TWI470192B - An integrated device for luminous flux and scattering characteristic measurement - Google Patents

Description

Integrated measuring device for luminous flux and material surface scattering

The present invention relates to a measurement system for scattering characteristics, and more particularly to a measurement system that measures forward scattering characteristics and backscatter characteristics.

In recent years, the development of new light sources such as LED (Light Emitting Diode) or EL (Electro Luminescence) has been rapidly developed. In terms of evaluating the index of the light source, the full luminous flux (total light beam) or light color of the light source is used. In the method of measuring the total luminous flux of the light source, an integrating sphere (spherical beam meter) which spreads a diffusion material such as barium sulfate on the inner wall of the hollow sphere is used. When the integrating sphere is used, the light emitted from the light source is made uniform by lighting the light source at the center of the integrating sphere, and the total luminous flux is calculated based on the illuminance of the uniformized light.

At least two of the above integrating spheres are required to separately measure the forward scattering characteristics and the backscattering characteristics of the light source. As shown in FIGS. 1A and 1B, the two integrating spheres 100a, 100b are all complete spheres, and the object to be tested 110 is placed between the two integrating spheres 100a, 100b, and the beam is directed toward the object to be tested 110, and the reflected beam is forwarded. Scattering, and the light beam that has passed through the object to be tested 110 generates backscattering, and then the light sensor or the light color and the like are respectively calculated by the light sensor. And adding a phosphor layer between the two integrating spheres 100a, 100b can measure the fluorescent characteristics of the phosphor layer.

In the conventional method of measuring the front and rear scatter characteristics of the two integrating spheres as shown above, the light energy dissipation caused by the fixture for fixing the object to be tested 110 at the center of the two integrating spheres 100a, 100b Become the cause of the error. In the current technology, an integral sphere is required to measure the total luminous flux, and if at least two integrating spheres are required to measure the scatter characteristics of the front and rear luminous fluxes or light colors, the measurement equipment is Take up space and increase measurement costs.

It is an object of the present invention to provide a measuring device that simultaneously integrates light flux, material surface scattering, and fluorescent characteristics under a single sphere structure.

Another object of the present invention is to provide an integrated measuring device for luminous flux and surface scattering of materials, which can reduce the space occupied by the device and reduce the measurement cost.

In order to achieve one or a part or all of the above, the present invention provides an integrated measuring device for luminous flux and surface scattering of a substance, comprising a plurality of hemispheres and a separator. The plurality of hemispheres includes a first hemispherical shell and a second hemispherical shell, and the first hemispherical shell and the second hemispherical shell are joined to each other to form a spherical shell. The partition is disposed between the first hemispherical shell and the second hemispherical shell. The partition has a first reflecting surface and a second reflecting surface, and the partition has a DST fixing portion on the partition and penetrates the first reflecting surface and the second reflecting surface. The first reflecting surface and the second reflecting surface are respectively located on opposite sides of the partition, and the first reflecting surface faces the first hemispherical shell, and the second reflecting surface faces the second hemispherical shell.

In one embodiment, the hemispheres each have an inner sidewall and the inner sidewall is coated with a highly reflective diffusion layer.

In an embodiment, the object to be tested is further disposed on the fixed portion of the object to be tested, and the object to be tested is selected from one of a light source or a phosphor layer.

In an embodiment, the integrated measuring device for the luminous flux and the surface scattering of the material further comprises a collimated light source disposed on one of the hemispheres, the collimated light source advancing toward the fixed portion of the object to be tested.

In one embodiment, the integrated measuring device for luminous flux and material surface scattering further includes a plurality of photo sensors, each photo sensor being disposed on each hemisphere.

In one embodiment, the spacer has a perforation at the edge of the spacer and through the first reflective surface and the second reflective surface of the spacer.

In an embodiment, the first hemispherical housing has a post that protrudes between the surface of the first hemispherical shell and the inner side wall, and the post passes through the perforation.

In one embodiment, the second hemispherical housing has a recess that is recessed between the surface of the second hemispherical housing and the inner sidewall, and the recess receives the post.

The above and other technical contents, features and advantages of the present invention will be apparent from the following detailed description of the preferred embodiments. The directional terms mentioned in the following embodiments, such as upper, lower, left, right, front or rear, etc., are only used to refer to the directions of the accompanying drawings. Therefore, these directions are used The language is used for illustration only and is not intended to limit the invention.

2A and 2B, FIG. 2A is a structural diagram of an integrated measuring device 200 for luminous flux and surface scattering of an embodiment of the present invention, and FIG. 2B is a light flux and surface scattering of an object according to an embodiment of the present invention. A cross-sectional view of the integrated measuring device 200. The integrated measuring device 200 for luminous flux and material surface scattering comprises a first hemispherical shell 300a, a second hemispherical shell 300, a partition 400, a first photosensor 600a and a second photosensor. 600b. There is a collimated light source placement portion 510, and the first hemispherical shell 300a and the second hemispherical shell 300b are combined to form a spherical shell. The partition plate 400 is disposed between the first hemispherical shell 300a and the second hemispherical shell 300b. The partition plate 400 has a first reflecting surface 410 and a second reflecting surface 420, and the first reflecting surface 410 and the second reflecting surface. The 420 series are respectively located on opposite sides of the spacer 400, and the first reflective surface 410 faces the first hemispherical housing 300a, and the second reflective surface 420 faces the second hemispherical housing 300b. The first reflective surface 410 and the second reflective surface 420 are, for example, a high-reflection mirror, and the spacer 400 has a test object fixing portion 450, which is, for example, an opening and penetrates through the first reflective surface 410 and the second. Reflecting surface 420. The first photo sensor 600a is disposed on the surface of the first hemispherical shell 300a, and the second photo sensor 600b is disposed on the surface of the second hemispherical shell 300b.

2A and 2B, the integrated measuring device 200 for light flux and material surface scattering further includes a collimated light source 500 disposed on the first hemispherical shell 300a or the second hemispherical shell 300b, the collimated light source. 500 series facing the partition The object to be tested fixing portion 450 of 400 advances. The integrated measuring device 200 for luminous flux and material surface scattering has an inner sidewall 310 coated with a highly reflective diffusion layer 310a, such as high purity barium sulfate, and a highly reflective diffusion layer 310a allows light to be contacted. The reflectance is increased at the side wall 310, and the effect of homogenization can be achieved. A phosphor layer can be placed on the object to be tested fixing portion 450 of the spacer 400, which can be used to measure the fluorescent characteristics of the phosphor layer. The spacer 400 has a through hole 720 at the edge of the spacer 400 and passing through the first reflective surface 410 and the second reflective surface 420 of the spacer 400. The first half ball housing 300a has a post 710 protruding from the surface of the first hemispherical housing 300a and the inner side wall 310, and the post 710 can pass through the through hole 720. The second hemispherical shell 300b has a recess 730 that is recessed between the surface of the second hemispherical shell 300b and the inner sidewall 310, and the recess 730 can receive the post 710. The design of the post 710, the perforation 720 and the recess 730 allows the post 710 to pass through the perforation 720 and be received in the recess 730 to form a latch to allow the spacer 400 to be detachable.

2C is a light path diagram of the integrated measuring device 200 for luminous flux and material surface scattering according to an embodiment of the present invention. A test object 800 is placed on the object to be tested fixing portion 450 of the partition 400, and a collimated light source 500 is placed in the collimated light source placing portion 510. The collimated light source 500 is directed by the first hemispherical shell 300a to be tested. The object 800 is partially reflected by the object to be tested 800 and directed toward the inner side wall 310 of the first hemispherical shell 300a. The other portion of the light passes through the object to be tested 800 and is directed to the inner side wall 310 of the second hemispherical shell 300b. First photo sensor 600a The first light sensor housing 600b is disposed on the first hemispherical housing 300b, and the second light sensor 600b is disposed on the second hemispherical housing 300b. Since the inner sidewall 310 is coated with the highly reflective diffusion layer 310a, the light is evenly distributed and reflected on the inner sidewall 310. This effect is also commonly referred to as scattering or diffuse reflection, so the first photo sensor 600a can be placed on the first hemispherical shell. The data measured at any position on the surface of the body 300a will be the same, and the second photo sensor 600b can be placed at any position on the surface of the second hemispherical shell 300b. The photo sensors 600a, 600b are, for example, one of optical sensors such as luminous flux, spectrum, color temperature, color coordinates, wavelength, lumen value, saturation, and fluorescence characteristics, and can measure the light emitted by the side object 800. Scattering characteristics generated by the first hemispherical shell 300a and the second hemispherical shell 300b.

FIG. 3 is an integrated measuring device 200a for luminous flux and material surface scattering according to an embodiment of the present invention. The detachment of the spacer 400 from the integrated measuring device 200 for scattering the light flux and the surface of the material forms an integrated measuring device 200a for illuminating the surface of the light flux and the surface of the material, and placing the object 800 on the surface light and the surface scattering. In the type measuring device 200a, the total luminous flux of the side object can be measured. All of the above embodiments show that under the framework of the integrated measuring device 200 of the luminous flux and the surface scattering of the present invention, the total luminous flux and the front and back scatter of the side object 800 can be measured without additional equipment. Features, which can achieve space utilization and reduce test costs.

However, the above is only the preferred embodiment of the present invention, and the scope of the present invention cannot be limited thereto, that is, the scope and application of the patent application according to the present invention. The simple equivalent changes and modifications made to the description are still within the scope of the present invention. In addition, any of the objects or advantages or features of the present invention are not required to be achieved by any embodiment or application of the invention. In addition, the abstract sections and headings are only used to assist in the search of patent documents and are not intended to limit the scope of the invention.

100a, 100b‧‧‧Skills of the technology

110‧‧‧Test object

200, 200a‧‧‧Integrated measuring device for luminous flux and surface scattering

300a‧‧‧first hemisphere shell

300b‧‧‧second hemisphere shell

310‧‧‧ inner side wall

310a‧‧‧High reflection diffusion layer

400‧‧‧Baffle

410‧‧‧First reflecting surface

420‧‧‧second reflective surface

450‧‧‧Determination of the object to be tested

500‧‧‧ Collimated light source

510‧‧‧ Collimated light source placement

600‧‧‧Photosensor

600a‧‧‧first light sensor

600b‧‧‧Second light sensor

710‧‧‧clamp

720‧‧‧Perforation

730‧‧‧ Groove

800‧‧‧Test object

1A and 1B are structural and cross-sectional views of an integrated measuring device for front, back, and surface scattering of a prior art.

2A is a structural view of an integrated measuring device for luminous flux and surface scattering of an object according to an embodiment of the present invention.

2B is a cross-sectional view of an integrated measuring device for luminous flux and material surface scattering according to an embodiment of the present invention.

2C is a light path diagram of an integrated measuring device for luminous flux and surface scattering of an object according to an embodiment of the present invention.

3 is an integrated measuring device for luminous flux and surface scattering of an object according to an embodiment of the present invention.

200‧‧‧Integrated measuring device for luminous flux and surface scattering

300a‧‧‧first hemisphere shell

300b‧‧‧second hemisphere shell

310‧‧‧ inner side wall

310a‧‧‧High reflection diffusion layer

400‧‧‧Baffle

410‧‧‧First reflecting surface

420‧‧‧second reflective surface

450‧‧‧Determination of the object to be tested

500‧‧‧ Collimated light source

510‧‧‧ Collimated light source placement

600a, 600b‧‧‧ light sensor

710‧‧‧clamp

720‧‧‧Perforation

730‧‧‧ Groove

800‧‧‧Test object

Claims (8)

An integrated measuring device for luminous flux and material surface scattering, comprising: a first hemispherical shell having a collimated light source placement portion; and a second hemispherical shell interfacing with the first hemispherical shell Forming a spherical shell for bonding; a partition disposed between the first hemispherical shell and the second hemispherical shell, the partition having a first reflecting surface, a second reflecting surface, and a test The first reflecting surface and the second reflecting surface are respectively located on opposite sides of the partition, and the first reflecting surface faces the first hemispherical shell, and the second reflecting surface faces The second hemispherical housing; a first photo sensor disposed on a surface of the first hemispherical housing; and a second photo sensor disposed on a surface of the second hemispherical housing. The integrated measuring device of the luminous flux and the surface scattering of the material according to claim 1, wherein the fixed portion of the object to be tested is, for example, an opening, the fixed portion of the object to be tested penetrates the first reflecting surface and the The second reflecting surface. An integrated measuring device for luminous flux and surface scattering of a material according to claim 1, wherein the first hemispherical housing has a first inner side wall and the second hemispherical housing has a second inner side wall. The first inner sidewall and the second inner sidewall are coated with a highly reflective diffusion layer. The integrated measuring device for the luminous flux and the surface scattering of the material as described in claim 1, further comprising an object to be tested, which is placed on the fixed portion of the object to be tested, The object to be tested is selected from one of a light source or a phosphor layer. An integrated measuring device for luminous flux and surface scattering of a material according to claim 1, further comprising a collimated light source disposed on the collimated light source placing portion, the collimated light source facing the partition The object to be tested fixing portion advances. An integrated measuring device for luminous flux and surface scattering of a material according to claim 1, wherein the spacer has a perforation at an edge of the spacer and passing through the first reflective surface of the spacer And the second reflecting surface. An integrated measuring device for luminous flux and surface scattering of a material according to claim 6 wherein the first hemispherical housing has a post protruding from the first hemispherical housing and located Between the junction of the first ball housing and the second hemisphere housing, and the post passes through the perforation. An integrated measuring device for luminous flux and surface scattering of a material according to claim 7, wherein the second hemispherical shell has a groove recessed in the second hemispherical shell and located at the Between the half ball housing and the junction of the second hemisphere housing, and the groove receives the post.