TWI505158B - Touch control detection circuit - Google Patents

Touch control detection circuit Download PDF

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TWI505158B
TWI505158B TW103112162A TW103112162A TWI505158B TW I505158 B TWI505158 B TW I505158B TW 103112162 A TW103112162 A TW 103112162A TW 103112162 A TW103112162 A TW 103112162A TW I505158 B TWI505158 B TW I505158B
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transistor
touch
coupled
diode
reference voltage
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TW103112162A
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TW201539283A (en
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Chung Min Lien
Ya Ling Hsu
Gang Yi Lin
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Au Optronics Corp
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Description

觸控偵測電路Touch detection circuit

本發明是有關於一種觸控電路,且特別是有關於一種觸控偵測電路。The present invention relates to a touch circuit, and more particularly to a touch detection circuit.

隨著科技的發展與進步,電子產品的使用者介面也由傳統的按鍵、鍵盤或滑鼠逐漸演變為更為人性化的觸控式介面。舉例來說,使用者可利用手指或觸控光筆在光感應式的觸控面板上進行觸控操作。另一方面,在觸控面板中常會利用光偵測電路來感應目前使用者的觸控位置。舉例來說,圖1繪示一種光偵測電路100的示意圖。光偵測電路100可應用於光感應式的觸控面板以偵測觸控面板的觸控點位置。With the development and advancement of technology, the user interface of electronic products has gradually evolved from a traditional button, keyboard or mouse to a more user-friendly touch interface. For example, the user can perform a touch operation on the light-sensitive touch panel by using a finger or a touch light pen. On the other hand, the light detecting circuit is often used in the touch panel to sense the current touch position of the user. For example, FIG. 1 is a schematic diagram of a light detecting circuit 100. The light detecting circuit 100 can be applied to the light sensing type touch panel to detect the touch point position of the touch panel.

光偵測電路100包括電晶體Q、電容C以及光偵測電晶體P。觸控面板的掃描線SCAN1可用來控制電晶體Q的開關狀態。光偵測電晶體P在不同強度的光線照射下會產生不同的電流Id。電容C的一端耦接於電晶體Q,另一端則耦接於電源VDD。電容C是用來儲存電流Id所產生的電荷。當電晶體Q開啟時,電容C中儲存的電荷會經由電晶體Q傳送至觸控面板的資料線 DATA1。由於電流Id不同,電容C中的電荷量也會不同。因此,光偵測電路100可依據資料線DATA1所接收到的電荷量來判斷觸控面板目前的觸碰情況。The light detecting circuit 100 includes a transistor Q, a capacitor C, and a photodetecting transistor P. The scan line SCAN1 of the touch panel can be used to control the switching state of the transistor Q. The light detecting transistor P generates different current Ids under illumination of different intensities of light. One end of the capacitor C is coupled to the transistor Q, and the other end is coupled to the power source VDD. Capacitor C is used to store the charge generated by current Id. When the transistor Q is turned on, the charge stored in the capacitor C is transmitted to the data line of the touch panel via the transistor Q. DATA1. Since the current Id is different, the amount of charge in the capacitor C will also be different. Therefore, the photodetection circuit 100 can determine the current touch condition of the touch panel according to the amount of charge received by the data line DATA1.

然而,當光偵測電晶體P所偵測到的光強度不足或是感光時間不夠長時,電容C中所儲存的電荷量過少會使得端點VA的電壓不足,導致觸控面板無法判斷觸控點的位置。另一方面,通常會將光偵測電晶體P的閘極G與源極S兩端的電壓差(即Vgs)操作在負偏壓下以控制電流Id,但這容易讓光偵測電晶體P發生劣化的情形。However, when the light intensity detected by the photodetecting transistor P is insufficient or the sensing time is not long enough, the amount of charge stored in the capacitor C is too small, so that the voltage of the terminal VA is insufficient, and the touch panel cannot be judged. The location of the handle. On the other hand, the voltage difference between the gate G and the source S of the photodetecting transistor P (ie, Vgs) is usually operated under a negative bias to control the current Id, but this easily makes the photodetecting transistor P A situation in which deterioration occurs.

本發明提供一種觸控偵測電路,藉由增加觸控偵測電路的光感應速度以提升觸控面板的光感應敏感度。The invention provides a touch detection circuit for increasing the light sensing speed of the touch panel by increasing the light sensing speed of the touch detection circuit.

本發明的觸控偵測電路包括觸控單元、比較單元以及觸控結果產生單元。觸控單元依據被觸碰狀態以提供偵測信號。比較單元耦接觸控單元並提供參考電流。比較單元並依據偵測信號以及第一參考電壓的電壓差來產生觸控狀態電流。比較單元比較參考電流以及觸控狀態電流來產生比較電壓。觸控結果產生單元耦接比較單元並依據比較電壓來提供觸控結果信號。The touch detection circuit of the present invention includes a touch unit, a comparison unit, and a touch result generation unit. The touch unit provides a detection signal according to the touched state. The comparison unit couples the contact control unit and provides a reference current. The comparison unit generates a touch state current according to the detection signal and the voltage difference of the first reference voltage. The comparison unit compares the reference current and the touch state current to generate a comparison voltage. The touch result generating unit is coupled to the comparing unit and provides the touch result signal according to the comparison voltage.

基於上述,本發明的觸控偵測電路中的比較單元藉由比較觸控單元在不同的觸控狀態下所提供的偵測信號與第一參考電壓兩者的電壓差來產生比較電壓。接著,觸控結果產生單元會依 據比較電壓來提供觸控結果信號。如此一來,本發明的觸控偵測電路可藉由分析觸控結果信號來得知觸控面板目前的觸碰狀態並得知觸控面板上觸控點的位置。Based on the above, the comparison unit in the touch detection circuit of the present invention generates a comparison voltage by comparing the voltage difference between the detection signal provided by the touch unit under different touch states and the first reference voltage. Then, the touch result generating unit will follow The touch result signal is provided according to the comparison voltage. In this way, the touch detection circuit of the present invention can know the current touch state of the touch panel by analyzing the touch result signal and know the position of the touch point on the touch panel.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the invention will be apparent from the following description.

100‧‧‧光偵測電路100‧‧‧Photodetection circuit

200、300、400、500、600、700、800‧‧‧觸控偵測電路200, 300, 400, 500, 600, 700, 800‧‧‧ touch detection circuits

202、302、402、502、602、702、802‧‧‧觸控單元202, 302, 402, 502, 602, 702, 802 ‧ ‧ touch unit

204、304、404、504、604、704、804‧‧‧比較單元204, 304, 404, 504, 604, 704, 804‧‧‧ comparison unit

206、306、406、506、606、706、806‧‧‧觸控結果產生單元206, 306, 406, 506, 606, 706, 806‧‧‧ touch result generation unit

A、B‧‧‧曲線A, B‧‧‧ curve

C、CT、CR‧‧‧電容C, CT, CR‧‧‧ capacitor

DATA1、DATA3‧‧‧資料線DATA1, DATA3‧‧‧ data line

D1~D3‧‧‧二極體D1~D3‧‧‧ diode

F‧‧‧波形週期F‧‧‧ waveform cycle

G‧‧‧閘極G‧‧‧ gate

Id‧‧‧電流Id‧‧‧ Current

IREF1‧‧‧參考電流IREF1‧‧‧reference current

IT1、IT2‧‧‧觸控狀態電流IT1, IT2‧‧‧ touch state current

P、P1~P7‧‧‧光偵測電晶體P, P1~P7‧‧‧Light detection transistor

S‧‧‧源極S‧‧‧ source

SCAN1、SCAN3‧‧‧掃描線SCAN1, SCAN3‧‧‧ scan line

SD1~SD6‧‧‧偵測信號SD1~SD6‧‧‧Detection signal

ST1、ST2‧‧‧觸控結果信號ST1, ST2‧‧‧ touch result signal

VA、VA1~VA3‧‧‧端點VA, VA1~VA3‧‧‧ endpoint

VCOMP、VCOMP1、VCOMP2‧‧‧比較電壓VCOMP, VCOMP1, VCOMP2‧‧‧ compare voltage

VREF1、VC2、VC4、T1、T2‧‧‧參考電壓VREF1, VC2, VC4, T1, T2‧‧‧ reference voltage

VC1、VC3‧‧‧參考電壓源VC1, VC3‧‧‧ reference voltage source

VC5‧‧‧參考電源VC5‧‧‧ reference power supply

VDD‧‧‧電源VDD‧‧‧ power supply

Q、M1~M6、MA、MB1~MB4、MC1~MC2、MD1~MD4、MF、MN‧‧‧電晶體Q, M1~M6, MA, MB1~MB4, MC1~MC2, MD1~MD4, MF, MN‧‧‧O crystal

圖1繪示一種光偵測電路100的示意圖。FIG. 1 is a schematic diagram of a light detecting circuit 100.

圖2~圖3A、圖4~圖8分別繪示本發明多個實施例的觸控偵測電路的示意圖。2 to 3A and 4 to 8 are schematic views respectively showing a touch detection circuit according to various embodiments of the present invention.

圖3B繪示圖3A觸控偵測電路300的讀出波形示意圖。FIG. 3B is a schematic diagram of the readout waveform of the touch detection circuit 300 of FIG. 3A.

圖2繪示本發明一實施例的觸控偵測電路200的示意圖。觸控偵測電路200包括觸控單元202、比較單元204以及觸控結果產生單元206。觸控偵測電路200可應用在光感應式的觸控面板中以偵測觸控面板上的觸控點位置。觸控單元202依據被觸碰狀態以提供偵測信號SD1。觸控單元202可以包括光感測器(Photo Sensor)、光偵測薄膜電晶體(Thin Film Transistor,TFT)或是其他具有光偵測功能的電子元件。觸控單元202所感受到的光強度會隨著觸控單元202是否被觸碰而有所不同。在不同的觸碰狀態 下,觸控單元202會產生不同的偵測信號SD1。其中,偵測信號SD1為電壓信號。FIG. 2 is a schematic diagram of a touch detection circuit 200 according to an embodiment of the invention. The touch detection circuit 200 includes a touch unit 202, a comparison unit 204, and a touch result generation unit 206. The touch detection circuit 200 can be applied to a light-sensitive touch panel to detect the position of the touch point on the touch panel. The touch unit 202 provides the detection signal SD1 according to the touched state. The touch unit 202 can include a photo sensor, a thin film transistor (TFT), or other electronic components having a light detecting function. The intensity of the light perceived by the touch unit 202 may vary depending on whether the touch unit 202 is touched. In different touch states The touch unit 202 generates different detection signals SD1. The detection signal SD1 is a voltage signal.

另一方面,比較單元204可以由TFT或是其他具有比較 器功能的電子電路所組成。比較單元204會耦接觸控單元202以接收偵測信號SD1,並比較偵測信號SD1與參考電壓VREF1兩者的電壓差,來產生不同的觸控狀態電流。接著,比較單元204會將觸控狀態電流與參考電流進行比較,再產生比較電壓VCOMP。 值得注意的是,參考電流的電流值可以被預先設定來當作比較基準。On the other hand, the comparison unit 204 can be compared by TFT or other The electronic circuit consists of functions. The comparison unit 204 couples the contact control unit 202 to receive the detection signal SD1 and compares the voltage difference between the detection signal SD1 and the reference voltage VREF1 to generate different touch state currents. Next, the comparing unit 204 compares the touch state current with the reference current, and then generates the comparison voltage VCOMP. It is worth noting that the current value of the reference current can be preset to serve as a comparison reference.

觸控結果產生單元206耦接比較單元204,觸控結果產生 單元206接收比較電壓VCOMP後會依據比較電壓VCOMP以提供觸控結果信號ST1。舉例來說,當觸控單元202被使用者的手指觸碰時,觸控單元202接收到的光線會因被使用者的手指遮蔽而減少,偵測信號SD1的電壓會小於參考電壓VREF1的電壓。比較單元204計算偵測信號SD1的電壓與參考電壓VREF1的電壓差來產生比較電壓VCOMP,並將比較電壓VCOMP會傳遞給觸控結果產生單元206。觸控結果產生單元206則可針對比較電壓VCOMP進行放大,並提供相對應的觸控結果信號ST1。如此一來,觸控偵測電路200可藉由觸控結果信號ST1得知目前觸控單元202是處於被觸碰的狀態。The touch result generating unit 206 is coupled to the comparing unit 204, and the touch result is generated. The unit 206 receives the comparison voltage VCOMP and provides a touch result signal ST1 according to the comparison voltage VCOMP. For example, when the touch unit 202 is touched by the user's finger, the light received by the touch unit 202 is reduced by being shielded by the user's finger, and the voltage of the detection signal SD1 is less than the voltage of the reference voltage VREF1. . The comparison unit 204 calculates the voltage difference between the voltage of the detection signal SD1 and the reference voltage VREF1 to generate the comparison voltage VCOMP, and transmits the comparison voltage VCOMP to the touch result generation unit 206. The touch result generating unit 206 can amplify the comparison voltage VCOMP and provide a corresponding touch result signal ST1. As a result, the touch detection circuit 200 can learn that the touch unit 202 is currently touched by the touch result signal ST1.

同理可知,當觸控單元202未被觸碰時,觸控單元202 因未被物體遮蔽而能接收到較多的光線,偵測信號SD1的電壓會 大於參考電壓VREF1的電壓。如此一來,觸控偵測電路200可藉由與上述範例不同的比較電壓VCOMP來得知不同的觸控結果信號ST1,並透過不同的觸控結果信號ST1來得知觸控單元202目前未被使用者的手指所觸碰。Similarly, when the touch unit 202 is not touched, the touch unit 202 Since more light can be received without being obscured by the object, the voltage of the detection signal SD1 will A voltage greater than the reference voltage VREF1. In this manner, the touch detection circuit 200 can learn the different touch result signals ST1 by using the comparison voltage VCOMP different from the above example, and learn that the touch unit 202 is not used by using the different touch result signals ST1. The finger of the person touched.

更值得一提的,上述的參考電流的電流值可以被設置在 第一電流以及第二電流的電流值間。其中的第一電流是觸控單元202有被觸碰時比較單元204所對應產生的觸控狀態電流,而第二電流則是觸控單元202未被觸碰時比較單元204所對應產生的觸控狀態電流。舉例來說,參考電流的電流值可以等於偵測信號SD1的電壓與參考電壓VREF1的電壓差等於0時,比較單元204對應產生的觸控狀態電流的電流值。It is worth mentioning that the current value of the above reference current can be set at Between the first current and the current value of the second current. The first current is the touch state current corresponding to the comparison unit 204 when the touch unit 202 is touched, and the second current is the touch corresponding to the comparison unit 204 when the touch unit 202 is not touched. Control the state current. For example, when the current value of the reference current can be equal to the voltage difference between the voltage of the detection signal SD1 and the reference voltage VREF1 is equal to 0, the comparison unit 204 corresponds to the current value of the generated touch state current.

圖3A繪示本發明另一實施例的觸控偵測電路300的示意 圖。觸控偵測電路300包括觸控單元302、比較單元304以及觸控結果產生單元306。觸控單元302包括二極體D1以及光偵測電晶體P1。二極體D1的陽極耦接參考電壓源VC1,二極體D1的陰極提供偵測信號SD2。在此實施例中,光偵測電晶體P1為N型TFT,光偵測電晶體P1具有第一端(例如汲極)、第二端(例如源極)以及控制端(例如閘極)。光偵測電晶體P1的第一端耦接二極體D1的陰極,光偵測電晶體P1的第二端及控制端相互耦接至參考電壓VC2。從另一個觀點來看,當二極體D1導通時可提供固定的電阻值,而光偵測電晶體P1會隨著偵測到的光強度不同而具有變動的電阻值。因此,觸控單元302可視為一個分壓電路,其中, 二極體D1與光偵測電晶體P1會針對參考電壓源VC1與參考電壓VC2的電壓差進行分壓以產生偵測信號SD2。FIG. 3A is a schematic diagram of a touch detection circuit 300 according to another embodiment of the present invention. Figure. The touch detection circuit 300 includes a touch unit 302, a comparison unit 304, and a touch result generation unit 306. The touch unit 302 includes a diode D1 and a photodetecting transistor P1. The anode of the diode D1 is coupled to the reference voltage source VC1, and the cathode of the diode D1 provides the detection signal SD2. In this embodiment, the photodetecting transistor P1 is an N-type TFT, and the photodetecting transistor P1 has a first end (eg, a drain), a second end (eg, a source), and a control end (eg, a gate). The first end of the photodetecting transistor P1 is coupled to the cathode of the diode D1. The second end of the photodetecting transistor P1 and the control end are coupled to the reference voltage VC2. From another point of view, a fixed resistance value can be provided when the diode D1 is turned on, and the photodetecting transistor P1 has a varying resistance value depending on the detected light intensity. Therefore, the touch unit 302 can be regarded as a voltage dividing circuit, wherein The diode D1 and the photodetecting transistor P1 divide the voltage difference between the reference voltage source VC1 and the reference voltage VC2 to generate the detection signal SD2.

比較單元304包括二極體D2以及電晶體M1。二極體D2的陽極耦接參考電壓源VC3,二極體D2的陰極產生比較電壓VCOMP1。二極體D2用以產生參考電流IREF1。在此實施例中,電晶體M1為N型TFT,電晶體M1具有第一端(例如汲極)、第二端(例如源極)以及控制端(例如閘極)。電晶體M1的第一端耦接至二極體D2的陰極,電晶體M1的控制端用以接收偵測信號SD2,電晶體M1的第二端則耦接至參考電壓VC4。假設偵測信號SD2為電壓信號,電晶體M1會依據偵測信號SD2與參考電壓VC4兩者的電壓差來產生觸控狀態電流IT1。The comparison unit 304 includes a diode D2 and a transistor M1. The anode of the diode D2 is coupled to the reference voltage source VC3, and the cathode of the diode D2 generates the comparison voltage VCOMP1. The diode D2 is used to generate the reference current IREF1. In this embodiment, the transistor M1 is an N-type TFT, and the transistor M1 has a first end (eg, a drain), a second end (eg, a source), and a control terminal (eg, a gate). The first end of the transistor M1 is coupled to the cathode of the diode D2, the control end of the transistor M1 is configured to receive the detection signal SD2, and the second end of the transistor M1 is coupled to the reference voltage VC4. Assuming that the detection signal SD2 is a voltage signal, the transistor M1 generates the touch state current IT1 according to the voltage difference between the detection signal SD2 and the reference voltage VC4.

舉例來說,當使用者的手指觸碰到觸控單元302時,光偵測電晶體P1所接收到的光線會比使用者的手指未接觸觸控單元302時來的少。因此,觸控單元302在不同的觸碰狀態下,光偵測電晶體P1所產生的漏電流也會不同。換句話說,二極體D1的陰極端所提供的偵測信號SD2也會不同。因此,對電晶體M1而言,觸控單元302在不同的觸碰狀態下,控制端與第二端兩端所產生的電壓差(Vgs)也會有所差異,並使得電晶體M1所產生的觸控狀態電流IT1不相同。在此實施例中,二極體D2所提供的參考電流IREF1可視為一個固定的參考電流。比較單元304則針對不同的觸控狀態電流IT1與參考電流IREF1做比較,再依據比較結果產生比較電壓VCOMP1,詳細說明請參考後述。For example, when the user's finger touches the touch unit 302, the light detected by the photodetecting transistor P1 may be less than when the user's finger does not touch the touch unit 302. Therefore, the leakage current generated by the photodetecting transistor P1 may be different under different touch states of the touch unit 302. In other words, the detection signal SD2 provided by the cathode terminal of the diode D1 will also be different. Therefore, for the transistor M1, the voltage difference (Vgs) generated between the control terminal and the second terminal of the touch unit 302 may be different under different touch states, and the transistor M1 is generated. The touch state current IT1 is different. In this embodiment, the reference current IREF1 provided by the diode D2 can be regarded as a fixed reference current. The comparison unit 304 compares the different touch state currents IT1 with the reference current IREF1, and generates a comparison voltage VCOMP1 according to the comparison result. For details, please refer to the following.

觸控結果產生單元306包括電晶體MA以及電晶體MN。 在此實施例中,電晶體MA與電晶體MN為N型TFT。電晶體MA具有第一端(例如汲極)、第二端(例如源極)以及控制端(例如閘極)。電晶體MA的第一端接收參考電源VC5,電晶體MA的控制端耦接比較電壓VCOMP1。電晶體MN具有第一端(例如汲極)、第二端(例如源極)以及控制端(例如閘極)。電晶體MN的第一端耦接至電晶體MA的第二端,電晶體MN的控制端耦接至掃描線SCAN3,電晶體MN的第二端產生觸控結果信號ST2並傳至耦接的資料線DATA3。The touch result generating unit 306 includes a transistor MA and a transistor MN. In this embodiment, the transistor MA and the transistor MN are N-type TFTs. The transistor MA has a first end (e.g., a drain), a second end (e.g., a source), and a control terminal (e.g., a gate). The first end of the transistor MA receives the reference power source VC5, and the control end of the transistor MA is coupled to the comparison voltage VCOMP1. The transistor MN has a first end (e.g., a drain), a second end (e.g., a source), and a control terminal (e.g., a gate). The first end of the transistor MN is coupled to the second end of the transistor MA, the control end of the transistor MN is coupled to the scan line SCAN3, and the second end of the transistor MN generates the touch result signal ST2 and is coupled to the coupled Data line DATA3.

圖3B繪示圖3A觸控偵測電路300的讀出波形示意圖。 其中,圖3B的橫軸代表時間,單位可以為微秒(μs),縱軸則代表電壓,單位可以為毫伏(mV),F代表波形週期。請同時參考圖3A與圖3B,曲線A代表觸控單元302未偵測到光線變化時,電晶體M1汲極的電壓變化。另一方面,曲線B代表觸控單元302偵測到光線變化時,電晶體M1汲極的電壓變化。由曲線B可知,當觸控單元302偵測到光線變化時,電晶體M1汲極的電壓只需要0.01個F的時間就可達到比較電壓VCOMP1。從另一個觀點來看,觸控偵測電路300可減少光偵測電晶體P1的感光時間以增加感應速度。FIG. 3B is a schematic diagram of the readout waveform of the touch detection circuit 300 of FIG. 3A. The horizontal axis of FIG. 3B represents time, the unit may be microseconds (μs), and the vertical axis represents voltage, and the unit may be millivolts (mV), and F represents a waveform period. Please refer to FIG. 3A and FIG. 3B simultaneously. The curve A represents the voltage change of the drain of the transistor M1 when the touch unit 302 does not detect the change of light. On the other hand, the curve B represents the voltage change of the drain of the transistor M1 when the touch unit 302 detects a change in light. As can be seen from the curve B, when the touch unit 302 detects a change in light, the voltage of the drain of the transistor M1 only needs 0.01 F to reach the comparison voltage VCOMP1. From another point of view, the touch detection circuit 300 can reduce the light sensing time of the light detecting transistor P1 to increase the sensing speed.

以下將詳細說明比較單元304與觸控結果產生單元306 兩者之間的動作關係。比較單元304所產生的比較電壓VCOMP1會被傳送至電晶體MA的閘極。在此,電晶體MA可以作為一個 放大器,並依據參考電源VC5及控制端所接收的比較電壓VCOMP1來進行放大。放大後的信號則被傳送至電晶體MN,並在當電晶體MN被導通後,放大後的信號透過電晶體MN傳遞至資料線DATA3以產生觸控結果信號ST2。The comparison unit 304 and the touch result generation unit 306 will be described in detail below. The action relationship between the two. The comparison voltage VCOMP1 generated by the comparison unit 304 is transmitted to the gate of the transistor MA. Here, the transistor MA can be used as a The amplifier is amplified according to the reference voltage VC5 and the comparison voltage VCOMP1 received by the control terminal. The amplified signal is transmitted to the transistor MN, and after the transistor MN is turned on, the amplified signal is transmitted to the data line DATA3 through the transistor MN to generate the touch result signal ST2.

圖4繪示本發明再一實施例的觸控偵測電路400的示意 圖。觸控偵測電路400包括觸控單元402、比較單元404以及觸控結果產生單元406。觸控單元402包括電晶體MD1以及光偵測電晶體P2。在此實施例中,電晶體MD1為N型TFT,電晶體MD1具有第一端(例如汲極)、第二端(例如源極)以及控制端(例如閘極)。電晶體MD1的第一端耦接參考電壓源VC1,電晶體MD1的第二端及控制端會共同耦接並提供偵測信號SD3。比較單元404包括電晶體MB1與電晶體M2。在此實施例中,電晶體MB1與電晶體M2為N型TFT,電晶體MB1具有第一端(例如汲極)、第二端(例如源極)以及控制端(例如閘極)。電晶體MB1的第一端接收參考電壓源VC3,電晶體MB1的控制端以及第二端共同耦接至電晶體M2的第一端。從另一個觀點來看,圖3中的二極體D1可視為圖4中的電晶體MD1,二極體D2可視為電晶體MB1。 另一方面,光偵測電晶體P2、電晶體M2、參考電壓VC2、參考電壓VC4以及觸控結果產生單元406的耦接關係請參考圖3,不在此贅述。FIG. 4 is a schematic diagram of a touch detection circuit 400 according to still another embodiment of the present invention. Figure. The touch detection circuit 400 includes a touch unit 402, a comparison unit 404, and a touch result generation unit 406. The touch unit 402 includes a transistor MD1 and a photodetecting transistor P2. In this embodiment, the transistor MD1 is an N-type TFT, and the transistor MD1 has a first end (eg, a drain), a second end (eg, a source), and a control terminal (eg, a gate). The first end of the transistor MD1 is coupled to the reference voltage source VC1. The second end of the transistor MD1 and the control terminal are coupled together and provide a detection signal SD3. The comparison unit 404 includes a transistor MB1 and a transistor M2. In this embodiment, the transistor MB1 and the transistor M2 are N-type TFTs, and the transistor MB1 has a first end (for example, a drain), a second end (for example, a source), and a control terminal (for example, a gate). The first end of the transistor MB1 receives the reference voltage source VC3, and the control terminal and the second end of the transistor MB1 are commonly coupled to the first end of the transistor M2. From another point of view, the diode D1 in FIG. 3 can be regarded as the transistor MD1 in FIG. 4, and the diode D2 can be regarded as the transistor MB1. On the other hand, please refer to FIG. 3 for the coupling relationship between the photodetecting transistor P2, the transistor M2, the reference voltage VC2, the reference voltage VC4, and the touch result generating unit 406, and details are not described herein.

以下將說明觸控偵測電路400的操作情形,請同時參考圖3。電晶體MD1與光偵測電晶體P2會針對參考電壓源VC1與 參考電壓VC2的電壓差進行分壓以產生偵測信號SD3。另一方面,由於電晶體MB1的控制端與第二端相互耦接,因此電晶體MB1的控制端與第二端兩端的電壓差為零。比較單元404會比較電晶體MB1的控制端與第二端兩端的電壓差(為零)與電晶體M2的控制端與第二端兩端的電壓差(偵測信號SD3與參考電壓VC4的電壓差)。當偵測信號SD3與參考電壓VC4兩者的電壓差大於零時(例如觸碰單元402被手指觸碰),端點VA1的電壓會趨近於參考電壓VC4。另一方面,當電晶體M2的控制端與第二端兩端的電壓差小於零時(例如觸碰單元402未被手指觸碰),端點VA1的電壓會趨近於參考電壓源VC3。如此一來,觸碰單元402在不同的觸碰情況下,端點VA1的電壓就會出現明顯的差異。The operation of the touch detection circuit 400 will be described below. Please refer to FIG. 3 at the same time. The transistor MD1 and the photodetecting transistor P2 are directed to the reference voltage source VC1 and The voltage difference of the reference voltage VC2 is divided to generate a detection signal SD3. On the other hand, since the control terminal and the second terminal of the transistor MB1 are coupled to each other, the voltage difference between the control terminal and the second terminal of the transistor MB1 is zero. The comparing unit 404 compares the voltage difference between the control terminal and the second terminal of the transistor MB1 (zero) and the voltage difference between the control terminal and the second terminal of the transistor M2 (the voltage difference between the detection signal SD3 and the reference voltage VC4) ). When the voltage difference between the detection signal SD3 and the reference voltage VC4 is greater than zero (for example, the touch unit 402 is touched by a finger), the voltage of the terminal VA1 approaches the reference voltage VC4. On the other hand, when the voltage difference between the control terminal and the second terminal of the transistor M2 is less than zero (for example, the touch unit 402 is not touched by a finger), the voltage of the terminal VA1 approaches the reference voltage source VC3. As a result, the touch unit 402 has a significant difference in the voltage of the terminal VA1 under different touch conditions.

圖5繪示本發明又一實施例的觸控偵測電路500的示意 圖。觸控偵測電路500包括觸控單元502、比較單元504以及觸控結果產生單元506。觸控單元502包括電晶體MD2以及光偵測電晶體P3。比較單元504包括電晶體MB2與電晶體M3。觸控結果產生單元506的作動情形請參考觸控結果產生單元306。請同時參考圖4與圖5,觸控偵測電路400與觸控偵測電路500的差異在於,電晶體M3的控制端與第二端分別接收參考電壓VC4與偵測信號SD4。然而,電晶體M2的耦接關係與電晶體M3相反,電晶體M2的控制端與第二端分別接收偵測信號SD3與參考電壓VC4。FIG. 5 is a schematic diagram of a touch detection circuit 500 according to still another embodiment of the present invention. Figure. The touch detection circuit 500 includes a touch unit 502, a comparison unit 504, and a touch result generation unit 506. The touch unit 502 includes a transistor MD2 and a photodetecting transistor P3. The comparison unit 504 includes a transistor MB2 and a transistor M3. For the operation of the touch result generating unit 506, please refer to the touch result generating unit 306. Referring to FIG. 4 and FIG. 5 simultaneously, the difference between the touch detection circuit 400 and the touch detection circuit 500 is that the control terminal and the second end of the transistor M3 receive the reference voltage VC4 and the detection signal SD4, respectively. However, the coupling relationship of the transistor M2 is opposite to that of the transistor M3. The control terminal and the second terminal of the transistor M2 receive the detection signal SD3 and the reference voltage VC4, respectively.

圖6繪示本發明更一實施例的觸控偵測電路600的示意圖。觸控偵測電路600包括觸控單元602、比較單元604以及觸控 結果產生單元606。觸控單元602包括電晶體MD3、電晶體MC1、光偵測電晶體P4以及光偵測電晶體P5。比較單元604包括電晶體MB3與電晶體M4。請同時參考圖4至圖6,觸控單元602與觸控單元402以及觸控單元502相比,觸控單元602中增加了光偵測電晶體P5以及電晶體MC1。光偵測電晶體P5以及電晶體MC1會針對參考電壓源VC1與參考電壓VC4的電壓差進行分壓以產生參考電壓T1。電晶體M4的控制端接收偵測信號SD5,電晶體M4的第二端則接收參考電壓T1。FIG. 6 is a schematic diagram of a touch detection circuit 600 according to a further embodiment of the present invention. The touch detection circuit 600 includes a touch unit 602, a comparison unit 604, and a touch Result generation unit 606. The touch unit 602 includes a transistor MD3, a transistor MC1, a photodetecting transistor P4, and a photodetecting transistor P5. The comparison unit 604 includes a transistor MB3 and a transistor M4. As shown in FIG. 4 to FIG. 6 , the touch unit 602 has a light detecting transistor P5 and a transistor MC1 added to the touch unit 602 . The photodetecting transistor P5 and the transistor MC1 divide the voltage difference between the reference voltage source VC1 and the reference voltage VC4 to generate a reference voltage T1. The control terminal of the transistor M4 receives the detection signal SD5, and the second terminal of the transistor M4 receives the reference voltage T1.

在另一實施例中,電晶體MD3可以用二極體來取代,二極體的陽極耦接至參考電壓源VC1,二極體的陰極用以提供偵測信號SD5。另一方面,電晶體MC1也可以用二極體來取代,二極體的陽極耦接至參考電壓源VC1,二極體的陰極用以提供參考電壓T1。在圖6的實施例中,當光偵測電晶體P4與光偵測電晶體P5所受到的光照強度改變時,偵測信號SD5與參考電壓T1也會隨之改變。另一方面,請參考圖4至圖6,圖4中電晶體M2的第二端與圖5中電晶體M3的控制端都是耦接到參考電壓VC4(可視為一個固定的電壓)。然而,電晶體M4的控制端(接收偵測信號SD5)與第二端(接收參考電壓T1)兩端的電壓差會隨著光強度不同而有較大幅度的改變,並藉以提升觸控偵測的敏感度。In another embodiment, the transistor MD3 can be replaced by a diode, the anode of the diode is coupled to the reference voltage source VC1, and the cathode of the diode is used to provide the detection signal SD5. On the other hand, the transistor MC1 can also be replaced by a diode, the anode of which is coupled to the reference voltage source VC1, and the cathode of the diode is used to provide the reference voltage T1. In the embodiment of FIG. 6, when the light intensity received by the photodetecting transistor P4 and the photodetecting transistor P5 is changed, the detecting signal SD5 and the reference voltage T1 are also changed. On the other hand, please refer to FIG. 4 to FIG. 6. The second end of the transistor M2 in FIG. 4 and the control end of the transistor M3 in FIG. 5 are both coupled to the reference voltage VC4 (which can be regarded as a fixed voltage). However, the voltage difference between the control terminal (receiving detection signal SD5) of the transistor M4 and the second terminal (receiving the reference voltage T1) may vary greatly with the light intensity, thereby improving the touch detection. Sensitivity.

圖7繪示本發明又一實施例的觸控偵測電路700的示意圖。觸控偵測電路700包括觸控單元702、比較單元704以及觸控結果產生單元706。觸控單元702包括電晶體MD4、電晶體MC2、 光偵測電晶體P6以及光偵測電晶體P7。比較單元704包括電晶體MF、電晶體MB4以及電晶體M5。在此實施例中,電晶體MF、電晶體MB4以及電晶體M5為N型TFT。電晶體MF具有第一端(例如汲極)、第二端(例如源極)以及控制端(例如閘極)。電晶體MF的第一端耦接參考電壓源VC3,電晶體MF的第二端產生比較電壓VCOMP2。電晶體MB4的第一端耦接電晶體MF的第二端,電晶體MB4的第二端與控制端共同耦接至電晶體MF的控制端。在另一實施例中,電晶體MB4可以用二極體取代,二極體的陽極耦接至電晶體MF的第二端,二極體的陰極則耦接至電晶體MF的控制端。二極體可用來產生參考電流。FIG. 7 is a schematic diagram of a touch detection circuit 700 according to still another embodiment of the present invention. The touch detection circuit 700 includes a touch unit 702, a comparison unit 704, and a touch result generation unit 706. The touch unit 702 includes a transistor MD4 and a transistor MC2. The light detecting transistor P6 and the light detecting transistor P7. The comparison unit 704 includes a transistor MF, a transistor MB4, and a transistor M5. In this embodiment, the transistor MF, the transistor MB4, and the transistor M5 are N-type TFTs. The transistor MF has a first end (eg, a drain), a second end (eg, a source), and a control terminal (eg, a gate). The first end of the transistor MF is coupled to the reference voltage source VC3, and the second end of the transistor MF generates the comparison voltage VCOMP2. The first end of the transistor MB4 is coupled to the second end of the transistor MF, and the second end of the transistor MB4 is coupled to the control end of the transistor MF. In another embodiment, the transistor MB4 can be replaced by a diode, the anode of the diode is coupled to the second end of the transistor MF, and the cathode of the diode is coupled to the control terminal of the transistor MF. The diode can be used to generate a reference current.

電晶體M5具有第一端(例如汲極)、第二端(例如源極)以及控制端(例如閘極)。電晶體M5的第一端耦接電晶體MB4的第二端,電晶體M5的控制端接收偵測信號SD6,電晶體M5的第二端耦接參考電壓T2。電晶體MF依據偵測信號SD6與參考電壓T2兩者的電壓差來產生觸控狀態電流IT2。請同時參考圖6與圖7,值得注意的是,將比較單元704與比較單元604相比,比較單元704中增加了電晶體MF。電晶體MF可限制流向電晶體MC2與光偵測電晶體P7的電流大小,可限制觸控偵測電路700消耗的工作電流。The transistor M5 has a first end (e.g., a drain), a second end (e.g., a source), and a control terminal (e.g., a gate). The first end of the transistor M5 is coupled to the second end of the transistor MB4, the control end of the transistor M5 receives the detection signal SD6, and the second end of the transistor M5 is coupled to the reference voltage T2. The transistor MF generates the touch state current IT2 according to the voltage difference between the detection signal SD6 and the reference voltage T2. Referring to FIG. 6 and FIG. 7 at the same time, it is worth noting that the comparison unit 704 is compared with the comparison unit 604, and the transistor MF is added to the comparison unit 704. The transistor MF can limit the current flowing to the transistor MC2 and the photodetecting transistor P7, and can limit the operating current consumed by the touch detecting circuit 700.

圖8繪示本發明另一實施例的觸控偵測電路800的示意圖。觸控偵測電路800可適用於電容式觸控面板。觸控偵測電路800包括觸控單元802、比較單元804以及觸控結果產生單元806。 觸控單元802包括觸控偵測電容CT與參考電容CR。觸控偵測電容CT的第一端接收偵測信號SD7,觸控偵測電容CT的第二端則用來提供偵測信號SD7。參考電容CR串接在觸控偵測電容CT的第二端以及參考接地端GND間。觸控結果產生單元806可以是類比數位轉換器。在此實施例中,觸控結果產生單元806可藉由端點VA3的電壓變化來得知觸碰面板的觸碰情況。FIG. 8 is a schematic diagram of a touch detection circuit 800 according to another embodiment of the present invention. The touch detection circuit 800 can be applied to a capacitive touch panel. The touch detection circuit 800 includes a touch unit 802, a comparison unit 804, and a touch result generation unit 806. The touch unit 802 includes a touch detection capacitor CT and a reference capacitor CR. The first end of the touch detection capacitor CT receives the detection signal SD7, and the second end of the touch detection capacitor CT is used to provide the detection signal SD7. The reference capacitor CR is connected in series between the second end of the touch detection capacitor CT and the reference ground GND. The touch result generation unit 806 can be an analog digital converter. In this embodiment, the touch result generating unit 806 can know the touch condition of the touch panel by the voltage change of the end point VA3.

綜上所述,本發明的觸控偵測電路會利用觸控單元依據觸控面板不同的觸控狀態提供不同的偵測信號。接著,比較單元接收到偵測信號後,會將偵測信號與參考電壓相比以產生比較電壓。最後,觸控結果產生單元會將比較電壓的信號進行放大並提供觸控結果信號。如此一來,本發明的觸控偵測電路便可依據觸控結果信號來得知觸控面板的觸控情況。換句話說,本發明的觸控偵測電路藉由分析觸控面板在不同的觸控狀態下所產生的電壓差來判斷目前觸控面板的觸碰情形,用以提升偵測的敏感度。因此,本發明的觸控偵測電路可節省光偵測電晶體所需要的光照時間,以增加偵測速度與敏感性。In summary, the touch detection circuit of the present invention uses the touch unit to provide different detection signals according to different touch states of the touch panel. Then, after receiving the detection signal, the comparison unit compares the detection signal with the reference voltage to generate a comparison voltage. Finally, the touch result generating unit amplifies the signal of the comparison voltage and provides a touch result signal. In this way, the touch detection circuit of the present invention can know the touch condition of the touch panel according to the touch result signal. In other words, the touch detection circuit of the present invention determines the touch situation of the current touch panel by analyzing the voltage difference generated by the touch panel under different touch states, so as to improve the sensitivity of the detection. Therefore, the touch detection circuit of the present invention can save the illumination time required for the photodetecting transistor to increase the detection speed and sensitivity.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.

200‧‧‧觸控偵測電路200‧‧‧Touch detection circuit

202‧‧‧觸控單元202‧‧‧Touch unit

204‧‧‧比較單元204‧‧‧Comparative unit

206‧‧‧觸控結果產生單元206‧‧‧Touch result generation unit

SD1‧‧‧偵測信號SD1‧‧‧Detection signal

ST1‧‧‧觸控結果信號ST1‧‧‧ touch result signal

VREF1‧‧‧參考電壓VREF1‧‧‧ reference voltage

VCOMP‧‧‧比較電壓VCOMP‧‧‧Comparative voltage

Claims (12)

一種觸控偵測電路,包括:一觸控單元,依據被觸碰狀態以提供一偵測信號;一比較單元,耦接該觸控單元,提供一參考電流,該比較單元並依據該偵測信號以及一第一參考電壓的電壓差來產生一觸控狀態電流,該比較單元比較該參考電流以及該觸控狀態電流來產生一比較電壓;以及一觸控結果產生單元,耦接該比較單元,依據該比較電壓來提供一觸控結果信號。A touch detection circuit includes: a touch unit that provides a detection signal according to the touched state; a comparison unit coupled to the touch unit to provide a reference current, and the comparison unit is based on the detection And a voltage difference between the signal and a first reference voltage to generate a touch state current, the comparing unit compares the reference current and the touch state current to generate a comparison voltage; and a touch result generating unit coupled to the comparing unit And providing a touch result signal according to the comparison voltage. 如申請專利範圍第1項所述的觸控偵測電路,其中該觸控單元包括:一二極體,其陽極耦接一參考電壓源,其陰極提供該偵測信號;以及一光偵測電晶體,具有第一端、第二端以及控制端,其第一端耦接該二極體的陰極,該光偵測電晶體的第二端及控制端相互耦接至一第二參考電壓。The touch detection circuit of claim 1, wherein the touch unit comprises: a diode, the anode is coupled to a reference voltage source, the cathode provides the detection signal; and a light detection The transistor has a first end, a second end, and a control end, the first end of which is coupled to the cathode of the diode, and the second end and the control end of the photodetecting transistor are coupled to a second reference voltage . 如申請專利範圍第2項所述的觸控偵測電路,其中該二極體為一電晶體,具有第一端、第二端以及控制端,該電晶體的第一端耦接該參考電壓源,該電晶體的第二端及控制端共同耦接並提供該偵測信號。The touch detection circuit of claim 2, wherein the diode is a transistor having a first end, a second end, and a control end, and the first end of the transistor is coupled to the reference voltage The second end of the transistor and the control end are coupled together and provide the detection signal. 如申請專利範圍第2項所述的觸控偵測電路,其中該光偵測電晶體以及該二極體用以對該參考電壓源與該第二參考電壓的 電壓差進行分壓以產生該偵測信號。The touch detection circuit of claim 2, wherein the photodetecting transistor and the diode are used for the reference voltage source and the second reference voltage The voltage difference is divided to generate the detection signal. 如申請專利範圍第1項所述的觸控偵測電路,其中該比較單元包括:一二極體,其陽極耦接一參考電壓源,其陰極產生該比較電壓,該二極體用以產生該參考電流;以及一第一電晶體,具有第一端、第二端以及控制端,該第一電晶體的第一端耦接至該二極體的陰極,該第一電晶體的第二端與控制端的其中之一接收該偵測信號,且該第一電晶體的第二端與控制端的其中之另一耦接該第一參考電壓,該第一電晶體依據該偵測信號以及該第一參考電壓的電壓差來產生該觸控狀態電流。The touch detection circuit of claim 1, wherein the comparison unit comprises: a diode, the anode is coupled to a reference voltage source, the cathode generates the comparison voltage, and the diode is used to generate a first transistor having a first end, a second end, and a control end, the first end of the first transistor being coupled to the cathode of the diode, and the second of the first transistor One of the terminal and the control terminal receives the detection signal, and the second end of the first transistor is coupled to the other one of the control terminals, the first transistor is configured according to the detection signal and the first transistor The voltage difference of the first reference voltage generates the touch state current. 如申請專利範圍第5項所述的觸控偵測電路,其中該二極體為一第二電晶體,具有第一端、第二端以及控制端,該第二電晶體的第一端接收該參考電壓源,該第二電晶體的控制端以及第二端共耦接至該第一電晶體的第一端。The touch detection circuit of claim 5, wherein the diode is a second transistor having a first end, a second end, and a control end, the first end of the second transistor receiving The reference voltage source, the control end of the second transistor and the second end are commonly coupled to the first end of the first transistor. 如申請專利範圍第1項所述的觸控偵測電路,其中該觸控單元包括:一第一二極體,其陽極耦接一參考電壓源,其陰極提供該偵測信號;一第一光偵測電晶體,具有第一端、第二端以及控制端,其第一端耦接該第一二極體的陰極,該第一光偵測電晶體的第二端及控制端相互耦接至一第二參考電壓;一第二二極體,其陽極耦接該參考電壓源,其陰極提供該第 一參考電壓;以及一第二光偵測電晶體,具有第一端、第二端以及控制端,其第一端耦接該第二二極體的陰極,該第二光偵測電晶體的第二端及控制端相互耦接至一第三參考電壓。The touch detection circuit of claim 1, wherein the touch unit comprises: a first diode, the anode is coupled to a reference voltage source, and the cathode provides the detection signal; The photodetecting transistor has a first end, a second end, and a control end, the first end of which is coupled to the cathode of the first diode, and the second end of the first photodetecting transistor and the control end are coupled to each other Connected to a second reference voltage; a second diode having an anode coupled to the reference voltage source and a cathode providing the second a reference voltage; and a second photodetecting transistor having a first end, a second end, and a control end, the first end of which is coupled to the cathode of the second diode, and the second photodetecting transistor The second end and the control end are coupled to each other to a third reference voltage. 如申請專利範圍第1項所述的觸控偵測電路,其中該比較單元包括:一第一電晶體,具有第一端、第二端以及控制端,其第一端耦接一參考電壓源,其第二端產生該比較電壓;一二極體,其陽極耦接該第一電晶體的第二端,其陰極耦接至該第一電晶體的控制端,該二極體用以產生該參考電流;以及一第二電晶體,具有第一端、第二端以及控制端,該第一電晶體的第一端耦接至該二極體的陰極,該第二電晶體的控制端接收該偵測信號,且該第二電晶體的第二端耦接該第一參考電壓,該第一電晶體依據該偵測信號以及該第一參考電壓的電壓差來產生該觸控狀態電流。The touch detection circuit of claim 1, wherein the comparison unit comprises: a first transistor having a first end, a second end, and a control end, the first end of which is coupled to a reference voltage source The second end generates the comparison voltage; a diode having an anode coupled to the second end of the first transistor, a cathode coupled to the control end of the first transistor, the diode being used to generate The reference current; and a second transistor having a first end, a second end, and a control end, the first end of the first transistor is coupled to the cathode of the diode, and the control end of the second transistor Receiving the detection signal, and the second end of the second transistor is coupled to the first reference voltage, and the first transistor generates the touch state current according to the detection signal and a voltage difference of the first reference voltage . 如申請專利範圍第8項所述的觸控偵測電路,其中該二極體為一第三電晶體,具有第一端、第二端以及控制端,該第三電晶體的第一端耦接至該第一電晶體的第二端,該第三電晶體的第二端及控制端共同耦接至該第二電晶體的第一端。The touch detection circuit of claim 8, wherein the diode is a third transistor having a first end, a second end, and a control end, and the first end of the third transistor is coupled Connected to the second end of the first transistor, the second end of the third transistor and the control end are coupled to the first end of the second transistor. 如申請專利範圍第1項所述的觸控偵測電路,其中該觸控結果產生單元包括:一第一電晶體,具有第一端、第二端以及控制端,其第一端 接收一參考電源,該第一電晶體的控制端耦接該比較電壓;以及一第二電晶體,具有第一端、第二端以及控制端,其第一端耦接至該第一電晶體的第二端,該第二電晶體的控制端接收一掃描訊號,該第二電晶體的第二端產生該觸控結果信號。The touch detection circuit of claim 1, wherein the touch result generating unit comprises: a first transistor having a first end, a second end, and a control end, the first end thereof Receiving a reference power supply, the control end of the first transistor is coupled to the comparison voltage; and a second transistor having a first end, a second end, and a control end, the first end of which is coupled to the first transistor The second end of the second transistor receives a scan signal, and the second end of the second transistor generates the touch result signal. 如申請專利範圍第1項所述的觸控偵測電路,其中該觸控單元包括:一觸控偵測電容,其一端接收一偵測信號,其另一端提供該偵測信號;以及一參考電容,串接在該觸控偵測電容的第二端以及一參考接地端間。The touch detection circuit of the first aspect of the invention, wherein the touch unit comprises: a touch detection capacitor, one end of which receives a detection signal, and the other end of which provides the detection signal; and a reference The capacitor is connected in series between the second end of the touch detection capacitor and a reference ground. 如申請專利範圍第11項所述的觸控偵測電路,其中該觸控結果產生單元為類比數位轉換器。The touch detection circuit of claim 11, wherein the touch result generating unit is an analog digital converter.
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