TWI465747B - - Google Patents

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Publication number
TWI465747B
TWI465747B TW102118836A TW102118836A TWI465747B TW I465747 B TWI465747 B TW I465747B TW 102118836 A TW102118836 A TW 102118836A TW 102118836 A TW102118836 A TW 102118836A TW I465747 B TWI465747 B TW I465747B
Authority
TW
Taiwan
Application number
TW102118836A
Other versions
TW201445152A (zh
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Filing date
Publication date
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Priority to TW102118836A priority Critical patent/TW201445152A/zh
Publication of TW201445152A publication Critical patent/TW201445152A/zh
Application granted granted Critical
Publication of TWI465747B publication Critical patent/TWI465747B/zh

Links

TW102118836A 2013-05-28 2013-05-28 校正射頻參數之方法 TW201445152A (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW102118836A TW201445152A (zh) 2013-05-28 2013-05-28 校正射頻參數之方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW102118836A TW201445152A (zh) 2013-05-28 2013-05-28 校正射頻參數之方法

Publications (2)

Publication Number Publication Date
TW201445152A TW201445152A (zh) 2014-12-01
TWI465747B true TWI465747B (zh) 2014-12-21

Family

ID=52575770

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102118836A TW201445152A (zh) 2013-05-28 2013-05-28 校正射頻參數之方法

Country Status (1)

Country Link
TW (1) TW201445152A (zh)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102438300A (zh) * 2010-09-20 2012-05-02 联发科技股份有限公司 射频信号控制模块与射频信号控制方法
TW201219797A (en) * 2010-11-10 2012-05-16 Univ Yuan Ze for enhancing measurement precision of scattering parameter and employing one-tier measurement for de-embedding procedure
CN102063514B (zh) * 2009-11-18 2012-07-11 上海华虹Nec电子有限公司 四端口射频器件射频参数测试方法
US20130005390A1 (en) * 2010-03-15 2013-01-03 Fujitsu Limited Radio base station and method of adjusting radio parameter
TW201303639A (zh) * 2011-04-21 2013-01-16 新力電腦娛樂股份有限公司 對控制器識別使用者之技術

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102063514B (zh) * 2009-11-18 2012-07-11 上海华虹Nec电子有限公司 四端口射频器件射频参数测试方法
US20130005390A1 (en) * 2010-03-15 2013-01-03 Fujitsu Limited Radio base station and method of adjusting radio parameter
CN102438300A (zh) * 2010-09-20 2012-05-02 联发科技股份有限公司 射频信号控制模块与射频信号控制方法
TW201219797A (en) * 2010-11-10 2012-05-16 Univ Yuan Ze for enhancing measurement precision of scattering parameter and employing one-tier measurement for de-embedding procedure
TW201303639A (zh) * 2011-04-21 2013-01-16 新力電腦娛樂股份有限公司 對控制器識別使用者之技術

Also Published As

Publication number Publication date
TW201445152A (zh) 2014-12-01

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