TWI504868B - - Google Patents

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Publication number
TWI504868B
TWI504868B TW103123868A TW103123868A TWI504868B TW I504868 B TWI504868 B TW I504868B TW 103123868 A TW103123868 A TW 103123868A TW 103123868 A TW103123868 A TW 103123868A TW I504868 B TWI504868 B TW I504868B
Authority
TW
Taiwan
Application number
TW103123868A
Other languages
Chinese (zh)
Other versions
TW201600838A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of TWI504868B publication Critical patent/TWI504868B/zh
Publication of TW201600838A publication Critical patent/TW201600838A/en

Links

TW103123868A 2014-06-18 2014-07-10 Temperature measurement method for correcting dual waveband temperature measurement error and system TW201600838A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410272583.3A CN105333962B (en) 2014-06-18 2014-06-18 A kind of thermometry and system for correcting two waveband temperature measurement error

Publications (2)

Publication Number Publication Date
TWI504868B true TWI504868B (en) 2015-10-21
TW201600838A TW201600838A (en) 2016-01-01

Family

ID=54851790

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103123868A TW201600838A (en) 2014-06-18 2014-07-10 Temperature measurement method for correcting dual waveband temperature measurement error and system

Country Status (2)

Country Link
CN (1) CN105333962B (en)
TW (1) TW201600838A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101867715B1 (en) * 2016-12-12 2018-06-14 주식회사 포스코 Temperature measurement apparatus for tap hole of blast furnace
CN113375757B (en) * 2020-03-27 2022-12-02 洛森自动化科技(上海)有限公司 Method for measuring material level by applying curve simulation and nuclear radiation principle

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW323333B (en) * 1994-05-30 1997-12-21 Nippon Kokan Kk
TW455676B (en) * 1998-03-18 2001-09-21 Applied Materials Inc Method and apparatus for measuring substrate temperatures
CN103411684A (en) * 2013-07-17 2013-11-27 中微半导体设备(上海)有限公司 Method for measuring temperature of film in reaction chamber
CN103604507A (en) * 2013-11-25 2014-02-26 国家电网公司 Method for detecting temperature rise of conductor in GIS tank body online

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2365659Y (en) * 1999-04-07 2000-02-23 何民才 Multicolour colorimetric thermometer
CN102749141A (en) * 2012-07-30 2012-10-24 中国科学院自动化研究所 Radiation temperature measuring method and apparatus for measuring true target temperature
CN103439003B (en) * 2013-09-03 2016-08-31 重庆大学 A kind of method improving infrared measurement of temperature precision
CN103604504B (en) * 2013-10-15 2016-06-29 中国人民解放军海军工程大学 A kind of accurate temp measuring method of infra-red radiation

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW323333B (en) * 1994-05-30 1997-12-21 Nippon Kokan Kk
TW455676B (en) * 1998-03-18 2001-09-21 Applied Materials Inc Method and apparatus for measuring substrate temperatures
CN103411684A (en) * 2013-07-17 2013-11-27 中微半导体设备(上海)有限公司 Method for measuring temperature of film in reaction chamber
CN103604507A (en) * 2013-11-25 2014-02-26 国家电网公司 Method for detecting temperature rise of conductor in GIS tank body online

Also Published As

Publication number Publication date
CN105333962B (en) 2018-06-22
TW201600838A (en) 2016-01-01
CN105333962A (en) 2016-02-17

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