TWI540308B - Optical detection system and interference controlling method thereof - Google Patents

Optical detection system and interference controlling method thereof Download PDF

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TWI540308B
TWI540308B TW102110958A TW102110958A TWI540308B TW I540308 B TWI540308 B TW I540308B TW 102110958 A TW102110958 A TW 102110958A TW 102110958 A TW102110958 A TW 102110958A TW I540308 B TWI540308 B TW I540308B
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light
detection system
optical detection
tested
objective lens
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TW201437605A (en
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胡恩德
黃英碩
王偉珉
鄭仲翔
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中央研究院
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Description

光學偵測系統及其干涉控制方法 Optical detection system and interference control method thereof

本發明係關於一種光學偵測系統及其干涉控制方法。 The present invention relates to an optical detection system and an interference control method thereof.

隨著科技的進步,光學偵測系統被廣泛地應用於各種測量儀器及電子裝置上,例如原子力顯微鏡(AFM)、光學顯微鏡(OM)、微機電系統(MEMS)、微結構測量儀或共振頻量測系統等用以偵測物體表面的粗糙狀態或極小位移的測量儀器,又例如CD光碟機、DVD光碟機或藍光光碟機等用以讀取儲存媒體的電子裝置。 With advances in technology, optical detection systems are widely used in a variety of measuring instruments and electronic devices, such as atomic force microscopy (AFM), optical microscopy (OM), microelectromechanical systems (MEMS), microstructure measuring instruments or resonant frequencies. A measuring instrument or the like for detecting a rough state or a very small displacement of an object surface, and an electronic device for reading a storage medium, such as a CD player, a DVD player, or a Blu-ray disc player.

以像散式的光學偵測系統的結構為例,其包括一物鏡、一分光元件、一光源系統以及一光電感測系統。當一光源系統發出的偵測光線抵達待測物時可能穿透待測物,而穿透光在藉由待測物下方之實際待測物或環境表面反射回光路系統。這些雜散光(反射光)並非光電感測系統獲取實際待測物表面資訊所需要的光線,反而有可能和由待測物反射的偵測光線產生光干涉作用,而使測量結果產生誤差。 Taking the structure of the astigmatic optical detection system as an example, it includes an objective lens, a beam splitting component, a light source system, and a photo-sensing system. When the detection light emitted by a light source system reaches the object to be tested, it may penetrate the object to be tested, and the transmitted light is reflected back to the optical path system by the actual object to be tested or the surface of the environment under the object to be tested. These stray light (reflected light) is not the light required by the photo-sensing system to obtain the actual surface information of the object to be tested, but may cause light interference with the detected light reflected by the object to be tested, which may cause errors in the measurement results.

因此,如何提供一種光學偵測系統及其干涉控制方法,可以避免光干涉導致的測量誤差,進而提升光學偵測系統的可靠度及精確度,已成為重要的課題之一。 Therefore, how to provide an optical detection system and its interference control method can avoid the measurement error caused by optical interference, thereby improving the reliability and accuracy of the optical detection system, and has become one of the important topics.

有鑑於上述課題,本發明之目的為提供一種光學偵測系統及其干涉控制方法,可以減少光干涉導致的測量誤差,進而提升光學偵測系統的可靠度及精確度。 In view of the above problems, an object of the present invention is to provide an optical detection system and an interference control method thereof, which can reduce measurement errors caused by optical interference, thereby improving the reliability and accuracy of the optical detection system.

為達上述目的,依據本發明之一種光學偵測系統,其係用以偵測一待測物,光學偵測系統包括一光源模組、一分光元件、一物鏡、一光電感測模組以及一遮光元件。光源模組發出一偵測光線。分光元件反 射偵測光線。物鏡折射經分光元件反射之偵測光線至待測物。光電感測模組接收待測物反射偵測光線所產生之一反射光線。遮光元件係設置於物鏡與待測物之間,且遮光元件遮蔽偵測光線經一環境表面所反射之至少部分光線。 In order to achieve the above object, an optical detection system according to the present invention is configured to detect a test object, and the optical detection system includes a light source module, a light splitting component, an objective lens, and a photo-sensing module. A shading element. The light source module emits a detection light. Spectroscopic component Shooting to detect light. The objective lens refracts the detected light reflected by the spectroscopic element to the object to be tested. The photo-sensing module receives one of the reflected light generated by the reflection of the object to be detected. The shading element is disposed between the objective lens and the object to be tested, and the shading element shields at least part of the light reflected by the ambient surface.

在一實施例中,遮光元件包括一遮光層。 In an embodiment, the shading element comprises a light shielding layer.

在一實施例中,遮光元件為一遮光片。 In an embodiment, the shading element is a light shielding sheet.

在一實施例中,遮光元件之形狀係為圓形、半圓形、多邊形、橢圓形或不規則形。 In one embodiment, the shape of the shading element is circular, semi-circular, polygonal, elliptical or irregular.

在一實施例中,遮光層或遮光元件具有一開口。 In an embodiment, the light shielding layer or the light blocking member has an opening.

在一實施例中,開口之直徑小於等於物鏡之穿透口徑。 In one embodiment, the diameter of the opening is less than or equal to the penetration diameter of the objective lens.

在一實施例中,遮光元件可包括一基板,其中遮光層係設置於基板。 In an embodiment, the shading element may include a substrate, wherein the light shielding layer is disposed on the substrate.

在一實施例中,待測物包括一探針單元,其具有一懸臂及一探針,探針係連接於懸臂,遮光元件係設置於物鏡及探針之間。 In one embodiment, the object to be tested includes a probe unit having a cantilever and a probe, the probe is coupled to the cantilever, and the light shielding member is disposed between the objective lens and the probe.

有鑑於上述課題,依據本發明之一種光學偵測系統的干涉控制方法,包括:提供一光學偵測系統,光學偵測系統包括一物鏡、一分光元件、一光源模組以及一光電感測模組;以及設置一遮光元件於物鏡及一待測物之間,以遮蔽一環境表面所反射之部分光線。 In view of the above problems, an interference control method for an optical detection system according to the present invention includes: providing an optical detection system including an objective lens, a beam splitting component, a light source module, and a photo-electricity sensing module And a shielding element is disposed between the objective lens and an object to be tested to shield a portion of the light reflected by an environmental surface.

承上所述,依據本發明之一種光學偵測系統及其干涉控制方法,藉由在物鏡與待測物之間設置遮光元件,可以使得光源模組所發出的光線經由物鏡折射至待測物,至少部分光線穿透待測物經下方環境表面反射後被遮光元件遮蔽,進而降低環境表面所反射的光線被光電感測模組所接收的強度,因而可減少光干涉作用,及光干涉作用致使測量的結果發生的誤差,故可進而提高光學偵測系統的可靠度與精確度。 According to the optical detection system and the interference control method of the present invention, by providing a light shielding element between the objective lens and the object to be tested, the light emitted by the light source module can be refracted to the object to be tested through the objective lens. At least part of the light penetrates the object to be tested and is shielded by the light-shielding element after being reflected by the lower surface of the environment, thereby reducing the intensity of the light reflected by the ambient surface received by the photo-sensing module, thereby reducing the interference of light and the interference of light. The error that results in the measurement results can further improve the reliability and accuracy of the optical detection system.

1、1a‧‧‧光學偵測系統 1, 1a‧‧‧ optical detection system

11‧‧‧光源模組 11‧‧‧Light source module

12‧‧‧物鏡 12‧‧‧ Objective lens

14、14a‧‧‧遮光元件 14, 14a‧‧‧ shading elements

141‧‧‧開口 141‧‧‧ openings

142‧‧‧遮光層 142‧‧‧Lighting layer

143‧‧‧基板 143‧‧‧Substrate

15‧‧‧分光元件 15‧‧‧Spectral components

16‧‧‧光電感測模組 16‧‧‧Light Inductance Module

2‧‧‧環境表面 2‧‧‧Environmental surface

3、3a‧‧‧待測物 3, 3a‧‧‧ test object

31‧‧‧探針 31‧‧‧ probe

32‧‧‧懸臂 32‧‧‧ cantilever

B‧‧‧實際待測物 B‧‧‧ actual test object

F‧‧‧雜散光 F‧‧‧stray light

N‧‧‧針座 N‧‧‧ needle seat

S01、S02‧‧‧步驟 S01, S02‧‧‧ steps

圖1為本發明較佳實施例之一種光學偵測系統的示意圖。 1 is a schematic diagram of an optical detection system in accordance with a preferred embodiment of the present invention.

圖2為本發明另一較佳實施例之一種光學偵測系統的示意圖。 2 is a schematic diagram of an optical detection system according to another preferred embodiment of the present invention.

圖3為光學偵測系統的仰視示意圖。 Figure 3 is a bottom view of the optical detection system.

圖4為本發明較佳實施例之一種光學偵測系統的干涉控制方法的流程圖。 4 is a flow chart of an interference control method of an optical detection system according to a preferred embodiment of the present invention.

以下將參照相關圖式,說明依本發明較佳實施例之一種光學偵測系統及其干涉控制方法,其中相同的元件將以相同的參照符號加以說明。須要注意的是,圖中所示僅為示意而已,不代表實際之尺寸、比例,應用上皆可有不同之設計、變化,特先陳明。 Hereinafter, an optical detecting system and an interference control method thereof according to a preferred embodiment of the present invention will be described with reference to the accompanying drawings, wherein the same elements will be described with the same reference numerals. It should be noted that the figures are only for the sake of illustration. They do not represent the actual size and proportion. The application can have different designs and changes.

請參照圖1所示,其為本發明較佳實施例之一種光學偵測系統的示意圖。光學偵測系統1係可用以偵測由一待測物3所反射的光線強度,利用所偵測到的光線強度,光學偵測系統1係可判斷待測物3的垂直位移(相對於主要光路徑)情況,或是待測物3之表面高度變化或粗糙程度,且精密度可達奈米等級。舉例而言,光學偵測系統1可以應用於光學顯微鏡、X光顯微鏡、原子力顯微鏡或讀取儲存媒體之裝置等,其中讀取存儲存媒體之裝置可以例如是光碟機,其包括CD光碟機、DVD光碟機或藍光光碟機等。當光學偵測系統1是用以作為光學顯微鏡、X光顯微鏡或原子力顯微鏡的讀取頭時,待測物3可包括探針單元;當光學偵測系統1是用以作為讀取儲存媒體之裝置之讀取頭時,待測物3則可例如是光碟片。 Please refer to FIG. 1 , which is a schematic diagram of an optical detection system according to a preferred embodiment of the present invention. The optical detection system 1 can be used to detect the intensity of light reflected by an object to be tested 3. Using the detected light intensity, the optical detection system 1 can determine the vertical displacement of the object 3 (relative to the main The light path), or the surface height or roughness of the object to be tested 3, and the precision is up to the nanometer level. For example, the optical detection system 1 can be applied to an optical microscope, an X-ray microscope, an atomic force microscope, or a device for reading a storage medium, etc., wherein the device for reading the storage medium can be, for example, a CD player, which includes a CD player, DVD player or Blu-ray disc player, etc. When the optical detection system 1 is used as a read head of an optical microscope, an X-ray microscope or an atomic force microscope, the object to be tested 3 may include a probe unit; when the optical detection system 1 is used as a reading storage medium When the head of the device is read, the object to be tested 3 may be, for example, a disc.

如圖1所示,本實施例之光學偵測系統1係應用於讀取儲存媒體之裝置為例,光學偵測系統1包括一光源模組11、一物鏡12、一分光元件15、一光電感測模組16以及一遮光元件14。其中,待測物3為一光學儲存元件,例如為光碟片。於此,並不加以限制光學偵測系統之態樣。 As shown in FIG. 1 , the optical detection system 1 of the present embodiment is applied to a device for reading a storage medium. The optical detection system 1 includes a light source module 11 , an objective lens 12 , a light splitting component 15 , and a photoelectric device . The sensing module 16 and a shading element 14 are provided. The object to be tested 3 is an optical storage element, such as an optical disc. Here, the aspect of the optical detection system is not limited.

在實施上,光源模組11可例如是一個或多個雷射二極體(laser diode)或是包括其他系統所需要的發光元件,例如是發光二極體、鹵素燈、鎢絲燈泡等等。於此,光源模組11是用以發出偵測光線(例如紅光雷射)至一分光元件15,偵測光線係被分光元件15反射至物鏡12。 In practice, the light source module 11 can be, for example, one or more laser diodes or include other light-emitting elements required for other systems, such as light-emitting diodes, halogen lamps, tungsten filament bulbs, and the like. . The light source module 11 is configured to emit a detecting light (for example, a red laser) to a beam splitting element 15 , and the detecting light is reflected by the beam splitting element 15 to the objective lens 12 .

於此,分光元件15係可依據光線之入射角的不同,而將入射的光線反射或折射,換言之,在本實施例中,分光元件15係可將光源模組11所發射的偵測光線一部分反射至物鏡12,且分光元件15亦可以將待測物3反射偵測光線所產生的一反射光線折射至光電感測模組16。 In this case, the light splitting element 15 can reflect or refract incident light according to the incident angle of the light. In other words, in the embodiment, the light splitting component 15 can partially detect the light emitted by the light source module 11. The light is reflected to the objective lens 12, and the light splitting element 15 can also refract a reflected light generated by the object 3 to detect the light to the photo-sensing module 16.

物鏡12例如是一凸透鏡,其係用以將偵測光線聚集,藉以讓偵測光線穿過物鏡12而折射至待測物3。於此,物鏡12的焦距以及與分光元件15的距離係可依據實際需求而有所不同,本發明於此並不予以限定。 The objective lens 12 is, for example, a convex lens for collecting the detection light so that the detection light is refracted through the objective lens 12 to be refracted to the object to be tested 3. Here, the focal length of the objective lens 12 and the distance from the spectroscopic element 15 may vary depending on actual needs, and the present invention is not limited thereto.

遮光元件14係設置於物鏡12及待測物3之間。在實施上,遮光元件14可包括一遮光層142以及一基板143,例如是遮光元件14同時結合遮光層142及基板143,其中基板143係為一透光基板,遮光層142是設置於基板143之一側,例如是以印刷或噴塗而設置於基板143上。在實施上,基板143之厚度,例如可為0.1毫米至0.6毫米。更具體來說,當光學偵測系統1係應用於CD光碟機,則基板143的厚度係可為0.6毫米;當光學偵測系統1係應用於藍光光碟機,則基板143的厚度係可為0.1毫米。須要注意的是,以上基板143的厚度僅為舉例,在不同的實施例中,基板143的厚度係可依據實際需要而改變。另外,在不同實施例中,基板143根據不同的量測應用可以移除,本發明並不加以限定。 The light shielding member 14 is disposed between the objective lens 12 and the object to be tested 3. In the implementation, the light shielding layer 14 can include a light shielding layer 142 and a substrate 143. For example, the light shielding layer 14 is combined with the light shielding layer 142 and the substrate 143. The substrate 143 is a transparent substrate, and the light shielding layer 142 is disposed on the substrate 143. One side is provided on the substrate 143, for example, by printing or spraying. In practice, the thickness of the substrate 143 may be, for example, 0.1 mm to 0.6 mm. More specifically, when the optical detection system 1 is applied to a CD player, the thickness of the substrate 143 can be 0.6 mm; when the optical detection system 1 is applied to a Blu-ray disc player, the thickness of the substrate 143 can be 0.1 mm. It should be noted that the thickness of the above substrate 143 is only an example. In different embodiments, the thickness of the substrate 143 may be changed according to actual needs. In addition, in different embodiments, the substrate 143 can be removed according to different measurement applications, and the invention is not limited thereto.

遮光元件14係可與物鏡12連結設置,或以其他方式設置於物鏡12及待測物3之間,本發明並不予以限定。在本實施例中,遮光元件14之形狀係為圓形,但不以此為限(在不同實施例中,遮光元件的形狀也可以為半圓形、多邊形、橢圓形或不規則形等),且遮光元件14具有一開口141而可以讓偵測光線通過。較佳的是,開口141的直徑係可小於物鏡12的穿透口徑(直徑),於此,開口141之直徑係可以為2毫米至3毫米,或者在其他實施例中,開口141之直徑可以依據物鏡12之穿透口徑的不同而改變,本發明並不加以限定。 The light shielding element 14 can be disposed in connection with the objective lens 12 or otherwise disposed between the objective lens 12 and the object to be tested 3, which is not limited by the present invention. In this embodiment, the shape of the light shielding member 14 is circular, but not limited thereto (in different embodiments, the shape of the light shielding member may also be semicircular, polygonal, elliptical or irregular, etc.) And the shading element 14 has an opening 141 for allowing the detection of light to pass. Preferably, the diameter of the opening 141 can be smaller than the penetration diameter (diameter) of the objective lens 12. Here, the diameter of the opening 141 can be 2 mm to 3 mm, or in other embodiments, the diameter of the opening 141 can be The present invention is not limited by the difference in the diameter of the aperture of the objective lens 12.

光電感測模組16係用以接收被待測物3反射偵測光線的一反射光線,將之轉換為電壓訊號,藉以從中獲取待測物3的表面的資訊或位移的資訊。於此,光電感測模組16係以一四象限光電感測晶片(photodiode IC,PDIC)為例。當偵測光線射至待測物3表面,被待測物3反射的反射光線經光電感測模組16接收、轉換為電壓值,並據以計算後,即可獲得待測物3所儲存資料的資訊。 The photo-sensing module 16 is configured to receive a reflected light reflected by the object to be tested 3 and convert it into a voltage signal, thereby obtaining information about the surface or the displacement of the object 3 to be measured. Here, the photo-sensing module 16 is exemplified by a four-quadrant photodiode IC (PDIC). When the detection light is incident on the surface of the object to be tested 3, the reflected light reflected by the object to be tested 3 is received by the photo-sensing module 16 and converted into a voltage value, and after being calculated, the object to be tested 3 can be stored. Information on the information.

由於待測物3的厚度很薄,或是偵測光線射至待測物3的照射面積大於待測物3的面積時,部分偵測光線係穿透待測物3或由待測物3的周圍漏光至他處,進而射至一環境表面2,於此,環境表面2例如是 光碟機的托盤或是放置樣品之樣品台。遮光元件14設置之目的便是用以遮蔽偵測光線被環境表面2所反射的至少部分光線(又可稱為雜散光F),進而可降低雜散光F被射至光電感測模組16之強度,藉以使得光電感測模組16在獲取待測物3的資訊時,可減少光干涉作用產生之影響,故可提高準確度及可靠度。 Since the thickness of the object to be tested 3 is very thin, or the area of the detection light hitting the object to be tested 3 is larger than the area of the object to be tested 3, part of the detected light passes through the object to be tested 3 or from the object to be tested 3 The surrounding area leaks to other places and then hits an environmental surface 2, where the environmental surface 2 is, for example, The tray of the CD player or the sample stage on which the sample is placed. The purpose of the shading element 14 is to shield at least part of the light (which may be referred to as stray light F) reflected by the ambient surface 2, thereby reducing the stray light F from being incident on the photo-sensing module 16. The intensity, so that the photo-sensing module 16 can reduce the influence of the interference of the light when acquiring the information of the object to be tested 3, thereby improving the accuracy and reliability.

請參照圖2所示,其為本發明較佳實施之另一種光學偵測系統的示意圖。光學偵測系統1a與光學偵測系統1相同,不同之處在於,本實施例之光學偵測系統1a係以應用於像散式(Astigmatic)原子力顯微鏡為例,於此,待測物3a包括一探針單元。 Please refer to FIG. 2, which is a schematic diagram of another optical detection system in accordance with a preferred embodiment of the present invention. The optical detection system 1a is the same as the optical detection system 1 except that the optical detection system 1a of the present embodiment is applied to an astigmatic atomic force microscope. Here, the object to be tested 3a includes A probe unit.

探針單元係包括一探針31以及一懸臂32,其中探針31係連結於懸臂32下方,且探針單元是位於物鏡12之焦點。一般來說,探針31之針尖尺寸僅數奈米,而懸臂32之寬度可為45至55微米,其厚度可為200奈米至500奈米。於此,偵測光線係以紅光雷射為例,其焦點直徑約為560奈米,偵測光線是藉由物鏡12之折射而聚焦於懸臂32,更精確來說,是聚焦於探針31之針尖垂直懸臂32方向的延長線與懸臂32朝向物鏡12的一表面之交點。 The probe unit includes a probe 31 and a cantilever 32, wherein the probe 31 is coupled below the cantilever 32, and the probe unit is located at the focus of the objective lens 12. In general, the probe 31 has a tip size of only a few nanometers, and the cantilever 32 has a width of 45 to 55 microns and a thickness of 200 to 500 nm. Here, the detection light is exemplified by a red laser having a focal point diameter of about 560 nm, and the detection light is focused on the cantilever 32 by the refraction of the objective lens 12, more precisely, focusing on the probe. The extension of the needle tip of the 31 is perpendicular to the intersection of the cantilever 32 toward a surface of the objective lens 12.

需注意的是,雖然本實施例係將探針單元定義為待測物3a,其是用以說明偵測光線聚焦偵測的地方,於實際應用時,探針單元的探針31係抵頂於一實際待測物B上。當改變實際待測物B與探針單元的探針31之相對位置時,探針單元便會因實際待測物B的高低起伏而產生垂直方向的位移,造成反射偵測光的強度不同,而讓光電感測模組16接收到不同程度的反射之偵測光線,藉以判斷出實際待測物B的表面輪廓。 It should be noted that, in this embodiment, the probe unit is defined as the object to be tested 3a, which is used to describe the detection of the focus detection of the light. In practical applications, the probe 31 of the probe unit is abutted. On an actual object B. When the relative position of the actual object B and the probe 31 of the probe unit is changed, the probe unit will be displaced in the vertical direction due to the fluctuation of the actual object B, resulting in different intensity of the reflected detection light. The photo-sensing module 16 receives the reflected light of different degrees of reflection to determine the surface contour of the actual object B.

由於探針單元(待測物3a)與實際待測物B的厚度可能很薄,或是偵測光線射至探針單元與實際待測物B的照射面積係大於探針單元與實際待測物B的面積時,部分偵測光線即會穿透待測物3a或由待測物3a的周圍漏光至他處,進而射至一環境表面2(圖2中係以偵測光線穿透探針單元與實際待測物B為例),舉例而言,環境表面2例如是原子力顯微鏡的載物台。於此,遮光元件14a係位於物鏡12與懸臂32之間。遮光元件14a可為一遮光片,其材質可例如是包括鐵片、不透光或吸光的材質,亦或是於一塑膠片上塗佈不透光或吸光的材料等,只要能遮擋住由環境表 面2反射回來之光線即可,本發明不加以限定。 Since the thickness of the probe unit (the object to be tested 3a) and the actual object to be tested B may be thin, or the irradiation area of the detection light to the probe unit and the actual object B is larger than the probe unit and the actual to be tested When the area of the object B is partially detected, the light is transmitted through the object to be tested 3a or leaked to the other side of the object to be tested 3a, and then hits an environmental surface 2 (Fig. 2 is used to detect light penetration). The needle unit and the actual object B are taken as an example. For example, the environmental surface 2 is, for example, a stage of an atomic force microscope. Here, the shading element 14a is located between the objective lens 12 and the cantilever 32. The light shielding member 14a can be a light shielding sheet, and the material thereof can be, for example, a material including iron sheets, opaque or light absorbing materials, or a material that is opaque or light absorbing on a plastic sheet, as long as it can block the environment. table The light reflected from the surface 2 can be used, and the invention is not limited.

如此一來,被環境表面2所反射的部分光線(雜散光F)便可被遮光元件14a所遮蔽,而可降低雜散光F被射至光電感測模組16之強度,藉以使得光電感測模組16在獲取探針單元的位移資訊時,減少光干涉作用產生之影響,故可提高準確度及可靠度。 In this way, part of the light (stray light F) reflected by the environmental surface 2 can be shielded by the light shielding element 14a, and the intensity of the stray light F being incident on the photo-sensing module 16 can be reduced, thereby making the optical inductance measurement. When acquiring the displacement information of the probe unit, the module 16 reduces the influence of the interference of the light, so that the accuracy and reliability can be improved.

請參照圖3所示,其為光學偵測系統的仰視示意圖。於此係以應用於原子力顯微鏡之光學偵測系統1a為例,故請同時參照圖2所示,以利理解。遮光元件14a係設置於物鏡12及探針31之間,且遮光元件14a的主要表面係大致上與光學偵測系統1a的光路實質上垂直,進而可以遮擋部分的反射光線通過。於圖3中可以看出,由針座N夾持的懸臂32係將探針31設置於開口141中,偵測光線被環境表面2表面反射後的反射光,除了由原來的光路徑而從遮光元件14a的開口141反射回光電感測模組16之外,其他的光線大致上均可以被遮光元件14a所阻擋,而不會被光電感測模組16所感測到。其中該些被阻擋的光線並非光電感測模組16感測探針單元位移資訊時所需之必要光線,反而該些被阻擋的反射光若沒有被遮光元件14a所阻擋,而被反射至光電感測模組16,將會造成光干涉作用,導致測量誤差,進而影響偵測的結果。換言之,藉由於物鏡12及探針單元之間設置遮光元件14a,可以減少光干涉作用的產生,提高光學偵測系統1a的可靠度及精確度。須注意的是,遮光元件14a所遮擋的光線,只要能減少環境表面2所反射回的干涉光即可,也就是說,遮光元件14a也可以是一濾光層,可減少不必要的波段影響光電感測模組16的感測。 Please refer to FIG. 3, which is a bottom view of the optical detection system. Here, the optical detection system 1a applied to the atomic force microscope is taken as an example, so please refer to FIG. 2 at the same time for the understanding. The light shielding element 14a is disposed between the objective lens 12 and the probe 31, and the main surface of the light shielding element 14a is substantially perpendicular to the optical path of the optical detection system 1a, so that the reflected light of the shielding portion can pass. As can be seen in FIG. 3, the cantilever 32 held by the needle holder N is disposed in the opening 141 to detect the reflected light of the light reflected by the surface of the environmental surface 2, except from the original light path. The opening 141 of the shading element 14a is reflected back to the photo-sensing module 16 , and other light rays can be substantially blocked by the shading element 14 a without being sensed by the photo-sensing module 16 . The blocked light is not the necessary light required for the photo-sensing module 16 to sense the displacement information of the probe unit. Instead, the blocked reflected light is reflected to the photoelectricity if not blocked by the light-shielding element 14a. The sensing module 16 will cause optical interference, resulting in measurement errors, which in turn affect the detection results. In other words, by providing the light shielding element 14a between the objective lens 12 and the probe unit, the generation of light interference can be reduced, and the reliability and accuracy of the optical detection system 1a can be improved. It should be noted that the light blocked by the light shielding element 14a can reduce the interference light reflected by the environmental surface 2, that is, the light shielding element 14a can also be a filter layer, which can reduce unnecessary band influence. Sensing of the photo-sensing module 16.

請參照圖4所示,其為本發明較佳實施例之一種光學偵測系統的干涉控制方法的流程圖。光學偵測系統的干涉控制方法包括步驟S01及步驟S02。 Please refer to FIG. 4, which is a flowchart of an interference control method of an optical detection system according to a preferred embodiment of the present invention. The interference control method of the optical detection system includes step S01 and step S02.

在步驟S01中,提供一光學偵測系統,光學偵測系統包括一物鏡、一分光元件、一光源模組以及一光電感測模組。在步驟S02中,設置一遮光元件於物鏡及一待測物之間,以遮蔽一環境表面所反射之至少部分光線。本實施例之技術特徵係與前述實施例相同,故請參考前文所述,於此不再贅述。 In step S01, an optical detection system is provided. The optical detection system includes an objective lens, a beam splitting component, a light source module, and a photo-sensing module. In step S02, a shading element is disposed between the objective lens and an object to be tested to shield at least part of the light reflected by an environmental surface. The technical features of this embodiment are the same as those of the foregoing embodiment, so please refer to the foregoing description, and details are not described herein again.

綜合上述,依據本發明之一種光學偵測系統及其干涉控制 方法,藉由在物鏡與待測物之間設置遮光元件,可以使得光源模組所發出的光線經由物鏡射至待測物之表面,部分光線穿透待測物經下方環境表面反射後,被遮光元件遮蔽,而減少該些光線被光電感測模組所接收的強度,因而可避免造成光干涉作用,及光干涉作用致使測量的結果發生的誤差,故可進而提高光學偵測系統的可靠度與精確度。 In summary, an optical detection system and interference control thereof according to the present invention In the method, by providing a light-shielding element between the objective lens and the object to be tested, the light emitted by the light source module can be incident on the surface of the object to be tested through the objective lens, and some of the light penetrates the object to be tested and is reflected by the lower surface of the environment. The shading element is shielded to reduce the intensity of the light received by the photo-sensing module, thereby avoiding the interference of the light and the interference caused by the optical interference, thereby improving the reliability of the optical detection system. Degree and precision.

以上所述僅為舉例性,而非為限制性者。任何未脫離本發明之精神與範疇,而對其進行之等效修改或變更,均應包括於後附之申請專利範圍中。 The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of the invention are intended to be included in the scope of the appended claims.

1‧‧‧光學偵測系統 1‧‧‧ Optical detection system

11‧‧‧光源模組 11‧‧‧Light source module

12‧‧‧物鏡 12‧‧‧ Objective lens

14‧‧‧遮光元件 14‧‧‧ shading elements

141‧‧‧開口 141‧‧‧ openings

142‧‧‧遮光層 142‧‧‧Lighting layer

143‧‧‧基板 143‧‧‧Substrate

15‧‧‧分光元件 15‧‧‧Spectral components

16‧‧‧光電感測模組 16‧‧‧Light Inductance Module

2‧‧‧環境表面 2‧‧‧Environmental surface

3‧‧‧待測物 3‧‧‧Test object

F‧‧‧雜散光 F‧‧‧stray light

Claims (14)

一種光學偵測系統,其係用以偵測一待測物,該光學偵測系統包括:一光源模組,發出一偵測光線;一分光元件,其係反射該偵測光線;一物鏡,折射經該分光元件反射之該偵測光線至該待測物;一光電感測模組,接收該待測物反射該偵測光線所產生之一反射光線;以及一遮光元件,其係設置於該物鏡與該待測物之間,且該遮光元件遮蔽該偵測光線經一環境表面所反射之至少部分光線,其中該環境表面為該待測物設置的一平台表面,其中該待測物包括一探針單元,其具有一探針及一懸臂,該探針係連接於該懸臂,且該探針單元係位於該物鏡之焦點,該偵測光線是藉由該物鏡之折射而聚焦於該懸臂的一表面,且該遮光元件係設置於該物鏡及該探針之間,當進行偵測時,該探針單元的該探針會頂抵一實際待測物,當該實際待測物與該探針的相對位置改變時,該探針單元會依該實際待測物的高低起伏而產生垂直方向的位移。 An optical detection system for detecting an object to be tested, the optical detection system comprising: a light source module for emitting a detection light; a light splitting component for reflecting the detected light; and an objective lens, Refraction of the detected light reflected by the spectroscopic element to the object to be tested; a photo-sensing module receiving a reflected light generated by the object to be detected to reflect the detected light; and a shading element disposed on the object Between the objective lens and the object to be tested, and the light shielding element shields at least part of the light reflected by the detection light through an environmental surface, wherein the environmental surface is a platform surface disposed on the object to be tested, wherein the object to be tested The utility model comprises a probe unit having a probe and a cantilever, the probe is connected to the cantilever, and the probe unit is located at a focus of the objective lens, and the detection light is focused by the refraction of the objective lens a surface of the cantilever, and the light shielding element is disposed between the objective lens and the probe. When detecting, the probe of the probe unit is topped against an actual object to be tested, when the actual test is to be performed. The relative position of the object and the probe When the probe unit will depend on the actual undulating was measured while displacement in the vertical direction. 如申請專利範圍第1項所述之光學偵測系統,其中該遮光元件包括一遮光層。 The optical detection system of claim 1, wherein the shading element comprises a light shielding layer. 如申請專利範圍第1項所述之光學偵測系統,其中該遮光元件為一遮光片。 The optical detection system of claim 1, wherein the shading element is a light shielding sheet. 如申請專利範圍第1項所述之光學偵測系統,其中該遮光元件之形狀係為圓形、半圓形、多邊形、橢圓形或不規則形。 The optical detection system of claim 1, wherein the shading element has a shape of a circle, a semicircle, a polygon, an ellipse or an irregular shape. 如申請專利範圍第1項所述之光學偵測系統,其中該遮光元件具有一開口。 The optical detection system of claim 1, wherein the shading element has an opening. 如申請專利範圍第5項所述之光學偵測系統,其中該開口之直徑小於等於該物鏡之穿透口徑。 The optical detection system of claim 5, wherein the diameter of the opening is less than or equal to the penetration diameter of the objective lens. 如申請專利範圍第2項所述之光學偵測系統,其中該遮光元件更包括一基板,其中該遮光層係設置於該基板。 The optical detection system of claim 2, wherein the shading element further comprises a substrate, wherein the light shielding layer is disposed on the substrate. 一種光學偵測系統的干涉控制方法,包括:提供一光學偵測系統,該光學偵測系統包括一光源模組、一分光元件、一物鏡及一光電感測模組;以及設置一遮光元件於該物鏡及一待測物之間,以遮蔽一環境表面所反射之至少部分光線,其中該環境表面為該待測物設置的一平台表面,其中該待測物包括一探針單元,其具有一探針及一懸臂,該探針係連接於該懸臂,且該探針單元係位於該物鏡之焦點,該偵測光線是藉由該物鏡之折射而聚焦於該懸臂的一表面,且該遮光元件係設置於該物鏡及該探針之間,當進行偵測時,該探針單元的該探針會頂抵一實際待測物,當該實際待測物與該探針的相對位置改變時,該探針單元會依該實際待測物的高低起伏而產生垂直方向的位移。 An interference detection method for an optical detection system includes: providing an optical detection system, the optical detection system comprising a light source module, a light splitting component, an objective lens, and a photo-sensing module; and providing a light-shielding component Between the objective lens and an object to be tested, to shield at least part of the light reflected by an environmental surface, wherein the environmental surface is a platform surface disposed on the object to be tested, wherein the object to be tested comprises a probe unit having a probe and a cantilever, the probe is connected to the cantilever, and the probe unit is located at a focus of the objective lens, and the detection light is focused on a surface of the cantilever by refraction of the objective lens, and the The light shielding component is disposed between the objective lens and the probe. When detecting, the probe of the probe unit is abutted against an actual object to be tested, and the relative position of the actual object to be tested is opposite to the probe. When changing, the probe unit will generate a vertical displacement according to the fluctuation of the actual object to be tested. 如申請專利範圍第8項所述之光學偵測系統的干涉控制方法,其中該遮光元件包括一遮光層。 The interference control method of the optical detection system of claim 8, wherein the shading element comprises a light shielding layer. 如申請專利範圍第8項所述之光學偵測系統的干涉控制方法,其中該遮光元件為一遮光片。 The interference control method of the optical detection system of claim 8, wherein the shading element is a light shielding sheet. 如申請專利範圍第8項所述之光學偵測系統的干涉控制方法,其中該遮光元件之形狀係為圓形、半圓形、多邊形、橢圓形或不規則形。 The interference control method of the optical detection system of claim 8, wherein the shading element has a shape of a circle, a semicircle, a polygon, an ellipse or an irregular shape. 如申請專利範圍第8項所述之光學偵測系統的干涉控制方法,其中該遮光元件具有一開口。 The interference control method of the optical detection system of claim 8, wherein the shading element has an opening. 如申請專利範圍第12項所述之光學偵測系統的干涉控制方法,其中該開口之直徑小於等於該物鏡之穿透口徑。 The interference control method of the optical detection system of claim 12, wherein the diameter of the opening is less than or equal to the penetration diameter of the objective lens. 如申請專利範圍第9項所述之光學偵測系統的干涉控制方法,其中該遮光元件更包括一基板,其中該遮光層係設置於該基板。 The interference control method of the optical detection system of claim 9, wherein the shading element further comprises a substrate, wherein the light shielding layer is disposed on the substrate.
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