TWI558841B - Slit valve tunnel support - Google Patents

Slit valve tunnel support Download PDF

Info

Publication number
TWI558841B
TWI558841B TW099145003A TW99145003A TWI558841B TW I558841 B TWI558841 B TW I558841B TW 099145003 A TW099145003 A TW 099145003A TW 99145003 A TW99145003 A TW 99145003A TW I558841 B TWI558841 B TW I558841B
Authority
TW
Taiwan
Prior art keywords
cover
chamber
plate
processing chamber
coupled
Prior art date
Application number
TW099145003A
Other languages
Chinese (zh)
Other versions
TW201134980A (en
Inventor
安瓦蘇華
Original Assignee
應用材料股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 應用材料股份有限公司 filed Critical 應用材料股份有限公司
Publication of TW201134980A publication Critical patent/TW201134980A/en
Application granted granted Critical
Publication of TWI558841B publication Critical patent/TWI558841B/en

Links

Description

狹縫閥通道支撐件Slit valve channel support

本發明的實施例一般係涉及電子元件製造。更具體地說,本發明的實施例係涉及防止在大面積基板處理室中於狹縫閥通道(slit valve tunnel)附近變形的方法和設備。Embodiments of the invention generally relate to the manufacture of electronic components. More specifically, embodiments of the present invention relate to methods and apparatus for preventing deformation in the vicinity of a slit valve tunnel in a large area substrate processing chamber.

基板處理室一般通過可密封開口與基板傳遞室連通,而該可密封開口係寬且相對較短以方便水平定向基板的置入和移除。眾所周知,使用腔室隔離閥(亦稱之為狹縫閥)來密封這樣的開口。例如,可使狹縫閥的密封板(亦稱之為密封門)延伸以密封開口,並且縮回以允許基板穿過此開口。The substrate processing chamber is typically in communication with the substrate transfer chamber through a sealable opening that is wide and relatively short to facilitate placement and removal of the horizontally oriented substrate. It is known to use a chamber isolation valve (also known as a slit valve) to seal such an opening. For example, a sealing plate (also referred to as a sealing door) of the slit valve can be extended to seal the opening and retracted to allow the substrate to pass through the opening.

狹縫閥經設計以在處理期間密封處理室,並且允許處理室維持在例如真空環境的處理條件。然而,在處理室內部和外部之間的壓差可能導致由狹縫閥密封的開口變形。對於處理需要非常寬開口的非常大型的基板(即,尺寸大於約1,000 mm x 1,000 mm)的處理室尤其如此。The slit valve is designed to seal the process chamber during processing and to allow the process chamber to be maintained under processing conditions such as a vacuum environment. However, a pressure differential between the interior of the processing chamber and the exterior may cause deformation of the opening sealed by the slit valve. This is especially true for processing chambers that require very large substrates that require very wide openings (i.e., sizes greater than about 1,000 mm x 1,000 mm).

因此,存在對於預防腔室之間的大壓差的改進狹縫閥的需要。Therefore, there is a need for an improved slit valve that prevents large pressure differences between chambers.

本發明的實施例提供了用於防止在大面積基板處理室中於狹縫閥通道附近變形的方法和設備。Embodiments of the present invention provide methods and apparatus for preventing deformation in the vicinity of a slit valve passage in a large area substrate processing chamber.

本發明的一個實施例提供一處理室,其包括:一室體,具有配置以允許基板通過的開口;一狹縫閥,係設置在室體外側,以選擇性地密封開口;以及一支撐組件,係剛性地耦接在室體與狹縫閥的殼體之間,以防止開口變形。One embodiment of the present invention provides a processing chamber including: a chamber having an opening configured to allow passage of a substrate; a slit valve disposed outside the chamber to selectively seal the opening; and a support assembly , is rigidly coupled between the chamber body and the housing of the slit valve to prevent deformation of the opening.

本發明揭示了用於防止狹縫閥通道變形的方法和設備。本發明的實施例包含狹縫閥通道支撐組件130,該狹縫閥通道支撐組件130增加了室體的剛性,尤其在長狹縫閥通道附近增加了室體的剛性以防止室體變形。在一個實施例中,狹縫閥通道支撐組件包含耦接至室體的板支撐件,該室體連接至管支撐件,該管支撐件耦接至設置在腔室外部的狹縫閥殼體(housing)。室體形成具有狹縫閥殼體、管支撐件和板支撐件的剛性結構,因此獲得了增加的剛性,以預防由在室體內部和外部之間的壓差所導致的變形。處理的精確性和處理的均勻性可隨著變形的減少而改進。Methods and apparatus for preventing deformation of a slit valve passage are disclosed. Embodiments of the present invention include a slit valve channel support assembly 130 that increases the rigidity of the chamber body, particularly in the vicinity of the long slit valve passage, to increase the rigidity of the chamber body to prevent deformation of the chamber body. In one embodiment, the slit valve channel support assembly includes a plate support coupled to the chamber body, the chamber body coupled to the tube support, the tube support coupled to a slit valve housing disposed outside the chamber (housing). The chamber body forms a rigid structure with a slit valve housing, a tube support and a plate support, thus achieving increased rigidity to prevent deformation caused by a pressure differential between the interior and exterior of the chamber body. The accuracy of the treatment and the uniformity of the treatment can be improved as the deformation is reduced.

第1圖為可適用而受益於本發明的示例性基板處理系統10的示意平面圖。基板處理系統10可以包括加載鎖定室20、傳遞室30、傳遞機器手(robot)31和多個基板處理室40和50。加載鎖定室20允許將一或多個基板引入基板處理系統10的真空環境中,而無需將整個系統加壓到大氣壓力。在處理室40和處理室50中處理基板。基板處理室40和基板處理室50可以在基板上執行例如:化學氣相沉積(chemical vapor deposition;CVD)、物理氣相沉積(physical vapor deposition;PVD)和電漿增強化學氣相沉積(plasma-enhanced chemical vapor deposition;PECVD)的處理。在一個實施例中,處理系統10係配置以處理大面積基板,諸如用於平板顯示器的基板。 1 is a schematic plan view of an exemplary substrate processing system 10 that is applicable to benefit from the present invention. The substrate processing system 10 can include a load lock chamber 20, a transfer chamber 30, a transfer robot 31, and a plurality of substrate processing chambers 40 and 50. The load lock chamber 20 allows one or more substrates to be introduced into the vacuum environment of the substrate processing system 10 without pressurizing the entire system to atmospheric pressure. The substrate is processed in the processing chamber 40 and the processing chamber 50. The substrate processing chamber 40 and the substrate processing chamber 50 may perform, for example, chemical vapor deposition (CVD), physical vapor deposition (PVD), and plasma enhanced chemical vapor deposition (plasma-) on the substrate. Enhanced chemical vapor deposition; PECVD). In one embodiment, processing system 10 is configured to process large area substrates, such as substrates for flat panel displays.

一般地,基板處理室40和基板處理室50可以彼此隔離,以使不相容處理氣體的滲透降至最低,且因為不同處理可能需要顯著不同的真空度。在傳遞室30內部的傳遞機器手31根據需要而在基板處理室40、基板處理室50和加載鎖定室20之間傳遞基板。一般地,基板處理系統10的各腔室可以借助於一或多個狹縫閥101與所有其他腔室隔離。如第1圖所示,狹縫閥101係設置在傳遞室30中,並且在處理室40、處理室50的外部。 In general, substrate processing chamber 40 and substrate processing chamber 50 may be isolated from each other to minimize penetration of incompatible process gases, and may require significantly different degrees of vacuum because of different processes. The transfer robot 31 inside the transfer chamber 30 transfers the substrate between the substrate processing chamber 40, the substrate processing chamber 50, and the load lock chamber 20 as needed. In general, each chamber of substrate processing system 10 can be isolated from all other chambers by means of one or more slit valves 101. As shown in Fig. 1, the slit valve 101 is provided in the transfer chamber 30 and outside the processing chamber 40 and the processing chamber 50.

處理室40、處理室50中的至少一者與通道支撐組件130接合。如下文進一步描述,通道支撐組件130增加處理室40、50的室體之的剛性,尤其在長狹縫閥通道附近增加了室體的剛性以防止室體變形。 At least one of the processing chamber 40, the processing chamber 50 is engaged with the channel support assembly 130. As further described below, the channel support assembly 130 increases the rigidity of the chamber body of the processing chambers 40, 50, particularly in the vicinity of the long slit valve passages to increase the rigidity of the chamber body to prevent deformation of the chamber body.

第2圖是根據本發明的一個實施例之附接至狹縫閥101的處理室50之示意截面前視圖。第3圖是第2圖的處理室50與狹縫閥101之示意截面側視圖。可以類似地建構處理室40。 2 is a schematic cross-sectional front view of a processing chamber 50 attached to a slit valve 101 in accordance with one embodiment of the present invention. Fig. 3 is a schematic cross-sectional side view of the processing chamber 50 and the slit valve 101 of Fig. 2. The processing chamber 40 can be similarly constructed.

處理室50包含室體52、附接至室體52的蓋56、及背板60、懸掛件58,以及設置在蓋56的開口中用於向處理室50供應處理氣體的氣體分配板62。狹縫閥通道54在室體52的一側上形成,並且經配置以允許待處理的基板通過。The processing chamber 50 includes a chamber body 52, a cover 56 attached to the chamber body 52, and a backing plate 60, a hanger 58, and a gas distribution plate 62 disposed in the opening of the cover 56 for supplying process gas to the processing chamber 50. A slit valve passage 54 is formed on one side of the chamber body 52 and is configured to allow passage of the substrate to be processed.

在一個實施例中,狹縫閥101在室體52外部附接至處理室50。狹縫閥101係配置以選擇性地密封該狹縫閥通道54,並且當狹縫閥通道54密封時允許在處理室50內部和外部之間的壓差。In one embodiment, the slit valve 101 is attached to the processing chamber 50 outside of the chamber body 52. The slit valve 101 is configured to selectively seal the slit valve passage 54 and to allow a pressure differential between the interior and exterior of the process chamber 50 when the slit valve passage 54 is sealed.

在一個實施例中,狹縫閥101包含用於密封狹縫閥通道54的封閉構件103和至少一部分封閉構件103可以在其中移動地設置的閥殼體105。閥殼體105通常是具有開口117和開口115的金屬外殼,而開口115、117與處理室的狹縫閥通道54對準。當未密封時,狹縫閥通道54與開口117、開口115一起提供用於待處理的基板之通道。狹縫閥101的閥殼體105可以抵靠處理室50放置,以使得在閥殼體105和待密封的狹縫閥通道54之間形成密封。閥殼體105尤其在高壓差處理期間向室體52提供結構支撐。In one embodiment, the slit valve 101 includes a closure member 103 for sealing the slit valve passage 54 and a valve housing 105 at least a portion of the closure member 103 movably disposed therein. The valve housing 105 is typically a metal housing having an opening 117 and an opening 115, while the openings 115, 117 are aligned with the slit valve passage 54 of the processing chamber. When unsealed, the slit valve passage 54 together with the opening 117, opening 115 provides a passage for the substrate to be treated. The valve housing 105 of the slit valve 101 can be placed against the processing chamber 50 such that a seal is formed between the valve housing 105 and the slit valve passage 54 to be sealed. The valve housing 105 provides structural support to the chamber body 52, particularly during high pressure differential processing.

封閉構件103在閥殼體105內垂直地移動,以密封和開啟處理室50的狹縫閥通道54。在一個實施例中,密封件104可以設置在開口117周圍,或在封閉構件103上,以實現在封閉構件103和閥殼體105之間的氣密密封。The closure member 103 moves vertically within the valve housing 105 to seal and open the slit valve passage 54 of the process chamber 50. In one embodiment, the seal 104 may be disposed around the opening 117 or on the closure member 103 to achieve a hermetic seal between the closure member 103 and the valve housing 105.

在一個實施例中,通道支撐組件130耦接至處理室50以防止狹縫閥通道54由於在室體52內部的真空和在室體52外部的大氣壓力之間的壓差所而產生的變形。例如,通道支撐組件130係配置以防止狹縫閥通道54的上邊緣54a由於作用於室體52的內向壓力而下垂,如虛線54b所示。In one embodiment, the channel support assembly 130 is coupled to the processing chamber 50 to prevent deformation of the slit valve passage 54 due to a pressure differential between the vacuum inside the chamber body 52 and the atmospheric pressure outside the chamber body 52. . For example, the channel support assembly 130 is configured to prevent the upper edge 54a of the slit valve passage 54 from sagging due to the inward pressure acting on the chamber body 52, as indicated by the dashed line 54b.

在一個實施例中,通道支撐組件130包含耦接至狹縫閥殼體105的管支撐件120,和耦接至管支撐件120與處理室50兩者的板支撐件122。在一個實施例中,管支撐件120和板支撐件122可以設置在狹縫閥殼體105上方,並且至少沿著狹縫閥通道54的長度而延伸。空心的管支撐件120重量輕,並且對處理室50提供剛性。在一個實施例中,管支撐件120和板支撐件122可由鋼形成。管支撐件120和板支撐件122可以藉由緊固、夾緊或其他適當的方法固定就位。 In one embodiment, the channel support assembly 130 includes a tube support 120 coupled to the slit valve housing 105 and a plate support 122 coupled to both the tube support 120 and the processing chamber 50. In one embodiment, the tube support 120 and the plate support 122 may be disposed above the slit valve housing 105 and extend at least along the length of the slit valve passage 54. The hollow tube support 120 is lightweight and provides rigidity to the processing chamber 50. In one embodiment, the tube support 120 and the plate support 122 may be formed from steel. Tube support 120 and plate support 122 can be secured in place by fastening, clamping, or other suitable means.

在第3圖所繪的實施例中,板支撐件122通過緊固件140連接至管支撐件120,該緊固件140穿過在板支撐件122中形成的孔142並且與管支撐件120中形成的螺紋孔144嚙合。管支撐件120藉由緊固件190連接至狹縫閥殼體105,該緊固件190穿過在管支撐件120中形成的孔192並且與狹縫閥殼體105中形成的螺紋孔194嚙合。可以預期板支撐件122、管支撐件120和狹縫閥殼體105可以採提供防止狹縫閥通道中的下垂的預期效果的不同方式緊固及/或固定在一起。 In the embodiment depicted in FIG. 3, the plate support 122 is coupled to the tube support 120 by fasteners 140 that pass through the apertures 142 formed in the plate support 122 and form with the tube support 120. The threaded holes 144 are engaged. The tube support 120 is coupled to the slit valve housing 105 by a fastener 190 that passes through an aperture 192 formed in the tube support 120 and that engages a threaded bore 194 formed in the slit valve housing 105. It is contemplated that the plate support 122, the tube support 120, and the slit valve housing 105 can be fastened and/or secured together in different ways that provide the desired effect of preventing sagging in the slit valve passage.

處理室50的室體52與板支撐件122、管支撐件120和閥殼體105形成剛性體,因此獲得了增加的剛性,以預防由在室體內部和外部之間的壓差導致的變形。處理的精確性和處理的均勻性可隨著變形的減少而改進。 The chamber body 52 of the processing chamber 50 forms a rigid body with the plate support 122, the tube support 120 and the valve housing 105, thus obtaining increased rigidity to prevent deformation caused by a pressure difference between the inside and the outside of the chamber body. . The accuracy of the treatment and the uniformity of the treatment can be improved as the deformation is reduced.

在一個實施例中,如第3圖所示,緊固件150延伸穿過在板支撐件122中形成的孔152,並且與在室體52中形成的螺紋孔156嚙合。為了允許緊固件150進入孔152,可以在板支撐件122一側的表面中形成扇形開口154,如在第3A-3B圖中進一步所示者。板支撐件122可連接至室蓋56、背板60或室體52。當連接至背板60時,板支撐件122可與背板60為電性絕緣。定向在垂直平面中的板支撐件122對於垂直變形具有高度抗性,從而實質防止室體52下垂到狹縫閥通道54中。In one embodiment, as shown in FIG. 3, the fastener 150 extends through an aperture 152 formed in the panel support 122 and engages a threaded aperture 156 formed in the chamber body 52. To allow the fastener 150 to enter the aperture 152, a fan-shaped opening 154 can be formed in the surface of one side of the panel support 122, as further shown in Figures 3A-3B. The plate support 122 can be coupled to the chamber cover 56, the back plate 60, or the chamber body 52. When connected to the backing plate 60, the board support 122 can be electrically insulated from the backing plate 60. The plate support 122 oriented in a vertical plane is highly resistant to vertical deformation, thereby substantially preventing the chamber body 52 from sagging into the slit valve passage 54.

此外,如第3圖的實施例中所示,蓋56由蓋加強板180及/或蓋加強管182所支撐,以防止蓋56對室體52施加力,這可能導致狹縫閥通道54中的下垂,而該力是由於處理室50內的真空而由背板60施加於蓋56上的力所引起的。在第3圖中所繪的實施例中,蓋加強板180藉由緊固件160而連接至蓋56,該緊固件160係設置穿過在蓋加強板180中的孔162,並且與在蓋56中形成的螺紋孔166嚙合。在蓋加強板180中提供扇形孔164,以提供緊固件160的通路。蓋加強板180可以由諸如鋁或鋼的導電材料形成,該導電材料具有通過蓋56返回以穿過蓋加強板180到覆蓋板184的射頻功率,其將射頻電流發送回到射頻功率源(圖中未示)。在背板60與蓋56之間設置絕緣體188以在其間提供電絕緣。Moreover, as shown in the embodiment of FIG. 3, the cover 56 is supported by the cover reinforcement panel 180 and/or the cover reinforcement tube 182 to prevent the cover 56 from exerting a force on the chamber body 52, which may result in the slit valve passage 54. The sag is caused by the force exerted by the backing plate 60 on the cover 56 due to the vacuum within the processing chamber 50. In the embodiment depicted in FIG. 3, the cover reinforcement panel 180 is coupled to the cover 56 by a fastener 160 that is disposed through the aperture 162 in the cover reinforcement panel 180 and with the cover 56. The threaded holes 166 formed therein are engaged. A scalloped hole 164 is provided in the cover reinforcement panel 180 to provide access to the fastener 160. The cover stiffener 180 may be formed from a conductive material, such as aluminum or steel, having radio frequency power that is returned through the cover 56 to pass through the cover stiffener 180 to the cover plate 184, which sends RF current back to the RF power source (figure Not shown). An insulator 188 is disposed between the backing plate 60 and the cover 56 to provide electrical insulation therebetween.

加強管182在蓋56的相對側上耦接至加強板180。在第3圖中所繪示的實施例中,利用緊固件170將加強管182固定至蓋加強板180。Reinforcing tube 182 is coupled to stiffener 180 on the opposite side of cover 56. In the embodiment illustrated in FIG. 3, the reinforcement tube 182 is secured to the cover reinforcement panel 180 using fasteners 170.

支撐組件130可以具有提供處理室的剛性之任何適當的結構,其取決於腔室或狹縫閥或其他有關裝置的結構。在一個實施例中,如第4圖所示,板支撐件124可連接至背板60,並且橋接構件126可用於將板支撐件124與管支撐件120連接。 The support assembly 130 can have any suitable structure that provides rigidity to the processing chamber depending on the configuration of the chamber or slit valve or other associated device. In one embodiment, as shown in FIG. 4, the plate support 124 can be coupled to the backing plate 60 and the bridging member 126 can be used to connect the plate support 124 to the tube support 120.

第5圖圖示根據本發明的另一實施例之處理室與狹縫閥的部分截面側視圖的另一實施例。在第5圖中所繪示的處理室50與在第3圖中所繪示的處理室50大致類似,除了下列特徵:其中支撐組件500的板支撐件510在防止狹縫閥通道54中的下垂之位置而與蓋56連接。雖然未在第5圖中圖示,但是管支撐件120可以採第3圖中圖示的方式或其他適當的方式而連接至狹縫閥殼體105和板支撐件510。 Figure 5 illustrates another embodiment of a partial cross-sectional side view of a process chamber and a slit valve in accordance with another embodiment of the present invention. The processing chamber 50 illustrated in FIG. 5 is substantially similar to the processing chamber 50 illustrated in FIG. 3 except for the feature in which the panel support 510 of the support assembly 500 is in the slit valve passage 54. The position of the sagging is connected to the cover 56. Although not illustrated in FIG. 5, the tube support 120 can be coupled to the slit valve housing 105 and the plate support 510 in the manner illustrated in FIG. 3 or other suitable manner.

在第5圖所繪示的實施例中,板支撐件510藉由緊固件508而緊固於蓋56,該緊固件508係設置穿過在板支撐件510中形成的孔502,並且與在蓋56中形成的螺紋孔506嚙合。緊固件508的通路由扇形開口504提供。 In the embodiment illustrated in FIG. 5, the plate support 510 is secured to the cover 56 by fasteners 508 that are disposed through holes 502 formed in the plate support 510 and The threaded holes 506 formed in the cover 56 are engaged. The passage of the fastener 508 is provided by a sector opening 504.

為了在蓋56與覆蓋板184之間提供良好的射頻返回路徑,在蓋56與覆蓋板184之間連接有一導體512。導體512通常是良好的射頻導體,諸如鋁薄板。在第5圖中所繪示的實施例中,導體512包括一端鉗合在板支撐件510與蓋56之間的一個突出部(tab),以及設置而實質平行於連接至覆蓋板184的第一突出部,並且自第一突出部偏移的第二突出部,其給予導體實質Z形剖面。導體512與背板60為電性絕緣。 To provide a good RF return path between the cover 56 and the cover panel 184, a conductor 512 is coupled between the cover 56 and the cover panel 184. Conductor 512 is typically a good radio frequency conductor such as an aluminum sheet. In the embodiment illustrated in FIG. 5, the conductor 512 includes a tab that is clamped between the plate support 510 and the cover 56 at one end, and is disposed substantially parallel to the first connection to the cover plate 184. A projection and a second projection offset from the first projection imparts a substantially Z-shaped cross-section to the conductor. Conductor 512 is electrically insulated from backing plate 60.

在本文揭示的各種實施例中,板支撐件通常圖示為具有矩形剖面,該矩形剖面係實質沿著處理室體52的整個側面延伸。可以預期板支撐件可由諸如鋁、鋼或其他適當材料的任何適當結構構件製成。雖然板支撐件係圖示為具有實質矩形剖面,但是應瞭解板支撐件的剖面或其他幾何形狀可以包括適於加強室體,並且防止狹縫閥通道54中的下垂之其他幾何形狀。其他幾何形狀包括諸如管的空心形狀、高束形(high beam)、三角形、梯形形狀以及其他幾何形狀。同樣地,在此設置的管支撐件或者可以類似於板支撐件而配置,其中設計配置係防止由於來自處理室50內的真空壓力之力導致的狹縫閥中的下垂。In various embodiments disclosed herein, the plate support is generally illustrated as having a rectangular cross-section that extends substantially along the entire side of the process chamber body 52. It is contemplated that the panel support can be made of any suitable structural member such as aluminum, steel, or other suitable material. While the plate support is illustrated as having a substantially rectangular cross-section, it will be appreciated that the cross-section or other geometry of the plate support may include other geometries suitable for reinforcing the chamber body and preventing sagging in the slit valve passage 54. Other geometries include hollow shapes such as tubes, high beams, triangles, trapezoidal shapes, and other geometric shapes. Likewise, the tube support disposed herein may alternatively be configured similar to a plate support that is designed to prevent sagging in the slit valve due to forces from vacuum pressure within the processing chamber 50.

雖然在本案中將管支撐件和板支撐件描述為支撐組件,但是可以預期可向處理室體提供剛性以防止狹縫閥開口變形的任何結構。Although the tube support and the plate support are described herein as a support assembly, any structure that provides rigidity to the process chamber body to prevent deformation of the slit valve opening is contemplated.

儘管上述內容針對本發明的實施例,但可以在不脫離本發明的基本範圍的情況下諸如結合本發明的多個方面設想本發明的其他及更多實施例,且本發明的範圍是由以上申請專利範圍來決定。While the foregoing is directed to embodiments of the present invention, the subject matter of the invention The scope of the patent application is decided.

10...系統10. . . system

20...加載鎖定室20. . . Load lock room

30...傳遞室30. . . Transfer room

31...傳遞機器手31. . . Passing robot

40,50...處理室40,50. . . Processing room

52...室體52. . . Chamber body

54...狹縫閥通道54. . . Slit valve channel

54a...上邊緣54a. . . Upper edge

54b...虛線54b. . . dotted line

56...蓋56. . . cover

58...懸掛件58. . . Suspension

60...背板60. . . Backplane

62...氣體分配板62. . . Gas distribution plate

101...狹縫閥101. . . Slit valve

103...封閉構件103. . . Closure member

104...密封件104. . . Seals

105...閥殼體105. . . Valve housing

115,117...開口115,117. . . Opening

120...管支撐件120. . . Pipe support

122...板支撐件122. . . Plate support

124...板支撐件124. . . Plate support

126...橋接構件126. . . Bridging member

130...支撐組件130. . . Support assembly

140...緊固件140. . . fastener

142...孔142. . . hole

144...螺紋孔144. . . Threaded hole

150...緊固件150. . . fastener

152...孔152. . . hole

154...開口154. . . Opening

156...孔156. . . hole

160...緊固件160. . . fastener

162...孔162. . . hole

164...扇形孔164. . . Fan hole

166...孔166. . . hole

170...緊固件170. . . fastener

180...蓋加強板180. . . Cover reinforcement

182...蓋加強管182. . . Cover reinforcement tube

184...覆蓋板184. . . Cover plate

188...絕緣體188. . . Insulator

190...緊固件190. . . fastener

192...孔192. . . hole

194...螺紋孔194. . . Threaded hole

500...支撐組件/緊固件500. . . Support assembly/fastener

502...孔502. . . hole

504...開口504. . . Opening

506...孔506. . . hole

510...板支撐件510. . . Plate support

512...導體512. . . conductor

因此,可以詳細理解本發明的上述特徵的方式,可以參考實施例獲得上文簡要概述的本發明的更具體描述,其中一些實施例圖示於附圖中。然而,應注意,附圖僅圖示本發明的典型實施例,且因此不應將其視為對本發明範圍的限制,因為本發明可以允許其他同等有效的實施例。Therefore, the above-described features of the present invention may be understood in detail, and a more detailed description of the invention may be It is to be understood, however, that the appended claims are in the claims

第1圖,係可適用而受益於本發明的示例性基板處理系統之示意平面圖。Figure 1 is a schematic plan view of an exemplary substrate processing system that may be adapted to benefit from the present invention.

第2圖,係根據本發明的一個實施例之附接至狹縫閥的處理室之示意截面前視圖。2 is a schematic cross-sectional front view of a processing chamber attached to a slit valve in accordance with an embodiment of the present invention.

第3圖,係第2圖的處理室與狹縫閥之示意截面側視圖。Fig. 3 is a schematic cross-sectional side view of the processing chamber and the slit valve of Fig. 2.

第3A-B圖,係第3圖的處理室之板支撐件的局部視圖。3A-B is a partial view of the plate support of the processing chamber of Fig. 3.

第4圖,係根據本發明的另一實施例之處理室與狹縫閥的示意截面側視圖。Figure 4 is a schematic cross-sectional side view of a process chamber and a slit valve in accordance with another embodiment of the present invention.

第5圖,係根據本發明的另一實施例之處理室與狹縫閥的示意截面側視圖。Figure 5 is a schematic cross-sectional side view of a process chamber and a slit valve in accordance with another embodiment of the present invention.

為清楚起見,在適用的情況下已使用相同元件符號以指定在各圖之間所共有的相同元件。For the sake of clarity, the same component symbols have been used where applicable to specify the same components that are common between the various figures.

50...處理室50. . . Processing room

54...狹縫閥通道54. . . Slit valve channel

54a...上邊緣54a. . . Upper edge

54b...虛線54b. . . dotted line

56...蓋56. . . cover

60...背板60. . . Backplane

103...封閉構件103. . . Closure member

104...密封件104. . . Seals

105...閥殼體105. . . Valve housing

117...開口117. . . Opening

120...管支撐件120. . . Pipe support

Claims (20)

一種處理室,包含:一室體,具有配置以允許基板通過的一通道;一狹縫閥,係設置在該室體的外側,以選擇性地密封該通道;以及一支撐組件,係剛性地耦接在該室體與該狹縫閥的一殼體之間,以防止該通道變形,其中該支撐組件更包含:一管支撐件,係耦接至該狹縫閥的一殼體;以及一板支撐件,係耦接至該管支撐件及該室體。 A processing chamber comprising: a chamber body having a passage configured to allow passage of a substrate; a slit valve disposed on an outer side of the chamber body to selectively seal the passage; and a support assembly rigidly Coupling between the chamber body and a housing of the slit valve to prevent deformation of the passage, wherein the support assembly further comprises: a tube support coupled to a housing of the slit valve; A plate support is coupled to the tube support and the chamber body. 一種處理室,包含:一室體,具有配置以允許基板通過的一通道;一狹縫閥,係設置在該室體的外側,以選擇性地密封該通道;以及一支撐組件,係剛性地耦接在該室體與該狹縫閥的一殼體之間,以防止該通道變形,其中該支撐組件更包含:一板支撐件,係設置在該狹縫閥之該殼體的上方,並且至少沿著穿過該室體形成的該通道之一長度延伸。 A processing chamber comprising: a chamber body having a passage configured to allow passage of a substrate; a slit valve disposed on an outer side of the chamber body to selectively seal the passage; and a support assembly rigidly Coupling between the chamber body and a housing of the slit valve to prevent deformation of the passage, wherein the support assembly further comprises: a plate support member disposed above the housing of the slit valve And extending at least along a length of one of the channels formed through the chamber body. 一種處理室,包含:一室體,具有配置以允許基板通過的一通道; 一狹縫閥,係設置在該室體的外側,以選擇性地密封該通道;以及一支撐組件,係剛性地耦接在該室體與該狹縫閥的一殼體之間,以防止該通道變形,其中該支撐組件更包含:一空心管支撐件,係耦接至在穿過該室體形成的該通道之上方的該處理室。 A processing chamber comprising: a chamber body having a passage configured to allow passage of a substrate; a slit valve disposed on an outer side of the chamber body to selectively seal the passage; and a support assembly rigidly coupled between the chamber body and a housing of the slit valve to prevent The channel is deformed, wherein the support assembly further comprises: a hollow tube support coupled to the processing chamber above the passage formed through the chamber body. 如申請專利範圍第1項或第2項所述之處理室,其中該板支撐件係耦接至該室體的一蓋。 The processing chamber of claim 1 or 2, wherein the plate support is coupled to a cover of the chamber body. 如申請專利範圍第1項或第2項所述之處理室,其中該板支撐件係耦接至一氣體分配組件的一背板。 The process chamber of claim 1 or 2, wherein the plate support is coupled to a backing plate of a gas distribution assembly. 如申請專利範圍第1項所述之處理室,其中該板支撐件及該管支撐件係由鋼形成。 The processing chamber of claim 1, wherein the plate support and the tube support are formed of steel. 如申請專利範圍第1-3項中任一項所述之處理室,更包含:一蓋,係封閉該室體;以及一蓋加強板及/或蓋加強管,係耦接至該蓋的一上表面。 The processing chamber of any one of claims 1-3, further comprising: a cover for closing the chamber body; and a cover reinforcing plate and/or a cover reinforcing tube coupled to the cover An upper surface. 如申請專利範圍第1-3項中任一項所述之處理室,更包含:一蓋,係封閉該室體;以及 一射頻導電蓋加強板,係耦接至該蓋的一上表面。 The processing chamber of any one of claims 1-3, further comprising: a cover that closes the chamber; An RF conductive cover reinforcing plate is coupled to an upper surface of the cover. 如申請專利範圍第8項所述之處理室,更包含:一加強管,係在該蓋的一側上耦接至該加強板。 The processing chamber of claim 8 further comprising: a reinforcing tube coupled to the reinforcing plate on one side of the cover. 如申請專利範圍第8項所述之處理室,更包含:一覆蓋板,係設置在該蓋加強板的上方,該覆蓋板將該蓋加強板和一射頻功率源電連接,以作為一接地返回路徑的一部分。 The processing chamber of claim 8, further comprising: a cover plate disposed above the cover reinforcement plate, the cover plate electrically connecting the cover reinforcement plate and a radio frequency power source to serve as a grounding Returns a part of the path. 如申請專利範圍第10項所述之處理室,更包含:一導體,係在該蓋與該覆蓋板之間提供一射頻連接。 The processing chamber of claim 10, further comprising: a conductor for providing a radio frequency connection between the cover and the cover plate. 如申請專利範圍第10項所述之處理室,更包含:一導體,係耦接在該蓋與該覆蓋板之間。 The processing chamber of claim 10, further comprising: a conductor coupled between the cover and the cover plate. 如申請專利範圍第12項所述之處理室,其中該導體更包含:一鋁板。 The processing chamber of claim 12, wherein the conductor further comprises: an aluminum plate. 如申請專利範圍第12項所述之處理室,其中該導體更包含:一第一突出部(tab),係耦接至該蓋;以及一第二突出部,係設置而平行於該第一突出部,並且 自該第一突出部偏移,該第二突出部係耦接至該覆蓋板。 The processing chamber of claim 12, wherein the conductor further comprises: a first tab coupled to the cover; and a second protrusion disposed parallel to the first Protruding section, and Offset from the first protrusion, the second protrusion is coupled to the cover plate. 如申請專利範圍第12項所述之處理室,其中該導體更包含一Z形剖面。 The processing chamber of claim 12, wherein the conductor further comprises a Z-shaped cross section. 一種處理室,包含:一室體,具有配置以允許基板通過的一通道;一蓋,係設置在該室體上;一氣體分配板,係位於該室體中;一背板,係支撐該氣體分配板;一狹縫閥,係設置在耦接至該室體的一殼體中,該狹縫閥係可操作以選擇性地密封該通道;以及一支撐組件,係剛性地耦接至該氣體分配板、該蓋和該室體中的至少一者,該支撐組件係設置而鄰近在該室體中形成的該通道,而處於防止該通道變形的一位置中。 A processing chamber comprising: a chamber having a passage configured to allow passage of a substrate; a cover disposed on the chamber; a gas distribution plate located in the chamber; a backing plate supporting the a gas distribution plate; a slit valve disposed in a housing coupled to the chamber body, the slit valve being operable to selectively seal the passage; and a support assembly rigidly coupled to At least one of the gas distribution plate, the lid and the chamber body, the support assembly is disposed adjacent to the passage formed in the chamber body in a position to prevent deformation of the passage. 如申請專利範圍第16項所述之處理室,其中該支撐組件包含:一板支撐件,係定向在一垂直平面中,並且在邊緣上耦接至該氣體分配板、該蓋和該室體中的至少一者。 The processing chamber of claim 16, wherein the support assembly comprises: a plate support oriented in a vertical plane and coupled to the gas distribution plate, the cover and the chamber body at an edge At least one of them. 如申請專利範圍第17項所述之處理室,其中該板支撐件為鋼。 The process chamber of claim 17, wherein the plate support is steel. 如申請專利範圍第16項所述之處理室,其中該支撐組件包含:一空心管,係耦接至該殼體和該板支撐件兩者。 The processing chamber of claim 16, wherein the support assembly comprises: a hollow tube coupled to both the housing and the plate support. 如申請專利範圍第16項所述之處理室,更包含:一覆蓋板,係設置在該蓋上方,該覆蓋板為一射頻接地返回路徑的一部分。 The processing chamber of claim 16, further comprising: a cover plate disposed above the cover, the cover plate being part of a radio frequency ground return path.
TW099145003A 2009-12-22 2010-12-21 Slit valve tunnel support TWI558841B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US28939109P 2009-12-22 2009-12-22
US34851310P 2010-05-26 2010-05-26

Publications (2)

Publication Number Publication Date
TW201134980A TW201134980A (en) 2011-10-16
TWI558841B true TWI558841B (en) 2016-11-21

Family

ID=44216432

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099145003A TWI558841B (en) 2009-12-22 2010-12-21 Slit valve tunnel support

Country Status (2)

Country Link
CN (1) CN102117735B (en)
TW (1) TWI558841B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI642139B (en) * 2016-08-16 2018-11-21 北京北方華創微電子裝備有限公司 Chuck, reaction chamber and semiconductor processing device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200930829A (en) * 2004-02-26 2009-07-16 Applied Materials Inc Support assembly

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050229849A1 (en) * 2004-02-13 2005-10-20 Applied Materials, Inc. High productivity plasma processing chamber
US7497414B2 (en) * 2004-06-14 2009-03-03 Applied Materials, Inc. Curved slit valve door with flexible coupling
US7494107B2 (en) * 2005-03-30 2009-02-24 Supercritical Systems, Inc. Gate valve for plus-atmospheric pressure semiconductor process vessels
CN101842514B (en) * 2007-11-01 2013-01-23 应用材料公司 Method and apparatus for sealing an opening of a processing chamber

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200930829A (en) * 2004-02-26 2009-07-16 Applied Materials Inc Support assembly

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI642139B (en) * 2016-08-16 2018-11-21 北京北方華創微電子裝備有限公司 Chuck, reaction chamber and semiconductor processing device

Also Published As

Publication number Publication date
CN102117735A (en) 2011-07-06
TW201134980A (en) 2011-10-16
CN102117735B (en) 2015-11-25

Similar Documents

Publication Publication Date Title
JP6994502B2 (en) Plasma screen for plasma processing chamber
JP6967656B2 (en) Substrate support with two embedded electrodes
JP6346698B2 (en) Symmetric plasma processing chamber
US9458538B2 (en) Method and apparatus for sealing an opening of a processing chamber
US10676817B2 (en) Flip edge shadow frame
US20110146577A1 (en) Showerhead with insulated corner regions
JP2007317745A (en) Gas introduction device
TWI558841B (en) Slit valve tunnel support
TW202033822A (en) Chamber design for semiconductor processing
JP4546303B2 (en) Plasma processing equipment
JP2011202744A (en) Vacuum seal structure, vacuum seal method, and vacuum device
TWI637660B (en) Plasma processing device
KR101798374B1 (en) Dielectric window supporting structure for inductively coupled plasma processing apparatus
TW202013829A (en) Wiring fixing structure and processing apparatus
WO2018131529A1 (en) Film forming device
US20140251216A1 (en) Flip edge shadow frame
CN217280680U (en) Substrate processing apparatus
CN112786517A (en) Substrate support, substrate processing apparatus, and substrate processing system
KR101798376B1 (en) Dielectric window supporting structure for inductively coupled plasma processing apparatus
KR101651172B1 (en) Substrate processing apparatus
TW202341277A (en) Plasma processing apparatus and method for manufacturing plasma processing apparatus
KR20220102887A (en) Apparatus for processing substrates
TW202231127A (en) Flow measuring method and substrate processing device characterized by high precisely measuring the branched gas flow that is circulated inside the processing chamber and is divided by a branched gas service pipe

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees