TWI472220B - Light quantity measuring apparatus - Google Patents

Light quantity measuring apparatus Download PDF

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TWI472220B
TWI472220B TW97143171A TW97143171A TWI472220B TW I472220 B TWI472220 B TW I472220B TW 97143171 A TW97143171 A TW 97143171A TW 97143171 A TW97143171 A TW 97143171A TW I472220 B TWI472220 B TW I472220B
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light
amount
measured
period
measurement
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TW97143171A
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TW200926766A (en
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Kiyoshi Imai
Makoto Takahashi
Shinji Shimizu
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Konica Minolta Sensing Inc
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0418Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using attenuators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/044Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using shutters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0213Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using attenuators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0232Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using shutters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2803Investigating the spectrum using photoelectric array detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2889Rapid scan spectrometers; Time resolved spectrometry

Description

光量測定裝置Light measuring device

本發明,係有關於能夠適切地對光量會週期性變動之被測定光作測定的光量測定裝置。The present invention relates to a light amount measuring device capable of measuring a light to be measured whose amount of light periodically changes.

對被測定光之光量作測定的光量測定裝置,一般而言,係具備有輸出因應了所受光之被測定光的光量之訊號的感測器,並從感測器之輸出而特定被測定光之光量。但是,在此種光量測定裝置中,若是欲對像是顯示器所發出的光一般之光量會週期性變動的被測定光作測定,則依存於測定之時機,測定結果會有所變動,而產生無法得到安定之測定結果的問題。The light amount measuring device that measures the amount of light to be measured is generally provided with a sensor that outputs a signal corresponding to the amount of light of the light to be received, and specifies the light to be measured from the output of the sensor. The amount of light. However, in such a light amount measuring device, if it is desired to measure the light to be measured which periodically changes in the amount of light emitted by the display, the measurement result may vary depending on the timing of the measurement. The problem of stable measurement results cannot be obtained.

為了解決此種問題,如同在「VESA平面面板顯示器測定規格(VESA Flat Panel Display Standard)」(美國)、p.172中所示一般,係進行有:藉由以具備有相較於被測定光之光量的變動週期而為充分長的時間常數之低通濾波器來對感測器之輸出作濾波,而使測定結果不會受到被測定光之光量的週期性變動之影響。In order to solve such a problem, as shown in the "VESA Flat Panel Display Standard" (US), p. 172, it is generally performed by comparing with the light to be measured. The low-pass filter having a sufficiently long time constant is used to filter the output of the sensor so that the measurement result is not affected by the periodic variation of the amount of light to be measured.

又,係進行有:藉由使用相較於被測定光之光量的變動週期而為充分長的時間來將感測器所產生之電荷作積蓄,來使測定結果不會受到被測定光之光量的週期性變動之影響。Further, by using a period of time sufficiently longer than the fluctuation period of the amount of light of the light to be measured, the charge generated by the sensor is accumulated, so that the measurement result does not receive the amount of light of the light to be measured. The impact of cyclical changes.

進而,係如同日本專利2003-18458號公報中所示一般,進行有:藉由使用被測定光之光量的變動週期之整數倍的時間而將感測器所產生之電荷作積蓄,來使測定結果不會受到被測定光之光量的週期性變動之影響。Further, as shown in Japanese Patent Laid-Open Publication No. 2003-18458, the measurement is performed by accumulating the electric charge generated by the sensor by using an integral multiple of the fluctuation period of the light amount of the light to be measured. As a result, it is not affected by the periodic variation of the amount of light to be measured.

進而,亦進行有:反覆進行被測定光之光量的測定,並取測定結果之平均,藉由此,而使測定結果不會受到被測定光之光量的週期性變動之影響。Further, the measurement of the amount of light to be measured is repeated, and the average of the measurement results is obtained, whereby the measurement result is not affected by the periodic variation of the amount of light to be measured.

但是,在藉由低通濾波器而將感測器之輸出作濾波的方法中,當有必要對光量之變動週期為相異的被測定光作測定的情況時,係必須要準備時間常數為相異之複數的低通濾波器,並因應於被測定光之光量的變動週期而對所使用之低通濾波器作選擇。然而,低通濾波器之選擇係為繁雜,且當被測定光之光量的變動週期並不安定的情況或是被測定光之光量的變動週期係為不明的情況時,對低通濾波器之選擇係成為困難。因此,係成為藉由時間常數非常長之低通濾波器來對感測器之輸出作濾波,而測定所需要之時間係成為非常長。However, in the method of filtering the output of the sensor by the low-pass filter, when it is necessary to measure the measured light whose cycle of variation is different, it is necessary to prepare a time constant of A plurality of different low-pass filters are selected, and the low-pass filter to be used is selected in accordance with the fluctuation period of the amount of light to be measured. However, the selection of the low-pass filter is complicated, and when the period of fluctuation of the amount of light to be measured is not stable or the period of variation of the amount of light of the measured light is unknown, the low-pass filter is used. Choosing a system becomes difficult. Therefore, the output of the sensor is filtered by a low-pass filter having a very long time constant, and the time required for the measurement becomes very long.

又,在藉由使用相較於被測定光之光量的變動週期而為充分長的時間來將感測器所產生之電荷作積蓄的方法中,測定所需要之時間係成為非常長。並且,當使用在近年係成為一般化之高感度的感測器之情況時,在將電荷作積蓄的期間中,會引起電荷之飽和,而無法作適切之測定。Further, in the method of accumulating the charge generated by the sensor for a sufficiently long period of time compared to the fluctuation period of the amount of light to be measured, the time required for the measurement is extremely long. Further, when a sensor having a high sensitivity which is generalized in recent years is used, during the period in which the electric charge is accumulated, the saturation of the electric charge is caused, and the measurement cannot be performed appropriately.

進而,在使用被測定光之光量的變動週期之整數倍的時間來將感測器所產生之電荷作積蓄的方法中,當被測定光之光量的變動週期並不安定的情況時、或是被測定光之光量的變動週期係為不明的情況時,係無法使電荷之積蓄與被測定光之光量的週期性變動作同步,而無法作適切的測定。又,當使用在近年係成為一般化之高感度的感測器之情況時,在將電荷作積蓄的期間中,會引起電荷之飽和,而無法作適切之測定。Further, in the method of accumulating the electric charge generated by the sensor using an integral multiple of the fluctuation period of the light amount of the light to be measured, when the fluctuation period of the light amount of the light to be measured is not stable, or When the fluctuation period of the amount of light to be measured is unknown, the accumulation of electric charge cannot be synchronized with the periodic operation of the amount of light to be measured, and the measurement cannot be performed appropriately. In addition, when a sensor having a high sensitivity that is generalized in recent years is used, during the period in which the electric charge is accumulated, the saturation of the electric charge is caused, and the measurement cannot be performed appropriately.

再加上,在反覆進行被測定光之光量的測定,並取測定結果之平均的方法中,為了使測定結果不會受到在測定與測定之間之被測定光之光量的變動之影響,係成為需進行多數次之測定,而測定所需要的時間係變的非常長。又,若是欲對如同CRT(Cathode Ray Tube)顯示器或是電漿顯示器所發出的光一般之發光期間係成為發光週期之數%以下的被測定光之光量作測定,則會有在測定與測定之間的期間成為發光期間並在測定結果中產生大的誤差之虞。此種大的誤差,在對於採用有黑插入一般之驅動方法的液晶顯示器所發出的光之光量作測定的情況時,亦有可能會產生。In addition, in the method of repeatedly measuring the amount of light of the light to be measured and taking the average of the measurement results, in order to prevent the measurement result from being affected by the fluctuation of the amount of light to be measured between the measurement and the measurement, It takes a lot of measurements, and the time required for the measurement is very long. In addition, if it is intended to measure the amount of light of the light to be measured which is equal to or less than the number of light-emitting periods of a light emitted by a CRT (Cathode Ray Tube) display or a plasma display, the measurement and measurement may be performed. The period between them becomes a light-emitting period and a large error occurs in the measurement result. Such a large error may occur in the case of measuring the amount of light emitted by a liquid crystal display using a black insertion general driving method.

另外,電荷飽和之問題,雖然只要將到達感測器處之被測定光藉由減光濾鏡來作減光即能夠消除,但是,若是減光濾鏡之透過率變低,則確保透過率之精確度一事係成為困難,同時,依存於被測定光之光量,亦會產生有:若是使用減光濾鏡,則會無法確保重複性、而若是不使用減光濾鏡,則在測定中所需要的時間係變的非常長之間題。In addition, the problem of charge saturation can be eliminated by reducing the light to be measured at the sensor by the dimming filter. However, if the transmittance of the dimming filter is low, the transmittance is ensured. The accuracy is difficult, and depending on the amount of light to be measured, there is also a problem that if the dimming filter is used, the repeatability cannot be ensured, and if the dimming filter is not used, the measurement is in progress. The time required is very long.

本發明,係為為了解決此些之問題而進行者,其目的,係在於提供一種:能夠在短時間內而適切地對光量會週期性變動之被測定光作測定的光量測定裝置。The present invention has been made in order to solve such problems, and an object of the invention is to provide a light amount measuring device capable of measuring a light to be measured whose amount of light periodically changes in a short time.

為了解決上述課題,申請項1之發明,係為一種光量測定裝置,係為對被測定光之光量作測定的光量測定裝置,其特徵為,具備有:電荷產生手段,係產生因應了所受光之被測定光的光量之電荷;和積蓄手段,係將前述電荷產生手段所產生之電荷作積蓄;和A/D變換手段,係將被積蓄於前述積蓄手段中之電荷的量變換為數位值;和累加手段,係將複數之數位值作累加;和控制手段,係對前述光量測定裝置作控制,藉由前述控制手段所致之控制,前述電荷產生手段,係在測定期間中,持續產生因應了所受光之被測定光的光量之電荷,前述積蓄手段,係在將測定期間作了分割之複數的積蓄期間的各個中,將前述電荷產生手段所產生之電荷作積蓄,前述A/D變換手段,係將在複數之積蓄期間的各個中而被積蓄於前述積蓄手段中的電荷之量變換為數位值,前述累加手段,係將前述A/D變換手段所變換了的複數之數位值作累加。In order to solve the problem, the invention of claim 1 is a light amount measuring device which is a light amount measuring device that measures the amount of light to be measured, and is characterized in that: a charge generating means is provided to generate a light-receiving means And a charge means for accumulating the charge generated by the charge generation means; and the A/D conversion means converting the amount of charge accumulated in the accumulation means into a digital value And accumulating means for accumulating the plurality of digit values; and controlling means for controlling the light quantity measuring means, and controlling by the aforementioned control means, the charge generating means is continuously generated during the measuring period In the storage period of the light amount of the light to be measured, the charge means generates the charge generated by the charge generation means, and the A/D is accumulated in each of the plurality of accumulation periods in which the measurement period is divided. The conversion means converts the amount of electric charge accumulated in the accumulation means in each of the plurality of accumulation periods, into a digital value, The adding means accumulates the digital values of the complex numbers converted by the A/D conversion means.

申請項2之發明,係在申請項1所記載之光量測定裝置中,更進而具備有:調整手段,係根據在測定期間的開始之前所預先作了預備測定的被測定光之光量,而對到達前述電荷產生手段處之被測定光的光量作調整。According to the invention, in the light quantity measuring device according to the first aspect of the invention, the apparatus for adjusting the amount of light to be measured, which is prepared in advance before the start of the measurement period, is The amount of light of the light to be measured that reaches the aforementioned charge generating means is adjusted.

申請項3之發明,係在申請項1又或是申請項2所記載之光量測定裝置中,具備有以下特徵:前述控制手段,係根據在測定期間的開始之前所預先作了預備測定的被測定光之光量,而決定積蓄期間之長度。The invention of claim 3, wherein the control means is based on a pre-measurement before the start of the measurement period, in the light quantity measuring device according to the application item 1 or the application item 2. The amount of light is measured to determine the length of the accumulation period.

申請項4之發明,係在申請項1乃至申請項3中之任一項所記載之光量測定裝置中,具備有以下特徵:前述控制手段,係根據被測定光之光量的變動週期,而決定積蓄期間之長度。The light quantity measuring device according to any one of the preceding claims, wherein the control means is determined based on a fluctuation period of the amount of light to be measured. The length of the savings period.

申請項5之發明,係在申請項4所記載之光量測定裝置中,更進而具備有:第1接受手段,其係接受被測定光之光量的變動週期之輸入,前述控制手段,係根據前述第1接受手段所接受輸入的變動週期,來決定積蓄期間之長度。The invention of claim 5, further comprising: a first receiving means for receiving an input of a fluctuation period of the amount of light to be measured, wherein the control means is based on the foregoing The length of the accumulation period is determined by the fluctuation period of the input received by the first receiving means.

申請項6之發明,係在申請項4所記載之光量測定裝置中,更進而具備有:取得手段,其係取得與被測定光之光量的變動作同步變動之訊號,前述控制手段,係由前述取得手段所取得之訊號,來檢測出被測定光之光量的變動週期,並根據所檢測出之變動週期,來決定積蓄期間之長度。The light quantity measuring device according to the fourth aspect of the invention, further comprising: obtaining means for obtaining a signal that changes in synchronization with a change in the amount of light to be measured, wherein the control means is The signal obtained by the acquisition means detects the fluctuation period of the amount of light to be measured, and determines the length of the accumulation period based on the detected fluctuation period.

申請項7之發明,係在申請項1所記載之光量測定裝置中,更進而具備有:第2接受手段,其係接受測定期間的長度之輸入,前述控制手段,係根據積蓄期間之長度與前述第2接受手段所接受輸入的測定時間之長度,來決定測定期間之分割數。The invention according to claim 1, further comprising: a second receiving means for receiving an input of a length of the measurement period, wherein the control means is based on a length of the accumulation period The length of the measurement time input by the second receiving means is determined to determine the number of divisions during the measurement period.

若藉由本發明,則不會產生積蓄手段之飽和,而能夠在短時間內而適切地對光量會週期性變動之被測定光作測定。According to the present invention, the saturation of the accumulation means is not generated, and the light to be measured whose amount of light periodically changes can be appropriately measured in a short time.

若藉由申請項2之發明,則能夠增廣可進行測定之光量的範圍。According to the invention of the application item 2, the range of the amount of light that can be measured can be increased.

若藉由申請項3之發明,則由於係成為更加難以產生積蓄手段之飽和,因此,能夠對被測定光更適切地作測定。According to the invention of claim 3, since the saturation of the accumulation means is more difficult to occur, the measurement light can be measured more appropriately.

若藉由申請項4乃至申請項6之發明,則能夠提昇光量之測定精確度。According to the invention of the application item 4 or the application item 6, the measurement accuracy of the light amount can be improved.

若藉由申請項7之發明,則能夠將測定時間保持為一定。According to the invention of claim 7, the measurement time can be kept constant.

〈1 第1實施形態〉<1 First Embodiment>

〈1-1 分光輻射亮度計1之構成〉<1-1 Composition of Spectroradiometer 1]

圖1,係為本發明之第1實施形態的分光輻射亮度計1之模式圖。分光輻射亮度計1,主要係將CRT顯示器、電漿顯示器、液晶顯示器等之顯示器602所發出之光作為被測定光604,而測定被測定光604之分光輻射亮度。Fig. 1 is a schematic view showing a spectroradiometer 1 according to a first embodiment of the present invention. The spectroradiometer 1 mainly measures the spectral radiance of the light to be measured 604 by using the light emitted from the display 602 such as a CRT display, a plasma display, or a liquid crystal display as the light to be measured 604.

如圖1中所示一般,分光輻射亮度計1,係具備有:光學系102、減光濾鏡104、光閘106、分散元件108、感測器110、A/D變換器112、通訊介面114、顯示部116、操作部118、同步訊號輸入端子120以及控制演算部122。As shown in FIG. 1 , the spectroradiometer 1 is provided with an optical system 102, a dimming filter 104, a shutter 106, a dispersing element 108, a sensor 110, an A/D converter 112, and a communication interface. 114. The display unit 116, the operation unit 118, the synchronization signal input terminal 120, and the control calculation unit 122.

光學系102,係將入射至分光輻射亮度計1中之被測定光604經由分散元件108而導引至感測器110處,並在感測器110之受光面上結像光像。光學系102,係可將透鏡或是反射鏡作組合而構成。The optical system 102 guides the light to be measured 604 incident on the spectroradiometer 1 to the sensor 110 via the dispersing element 108, and forms an optical image on the light receiving surface of the sensor 110. The optical system 102 can be constructed by combining a lens or a mirror.

減光濾鏡104,係將透過之光作減光。減光濾鏡104,係受到控制演算部122之控制,而在被測定光604之光路中被作插拔。當在被測定光604之光路中被插入有減光濾鏡104的情況時,入射至分光輻射亮度計1中之光,係在經由減光濾鏡104而被減光後,到達感測器110處。另一方面,當減光濾鏡104從被測定光604之光路而被拔去的情況時,入射至分光輻射亮度計1中之光,係不被減光地而到達感測器110處。故而,減光濾鏡104,係受到控制演算部122之控制,而作為對到達感測器110處之被測定光604的光量作調整之調整手段而起作用。減光濾鏡104之透過率,係以設為2%以上為理想,又以設為5%以上為更理想。此係因為,若是透過率在此範圍內,則能夠使用透過率之精確度為良好的減光濾鏡104之故。The dimming filter 104 dims the transmitted light. The dimming filter 104 is controlled by the control calculation unit 122, and is inserted and removed in the optical path of the light to be measured 604. When the dimming filter 104 is inserted in the optical path of the light to be measured 604, the light incident on the spectroradiometer 1 is dimmed via the dimming filter 104, and then reaches the sensor. 110 places. On the other hand, when the dimming filter 104 is removed from the optical path of the light to be measured 604, the light incident on the spectroradiometer 1 reaches the sensor 110 without being dimmed. Therefore, the dimming filter 104 is controlled by the control calculation unit 122 and functions as an adjustment means for adjusting the amount of light of the light to be measured 604 at the sensor 110. The transmittance of the dimming filter 104 is preferably 2% or more, and more preferably 5% or more. This is because if the transmittance is within this range, the dimming filter 104 having a good transmittance accuracy can be used.

光閘106,係將光作遮蔽。光閘106,係受到控制演算部122之控制,而在被測定光604之光路中被作插拔。當在被測定光604之光路中被插入有光閘106的情況時,入射至分光輻射亮度計1中之被測定光604,係成為不會到達感測器110處。另一方面,當從被測定光604之光路中而將光閘106拔去的情況時,入射至分光輻射亮度計1中之被測定光604,係成為會到達感測器110處。The shutter 106 shields the light. The shutter 106 is controlled by the control calculation unit 122 and is inserted and removed in the optical path of the light to be measured 604. When the shutter 106 is inserted into the optical path of the light to be measured 604, the light to be measured 604 incident on the spectroradiometer 1 does not reach the sensor 110. On the other hand, when the shutter 106 is removed from the optical path of the light to be measured 604, the light to be measured 604 incident on the spectroradiometer 1 is reached at the sensor 110.

分散元件108,係將入射之被測定光604於每一波長作分散。作為分散元件108,例如,係可使用繞射格子或是稜鏡。其中,作為分散元件108,係以使用凹面繞射格子為理想。此係因為,若是使用凹面繞射格子作為分散元件108,則係可將光學系102簡略化之故。The dispersing element 108 distributes the incident light 604 to be measured at each wavelength. As the dispersing element 108, for example, a diffraction grating or a crucible can be used. Among them, as the dispersing element 108, it is preferable to use a concave diffraction grating. This is because if the concave diffraction grating is used as the dispersion element 108, the optical system 102 can be simplified.

感測器110,係受光經由分散元件108而於每一波長被作了分散之被測定光604,並在每一波長成分中將代表被測定光604之光量的訊號作輸出。The sensor 110 is a light to be measured 604 that is dispersed at each wavelength by the light passing through the dispersing element 108, and outputs a signal representing the amount of light of the light to be measured 604 in each wavelength component.

圖2,係為感測器110之模式圖。圖2,係成為感測器110之平面圖。如圖2所示一般,在感測器110之受光面126處,係被配列有複數個的光二極體128。光二極體128之配列方向,係與分散元件108之將被測定光604於每一波長作分散的方向為一致。故而,光二極體128之各個,係將受光了的被測定光604之特定的波長成分作光電變換,並產生因應了所受光之被測定光604的特定波長成分之光量的電荷,而將產生了的電荷作積蓄。另外,將電荷之產生以及積蓄之兩者均藉由光二極體128來進行一事,係並非為必須,亦可設為在與光二極體128相獨立地設置之電荷積蓄部處來將光二極體128所產生之電荷作積蓄。FIG. 2 is a schematic diagram of the sensor 110. 2 is a plan view of the sensor 110. As shown in FIG. 2, in general, a plurality of photodiodes 128 are arranged at the light receiving surface 126 of the sensor 110. The arrangement direction of the photodiodes 128 coincides with the direction in which the dispersion elements 108 are dispersed by the measurement light 604 at each wavelength. Therefore, each of the photodiodes 128 photoelectrically converts a specific wavelength component of the light to be measured 604, and generates an electric charge corresponding to the amount of light of a specific wavelength component of the light 604 to be received. The charge is saved. Further, it is not necessary to carry out the generation and accumulation of electric charges by the photodiode 128, and it is also possible to provide the photodiode at the charge accumulating portion provided separately from the photodiode 128. The charge generated by the body 128 is accumulated.

感測器110,係具備有CCD(Charge Coupled Device)130以及FD(Floating Diffusion)放大器132。CCD130,係將光二極體128所產生以及積蓄的電荷傳送至FD放大器132處。FD放大器132,係將具備有因應了藉由CCD130所傳送而來之電荷的量之電壓的類比之像素訊號作輸出。另外,代替FD放大器132,亦可使用FG(Floating Gate)放大器。The sensor 110 is provided with a CCD (Charge Coupled Device) 130 and an FD (Floating Diffusion) amplifier 132. The CCD 130 transmits the electric charge generated and accumulated by the photodiode 128 to the FD amplifier 132. The FD amplifier 132 is provided with an analog pixel signal having an amount corresponding to the amount of charge transferred by the CCD 130. Further, instead of the FD amplifier 132, an FG (Floating Gate) amplifier may be used.

若是回到圖1並作說明,則A/D變換器112,係將感測器110所輸出之類比的像素訊號變換為數位之像素資料,並輸出至控制演算部122處。藉由此,A/D變換器112,係能夠將被積蓄在光二極體128中之電荷的量變換為數位值並輸出。If it is returned to FIG. 1 and described, the A/D converter 112 converts the analog pixel signal output by the sensor 110 into digital pixel data, and outputs it to the control calculation unit 122. Thereby, the A/D converter 112 can convert the amount of electric charge accumulated in the photodiode 128 into a digital value and output it.

通訊介面114,係將分光輻射亮度計1與外部電腦等之外部機器可通訊地作連接。The communication interface 114 connects the spectroradiometer 1 to an external device such as an external computer.

顯示部116,係將分光輻射亮度計1之測定結果作顯示。另外,代替以顯示部116來顯示測定結果、又或是在以顯示部116來顯示測定結果的同時,亦可將測定結果輸出至經由通訊介面114而被連接於分光輻射亮度計1之外部機器處。The display unit 116 displays the measurement result of the spectroradiometer 1 . Further, instead of displaying the measurement result by the display unit 116 or displaying the measurement result on the display unit 116, the measurement result may be output to an external device connected to the spectroradiometer 1 via the communication interface 114. At the office.

操作部118,係接受被測定光之光量的變動週期或是測定期間之長度(以下,稱為「測定時間」)的輸入等之操作者的操作。另外,代替以操作部118來接受操作者之操作、又或是在以操作部118來接受操作者之操作的同時,亦可接受從經由通訊介面114而被連接於分光輻射亮度計1之外部機器而來的遠端操作。The operation unit 118 accepts an operator's operation such as input of a fluctuation period of the amount of light to be measured or a length of the measurement period (hereinafter referred to as "measurement time"). In addition, instead of accepting the operation of the operator by the operation unit 118, or accepting the operation of the operator by the operation unit 118, it is also acceptable to be connected to the outside of the spectroradiometer 1 via the communication interface 114. Remote operation from the machine.

同步訊號輸入端子120,係取得如同對CRT顯示器所發出之光作測定的情況時之垂直同步訊號一般的與被測定光604之光量的變動同步變動的訊號。The synchronizing signal input terminal 120 obtains a signal in which a vertical synchronizing signal generally changes in accordance with a change in the amount of light of the light to be measured 604 as in the case of measuring light emitted from the CRT display.

控制演算部122,係為至少具備有CPU136以及記憶體138之嵌入式電腦,並藉由使CPU136實行從記憶體138所讀出之控制程式,來對減光濾鏡104、光閘106、感測器110、A/D變換器112、通訊介面114、顯示部116、操作部118或其他之分光輻射亮度計1的各部作控制。又,控制演算部122,係藉由使CPU136實行從記憶體138中所讀出之控制程式,而由從A/D變換器112所取得之像素資料的集合來演算出分光輻射亮度。The control calculation unit 122 is an embedded computer including at least a CPU 136 and a memory 138, and causes the CPU 136 to execute a control program read from the memory 138 to sense the dimming filter 104 and the shutter 106. The detector 110, the A/D converter 112, the communication interface 114, the display unit 116, the operation unit 118, or other components of the spectroradiometer 1 are controlled. Further, the control calculation unit 122 calculates the spectral radiance from the set of pixel data acquired from the A/D converter 112 by causing the CPU 136 to execute the control program read from the memory 138.

控制演算部122,係在光二極體128將被測定光604作光電變換之測定期間的途中,在CCD130處,將光二極體128所產生以及積蓄之電荷從光二極體128而傳送至FD放大器132處,並在FD放大器132中,將具備有因應了藉由CCD130所傳送而來之電荷的量之電壓的類比之像素訊號作輸出,並在A/D變換器112中,將感測器110所輸出之類比之像素訊號變換為數位之像素資料。The control calculation unit 122 transmits the charge generated and accumulated by the photodiode 128 from the photodiode 128 to the FD amplifier in the middle of the measurement period in which the photodiode 128 photoelectrically converts the measurement light 604. At 132, and in the FD amplifier 132, an analog signal pixel having a voltage corresponding to the amount of charge transferred by the CCD 130 is output, and in the A/D converter 112, the sensor is used. The analog pixel signal of the output of 110 is converted into digital pixel data.

藉由此,光二極體128在測定期間中所產生以及積蓄之電荷,係分成複數次而被讀出,控制演算部122,係取得在如圖3所示一般而將測定期間MP作了分割後之複數個的積蓄期間SP(1)、SP(2)、…、SP(M)之各個中的因應了光二極體128所產生以及積蓄之電荷的量Q(1,i)、Q(2,i)、…、Q(M,i)(i=1,2,…,N)之像素資料D(1,i),D(2,i),…,D(M,i)。於此,像素資料D(j,i),係為將具備有因應了在積蓄期間SP(j)(j=1,2,…,M)中之第1個光二極體128所產生以及積蓄了的電荷之量Q(j,i)之電壓的像素訊號A(j,i)變換成了數位值者。As a result, the electric charge generated and accumulated in the measurement period of the photodiode 128 is read and divided into a plurality of times, and the control unit 122 obtains the measurement period MP as shown in FIG. In the subsequent accumulation periods SP(1), SP(2), ..., SP(M), the amount of charge Q(1, i), Q generated by the photodiode 128 and accumulated is reflected in each of the SP(1), SP(2), ..., SP(M). 2, i), ..., Q(M, i) (i = 1, 2, ..., N) pixel data D (1, i), D (2, i), ..., D (M, i). Here, the pixel data D(j, i) is generated and accumulated in response to the first photodiode 128 in the accumulation period SP(j) (j=1, 2, ..., M). The pixel signal A(j, i) of the voltage of the amount of charge Q(j, i) is converted into a digital value.

進而,控制演算部122,係將複數之像素資料D(1,i)、D(2,i)、...、D(M,i)依據式1而作累加,並計算出因應了光二極體128在測定期間MP中所產生以及積蓄的電荷之量Q(1)、Q(2)、...、Q(N)的像素資料D(1)、D(2)、...D(N)。Further, the control calculation unit 122 converts the plural pixel data D(1, i), D(2, i), . . . D(M, i) is accumulated according to Equation 1, and the amount of charge Q(1), Q(2), which is generated and accumulated by the photodiode 128 during the measurement period MP is calculated. . . , Q (N) pixel data D (1), D (2),. . . D(N).

而後,控制演算部122,係從像素資料D(1)、D(2)、...D(N)來演算出分光輻射亮度。Then, the control calculation unit 122 is based on the pixel data D(1), D(2), . . . D(N) is used to calculate the spectral radiance.

〈1-2 分光輻射亮度計1之動作〉<1-2 Action of Spectroradiometer 1

圖4以及圖5,係為對藉由控制演算部122所致之控制而實現的分光輻射亮度計1之動作作說明的流程圖。4 and 5 are flowcharts for explaining the operation of the spectroradiometer 1 by the control by the control unit 122.

在分光輻射亮度的測定中,首先,係如圖4所示一般,使控制演算部122對感測器110以及A/D變換部112作控制,並對被測定光604之光量作預備測定(步驟S101)。被測定光604之光量,當在被測定光604之光路中被插入有減光濾鏡104的狀態下,係可由控制演算部122所取得之像素資料與減光濾鏡104之透過率而計算出來,而當從被測定光604之光路而將減光濾鏡104拔去的狀態下,係可由控制演算部122所取得之像素資料而計算出來。於此,由於係並不需要提高預備測定之精確度,因此,亦可容許將預備測定在較正式測定為更短的時間下來進行。另外,使用感測器110來進行預備測定一事係並非為必須,亦可設置與感測器110相異之預備測定用的感測器,並使用預備測定用之感測器來進行預備測定。In the measurement of the spectral radiance, first, as shown in FIG. 4, the control calculation unit 122 controls the sensor 110 and the A/D conversion unit 112, and performs preliminary measurement on the amount of light to be measured 604 ( Step S101). The amount of light of the light to be measured 604 can be calculated by the pixel data acquired by the control calculation unit 122 and the transmittance of the dimming filter 104 in a state where the light-reducing filter 104 is inserted into the optical path of the light to be measured 604. When the dimming filter 104 is removed from the optical path of the light to be measured 604, the pixel data obtained by the control unit 122 can be calculated. Here, since it is not necessary to improve the accuracy of the preliminary measurement, it is also possible to allow the preliminary measurement to be performed in a shorter time than the official measurement. It is not necessary to perform the preliminary measurement using the sensor 110, and a sensor for preliminary measurement different from the sensor 110 may be provided, and the preliminary measurement may be performed using a sensor for preliminary measurement.

接下來,控制演算部122,係決定積蓄期間SP(1)、SP(2)、…、SP(M)的長度(以下,係稱為「積蓄時間」)(步驟S102)。控制演算部122,係根據在步驟S101中所預備測定了的被測定光604之光量,而決定不會使光二極體128飽和之積蓄期間。藉由此,無關於測定時間或是被測定光604之光量,均成為難以產生光二極體128之飽和,而能夠對被測定光604之光量適切地作測定。Next, the control calculation unit 122 determines the lengths of the accumulation periods SP(1), SP(2), ..., SP(M) (hereinafter referred to as "storage time") (step S102). The control calculation unit 122 determines the accumulation period in which the photodiode 128 is not saturated, based on the amount of light to be measured 604 measured in step S101. As a result, irrespective of the measurement time or the amount of light of the light to be measured 604, it is difficult to generate saturation of the photodiode 128, and the amount of light to be measured 604 can be appropriately measured.

另外,亦期待使控制演算部122在光二極體128不會飽和的範圍內,而根據操作部118所接受輸入的被測定光604之光量的變動週期,來以使測定時間成為被測定光604之光量的變動週期之整數倍的方式而決定積蓄時間。又或是,亦期待使控制演算部122由同步訊號輸入端子120所取得之訊號來檢測出被測定光604之光量的變動週期,並在光二極體128不會飽和的範圍內,根據所檢測出之變動週期,來以使測定時間成為被測定光604之光量的變動週期之整數倍的方式而決定積蓄時間。此係因為,若是如此這般而根據被測定光604之光量的變動週期來決定積蓄期間,則能夠提昇被測定光604之光量的測定精確度之故。In addition, it is expected that the control calculation unit 122 makes the measurement time the light to be measured 604 based on the fluctuation period of the light amount of the light to be measured 604 that is received by the operation unit 118 in a range in which the photodiode 128 is not saturated. The accumulation time is determined in such a manner that the fluctuation period of the light amount is an integral multiple. Further, it is also expected that the control calculation unit 122 detects the fluctuation period of the amount of light of the light to be measured 604 from the signal acquired by the synchronization signal input terminal 120, and detects the range in which the photodiode 128 does not saturate. The fluctuation period is determined such that the measurement time is an integral multiple of the fluctuation period of the light amount of the light to be measured 604. In this case, if the accumulation period is determined based on the fluctuation period of the amount of light of the light to be measured 604, the measurement accuracy of the amount of light to be measured 604 can be improved.

另外,積蓄時間,係可對於所有的積蓄期間SP(1)、SP(2)、…、SP(M)而設為相同,亦可使積蓄期間SP(1)、SP(2)、…、SP(M)的各個成為相異。In addition, the accumulation time may be the same for all of the accumulation periods SP(1), SP(2), ..., SP(M), or the accumulation periods SP(1), SP(2), ..., Each of SP(M) becomes different.

再接下來,控制演算部122,係根據預備測定了的被測定光604之光量,而將減光濾鏡104作插拔(步驟S103)。亦即是,若是在將減光濾鏡104插入至被測定光604之光路中的狀態下所預備測定的被測定光604之光量係為臨限值TH1以下,則係從被測定光604之光路而將減光濾鏡104拔去,而若是在將減光濾鏡104從被測定光604之光路而拔去的狀態下所預備測定之被測定光604的光量係較臨限值TH2為更大,則將減光濾鏡104插入至被測定光604之光路中。如此這般,根據預備測定了的被測定光604之光量來對到達光二極體128處之被測定光的光量作調整,當被測定光604之光量為多的情況時,先將被測定光604減光後再導引至感測器110處,而當被測定光604之光量為少的情況時,則不將被測定光604作減光地導引至感測器110處,藉由此,能夠將在正式測定中所能夠測定的光量之範圍增廣。Next, the control calculation unit 122 inserts and removes the dimming filter 104 based on the amount of light of the light to be measured 604 that has been measured (step S103). In other words, when the amount of light of the light to be measured 604 that is to be measured in a state where the light-reducing filter 104 is inserted into the optical path of the light to be measured 604 is equal to or less than the threshold value TH1, the light to be measured 604 is The light-reducing filter 104 is removed by the optical path, and the light quantity of the light to be measured 604 which is prepared and measured in a state where the light-reducing filter 104 is removed from the optical path of the light to be measured 604 is compared with the threshold value TH2. Larger, the dimming filter 104 is inserted into the optical path of the light 604 to be measured. In this manner, the amount of light to be measured at the photodiode 128 is adjusted based on the amount of light to be measured 604, and when the amount of light to be measured 604 is large, the light to be measured is first measured. The 604 is dimmed and then guided to the sensor 110. When the amount of light to be measured 604 is small, the measured light 604 is not dimmed to the sensor 110. Thus, the range of the amount of light that can be measured in the formal measurement can be increased.

又,雖然亦可將拔去減光濾鏡104之臨限值TH1與插入減光濾鏡104之臨限值TH2設為相同,但是,藉由使拔去減光濾鏡104之臨限值TH1與插入減光濾鏡104之臨限值TH2成為相異而進行滯後(Hysteresis)控制,能夠防止減光濾鏡被頻繁的作插拔而使測定結果有所偏差。Moreover, although the threshold TH1 of the de-wiffering filter 104 and the threshold TH2 of the insertion dimming filter 104 may be set to be the same, by removing the threshold of the dimming filter 104. The TH1 is different from the threshold value TH2 of the insertion dimming filter 104 by hysteresis control, and it is possible to prevent the dimming filter from being frequently inserted and removed, and the measurement result is deviated.

若是結束了預備測定,則分光輻射亮度計1,係開始正式測定,並在步驟S104~S112之取樣測定之後,繼續進行步驟S113~S121的黑暗測定。When the preliminary measurement is completed, the spectroradiometer 1 starts the formal measurement, and after the sampling measurement in steps S104 to S112, the dark measurement in steps S113 to S121 is continued.

在取樣測定中,首先,如圖4所示一般,控制演算部122,係對光閘106作控制並開啟光閘106(步驟S104),並對感測器110作控制而開始對於光二極體128之電荷的積蓄(步驟S105)。In the sampling measurement, first, as shown in FIG. 4, the control calculation unit 122 controls the shutter 106 and turns on the shutter 106 (step S104), and controls the sensor 110 to start the photodiode. The accumulation of charge of 128 (step S105).

接著,控制演算部122,係等待積蓄時間經過(步驟S106),並在經過了積蓄時間後,對感測器110作控制並將CCD130中之光二極體128所產生以及積蓄的電荷傳送至FD放大器132處(步驟S107),而使FD放大器132輸出像素訊號(步驟S108)。Next, the control calculation unit 122 waits for the accumulation time to elapse (step S106), and after the accumulation time has elapsed, controls the sensor 110 and transfers the charge generated and accumulated by the photodiode 128 in the CCD 130 to the FD. At the amplifier 132 (step S107), the FD amplifier 132 is caused to output a pixel signal (step S108).

再接下來,控制演算部122,係在A/D變換部112中將類比之像素訊號變換為數位之像素資料(步驟S109),並將所取得之像素資料記憶在記憶體138中(步驟S110)。Next, the control calculation unit 122 converts the analog pixel signal into digital pixel data in the A/D conversion unit 112 (step S109), and stores the acquired pixel data in the memory 138 (step S110). ).

接下來,控制演算部122,係將被記憶在記憶體138中之像素資料,依據式1來作累加(步驟S111),當經過了測定時間時(在步驟S112中為"YES"),結束取樣測定並開始黑暗測定,而當尚未經過測定時間時(在步驟S112中為"NO"),則回到步驟S106,並等待下一個的積蓄期間之經過。Next, the control calculation unit 122 accumulates the pixel data stored in the memory 138 in accordance with Equation 1 (step S111), and when the measurement time has elapsed ("YES" in step S112), the process ends. The sampling measurement is started and the dark measurement is started, and when the measurement time has not elapsed ("NO" in step S112), the process returns to step S106, and waits for the passage of the next accumulation period.

於此,在電荷傳送(步驟S107)、像素訊號輸出(步驟S108)、A/D變換(步驟S109)以及像素資料記憶(步驟S110)之間,光二極體128,係並不中斷地繼續進行電荷之產生以及積蓄。故而,光二極體128,係在測定期間MP之間,持續將被測定光604作光電變換,並持續產生因應了所受光之被測定光604的光量之電荷,同時,將在積蓄期間SP(1)、SP(2)、…、SP(M)之各個中所產生了的電荷作積蓄。又,A/D變換部112,係將在積蓄期間SP(1)、SP(2)、…、SP(M)之各個中所積蓄在光二極體128中之電荷的量Q(1,i)、Q(2,i)、…、Q(M,i)變換為像素資料D(1,i)、D(2,i)、…D(M,i)。進而,控制演算部122,係將A/D變換器112所變換了的複數之像素資料D(1,i)、D(2,i)、…、D(M,i)作累加,並計算出涵蓋測定期間MP之全體的像素資料D(i)。Here, between the charge transfer (step S107), the pixel signal output (step S108), the A/D conversion (step S109), and the pixel data memory (step S110), the photodiode 128 continues without interruption. The generation and accumulation of electric charge. Therefore, the photodiode 128 continuously photoelectrically converts the light to be measured 604 between the measurement periods MP, and continues to generate an electric charge corresponding to the amount of light of the light to be measured 604 of the received light, and at the same time, during the accumulation period SP ( 1) The charge generated in each of SP(2), ..., SP(M) is accumulated. Further, the A/D conversion unit 112 is the amount Q (1, i) of the electric charge accumulated in the photodiode 128 in each of the accumulation periods SP(1), SP(2), ..., SP(M). ), Q(2, i), ..., Q(M, i) are transformed into pixel data D(1, i), D(2, i), ... D(M, i). Further, the control calculation unit 122 accumulates the complex pixel data D(1, i), D(2, i), ..., D(M, i) converted by the A/D converter 112, and calculates The pixel data D(i) covering the entirety of the measurement period MP is shown.

在黑暗測定中,首先,如圖5所示一般,控制演算部122,係對光閘106作控制並關閉光閘106(步驟S113),並對感測器110作控制而開始對於光二極體128之電荷的積蓄(步驟S114)。In the dark measurement, first, as shown in FIG. 5, the control calculation unit 122 controls the shutter 106 and closes the shutter 106 (step S113), and controls the sensor 110 to start the photodiode. The accumulation of charge of 128 (step S114).

接下來,與取樣測定之S106~S111同樣的,進行有等待積蓄時間經過(步驟S115)、電荷傳送(步驟S116)、像素訊號輸出(步驟S117)、A/D變換(步驟S118)、像素資料記憶(步驟S119)以及像素資料累加(步驟S120),當經過了測定時間時(在步驟S121中為"YES"),結束黑暗測定,而當尚未經過測定時間時(在步驟S121中為"NO"),則回到步驟S115,並等待下一個的積蓄期間之經過。Next, in the same manner as S106 to S111 of the sampling measurement, the waiting accumulation time elapse (step S115), charge transfer (step S116), pixel signal output (step S117), A/D conversion (step S118), and pixel data are performed. The memory (step S119) and the pixel data accumulation (step S120), when the measurement time has elapsed ("YES" in step S121), the dark measurement is ended, and when the measurement time has not elapsed ("NO in step S121" "), then return to step S115 and wait for the passage of the next accumulation period.

在黑暗測定結束後,控制演算部122,係為了除去暗電流雜訊,而從藉由取樣測定所得到的像素資料D(i)來減去在黑暗測定中所得到的像素資料D(i),並由該演算結果而演算出分光輻射亮度。After the dark measurement is completed, the control calculation unit 122 subtracts the pixel data D(i) obtained in the dark measurement from the pixel data D(i) obtained by the sampling measurement in order to remove the dark current noise. And the spectral radiance is calculated from the calculation result.

若是如此這般地對分光輻射亮度作測定,則不會產生光二極體128之飽和,而能夠在短時間內而適切地對光量會週期性變動之被測定光604作測定。又,分光輻射亮度計1,係亦具備有:不需要為了防止電荷之飽和而使用難以確保透過率之精確度的透過率為極端低之減光濾鏡104的優點。If the spectral radiance is measured in such a manner, the saturation of the photodiode 128 does not occur, and the light to be measured 604 whose amount of light periodically changes can be appropriately measured in a short time. Further, the spectroradiometer 1 is also provided with the advantage that the dimming filter 104 having an extremely low transmittance which is difficult to ensure the accuracy of the transmittance is not required in order to prevent saturation of the electric charge.

另外,雖然亦可預先對測定期間MP之分割數M作決定,並將在步驟S102中所決定之積蓄時間的M倍作為測定時間,但是,亦可根據在步驟S102中所決定之積蓄時間與操作部118所接收輸入之測定時間,來決定測定期間MP之分割數M。若是如此作,則在能夠不受積蓄時間影響而將測定時間設為一定的同時,由於在被測定光604之光量為多而容易受到閃爍(flicker)影響的情況時,分割數M係變多,而當被測定光604之光量為少而不易受到閃爍(flicker)影響的情況時,分割數M係變少,因此,能夠對被測定光604之光量進行適切的測定。In addition, although the number M of divisions of the measurement period MP may be determined in advance, and M times of the accumulation time determined in step S102 is used as the measurement time, the accumulation time determined in step S102 may be used. The operation unit 118 receives the input measurement time to determine the division number M of the measurement period MP. If this is the case, the measurement time can be made constant without being affected by the accumulation time, and when the amount of light to be measured 604 is large, it is likely to be affected by flicker, and the number of divisions M is increased. On the other hand, when the amount of light to be measured 604 is small and is not easily affected by flicker, the number of divisions M is small, and therefore the amount of light to be measured 604 can be appropriately measured.

圖6,係為展示先前技術之分光輻射亮度計以及本發明之第1實施形態的分光輻射亮度計1所致之測定結果的實例之圖。於圖6中,針對光量之變動頻率為20~200Hz的被測定光之各個,而展示有當藉由先前技術之分光輻射亮度計以及本發明之第1實施形態的分光輻射亮度計1而對亮度作了測定的情況時之亮度的最大值、最小值、平均值、讀值(of reading)的誤差範圍。於此,係將測定時間設為1/60秒。Fig. 6 is a view showing an example of the measurement results of the spectral radiance luminance meter of the prior art and the spectroradiometer 1 of the first embodiment of the present invention. In Fig. 6, for each of the light to be measured whose frequency of variation is 20 to 200 Hz, the spectroradiometer 1 of the first embodiment of the present invention and the spectroradiometer 1 of the first embodiment of the present invention are shown. The maximum value, the minimum value, the average value, and the error range of the reading of the brightness when the brightness is measured. Here, the measurement time was set to 1/60 second.

如同由圖6而可明瞭一般,第1實施形態的分光輻射亮度計1所致之測定結果,係能夠在較先前技術之分光輻射亮度計而更廣的頻率之範圍下,而得到良好的重複精確度。As is clear from Fig. 6, the measurement result by the spectroradiometer 1 of the first embodiment can be well repeated in a wider range of frequencies than the prior art spectroradiometer. Accuracy.

〈2 第2實施形態〉<2 Second Embodiment>

圖7,係為本發明之第2實施形態的亮度計2之模式圖。亮度計2,主要係將CRT顯示器、電漿顯示器、液晶顯示器等之顯示器602所發出之光作為被測定光604,而測定被測定光604之亮度。Fig. 7 is a schematic view showing a luminance meter 2 according to a second embodiment of the present invention. The luminance meter 2 mainly measures the brightness of the light to be measured 604 by using the light emitted from the display 602 such as a CRT display, a plasma display, or a liquid crystal display as the light to be measured 604.

如圖7中所示一般,亮度計2,係具備有:光學系202、光圈204、光閘206、感測器210、A/D變換器212、通訊介面214、顯示部216、操作部218、同步訊號輸入端子220以及控制演算部222。As shown in FIG. 7 , the luminance meter 2 includes an optical system 202 , an aperture 204 , a shutter 206 , a sensor 210 , an A/D converter 212 , a communication interface 214 , a display unit 216 , and an operation unit 218 . The synchronization signal input terminal 220 and the control calculation unit 222.

光學系202,係將入射至亮度計2中之被測定光604導引至感測器210處。光學系202,係可將透鏡或是反射鏡作組合而構成。The optical system 202 guides the light to be measured 604 incident on the luminance meter 2 to the sensor 210. The optical system 202 can be constructed by combining a lens or a mirror.

光圈204,係對透過之光的光束作限制。光圈204,係受到控制演算部222之控制而開閉。當光圈204被關閉的情況時,入射至亮度計2中之光,係在經由光圈204而被作限制後,到達感測器210處。另一方面,當光圈204被開啟的情況時,入射至亮度計2中之被測定光604,其光束係不會被作限制並到達感測器210處。故而,光圈204,係作為對到達感測器210處之被測定光604的光量作調整之調整手段而起作用。The aperture 204 limits the beam of light transmitted through it. The aperture 204 is opened and closed under the control of the control calculation unit 222. When the aperture 204 is closed, the light incident on the luminance meter 2 is limited by the aperture 204 and reaches the sensor 210. On the other hand, when the aperture 204 is turned on, the light to be measured 604 incident on the luminance meter 2 is not limited and reaches the sensor 210. Therefore, the aperture 204 functions as an adjustment means for adjusting the amount of light of the light to be measured 604 at the sensor 210.

光閘206,係將光作遮蔽。光閘206,係受到控制演算部222之控制,而在被測定光604之光路中被作插拔。當在被測定光604之光路中被插入有光閘206的情況時,入射至亮度計2中之被測定光604,係成為不會到達感測器210處。另一方面,當從被測定光604之光路中而將光閘206拔去的情況時,入射至亮度計2中之被測定光604,係成為會到達感測器210處。The shutter 206 shields the light. The shutter 206 is controlled by the control calculation unit 222, and is inserted and removed in the optical path of the light to be measured 604. When the shutter 206 is inserted into the optical path of the light to be measured 604, the light to be measured 604 incident on the luminance meter 2 does not reach the sensor 210. On the other hand, when the shutter 206 is removed from the optical path of the light to be measured 604, the light to be measured 604 incident on the luminance meter 2 reaches the sensor 210.

感測器210,係受光被測定光604,並將代表被測定光604之光量的訊號作輸出。The sensor 210 receives the light-measured light 604 and outputs a signal representing the amount of light of the light to be measured 604.

圖8,係為感測器210之電路圖。如圖8中所示一般,感測器210,係具備有:光二極體240、差動放大器242、非反轉放大器244、電容器246、248、250、切換開關252、254、以及放電開關256、258、260。FIG. 8 is a circuit diagram of the sensor 210. As shown in FIG. 8 , the sensor 210 is provided with a photodiode 240 , a differential amplifier 242 , a non-inverting amplifier 244 , capacitors 246 , 248 , 250 , switch 252 , 254 , and a discharge switch 256 . 258, 260.

在差動放大器242之輸入端處,係被連接有光二極體240,在差動放大器242之輸出端處,係經由切換開關252而被連接有電容器246、248。差動放大器242,係將光二極體240所輸出之訊號放大並輸出。切換開關252,係受到控制演算部222之控制,而將差動放大器242之輸出目標在電容器246與電容器248之間作切換。更具體而言,切換開關252,係在第奇數個的積蓄期間SP(1)、SP(3)、…中,將差動放大器242之輸出連接於電容器246處,並在第偶數個的積蓄期間SP(2)、SP(4)、…中,將差動放大器242之輸出連接於電容器248處。藉由此,光二極體240所輸出之訊號係藉由差動放大器242而被放大,並在第奇數個的積蓄期間SP(1)、SP(3)、…中,將被放大後之訊號施加於電容器246處,並在第偶數個的積蓄期間SP(2)、SP(4)、…中,將放大後之訊號施加於電容器248處。其結果,在第奇數個的積蓄期間SP(1)、SP(3)、…中,因應了光二極體240所受光之光量的電荷,係被積蓄在電容器246處,在第偶數個的積蓄期間SP(2)、SP(4)、…中,因應了光二極體240所受光之光量的電荷,係被積蓄在電容器248處。At the input of the differential amplifier 242, an optical diode 240 is connected, and at the output of the differential amplifier 242, capacitors 246, 248 are connected via a changeover switch 252. The differential amplifier 242 amplifies and outputs the signal output from the photodiode 240. The changeover switch 252 is controlled by the control calculation unit 222 to switch the output of the differential amplifier 242 between the capacitor 246 and the capacitor 248. More specifically, the changeover switch 252 connects the output of the differential amplifier 242 to the capacitor 246 in the odd-numbered accumulation periods SP(1), SP(3), ..., and stores the even number of times. During the period SP(2), SP(4), ..., the output of the differential amplifier 242 is connected to the capacitor 248. Thereby, the signal output from the photodiode 240 is amplified by the differential amplifier 242, and the amplified signal is generated in the odd-numbered accumulation periods SP(1), SP(3), . It is applied to the capacitor 246, and the amplified signal is applied to the capacitor 248 in the even-numbered accumulation periods SP(2), SP(4), . As a result, in the odd-numbered accumulation periods SP(1), SP(3), ..., the electric charge corresponding to the amount of light received by the photodiode 240 is accumulated in the capacitor 246, and the even-numbered accumulation is accumulated. In the periods SP(2), SP(4), ..., the electric charge corresponding to the amount of light received by the photodiode 240 is accumulated in the capacitor 248.

在非反轉放大器244之輸入端處,係經由切換開關254而被連接有電容器246、248,在非反轉放大器244之輸出端處,係被連接有電容器250。非反轉放大器244之電壓放大率係為1,非反轉放大器244之輸入阻抗係成為充分的高。切換開關254,係受到控制演算部222之控制,而將非反轉放大器244之輸入的連接目標在電容器246與電容器248之間作切換。更具體而言,切換開關254,係在第奇數個的積蓄期間SP(1)、SP(3)、…結束後,將非反轉放大器244之輸入連接於電容器246處,並在第偶數個的積蓄期間SP(2)、SP(4)、…結束後,將非反轉放大器244之輸入連接於電容器248處。藉由此,在第奇數個的積蓄期間SP(1)、SP(3)、…結束後,在電容器250處係被施加有與電容器246之兩端的電壓為相同之電壓,在第偶數個的積蓄期間SP(2)、SP(4)、…結束後,在電容器250處係被施加有與電容器248之兩端的電壓為相同之電壓。其結果,在第奇數個的積蓄期間SP(1)、SP(3)、…結束後,被積蓄於電容器250中的電荷,係與被積蓄在電容器246中之電荷的量成為相同,在第偶數個的積蓄期間SP(2)、SP(4)、…結束後,被積蓄於電容器250中的電荷,係成為與被積蓄在電容器248中之電荷為相同。亦即是,係可得到與將被積蓄在電容器246又或是電容器248中之電荷傳送至電容器250一事同等之結果。At the input of the non-inverting amplifier 244, capacitors 246, 248 are coupled via switch 254, and at the output of non-inverting amplifier 244, capacitor 250 is coupled. The voltage amplification factor of the non-inverting amplifier 244 is 1, and the input impedance of the non-inverting amplifier 244 is sufficiently high. The changeover switch 254 is controlled by the control calculation unit 222, and the connection destination of the input of the non-inverting amplifier 244 is switched between the capacitor 246 and the capacitor 248. More specifically, the changeover switch 254 connects the input of the non-inverting amplifier 244 to the capacitor 246 after the end of the odd-numbered accumulation periods SP(1), SP(3), ..., and is in the even number After the end of the accumulation period SP(2), SP(4), ..., the input of the non-inverting amplifier 244 is connected to the capacitor 248. As a result, after the end of the odd-numbered accumulation periods SP(1), SP(3), ..., the voltage at the both ends of the capacitor 246 is applied to the capacitor 250 at the same number. After the end of the accumulation period SP (2), SP (4), ..., a voltage equal to the voltage across the capacitor 248 is applied to the capacitor 250. As a result, after the end of the odd-numbered accumulation periods SP(1), SP(3), ..., the amount of charge accumulated in the capacitor 250 is the same as the amount of charge accumulated in the capacitor 246. After the end of the even number of accumulation periods SP (2), SP (4), ..., the electric charge accumulated in the capacitor 250 is the same as the electric charge accumulated in the capacitor 248. That is, it is possible to obtain the same result as the transfer of the charge accumulated in the capacitor 246 or the capacitor 248 to the capacitor 250.

電容器250之兩端的電壓,係作為感測器210之輸出而被輸出至A/D變換器212處。The voltage across the capacitor 250 is output to the A/D converter 212 as an output of the sensor 210.

電容器246、248、250,係分別被並聯連接於放電開關256、258、260處。放電開關256、258、260,係受到控制部之控制而作開閉,並分別將電容器246、248、250中所積蓄之電荷作放電。具體而言,放電開關256、258,係分別在將積蓄於電容器246、248中之電荷傳送至電容器250處之後,將被積蓄在電容器246、248中之電荷作放電,而放電開關260,係在將藉由對於電容器250之電荷的積蓄所產生的電壓作為感測器210之輸出而作了輸出後,將被積蓄在電容器250中之電荷作放電。Capacitors 246, 248, 250 are connected in parallel to discharge switches 256, 258, 260, respectively. The discharge switches 256, 258, and 260 are controlled to open and close by the control unit, and discharge the electric charges accumulated in the capacitors 246, 248, and 250, respectively. Specifically, the discharge switches 256 and 258 respectively discharge the charges accumulated in the capacitors 246 and 248 after the charges accumulated in the capacitors 246 and 248 are transferred to the capacitor 250, and the discharge switch 260 is discharged. After the voltage generated by the accumulation of the electric charge to the capacitor 250 is output as the output of the sensor 210, the electric charge accumulated in the capacitor 250 is discharged.

如此這般,一面在電容器246與電容器248之間,將對在第奇數個的積蓄期間SP(1)、SP(3)、…中與第偶數個的積蓄期間SP(2)、SP(4)、…中所產生的電荷作積蓄之積蓄手段作切換,一面在直到下一個的積蓄期間來臨為止的期間中,將在電容器246又或是電容器248中所積蓄之電荷傳送至另外的電容器250處並進行放電,藉由此,成為能夠一面連續地進行電荷之積蓄,一面將在測定期間MP之途中所積蓄的電荷作傳送並進行A/D變換。In this manner, between the capacitor 246 and the capacitor 248, the even-numbered accumulation periods SP(1), SP(3), ... and the even-numbered accumulation periods SP(2), SP(4) In the period until the next accumulation period comes, the charge accumulated in the capacitor 246 or the capacitor 248 is transferred to the other capacitor 250 while the storage means for accumulating the charge generated in the ... is switched. At the same time, the electric charge is stored, and the electric charge accumulated in the middle of the measurement period MP is transmitted and A/D-converted.

若是回到圖7並作說明,則A/D變換器212,係將感測器210所輸出之類比訊號變換為數位資料,並輸出至控制演算部222處。藉由此,A/D變換器212,係能夠將被積蓄在電容器250中之電荷的量變換為數位值並輸出。If it is returned to FIG. 7 and described, the A/D converter 212 converts the analog signal output from the sensor 210 into digital data and outputs it to the control calculation unit 222. Thereby, the A/D converter 212 can convert the amount of electric charge accumulated in the capacitor 250 into a digital value and output it.

通訊介面214,係將亮度計2與外部電腦等之外部機器可通訊地作連接。The communication interface 214 connects the luminance meter 2 to an external device such as an external computer.

顯示部216,係將亮度計2之測定結果作顯示。The display unit 216 displays the measurement result of the luminance meter 2.

操作部218,係接受被測定光之光量的變動週期或是測定時間之輸入等之操作者的操作。The operation unit 218 is an operator who receives an fluctuation period of the amount of light to be measured or an input of the measurement time.

同步訊號輸入端子220,係取得如同對CRT顯示器所發出之光作測定的情況時之垂直同步訊號一般的與被測定光604之光量的變動同步變動的訊號。The synchronizing signal input terminal 220 obtains a signal in which a vertical synchronizing signal generally changes in synchronization with a change in the amount of light of the light to be measured 604 as in the case of measuring light emitted from the CRT display.

控制演算部222,係為至少具備有CPU236以及記憶體238之嵌入式電腦,並藉由使CPU236實行從記憶體238所讀出之控制程式,來對光圈204、光閘206、感測器210、A/D變換器212、通訊介面214、顯示部216、操作部218或其他之亮度計2的各部作控制。又,控制演算部222,係藉由使CPU236實行從記憶體238中所讀出之控制程式,而由從A/D變換器212所取得之數位資料來演算出亮度。The control calculation unit 222 is an embedded computer including at least a CPU 236 and a memory 238, and causes the CPU 236 to execute a control program read from the memory 238 to face the aperture 204, the shutter 206, and the sensor 210. The A/D converter 212, the communication interface 214, the display unit 216, the operation unit 218, or other units of the luminance meter 2 are controlled. Further, the control calculation unit 222 calculates the brightness from the digital data acquired from the A/D converter 212 by causing the CPU 236 to execute the control program read from the memory 238.

控制演算部222,係在光二極體240將被測定光604作光電變換之測定期間的途中,在感測器210處,將被積蓄在電容器246、248中之電荷從電容器246、248而傳送至電容器250處,並將具備有因應了所傳送而來之電荷的量之電壓的類比訊號作輸出,並在A/D變換器212中,將感測器210所輸出之類比訊號變換為數位資料。The control calculation unit 222 transmits the charges accumulated in the capacitors 246 and 248 from the capacitors 246 and 248 at the sensor 210 while the photodiode 240 is performing the photoelectric conversion of the measurement light 604. To the capacitor 250, an analog signal having a voltage corresponding to the amount of the transferred charge is output, and in the A/D converter 212, the analog signal output from the sensor 210 is converted into a digital position. data.

藉由此,光二極體240在測定期間中所產生並積蓄在電容器246、248中之電荷,係分成複數次而被讀出,控制演算部222,係取得在如圖3所示一般而將測定期間MP作了分割後之複數個的積蓄期間SP(1)、SP(2)、…、SP(M)之各個中的因應了光二極體240所產生並積蓄在電容器246、248中之電荷的量q(1)、q(2)、…、q(M)之數位資料d(1),d(2),…,d(M)。於此,數位資料d(j),係為將具備有因應了在積蓄期間SP(j)(j=1,2,…,M)中之光二極體240所產生並積蓄在電容器246、248中的電荷之量q(j)之電壓的類比訊號a(j)變換成了數位值者。As a result, the electric charge generated by the photodiode 240 during the measurement period and accumulated in the capacitors 246 and 248 is read and divided into a plurality of times, and the control unit 222 is obtained as shown in FIG. The plurality of accumulation periods SP(1), SP(2), ..., SP(M) after the division of the measurement period MP are generated by the photodiode 240 and accumulated in the capacitors 246, 248. The digital data d(1), d(2), ..., d(M) of the amount of charge q(1), q(2), ..., q(M). Here, the digital data d(j) is generated and stored in the capacitors 246 and 248 in response to the photodiode 240 in the accumulation period SP(j) (j=1, 2, ..., M). The analog signal a(j) of the voltage of the amount of charge q(j) is converted into a digital value.

進而,控制演算部222,係將複數之像素資料d(1)、d(2)、…、d(M)依據式2而作累加,並計算出因應了感測器210在測定期間MP中所產生以及積蓄的電荷之量q(1)、q(2)、…、q(N)的數位資料d(1)、d(2)、…、d(N)。Further, the control calculation unit 222 accumulates the plural pixel data d(1), d(2), ..., d(M) according to Equation 2, and calculates that the sensor 210 is in the measurement period MP in response to the measurement. The digital data d(1), d(2), ..., d(N) of the generated and accumulated amounts of charge q(1), q(2), ..., q(N).

此種亮度計2,亦係藉由與第1實施形態之分光輻射亮度計1同樣的動作,而能夠不產生光二極體240之飽和,並在短時間內而適切地對光量會週期性變動之被測定光604作測定。In the same manner as the spectroradiometer 1 of the first embodiment, the luminance meter 2 can prevent the saturation of the photodiode 240 and periodically change the amount of light in a short time. The measured light 604 is measured.

(3其他)(3 other)

在上述之第1實施形態中,係針對在測定被測定光604之分光輻射亮度的分光輻射亮度計1中適用了本發明之例子而作了說明,在上述第2實施形態中,係針對在測定被測定光604之亮度的亮度計2中適用了本發明之例子而作了說明,但是,本發明之適用範圍,係並不被限定於此些。亦即是,本發明,係可適用在照度計、分光測色計等之對被測定光604之光量作測定的各種光量測定裝置中。In the first embodiment described above, an example in which the present invention is applied to the spectroradiometer 1 for measuring the spectral radiance of the light to be measured 604 is described. In the second embodiment, The luminance meter 2 for measuring the brightness of the light to be measured 604 is described by applying the example of the present invention, but the scope of application of the present invention is not limited thereto. In other words, the present invention can be applied to various light amount measuring devices that measure the amount of light of the light to be measured 604, such as an illuminometer or a spectrophotometer.

又,上述之說明,在所有的局面中,係僅為例示,本發明,係並不被限定於該些。可以想見,在不脫離本發明之範圍下,能夠想出未作例示之無數的變形例。特別是,將第1實施形態中所說明之技術與在第2實施形態中所說明之技術作組合一事,不用說當然係可被預想。Further, in the above description, in all cases, the description is merely illustrative, and the present invention is not limited thereto. It is to be understood that numerous modifications, not exemplified, can be devised without departing from the scope of the invention. In particular, it is needless to say that the technique described in the first embodiment can be combined with the technique described in the second embodiment.

1...分光輻射亮度計1. . . Spectroradiometer

2...亮度計2. . . Luminance meter

104...減光濾鏡104. . . Dimming filter

110、210...感測器110, 210. . . Sensor

112、212...A/D變換器112, 212. . . A/D converter

122、222...控制演算部122, 222. . . Control calculation department

118、218...操作部118,218. . . Operation department

120、220...同步訊號輸入端子120, 220. . . Synchronous signal input terminal

128、240...光二極體128, 240. . . Light diode

246、248...電容器246, 248. . . Capacitor

圖1,係為第1實施形態的分光輻射亮度計之模式圖。Fig. 1 is a schematic view showing a spectroradiometer according to the first embodiment.

圖2,係為感測器之平面圖。Figure 2 is a plan view of the sensor.

圖3,係為展示測定期間與積蓄期間之間的關係之圖。Figure 3 is a graph showing the relationship between the measurement period and the accumulation period.

圖4,係為對分光輻射亮度計之動作作說明的流程圖。Fig. 4 is a flow chart for explaining the operation of the spectroradiometer.

圖5,係為對分光輻射亮度計之動作作說明的流程圖。Fig. 5 is a flow chart for explaining the operation of the spectroradiometer.

圖6,係為展示測定結果之實例的圖。Fig. 6 is a view showing an example of the measurement result.

圖7,係為第2實施形態的亮度計之模式圖。Fig. 7 is a schematic view showing a luminance meter of the second embodiment.

圖8,係為感測器之電路圖。Figure 8 is a circuit diagram of the sensor.

1...分光輻射亮度計1. . . Spectroradiometer

102...光學系102. . . Optical system

104...減光濾鏡104. . . Dimming filter

106...光閘106. . . Shutter

108...分散元件108. . . Dispersing element

110...感測器110. . . Sensor

112...A/D變換器112. . . A/D converter

114...通訊介面114. . . Communication interface

116...顯示部116. . . Display department

118...操作部118. . . Operation department

120...同步訊號輸入端子120. . . Synchronous signal input terminal

122...控制演算部122. . . Control calculation department

136...CPU136. . . CPU

138...記憶體138. . . Memory

602...顯示器602. . . monitor

604...被測定光604. . . Measured light

Claims (7)

一種光量測定裝置,係為對被測定光之光量作測定的光量測定裝置,其特徵為,具備有:電荷產生手段,係產生因應了所受光之被測定光的光量之電荷;和積蓄手段,係將前述電荷產生手段所產生之電荷作積蓄;和A/D變換手段,係將被積蓄於前述積蓄手段中之電荷的量變換為數位值;和累加手段,係將複數之數位值作累加;和控制手段,係對前述光量測定裝置作控制,藉由前述控制手段所致之控制,前述電荷產生手段,係在測定期間中,將與所受光之被測定光的光量相對應之電荷無中斷地而連續性持續產生,前述積蓄手段,係在將測定期間無中斷地而作了分割之複數的積蓄期間的各個中,將前述電荷產生手段所產生之電荷作積蓄,前述A/D變換手段,係將於接收藉由前述電荷產生手段所產生了的電荷之期間中而在複數之積蓄期間的各個中所被積蓄於前述積蓄手段中的電荷之量變換為數位值,前述累加手段,係將前述A/D變換手段所變換了的複數之數位值作累加。 A light amount measuring device is a light amount measuring device that measures the amount of light to be measured, and is characterized in that: a charge generating means is provided, and a charge corresponding to the amount of light of the light to be received is received; and a storage means is provided. And accumulating the electric charge generated by the electric charge generating means; and the A/D converting means converting the amount of electric charge accumulated in the accumulating means into a digital value; and accumulating means accumulating the plural digital value And the control means for controlling the light quantity measuring device by the control means, wherein the charge generating means adjusts the amount of light corresponding to the amount of light of the light to be received during the measurement period. In the meantime, the accumulation means is continued, and the charge means generates the charge generated by the charge generation means in each of the accumulation periods in which the plurality of divisions are performed without interruption during the measurement, and the A/D conversion is performed. The means is stored in each of the plurality of accumulation periods during the period in which the electric charge generated by the electric charge generating means is received. The amount of charge in said accumulator means for converting the bit number value, the accumulation means, the digital system the A / D converting means for converting the complex of the accumulated value for. 如申請專利範圍第1項所記載之光量測定裝置,其中,係更進而具備有:調整手段,係根據在測定期間的開 始之前所預先作了預備測定的被測定光之光量,而對到達前述電荷產生手段處之被測定光的光量作調整。 The light quantity measuring device according to the first aspect of the invention, further comprising: adjusting means, based on the opening during the measuring period Before the start, the amount of light to be measured is measured in advance, and the amount of light to be measured at the charge generating means is adjusted. 如申請專利範圍第1項或第2項所記載之光量測定裝置,其中,前述控制手段,係根據在測定期間的開始之前所預先作了預備測定的被測定光之光量,而決定積蓄期間之長度。 The light quantity measuring device according to the first or second aspect of the invention, wherein the control means determines the storage period based on the amount of light to be measured which is previously measured before the start of the measurement period. length. 如申請專利範圍第1項所記載之光量測定裝置,其中,前述控制手段,係根據被測定光之光量的變動週期,而決定積蓄期間之長度。 The light quantity measuring device according to the first aspect of the invention, wherein the control means determines the length of the accumulation period based on a fluctuation period of the amount of light to be measured. 如申請專利範圍第4項所記載之光量測定裝置,其中,係更進而具備有:第1接受手段,其係接受被測定光之光量的變動週期之輸入,前述控制手段,係根據前述第1接受手段所接受輸入的變動週期,來決定積蓄期間之長度。 The light quantity measuring device according to the fourth aspect of the invention, further comprising: a first receiving means for receiving an input of a fluctuation period of the amount of light to be measured, wherein the control means is based on the first The length of the accumulation period is determined by the period of change accepted by the input means. 如申請專利範圍第4項所記載之光量測定裝置,其中,係更進而具備有:取得手段,其係取得與被測定光之光量的變動作同步變動之訊號,前述控制手段,係由前述取得手段所取得之訊號,來檢測出被測定光之光量的變動週期,並根據所檢測出之變動週期,來決定積蓄期間之長度。 The light quantity measuring device according to the fourth aspect of the invention, further comprising: obtaining means for obtaining a signal that changes in synchronization with a change in the amount of light to be measured, wherein the control means is obtained by the obtaining The signal obtained by the means detects the fluctuation period of the amount of light to be measured, and determines the length of the accumulation period based on the detected fluctuation period. 如申請專利範圍第1項所記載之光量測定裝置,其中,係更進而具備有:第2接受手段,其係接受測定期間的長度之輸入,前述控制手段,係根據積蓄期間之長度與前述第2接 受手段所接受輸入的測定時間之長度,來決定測定期間之分割數。The light quantity measuring device according to the first aspect of the invention, further comprising: a second receiving means for receiving an input of a length of the measurement period, wherein the control means is based on a length of the accumulation period and the length 2 The number of divisions during the measurement period is determined by the length of the measurement time accepted by the means.
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