TWI533544B - Surge absorber and manufacturing method thereof - Google Patents
Surge absorber and manufacturing method thereof Download PDFInfo
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- TWI533544B TWI533544B TW100140844A TW100140844A TWI533544B TW I533544 B TWI533544 B TW I533544B TW 100140844 A TW100140844 A TW 100140844A TW 100140844 A TW100140844 A TW 100140844A TW I533544 B TWI533544 B TW I533544B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/06—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base
- H01C17/075—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thin film techniques
- H01C17/14—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thin film techniques by chemical deposition
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01T—SPARK GAPS; OVERVOLTAGE ARRESTERS USING SPARK GAPS; SPARKING PLUGS; CORONA DEVICES; GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES
- H01T4/00—Overvoltage arresters using spark gaps
- H01T4/10—Overvoltage arresters using spark gaps having a single gap or a plurality of gaps in parallel
- H01T4/12—Overvoltage arresters using spark gaps having a single gap or a plurality of gaps in parallel hermetically sealed
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C1/00—Details
- H01C1/01—Mounting; Supporting
- H01C1/014—Mounting; Supporting the resistor being suspended between and being supported by two supporting sections
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/06—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base
- H01C17/075—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thin film techniques
- H01C17/08—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thin film techniques by vapour deposition
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/10—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors
- H01C7/12—Overvoltage protection resistors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01T—SPARK GAPS; OVERVOLTAGE ARRESTERS USING SPARK GAPS; SPARKING PLUGS; CORONA DEVICES; GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES
- H01T21/00—Apparatus or processes specially adapted for the manufacture or maintenance of spark gaps or sparking plugs
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Description
本發明有關於浪湧吸收器,用於保護電子裝置免於例如雷擊的高電壓侵害,以及其製造方法。The present invention relates to surge absorbers for protecting electronic devices from high voltage ingress, such as lightning strikes, and methods of making same.
一般而言,高電壓高電流脈波通常稱為浪湧,其為一種電子雜訊。這種浪湧是由自然的雷擊現象、電力系統(例如高壓電路斷路器(breakers、disconnectors)等開關),以及大型工業設備(電感性負載切換、電弧與開關、繼電器、焊接機等短路造成之切換突波,以及升降機、馬達等造成之驅動突波)所產生的。In general, high voltage, high current pulses are commonly referred to as surges, which are an electronic noise. Such surges are caused by natural lightning strikes, power systems (such as high-voltage circuit breakers (breakers, disconnectors), and large industrial equipment (inductive load switching, arcs and switches, relays, welding machines, etc.). Switching surges, as well as driving surges caused by lifts, motors, etc.).
現今,隨著半導體技術的發展,電子裝置以超大型積體(VLSI)的方式設置於內部。浪湧經常透過電源供應器、通訊與訊號線路傳送至電子裝置,進而損害設置於電子裝置之電路系統或半導體裝置。因此,為了保護電子裝置免於浪湧的損害,浪湧吸收器廣泛用於軍用、工業用以及手持式電子裝置。Nowadays, with the development of semiconductor technology, electronic devices are placed inside in a very large form factor (VLSI). Surge is often transmitted to an electronic device through a power supply, communication, and signal line, thereby damaging the circuitry or semiconductor device disposed in the electronic device. Therefore, in order to protect electronic devices from surge damage, surge absorbers are widely used in military, industrial, and handheld electronic devices.
典型的浪湧吸收器包括設置在容器管內且為絕緣狀態的浪湧吸收元件。浪湧吸收元件包括非導電性元件、環繞非導電性元件之導電性鍍膜,以及將導電性鍍膜分為複數層之放電間隙,藉此導電性鍍膜能夠用來作為放電電極。A typical surge absorber includes a surge absorbing element disposed within the vessel tube and in an insulated state. The surge absorbing element includes a non-conductive element, a conductive plating film surrounding the non-conductive element, and a discharge gap separating the conductive plating film into a plurality of layers, whereby the conductive plating film can be used as a discharge electrode.
如上所述,導電性鍍膜用來作為放電電極,並由高導電性的金屬所構成,例如鈦(Ti)或鎳(Ni)。導電性鍍膜係以一般的濺鍍法沉積於非導電性元件的表面之上。As described above, the conductive plating film is used as a discharge electrode and is made of a highly conductive metal such as titanium (Ti) or nickel (Ni). The conductive coating is deposited on the surface of the non-conductive element by a general sputtering method.
然而,使用濺鍍法,將導電性鍍膜沉積在非導電性元件上所製造之習知浪湧吸收器,其缺點在於需要熱處理(heat treatment),這是因為所沉積之導電性鍍膜的鍵結力較弱導致。However, a conventional surge absorber fabricated by depositing a conductive plating film on a non-conductive member using a sputtering method has a disadvantage in that heat treatment is required because of the bonding of the deposited conductive coating film. The force is weaker.
當進行熱處理,以增加沉積於非導電性元件上之導電性鍍膜的鍵結力時,導電性鍍膜的電阻值會增加,進而減少浪湧吸收器的反應時間。When heat treatment is performed to increase the bonding force of the conductive plating film deposited on the non-conductive member, the resistance value of the conductive plating film is increased, thereby reducing the reaction time of the surge absorber.
此外,習知浪湧吸收器的導電性鍍膜厚度正比於電阻值。然而,對於使用在高電壓情況下的浪湧吸收器,使其導電性鍍膜厚度正比於高電阻值是必要的,並且高電壓下的浪湧吸收器,其導電性鍍膜厚度的增加僅能增加至既定數值(或以上)。因此,當浪湧來臨時,導電性鍍膜便會承受嚴重的損害,並造成浪湧吸收器的特性退化。In addition, the thickness of the conductive coating of the conventional surge absorber is proportional to the resistance value. However, for a surge absorber using a high voltage, it is necessary to make the thickness of the conductive coating proportional to the high resistance value, and the surge absorber of the high voltage can only increase the thickness of the conductive coating. To the established value (or above). Therefore, when a surge comes, the conductive coating will suffer severe damage and degrade the characteristics of the surge absorber.
此外,使用濺鍍法,將導電性鍍膜沉積在非導電性元件上所製造之習知浪湧吸收器,導電性鍍膜的厚度也有可能是不均勻的。Further, a conventional surge absorber manufactured by depositing a conductive plating film on a non-conductive member by a sputtering method may have a non-uniform thickness of the conductive plating film.
在導電性鍍膜並非均勻的情況下,當進行浪湧模擬而多次施加浪湧所量到之放電啟始電壓(discharge starting voltage)的比較結果值,每一次施加浪湧所量到放電啟始電壓很難會落在既定範圍內。In the case where the conductive coating is not uniform, the comparison result of the discharge starting voltage measured by the surge is applied a plurality of times when the surge simulation is performed, and the discharge is started every time the surge is applied. It is difficult for the voltage to fall within the established range.
本發明涉及一種浪湧吸收器,其能夠避免因將導電性鍍膜沉積於非導電性元件外表面所造成之電阻值增加,並且避免因電阻值增加造成之反應時間減少。The present invention relates to a surge absorber capable of avoiding an increase in resistance value caused by depositing a conductive plating film on an outer surface of a non-conductive member, and avoiding a decrease in reaction time due to an increase in resistance value.
本發明涉及一種浪湧吸收器,其能夠避免因無法在非導電性元件的外表面將導電性鍍膜沉積至既定厚度或以上所造成之效能降低。The present invention relates to a surge absorber capable of avoiding a decrease in performance due to the inability to deposit a conductive plating film to a predetermined thickness or more on the outer surface of a non-conductive member.
本發明涉及一種浪湧吸收器,其中能夠在非導電性元件的外表面沉積固定厚度的導電性鍍膜。The present invention relates to a surge absorber in which a conductive plating film of a fixed thickness can be deposited on the outer surface of a non-conductive member.
本發明具體實施例提供一種製造浪湧吸收器的方法,包括:準備非導電性元件;使用化學氣相沉積法,將導電性鍍膜沉積在非導電性元件的外表面之上,化學氣相沉積法係在高溫環境下,旋轉非導電性元件並噴佈沉積溶液;在導電性鍍膜中,形成至少一放電間隙,以構成浪湧吸收元件;在容器管之中,沉積浪湧吸收元件,並且在容器管之中,將密封電極密封在上述容器管的兩端,容器管具有一惰性氣體填充於其中;以及將引線電性連接至個別的密封電極。Embodiments of the present invention provide a method of fabricating a surge absorber comprising: preparing a non-conductive element; depositing a conductive coating on an outer surface of the non-conductive element using chemical vapor deposition, chemical vapor deposition The method rotates the non-conductive element and sprays the deposition solution in a high temperature environment; in the conductive plating film, at least one discharge gap is formed to constitute a surge absorbing element; in the container tube, a surge absorbing element is deposited, and In the container tube, a sealing electrode is sealed at both ends of the container tube, the container tube has an inert gas filled therein; and the lead wire is electrically connected to the individual sealing electrode.
導電性鍍膜包括含有重量百分比為0.5%至5%之氧化錫的銻錫氧化物。The conductive plating film includes antimony tin oxide containing 0.5% to 5% by weight of tin oxide.
導電性鍍膜的沉積步驟係執行於攝氏600度或以上,且高於密封步驟所用之溫度。The deposition step of the conductive coating is performed at 600 degrees Celsius or higher and higher than the temperature used for the sealing step.
本發明另一具體實施例提供一種浪湧吸收器,包括:容器管,具有惰性氣體填充於其中;一對密封電極,設置於容器管的兩側且電性連接於個別的引線;以及浪湧吸收元件,電性連接至密封電極,其中浪湧吸收單元包括非導電性元件、導電性鍍膜,沉積於非導電性元件的外表面之上,以及分隔導電性鍍膜之至少一放電間隙,並且導電性鍍膜包括含有氧化錫(SnO2)與氧化銻(Sb2O3)的銻錫氧化物且係藉由化學氣相沉積設備沉積於非導電性鍍膜之外表面之上。Another embodiment of the present invention provides a surge absorber comprising: a container tube having an inert gas filled therein; a pair of sealing electrodes disposed on both sides of the container tube and electrically connected to individual leads; and a surge The absorbing member is electrically connected to the sealing electrode, wherein the surge absorbing unit comprises a non-conductive member, a conductive coating, deposited on the outer surface of the non-conductive member, and at least one discharge gap separating the conductive coating, and is electrically conductive The coating includes a antimony tin oxide containing tin oxide (SnO 2 ) and antimony oxide (Sb 2 O 3 ) and is deposited on the outer surface of the non-conductive coating by a chemical vapor deposition apparatus.
包含於導電性鍍膜之氧化銻具有0.5%至5%的重量百分比。The cerium oxide contained in the conductive plating film has a weight percentage of 0.5% to 5%.
不同於習知以熱處理作為後處理之濺鍍法,因為本發明浪湧吸收器係在高溫環境下,使用CVD方法將沉積溶液噴灑和沉積在被旋轉之非導電性元件的外表面之上,因此可以避免因進行熱處理造成之電阻值增加,並且避免本發明浪湧吸收器的反應時間因電阻值增加而減少。Unlike the conventional sputtering method in which heat treatment is used as a post-treatment, since the surge absorber of the present invention sprays and deposits a deposition solution on the outer surface of the rotated non-conductive member by a CVD method in a high temperature environment, Therefore, an increase in the resistance value due to the heat treatment can be avoided, and the reaction time of the surge absorber of the present invention can be prevented from being reduced due to an increase in the resistance value.
導電性鍍膜係使用CVD方法沉積於非導電性元件之上,所以即使在相同厚度下,導電性鍍膜仍能具有不同電阻值,因此易於調整導電性鍍膜的厚度。Since the conductive plating film is deposited on the non-conductive element by the CVD method, the conductive plating film can have different resistance values even at the same thickness, and thus it is easy to adjust the thickness of the conductive plating film.
導電性鍍膜係使用CVD方法在非導電性元件之上均勻地沉積固定的厚度。藉此,當進行浪湧模擬時,每一次施加浪湧所量到放電啟始電壓能夠穩定地落在既定範圍內。The conductive coating is uniformly deposited on the non-conductive element by a CVD method to a fixed thickness. Thereby, when the surge simulation is performed, the discharge start voltage can be stably settled within a predetermined range every time a surge is applied.
本發明之浪湧吸收器將搭配所附圖式說明如下。The surge absorber of the present invention will be described below in conjunction with the drawings.
參考第1圖,本發明浪湧吸收器10包括含有惰性氣體的容器管11、一對密封電極12,設置於容器管11的兩端且電性連接於個別的引線13、浪湧吸收元件15,絕緣設置於容器管11之內,以及一對端電極14,設置於浪湧吸收器15的兩端且電性連接於密封電極12與浪湧吸收元件15。Referring to Fig. 1, a surge absorber 10 of the present invention includes a container tube 11 containing an inert gas, and a pair of sealing electrodes 12 disposed at both ends of the container tube 11 and electrically connected to the individual leads 13 and the surge absorbing member 15. The insulation is disposed in the container tube 11 and the pair of end electrodes 14 are disposed at both ends of the surge absorber 15 and are electrically connected to the sealing electrode 12 and the surge absorbing element 15.
具體而言,圓柱形的容器管11係由玻璃與陶瓷材料組成。圓柱形的容器管11係由位於其兩端的密封電極12所密封,並且具有惰性氣體填充於其中。Specifically, the cylindrical container tube 11 is composed of a glass and a ceramic material. The cylindrical container tube 11 is sealed by a sealing electrode 12 at both ends thereof and has an inert gas filled therein.
如上述,密封電極12設置於容器管11的兩端且電性連接於個別的引線13。As described above, the sealing electrode 12 is provided at both ends of the container tube 11 and is electrically connected to the individual lead wires 13.
如上述,端電極14設置於浪湧吸收器15的兩端且電性連接於密封電極12與浪湧吸收元件15。當密封電極12與浪湧吸收器15直接電性相連時,端電極14可以省略。As described above, the terminal electrodes 14 are provided at both ends of the surge absorber 15 and are electrically connected to the sealing electrode 12 and the surge absorbing element 15. When the sealing electrode 12 is directly electrically connected to the surge absorber 15, the terminal electrode 14 can be omitted.
浪湧吸收元件15絕緣設置於容器管11之內。浪湧吸收元件15包括非導電性元件16、導電性鍍膜17,用以封閉非導電性元件16且作為放電電極,以及分隔導電性鍍膜17之至少一放電間隙18。The surge absorbing member 15 is insulated from the container tube 11. The surge absorbing element 15 includes a non-conductive element 16 and a conductive plating film 17 for blocking the non-conductive element 16 as a discharge electrode and separating at least one discharge gap 18 of the conductive plating film 17.
非導電性元件16係由圓柱形鋁棒構成。The non-conductive element 16 is composed of a cylindrical aluminum rod.
導電性鍍膜17係由導電的金屬氧化物構成。具體而言,銻錫氧化物(ATO)鍍膜係用如第2圖所示之化學氣相沉積(CVD)設備沉積在非導電性元件16的外表面之上。The conductive plating film 17 is made of a conductive metal oxide. Specifically, an antimony tin oxide (ATO) coating is deposited on the outer surface of the non-conductive member 16 by a chemical vapor deposition (CVD) apparatus as shown in FIG.
如第2圖所示,CVD設備20包括加熱爐21,加熱爐21之中設置有料桶22,料桶22之中設置有許多非導電性元件16、旋轉馬達23,其係可旋轉地耦接於料桶22並旋轉料桶22,以及噴霧器24,其噴灑沉積溶液以將導電性鍍膜17沉積於非導電性元件16之上,非導電性元件16係於加熱爐21之中被沉積。As shown in Fig. 2, the CVD apparatus 20 includes a heating furnace 21 in which a drum 22 is disposed. The drum 22 is provided with a plurality of non-conductive elements 16 and a rotary motor 23 rotatably coupled thereto. The drum 22 is rotated and the drum 22 is rotated, and a sprayer 24 is sprayed to deposit a conductive coating 17 on the non-conductive member 16, and the non-conductive member 16 is deposited in the heating furnace 21.
噴霧器24包括沉積溶液儲存槽24a、閥門24b,其設置於沉積溶液儲存槽24a之上,以及噴嘴24c,其係藉由軟管連接於閥門24b並向加熱爐21之中的料桶22噴灑沉積溶液。未提及之元件符號25代表溫度調節器,其係維持加熱爐21於高溫。溫度調節器25維持加熱爐21內部的溫度於攝氏600度或以上。The sprayer 24 includes a deposition solution storage tank 24a, a valve 24b disposed above the deposition solution storage tank 24a, and a nozzle 24c which is connected to the valve 24b by a hose and spray-deposited to the barrel 22 in the heating furnace 21. Solution. The component symbol 25, which is not mentioned, represents a temperature regulator which maintains the heating furnace 21 at a high temperature. The temperature regulator 25 maintains the temperature inside the heating furnace 21 at 600 degrees Celsius or more.
總結來說,本發明浪湧吸收器10係使用CVD方法所製造,上述方法包括在高溫環境下將沉積溶液噴灑與沉積於旋轉的非導電性元件16的外表面之上。習知方法係使用濺鍍方法然後進行後處理,或熱處理,以增加導電性鍍膜的鍵結力,與習知方法不同的是,當導電性鍍膜17依上述法沉積於非導電性元件16之上時,CVD方法不需要進行熱處理,因此能夠避免因熱處理造成的電阻值增加。In summary, the surge absorber 10 of the present invention is fabricated using a CVD process that includes spraying and depositing a deposition solution onto the outer surface of the rotating non-conductive element 16 in a high temperature environment. Conventional methods use a sputtering method followed by post-treatment, or heat treatment to increase the bonding force of the conductive plating film. Unlike the conventional method, when the conductive plating film 17 is deposited on the non-conductive member 16 by the above method, In the upper case, the CVD method does not require heat treatment, so that an increase in the resistance value due to the heat treatment can be avoided.
此外,當浪湧吸收器處於高電壓之下,習知方法製造的導電性鍍膜17必須大於或等於既定厚度,與習知方法不同的是,因為導電性鍍膜17係以CVD方法所形成,本發明浪湧吸收器10的特徵在於,導電性鍍膜17的厚度能被輕易地調整,即使在相同厚度的情況下,CVD方法也能夠製造具有不同電阻值的導電性鍍膜。同時,CVD方法能夠持續地控制浪湧造成之累積損害。In addition, when the surge absorber is under a high voltage, the conductive plating film 17 manufactured by a conventional method must be greater than or equal to a predetermined thickness, which is different from the conventional method because the conductive plating film 17 is formed by a CVD method. The surge absorber 10 of the invention is characterized in that the thickness of the conductive plating film 17 can be easily adjusted, and the CVD method can produce a conductive plating film having different resistance values even in the case of the same thickness. At the same time, the CVD method can continuously control the cumulative damage caused by the surge.
此外,本發明浪湧吸收器10的特徵在於,導電性鍍膜17係以CVD方法沉積於非導電性元件16的外表面之上,導電性鍍膜17能夠具有固定的厚度。當進行浪湧模擬而多次施加浪湧所量到之放電啟始電壓的比較結果值,每一次施加浪湧所量到放電啟始電壓能夠穩定地落在既定範圍內。Further, the surge absorber 10 of the present invention is characterized in that the conductive plating film 17 is deposited on the outer surface of the non-conductive member 16 by a CVD method, and the conductive plating film 17 can have a fixed thickness. When the surge simulation is performed and the comparison result of the discharge start voltage measured by the surge is applied a plurality of times, the discharge start voltage can be stably settled within a predetermined range every time the surge is applied.
此外,在導電性鍍膜17的外表面之上能夠形成鈍化層(未圖示)。導電性陶瓷薄膜能夠作為鈍化層。當氣體放電時,鈍化層能夠避免氣體放電產生之放電能量轉移至導電性鍍膜,藉此保護導電性鍍膜免於遭受損害。Further, a passivation layer (not shown) can be formed on the outer surface of the conductive plating film 17. The conductive ceramic film can function as a passivation layer. When the gas is discharged, the passivation layer can prevent the discharge energy generated by the gas discharge from being transferred to the conductive plating film, thereby protecting the conductive plating film from damage.
鈍化層係由具有強共價鍵特性之導電性陶瓷形成,例如導電性氧化物、導電性氮化物、導電性碳化物、導電性氟化物、導電性矽化物,或是類似化合物。The passivation layer is formed of a conductive ceramic having strong covalent bond characteristics, such as a conductive oxide, a conductive nitride, a conductive carbide, a conductive fluoride, a conductive telluride, or the like.
換言之,相較於導電性鍍膜17,以上述材料形成之鈍化層具有相對較長的反應時間,但其具有高熔點,且具有極佳的耐浪湧與耐熱特性。藉此,其能夠有效避免放電能量被轉移至導電性鍍膜。In other words, the passivation layer formed of the above material has a relatively long reaction time as compared with the conductive plating film 17, but it has a high melting point and has excellent surge resistance and heat resistance. Thereby, it is possible to effectively prevent the discharge energy from being transferred to the conductive plating film.
放電間隙18將導電性鍍膜17分隔為複數導電性鍍膜,並且被分隔之導電性鍍膜17作為放電電極。因為放電間隙18上所形成的放電能量隨著放電間隙18的數量的增加而減少,故放電間隙18將導電性鍍膜17分隔為複數導電性鍍膜。The discharge gap 18 divides the conductive plating film 17 into a plurality of conductive plating films, and the divided conductive plating film 17 serves as a discharge electrode. Since the discharge energy formed on the discharge gap 18 decreases as the number of the discharge gaps 18 increases, the discharge gap 18 separates the conductive plating film 17 into a plurality of conductive plating films.
接著,本發明浪湧吸收器的製造方法將搭配第3圖說明如下。Next, a method of manufacturing the surge absorber of the present invention will be described below with reference to FIG.
(a) 為了製造浪湧吸收器10,首先,準備非導電性元件16。為此,將圓柱形鋁棒裁切為既定長度。(a) In order to manufacture the surge absorber 10, first, the non-conductive element 16 is prepared. To this end, the cylindrical aluminum rod is cut to a predetermined length.
(b) 準備好之非導電性元件16被裝入CVD設備。非導電性元件16被旋轉,且沉積溶液在攝氏約600度或以上的高溫環境下被噴灑至非導電性元件16的外表面之上,導電性鍍膜17藉此而被沉積。在本實施例中,沉積在非導電性元件16上的導電性鍍膜17係導電性金屬氧化物,較佳為ATO。(b) The prepared non-conductive element 16 is loaded into the CVD apparatus. The non-conductive member 16 is rotated, and the deposition solution is sprayed onto the outer surface of the non-conductive member 16 in a high-temperature environment of about 600 degrees Celsius or more, and the conductive plating film 17 is thereby deposited. In the present embodiment, the conductive plating film 17 deposited on the non-conductive element 16 is a conductive metal oxide, preferably ATO.
依此方式,沉積在非導電性元件16上的導電性鍍膜17係ATO,因為若僅將氧化錫(SnO2)沉積在非導電性元件上,要得到所需的電阻值是很困難的,因此,應該包含少量的氧化銻(Sb2O3)方能得到所需的電阻值。In this manner, the conductive plating film 17 deposited on the non-conductive element 16 is ATO, because if only tin oxide (SnO 2 ) is deposited on the non-conductive element, it is difficult to obtain a desired resistance value. Therefore, a small amount of bismuth oxide (Sb 2 O 3 ) should be included to obtain the desired resistance value.
具體而言,包含於導電性鍍膜17之內的氧化銻是一種有害材料(harmful material),其通常用來維持電阻的溫度係數(temperature coefficient of resistance,TCR)。然而,因為本發明浪湧吸收器10不需要維持TCR,所以導電性鍍膜17能夠僅含有少量的氧化銻,如上述。Specifically, cerium oxide contained in the conductive plating film 17 is a harmful material which is generally used to maintain a temperature coefficient of resistance (TCR). However, since the surge absorber 10 of the present invention does not need to maintain the TCR, the conductive plating film 17 can contain only a small amount of cerium oxide, as described above.
換言之,本發明之導電性鍍膜17包含氧化錫和氧化銻。在本實施例中,氧化錫的重量百分比較佳為95%至99.5%,氧化銻的重量百分比較佳為0.5%至5%。In other words, the conductive plating film 17 of the present invention contains tin oxide and cerium oxide. In the present embodiment, the weight percentage of tin oxide is preferably 95% to 99.5%, and the weight percentage of cerium oxide is preferably 0.5% to 5%.
(C) 端電極14被覆蓋在非導電性元件16的兩端,導電性鍍膜17沉積在非導電性元件16之上。在本步驟中,若浪湧吸收器10其上沉積有導電性鍍膜17的非導電性元件16直接電性連接於密封電極12,則覆蓋步驟可以省略。(C) The terminal electrode 14 is covered at both ends of the non-conductive member 16, and the conductive plating film 17 is deposited on the non-conductive member 16. In this step, if the non-conductive element 16 on which the conductive coating film 17 is deposited on the surge absorber 10 is directly electrically connected to the sealing electrode 12, the covering step can be omitted.
(d) 在端電極14被覆蓋之後,接著形成將導電性鍍膜17分隔為複數導電性鍍膜的放電間隙18。浪湧吸收裝置15藉此而被完成。導電性鍍膜17以放電間隙18的方式被分隔,以使被分隔之導電性鍍膜17作為放電電極。(d) After the terminal electrode 14 is covered, a discharge gap 18 for separating the conductive plating film 17 into a plurality of conductive plating films is formed. The surge absorbing device 15 is thereby completed. The conductive plating film 17 is partitioned so as to discharge the gap 18 so that the divided conductive plating film 17 serves as a discharge electrode.
(e) 在浪湧吸收裝置15完成之後,接著在容器管11之內浪湧沉積吸收裝置15,並且分別將密封電極12密封在容器管11的兩端。將惰性氣體依此封入被密封電極12密封之容器管11之內。設置於浪湧吸收元件15兩端之端電極14係電性連接於個別的密封電極12。(e) After the surge absorbing device 15 is completed, the absorption device 15 is then surgely deposited inside the container tube 11, and the sealing electrode 12 is sealed at both ends of the container tube 11, respectively. The inert gas is thereby enclosed in the container tube 11 sealed by the sealed electrode 12. The terminal electrodes 14 provided at both ends of the surge absorbing member 15 are electrically connected to the individual sealing electrodes 12.
上述將密封電極12密封於容器管11兩端的密封步驟係進行於攝氏約600度或以上的高溫環境之下。相較之下,習知浪湧吸收器的導電性鍍膜是使用濺鍍法所沉積製造。在此情況下,導電性鍍膜可能會因密封步驟在高溫環境下製造而有所改變。然而,在本發明浪湧吸收器10之中,導電性鍍膜17的沉積步驟係在類似於且較佳地大於密封溫度的高溫環境下所製造,所以當進行密封步驟時,導電性鍍膜不會受到高溫造成的應力。The sealing step of sealing the sealing electrode 12 to both ends of the container tube 11 is carried out under a high temperature environment of about 600 degrees Celsius or above. In contrast, the conductive coating of the conventional surge absorber is deposited by sputtering. In this case, the conductive coating may be changed due to the sealing step being manufactured in a high temperature environment. However, in the surge absorber 10 of the present invention, the deposition step of the conductive plating film 17 is performed in a high temperature environment similar to, and preferably higher than, the sealing temperature, so when the sealing step is performed, the conductive plating film does not Subject to stress caused by high temperatures.
(f) 將浪湧吸收元件15密封之後,將引線13連接至個別的密封電極12。藉此,本發明浪湧吸收器10製造完成。(f) After the surge absorbing element 15 is sealed, the lead 13 is connected to the individual sealing electrode 12. Thereby, the surge absorber 10 of the present invention is completed.
不同於習知以熱處理作為後處理之濺鍍法,因為本發明浪湧吸收器10係在高溫環境下,使用CVD方法將沉積溶液噴灑和沉積在被旋轉之非導電性元件16的外表面之上,因此可以避免因進行熱處理造成之電阻值增加,並且避免本發明浪湧吸收器10的反應時間因電阻值增加而減少。Unlike the conventional sputtering method in which heat treatment is used as a post-treatment, since the surge absorber 10 of the present invention is used in a high temperature environment, a deposition solution is sprayed and deposited on the outer surface of the non-conductive member 16 to be rotated using a CVD method. Therefore, it is possible to avoid an increase in the resistance value due to the heat treatment, and to prevent the reaction time of the surge absorber 10 of the present invention from being decreased due to an increase in the resistance value.
如上述,因為本發明浪湧吸收器10係使用CVD方法將導電性鍍膜17沉積於非導電性元件16之上,所以即使在相同厚度下,導電性鍍膜仍能具有不同電阻值,因此易於調整導電性鍍膜17的厚度。As described above, since the surge absorber 10 of the present invention deposits the conductive plating film 17 on the non-conductive member 16 by the CVD method, the conductive plating film can have different resistance values even at the same thickness, and thus it is easy to adjust. The thickness of the conductive plating film 17.
如上述,因為本發明浪湧吸收器係使用CVD方法將導電性鍍膜17在非導電性元件16之上均勻地沉積固定的厚度,所以當進行浪湧模擬時,每一次施加浪湧所量到放電啟始電壓能夠穩定地落在既定範圍內。As described above, since the surge absorber of the present invention uniformly deposits the conductive plating film 17 on the non-conductive member 16 by a CVD method, when the surge simulation is performed, the amount of surge is applied every time. The discharge starting voltage can stably fall within a predetermined range.
此外如上述,因為本發明浪湧吸收器10係使用CVD方法將導電性鍍膜17沉積於非導電性元件16之上,且導電性鍍膜17係由包含銻之ATO所組成,所以能夠提供浪湧吸收器10既定電阻值。在本實施例中,因為所使用之ATO為有害材料,故其少量使用為佳。在本發明浪湧吸收器10中,不需要維持TCR,所以當沉積導電性鍍膜17時,其能僅含有少量有害的銻。Further, as described above, since the surge absorber 10 of the present invention deposits the conductive plating film 17 on the non-conductive element 16 by the CVD method, and the conductive plating film 17 is composed of ATO containing germanium, it is possible to provide a surge. The absorber 10 has a predetermined resistance value. In the present embodiment, since the ATO used is a hazardous material, it is preferably used in a small amount. In the surge absorber 10 of the present invention, it is not necessary to maintain the TCR, so that when the conductive plating film 17 is deposited, it can contain only a small amount of harmful ruthenium.
此外如上述,不同於導電性鍍膜17會在密封電極12之密封步驟而所改變的習知方法,因為本發明浪湧吸收器10的導電性鍍膜17係在高溫環境下,使用CVD方法將沉積溶液噴灑和沉積在被旋轉之非導電性元件16的外表面之上,所以導電性鍍膜不會受到高溫造成的應力。Further, as described above, unlike the conventional method in which the conductive plating film 17 is changed in the sealing step of the sealing electrode 12, since the conductive plating film 17 of the surge absorber 10 of the present invention is in a high temperature environment, deposition is performed using a CVD method. The solution is sprayed and deposited on the outer surface of the non-conductive element 16 being rotated, so that the conductive coating is not subjected to stress caused by high temperature.
本發明已經由數種實施例揭露如上。習知技藝者應能以本發明所揭露的技術內容作為基礎來設計或修改其他的製程或架構來達到相同於本發明之目的和/或優點。習知技藝者應能知悉在不脫離本發明的精神和架構的前提下,當可作些許更動、替換和置換。本發明之範疇當視所附申請專利範圍而定。The invention has been disclosed above by several embodiments. The skilled artisan will be able to design or modify other processes or architectures based on the technical aspects disclosed herein to achieve the objects and/or advantages of the present invention. It will be appreciated by those skilled in the art that a number of changes, substitutions and substitutions can be made without departing from the spirit and scope of the invention. The scope of the invention is determined by the scope of the appended claims.
10...浪湧吸收器10. . . Surge absorber
11...容器管11. . . Container tube
12...密封電極12. . . Sealed electrode
13...引線13. . . lead
14...端電極14. . . Terminal electrode
15...浪湧吸收元件15. . . Surge absorption component
16...非導電性元件16. . . Non-conductive component
17...導電性鍍膜17. . . Conductive coating
18...放電間隙18. . . Discharge gap
20...CVD設備20. . . CVD equipment
21...加熱爐twenty one. . . Heating furnace
22...料桶twenty two. . . Bucket
23...旋轉馬達twenty three. . . Rotary motor
24...噴霧器twenty four. . . sprayer
24a...沉積溶液儲存槽24a. . . Deposition solution storage tank
24b...閥門24b. . . valve
24c...噴嘴24c. . . nozzle
25...溫度調節器25. . . temperature regulator
本領域具有通常知識者當能根據上述具體實施例,搭配所附圖式了解本發明上述與其他目的、技術特徵與優點,其中:Those skilled in the art will be able to understand the above and other objects, features and advantages of the present invention in light of the above-described embodiments.
第1圖為本發明具體實施例浪湧吸收器之截面圖;Figure 1 is a cross-sectional view of a surge absorber of a specific embodiment of the present invention;
第2圖圖示用於製造本發明具體實施例之浪湧吸收器的CVD設備;以及Figure 2 illustrates a CVD apparatus for fabricating a surge absorber of a particular embodiment of the present invention;
第3圖(a)~(f)為本實施例具體實施例之浪湧吸收器的製造方法示意圖。Fig. 3 (a) to (f) are schematic views showing a method of manufacturing a surge absorber according to a specific embodiment of the present embodiment.
10...浪湧吸收器10. . . Surge absorber
11...容器管11. . . Container tube
12...密封電極12. . . Sealed electrode
13...引線13. . . lead
14...端電極14. . . Terminal electrode
15...浪湧吸收元件15. . . Surge absorption component
16...非導電性元件16. . . Non-conductive component
17...導電性鍍膜17. . . Conductive coating
18...放電間隙18. . . Discharge gap
Claims (3)
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KR1020110083587A KR101226328B1 (en) | 2011-08-22 | 2011-08-22 | Surge absorber and manufacturing method thereof |
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TW201310830A TW201310830A (en) | 2013-03-01 |
TWI533544B true TWI533544B (en) | 2016-05-11 |
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DE (1) | DE112012003490T5 (en) |
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JPH0443584A (en) * | 1990-06-08 | 1992-02-13 | Aibetsukusu Kk | Gas-tight structure of surge absorbing element |
JP3969098B2 (en) * | 2002-01-17 | 2007-08-29 | 三菱マテリアル株式会社 | surge absorber |
TWI380545B (en) * | 2003-02-28 | 2012-12-21 | Mitsubishi Materials Corp | Surge absorber and manufacturing method thereof |
KR100604250B1 (en) * | 2004-02-17 | 2006-07-26 | 스마트전자 주식회사 | Surge absorber |
KR100550497B1 (en) * | 2004-02-17 | 2006-02-10 | 스마트전자 주식회사 | Manufacturing method for surge absorber |
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2011
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- 2011-11-09 TW TW100140844A patent/TWI533544B/en active
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