TWI448577B - - Google Patents
Info
- Publication number
- TWI448577B TWI448577B TW101119503A TW101119503A TWI448577B TW I448577 B TWI448577 B TW I448577B TW 101119503 A TW101119503 A TW 101119503A TW 101119503 A TW101119503 A TW 101119503A TW I448577 B TWI448577 B TW I448577B
- Authority
- TW
- Taiwan
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW101119503A TW201348500A (en) | 2012-05-31 | 2012-05-31 | Method of using chemical bonding to form compound epitaxial layer and epitaxial product |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW101119503A TW201348500A (en) | 2012-05-31 | 2012-05-31 | Method of using chemical bonding to form compound epitaxial layer and epitaxial product |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201348500A TW201348500A (en) | 2013-12-01 |
TWI448577B true TWI448577B (en) | 2014-08-11 |
Family
ID=50157268
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW101119503A TW201348500A (en) | 2012-05-31 | 2012-05-31 | Method of using chemical bonding to form compound epitaxial layer and epitaxial product |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW201348500A (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113707526A (en) * | 2020-05-20 | 2021-11-26 | 中微半导体设备(上海)股份有限公司 | Component, method for forming plasma-resistant coating and plasma reaction device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020015791A1 (en) * | 1999-03-17 | 2002-02-07 | Ryoki Tobe | Method and manufacturing device for manufacturing a titanium nitride thin film |
TWI295823B (en) * | 2004-12-09 | 2008-04-11 | Samsung Electronics Co Ltd | Method for forming a titanium nitride layer and method for forming a lower electrode of a mim capacitor using the titanium nitride layer |
-
2012
- 2012-05-31 TW TW101119503A patent/TW201348500A/en not_active IP Right Cessation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020015791A1 (en) * | 1999-03-17 | 2002-02-07 | Ryoki Tobe | Method and manufacturing device for manufacturing a titanium nitride thin film |
TWI295823B (en) * | 2004-12-09 | 2008-04-11 | Samsung Electronics Co Ltd | Method for forming a titanium nitride layer and method for forming a lower electrode of a mim capacitor using the titanium nitride layer |
Non-Patent Citations (1)
Title |
---|
民國99年7月,林雅雯,交通大學碩士論文"在具有氮化鈦緩衝層之(001)矽晶片上成長鑽石之研究" * |
Also Published As
Publication number | Publication date |
---|---|
TW201348500A (en) | 2013-12-01 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |