,當使用者朝第二時針方向C2將旋轉螺栓260逐漸轉出容置槽110並逐漸釋放Z型對折彈片230時,同理,由於Z型對折彈片230回復,Z型對折彈片230增大這些針腳300的這些間距G1。 Thus, as shown in FIG. 6, when the user gradually turns the rotating bolt 260 into the accommodating groove 110 in the first hour hand direction C1, the rotating bolt 260 compresses the Z-folded elastic piece 230 so that the first piece body portion 231 is The second body portions 232 are close to each other, thereby narrowing the pitch G1 of the pins 300; otherwise, when the user turns the rotating bolt 260 gradually out of the receiving groove 110 toward the second hour hand direction C2 and gradually releases the Z-folded elastic piece At 230 o'clock, for the same reason, since the Z-shaped folded elastic piece 230 is restored, the Z-shaped folded elastic piece 230 increases the pitch G1 of the stitches 300.

此外,旋轉螺栓260之圓周表面261具有一刻度表262,刻度表262具有複數個刻度值。這些刻度值分別對應表示這些針腳300的這些間距G1的種類規格。例如旋轉螺栓260部份外露於殼體101外的其中一個刻度值262恰表示這些針腳300的這些間距G之尺寸大小。 Further, the circumferential surface 261 of the rotating bolt 260 has a scale 262 having a plurality of scale values. These scale values correspond to the type specifications of the pitches G1 of the stitches 300, respectively. For example, one of the scale values 262 of the rotating bolt 260 partially exposed outside the casing 101 indicates the size of the pitch G of the pins 300.

然而,本發明不限於此,當伸縮機構為Z型對折彈片時,調整部不限必須為旋轉螺栓,其他實施方式中,調整部也可以是滑塊,透過往返滑動而控制伸縮機構之伸縮,以達成增大或縮小這些針腳的這些間距。 However, the present invention is not limited thereto. When the telescopic mechanism is a Z-folded elastic piece, the adjustment portion is not limited to a rotating bolt. In other embodiments, the adjustment portion may also be a slider, and the telescopic mechanism is controlled to retract and contract by reciprocating sliding. To increase or decrease these spacings of these pins.

第7圖繪示依照本發明又一實施方式之清潔裝置12的示意圖。如第7圖所示,前述實施方式之清潔裝置10、11與本實施方式之清潔裝置12大致相同,只是本實施方式之清潔裝置12的清潔頭201是固定地位於殼體102上,且這些針腳300 是固定地位於清潔頭201上。如此,這些針腳300的這些間距G1為不變的或稱無法變動的。如此,清潔裝置12的這些針腳300具有特定程度之結構強度,不易於清潔過程中受到損壞。 FIG. 7 is a schematic view of a cleaning device 12 in accordance with yet another embodiment of the present invention. As shown in FIG. 7, the cleaning devices 10, 11 of the foregoing embodiment are substantially the same as the cleaning device 12 of the present embodiment except that the cleaning head 201 of the cleaning device 12 of the present embodiment is fixedly located on the housing 102, and these Pin 300 It is fixedly located on the cleaning head 201. As such, these pitches G1 of the pins 300 are constant or invariant. As such, the pins 300 of the cleaning device 12 have a certain degree of structural strength that is less susceptible to damage during cleaning.

此外,第8圖繪示依照本發明又一實施方式之清潔裝置13的示意圖。如第8圖所示,前述實施方式之清潔裝置10~11與本實施方式之清潔裝置13大致相同,只是本實施方式之清潔裝置13的清潔頭202可拆卸地位於位於殼體103上。如此,使用者可拆卸清潔頭202以便加以更換或清潔。舉例來說,可對清潔頭202的結構與種類進行模組化,以提供複數個具有不同間距種類之清潔頭。 In addition, FIG. 8 is a schematic view of a cleaning device 13 according to still another embodiment of the present invention. As shown in Fig. 8, the cleaning devices 10 to 11 of the above-described embodiment are substantially the same as the cleaning device 13 of the present embodiment except that the cleaning head 202 of the cleaning device 13 of the present embodiment is detachably located on the casing 103. As such, the user can remove the cleaning head 202 for replacement or cleaning. For example, the structure and type of cleaning head 202 can be modularized to provide a plurality of cleaning heads having different spacing types.

更具體地,清潔頭202具有一第一套接部211。第一套接部211位於清潔頭202背對這些針腳300之一側。第一套接部211例如為插槽。殼體103具有一第二套接部160。第二套接部160位於殼體103之一側,且第二套接部160與第一套接部211於外型上相互匹配。第二套接部160例如為凸塊。如此,透過第一套接部211套接第二套接部160,清潔頭202得以組裝於殼體103上。 More specifically, the cleaning head 202 has a first socket 211. The first set of joints 211 are located on one side of the cleaning head 202 opposite the pins 300. The first set of joints 211 is, for example, a slot. The housing 103 has a second socket 160. The second socket portion 160 is located on one side of the housing 103, and the second socket portion 160 and the first socket portion 211 are matched to each other on the outer shape. The second socket portion 160 is, for example, a bump. Thus, the second socket portion 160 is sleeved through the first socket portion 211, and the cleaning head 202 is assembled on the casing 103.

第9A圖~第9D圖繪示依照本發明其他實施方式之清潔裝置的針腳的示意圖。如第9A圖所示,每一針腳300A的外型呈直線狀,使得針腳300A的長軸L彼此平行。然而,本發明不限於此,在其他實施方式中,為了其他需求或限制,舉例來說,如第9B圖~第9D圖所示,針腳也可以為呈勾狀之針腳300B(第9B圖)、大致呈L狀之針腳300C(第9C圖)或呈尖針狀之針腳300D(第9D圖)。本發明所屬技術領域中具有 通常知識者,應視實際需要,彈性選擇針腳的外型種類。 9A to 9D are schematic views showing the stitches of the cleaning device according to other embodiments of the present invention. As shown in Fig. 9A, the outer shape of each of the stitches 300A is linear, so that the long axes L of the stitches 300A are parallel to each other. However, the present invention is not limited thereto. In other embodiments, for other needs or limitations, for example, as shown in FIGS. 9B to 9D, the stitches may also be hook-shaped pins 300B (FIG. 9B). A generally L-shaped stitch 300C (Fig. 9C) or a needle-shaped stitch 300D (Fig. 9D). Having the technical field of the present invention Generally, the knowledge should flexibly select the type of the pin according to the actual needs.

此外,其他變化中,如第9A圖所示,針腳300A的一端面301呈平面,且針腳300A的長軸L穿過針腳300A之平面301。然而,本發明不限於此,在其他實施方式中,為了其他需求或限制,舉例來說,如第9C圖所示,由於針腳300C呈勾狀,故,針腳300C的長軸L不穿過針腳300C之端面303;或者,第9D圖的針腳300D之一末端也可具有尖銳部302。本發明所屬技術領域中具有通常知識者,應視實際需要,彈性選擇針腳之一端的外型種類。 Further, in other variations, as shown in Fig. 9A, one end surface 301 of the stitch 300A is flat, and the long axis L of the stitch 300A passes through the plane 301 of the stitch 300A. However, the present invention is not limited thereto. In other embodiments, for other needs or limitations, for example, as shown in FIG. 9C, since the stitch 300C is hook-shaped, the long axis L of the stitch 300C does not pass through the stitch. The end face 303 of the 300C; or one end of the pin 300D of the 9D figure may have a sharp portion 302. Those having ordinary knowledge in the technical field to which the present invention pertains should flexibly select the type of appearance of one end of the pin according to actual needs.

此外,上述所有實施方式中,這些針腳包含金屬材質或非金屬材質,然而,只要這些針腳的材質的硬度足夠將封裝單元之導電端子之間距的髒汙或異物移除,本發明不限這些針腳之材質。更進一步,當這些針腳更包含抗靜電材質時,可降低產生靜電以傷害封裝單元的機會。 In addition, in all the above embodiments, the pins include a metal material or a non-metal material. However, as long as the hardness of the material of the pins is sufficient to remove dirt or foreign matter between the conductive terminals of the package unit, the present invention is not limited to the pins. Material. Furthermore, when these pins are further provided with an antistatic material, the chance of generating static electricity to damage the package unit can be reduced.

再者,上述所有實施方式中,可供清潔裝置進行清潔之封裝單元不限其種類與外型,舉例來說,封裝單元可為以下規格種類。四方形扁平封裝元件(quad flat package,QFP)、薄型四方形扁平封裝元件(Low/Thin quad flat package,LQFP或TQFP)、四方形扁平無引腳封裝元件(quad flat non-leaded package,QFN)、四方形扁平I形引腳封裝元件(quad flat I-leaded package,QFI)、小外型封裝元件(small outline package,SOP)、薄小外型封裝元件(Thin small outline package,TSOP)、小外型J型接腳封裝元件(Small Outline J-lead Package,SOJ)、小外型I型接腳封 裝元件(Small Outline I-lead Package,SOI)、帶引脚的陶瓷晶片載體(Ceramic Leaded Chip Carrier,CLCC)、帶引脚的塑膠晶片載體(Plastic Leaded Chip Carrier,PLCC)、J形引脚晶片載體(J-leaded chip carrier,JLCC)、單列直插式封裝元件(Single In-Line Package,SIP)、雙列直插式封裝元件(Dual In-Line Package,DIP)、塑膠雙列直插式封裝元件(Plastic Dual In-Line Package,P-DIP)、交叉引腳封裝元件(Zigzag In-Line Package,ZIP)、小外型電晶體(small outline transistor,SOT)、薄型電晶體(Thin small outline transistor,SOT)、針腳300柵格陣列(pin grid array,PGA)、球柵陣列封裝(Ball Grid Array,BGA)、塑膠球柵陣列封裝(PLASTIC Ball Grid Array,BGA)、散熱性之球柵陣列式封裝結構(HEAT SLUG Ball Grid Array,HSBGA)或晶片尺寸封裝(Chip-Scale Package,CSP)。 Furthermore, in all of the above embodiments, the package unit for cleaning by the cleaning device is not limited to the type and shape. For example, the package unit may be of the following specifications. Quad flat package (QFP), low/thin quad flat package (LQFP or TQFP), quad flat non-leaded package (QFN) , quad flat I-leaded package (QFI), small outline package (SOP), thin small outline package (TSOP), small Small Outline J-lead Package (SOJ), small outline type I pin seal Small Outline I-lead Package (SOI), Ceramic Leaded Chip Carrier (CLCC), Plastic Leaded Chip Carrier (PLCC), J-Lead Wafer J-leaded chip carrier (JLCC), single in-line package (SIP), dual in-line package (DIP), plastic dual in-line Packaged components (Plastic Dual In-Line Package, P-DIP), Zigzag In-Line Package (ZIP), Small Outline Transistor (SOT), Thin transistor (Thin small outline) Transistor, SOT), pin grid array (PGA), ball grid array (BGA), ball grid array (BGA), PLASTIC Ball Grid Array (BGA), heat dissipation ball grid array HEAT SLUG Ball Grid Array (HSBGA) or Chip-Scale Package (CSP).

本發明所屬技術領域中具有通常知識者,應視實際需要,彈性選擇清潔裝置進行清潔之封裝單元的外型種類。 Those having ordinary knowledge in the technical field to which the present invention pertains should flexibly select the type of the package unit to be cleaned by the cleaning device according to actual needs.

最後,上述所揭露之各實施例中,並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,皆可被保護於本發明中。因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 Finally, the various embodiments disclosed above are not intended to limit the invention, and those skilled in the art can be protected in various modifications and refinements without departing from the spirit and scope of the invention. In the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

10‧‧‧清潔裝置 10‧‧‧ cleaning device

100‧‧‧殼體 100‧‧‧shell

120‧‧‧第一開口 120‧‧‧ first opening

130‧‧‧第二開口 130‧‧‧second opening

170‧‧‧刻度表 170‧‧‧scale

200‧‧‧清潔頭 200‧‧‧ cleaning head

210‧‧‧本體 210‧‧‧ body

252‧‧‧操作件 252‧‧‧Operating parts

300‧‧‧針腳 300‧‧‧ stitches

400‧‧‧封裝單元 400‧‧‧Package unit

410‧‧‧導電端子 410‧‧‧Electrical terminals

D1‧‧‧第一方向 D1‧‧‧ first direction

D2‧‧‧第二方向 D2‧‧‧ second direction

G1‧‧‧間距 G1‧‧‧ spacing

G2‧‧‧間隙 G2‧‧‧ gap

X~Z‧‧‧軸 X~Z‧‧‧ axis

Claims (14)

一種清潔裝置,適於對一半導體產品進行清潔,該半導體產品具有複數個間隔排列之導電端子,且該些導電端子之間分別形成複數個間隙,該清潔裝置包含:一殼體;以及一清潔頭,包含:一本體,位於該殼體上;以及複數個針腳,間隔地並排於該本體上,用以分別伸入該些導電端子的該些間隙內,其中任二相鄰之該些針腳之間的空間恰容納單一該些導電端子,其中該些針腳可移動地位於該本體上,以致該些針腳間的複數個間距為可調整的。 A cleaning device is suitable for cleaning a semiconductor product, the semiconductor product has a plurality of spaced-apart conductive terminals, and a plurality of gaps are respectively formed between the conductive terminals, the cleaning device comprises: a casing; and a cleaning The head includes: a body on the housing; and a plurality of pins spaced side by side on the body for respectively extending into the gaps of the conductive terminals, wherein the two adjacent pins The space between them accommodates a single of the conductive terminals, wherein the pins are movably located on the body such that the plurality of pitches between the pins are adjustable. 如請求項1所述之清潔裝置,其中該本體包含:一伸縮機構,可伸縮地位於該殼體內,並沿一軸向伸縮,且該些針腳沿該軸向並排於該伸縮機構之一側,以致該些針腳彼此間的複數個間距隨著該伸縮機構的伸縮進行相應之調整;以及一調整部,活動地位於該殼體上,且連接該伸縮機構,用以控制該伸縮機構的伸縮。 The cleaning device of claim 1, wherein the body comprises: a telescopic mechanism retractably located in the housing and telescopically extending along an axial direction, and the stitches are side by side of the telescopic mechanism along the axial direction So that the plurality of stitches are spaced apart from each other by the expansion and contraction of the telescopic mechanism; and an adjusting portion is movably located on the housing and connected to the telescopic mechanism for controlling the expansion and contraction of the telescopic mechanism . 如請求項2所述之清潔裝置,其中該伸縮機構包含: 複數個軸桿,分別連接該些針腳,且每一該些針腳之一長軸與每一該些軸桿之一長軸至少相交;複數個第一連桿;複數個第二連桿,每一該些第二連桿的一端透過該些軸桿其中之一樞接每一該些第一連桿的一端;複數個第三連桿,每一該些第三連桿的一中間區域樞接每一該些第一連桿的一中間區域;以及複數個第四連桿,每一該些第四連桿的一端透過另一該些軸桿樞接每一該些第三連桿的一端,且每一該些第四連桿的一中間區域樞接每一該些第二連桿的一中間區域,其中該調整部連接該些第一連桿其中之一的另端與該些第三連桿其中之一的另端,其中,當該調整部轉動該些第一連桿、該些第二連桿、該些第三連桿與該些第四連桿,使得該些第一連桿的該些中間區域與該些第四連桿的該些中間區域彼此接近時,該伸縮機構縮小該些針腳的該些間距。 The cleaning device of claim 2, wherein the telescopic mechanism comprises: a plurality of shafts respectively connected to the stitches, and one of the long axes of each of the stitches intersects at least one of the long axes of each of the plurality of shafts; a plurality of first links; a plurality of second links, each One end of the second connecting rod is pivotally connected to one end of each of the first connecting rods through one of the shafts; a plurality of third connecting rods, and an intermediate portion of each of the third connecting rods Connecting an intermediate portion of each of the first links; and a plurality of fourth links, one end of each of the fourth links being pivotally connected to each of the third links through another of the plurality of shafts An intermediate portion of each of the fourth links is pivotally connected to an intermediate portion of each of the second links, wherein the adjusting portion connects the other ends of one of the first links with the The other end of one of the third links, wherein the adjusting portion rotates the first link, the second links, the third links, and the fourth links, so that the When the intermediate regions of a link and the intermediate regions of the fourth links are close to each other, the telescopic mechanism reduces the spacing of the stitches. 如請求項2所述之清潔裝置,其中該伸縮機構包含一Z型對折彈片,該Z型對折彈片之二相對端分別連接該殼體與該調整部,且具有複數個第一片體部與複數個第二片體部,該些第一片體部與該些第二片體部相互鄰接,每一該些第一片體部與其鄰接之該些第二片體部之間分別具有一鄰接側緣,其中該些針腳分別連接該些鄰接側緣,且每一該些針腳之一長軸與每一該些鄰接側緣之一長軸至少相交, 其中,當該調整部壓縮該Z型對折彈片,使得該些第一片體部與該些第二片體部彼此接近時,該伸縮機構縮小該些針腳的該些間距。 The cleaning device of claim 2, wherein the telescopic mechanism comprises a Z-shaped folded elastic piece, and the opposite ends of the Z-shaped folded elastic piece are respectively connected to the housing and the adjusting portion, and have a plurality of first body portions and a plurality of second body portions, wherein the first body portions and the second body portions are adjacent to each other, and each of the first body portions and the second portion adjacent to each of the second body portions respectively have a Adjacent side edges, wherein the pins are respectively connected to the adjacent side edges, and one of the long axes of each of the pins intersects at least one of the long axes of each of the adjacent side edges, Wherein, when the adjusting portion compresses the Z-folding elastic piece such that the first piece body portion and the second piece body portions are close to each other, the telescopic mechanism reduces the spacing of the stitches. 如請求項2所述之清潔裝置,其中該調整部為一滑塊,該滑塊可滑動地位於該殼體上,且連接該伸縮機構之一端,用以藉由控制該伸縮機構的伸縮,調整該些針腳的該些間距。 The cleaning device of claim 2, wherein the adjusting portion is a slider slidably located on the housing and connected to one end of the telescopic mechanism for controlling expansion and contraction of the telescopic mechanism. Adjust the spacing of the stitches. 如請求項5所述之清潔裝置,其中該些針腳等距地並排於該本體上,其中該些針腳的該些間距彼此相同;以及該殼體表面鄰近該滑塊之位置具有一刻度表,該刻度表具有複數個刻度值,該些刻度值分別對應表示該些針腳的該些間距。 The cleaning device of claim 5, wherein the stitches are equidistantly arranged on the body, wherein the pitches of the stitches are identical to each other; and the surface of the housing has a scale adjacent to the slider. The scale has a plurality of scale values, and the scale values respectively correspond to the pitches of the stitches. 如請求項2所述之清潔裝置,其中該伸縮機構具回復彈性,該調整部為一旋轉螺栓,該旋轉螺栓螺接於該殼體上,且該旋轉螺栓抵靠該伸縮機構之一端,用以藉由控制該伸縮機構的伸縮,調整該些針腳的該些間距。 The cleaning device of claim 2, wherein the telescopic mechanism has a resilient elasticity, the adjusting portion is a rotating bolt, the rotating bolt is screwed to the housing, and the rotating bolt abuts against one end of the telescopic mechanism, The spacing of the stitches is adjusted by controlling the expansion and contraction of the telescopic mechanism. 如請求項7所述之清潔裝置,其中該些針腳等距地並排於該本體上,其中該些針腳的該些間距彼此相同;以及 該旋轉螺栓表面具有一刻度表,該刻度表具有複數個刻度值,該些刻度值分別對應表示該些針腳的該些間距。 The cleaning device of claim 7, wherein the stitches are juxtaposed side by side on the body, wherein the pitches of the stitches are identical to each other; The surface of the rotating bolt has a scale, and the scale has a plurality of scale values, and the scale values respectively correspond to the pitches of the stitches. 如請求項1所述之清潔裝置,其中該些針腳固定地位於該本體上,以致該些針腳彼此間的複數個間距為不變的。 The cleaning device of claim 1, wherein the pins are fixedly located on the body such that the plurality of stitches are spaced apart from each other by a constant distance. 如請求項1所述之清潔裝置,其中該清潔頭可拆卸地位於該殼體上。 A cleaning device according to claim 1, wherein the cleaning head is detachably located on the housing. 如請求項1所述之清潔裝置,其中該些針腳等距地並排於該本體上,其中該些針腳彼此間的複數個間距彼此相同。 The cleaning device of claim 1, wherein the stitches are juxtaposed side by side on the body, wherein the plurality of stitches are spaced apart from each other by a plurality of intervals. 如請求項1所述之清潔裝置,其中該些針腳包含抗靜電材質。 The cleaning device of claim 1, wherein the pins comprise an antistatic material. 如請求項1所述之清潔裝置,其中每一該些針腳呈直線狀、勾狀、L狀或尖針狀。 The cleaning device of claim 1, wherein each of the stitches is linear, hooked, L-shaped or pointed. 如請求項1所述之清潔裝置,其中每一該些針腳之一末端具有尖銳部或平面。 The cleaning device of claim 1, wherein one of the ends of each of the pins has a sharp portion or a flat surface.
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