TWI504868B - - Google Patents
Info
- Publication number
- TWI504868B TWI504868B TW103123868A TW103123868A TWI504868B TW I504868 B TWI504868 B TW I504868B TW 103123868 A TW103123868 A TW 103123868A TW 103123868 A TW103123868 A TW 103123868A TW I504868 B TWI504868 B TW I504868B
- Authority
- TW
- Taiwan
Links
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410272583.3A CN105333962B (en) | 2014-06-18 | 2014-06-18 | A kind of thermometry and system for correcting two waveband temperature measurement error |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI504868B true TWI504868B (en) | 2015-10-21 |
TW201600838A TW201600838A (en) | 2016-01-01 |
Family
ID=54851790
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103123868A TW201600838A (en) | 2014-06-18 | 2014-07-10 | Temperature measurement method for correcting dual waveband temperature measurement error and system |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN105333962B (en) |
TW (1) | TW201600838A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101867715B1 (en) * | 2016-12-12 | 2018-06-14 | 주식회사 포스코 | Temperature measurement apparatus for tap hole of blast furnace |
CN113375757B (en) * | 2020-03-27 | 2022-12-02 | 洛森自动化科技(上海)有限公司 | Method for measuring material level by applying curve simulation and nuclear radiation principle |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW323333B (en) * | 1994-05-30 | 1997-12-21 | Nippon Kokan Kk | |
TW455676B (en) * | 1998-03-18 | 2001-09-21 | Applied Materials Inc | Method and apparatus for measuring substrate temperatures |
CN103411684A (en) * | 2013-07-17 | 2013-11-27 | 中微半导体设备(上海)有限公司 | Method for measuring temperature of film in reaction chamber |
CN103604507A (en) * | 2013-11-25 | 2014-02-26 | 国家电网公司 | Method for detecting temperature rise of conductor in GIS tank body online |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2365659Y (en) * | 1999-04-07 | 2000-02-23 | 何民才 | Multicolour colorimetric thermometer |
CN102749141A (en) * | 2012-07-30 | 2012-10-24 | 中国科学院自动化研究所 | Radiation temperature measuring method and apparatus for measuring true target temperature |
CN103439003B (en) * | 2013-09-03 | 2016-08-31 | 重庆大学 | A kind of method improving infrared measurement of temperature precision |
CN103604504B (en) * | 2013-10-15 | 2016-06-29 | 中国人民解放军海军工程大学 | A kind of accurate temp measuring method of infra-red radiation |
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2014
- 2014-06-18 CN CN201410272583.3A patent/CN105333962B/en active Active
- 2014-07-10 TW TW103123868A patent/TW201600838A/en unknown
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW323333B (en) * | 1994-05-30 | 1997-12-21 | Nippon Kokan Kk | |
TW455676B (en) * | 1998-03-18 | 2001-09-21 | Applied Materials Inc | Method and apparatus for measuring substrate temperatures |
CN103411684A (en) * | 2013-07-17 | 2013-11-27 | 中微半导体设备(上海)有限公司 | Method for measuring temperature of film in reaction chamber |
CN103604507A (en) * | 2013-11-25 | 2014-02-26 | 国家电网公司 | Method for detecting temperature rise of conductor in GIS tank body online |
Also Published As
Publication number | Publication date |
---|---|
CN105333962B (en) | 2018-06-22 |
TW201600838A (en) | 2016-01-01 |
CN105333962A (en) | 2016-02-17 |