TWI490470B - Laminated structure test apparatus and method - Google Patents
Laminated structure test apparatus and method Download PDFInfo
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- TWI490470B TWI490470B TW102145713A TW102145713A TWI490470B TW I490470 B TWI490470 B TW I490470B TW 102145713 A TW102145713 A TW 102145713A TW 102145713 A TW102145713 A TW 102145713A TW I490470 B TWI490470 B TW I490470B
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Description
本揭露係關於一種結構測試。詳言之，本揭露係關於一種層壓結構測試裝置其方法。This disclosure relates to a structural test. In particular, the present disclosure relates to a method of a laminated structure testing device.
層壓結構常見的問題之一為不同的層壓層(laminated plies)間因張裂應力(peeling/opening stress)以及剪切應力(sliding/shear stress)所造成的剝離(delamination)。One of the common problems with laminate structures is the delamination between different laminated plies due to peeling/opening stress and sliding/shear stress.
受測結構的應變能量釋放率(strain energy release rate)G的臨界值(critical value)通常用來表示層壓結構的抗剝離(lamination resistance)能力，例如受測結構因張裂應力所產生的模式(I)應變能量釋放率GI 和因剪切應力所產生的模式(II)應變能量釋放率GII 。The critical value of the strain energy release rate G of the structure to be tested is usually used to indicate the lamination resistance of the laminated structure, such as the mode of the measured structure due to the tensile stress. (I) Strain energy release rate G I and mode due to shear stress (II) Strain energy release rate G II .
本揭露之一方面係關於一種測試一層壓結構的裝置。在一實施例中，層壓結構包括一上表面、與該上表面相對的一下表面、一第一端及一第二端，該第二端被剝離而形成相對配置的一上半部和一下半部，該測試裝置包括：一基座；自該基座向上延伸的一第一突出，該第一突出被固定地與該層壓結構的下半部連接；自該基座向上延伸的一第二突出，該第二突出與該第一突出被間隔開來且該第二突出的末端抵接於該層壓結構第一端的上表面；及一水平放置的懸臂樑，該懸臂樑包括一第一端、一第二端、從該懸臂樑第二端向下延伸的一第三 突出和從該懸臂樑第一端和第二端之間向下延伸一第四突出，該第三突出被固定地與該層壓結構的上半部連接，該第四突出的末端抵接於該層壓結構第一端和第二端之間的下表面。One aspect of the disclosure relates to an apparatus for testing a laminated structure. In one embodiment, the laminate structure includes an upper surface, a lower surface opposite the upper surface, a first end and a second end, the second end being stripped to form an upper half and a relative arrangement The test device includes: a base; a first protrusion extending upward from the base, the first protrusion being fixedly coupled to the lower half of the laminated structure; and an upward extending from the base a second protrusion, the second protrusion being spaced apart from the first protrusion and the end of the second protrusion abutting an upper surface of the first end of the laminate structure; and a horizontally placed cantilever beam, the cantilever beam including a first end, a second end, and a third extending downward from the second end of the cantilever beam Projecting and extending a fourth protrusion from between the first end and the second end of the cantilever beam, the third protrusion being fixedly coupled to the upper half of the laminated structure, the fourth protruding end abutting a lower surface between the first end and the second end of the laminate structure.
本揭露之另一方面係關於一種測試一層壓結構的裝置。在一實施例中，層壓結構包括一上表面、與該上表面相對的一下表面、一第一端及一第二端，該第二端被剝離而形成相對配置的一上半部和一下半部，該測試裝置包括：一配置於該層壓結構下方的基座，該基座包括與該層壓結構第一端的上表面抵接的第一延伸部和與該層壓結構的下半部連接的第二延伸部；以及一配置於該層壓結構上方的懸臂樑，該懸臂樑包括與該層壓結構的上半部連接的第一延伸部以及與該層壓結構第一端和第二端之間的下表面抵接的第二延伸部。Another aspect of the disclosure relates to an apparatus for testing a laminated structure. In one embodiment, the laminate structure includes an upper surface, a lower surface opposite the upper surface, a first end and a second end, the second end being stripped to form an upper half and a relative arrangement The test device includes: a base disposed under the laminate structure, the base including a first extension abutting the upper surface of the first end of the laminate structure and a lower portion of the laminate structure a second extension of the half connection; and a cantilever beam disposed over the laminate structure, the cantilever beam including a first extension coupled to the upper half of the laminate structure and a first end of the laminate structure a second extension that abuts the lower surface between the second ends.
本揭露之另一方面係關於一種層壓結構測試方法。在一實施例中，層壓結構包括一上表面、與該上表面相對的一下表面、一第一端及一第二端，該第二端被剝離而形成相對配置的一上半部和一下半部，該方法包括：在該層壓結構下方提供一基座，該基座包括與該層壓結構第一端的上表面抵接的第一延伸部和與該層壓結構的下半部連接的第二延伸部；在該層壓結構上方提供一懸臂樑，該懸臂樑包括與該層壓結構的上半部連接的第一延伸部以及與該層壓結構第一端和第二端之間的下表面抵接的第二延伸部；以及在該懸臂樑上施加一向上應力。Another aspect of the disclosure relates to a laminate structure testing method. In one embodiment, the laminate structure includes an upper surface, a lower surface opposite the upper surface, a first end and a second end, the second end being stripped to form an upper half and a relative arrangement a half, the method comprising: providing a pedestal under the laminate structure, the pedestal comprising a first extension abutting an upper surface of the first end of the laminate structure and a lower half of the laminate structure a second extension of the connection; providing a cantilever beam over the laminate structure, the cantilever beam including a first extension connected to the upper half of the laminate structure and the first end and the second end of the laminate structure a second extension that abuts the lower surface; and applies an upward stress on the cantilever beam.
1‧‧‧層壓結構測試裝置1‧‧‧Laminated structural test device
10‧‧‧固定平台10‧‧‧Fixed platform
11‧‧‧基座11‧‧‧Base
12‧‧‧懸臂樑12‧‧‧Cantilever beam
13‧‧‧試片13‧‧‧ test strips
110‧‧‧突出/延伸部110‧‧‧Protection/Extension
111‧‧‧突出/延伸部111‧‧‧Protection/Extension
112‧‧‧滾軸112‧‧‧roller
113‧‧‧琴式鉸鏈113‧‧‧Piano hinge
118‧‧‧上表面118‧‧‧ upper surface
120‧‧‧突出/延伸部120‧‧‧Protection/Extension
121‧‧‧突出/延伸部121‧‧‧Protection/Extension
122‧‧‧滾軸122‧‧‧roller
123‧‧‧琴式鉸鏈123‧‧‧Piano hinge
127‧‧‧上表面127‧‧‧ upper surface
128‧‧‧下表面128‧‧‧ lower surface
131‧‧‧上半部131‧‧‧ upper half
132‧‧‧下半部132‧‧‧ Lower half
133‧‧‧上表面133‧‧‧ upper surface
134‧‧‧下表面134‧‧‧ lower surface
圖一顯示本揭露中層壓結構測試裝置之一實施例之示意圖。BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a schematic illustration of one embodiment of a laminated structure testing apparatus of the present disclosure.
圖二A顯示使用本揭露之一實施例的層壓結構測試裝置測試時在層壓結構測試裝置及受測結構上的應力示意圖。Figure 2A is a graph showing the stress on the laminated structure test apparatus and the structure to be tested when tested using the laminate structure test apparatus of one embodiment of the present disclosure.
圖二B顯示使用本揭露之一實施例的層壓結構測試裝置測試時在受測結構上的應力示意圖。Figure 2B is a graph showing the stress on the structure under test when tested using the laminate structure test apparatus of one embodiment of the present disclosure.
圖二C顯示使用本揭露之一實施例的層壓結構測試裝置測試時在受測結構上的應力示意圖。Figure 2C is a graph showing the stress on the structure under test when tested using the laminate structure test apparatus of one embodiment of the present disclosure.
參考圖一，顯示本揭露層壓結構測試裝置之一實施例之示意圖。在本發明的一實施例中，用於測試一試片(specimen)13的層壓結構測試裝置1可包括一固定平台10、一基座11以及一懸臂樑(cantilever beam)12。Referring to Figure 1, there is shown a schematic diagram of one embodiment of the disclosed laminate structure testing apparatus. In an embodiment of the invention, the laminated structure testing device 1 for testing a specimen 13 may include a fixed platform 10, a base 11 and a cantilever beam 12.
在本揭露之一實施例中，試片/層壓結構13可以是但不限於由石墨(graphite)或是polyaryletherketone(PEEK)所組成的24層板，且具有上表面133和下表面134。試片13具有從實質上20毫米(mm)到25毫米的寬度以及從實質上120毫米(mm)到185毫米的長度。受測試的試片13的一端(例如在本實施例中為右端)可在受測試前被分裂(split)或剝離(delaminate)成上半部131和下半部132，上半部131和下半部132之間為一缺口或未連接區域。In one embodiment of the present disclosure, the test piece/laminate structure 13 may be, but not limited to, a 24-layer board composed of graphite or polyaryletherketone (PEEK) and having an upper surface 133 and a lower surface 134. The test piece 13 has a width from substantially 20 millimeters (mm) to 25 mm and a length from substantially 120 mm (mm) to 185 mm. One end of the test piece 13 to be tested (for example, the right end in this embodiment) may be split or delaminated into upper half 131 and lower half 132, upper half 131 and lower before being tested. There is a gap or unconnected area between the halves 132.
基座11位於固定平台10上且包含自上表面118向上延伸的突出或延伸部110和111。突出110和111被間隔開來且突出111可被固定地連接到試片13下半部132的下表面134。突出111可藉由但不限於一夾鉗(clmap，圖未示)與一琴式鉸鏈(piano hinge)113的一端連接，琴式鉸鏈113的另一端可藉由但不限於黏接(adhesive bonding)或其他合適的表面接合技術與試片13下半部132的下表面134連接。在本實施例中，突出110可藉由但不限於一可調整式滾軸(roller)112可移動地支撐或抵接試片13沒有被分裂的一端(例如在本實施例中為左端)的上表面133。在另一實施例中，突出110可藉由但不限於可調整式滾軸112可移動地支撐或抵接試片13的下表面134。The base 11 is located on the fixed platform 10 and includes projections or extensions 110 and 111 that extend upwardly from the upper surface 118. The protrusions 110 and 111 are spaced apart and the protrusion 111 can be fixedly coupled to the lower surface 134 of the lower half 132 of the test strip 13. The protrusion 111 can be connected to one end of a piano hinge 113 by, but not limited to, a clamp (not shown). The other end of the piano hinge 113 can be adhered by but not limited to adhesive bonding. Or other suitable surface bonding technique is coupled to the lower surface 134 of the lower half 132 of the test strip 13. In the present embodiment, the protrusion 110 can movably support or abut the end of the test piece 13 that is not split (for example, the left end in this embodiment) by, but not limited to, an adjustable roller 112. Upper surface 133. In another embodiment, the protrusion 110 can movably support or abut the lower surface 134 of the test strip 13 by, but not limited to, the adjustable roller 112.
懸臂樑12可包含自下表面128向下延伸的突出或延伸部120和121。在本實施例中，突出120可藉由但不限於一可調整式滾軸122可 移動地抵接試片13的下表面134。在另一實施例中，突出120可藉由但不限於一可調整式滾軸122可移動地抵接試片13的上表面133。滾軸122可沿著平行於上表面133或下表面134的軸轉動。同樣參考圖一，突出121可藉由但不限於一夾鉗(圖未示)與一琴式鉸鏈123的一端連接，琴式鉸鏈123的另一端可藉由但不限於黏接或其他合適的表面接合技術與試片13上半部131的上表面133連接。在本實施例中，突出121和突出111實質上對齊且琴式鉸鏈113和123具有位於實質上同一垂直平面的水平轉軸。The cantilever beam 12 can include protrusions or extensions 120 and 121 that extend downwardly from the lower surface 128. In this embodiment, the protrusion 120 can be by, but not limited to, an adjustable roller 122. The lower surface 134 of the test piece 13 is movably abutted. In another embodiment, the protrusion 120 can movably abut the upper surface 133 of the test strip 13 by, but not limited to, an adjustable roller 122. The roller 122 is rotatable along an axis that is parallel to the upper surface 133 or the lower surface 134. Referring also to FIG. 1, the protrusion 121 can be coupled to one end of a piano hinge 123 by, but not limited to, a clamp (not shown). The other end of the piano hinge 123 can be adhered by, but not limited to, adhesive or other suitable The surface bonding technique is connected to the upper surface 133 of the upper half 131 of the test piece 13. In the present embodiment, the projections 121 and the projections 111 are substantially aligned and the piano hinges 113 and 123 have horizontal axes of rotation that are substantially the same vertical plane.
參考圖一，在一實施例中，一液壓夯或其他測試機具可提供施加於試片13之應力P。當一向上應力P通過懸臂樑12上表面127上的一處n時，懸臂樑12會通過突出120及滾軸122同時對試片13施加一向上的彎曲力和向下的張裂力。這兩個力的大小與施加的向上應力P成比例且可藉由改變施力距離c來改變，在本實施例中，施力距離c可以是但不侷限於施力點n和上表面127對應下表面128形成突出120處位置間的距離。Referring to Figure 1, in one embodiment, a hydraulic ram or other test implement can provide a stress P applied to the test strip 13. When an upward stress P passes through a portion n on the upper surface 127 of the cantilever beam 12, the cantilever beam 12 simultaneously applies an upward bending force and a downward tensile force to the test piece 13 through the protrusion 120 and the roller 122. The magnitudes of the two forces are proportional to the applied upward stress P and can be varied by changing the force application distance c. In the present embodiment, the force application distance c can be, but is not limited to, the force application point n and the upper surface 127. The corresponding lower surface 128 forms a distance between the locations at which the protrusions 120 are located.
參考圖一，在本揭露之另一實施例中，層壓結構13可包括一上表面133、與該上表面133相對的一下表面134、一第一端及一第二端，該第二端被剝離而形成相對配置的一上半部131和一下半部132，該測試裝置1包括：一基座11；自該基座11向上延伸的一第一突出111，該第一突出111被固定地與該層壓結構13的下半部132連接；自該基座11向上延伸的一第二突出110，該第二突出110與該第一突出111被間隔開來且該第二突出110的末端抵接於該層壓結構13第一端的上表面133；及一水平放置的懸臂樑12，該懸臂樑12包括一第一端、一第二端、從該懸臂樑12第二端向下延伸的一第三突出121和從該懸臂樑12第一端和第二端之間向下延伸一第四突出120，該第三突出121被固定地與該層壓結構13的上半部131連接，該第四突出120的末端抵接 於該層壓結構13第一端和第二端之間的下表面134。Referring to FIG. 1, in another embodiment of the present disclosure, the laminated structure 13 can include an upper surface 133, a lower surface 134 opposite the upper surface 133, a first end, and a second end, the second end An upper half 131 and a lower half 132 are formed to be oppositely disposed, and the testing device 1 includes: a base 11; a first protrusion 111 extending upward from the base 11, the first protrusion 111 being fixed Connected to the lower half 132 of the laminated structure 13; a second protrusion 110 extending upward from the base 11, the second protrusion 110 being spaced apart from the first protrusion 111 and the second protrusion 110 The end abuts against the upper surface 133 of the first end of the laminated structure 13; and a horizontally placed cantilever beam 12, the cantilever beam 12 includes a first end and a second end, and the second end of the cantilever beam 12 a third protrusion 121 extending downwardly and a fourth protrusion 120 extending downward from between the first end and the second end of the cantilever beam 12, the third protrusion 121 being fixedly coupled to the upper half of the laminated structure 13 131 connection, the end of the fourth protrusion 120 abuts A lower surface 134 between the first end and the second end of the laminate structure 13.
參考圖一，在本揭露之另一實施例中，層壓結構13包括一上表面133、與該上表面133相對的一下表面134、一第一端及一第二端，該第二端被剝離而形成相對配置的一上半部131和一下半部132，該測試裝置1包括：一配置於該層壓結構13下方的基座11，該基座11包括與該層壓結構13第一端的上表面133抵接的第一延伸部110和與該層壓結構13的下半部132連接的第二延伸部111；以及一配置於該層壓結構13上方的懸臂樑12，該懸臂樑12包括與該層壓結構13的上半部131連接的第一延伸部121以及與該層壓結構13第一端和第二端之間的下表面134抵接的第二延伸部120。Referring to FIG. 1, in another embodiment of the present disclosure, the laminated structure 13 includes an upper surface 133, a lower surface 134 opposite the upper surface 133, a first end and a second end, the second end being Stripped to form an upper half 131 and a lower half 132 of the opposite arrangement, the test apparatus 1 includes: a susceptor 11 disposed under the laminated structure 13, the pedestal 11 including the laminated structure 13 first a first extension 110 abutting the upper surface 133 of the end and a second extension 111 connected to the lower half 132 of the laminate structure 13; and a cantilever beam 12 disposed above the laminate structure 13, the cantilever The beam 12 includes a first extension 121 that is coupled to the upper half 131 of the laminate structure 13 and a second extension 120 that abuts the lower surface 134 between the first end and the second end of the laminate structure 13.
本揭露之另一方面係關於一種層壓結構測試方法。參考圖一，在本揭露之另一實施例中，層壓結構13包括一上表面133、與該上表面133相對的一下表面134、一第一端及一第二端，該第二端被剝離而形成相對配置的一上半部131和一下半部132，該方法包括：在該層壓結構13下方提供一基座11，該基座11包括與該層壓結構13第一端的上表面133抵接的第一延伸部110和與該層壓結構13的下半部132連接的第二延伸部111；在該層壓結構13上方提供一懸臂樑12，該懸臂樑12包括與該層壓結構13的上半部131連接的第一延伸部121以及與該層壓結構13第一端和第二端之間的下表面134抵接的第二延伸部120；以及在該懸臂樑12上施加一向上應力。Another aspect of the disclosure relates to a laminate structure testing method. Referring to FIG. 1, in another embodiment of the present disclosure, the laminated structure 13 includes an upper surface 133, a lower surface 134 opposite the upper surface 133, a first end and a second end, the second end being Stripping to form an upper half 131 and a lower half 132 of the opposite configuration, the method comprising: providing a pedestal 11 below the laminate structure 13, the pedestal 11 including the first end of the laminate structure 13 a first extension 110 abutting the surface 133 and a second extension 111 connected to the lower half 132 of the laminate structure 13; a cantilever beam 12 is provided above the laminate structure 13, the cantilever beam 12 including a first extension 121 connecting the upper half 131 of the laminate structure 13 and a second extension 120 abutting the lower surface 134 between the first end and the second end of the laminate structure 13; and the cantilever beam An upward stress is applied to 12.
參考圖二A，顯示使用本揭露之一實施例的層壓結構測試裝置測試時在層壓結構測試裝置及受測結構上的應力示意圖。如圖二A所示，在本實施例中，突出120可藉由可調整式滾軸122抵接試片13下表面134的中央，因此突出120和121間的距離L實質上為試片長度的二分之一。當一向上應力P通過懸臂樑12上表面127上的一處n時，突出120 受到的向下分力為()P，而突出121受到的向下分力為()P，這裡的負號表示上應力P係施加於以突出120為起始點朝向與箭號B相反方向的懸臂樑12位置上，例如在本實施例中上應力P係施加於懸臂樑12位於突出120右側的位置上。此時，試片13下表面134與滾軸122抵接處會受到向上分力()P，而試片13的上半部131會受到的向上分 力為()P，試片13的下半部132會受到的向下分力為()P，且試片 13與滾軸112的接觸點所受向下分力為()P。Referring to Figure 2A, there is shown a schematic diagram of the stress on the laminated structure test apparatus and the structure under test when tested using the laminate structure test apparatus of one embodiment of the present disclosure. As shown in FIG. 2A, in the present embodiment, the protrusion 120 can abut the center of the lower surface 134 of the test piece 13 by the adjustable roller 122, so the distance L between the protrusions 120 and 121 is substantially the length of the test piece. One-half. When an upward stress P passes through a portion n on the upper surface 127 of the cantilever beam 12, the downward component of the protrusion 120 is ( )P, and the downward component of the protrusion 121 is ( P, where the negative sign indicates that the upper stress P is applied to the position of the cantilever beam 12 from the protrusion 120 toward the opposite direction to the arrow B, for example, in the present embodiment, the upper stress P is applied to the cantilever beam 12 Located on the right side of the protrusion 120. At this time, the lower surface 134 of the test piece 13 and the roller 122 are subjected to an upward force component ( P, and the upward force of the upper half 131 of the test piece 13 is ( P, the downward force of the lower half 132 of the test piece 13 is ( P), and the contact point of the test piece 13 and the roller 112 is subjected to a downward force component ( )P.
圖二B顯示使用本揭露之一實施例的層壓結構測試裝置測試時在受測結構上的應力示意圖。如圖二B所示，在本實施例中，當向上應力P通過懸臂樑12上表面127上的一處n時(如圖二A所示)，試片13受到的張裂應力分別為上半部131受到的向上分力()P和下半部132所 受到的向下分力()P。在圖二B中，試片13受到張裂應力所得出的 的模式(I)應變能量釋放率，其中a為上半部131或下半部132的長度，b為試片13的寬度，h為試片13的一半厚度且E11 為試片13的縱向係數(longitudinal modulus)。Figure 2B is a graph showing the stress on the structure under test when tested using the laminate structure test apparatus of one embodiment of the present disclosure. As shown in FIG. 2B, in the present embodiment, when the upward stress P passes through a portion n on the upper surface 127 of the cantilever beam 12 (as shown in FIG. 2A), the tensile stress of the test piece 13 is respectively The upward force exerted by the half 131 ( ) the downward component of the P and lower half 132 ( )P. In Fig. 2B, the mode (I) strain energy release rate of the test piece 13 subjected to the tensile stress is obtained. Where a is the length of the upper half 131 or the lower half 132, b is the width of the test piece 13, h is half the thickness of the test piece 13, and E 11 is the longitudinal modulus of the test piece 13.
圖二C顯示使用本揭露之一實施例的層壓結構測試裝置測試時在受測結構上的應力示意圖。如圖二C所示，在本實施例中，當向上應力P通過懸臂樑12上表面127上的一處n時(如圖二A所示)，試片13受到的剪切應力分別為下表面134與滾軸122抵接處受到的向上分力()P、上半部131受到的向下分力為()P、下半部132受到的向 下分力()P以及試片13與滾軸112的接觸點所受的向下分力 ()P。在圖二B中，試片13受到剪切應力所得出的的模式(II)應變 能量釋放率。Figure 2C is a graph showing the stress on the structure under test when tested using the laminate structure test apparatus of one embodiment of the present disclosure. As shown in FIG. 2C, in the present embodiment, when the upward stress P passes through a portion n on the upper surface 127 of the cantilever beam 12 (as shown in FIG. 2A), the shear stress of the test piece 13 is respectively lower. The upward component of the contact between the surface 134 and the roller 122 ( ) P, the upper part of the 131 is subjected to the downward force component ( ) P, the lower part of the 132 is subjected to the downward force ( )P and the downward component of the contact point between the test piece 13 and the roller 112 ( )P. In Fig. 2B, the mode (II) strain energy release rate obtained from the shear stress of the test piece 13 .
模式(I)應變能量釋放率和模式(II)應變能量釋放 率的比GI /GII 也可用於表示層壓結構的抗剝離能 力。在本實施例中，模式(I)和模式(II)的比。因此可使用本揭露的層壓結構測試裝置，調整施力距離c的大小來獲得不同的 比，使GI /GII 的範圍在零和無限大之間(0GI /GII <∞)。例如，在一實施例中，可使c=-L而得到模式(I)應變能量釋放率GI 。在另一實施例中，可使c=L/3而得到模式(II)應變能量釋放率GII 。換句話說，施力距離c的範圍為-LcL/3。Mode (I) strain energy release rate And mode (II) strain energy release rate The ratio G I /G II can also be used to indicate the peel resistance of the laminate structure. In this embodiment, the ratio of mode (I) to mode (II) . Therefore, the laminated structure testing device of the present disclosure can be used to adjust the magnitude of the applied force distance c to obtain different ratios. , so that the range of G I /G II is between zero and infinity (0 G I /G II <∞). For example, in one embodiment, the mode (I) strain energy release rate G I can be obtained by c=-L. In another embodiment, the mode (II) strain energy release rate G II can be obtained by c=L/3. In other words, the range of the applied force distance c is -L c L/3.
惟上述實施例僅為說明本發明之原理及其功效，而非用以限制本發明。因此，習於此技術之人士對上述實施例進行修改及變化仍不脫本發明之精神。本發明之權利範圍應如後述之申請專利範圍所列。However, the above embodiments are merely illustrative of the principles and effects of the invention and are not intended to limit the invention. Therefore, those skilled in the art can make modifications and changes to the above embodiments without departing from the spirit of the invention. The scope of the invention should be as set forth in the appended claims.
1‧‧‧層壓結構測試裝置1‧‧‧Laminated structural test device
10‧‧‧固定平台10‧‧‧Fixed platform
11‧‧‧基座11‧‧‧Base
110‧‧‧突出/延伸部110‧‧‧Protection/Extension
111‧‧‧突出/延伸部111‧‧‧Protection/Extension
112‧‧‧滾軸112‧‧‧roller
113‧‧‧琴式鉸鏈113‧‧‧Piano hinge
118‧‧‧上表面118‧‧‧ upper surface
12‧‧‧懸臂樑12‧‧‧Cantilever beam
120‧‧‧突出/延伸部120‧‧‧Protection/Extension
121‧‧‧突出/延伸部121‧‧‧Protection/Extension
122‧‧‧滾軸122‧‧‧roller
123‧‧‧琴式鉸鏈123‧‧‧Piano hinge
127‧‧‧上表面127‧‧‧ upper surface
128‧‧‧下表面128‧‧‧ lower surface
13‧‧‧試片13‧‧‧ test strips
131‧‧‧上半部131‧‧‧ upper half
132‧‧‧下半部132‧‧‧ Lower half
133‧‧‧上表面133‧‧‧ upper surface
134‧‧‧下表面134‧‧‧ lower surface
Claims (7)
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| TW102145713A TWI490470B (en) | 2013-12-11 | 2013-12-11 | Laminated structure test apparatus and method |
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| Application Number | Priority Date | Filing Date | Title |
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| TW102145713A TWI490470B (en) | 2013-12-11 | 2013-12-11 | Laminated structure test apparatus and method |
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| TWI490470B true TWI490470B (en) | 2015-07-01 |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04343042A (en) * | 1991-05-20 | 1992-11-30 | Mitsubishi Heavy Ind Ltd | Method for testing interlayer release breakdown toughness |
| JP2010002289A (en) * | 2008-06-20 | 2010-01-07 | Society Of Japanese Aerospace Co Inc | Evaluation testing method of peeling in multilayer structure |
| CN101779115A (en) * | 2008-05-09 | 2010-07-14 | 日东电工株式会社 | Peel test device, method for evaluating impact peel property of adhesive tape, adhesive tape, and mobile device |
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2013
- 2013-12-11 TW TW102145713A patent/TWI490470B/en active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04343042A (en) * | 1991-05-20 | 1992-11-30 | Mitsubishi Heavy Ind Ltd | Method for testing interlayer release breakdown toughness |
| CN101779115A (en) * | 2008-05-09 | 2010-07-14 | 日东电工株式会社 | Peel test device, method for evaluating impact peel property of adhesive tape, adhesive tape, and mobile device |
| JP2010002289A (en) * | 2008-06-20 | 2010-01-07 | Society Of Japanese Aerospace Co Inc | Evaluation testing method of peeling in multilayer structure |
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| TW201522937A (en) | 2015-06-16 |
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