TW201323889A - Anechoic chamber - Google Patents
Anechoic chamber Download PDFInfo
- Publication number
- TW201323889A TW201323889A TW100146200A TW100146200A TW201323889A TW 201323889 A TW201323889 A TW 201323889A TW 100146200 A TW100146200 A TW 100146200A TW 100146200 A TW100146200 A TW 100146200A TW 201323889 A TW201323889 A TW 201323889A
- Authority
- TW
- Taiwan
- Prior art keywords
- peripheral wall
- anechoic chamber
- absorbing material
- wall
- antenna
- Prior art date
Links
Landscapes
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Aerials With Secondary Devices (AREA)
Abstract
Description
本發明涉及電磁相容領域,尤其涉及一種電波暗室。The present invention relates to the field of electromagnetic compatibility, and more particularly to an anechoic chamber.
一般的電磁相容(Electromagnetic Compatibility,EMC)測試需要使用電波暗室作為測試場地。通常地,電波暗室分為全電波暗室及半電波暗室。全電波暗室的內表面完全鋪滿吸波材料,半電波暗室則有一部分內表面覆蓋吸波材料。通常的電波暗室為矩形體結構。該吸波材料一般為表面具有多個尖錐突起的鐵氧體和聚氨酯泡沫材料。電波暗室內可以放置需要進行EMC測試的電磁輻射源,例如電腦等電子裝置。當吸波材料表面的尖錐形突起垂直正對待測的電磁輻射源時,該吸波材料對於待測物產生的電磁波具有最大的吸收率。但是,傳統的電波暗室由於受到形狀限制,很難使其內表面鋪設的吸波材料表面形成的全部或絕大多數尖錐形突起同時垂直正對待測對電磁輻射源,較難獲得足夠大的電磁波吸收率。General Electromagnetic Compatibility (EMC) testing requires the use of an anechoic chamber as a test site. Generally, the anechoic chamber is divided into a full anechoic chamber and a semi-anechoic chamber. The inner surface of the full anechoic chamber is completely covered with absorbing material, and the semi-anechoic chamber has a part of the inner surface covered with absorbing material. A typical anechoic chamber is a rectangular body structure. The absorbing material is generally a ferrite and polyurethane foam having a plurality of tapered protrusions on its surface. An electromagnetic radiation source that requires EMC testing, such as an electronic device such as a computer, can be placed in the anechoic chamber. When the pointed conical protrusion on the surface of the absorbing material is perpendicular to the electromagnetic radiation source to be measured, the absorbing material has the largest absorption rate for the electromagnetic wave generated by the object to be tested. However, due to the shape limitation of the conventional anechoic chamber, it is difficult to make all or most of the pointed pyramidal protrusions formed on the surface of the absorbing material laid on the inner surface thereof at the same time perpendicular to the electromagnetic radiation source to be measured, which is difficult to obtain sufficiently large. Electromagnetic wave absorption rate.
有鑒於此,有必要提供一種具有較高吸波率的電波暗室。In view of this, it is necessary to provide an anechoic chamber having a high absorbing rate.
一種電波暗室,包括周壁及底面,該周壁內表面鋪設有吸波材料,吸波材料表面形成緊密排列的尖錐部。所述周壁包括銜接在一起的第一周壁及第二周壁,該第一周壁呈半圓柱形殼體狀,且第一周壁內表面鋪設的吸波材料表面形成的尖錐部的頂端沿第一周壁的徑向延伸而指向第一周壁的中心軸。該第二周壁呈半球形殼體狀,該第二周壁內表面鋪設的吸波材料表面形成的尖錐部的頂端垂直沿第二周壁的徑向延伸而指向第二周壁的球心。該電波暗室放置待測電子裝置及天線,用於進行EMC測試。An anechoic chamber comprising a peripheral wall and a bottom surface, the inner surface of the peripheral wall is provided with an absorbing material, and the surface of the absorbing material forms a closely arranged tapered portion. The peripheral wall includes a first peripheral wall and a second peripheral wall that are joined together, the first peripheral wall is in the shape of a semi-cylindrical shell, and the top end of the tapered portion formed on the surface of the absorbing material laid on the inner surface of the first peripheral wall It extends in the radial direction of the first peripheral wall and points to the central axis of the first peripheral wall. The second peripheral wall has a semi-spherical shell shape, and a tip end of the tapered portion formed on the surface of the absorbing material laid on the inner surface of the second peripheral wall extends perpendicularly in the radial direction of the second peripheral wall to point toward the center of the second peripheral wall. The anechoic chamber is placed with an electronic device to be tested and an antenna for performing EMC testing.
所述電波暗室通過將第一周壁與第二周壁設計為半圓柱形殼體狀及半球型殼體狀,使周壁表面鋪設的吸波材料表面形成的絕大多數尖錐部的頂端可以垂直正對待測電子裝置及天線。這樣,當待測電子裝置及天線產生非必要電磁波輻射至周壁時,吸波材料能最大程度地吸收這些電磁波,降低電磁波的非必要反射率,確保測試結果的準確性,從而提高了該電波暗室作為實驗室的精准度。The anechoic chamber is designed to have a semi-cylindrical shell shape and a hemispherical shell shape by the first peripheral wall and the second peripheral wall, so that the top end of most of the tapered portions formed on the surface of the absorbing material laid on the surface of the peripheral wall can be vertical The electronic device and antenna are being measured. In this way, when the electronic device to be tested and the antenna generate unnecessary electromagnetic radiation to the peripheral wall, the absorbing material can absorb the electromagnetic waves to the greatest extent, reduce the unnecessary reflectance of the electromagnetic wave, and ensure the accuracy of the test result, thereby improving the anechoic chamber. As the precision of the laboratory.
請參閱圖1,本發明較佳實施例的電波暗室100為半電波暗室,其包括周壁10、底面20、旋轉台30以及天線40。所述電波暗室100的周壁10罩設於底面20上並與底面20共同圍成一個封閉的容置空間110。旋轉台30及天線40均位於底面20上,同時容置於該容置空間110內部,該旋轉台30與天線40之間相隔一定距離放置。該電波暗室100可用於測試電腦、電視機或電冰箱等電磁輻射源的EMC品質。本實施例中以測試一待測電腦50的EMC品質為例進行說明。所述周壁10包括依次銜接在一起的第一周壁12、第二周壁14及第三周壁(圖未示)。該第一周壁12大致呈半圓柱形殼體狀,該第二周壁14大致呈半球形殼體狀,第三周壁可為平板狀,該第一周壁12與第三周壁分別連接于第二周壁14的兩端。該周壁10內部表面鋪滿吸波材料16,吸波材料16表面形成緊密排列的尖錐部162,用於吸收電磁波。該第一周壁12內表面的吸波材料16表面形成的尖錐部162頂端沿著第一周壁12的徑向延伸,從而都指向該第一周壁12的中心軸。該第二周壁14內表面的吸波材料16表面形成的尖錐部162頂端沿著第二周壁14的徑向延伸,從而都指向該第二周壁的球心。該第三周壁內表面的吸波材料16表面形成的尖錐部162頂端沿著指向該容置空間110。這樣可以使絕大多數尖錐部162的頂端沿著半圓柱面或半球面的徑向指向該容置空間110的中心位置。Referring to FIG. 1, an anechoic chamber 100 in accordance with a preferred embodiment of the present invention is a semi-anechoic chamber including a peripheral wall 10, a bottom surface 20, a rotating stage 30, and an antenna 40. The peripheral wall 10 of the anechoic chamber 100 is disposed on the bottom surface 20 and surrounds the bottom surface 20 to form a closed accommodating space 110. The rotating table 30 and the antenna 40 are both located on the bottom surface 20 and are accommodated inside the accommodating space 110. The rotating table 30 and the antenna 40 are placed at a certain distance. The anechoic chamber 100 can be used to test the EMC quality of electromagnetic radiation sources such as computers, televisions or refrigerators. In this embodiment, the EMC quality of the computer 50 to be tested is tested as an example. The peripheral wall 10 includes a first peripheral wall 12, a second peripheral wall 14, and a third peripheral wall (not shown) that are sequentially joined together. The first peripheral wall 12 has a substantially semi-cylindrical shape, and the second peripheral wall 14 has a substantially semi-spherical shape. The third peripheral wall may have a flat shape, and the first peripheral wall 12 and the third peripheral wall are respectively connected to the first Both ends of the wall 14 of the second week. The inner surface of the peripheral wall 10 is covered with an absorbing material 16, and the surface of the absorbing material 16 forms a closely-arranged tapered portion 162 for absorbing electromagnetic waves. The tip end of the tapered portion 162 formed on the surface of the absorbing material 16 on the inner surface of the first peripheral wall 12 extends in the radial direction of the first peripheral wall 12 so as to be directed to the central axis of the first peripheral wall 12. The tip end of the tapered portion 162 formed on the surface of the absorbing material 16 on the inner surface of the second peripheral wall 14 extends in the radial direction of the second peripheral wall 14 so as to both point toward the center of the second peripheral wall. The tip end of the tapered portion 162 formed on the surface of the absorbing material 16 on the inner surface of the third peripheral wall is directed to the accommodating space 110. In this way, the top end of most of the tapered portion 162 can be directed to the central position of the accommodating space 110 along the radial direction of the semi-cylindrical surface or the hemispherical surface.
較佳地,該旋轉台30位於本實施例電波暗室100的第二周壁14下方中央位置。該旋轉台30上承載一測試桌32。所述待測電腦50放置於該測試桌32上。所述天線40放置于第一周壁12下方中央位置且對準該待測電腦50。所述天線40的接收部具有一定的高度,從而被置於該第一周壁12的半圓柱面結構中心。這樣,鋪設于第一周壁12內表面的吸波材料16表面形成的絕大多數尖錐部162的頂端亦均垂直正對該天線40的接收部。Preferably, the rotary table 30 is located at a central position below the second peripheral wall 14 of the anechoic chamber 100 of the present embodiment. A test table 32 is carried on the rotary table 30. The computer to be tested 50 is placed on the test table 32. The antenna 40 is placed at a central position below the first peripheral wall 12 and aligned with the computer 50 to be tested. The receiving portion of the antenna 40 has a certain height so as to be placed at the center of the semi-cylindrical structure of the first peripheral wall 12. Thus, the tips of most of the tapered portions 162 formed on the surface of the absorbing material 16 laid on the inner surface of the first peripheral wall 12 are also perpendicular to the receiving portion of the antenna 40.
請參閱圖2,所述測試桌32具有一定的高度,從而被放置於測試桌32的待測電腦50大致處於第二周壁14半球面結構中心。這樣,鋪設于第二周壁14內表面的吸波材料16表面形成的絕大多數尖錐部162的頂端均可垂直正對該待測電腦50。Referring to FIG. 2, the test table 32 has a height such that the computer 50 to be tested placed on the test table 32 is substantially at the center of the hemispherical structure of the second peripheral wall 14. Thus, the top ends of most of the tapered portions 162 formed on the surface of the absorbing material 16 laid on the inner surface of the second peripheral wall 14 can be vertically aligned with the computer 50 to be tested.
在該電波暗室100內進行EMC測試時,當開啟待測電腦50使其工作時,該天線40接收該待測電腦50產生的工作信號並轉換為電信號,供接收機(圖未示)讀值,檢測待測電腦50對空間輻射出的工作信號強度。待測電腦50產生的雜訊及其他測試所不需要的電磁波輻射至周壁10時,可被吸波材料16吸收,從而避免被反射到天線40而對測試造成干擾。本實施例中的第二周壁14內表面吸波材料16的絕大多數尖錐部162的頂端垂直正對待測電腦50,當電磁波輻射至周壁10時,該等吸波材料16可最大程度地吸收這些電磁波,以降低電磁波的非必要反射率,提高測試結果的準確性,可以減小電磁干擾測試中場地歸一化衰減(Normalized Site Attenuation,NSA)偏離。另外,該第一周壁12內表面吸波材料16的絕大多數尖錐部162的頂端垂直正對天線40的接收部,可以盡可能地吸收天線40產生的不必要的電磁波,例如因共振而產生的電磁輻射,從而進一步提高測試結果的準確性。When the EMC test is performed in the anechoic chamber 100, when the computer 50 to be tested is turned on to operate, the antenna 40 receives the work signal generated by the computer 50 to be tested and converts it into an electrical signal for reading by the receiver (not shown). The value is used to detect the intensity of the working signal radiated by the computer 50 to be tested. When the noise generated by the computer 50 to be tested and other electromagnetic waves not required for the test are radiated to the peripheral wall 10, it can be absorbed by the absorbing material 16 to avoid being reflected to the antenna 40 and causing interference to the test. The top end of most of the tapered portion 162 of the inner peripheral wave absorbing material 16 of the second peripheral wall 14 in this embodiment is perpendicular to the computer 50 to be tested. When electromagnetic waves are radiated to the peripheral wall 10, the absorbing materials 16 can be maximized. Absorbing these electromagnetic waves to reduce the unnecessary reflection rate of electromagnetic waves and improving the accuracy of the test results can reduce the normalized Site Attenuation (NSA) deviation in the electromagnetic interference test. In addition, the top end of most of the tapered portion 162 of the inner surface absorbing material 16 of the first peripheral wall 12 is perpendicular to the receiving portion of the antenna 40, and the unnecessary electromagnetic waves generated by the antenna 40 can be absorbed as much as possible, for example, due to resonance. The electromagnetic radiation generated thereby further improves the accuracy of the test results.
所述電波暗室100通過將第一周壁12與第二周壁14設計為半圓柱形殼體狀及半球型殼體狀,使周壁10內表面鋪設的吸波材料16表面形成的絕大多數尖錐部162的頂端可以垂直正對待測電腦50及天線40。這樣,當待測電腦50及天線40產生非必要電磁波輻射至周壁10時,吸波材料16能最大程度地吸收這些電磁波,降低電磁波的非必要反射率,確保測試結果的準確性,從而提高了該電波暗室100作為實驗室的精准度。The anechoic chamber 100 is formed into a semi-cylindrical shell shape and a hemispherical shell shape by the first peripheral wall 12 and the second peripheral wall 14, so that most of the tips formed on the surface of the absorbing material 16 on the inner surface of the peripheral wall 10 are formed. The top end of the tapered portion 162 can be perpendicular to the computer 50 and the antenna 40 to be tested. Thus, when the computer 50 and the antenna 40 to be tested generate unnecessary electromagnetic radiation to the peripheral wall 10, the absorbing material 16 can absorb the electromagnetic waves to the greatest extent, reduce the unnecessary reflectance of the electromagnetic wave, and ensure the accuracy of the test result, thereby improving the accuracy. The anechoic chamber 100 serves as a laboratory precision.
可以理解的是,對於本領域的普通技術人員來說,可以根據本發明的技術構思做出其他各種相應的改變與變形,而所有這些改變與變形都應屬於本發明權利要求的保護範圍。It is to be understood that those skilled in the art can make various other changes and modifications in accordance with the technical concept of the present invention, and all such changes and modifications are intended to fall within the scope of the appended claims.
100...電波暗室100. . . Radio darkroom
110...容置空間110. . . Housing space
10...周壁10. . . Zhou wall
12...第一周壁12. . . First week wall
14...第二周壁14. . . Second week wall
16...吸波材料16. . . Absorbing material
162...尖錐部162. . . Tip cone
20...底面20. . . Bottom
30...旋轉台30. . . Rotary table
32...測試桌32. . . Test table
40...天線40. . . antenna
50...待測電腦50. . . Computer to be tested
圖1為本發明較佳實施例的電波暗室的示意圖。1 is a schematic view of an anechoic chamber in accordance with a preferred embodiment of the present invention.
圖2為圖1所示電波暗室的部分截面圖。Figure 2 is a partial cross-sectional view of the anechoic chamber of Figure 1.
100...電波暗室100. . . Radio darkroom
110...容置空間110. . . Housing space
10...周壁10. . . Zhou wall
12...第一周壁12. . . First week wall
14...第二周壁14. . . Second week wall
16...吸波材料16. . . Absorbing material
162...尖錐部162. . . Tip cone
20...底面20. . . Bottom
30...旋轉台30. . . Rotary table
32...測試桌32. . . Test table
40...天線40. . . antenna
50...待測電腦50. . . Computer to be tested
Claims (8)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201110408547.1A CN103163339B (en) | 2011-12-09 | 2011-12-09 | Anechoic chamber, |
Publications (1)
Publication Number | Publication Date |
---|---|
TW201323889A true TW201323889A (en) | 2013-06-16 |
Family
ID=48586595
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW100146200A TW201323889A (en) | 2011-12-09 | 2011-12-14 | Anechoic chamber |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN103163339B (en) |
TW (1) | TW201323889A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI512311B (en) * | 2014-03-06 | 2015-12-11 | Chung Huan Li | Spherical near-field measurement system and method |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104422826A (en) * | 2013-08-19 | 2015-03-18 | 鸿富锦精密电子(天津)有限公司 | Anechoic chamber and electric wave test device thereof |
CN104655949A (en) * | 2013-11-21 | 2015-05-27 | 鸿富锦精密电子(天津)有限公司 | Anechoic chamber and testing method of electromagnetic interference |
CN105242249B (en) * | 2015-11-25 | 2018-09-18 | 北京机电工程研究所 | A kind of microwave dark room of ultralow background level for RCS tests |
SE540655C2 (en) * | 2017-03-06 | 2018-10-09 | Bluetest Ab | Arrangement and method for measuring the performance of devices with wireless capability |
CN109353100B (en) * | 2018-09-28 | 2021-03-30 | 南京波平电子科技有限公司 | Flame-retardant broadband high-power composite wave-absorbing material |
CN109884569B (en) * | 2019-01-31 | 2021-06-15 | 中国人民解放军63653部队 | Small-reflection broadband standard field generating device |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0217515Y2 (en) * | 1987-06-03 | 1990-05-16 | ||
US5642118A (en) * | 1995-05-09 | 1997-06-24 | Lockheed Corporation | Apparatus for dissipating electromagnetic waves |
KR101038352B1 (en) * | 2007-07-30 | 2011-06-01 | 가부시키가이샤 무라타 세이사쿠쇼 | Electromagnetic wave measuring device |
CN102269783A (en) * | 2010-06-02 | 2011-12-07 | 鸿富锦精密工业(深圳)有限公司 | Fully anechoic chamber |
-
2011
- 2011-12-09 CN CN201110408547.1A patent/CN103163339B/en not_active Expired - Fee Related
- 2011-12-14 TW TW100146200A patent/TW201323889A/en unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI512311B (en) * | 2014-03-06 | 2015-12-11 | Chung Huan Li | Spherical near-field measurement system and method |
Also Published As
Publication number | Publication date |
---|---|
CN103163339A (en) | 2013-06-19 |
CN103163339B (en) | 2016-12-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW201323889A (en) | Anechoic chamber | |
TW201325427A (en) | Anechoic chamber | |
US8072366B2 (en) | Radio wave absorber, electromagnetic field measurement system and radiated immunity system | |
CN106161704B (en) | The test macro of wireless terminal | |
US10101282B2 (en) | Scattering tomography method and scattering tomography device | |
WO2016161654A1 (en) | Wireless terminal testing system and method for controlling same | |
JP2007271317A (en) | Emi measuring instrument, and emi measuring method | |
CN106936524B (en) | Test system of wireless terminal | |
CN105527598B (en) | A kind of field sensor calibration system and method | |
TWI442064B (en) | Electromagnetic anechoic chamber | |
CN106161703A (en) | The test system of wireless terminal and be used for its control method | |
TWI542884B (en) | Microwave dark room with absorbing body changing reflection path | |
Kirbas et al. | Primary sound power sources for the realisation of the unit watt in airborne sound | |
JP2006162626A (en) | Probe for test of integrated circuit | |
CN217385657U (en) | Antenna testing device | |
JP4645365B2 (en) | Turntable device | |
JP2015130599A (en) | Small-sized antenna and radiation disturbance radio wave measurement system | |
JP2003152438A (en) | Antenna unit | |
JP2006317188A (en) | Electromagnetic field measuring system and radiation immunity system | |
JP2013083455A (en) | Radio wave measuring apparatus and radio wave measuring method | |
JP6949273B2 (en) | Reflection point estimation device and reflection point estimation method | |
KR101498153B1 (en) | Electromagnetic measurement system with positioning part | |
TW201415038A (en) | Anechoic chamber | |
CN202975308U (en) | Assessing and checking apparatus for ultrahigh frequency partial discharge tester | |
JP7115301B2 (en) | Radiated Emission Measurement Equipment |