TWI550683B - Fluid supply pipe device using for wet bench tank - Google Patents

Fluid supply pipe device using for wet bench tank Download PDF

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Publication number
TWI550683B
TWI550683B TW104121343A TW104121343A TWI550683B TW I550683 B TWI550683 B TW I550683B TW 104121343 A TW104121343 A TW 104121343A TW 104121343 A TW104121343 A TW 104121343A TW I550683 B TWI550683 B TW I550683B
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Taiwan
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cassette
liquid inlet
inlet line
line device
tank
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TW104121343A
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Chinese (zh)
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TW201703103A (en
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黃立佐
吳進原
葉蔭晟
徐子正
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弘塑科技股份有限公司
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Publication of TW201703103A publication Critical patent/TW201703103A/en

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Description

用於濕製程槽的進液管路裝置 Inlet line device for wet process tank

本發明是關於一種進液管路裝置,特別是關於一種用於濕製程槽的進液管路裝置。 BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to an infusion line device, and more particularly to an infusion line device for a wet process tank.

在半導體的濕式製程中,由於是採用批次式的生產方法將複數個晶片(如9至50片)一同放置入濕製程槽中進行製程,因此濕製程槽內部管路的流場設計是影響半導體濕式製程的關鍵。 In the wet process of semiconductor, since a plurality of wafers (such as 9 to 50 sheets) are placed together in a wet process tank by a batch production method, the flow field design of the internal pipeline of the wet process tank is The key to affecting semiconductor wet processes.

請參照第1圖,其繪示一種傳統的濕製程槽100與進液管路裝置140之立體透視圖。該濕製程槽100包含一槽體110和一卡匣120,該卡匣120設置在該槽體110內部,用於承載複數個晶片130。該進液管路裝置140與該濕製程槽100相連通,包含設置在該槽體110底部的兩管路142,每一管路142具有複數個朝向該卡匣120的開孔1422,用以將製程液體輸入該槽體110內部。然而,由於該等管路142是設置在該槽體110底部相對兩側邊,相距該卡匣120皆有一段距離,使得該等管路142接近該槽體110兩端的最外側位置的流場最強,而在放置有該等待製程的晶片130的卡匣120的中央位置的流場最弱,進而導致該等晶片130在該槽體110兩端的最外側的蝕刻反應速率較快,在中央的蝕刻反應速率較慢。 Referring to FIG. 1 , a perspective view of a conventional wet processing tank 100 and an inlet line assembly 140 is shown. The wet processing tank 100 includes a tank body 110 and a cassette 120 disposed inside the tank body 110 for carrying a plurality of wafers 130. The liquid inlet line device 140 is in communication with the wet processing tank 100, and includes two pipelines 142 disposed at the bottom of the tank body 110. Each of the pipelines 142 has a plurality of openings 1422 facing the cassette 120 for The process liquid is introduced into the interior of the tank 110. However, since the pipelines 142 are disposed on opposite sides of the bottom of the tank body 110, there is a distance from the cassette 120, so that the pipelines 142 are close to the flow field at the outermost position of the two ends of the tank body 110. The flow field is the strongest, and the flow field at the center of the cassette 120 of the wafer 130 in which the waiting process is placed is the weakest, thereby causing the wafers 130 to have a faster outermost etching reaction rate at both ends of the groove body 110, at the center. The etching reaction rate is slower.

有鑑於此,有必要提出一種新型的進液管路裝置,當藉由該 進液管路裝置將製程液體傳輸入該濕製程槽內時,其能提升在該濕製程槽中相對應於放置晶片的位置的流場流速,以使得晶片在該濕製程槽內具有均勻的製程反應速率。 In view of this, it is necessary to propose a new type of liquid inlet pipe device, by which When the liquid inlet conduit device transfers the process liquid into the wet processing tank, it can increase the flow field flow rate in the wet processing tank corresponding to the position where the wafer is placed, so that the wafer has uniformity in the wet processing tank. Process response rate.

為解決上述習知技術之問題,本發明之目的在於提供一種用於濕製程槽的進液管路裝置,其藉由將進液管路設置在該濕製程槽中相對應放置複數個晶片的位置,以提升在該濕製程槽中相對應於放置該等晶片的位置的流場流速。再者,藉由增設至少一分流盒以提升該濕製程槽內製程液體的流場分布的均勻性,進而使該複數個晶片的製程反應能更加均勻,以改善該等晶片蝕刻後的均勻度。 In order to solve the above problems of the prior art, an object of the present invention is to provide a liquid inlet line device for a wet process tank, wherein a plurality of wafers are correspondingly disposed by placing a liquid inlet pipe in the wet process tank. Position to increase the flow field flow rate in the wet process tank corresponding to the location at which the wafers are placed. Furthermore, by adding at least one shunt box to improve the uniformity of the flow field distribution of the process liquid in the wet processing tank, the process reaction of the plurality of wafers can be more uniform to improve the uniformity of the wafer after etching. .

為達成上述目的,本發明提供一種用於濕製程槽的進液管路裝置,該濕製程槽包含一槽體和一卡匣,該卡匣設置在該槽體內部,並且包含複數個朝一第一方向排列的卡槽,用於放置複數個晶片,該進液管路裝置包含至少一第一管路,該至少一第一管路具有複數個面向該卡匣的開孔,其中該至少一第一管路設置在該槽體之底部並且位於該卡匣之下方,以及該至少一第一管路經過該卡匣之每一卡槽之下方。 In order to achieve the above object, the present invention provides a liquid inlet pipe device for a wet process tank, the wet process tank comprising a tank body and a cassette, the cassette being disposed inside the tank body, and comprising a plurality of a card slot arranged in a direction for placing a plurality of wafers, the liquid inlet line device comprising at least one first pipe, the at least one first pipe having a plurality of openings facing the cassette, wherein the at least one The first conduit is disposed at the bottom of the tank and below the cassette, and the at least one first conduit passes under each of the slots of the cartridge.

於本發明其中之一較佳實施例當中,該至少一第一管路之延伸方向與該第一方向平行。 In a preferred embodiment of the present invention, the extending direction of the at least one first conduit is parallel to the first direction.

於本發明其中之一較佳實施例當中,該進液管路裝置進一步包含至少一分流盒設置在該卡匣之下方並且將該至少一第一管路包覆在其內,該至少一分流盒在面向該卡匣之一面形成複數個通孔。 In a preferred embodiment of the present invention, the liquid inlet conduit device further comprises at least one shunt box disposed below the cassette and enclosing the at least one first tube therein, the at least one shunt The box forms a plurality of through holes on one side facing the cassette.

於本發明其中之一較佳實施例當中,在該至少一第一管路上 對應於該卡匣之兩相鄰的該等卡槽的第一位置處形成至少一該開孔。 In one of the preferred embodiments of the present invention, on the at least one first conduit At least one of the openings is formed at a first position corresponding to the two adjacent slots of the cassette.

於本發明其中之一較佳實施例當中,該第一位置為該卡匣之兩相鄰的該等卡槽之中央。 In a preferred embodiment of the present invention, the first position is the center of the two adjacent card slots of the cassette.

於本發明其中之一較佳實施例當中,該進液管路裝置進一步包含一對第二管路,設置在該槽體之底部並且分別位於該卡匣之相對兩側。 In a preferred embodiment of the present invention, the inlet conduit means further includes a pair of second conduits disposed at the bottom of the tank and located on opposite sides of the cassette.

於本發明其中之一較佳實施例當中,該對第二管路的延伸方向平行於該至少一第一管路之該延伸方向。 In a preferred embodiment of the invention, the pair of second conduits extend in a direction parallel to the direction of extension of the at least one first conduit.

於本發明其中之一較佳實施例當中,在該至少一分流盒上對應於該卡匣之兩相鄰的該等卡槽的第一位置處形成至少一該通孔。 In a preferred embodiment of the present invention, at least one of the through holes is formed in the first position of the at least one shunt box corresponding to the two adjacent card slots of the cassette.

於本發明其中之一較佳實施例當中,該第一位置為該卡匣之兩相鄰的該等卡槽之中央。 In a preferred embodiment of the present invention, the first position is the center of the two adjacent card slots of the cassette.

於本發明其中之一較佳實施例當中,進液管路裝置進一步包含一對第二管路,設置在該槽體之底部並且分別位於該卡匣之相對兩側。 In a preferred embodiment of the invention, the inlet conduit means further includes a pair of second conduits disposed at the bottom of the housing and located on opposite sides of the cartridge.

於本發明其中之一較佳實施例當中,該對第二管路的延伸方向平行於該至少一第一管路之該延伸方向。 In a preferred embodiment of the invention, the pair of second conduits extend in a direction parallel to the direction of extension of the at least one first conduit.

100、200、300、400‧‧‧濕製程槽 100, 200, 300, 400‧‧‧ Wet groove

110、210、310、410‧‧‧槽體 110, 210, 310, 410‧‧‧

120、220、320、420‧‧‧卡匣 120, 220, 320, 420‧‧‧ Carl

130、230、330、430‧‧‧晶片 130, 230, 330, 430‧‧‧ wafers

140、240、340、440‧‧‧進液管路裝置 140, 240, 340, 440 ‧ ‧ inlet piping

142‧‧‧管路 142‧‧‧ pipeline

222、322、422‧‧‧卡槽 222, 322, 422‧‧‧ card slots

242、342、442‧‧‧第一管路 242, 342, 442‧‧‧ first pipeline

1422、2422、3422‧‧‧開孔 1422, 2422, 3422‧‧ hole

344、444‧‧‧分流盒 344, 444‧‧ ‧ shunt box

3442‧‧‧通孔 3442‧‧‧through hole

446‧‧‧第二管路 446‧‧‧Second line

X‧‧‧第一方向 X‧‧‧ first direction

A‧‧‧對應至第2C圖之部分 A‧‧‧ corresponds to the part of Figure 2C

B‧‧‧對應至第3C圖之部分 B‧‧‧ corresponds to the part of Figure 3C

P‧‧‧第一位置 P‧‧‧ first position

第1圖顯示繪示一種傳統的濕製程槽與進液管路裝置之立體透視圖。 Figure 1 shows a perspective view of a conventional wet process tank and inlet line arrangement.

第2A圖顯示一種根據本發明之第一實施例之濕製程槽與進液管路裝置之立體透視圖。 Fig. 2A is a perspective perspective view showing a wet process tank and a liquid inlet line device according to a first embodiment of the present invention.

第2B圖顯示一種根據本發明之第一實施例之濕製程槽與進液管路裝置之上視透視圖。 Fig. 2B is a top perspective view showing the wet process tank and the inlet piping apparatus according to the first embodiment of the present invention.

第2C圖顯示第2B圖中之A部分之放大圖。 Fig. 2C is an enlarged view showing a portion A in Fig. 2B.

第3A圖顯示一種根據本發明之第二實施例之濕製程槽與進液管路裝置之立體透視圖。 Fig. 3A is a perspective perspective view showing a wet process tank and a liquid inlet line device according to a second embodiment of the present invention.

第3B圖顯示一種根據本發明之第二實施例之濕製程槽與進液管路裝置之上視透視圖。 Fig. 3B is a top perspective view showing a wet process tank and a liquid inlet line device according to a second embodiment of the present invention.

第3C圖顯示第3B圖中之B部分之放大圖。 Fig. 3C shows an enlarged view of a portion B in Fig. 3B.

第4圖顯示一種根據本發明之第三實施例之濕製程槽與進液管路裝置之立體透視圖。 Fig. 4 is a perspective perspective view showing a wet process tank and a liquid inlet line device according to a third embodiment of the present invention.

為了讓本發明之上述及其他目的、特徵、優點能更明顯易懂,下文將特舉本發明較佳實施例,並配合所附圖式,作詳細說明如下。 The above and other objects, features and advantages of the present invention will become more <RTIgt;

請參照第2A圖所示,其顯示一種根據本發明之第一實施例之濕製程槽200與進液管路裝置240之立體透視圖。該濕製程槽200包含一槽體210和一卡匣220。該卡匣220設置在該槽體210內部,包含複數個朝一第一方向X排列的卡槽222(請參照2B圖),每一卡槽222用於放置一晶片230。該進液管路裝置240用於與該濕製程槽200相連通,包含設置並延伸通過該槽體210底部的一對第一管路242,其中在本實施例中該第一管路242的數量僅係作為示例,不局限於此。每一第一管路242具有複數個朝向該卡匣220並沿該第一方向X排列的開孔2422,分別用以將製程液體輸入該槽體210內部。 Referring to Fig. 2A, there is shown a perspective perspective view of a wet process tank 200 and a feed line assembly 240 in accordance with a first embodiment of the present invention. The wet processing tank 200 includes a tank body 210 and a cassette 220. The cassette 220 is disposed inside the trough body 210 and includes a plurality of card slots 222 arranged in a first direction X (refer to FIG. 2B). Each card slot 222 is used for placing a wafer 230. The liquid inlet line device 240 is configured to communicate with the wet processing tank 200, and includes a pair of first conduits 242 disposed and extending through the bottom of the tank body 210, wherein in the embodiment the first conduit 242 is The number is only an example and is not limited to this. Each of the first conduits 242 has a plurality of openings 2422 oriented toward the latch 220 and aligned along the first direction X for respectively inputting process liquid into the interior of the housing 210.

如第2A圖所示,該對第一管路242係通過該卡匣220之每一卡槽222的下方,因此當該進液管路裝置240之該對第一管路240將製程液體 通過開孔2422注入該濕製程槽內時,即能提升在該濕製程槽240中相對應於放置該等晶片230的位置的流場流速,進而提升該等晶片230的製程反應速率。 As shown in FIG. 2A, the pair of first conduits 242 pass under each of the slots 222 of the cassette 220, so that the pair of first conduits 240 of the inlet conduit assembly 240 will process the liquid When the opening 2422 is injected into the wet processing tank, the flow field flow rate corresponding to the position where the wafers 230 are placed in the wet processing tank 240 can be increased, thereby increasing the process reaction rate of the wafers 230.

請參照第2B圖和第2C圖,第2B圖顯示一種根據本發明之第一實施例之該濕製程槽200與該進液管路裝置240之上視透視圖,以及第2C圖顯示第2B圖中之A部分之放大圖。如第2B圖所示,該卡匣220包含多組左右對稱的卡槽222,每一組卡槽222用於放置一晶片230(如第2A圖所示),並且該等卡槽222排列的該第一方向X與該對第一管路240之延伸方向平行。再者,如第2C圖所示的A部分中,在該對第一管路240對應該卡匣220之每兩個相鄰的該等卡槽222之間的一第一位置P處形成至少一該開孔2422。較佳的,該第一位置P係位於為該卡匣220之兩相鄰的該等卡槽222之間。因此,當每一卡槽222上放置一晶片時,位於該第一位置P的該開孔2422係對應於兩片晶片之間的空間,進而確保製程液體可有效地分佈在任兩片晶片之間的縫隙。 Please refer to FIG. 2B and FIG. 2C. FIG. 2B shows a top perspective view of the wet processing tank 200 and the liquid inlet line device 240 according to the first embodiment of the present invention, and FIG. 2C shows the second portion. A magnified view of Part A of the figure. As shown in FIG. 2B, the cassette 220 includes a plurality of sets of left and right symmetrical card slots 222, each set of card slots 222 for placing a wafer 230 (as shown in FIG. 2A), and the card slots 222 are arranged. The first direction X is parallel to the direction in which the pair of first conduits 240 extend. Furthermore, in the portion A shown in FIG. 2C, at least a first position P between the pair of adjacent card slots 222 of the pair of first tubes 240 corresponding to the cassette 220 is formed. One of the openings 2422. Preferably, the first position P is located between the two adjacent slots 222 of the cassette 220. Therefore, when a wafer is placed on each of the card slots 222, the opening 2422 at the first position P corresponds to the space between the two wafers, thereby ensuring that the process liquid can be effectively distributed between any two wafers. The gap.

請參照第3A圖所示,其顯示一種根據本發明之第二實施例之濕製程槽300與進液管路裝置340之立體透視圖。該濕製程槽300包含一槽體310和一卡匣320。該卡匣320設置在該槽體310內部,包含複數個朝一第一方向X排列的卡槽322(請參照3B圖),每一卡槽322用於放置一晶片330。該進液管路裝置340用於與該濕製程槽300相連通,包含一對第一管路342和一分流盒344。該對第一管路342設置並延伸通過該槽體310底部,並且在本實施例中該第一管路342的數量僅係作為示例,不局限於此。同理,在本實施例中該分流盒344的數量僅係作為示例,不局限於此。該分流盒344設置 在該卡匣320之下方並且將該對第一管路342包覆在其內。 Referring to Fig. 3A, there is shown a perspective perspective view of a wet processing tank 300 and a liquid inlet line unit 340 according to a second embodiment of the present invention. The wet process tank 300 includes a tank body 310 and a cassette 320. The cassette 320 is disposed inside the tank 310 and includes a plurality of card slots 322 arranged in a first direction X (refer to FIG. 3B). Each card slot 322 is used for placing a wafer 330. The inlet line device 340 is configured to communicate with the wet process tank 300 and includes a pair of first lines 342 and a splitter box 344. The pair of first conduits 342 are disposed and extend through the bottom of the tank 310, and the number of the first conduits 342 in this embodiment is by way of example only, and is not limited thereto. Similarly, the number of the shunt boxes 344 in this embodiment is merely an example, and is not limited thereto. The shunt box 344 is set Below the cassette 320 and the pair of first tubes 342 are wrapped therein.

如第3A圖所示,每一第一管路342具有複數個朝向該卡匣320並沿該第一方向X排列的開孔3422,以及該分流盒344在面向該卡匣320之一面形成複數個通孔3442。在本發明之第二實施例中,該進液管路裝置340係藉由該對第一管路342之該等開孔3422分別將製程液體輸入該分流盒344內,接著再藉由該分流盒344之該等通孔3442分別將製程液體流通入該槽體310內部。 As shown in FIG. 3A, each of the first conduits 342 has a plurality of openings 3422 oriented toward the cassette 320 and aligned along the first direction X, and the shunt box 344 forms a plurality of faces facing the cassette 320. Through holes 3442. In the second embodiment of the present invention, the liquid inlet conduit means 340 respectively inputs the process liquid into the splitter box 344 by the openings 3422 of the pair of first conduits 342, and then by the splitting The through holes 3442 of the cartridge 344 respectively circulate the process liquid into the interior of the tank 310.

請參照第3B圖和第3C圖,第3B圖顯示一種根據本發明之第二實施例之該濕製程槽300與該進液管路裝置340之上視透視圖,以及第3C圖顯示第3B圖中之B部分之放大圖。如第3B圖所示,該卡匣320包含多組左右對稱的卡槽322,每一組卡槽322用於放置一晶片330(如第3A圖所示),並且該等卡槽322排列的該第一方向X與該對第一管路340之延伸方向平行。再者,由於該分流盒344係將該對第一管路342包覆在其內,因此從該濕製程槽300的上方視之時,僅可目視到該分流盒344。此外,如第3C圖所示的B部分中,在該對分流盒344對應該卡匣320之每兩個相鄰的該等卡槽322之間的一第一位置P處形成一排該通孔3442。較佳的,該第一位置P係位於為該卡匣320之兩相鄰的該等卡槽322之間。舉例來說,當該濕製程槽300是用於12吋晶片的濕式製程時,其中一排位於該第一位置P的通孔3442與另一排相鄰且也是於該第一位置P的通孔3442相距10公釐。或者,當該濕製程槽300是用於8吋晶片的濕式製程時,其中一排位於該第一位置P的通孔3442與另一排相鄰且也是於該第一位置P的通孔3442相距6.35公釐。因此藉由上述設計,當每一卡槽322上放置一晶片時,位於該第一位置P的該一排通孔3442 係對應於兩片晶片之間的空間,進而確保製程液體可有效地分佈在任兩片晶片之間的縫隙。再者,由於增設分流盒344,因此提升該濕製程槽300內製程液體的流場分布的均勻性,進而使該複數個晶片330的製程反應能更加均勻,以改善該複數個晶片330蝕刻後的均勻度。 Please refer to FIG. 3B and FIG. 3C. FIG. 3B shows a top perspective view of the wet processing tank 300 and the liquid inlet line device 340 according to the second embodiment of the present invention, and FIG. 3C shows the third portion. An enlarged view of part B of the figure. As shown in FIG. 3B, the cassette 320 includes a plurality of sets of left and right symmetrical card slots 322, each set of card slots 322 for placing a wafer 330 (as shown in FIG. 3A), and the card slots 322 are arranged. The first direction X is parallel to the direction in which the pair of first conduits 340 extend. Moreover, since the shunt box 344 covers the pair of first tubes 342 therein, the shunt box 344 can only be visually observed when viewed from above the wet processing tank 300. In addition, in the portion B shown in FIG. 3C, a row is formed at a first position P between the two adjacent card slots 322 of the pair of shunt boxes 344 corresponding to the cassette 320. Hole 3442. Preferably, the first position P is located between the adjacent card slots 322 of the cassette 320. For example, when the wet processing tank 300 is a wet process for a 12-inch wafer, one of the rows of through-holes 3442 located at the first position P is adjacent to the other row and is also at the first position P. The through holes 3442 are 10 mm apart. Alternatively, when the wet processing tank 300 is a wet process for an 8-inch wafer, one of the rows of through holes 3442 at the first position P is adjacent to the other row and is also a through hole at the first position P. 3442 is 6.35 mm apart. Therefore, by the above design, when a wafer is placed on each of the card slots 322, the row of through holes 3442 located at the first position P It corresponds to the space between the two wafers, thereby ensuring that the process liquid can be effectively distributed in the gap between any two wafers. Moreover, since the shunt box 344 is added, the uniformity of the flow field distribution of the process liquid in the wet processing tank 300 is improved, and the process response of the plurality of wafers 330 is more uniform to improve the etching of the plurality of wafers 330. Uniformity.

請參照第4圖所示,其顯示一種根據本發明之第三實施例之濕製程槽400與進液管路裝置440之立體透視圖。該濕製程槽400包含一槽體410和一卡匣420。該卡匣420設置在該槽體410內部,包含複數個朝一第一方向X排列的卡槽422,每一卡槽422用於放置一晶片430。該進液管路裝置440用於與該濕製程槽400相連通,包含一對第一管路442、一分流盒444、和一對第二管路446,其中該對第一管路442和該分流盒444的構造與功能相似於本發明之第二實施例之該進液管路裝置340之該對第一管路342和該分流盒344,在此不加以贅述。 Referring to Fig. 4, there is shown a perspective perspective view of a wet processing bath 400 and a liquid inlet line assembly 440 according to a third embodiment of the present invention. The wet process tank 400 includes a tank body 410 and a cassette 420. The cassette 420 is disposed inside the slot 410 and includes a plurality of card slots 422 arranged in a first direction X. Each card slot 422 is used to place a wafer 430. The liquid inlet line device 440 is configured to communicate with the wet processing tank 400, and includes a pair of first tubes 442, a shunt box 444, and a pair of second tubes 446, wherein the pair of first tubes 442 and The configuration and function of the shunt box 444 are similar to the pair of first lines 342 and the shunt box 344 of the liquid inlet line device 340 of the second embodiment of the present invention, and details are not described herein.

如第4圖所示,該進液管路裝置440之該對第二管路446設置在該槽體410之底部並且分別位於該卡匣420之相對兩側,並且該對第二管路446的延伸方向平行於該對第一管路442之該延伸方向。藉由該對第二管路446將製程液體輸入該濕製程槽400的兩側邊角區域,進而使得製程液體在該濕製程槽400內的液體流速更為均勻,並且使得該複數個晶片430的製程反應能更加均勻。 As shown in FIG. 4, the pair of second conduits 446 of the inlet conduit means 440 are disposed at the bottom of the tank 410 and are respectively located on opposite sides of the cassette 420, and the pair of second conduits 446 The direction of extension is parallel to the direction of extension of the pair of first conduits 442. The process liquid is introduced into the two corner regions of the wet processing tank 400 by the pair of second conduits 446, so that the liquid flow rate of the process liquid in the wet processing tank 400 is more uniform, and the plurality of wafers 430 are made. The process response is more uniform.

綜上所述,藉由將進液管路裝置的進液管路設置在濕製程槽中相對應放置複數個晶片的位置,以提升在該濕製程槽中相對應於放置該等晶片的位置的流場流速。再者,藉由增設至少一分流盒以提升該濕製程槽內製程液體的流場分布的均勻性,進而使該複數個晶片的製程反應能更 加均勻,以改善該等晶片蝕刻後的均勻度。 In summary, the position of the plurality of wafers is correspondingly placed in the wet processing tank by placing the liquid inlet line of the liquid inlet line device to raise the position corresponding to the wafers in the wet processing tank. Flow field flow rate. Furthermore, by adding at least one shunt box to improve the uniformity of the flow field distribution of the process liquid in the wet processing tank, the process reaction of the plurality of wafers can be further improved. Uniformity is added to improve the uniformity of the wafers after etching.

雖然本發明已用較佳實施例揭露如上,然其並非用以限定本發明,本發明所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 While the invention has been described above in terms of the preferred embodiments, the invention is not intended to limit the invention, and the invention may be practiced without departing from the spirit and scope of the invention. The scope of protection of the present invention is therefore defined by the scope of the appended claims.

200‧‧‧濕製程槽 200‧‧‧ Wet process slot

210‧‧‧槽體 210‧‧‧

220‧‧‧卡匣 220‧‧‧Carmen

230‧‧‧晶片 230‧‧‧ wafer

240‧‧‧進液管路裝置 240‧‧‧Inlet line installation

242‧‧‧第一管路 242‧‧‧First line

2422‧‧‧開孔 2422‧‧‧Opening

Claims (11)

一種用於濕製程槽的進液管路裝置,該濕製程槽包含一槽體和一卡匣,該卡匣設置在該槽體內部,並且包含複數個朝一第一方向排列的卡槽,用於放置複數個晶片,該進液管路裝置包含至少一第一管路,該至少一第一管路具有複數個面向該卡匣的開孔,其中該至少一第一管路設置在該槽體之底部並且位於該卡匣之下方內側,以及該至少一第一管路經過該卡匣之每一卡槽之下方。 An inlet pipe device for a wet process tank, the wet process tank comprising a tank body and a cassette, the cassette being disposed inside the tank body and comprising a plurality of card slots arranged in a first direction, Depositing a plurality of wafers, the inlet conduit means comprising at least one first conduit, the at least one first conduit having a plurality of openings facing the cassette, wherein the at least one first conduit is disposed in the slot The bottom of the body is located below the inside of the cassette, and the at least one first line passes under each of the slots of the cassette. 如申請專利範圍第1項所述之進液管路裝置,其中該至少一第一管路之延伸方向與該第一方向平行。 The liquid inlet line device of claim 1, wherein the at least one first pipe extends in a direction parallel to the first direction. 如申請專利範圍第1項所述之進液管路裝置,其中該進液管路裝置進一步包含至少一分流盒設置在該卡匣之下方並且將該至少一第一管路包覆在其內,該至少一分流盒在面向該卡匣之一面形成複數個通孔。 The liquid inlet line device of claim 1, wherein the liquid inlet line device further comprises at least one shunt box disposed below the cassette and enclosing the at least one first line therein The at least one shunt box forms a plurality of through holes on one side facing the cassette. 如申請專利範圍第1項至第3項任一項所述之進液管路裝置,其中在該至少一第一管路上對應於該卡匣之兩相鄰的該等卡槽的第一位置處形成至少一該開孔。 The liquid inlet line device according to any one of the preceding claims, wherein the at least one first line corresponds to a first position of the two adjacent card slots of the cassette At least one of the openings is formed. 如申請專利範圍第4項所述之進液管路裝置,其中該第一位置為該卡匣之兩相鄰的該等卡槽之中央。 The liquid inlet line device of claim 4, wherein the first position is the center of the two adjacent card slots of the cassette. 如申請專利範圍第4項所述之進液管路裝置,其中該進液管路裝置進一步包含一對第二管路,設置在該槽體之底部並且分別位於該卡匣之相對兩側。 The liquid inlet line device of claim 4, wherein the liquid inlet line device further comprises a pair of second tubes disposed at the bottom of the tank body and respectively located on opposite sides of the cassette. 如申請專利範圍第6項所述之進液管路裝置,其中該對第二管路的延伸方向平行於該至少一第一管路之延伸方向。 The liquid inlet piping device of claim 6, wherein the pair of second conduits extend in a direction parallel to an extending direction of the at least one first conduit. 如申請專利範圍第1項至第3項任一項所述之進液管路裝置,其中在該至少一分流盒上對應於該卡匣之兩相鄰的該等卡槽的第一位置處形成至少一通孔。 The liquid inlet line device according to any one of claims 1 to 3, wherein at the first position of the at least one shunt box corresponding to the two adjacent card slots of the cassette At least one through hole is formed. 如申請專利範圍第8項所述之進液管路裝置,其中該第一位置為該卡匣之兩相鄰的該等卡槽之中央。 The liquid inlet line device of claim 8, wherein the first position is the center of the two adjacent card slots of the cassette. 如申請專利範圍第8項所述之進液管路裝置,其中進液管路裝置進一步包含一對第二管路,設置在該槽體之底部並且分別位於該卡匣之相對兩側。 The liquid inlet line device of claim 8, wherein the liquid inlet line device further comprises a pair of second tubes disposed at the bottom of the tank body and located on opposite sides of the cassette. 如申請專利範圍第10項所述之進液管路裝置,其中該對第二管路的延伸方向平行於該至少一第一管路之延伸方向。 The liquid inlet piping device of claim 10, wherein the pair of second conduits extend in a direction parallel to an extending direction of the at least one first conduit.
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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020017315A1 (en) * 1997-01-24 2002-02-14 Yuji Kamikawa Apparatus for and method of cleaning object to be processed
CN201159580Y (en) * 2007-11-29 2008-12-03 甘庆潜 Cleaning and drying device of distance-adjustable packaging bottle
TW201001586A (en) * 2008-03-24 2010-01-01 Dainippon Screen Mfg Substrate processing apparatus and substrate processing method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020017315A1 (en) * 1997-01-24 2002-02-14 Yuji Kamikawa Apparatus for and method of cleaning object to be processed
CN201159580Y (en) * 2007-11-29 2008-12-03 甘庆潜 Cleaning and drying device of distance-adjustable packaging bottle
TW201001586A (en) * 2008-03-24 2010-01-01 Dainippon Screen Mfg Substrate processing apparatus and substrate processing method

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