TWI529399B - Test system, phase detection device and method of the same - Google Patents

Description

Test system and phase detecting device and method thereof

The present invention relates to a phase detection technique, and more particularly to a test system and a phase detection apparatus and method thereof.

The components of the basic AC circuit include a resistor, an inductor, and a capacitor. These circuit components have a phase difference in current and voltage due to the response of the AC sine wave. Some test systems are equipped with phase detection devices to detect the phase of the voltage signal of the circuit component under test. Among them, the phase can be detected by the real part and the imaginary part of the voltage signal. However, when the phase of the voltage signal is too close to 0 or 90 degrees, it is easy to cause a great error due to the influence of the internal components of the phase detecting device. For example, in the case where the real part is measured and the imaginary part is 0.001, if an error of 1 millivolt is generated, the calculated angular error will be 100%.

Therefore, how to design a new phase detecting device and method to improve the above disadvantages is an urgent problem to be solved in the industry.

Therefore, an aspect of the present invention provides a phase detecting device including: a signal generating module, an analog multiplication module, and a processing module. The signal generating module generates a driving voltage signal to the module to be tested, so that the module to be tested generates an output voltage signal having a phase to be tested. The analog multiplication module receives the output voltage signal to multiply with the reference voltage signal to generate a DC offset voltage signal. The processing module calculates the phase to be measured according to the DC offset voltage signal and the reference voltage signal to determine whether the difference between the phase to be measured and one of the phase minimum and the phase maximum is less than a critical value. When the difference between the phase to be measured and the phase minimum and the phase maximum is less than the threshold, the processing module controls the signal generating module to phase shift the driving voltage signal, so that the phase of the output voltage signal is phased according to the phase After the offset is offset to the middle range between the phase minimum and the phase maximum, the phase-shifted output voltage signal is received by the analog multiplication module to multiply with the reference voltage signal to generate a phase offset. The DC offset voltage signal, the processing module calculates the phase to be measured according to the DC offset voltage signal, the reference voltage signal, and the phase offset after the phase offset.

According to an embodiment of the invention, the intermediate range is a range of plus or minus ten degrees of the phase intermediate value between the phase minimum and the phase maximum.

According to another embodiment of the invention, the phase minimum is 0 degrees, the phase maximum is 90 degrees and the phase intermediate value is 45 degrees.

According to still another embodiment of the present invention, the analog multiplication module further includes: an analog multiplier and a low pass filter. The analog multiplier receives the output voltage signal to multiply the reference voltage signal to generate a product voltage signal. low The pass filter filters the product voltage signal to generate a DC offset voltage signal.

According to still another embodiment of the present invention, the signal generating module comprises: a signal generator and a driving circuit. The signal generator generates a control signal. The driving circuit generates a driving voltage signal according to the control signal.

Another object of the present invention is to provide a test system comprising: a jig, a multi-channel switcher, and a phase detecting device. The fixture is electrically connected to the module to be tested. The phase detecting device comprises: a signal generating module, an analog multiplication module and a processing module. The signal generating module is electrically connected to the multi-channel switcher, and is configured to generate a driving voltage signal to be transmitted to the module to be tested through the multi-channel switcher and the jig, so that the module to be tested generates an output voltage signal having a phase to be tested. The analog multiplication module is electrically connected to the multi-channel switcher, and receives the output voltage signal through the fixture and the multi-channel switcher to multiply with the reference voltage signal to generate a DC offset voltage signal. The processing module calculates the phase to be measured according to the DC offset voltage signal and the reference voltage signal to determine whether the difference between the phase to be measured and one of the phase minimum and the phase maximum is less than a critical value. When the difference between the phase to be measured and the phase minimum and the phase maximum is less than the threshold, the processing module controls the signal generating module to phase shift the driving voltage signal, so that the phase of the output voltage signal is phased according to the phase After the offset is offset to the middle range between the phase minimum and the phase maximum, the analog multiplication module receives the output voltage signal to multiply with the reference voltage signal to generate a DC offset voltage signal, and the processing module is configured according to The DC offset voltage signal, the reference voltage signal, and the phase offset calculate the phase to be measured.

According to an embodiment of the invention, the intermediate range is a range of plus or minus ten degrees of the phase intermediate value between the phase minimum and the phase maximum.

According to another embodiment of the invention, the phase minimum is 0 degrees, the phase maximum is 90 degrees and the phase intermediate value is 45 degrees.

According to still another embodiment of the present invention, the analog multiplication module further includes: an analog multiplier and a low pass filter. The analog multiplier receives the output voltage signal to multiply the reference voltage signal to generate a product voltage signal. The low pass filter filters the product voltage signal to produce a DC offset voltage signal.

According to still another embodiment of the present invention, the signal generating module comprises: a signal generator and a driving circuit. The signal generator generates a control signal. The driving circuit generates a driving voltage signal according to the control signal.

It is still another object of the present invention to provide a phase detecting method for use in a phase detecting device. The phase detection method includes the following steps. The signal generating module generates a driving voltage signal to the module to be tested, so that the module to be tested generates an output voltage signal having a phase to be tested; and the analog multiplication module receives the output voltage signal to perform phase response with the reference voltage signal. Multiply, generate a DC offset voltage signal; the processing module calculates the phase to be measured according to the DC offset voltage signal and the reference voltage signal to determine whether the phase to be measured is different from the phase minimum and the phase maximum value. Less than the critical value; when the difference between the phase to be measured and the phase minimum and the phase maximum is less than the critical value, the processing module controls the signal generation module to phase shift the driving voltage signal, so that the output voltage signal is waiting The phase is shifted according to the phase offset to the intermediate range between the phase minimum and the phase maximum; by analogy multiplication module Receiving the phase offset output voltage signal to multiply with the reference voltage signal, generating a phase offset DC offset voltage signal; and processing the module according to the phase offset DC offset voltage signal, The reference voltage signal and the phase offset are used to calculate the phase to be measured.

According to an embodiment of the invention, the intermediate range is a range of plus or minus ten degrees of the phase intermediate value between the phase minimum and the phase maximum.

According to another embodiment of the invention, the phase minimum is 0 degrees, the phase maximum is 90 degrees and the phase intermediate value is 45 degrees.

According to still another embodiment of the present invention, the analog multiplication module further includes an analog multiplier and a low pass filter, and the phase detection method further comprises: receiving the output voltage signal by the analog multiplier to multiply with the reference voltage signal, and generating a product voltage signal; and filtering the product voltage signal by a low pass filter to generate a DC offset voltage signal.

According to still another embodiment of the present invention, the signal generating module includes a signal generator and a driving circuit. The phase detecting method further includes: generating a control signal by the signal generator; and generating a driving voltage signal according to the control signal by the driving circuit.

An advantage of the present invention is that the phase detecting device of the present invention can first determine the phase of the phase to be measured by detecting, and further output the voltage having the phase to be tested when the phase to be measured is too close to the phase minimum or the phase maximum. The signal is phase shifted to obtain a more accurate detection result, and the above purpose is easily achieved.

1‧‧‧ phase detection device

10‧‧‧Signal Generation Module

100‧‧‧Signal Generator

102‧‧‧ drive circuit

12‧‧‧ analog multiplication module

120‧‧‧ analog multiplier

122‧‧‧Low-pass filter

14‧‧‧Processing module

16‧‧‧ analog digital conversion module

2‧‧‧ modules to be tested

3‧‧‧Test system

30‧‧‧ fixture

32‧‧‧Multichannel switcher

400‧‧‧ Phase detection method

401-408‧‧‧Steps

1 is a block diagram of a phase detecting device according to an embodiment of the present invention; FIG. 2 is a schematic diagram of an output voltage signal according to an embodiment of the present invention; and FIG. 3 is a test system according to an embodiment of the present invention; FIG. 4 is a flow chart of a phase detecting method according to an embodiment of the present invention.

Please refer to Figure 1. 1 is a block diagram of a phase detecting device 1 according to an embodiment of the present invention. The phase detecting device 1 includes a signal generating module 10, an analog multiplication module 12, and a processing module 14.

In one embodiment, the signal generation module 10 includes a signal generator 100 and a drive circuit 102. The signal generator 100 generates the control signal CTL to enable the driving circuit 102 to generate the driving voltage signal Vdrive to the module under test 2 according to the control signal CTL. The module under test 2 generates an output voltage signal Vout having a phase θ to be measured according to the driving voltage signal Vdrive. In various embodiments, the module under test 2 may include different types of circuits such as, but not limited to, a capacitive circuit.

In an embodiment, the analog multiplication module 12 includes an analog multiplier 120 and a low pass filter 122. The analog multiplier 120 receives the output voltage signal Vout to be multiplied by the reference voltage signal Vref to generate a product voltage. Signal Vm. The low pass filter 122 further filters the product voltage signal Vm to filter out the AC component and generate a DC offset voltage signal Vdc.

In one embodiment, the phase to be measured θ is the phase difference between the voltage and the current of the output voltage signal Vout, and is determined by the circuit in the module 2 to be tested that generates the output voltage signal Vout. For example, when the module to be tested 2 includes a capacitance circuit formed by parallel capacitors and resistors, the resistor will determine the real part of the overall impedance, and the capacitance will determine the imaginary part of the overall impedance. The larger the relative resistance of the resistor, the smaller the phase θ of the output voltage signal Vout to be measured, and the smaller the relative capacitance of the resistor, the larger the phase θ of the output voltage signal Vout to be measured.

In one embodiment, the measured phase θ of the output voltage signal Vout is in the range of 0 degrees to 90 degrees, wherein 0 degrees is the phase minimum value and 90 degrees is the phase maximum value. When the relative capacitance of the resistor is larger, the phase θ of the output voltage signal Vout is closer to 0 degree, and the smaller the relative capacitance of the resistor is, the closer the phase θ of the output voltage signal Vout is to 90 degrees.

When the phase of the reference voltage signal Vref is 0 degrees, the DC offset voltage signal Vdc generated by multiplying the output voltage signal Vout will be the real part of the output voltage signal Vout. When the phase of the reference voltage signal Vref is 90 degrees, the DC offset voltage signal Vdc generated by multiplying the output voltage signal Vout will be the imaginary part of the output voltage signal Vout.

The processing module 14 receives the DC offset voltage signal Vdc from the analog multiplication module 12. In an embodiment, the phase detecting device 1 may include an analog digital conversion module 16 (identified by the ADC in FIG. 1) to bias the DC The shift voltage signal Vdc is converted from an analog form to a digital form. Therefore, the processing module 14 will receive the DC offset voltage signal Vdc in digital form.

The processing module 14 further calculates the phase θ to be measured according to the DC offset voltage signal Vdc and the reference voltage signal Vref. In an embodiment, when the phase to be measured is θ, the real part detected is Real, and the imaginary part is Imag, the phase θ to be measured can be expressed by: θ=tan ^-1 (Imag/Real)

The processing module 14 further determines whether the difference between the phase θ to be measured and one of the phase minimum and the phase maximum is less than a critical value.

In an embodiment, when the processing module 14 determines that the difference between the phase θ to be measured and one of the phase minimum and the phase maximum is less than a threshold, the component that is to be measured is not susceptible to detection. If the components included in the analog multiplication module 12 and/or the analog digital conversion module 16 are affected, the measured phase values are more accurate. The processing module 14 takes the phase θ to be measured measured directly at this stage as the detection result.

In one embodiment, taking the above-mentioned phase minimum value as 0 degrees and the phase maximum value as 90 degrees as an example, the threshold value may be 10 degrees. Therefore, when the phase θ to be measured is not less than 10 degrees and not more than 80 degrees, the processing module 14 directly uses the phase θ to be measured measured at this stage as the detection result. In another embodiment, the threshold can be 20 degrees. Therefore, when the phase θ to be measured is not less than 20 degrees and not more than 70 degrees, the processing module 14 directly uses the phase θ to be measured measured at this stage as the detection result.

However, when the processing module 14 determines that the difference between the phase θ to be measured and one of the phase minimum and the phase maximum is less than a critical value, it indicates that the The measured phase θ is susceptible to the components being detected, such as the components included in the analog multiplication module 12, and the accuracy is greatly reduced.

At this time, the processing module 14 controls the signal generating module 10 to phase shift the driving voltage signal Vdrive. The module 2 to be tested will shift the phase θ of the original output voltage signal Vout according to the phase offset Δθ to the middle of the phase minimum value and the phase maximum value according to the phase-shifted driving voltage signal Vdrive'. range.

In one embodiment, the intermediate range is the range of positive and negative ten degrees of the phase intermediate value between the phase minimum and the phase maximum. Taking the above-mentioned phase minimum value as 0 degree and the phase maximum value as 90 degrees as an example, the phase intermediate value will be 45 degrees. Therefore, the intermediate range will be plus or minus ten degrees of 45 degrees. That is, the phase θ to be measured of the output voltage signal Vout is shifted to a range of plus or minus ten degrees of 45 degrees, that is, between 35 degrees and 55 degrees, according to the phase shift amount Δθ.

The analog multiplication module 12 receives the phase-shifted output voltage signal Vout' to multiply the reference voltage signal to generate a phase-shifted DC offset voltage signal Vdc'. As described above, the analog multiplier 120 in the analog multiplication module 12 will receive the output voltage signal Vout' to multiply the reference voltage signal Vref to generate the product voltage signal Vm', and then further the product voltage by the low pass filter 122. The signal Vm' is filtered and generates a DC offset voltage signal Vdc'.

The processing module 14 calculates the phase θ to be measured according to the DC offset voltage signal Vdc′ after the phase shift, the reference voltage signal Vref, and the phase shift amount Δθ. In an embodiment, in an embodiment, when the measured phase is θ, the detected real part is Real, and the imaginary part is Imag, and the phase offset is Δθ, the phase to be measured θ can be Representation: θ=tan ^-1 (Imag/Real)-△θ

In one embodiment, taking the above-mentioned phase minimum value as 0 degrees and the phase maximum value as 90 degrees as an example, the threshold value may be 10 degrees. Therefore, when the phase θ to be measured is less than 10 degrees and greater than 80 degrees, the processing module 14 performs phase shifting on the driving voltage signal Vdrive by the control signal generating module 10, and detects the phase offset as the detection result. In another embodiment, the threshold can be 20 degrees. Therefore, when the phase θ to be measured is less than 20 degrees and greater than 70 degrees, the processing module 14 performs phase shifting on the driving voltage signal Vdrive by the control signal generating module 10, and detects the phase offset as the detection result.

Please refer to Figure 2. Fig. 2 is a schematic diagram showing output voltage signals Vout and Vout' in an embodiment of the invention. The component of the output voltage signal Vout on the real axis is the real part Real, and the component on the imaginary part axis is the imaginary part Imag.

As shown in FIG. 2, in the present embodiment, since the real part Real of the output voltage signal Vout is much larger than the imaginary part Imag, the phase θ to be measured is too close to 0 degree. Therefore, by the phase shifting mechanism described above, the output voltage signal Vout' having the phase shift amount Δθ can be generated. At this time, the phase θ+Δθ of the phase-shifted output voltage signal Vout′ will not be easily affected by the component to be detected, such as the component included in the analog multiplication module 12, but the phase θ+Δθ may be measured first. Then, the phase offset Δθ is subtracted to obtain the phase θ to be measured.

Therefore, the phase detecting device 1 of the present invention can first determine the phase θ to be measured by detecting, and further the phase θ to be measured is too close to the phase. At the minimum or phase maximum, the output voltage signal with the phase θ to be measured is phase shifted to obtain a more accurate detection result.

Please refer to Figure 3. Figure 3 is a block diagram of a test system 3 in accordance with one embodiment of the present invention. The test system 3 includes a jig 30, a multi-channel switch 32, and a phase detecting device 1.

In the embodiment, the fixture 30 is electrically connected to the module 2 to be tested. The phase detecting device 1 transmits the driving voltage signals Vdrive and Vdrive' to the module 2 to be tested through the multi-channel switch 32 and the fixture 30 electrically connected to the jig 30, and receives the output voltage signal from the module 2 to be tested. Vout and Vout'.

Please refer to Figure 4. 4 is a flow chart of a phase detection method 400 in accordance with an embodiment of the present invention. The phase detecting method 400 can be applied to the phase detecting device 1 as shown in Fig. 1. Phase detection method 400 includes the following steps.

In step 401, the signal generating module 10 generates a driving voltage signal Vdrive to the module 2 to be tested, and causes the module under test 2 to generate an output voltage signal Vout having a phase θ to be measured.

In step 402, the analog voltage signal Vout is received by the analog multiplication module 12 to multiply the reference voltage signal Vref to generate a DC offset voltage signal Vdc.

In step 403, the processing module 14 calculates the phase to be measured according to the DC offset voltage signal Vdc and the reference voltage signal Vref, so as to determine, in step 404, whether the phase to be measured θ is different from one of the phase minimum and the phase maximum. The value is less than the critical value.

When the difference between the phase to be measured and the phase minimum and the phase maximum is not less than the threshold, the processing module 14 determines in step 405 that the phase θ to be measured is accurate.

When the difference between the phase to be measured and the phase minimum and the phase maximum is less than the threshold, the processing module 14 controls the signal generating module 10 to phase shift the driving voltage signal Vdrive in step 406, so that the test is to be tested. Module 2 produces an output voltage signal Vout' after phase shift.

In step 407, the analog voltage signal Vout' is received by the analog multiplication module 12 to multiply the reference voltage signal Vref to generate a DC offset voltage signal Vdc'.

In step 408, the processing module 14 calculates the phase θ to be measured according to the DC offset voltage signal Vdc, the reference voltage signal Vref, and the phase shift amount Δθ.

The present disclosure has been disclosed in the above embodiments, but it is not intended to limit the disclosure, and any person skilled in the art can make various changes and refinements without departing from the spirit and scope of the disclosure. The scope of protection of the disclosure is subject to the definition of the scope of the patent application.

1‧‧‧ phase detection device

10‧‧‧Signal Generation Module

100‧‧‧Signal Generator

102‧‧‧ drive circuit

12‧‧‧ analog multiplication module

120‧‧‧ analog multiplier

122‧‧‧Low-pass filter

14‧‧‧Processing module

16‧‧‧ analog digital conversion module

2‧‧‧ modules to be tested

Claims (15)

A phase detecting device includes: a signal generating module for generating a driving voltage signal to a module to be tested, and causing the module to be tested to generate an output voltage signal having a phase to be measured; an analog multiplication mode The group is configured to receive the output voltage signal for multiplication with a reference voltage signal to generate a DC offset voltage signal, and a processing module for calculating the DC offset voltage signal and the reference voltage signal The phase to be measured is used to determine whether the difference between the phase to be measured and one of the phase minimum and one phase maximum is less than a threshold; when the phase to be measured and the phase minimum and the phase maximum are The difference between the one of the thresholds is less than the threshold value, and the processing module controls the signal generating module to phase shift the driving voltage signal, so that the phase to be measured of the output voltage signal is offset according to a phase offset After the intermediate range between the minimum value of the phase and the maximum value of the phase, the analog multiplication module receives the output voltage signal after the phase offset, and the reference voltage The multiplication is performed to generate the DC offset voltage signal after the phase shift, and the processing module calculates the to-be-tested according to the DC offset voltage signal after the phase offset, the reference voltage signal, and the phase offset Phase. The phase detecting device of claim 1, wherein the intermediate range is a range of plus or minus ten degrees of the phase intermediate value and the phase intermediate value between the phase maximum values. The phase detecting device according to claim 2, wherein the phase minimum value is 0 degrees, the phase maximum value is 90 degrees, and the phase intermediate value is 45 degrees. The phase detecting device of claim 1, wherein the analog multiplication module further comprises: an analog multiplier for receiving the output voltage signal to multiply the reference voltage signal to generate a product voltage signal; A low pass filter is used to filter the product voltage signal to generate the DC offset voltage signal. The phase detecting device of claim 1, wherein the signal generating module comprises: a signal generator for generating a control signal; and a driving circuit for generating the driving voltage signal according to the control signal. A test system comprising: a fixture for electrically connecting to a module to be tested; a multi-channel switch; and a phase detecting device comprising: a signal generating module electrically connected to the multi-channel switching And generating a driving voltage signal through the multi-channel switch and The fixture is transmitted to the module to be tested, so that the module to be tested generates an output voltage signal having a phase to be tested; an analog multiplication module is electrically connected to the multichannel switch and passes through the treatment And the multi-channel switch receives the output voltage signal for multiplying with a reference voltage signal to generate a DC offset voltage signal; and a processing module for determining the DC offset voltage signal and the reference Calculating the phase to be measured by the voltage signal to determine whether the difference between the phase to be measured and one of the phase minimum and one phase maximum is less than a threshold; when the phase to be measured and the phase minimum and the phase The difference between one of the maximum values is less than the threshold value, and the processing module controls the signal generating module to phase shift the driving voltage signal, so that the phase to be measured of the output voltage signal is offset according to a phase After the amount is offset to an intermediate range between the minimum value of the phase and the maximum value of the phase, the analog multiplication module receives the output voltage signal for multiplication with the reference voltage signal. Serve to generate the DC offset voltage signal, the processing module based on the DC offset voltage signal, the reference voltage signal and calculating the phase shift amount of the test phase. The test system of claim 6, wherein the intermediate range is a range of plus or minus ten degrees of the phase minimum value and one of the phase intermediate values. The test system of claim 7, wherein the phase minimum is 0 degrees, the phase maximum is 90 degrees and the phase intermediate value is 45 degrees. The test system of claim 6, wherein the analog multiplication module further comprises: an analog multiplier for receiving the output voltage signal for multiplying the reference voltage signal to generate a product voltage signal; and And a low pass filter for filtering the product voltage signal to generate the DC offset voltage signal. The test system of claim 6, wherein the signal generating module comprises: a signal generator for generating a control signal; and a driving circuit for generating the driving voltage signal according to the control signal. A phase detecting method is applied to a phase detecting device, comprising: generating a driving voltage signal to a module to be tested by a signal generating module, and causing the module to be tested to generate an output having a phase to be tested a voltage signal; receiving the output voltage signal by a analog multiplication module to multiply with a reference voltage signal to generate a DC offset voltage signal; and a processing module according to the DC offset voltage signal and the Calculating the phase to be measured by the reference voltage signal to determine whether the difference between the phase to be measured and one of the phase minimum and one phase maximum is less than a threshold; when the phase to be measured and the phase minimum are The difference between one of the phase maximum values is less than the threshold value, and the processing module controls the signal production The generating module phase shifts the driving voltage signal, so that the phase to be measured of the output voltage signal is offset according to a phase offset to an intermediate range between the phase minimum and the phase maximum value; The analog multiplication module receives the phase offset signal of the output voltage signal to multiply the reference voltage signal to generate the phase offset signal after the phase offset; and the phase shift by the processing module The shifted DC offset voltage signal, the reference voltage signal, and the phase offset calculate the phase to be tested. The phase detecting method according to claim 11, wherein the intermediate range is a range of plus or minus ten degrees of the phase minimum value and the phase intermediate value between the phase maximum values. The phase detecting method according to claim 12, wherein the phase minimum value is 0 degrees, the phase maximum value is 90 degrees, and the phase intermediate value is 45 degrees. The phase detecting method of claim 11, wherein the analog multiplication module further comprises an analog multiplier and a low pass filter, the phase detecting method further comprising: receiving the output voltage signal by the analog multiplier, Multiplying the reference voltage signal to generate a product voltage signal; and filtering the product voltage signal by a low pass filter to generate the DC offset voltage signal. The phase detecting method of claim 11, wherein the signal generating module comprises a signal generator and a driving circuit, the phase detecting method further comprises: generating a control signal by the signal generator; and by using the driving The circuit generates the driving voltage signal according to the control signal.