TWI493059B - Method for plating film - Google Patents

Method for plating film Download PDF

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TWI493059B
TWI493059B TW100126300A TW100126300A TWI493059B TW I493059 B TWI493059 B TW I493059B TW 100126300 A TW100126300 A TW 100126300A TW 100126300 A TW100126300 A TW 100126300A TW I493059 B TWI493059 B TW I493059B
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substrate
shadow mask
coating
mask unit
region
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TW100126300A
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TW201305354A (en
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黃浩榕
周晧煜
康嘉濱
林哲瑋
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群創光電股份有限公司
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Description

鍍膜的方法Coating method

本發明有關於膜層的形成方法,且特別是有關於在大尺寸的基板上進行鍍膜的方法。The present invention relates to a method of forming a film layer, and more particularly to a method of coating a film on a large-sized substrate.

有機發光二極體(Organic Light Emittine Diode;OLED)具有結構簡單、不需外加背光源、解析度高、像素獨立色彩表現佳、反應時間較短等優異的特性,目前已普遍運用於平面顯示器之全彩化的製程技術中。Organic Light Emittine Diode (OLED) has excellent structure, no need for external backlight, high resolution, good pixel independent color performance, and short reaction time. It has been widely used in flat panel displays. Full color process technology.

有機發光二極體顯示元件的製作方法係利用罩幕(Shadow Mask)與像素對位技術將有機發光材料蒸鍍於玻璃基板上以形成一圖案化的有機發光層,其中罩幕係由一金屬薄膜以及一與金屬薄膜的周邊區相連的框架構成。The method for fabricating an organic light-emitting diode display device is to deposit an organic light-emitting material on a glass substrate by using a shadow mask and a pixel alignment technique to form a patterned organic light-emitting layer, wherein the mask is made of a metal. The film and a frame connected to the peripheral region of the metal film are formed.

近年來,隨著玻璃基板的製作技術日益進步,玻璃基板的尺寸日益增加,因此,需要使用尺寸較大的罩幕。然而,罩幕的尺寸增加會衍生出一些問題,例如:框架尺寸增加會導致重量增加且容易變形,因此,在儲存、搬運、與製程中對人員的操作以及機台設計會增加許多難度,以致於製作成本提高;金屬薄膜的尺寸受到供應商的限制,故不易取得大尺寸的金屬薄膜;以及隨著金屬薄膜的尺寸增加,用以加工金屬薄膜的機具也須配合放大,以致於製作成本大幅提高。In recent years, as the production technology of glass substrates has progressed, the size of glass substrates has been increasing, and therefore, it has been required to use a mask having a large size. However, the increase in the size of the mask may cause problems. For example, an increase in the size of the frame may result in an increase in weight and an easy deformation. Therefore, the handling of the personnel and the design of the machine during the storage, handling, and manufacturing process may increase the difficulty. The manufacturing cost is increased; the size of the metal film is limited by the supplier, so it is difficult to obtain a large-sized metal film; and as the size of the metal film increases, the tool for processing the metal film must also be enlarged, so that the manufacturing cost is large. improve.

本發明一實施例提供一種鍍膜的方法,包括:提供一基板、以及一鍍膜源與基板相對,提供一陰影罩幕單元於基板與鍍膜源之間且對應於基板之一第一區域,其中陰影罩幕單元具有一開口圖案;以陰影罩幕單元為罩幕,利用鍍膜源進行一第一鍍膜製程,以於開口圖案所暴露出的第一區域上形成一第一圖案化鍍膜;使陰影罩幕單元與基板之間相對位移,以使位移後的陰影罩幕單元對應於基板的一第二區域,第二區域與第一區域部分重疊或是彼此分離;以及以陰影罩幕單元為罩幕,利用鍍膜源進行一第二鍍膜製程,以於開口圖案所暴露出的第二區域上形成一第二圖案化鍍膜。An embodiment of the invention provides a method for coating a film, comprising: providing a substrate, and a coating source opposite to the substrate, providing a shadow mask unit between the substrate and the coating source and corresponding to a first region of the substrate, wherein the shadow The mask unit has an opening pattern; the shadow mask unit is used as a mask, and a first coating process is performed by using the coating source to form a first patterned coating on the first region exposed by the opening pattern; The relative displacement between the screen unit and the substrate is such that the displaced shadow mask unit corresponds to a second area of the substrate, the second area partially overlaps or separates from the first area; and the shadow mask unit is used as a mask And performing a second coating process by using the coating source to form a second patterned coating on the second region exposed by the opening pattern.

以下將詳細說明本發明實施例之製作與使用方式。然應注意的是,本發明提供許多可供應用的發明概念,其可以多種特定型式實施。文中所舉例討論之特定實施例僅為製造與使用本發明之說明,非用以限制本發明之範圍。此外,在不同實施例中可能使用重複的標號或標示。這些重複僅為了簡單清楚地敘述本發明,不代表所討論之不同實施例及/或結構之間具有任何關連性。再者,當述及一第一材料層位於一第二材料層上或之上時,包括第一材料層與第二材料層直接接觸或間隔有一或更多其他材料層之情形。在圖式中,實施例之形狀或是厚度可擴大,以簡化或是方便標示。The manner of making and using the embodiments of the present invention will be described in detail below. It should be noted, however, that the present invention provides many inventive concepts that can be applied in various specific forms. The specific embodiments discussed herein are merely illustrative of the invention and are not intended to limit the scope of the invention. Moreover, repeated numbers or labels may be used in different embodiments. These repetitions are merely for the purpose of simplicity and clarity of the invention and are not to be construed as a limitation of the various embodiments and/or structures discussed. Furthermore, when a first material layer is referred to or on a second material layer, the first material layer is in direct contact with or separated from the second material layer by one or more other material layers. In the drawings, the shape or thickness of the embodiment may be expanded to simplify or facilitate the marking.

第1A圖至第1D圖繪示本發明一實施例之鍍膜製程的上視圖。第2A至第2D圖分別繪示第1A圖至第1D圖沿I-I’線段的剖面圖。1A to 1D are top views of a coating process according to an embodiment of the present invention. 2A to 2D are cross-sectional views taken along line I-I' of Figs. 1A to 1D, respectively.

請同時參照第1A圖與第2A圖,提供一基板110、以及一鍍膜源120與基板110相對,其中鍍膜源120例如為一蒸發源,其適於在基板上蒸鍍電激發光材料,例如有機發光二極體(OLED)材料。基板110例如為一玻璃基板。於基板110與鍍膜源120之間提供一陰影罩幕單元130,且陰影罩幕單元130對應於基板110之一第一區域A1。在一實施例中,陰影罩幕單元130係配置於第一區域A1上。Referring to FIG. 1A and FIG. 2A simultaneously, a substrate 110 and a coating source 120 are disposed opposite to the substrate 110. The coating source 120 is, for example, an evaporation source, and is adapted to vaporize an electroluminescent material on the substrate, for example. Organic light-emitting diode (OLED) material. The substrate 110 is, for example, a glass substrate. A shadow mask unit 130 is provided between the substrate 110 and the coating source 120, and the shadow mask unit 130 corresponds to one of the first regions A1 of the substrate 110. In an embodiment, the shadow mask unit 130 is disposed on the first area A1.

詳細而言,陰影罩幕單元130具有一開口圖案132暴露出部分第一區域A1。在一實施例中,開口圖案132具有多個開口132a。在一實施例中,陰影罩幕單元130的面積小於基板110的面積,也就是說,陰影罩幕單元130的尺寸小於基板110的尺寸(例如長度及/或寬度)。在一實施例中,陰影罩幕單元130包括一具有開口圖案132的金屬薄膜134以及一框架136,框架136與金屬薄膜134的周邊區接觸以支撐金屬薄膜134。In detail, the shadow mask unit 130 has an opening pattern 132 exposing a portion of the first area A1. In an embodiment, the opening pattern 132 has a plurality of openings 132a. In an embodiment, the area of the shadow mask unit 130 is smaller than the area of the substrate 110, that is, the size of the shadow mask unit 130 is smaller than the size (eg, length and/or width) of the substrate 110. In one embodiment, the shadow mask unit 130 includes a metal film 134 having an opening pattern 132 and a frame 136 that contacts the peripheral region of the metal film 134 to support the metal film 134.

接著,以陰影罩幕單元130為罩幕,利用鍍膜源120進行一鍍膜製程(例如蒸鍍製程),以於開口圖案132所暴露出的第一區域A1上形成一圖案化鍍膜142(如第1B圖與第2B圖所示)。Then, using the shadow mask unit 130 as a mask, a coating process (for example, an evaporation process) is performed by the coating source 120 to form a patterned plating film 142 on the first region A1 exposed by the opening pattern 132 (eg, 1B and 2B)).

然後,請同時參照第1B圖與第2B圖,使陰影罩幕單元130與基板110之間相對位移,以使位移後的陰影罩幕單元130對應於基板110的一第二區域A2。詳細而言,在本實施例中,使陰影罩幕單元130與基板110之間相對位移係為在基板110位置固定的情況下移動陰影罩幕單元130,以改變陰影罩幕單元130與基板110的相對位置。在一實施例中,第二區域A2與第一區域A1彼此不重疊。Then, referring to FIG. 1B and FIG. 2B simultaneously, the shadow mask unit 130 and the substrate 110 are relatively displaced, so that the displaced shadow mask unit 130 corresponds to a second area A2 of the substrate 110. In detail, in the present embodiment, the relative displacement between the shadow mask unit 130 and the substrate 110 is such that the shadow mask unit 130 is moved with the substrate 110 fixed in position to change the shadow mask unit 130 and the substrate 110. Relative position. In an embodiment, the second area A2 and the first area A1 do not overlap each other.

在一實施例中,陰影罩幕單元130係位於基板110之一表面112上,且陰影罩幕單元130的移動方向(如第2B圖所示的移動方向V1)係平行於表面112的任一方向。此外,在移動陰影罩幕單元130時,可一併移動鍍膜源120,以使鍍膜源120對齊陰影罩幕單元130。In one embodiment, the shadow mask unit 130 is located on one surface 112 of the substrate 110, and the moving direction of the shadow mask unit 130 (such as the moving direction V1 shown in FIG. 2B) is parallel to any of the surfaces 112. direction. In addition, when moving the shadow mask unit 130, the coating source 120 can be moved together to align the coating source 120 with the shadow mask unit 130.

之後,以陰影罩幕單元130為罩幕,利用鍍膜源120進行一鍍膜製程,以於開口圖案132所暴露出的第二區域A2上形成一圖案化鍍膜144(如第1C圖與第2C圖所示)。在一實施例中,圖案化鍍膜142與圖案化鍍膜144彼此分離。Then, using the shadow mask unit 130 as a mask, a coating process is performed by the coating source 120 to form a patterned plating film 144 on the second region A2 exposed by the opening pattern 132 (as shown in FIG. 1C and FIG. 2C). Shown). In an embodiment, the patterned plating film 142 and the patterned plating film 144 are separated from each other.

接著,請參照第1C圖與第2C圖,使陰影罩幕單元130與基板110之間再次相對位移,以使再次位移後的陰影罩幕單元130對應於基板110的一第三區域A3。在一實施例中,第三區域A3與第一區域A1及第二區域A2係彼此分離。在一實施例中,陰影罩幕單元130的移動方向(如第2C圖所示的移動方向V2)係平行於表面112的任一方向。Next, referring to FIGS. 1C and 2C, the shadow mask unit 130 and the substrate 110 are again relatively displaced so that the shadow mask unit 130 after the displacement again corresponds to a third region A3 of the substrate 110. In an embodiment, the third area A3 and the first area A1 and the second area A2 are separated from each other. In one embodiment, the direction of movement of the shadow mask unit 130 (such as the direction of movement V2 shown in FIG. 2C) is parallel to either direction of the surface 112.

然後,以陰影罩幕單元130為罩幕,利用鍍膜源120進行一鍍膜製程,以於開口圖案132所暴露出的第三區域A3上形成一圖案化鍍膜146(如第1D圖與第2D圖所示)。圖案化鍍膜142、144、146的材質例如為電激發光材料,如有機發光二極體材料。Then, using the shadow mask unit 130 as a mask, a coating process is performed by the coating source 120 to form a patterned plating film 146 on the third region A3 exposed by the opening pattern 132 (such as 1D and 2D). Shown). The material of the patterned plating film 142, 144, 146 is, for example, an electroluminescent material such as an organic light emitting diode material.

之後,如第1D圖與第2D圖所示,可視情況而重複前述製程步驟(包括依序使陰影罩幕單元130與基板110之間相對位移以及進行鍍膜製程)一或多次,以再於基板110上形成一或多個圖案化鍍膜148。Thereafter, as shown in FIG. 1D and FIG. 2D, the foregoing process steps (including sequentially causing relative displacement between the shadow mask unit 130 and the substrate 110 and performing a coating process) may be repeated one or more times to further One or more patterned plating films 148 are formed on the substrate 110.

在一實施例中,當陰影罩幕單元130的長度L1不小於基板110的長度L2,且陰影罩幕單元130的寬度W1係小於基板110的寬度W2時(如第1A圖所示),可使相對位移的移動方向V1與再次相對位移的移動方向V2皆平行於基板110的寬度方向(如第1C圖所示)。In an embodiment, when the length L1 of the shadow mask unit 130 is not less than the length L2 of the substrate 110, and the width W1 of the shadow mask unit 130 is smaller than the width W2 of the substrate 110 (as shown in FIG. 1A), The moving direction V1 of the relative displacement and the moving direction V2 of the relative displacement are both parallel to the width direction of the substrate 110 (as shown in FIG. 1C).

第3A圖繪示本發明另一實施例之鍍膜製程的上視圖。第3B圖繪示第3A圖沿I-I’線段的剖面圖。在另一實施例中,如第3A圖與第3B圖所示,第一區域A1與第二區域A2可部分重疊,且進行鍍膜製程之後所形成的圖案化鍍膜142與圖案化鍍膜144a可彼此部分重疊。之後,可重複移動陰影罩幕單元並進行鍍膜製程直到完成預定形成在基板110上的所有圖案化鍍膜。FIG. 3A is a top view showing a coating process according to another embodiment of the present invention. Fig. 3B is a cross-sectional view along line I-I' of Fig. 3A. In another embodiment, as shown in FIGS. 3A and 3B, the first region A1 and the second region A2 may partially overlap, and the patterned plating film 142 and the patterned plating film 144a formed after the coating process may be mutually Partial overlap. Thereafter, the shadow mask unit can be repeatedly moved and the plating process is performed until all of the patterned plating films predetermined to be formed on the substrate 110 are completed.

第4圖繪示本發明又一實施例之鍍膜製程的上視圖。在又一實施例中,如第4圖所示,當陰影罩幕單元130的寬度W1係小於基板110的寬度W2,且陰影罩幕單元130的長度L1係小於基板110的長度L2時,陰影罩幕單元130需沿著基板110的長度方向與寬度方向進行相對位移,以完成基板110上所有區域的鍍膜,因此,相對位移的移動方向V1可不平行於再次相對位移的移動方向V2,舉例來說,相對位移的移動方向V1垂直於再次相對位移的移動方向V2。值得注意的是,第4圖的虛線圖案係代表在進行每一次鍍膜製程時陰影罩幕單元130的位置。4 is a top view of a coating process according to still another embodiment of the present invention. In still another embodiment, as shown in FIG. 4, when the width W1 of the shadow mask unit 130 is smaller than the width W2 of the substrate 110, and the length L1 of the shadow mask unit 130 is smaller than the length L2 of the substrate 110, the shadow The mask unit 130 is required to be relatively displaced along the length direction of the substrate 110 and the width direction to complete the coating of all regions on the substrate 110. Therefore, the moving direction V1 of the relative displacement may not be parallel to the moving direction V2 of the relative displacement again, for example. It is said that the moving direction V1 of the relative displacement is perpendicular to the moving direction V2 of the relative displacement again. It is to be noted that the dotted line pattern of Fig. 4 represents the position of the shadow mask unit 130 at each plating process.

第5圖繪示本發明一實施例之鍍膜製程的上視圖。此外,在一實施例中,如第5圖所示,在進行鍍膜製程時,陰影罩幕單元130與基板110可僅部分重疊,且陰影罩幕單元130可朝向方向V3、V4移動。值得注意的是,第5圖的虛線圖案係代表在進行每一次鍍膜製程時陰影罩幕單元130的位置。Fig. 5 is a top view showing a coating process according to an embodiment of the present invention. Further, in an embodiment, as shown in FIG. 5, when the coating process is performed, the shadow mask unit 130 and the substrate 110 may only partially overlap, and the shadow mask unit 130 may move toward the directions V3, V4. It is to be noted that the dotted line pattern of Fig. 5 represents the position of the shadow mask unit 130 at each plating process.

由前述可知,本實施例的鍍膜方法是藉由使陰影罩幕單元130與基板110相對位移來達成全板鍍膜,因此,可使用尺寸較小的陰影罩幕單元130(小於基板110的尺寸)來作為罩幕,故可避免習知因罩幕尺寸增加所衍生出的各種問題,進而增加製程的容易度並大幅降低製作成本。It can be seen from the foregoing that the coating method of the present embodiment achieves full-plate coating by relatively displacing the shadow mask unit 130 and the substrate 110. Therefore, the shadow mask unit 130 having a smaller size can be used (less than the size of the substrate 110). As a mask, it is possible to avoid the problems caused by the increase in the size of the mask, thereby increasing the ease of the process and greatly reducing the manufacturing cost.

第6A圖至第6C圖繪示本發明一實施例之鍍膜製程的上視圖。第7A至第7C圖分別繪示第6A圖至第6C圖沿I-I’線段的剖面圖。值得注意的是,本實施例所使用的元件結構、材質等係相似於前述第1A圖至第1D圖的實施例,因此,於此不再贅述相似元件的結構與材質。6A to 6C are top views of a coating process according to an embodiment of the present invention. 7A to 7C are cross-sectional views taken along line I-I' of Figs. 6A to 6C, respectively. It should be noted that the component structure, material, and the like used in the present embodiment are similar to those of the above-described first to third embodiments, and therefore, the structure and material of similar components will not be described herein.

請同時參照第6A圖與第7A圖,提供一基板110、以及一鍍膜源120與基板110相對。於基板110與鍍膜源120之間提供一陰影罩幕單元130,且陰影罩幕單元130對應於基板110之一第一區域A1。Referring to FIGS. 6A and 7A simultaneously, a substrate 110 and a coating source 120 are provided opposite to the substrate 110. A shadow mask unit 130 is provided between the substrate 110 and the coating source 120, and the shadow mask unit 130 corresponds to one of the first regions A1 of the substrate 110.

接著,以陰影罩幕單元130為罩幕,利用鍍膜源120進行一鍍膜製程,以於陰影罩幕單元130的開口圖案132所暴露出的第一區域A1上形成一圖案化鍍膜142(如第6B圖與第7B圖所示)。Then, using the shadow mask unit 130 as a mask, a coating process is performed by the coating source 120 to form a patterned plating film 142 on the first region A1 exposed by the opening pattern 132 of the shadow mask unit 130 (eg, Figure 6B and Figure 7B).

然後,請同時參照第6B圖與第7B圖,在陰影罩幕單元130位置固定的情況下,移動基板110,以使位移後的陰影罩幕單元130對應於基板110的一第二區域A2。Then, referring to FIG. 6B and FIG. 7B simultaneously, in the case where the shadow mask unit 130 is fixed in position, the substrate 110 is moved such that the displaced shadow mask unit 130 corresponds to a second area A2 of the substrate 110.

此外,在一實施例中,陰影罩幕單元130係位於基板110之一表面112上,且基板110的移動方向(如第7B圖所示的移動方向V1)係平行於表面112的任一方向。In addition, in one embodiment, the shadow mask unit 130 is located on one surface 112 of the substrate 110, and the moving direction of the substrate 110 (such as the moving direction V1 shown in FIG. 7B) is parallel to any direction of the surface 112. .

之後,以陰影罩幕單元130為罩幕,利用鍍膜源120進行一鍍膜製程,以於開口圖案132所暴露出的第二區域A2上形成一圖案化鍍膜144(如第6C圖與第7C圖所示)。Then, using the shadow mask unit 130 as a mask, a coating process is performed by the coating source 120 to form a patterned plating film 144 on the second region A2 exposed by the opening pattern 132 (as shown in FIG. 6C and FIG. 7C). Shown).

之後,如第6C圖與第7C圖所示,可視情況而重複前述製程步驟(包括依序移動基板110以及進行鍍膜製程)一或多次,以再於基板110上形成一或多個圖案化鍍膜148。Thereafter, as shown in FIG. 6C and FIG. 7C, the foregoing process steps (including sequentially moving the substrate 110 and performing the coating process) may be repeated one or more times to form one or more patterning on the substrate 110. Coating 148.

第8圖繪示本發明另一實施例之鍍膜製程的上視圖。在一實施例中,如第8圖所示,在陰影罩幕單元130位置固定的情況下,可沿任意方向移動基板110,例如沿方向V5、V6移動,以於基板110上形成適合的圖案化鍍膜。值得注意的是,第8圖中所繪示的虛線框為基板110沿方向V5、V6位移後所在的位置。Figure 8 is a top plan view showing a coating process of another embodiment of the present invention. In an embodiment, as shown in FIG. 8, in the case where the shadow mask unit 130 is fixed in position, the substrate 110 can be moved in any direction, for example, in the directions V5, V6 to form a suitable pattern on the substrate 110. Coating. It should be noted that the dotted line frame illustrated in FIG. 8 is the position where the substrate 110 is displaced in the directions V5 and V6.

綜上所述,本發明的鍍膜方法係藉由使陰影罩幕單元與基板相對位移來達成全板鍍膜,故可使用尺寸較小的陰影罩幕單元來作為罩幕,因此,可避免習知因罩幕尺寸增加所衍生出的各種問題,進而增加製程的容易度,並大幅降低製作成本。In summary, the coating method of the present invention achieves full-plate coating by relatively displacing the shadow mask unit and the substrate, so that a shadow mask unit having a small size can be used as a mask, thereby avoiding the conventional knowledge. Various problems arising from the increase in the size of the mask increase the ease of the process and greatly reduce the manufacturing cost.

本發明雖以較佳實施例揭露如上,然其並非用以限定本發明的範圍,任何所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可做些許的更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。The present invention has been disclosed in the above preferred embodiments, and is not intended to limit the scope of the present invention. Any one of ordinary skill in the art can make a few changes without departing from the spirit and scope of the invention. The scope of protection of the present invention is therefore defined by the scope of the appended claims.

110...基板110. . . Substrate

112...表面112. . . surface

120...鍍膜源120. . . Coating source

130...陰影罩幕單元130. . . Shadow mask unit

132...開口圖案132. . . Opening pattern

132a...開口132a. . . Opening

134...金屬薄膜134. . . Metal film

136...框架136. . . frame

142、144、144a、146、148...圖案化鍍膜142, 144, 144a, 146, 148. . . Patterned coating

A1...第一區域A1. . . First area

A2...第二區域A2. . . Second area

A3...第三區域A3. . . Third area

L1、L2...長度L1, L2. . . length

V1、V2、V3、V4、V5、V6...移動方向V1, V2, V3, V4, V5, V6. . . Direction of movement

W1、W2...寬度W1, W2. . . width

第1A圖至第1D圖繪示本發明一實施例之鍍膜製程的上視圖。1A to 1D are top views of a coating process according to an embodiment of the present invention.

第2A至第2D圖分別繪示第1A圖至第1D圖沿I-I’線段的剖面圖。2A to 2D are cross-sectional views taken along line I-I' of Figs. 1A to 1D, respectively.

第3A圖繪示本發明另一實施例之鍍膜製程的上視圖。FIG. 3A is a top view showing a coating process according to another embodiment of the present invention.

第3B圖繪示第3A圖沿I-I’線段的剖面圖。Fig. 3B is a cross-sectional view along line I-I' of Fig. 3A.

第4圖繪示本發明又一實施例之鍍膜製程的上視圖。4 is a top view of a coating process according to still another embodiment of the present invention.

第5圖繪示本發明一實施例之鍍膜製程的上視圖。Fig. 5 is a top view showing a coating process according to an embodiment of the present invention.

第6A圖至第6C圖繪示本發明一實施例之鍍膜製程的上視圖。6A to 6C are top views of a coating process according to an embodiment of the present invention.

第7A至第7C圖分別繪示第6A圖至第6C圖沿I-I’線段的剖面圖。7A to 7C are cross-sectional views taken along line I-I' of Figs. 6A to 6C, respectively.

第8圖繪示本發明另一實施例之鍍膜製程的上視圖。Figure 8 is a top plan view showing a coating process of another embodiment of the present invention.

110...基板110. . . Substrate

130...陰影罩幕單元130. . . Shadow mask unit

142...圖案化鍍膜142. . . Patterned coating

A1...第一區域A1. . . First area

A2...第二區域A2. . . Second area

V1...移動方向V1. . . Direction of movement

Claims (14)

一種鍍膜的方法,包括:提供一基板、以及一鍍膜源與該基板相對,提供一陰影罩幕單元於該基板與該鍍膜源之間且對應於該基板之一第一區域,其中該陰影罩幕單元具有一開口圖案;以該陰影罩幕單元為罩幕,利用該鍍膜源進行一第一鍍膜製程,以於該開口圖案所暴露出的該第一區域上形成一第一圖案化鍍膜;使該陰影罩幕單元與該基板之間相對位移,以使位移後的該陰影罩幕單元對應於該基板的一第二區域,該第二區域與該第一區域部分重疊或是彼此分離;以及以該陰影罩幕單元為罩幕,利用該鍍膜源進行一第二鍍膜製程,以於該開口圖案所暴露出的該第二區域上形成一第二圖案化鍍膜,其中使該陰影罩幕單元與該基板之間相對位移的步驟包括:在該基板的位置固定時,移動該陰影罩幕單元;或者在該陰影罩幕單元的位置固定時,移動該基板。 A method of coating, comprising: providing a substrate, and a coating source opposite to the substrate, providing a shadow mask unit between the substrate and the coating source and corresponding to a first region of the substrate, wherein the shadow mask The screen unit has an opening pattern; the shadow mask unit is used as a mask, and the first coating process is performed by using the coating source to form a first patterned coating on the first region exposed by the opening pattern; Disposing the shadow mask unit and the substrate relative to each other such that the displaced shadow mask unit corresponds to a second region of the substrate, the second region partially overlapping or separated from the first region; And using the shadow mask unit as a mask, using the coating source to perform a second coating process to form a second patterned coating on the second region exposed by the opening pattern, wherein the shadow mask is formed The step of relative displacement between the unit and the substrate includes: moving the shadow mask unit when the position of the substrate is fixed; or moving the substrate when the position of the shadow mask unit is fixed 如申請專利範圍第1項所述之鍍膜的方法,其中使該陰影罩幕單元與該基板之間相對位移的步驟包括:在該基板的位置固定時,移動該陰影罩幕單元。 The method of coating according to claim 1, wherein the step of relatively displacing the shadow mask unit with the substrate comprises moving the shadow mask unit when the position of the substrate is fixed. 如申請專利範圍第2項所述之鍍膜的方法,其中使該陰影罩幕單元與該基板之間相對位移的步驟更包括:移動該鍍膜源,以對齊該陰影罩幕單元。 The method of coating according to claim 2, wherein the step of relatively displacing the shadow mask unit with the substrate further comprises: moving the coating source to align the shadow mask unit. 如申請專利範圍第2項所述之鍍膜的方法,其中 該陰影罩幕單元係位於該基板之一表面上,且該陰影罩幕單元的移動方向係平行於該表面的任一方向。 A method of coating as described in claim 2, wherein The shadow mask unit is located on a surface of the substrate, and the moving direction of the shadow mask unit is parallel to any direction of the surface. 如申請專利範圍第1項所述之鍍膜的方法,其中使該陰影罩幕單元與該基板之間相對位移的步驟包括:在該陰影罩幕單元的位置固定時,移動該基板。 The method of coating according to claim 1, wherein the step of relatively displacing the shadow mask unit with the substrate comprises moving the substrate when the position of the shadow mask unit is fixed. 如申請專利範圍第5項所述之鍍膜的方法,其中該陰影罩幕單元係位於該基板之一表面上,且該基板的移動方向係平行於該表面的任一方向。 The method of coating according to claim 5, wherein the shadow mask unit is located on a surface of the substrate, and the moving direction of the substrate is parallel to any direction of the surface. 如申請專利範圍第1項所述之鍍膜的方法,其中該第一圖案化鍍膜與該第二圖案化鍍膜彼此分離或是彼此部分重疊。 The method of coating according to claim 1, wherein the first patterned coating and the second patterned coating are separated from each other or partially overlap each other. 如申請專利範圍第1項所述之鍍膜的方法,更包括:使該陰影罩幕單元與該基板之間再次相對位移,以使再次位移後的該陰影罩幕單元對應於該基板的一第三區域,該第三區域與該第一區域及該第二區域部分重疊或是彼此分離;以及以該陰影罩幕單元為罩幕,利用該鍍膜源進行一第三鍍膜製程,以於該開口圖案所暴露出的該第三區域上形成一第三圖案化鍍膜。 The method of coating according to claim 1, further comprising: re-displace the shadow mask unit and the substrate again, so that the shadow mask unit after the displacement is corresponding to the first of the substrate a third region, the third region partially overlapping or separating from the first region and the second region; and using the shadow mask unit as a mask, using the coating source to perform a third coating process for the opening A third patterned coating is formed on the third region exposed by the pattern. 如申請專利範圍第8項所述之鍍膜的方法,其中該陰影罩幕單元的寬度係大於或等於該基板的寬度,且該相對位移的方向平行於該再次相對位移的方向。 The method of coating according to claim 8, wherein the width of the shadow mask unit is greater than or equal to the width of the substrate, and the direction of the relative displacement is parallel to the direction of the relative displacement. 如申請專利範圍第8項所述之鍍膜的方法,其中該陰影罩幕單元的寬度係小於該基板的寬度,且該陰影罩 幕單元的長度係小於該基板的長度,其中該相對位移的方向不平行於該再次相對位移的方向。 The method of coating according to claim 8, wherein the shadow mask unit has a width smaller than a width of the substrate, and the shadow mask The length of the curtain unit is less than the length of the substrate, wherein the direction of the relative displacement is not parallel to the direction of the relative displacement. 如申請專利範圍第10項所述之鍍膜的方法,其中該相對位移的方向垂直於該再次相對位移的方向。 The method of coating according to claim 10, wherein the direction of the relative displacement is perpendicular to the direction of the relative displacement. 如申請專利範圍第1項所述之鍍膜的方法,其中該第一鍍膜製程與該第二鍍膜製程為蒸鍍製程。 The method of coating according to claim 1, wherein the first coating process and the second coating process are vapor deposition processes. 如申請專利範圍第1項所述之鍍膜的方法,其中該第一圖案化鍍膜與該第二圖案化鍍膜的材質包括電激發光材料。 The method of coating according to claim 1, wherein the material of the first patterned coating and the second patterned coating comprises an electroluminescent material. 如申請專利範圍第1項所述之鍍膜的方法,其中該陰影罩幕單元的面積小於該基板的面積。The method of coating according to claim 1, wherein the area of the shadow mask unit is smaller than the area of the substrate.
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JP2004103269A (en) * 2002-09-05 2004-04-02 Sanyo Electric Co Ltd Manufacture method for organic electroluminescence display device

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004103269A (en) * 2002-09-05 2004-04-02 Sanyo Electric Co Ltd Manufacture method for organic electroluminescence display device

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