TWI547325B - A surface-treated metal powder, and a method for producing the same - Google Patents

A surface-treated metal powder, and a method for producing the same Download PDF

Info

Publication number
TWI547325B
TWI547325B TW102105463A TW102105463A TWI547325B TW I547325 B TWI547325 B TW I547325B TW 102105463 A TW102105463 A TW 102105463A TW 102105463 A TW102105463 A TW 102105463A TW I547325 B TWI547325 B TW I547325B
Authority
TW
Taiwan
Prior art keywords
metal powder
copper powder
treated
powder
decane
Prior art date
Application number
TW102105463A
Other languages
Chinese (zh)
Other versions
TW201334890A (en
Inventor
Hideki Furusawa
Original Assignee
Jx Nippon Mining & Metals Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=48947643&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=TWI547325(B) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Jx Nippon Mining & Metals Corp filed Critical Jx Nippon Mining & Metals Corp
Publication of TW201334890A publication Critical patent/TW201334890A/en
Application granted granted Critical
Publication of TWI547325B publication Critical patent/TWI547325B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/02Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of metals or alloys
    • H01B1/026Alloys based on copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
    • B22F1/00Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
    • B22F1/14Treatment of metallic powder
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/002Details
    • H01G4/005Electrodes
    • H01G4/008Selection of materials
    • H01G4/0085Fried electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00Fixed capacitors; Processes of their manufacture
    • H01G4/30Stacked capacitors

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Powder Metallurgy (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Conductive Materials (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Manufacturing Of Electric Cables (AREA)
  • Manufacture Of Metal Powder And Suspensions Thereof (AREA)
  • Non-Insulated Conductors (AREA)
  • Ceramic Capacitors (AREA)

Description

經表面處理之金屬粉、及其製造方法 Surface treated metal powder, and method of producing the same

本發明係關於一種適合於製造晶片積層陶瓷電容器用電極之經表面處理之銅粉、及其製造方法。 The present invention relates to a surface-treated copper powder suitable for producing an electrode for a wafer-laminated ceramic capacitor, and a method of manufacturing the same.

晶片積層陶瓷電容器具有小型、大容量之特徵,因此為較多電子機器中使用之電子零件。晶片積層陶瓷電容器具有將陶瓷介電體與內部電極以層狀堆疊且形成為一體之結構,所積層之各層分別構成電容器元件,且該等元件藉由外部電極而以電性並列之方式連接,從而整體成為一個小型且大容量之電容器。 Wafer-layered ceramic capacitors are characterized by their small size and large capacity, and are therefore electronic components used in many electronic devices. The wafer-stacked ceramic capacitor has a structure in which a ceramic dielectric body and an internal electrode are stacked in a layered manner, and each layer of the laminated layer constitutes a capacitor element, and the elements are electrically connected in parallel by external electrodes. Thus, the whole becomes a small and large-capacity capacitor.

於晶片積層陶瓷電容器之製造中,介電體之片材係以下述方式製造。即,首先,於BaTiO3等介電體原料粉末中添加作為分散劑或成形助劑之有機黏合劑及溶劑,經過粉碎、混合、消泡步驟而獲得漿料。其後,藉由壓膜塗佈機等塗佈方法,於PET膜等承載膜上以薄薄地延展之方式塗佈漿料。將其乾燥而獲得薄介電體片材(生片)。 In the manufacture of a wafer-stacked ceramic capacitor, a sheet of a dielectric is manufactured in the following manner. In other words, first, an organic binder and a solvent as a dispersing agent or a forming aid are added to a dielectric raw material powder such as BaTiO 3 , and a slurry is obtained by a pulverization, mixing, and defoaming step. Thereafter, the slurry is applied to the carrier film such as a PET film by a coating method such as a film coater so as to be thinly spread. It was dried to obtain a thin dielectric sheet (green sheet).

另一方面,作為晶片積層陶瓷電容器之內部電極原料的金屬粉末係與介電體原料粉末同樣地,經過與作為分散劑或成形助劑之有機黏合劑及溶劑之混合、消泡步驟而形成漿料。將其主要藉由網板印刷法而於生片(介電體片材)上印刷內部電極,乾燥後,將印刷完畢之生片自承載膜剝離,且將多個此種生片積層。 On the other hand, the metal powder which is the internal electrode raw material of the wafer laminated ceramic capacitor is formed into a slurry by mixing and defoaming steps with an organic binder and a solvent as a dispersing agent or a forming aid, similarly to the dielectric raw material powder. material. The internal electrode is printed on the green sheet (dielectric sheet) mainly by screen printing, and after drying, the printed green sheet is peeled off from the carrier film, and a plurality of such green sheets are laminated.

對以上述方式積層之生片施加數10~數100MPa之加壓壓力而使其等形成為一體後,切斷為單個的晶片。其後,於燒成爐內以1000℃左右之高溫使內部電極層、介電體層燒結。如此,可製造晶片積層陶瓷電容器。 The green sheets laminated in the above manner are applied to a green sheet having a pressure of 10 to several 100 MPa, and are formed into a single wafer. Thereafter, the internal electrode layer and the dielectric layer are sintered at a high temperature of about 1000 ° C in a firing furnace. Thus, a wafer-stacked ceramic capacitor can be manufactured.

於開發出該技術當時,此種晶片積層陶瓷電容器之內部電極中使用Pt,但就成本之觀點而言,主要使用Pd、Pd-Ag合金,目前主要使用Ni。但近年來,就環境防治觀點而言,逐漸要求將Ni替換為Cu。又,若將Ni替換為Cu,則原理上可於高頻用途中實現低電感。又,Cu亦具有成本比Ni更低之優點。 At the time of development of the technology, Pt was used in the internal electrodes of such a wafer-stacked ceramic capacitor, but from the viewpoint of cost, Pd and Pd-Ag alloys were mainly used, and Ni was mainly used at present. However, in recent years, in terms of environmental control, it has been gradually required to replace Ni with Cu. Moreover, if Ni is replaced by Cu, in principle, low inductance can be achieved in high frequency applications. Also, Cu has the advantage of being lower in cost than Ni.

另一方面,隨著電容器小型化,內部電極存在薄層化之傾向,一般認為下一代類型之內部電極將為1μm左右。因此,期待內部電極用粉末之粒子尺寸更小。 On the other hand, as the capacitor is miniaturized, the internal electrode tends to be thinned, and it is considered that the next-generation type internal electrode will be about 1 μm. Therefore, it is expected that the particle size of the powder for internal electrodes is smaller.

然而,原本Cu之熔點就已經低於Pt、Pd、Ni。進而,藉由如上所期待之粒子小直徑化導致之表面積增加所引起之熔點降低,使得當採用Cu作為內部電極粉末時,燒成時Cu粉於更低之溫度開始熔融。該情況會導致電極層本身產生龜裂。又,由於降溫後電極層急遽地收縮,因此存在介電體層與電極層產生剝離(分層)之可能性。為了避免此種不良狀況,要求內部電極用金屬粉具有與介電體同等之熱收縮特性,作為表示該熱收縮特性之指標,有燒結開始溫度。 However, the melting point of the original Cu is already lower than Pt, Pd, and Ni. Further, the melting point caused by the increase in surface area due to the small diameter reduction of the particles as expected is such that when Cu is used as the internal electrode powder, the Cu powder starts to melt at a lower temperature at the time of firing. This condition causes cracks in the electrode layer itself. Further, since the electrode layer is rapidly contracted after the temperature is lowered, there is a possibility that the dielectric layer and the electrode layer are peeled off (layered). In order to avoid such a problem, the metal powder for internal electrodes is required to have heat shrinkage characteristics equivalent to those of the dielectric material, and as an index indicating the heat shrinkage characteristics, there is a sintering start temperature.

針對上述要求,先前提出有為了獲得適合於晶片積層陶瓷電容器之內部電極的Cu粉,而對Cu粉進行表面處理之方法。 In response to the above requirements, a method of surface-treating Cu powder in order to obtain Cu powder suitable for an internal electrode of a wafer-stacked ceramic capacitor has been proposed.

專利文獻1(日本專利第4001438號)係下述技術:使Cu 粉分散於液體中,於其中添加金屬元素之水溶性鹽之水溶液,調整pH值而使金屬氧化物固著於Cu粉表面,進而使該等表面處理銅粉相互碰撞而強化表面處理層之固著。但由於步驟係由金屬氧化物對銅粉之吸附及固著強化構成,因此就生產性方面而言存在問題。又,預想若銅粉之粒徑進而小於0.5μm,則與吸附之金屬氧化物粒子的尺寸相近,因此氧化物對銅粉之吸附本身即變得困難。 Patent Document 1 (Japanese Patent No. 4001438) is a technique of making Cu The powder is dispersed in a liquid, an aqueous solution of a water-soluble salt of a metal element is added thereto, and the pH value is adjusted to fix the metal oxide on the surface of the Cu powder, thereby causing the surface-treated copper powder to collide with each other to strengthen the surface treatment layer. With. However, since the steps are composed of adsorption and fixation strengthening of the copper oxide by the metal oxide, there is a problem in terms of productivity. Further, it is expected that if the particle diameter of the copper powder is further less than 0.5 μm, the size of the adsorbed metal oxide particles is similar, and thus the adsorption of the copper powder by the oxide itself becomes difficult.

專利文獻2(日本專利第4164009號)係藉由具有特定官能基之聚矽氧油來被覆銅粉之技術。但由於將油與Cu粉混合,因此容易凝聚,於作業性方面存在問題。又,將油與Cu粉分離時之過濾困難,於作業性方面存在問題。 Patent Document 2 (Japanese Patent No. 4164009) is a technique of coating copper powder by a polyoxygenated oil having a specific functional group. However, since the oil is mixed with the Cu powder, it tends to aggregate, and there is a problem in workability. Further, when the oil is separated from the Cu powder, the filtration is difficult, and there is a problem in workability.

專利文獻3(日本專利第3646259號)係下述技術:於銅粉表面使經水解之烷氧基矽烷以氨觸媒進行縮聚合,而形成SiO2凝膠塗佈膜。但將該技術應用於粒徑1μm以下之銅粉時,必須連續地添加作為觸媒之NH3以防止凝聚,反應控制依賴於添加之具體操作技能的優劣,因而非常困難,於作業性及生產性方面存在問題。 Patent Document 3 (Japanese Patent No. 3646259) is a technique in which a hydrolyzed alkoxysilane is subjected to condensation polymerization on an ammonia catalyst on a surface of a copper powder to form an SiO 2 gel-coated film. However, when the technique is applied to copper powder having a particle diameter of 1 μm or less, it is necessary to continuously add NH 3 as a catalyst to prevent aggregation, and the reaction control depends on the merits of the specific operation skill added, and thus it is very difficult in workability and production. There are problems with sex.

專利文獻1:日本專利第4001438號公報 Patent Document 1: Japanese Patent No. 4001438

專利文獻2:日本專利第4164009號公報 Patent Document 2: Japanese Patent No. 4164009

專利文獻3:日本專利第3646259號公報 Patent Document 3: Japanese Patent No. 3646259

如此,需要可較佳地用於製造晶片積層陶瓷電容器之內部電極的燒結延遲性、作業性及生產性優異之銅粉。 Thus, there is a need for a copper powder which is preferably used for producing an internal electrode of a wafer-laminated ceramic capacitor which is excellent in sintering retardation, workability, and productivity.

因此,本發明之目的在於提供一種可較佳地用於製造晶片積層陶瓷電容器用電極之燒結延遲性優異且經表面處理之銅粉、及其製造方法。 Accordingly, an object of the present invention is to provide a surface-treated copper powder which is preferably used for producing an electrode for a wafer-laminated ceramic capacitor and which is excellent in sintering retardation, and a method for producing the same.

本發明人進行了潛心研究,結果發現藉由將銅粉與胺基矽烷水溶液混合,使胺基矽烷吸附於銅粉表面,則不存在表面處理後之凝聚,且燒結延遲性顯著地提高,從而完成本發明。該操作非常簡單,無需高度之技能,作業性優異,生產性優異。又,以上述方式獲得之經表面處理之銅粉儘管為小粒子之銅粉,亦顯示高燒結開始溫度。進一步得知,以相同之方式對銅粉以外之金屬粉進行表面處理之情形時、利用胺基矽烷以外之偶合劑進行表面處理之情形時,亦可獲得特性同樣優異之經表面處理之金屬粉。 The present inventors conducted intensive studies and found that by mixing copper powder with an aqueous solution of amino decane to adsorb the amino decane on the surface of the copper powder, there is no coagulation after surface treatment, and the sintering delay is remarkably improved. The present invention has been completed. This operation is very simple, requires no high level of skill, is excellent in workability, and is excellent in productivity. Further, the surface-treated copper powder obtained in the above manner exhibits a high sintering onset temperature although it is a small particle copper powder. Further, when the surface treatment of the metal powder other than the copper powder is performed in the same manner, and the surface treatment is performed by a coupling agent other than the amine decane, the surface-treated metal powder having the same excellent properties can be obtained. .

因此,本發明係下述(1)至(27)。 Therefore, the present invention is the following (1) to (27).

(1)一種經表面處理之銅粉,其於XPS之survey測定中,檢測出N之光電子為1000cps(count per second)以上,且檢測出Si之光電子為1000cps以上。 (1) A surface-treated copper powder in which a photoelectron of N is detected to be 1000 cps or more in a survey of XPS, and a photoelectron of Si is detected to be 1000 cps or more.

(2)一種經表面處理之銅粉,其於XPS之survey測定中,檢測出表面之N為1%以上,且檢測出Si為0.6%以上。 (2) A surface-treated copper powder having a surface N of 1% or more and a Si content of 0.6% or more detected in the Survey of XPS.

(3)如上述(1)或(2)之銅粉,其於XPS之survey測定中,檢測出表面之N為1%以上,檢測出N之光電子為1000cps(count per second)以上,且檢測出Si為0.6%以上,檢測出Si之光電子為1000cps以上。 (3) The copper powder according to (1) or (2) above, wherein in the measurement of XPS, the surface N is detected to be 1% or more, and the photoelectron of N is detected to be 1000 cps (count per second) or more, and the detection is performed. The Si content was 0.6% or more, and the photoelectron of Si was detected to be 1000 cps or more.

(4) 如上述(1)至(3)中任一項之銅粉,其中,銅粉為經矽烷偶合劑進行過表面處理之銅粉。 (4) The copper powder according to any one of the above (1) to (3) wherein the copper powder is a copper powder surface-treated with a decane coupling agent.

(5)如上述(4)之銅粉,其中,矽烷偶合劑為胺基矽烷。 (5) The copper powder according to (4) above, wherein the decane coupling agent is an amino decane.

(6)如上述(1)至(5)中任一項之銅粉,其燒結開始溫度為400℃以上。 (6) The copper powder according to any one of the above (1) to (5), which has a sintering start temperature of 400 ° C or higher.

(7)一種銅粉,其係對上述(1)至(6)中任一項之銅粉進行熱處理而將N去除所成者。 (7) A copper powder obtained by heat-treating the copper powder according to any one of the above (1) to (6) to remove N.

(8)一種銅粉,其係於氧環境或惰性環境下,對上述(1)至(7)中任一項之銅粉進行熱處理而獲得者。 (8) A copper powder obtained by heat-treating the copper powder according to any one of the above (1) to (7) in an oxygen atmosphere or an inert atmosphere.

(9)如上述(1)至(8)中任一項之銅粉,其係將胺基矽烷之水溶液與銅粉混合、攪拌後使其乾固而獲得者。 (9) The copper powder according to any one of the above (1) to (8), which is obtained by mixing an aqueous solution of amino decane with copper powder, stirring it, and drying it.

(10)如上述(1)至(9)中任一項之銅粉,其中,相對於銅粉1g,供於表面處理之胺基矽烷的量為0.01mL以上。 (10) The copper powder according to any one of the above (1) to (9), wherein the amount of the amine decane to be surface-treated is 0.01 mL or more with respect to 1 g of the copper powder.

(11)如上述(10)之銅粉,其中,胺基矽烷之量為0.05mL以上,與銅粉之混合、攪拌時間為30分鐘以下。 (11) The copper powder according to the above (10), wherein the amount of the amino decane is 0.05 mL or more, and the mixture is mixed with the copper powder, and the stirring time is 30 minutes or shorter.

(12) 如上述(5)至(11)中任一項之銅粉,其中,胺基矽烷為單胺基矽烷或二胺基矽烷。 (12) The copper powder according to any one of the above (5) to (11), wherein the amino decane is monoamino decane or diamino decane.

(13)如上述(1)至(12)中任一項之銅粉,其中,原料銅粉係藉由濕式法而獲得。 (13) The copper powder according to any one of (1) to (12) above, wherein the raw material copper powder is obtained by a wet method.

(14)如上述(1)至(13)中任一項之銅粉,其D50≦1.5μm。 (14) The copper powder according to any one of the above (1) to (13), which has a D50 ≦ 1.5 μm.

(15)如上述(1)至(13)中任一項之銅粉,其D50≦1.0μm。 (15) The copper powder according to any one of the above (1) to (13), which has a D50 ≦ 1.0 μm.

(16)如上述(1)至(13)中任一項之銅粉,其D50≦0.5μm,Dmax≦1.0μm。 (16) The copper powder according to any one of (1) to (13) above which has a D50 ≦ 0.5 μm and a Dmax ≦ 1.0 μm.

(17)如上述(1)至(16)中任一項之銅粉,其粒度分佈為單峰。 (17) The copper powder according to any one of the above (1) to (16), wherein the particle size distribution is a single peak.

(18)一種內部電極用銅粉,其具備上述(1)至(17)中任一項之特徵。 (18) A copper powder for internal electrodes, which is characterized by any one of the above (1) to (17).

(19)一種外部電極用銅粉,其具備上述(1)至(17)中任一項之特徵。 (19) A copper powder for external electrodes, which is characterized by any one of the above (1) to (17).

(20)一種經表面處理之銅粉,其係上述(1)至(19)中任一項之銅粉進一步經有機化合物進行表面處理而成者。 (20) A surface-treated copper powder obtained by subjecting the copper powder according to any one of the above (1) to (19) to further surface treatment with an organic compound.

(21)一種導電性糊劑,其係使用有上述(1)至(20)中任一項之銅粉者。 (21) A conductive paste using the copper powder according to any one of the above (1) to (20).

(22)一種晶片積層陶瓷電容器,其係使用上述(21)之糊劑而製造者。 (22) A wafer laminated ceramic capacitor produced by using the paste of the above (21).

(23)如上述(22)之晶片積層陶瓷電容器,其中,於內部電極剖面存在有直徑為10nm以上之SiO2(23) The wafer multilayer ceramic capacitor according to the above (22), wherein SiO 2 having a diameter of 10 nm or more exists in a cross section of the internal electrode.

(24)如上述(22)或(23)之晶片積層陶瓷電容器,其中,於內部電極剖面以0.5個/cm2以下存在有最大直徑為0.5μm以上之SiO2(24) The wafer-layered ceramic capacitor according to the above (22) or (23), wherein SiO 2 having a maximum diameter of 0.5 μm or more exists in a cross section of the internal electrode of 0.5/cm 2 or less.

(25)一種多層基板,其係將上述(22)至(24)中任一項之晶片積層陶瓷電容器構裝於最外層者。 (25) A multilayer substrate in which the wafer laminated ceramic capacitor according to any one of the above (22) to (24) is attached to the outermost layer.

(26)一種多層基板,其係將上述(22)至(24)中任一項之晶片積層陶瓷電容器構裝於內層者。 (26) A multilayer substrate in which the wafer laminated ceramic capacitor according to any one of the above (22) to (24) is laminated to an inner layer.

(27)一種電子零件,其係搭載有上述(25)或(26)之多層基板者。 (27) An electronic component in which the multilayer substrate of the above (25) or (26) is mounted.

又,本發明亦為下述(31)至(50)。 Further, the present invention is also the following (31) to (50).

(31)一種製造經表面處理之銅粉的方法,其包含將銅粉與胺基矽烷水溶液混合而製備銅粉分散液之步驟。 (31) A method of producing a surface-treated copper powder comprising the steps of mixing a copper powder with an aqueous solution of an amino decane to prepare a copper powder dispersion.

(32)如上述(31)之方法,其包含攪拌銅粉分散液之步驟。 (32) The method according to (31) above, which comprises the step of stirring the copper powder dispersion.

(33)如上述(31)或(32)之方法,其包含對銅粉分散液進行超音波處理之步驟。 (33) A method according to (31) or (32) above, which comprises the step of ultrasonically treating the copper powder dispersion.

(34)如上述(33)之方法,其中,進行超音波處理之步驟為進行1~180分鐘超音波處理之步驟。 (34) The method of (33) above, wherein the step of performing the ultrasonic processing is a step of performing ultrasonic processing for 1 to 180 minutes.

(35)如上述(31)至(34)中任一項之方法,其包含下述步驟:將銅粉分散液過濾而回收銅粉之步驟;及將過濾回收之銅粉乾燥而獲得經表面處理之銅粉之步驟。 (35) The method according to any one of the above (31) to (34), comprising the steps of: filtering a copper powder dispersion to recover copper powder; and drying the filtered copper powder to obtain a surface The step of treating the copper powder.

(36)如上述(35)之方法,其中,乾燥係藉由於50~90℃加熱處理30~120分鐘而進行。 (36) The method according to (35) above, wherein the drying is carried out by heat treatment at 50 to 90 ° C for 30 to 120 minutes.

(37)如上述(35)或(36)之方法,其中,乾燥係於氧環境或惰性環境下進行。 (37) The method according to the above (35) or (36), wherein the drying is carried out in an oxygen atmosphere or an inert environment.

(38)如上述(31)至(37)中任一項之方法,其中,銅分散液相對於銅粉1g含有胺基矽烷0.025g以上。 The method of any one of the above (31) to (37), wherein the copper dispersion liquid phase contains 0.025 g or more of the amine decane for 1 g of the copper powder.

(39)如上述(31)至(38)中任一項之方法,其中,胺基矽烷水溶液為以下述式I表示之胺基矽烷的水溶液: H2N-R1-Si(OR2)2(R3) (式I) The method of any one of the above (31) to (38), wherein the aqueous solution of the amino decane is an aqueous solution of the amino decane represented by the following formula I: H 2 NR 1 -Si(OR 2 ) 2 ( R 3 ) (Formula I)

(其中,上述式I中,R1為直鏈狀或具有支鏈之飽和或不飽和、經取代或未經取代、環式或非環式、具有雜環或不具有雜環之C1~C12之烴的二價基,R2為C1~C5之烷基,R3為C1~C5之烷基或C1~C5之烷氧基)。 (In the above formula I, R1 is a linear or branched saturated or unsaturated, substituted or unsubstituted, cyclic or acyclic, heterocyclic or non-heterocyclic C1~C12 A divalent group of a hydrocarbon, R2 is an alkyl group of C1 to C5, and R3 is an alkyl group of C1 to C5 or an alkoxy group of C1 to C5.

(40)如上述(39)之方法,其中,R1為選自由下述者組成之群中之基:經取代或未經取代C1~C12之直鏈狀飽和烴的二價基、經取代或未經取代C1~C12之支鏈狀飽和烴的二價基、經取代或未經取代C1~C12之直鏈狀不飽和烴的二價基、經取代或未經取代C1~C12之支鏈狀不飽和烴的二價基、經取代或未經取代C1~C12之環式烴的二價基、經取代或未經取代C1~C12之雜環式烴的二價基、經取代或未經取代C1~C12之芳香族烴的二價基。 (40) The method according to the above (39), wherein R1 is a group selected from the group consisting of a substituted or unsubstituted C1-C12 linear saturated hydrocarbon, a divalent group, a substituted or Divalent group of unsubstituted C1~C12 branched saturated hydrocarbon, divalent group of substituted or unsubstituted linear unsaturated hydrocarbon of C1~C12, substituted or unsubstituted C1~C12 branch a divalent group of a monounsaturated hydrocarbon, a divalent group of a substituted or unsubstituted C1 to C12 cyclic hydrocarbon, a divalent group of a substituted or unsubstituted C1 to C12 heterocyclic hydrocarbon, substituted or not A divalent group of an aromatic hydrocarbon substituted with C1 to C12.

(41)如上述(39)之方法,其中,R1為選自由下述者組成之群中的基:-(CH2)n-、-(CH2)n-(CH)m-(CH2)j-1-、-(CH2)n-(CC)-(CH2)n-1-、-(CH2)n-NH-(CH2)m-、-(CH2)n-NH-(CH2)m-NH-(CH2)j-、-(CH2)n-1-(CH)NH2-(CH2)m-1-、-(CH2)n-1-(CH)NH2-(CH2)m-1-NH-(CH2)j-(其中,n、m、j為1以上之整數)。 (41) The method according to the above (39), wherein R1 is a group selected from the group consisting of -(CH 2 ) n -, -(CH 2 ) n -(CH) m -(CH 2 J-1 -, -(CH 2 ) n -(CC)-(CH 2 ) n-1 -, -(CH 2 ) n -NH-(CH 2 ) m -, -(CH 2 ) n -NH -(CH 2 ) m -NH-(CH 2 ) j -, -(CH 2 ) n-1 -(CH)NH 2 -(CH 2 ) m-1 -, -(CH 2 ) n-1 -( CH)NH 2 -(CH 2 ) m-1 -NH-(CH 2 ) j - (wherein n, m, j are integers of 1 or more).

(42)如上述(39)之方法,其中,R1為-(CH2)n-或-(CH2)n-NH-(CH2)m-。 (42) The method according to the above (39), wherein R1 is -(CH 2 ) n - or -(CH 2 ) n -NH-(CH 2 ) m -.

(43)如上述(41)或(42)之方法,其中,n、m、j各自獨立地為1、2或3。 (43) The method of (41) or (42) above, wherein n, m, and j are each independently 1, 2 or 3.

(44)如上述(39)至(43)中任一項之方法,其中,R2為甲基或乙基。 The method of any one of the above (39) to (43), wherein R2 is a methyl group or an ethyl group.

(45)如上述(39)至(44)中任一項之方法,其中,R3為甲基、乙基、甲氧基或乙氧基。 The method of any one of the above (39) to (44), wherein R3 is a methyl group, an ethyl group, a methoxy group or an ethoxy group.

(46)如上述(31)至(45)中任一項之方法,其中,銅粉為藉由濕式法製造之銅粉。 (46) The method according to any one of the above (31) to (45) wherein the copper powder is copper powder produced by a wet method.

(47)一種製造導電性銅糊劑之方法,其係將藉由上述(31)至(46)中任一項之製造方法製造之經表面處理之銅粉與溶劑及/或黏合劑摻合而製造導電性銅糊劑。 (47) A method of producing a conductive copper paste by blending a surface-treated copper powder produced by the production method according to any one of the above (31) to (46) with a solvent and/or a binder A conductive copper paste is produced.

(48)一種製造電極之方法,其包含下述步驟:將藉由上述(31)至(46)中任一項之製造方法製造之經表面處理之銅粉與溶劑及/或黏合劑摻合而獲得導電性銅糊劑之步驟;將導電性銅糊劑塗佈於基材之步驟;及將塗佈於基材之導電性銅糊劑加熱燒成之步驟。 (48) A method of producing an electrode, comprising the step of blending a surface-treated copper powder produced by the production method according to any one of the above (31) to (46) with a solvent and/or a binder a step of obtaining a conductive copper paste; a step of applying a conductive copper paste to the substrate; and a step of heating and baking the conductive copper paste applied to the substrate.

(49)如上述(48)之方法,其中,電極為晶片積層陶瓷電容器用電極。 (49) The method according to (48) above, wherein the electrode is an electrode for a wafer laminated ceramic capacitor.

(50)如上述(31)至(49)中任一項之方法,其包含對經表面處理之銅粉進一步經有機化合物進行表面處理之步驟。 (50) The method according to any one of (31) to (49) above comprising the step of surface-treating the surface-treated copper powder further by an organic compound.

又,本發明亦為下述(51)至(54)。 Further, the present invention is also the following (51) to (54).

(51)一種經表面處理之銅粉,其係藉由上述(31)至(46)中任一項之製造方法而製造者。 (51) A surface-treated copper powder produced by the production method according to any one of the above (31) to (46).

(52)一種導電性銅糊劑,其係藉由上述(45)之製造方法而製造者。 (52) A conductive copper paste produced by the production method of the above (45).

(53)一種電極,其係藉由上述(46)之製造方法而製造者。 (53) An electrode produced by the production method of the above (46).

(54)一種晶片積層陶瓷電容器用電極,其係藉由上述(47)之製造方法而製造者。 (54) An electrode for a wafer laminated ceramic capacitor produced by the method of the above (47).

又,本發明亦為下述(61)至(63)。 Further, the present invention is also the following (61) to (63).

(61)一種銅粉,其係藉由上述(31)至(46)中任一項之製造方法製造之經表面處理之銅粉,於XPS之survey測定中,檢測出表面之N為1%以上,N之光電子為1000cps(count per second),且Si為0.6%以上,Si之光電子為1000cps以上,燒結開始溫度為400℃以上。 (61) A copper powder obtained by the surface-treated copper powder produced by the method of any one of the above (31) to (46), wherein a surface N of 1% is detected in a survey of XPS As described above, the photoelectron of N is 1000 cps (count per second), and Si is 0.6% or more, the photoelectron of Si is 1000 cps or more, and the sintering start temperature is 400 ° C or more.

(62) 一種導電性銅糊劑,其係摻合上述(61)之經表面處理之銅粉而成者。 (62) A conductive copper paste obtained by blending the surface-treated copper powder of the above (61).

(63)一種電極,其係塗佈上述(62)之導電性銅糊劑並進行加熱燒成而成者;於電極剖面以0.5個/cm2以下存在有最大直徑為0.5μm以上之SiO2(63) An electrode obtained by applying the conductive copper paste of the above (62) and firing it by heating; and having SiO 2 having a maximum diameter of 0.5 μm or more in an electrode cross section of 0.5/cm 2 or less .

進而,本發明亦為下述(71)至(78)。 Further, the present invention is also the following (71) to (78).

(71)一種經表面處理之金屬粉,其於XPS之survey測定中,檢測出表面之N為1%以上,且檢測出Ti、Al、Si、Zr、Ce、Sn之任意一種以上為0.6%以上。 (71) A surface-treated metal powder having a surface N of 1% or more detected in a survey of XPS, and detecting any one or more of Ti, Al, Si, Zr, Ce, and Sn is 0.6% the above.

(72)如上述(71)之金屬粉,其中,金屬粉為Cu、Pt、Pd、Ag、Ni之任一者。 (72) The metal powder according to (71) above, wherein the metal powder is any one of Cu, Pt, Pd, Ag, and Ni.

(73)如上述(71)或(72)之金屬粉,其藉由偶合劑處理而吸附有Ti、Al、Si、Zr、Ce、Sn。 (73) The metal powder according to (71) or (72) above, wherein Ti, Al, Si, Zr, Ce, and Sn are adsorbed by the treatment with a coupling agent.

(74)如上述(73)之金屬粉,其中,偶合劑為矽烷、鈦酸酯、鋁酸酯之任一者。 (74) The metal powder according to (73) above, wherein the coupling agent is any one of decane, titanate, and aluminate.

(75)如上述(74)之金屬粉,其係經末端為胺基之偶合劑處理過者。 (75) The metal powder according to (74) above, which is treated by a coupling agent having an amine group at the end.

(76) 一種金屬粉,其於XPS之survey測定中,檢測出表面之N為1%以上,且Ti、Al、Si、Zr、Ce、Sn為0.6%以上,燒結開始溫度為400℃以上。 (76) A metal powder having a surface N of 1% or more and a Ti, Al, Si, Zr, Ce, and Sn of 0.6% or more and a sintering start temperature of 400 ° C or more in the measurement of XPS.

(77)一種導電性銅糊劑,其係摻合上述(71)至(76)中任一項之經表面處理之金屬粉而成者。 (77) A conductive copper paste obtained by blending the surface-treated metal powder of any one of the above (71) to (76).

(78)一種電極,其係塗佈上述(77)之導電性銅糊劑並進行加熱燒成而成者;於電極剖面以0.5個/μm2以下存在有最大直徑為0.5μm以上之SiO2、TiO2、Al2O3(78) An electrode obtained by applying the conductive copper paste of the above (77) and firing it by heating; and having SiO 2 having a maximum diameter of 0.5 μm or more in an electrode cross section of 0.5/μm 2 or less , TiO 2 , Al 2 O 3 .

進一步,本發明亦為下述(101)至(143)。 Further, the present invention is also the following (101) to (143).

(101)一種經表面處理之金屬粉,其於XPS之survey測定中,檢測出N之光電子為1000cps(count per second)以上,且檢測出Ti、Al、Si、Zr、Ce、Sn之任一者之光電子為1000cps以上。 (101) A surface-treated metal powder, wherein in the survey of XPS, the photoelectron of N is detected to be 1000 cps (count per second) or more, and any one of Ti, Al, Si, Zr, Ce, and Sn is detected. The photoelectron is above 1000 cps.

(102)一種經表面處理之金屬粉,其於XPS之survey測定中,檢測出表面之N為1%以上,且檢測出Ti、Al、Si、Zr、Ce、Sn之任意一種以上為0.6%以上。 (102) A surface-treated metal powder having a surface N of 1% or more detected in a survey of XPS, and detecting any one or more of Ti, Al, Si, Zr, Ce, and Sn is 0.6% the above.

(103)如上述(101)或(102)之經表面處理之金屬粉,其於XPS之survey測定中,檢測出表面之N為1%以上,且檢測出Si、Ti或Al為0.6%以上。 (103) The surface-treated metal powder according to (101) or (102) above, wherein in the measurement of XPS, the surface N is detected to be 1% or more, and Si, Ti or Al is detected to be 0.6% or more. .

(104)如上述(101)至(103)中任一項之金屬粉,其於XPS之survey測定中,檢測出表面之N為1%以上,檢測出N之光電子為1000cps(count per second)以上,且檢測出Si或Ti為0.6%以上,檢測出Si、Ti或Al之光電子為1000cps以上。 (104) The metal powder according to any one of the above (101) to (103), wherein in the measurement of XPS, the surface N is detected to be 1% or more, and the photoelectron of N is detected to be 1000 cps (count per second) As described above, Si or Ti was detected to be 0.6% or more, and photoelectrons of Si, Ti or Al were detected to be 1000 cps or more.

(105)如上述(101)至(104)中任一項之金屬粉,其中,金屬粉為Cu、Pt、Pd、Ag、Ni中之任一種金屬粉。 The metal powder according to any one of the above (101), wherein the metal powder is any one of Cu, Pt, Pd, Ag, and Ni.

(106)如上述(101)至(104)中任一項之金屬粉,其中,金屬粉為銅粉。 The metal powder according to any one of the above (101), wherein the metal powder is copper powder.

(107)如上述(101)至(106)中任一項之金屬粉,其藉由偶合劑處理而吸附有Ti、Al、Si、Zr、Ce、Sn。 (107) The metal powder according to any one of (101) to (106) above which is adsorbed with Ti, Al, Si, Zr, Ce, and Sn by a coupling agent treatment.

(108)如上述(107)之金屬粉,其中,偶合劑為矽烷、鈦酸酯、鋁酸酯之任一者。 (108) The metal powder according to (107) above, wherein the coupling agent is any one of decane, titanate, and aluminate.

(109)如上述(108)之金屬粉,其係經末端為胺基之偶合劑處理過者。 (109) A metal powder according to the above (108) which is treated with a coupling agent having an amine group at the end.

(110)如上述(101)至(109)中任一項之金屬粉,其中,金屬粉為經矽烷偶合劑進行過表面處理之金屬粉。 The metal powder according to any one of the above (101) to (109) wherein the metal powder is a metal powder surface-treated with a decane coupling agent.

(111) 如上述(110)之金屬粉,其中,矽烷偶合劑為胺基矽烷。 (111) The metal powder according to (110) above, wherein the decane coupling agent is an amino decane.

(112)如上述(101)至(111)中任一項之金屬粉,其燒結開始溫度為400℃以上。 (112) The metal powder according to any one of the above (101) to (111), which has a sintering start temperature of 400 ° C or higher.

(113)如上述(111)或(112)之金屬粉,其中,胺基矽烷為單胺基矽烷或二胺基矽烷。 (113) The metal powder according to (111) or (112) above, wherein the amino decane is monoamine decane or diamino decane.

(114)一種經表面處理之金屬粉,其係上述(101)至(113)中任一項之金屬粉進一步經有機化合物進行表面處理而成者。 (114) A surface-treated metal powder obtained by further surface-treating a metal powder according to any one of the above (101) to (113).

(115)一種導電性金屬粉糊劑,其係使用有上述(101)至(114)中任一項之金屬粉者。 (115) A conductive metal powder paste using the metal powder according to any one of the above (101) to (114).

(116)一種晶片積層陶瓷電容器,其係使用上述(115)之糊劑而製造者。 (116) A wafer laminated ceramic capacitor produced by using the paste of the above (115).

(117)如上述(116)之晶片積層陶瓷電容器,其中,於內部電極剖面存在有直徑為10nm以上之SiO2、TiO2或Al2O3(104) The wafer-stacked ceramic capacitor according to the above (116), wherein SiO 2 , TiO 2 or Al 2 O 3 having a diameter of 10 nm or more is present in the internal electrode cross section.

(118)如上述(116)或(117)之晶片積層陶瓷電容器,其中,於內部電極剖面以0.5個/μm2以下存在有最大直徑為0.5μm以上之SiO2、TiO2或Al2O3(118) The wafer-stacked ceramic capacitor of the above (116) or (117), wherein SiO 2 , TiO 2 or Al 2 O 3 having a maximum diameter of 0.5 μm or more exists in a cross section of the internal electrode of 0.5/μm 2 or less. .

(119) 一種多層基板,其係將上述(116)至(118)中任一項之晶片積層陶瓷電容器構裝於最外層者。 (119) A multilayer substrate in which the wafer laminated ceramic capacitor according to any one of the above (116) to (118) is attached to the outermost layer.

(120)一種多層基板,其係將上述(116)至(118)中任一項之晶片積層陶瓷電容器構裝於內層者。 (120) A multilayer substrate in which the wafer laminated ceramic capacitor according to any one of the above (116) to (118) is attached to the inner layer.

(121)一種電子零件,其係搭載有上述(119)或(120)之多層基板者。 (121) An electronic component in which the multilayer substrate of the above (119) or (120) is mounted.

(122)一種製造經表面處理之金屬粉之方法,其包含將金屬粉與偶合劑水溶液混合而製備金屬粉分散液之步驟。 (122) A method of producing a surface-treated metal powder comprising the steps of mixing a metal powder with an aqueous solution of a coupling agent to prepare a metal powder dispersion.

(123)如上述(122)之方法,其中,金屬粉為Cu、Pt、Pd、Ag、Ni中之任一種金屬粉。 (123) The method according to the above (122), wherein the metal powder is any one of Cu, Pt, Pd, Ag, and Ni.

(124)如上述(122)之方法,其中,金屬粉為銅粉。 (124) The method of (122) above, wherein the metal powder is copper powder.

(125)如上述(122)至(124)中任一項之方法,其包含攪拌金屬粉分散液之步驟。 (125) The method according to any one of the above (122) to (124), comprising the step of stirring the metal powder dispersion.

(126)如上述(122)至(125)中任一項之方法,其包含對金屬粉分散液進行超音波處理之步驟。 (126) The method according to any one of the above (122) to (125) comprising the step of ultrasonically treating the metal powder dispersion.

(127) 如上述(126)之方法,其中,進行超音波處理之步驟為進行1~180分鐘超音波處理之步驟。 (127) The method of (126) above, wherein the step of performing the ultrasonic processing is a step of performing ultrasonic processing for 1 to 180 minutes.

(128)如上述(122)至(127)中任一項之方法,其包含下述步驟:將金屬粉分散液過濾而回收金屬粉之步驟;及將過濾回收之金屬粉乾燥而獲得經表面處理之金屬粉之步驟。 The method of any one of the above (122) to (127), comprising the steps of: filtering the metal powder dispersion to recover the metal powder; and drying the filtered metal powder to obtain a surface. The step of treating the metal powder.

(129)如上述(128)之方法,其中,乾燥係於氧環境或惰性環境下進行。 (129) The method of (128) above, wherein the drying is carried out in an oxygen atmosphere or an inert environment.

(130)如上述(122)至(129)中任一項之方法,其中,金屬粉分散液相對於銅粉1g含有偶合劑0.025g以上。 The method of any one of the above-mentioned (122) to (129), wherein the metal powder dispersion liquid phase contains 0.025 g or more of a coupling agent for 1 g of copper powder.

(131)如上述(122)至(130)中任一項之方法,其中,偶合劑水溶液為以下述式I表示之胺基矽烷的水溶液:H2N-R1-Si(OR2)2(R3) (式I) The method of any one of the above (122) to (130), wherein the aqueous solution of the coupling agent is an aqueous solution of an amino decane represented by the following formula I: H 2 NR 1 -Si(OR 2 ) 2 (R 3 ) (Formula I)

(其中,上述式I中,R1為直鏈狀或具有支鏈之飽和或不飽和、經取代或未經取代、環式或非環式、具有雜環或不具有雜環之C1~C12之烴的二價基,R2為C1~C5之烷基;R3為C1~C5之烷基或C1~C5之烷氧基)。 (In the above formula I, R1 is a linear or branched saturated or unsaturated, substituted or unsubstituted, cyclic or acyclic, heterocyclic or non-heterocyclic C1~C12 a divalent group of a hydrocarbon, R2 is an alkyl group of C1 to C5; and R3 is an alkyl group of C1 to C5 or an alkoxy group of C1 to C5.

(132)如上述(131)之方法,其中,R1為選自由下述者組成之群中之基:- (CH2)n-、-(CH2)n-(CH)m-(CH2)j-1-、-(CH2)n-(CC)-(CH2)n-1-、-(CH2)n-NH-(CH2)m-、-(CH2)n-NH-(CH2)m-NH-(CH2)j-、-(CH2)n-1-(CH)NH2-(CH2)m-1-、-(CH2)n-1-(CH)NH2-(CH2)m-1-NH-(CH2)j-(其中,n、m、j為1以上之整數)。 (132) The method according to the above (131), wherein R1 is a group selected from the group consisting of: -(CH 2 ) n -, -(CH 2 ) n -(CH) m -(CH 2 J-1 -, -(CH 2 ) n -(CC)-(CH 2 ) n-1 -, -(CH 2 ) n -NH-(CH 2 ) m -, -(CH 2 ) n -NH -(CH 2 ) m -NH-(CH 2 ) j -, -(CH 2 ) n-1 -(CH)NH 2 -(CH 2 ) m-1 -, -(CH 2 ) n-1 -( CH)NH 2 -(CH 2 ) m-1 -NH-(CH 2 ) j - (wherein n, m, j are integers of 1 or more).

(133)如上述(122)至(130)中任一項之方法,其中,偶合劑水溶液為以下述式II表示之含胺基之鈦酸酯的水溶液:(H2N-R1-O)PTi(OR2)q (式II) The method of any one of the above (122) to (130), wherein the aqueous solution of the coupling agent is an aqueous solution of an amine group-containing titanate represented by the following formula II: (H 2 NR 1 -O) P Ti(OR 2 ) q (Formula II)

(其中,上述式II中,R1為直鏈狀或具有支鏈之飽和或不飽和、經取代或未經取代、環式或非環式、具有雜環或不具有雜環之C1~C12之烴的二價基,R2為直鏈狀或具有支鏈之C1~C5之烷基;p及q為1~3之整數,且p+q=4)。 (In the above formula II, R1 is a linear or branched saturated or unsaturated, substituted or unsubstituted, cyclic or acyclic, heterocyclic or non-heterocyclic C1~C12 a divalent group of a hydrocarbon, R2 is a linear or branched C1 to C5 alkyl group; p and q are integers of 1 to 3, and p+q=4).

(134)如上述(133)之方法,其中,R1為選自由下述者組成之群中之基:-(CH2)n-、-(CH2)n-(CH)m-(CH2)j-1-、-(CH2)n-(CC)-(CH2)n-1-、-(CH2)n-NH-(CH2)m-、-(CH2)n-NH-(CH2)m-NH-(CH2)j-、-(CH2)n-1-(CH)NH2-(CH2)m-1-、-(CH2)n-1-(CH)NH2-(CH2)m-1-NH-(CH2)j-(其中,n、m、j為1以上之整數)。 (134) The method according to the above (133), wherein R1 is a group selected from the group consisting of -(CH 2 ) n -, -(CH 2 ) n -(CH) m -(CH 2 J-1 -, -(CH 2 ) n -(CC)-(CH 2 ) n-1 -, -(CH 2 ) n -NH-(CH 2 ) m -, -(CH 2 ) n -NH -(CH 2 ) m -NH-(CH 2 ) j -, -(CH 2 ) n-1 -(CH)NH 2 -(CH 2 ) m-1 -, -(CH 2 ) n-1 -( CH)NH 2 -(CH 2 ) m-1 -NH-(CH 2 ) j - (wherein n, m, j are integers of 1 or more).

(135)如上述(122)至(134)中任一項之方法,其中,金屬粉為藉由濕式法製造之銅粉。 The method of any one of the above (122) to (134), wherein the metal powder is copper powder produced by a wet method.

(136)一種製造導電性金屬粉糊劑之方法,其係將藉由上述(122)至(135)中任一項之製造方法製造之經表面處理之金屬粉與溶劑及/或黏合劑摻合而製造導電性金屬粉糊劑。 (136) A method of producing a conductive metal powder paste by mixing the surface-treated metal powder produced by the production method according to any one of the above (122) to (135) with a solvent and/or a binder A conductive metal powder paste is produced in combination.

(137)一種製造電極之方法,其包含下述步驟:將藉由上述(122)至(135)中任一項之製造方法製造之經表面處理之金屬粉與溶劑及/或黏合劑摻合,而獲得導電性金屬粉糊劑之步驟;將導電性金屬粉糊劑塗佈於基材之步驟;及將塗佈於基材之導電性金屬粉糊劑加熱燒成之步驟。 (137) A method of producing an electrode, comprising the step of blending a surface-treated metal powder produced by the production method according to any one of the above (122) to (135) with a solvent and/or a binder a step of obtaining a conductive metal powder paste; a step of applying a conductive metal powder paste to the substrate; and a step of heating and baking the conductive metal powder paste applied to the substrate.

(138)一種經表面處理之金屬粉,其係藉由上述(122)至(135)中任一項之製造方法而製造者。 (138) A surface-treated metal powder produced by the production method according to any one of the above (122) to (135).

(139)一種導電性金屬粉糊劑,其係藉由上述(136)之製造方法而製造者。 (139) A conductive metal powder paste produced by the production method of the above (136).

(140)一種電極,其係藉由上述(137)之製造方法而製造者。 (140) An electrode produced by the production method of the above (137).

(141)一種金屬粉,其係藉由上述(122)至(135)中任一項之製造方法製造之經表面處理之金屬粉;於XPS之survey測定中,檢測出表面之N為1%以上,N之光電子為1000cps(count per second),且Si、Ti或Al為0.6%以上,Si、Ti或Al之光 電子為1000cps以上,燒結開始溫度為400℃以上。 (141) A metal powder which is a surface-treated metal powder produced by the method of any one of (122) to (135) above; in the survey of XPS, a surface N of 1% is detected. Above, the photoelectron of N is 1000 cps (count per second), and Si, Ti or Al is 0.6% or more, and the light of Si, Ti or Al The electrons are 1000 cps or more, and the sintering start temperature is 400 ° C or more.

(142)一種導電性金屬粉糊劑,其係摻合上述(141)之經表面處理之金屬粉而成者。 (142) A conductive metal powder paste obtained by blending the surface-treated metal powder of the above (141).

(143)一種電極,其係塗佈上述(142)之導電性金屬粉糊劑並進行加熱燒成而成者;於電極剖面以0.5個/μm2以下存在有最大直徑為0.5μm以上之SiO2、TiO2或Al2O3(143) An electrode obtained by applying the conductive metal powder paste of the above (142) and firing it by heating; and having SiO having a maximum diameter of 0.5 μm or more in an electrode cross section of 0.5/μm 2 or less 2 , TiO 2 or Al 2 O 3 .

本發明之經表面處理之銅粉於表面處理後亦不會凝聚,且燒結延遲性優異,即便為小粒子之銅粉亦顯示高燒結開始溫度。因此,若使用摻合本發明之經表面處理之銅粉而成的導電性銅糊劑,則可避免電極剝離等製造方面之問題,而有利於製造晶片積層陶瓷電容器用電極。又,本發明之經表面處理之銅粉可藉由對銅粉進行非常簡單之處理而製造,其製造方法無需高度之技能,作業性及生產性優異。又,根據本發明,則銅粉以外之金屬粉亦可具有同樣優異之特性。 The surface-treated copper powder of the present invention does not aggregate after surface treatment, and is excellent in sintering retardation, and even a small particle copper powder exhibits a high sintering onset temperature. Therefore, when a conductive copper paste obtained by blending the surface-treated copper powder of the present invention is used, it is possible to avoid problems in manufacturing such as electrode peeling, and it is advantageous to manufacture an electrode for a wafer laminated ceramic capacitor. Further, the surface-treated copper powder of the present invention can be produced by very simple treatment of copper powder, and the manufacturing method does not require a high degree of skill, and is excellent in workability and productivity. Further, according to the present invention, the metal powder other than the copper powder can have the same excellent characteristics.

圖1係由經表面處理之銅粉獲得之燒結體之剖面的TEM影像。 Figure 1 is a TEM image of a cross section of a sintered body obtained from surface-treated copper powder.

圖2係表示經表面處理之銅粉(實施例)之表面之XPS survey測定結果的圖。 Fig. 2 is a graph showing the results of XPS survey of the surface of the surface-treated copper powder (Example).

圖3係表示經表面處理之銅粉(比較例)之表面之XPS survey測定結果的圖。 Fig. 3 is a graph showing the results of XPS survey of the surface of the surface-treated copper powder (Comparative Example).

以下,列舉實施態樣詳細地對本發明進行說明。本發明並不限定於以下所列舉之具體實施態樣。 Hereinafter, the present invention will be described in detail with reference to the embodiments. The invention is not limited to the specific embodiments listed below.

於本發明中,可進行將銅粉與胺基矽烷水溶液混合而製備銅粉分散液之步驟,由該銅粉分散液而獲得經表面處理之銅粉。 In the present invention, a step of preparing a copper powder dispersion by mixing copper powder with an aqueous solution of an amino decane, and obtaining a surface-treated copper powder from the copper powder dispersion may be carried out.

作為供於表面處理之銅粉,可使用藉由公知之方法製造之銅粉。例如,銅粉可使用藉由乾式法製造之銅粉、藉由濕式法製造之銅粉之任一者。就至本發明之表面處理為止全部一貫地為濕式製程之方面而言,較佳為藉由濕式法製造之銅粉。 As the copper powder for surface treatment, copper powder produced by a known method can be used. For example, the copper powder may be any of copper powder produced by a dry method or copper powder produced by a wet method. As far as the surface treatment of the present invention is consistently a wet process, copper powder produced by a wet process is preferred.

胺基矽烷水溶液為可用作矽烷偶合劑之胺基矽烷之水溶液。於較佳之實施態樣中,關於胺基矽烷之使用量,相對於製成銅粉分散液時之銅粉之質量1g,胺基矽烷之質量可設為含0.025g以上,較佳為0.050g以上,進而較佳為0.075g以上,進而較佳為0.10g以上,或者可設為例如含0.025~0.500g、0.025~0.250g、0.025~0.100g之範圍的量。於較佳之實施態樣中,胺基矽烷之使用量可設為相對於製成銅粉分散液時之銅粉之質量1g,25℃之胺基矽烷之體積為0.01mL以上、0.025mL以上,較佳為0.050mL以上,進而較佳為0.075mL以上,進而較佳為0.10mL以上,或者例如可設為含0.025~0.500mL、0.025~0.250mL、0.025~0.100mL之範圍的量。 The aqueous solution of amino decane is an aqueous solution of an amino decane which can be used as a decane coupling agent. In a preferred embodiment, the amount of the amino decane used may be set to be 0.025 g or more, preferably 0.050 g, based on 1 g of the mass of the copper powder when the copper powder dispersion is prepared. The above is more preferably 0.075 g or more, further preferably 0.10 g or more, or may be, for example, an amount in the range of 0.025 to 0.500 g, 0.025 to 0.250 g, and 0.025 to 0.100 g. In a preferred embodiment, the amount of the amino decane used may be 1 g relative to the mass of the copper powder when the copper powder dispersion is prepared, and the volume of the amino decane at 25 ° C is 0.01 mL or more and 0.025 mL or more. It is preferably 0.050 mL or more, more preferably 0.075 mL or more, further preferably 0.10 mL or more, or may be, for example, in an amount ranging from 0.025 to 0.500 mL, 0.025 to 0.250 mL, and 0.025 to 0.100 mL.

於較佳之實施態樣中,作為胺基矽烷,可使用含有1個以上之胺基及/或亞胺基之矽烷。胺基矽烷中所含之胺基及亞胺基之數例如 可分別為1~4個,較佳為分別為1~3個,進而較佳為1~2個。於較佳之實施態樣中,胺基矽烷中所含之胺基及亞胺基之數可分別為1個。胺基矽烷中所含之胺基及亞胺基之數之合計為1個的胺基矽烷可特殊地稱為單胺基矽烷,為2個之胺基矽烷可特殊地稱為二胺基矽烷,為3個之胺基矽烷可特殊地稱為三胺基矽烷。於本發明中可較佳地使用單胺基矽烷、二胺基矽烷。於較佳之實施態樣中,作為胺基矽烷,可使用含有1個胺基之單胺基矽烷。於較佳之實施態樣中,胺基矽烷可設為於分子之末端、較佳為直鏈狀或支鏈狀之鏈狀分子之末端含有至少1個,例如1個胺基者。 In a preferred embodiment, as the aminodecane, a decane containing one or more amine groups and/or an imido group can be used. The number of amine groups and imine groups contained in the amino decane, for example It may be 1 to 4, preferably 1 to 3, and more preferably 1 to 2. In a preferred embodiment, the number of amine groups and imine groups contained in the amino decane may be one. The amino decane which is a total of the number of the amine group and the imine group contained in the amino decane may be specifically referred to as a monoamino decane, and the two amino decane may be specifically referred to as a diamino decane. The three amino decanes are specifically referred to as triamine decanes. Monoamine decane or diamino decane can be preferably used in the present invention. In a preferred embodiment, as the aminodecane, a monoamine decane containing one amine group can be used. In a preferred embodiment, the aminodecane may be at least one, for example, one amine group at the end of the molecule, preferably at the end of a linear or branched chain molecule.

作為胺基矽烷,例如可列舉:N-2-(胺基乙基)-3-胺基丙基甲基二甲氧基矽烷、N-2-(胺基乙基)-3-胺基丙基三甲氧基矽烷、3-胺基丙基三甲氧基矽烷、1-胺基丙基三甲氧基矽烷、2-胺基丙基三甲氧基矽烷、1,2-二胺基丙基三甲氧基矽烷、3-胺基-1-丙烯基三甲氧基矽烷、3-胺基-1-丙炔基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-三乙氧基矽烷基-N-(1,3-二甲基-亞丁基)丙基胺、N-苯基-3-胺基丙基三甲氧基矽烷、N-(乙烯基苄基)-2-胺基乙基-3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-胺基丙基三甲氧基矽烷、N-(2-胺基乙基)-3-胺基丙基三甲氧基矽烷、N-(2-胺基乙基)-3-胺基丙基甲基二甲氧基矽烷、3-(N-苯基)胺基丙基三甲氧基矽烷。 As the amino decane, for example, N-2-(aminoethyl)-3-aminopropylmethyldimethoxydecane, N-2-(aminoethyl)-3-aminopropyl Trimethoxy decane, 3-aminopropyltrimethoxy decane, 1-aminopropyltrimethoxydecane, 2-aminopropyltrimethoxydecane, 1,2-diaminopropyltrimethoxy Baseline, 3-amino-1-propenyltrimethoxydecane, 3-amino-1-propynyltrimethoxydecane, 3-aminopropyltriethoxydecane, 3-triethoxy矽alkyl-N-(1,3-dimethyl-butylene)propylamine, N-phenyl-3-aminopropyltrimethoxydecane, N-(vinylbenzyl)-2-amino Ethyl-3-aminopropyltrimethoxydecane, 3-aminopropyltriethoxydecane, 3-aminopropyltrimethoxydecane, N-(2-aminoethyl)-3- Aminopropyltrimethoxydecane, N-(2-aminoethyl)-3-aminopropylmethyldimethoxydecane, 3-(N-phenyl)aminopropyltrimethoxydecane .

於較佳之實施態樣中,可使用以下式I表示之胺基矽烷。 In a preferred embodiment, the amino decane represented by the following formula I can be used.

H2N-R1-Si(OR2)2(R3) (式I) H 2 NR 1 -Si(OR 2 ) 2 (R 3 ) (Formula I)

上述式I中,R1為直鏈狀或具有支鏈之飽和或不飽和、經取代或未經取代、環式或 非環式、具有雜環或不具有雜環之C1~C12之烴之二價基,R2為C1~C5之烷基,R3為C1~C5之烷基或C1~C5之烷氧基。 In the above formula I, R1 is linear or branched, saturated or unsaturated, substituted or unsubstituted, cyclic or a divalent group of a hydrocarbon having a heterocyclic ring or a heterocyclic ring or a C1 to C12 group having no hetero ring, R 2 is an alkyl group of C1 to C5, and R 3 is an alkyl group of C1 to C5 or an alkoxy group of C1 to C5.

於較佳之實施態樣中,上述式I之R1為直鏈狀或具有支鏈之飽和或不飽和、經取代或未經取代、環式或非環式、具有雜環或不具有雜環之C1~C12之烴之二價基,進而較佳為R1可為選自由下述者組成之群中之基:經取代或未經取代C1~C12之直鏈狀飽和烴之二價基、經取代或未經取代C1~C12之支鏈狀飽和烴之二價基、經取代或未經取代C1~C12之直鏈狀不飽和烴之二價基、經取代或未經取代C1~C12之支鏈狀不飽和烴之二價基、經取代或未經取代C1~C12之環式烴之二價基、經取代或未經取代C1~C12之雜環式烴之二價基、經取代或未經取代C1~C12之芳香族烴之二價基。於較佳之實施態樣中,上述式I之R1為C1~C12之飽和或不飽和鏈狀烴之二價基,進而較佳為鏈狀結構之兩末端之原子為具有游離原子價之二價基。於較佳之實施態樣中,二價基之碳數例如為C1~C12,較佳為C1~C8,較佳為C1~C6,較佳為C1~C3。 In a preferred embodiment, R1 of the above formula I is linear or branched, saturated or unsaturated, substituted or unsubstituted, cyclic or acyclic, heterocyclic or non-heterocyclic. The divalent group of the hydrocarbon of C1 to C12, and more preferably R1 may be a group selected from the group consisting of a divalent group of a substituted or unsubstituted linear saturated hydrocarbon of C1 to C12, a divalent group of a substituted or unsubstituted C1 to C12 branched saturated hydrocarbon, a substituted or unsubstituted C1 to C12 linear unsaturated hydrocarbon, a divalent group, a substituted or unsubstituted C1 to C12 a divalent group of a branched unsaturated hydrocarbon, a divalent group of a substituted or unsubstituted C1 to C12 cyclic hydrocarbon, a divalent group of a substituted or unsubstituted C1 to C12 heterocyclic hydrocarbon, substituted Or a divalent group of an aromatic hydrocarbon which is not substituted with C1 to C12. In a preferred embodiment, R1 of the above formula I is a divalent group of a saturated or unsaturated chain hydrocarbon of C1 to C12, and further preferably the atom at both ends of the chain structure is a divalent having a free valence. base. In a preferred embodiment, the carbon number of the divalent group is, for example, C1 to C12, preferably C1 to C8, preferably C1 to C6, preferably C1 to C3.

於較佳之實施態樣中,上述式I之R1可為選自由下述者組成之群中之基:-(CH2)n-、-(CH2)n-(CH)m-(CH2)j-1-、-(CH2)n-(CC)-(CH2)n-1-、-(CH2)n-NH-(CH2)m-、-(CH2)n-NH-(CH2)m-NH-(CH2)j-、-(CH2)n-1-(CH)NH2-(CH2)m-1-、-(CH2)n-1-(CH)NH2-(CH2)m-1-NH-(CH2)j-(其中,n、m、j為1以上之整數)(其中,上述(CC)表示C與C之三鍵)。於較佳之實施態樣中,R1可為-(CH2)n-或-(CH2)n-NH-(CH2)m-(其中,上述(CC)表示C與C之三鍵)。於較佳之實施態樣中,上述二價基 R1之氫亦可經胺基取代,例如1~3個氫、例如1~2個氫、例如1個氫經胺基取代。 In a preferred embodiment, R1 of the above formula I may be a group selected from the group consisting of: -(CH 2 ) n -, -(CH 2 ) n -(CH) m -(CH 2 J-1 -, -(CH 2 ) n -(CC)-(CH 2 ) n-1 -, -(CH 2 ) n -NH-(CH 2 ) m -, -(CH 2 ) n -NH -(CH 2 ) m -NH-(CH 2 ) j -, -(CH 2 ) n-1 -(CH)NH 2 -(CH 2 ) m-1 -, -(CH 2 ) n-1 -( CH)NH 2 -(CH 2 ) m-1 -NH-(CH 2 ) j - (wherein n, m, j are integers of 1 or more) (wherein (CC) represents a triple bond of C and C) . In a preferred embodiment, R1 may be -(CH 2 ) n - or -(CH 2 ) n -NH-(CH 2 ) m - (wherein (CC) represents a triple bond of C and C). In a preferred embodiment, the hydrogen of the divalent group R1 may be substituted with an amine group, for example, 1 to 3 hydrogens, for example, 1 to 2 hydrogens, for example, 1 hydrogen, is substituted with an amine group.

於較佳之實施態樣中,上述式I之n、m、j可各自獨立地為1以上12以下之整數,較佳為1以上6以下之整數,進而較佳為1以上4以下之整數,例如可為選自1、2、3、4之整數,例如可為1、2或3。 In a preferred embodiment, n, m, and j of the above formula I may each independently be an integer of 1 or more and 12 or less, preferably an integer of 1 or more and 6 or less, and more preferably an integer of 1 or more and 4 or less. For example, it may be an integer selected from 1, 2, 3, and 4, and may be 1, 2, or 3, for example.

於較佳之實施態樣中,上述式I之R2可為C1~C5之烷基,較佳為C1~C3之烷基,進而較佳為C1~C2之烷基,例如可為甲基、乙基、異丙基或丙基,較佳為甲基或乙基。 In a preferred embodiment, R2 of the above formula I may be a C1~C5 alkyl group, preferably a C1~C3 alkyl group, and further preferably a C1~C2 alkyl group, for example, a methyl group or a B group. The group, isopropyl or propyl group is preferably a methyl group or an ethyl group.

於較佳之實施態樣中,關於上述式I之R3,作為烷基可為C1~C5之烷基,較佳為C1~C3之烷基,進而較佳為C1~C2之烷基,例如可為甲基、乙基、異丙基或丙基,較佳為甲基或乙基。又,關於上述式I之R3,作為烷氧基,可為C1~C5之烷氧基,較佳為C1~C3之烷氧基,進而較佳為C1~C2之烷氧基,例如可為甲氧基、乙氧基、異丙氧基或丙氧基,較佳為甲氧基或乙氧基。 In a preferred embodiment, R3 of the above formula I may be an alkyl group of C1 to C5, preferably an alkyl group of C1 to C3, and more preferably an alkyl group of C1 to C2, for example, It is a methyl group, an ethyl group, an isopropyl group or a propyl group, preferably a methyl group or an ethyl group. Further, R3 of the above formula I may be an alkoxy group of C1 to C5, preferably an alkoxy group of C1 to C3, more preferably an alkoxy group of C1 to C2, and for example, Methoxy, ethoxy, isopropoxy or propoxy is preferably methoxy or ethoxy.

胺基矽烷水溶液可藉由公知之方法而與銅粉混合。於混合時可適當藉由公知之方法而進行攪拌。於較佳之實施態樣中,混合例如可於常溫下進行,例如可於5~80℃、10~40℃、20~30℃之範圍之溫度下進行。 The aqueous solution of the aminodecane can be mixed with the copper powder by a known method. Stirring can be suitably carried out by a known method at the time of mixing. In a preferred embodiment, the mixing can be carried out, for example, at room temperature, for example, at a temperature in the range of 5 to 80 ° C, 10 to 40 ° C, and 20 to 30 ° C.

於較佳之實施態樣中,銅粉分散液可於混合後進行超音波處理。超音波處理之處理時間係根據銅粉分散液之狀態而選擇,較佳可為1~180分鐘,進而較佳為3~150分鐘,進而較佳為10~120分鐘,進而較佳為20~80分鐘。 In a preferred embodiment, the copper powder dispersion can be ultrasonically treated after mixing. The processing time of the ultrasonic treatment is selected according to the state of the copper powder dispersion, preferably from 1 to 180 minutes, more preferably from 3 to 150 minutes, further preferably from 10 to 120 minutes, and further preferably from 20 to 20 minutes. 80 minutes.

於較佳之實施態樣中,超音波處理可平均每100ml以較佳為50~600W、進而較佳為100~600W之功率進行。於較佳之實施態樣中,超音波處理可以較佳為10~1MHz,進而較佳為20~1MHZ,進而較佳為50~1MHz之頻率進行。 In a preferred embodiment, the ultrasonic treatment can be carried out on average at a power of preferably 50 to 600 W, and more preferably 100 to 600 W per 100 ml. In a preferred embodiment, the ultrasonic processing may preferably be 10 to 1 MHz, more preferably 20 to 1 MHz, and still preferably 50 to 1 MHz.

銅粉分散液中之銅粉可於以上述方式而受到利用胺基矽烷之表面處理後,自分散液中分離,回收獲得經表面處理之銅粉。該分離及回收可使用公知之方法,例如可使用過濾、離心分離、傾析法(decantation)等。繼分離回收之後,視需要可進行乾燥。乾燥可使用公知之方法,例如可藉由加熱而進行乾燥。加熱乾燥可藉由於例如50~90℃、60~80℃之溫度下,例如30~120分鐘、45~90分鐘之加熱處理而進行。繼加熱乾燥之後,可視需要進而對銅粉進行粉碎處理。又,對於回收所得之經表面處理之銅粉,為了防銹或提高糊劑中之分散性等目的,亦可進而使有機物等吸附於經表面處理之銅粉之表面。 The copper powder in the copper powder dispersion can be separated from the dispersion by surface treatment with an amino decane in the above manner, and the surface-treated copper powder can be recovered. A known method can be used for the separation and recovery, and for example, filtration, centrifugation, decantation, or the like can be used. After separation and recovery, drying can be carried out as needed. Drying can be carried out by a known method, for example, drying can be carried out by heating. The heat drying can be carried out by, for example, heat treatment at a temperature of 50 to 90 ° C and 60 to 80 ° C, for example, 30 to 120 minutes and 45 to 90 minutes. After heating and drying, the copper powder may be pulverized as needed. Further, for the purpose of preventing rust or improving the dispersibility in the paste, the surface-treated copper powder obtained may be further adsorbed on the surface of the surface-treated copper powder.

如上所述,於較佳之實施態樣中,供於表面處理之銅粉可使用藉由濕式法製造之銅粉。於較佳之實施態樣中,作為藉由濕式法製造之銅粉的製造方法,可使用以下述方法製造之銅粉,該方法包含下述步驟:於含有阿拉伯膠添加劑之水性溶劑中添加氧化亞銅而製作漿料之步驟;及將稀硫酸於5秒以內一次性地添加至漿料中而進行歧化反應之步驟。於較佳之實施態樣中,可將上述漿料保持為室溫(20~25℃)以下,並且添加同樣保持為室溫以下之稀硫酸而進行歧化反應。於較佳之實施態樣中,可將上述漿料保持為7℃以下,並且添加同樣保持為7℃以下之稀硫酸而進行歧化反應。於較佳之實施態樣中,稀硫酸之添加可以pH值為2.5以下,較佳 為pH值為2.0以下,進而較佳為pH值為1.5以下之方式而添加。於較佳之實施態樣中,漿料中之稀硫酸之添加可於5分鐘以內,較佳為1分鐘以內,進而較佳為30秒以內,進而較佳為10秒以內,進而較佳為5秒以內添加。於較佳之實施態樣中,上述歧化反應可於10分鐘內結束。於較佳之實施態樣中,上述漿料中之阿拉伯膠之濃度可為0.229~1.143g/L。作為上述氧化亞銅,可使用公知之方法中所使用之氧化亞銅,較佳為使用氧化亞銅粒子,該氧化亞銅粒子之粒徑等與藉由歧化反應而生成之銅粉之粒子的粒徑等並無直接關係,因此可使用粗粒之氧化亞銅粒子。該歧化反應之原理係如下所述:Cu2O+H2SO4 → Cu↓+CuSO4+H2O。 As described above, in the preferred embodiment, the copper powder for surface treatment can be made of copper powder produced by a wet method. In a preferred embodiment, as a method for producing copper powder produced by a wet method, copper powder produced by the following method may be used, which comprises the steps of: adding oxidation to an aqueous solvent containing an acacia additive; a step of preparing a slurry by cuprous copper; and a step of disproportionation reaction by adding dilute sulfuric acid to the slurry at a time within 5 seconds. In a preferred embodiment, the slurry may be kept at room temperature (20 to 25 ° C) or lower, and a disproportionation reaction may be carried out by adding dilute sulfuric acid which is also kept at room temperature or lower. In a preferred embodiment, the slurry may be maintained at 7 ° C or lower, and a disproportionation reaction may be carried out by adding dilute sulfuric acid which is also kept at 7 ° C or lower. In a preferred embodiment, the addition of dilute sulfuric acid may be carried out at a pH of 2.5 or less, preferably at a pH of 2.0 or less, and more preferably at a pH of 1.5 or less. In a preferred embodiment, the addition of dilute sulfuric acid in the slurry may be within 5 minutes, preferably within 1 minute, further preferably within 30 seconds, further preferably within 10 seconds, and further preferably 5 minutes. Added within seconds. In a preferred embodiment, the disproportionation reaction can be completed within 10 minutes. In a preferred embodiment, the concentration of gum arabic in the slurry may be from 0.229 to 1.143 g/L. As the cuprous oxide, cuprous oxide used in a known method can be used, and it is preferable to use cuprous oxide particles, the particle size of the cuprous oxide particles, and the like, and particles of copper powder formed by disproportionation reaction. Since the particle diameter and the like are not directly related, coarse-grained cuprous oxide particles can be used. The principle of the disproportionation reaction is as follows: Cu 2 O+H 2 SO 4 →Cu↓+CuSO 4 +H 2 O.

藉由該歧化而獲得之銅粉亦可視需要進行洗淨、防銹、過濾、乾燥、壓碎、分級,然後與胺基矽烷混合,但於較佳之實施態樣中,可於視需要進行洗淨、防銹、過濾後,不進行乾燥而直接與胺基矽烷水溶液混合。 The copper powder obtained by the disproportionation may also be washed, rustproof, filtered, dried, crushed, classified, and then mixed with an amino decane, but in a preferred embodiment, it may be washed as needed. After being cleaned, rustproof, and filtered, it is directly mixed with an aqueous solution of amino decane without drying.

於較佳之實施態樣中,藉由上述歧化反應而獲得之銅粉利用雷射繞射式粒度分佈測定裝置所測定的平均粒徑為0.25μm以下。於較佳之實施態樣中,藉由上述歧化反應而獲得之銅粉利用雷射繞射式粒度分佈測定裝置所測定的D10、D90、Dmax滿足[Dmax≦D50×3、D90≦D50×2、D10≧D50×0.5]之關係式,且粒徑之分佈具有單一之波峰。於較佳之實施態樣中,藉由上述歧化反應而獲得之銅粉於利用雷射繞射式粒度分佈測定裝置之測定中,粒度分佈為單峰(具有單一之波峰)。於較佳之實施態樣中,利用雷射繞射式粒度分佈測定裝置所測定的值為[D50≦1.5μm],較佳為[D50≦1.0μm],進而較佳為[D50≦0.5μm、Dmax≦1.0μm]。作為雷射繞射式粒 度分佈測定裝置,例如可使用島津製作所製造之SALD-2100。 In a preferred embodiment, the copper powder obtained by the disproportionation reaction has an average particle diameter of 0.25 μm or less as measured by a laser diffraction type particle size distribution measuring apparatus. In a preferred embodiment, the D10, D90, and Dmax of the copper powder obtained by the disproportionation reaction determined by the laser diffraction type particle size distribution measuring device satisfy [Dmax≦D50×3, D90≦D50×2. The relationship of D10 ≧ D50 × 0.5], and the distribution of the particle diameter has a single peak. In a preferred embodiment, the copper powder obtained by the above disproportionation reaction has a particle size distribution of a single peak (having a single peak) in the measurement using a laser diffraction type particle size distribution measuring apparatus. In a preferred embodiment, the value measured by the laser diffraction type particle size distribution measuring apparatus is [D50 ≦ 1.5 μm], preferably [D50 ≦ 1.0 μm], and further preferably [D50 ≦ 0.5 μm, Dmax ≦ 1.0 μm]. Laser diffraction type As the degree distribution measuring device, for example, SALD-2100 manufactured by Shimadzu Corporation can be used.

藉由本發明而獲得之經表面處理之銅粉具有優異之燒結延遲性。作為燒結延遲性之指標,有燒結開始溫度。其係指於還原性環境中使由金屬粉構成之壓粉體升溫,當產生一定程度之體積變化(收縮)時之溫度。於本發明中,將產生1%之體積收縮時之溫度作為燒結開始溫度。具體而言係如實施例中之記載般地進行測定。燒結開始溫度高,表示燒結延遲性優異。 The surface-treated copper powder obtained by the present invention has excellent sintering retardation. As an index of the sintering retardation, there is a sintering start temperature. It refers to the temperature at which the powder compact composed of the metal powder is heated in a reducing environment and when a certain volume change (shrinkage) occurs. In the present invention, a temperature at which a volume shrinkage of 1% is generated is taken as a sintering start temperature. Specifically, the measurement was carried out as described in the examples. The sintering start temperature is high, indicating that the sintering retardation is excellent.

於較佳之實施態樣中,本發明之經表面處理之銅粉之燒結開始溫度可為450℃以上,較佳為500℃以上,進而較佳為600℃以上,進而較佳為700℃以上,進而較佳為780℃以上,進而較佳為800℃以上,進而較佳為810℃以上,進而較佳為840℃以上,進而較佳為900℃以上,進而較佳為920℃以上,進而較佳為950℃以上。先前一直用於要求高燒結開始溫度之情形的Ni超微粉(平均粒徑為0.2~0.4μm)之燒結開始溫度為500~600℃之範圍,與此相比,本發明之經表面處理之銅粉係使用較Ni更廉價且易於獲取之Cu,為微細之粒子並且具有同等以上之優異之燒結延遲性。 In a preferred embodiment, the surface-treated copper powder of the present invention may have a sintering start temperature of 450 ° C or higher, preferably 500 ° C or higher, more preferably 600 ° C or higher, and still more preferably 700 ° C or higher. Further, it is preferably 780 ° C or higher, more preferably 800 ° C or higher, further preferably 810 ° C or higher, further preferably 840 ° C or higher, further preferably 900 ° C or higher, further preferably 920 ° C or higher, and further Good for 950 ° C or more. The surface-treated copper of the present invention is used in the range of 500 to 600 ° C of the conventional ultrafine powder (average particle diameter of 0.2 to 0.4 μm) which has been used for the case where a high sintering start temperature is required. The powder system uses Cu which is cheaper and more easily available than Ni, which is fine particles and has an excellent sintering retardation equivalent to or higher.

於較佳之實施態樣中,本發明之經表面處理之銅粉可使壓粉體於還原性環境中升溫而形成燒結體。所獲得之燒結體係形成為優異之電極。該燒結之製程尤其可較佳地用於製造晶片積層陶瓷電容器之內部電極。該燒結體尤其可較佳地用作晶片積層陶瓷電容器之內部電極。於較佳之實施態樣中,該燒結體可於其剖面存在較佳為直徑為10nm以上之SiO2。於較佳之實施態樣中,該燒結體可於其剖面以0.5個/μm2以下存在最大直 徑為0.5μm以上之SiO2,或者例如可以0.0~0.5個/μm2之範圍存在最大直徑為0.5μm以上之SiO2,例如以0.1~0.5個/μm2之範圍存在最大直徑為0.5μm以上之SiO2。該最大直徑係指SiO2粒子之最小外接圓之直徑。於本發明之較佳之實施態樣中,SiO2粒子之析出如此般被控制,而變得能形成極薄電極,同時不會使電極之可靠性(品質)降低。 In a preferred embodiment, the surface treated copper powder of the present invention allows the compact to be heated in a reducing environment to form a sintered body. The obtained sintering system was formed into an excellent electrode. The sintering process is particularly preferably used to fabricate internal electrodes of a wafer-stacked ceramic capacitor. The sintered body is particularly preferably used as an internal electrode of a wafer laminated ceramic capacitor. In a preferred embodiment, the sintered body may have SiO 2 having a diameter of 10 nm or more in its cross section. In a preferred embodiment, the sintered body may have SiO 2 having a maximum diameter of 0.5 μm or more in a cross section of 0.5/μm 2 or may have a maximum diameter of 0.5 in a range of 0.0 to 0.5 / μm 2 , for example. the above μm SiO 2, for example, present in the range of 0.1 to 0.5 / μm 2 or more of the maximum diameter of 0.5μm SiO 2. The maximum diameter refers to the diameter of the smallest circumscribed circle of the SiO 2 particles. In a preferred embodiment of the present invention, the precipitation of SiO 2 particles is controlled as such, and it becomes possible to form an extremely thin electrode without deteriorating the reliability (quality) of the electrode.

於較佳之實施態樣中,經表面處理之銅粉可設為相對於銅粉1g,Si之附著量一般為500~16000μg,較佳為500~3000μg。該Si附著量可藉由ICP(電感耦合電漿原子發射光譜分析法)而求出。於較佳之實施態樣中,可進而設為相對於銅粉重量含有0.05wt%以上之N。矽烷偶合劑吸附於銅粉之機制並不明確,本發明人認為係由於在矽烷偶合劑末端之胺基之氮與銅間發揮作用之相互作用而吸附。 In a preferred embodiment, the surface-treated copper powder may be set to 1 g with respect to the copper powder, and the adhesion amount of Si is generally 500 to 16,000 μg, preferably 500 to 3000 μg. The Si adhesion amount can be determined by ICP (Inductively Coupled Plasma Atomic Emission Spectrometry). In a preferred embodiment, it may be further set to contain 0.05% by weight or more of N based on the weight of the copper powder. The mechanism by which the decane coupling agent is adsorbed to the copper powder is not clear, and the inventors believe that it is adsorbed by the interaction between the nitrogen of the amine group at the end of the decane coupling agent and copper.

於較佳之實施態樣中,經表面處理之銅粉其藉由表面處理而形成之含Si層之厚度(Si厚度)通常可為0.6~25nm,較佳為1.0~25nm,進而較佳為1.5~20nm。本發明中之該含Si層之厚度(Si厚度)可規定為經表面處理之銅粉之表面的剖面中,將藉由EDS(能量分散型X射線分析)進行測定且將相對於全部原子Si原子之存在比為最大之深度的Si原子之存在量設為100%時,Si原子之存在量為10%以上之範圍。關於經表面處理之銅粉之表面的剖面,係自於試樣切片上觀察到的至少100個以上之銅粉粒子中選擇5個,分別將其最清晰之邊界作為經表面處理之銅粉之與表面垂直之剖面而進行測定及合計。 In a preferred embodiment, the surface-treated copper powder has a thickness (Si thickness) of the Si-containing layer formed by surface treatment, which is usually 0.6 to 25 nm, preferably 1.0 to 25 nm, and more preferably 1.5. ~20nm. The thickness (Si thickness) of the Si-containing layer in the present invention may be defined as a profile of the surface of the surface-treated copper powder, which will be measured by EDS (energy dispersive X-ray analysis) and will be relative to all atomic Si When the existence ratio of the Si atom having the largest depth is 100%, the amount of the Si atom present is in the range of 10% or more. Regarding the cross-section of the surface of the surface-treated copper powder, five of the at least 100 copper powder particles observed on the sample slice are selected as the surface-treated copper powder. The cross section perpendicular to the surface is measured and totaled.

於較佳之實施態樣中,經表面處理之銅粉其N相對於銅粉之重量%例如可為0.05重量%以上,較佳為0.06重量%以上,進而較佳為0.07 重量%以上,例如可為0.05~0.50重量%,較佳為0.06~0.45重量%,進而較佳為0.08~0.40重量%之範圍。N相對於銅粉之重量%係可使銅粉於高溫下熔融,根據所產生之NO2而算出N之附著量。 In a preferred embodiment, the surface-treated copper powder may have a weight % of N relative to the copper powder of, for example, 0.05% by weight or more, preferably 0.06% by weight or more, more preferably 0.07% by weight or more, for example, It is 0.05 to 0.50% by weight, preferably 0.06 to 0.45% by weight, and more preferably in the range of 0.08 to 0.40% by weight. The weight % of N relative to the copper powder allows the copper powder to be melted at a high temperature, and the amount of adhesion of N is calculated from the NO 2 produced.

於較佳之實施態樣中,經表面處理之銅粉於XPS(X射線光電子光譜)分析法之survey測定中,表面之N例如可為1.0%以上,較佳為1.4%以上,進而較佳為1.5%以上,進而較佳為1.6%以上,或者例如可在1.0~6.0%,較佳為1.4~6.0%,進而較佳為1.5~6.0%,進而較佳為1.6~6.0%之範圍內,N之光電子例如可為1000cps(count per second)以上,較佳為1200cps以上,或者例如可為1000~9000cps,較佳為1200~8000cps之範圍。 In a preferred embodiment, the surface-treated copper powder may have a surface N of, for example, 1.0% or more, preferably 1.4% or more, in a survey by XPS (X-ray photoelectron spectroscopy) analysis, and more preferably 1.5% or more, further preferably 1.6% or more, or may be, for example, 1.0 to 6.0%, preferably 1.4 to 6.0%, more preferably 1.5 to 6.0%, still more preferably 1.6 to 6.0%, The photoelectron of N may be, for example, 1000 cps (count per second) or more, preferably 1200 cps or more, or may be, for example, 1000 to 9000 cps, preferably 1200 to 8000 cps.

於較佳之實施態樣中,經表面處理之銅粉於XPS(X射線光電子光譜)分析法之survey測定中,表面之Si例如可為0.6%以上,較佳為0.8%以上,進而較佳為1.0%以上,進而較佳為1.1%以上,進而較佳為1.2%以上,進而較佳為1.3%以上,進而較佳為1.4%以上,或者例如可在0.6~4.0%,較佳為0.8~4.0%,進而較佳為1.0~4.0%,進而較佳為1.1~4.0%,進而較佳為1.2~4.0%,進而較佳為1.3~4.0%,進而較佳為1.4~4.0%之範圍內,關於Si之光電子,例如可為藉由對直徑800μm之圓進行照射(照射面積為502655μm2)而測定為1000cps(count per second)以上,較佳為1200cps以上,或者例如為1000~12000cps,較佳為1200~12000cps之範圍。 In a preferred embodiment, the surface-treated copper powder may have a surface Si of, for example, 0.6% or more, preferably 0.8% or more, in a survey by XPS (X-ray photoelectron spectroscopy) analysis, and more preferably 1.0% or more, further preferably 1.1% or more, further preferably 1.2% or more, further preferably 1.3% or more, further preferably 1.4% or more, or may be, for example, 0.6 to 4.0%, preferably 0.8 to 4.0%, further preferably 1.0 to 4.0%, further preferably 1.1 to 4.0%, further preferably 1.2 to 4.0%, further preferably 1.3 to 4.0%, and further preferably 1.4 to 4.0%. The photoelectron of Si can be measured to be 1000 cps (count per second) or more, preferably 1200 cps or more, or, for example, 1000 to 12,000 cps, by irradiating a circle having a diameter of 800 μm (irradiation area: 502655 μm 2 ). Good range of 1200~12000cps.

於較佳之實施態樣中,經表面處理之銅粉可於受到利用胺基矽烷之表面處理後,進而進行表面處理。作為此種表面處理,例如可列舉利用苯并三唑、咪唑等有機防銹劑之防銹處理,即便進行該等通常之處理,利用胺基矽烷所進行之表面處理亦不會產生脫離等情況。因此,本領 域技術人員可於不失去優異之燒結延遲性之限度內,視需要進行上述公知之表面處理。即,於不失去優異之燒結延遲性之限度內,對本發明之經表面處理之銅粉之表面進而進行表面處理而獲得之銅粉亦在本發明之範圍內。 In a preferred embodiment, the surface treated copper powder may be subjected to a surface treatment after being subjected to surface treatment with an amino decane. As such a surface treatment, for example, an rust-preventing treatment using an organic rust preventive agent such as benzotriazole or imidazole can be used, and even if these ordinary treatments are carried out, the surface treatment by the amino decane does not cause detachment or the like. . Therefore, the ability The skilled artisan can perform the above-described known surface treatment as needed without losing the excellent sintering retardation. Namely, it is also within the scope of the present invention to further obtain the copper powder obtained by subjecting the surface of the surface-treated copper powder of the present invention to surface treatment without losing the excellent sintering retardation.

於使用銅粉以外之金屬粉之情形時,本發明亦可藉由上述關於銅粉所記載之表面處理而獲得優異之特性。於使用銅粉以外之金屬粉之情形時,亦可藉由關於上述銅粉所記載之較佳之實施態樣而實施本發明。作為金屬粉,例如可使用Pt、Pd、Ag、Ni、Cu中之任一種金屬粉。包含銅粉在內,較佳之金屬粉可列舉Ag、Ni、Cu中之任一種金屬粉。 In the case of using a metal powder other than copper powder, the present invention can also obtain excellent characteristics by the surface treatment described above with respect to copper powder. In the case of using a metal powder other than copper powder, the present invention can also be carried out by the preferred embodiment described above with respect to the copper powder. As the metal powder, for example, any one of Pt, Pd, Ag, Ni, and Cu can be used. Preferred metal powders containing copper powder include any one of Ag, Ni, and Cu.

本發明可藉由Si之附著而如上所述般較佳地實施,亦可藉由Si以外之元素之附著而較佳地實施。於附著Si以外之元素之情形時,可藉由上述關於Si所記載之較佳實施態樣而實施本發明。作為Si以外之元素,可列舉Ti、Al、Zr、Ce、Sn中之任一種以上。包含Si在內,作為較佳之元素,可列舉Si、Ti、Al、Zr、Ce、Sn中之任一種以上,進而可較佳地列舉Si、Ti、Al中之任一種以上。 The present invention can be preferably carried out as described above by the adhesion of Si, and can be preferably carried out by adhesion of elements other than Si. In the case where an element other than Si is attached, the present invention can be carried out by the above-described preferred embodiment described in relation to Si. Examples of the element other than Si include any one of Ti, Al, Zr, Ce, and Sn. In addition, any one or more of Si, Ti, Al, Zr, Ce, and Sn may be mentioned as the preferable element, and any one or more of Si, Ti, and Al may be preferably used.

如上述中關於銅粉所說明般,本發明可藉由利用矽烷偶合劑進行表面處理而較佳地實施,但亦可藉由利用矽烷偶合劑以外之偶合劑進行表面處理而較佳地實施。作為矽烷偶合劑以外之偶合劑,可列舉鈦酸酯、鋁酸酯。於使用矽烷偶合劑作為偶合劑情形時,可較佳地使Si附著;使用鈦酸酯作為偶合劑之情形時,可較佳地使Ti附著;使用鋁酸酯作為偶合劑之情形時,可較佳地使Al附著。該等偶合劑之使用態樣可如上述中關於矽烷偶合劑所記載般。與矽烷偶合劑之結構同樣地,鈦酸酯及鋁酸酯之 結構亦較佳為末端含有胺基之取代基配位於中心原子Ti及Al的結構。 As described above with respect to the copper powder, the present invention can be preferably carried out by surface treatment with a decane coupling agent, but it can be preferably carried out by surface treatment with a coupling agent other than a decane coupling agent. Examples of the coupling agent other than the decane coupling agent include titanate and aluminate. When a decane coupling agent is used as a coupling agent, Si can be preferably attached; when a titanate is used as a coupling agent, Ti can be preferably attached; when an aluminate is used as a coupling agent, Preferably, Al is attached. The use of the coupling agents can be as described above for the decane coupling agent. As with the structure of the decane coupling agent, titanate and aluminate The structure is also preferably a structure in which a substituent having an amine group at the terminal is bonded to a central atom of Ti and Al.

於較佳之實施態樣中,利用此種偶合劑而附著之Si、Ti或Al之較佳附著量係如上述中關於銅粉所記載般,進而可列舉相對於金屬粉1g,例如為200~16000μg、300~16000μg、500~16000μg之範圍,例如為200~3000μg、300~3000μg、500~3000μg之範圍,例如為200~1500μg、300~1500μg、500~1500μg之範圍。 In a preferred embodiment, the preferred adhesion amount of Si, Ti or Al adhered by the coupling agent is as described above for the copper powder, and further, for example, 1 g with respect to the metal powder, for example, 200~ The range of 16000 μg, 300-16000 μg, and 500-16000 μg is, for example, in the range of 200 to 3000 μg, 300 to 3000 μg, and 500 to 3000 μg, for example, in the range of 200 to 1500 μg, 300 to 1500 μg, and 500 to 1500 μg.

於較佳之實施態樣中,金屬粉藉由表面處理而形成之含Si層之厚度(Si厚度)係如上述中關於銅粉所記載般,進而,含Ti層之厚度(Ti厚度)、含Al層之厚度(Al厚度)亦可設為如上述中關於含Si層之厚度(Si厚度)所記載般。 In a preferred embodiment, the thickness (Si thickness) of the Si-containing layer formed by the surface treatment of the metal powder is as described above for the copper powder, and further, the thickness of the Ti-containing layer (Ti thickness), including The thickness (Al thickness) of the Al layer may be as described above with respect to the thickness (Si thickness) of the Si-containing layer.

於較佳之實施態樣中,經表面處理之金屬粉於XPS(X射線光電子光譜)分析法之survey測定中的表面之Si可設為如上述中關於銅粉所記載般。進而,除藉由表面處理而附著之Si以外,對於Ti及Al,亦可設為藉由與Si相同之測定方法測定出與關於Si所規定之數值範圍相同之數值範圍。 In a preferred embodiment, the surface Si of the surface-treated metal powder in the Survey of XPS (X-ray photoelectron spectroscopy) analysis can be set as described above for the copper powder. Further, in addition to Si adhered by surface treatment, Ti and Al may be measured by the same measurement method as Si to the same numerical range as that specified for Si.

於較佳之實施態樣中,經表面處理之金屬粉於XPS(X射線光電子光譜)分析法之survey測定中的表面之N可設為如上述中關於銅粉所記載般。 In a preferred embodiment, the surface N of the surface-treated metal powder in the Survey of XPS (X-ray photoelectron spectroscopy) analysis can be set as described above for the copper powder.

作為本發明中可較佳地使用之鈦酸酯,可列舉以下述式II表示之含胺基之鈦酸酯:(H2N-R1-O)pTi(OR2)q (式II) As the titanate which can be preferably used in the present invention, an amine group-containing titanate represented by the following formula II: (H 2 NR 1 -O) p Ti(OR 2 ) q (Formula II)

(其中,上述式II中, R1為直鏈狀或具有支鏈之飽和或不飽和、經取代或未經取代、環式或非環式、具有雜環或不具有雜環之C1~C12之烴之二價基,R2為直鏈狀或具有支鏈之C1~C5之烷基,p及q為1~3之整數,p+q=4)。 (wherein, in the above formula II, R1 is a linear or branched or saturated, unsaturated or unsubstituted, cyclic or acyclic, divalent or heterocyclic group having a heterocyclic or non-heterocyclic C1 to C12 hydrocarbon, R2 is A linear or branched C1-C5 alkyl group, p and q are integers from 1 to 3, p+q=4).

作為上述式II之R1,可較佳地使用作為上述式I之R1所列舉之基。上述式II之R1例如可為選自以下述者所組成群中之基:-(CH2)n-、-(CH2)n-(CH)m-(CH2)j-1-、-(CH2)n-(CC)-(CH2)n-1-、-(CH2)n-NH-(CH2)m-、-(CH2)n-NH-(CH2)m-NH-(CH2)j-、-(CH2)n-1-(CH)NH2-(CH2)m-1-、-(CH2)n-1-(CH)NH2-(CH2)m-1-NH-(CH2)j-(其中,n、m、j為1以上之整數)。作為尤佳之R1,可列舉-(CH2)n-NH-(CH2)m-(其中,n+m=4,尤佳為n=m=2)。 As R1 of the above formula II, a group exemplified as R1 of the above formula I can be preferably used. R1 of the above formula II may be, for example, a group selected from the group consisting of -(CH 2 ) n -, -(CH 2 ) n -(CH) m -(CH 2 ) j-1 -, - (CH 2 ) n -(CC)-(CH 2 ) n-1 -, -(CH 2 ) n -NH-(CH 2 ) m -, -(CH 2 ) n -NH-(CH 2 ) m - NH-(CH 2 ) j -, -(CH 2 ) n-1 -(CH)NH 2 -(CH 2 ) m-1 -, -(CH 2 ) n-1 -(CH)NH 2 -(CH 2 ) m-1 -NH-(CH 2 ) j - (wherein n, m, j are integers of 1 or more). As a more preferable R1, -(CH 2 ) n -NH-(CH 2 ) m - (wherein n + m = 4, particularly preferably n = m = 2) can be cited.

作為上述式II之R2,可較佳地使用作為上述式I之R2所列舉之基。於較佳之實施態樣中,可列舉C3之烷基,尤佳可列舉丙基及異丙基。 As R2 of the above formula II, a group exemplified as R2 of the above formula I can be preferably used. In a preferred embodiment, an alkyl group of C3 may be mentioned, and a propyl group and an isopropyl group are particularly preferable.

上述式II之p及q為1~3之整數,p+q=4,可較佳地列舉p=q=2之組合、p=3且q=1之組合。作為以如此之方式配置官能基之含胺基之鈦酸酯,可列舉Plenact KR44(AJINOMOTO FINE-TECHNO公司製造)。 p and q of the above formula II are integers of 1 to 3, and p + q = 4, preferably a combination of p = q = 2, a combination of p = 3 and q = 1. Plenact KR44 (manufactured by AJINOMOTO FINE-TECHNO Co., Ltd.) is exemplified as the amine group-containing titanate in which the functional group is disposed in such a manner.

本發明之金屬粉如上述中關於本發明之銅粉所記載般具有高燒結開始溫度,藉由將其摻合可製造優異之導電性金屬粉糊劑,藉由燒結該導電性金屬粉糊劑可製造優異之電極。本發明之金屬粉之燒結開始溫度係如上述中關於銅粉之記載般。於較佳之實施態樣中,藉由本發明而 獲得之電極係如上述中關於電極剖面之SiO2所記載般,同樣地,關於電極剖面之TiO2、及/或電極剖面之Al2O3,亦可設為如上述中關於電極剖面之SiO2所述之大小、個數、密度。於較佳之實施態樣中,電極剖面之SiO2相當於使用矽烷偶合劑作為表面處理之偶合劑之情形,電極剖面之TiO2相當於使用鈦酸酯作為表面處理之偶合劑之情形,電極剖面之Al2O3相當於使用鋁酸酯作為表面處理之偶合劑之情形。 The metal powder of the present invention has a high sintering initiation temperature as described above in relation to the copper powder of the present invention, and by blending it, an excellent conductive metal powder paste can be produced by sintering the conductive metal powder paste. Excellent electrodes can be manufactured. The sintering start temperature of the metal powder of the present invention is as described above for the copper powder. In a preferred embodiment, the electrode obtained by the present invention is as described above for SiO 2 of the electrode cross section, and similarly to the TiO 2 of the electrode cross section and/or the Al 2 O 3 of the electrode cross section. It is also possible to set the size, the number, and the density as described above for the SiO 2 of the electrode cross section. In a preferred embodiment, the SiO 2 of the electrode profile corresponds to the case where a decane coupling agent is used as a coupling agent for the surface treatment, and the TiO 2 of the electrode profile corresponds to the case where the titanate is used as a coupling agent for the surface treatment, and the electrode profile Al 2 O 3 corresponds to the case where an aluminate is used as a coupling agent for surface treatment.

[實施例] [Examples]

以下,列舉實施例更詳細地對本發明進行說明。本發明並不限定於以下實施例。 Hereinafter, the present invention will be described in more detail by way of examples. The invention is not limited to the following examples.

[表面處理銅粉之製造] [Manufacture of surface treated copper powder]

以下述方式製造經表面處理之銅粉。 The surface treated copper powder was produced in the following manner.

[利用濕式法之製粉] [Using wet method for milling]

藉由濕式法而製造供於表面處理之銅粉20g。所獲得之銅粉具有如下所述之特性。測定係使用雷射繞射式粒度分佈測定裝置(島津製作所製造之SALD-2100)。 20 g of copper powder for surface treatment was produced by a wet method. The copper powder obtained has the characteristics as described below. For the measurement, a laser diffraction type particle size distribution measuring apparatus (SALD-2100 manufactured by Shimadzu Corporation) was used.

D50:0.12μm D50: 0.12μm

分佈:單峰 Distribution: single peak

[矽烷水溶液之製備] [Preparation of decane aqueous solution]

使用下述之各種矽烷分別製備矽烷水溶液50ml。 50 ml of an aqueous solution of decane was separately prepared using each of the following decanes.

矽烷:二胺基矽烷A-1120(MOMENTIVE公司製造) 矽: diamino decane A-1120 (manufactured by MOMENTIVE)

胺基矽烷A-1110(MOMENTIVE公司製造) Amino decane A-1110 (manufactured by MOMENTIVE)

環氧矽烷Z-6040(DOW CORNING TORAY公司製造) Epoxy decane Z-6040 (manufactured by DOW CORNING TORAY)

甲基三甲氧基矽烷KBM-13(SHIN-ETSU SILICONES公司製造) Methyltrimethoxydecane KBM-13 (manufactured by SHIN-ETSU SILICONES)

3-苯基胺基丙基三甲氧基矽烷(MOMENTIVE公司製造) 3-phenylaminopropyltrimethoxydecane (manufactured by MOMENTIVE)

關於濃度,係於0.5~15vol%之範圍內進行製備。又,除胺基系矽烷以外,均使用稀硫酸將pH值調整為4。 Regarding the concentration, the preparation was carried out in the range of 0.5 to 15 vol%. Further, the pH was adjusted to 4 using dilute sulfuric acid except for the amine decane.

各種矽烷之結構式如下。 The structural formula of various decanes is as follows.

二胺基矽烷A-1120:H2N-C2H4-NH-C3H6-Si(OCH3)3 Diaminodecane A-1120: H 2 NC 2 H 4 -NH-C 3 H 6 -Si(OCH 3 ) 3

胺基矽烷A-1110:H2N-C3H6-Si(OCH3)3 Amino decane A-1110: H 2 NC 3 H 6 -Si(OCH 3 ) 3

環氧矽烷Z-6040: Epoxy decane Z-6040:

甲基三甲氧基矽烷KBM-13:H3C-Si(OCH3)3 Methyltrimethoxydecane KBM-13:H 3 C-Si(OCH 3 ) 3

3-苯基胺基丙基三甲氧基矽烷:C6H5-NH-C3H6-Si(OCH3)3 3-phenylaminopropyltrimethoxydecane: C 6 H 5 -NH-C 3 H 6 -Si(OCH 3 ) 3

[藉由與矽烷水溶液混合而進行之表面處理] [Surface treatment by mixing with decane aqueous solution]

將銅粉20g與各矽烷水溶液50ml混合並進行攪拌,而製備銅粉分散液,立即進行60分鐘(或120分鐘)之超音波處理(TECH-JAM股份有限公司製造,超音波洗淨器,三頻型/W-113)(功率為100W,頻率為100kHz)。於表1中,將該60分鐘之所需時間記載為混合攪拌時間。操作係於室溫下進行。 20 g of copper powder and 50 ml of each decane aqueous solution were mixed and stirred to prepare a copper powder dispersion, which was immediately subjected to ultrasonic treatment for 60 minutes (or 120 minutes) (manufactured by TECH-JAM Co., Ltd., ultrasonic cleaner, three Frequency type / W-113) (power is 100W, frequency is 100kHz). In Table 1, the time required for the 60 minutes is described as the mixing and stirring time. The operation is carried out at room temperature.

又,如表1記載般,於幾個實施例中將利用旋轉葉片之攪拌混合 (300rpm)與上述超音波攪拌併用,或者僅藉由利用旋轉葉片之攪拌而使矽烷偶合劑吸附於銅粉。 Further, as described in Table 1, agitating mixing using rotating blades will be used in several embodiments. (300 rpm) was used in combination with the above-described ultrasonic agitation, or the decane coupling agent was adsorbed to the copper powder only by stirring with a rotating blade.

將銅粉分散液過濾而回收經表面處理之銅粉,於70℃下加熱乾燥1小時,獲得經表面處理之銅粉。 The copper powder dispersion was filtered to recover the surface-treated copper powder, and dried by heating at 70 ° C for 1 hour to obtain a surface-treated copper powder.

將各實施例及比較例之經表面處理之銅粉所進行的處理彙總於表1。 The treatments performed on the surface-treated copper powder of each of the examples and the comparative examples are summarized in Table 1.

[經表面處理之銅粉之評價] [Evaluation of surface treated copper powder]

藉由下述方法,對藉由上述操作而獲得之經表面處理之銅粉進行評價。 The surface-treated copper powder obtained by the above operation was evaluated by the following method.

[銅粉尺寸測定] [Measurement of copper powder size]

藉由下述手段對銅粉之大小進行測定。將其結果彙總於表2。 The size of the copper powder was measured by the following means. The results are summarized in Table 2.

雷射繞射式粒度分佈測定(島津製作所SLAD-2100) Laser diffraction type particle size distribution measurement (Shimadzu SLAD-2100)

[利用TMA之測定] [Measurement by TMA]

使用經表面處理之銅粉製作樣品,利用TMA(Thermomechanical Analyzer),於下述條件下測定燒結開始溫度。 A sample was prepared using the surface-treated copper powder, and the sintering start temperature was measured under the following conditions using a TMA (Thermomechanical Analyzer).

樣品製作條件 Sample preparation conditions

壓粉體尺寸:7mm×高度5mm Powder size: 7mm × height 5mm

成形壓力:1Ton/cm2(1000kg重/cm2) Forming pressure: 1Ton/cm 2 (1000kg weight/cm 2 )

(添加0.5wt%之硬脂酸鋅作為潤滑劑) (Adding 0.5% by weight of zinc stearate as a lubricant)

測定條件 Measuring condition

裝置:島津製作所TMA-50 Installation: Shimadzu Corporation TMA-50

升溫:5℃/min Heating: 5 ° C / min

環境:2vol%H2-N2(300cc/min) Environment: 2vol% H 2 -N 2 (300cc/min)

荷重:98.0mN Load: 98.0mN

如此,於測定對象之銅粉中添加0.5wt%之硬脂酸鋅並混合,將該混合物裝填於直徑7mm之筒體中,自上部壓入衝壓機而賦予1Ton/cm2且保持3秒之加壓,成形為高度約為5mm左右之圓柱狀。將該成形體於使軸為鉛垂方向且對軸方向賦予98.0mN之荷重之條件下,裝填於升溫爐內,於2vol%H2-N2(300cc/min)流量中,以升溫速度5℃/min、測定範圍:50~1000℃內連續地升溫,且自動記錄成形體之高度變化(膨脹、收縮之變化)。將成形體開始產生高度變化(收縮)且其收縮率達到1%時之溫度作為「燒結開始溫度」。將關於各實施例及比較例之經表面處理之銅粉的燒結開始溫度之測定結果彙總於表3。 Thus, 0.5 wt% of zinc stearate was added to the copper powder to be measured and mixed, and the mixture was packed in a cylinder having a diameter of 7 mm, and pressed into the press from the upper portion to give 1 Ton/cm 2 and hold for 3 seconds. Pressurized and formed into a cylindrical shape having a height of about 5 mm. The molded body was placed in a heating furnace under the condition that the shaft was placed in the vertical direction and the load was applied to the axial direction at a rate of 98.0 mN, and the temperature was increased at a rate of 5 vol% H 2 -N 2 (300 cc/min). °C/min, measurement range: continuous heating in 50~1000 °C, and automatically record the height change (change in expansion and contraction) of the molded body. The temperature at which the molded body starts to change in height (shrinkage) and the shrinkage ratio thereof reaches 1% is referred to as "sintering start temperature". The measurement results of the sintering start temperatures of the surface-treated copper powders of the respective examples and comparative examples are summarized in Table 3.

對於利用該TMA進行升溫而形成之各燒結體,藉由TEM觀察其剖面,將最大直徑為0.5μm以上之SiO2之個數計數。將所獲得之結果彙總於表3中。 The sintered body formed by raising the temperature by this TMA was observed by TEM, and the number of SiO 2 having a maximum diameter of 0.5 μm or more was counted. The results obtained are summarized in Table 3.

裝置:STEM Device: STEM

剖面TEM影像倍率:200000倍(20萬倍) Profile TEM image magnification: 200000 times (200,000 times)

[分析] [analysis]

於下述條件下對附著於經表面處理之銅粉之表面的Si、N進行分析。將其結果彙總於表3中。 Si and N attached to the surface of the surface-treated copper powder were analyzed under the following conditions. The results are summarized in Table 3.

表面N及表面Si:將銅粉0.5g填充於直徑為0.5mm之圓筒狀容器中,以無間隙地覆蓋之方式鋪滿底面。對鋪滿圓筒容器之銅粉之上面進行XPS survey測定。(附著於銅粉球體之上半部分之表面的N及Si之半定量分析) Surface N and surface Si: 0.5 g of copper powder was filled in a cylindrical container having a diameter of 0.5 mm, and the bottom surface was covered with a gap-free covering. The XPS survey was conducted on the top of the copper powder covered with a cylindrical container. (Semi-quantitative analysis of N and Si attached to the surface of the upper half of the copper powder sphere)

裝置:ULVAC-PHI公司製造之5600MC Device: 5600MC manufactured by ULVAC-PHI

極限真空度:5.7×10-9Torr Ultimate vacuum: 5.7×10 -9 Torr

激發源:單色化AlK α Excitation source: monochromatic AlK α

功率:210W Power: 210W

檢測面積:800μm Detection area: 800μm

入射角、取出角:45° Incident angle, take-out angle: 45°

使用中和槍 Use neutralizing gun

[對經表面處理之銅粉之防銹處理] [Anti-rust treatment of surface treated copper powder]

為了確認即便對上述實施例4中獲得之經表面處理之銅粉進而進行防銹處理後亦可維持本發明之燒結延遲性,進行以下實驗(實施例9)。 In order to confirm that the sintering delay of the present invention can be maintained even after the surface-treated copper powder obtained in the above Example 4 is subjected to the rust-preventing treatment, the following experiment (Example 9) was carried out.

[防銹處理之方法] [Method of anti-rust treatment]

獲得實施例4之銅粉後,為了進行防銹處理而使其分散於苯并三唑水溶液(0.1g/L)100mL中,藉由旋轉葉片以500rpm攪拌10分鐘,進行過濾、乾燥(氮環境下70℃×1h),獲得進而經防銹處理之銅粉(實施例9)。 After the copper powder of Example 4 was obtained, it was dispersed in 100 mL of a benzotriazole aqueous solution (0.1 g/L) for rust-preventing treatment, and stirred and rotated at 500 rpm for 10 minutes by a rotating blade to carry out filtration and drying (nitrogen environment). Under 70 ° C × 1 h), copper powder which was further subjected to rust prevention treatment (Example 9) was obtained.

[經防銹處理之銅粉之評價] [Evaluation of copper powder by anti-rust treatment]

以與上述實施例4相同之方式,對上述經防銹處理之銅粉進行評價,將其結果彙總於表1~3中。再者,關於實施例9,表2中之處理後之銅粉之尺寸為防銹處理後之銅粉之尺寸,表3之各評價亦為關於經防銹處理之銅粉之結果。 The rust-proof treated copper powder was evaluated in the same manner as in the above-described Example 4, and the results are summarized in Tables 1 to 3. Further, regarding Example 9, the size of the treated copper powder in Table 2 is the size of the copper powder after the rust-preventing treatment, and the evaluations in Table 3 are also the results regarding the rust-proof treated copper powder.

除了上述比較例1~4以外,使用四乙氧基矽烷(TEOS)作為矽烷偶合劑,使用氨作為觸媒而對銅粉進行表面處理,進行比較實驗,但於使用四乙氧基矽烷之情形時,所獲得之表面處理銅粉產生凝聚,形成為以肉眼觀察認為並未獲得均勻之表面處理及粒徑的狀態。於該情形時,表面處理前D50=0.13μm,Dmax=0.44μm,但表面處理後D50=0.87μm,Dmax=3.1μm,任一者均增大7倍左右。又,關於粒度分佈,表面處理前為單峰者變成雙峰。 In addition to the above Comparative Examples 1 to 4, tetraethoxy decane (TEOS) was used as a decane coupling agent, and copper powder was surface-treated with ammonia as a catalyst to carry out a comparative experiment, but in the case of using tetraethoxy decane At the time, the surface-treated copper powder obtained was agglomerated, and was formed into a state in which it was considered that the surface treatment and the particle diameter were not uniformly obtained by visual observation. In this case, D50 = 0.13 μm and Dmax = 0.44 μm before surface treatment, but D50 = 0.87 μm and Dmax = 3.1 μm after surface treatment, and either of them increased by about 7 times. Further, regarding the particle size distribution, a single peak before the surface treatment becomes a double peak.

作為代表例,將由實施例5之經表面處理之銅粉獲得的燒結體之剖面之TEM影像(4萬倍)示於圖1。白色部分為經燒結之銅,黑色部分為SiO2粒子。為SiO2粒子一事係另外進行EDS分析而確認。又,為將剖面拋光,對表面進行精密聚焦離子束(FIB)加工,獲得掃描式電子顯微鏡(SEM)照片,藉此對SiO2粒子數計數。 As a representative example, a TEM image (40,000 times) of the cross section of the sintered body obtained from the surface-treated copper powder of Example 5 is shown in Fig. 1 . The white portion is sintered copper and the black portion is SiO 2 particles. It was confirmed by separately performing EDS analysis for the SiO 2 particles. Further, in order to polish the cross section, the surface was subjected to precision focused ion beam (FIB) processing to obtain a scanning electron microscope (SEM) photograph, thereby counting the number of SiO 2 particles.

作為代表例,將實施例5之經表面處理之銅粉之表面的XPS survey測定結果示於圖2,將比較例2之經表面處理之銅粉之表面的XPS survey測定結果示於圖3。圖2中,於橫軸400eV附近觀察到表示表面之N之存在之波峰,但於圖3中,於對應之橫軸400eV附近未觀察到表示表面之N之存在之波峰。如此,於實施例5之經表面處理之銅粉之表面觀察到表示表面之N之存在量之波峰,另一方面,於比較例2之經表面處理之銅粉之表面未觀察到表示表面之N之存在量之波峰。 As a representative example, the results of XPS measurement of the surface of the surface-treated copper powder of Example 5 are shown in Fig. 2, and the results of XPS measurement of the surface of the surface-treated copper powder of Comparative Example 2 are shown in Fig. 3. In Fig. 2, a peak indicating the presence of N on the surface was observed in the vicinity of the horizontal axis 400eV, but in Fig. 3, no peak indicating the presence of N on the surface was observed in the vicinity of the corresponding horizontal axis 400eV. Thus, a peak indicating the amount of N present on the surface was observed on the surface of the surface-treated copper powder of Example 5, and on the other hand, no surface was observed on the surface of the surface-treated copper powder of Comparative Example 2. The peak of the amount of N.

根據該等結果,可知:本發明之混合胺基矽烷水溶液製造之經表面處理之銅粉儘管其製造方法極其簡易,儘管為尺寸微小之銅粉,但具有與由鎳合金獲得之微粉同等以上之高燒結開始溫度。又,可由該經表面處理之銅粉,藉由與晶片積層陶瓷電容器之電極之製造步驟相同的燒結而製造燒結體,以此種方式製造(形成)之燒結體儘管係使用上述經表面處理之銅粉,但於燒結體之剖面,大直徑(粒子之最小外接圓之直徑)之SiO2粒子之個數(個數/μm2)較少。 According to these results, it is understood that the surface-treated copper powder produced by the mixed amine decane aqueous solution of the present invention has an extremely simple method of production, and is a copper powder having a small size, but has the same level as the fine powder obtained from the nickel alloy. High sintering start temperature. Further, the surface-treated copper powder can be produced by sintering the same electrode as the electrode of the wafer-laminated ceramic capacitor, and the sintered body produced (formed) in this manner is used in the above-described surface treatment. Copper powder, but in the cross section of the sintered body, the number (number/μm 2 ) of SiO 2 particles having a large diameter (the diameter of the smallest circumscribed circle of the particles) is small.

又,根據上述結果,可知為了實現充分之燒結延遲性,需要使用具有胺基之胺基矽烷作為矽烷偶合劑。又,可知作為胺基矽烷,較佳為末端具有胺基之胺基矽烷。於比較例4中,雖然看似對銅粉附著有充分量之Si,但並未實現充分之燒結延遲性。其原因並不明確,但本發明人推測其原因可能在於:於比較例4中,胺基矽烷並未形成為末端具有胺基之結構,並且苯環存在於較胺基更末端,因此產生如立體阻礙般之狀態,於用以燒結之升溫中途,暫時附著於銅粉之胺基矽烷或Si於較早之時期即已自銅粉脫離。 Further, from the above results, it has been found that in order to achieve sufficient sintering retardation, it is necessary to use an amino group-containing decane having an amine group as a decane coupling agent. Further, it is understood that the amino decane is preferably an amino decane having an amine group at the terminal. In Comparative Example 4, although it appeared that a sufficient amount of Si was adhered to the copper powder, sufficient sintering retardation was not achieved. The reason for this is not clear, but the inventors speculate that the reason may be that, in Comparative Example 4, the aminodecane is not formed into a structure having an amine group at the terminal, and the benzene ring is present at the end of the amine group, thus producing In the state of steric hindrance, in the middle of the temperature rise for sintering, the amino decane or Si temporarily attached to the copper powder has been detached from the copper powder at an early stage.

又,根據上述實施例9之結果,可知:本發明之經表面處理之銅粉即便在受到利用胺基矽烷之表面處理後,進而進行防銹處理等表面處理,亦可維持其優異之性質。即,對本發明之經表面處理之銅粉之表面,於利用胺基矽烷所進行之表面處理不會脫離等之範圍內進而利用有機物等進行表面處理而獲得的銅粉亦在本發明之範圍內。 Further, according to the results of the above-described Example 9, it is understood that the surface-treated copper powder of the present invention can maintain its excellent properties even after being subjected to surface treatment with an amine-based decane and further subjected to a surface treatment such as rust-preventing treatment. In other words, it is also within the scope of the present invention that the surface of the surface-treated copper powder of the present invention is obtained by surface treatment with an organic substance or the like in a range in which the surface treatment by the amino decane is not removed or the like. .

[製造例] [Manufacturing example]

如下所述,製造微細之銅粉,進而利用胺基矽烷對所製造之銅粉進行表面處理,藉此一貫地利用濕式法製造本發明之經表面處理之銅粉。 As described below, fine copper powder is produced, and the copper powder produced is surface-treated with an amino decane, whereby the surface-treated copper powder of the present invention is consistently produced by a wet method.

(1)於阿拉伯膠0.2g+純水350mL中添加氧化亞銅50g。 (1) 50 g of cuprous oxide was added to 0.2 g of gum arabic and 350 mL of pure water.

(2)繼而,一次性地添加稀硫酸(25wt%)50mL。 (2) Then, 50 mL of dilute sulfuric acid (25 wt%) was added in one portion.

(3)藉由旋轉葉片將其攪拌後(300rpm×10分鐘),放置60分鐘。 (3) After stirring it by rotating blades (300 rpm x 10 minutes), it was allowed to stand for 60 minutes.

(4)繼而,對沈澱進行洗淨。 (4) Then, the precipitate is washed.

洗淨係藉由如下方式而進行:首先去除上清液,添加純水350mL並進行攪拌(300rpm×10分鐘)後,放置60分鐘,去除上清液,添加純水350mL並進行攪拌(300rpm×10分鐘)後,放置60分鐘,去除上清液。 The washing was carried out by first removing the supernatant, adding 350 mL of pure water, stirring (300 rpm × 10 minutes), leaving it for 60 minutes, removing the supernatant, and adding 350 mL of pure water and stirring (300 rpm × After 10 minutes), leave for 60 minutes and remove the supernatant.

(5)繼而,進行胺基矽烷處理。 (5) Subsequently, treatment with an amino decane was carried out.

胺基矽烷處理係添加胺基矽烷水溶液(50mL)並攪拌60分鐘,此時進行旋轉葉片(300rpm)+超音波(TECH-JAM股份有限公司製造,超音波洗淨器三頻型/W-113)(功率為100W,頻率為100kHz)之處理。除此以外,另外進行僅利用旋轉葉片(300rpm)之處理、僅利用超音波之處理。作為胺基矽烷,分別使用二胺基矽烷A-1120(MOMENTIVE公司製造)、及胺基矽烷A-1110(MOMENTIVE公司製造)。 Amino decane treatment was carried out by adding an aqueous solution of amino decane (50 mL) and stirring for 60 minutes, at which time a rotating blade (300 rpm) + ultrasonic wave (manufactured by TECH-JAM Co., Ltd., ultrasonic cleaner three-frequency type / W-113) was used. ) (power is 100W, frequency is 100kHz). In addition to this, processing using only rotating blades (300 rpm) and processing using only ultrasonic waves were performed. As the amino decane, diaminodecane A-1120 (manufactured by MOMENTIVE Co., Ltd.) and amino decane A-1110 (manufactured by MOMENTIVE Co., Ltd.) were used.

(6)繼而,進行過濾,分離沈澱。 (6) Subsequently, filtration was carried out to separate the precipitate.

(7)繼而,將所分離之沈澱乾燥。乾燥(70℃×2h)係分別進行大氣環境下之乾燥、及氮中之乾燥。 (7) The separated precipitate is then dried. Drying (70 ° C × 2 h) was carried out in an air atmosphere and drying in nitrogen.

如此,藉由一貫製造而獲得經表面處理之微細銅粉。如此而獲得之經表面處理之銅粉與上述實施例1~9之經表面處理之銅粉同樣地具有優異之燒結延遲性,同時其燒結體剖面所存在之SiO2之大粒子數較少。又,該一貫製造可於獲得最終製品之前無需進行乾燥地進行,簡便且作業性優異。 Thus, the surface-treated fine copper powder is obtained by consistent production. The surface-treated copper powder thus obtained has excellent sintering retardation similarly to the surface-treated copper powders of the above-described Examples 1 to 9, and the number of large particles of SiO 2 present in the cross section of the sintered body is small. Moreover, this consistent production can be carried out without drying before obtaining the final product, and is simple and excellent in workability.

[實施例] [Examples]

除上述中已說明之實施例以外,列舉以下實施例更詳細地對本發明進行說明。本發明並不限定於以下實施例。 In addition to the embodiments described above, the present invention will be described in more detail by way of the following examples. The invention is not limited to the following examples.

[金屬粉] [metal powder]

以下述順序準備銅微粉、鎳粉、銀粉作為金屬粉。 Copper fine powder, nickel powder, and silver powder were prepared as metal powder in the following order.

(銅微粉) (copper powder) .實施例15~17、比較例9 . Examples 15 to 17, Comparative Example 9

藉由上述濕式法製造供於表面處理之銅粉20g。即, 20 g of copper powder for surface treatment was produced by the above wet method. which is,

(1)於阿拉伯膠0.4g+純水350mL中添加氧化亞銅50g。 (1) 50 g of cuprous oxide was added to 0.5 g of gum arabic + 350 mL of pure water.

(2)繼而,一次性地添加稀硫酸(25wt%)50mL。 (2) Then, 50 mL of dilute sulfuric acid (25 wt%) was added in one portion.

(3)藉由旋轉葉片將其攪拌後(300rpm×10分鐘),放置60分鐘。 (3) After stirring it by rotating blades (300 rpm x 10 minutes), it was allowed to stand for 60 minutes.

(4)繼而,對沈澱進行洗淨。 (4) Then, the precipitate is washed.

洗淨係首先去除上清液,添加純水350mL並攪拌(300rpm×10分)後,放置60分鐘,去除上清液,添加純水350mL並攪拌(300rpm×10分鐘)後, 放置60分鐘,使銅微粉沈澱。於該狀態下藉由雷射繞射式粒度分佈測定(島津製作所SLAD-2100)進行粒度測定,作為表面處理前之粒度測定。 The washing system first removes the supernatant, adds 350 mL of pure water, and stirs (300 rpm × 10 minutes), and then left for 60 minutes, removes the supernatant, and adds 350 mL of pure water and stirs (300 rpm × 10 minutes). It was allowed to stand for 60 minutes to precipitate copper fine powder. In this state, particle size measurement was carried out by laser diffraction type particle size distribution measurement (Shimadzu Corporation SLAD-2100), and the particle size measurement before surface treatment was performed.

將所獲得之銅粉之粒子尺寸(D50、Dmax)示於表3。測定係使用雷射繞射式粒度分佈測定裝置(島津製作所製造之SALD-2100)。 The particle size (D50, Dmax) of the obtained copper powder is shown in Table 3. For the measurement, a laser diffraction type particle size distribution measuring apparatus (SALD-2100 manufactured by Shimadzu Corporation) was used.

.實施例10 . Example 10

依照日本專利第4164009號公報,藉由化學還原法而獲得銅粉。即,將阿拉伯膠2g添加至2900mL之純水中後,添加硫酸銅125g,一面攪拌一面添加80%肼一水合物360mL。添加肼一水合物後歷時3小時自室溫升溫至60℃,再歷時3小時使氧化銅進行反應。反應結束後,藉由布氏漏斗(Nutsche)將所獲得之漿料過濾,繼而藉由純水及甲醇進行洗淨,進而將其乾燥而獲得銅粉。以實施例1之順序將該銅粉與二胺基矽烷偶合劑水溶液混合,獲得表面處理銅粉。以實施例1之順序對其特性進行評價。 Copper powder is obtained by a chemical reduction method in accordance with Japanese Patent No. 4164009. Specifically, 2 g of gum arabic was added to 2900 mL of pure water, and then 125 g of copper sulfate was added, and 360 mL of 80% hydrazine monohydrate was added while stirring. After the addition of the hydrazine monohydrate, the temperature was raised from room temperature to 60 ° C over a period of 3 hours, and the copper oxide was further reacted for 3 hours. After completion of the reaction, the obtained slurry was filtered by a Buchner funnel (Nutsche), followed by washing with pure water and methanol, and further dried to obtain copper powder. The copper powder was mixed with an aqueous solution of a diamine decane coupling agent in the order of Example 1 to obtain a surface-treated copper powder. The characteristics were evaluated in the order of Example 1.

(鎳粉) (nickel powder)

鎳粉係使用TOHO TITANIUM製造之NF32(D50為0.3μm)。 As the nickel powder, NF32 (D50 of 0.3 μm) manufactured by TOHO TITANIUM was used.

(銀粉) (silver powder)

依照日本專利特開2007-291513製粉。即,使硝酸銀12.6g溶解於0.8L之純水中,添加25%氨水24mL,進而添加硝酸銨40g,製備銀胺錯鹽水溶液。於其中以1g/L之比例添加明膠,將其作為電解液,陽極、陰極均使用DSE極板,於電流密度200A/m2、溶液溫度20℃下進行電解,一面將電沈積之銀粒子自極板刮落,一面進行1小時電解。將以此種方式獲得之銀粉藉由布氏漏斗過濾,依序以純水、乙醇洗淨,於70℃下、大氣環境下乾燥12小時。對該銀粉進行乾式分級,最終獲得D50為0.1μm,Dmax為0.5μm 之銀粉。 Powdering according to Japanese Patent Laid-Open No. 2007-291513. Specifically, 12.6 g of silver nitrate was dissolved in 0.8 L of pure water, 24 mL of 25% ammonia water was added, and 40 g of ammonium nitrate was further added to prepare an aqueous solution of a silveramine wrong salt. Gelatin was added in a ratio of 1 g/L, and this was used as an electrolyte. Both the anode and the cathode were subjected to electrolysis at a current density of 200 A/m 2 and a solution temperature of 20 ° C, and the electrodeposited silver particles were self-deposited. The plates were scraped off and electrolyzed for 1 hour. The silver powder obtained in this manner was filtered through a Buchner funnel, washed successively with pure water and ethanol, and dried at 70 ° C for 12 hours under an atmosphere. The silver powder was subjected to dry classification to finally obtain a silver powder having a D50 of 0.1 μm and a Dmax of 0.5 μm.

(偶合劑水溶液之製備) (Preparation of coupling agent aqueous solution)

使用下述各種矽烷分別製備矽烷水溶液50ml。 50 ml of an aqueous solution of decane was separately prepared using various decanes described below.

矽烷:二胺基矽烷A-1120(MOMENTIVE公司製造) 矽: diamino decane A-1120 (manufactured by MOMENTIVE)

甲基三甲氧基矽烷KBM-13(SHIN-ETSU SILICONES公司製造) Methyltrimethoxydecane KBM-13 (manufactured by SHIN-ETSU SILICONES)

鈦酸酯:含有胺基之Plenact KR44(AJINOMOTO FINE-TECHNO公司製造) Titanate: Plenact KR44 containing an amine group (manufactured by AJINOMOTO FINE-TECHNO)

不含有胺基之Plenact KR TTS(AJINOMOTO FINE-TECHNO公司製造) Plenact KR TTS (manufactured by AJINOMOTO FINE-TECHNO Co., Ltd.) which does not contain an amine group

關於濃度,係於1~10vol%之範圍內製備。又,除胺基系偶合劑以外,均使用稀硫酸將pH值調整為4。 The concentration is prepared in the range of 1 to 10 vol%. Further, the pH was adjusted to 4 using dilute sulfuric acid except for the amine-based coupling agent.

各種矽烷之結構式如下。 The structural formula of various decanes is as follows.

二胺基矽烷A-1120:H2N-C2H4-NH-C3H6-Si(OCH3)3 Diaminodecane A-1120: H 2 NC 2 H 4 -NH-C 3 H 6 -Si(OCH 3 ) 3

甲基三甲氧基矽烷KBM-13:H3C-Si(OCH3)3 Methyltrimethoxydecane KBM-13:H 3 C-Si(OCH 3 ) 3

含有胺基之Plenact KR44 Amine-containing Plenact KR44

疏水基之側鏈有機官能基 Side chain organic functional group

(CH3)2CH-O- (CH 3 ) 2 CH-O-

親水基之側鏈有機官能基 Hydrophilic side chain organic functional group

-O-(C2H4)-NH-(C2H4)-NH2 -O-(C 2 H 4 )-NH-(C 2 H 4 )-NH 2

不含有胺基之Plenact KR TTS Plenact KR TTS without amine groups

疏水基之側鏈有機官能基 Side chain organic functional group

(CH3)2CH-O- (CH 3 ) 2 CH-O-

親水基之側鏈有機官能基 Hydrophilic side chain organic functional group

-O-CO-(C17H35) -O-CO-(C 17 H 35 )

(表面處理) (surface treatment)

自藉由上述(銅微粉)順序而獲得之銅微粉漿料中去除上清液,不將銅微粉乾燥而利用下述任一方法與上述(偶合劑水溶液之製備)中所製備之偶合劑混合60分鐘(實施例15~17、比較例9)。 The supernatant is removed from the copper micropowder slurry obtained by the above (copper micropowder) sequence, and the copper micropowder is not dried, and is mixed with the coupling agent prepared in the above (preparation of the coupling agent aqueous solution) by any of the following methods. 60 minutes (Examples 15 to 17, Comparative Example 9).

(1)旋轉葉片(300rpm)+超音波(TECH-JAM股份有限公司製造,超音波洗淨器三頻型/W-113)(功率為100W,頻率為100kHz) (1) Rotating blade (300 rpm) + ultrasonic (manufactured by TECH-JAM Co., Ltd., ultrasonic cleaner three-frequency type / W-113) (power is 100 W, frequency is 100 kHz)

(2)僅旋轉葉片(300rpm) (2) Rotate the blade only (300 rpm)

(3)僅超音波 (3) Ultrasonic only

繼而,利用抽吸器將該等偶合劑水溶液分別進行抽吸過濾後,於銅微粉上添加純水350mL,進而進行過濾。將其於氮環境下、以70℃乾燥1小時,用研缽粉碎。於該狀態下再次進行粒度測定。 Then, the coupler aqueous solutions were separately suction-filtered by an aspirator, and then 350 mL of pure water was added to the copper fine powder, followed by filtration. This was dried at 70 ° C for 1 hour in a nitrogen atmosphere and pulverized in a mortar. The particle size measurement was performed again in this state.

關於實施例10,係如上述(銅微粉)所記載般,藉由上述(1)之順序而進行表面處理。 In Example 10, the surface treatment was carried out in the order of the above (1) as described in the above (copper powder).

關於上述(鎳粉)中所獲得之鎳粉、以上述(銀粉)順序而獲得之銀粉,係藉由上述(1)之順序與上述(偶合劑水溶液之製備)中所製備之偶合劑混合60分鐘,而進行表面處理(實施例11~14及18~23、比較例6、8、10、11)。 The nickel powder obtained in the above (nickel powder) and the silver powder obtained in the above (silver powder) order are mixed with the coupling agent prepared in the above (preparation of a coupling agent aqueous solution) by the above procedure (1). The surface treatment was carried out in minutes (Examples 11 to 14 and 18 to 23, and Comparative Examples 6, 8, 10, and 11).

將所獲得之結果示於下述表4~6。 The results obtained are shown in Tables 4 to 6 below.

如上所述,可知根據本發明,於使用銅粉以外之金屬粉之情形時,又,於使用矽烷偶合劑以外之偶合劑之情形時,亦可獲得具有優異特性之經表面處理之金屬粉。 As described above, according to the present invention, in the case of using a metal powder other than copper powder, and in the case of using a coupling agent other than a decane coupling agent, a surface-treated metal powder having excellent characteristics can be obtained.

[產業上之可利用性] [Industrial availability]

本發明係提供一種經表面處理之銅粉,其於表面處理後亦不會凝聚,燒結延遲性優異,即便為小粒子之銅粉,亦顯示高燒結開始溫度。本發明之經表面處理之銅粉可藉由對銅粉進行非常簡單之處理而製造,該製造方法無需高度之技能,作業性及生產性優異。本發明係於產業上有用之發明。 The present invention provides a surface-treated copper powder which does not aggregate after surface treatment, and which is excellent in sintering retardation, and exhibits a high sintering onset temperature even in the case of copper particles of small particles. The surface-treated copper powder of the present invention can be produced by very simple treatment of copper powder, and the manufacturing method does not require a high degree of skill, and is excellent in workability and productivity. The present invention is an industrially useful invention.

Claims (43)

一種經表面處理之金屬粉,其於XPS之survey測定中,檢測出N之光電子為1000cps(count per second)以上,且檢測出Ti、Al、Si、Zr、Ce、Sn之任一者的光電子為1000cps以上。 A surface-treated metal powder in which a photoelectron of N is detected above 1000 cps (count per second) in a survey of XPS, and photoelectrons of any of Ti, Al, Si, Zr, Ce, and Sn are detected. It is above 1000cps. 一種經表面處理之金屬粉,其於XPS之survey測定中,檢測出表面之N為1%以上,且檢測出Ti、Al、Si、Zr、Ce、Sn之任意一種以上為0.6%以上。 A surface-treated metal powder having a surface N of 1% or more is detected in a survey of XPS, and any one or more of Ti, Al, Si, Zr, Ce, and Sn is detected to be 0.6% or more. 如申請專利範圍第1或2項之經表面處理之金屬粉,其於XPS之survey測定中,檢測出表面之N為1%以上,且檢測出Si、Ti或Al為0.6%以上。 The surface-treated metal powder according to the first or second aspect of the patent application is found to have a surface N of 1% or more and an average of 0.6% or more of Si, Ti or Al detected in the Survey of XPS. 如申請專利範圍第1或2項之金屬粉,其於XPS之survey測定中,檢測出表面之N為1%以上,檢測出N之光電子為1000cps(count per second)以上,且檢測出Si或Ti為0.6%以上,檢測出Si、Ti或Al之光電子為1000cps以上。 For the metal powder of claim 1 or 2, in the survey of XPS, the surface N is detected to be 1% or more, and the photoelectron of N is detected to be 1000 cps (count per second) or more, and Si or Ti is 0.6% or more, and photoelectrons of Si, Ti or Al are detected to be 1000 cps or more. 如申請專利範圍第1或2項之金屬粉,其中,金屬粉為Cu、Pt、Pd、Ag、Ni中之任一種金屬粉。 The metal powder according to claim 1 or 2, wherein the metal powder is any one of Cu, Pt, Pd, Ag, and Ni. 如申請專利範圍第1或2項之金屬粉,其中,金屬粉為銅粉。 The metal powder according to claim 1 or 2, wherein the metal powder is copper powder. 如申請專利範圍第1或2項之金屬粉,其藉由偶合劑處理而吸附有Ti、Al、Si、Zr、Ce、Sn之任意一種以上。 The metal powder according to claim 1 or 2, wherein at least one of Ti, Al, Si, Zr, Ce, and Sn is adsorbed by a coupling agent treatment. 如申請專利範圍第7項之金屬粉,其中,偶合劑為矽烷、鈦酸酯、鋁酸酯之任一者。 The metal powder according to claim 7, wherein the coupling agent is any one of decane, titanate or aluminate. 如申請專利範圍第8項之金屬粉,其係經末端為胺基之偶合劑處理過者。 The metal powder of claim 8 is treated with a coupling agent having an amine group at the end. 如申請專利範圍第1或2項之金屬粉,其中,金屬粉為經矽烷偶合劑進 行過表面處理之金屬粉。 For example, the metal powder of claim 1 or 2, wherein the metal powder is a decane coupling agent. Metal powder that has been surface treated. 如申請專利範圍第10項之金屬粉,其中,矽烷偶合劑為胺基矽烷。 The metal powder of claim 10, wherein the decane coupling agent is an amino decane. 如申請專利範圍第1或2項之金屬粉,其燒結開始溫度為400℃以上。 The metal powder according to claim 1 or 2 has a sintering start temperature of 400 ° C or higher. 如申請專利範圍第11項之金屬粉,其中,胺基矽烷為單胺基矽烷或二胺基矽烷。 The metal powder according to claim 11, wherein the amino decane is monoamino decane or diamino decane. 一種經表面處理之金屬粉,其係申請專利範圍第1至13項中任一項之金屬粉進一步經有機化合物進行表面處理而成者。 A surface-treated metal powder obtained by further surface-treating a metal powder according to any one of claims 1 to 13 with an organic compound. 一種導電性金屬粉糊劑,其係使用有申請專利範圍第1至14項中任一項之金屬粉者。 A conductive metal powder paste using the metal powder of any one of claims 1 to 14. 一種晶片積層陶瓷電容器,其係使用申請專利範圍第15項之糊劑而製造者。 A wafer-stacked ceramic capacitor manufactured by using the paste of claim 15 of the patent application. 如申請專利範圍第16項之晶片積層陶瓷電容器,其中,於內部電極剖面存在直徑為10nm以上之SiO2、TiO2或Al2O3A wafer-stacked ceramic capacitor according to claim 16, wherein SiO 2 , TiO 2 or Al 2 O 3 having a diameter of 10 nm or more is present in the internal electrode cross section. 如申請專利範圍第16或17項之晶片積層陶瓷電容器,其中,於內部電極剖面以0.5個/μm2以下存在最大直徑為0.5μm以上之SiO2、TiO2或Al2O3The wafer-stacked ceramic capacitor according to claim 16 or 17, wherein SiO 2 , TiO 2 or Al 2 O 3 having a maximum diameter of 0.5 μm or more is present in the internal electrode cross section at 0.5/μm 2 or less. 一種多層基板,其係將申請專利範圍第16至18項中任一項之晶片積層陶瓷電容器構裝於最外層者。 A multilayer substrate which is constructed by laminating a wafer laminated ceramic capacitor according to any one of claims 16 to 18. 一種多層基板,其係將申請專利範圍第16至18項中任一項之晶片積層陶瓷電容器構裝於內層者。 A multilayer substrate which is constructed by laminating a wafer-layered ceramic capacitor according to any one of claims 16 to 18. 一種電子零件,其係搭載有申請專利範圍第19或20項之多層基板者。 An electronic component mounted on a multilayer substrate of claim 19 or 20. 一種製造經表面處理之金屬粉之方法,其包含將金屬粉與偶合劑水溶液 混合而製備金屬粉分散液之步驟。 A method for producing a surface treated metal powder comprising a metal powder and a coupling agent aqueous solution The step of preparing a metal powder dispersion by mixing. 如申請專利範圍第22項之方法,其中,金屬粉為Cu、Pt、Pd、Ag、Ni中之任一種金屬粉。 The method of claim 22, wherein the metal powder is any one of Cu, Pt, Pd, Ag, and Ni. 如申請專利範圍第22項之方法,其中,金屬粉為銅粉。 The method of claim 22, wherein the metal powder is copper powder. 如申請專利範圍第22至24項中任一項之方法,其包含攪拌金屬粉分散液之步驟。 The method of any one of claims 22 to 24, which comprises the step of agitating the metal powder dispersion. 如申請專利範圍第22至24項中任一項之方法,其包含對金屬粉分散液進行超音波處理之步驟。 The method of any one of claims 22 to 24, which comprises the step of ultrasonically treating the metal powder dispersion. 如申請專利範圍第26項之方法,其中,進行超音波處理之步驟為進行1~180分鐘超音波處理之步驟。 The method of claim 26, wherein the step of performing ultrasonic processing is the step of performing ultrasonic processing for 1 to 180 minutes. 如申請專利範圍第22至24項中任一項之方法,其包含下述步驟:將金屬粉分散液過濾而回收金屬粉之步驟;及將過濾回收之金屬粉乾燥而獲得經表面處理之金屬粉之步驟。 The method of any one of claims 22 to 24, comprising the steps of: filtering a metal powder dispersion to recover metal powder; and drying the filtered metal powder to obtain a surface-treated metal The step of powder. 如申請專利範圍第28項之方法,其中,乾燥係於氧環境或惰性環境下進行。 The method of claim 28, wherein the drying is carried out in an oxygen atmosphere or an inert environment. 如申請專利範圍第22至24項中任一項之方法,其中,金屬粉分散液相對於銅粉1g含有偶合劑0.025g以上。 The method according to any one of claims 22 to 24, wherein the metal powder dispersion liquid phase contains 0.025 g or more of a coupling agent for 1 g of copper powder. 如申請專利範圍第22至24項中任一項之方法,其中,偶合劑水溶液為以下述式I表示之胺基矽烷的水溶液:H2N-R1-Si(OR2)2(R3) (式I)(其中,該式I中,R1為直鏈狀或具有支鏈之飽和或不飽和、經取代或未經取代、環式 或非環式、具有雜環或不具有雜環之C1~C12之烴的二價基,R2為C1~C5之烷基,R3為C1~C5之烷基或C1~C5之烷氧基)。 The method of any one of claims 22 to 24, wherein the aqueous solution of the coupling agent is an aqueous solution of an amino decane represented by the following formula I: H 2 NR 1 -Si(OR 2 ) 2 (R 3 ) ( Formula I) (wherein, in the formula I, R1 is a linear or branched saturated or unsaturated, substituted or unsubstituted, cyclic or acyclic, C1 having a heterocyclic ring or a heterocyclic ring a divalent group of a hydrocarbon of -C12, R2 is an alkyl group of C1 to C5, and R3 is an alkyl group of C1 to C5 or an alkoxy group of C1 to C5. 如申請專利範圍第31項之方法,其中,R1為選自由下述者組成之群中的基:-(CH2)n-、-(CH2)n-(CH)m-(CH2)j-1-、-(CH2)n-(CC)-(CH2)n-1-、-(CH2)n-NH-(CH2)m-、-(CH2)n-NH-(CH2)m-NH-(CH2)j-、-(CH2)n-1-(CH)NH2-(CH2)m-1-、-(CH2)n-1-(CH)NH2-(CH2)m-1-NH-(CH2)j-(其中,n、m、j為1以上之整數)。 The method of claim 31, wherein R1 is a group selected from the group consisting of: -(CH 2 ) n -, -(CH 2 ) n -(CH) m -(CH 2 ) J-1 -, -(CH 2 ) n -(CC)-(CH 2 ) n-1 -, -(CH 2 ) n -NH-(CH 2 ) m -, -(CH 2 ) n -NH- (CH 2 ) m -NH-(CH 2 ) j -, -(CH 2 ) n-1 -(CH)NH 2 -(CH 2 ) m-1 -, -(CH 2 ) n-1 -(CH NH 2 -(CH 2 ) m-1 -NH-(CH 2 ) j - (wherein n, m, j are integers of 1 or more). 如申請專利範圍第22至24項中任一項之方法,其中,偶合劑水溶液為以下述式II表示之含胺基之鈦酸酯的水溶液:(H2N-R1-O)PTi(OR2)q (式II)(其中,該式II中,R1為直鏈狀或具有支鏈之飽和或不飽和、經取代或未經取代、環式或非環式、具有雜環或不具有雜環之C1~C12之烴的二價基,R2為直鏈狀或具有支鏈之C1~C5的烷基,p及q為1~3之整數,p+q=4)。 The method of any one of claims 22 to 24, wherein the aqueous solution of the coupling agent is an aqueous solution of an amine group-containing titanate represented by the following formula II: (H 2 NR 1 -O) P Ti (OR 2 ) q (Formula II) (wherein, in the formula II, R1 is linear or has a saturated or unsaturated, branched or unsubstituted, cyclic or acyclic, heterocyclic or non-cyclic a divalent group of a hydrocarbon of a heterocyclic ring C1 to C12, R2 is a linear or branched C1 to C5 alkyl group, and p and q are integers of 1 to 3, p+q=4). 如申請專利範圍第33項之方法,其中,R1為選自由下述者組成之群中的基:-(CH2)n、-(CH2)n-(CH)m-(CH2)j-1-、-(CH2)n-(CC)-(CH2)n-1、-(CH2)n-NH-(CH2)m-、-(CH2)n-NH-(CH2)m-NH-(CH2)j-、-(CH2)n-1-(CH)NH2-(CH2)m-1-、-(CH2)n-1-(CH)NH2-(CH2)m-1-NH-(CH2)j-(其中,n、m、j為1以上之整數)。 The method of claim 33, wherein R1 is a group selected from the group consisting of: -(CH 2 ) n , -(CH 2 ) n -(CH) m -(CH 2 ) j -1 -, -(CH 2 ) n -(CC)-(CH 2 ) n-1 , -(CH 2 ) n -NH-(CH 2 ) m -, -(CH 2 ) n -NH-(CH 2 ) m -NH-(CH 2 ) j -, -(CH 2 ) n-1 -(CH)NH 2 -(CH 2 ) m-1 -, -(CH 2 ) n-1 -(CH)NH 2 -(CH 2 ) m-1 -NH-(CH 2 ) j - (wherein n, m, j are integers of 1 or more). 如申請專利範圍第22至24項中任一項之方法,其中,金屬粉為藉由濕 式法製造之銅粉。 The method of any one of claims 22 to 24, wherein the metal powder is wet Copper powder produced by the method. 一種製造導電性金屬粉糊劑之方法,其係將藉由申請專利範圍第22至35項中任一項之製造方法製造之經表面處理的金屬粉與溶劑及/或黏合劑摻合而製造導電性金屬粉糊劑。 A method of producing a conductive metal powder paste, which is produced by blending a surface-treated metal powder produced by the manufacturing method of any one of claims 22 to 35 with a solvent and/or a binder. Conductive metal powder paste. 一種製造電極之方法,其包含下述步驟:將藉由申請專利範圍第22至35項中任一項之製造方法製造之經表面處理的金屬粉與溶劑及/或黏合劑摻合,而獲得導電性金屬粉糊劑之步驟;將導電性金屬粉糊劑塗佈於基材之步驟;及將塗佈於基材之導電性金屬粉糊劑加熱燒成之步驟。 A method of producing an electrode, comprising the steps of: blending a surface-treated metal powder produced by the manufacturing method of any one of claims 22 to 35 with a solvent and/or a binder to obtain a step of applying a conductive metal powder paste; a step of applying a conductive metal powder paste to the substrate; and a step of heating and baking the conductive metal powder paste applied to the substrate. 一種經表面處理之金屬粉,其係藉由申請專利範圍第22至35項中任一項之製造方法而製造者。 A surface-treated metal powder manufactured by the manufacturing method of any one of claims 22 to 35. 一種導電性金屬粉糊劑,其係藉由申請專利範圍第36項之製造方法而製造者。 A conductive metal powder paste which is manufactured by the manufacturing method of claim 36 of the patent application. 一種電極,其係藉由申請專利範圍第37項之製造方法而製造者。 An electrode produced by the manufacturing method of claim 37 of the patent application. 一種金屬粉,其係藉由申請專利範圍第22至35項中任一項之製造方法製造之經表面處理的金屬粉;於XPS之survey測定中,檢測出表面之N為1%以上,N之光電子為1000cps(count per second),且Si、Ti或Al為0.6%以上,Si、Ti或Al之光電子為1000cps以上,該金屬粉之燒結開始溫度為400℃以上。 A metal powder which is a surface-treated metal powder produced by the manufacturing method of any one of claims 22 to 35; in the survey of XPS, the surface N is detected to be 1% or more, N The photoelectron is 1000 cps (count per second), and Si, Ti or Al is 0.6% or more, and photoelectrons of Si, Ti or Al are 1000 cps or more, and the sintering start temperature of the metal powder is 400 ° C or more. 一種導電性金屬粉糊劑,其係摻合申請專利範圍第41項之經表面處理的 金屬粉而成者。 A conductive metal powder paste which is surface-treated in accordance with claim 41 of the scope of the patent application Metal powder is the original. 一種電極,其係塗佈申請專利範圍第42項之導電性金屬粉糊劑並進行加熱燒成而成者;於電極剖面以0.5個/μm2以下存在最大直徑為0.5μm以上之SiO2、TiO2或Al2O3An electrode obtained by coating a conductive metal powder paste of claim 42 and heating and firing the same; and having SiO 2 having a maximum diameter of 0.5 μm or more in an electrode cross section of 0.5/μm 2 or less, TiO 2 or Al 2 O 3 .
TW102105463A 2012-02-08 2013-02-08 A surface-treated metal powder, and a method for producing the same TWI547325B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012025336 2012-02-08

Publications (2)

Publication Number Publication Date
TW201334890A TW201334890A (en) 2013-09-01
TWI547325B true TWI547325B (en) 2016-09-01

Family

ID=48947643

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102105463A TWI547325B (en) 2012-02-08 2013-02-08 A surface-treated metal powder, and a method for producing the same

Country Status (3)

Country Link
JP (1) JP5977267B2 (en)
TW (1) TWI547325B (en)
WO (1) WO2013118891A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106964771B (en) * 2017-05-16 2018-09-14 合肥学院 Control method of oxygen content of superfine Mg powder and characterization method of oxidation resistance
JP7244573B2 (en) * 2021-05-26 2023-03-22 Jx金属株式会社 METHOD FOR MANUFACTURING METAL POWDER SINTERED BODY

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002249803A (en) * 2001-02-21 2002-09-06 Sumitomo Metal Mining Co Ltd Method of oxidation-proofing treatment for copper powder
JP2005216634A (en) * 2004-01-28 2005-08-11 Toda Kogyo Corp Composite conductive particle powder, and conductive coating and stacked ceramic capacitor containing it
CN1264633C (en) * 1998-06-12 2006-07-19 东邦钛株式会社 Method for producing metal powder
TW201100184A (en) * 2009-06-29 2011-01-01 Mitsui Mining & Smelting Co Ltd Composite copper particle

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04190502A (en) * 1990-11-22 1992-07-08 Sumitomo Metal Ind Ltd Copper conductor paste
JP4287557B2 (en) * 1999-11-02 2009-07-01 Jfeミネラル株式会社 Copper alloy powder for conductive paste
JP2002231053A (en) * 2001-02-01 2002-08-16 Dainippon Ink & Chem Inc Encapsulated particle for static charge image development and manufacturing method of the same, and conductive wiring pattern forming method using the encapsulated particle
JP4146119B2 (en) * 2001-12-04 2008-09-03 Jfeミネラル株式会社 Copper alloy powder for conductive paste
JP2005281712A (en) * 2004-03-26 2005-10-13 Fujikura Ltd Metal powder, and method and device for producing the same
JP4574246B2 (en) * 2004-06-28 2010-11-04 京セラ株式会社 Chip-type electronic component and its manufacturing method
KR100771773B1 (en) * 2005-11-01 2007-10-30 삼성전기주식회사 A Composite Nickel Particle and A Preparing Method Thereof
JP2009013490A (en) * 2007-07-09 2009-01-22 Sumitomo Metal Mining Co Ltd Nickel powder, and method for producing the same
JP5191844B2 (en) * 2008-09-10 2013-05-08 国立大学法人東北大学 Method for producing aqueous solvent-dispersible silver fine powder

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1264633C (en) * 1998-06-12 2006-07-19 东邦钛株式会社 Method for producing metal powder
JP2002249803A (en) * 2001-02-21 2002-09-06 Sumitomo Metal Mining Co Ltd Method of oxidation-proofing treatment for copper powder
JP2005216634A (en) * 2004-01-28 2005-08-11 Toda Kogyo Corp Composite conductive particle powder, and conductive coating and stacked ceramic capacitor containing it
TW201100184A (en) * 2009-06-29 2011-01-01 Mitsui Mining & Smelting Co Ltd Composite copper particle

Also Published As

Publication number Publication date
JPWO2013118891A1 (en) 2015-05-11
WO2013118891A1 (en) 2013-08-15
JP5977267B2 (en) 2016-08-24
TW201334890A (en) 2013-09-01

Similar Documents

Publication Publication Date Title
TWI547326B (en) A surface-treated metal powder, and a method for producing the same
TWI505293B (en) The treated copper powder
JP6212480B2 (en) Metal powder paste and method for producing the same
KR101729455B1 (en) Surface-treated metal powder, and method for producing same
EP3034202A1 (en) Metal powder paste and method for producing same
JP5843820B2 (en) Method for producing surface-treated metal powder
JP5843819B2 (en) Method for producing surface-treated metal powder
TWI547325B (en) A surface-treated metal powder, and a method for producing the same
JP2015036440A (en) Surface-treated metal powder and method for producing the same
JP5869538B2 (en) Method for producing surface-treated metal powder
JP5986046B2 (en) Surface-treated metal powder and method for producing the same
JP2015132000A (en) Surface-treated copper powder and production method therefor
JP2015131997A (en) Surface-treated copper powder and production method therefor
JP2015132001A (en) Surface-treated copper powder and production method therefor