TWI490446B - Lighting module detecting device and lighting module detecting method - Google Patents

Lighting module detecting device and lighting module detecting method Download PDF

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TWI490446B
TWI490446B TW102112648A TW102112648A TWI490446B TW I490446 B TWI490446 B TW I490446B TW 102112648 A TW102112648 A TW 102112648A TW 102112648 A TW102112648 A TW 102112648A TW I490446 B TWI490446 B TW I490446B
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light
lens
image
emitting
illuminating
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TW102112648A
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TW201439500A (en
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李明翰
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致茂電子股份有限公司
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Description

發光模組檢測裝置以及發光模組檢測方法Light-emitting module detecting device and light-emitting module detecting method

本發明係關於一種發光模組檢測裝置以及發光模組檢測方法,並且特別地,關於一種可精確算出發光模組中發光元件與透鏡中心位置之偏差的發光模組檢測裝置以及發光模組檢測方法。The present invention relates to a light-emitting module detecting device and a light-emitting module detecting method, and in particular to a light-emitting module detecting device and a light-emitting module detecting method capable of accurately calculating a deviation between a light-emitting element and a lens center position in a light-emitting module .

大功率LED照明零組件在成為照明產品前,一般要進行光學設計來調整LED發出所需的光源。一次光學設計係指當LED晶片封裝成LED光電零組件時以一次透鏡調整LED本身的出光角度、光強、光通量大小、光強分佈、色溫的範圍與分佈。經過一次光學設計後的LED光電零組件,其發光角度大約為120度左右。由於LED光電零組件屬於點光源,故這些LED光電零組件常以排成陣列的方式形成發光模組,藉此可發出面光源而可供背光模組等裝置應用。Before becoming a lighting product, high-power LED lighting components are generally optically designed to adjust the light source required for LED emission. The primary optical design refers to adjusting the range, distribution of light intensity, luminous flux, light intensity distribution, and color temperature of the LED itself with a primary lens when the LED chip is packaged into an LED photoelectric component. After an optical design of the LED optoelectronic components, the illumination angle is about 120 degrees. Since the LED optoelectronic components are point light sources, the LED optoelectronic components are often arranged in an array to form a light-emitting module, thereby enabling the surface light source to be used for devices such as backlight modules.

以作為背光源的發光模組為例,各LED光電零組件可先以一列的方式設置於長條形的基板上,接著再將類似的各基板並排而形成LED陣列。LED光電零組件係發光角度為120度左右的點光源,雖然藉由陣列排列可達到類似面光源的功能,但仍有出光不均的問題使得面光源的效果不佳。因此,一般LED光電零組件於應用時(不論是否為背光模組之應用),皆須經過二次光學設計來進一步調整出光為所需光源。以背光模組而言,長條形的基板上可再進一步設置多個二次光學透鏡,而各LED光電零組件則分別位於各二次光學透鏡的中心位置。藉由各二次光學透鏡,可令各LED光電零組件所發出的光形成面光源。Taking the light-emitting module as a backlight as an example, each of the LED optoelectronic components can be disposed on the elongated substrate in a row, and then the similar substrates are arranged side by side to form an LED array. The LED photoelectric component is a point light source with an illumination angle of about 120 degrees. Although the function of the surface light source can be achieved by array arrangement, the problem of uneven light output makes the surface light source not effective. Therefore, the general LED optoelectronic components in the application (whether or not the application of the backlight module) must be subjected to secondary optical design to further adjust the light to the desired source. In the case of the backlight module, a plurality of secondary optical lenses can be further disposed on the elongated substrate, and the LED photoelectric components are respectively located at the center positions of the secondary optical lenses. With each secondary optical lens, the light emitted by each LED optoelectronic component can be used to form a surface light source.

請參閱圖一A以及圖一B,圖一A係繪示先前技術之發光模組1的示意圖,圖一B則繪示圖一A之發光模組1的部分側視圖。如圖一A所示,發光模組1可具有基板10以及於基板10上設置一列之發光單 元12。另外,如圖一B所式,各發光單元12包含發光元件120及透鏡122,兩者皆設置在基板10之上,並且發光元件120位在透鏡122的中心位置。發光元件120所發出的光線經過透鏡122的二次光學處理後,可在空間中產生使用者所需的光學特性。Referring to FIG. 1A and FIG. 1B, FIG. 1A is a schematic diagram of a lighting module 1 of the prior art, and FIG. 1B is a partial side view of the lighting module 1 of FIG. As shown in FIG. 1A, the light-emitting module 1 can have a substrate 10 and a column of light-emitting sheets disposed on the substrate 10. Yuan 12. In addition, as shown in FIG. 1B, each of the light emitting units 12 includes a light emitting element 120 and a lens 122, both of which are disposed on the substrate 10, and the light emitting element 120 is located at a center position of the lens 122. The light emitted by the light-emitting element 120 is subjected to secondary optical processing by the lens 122 to produce optical characteristics desired by the user in space.

上述二次光學設計中,若因人為或系統的誤差使得LED光電零組件偏離二次光學透鏡之中心位置時,二次光學透鏡所散射出的光線會影響到面光源的均勻度。因此,發光模組皆須經過二次光學的檢測,以背光模組而言,即檢測各LED光電零組件是否為於對應的二次光學透鏡的中心位置。於先前技術中,此檢測係將先各LED光電零組件通電使其發出光線,當光線經過二次光學透鏡散射至發光模組外時,透過擴散板將空間中的光線強度收集以進行分析,並反推LED光電零組件與二次光學透鏡的位置,藉此得知LED光電零組件是否位於二次光學透鏡的中心位置。In the above secondary optical design, if the LED photoelectric component deviates from the center position of the secondary optical lens due to an artificial or systematic error, the light scattered by the secondary optical lens affects the uniformity of the surface light source. Therefore, the illumination module must be subjected to secondary optical detection. In the case of the backlight module, it is detected whether the LED photoelectric components are at the center position of the corresponding secondary optical lens. In the prior art, the detection system first energizes each of the LED optoelectronic components to emit light. When the light is scattered outside the illumination module through the secondary optical lens, the intensity of the light in the space is collected through the diffusion plate for analysis. And the position of the LED optoelectronic component and the secondary optical lens is reversed, thereby knowing whether the LED optoelectronic component is located at the center of the secondary optical lens.

如上所述,於先前技術的二次光學檢測中必須先連接電極來點亮LED光電零組件,再以其所發出之光源進行檢測。各LED光電零組件設置於基板上而成為發光模組時,通常各LED光電零組件的電極接透過基板上的電路連接到一個統一的電極開關,故所有LED光電零組件會同時被點亮。若以先前技術之二次檢測方法對其中一個LED光電零組件的位置進行檢測時,可能會被其他LED光電零組件所發出的光源所干擾,導致檢測結果嚴重偏差。另外,即便是同樣規格的LED光電零組件,所發出的光源也可能具有個體差異,若以LED光電零組件所發出光源進行檢測同時也會受到不同光源的偏差所干擾,而必須各別進行校正而增加檢測的複雜度。As described above, in the secondary optical inspection of the prior art, the electrodes must be connected first to illuminate the LED optoelectronic components, and then the light source emitted therefrom is detected. When the LED photoelectric components are disposed on the substrate and become the light-emitting module, usually the electrodes of the LED photoelectric components are connected to a unified electrode switch through the circuit on the substrate, so all the LED photoelectric components are simultaneously illuminated. If the position of one of the LED optoelectronic components is detected by the secondary detection method of the prior art, it may be disturbed by the light source emitted by other LED optoelectronic components, resulting in a serious deviation of the detection result. In addition, even for the same specification of LED optoelectronic components, the emitted light source may have individual differences. If the light source emitted by the LED photoelectric component is detected, it will also be interfered by the deviation of different light sources, and must be corrected separately. Increase the complexity of detection.

因此,本發明之一範疇在於提供一種不需透過發光元件所發出之光源即可精確算出發光元件與透鏡中心位置之偏差的發光模組檢測裝置,以解決先前技術之問題。Accordingly, it is an object of the present invention to provide an illumination module detecting apparatus that accurately calculates a deviation of a position of a light-emitting element from a center of a lens without transmitting a light source emitted from the light-emitting element, to solve the problems of the prior art.

根據一具體實施例,本發明之發光模組檢測裝置係用來檢測包含發光模組之發光元件是否為於透鏡的中心位置,其包含光源、第一攝像單元以及第二攝像單元。發光模組檢測裝置的光源係自透鏡外發出光源,以照射發光模組之透鏡及發光元件,第一攝像單元可自透鏡的第一側 向對透鏡及發光元件擷取第一影像,而第二攝像單元則可自透鏡的第二側向對透鏡及發光元件擷取第二影像,其中,第一側向與第二側向間具有角度不為零的夾角。根據第一攝像單元與第二攝像單元所擷取出的第一影像、第二影像以及第一側向與第二側向間之夾角,可計算得到發光元件與透鏡中心位置間的偏差。According to a specific embodiment, the illumination module detecting device of the present invention is configured to detect whether a light emitting component including the light emitting module is a center position of the lens, and includes a light source, a first imaging unit, and a second imaging unit. The light source of the illumination module detecting device emits a light source from outside the lens to illuminate the lens and the light emitting component of the light emitting module, and the first camera unit can be from the first side of the lens The first image is captured from the lens and the light-emitting element, and the second image capturing unit can capture the second image from the second side of the lens to the lens and the light-emitting element, wherein the first lateral direction and the second lateral direction have The angle at which the angle is not zero. The deviation between the light-emitting element and the center position of the lens can be calculated according to the angle between the first image and the second image taken by the first image capturing unit and the second image capturing unit and the first lateral direction and the second lateral direction.

本發明之另一範疇在於提供一種發光模組檢測方法,可解決先前技術之問題。Another aspect of the present invention is to provide a method for detecting a light-emitting module that solves the problems of the prior art.

根據另一具體實施例,本發明之發光模組檢測方法可用來檢測發光模組之發光元件是否位於透鏡的中心位置。發光模組檢測方法包含下列步驟:自透鏡外對透鏡以及發光元件照射光線;自透鏡的第一側向對透鏡以及發光元件擷取第一影像;以及,自透鏡的第二側向對透鏡以及發光元件擷取第二影像。上述第一側向與第二側向之間具有一不為零的夾角。根據上述發光模組檢測方法所獲得的第一影像、第二影像以及第一側向與第二側向間之夾角,可計算出發光元件與透鏡中心位置間的偏差。According to another embodiment, the illumination module detection method of the present invention can be used to detect whether the illumination element of the illumination module is located at a central position of the lens. The method for detecting a light module comprises the steps of: illuminating a lens and a light emitting element from outside the lens; capturing a first image from the first side of the lens to the lens and the light emitting element; and, from the second side of the lens to the lens and The illuminating element captures the second image. There is a non-zero angle between the first lateral direction and the second lateral direction. According to the angle between the first image and the second image obtained by the illumination module detecting method and the first lateral direction and the second lateral direction, the deviation between the light-emitting element and the center position of the lens can be calculated.

關於本發明之優點與精神可以藉由以下的發明詳述及所附圖式得到進一步的瞭解。The advantages and spirit of the present invention will be further understood from the following detailed description of the invention.

1‧‧‧發光模組1‧‧‧Lighting module

10‧‧‧基板10‧‧‧Substrate

12‧‧‧發光單元12‧‧‧Lighting unit

120‧‧‧發光元件120‧‧‧Lighting elements

122‧‧‧透鏡122‧‧‧ lens

2‧‧‧發光模組檢測裝置2‧‧‧Lighting module detection device

20‧‧‧光源20‧‧‧Light source

22‧‧‧第一攝像單元22‧‧‧First camera unit

24‧‧‧第二攝像單元24‧‧‧Second camera unit

26‧‧‧處理器26‧‧‧ Processor

260‧‧‧影像處理程式260‧‧‧Image Processing Program

D1‧‧‧第一側向D1‧‧‧ first lateral

D2‧‧‧第二側向D2‧‧‧ second lateral direction

1220‧‧‧中心位置1220‧‧‧ central location

L‧‧‧絕對偏差距離L‧‧‧Absolute deviation distance

L1‧‧‧第一投影距離L1‧‧‧first projection distance

L2‧‧‧第二投影距離L2‧‧‧second projection distance

a‧‧‧第一偏差距離A‧‧‧first deviation distance

b‧‧‧第二偏差距離B‧‧‧second deviation distance

θ‧‧‧夾角Θ‧‧‧ angle

S30~S34、S340~S344‧‧‧流程步驟S30~S34, S340~S344‧‧‧ Process steps

圖一A係繪示先前技術之發光模組的示意圖。FIG. 1A is a schematic diagram showing a prior art lighting module.

圖一B係繪示圖一A之發光模組的部分側視圖。FIG. 1B is a partial side view showing the light emitting module of FIG.

圖二係繪示根據本發明之一具體實施例之發光模組檢測裝置的示意圖。2 is a schematic diagram of a light module detecting device according to an embodiment of the present invention.

圖三係繪示圖二之發光模組檢測裝置擷取發光元件與透鏡的示意圖。FIG. 3 is a schematic diagram showing the illumination module detecting device of FIG. 2 capturing the light-emitting element and the lens.

圖四係繪示根據本發明之一具體實施例之發光模組檢測方法的步驟流程圖。FIG. 4 is a flow chart showing the steps of a method for detecting a light-emitting module according to an embodiment of the present invention.

圖五係繪示圖四之發光模組檢測方法進一步的步驟流程圖。FIG. 5 is a flow chart showing the further steps of the method for detecting the illumination module of FIG.

請參閱圖二及圖三,圖二係繪示根據本發明之一具體實施例之發光模組檢測裝置2的示意圖,圖三則繪示圖二之發光模組檢測裝置2 擷取發光元件120與透鏡122的詳細示意圖。如圖二所示,發光模組檢測裝置2可用來檢測發光模組1,於本具體實施例中,發光模組1可參照圖一A及圖一B所示。發光模組檢測裝置2可用來檢測發光模組1的發光元件120是否位於其對應之透鏡122的中心位置,以下將詳述發光模組檢測裝置2之各單元的結構、功能與其相對關係。Referring to FIG. 2 and FIG. 3 , FIG. 2 is a schematic diagram of a light-emitting module detecting device 2 according to an embodiment of the present invention, and FIG. 3 is a second embodiment of the light-emitting module detecting device 2 . A detailed schematic diagram of the light-emitting element 120 and the lens 122 is taken. As shown in FIG. 2, the light-emitting module detecting device 2 can be used to detect the light-emitting module 1. In the specific embodiment, the light-emitting module 1 can be referred to FIG. 1A and FIG. The illuminating module detecting device 2 can be used to detect whether the illuminating element 120 of the illuminating module 1 is located at the center of the corresponding lens 122. The structure and function of each unit of the illuminating module detecting device 2 will be described in detail below.

於本具體實施例中,發光模組檢測裝置2包含有光源20、第一攝像單元22以及第二攝像單元24。光源20可對發光模組1之發光單元12提供光線,以照亮發光單元12之發光元件120以及透鏡122。第一攝像單元22以及第二攝像單元24可分別設置在透鏡122側面的不同位置上,並可分別從第一側向D1以及第二側向D2對發光元件120及透鏡122取像。請注意,於實務中,光源20的設置位置以及所提供之光線的方向並不限定於本具體實施例,而以其提供之光線能被發光元件12所反射,且反射的光線能被第一攝像單元22及第二攝像單元24接收而形成影像為原則。換言之,光源20對發光單元12投射光線,而發光單元12的發光元件120及透鏡122可反射這些光線,第一攝像單元22及第二攝像單元24則可接收這些反射的光線,藉以擷取發光元件120及透鏡122在不同側向上的第一影像及第二影像。In the specific embodiment, the illumination module detecting device 2 includes a light source 20, a first imaging unit 22, and a second imaging unit 24. The light source 20 can provide light to the light emitting unit 12 of the light emitting module 1 to illuminate the light emitting element 120 and the lens 122 of the light emitting unit 12. The first imaging unit 22 and the second imaging unit 24 may be respectively disposed at different positions on the side of the lens 122, and may image the light-emitting element 120 and the lens 122 from the first side D1 and the second side D2, respectively. Please note that in practice, the position of the light source 20 and the direction of the light provided are not limited to the specific embodiment, and the light provided by the light source can be reflected by the light-emitting element 12, and the reflected light can be first. The imaging unit 22 and the second imaging unit 24 receive and form an image as a principle. In other words, the light source 20 projects light to the light emitting unit 12, and the light emitting element 120 and the lens 122 of the light emitting unit 12 can reflect the light, and the first image capturing unit 22 and the second image capturing unit 24 can receive the reflected light, thereby extracting light. The first image and the second image of the component 120 and the lens 122 in different lateral directions.

如圖二所示,發光模組檢測裝置2的第一攝像單元22與第二攝像單元24係分別位於不同的位置,並從第一側向D1與第二側向D2對發光單元12取像,其中第一側向D1與第二側向D2之間具有不為零之夾角。於本具體實施例中,第一攝像單元22與第二攝像單元24係分別自第一側向D1與第二側向D2正對發光單元12,換言之,由發光元件120及透鏡122所反射的光線可視為垂直地進入第一攝像單元22與第二攝像單元24。因此,由第一攝像單元22所擷取到的第一影像以及夾角可得知發光元件120與透鏡122之中心位置於第二側向D2上的第一偏差距離,相對地,由第二攝像單元22所擷取到的第二影像以及夾角可得知發光元件120與透鏡122之中心位置於第一側向D1上的第二偏差距離。As shown in FIG. 2, the first imaging unit 22 and the second imaging unit 24 of the illumination module detecting device 2 are respectively located at different positions, and the light-emitting unit 12 is imaged from the first side D1 and the second side D2. , wherein the first lateral direction D1 and the second lateral direction D2 have an angle of not zero. In this embodiment, the first imaging unit 22 and the second imaging unit 24 face the light-emitting unit 12 from the first side D1 and the second side D2, respectively, in other words, reflected by the light-emitting element 120 and the lens 122. The light can be regarded as entering the first camera unit 22 and the second camera unit 24 vertically. Therefore, the first image captured by the first imaging unit 22 and the included angle can be used to know the first deviation distance between the center position of the light-emitting element 120 and the lens 122 on the second lateral direction D2, and relatively, by the second imaging. The second image captured by the unit 22 and the included angle can be used to know the second deviation distance between the center position of the light-emitting element 120 and the lens 122 on the first lateral direction D1.

如圖三所示,由發光單元12外朝發光單元12看過去,發光元件120於基板10上之位置偏離透鏡122的中心位置1220,兩者間具有一 絕對偏差距離L。上述發光元件120與中心位置1220間之偏差,在第二影像中可投影出一第二投影距離L2,其係沿第二側向D2之垂直方向延伸,而根據第二投影距離L2、夾角θ以及a=L2/cos(90-θ)的公式可計算出沿第一側向D1之第一偏差距離a。同樣地,第一影像中可投影出一第一投影距離L1,其係沿第一側向D1之垂直方向延伸,而根據第一投影距離L1、夾角θ以及b=L1/cos(90-θ)的公式可計算出沿第二側向D2之第二偏差距離b。獲得第一偏差距離L1與第二偏差距離L2後,可再由夾角θ以及L2 =a2 +b2 -2ab.cos(180-θ)的公式算出絕對偏差距離L。因此,藉由第一影像、第二影像以及兩側向間的夾角θ,可算出發光元件120與透鏡122之中心位置1220的實際偏差和絕對偏差距離。As shown in FIG. 3, from the outside of the light-emitting unit 12 toward the light-emitting unit 12, the position of the light-emitting element 120 on the substrate 10 is offset from the center position 1220 of the lens 122 with an absolute deviation distance L therebetween. The deviation between the light-emitting element 120 and the central position 1220 can project a second projection distance L2 in the second image, which extends in the vertical direction of the second lateral direction D2, and according to the second projection distance L2, the angle θ And the formula of a = L2 / cos (90 - θ) can calculate the first deviation distance a along the first lateral direction D1. Similarly, a first projection distance L1 can be projected in the first image, which extends in the vertical direction of the first lateral direction D1, and according to the first projection distance L1, the included angle θ, and b=L1/cos (90-θ) The formula can calculate the second deviation distance b along the second lateral direction D2. After obtaining the first deviation distance L1 and the second deviation distance L2, the angle θ and L 2 = a 2 + b 2 -2ab can be further increased. The formula of cos(180-θ) calculates the absolute deviation distance L. Therefore, the actual deviation and the absolute deviation distance between the central position 1220 of the light-emitting element 120 and the lens 122 can be calculated from the first image, the second image, and the angle θ between the two sides.

上述透過第一影像、第二影像以及夾角θ來得出發光元件120與透鏡122之中心位置1220的實際偏差和絕對偏差距離的步驟,可由一處理器統一進行處理。請再參閱圖二,發光模組檢測裝置2可進一步包含處理器26,其係與第一攝像單元22以及第二攝像單元24連接,用以接收兩者所擷取的第一影像及第二影像,也可用來進行第一攝像單元22以及第二攝像單元24的控制。此外,處理器26亦能進一步連接光源20,以控制光源20對發光單元12投射光線。於實務中,處理器26可為但不受限於一主控電腦,用來控制發光模組檢測裝置2的各單元。處理器26內包含有影像處理程式260,其可分析第一影像以及第二影像以計算獲得發光元件120與透鏡122之中心位置1220間的實際偏差。The step of obtaining the actual deviation and the absolute deviation distance between the light-emitting element 120 and the center position 1220 of the lens 122 through the first image, the second image, and the angle θ can be uniformly processed by a processor. Referring to FIG. 2, the illuminating module detecting device 2 may further include a processor 26 connected to the first camera unit 22 and the second camera unit 24 for receiving the first image and the second image captured by the two. The image can also be used to control the first camera unit 22 and the second camera unit 24. In addition, the processor 26 can further connect the light source 20 to control the light source 20 to project light to the light emitting unit 12. In practice, the processor 26 can be, but is not limited to, a host computer for controlling the units of the lighting module detecting device 2. The processor 26 includes an image processing program 260 that can analyze the first image and the second image to calculate an actual deviation between the central position 1220 of the light-emitting element 120 and the lens 122.

影像處理程式260在處理器26接收到第一影像與第二影像後,可分別對第一影像與第二影像進行影像處理,以分辨出影像中的發光元件120及透鏡122,並量測出各影像中發光元件120與透鏡122之中心位置的偏移量。此外,影像處理程式260也可進行上述對各偏差距離的計算,以獲得發光元件120與透鏡122在空間中的實際偏差與絕對偏差距離。After receiving the first image and the second image, the image processing program 260 can perform image processing on the first image and the second image respectively to distinguish the light-emitting component 120 and the lens 122 in the image, and measure the same. The amount of shift of the light-emitting element 120 from the center position of the lens 122 in each image. In addition, the image processing program 260 can also perform the above calculation of each deviation distance to obtain an actual deviation and an absolute deviation distance between the light-emitting element 120 and the lens 122 in space.

於本具體實施例中,第一攝像單元22與第二攝像單元24可固定於圖二所示的位置,當檢測完其中一個發光單元12時,可令基板10移動,致使下一個發光單元12進入到檢測位置。於本具體實施例中,發光模組檢測裝置2可再包含傳送機構,其可用來置放或連接發光模組1,使發 光模組1可被傳送到定位,以令各發光單元12依序移動到檢測位置供第一攝像單元22及第二攝像單元24擷取第一影像以及第二影像。In this embodiment, the first camera unit 22 and the second camera unit 24 can be fixed at the position shown in FIG. 2, and when one of the light-emitting units 12 is detected, the substrate 10 can be moved, so that the next light-emitting unit 12 is caused. Enter the detection location. In this embodiment, the illumination module detecting device 2 can further include a transmission mechanism, which can be used for placing or connecting the illumination module 1 to enable The light module 1 can be transferred to the positioning so that the light-emitting units 12 are sequentially moved to the detection position for the first imaging unit 22 and the second imaging unit 24 to capture the first image and the second image.

如上述,發光模組檢測裝置2可透過外加光源以及位於透鏡側面不同位置之攝像單元擷取發光元件及透鏡之影像,判斷發光元件是否位於透鏡的中心位置,同時發光元件若不位於透鏡的中心位置,亦可計算出發光元件與中心位置的偏差量以利校正。因此,本發明的發光模組檢測裝置於檢測時不需點亮發光元件,可避免因個體差異或是其他發光元件的干擾導致檢測誤差。請注意,上述各具體實施例的發光元件可為發光二極體,但於實務中並不以此為限,而是各種適用二次光學設計的發光元件均可透過本發明之發光模組檢測裝置進行檢測。As described above, the illumination module detecting device 2 can capture the image of the light-emitting component and the lens through the external light source and the image capturing unit at different positions on the side of the lens to determine whether the light-emitting component is located at the center of the lens, and the light-emitting component is not located at the center of the lens. The position can also calculate the amount of deviation of the illuminating element from the center position for correction. Therefore, the illumination module detecting device of the present invention does not need to illuminate the light-emitting elements during detection, and can avoid detection errors caused by individual differences or interference of other light-emitting elements. Please note that the light-emitting elements of the above specific embodiments may be light-emitting diodes, but not limited thereto in practice, but various light-emitting elements suitable for secondary optical design can be detected by the light-emitting module of the present invention. The device performs the test.

請參閱圖四,圖四係繪示根據本發明之一具體實施例之發光模組檢測方法的步驟流程圖。圖四之發光模組檢測方法可透過如圖二之發光模組檢測裝置2來檢測發光模組1,因此以下藉發光模組檢測裝置2對檢測方法進行說明。如圖四所示,發光模組檢測方法包含下列步驟:於步驟S30,自透鏡122外對透鏡122及發光元件120照射光線;於步驟S32,分別自透鏡122的第一側向D1以及第二側向D2,對透鏡122及發光元件120擷取第一影像及第二影像,其中第一側向D1與第二側向D2間具有不為零的夾角θ。上述步驟S30可透過圖二之發光模組檢測裝置2的光源20來進行,亦即光源20對透鏡122與發光元件120照射光線。同樣地,步驟S32也可透過第一攝像單元22以及第二攝像單元24來進行,即第一攝像單元22以及第二攝像單元24分別取得第一影像及第二影像。Referring to FIG. 4, FIG. 4 is a flow chart showing the steps of a method for detecting a light-emitting module according to an embodiment of the present invention. The illumination module detection method of FIG. 4 can detect the illumination module 1 through the illumination module detection device 2 of FIG. 2. Therefore, the detection method will be described below by the illumination module detection device 2. As shown in FIG. 4, the method for detecting a light-emitting module includes the following steps: in step S30, the lens 122 and the light-emitting element 120 are irradiated with light from outside the lens 122; and in step S32, respectively, from the first side of the lens 122 to the D1 and the second In the lateral direction D2, the first image and the second image are captured by the lens 122 and the light-emitting element 120, wherein the first lateral direction D1 and the second lateral direction D2 have an angle θ that is not zero. The above step S30 can be performed by the light source 20 of the light-emitting module detecting device 2 of FIG. 2, that is, the light source 20 irradiates the lens 122 and the light-emitting element 120 with light. Similarly, step S32 can also be performed by the first imaging unit 22 and the second imaging unit 24, that is, the first imaging unit 22 and the second imaging unit 24 respectively acquire the first image and the second image.

於本具體實施例中,發光模組檢測方法還可包含接收並處理所擷取到的第一影像及第二影像的步驟,如步驟S34所示,而步驟S34同樣可透過發光模組檢測裝置2的處理器26來進行。經過步驟S34處理後,可得知發光元件120是否位於透鏡122的中心位置1220,或與中心位置1220間的偏差量。請參閱圖五,圖五係繪示圖四之發光模組檢測方法進一步的步驟流程圖。如圖五所示,發光模組檢測方法進一步包含步驟S340、S342以及S344,其係為圖四之步驟S34的拆解步驟。In the embodiment, the illuminating module detecting method may further include the steps of receiving and processing the captured first image and the second image, as shown in step S34, and step S34 is also permeable to the illuminating module detecting device. The processor 26 of 2 performs. After the processing in step S34, it is known whether or not the light-emitting element 120 is located at the center position 1220 of the lens 122 or the amount of deviation from the center position 1220. Please refer to FIG. 5 , which is a flow chart showing further steps of the method for detecting the illumination module of FIG. 4 . As shown in FIG. 5, the illumination module detection method further includes steps S340, S342, and S344, which are the disassembly steps of step S34 of FIG.

圖五之步驟S340~S344詳述如下:於步驟S340,根據第二 影像及夾角θ判斷發光元件120與透鏡122中心位置1220於第一側向D1上之第一偏差距離a;於步驟S342,根據第一影像及夾角θ判斷發光元件120與透鏡122中心位置1220於第二側向D2上之第二偏差距離b;以及,於步驟S344,根據第一偏差距離a、第二偏差距離b以及夾角θ,計算出發光元件120與透鏡122中心位置1220間的絕對偏差距離L。因此,本具體實施例之發光模組檢測方法可算出發光元件120與透鏡122之中心位置1220的實際偏差,以供後續校正利用。上述步驟S340~S344,同樣可透過圖二所示之發光模組檢測裝置2之處理器26的影像處理程式260來執行。Steps S340 to S344 of FIG. 5 are detailed as follows: In step S340, according to the second The image and the angle θ determine the first deviation distance a of the central position 1220 of the light-emitting element 120 and the lens 122 in the first lateral direction D1. In step S342, the light-emitting element 120 and the central position 1220 of the lens 122 are determined according to the first image and the angle θ. a second deviation distance b on the second lateral direction D2; and, in step S344, an absolute deviation between the light-emitting element 120 and the central position 1220 of the lens 122 is calculated according to the first deviation distance a, the second deviation distance b, and the included angle θ Distance L. Therefore, the illumination module detection method of the specific embodiment can calculate the actual deviation of the central position 1220 of the light-emitting element 120 from the lens 122 for subsequent correction. The above steps S340 to S344 can also be performed by the image processing program 260 of the processor 26 of the illumination module detecting device 2 shown in FIG.

綜上所述,本發明之發光模組檢測裝置以及發光模組檢測方法,係利用外加光源照射發光元件與透鏡,並從透鏡的第一側向與第二側向接收反射的光線,以擷取發光元件與透鏡的第一影像及第二影像。接著,再根據第一影像、第二影像以及第一側向與第二側向間的夾角,記算出發光元件與透鏡之中心位置間的實際偏差。相較於先前技術,本發明之裝置與方法於檢測時可不需點亮發光元件,避免因個體差異或是其他發光元件的干擾導致檢測誤差。In summary, the illumination module detecting device and the illumination module detecting method of the present invention use an external light source to illuminate the light emitting element and the lens, and receive the reflected light from the first side and the second side of the lens. Taking the first image and the second image of the light-emitting element and the lens. Then, based on the angle between the first image, the second image, and the first lateral direction and the second lateral direction, the actual deviation between the light-emitting element and the center position of the lens is calculated. Compared with the prior art, the device and method of the present invention can eliminate the need to illuminate the light-emitting elements during detection, and avoid detection errors caused by individual differences or interference of other light-emitting elements.

藉由以上較佳具體實施例之詳述,係希望能更加清楚描述本發明之特徵與精神,而並非以上述所揭露的較佳具體實施例來對本發明之範疇加以限制。相反地,其目的是希望能涵蓋各種改變及具相等性的安排於本發明所欲申請之專利範圍的範疇內。因此,本發明所申請之專利範圍的範疇應該根據上述的說明作最寬廣的解釋,以致使其涵蓋所有可能的改變以及具相等性的安排。The features and spirit of the present invention will be more apparent from the detailed description of the preferred embodiments. On the contrary, the intention is to cover various modifications and equivalents within the scope of the invention as claimed. Therefore, the scope of the patented scope of the invention should be construed as broadly construed in the

1‧‧‧發光模組1‧‧‧Lighting module

10‧‧‧基板10‧‧‧Substrate

12‧‧‧發光單元12‧‧‧Lighting unit

2‧‧‧發光模組檢測裝置2‧‧‧Lighting module detection device

20‧‧‧光源20‧‧‧Light source

22‧‧‧第一攝像單元22‧‧‧First camera unit

24‧‧‧第二攝像單元24‧‧‧Second camera unit

26‧‧‧處理器26‧‧‧ Processor

260‧‧‧影像處理程式260‧‧‧Image Processing Program

D1‧‧‧第一側向D1‧‧‧ first lateral

D2‧‧‧第二側向D2‧‧‧ second lateral direction

Claims (4)

一種發光模組檢測裝置,用以檢測一包含一基板、一發光元件及一透鏡之發光模組,該發光元件及該透鏡均設置於該基板上,該發光模組檢測裝係用以檢測該發光元件是否位於該透鏡之一中心位置,該發光元件於檢測的過程中為不發光,該發光模組檢測裝置包含:一光源,用以自該透鏡外發出光線照射該透鏡及該發光元件;一第一攝像單元,用以自該透鏡之一第一側向對該透鏡及該發光元件擷取一第一影像;一第二攝像單元,用以自該透鏡之一第二側向對該透鏡及該發光元件擷取一第二影像,該第一側向與該第二側向間具有角度不為零之一夾角;以及一處理器,電性連接於該第一攝像單元及該第二攝像單元以接收該第一影像及該第二影像,該處理器包含一影像處理程式,用以根據該第二影像及該夾角判斷該發光元件與該中心位置於該第一側向上之一第一偏差距離,根據該第一影像及該夾角判斷該發光元件與該中心位置於該第二側向上之一第二偏差距離,以及根據該第一偏差距離、該第二偏差距離與該夾角計算該發光元件與該中心位置間之一絕對偏差距離。 An illumination module detecting device is configured to detect a light-emitting module including a substrate, a light-emitting component and a lens, wherein the light-emitting component and the lens are disposed on the substrate, and the light-emitting module detects the device for detecting the Whether the light-emitting element is located at a central position of the lens, the light-emitting element is not illuminated during the detecting process, and the light-emitting module detecting device comprises: a light source for emitting light from the outside of the lens to illuminate the lens and the light-emitting element; a first image capturing unit for extracting a first image from the first side of the lens to the lens and the light emitting element; and a second image capturing unit for aligning the second side of the lens The lens and the illuminating element capture a second image, the first lateral direction and the second lateral direction have an angle that is not zero; and a processor electrically connected to the first imaging unit and the first The second camera unit receives the first image and the second image, and the processor includes an image processing program for determining, according to the second image and the angle, the light emitting element and the center position on the first side a first deviation distance, determining, according to the first image and the angle, a second deviation distance between the light-emitting element and the center position on the second side, and according to the first deviation distance, the second deviation distance, and the angle An absolute deviation distance between the illuminating element and the center position is calculated. 如申請專利範圍第1項所述之發光模組檢測裝置,其中該發光元件係一發光二極體。 The light-emitting module detecting device according to claim 1, wherein the light-emitting element is a light-emitting diode. 如申請專利範圍第1項所述之發光模組檢測裝置,進一步包含:一傳送機構,用以置放該發光模組並將該發光模組傳送至定位以供該第一攝像單元及該第二攝像單元擷取該第一影像以及該第二影像。 The illuminating module detecting device of claim 1, further comprising: a transmitting mechanism for arranging the illuminating module and transmitting the illuminating module to the positioning for the first camera unit and the first The second camera unit captures the first image and the second image. 一種發光模組檢測方法,用以檢測一包含一基板、一發光元件及一透鏡之發光模組,該發光元件及該透鏡均設置於該基板上,該發光模組檢測方法係用以檢測該發光元件是否位於該透鏡之一中心位置,該發光元件於檢測的過程中為不發光,該發光模組檢測方法包含下列步驟: 自該透鏡外對該透鏡及該發光元件照射光線;自該透鏡之一第一側向對該透鏡及該發光元件擷取一第一影像;自該透鏡之一第二側向對該透鏡及該發光元件擷取一第二影像,該第一側向與該第二側向間具有角度不為零之一夾角;根據該第二影像及該夾角判斷該發光元件與該中心位置於該第一側向上之一第一偏差距離;根據該第一影像及該夾角判斷該發光元件與該中心位置於該第二側向上之一第二偏差距離;以及根據該第一偏差距離、該第二偏差距離以及該夾角計算該發光元件與該中心位置間之一絕對偏差距離。A light-emitting module detecting method for detecting a light-emitting module including a substrate, a light-emitting component and a lens, wherein the light-emitting component and the lens are disposed on the substrate, and the light-emitting module detecting method is used for detecting the light-emitting module Whether the illuminating element is located at a central position of the lens, and the illuminating element is not illuminating during the detecting process, and the illuminating module detecting method comprises the following steps: Illuminating the lens and the illuminating element from the outside of the lens; extracting a first image from the first side of the lens to the lens and the illuminating element; and from the second side of the lens to the lens and The illuminating element captures a second image, and the first lateral direction and the second lateral direction have an angle that is not zero; and the illuminating element and the center position are determined according to the second image and the included angle a first deviation distance from one side upward; determining a second deviation distance of the light emitting element from the center position on the second side direction according to the first image and the angle; and according to the first deviation distance, the second The deviation distance and the angle calculate an absolute deviation distance between the light-emitting element and the center position.
TW102112648A 2013-04-10 2013-04-10 Lighting module detecting device and lighting module detecting method TWI490446B (en)

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5153668A (en) * 1990-05-11 1992-10-06 Orbot Systems Ltd. Optical inspection apparatus and illumination system particularly useful therein
US6630996B2 (en) * 2000-11-15 2003-10-07 Real Time Metrology, Inc. Optical method and apparatus for inspecting large area planar objects
TW200936992A (en) * 2007-11-30 2009-09-01 Otsuka Denshi Kk Apparatus for measuring optical property
TW201144791A (en) * 2010-03-30 2011-12-16 Jfe Steel Corp Surface inspection method and apparatus for steel plate with resin coating film
TW201213792A (en) * 2010-05-25 2012-04-01 Toray Industries Device for inspecting film defects, method for inspecting defects and demold film

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5153668A (en) * 1990-05-11 1992-10-06 Orbot Systems Ltd. Optical inspection apparatus and illumination system particularly useful therein
US6630996B2 (en) * 2000-11-15 2003-10-07 Real Time Metrology, Inc. Optical method and apparatus for inspecting large area planar objects
TW200936992A (en) * 2007-11-30 2009-09-01 Otsuka Denshi Kk Apparatus for measuring optical property
TW201144791A (en) * 2010-03-30 2011-12-16 Jfe Steel Corp Surface inspection method and apparatus for steel plate with resin coating film
TW201213792A (en) * 2010-05-25 2012-04-01 Toray Industries Device for inspecting film defects, method for inspecting defects and demold film

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