TWI453500B - Liquid crystal test cell and manufacturing method thereof - Google Patents

Description

Liquid crystal test box and method of manufacturing same

The present invention relates to a photovoltaic element and a method of fabricating the same, and more particularly to a liquid crystal test cell and a method of fabricating the same.

Liquid crystal is a key component of liquid crystal displays, which plays an important role in the characteristics of liquid crystal displays (such as reaction time, driving voltage, operable temperature range, etc.). The improvement of the liquid crystal material can effectively improve the characteristics of the liquid crystal display, so the introduction of liquid crystal materials with excellent performance is an indispensable part in the development of high-standard liquid crystal displays. However, the introduction of liquid crystal materials into actual liquid crystal displays often takes a lot of time and the cost of related materials, which not only delays the progress of liquid crystal material evaluation, but also wastes the material cost of unnecessary parts.

Therefore, it has been proposed to use a liquid crystal test cell to evaluate liquid crystal materials to reduce the cost of evaluating liquid crystal materials. Taking a liquid crystal test box for evaluating Fringe Field Switching (FFS) liquid crystal as an example, at least one common electrode, a pixel electrode, and a common electrode and a pixel electrode are disposed on one of the substrates of the liquid crystal test box. Insulation layer. In the prior art, at least three different masks are used to form the above-mentioned common electrode, pixel electrode and insulating layer, respectively, so that the cost required for evaluating the liquid crystal material cannot be further reduced.

In view of this, the present invention provides a liquid crystal test cell and a method of manufacturing the same, which can effectively reduce the cost required for evaluating a liquid crystal.

The present invention provides another liquid crystal test cell and a method of manufacturing the same, which can effectively reduce the cost required for evaluating liquid crystal.

The present invention provides a method of manufacturing a liquid crystal test cell comprising the following steps. A first substrate is provided. The first conductive mask is formed on the first substrate by using the first mask as a mask. Rotating one of the first substrate and the first mask. The first mask is used as a mask, and an insulation pattern is formed on the first conductive pattern, and the insulation pattern overlaps with the first conductive pattern and exposes a portion of the first conductive pattern. Forming a second conductive pattern on the insulating pattern, the second conductive pattern being electrically insulated from the first conductive pattern. A second substrate is provided. The first substrate and the second substrate are assembled. A liquid crystal layer is filled between the first substrate and the second substrate.

In an embodiment of the invention, the rotating the first substrate and the first mask comprises: rotating the first substrate by 180 degrees with respect to the first mask.

In an embodiment of the invention, the outer shape and dimension of the insulating pattern are substantially the same as the outer shape and size of the first conductive pattern.

In an embodiment of the invention, the first conductive pattern includes a first working portion and a first terminal portion connected to the first working portion, and the insulating pattern includes an insulating portion and an extending portion connected to the insulating portion, the first work The shape and size of the portion are substantially the same as the shape and size of the insulating portion, and the shape and size of the first terminal portion are substantially the same as the shape and size of the extending portion, wherein the first working portion and the insulating portion are coincident, and the first terminal portion The extensions are respectively located on opposite sides of the first working portion.

In an embodiment of the invention, the first working portion does not have a closed opening, and the second conductive pattern has a plurality of slits that expose the insulating portion and are located on the first working portion.

In an embodiment of the invention, the second conductive pattern is divided into a plurality of test areas connected to each other, and at least two slits are arranged in each test area, and the slit width of one of the test areas is located in another test. The slit width of the zone is different.

In an embodiment of the invention, the second conductive pattern is divided into a plurality of test areas connected to each other, and at least two slits are arranged in each test area, and the pitch and the pitch of the slits located in one of the test areas are located. The slit spacing of the other test zone is different.

In an embodiment of the invention, the method of fabricating the liquid crystal test cell described above may further include cutting the second substrate.

In an embodiment of the invention, the second conductive pattern includes a second working portion and a second terminal portion connected to the second working portion, and the second working portion overlaps with the first working portion and the insulating portion, in the cutting The first terminal portion and the second terminal portion are exposed after the two substrates.

The invention provides a liquid crystal test cell comprising a first substrate, a first conductive pattern, an insulating pattern, a second conductive pattern, a second substrate, and a liquid crystal layer. The first conductive pattern is disposed on the first substrate. The insulating pattern is disposed on the first substrate and overlaps with the first conductive pattern to expose a portion of the first conductive pattern, wherein the outer shape and size of the insulating pattern are substantially the same as the outer shape and size of the first conductive pattern. The second conductive pattern is disposed on the first substrate and electrically insulated from the first conductive pattern, and the insulating pattern is located between the first conductive pattern and the second conductive pattern. The second substrate is opposite to the first substrate. The liquid crystal layer is located between the first substrate and the second substrate.

In an embodiment of the invention, the first conductive pattern is located between the first substrate and the insulating pattern.

In an embodiment of the invention, the second conductive pattern is located between the second substrate and the insulating pattern.

In an embodiment of the invention, the first conductive pattern includes a first working portion and a first terminal portion connected to the first working portion, and the insulating pattern includes an insulating portion and an extending portion connected to the insulating portion, the first work The shape and size of the portion are substantially the same as the shape and size of the insulating portion, and the shape and size of the first terminal portion are substantially the same as the shape and size of the extending portion, wherein the first working portion and the insulating portion are coincident, and the first terminal portion The extensions are respectively located on opposite sides of the first working portion.

In an embodiment of the invention, the first working portion does not have a closed opening, and the second conductive pattern has a plurality of slits that expose the insulating portion and are located on the first working portion.

In an embodiment of the invention, the second conductive pattern is divided into a plurality of test areas connected to each other, and at least two slits are disposed in each test area, and a slit width of one of the test areas is located at another The slit width of the test zone is different.

In an embodiment of the invention, the second conductive pattern is divided into a plurality of test areas connected to each other, and at least two slits are disposed in each test area, and the slit spacing of one of the test areas is located at another The slit spacing of the test zone is different.

In an embodiment of the invention, the second conductive pattern includes a second working portion and a second terminal portion connected to the second working portion, the second working portion overlapping the first working portion and the insulating portion, and the second substrate There are at least two openings, and the two openings expose the first terminal portion and the second terminal portion, respectively.

Based on the above, in the liquid crystal test cell of the present invention and the method of manufacturing the same, a conductive pattern and an insulating pattern are respectively fabricated using the same photomask. Therefore, the number of masks required for the liquid crystal test cell of the present invention and the method of manufacturing the same is small, and the cost required for evaluating the liquid crystal can be effectively reduced.

The above described features and advantages of the present invention will be more apparent from the following description.

First embodiment

1A to 1E are schematic top views showing a manufacturing process of a liquid crystal test cell according to a first embodiment of the present invention. Referring to FIG. 1A, first, a first substrate 100 is provided. In this embodiment, the first substrate 100 is mainly used for carrying components on the first substrate 100, and the material thereof may be glass, quartz, organic polymer or other applicable materials.

Referring to FIG. 1B , a first conductive pattern 110 is formed on the first substrate 100 by using a first mask (not shown) as a mask. In the embodiment, the first conductive pattern 110 includes a first working portion 112 and a first terminal portion 114. The first working portion 112 of the embodiment is used to simulate a common electrode in a Fringe Field Switching (FFS) liquid crystal display panel. The first working portion 112 can be a complete conductive electrode. In other words, the first working portion 112 of the present embodiment does not have any closed openings. The first terminal portion 114 of the present embodiment is connected to the first working portion 112. The first terminal portion 114 is configured to transmit the test signal to the first working portion 112. In this embodiment, the first conductive pattern 110 is, for example, a transparent conductive pattern, and the material thereof includes a metal oxide such as indium tin oxide, indium zinc oxide, aluminum tin oxide, aluminum zinc oxide, indium antimony zinc oxide. , or other suitable oxide, or a stacked layer of at least two of the foregoing.

Next, one of the first substrate 100 and the first mask is rotated. In detail, the first substrate 100 or the first mask may be separately rotated while the first substrate 100 and the first mask are kept in parallel and the distance between the two is maintained constant. Referring to FIG. 1C , after the first substrate 100 and the first mask are rotated, the first mask is used as a mask to form an insulation pattern 120 on the first conductive pattern 110 . The insulating pattern 120 overlaps the first conductive pattern 110 and exposes a portion of the first conductive pattern 110.

For example, in the present embodiment, the substrate 100 can be rotated 180 degrees relative to the first mask. Next, the first mask is used to form the insulating pattern 120 for the mask. The first conductive pattern 110 and the insulating pattern 120 are respectively formed by the same first mask, and the distance between the first mask and the first substrate 100 is different when the first conductive pattern 110 is formed and the insulating pattern 120 is formed. Same time. Therefore, the shape and dimensions of the insulation pattern 120 of the embodiment are substantially the same as the shape and size of the first conductive pattern 110. In this embodiment, the material of the insulation pattern 120 may be an inorganic material (for example, yttrium oxide, lanthanum nitride, ytterbium oxynitride, or a stacked layer of at least two materials described above), an organic material, or a combination thereof.

Furthermore, the insulation pattern 120 of the present embodiment includes an insulating portion 122 and an extension portion 124 connected to the insulating portion 122. The outer shape and size of the insulating portion 122 are substantially the same as the outer shape and size of the first working portion 112, and the outer shape and size of the extending portion 124 are substantially the same as the outer shape and size of the first terminal portion 114. In this embodiment, since the first substrate 100 is rotated by 180 degrees with respect to the first mask when the insulating pattern 120 is formed, the first working portion 112 and the insulating portion 122 overlap, and the first terminal portion 114 and the extending portion 124 They are respectively located on opposite sides of the first working portion 112.

Referring to FIG. 1D, a second conductive pattern 130 is formed on the insulating pattern 120. The second conductive pattern 130 is electrically insulated from the first conductive pattern 110. In the embodiment, the second conductive pattern 130 includes a second working portion 132 and a second terminal portion 134 connected to the second working portion 132. The second working portion 132 overlaps the first working portion 112 and the insulating portion 122. The second working portion 132 is electrically insulated from the first conductive pattern 110 by the insulating portion 122. The second terminal portion 134 overlaps with the extending portion 124 of the insulating pattern 120 and does not overlap the first working portion 112 and the first terminal portion 114. Therefore, the second terminal portion 134 is electrically insulated from the first conductive pattern 110.

The second working portion 132 of the embodiment is used to simulate a pixel electrode of a Fringe Field Switching (FFS) liquid crystal display panel. In the present embodiment, the second working portion 132 has a plurality of slits S that expose the insulating portion 122 and are located on the first working portion 112. The second terminal portion 134 of the embodiment is configured to transmit the test signal to the second working portion 132. When the first signal portion 114 and the second terminal portion 134 are respectively input into the first working portion 112 and the second working portion 132, an electric field is formed between the first working portion 112 and the second working portion 132. The liquid crystal can be driven, so that the liquid crystal test cell of the embodiment has the effect of evaluating the liquid crystal.

In addition, it should be particularly noted that only one first conductive pattern 110, one insulating pattern 120 or one second conductive pattern 130 is exemplified in FIGS. 1A to 1E. However, the present invention does not particularly limit the number of the conductive patterns 110, the insulating patterns 120, and the second conductive patterns 130 formed on the first substrate 100. As shown in FIG. 2 and FIG. 3 , in other embodiments, the plurality of first conductive patterns 110 , the plurality of insulating patterns 120 , and the plurality of second conductive patterns 130 may also be formed at one time.

Referring to FIG. 1E, next, a second substrate 200 is provided. Then, the first substrate 100 and the second substrate 200 are assembled. Next, a liquid crystal layer (not shown) is filled between the first substrate 100 and the second substrate 200. In detail, in the embodiment, the first substrate 100 and the second substrate 200 may be assembled first, and then liquid crystal is injected between the first substrate 100 and the second substrate 200 by a vacuum implantation method. Floor. In this embodiment, a spacer may be sprinkled on the first substrate 100 or the second substrate 200 before the liquid crystal layer is filled before the first substrate 100 and the second substrate 200 are assembled. A spacer maintains a gap (ie, a cell gap) between the first substrate 100 and the second substrate 200. However, the present invention is not limited to the above description. In other embodiments, the liquid crystal layer may be dropped on the first substrate 100 or the second substrate 200, and then the first substrate 100 and the second substrate 200 (ie, One) may be assembled. Drop fill, ODF).

The method of manufacturing the liquid crystal test cell of the present embodiment may further include cutting the second substrate 200. The manner in which the second substrate 200 is cut includes cutter wheel cutting, or laser cutting. After the second substrate 200 is cut, the first terminal portion 114 and the second terminal portion 134 are directly exposed to the external environment, so that the user can easily apply the test signal to the first terminal portion 114 and the second terminal portion 134. And driving the liquid crystal layer in the liquid crystal test cell. Thus, the liquid crystal test cell 1000 of the present embodiment is completed.

In the manufacturing method of the liquid crystal test cell of the embodiment, the first conductive pattern and the insulating layer are respectively formed by the same mask, so that the manufacturing method of the liquid crystal test box of the embodiment can reduce the number of masks required. This saves the cost of evaluating the liquid crystal.

1E is a top view of a liquid crystal test cell according to a first embodiment of the present invention. Fig. 4 is a cross-sectional view showing the liquid crystal test cell corresponding to the line A-A' of Fig. 1E. Referring to FIG. 1E and FIG. 4 simultaneously, the liquid crystal test cell 1000 of the present embodiment includes a first substrate 100, a first conductive pattern 110, an insulating pattern 120, a second conductive pattern 130, and a second substrate opposite to the first substrate 100. 200 and a liquid crystal layer 300 between the first substrate 100 and the second substrate 200.

The first conductive pattern 110 of the embodiment is disposed on the first substrate 100. on. The first conductive pattern 110 of the embodiment includes a first working portion 112 and a first terminal portion 114 connected to the first working portion 112. In the present embodiment, the first working portion 112 is a complete conductive electrode and does not have a closed opening.

The insulating pattern 120 of the present embodiment is disposed on the first substrate 100 and overlaps with the first conductive pattern 110 and exposes a portion of the first conductive pattern 110, wherein the shape and size of the insulating pattern 120 and the shape and size of the first conductive pattern 110 Essentially the same. In detail, the insulating pattern 120 includes an insulating portion 122 and an extending portion 124 connected to the insulating portion 122. The outer shape and size of the first working portion 112 are substantially the same as the outer shape and size of the insulating portion 122. The shape and size of the first terminal portion 114 are substantially the same as the shape and size of the extension portion 124. The first working portion 112 and the insulating portion 122 are overlapped, and the first terminal portion 114 and the extending portion 124 are respectively located on opposite sides of the first working portion 112. In the embodiment, the first conductive pattern 110 is located between the first substrate 100 and the insulation pattern 120.

The second conductive pattern 130 of the embodiment is disposed on the first substrate 100 and electrically insulated from the first conductive pattern 110. The insulation pattern 120 is located between the first conductive pattern 110 and the second conductive pattern 130. The second conductive pattern 130 includes a second working portion 132 and a second terminal portion 134 connected to the second working portion 132. The second working portion 132 overlaps the first working portion 112 and the insulating portion 122. In the present embodiment, the second conductive pattern 130 has a plurality of slits S. The slit S exposes the insulating portion 122 and is located on the first working portion 112.

The second substrate 200 of this embodiment has at least two openings H1, H2. The openings H1 and H2 expose the first terminal portion 114 and the second terminal 134, respectively. The test signal can be input to the first working portion 112 and the second working portion 132 through the first terminal portion 114 and the second terminal 134 to drive the liquid crystal molecules in the liquid crystal layer 300, thereby allowing the user to measure the photoelectric characteristics of the liquid crystal molecules. For example, response time, voltage versus VT curve, and the like.

The liquid crystal test cell of the present embodiment can be used to evaluate the characteristics of liquid crystals, and the number of masks used in the fabrication process is small. Therefore, the liquid crystal test box 1000 of the present embodiment is low in manufacturing cost, and can effectively reduce the cost required for evaluating the liquid crystal.

Second embodiment

The manufacturing process of the liquid crystal test cell of this embodiment is almost the same as that of the liquid crystal test cell of the first embodiment. The difference between the two is only that the second conductive pattern 130B of the present embodiment is different from the second conductive pattern 130 of the first embodiment. Therefore, the manufacturing process of the liquid crystal test cell of the present embodiment will not be repeated. Only the structural difference between the liquid crystal test cell 1000B of the present embodiment and the liquid crystal test cell 100 of the first embodiment will be described below.

FIG. 5 is a top view of a liquid crystal test box according to a second embodiment of the present invention. Fig. 6 is a cross-sectional view showing the liquid crystal test cell corresponding to the line C-C' of Fig. 5. Referring to FIG. 5 and FIG. 6, the liquid crystal test cell 1000B of the present embodiment is similar to the liquid crystal test cell 1000 of the first embodiment. However, the second conductive pattern 130B of the present embodiment is slightly different from the second conductive pattern 130 of the first embodiment. Only the differences will be described below, and the similarities will not be repeated.

Referring to FIG. 5 and FIG. 6 simultaneously, the liquid crystal test cell 1000B of the present embodiment includes a first substrate 100, a first conductive pattern 110, an insulating pattern 120, a second conductive pattern 130B, and a second substrate opposite to the first substrate 100. 200 and a liquid crystal layer 300 between the first substrate 100 and the second substrate 200.

The first conductive pattern 110 of the embodiment is disposed on the first substrate 100. on. The first conductive pattern 110 of the embodiment includes a first working portion 112 and a first terminal portion 114 connected to the first working portion 112. In the present embodiment, the first working portion 112 is a complete conductive electrode and does not have a closed opening.

The insulating pattern 120 of the present embodiment is disposed on the first substrate 100 and overlaps with the first conductive pattern 110 and exposes a portion of the first conductive pattern 110, wherein the shape and size of the insulating pattern 120 and the shape and size of the first conductive pattern 110 Essentially the same. In detail, the insulating pattern 120 includes an insulating portion 122 and an extending portion 124 connected to the insulating portion 122. The outer shape and size of the first working portion 112 are substantially the same as the outer shape and size of the insulating portion 122. The shape and size of the first terminal portion 114 are substantially the same as the shape and size of the extension portion 124. The first working portion 112 and the insulating portion 122 are overlapped, and the first terminal portion 114 and the extending portion 124 are respectively located on opposite sides of the first working portion 112. In this embodiment, the first conductive pattern 110 is located on the first substrate 100. Between the insulation pattern 120 and the insulation pattern 120.

The second conductive pattern 130B of the embodiment is disposed on the first substrate 100 and electrically insulated from the first conductive pattern 110. The insulation pattern 120 is located between the first conductive pattern 110 and the second conductive pattern 130B. The second conductive pattern 130B includes a second working portion 132B and a second terminal portion 134B connected to the second working portion 132B. The second working portion 132B overlaps the first working portion 112 and the insulating portion 124. In the present embodiment, the second conductive pattern 130 has a plurality of slits S. The slit S exposes the insulating portion 122 and is located on the first working portion 112.

Different from the first embodiment, the second conductive pattern 130B of the embodiment can be divided into a plurality of test areas R connected to each other. At least two slits S are disposed in each of the test zones R, and the slit width of one of the test zones R is different from the width of the slits of the other test zone R. For example, the slit width W1 located in the test zone R1 is different from the slit width W2 located in the test zone R2. Further, in the present embodiment, the slit pitch at one of the test areas R is different from the pitch of the slits located at the other test area R. For example, the slit pitch P1 located in the test zone R1 is different from the slit pitch P2 located in the test zone R2.

When designing test zones of different sets of different experimental conditions (such as different slit widths, slit pitches or combinations thereof) in the same liquid crystal test box, the difference in cell gap between different experimental conditions can be reduced. The error, which in turn improves the accuracy of the data between different experimental conditions.

The liquid crystal test cell 1000B of the present embodiment and its manufacturing method have similar effects and advantages as those of the first embodiment, and will not be repeated here.

In summary, in the liquid crystal test cell of the present invention and the method of manufacturing the same, a conductive pattern and an insulating pattern are respectively fabricated using the same photomask. Therefore, the number of masks required for the liquid crystal test cell of the present invention and the method of manufacturing the same is small, and the cost required for evaluating the liquid crystal can be effectively reduced.

Although the present invention has been disclosed in the above embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art can make some modifications and refinements without departing from the spirit and scope of the invention. The scope of the invention is defined by the scope of the appended claims.

1000, 1000A, 1000B. . . LCD test box

100. . . First substrate

110. . . First conductive pattern

112. . . First work department

114. . . First terminal part

120. . . Insulation pattern

122. . . Insulation

124. . . Extension

130, 130B. . . Second conductive pattern

132, 132B. . . Second work department

134, 134B. . . Second terminal

200. . . Second substrate

300. . . Liquid crystal layer

H1, H2. . . Opening

S. . . Slit

R, R1, R2. . . Test area

W1, W2. . . Slit width

W1, W2. . . Slit width

P1, P2. . . Slit spacing

1A to 1E are schematic top views showing a manufacturing process of a liquid crystal test cell according to a first embodiment of the present invention.

2 and 3 illustrate the arrangement of the first conductive pattern, the insulating pattern 120, and the second conductive pattern on the first substrate in accordance with an embodiment of the present invention.

Fig. 4 is a cross-sectional view showing the liquid crystal test cell corresponding to the line A-A' of Fig. 1E.

FIG. 5 is a top view of a liquid crystal test box according to a second embodiment of the present invention.

Fig. 6 is a cross-sectional view showing the liquid crystal test cell corresponding to the line C-C' of Fig. 5.

100. . . First substrate

110. . . First conductive pattern

112. . . First work department

114. . . First terminal part

120. . . Insulation pattern

122. . . Insulation

124. . . Extension

Claims (15)

A method for manufacturing a liquid crystal test cell, comprising: providing a first substrate; forming a first conductive pattern on the first substrate by using a first mask as a mask; rotating the first substrate and the first mask One of the first masks is a mask, and an insulating pattern is formed on the first conductive pattern, the insulating pattern is overlapped with the first conductive pattern and a portion of the first conductive pattern is exposed; a second conductive pattern is formed on the pattern, the second conductive pattern is electrically insulated from the first conductive pattern; a second substrate is provided; the first substrate and the second substrate are assembled; and the first substrate and the first substrate are Filling a liquid crystal layer between the two substrates, wherein the first conductive pattern comprises a first working portion, the first working portion is a complete conductive electrode and has no closed opening, the insulating pattern comprises an insulating portion, and the second conductive portion The pattern has a plurality of slits that expose the insulating portion and are located on the first working portion. The method for manufacturing a liquid crystal test cell according to claim 1, wherein the rotating the first substrate and the first mask comprises: rotating the first substrate 180 with respect to the first mask degree. The method for manufacturing a liquid crystal test cell according to claim 1, wherein the outer shape and dimension of the insulating pattern are substantially the same as the outer shape and size of the first conductive pattern. The manufacturer of the liquid crystal test box as described in claim 3 of the patent application scope The first conductive pattern further includes a first terminal portion connected to the first working portion, the insulating pattern further comprising an extension portion connected to the insulating portion, the first working portion being shaped and dimensioned The shape and size of the insulating portion are substantially the same, and the shape and size of the first terminal portion are substantially the same as the shape and size of the extending portion, wherein the first working portion and the insulating portion are coincident, and the first terminal portion is The extensions are respectively located on opposite sides of the first working portion. The method for manufacturing a liquid crystal test cell according to claim 1, wherein the second conductive pattern is divided into a plurality of test areas connected to each other, and each of the test areas is provided with at least two slits located in the test areas. One of the slits has a different width than the slits located in the other test zone. The method for manufacturing a liquid crystal test cell according to claim 1, wherein the second conductive pattern is divided into a plurality of test areas connected to each other, and each of the test areas is provided with at least two slits located in the test areas. One of the slits has a pitch different from the pitch of the slits located in the other test zone. The method for manufacturing a liquid crystal test cell according to claim 4, further comprising cutting the second substrate. The method of manufacturing a liquid crystal test cell according to claim 7, wherein the second conductive pattern comprises a second working portion and a second terminal portion connected to the second working portion, the second working portion and The first working portion and the insulating portion overlap each other, and the first terminal portion and the second terminal portion are exposed after the second substrate is cut. A liquid crystal test box includes: a first substrate; a first conductive pattern disposed on the first substrate; an insulating pattern disposed on the first substrate and overlapping with the first conductive pattern and exposing a portion thereof The first conductive pattern, wherein the shape and size of the insulating pattern are substantially the same as the shape and size of the first conductive pattern; a second conductive pattern is disposed on the first substrate and electrically connected to the first conductive pattern Insulating, the insulating pattern is between the first conductive pattern and the second conductive pattern; a second substrate opposite the first substrate; and a liquid crystal layer between the first substrate and the second substrate Wherein the first working portion does not have a closed opening, and the second conductive pattern has a plurality of slits, the slits exposing the insulating portion and located on the first working portion. The liquid crystal test cartridge of claim 9, wherein the first conductive pattern is located between the first substrate and the insulating pattern. The liquid crystal test cell of claim 9, wherein the second conductive pattern is located between the second substrate and the insulating pattern. The liquid crystal test cartridge of claim 9, wherein the first conductive pattern further comprises a first terminal portion connected to the first working portion, the insulating pattern further comprising an extension portion connected to the insulating portion The shape and size of the first working portion are substantially the same as the shape and size of the insulating portion. The shape and size of the first terminal portion are substantially the same as the shape and size of the extending portion, wherein the first working portion and the first working portion are The insulating portions are overlapped, and the first terminal portion and the extending portion are respectively located at opposite sides of the first working portion side. The liquid crystal test cartridge of claim 9, wherein the second conductive pattern is divided into a plurality of test areas connected to each other, and each of the test areas is provided with at least two slits, one of the test areas. The width of the slits is different from the width of the slits located in the other test zone. The liquid crystal test cartridge of claim 9, wherein the second conductive pattern is divided into a plurality of test areas connected to each other, and each of the test areas is provided with at least two slits, one of the test areas. The pitch between the slits is different from the pitch of the slits located in the other test zone. The liquid crystal test cartridge of claim 12, wherein the second conductive pattern comprises a second working portion and a second terminal portion connected to the second working portion, the second working portion and the first The working portion and the insulating portion overlap, and the second substrate has at least two openings that expose the first terminal portion and the second terminal portion, respectively.