TWI512311B - Spherical near-field measurement system and method - Google Patents
Spherical near-field measurement system and method Download PDFInfo
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本發明係有關於一種球面近場量測系統與方法，特別是有關於一種不需要在無響室中量測的球面近場量測系統與方法。The present invention relates to a spherical near-field measurement system and method, and more particularly to a spherical near-field measurement system and method that does not require measurement in a non-sound chamber.
一般來說，在通訊產品上市之前，需要量測天線之發射場型或電磁干擾以評估產品的品質及性能。電磁輻射源的場型分布通常都是在無響室(anechoic chamber)裡進行，如第1A圖所示，且發射天線與接收天線的距離至少必須符合2D2 /λ的遠場條件，其中D為發射/接收天線孔徑，λ為工作波長。習知技藝主要係利用大尺寸之接收天線搭配機械空間掃描以擷取場型分布。惟大尺寸之接收天線必須建構一大型無響室，方可符合發射天線與接收天線的距離大於2D2 /λ。然而，傳統之無響室的空間約為數十立方公尺或更大，其建構成本相當高昂，且不適於搬動。因此，若能在一般環境下做訊號輻射的量測，可省下龐大的成本，且可以不受時間與空間的限制。Generally speaking, before the communication products are put on the market, it is necessary to measure the emission field type or electromagnetic interference of the antenna to evaluate the quality and performance of the product. The field distribution of the electromagnetic radiation source is usually carried out in an anechoic chamber, as shown in Figure 1A, and the distance between the transmitting antenna and the receiving antenna must at least meet the far field condition of 2D 2 /λ, where D For the transmit/receive antenna aperture, λ is the operating wavelength. The conventional technique mainly uses a large-sized receiving antenna with a mechanical space scan to capture the field distribution. However, a large-sized receiving antenna must construct a large non-sounding chamber to meet the distance between the transmitting antenna and the receiving antenna by more than 2D 2 /λ. However, the space of the conventional soundless chamber is about tens of cubic meters or more, and its construction is quite high and is not suitable for moving. Therefore, if the measurement of signal radiation can be performed under the general environment, the huge cost can be saved, and it can be free from time and space restrictions.
第1B圖顯示在一般環境下量測天線之發射場型或電磁干擾的示意圖。如第1B圖所示，若在一般環境下量測天線時，因為沒有類似無 響室的密閉空間可以隔絕外在雜訊(ambient noise)，外在雜訊會干擾量測，造成量測的誤差。為了解決外在雜訊的干擾，可以將量測探頭靠近待測物，若量測探頭十分靠近待測物，則可以忽略外在雜訊。另外，除了外在雜訊外，輻射訊號在傳遞中產生的反射及散射，同樣會造成量測的誤差，因為在無響室的四面遍佈吸波體可以排除輻射訊號在傳遞中所產生的反射及散射。但是，在一般環境下，四周沒有類似無響室的吸波體可以排除訊號在傳遞中所產生的反射及散射。而訊號在傳遞中所產生的反射或散射會造成輻射電磁場量測的誤差，導致量測的不準確。Figure 1B shows a schematic diagram of the emission field or electromagnetic interference of the measuring antenna in a general environment. As shown in Figure 1B, if the antenna is measured under normal circumstances, because there is no similar The confined space of the chamber can isolate the ambient noise, and the external noise will interfere with the measurement, causing measurement errors. In order to solve the interference of external noise, the measuring probe can be placed close to the object to be tested. If the measuring probe is very close to the object to be tested, the external noise can be ignored. In addition, in addition to external noise, the reflection and scattering generated by the radiation signal in the transmission will also cause measurement error, because the absorption of the radiation signal in the transmission can be eliminated on the four sides of the non-sound chamber. And scattering. However, in the general environment, there is no absorber similar to the non-sounding chamber to eliminate the reflection and scattering of the signal during transmission. The reflection or scattering generated by the signal in the transmission will cause errors in the measurement of the radiation electromagnetic field, resulting in inaccurate measurement.
因此，存在一種需求，設計一種無須無響室的球面近場量測系統與方法，可以降低量測的成本，且量測的效果近似於無響室的量測效果。Therefore, there is a need to design a spherical near-field measurement system and method that does not require a soundless chamber, which can reduce the cost of measurement, and the measurement effect is similar to the measurement effect of the non-sound chamber.
本發明的目的在提供一種球面近場量測系統，透過此球面近場量測系統，無須在無響室內量測，同樣可以達到近似的量測結果。SUMMARY OF THE INVENTION The object of the present invention is to provide a spherical near-field measurement system through which a spherical near-field measurement system can be used to achieve an approximate measurement result without measuring in a non-sounding room.
根據上述的目的，本發明提供一種球面近場量測系統，其包含訊號模擬器、複數個接收探頭、控制模組與計算單元。訊號模擬器用於模擬在主動量測或被動量測下的訊號傳遞。該些接收探頭繞著至少一球面旋轉，以量測開放空間中的電場與/或磁場。控制模組透過複數條傳輸線與該些接收探頭連接，用於控制該訊號模擬器開始或停止，且用於傳送該些接收探頭量測到的該電場與/或磁場以及該些接收探頭的對應位置。計算單元用於接收從該控制單元所傳送出的該些接收探頭量測到的該電場與/或磁 場以及該些接收探頭的該對應位置以萃取出該待測物輻射出來的該電場與/或磁場。In accordance with the above objects, the present invention provides a spherical near-field measurement system including a signal simulator, a plurality of receiving probes, a control module, and a computing unit. The signal simulator is used to simulate signal transmission under active or passive measurements. The receiving probes are rotated about at least one spherical surface to measure an electric field and/or a magnetic field in the open space. The control module is connected to the receiving probes through a plurality of transmission lines for controlling the start or stop of the signal simulator, and is configured to transmit the electric field and/or magnetic field measured by the receiving probes and corresponding to the receiving probes. position. The computing unit is configured to receive the electric field and/or magnetic quantity measured by the receiving probes transmitted from the control unit The field and the corresponding position of the receiving probes extract the electric field and/or magnetic field radiated from the object to be tested.
本發明的另一目的在提供一種球面近場量測方法，透過此量測方法，可以降低檢測的成本，且量測的效果近似於無響室的量測效果。Another object of the present invention is to provide a spherical near-field measurement method by which the cost of detection can be reduced, and the measurement effect is similar to the measurement effect of the non-sound chamber.
一種球面近場量測方法，包含下列步驟：將球面近場量測系統設置於一開放空間，並將待測物放置於置具上；使待測物輻射訊號的電場與/或磁場；複數個接收探頭環繞至少一球面旋轉以量測該開放空間中的該電場與/或磁場，並將所量測到的該電場與/或磁場透過複數條光纖傳輸線傳送至一控制模組；該控制模組將該些接收探頭所量測到的該電場與/或磁場以及該些接收探頭的對應位置傳送至一計算單元；以及該計算單元根據該些接收探頭所量測到的該電場與/或磁場以及該些接收探頭的對應位置將該待測物輻射出來的該電場與/或磁場萃取出來。A spherical near-field measurement method, comprising the steps of: setting a spherical near-field measurement system in an open space, and placing the object to be tested on the device; and causing the electric field and/or the magnetic field of the object to be measured to radiate the signal; Receiving probes rotate around at least one sphere to measure the electric field and/or magnetic field in the open space, and transmit the measured electric field and/or magnetic field to a control module through a plurality of optical fiber transmission lines; the control The module transmits the electric field and/or magnetic field measured by the receiving probes and the corresponding positions of the receiving probes to a calculating unit; and the calculating unit measures the electric field and/or according to the receiving probes. Or the magnetic field and corresponding positions of the receiving probes extract the electric field and/or magnetic field radiated from the object to be tested.
20‧‧‧待測物20‧‧‧Test object
30‧‧‧球面近場量測系統30‧‧‧Spherical near field measurement system
302‧‧‧待測物302‧‧‧Test object
304‧‧‧接收探頭304‧‧‧Receiving probe
306‧‧‧控制模組306‧‧‧Control Module
308‧‧‧訊號模擬器308‧‧‧Signal Simulator
310‧‧‧計算單元310‧‧‧Computation unit
S402~S410‧‧‧步驟S402~S410‧‧‧Steps
為了更清楚地說明本發明實施例或現有技術中的技術方案，下面將對實施例或現有技術描述中所需要使用的附圖作簡單地介紹，顯而易見地，下面描述中的附圖僅僅是本發明的一些實施例，對於本領域普通技術人員來講，在不付出創造性勞動的前提下，還可以根據這些附圖獲得其他的附圖。In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the description of the prior art will be briefly described below. Obviously, the drawings in the following description are only Some embodiments of the invention may also be used to obtain other figures from these figures without departing from the art.
第1A圖顯示在傳統無響室的示意圖；第1B圖顯示在一般環境下量測天線之發射場型或電磁干擾的示意圖；第2圖係顯示本發明的球面近場量測系統較佳的量測環境的示意圖； 第3圖係顯示本發明之較佳實施例的球面近場量測系統的示意圖；第4圖係顯示本發明之實施例的球面近場量測方法的示意圖；第5A圖係顯示本發明之球面近場量測系統量測放置在置具上的通訊裝置之輻射增益曲線圖；以及第5B圖係顯示本發明之球面近場量測系統量測通訊裝置貼近一假人頭部之輻射增益曲線圖。Figure 1A shows a schematic diagram of a conventional non-sounding chamber; Figure 1B shows a schematic diagram of a transmitting field type or electromagnetic interference of a measuring antenna in a general environment; and Figure 2 shows a preferred spherical near-field measuring system of the present invention. a schematic diagram of the measurement environment; 3 is a schematic view showing a spherical near-field measurement system according to a preferred embodiment of the present invention; FIG. 4 is a schematic view showing a spherical near-field measurement method according to an embodiment of the present invention; and FIG. 5A is a view showing the present invention. The spherical near-field measurement system measures the radiation gain curve of the communication device placed on the device; and FIG. 5B shows the radiation gain of the spherical near-field measurement system of the present invention close to a dummy head Graph.
下面將結合本實施例中的附圖，對本實施例中的技術方案進行清楚、完整地描述，顯然，所描述的實施例僅僅是本發明一部分實施例，而不是全部的實施例。基於本發明中的實施例，本領域普通技術人員在沒有作出創造性勞動前提下所獲得的所有其他實施例，都屬於本發明保護的範圍。The technical solutions in the present embodiment will be clearly and completely described in the following with reference to the drawings in the embodiments. It is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative efforts are within the scope of the present invention.
第2圖係顯示本發明的球面近場量測系統較佳的量測環境的示意圖。如第2圖所示，本發明的球面近場量測系統的待測物20較佳放置於鄰近兩壁面的位置上，此兩壁面可以是房間角落的兩面牆，或者是在球面近場量測系統中所設立的兩壁面，在此並不侷限。而且，此兩壁面可以是水泥等絕緣材料所構成或者是金屬材質所構成，在此並不侷限。而且待測物距離兩壁面的距離較佳為1公尺，離地面的距離也大約為1公尺。由上述的量測環境條件可以得知，符合此量測環境條件的地方可以很容易在一般環境中找到可進行近場輻射量測。而當待測物20放置於適當的量測位置後，即可以開始在待測物的量測球面上進行近場輻射電磁場的量測。在第2 圖所示的實施例中具有兩個量測球面，但是在不同實施例中可以只有一個量測球面，在此並不侷限。Figure 2 is a schematic diagram showing a preferred measurement environment for a spherical near field measurement system of the present invention. As shown in FIG. 2, the object to be tested 20 of the spherical near-field measurement system of the present invention is preferably placed at a position adjacent to the two wall surfaces, which may be two walls of the corner of the room, or a near-field amount on the spherical surface. The two walls set up in the test system are not limited here. Moreover, the two wall surfaces may be composed of an insulating material such as cement or a metal material, and are not limited thereto. Moreover, the distance between the object to be tested and the two walls is preferably 1 meter, and the distance from the ground is also about 1 meter. It can be known from the above-mentioned measurement environmental conditions that the place where the environmental conditions are met can be easily found in the general environment for near-field radiation measurement. When the object to be tested 20 is placed at an appropriate measurement position, measurement of the near-field radiation electromagnetic field on the measurement spherical surface of the object to be tested can be started. At the 2nd The embodiment shown in the figures has two measuring spheres, but in a different embodiment there may be only one measuring sphere, which is not limited here.
第3圖係顯示本發明之較佳實施例的球面近場量測系統的示意圖。如第3圖所示，球面近場量測系統30主要包含待測物302、接收探頭304、控制模組306、訊號模擬器308與計算單元310。待測物302透過一置具設置於球面近場量測系統30上，且待測物302為固定不動。接收探頭304用於擷取球面之切線方向的輻射電場與/或磁場，且透過光纖(optical fiber)連接至控制模組306。在本發明的實施例中，較佳使用光纖作為傳輸線是因為光纖本身是介質，不會像一般金屬傳輸線容易產生散射場，影響量測結果，但是在不同實施例中也可以使用其它較不容易產生散射場的傳輸線來傳遞，在此並不侷限。接收探頭304較佳為四個，且透過夾具(未圖示)將接收探頭304環繞至少一球面以接收近場的電磁場。在本發明實施例中，每兩個接收探頭304環繞一球面，每一接收探頭304量測一切線方向之電場與/或磁場，並將所量測到的電場與/或磁場以及接收探頭304的對應位置傳遞至控制模組306。然而，在不同實施例中，接收探頭304可以有兩個，分別繞著一個球面量測近場的電場與/或磁場，或者兩個接收探頭304繞著一個球面分別量測近場的電場與/或磁場，接收探頭304的數量或環繞球面的數量是根據接收探頭304的設計或種類而有所增減。依據接收探頭304的不同，可以有不同數量的接收探頭304，甚至可以僅用一個接收探頭304即可量測球面近場的輻射。因設計的不同，不同接收探頭304的電磁場接收效果不同，接收探頭304的數量可以是兩個或兩個以上，或者需要兩個量測球面。控制模組306用於將接收探頭304量測到的電場與/或磁場以及接收探頭304的對應位置傳 送至計算單元310，另一方面，控制模組306用於控制訊號模擬器308何時開始或停止發射訊號。計算單元310從量測的結果中萃取出待測物302輻射出來的電磁場，並對其輻射場作近場對遠場的轉換(near-field to far-field transformation)，最後得到類似於在一般無響室的遠場結果。另外，在此需要說明的是，訊號模擬器308用於模擬主動測試或被動測試下的訊號傳遞。訊號模擬器308可以模擬基地台所發射的訊號，也可以模擬網路分析儀(vector network analyzer)發射訊號，讓待測物302可以在主動測試與被動測試的環境下量測其電磁場。Figure 3 is a schematic diagram showing a spherical near field measurement system in accordance with a preferred embodiment of the present invention. As shown in FIG. 3 , the spherical near-field measurement system 30 mainly includes a test object 302 , a receiving probe 304 , a control module 306 , a signal simulator 308 , and a computing unit 310 . The object to be tested 302 is disposed on the spherical near field measurement system 30 through a device, and the object to be tested 302 is fixed. The receiving probe 304 is configured to extract a radiated electric field and/or a magnetic field in a tangential direction of the spherical surface, and is connected to the control module 306 through an optical fiber. In the embodiment of the present invention, the optical fiber is preferably used as the transmission line because the optical fiber itself is a medium, and the scattering field is not easily generated like a general metal transmission line, which affects the measurement result, but other embodiments may also be used in other embodiments. The transmission line that produces the scattered field is transmitted, which is not limited here. The receiving probes 304 are preferably four and pass the receiving probe 304 around at least one spherical surface through a clamp (not shown) to receive the near field electromagnetic field. In the embodiment of the present invention, each of the two receiving probes 304 surrounds a spherical surface, and each receiving probe 304 measures an electric field and/or a magnetic field in all line directions, and measures the measured electric field and/or magnetic field and the receiving probe 304. The corresponding position is passed to the control module 306. However, in various embodiments, there may be two receiving probes 304 that measure the electric field and/or magnetic field of the near field around a spherical surface, or two receiving probes 304 measure the electric field of the near field around a spherical surface, respectively. / or magnetic field, the number of receiving probes 304 or the number of surrounding spheres is increased or decreased depending on the design or type of receiving probe 304. Depending on the receiving probe 304, there may be a different number of receiving probes 304, and even a single receiving probe 304 may be used to measure the near-field radiation of the sphere. Depending on the design, the electromagnetic field receiving effects of the different receiving probes 304 are different, and the number of receiving probes 304 may be two or more, or two measuring spheres are required. The control module 306 is configured to transmit the electric field and/or magnetic field measured by the receiving probe 304 and the corresponding position of the receiving probe 304. The control module 306 is used to control when the signal simulator 308 starts or stops transmitting signals. The calculating unit 310 extracts the electromagnetic field radiated from the object to be tested 302 from the measured result, and performs a near-field to far-field transformation on the radiation field, and finally obtains a similar to the general field. Far field results without a chamber. In addition, it should be noted that the signal simulator 308 is used to simulate signal transmission under active test or passive test. The signal simulator 308 can simulate the signal transmitted by the base station, and can also simulate the vector network analyzer to transmit signals, so that the object to be tested 302 can measure its electromagnetic field in the environment of active test and passive test.
第4圖係顯示本發明之實施例的球面近場量測方法的流程圖。如第4圖所示，本發明之球面近場量測方法包含下列步驟，且下列的步驟配合第3圖的元件符號做說明。在步驟S402中，將球面近場量測系統30設置於一開放空間，並將待測物放置於置具上。將球面近場量測系統30設置於開放空間的角落可以降低訊號散射或反射造成的影響。在步驟S404中，提供輻射訊號，待測物302開始輻射訊號的電場與/或磁場。開啟訊號模擬器308，且待測物302開始發送輻射訊號的電場與/或磁場，使待測物302在主動測試與被動測試的環境下模擬無線通訊之訊號的傳遞與接收。在步驟S406中，接收探頭304環繞至少一球面旋轉以接收在開放空間中的電場與/或磁場。接收探頭304在本發明實施例中的數量為四個，且每兩個分別繞著一球面旋轉以接收電場與/或磁場。但是在不同實施例中，四個接收探頭304可以僅繞著一球面旋轉(兩個量測磁場，另外兩個量測電場)，或者接收探頭304的數量可以為兩個分別繞著一球面旋轉以量測電場與/或磁場，或兩個接收探頭304(一個量測電場，另外一個量測磁場)僅繞著一個球面旋轉，在此並 不侷限。在步驟S408中，控制模組306把接收探頭304量到的電磁場以及接收探頭304的對應位置透過光纖傳輸線傳送至計算單元310。在步驟S410中，透過計算單元310將待測物輻射出來的電磁場從所量測到的電磁場中萃取出來，並對其輻射場作近場對遠場的轉換(near-field to far-field transformation)。最後，可以得到如同一般無響室量測出來的結果。透過上述的球面近場量測方法，可以在沒有無響室的情況下對通訊裝置做球面近場量測，而且所量測的結果近似於在無響室量測的效果。Fig. 4 is a flow chart showing a method of measuring a spherical near field in an embodiment of the present invention. As shown in Fig. 4, the spherical near-field measurement method of the present invention comprises the following steps, and the following steps are explained in conjunction with the component symbols of Fig. 3. In step S402, the spherical near-field measurement system 30 is placed in an open space, and the object to be tested is placed on the fixture. The placement of the spherical near-field measurement system 30 in the corners of the open space reduces the effects of signal scattering or reflection. In step S404, a radiation signal is provided, and the object to be tested 302 starts to emit an electric field and/or a magnetic field of the signal. The signal simulator 308 is turned on, and the object to be tested 302 starts to transmit the electric field and/or the magnetic field of the radiation signal, so that the object to be tested 302 simulates the transmission and reception of the signal of the wireless communication in the environment of active test and passive test. In step S406, the receiving probe 304 rotates around at least one sphere to receive an electric field and/or a magnetic field in the open space. The number of receiving probes 304 in the embodiment of the present invention is four, and each two rotates about a spherical surface to receive an electric field and/or a magnetic field, respectively. However, in various embodiments, the four receiving probes 304 can only rotate about a spherical surface (two measuring magnetic fields, the other two measuring electric fields), or the number of receiving probes 304 can be rotated about two spherical surfaces respectively. To measure the electric field and / or magnetic field, or two receiving probes 304 (one measuring electric field, another measuring magnetic field) only rotate around a spherical surface, here Not limited. In step S408, the control module 306 transmits the electromagnetic field received by the receiving probe 304 and the corresponding position of the receiving probe 304 to the computing unit 310 through the optical fiber transmission line. In step S410, the electromagnetic field radiated from the object to be tested is extracted from the measured electromagnetic field by the calculation unit 310, and the near field to far field conversion is performed on the radiation field (near-field to far-field transformation). ). Finally, results can be obtained as measured by a general chamberless chamber. Through the spherical near-field measurement method described above, the spherical near-field measurement can be performed on the communication device without the absence of the sound chamber, and the measured result approximates the effect of the measurement without the sound chamber.
第5A圖係顯示本發明之球面近場量測系統量測放置在置具上的通訊裝置之輻射增益曲線圖。如第5A圖所示，無論球面近場量測系統在開放空間量測，或在兩絕緣壁面量測，或在兩金屬壁面量測，或在一金屬壁面與一絕緣壁面量測的結果都趨近於同一條曲線，可見本發明之球面近場量測系統在不同壁面或開放空間下量測結果的誤差都在可接受的範圍內。第5B圖係顯示本發明之球面近場量測系統量測通訊裝置貼近一模型人頭且放置於模型手上之輻射增益曲線圖。如第5B圖所示，在不同壁面或開放空間下的量測結果都趨近於同一條曲線，可見量測結果的誤差都在可接受的範圍內。由此可知，本發明的球面近場量測系統與方法，可以在一般環境下完成傳統需要在無響室下量測，且量測結果近似於在無響室下量測的結果。Figure 5A is a graph showing the radiation gain curve of the communication device placed on the fixture by the spherical near-field measurement system of the present invention. As shown in Figure 5A, whether the spherical near-field measurement system is measured in open space, or measured on two insulated walls, or measured on two metal walls, or measured on a metal wall and an insulated wall, Approaching the same curve, it can be seen that the error of the measurement result of the spherical near-field measurement system of the present invention under different wall surfaces or open spaces is within an acceptable range. Fig. 5B is a graph showing the radiation gain curve of the spherical near-field measurement system measuring communication device of the present invention which is close to a model head and placed on the model hand. As shown in Fig. 5B, the measurement results under different wall surfaces or open spaces approach the same curve, and the errors of the measurement results are all within an acceptable range. It can be seen that the spherical near-field measurement system and method of the present invention can be used in a general environment to perform measurement under a non-sounding chamber, and the measurement result is approximated by the measurement under the non-sound chamber.
以上所述，僅為本發明的具體實施方式，但本發明的保護範圍並不局限於此，任何熟悉本技術領域的技術人員在本發明揭露的技術範圍內，可輕易想到變化或替換，都應涵蓋在本發明的保護範圍之內。因此，本發明的保護範圍應所述以申請專利範圍第的保護範圍為准。The above is only a specific embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily think of changes or substitutions within the technical scope of the present invention. It should be covered by the scope of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of protection of the scope of the patent application.
30‧‧‧球面近場量測系統30‧‧‧Spherical near field measurement system
302‧‧‧待測物302‧‧‧Test object
304‧‧‧接收探頭304‧‧‧Receiving probe
306‧‧‧控制模組306‧‧‧Control Module
308‧‧‧基地台模擬器308‧‧‧Base Station Simulator
310‧‧‧計算單元310‧‧‧Computation unit
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| US5126669A (en) * | 1990-11-27 | 1992-06-30 | The United States Of America As Represented By The Administrator, Of The National Aeronautics And Space Administration | Precision measurement of magnetic characteristics of an article with nullification of external magnetic fields |
| TW201300790A (en) * | 2011-06-30 | 2013-01-01 | Hon Hai Prec Ind Co Ltd | Electromagnetic interference testing equipment |
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| TW201333460A (en) * | 2012-12-27 | 2013-08-16 | King Yuan Electronics Co Ltd | Three-axis test socket and test system thereof |
| US8575929B1 (en) * | 2011-06-20 | 2013-11-05 | The United States Of America As Represented By The Secretary Of The Navy | Magnetic anomaly surveillance system using spherical trilateration |
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| US5126669A (en) * | 1990-11-27 | 1992-06-30 | The United States Of America As Represented By The Administrator, Of The National Aeronautics And Space Administration | Precision measurement of magnetic characteristics of an article with nullification of external magnetic fields |
| US8575929B1 (en) * | 2011-06-20 | 2013-11-05 | The United States Of America As Represented By The Secretary Of The Navy | Magnetic anomaly surveillance system using spherical trilateration |
| TW201300790A (en) * | 2011-06-30 | 2013-01-01 | Hon Hai Prec Ind Co Ltd | Electromagnetic interference testing equipment |
| TW201323889A (en) * | 2011-12-09 | 2013-06-16 | Hon Hai Prec Ind Co Ltd | Anechoic chamber |
| TW201333460A (en) * | 2012-12-27 | 2013-08-16 | King Yuan Electronics Co Ltd | Three-axis test socket and test system thereof |
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