TWI474140B - - Google Patents
Info
- Publication number
- TWI474140B TWI474140B TW100136514A TW100136514A TWI474140B TW I474140 B TWI474140 B TW I474140B TW 100136514 A TW100136514 A TW 100136514A TW 100136514 A TW100136514 A TW 100136514A TW I474140 B TWI474140 B TW I474140B
- Authority
- TW
- Taiwan
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW100136514A TW201316144A (zh) | 2011-10-07 | 2011-10-07 | 溫度控制模式之建構方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW100136514A TW201316144A (zh) | 2011-10-07 | 2011-10-07 | 溫度控制模式之建構方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201316144A TW201316144A (zh) | 2013-04-16 |
| TWI474140B true TWI474140B (zh) | 2015-02-21 |
Family
ID=48803028
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW100136514A TW201316144A (zh) | 2011-10-07 | 2011-10-07 | 溫度控制模式之建構方法 |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW201316144A (zh) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7188001B2 (en) * | 1998-03-23 | 2007-03-06 | Cepheid | System and method for temperature control |
| JP2007071806A (ja) * | 2005-09-09 | 2007-03-22 | Seiko Epson Corp | 電子部品の温度制御装置並びにハンドラ装置 |
| CN101675347A (zh) * | 2007-05-21 | 2010-03-17 | 富士通微电子株式会社 | 半导体装置的测试装置及测试方法 |
| TW201017087A (en) * | 2008-10-29 | 2010-05-01 | Advantest Corp | Thermal controller for electronic devices |
-
2011
- 2011-10-07 TW TW100136514A patent/TW201316144A/zh unknown
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7188001B2 (en) * | 1998-03-23 | 2007-03-06 | Cepheid | System and method for temperature control |
| JP2007071806A (ja) * | 2005-09-09 | 2007-03-22 | Seiko Epson Corp | 電子部品の温度制御装置並びにハンドラ装置 |
| CN101675347A (zh) * | 2007-05-21 | 2010-03-17 | 富士通微电子株式会社 | 半导体装置的测试装置及测试方法 |
| TW201017087A (en) * | 2008-10-29 | 2010-05-01 | Advantest Corp | Thermal controller for electronic devices |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201316144A (zh) | 2013-04-16 |