TWI547584B - Vapor deposition treatment equipment and evaporation treatment method - Google Patents

Vapor deposition treatment equipment and evaporation treatment method Download PDF

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TWI547584B
TWI547584B TW103126274A TW103126274A TWI547584B TW I547584 B TWI547584 B TW I547584B TW 103126274 A TW103126274 A TW 103126274A TW 103126274 A TW103126274 A TW 103126274A TW I547584 B TWI547584 B TW I547584B
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chamber
gate
processing
temporary storage
vapor deposition
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TW201604301A (en
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Mei-Fang Huang
Bo-Quan Zhan
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蒸鍍處理設備及蒸鍍處理方法 Evaporation processing equipment and evaporation treatment method

一種蒸鍍處理設備及蒸鍍處理方法,尤其是一種具有可恆保持真空狀態及阻絕外界污染之蒸鍍處理設備及蒸鍍處理方法。 An evaporation treatment device and an evaporation treatment method, in particular, an evaporation treatment device and an evaporation treatment method which can maintain a vacuum state and prevent external pollution.

請參考新型專利公告號M268354之申請案的蒸鍍設備,在此僅作主要結構之描述。參閱第一圖,習知技術之蒸鍍設備之側面示意圖,習知技術的蒸鍍設備包含有一真空系統30a,該真空系統30a係由相連通之一第一真空室31a與一第二真空室32a及一做為控制該第一真空室31a與該第二真空室32a相通與否使用的開關33a所組成;該第二真空室32a中則設置有該加熱裝置50a及位於該加熱裝置50a上方可供被蒸鍍物A安裝的支持台35a;一設置於該第一真空室31a中的餵料裝置40a,該餵料裝置40a具有一供收納蒸鍍源B的儲料容器42a及一導料機構46a,該導料機構46a在該第一真空室31a與該第二真空室32a相通時,可將蒸鍍源B往該第二真空室32a遞送:至少一設置於該第二真空室32a中的加熱裝置50a,該加熱裝置50a適於收容來自該餵料裝置40a的蒸鍍源B並予以加熱以使蒸鍍源B氣化。 Please refer to the vapor deposition apparatus of the application of the new patent publication No. M268354, which is only described as the main structure. Referring to the first drawing, a schematic side view of a vapor deposition apparatus of the prior art, the vapor deposition apparatus of the prior art includes a vacuum system 30a which is connected by a first vacuum chamber 31a and a second vacuum chamber. 32a and a switch 33a for controlling whether the first vacuum chamber 31a is in communication with the second vacuum chamber 32a; the second vacuum chamber 32a is provided with the heating device 50a and above the heating device 50a. a support table 35a for being mounted by the vapor deposition material A; a feeding device 40a disposed in the first vacuum chamber 31a, the feeding device 40a having a storage container 42a for accommodating the vapor deposition source B and a guide The material guiding mechanism 46a, when the first vacuum chamber 31a communicates with the second vacuum chamber 32a, can deliver the vapor deposition source B to the second vacuum chamber 32a: at least one is disposed in the second vacuum chamber In the heating device 50a of 32a, the heating device 50a is adapted to receive the vapor deposition source B from the feeding device 40a and heat it to vaporize the vapor deposition source B.

習知技術透過利用於該餵料裝置40a中預先置放定量的蒸鍍源B,藉以提供每次蒸鍍作業時所需足量的材料,據以避免因過多的供給而造成材料於長時間閒置下產生變質,以及透過先將該開關33a關閉以阻絕第一真空室31a與第二真空室32a相通,再開啟該閘門34a,藉以完成抽真空作業。 The prior art utilizes a predetermined amount of vapor deposition source B in the feeding device 40a to provide a sufficient amount of material for each evaporation operation, in order to avoid material being prolonged due to excessive supply. Deterioration occurs under idle, and the vacuuming operation is completed by first closing the switch 33a to block the first vacuum chamber 31a from communicating with the second vacuum chamber 32a, and then opening the shutter 34a.

然而該蒸鍍設備之缺點在於在每次更換被蒸鍍物A時還是必須先使第二真空室32a內部恢復常壓狀態,待於新的被蒸鍍物A入料完成後再進行抽真空作業,惟第二真空室32a因應蒸鍍作業之需求而具有較大 的容積,遂造成抽真空作業時間拉長,導致產能降低。再者第二真空室32a在每一次進行新的蒸鍍源B餵料時,其腔體必須經過開啟、關閉與抽真空等動作,而在多次重複上述動作後,遂有影響腔體內部真空度之虞。 However, the vapor deposition apparatus has a disadvantage in that it is necessary to restore the inside of the second vacuum chamber 32a to a normal pressure state every time the vapor-deposited material A is replaced, and to perform vacuuming after the new vapor-deposited material A is filled. Work, but the second vacuum chamber 32a has a larger demand for the vapor deposition operation. The volume, which causes the pumping operation to take longer, leads to a decrease in productivity. Further, each time the second vacuum chamber 32a feeds a new vapor deposition source B, the cavity must undergo an action of opening, closing, and evacuating, and after repeating the above actions many times, the flaw affects the interior of the cavity. The degree of vacuum.

本發明之主要目的在於提供一種蒸鍍處理設備,具有連續處理鍍鍋及自動替換複數個蒸鍍源之機制,據以提升產能。 The main object of the present invention is to provide an evaporation processing apparatus having a mechanism for continuously processing a plating pot and automatically replacing a plurality of vapor deposition sources, thereby increasing productivity.

本發明之另一目的在於提供一種蒸鍍處理設備,不須解除製程腔室的真空狀態,以維持製程腔室內部真空度及阻絕從外界而來的污染。 Another object of the present invention is to provide an evaporation processing apparatus that does not need to release the vacuum state of the process chamber to maintain the vacuum inside the process chamber and to prevent contamination from the outside.

為達上述目的,本發明之具體技術手段包含有一第一暫存腔室,係可自外界接收一鍍鍋,該第一暫存腔室內部可成為真空狀態;一第一閘門,其可來回移動;一製程腔室,其與該第一暫存腔室之間設置有該第一閘門,該製程腔室內部恆保持真空狀態;一第二閘門,其可來回移動;一第二暫存腔室,係與該製程腔室之間設置有該第二閘門;以及一真空腔室,與該製程腔室相連接,該真空腔室內具有可旋轉的一承載盤,該承載盤具有複數個蒸鍍源,一蒸鍍源透過一升降裝置而被送入於該製程腔室中。 In order to achieve the above object, the specific technical means of the present invention includes a first temporary storage chamber, which can receive a plating pot from the outside, the first temporary storage chamber can be in a vacuum state; and a first gate can be back and forth Moving; a processing chamber, the first gate is disposed between the first temporary storage chamber, and the interior of the processing chamber is kept in a vacuum state; a second gate is movable back and forth; and a second temporary storage a second gate is disposed between the chamber and the processing chamber; and a vacuum chamber is connected to the processing chamber, the vacuum chamber has a rotatable carrier, the carrier has a plurality of An evaporation source, an evaporation source is sent into the process chamber through a lifting device.

本發明之另一目的在於提供一種蒸鍍處理方法,係包含有將一鍍鍋載入一第一暫存腔室中,該第一暫存腔室與一製程腔室之間設置有一第一閘門,該製程腔室與一第二暫存腔室之間設有一第二閘門,其中該製程腔室恆保持真空狀態;使該第一暫存腔室成為真空狀態;開啟該第一閘門,使該第一暫存腔室與該製程腔室相連通;將該鍍鍋移載至該製程腔室;該製程腔室對該基板進行製程處理;使該第二暫存腔室預先成為真空狀態;開啟該第二閘門;將已製程處理過之該鍍鍋移載至該第二暫存腔室;以及關閉該第二閘門,並將該鍍鍋傳送出去。 Another object of the present invention is to provide an evaporation processing method, which comprises loading a plating pot into a first temporary storage chamber, and a first between the first temporary storage chamber and a processing chamber a gate, a second gate is disposed between the process chamber and a second temporary storage chamber, wherein the process chamber is kept in a vacuum state; the first temporary storage chamber is in a vacuum state; and the first gate is opened, The first temporary storage chamber is connected to the processing chamber; the plating pot is transferred to the processing chamber; the processing chamber performs a processing process on the substrate; and the second temporary storage chamber is pre-empted into a vacuum a state; opening the second gate; transferring the processed plating pot to the second temporary storage chamber; and closing the second gate and transferring the plating pot.

因此製程腔室完全不需要解除真空狀態,就可立即對被鍍元件進行製程處理,以及立即將已處理過的鍍鍋送出再接收待處理的鍍鍋,由於製程腔室不需要解除真空狀態,可使製程腔室隨時都能進行製程處理,如此可提升產能,且製程腔室也與外界有效隔離,可將外界污染阻絕於外,進而提昇被鍍元件的良率 Therefore, the process chamber can be processed without any need to release the vacuum state, and the processed plated pot can be immediately sent out to receive the plated pot to be processed. Since the process chamber does not need to be relieved of the vacuum state, The process chamber can be processed at any time, which can increase the productivity, and the process chamber is also effectively isolated from the outside, which can block external pollution and improve the yield of the plated component.

1‧‧‧第一暫存腔室 1‧‧‧First temporary storage chamber

2‧‧‧第一閘門 2‧‧‧The first gate

3‧‧‧製程腔室 3‧‧‧Processing chamber

4‧‧‧第二閘門 4‧‧‧second gate

5‧‧‧第二暫存腔室 5‧‧‧Second temporary storage chamber

7‧‧‧真空腔室 7‧‧‧vacuum chamber

8‧‧‧第三閘門 8‧‧‧ third gate

9‧‧‧升降裝置 9‧‧‧ lifting device

10‧‧‧鍍鍋 10‧‧‧ plating pot

101‧‧‧被鍍元件 101‧‧‧Ironed components

20‧‧‧第一驅動裝置 20‧‧‧First drive

30‧‧‧第二驅動裝置 30‧‧‧Second drive

71‧‧‧承載盤 71‧‧‧ Carrying tray

711‧‧‧承接孔 711‧‧‧ socket

73‧‧‧蒸鍍源 73‧‧‧vapor deposition source

91‧‧‧齒輪 91‧‧‧ Gears

93‧‧‧線性螺桿 93‧‧‧linear screw

95‧‧‧升降台 95‧‧‧ Lifting platform

100‧‧‧馬達 100‧‧‧Motor

200‧‧‧旋轉裝置 200‧‧‧Rotating device

30a‧‧‧真空系統 30a‧‧‧vacuum system

31a‧‧‧第一真空室 31a‧‧‧First vacuum chamber

32a‧‧‧第二真空室 32a‧‧‧Second vacuum chamber

33a‧‧‧開關 33a‧‧‧Switch

34a‧‧‧閥門 34a‧‧‧Valves

50a‧‧‧加熱裝置 50a‧‧‧heating device

35a‧‧‧支持台 35a‧‧‧Support Desk

40a‧‧‧餵料裝置 40a‧‧‧feeding device

42a‧‧‧儲料容器 42a‧‧‧ storage container

46a‧‧‧導料機構 46a‧‧‧Guide mechanism

A‧‧‧蒸鍍物 A‧‧‧ evaporation

B‧‧‧蒸鍍源 B‧‧·vapor deposition source

S10~S90、S100~S60‧‧‧步驟 S10~S90, S100~S60‧‧‧ steps

第一圖為習知技術之蒸鍍設備之側面示意圖。 The first figure is a side view of a vapor deposition apparatus of the prior art.

第二圖為本發明之蒸鍍處理設備之側面示意圖。 The second figure is a schematic side view of the vapor deposition processing apparatus of the present invention.

第三圖為本發明之蒸鍍處理設備之承載盤上視圖。 The third figure is a top view of the carrier tray of the vapor deposition processing apparatus of the present invention.

第四圖為本發明之蒸鍍處理方法之流程示意圖。 The fourth figure is a schematic flow chart of the vapor deposition processing method of the present invention.

第五圖為本發明之第一閘門之開啟示意圖。 The fifth figure is a schematic diagram of the opening of the first gate of the present invention.

第六圖為本發明之將鍍鍋移載至製程腔室的示意圖。 Figure 6 is a schematic view of the present invention for transferring a plating pot to a process chamber.

第七圖為本發明之製程腔室進行製程處理的示意圖。 The seventh figure is a schematic diagram of the process of the process chamber of the present invention.

第八圖為本發明之第一閘門之開啟示意圖。 The eighth figure is a schematic diagram of the opening of the first gate of the present invention.

第九圖為本發明之將鍍鍋移載至第二暫存腔室的示意圖。 The ninth figure is a schematic view of the present invention for transferring a plating pot to a second temporary storage chamber.

第十圖為本發明之關閉第二閘門並將鍍鍋傳送出去之示意圖。 The tenth figure is a schematic view of the invention for closing the second gate and conveying the plating pot.

第十一圖為本發明之蒸鍍處理方法之另一流程示意圖。 Figure 11 is a schematic view showing another flow of the vapor deposition treatment method of the present invention.

第十二圖為本發明之提供具承載盤的真空腔室之示意圖。 Fig. 12 is a schematic view showing the provision of a vacuum chamber with a carrier tray according to the present invention.

第十三圖為本發明之將蒸鍍源置入於承載盤之示意圖。 Figure 13 is a schematic view of the present invention for placing an evaporation source on a carrier tray.

第十四圖為本發明將蒸鍍源送往製程腔室之示意圖。 Figure 14 is a schematic view of the present invention for delivering a vapor deposition source to a process chamber.

以下配合圖式及元件符號對本發明之實施方式做更詳細的說明,俾使熟習該項技藝者在研讀本說明書後能據以實施。 The embodiments of the present invention will be described in more detail below with reference to the drawings and the <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt;

參閱第二圖,本發明之蒸鍍處理設備之側面示意圖。本發明係有關一種蒸鍍處理設備之示意圖,其至少包含有一第一暫存腔室1、一製程腔室3、一第二暫存腔室5及一真空腔室7。 Referring to the second figure, a schematic side view of the vapor deposition processing apparatus of the present invention. The invention relates to a vapor deposition processing apparatus, which comprises at least a first temporary storage chamber 1, a processing chamber 3, a second temporary storage chamber 5 and a vacuum chamber 7.

該第一暫存腔室1可自外界接收一鍍鍋10,當該第一暫存腔室1自外界接收一鍍鍋10後,該第一暫存腔室1即抽真空,以使該第一暫存腔室1內部呈現密閉真空狀態,外界可以是基板移載裝置或其他適當之基板轉移裝置,比如像是機械手幣之基板移載裝置,其中該鍍鍋10上配置有一個或複數個被鍍元件101。 The first temporary storage chamber 1 can receive a plating pot 10 from the outside. When the first temporary storage chamber 1 receives a plating pot 10 from the outside, the first temporary storage chamber 1 is evacuated, so that the first temporary storage chamber 1 is evacuated. The inside of the first temporary storage chamber 1 is in a closed vacuum state, and the external environment may be a substrate transfer device or other suitable substrate transfer device, such as a substrate transfer device such as a robot coin, wherein the plating pot 10 is provided with one or A plurality of plated elements 101 are plated.

其中該至少一個被鍍元件101可以是一用於製造半導體之基板、一用於製造發光二極體之基板、一用於製造太陽能電池之晶圓及一用於製造顯示面板之基板之至少其中之一。 The at least one plated component 101 may be at least one of a substrate for manufacturing a semiconductor, a substrate for manufacturing a light emitting diode, a wafer for manufacturing a solar cell, and a substrate for manufacturing a display panel. one.

該第一暫存腔室1與該製程腔室3之間設置有一第一閘門2,該第一閘門2可來回上下移動,製程腔室3內部恆保持真空狀態,且可接收自該第一暫存腔室1傳來之該鍍鍋10,其中透過控制該第一閘門2之開關,可以決定要讓該第一暫存腔室1與該製程腔室3要相互隔離或相互連通,其中該第一閘門2可與一第一驅動裝置20連結,透過該第一驅動裝置20可控制該第一閘門2之開啟或關合。其中該製程腔室3可以是一蒸鍍腔室。 A first gate 2 is disposed between the first temporary storage chamber 1 and the processing chamber 3, and the first gate 2 is movable up and down. The interior of the processing chamber 3 is kept in a vacuum state and can be received from the first The plating pot 10 is transferred from the temporary storage chamber 1 , wherein the first temporary storage chamber 1 and the processing chamber 3 are separated from each other or connected to each other through a switch for controlling the first gate 2, wherein The first gate 2 can be coupled to a first driving device 20, and the first driving device 20 can control the opening or closing of the first gate 2. The process chamber 3 can be an evaporation chamber.

其中該製程腔室3更可設置有一旋轉裝置200,當該鍍鍋10於該製程腔室3中到達定位時,該旋轉裝置200會先與該鍍鍋10連結,再帶動該鍍鍋10旋轉,其中該旋轉裝置200可以是一馬達。 The processing chamber 3 is further provided with a rotating device 200. When the plating pot 10 reaches the positioning in the processing chamber 3, the rotating device 200 is first coupled with the plating pot 10, and then the plating pot 10 is rotated. Wherein the rotating device 200 can be a motor.

該第二暫存腔室5與該製程腔室3之間設置有該第二閘門4,該第二閘門4可來回上下移動,其中透過控制該第二閘門4之開關,可以決定要讓該第二暫存腔室5與該製程腔室3要相互隔離或相互連通,其中該第二閘門4可與一第二驅動裝置30連結,透過該第二驅動裝置20可控制該第二閘門4之開啟或關合。 The second gate 4 is disposed between the second temporary storage chamber 5 and the processing chamber 3, and the second gate 4 can be moved up and down, wherein by controlling the switch of the second gate 4, the The second temporary storage chamber 5 and the processing chamber 3 are separated from each other or connected to each other. The second gate 4 can be coupled to a second driving device 30. The second driving device 20 can control the second gate 4. Open or close.

該真空腔室7係與該製程腔室3相連接,該真空腔室7與該製程腔室3之間亦可設置有一第三閘門8,該第三閘門8可與一第三驅動裝置(圖面未顯示)連結,透過該第三驅動裝置可控制該第三閘門8之開啟或關合。 The vacuum chamber 7 is connected to the processing chamber 3, and a third gate 8 can be disposed between the vacuum chamber 7 and the processing chamber 3, and the third gate 8 can be coupled to a third driving device ( The figure is not shown), and the opening or closing of the third gate 8 can be controlled by the third driving device.

參閱第三圖,本發明之蒸鍍處理設備之承載盤上視圖,並請配合第二圖所示,該真空腔室7內具有可旋轉的一承載盤71,該承載盤71具有複數個承接口711,該等承接口711可分別承置一蒸鍍源73,其中該承載盤71中心與一馬達100相連結,該馬達100可帶動該承載盤71旋轉,該蒸鍍源73係透過一升降裝置9而被送入於該製程腔室3中。 Referring to the third figure, a top view of the carrier tray of the vapor deposition processing apparatus of the present invention, and as shown in the second figure, the vacuum chamber 7 has a rotatable carrier 71 having a plurality of receiving trays 71 The port 711 can receive an evaporation source 73, wherein the center of the carrier 71 is coupled to a motor 100. The motor 100 can drive the carrier 71 to rotate. The lifting device 9 is fed into the processing chamber 3.

其中該升降裝置9包含一動力裝置(圖面未顯示)、一齒輪91、一線性螺桿93及一升降台95,該動力裝置與該齒輪91相連結,該齒輪91與該線性螺桿93相囓接,該線性螺桿93之上可裝設有該升降台95,其中藉由旋轉該承載盤71,可使任一個蒸鍍源73剛好對應在該升降台95之上,如此該升降台95可進入該承接口711中以帶動該升降台95及其上之 該蒸鍍源73上下升降。其中該動力裝置可以是一馬達。 The lifting device 9 includes a power unit (not shown), a gear 91, a linear screw 93, and a lifting platform 95. The power unit is coupled to the gear 91, and the gear 91 is engaged with the linear screw 93. The lifting platform 95 can be mounted on the linear screw 93. By rotating the carrier 71, any evaporation source 73 can be directly arranged on the lifting platform 95, so that the lifting platform 95 can be Entering the receiving interface 711 to drive the lifting platform 95 and the upper The vapor deposition source 73 is raised and lowered. Wherein the power unit can be a motor.

本發明的一實施例中,該鍍鍋10的傳送可藉由傳送滾輪、傳送軌道或其他適當傳送方式的達成。 In one embodiment of the invention, the transfer of the plating pot 10 can be accomplished by means of a transfer roller, transport track or other suitable means of transport.

參閱第四圖,本發明之蒸鍍處理方法之流程示意圖,並配合第一~三圖所示,如第四圖的步驟S10所示,將鍍鍋10載入至該第一暫存腔室1中,如第二圖所示,其中該第一暫存腔室1與一製程腔室3之間設置有一第一閘門2,該製程腔室3與一第二暫存腔室5之間設有一第二閘門4,其中該製程腔室3恆保持真空狀態。其中該鍍鍋10上配置有一個或複數個被鍍元件101。 Referring to the fourth figure, a schematic flow chart of the vapor deposition processing method of the present invention is combined with the first to third figures. As shown in step S10 of the fourth figure, the plating pot 10 is loaded into the first temporary storage chamber. 1 , as shown in the second figure, a first gate 2 is disposed between the first temporary storage chamber 1 and a processing chamber 3, and between the processing chamber 3 and a second temporary storage chamber 5 A second gate 4 is provided, wherein the process chamber 3 is constantly maintained in a vacuum state. The plating pot 10 is provided with one or a plurality of plated elements 101.

接著,進入第四圖的步驟S20所示,使該第一暫存腔室1成為真空狀態,其中在該第一暫存腔室1成為真空狀態前,該第一閘門2須保持在關閉狀態。進入第四圖的步驟S30所示,開啟該第一閘門2,使該第一暫存腔室1與該製程腔室3相連通,如第五圖所示。較佳的,可使該第一暫存腔室1的真空狀態設定成與該製程腔室3的真空狀態一致。 Then, as shown in step S20 of the fourth figure, the first temporary storage chamber 1 is brought into a vacuum state, wherein the first temporary storage chamber 1 must be kept in a closed state before the first temporary storage chamber 1 is in a vacuum state. . In step S30 of the fourth figure, the first gate 2 is opened to connect the first temporary storage chamber 1 with the processing chamber 3, as shown in the fifth figure. Preferably, the vacuum state of the first temporary storage chamber 1 can be set to coincide with the vacuum state of the processing chamber 3.

進入第四圖的步驟S40,將該鍍鍋10移載至該製程腔室3,如第六圖所示,進入第四圖的步驟S50,該製程腔室3對該鍍鍋10上的被鍍元件101進行製程處理,其中當該鍍鍋10移載至該製程腔室3內時,該第一閘門2可恢復成關閉狀態,如此該第一暫存腔室1可接收下一個待處理之鍍鍋10,如第七圖所示。 Going to step S40 of the fourth figure, the plating pot 10 is transferred to the processing chamber 3, as shown in the sixth figure, and proceeds to step S50 of the fourth drawing, the processing chamber 3 is on the plating pot 10. The plating element 101 performs a processing process, wherein when the plating pot 10 is transferred into the processing chamber 3, the first gate 2 can be restored to a closed state, so that the first temporary storage chamber 1 can receive the next pending The plating pot 10 is as shown in the seventh figure.

接著,進入第四圖的步驟S60,使該第二暫存腔室5預先成為真空狀態,較佳的,可將該第二暫存腔室5的真空狀態設定成與該製程腔室3的真空狀態5一致。進入第四圖的步驟S70,開啟該第二閘門4,如第八圖所示。 Then, proceeding to step S60 of the fourth figure, the second temporary storage chamber 5 is pre-empted into a vacuum state. Preferably, the vacuum state of the second temporary storage chamber 5 is set to be the same as the processing chamber 3 The vacuum state 5 is the same. Proceeding to step S70 of the fourth figure, the second gate 4 is opened, as shown in the eighth figure.

進入第四圖的步驟S80,將已製程處理過之該鍍鍋10移載至該第二暫存腔室5中,如第九圖所示。最後,進入第四圖的步驟S80,關閉該第二閘門4,並將該鍍鍋10傳送出去,如第十圖所示。 Step S80 of the fourth figure is performed, and the plating pot 10 that has been processed by the process is transferred to the second temporary storage chamber 5, as shown in the ninth figure. Finally, proceeding to step S80 of the fourth figure, the second gate 4 is closed and the plating pot 10 is conveyed as shown in the tenth figure.

如上所述,當該鍍鍋10移載至該製程腔室3內時,該第一閘門2可恢復成關閉狀態,接著該製程腔室3即對該鍍鍋10之被鍍元件101進行製程處理,在製程腔室3進行製程處理期間,由於該第一閘門2為關 閉,因此該第一暫存腔室1又可自外界接收待處理的鍍鍋10,也不會影響該製程腔室3的真空狀態,值得一提的是,該第一暫存腔室1的容積比製程腔室3小許多,即使在真空狀態被解除的狀況下,也能很快就達到真空狀態,實際上其耗費時間不超過製程處理的時間,因此當該製程腔室3的製程處理一完成,就可把待處理的鍍鍋10馬上再移載至該製程腔室3內。 As described above, when the plating pot 10 is transferred into the process chamber 3, the first gate 2 can be restored to a closed state, and then the processing chamber 3 is processed by the plated member 101 of the plating pot 10. Processing, during the processing of the process chamber 3, since the first gate 2 is off Therefore, the first temporary storage chamber 1 can receive the plating pot 10 to be processed from the outside, and does not affect the vacuum state of the processing chamber 3. It is worth mentioning that the first temporary storage chamber 1 The volume is much smaller than the process chamber 3, and even when the vacuum state is released, the vacuum state can be quickly reached, and in fact, it takes time not to exceed the processing time of the process, so when the process of the process chamber 3 is performed Once the processing is completed, the plating pot 10 to be processed can be transferred to the processing chamber 3 immediately.

其中該製程腔室3更可設置有一旋轉裝置200,當該鍍鍋10於該製程腔室3中到達定位時,該旋轉裝置200會先與該鍍鍋10連結,再帶動該鍍鍋10旋轉。 The processing chamber 3 is further provided with a rotating device 200. When the plating pot 10 reaches the positioning in the processing chamber 3, the rotating device 200 is first coupled with the plating pot 10, and then the plating pot 10 is rotated. .

此外,該第二暫存腔室5可預先成為真空狀態,如此當該製程腔室3的製程處理一完成,就可馬上接收於該製程腔室3的鍍鍋10,只要把第二閘門4關閉,該製程腔室3就可以又在對下一個的鍍鍋10進行處理,同時該第二暫存腔室5也可以把已處理好的鍍鍋10傳送出去。 In addition, the second temporary storage chamber 5 can be in a vacuum state in advance, so that when the processing of the processing chamber 3 is completed, the plating pot 10 of the processing chamber 3 can be received immediately, as long as the second gate 4 is When closed, the process chamber 3 can be processed again for the next plating pot 10, and the second temporary storage chamber 5 can also transport the processed plating pot 10.

由此可知,製程腔室3內部能一直保持於真空狀態,且該製程腔室3位在該第一暫存腔室1及該第二暫存腔室5之間,加上該第一閘門2及該第二閘門4之隔絕,使得製程腔室3可與外界完全隔離,如此可完全確保製程腔室3不會受到外界的污染,有效保持該製程腔室3內部真空度,如此可提升被鍍元件的良率,值得一提的是,由於製程腔室3一直保持於真空狀態,也就能讓製程腔室3隨時都能進行製程處理,更能提升產能。 It can be seen that the interior of the processing chamber 3 can be kept in a vacuum state, and the processing chamber 3 is located between the first temporary storage chamber 1 and the second temporary storage chamber 5, and the first gate is added. 2 and the isolation of the second gate 4, so that the process chamber 3 can be completely isolated from the outside, so that the process chamber 3 can be completely protected from external pollution, and the internal vacuum of the process chamber 3 can be effectively maintained, so that the process can be improved. The yield of the component to be plated is worth mentioning. Since the process chamber 3 is always kept in a vacuum state, the process chamber 3 can be processed at any time, and the productivity can be improved.

參閱第十一圖,本發明蒸鍍處理方法之另一流程示意圖。如第十一圖的步驟S100所示,提供一真空腔室7,該真空腔室7與一製程腔室3相連接,該真空腔室7與該製程腔室3之間設置有至少一第三閘門8,該真空腔室7之內部具有可旋轉的一承載盤71,該承載盤71具有複數個承接口711,如第十二圖所示。其中,該真空腔室恆保持真空狀態。 Referring to the eleventh drawing, another schematic flow chart of the vapor deposition processing method of the present invention is shown. As shown in step S100 of FIG. 11 , a vacuum chamber 7 is provided. The vacuum chamber 7 is connected to a processing chamber 3, and at least one of the vacuum chamber 7 and the processing chamber 3 is disposed. The three gates 8 have a rotatable carrier 71 inside, and the carrier 71 has a plurality of receiving interfaces 711 as shown in FIG. Wherein, the vacuum chamber is kept in a vacuum state.

接著,進入第十一圖的步驟S200,將複數個蒸鍍源73分別置入於該等承接口中711,如第十三圖所示。進入第十一圖的步驟S300,利用至少一升降裝置9將任一蒸鍍源73往該製程腔室3之方向送入,如第十四圖所示。 Next, proceeding to step S200 of FIG. 11 , a plurality of vapor deposition sources 73 are respectively placed in the receiving interfaces 711 as shown in FIG. Proceeding to step S300 of Fig. 11, any of the vapor deposition sources 73 are fed into the process chamber 3 by at least one lifting device 9, as shown in Fig. 14.

接著,進入第十一圖的步驟S400,對該蒸鍍源73進行製程 處理,當該蒸鍍源73被製程處理完後,該至少一升降裝置9將被處理完後的該蒸鍍源73移回原承載該蒸鍍源73之承接口731,請參考第十三圖。 Then, proceeding to step S400 of the eleventh diagram, the evaporation source 73 is processed. Processing, after the evaporation source 73 is processed by the process, the at least one lifting device 9 moves the processed evaporation source 73 back to the bearing interface 731 that originally carries the evaporation source 73, please refer to the thirteenth Figure.

接著,進入第十一圖的步驟S500,令該承載盤71旋轉以使其他任一可供製程處理之蒸鍍源73與該升降台95之位置相對應。最後,進入第十一圖的步驟S600,再利用該至少一升降裝置將其他任一可供製程使用之蒸鍍源73往該製程腔室3之方向送入,依照重複步驟S300至S600的步驟,直到所有的蒸鍍源73都被製程處理過。 Next, proceeding to step S500 of FIG. 11 to rotate the carrier tray 71 so that any other vapor deposition source 73 available for processing corresponds to the position of the elevator table 95. Finally, proceeding to step S600 of FIG. 11 , the at least one elevating device 73 for supplying the process is fed into the process chamber 3 by using the at least one lifting device, and repeating the steps of steps S300 to S600. Until all the evaporation source 73 has been processed by the process.

承上所述,除了將該等蒸鍍源73分別置入於該等承接口中711時,須把該至少一第三閘門8關閉外,其餘時候該至少一第三閘門8可保持於開放狀態。當把該至少一第三閘門8關閉時,該製程腔室3會與該真空腔室7隔離,因此可以在不影響該製程腔室3的真空狀態下,把經製程處理過的蒸鍍源73從真空腔室7內取出,再重新把新品的蒸鍍源7置入於該等承接口中711,由於一次可填入一定數量的蒸鍍源7,加上還有可自動替換蒸鍍源7的機制,因此可使每次重新添料間隔時間拉長,不需常破真空腔室7,以降低影響真空腔室內部真空度及降低污染的機率。 As described above, in addition to placing the vapor deposition sources 73 in the sockets 711, the at least one third gate 8 must be closed, and the at least one third gate 8 can be kept open during the rest. . When the at least one third gate 8 is closed, the processing chamber 3 is isolated from the vacuum chamber 7, so that the processed evaporation source can be processed without affecting the vacuum condition of the processing chamber 3. 73 is taken out from the vacuum chamber 7, and the new vapor deposition source 7 is again placed in the bearing port 711. Since a certain number of vapor deposition sources 7 can be filled at one time, and the vapor deposition source can be automatically replaced. The mechanism of 7 can thus lengthen the interval of re-feeding each time, and does not need to break the vacuum chamber 7 frequently, so as to reduce the probability of affecting the vacuum inside the vacuum chamber and reducing the pollution.

以上所述者僅為用以解釋本發明之較佳實施例,並非企圖據以對本發明做任何形式上之限制,是以,凡有在相同之發明精神下所作有關本發明之任何修飾或變更,皆仍應包括在本發明意圖保護之範疇。 The above is only a preferred embodiment for explaining the present invention, and is not intended to limit the present invention in any way, and any modifications or alterations to the present invention made in the spirit of the same invention. All should still be included in the scope of the intention of the present invention.

1‧‧‧第一暫存腔室 1‧‧‧First temporary storage chamber

2‧‧‧第一閘門 2‧‧‧The first gate

3‧‧‧製程腔室 3‧‧‧Processing chamber

4‧‧‧第二閘門 4‧‧‧second gate

5‧‧‧第二暫存腔室 5‧‧‧Second temporary storage chamber

7‧‧‧真空腔室 7‧‧‧vacuum chamber

8‧‧‧第三閘門 8‧‧‧ third gate

9‧‧‧升降裝置 9‧‧‧ lifting device

10‧‧‧鍍鍋 10‧‧‧ plating pot

20‧‧‧第一驅動裝置 20‧‧‧First drive

30‧‧‧第二驅動裝置 30‧‧‧Second drive

71‧‧‧承載盤 71‧‧‧ Carrying tray

73‧‧‧蒸鍍源 73‧‧‧vapor deposition source

91‧‧‧齒輪 91‧‧‧ Gears

93‧‧‧線性螺桿 93‧‧‧linear screw

95‧‧‧升降台 95‧‧‧ Lifting platform

100‧‧‧馬達 100‧‧‧Motor

101‧‧‧被鍍元件 101‧‧‧Ironed components

200‧‧‧旋轉裝置 200‧‧‧Rotating device

Claims (12)

一種蒸鍍處理設備,係包含:一第一暫存腔室,係可自外界接收一鍍鍋,該第一暫存腔室內部可成為真空狀態;一第一閘門,其可來回移動;一製程腔室,係可接收自該第一暫存腔室傳來之該鍍鍋,該製程腔室與該第一暫存腔室之間設置有該第一閘門,該製程腔室內部恆保持真空狀態;一第二閘門,其可來回移動;一第二暫存腔室,係可接收自該製程腔室傳來之該鍍鍋,該第二暫存腔室係與該製程腔室之間設置有該第二閘門;以及一真空腔室,與該製程腔室相連接,該真空腔室內具有可旋轉的一承載盤,該承載盤具有複數個蒸鍍源,一蒸鍍源透過一升降裝置而被送入於該製程腔室中。 An evaporation processing device comprising: a first temporary storage chamber, wherein a plating pot can be received from the outside, the first temporary storage chamber can be in a vacuum state; and a first gate can be moved back and forth; The processing chamber is configured to receive the plating pot from the first temporary storage chamber, the first gate is disposed between the processing chamber and the first temporary storage chamber, and the interior of the processing chamber is always maintained a vacuum state; a second gate movable back and forth; a second temporary storage chamber receiving the plating pot from the processing chamber, the second temporary storage chamber and the processing chamber Between the second gate; and a vacuum chamber connected to the processing chamber, the vacuum chamber has a rotatable carrier, the carrier has a plurality of evaporation sources, and an evaporation source passes through The lifting device is fed into the processing chamber. 依據申請專利範圍第1項所述之一種蒸鍍處理設備,其中該鍍鍋配置有至少一個被鍍元件,該至少一個被鍍元件可以是一用於製造半導體之基板、一用於製造發光二極體之基板、一用於製造太陽能電池之晶圓及一用於製造顯示面板之基板之至少其中之一。 An evaporation processing apparatus according to claim 1, wherein the plating pot is provided with at least one plated member, and the at least one plated member may be a substrate for manufacturing a semiconductor, and one for manufacturing a light emitting device. At least one of a substrate of a polar body, a wafer for manufacturing a solar cell, and a substrate for manufacturing a display panel. 依據申請專利範圍第1項所述之一種蒸鍍處理設備,其中該製程腔室可以是一蒸鍍腔室。 An evaporation processing apparatus according to claim 1, wherein the processing chamber may be an evaporation chamber. 依據申請專利範圍第1項所述之一種蒸鍍處理設備,其中該第一閘門可與一第一驅動裝置連結,透過該第一驅動裝置以控制該第一閘門之開關,該第二閘門可與一第二驅動裝置連結,透過該第二驅動裝置以控制該第三閘門之開關,該第三閘門可與一第三驅動裝置連結,透過該第三驅動裝置以控制該第三閘門之開關,該第一驅動裝置、該第二驅動裝置及該第三驅動裝置可以是氣壓缸及油壓缸之至少其中之一。 The vapor deposition processing apparatus of claim 1, wherein the first gate is connectable with a first driving device, and the first driving device is controlled to control the switch of the first gate, the second gate is Connected to a second driving device, through the second driving device to control the switch of the third gate, the third gate is connectable with a third driving device, and the third driving device is controlled to control the switch of the third gate The first driving device, the second driving device and the third driving device may be at least one of a pneumatic cylinder and a hydraulic cylinder. 依據申請專利範圍第1項所述之一種蒸鍍處理設備,其中,該承載盤具有複數個承接口,該等承接口可分別承置該蒸鍍源,該升降裝置包含一動力裝置、一齒輪、一線性螺桿及一升降台,該動力裝置與該齒輪相連結,該齒輪與該線性螺桿相囓接,該線性螺桿上可裝設有該升降台,其中藉由旋轉該承載盤,使任一個蒸鍍源對應在該升降台之上,該動力裝置可以是一 馬達。 The vapor deposition processing apparatus of claim 1, wherein the carrier tray has a plurality of sockets, the sockets respectively receiving the evaporation source, the lifting device comprising a power device and a gear a linear screw and a lifting platform, the power device is coupled to the gear, the gear is engaged with the linear screw, and the lifting platform can be mounted on the linear screw, wherein the rotating tray is used to rotate An evaporation source corresponds to the lifting platform, and the power device can be a motor. 依據申請專利範圍第1項所述之一種蒸鍍處理設備,其中該製程腔室更包含有一旋轉裝置,該旋轉裝置可帶動該鍍鍋旋轉,該旋轉裝置可以是一馬達。 An evaporation processing apparatus according to claim 1, wherein the processing chamber further comprises a rotating device, the rotating device can drive the plating pot to rotate, and the rotating device can be a motor. 一種蒸鍍處理方法,係包含有:將一鍍鍋載入一第一暫存腔室中,該第一暫存腔室與一製程腔室之間設置有一第一閘門,該製程腔室與一第二暫存腔室之間設有一第二閘門,其中該製程腔室恆保持真空狀態;使該第一暫存腔室成為真空狀態;開啟該第一閘門,使該第一暫存腔室與該製程腔室相連通;將該鍍鍋移載至該製程腔室;該製程腔室對該基板進行製程處理;使該第二暫存腔室預先成為真空狀態;開啟該第二閘門;將已製程處理過之該鍍鍋移載至該第二暫存腔室;以及關閉該第二閘門,並將該鍍鍋傳送出去。 An evaporation processing method includes: loading a plating pot into a first temporary storage chamber, and providing a first gate between the first temporary storage chamber and a processing chamber, the processing chamber and the processing chamber a second gate is disposed between a second temporary storage chamber, wherein the processing chamber is kept in a vacuum state; the first temporary storage chamber is in a vacuum state; and the first temporary gate is opened to make the first temporary storage chamber The chamber is in communication with the processing chamber; the plating pot is transferred to the processing chamber; the processing chamber performs a processing process on the substrate; the second temporary storage chamber is pre-empted into a vacuum state; and the second gate is opened Transferring the plated pot that has been processed to the second temporary storage chamber; and closing the second gate and transferring the plating pot. 依據申請專利範圍第7項所述之蒸鍍處理方法,其中,該第一暫存腔室之真空狀態設定成與該製程腔室之真空狀態一致,該第二暫存腔室之真空狀態設定成與該製程腔室之真空狀態一致。 According to the vapor deposition processing method of claim 7, wherein the vacuum state of the first temporary storage chamber is set to be consistent with the vacuum state of the processing chamber, and the vacuum state of the second temporary storage chamber is set. It is in accordance with the vacuum state of the process chamber. 依據申請專利範圍第7項所述之蒸鍍處理方法,其中,該鍍鍋被移載至該製程腔室後關閉該第一閘門,以供該第一暫存腔室繼續接收下一片待處理之鍍鍋。 According to the vapor deposition processing method of claim 7, wherein the plating pot is transferred to the processing chamber, the first gate is closed, and the first temporary storage chamber continues to receive the next piece to be processed. Plated pot. 依據申請專利範圍第7項所述之蒸鍍處理方法,其中更包含有:提供一真空腔室,該真空腔室與一製程腔室相連接,該真空腔室與該製程腔室之間設置有至少一第三閘門,該真空腔室之內部具有可旋轉的一承載盤,該承載盤具有複數個承接口;將複數個蒸鍍源分別置入於該等承接口中;將一蒸鍍源往該製程腔室之方向送入;該蒸鍍源進行製程處理後,將被製程處理後的該蒸鍍源移回原承載該蒸鍍源之承接口; 將其他任一可供製程處理之蒸鍍源與該升降台之位置相對應;以及將其他任一可供製程處理之蒸鍍源往該製程腔室之方向送入。 The vapor deposition processing method of claim 7, further comprising: providing a vacuum chamber, the vacuum chamber being connected to a processing chamber, the vacuum chamber being disposed between the processing chamber and the processing chamber There is at least one third gate, the inside of the vacuum chamber has a rotatable carrier, the carrier has a plurality of sockets; a plurality of evaporation sources are respectively placed in the sockets; a vapor deposition source is used Feeding in the direction of the processing chamber; after the evaporation source is processed, the evaporation source after the processing is returned to the original interface carrying the evaporation source; All other vapor deposition sources available for processing are corresponding to the position of the lifting platform; and any other vapor deposition source available for processing is fed into the processing chamber. 依據申請專利範圍第10項所述之蒸鍍處理方法,其中該真空腔室常保持真空狀態。 The vapor deposition treatment method according to claim 10, wherein the vacuum chamber is constantly maintained in a vacuum state. 依據申請專利範圍第10項所述之蒸鍍處理方法,其中除了將該等個蒸鍍源分別置入於該等承接口中須把該至少一第三閘門關閉外,其餘時候該至少一第三閘門可保持於開放狀態。 The vapor deposition treatment method according to claim 10, wherein the at least one third gate is closed except that the vapor deposition sources are respectively placed in the bearing interfaces, and the at least one third is The gate can be kept open.
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