TWI443330B - Off-axis sheet-handling apparatus and technique for transmission-mode measurements - Google Patents

Off-axis sheet-handling apparatus and technique for transmission-mode measurements Download PDF

Info

Publication number
TWI443330B
TWI443330B TW99135660A TW99135660A TWI443330B TW I443330 B TWI443330 B TW I443330B TW 99135660 A TW99135660 A TW 99135660A TW 99135660 A TW99135660 A TW 99135660A TW I443330 B TWI443330 B TW I443330B
Authority
TW
Taiwan
Prior art keywords
sheet
axis
transparent sheet
image
width
Prior art date
Application number
TW99135660A
Other languages
Chinese (zh)
Other versions
TW201237397A (en
Inventor
Richard Sean Priestley
Eric Alfred Soehnlein
Original Assignee
Corning Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Corning Inc filed Critical Corning Inc
Priority to TW99135660A priority Critical patent/TWI443330B/en
Publication of TW201237397A publication Critical patent/TW201237397A/en
Application granted granted Critical
Publication of TWI443330B publication Critical patent/TWI443330B/en

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Description

用於傳送模量測之偏軸片狀物處理之裝置及技術Device and technology for processing off-axis sheet processing for modulus measurement

本發明係關於在檢驗過程中處理薄的片狀物之支撐結構以及方法,特別是作為透射模式量測過程中處理薄的透明片狀物。The present invention relates to a support structure and method for processing a thin sheet during inspection, particularly as a thin transparent sheet during transmission mode measurement.

近來由於液晶顯示(LCD)電視的普及度和接受度,很多關注集中在譬如玻璃片的透明基板缺陷偵測上。因此工業界目前面臨的挑戰是在運送符合嚴格的LCD穿透模式規格的基板時,滿足與日俱增的體積需求。此外,使用在LCD工業的透明片尺寸變得越來越大,而同時必須維持相同的厚度,甚至變得更薄。據此,挑戰便是安全地固定住大而薄的透明片,使其可進行檢查量測,一方面必須同時根據用來固定透明片的結構所引起的誤差,保持量測的準確度。Recently, due to the popularity and acceptance of liquid crystal display (LCD) televisions, much attention has been focused on the detection of transparent substrate defects such as glass sheets. Therefore, the industry's current challenge is to meet increasing volume requirements when delivering substrates that meet stringent LCD penetration mode specifications. In addition, the size of the transparent sheets used in the LCD industry has become larger and larger while maintaining the same thickness and even becoming thinner. Accordingly, the challenge is to securely hold the large, thin transparent sheet so that it can be inspected and measured. On the one hand, the accuracy of the measurement must be maintained according to the error caused by the structure used to fix the transparent sheet.

透射模式量測包括通過光線從一個平面穿過透明玻璃片到另一個平面,並且量測光線通過時如何改變。可使用透射模式量測來偵測處理過程引起的特徵,譬如透明玻璃片內的夾雜物、厚度變化、細繩、條紋,和應力。Transmission mode measurement involves passing light from one plane through the transparent glass sheet to another plane and measuring how the light changes as it passes. Transmission mode measurements can be used to detect features caused by the process, such as inclusions, thickness variations, strings, streaks, and stress in the transparent glass sheet.

舉應力量測為例,由於固定結構和片狀物的形狀的 交互作用可能引起應力,片狀物固定的方式會影響量測。假使玻璃是完全平坦的,當以固定結構固定在實質平面的結構時,其形狀並不會改變,因此固定結構不會影響應力量測。然而,透明片並不是完全平坦的,而是包括一些形狀的變化(雖然在顯示器工業中大部分的情況都很小),像是翹曲、彎曲、凸面,或凹面,不太可能每一片都相同。更者,在片狀物的不同區域包含各種不同程度的形狀變化。據此,當透明片在量測期間被固定結構平坦化時,玻璃片形狀會改變,在透射模式量測中產生誤差。例如,在名義上的靜止狀態,透明片包含會影響透過片狀物的光線透光性之應力分佈。當支撐結構中的玻璃片被平坦化時,應力分佈會改變以包含平坦化玻璃片時支撐結構引起的應力。因此,片狀物的量測精準度受影響。最好可以某種程度負責並移除支撐結構引起的不精確。然而,要區別什麼是支撐結構引起的應力,什麼是透明玻璃片內自然產生的應力是不容易的。Taking the stress measurement as an example, due to the shape of the fixed structure and the sheet Interaction can cause stress and the way the sheet is fixed can affect the measurement. If the glass is completely flat, its shape does not change when it is fixed in a substantially planar structure with a fixed structure, so the fixed structure does not affect the stress measurement. However, the transparent sheet is not completely flat, but includes some shape changes (although most of the situation in the display industry is small), such as warping, bending, convex, or concave, it is unlikely that each piece will be the same. Moreover, various degrees of shape changes are included in different regions of the sheet. According to this, when the transparent sheet is flattened by the fixing structure during measurement, the shape of the glass sheet changes, and an error occurs in the transmission mode measurement. For example, in a nominally stationary state, the transparent sheet contains a stress distribution that affects the light transmission through the sheet. When the glass sheet in the support structure is planarized, the stress distribution changes to include the stress caused by the support structure when the glass sheet is flattened. Therefore, the measurement accuracy of the sheet is affected. It is best to be responsible for some extent and to remove the inaccuracies caused by the support structure. However, to distinguish what is the stress caused by the support structure, what is naturally occurring stress in the transparent glass sheet is not easy.

根據上述,我們需要可以安全固定大且薄透明基板的檢查方法和裝置,可容易偵測出支撐結構引起的誤差,並以某種程度移除。According to the above, we need an inspection method and apparatus that can safely fix a large and thin transparent substrate, and can easily detect the error caused by the support structure and remove it to some extent.

本發明申請案說明進行片狀物透射模式量測的裝置和技術,譬如薄的透明玻璃片,可單獨取得各種特徵或和其他特徵的各式組合:安全地固定玻璃片以進行精確的量測;區別支撐結構引起的誤差和片狀物本身的特徵;快速進行整個片狀物的量測;以及量測各種大小的片狀物。The present application describes an apparatus and technique for measuring the transmission mode of a sheet, such as a thin transparent glass sheet, which can be individually obtained in various combinations of features or other features: securely securing the glass sheet for accurate measurement Distinguish between the error caused by the support structure and the characteristics of the sheet itself; rapid measurement of the entire sheet; and measurement of sheets of various sizes.

可安全地固定薄片狀物之裝置的特徵包括:相對於片狀物軸的支撐元件離軸方向;沿著傾斜於所量測片狀物的交叉軸和向下抽拉軸方向延伸的支撐結構條狀物或其他支撐物;耦合到支撐物的壓力(真空)來源,對片狀物起作用;和(或)大於片狀物的支撐物維度,雖然這不是必要的。由於支撐物以傾斜於片狀物主軸的方向延伸,支撐物跨過片狀物邊緣,使得只有沿著玻璃片邊緣很小的區段在任何時間內是未受支撐的,尤其是在處理過程引起的特徵量測期間。據此,可安全地固定玻璃片。Features of the device for securely securing the sheet include: an off-axis direction of the support member relative to the sheet axis; and a support structure extending along the intersecting axis and the downward draw axis of the measured sheet A strip or other support; a source of pressure (vacuum) coupled to the support, acting on the sheet; and/or a support dimension greater than the sheet, although this is not essential. Since the support extends in a direction oblique to the major axis of the sheet, the support spans the edge of the sheet so that only a small section along the edge of the sheet is unsupported at any time, especially during processing The resulting feature measurement period. According to this, the glass piece can be securely fixed.

可容易區別支撐物引起的誤差和處理過程引起的感興趣特徵的裝置特徵包括:一種支撐結構設置並安置以引起沿著一軸的量測誤差,該軸傾斜於處理過程引起的特徵在片狀物所沿著延伸的一軸;和(或)(影像裝置的)影像擷取單元的畫素沿著平行於片狀物並傾斜於支撐結構的軸方向。處理過程引起的特徵通常是以片狀物形成的方向延伸。在很多例子,這些特徵(譬如厚度變化、細索狀物、條紋、玻璃片內的不連續和夾雜物,和應力)以與透明片抽拉匹配的方向,亦即向下抽拉的方向,來表明自身的特徵。在其他例子,某些特徵以與透明片抽拉垂直的方向,亦即交叉於抽拉的方向,來表明自身的特徵。據此,定位支撐結構使得量測中所引起的誤差沿著傾斜於交叉抽拉或向下抽拉軸的軸延伸,有效區別所引起的誤差和所要量測的物件本身處理過程引起的特徵。Device features that can readily distinguish between errors caused by the support and features of interest caused by the process include: a support structure disposed and positioned to cause a measurement error along an axis that is oblique to the features caused by the process in the sheet The pixel along the extended axis; and/or the image capturing unit (of the imaging device) is parallel to the sheet and oblique to the axis of the support structure. The features caused by the process typically extend in the direction in which the sheets are formed. In many instances, these features (such as thickness variations, fines, streaks, discontinuities and inclusions in the glass sheet, and stress) are in a direction that matches the pull of the transparent sheet, ie, the direction in which it is pulled downward. To show the characteristics of itself. In other examples, certain features indicate their characteristics in a direction perpendicular to the drawing of the transparent sheet, that is, in a direction that is crossed. Accordingly, the positioning support structure causes the error caused in the measurement to extend along the axis inclined to the cross-pushing or downward drawing axis, effectively distinguishing the error caused and the characteristic caused by the processing of the object itself to be measured.

影響處理速度的裝置特徵包括:片狀物影像可以被 擷取的視野區尺寸大於所量測片狀物的對應尺寸,該大於的尺寸量大於或等於被阻塞或非影像可見區尺寸的量;影像可見區的大小大於非影像可見區的大小;支撐物和片狀物經由量測裝置的運送方向形成約25度到約65度的角度;和(或)支撐物的大小大於玻璃片的大小。據此,可影像化玻璃片,以阻塞或非影像可見區的尺寸索引化,再影像化。這使得整個玻璃片的測量很少會有兩個重疊的影像,影響處理上的速度。Device features that affect processing speed include: sheet images can be The size of the field of view captured is larger than the corresponding size of the measured sheet, and the larger the size is greater than or equal to the size of the blocked or non-image visible area; the size of the visible area of the image is larger than the size of the non-image visible area; The article and the sheet form an angle of from about 25 degrees to about 65 degrees via the transport direction of the measuring device; and/or the size of the support is greater than the size of the glass sheet. Accordingly, the imageable glass piece can be indexed by the size of the blocked or non-image visible area and then imaged. This makes the measurement of the entire glass sheet rarely have two overlapping images, affecting the speed of processing.

可無視於片狀物大小的裝置特徵包括支撐物沿著傾斜於片狀物主軸的方向延伸。據此,由於支撐物橫跨片狀物對角線延伸,因而不需以特定的片狀物大小間隔開,量測設備大多無視於所要量測的片狀物大小。以另一種方式來說以傾斜於片狀物主軸延伸的支撐物,即使支撐物的大小範圍從稍微小於片狀物區域到遠大於片狀物區域,支撐結構可穩定地固定玻璃片區域。Device features that may be contiguous with the size of the sheet include the support extending in a direction that is oblique to the major axis of the sheet. Accordingly, since the support extends across the diagonal of the sheet, it does not need to be spaced apart by a particular sheet size, and the measuring device mostly ignores the size of the sheet to be measured. In another way, with a support extending obliquely to the main axis of the sheet, the support structure can stably fix the glass sheet region even if the size of the support ranges from slightly smaller than the sheet region to much larger than the sheet region.

藉由非限制性範例,各種特徵能夠依據下列態樣加以組合:根據第一態樣,提供一種裝置以量測透明片狀物處理過程引起的特徵,該裝置包括:光源;影像裝置;和位於光源和影像裝置之間的透明片支撐結構,其中設置並安置支撐結構來支撐透明片,使得支撐結構引起的量測誤差被影像裝置看成沿著或平行於第一軸延伸,該第一軸 傾斜於第二軸,而當處理過程引起的特徵由影像裝置所見時,透明片中的處理過程引起的特徵沿著或平行於該第二軸延伸。By way of non-limiting example, various features can be combined in accordance with the following aspects: According to a first aspect, a device is provided for measuring features caused by a transparent sheet processing, the apparatus comprising: a light source; an imaging device; a transparent sheet support structure between the light source and the image device, wherein the support structure is disposed and disposed to support the transparent sheet such that the measurement error caused by the support structure is viewed by the image device as extending along or parallel to the first axis, the first axis Tilting to the second axis, and when the features caused by the process are seen by the imaging device, the features caused by the processing in the transparent sheet extend along or parallel to the second axis.

依據第2態樣,提供態樣1之任一裝置,其中處理過程引起之特徵包含應力。According to a second aspect, any of the devices of aspect 1, wherein the feature caused by the process comprises stress.

依據第3態樣,提供態樣1之裝置,其中支撐結構包含沿著傾斜於第二軸延伸之條狀物。According to a third aspect, the apparatus of aspect 1, wherein the support structure comprises a strip extending along the second axis.

依據第4態樣,提供態樣3之裝置,其中條狀物包含開口,以及支撐包含與開口連通的真空源。According to a fourth aspect, the apparatus of aspect 3 is provided wherein the strip comprises an opening and the support comprises a vacuum source in communication with the opening.

依據第5態樣,提供態樣3之裝置,其中間隔位於條狀物之間,其中條狀物包括第一寬度,以及間隔包括第二寬度,而且其中更進一步地第一寬度小於或等於第二寬度。According to a fifth aspect, the apparatus of aspect 3 is provided, wherein the spacing is between the strips, wherein the strip comprises a first width, and the spacing comprises a second width, and wherein the first width is further less than or equal to the first Two widths.

依據第6態樣,提供態樣1的裝置,其中影像裝置包括沿著第三軸定位的畫素,其中支撐結構包括影像裝置可見到光線從光源通過的間隔,間隔包括平行於第一軸的縱軸,而且其中更進一步第三軸傾斜於縱軸。According to a sixth aspect, the apparatus of aspect 1 is provided, wherein the image device comprises a pixel positioned along a third axis, wherein the support structure comprises an interval at which the image device sees light passing from the light source, the interval comprising parallel to the first axis The longitudinal axis, and further wherein the third axis is inclined to the longitudinal axis.

依據第7態樣,提供量測透明片處理過程引起特徵的方法,該方法包括:在光源和影像裝置之間的支撐結構上放置透明片;支撐該透明片使得支撐結構引起的量測誤差被影像裝置看成沿著或平行於第一軸延伸,該第一軸傾斜於第二軸,而當處理過程引起的特徵由影像裝置所見時,透明片中的處理過程引起的特徵沿著或平行於該第二軸延伸;擷取透明片第一區段的第一影像; 移動透明片並接著擷取透明片之第一區段的第二影像;結合第一和第二影像以形成透明片第一區段處理過程引起的特徵的影像。According to a seventh aspect, a method for measuring a feature caused by a transparent sheet processing process is provided, the method comprising: placing a transparent sheet on a support structure between the light source and the image device; supporting the transparent sheet such that a measurement error caused by the support structure is The imaging device is viewed as extending along or parallel to the first axis, the first axis being inclined to the second axis, and when the features caused by the process are seen by the imaging device, the features caused by the processing in the transparent sheet are along or parallel Extending on the second axis; capturing a first image of the first segment of the transparent sheet; Moving the transparent sheet and then capturing the second image of the first segment of the transparent sheet; combining the first and second images to form an image of the feature caused by the first segment processing of the transparent sheet.

依據第8態樣,提供態樣7的方法,其中第一和第二影像一起覆蓋透明片第一區段的整個區域。According to an eighth aspect, the method of aspect 7, wherein the first and second images together cover the entire area of the first section of the transparent sheet.

依據第9態樣,提供態樣8的方法,其中透明片之第一區段涵蓋透明片之整個區域。According to a ninth aspect, the method of aspect 8, wherein the first section of the transparent sheet covers the entire area of the transparent sheet.

依據第10態樣,提供態樣7-9任何一項的方法,進一步包含在移動步驟中透明片與運送裝置接觸,但是在擷取第一及第二影像步驟中透明片不與運送裝置接觸。According to a tenth aspect, the method of any of aspects 7-9, further comprising contacting the transparent sheet with the transport device during the moving step, but the transparent sheet is not in contact with the transport device during the step of capturing the first and second images .

依據第11態樣,提供態樣7-10任何一項的方法,進一步包含於擷取第一及第二影像步驟之前將透明片平坦化,且在擷取第一與第二影像步驟中維持透明片的平坦狀態。According to the eleventh aspect, the method of any of aspects 7-10, further comprising planarizing the transparent sheet before the first and second image capturing steps, and maintaining the first and second image capturing steps The flat state of the transparent sheet.

依據第12態樣,提供態樣11的方法,其中平坦化步驟包含將透明片抽成真空以抵抗支撐結構。According to a twelfth aspect, the method of aspect 11, wherein the planarizing step comprises evacuating the transparent sheet to resist the support structure.

依據第13態樣,提供態樣7的方法,其中結合步驟進一步包含去除由於支撐結構引起之量測誤差。According to a thirteenth aspect, the method of aspect 7, wherein the combining step further comprises removing a measurement error due to the support structure.

依據第14態樣,提供態樣7-13任何一態樣的方法,其中支撐結構包含沿著傾斜於第二軸延伸之條狀物,其中間隔位於條狀物之間,其中條狀物包括第一寬度且間隔包括第二寬度,且進一步第一寬度小於或等於第二寬度。According to a fourteenth aspect, there is provided a method of any aspect of aspect 7-13, wherein the support structure comprises a strip extending along the second axis, wherein the spacing is between the strips, wherein the strip comprises The first width and the interval include a second width, and further the first width is less than or equal to the second width.

依據第15態樣,提供態樣14的方法,其中影像裝 置能夠於具有第三寬度觀看區域內擷取影像,透明玻璃片包含第四寬度,以及其中第三寬度大於第四寬度之量值為大於或等於第一寬度。According to the fifteenth aspect, the method of the aspect 14 is provided, wherein the image is loaded The image is captured in a third width viewing area, the transparent glass sheet includes a fourth width, and wherein the third width is greater than the fourth width by a magnitude greater than or equal to the first width.

依據第16態樣特性,提供態樣15的方法,其中支撐結構包含第五寬度,以及第五寬度大於第四寬度之量值為大於或等於第一寬度。According to a sixth aspect feature, the method of aspect 15 is provided wherein the support structure comprises a fifth width and the fifth width is greater than the fourth width by a magnitude greater than or equal to the first width.

依據第17態樣,提供態樣14的方法,其中透明片以相對於支撐結構的運送方向移動,以及其中條狀物之軸與運送方向形成一個角度,該角度在25至65度範圍內。According to a seventeenth aspect, the method of aspect 14, wherein the transparent sheet is moved in a transport direction with respect to the support structure, and wherein the axis of the strip forms an angle with the transport direction, the angle being in the range of 25 to 65 degrees.

依據第18態樣,提供態樣7-17任何一態樣的方法,其中透明片以平行或垂直於第二軸之方向移動。According to an eighteenth aspect, there is provided a method of any aspect of aspect 7-17, wherein the transparent sheet moves in a direction parallel or perpendicular to the second axis.

依據第19態樣,提供態樣7-18任何一態樣的方法,其中影像裝置包含沿著第三軸延伸之畫素,以及進一步其中第三軸傾斜於第一軸。According to a nineteenth aspect, there is provided a method of any aspect of aspect 7-18, wherein the imaging device comprises a pixel extending along a third axis, and further wherein the third axis is oblique to the first axis.

依據第20態樣,提供態樣7-18任何一態樣的方法,其中處理過程引起之特徵包含應力。According to a twentieth aspect, there is provided a method of any aspect of aspect 7-18, wherein the feature caused by the process comprises stress.

本發明其他特徵及優點揭示於下列說明,且對所屬技術領域中具有通常知識者,可由說明書簡單了解部份發明,或藉由實施所述說明及附圖而明瞭。藉由前述的大致說明與下列的詳細說明可以了解本發明的實施例,並提供概述與架構以了解本發明所申請專利範圍中的性質與特點。Other features and advantages of the invention will be apparent from the description and appended claims. The embodiments of the present invention can be understood by the foregoing general description and the following detailed description of the invention.

所包含附圖進一步提供了解本發明之原理以及在此加入與構成說明書之一部份。圖式描述一個或多個實施例,以及隨同說明以實例之方式解釋本發明之原理及操作。人們 了解在說明書中以及附圖中所揭示本發明各種特徵能夠以任何以及全部組合方式加以使用。The accompanying drawings are provided to provide a further understanding of the principles of the invention, The drawings illustrate one or more embodiments, and, in the claims people It is understood that the various features of the invention disclosed in the description and the drawings can be used in any and all combinations.

2‧‧‧裝置2‧‧‧ device

10‧‧‧片狀物10‧‧‧Flakes

11‧‧‧區段11‧‧‧ Section

12‧‧‧區段Section 12.‧‧

13‧‧‧區段Section 13‧‧‧

14‧‧‧區段14‧‧‧ Section

16‧‧‧寬16‧‧ ‧ wide

18‧‧‧高18‧‧‧High

20‧‧‧邊緣20‧‧‧ edge

22‧‧‧軸22‧‧‧Axis

24‧‧‧軸24‧‧‧Axis

26‧‧‧厚度26‧‧‧ thickness

30‧‧‧支撐結構30‧‧‧Support structure

32‧‧‧高32‧‧‧High

34‧‧‧寬34‧‧ Wide

40‧‧‧條狀物40‧‧‧ strips

44‧‧‧寬44‧‧ ‧ wide

46‧‧‧軸46‧‧‧Axis

48‧‧‧開口48‧‧‧ openings

50‧‧‧間隔50‧‧‧ interval

52‧‧‧寬52‧‧ Wide

54‧‧‧軸54‧‧‧Axis

60‧‧‧充氣風管60‧‧‧Inflatable duct

62‧‧‧壓力/真空來源62‧‧‧ Pressure/vacuum source

64‧‧‧導管64‧‧‧ catheter

70‧‧‧運送裝置70‧‧‧Transportation device

72‧‧‧滾輪72‧‧‧Roller

74‧‧‧輸送帶74‧‧‧ conveyor belt

80‧‧‧影像裝置80‧‧‧Image installation

81‧‧‧影像擷取單元81‧‧‧Image capture unit

82‧‧‧光軸82‧‧‧ optical axis

83‧‧‧重疊83‧‧‧Overlapping

84‧‧‧畫素陣列84‧‧‧ pixel array

85‧‧‧軸85‧‧‧Axis

86‧‧‧軸86‧‧‧Axis

90‧‧‧觀察區90‧‧‧ observation area

92‧‧‧寬92‧‧ ‧ wide

94‧‧‧高94‧‧‧High

96‧‧‧阻塞區96‧‧‧blocking area

97‧‧‧寬97‧‧ wide

98‧‧‧影像區98‧‧‧Image area

99‧‧‧寬99‧‧ wide

100‧‧‧光源100‧‧‧Light source

圖1為依據本發明一項實施例量測裝置之等角投影示意圖。BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a schematic illustration of an isometric projection of a metrology apparatus in accordance with one embodiment of the present invention.

圖2為圖1量測裝置沿著線2-2展開之側面示意圖。Figure 2 is a side elevational view of the measuring device of Figure 1 taken along line 2-2.

圖3為可形成部份量測裝置之支撐結構以及運送裝置的示意圖。3 is a schematic view of a support structure and a transport device that can form a partial measuring device.

圖4為可形成部份量測裝置之影像擷取單元的畫素陣列示意圖,以及包含重疊在其上面支撐結構特徵之軸。4 is a schematic diagram of a pixel array of an image capture unit that can form a partial measurement device, and a shaft including features of the support structure superposed thereon.

圖5為相對於影像裝置觀看區域之透明片的示意圖。Figure 5 is a schematic illustration of a transparent sheet relative to the viewing area of the image device.

圖6為相對於影像裝置觀看區域之透明片的示意圖,其顯示出透明片之位置,其由圖5中位置加以標示。Figure 6 is a schematic illustration of a transparent sheet relative to the viewing area of the image device showing the position of the transparent sheet, which is indicated by the position in Figure 5.

在下列詳細說明中,為了說明用途且不作限制,揭示具體細節的實施例在於提供本發明之完全闡述。不過,受益於本發明揭露之所屬領域中具有通常知識者在不背離本發明所揭露之具體細節下,顯然可將本發明實施於其他實施例中。除此,為人所熟知的裝置,方法以及材料可省略避免模糊本發明之說明。除此,整個附圖中相同的參考數字代表相同的或類似的元件。In the following detailed description, for purposes of illustration and description However, it is apparent that the present invention may be embodied in other embodiments without departing from the specific details of the invention. In addition, well-known devices, methods, and materials may be omitted to avoid obscuring the description of the invention. Throughout the drawings, the same reference numerals are used throughout the drawings.

範圍能夠以「大約」為一個特定數值及(或)至「大約」另一特定值表示。當以該範圍表示時,另一項包含由一 個特定數值及(或)至另一特定數值。同樣地,當數值藉由前面加上「大約」表示為近似值,人們瞭解該特定值形成另外一項。人們更進一步瞭解每一範圍之每一端點值表示與另一端點相關以及與另一端點無關兩種意義。Ranges can be expressed as "about" as a specific value and/or as "about" another particular value. When expressed in the range, the other item consists of one A specific value and/or to another specific value. Similarly, when the value is expressed as an approximation by the addition of "about", it is understood that the specific value forms another. It is further understood that each endpoint value of each range is associated with another endpoint and is independent of the other endpoint.

除非另有清楚地表示,如本發明所使用,單數形式之冠詞「a」,「an」以及「the」亦包含複數之含意,。例如「元件」包含兩個或多個元件,除非另有清楚地顯示其他裝置。The singular articles "a", "an" and "the" are used in the s For example, "element" includes two or more elements unless otherwise clearly indicated.

對方向及(或)定位例如左,右,水平,垂直,寬度,高度所作說明係只相對所示之圖,並非表示絕對關係。The description of the direction and/or positioning such as left, right, horizontal, vertical, width, and height is only relative to the figure shown, and does not represent an absolute relationship.

在一項實施例中,提供的支撐結構可以使支撐結構引起的量測誤差很容易從透明片處理過程引起特徵的透射模式量測移除。處理過程引起的特徵可包括譬如厚度變化、細索狀物、條紋、片狀物內的不連續或夾雜物,和(或)應力。可設置並安置支撐結構,使得當其支撐透明玻璃片時,支撐結構引起的量測誤差被影像裝置看成沿著或平行於第一軸延伸,該第一軸傾斜於第二軸,而當處理過程引起的特徵由影像裝置所見時,透明片中的處理過程引起的特徵沿著或平行於該第二軸延伸。由於支撐結構引起的誤差是和處理過程引起的特徵沿著不同的軸,因此可以很容易區別出支撐結構引起的誤差,並從片狀物測量中移除。In one embodiment, the support structure is provided such that the measurement error caused by the support structure is easily removed from the transmission mode measurement of the feature caused by the transparent sheet processing. Features caused by the process may include, for example, thickness variations, fine cords, streaks, discontinuities or inclusions within the sheet, and/or stress. The support structure can be disposed and disposed such that when it supports the transparent glass sheet, the measurement error caused by the support structure is viewed by the image device as extending along or parallel to the first axis, the first axis being inclined to the second axis, and When the features caused by the process are seen by the imaging device, the features caused by the processing in the transparent sheet extend along or parallel to the second axis. Since the error caused by the support structure is along the different axes from the features caused by the process, the error caused by the support structure can be easily distinguished and removed from the sheet measurement.

圖1和2顯示裝置2的實施例,進行透明片10的透射模式量測,裝置2包括光源100,具有觀察區90的影像裝 置80,和用來固定透明片10以進行透射模式量測的支撐結構30。1 and 2 show an embodiment of the apparatus 2 for performing transmission mode measurement of the transparent sheet 10, the apparatus 2 comprising a light source 100, an image mount having an observation area 90 80, and a support structure 30 for fixing the transparent sheet 10 for transmission mode measurement.

透明片10包括寬16,高18,邊20,和軸22,24。軸24沿著片狀物10抽拉的方向延伸,也就是向下抽拉的方向。雖然嚴格來講,片狀物可能是切割自抽拉的帶狀物,但為了方便說明,片狀物可以被描述成是被抽拉的,但我們瞭解其實是帶狀物被抽拉,而片狀物是切割自帶狀物。例如,片狀物10可切割自帶狀物,例如,由向下抽拉、槽孔抽拉、向上抽拉、或浮式處理所產生。軸22沿著垂直於片狀物10被抽拉的方向延伸,也就是交叉於抽拉的方向。如圖1和2所示,軸22沿著片狀物10索引化的方向延伸,或最好經由裝置2移動。此外,如圖2所示,片狀物10包括厚度26。例如,透明片可以是玻璃,尤其是用在製造像是LCD平板顯示器,電場發射裝置,或電漿顯示器的玻璃。如圖1所示,片狀物10是在X-Y平面。The transparent sheet 10 includes a width 16, a height 18, a side 20, and a shaft 22, 24. The shaft 24 extends in the direction in which the sheet 10 is pulled, that is, the direction in which it is pulled downward. Although strictly speaking, the sheet may be a strip that is cut from the pull, for convenience of explanation, the sheet may be described as being pulled, but we understand that the strip is actually pulled, and The sheet is cut from the strip. For example, the flap 10 can be cut from the web, for example, by pulling down, slotting, pulling up, or floating. The shaft 22 extends in a direction perpendicular to the direction in which the sheet 10 is drawn, that is, in a direction of drawing. As shown in Figures 1 and 2, the shaft 22 extends in the direction indexed by the flap 10, or preferably via the device 2. Further, as shown in FIG. 2, the sheet 10 includes a thickness 26. For example, the transparent sheet can be glass, especially for making glass such as LCD flat panel displays, electric field emitting devices, or plasma displays. As shown in Fig. 1, the sheet 10 is in the X-Y plane.

處理過程引起的特徵(譬如夾雜物、厚度變化、細索狀物、條紋,和應力)證實其本身的方向和透明玻璃片抽拉,亦即沿著或大致平行軸24的方向類似。在其他例子中,一些處理過程引起的特徵證實其本身的方向是垂直於透明片抽拉的方向,亦即交叉於抽拉方向或沿著或大致平行軸22的方向。Features induced by the process, such as inclusions, thickness variations, fine cords, streaks, and stress, confirm their orientation and the transparent glass sheet drawing, i.e., along the direction of the substantially parallel axis 24. In other examples, the features caused by some of the processes confirm that the direction of itself is perpendicular to the direction in which the transparent sheets are drawn, i.e., intersecting the direction of the draw or the direction along or substantially parallel to the axis 22.

光源100(請見圖2)可以是任何適合進行透射模式量測的光源。例如,光源100可以是單色的光、雷射光、白熾燈、漫射光和/或視準光,也可包括肉眼可見或不可見範圍的任何適合波長。例如當進行應力量測時,光源可包括極化的 特定度數,不論是線性極化或環形極化。光源100的大小應該夠照明影像裝置80的觀察區90。Light source 100 (see Figure 2) can be any light source suitable for transmission mode measurement. For example, light source 100 can be monochromatic light, laser light, incandescent light, diffuse light, and/or collimated light, and can include any suitable wavelength in the visible or invisible range. For example, when performing stress measurement, the light source can include polarization A certain degree, whether linear or circular. Light source 100 should be sized to illuminate viewing area 90 of imaging device 80.

影像裝置80包括一起覆蓋觀察區90的影像擷取單元81。觀察區90包括可擷取影像的寬92和高94。雖然圖1中顯示的影像裝置80是包括四個影像擷取單元81,但也可使用任何適當個數的影像擷取單元81,包括只有一個以適應特定的觀察區90。例如,影像擷取單元81的個數可依據每個影像擷取單元81的影像擷取區域、所要檢查的玻璃片10大致的尺寸範圍,和所需的處理速度而定。影像擷取單元81可包括例如CCD或CMOS技術,可以是區域或線掃瞄型態的影像裝置,或PIN(Positive-Intrinsic-Negative)偵測器。每個影像擷取單元81有一個光軸82,光軸82相對於玻璃片10所在的X-Y平面以任何適合的角度延伸。顯示相鄰影像擷取單元81的影像擷取區域在83重疊,所以可將個別的影像接合在一起以取得整個玻璃片10的完整影像,而不需要任何重疊83。雖然顯示的影像擷取單元81是放在垂直的欄上,然而也可以任何適合的安排方式,例如水平或放成一列以定義觀察區90。The imaging device 80 includes an image capturing unit 81 that covers the viewing area 90 together. The viewing zone 90 includes a width 92 and a height 94 of the image that can be captured. Although the image device 80 shown in FIG. 1 includes four image capture units 81, any suitable number of image capture units 81 can be used, including only one to accommodate a particular viewing area 90. For example, the number of image capturing units 81 may depend on the image capturing area of each image capturing unit 81, the approximate size range of the glass sheet 10 to be inspected, and the required processing speed. The image capturing unit 81 may include, for example, CCD or CMOS technology, and may be an area or line scanning type image device or a PIN (Positive-Intrinsic-Negative) detector. Each image capture unit 81 has an optical axis 82 that extends at any suitable angle relative to the X-Y plane of the glass sheet 10. The image capturing areas of the adjacent image capturing unit 81 are displayed at 83, so that the individual images can be joined together to obtain a complete image of the entire glass sheet 10 without any overlap 83. Although the displayed image capture unit 81 is placed on a vertical column, the viewing area 90 can also be defined in any suitable arrangement, such as horizontally or in a row.

為了量測玻璃片10的應力,例如,影像擷取單元81可以是光應力量測感測器,可以提供量測平面內的應力和跨越某定義區的光學遲延。光源100可以和應力量測感測器對齊,產生環形極化和均勻的光線分佈,透射玻璃片10到感測器上,作為玻璃片10內應力分佈的分析。In order to measure the stress of the glass sheet 10, for example, the image capturing unit 81 may be a photo-stress measuring sensor that provides a measurement of the stress in the plane and an optical delay across a defined area. The light source 100 can be aligned with the stress measurement sensor to produce an annular polarization and a uniform light distribution that is transmitted through the glass sheet 10 to the sensor as an analysis of the stress distribution within the glass sheet 10.

支撐結構30安置在光源100和影像裝置80之間,在透射模式量測期間固定住玻璃片10。支撐結構30包括條狀 物40、間隔50,和壓力(真空)來源62。條狀物40互相以介於其間的間隔50隔開。The support structure 30 is disposed between the light source 100 and the image device 80 to hold the glass sheet 10 during transmission mode measurement. Support structure 30 includes strips 40, interval 50, and pressure (vacuum) source 62. The strips 40 are separated from each other by a space 50 therebetween.

現在參考圖3,以更詳細說明條狀物40和間隔50的特徵。然而應該要注意圖1和圖3之間,所顯示玻璃片10的寬16和高18和觀察區90的寬92和高94是成不同的比例。每個條狀物40包括平行於X-軸的寬44,和傾斜於X-軸(因而也傾斜於軸22)的縱軸46。明確地說,軸46和X軸形成一個角度θ。角度θ可以是任何適合的值,以使軸46傾斜於X-軸(因而也傾斜於軸22)。角度θ的值會影響影像裝置80看到的支撐結構引起誤差的方向。軸46越接近平行於軸22,支撐結構引起的誤差看起來就越像是平行於軸22延伸的處理過程引起的特徵,越難以分開兩者。類似地,軸46越接近平行於軸24,支撐結構引起的誤差看起來就越像是平行於軸24延伸的處理過程引起的特徵,也越難以分開兩者。例如,在一項實施例中,角度θ可以是25到65度,在另一實施例,角度θ可以是35到55度,又在另一實施例中,角度θ可以使條狀物實質上形成一或兩條對角線:i)影像擷取單元81的影像擷取區域,譬如正方形影像擷取區域的約45度;和ii)觀察區90,譬如正方形觀察區90的約45度。只要角度θ是在上述的範圍,當處理過程引起的特徵是沿著向下抽拉軸24或交叉於抽拉軸22形成,那麼裝置2就可以運作。也就是說,設備2無感於片狀物的定位是橫式(landscape)或縱式(portrait)。類似於條狀物40,每個間隔50包括平行於X-軸的寬52,和傾斜於X-軸(因而也傾斜於軸22)的縱軸54。Referring now to Figure 3, the features of strip 40 and spacing 50 are illustrated in greater detail. However, it should be noted that between Figures 1 and 3, the widths 16 and 18 of the glass sheet 10 and the widths 92 and 94 of the viewing zone 90 are shown in different ratios. Each strip 40 includes a width 44 that is parallel to the X-axis and a longitudinal axis 46 that is oblique to the X-axis (and thus also to the shaft 22). Specifically, the shaft 46 and the X axis form an angle θ. The angle θ can be any suitable value such that the shaft 46 is inclined to the X-axis (and thus also to the shaft 22). The value of the angle θ affects the direction in which the support structure seen by the image device 80 causes an error. The closer the shaft 46 is to the axis 22, the more the error caused by the support structure appears to be the feature caused by the process extending parallel to the axis 22, the more difficult it is to separate the two. Similarly, the closer the shaft 46 is to parallel to the axis 24, the more the error caused by the support structure appears to be the feature caused by the process extending parallel to the axis 24, and the more difficult it is to separate the two. For example, in one embodiment, the angle θ can be 25 to 65 degrees, and in another embodiment, the angle θ can be 35 to 55 degrees, and in another embodiment, the angle θ can make the strip substantially One or two diagonal lines are formed: i) an image capturing area of the image capturing unit 81, such as about 45 degrees of the square image capturing area; and ii) an observation area 90, such as about 45 degrees of the square viewing area 90. As long as the angle θ is in the above range, the device 2 can operate when the features caused by the process are formed along the downward draw shaft 24 or across the draw shaft 22. That is to say, the device 2 does not feel that the positioning of the sheet is a landscape or a portrait. Similar to the strip 40, each of the spaces 50 includes a width 52 that is parallel to the X-axis and a longitudinal axis 54 that is oblique to the X-axis (and thus also to the axis 22).

當使用條狀物40來固定住玻璃片10時,會影響到處理過程引起特徵的透射模式量測。不希望受制於條狀物如何影響處理過程引起特徵的任何特定理論,本發明提供以下的應用。條狀物40呈現用來固定住玻璃片10的平面表面,因而在固定時改變片狀物10的形狀。條狀物40可以是用來形成氣墊以支撐片狀物10的空氣條狀物,將片狀物10抽真空以抵擋條狀物40的真空條狀物,或是可施加壓力和真空的壓力(真空)條狀物。當條狀物40是壓力(真空)條狀物時,可同時施加壓力和真空以形成氣墊,或者是依序施加壓力和真空,利用壓力形成用來運輸的氣墊,並使用真空固定住玻璃片10以抵擋條狀物40。條狀物40包括開口48,在壓力和(或)真空下可通過如空氣的氣體,並以充氣風管60和導管64耦合到壓力(真空)來源62。每個條狀物40和其開口48耦合到壓力/真空來源62的特定方式並不是本發明的一部分,可包括任何已知的技術。在任何情況,藉由壓力和(或)真空的使用,條狀物40會在片狀物10上行使一股把持的力,此股把持的力會導致平面結構上的片狀物10改變片狀物的形狀,如以上所描述的。When the strip 40 is used to hold the glass sheet 10, it affects the transmission mode measurement of the features caused by the process. Without wishing to be bound by any particular theory of how the strip affects the characteristics of the process, the present invention provides the following applications. The strip 40 presents a planar surface for holding the glass sheet 10, thereby changing the shape of the sheet 10 when fixed. The strip 40 can be an air strip used to form an air cushion to support the sheet 10, a vacuum that pulls the sheet 10 against the strips of the strip 40, or a pressure that can apply pressure and vacuum. (vacuum) strips. When the strip 40 is a pressure (vacuum) strip, pressure and vacuum can be applied simultaneously to form an air cushion, or pressure and vacuum can be applied sequentially, pressure is used to form an air cushion for transport, and vacuum is used to hold the glass sheet. 10 to resist the strip 40. The strip 40 includes an opening 48 that can be coupled to a source of pressure (vacuum) 62 by a gas such as air under pressure and/or vacuum and with a gas duct 60 and conduit 64. The particular manner in which each strip 40 and its opening 48 are coupled to the pressure/vacuum source 62 is not part of the invention and may include any known technique. In any case, by the use of pressure and/or vacuum, the strip 40 will exert a holding force on the sheet 10, and the force of the strand will cause the sheet 10 on the planar structure to change. The shape of the object, as described above.

藉由改變片狀物10的形狀,條狀物40引起片狀物10內處理過程引起特徵的量測之誤差,該量測會由影像裝置80取像。由於條狀物40的縱軸46傾斜於片狀物10的軸22和24,影像中顯示出支撐結構引起的誤差傾斜於片狀物10內處理過程引起的特徵。同樣地,由於間隔50(光源100的光線通過其間到影像裝置80)的縱軸54傾斜於玻璃片的軸22和 24,由於重疊/接合,任何支撐結構引起的誤差會在影像中顯示成傾斜於片狀物10內的處理過程引起的特徵。據此,藉由一般的影像/資料處理技術,很容易移除支撐結構引起的誤差,因而給予處理過程引起的特徵更精準的描繪。By changing the shape of the sheet 10, the strip 40 causes an error in the measurement of the features caused by the processing within the sheet 10, which measurement is taken by the image device 80. Since the longitudinal axis 46 of the strip 40 is inclined to the axes 22 and 24 of the flap 10, the image shows the error caused by the support structure being inclined to the processing caused by the processing within the flap 10. Similarly, the longitudinal axis 54 of the spacing 50 (light passing through the source 100 to the imaging device 80) is inclined to the axis 22 of the glass sheet and 24. Due to the overlap/join, errors caused by any of the support structures may appear in the image as being characteristic of the process being tilted within the sheet 10. Accordingly, the error caused by the support structure can be easily removed by the general image/data processing technique, thereby giving a more accurate depiction of the features caused by the process.

除了以上所提及的,條狀物40縱軸46傾斜於軸22和24還有其他的優點。明確地說,這種安排使支撐結構30,尤其是寬44,52大大無關於片狀物10的寬16和高18。此外,這種安排在量測時可在接近片狀物10邊緣,提供適當的支撐。也就是說,假使包括條狀物40的支撐是平行於軸22或軸24,那麼在影像化時,整個片狀物10的縱向邊會變的沒有支撐,因而可能導致量測誤差。In addition to the above, there are other advantages to the longitudinal axis 46 of the strip 40 being inclined to the shafts 22 and 24. In particular, this arrangement makes the support structure 30, and in particular the width 44, 52, substantially independent of the width 16 and height 18 of the sheet 10. Moreover, this arrangement provides close support to the edge of the sheet 10 during measurement, providing proper support. That is, if the support including the strip 40 is parallel to the shaft 22 or the shaft 24, the longitudinal side of the entire sheet 10 becomes unsupported during imaging, which may result in measurement errors.

真空片狀物10到條狀物40還提供如下的優點。首先,在定義好的固定Z-軸位置提供片狀物10,亦即條狀物40所定義的平面。這種安排可使量測裝置2,尤其是影像裝置80容易設置。此外,或者,這種安排也可以減少取得影像時,玻璃片10內位置變化引起的量測誤差。更者,由於每個玻璃片是固定在已知的條件下,真空玻璃片10到條狀物40還可提供較容易的玻璃片對玻璃片的比較。第二,由於其存在於玻璃片10是平坦的面板元件或其他顯示器製造處理過程,以此種條件取得玻璃片10的影像可提供這些特徵測量的好處。The vacuum sheet 10 to strip 40 also provides the following advantages. First, the sheet 10, i.e., the plane defined by the strip 40, is provided at a defined fixed Z-axis position. This arrangement makes it easy to set up the measuring device 2, in particular the imaging device 80. In addition, or in addition, this arrangement can also reduce the measurement error caused by the positional change in the glass sheet 10 when the image is acquired. Moreover, since each of the glass sheets is fixed under known conditions, the vacuum glass sheets 10 to 40 can also provide an easier comparison of the glass sheets to the glass sheets. Second, because of the presence of the glass sheet 10 being a flat panel component or other display manufacturing process, obtaining images of the glass sheet 10 under such conditions provides the benefit of these feature measurements.

此外,片狀物10相對於水平線的定向可能影響影像裝置80所看到的支撐結構引起的誤差。如圖2所示,可在這種安排中提供條狀物40,以使片狀物10固定在X-Y平面。或者,也可相對於Z軸以任何適合的角度α放置條狀物40, 以固定片狀物10。也就是說,片狀物10可以固定在一垂直方向,例如α是如圖所示的90度(片狀物10在X-Y平面),或者以任何連續越來越小的角度α到零度,亦即在一水平的位置(片狀物10在X-Y平面)。然而,α最好是較小的值,因為當α增加到90度時,透明片10可能會因重力作用而下垂(根據間隔50的寬52,以及片狀物10的堅硬度而定)。Moreover, the orientation of the sheet 10 relative to the horizontal line may affect errors caused by the support structure seen by the image device 80. As shown in Figure 2, a strip 40 can be provided in this arrangement to secure the flap 10 in the X-Y plane. Alternatively, the strip 40 can also be placed at any suitable angle a with respect to the Z axis. To fix the sheet 10 . That is, the sheet 10 can be fixed in a vertical direction, for example, α is 90 degrees as shown (the sheet 10 is in the XY plane), or at any successively smaller and smaller angle α to zero, That is, at a horizontal position (the sheet 10 is in the XY plane). However, α is preferably a small value because when α is increased to 90 degrees, the transparent sheet 10 may sag due to gravity (depending on the width 52 of the interval 50 and the hardness of the sheet 10).

如圖3所示,支撐結構30也可包括運送裝置70。運送裝置70包括滾輪72和接觸片狀物10邊緣20的輸送帶74。輸送帶74可由滾輪72驅動以移動或標示通過量測裝置2的片狀物10以取得片狀物10的連續影像;一起接合連續的影像以形成完整片狀物的量測。運送裝置70可以此項技術中所需的任何適合機制,從圖3中實線所示的位置移動到虛線顯示的位置。據此,當取得片狀物10的影像時,運送裝置70可接觸,或從邊緣20移開。以某方面來看,運送裝置70在影像化期間可支撐片狀物邊緣20,當量測裝置2留在原位時可快速移動片狀物10。然而,以一方面來看,運送裝置70接觸邊緣20可能引起玻璃片10位置上的誤差,因而減低量測的精確度。因此,在影像化期間,最好將運送裝置70移到離開片狀物10的位置。雖然是顯示滾輪和輸送帶作為運送裝置70,但也可使用任何適合的裝置。例如,運送裝置70可包括夾爪、抽吸夾具,和(或)機器人手臂。As shown in FIG. 3, the support structure 30 can also include a transport device 70. The transport device 70 includes a roller 72 and a conveyor belt 74 that contacts the edge 20 of the flap 10. The conveyor belt 74 can be driven by the rollers 72 to move or mark the sheets 10 passing through the measuring device 2 to obtain a continuous image of the sheets 10; the continuous images are joined together to form a measurement of the complete sheets. The transport device 70 can be moved from the position shown in solid lines in Figure 3 to the position shown in dashed lines by any suitable mechanism required in the art. Accordingly, when the image of the sheet 10 is taken, the transport device 70 can be contacted or removed from the edge 20. In some respects, the transport device 70 can support the flap edge 20 during visualization, and the wafer 10 can be moved quickly when the equivalent device 2 is left in place. However, in one aspect, the contact of the transport device 70 with the edge 20 may cause errors in the position of the glass sheet 10, thereby reducing the accuracy of the measurement. Therefore, during the imaging, it is preferable to move the transport device 70 to a position away from the sheet 10. Although the display roller and the conveyor belt are used as the transport device 70, any suitable device can be used. For example, the transport device 70 can include a jaw, a suction clamp, and/or a robotic arm.

更進一步如圖3所示,支撐結構30和觀察區90的相對大小有助於減少進行完整片狀物量測的時間。事實上,以正確的比例中,完整片狀物的量測可能以儘量少的影像裝 置80兩個重疊影像進行。支撐結構30包括寬34和高32。同樣地,觀察區90包括寬92和高94,而片狀物10包括寬16和高18,每個條狀物40包括寬44。例如,當高94等於或大於片狀物高18;以及寬92大於片狀物寬16至少寬44時,兩個來自影像裝置80的影像足以取得完整片狀物的量測。如圖3所示,支撐結構高32和寬34等於或大於片狀物的寬16和高18,可能是促進較小型片狀物提高精確度和量測速度的情況,但不必要是。在以上的討論中應該要注意的是,寬44用來替代阻塞區96的寬97,亦即由於被條狀物40阻塞,觀察區90的區域不會被影像裝置80影像化。然而,這可能不是必要的情況。也就是說,根據光軸82相對於條狀物40所在平面的角度(依序是根據角度α)、條狀物40的厚度,以及條狀物40的邊緣輪廓,寬97可能大於寬44(同樣地,可影像區98的寬44可能小於間隔50的寬52)。然而,寬44提供了寬92必須超過寬16的最小量,以只有兩個影像來取得完整片狀物的量測。Still further, as shown in Figure 3, the relative size of the support structure 30 and the viewing zone 90 helps to reduce the time required to perform a complete sheet measurement. In fact, in the right proportions, the measurement of the complete sheet may be loaded with as few images as possible. Set 80 two overlapping images. Support structure 30 includes a width 34 and a height 32. Likewise, viewing zone 90 includes a width 92 and a height 94, while sheet 10 includes a width 16 and a height 18, and each strip 40 includes a width 44. For example, when the height 94 is equal to or greater than the sheet height 18; and the width 92 is greater than the sheet width 16 and at least the width 44, the two images from the image device 80 are sufficient to take measurements of the complete sheet. As shown in FIG. 3, the support structure height 32 and width 34 are equal to or greater than the width 16 and height 18 of the sheet, which may be the case for promoting the accuracy and measurement speed of the smaller sheet, but it is not necessary. It should be noted in the above discussion that the width 44 is used to replace the width 97 of the blocking zone 96, i.e., due to the blockage by the strip 40, the area of the viewing zone 90 is not imaged by the imaging device 80. However, this may not be necessary. That is, depending on the angle of the optical axis 82 relative to the plane of the strip 40 (in order, according to the angle a), the thickness of the strip 40, and the edge contour of the strip 40, the width 97 may be greater than the width 44 ( Likewise, the width 44 of the imageable area 98 may be less than the width 52 of the spacing 50). However, the width 44 provides a minimum amount of width 92 that must exceed a width of 16, with only two images to take measurements of the complete sheet.

將片狀物10放到量測裝置2的結構,尤其是支撐結構30,並沒有特別限制,可以是任何適合的結構,譬如底部輸送帶、頂上接觸機制、抽吸夾具、夾爪、機器人手臂,和/或流體軸承桿。The structure for placing the sheet 10 into the measuring device 2, in particular the supporting structure 30, is not particularly limited and may be any suitable structure, such as a bottom conveyor belt, an overhead contact mechanism, a suction jig, a jaw, a robot arm. , and / or fluid bearing rods.

圖4是影像擷取單元81畫素陣列一種可能排列的示意圖,包括疊加於畫素陣列上的軸46和54。如圖中所示,影像擷取單元81有二維的畫素陣列84,沿著軸85和86安排放置。影像擷取單元81相對於支撐結構30和玻璃片10定位, 使得軸85和86平行於片狀物的軸22和24(對應於X和Y軸),但傾斜於軸46和54。4 is a schematic illustration of one possible arrangement of pixel arrays of image capture unit 81, including axes 46 and 54 superimposed on a pixel array. As shown in the figure, image capture unit 81 has a two-dimensional array of pixels 84 arranged along axes 85 and 86. The image capturing unit 81 is positioned relative to the support structure 30 and the glass sheet 10, The shafts 85 and 86 are made parallel to the axes 22 and 24 of the sheet (corresponding to the X and Y axes) but inclined to the axes 46 and 54.

現在將陳述量測裝備2的操作。The operation of the measurement equipment 2 will now be stated.

請參考圖3說明的第一個方案,這裡片狀物的高18等於或小於觀察區的高94,片狀物的寬16小於觀察區的寬92至少條狀物40的寬44。在這種情況下,可只以兩個來自影像裝置80的影像來進行完整片狀物的量測,而且可以下列步驟來完成。將片狀物10載入到支撐結構30上,使得寬16是在虛線的位置。從圖3看到的,寬16(虛線位置)是在寬92內。片狀物10在這個位置時,影像裝置80可擷取玻璃片10的第一個影像,包括可影像區98(白色顯示的區域),但不包括鄰近條狀物40的阻塞區96(黑色顯示的區域)。接著,以一個阻塞區寬97的量標示片狀物10,使得寬16是在實線顯示的位置,仍然是在觀察區90的寬92之內。如我們從片狀物寬16的虛線和實線位置的比較所看到的,先前阻塞的區96現在可被影像化,同樣地,先前可影像區98接著被阻塞了。片狀物10在這個位置時(實線所示的寬度),影像裝置80擷取片狀物10的第二個影像。第一和第二個影像可利用此項技術已知的技術結合起來以形成完整片狀物的量測。如以上的顯示和說明,可藉由量測裝置2在負X的方向標示玻璃片10。或者,片狀物10可在正X的方向,從實線位置到虛線位置標示。在任何一種情況,片狀物10可藉由輸送裝置70索引化或移除。Referring to the first embodiment illustrated in Figure 3, the height 18 of the sheet is equal to or less than the height 94 of the viewing zone, and the width 16 of the sheet is less than the width 92 of the viewing zone and at least the width 44 of the strip 40. In this case, the measurement of the complete sheet can be performed with only two images from the image device 80, and can be accomplished in the following steps. The sheet 10 is loaded onto the support structure 30 such that the width 16 is at the position of the dashed line. As seen in Figure 3, the width 16 (the position of the dashed line) is within the width 92. When the sheet 10 is in this position, the image device 80 can capture the first image of the glass sheet 10, including the imageable area 98 (the area shown in white), but does not include the blocking area 96 adjacent the strip 40 (black) The area shown). Next, the sheet 10 is marked with an amount of blockage width 97 such that the width 16 is at the position shown by the solid line and is still within the width 92 of the observation area 90. As we can see from the comparison of the dashed line and the solid line position of the sheet width 16, the previously blocked region 96 can now be imaged, and as such, the previously imageable region 98 is then blocked. When the sheet 10 is in this position (the width shown by the solid line), the image device 80 captures the second image of the sheet 10. The first and second images can be combined using techniques known in the art to form a measurement of the complete sheet. As shown and described above, the glass sheet 10 can be indicated by the measuring device 2 in the direction of the negative X. Alternatively, the sheet 10 may be indicated in the direction of positive X from the solid line position to the dotted line position. In either case, the flap 10 can be indexed or removed by the delivery device 70.

參考圖5和6說明另一個方案,這裡片狀物的寬高 16大於觀察區90的寬92,而片狀物10的高18等於觀察區90的高94。這類似於圖1所示的情況,可使用類似以下針對圖5和6說明的處理過程,得到完整片狀物的量測;其區別是圖1中,觀察區90的高94大於片狀物10的高18,而圖5和6中,觀察區90的高94等於高18。觀察區90包括阻塞區96,每個具有寬97,和可影像區98,每個具有寬99。影像擷取單元81可在可影像區98得到片狀物10的影像,但不會得到阻塞區96上片狀物10的影像。配置支撐結構30(包括條狀物40、寬44、厚42,和角度α和θ)和影像裝置80(包括光軸82)以使寬99大於或等於寬97。寬99大於寬97可容易接合,影像會包含片狀物10的一些重疊區域。在圖5和6所示的例子中,需要取得超過兩個影像並接合在一起,以提供完整片狀物的量測,可以下列步驟來取得影像。Another scheme is illustrated with reference to Figures 5 and 6, where the width and width of the sheet 16 is greater than the width 92 of the viewing zone 90, while the height 18 of the flap 10 is equal to the height 94 of the viewing zone 90. This is similar to the situation shown in Figure 1, and a measurement similar to that described below with respect to Figures 5 and 6 can be used to obtain a measurement of the complete sheet; the difference is that in Figure 1, the height 94 of the viewing zone 90 is larger than the sheet. The height 18 of 10, while in Figures 5 and 6, the height 94 of the viewing zone 90 is equal to the height 18. The viewing zone 90 includes blocking zones 96, each having a width of 97, and an imageable zone 98, each having a width of 99. The image capturing unit 81 can obtain an image of the sheet 10 in the imageable area 98, but does not obtain an image of the sheet 10 on the blocking area 96. Support structure 30 (including strip 40, width 44, thickness 42, and angles a and θ) and image device 80 (including optical axis 82) are configured such that width 99 is greater than or equal to width 97. The width 99 is greater than the width 97 and can be easily joined, and the image will contain some overlapping areas of the sheet 10. In the example shown in Figures 5 and 6, more than two images need to be taken and joined together to provide a measurement of the complete flap, which can be taken in the following steps.

將片狀物10分割成彼此大約同樣寬的假想區段,每個的寬度大約是觀察區90寬92的一半;在這個例子,第一到第四區段11,12,13,和14。第一區段11放在觀察區90的右半,取得第一影像;第一影像包括來自可影像區98的資料,大約是區段11區域的一半。請見圖5。接著標示或移動片狀物10,使得區段11和12是在觀察區90內,區段11在左半部,區段12在右半部,以影像裝置80取得第二影像。請見圖6。在這個點上,區段11的整個區域已被影像化,每個第一和第二影像包括一半的資料,大約一半的區段12區域被影像化。然後再標示片狀物10,使得區段12和13是在觀察區90內,區段12在左半部,區段13在右半部,以影像裝 置80取得第三影像。在這個點上,區段12的整個區域已被影像化,每個第二和第三影像包括一半的資料,大約一半的區段13區域被影像化。繼續這一系列的影像化和標示過程,直到區段14是在觀察區90的左半部,取得第五影像。接著利用此項技術已知的技術將第一到第五影像接合在一起以得到處理引起的特徵的完整片狀物量測。假使某特定片狀物寬度不是寬92一半的偶數倍,片狀物可被分割成相等的半寬區段,餘數在片狀物寬16任一端點的一個或以上區段。The sheet 10 is divided into imaginary sections that are approximately the same width as each other, each having a width approximately half of the width 92 of the viewing area 90; in this example, the first to fourth sections 11, 12, 13, and 14. The first segment 11 is placed in the right half of the viewing zone 90 to obtain a first image; the first image includes data from the imageable region 98, which is approximately half of the segment 11 region. Please see Figure 5. The sheet 10 is then marked or moved such that the segments 11 and 12 are in the viewing zone 90, the segment 11 is in the left half, and the segment 12 is in the right half, with the image device 80 taking the second image. Please see Figure 6. At this point, the entire area of the segment 11 has been imaged, with each of the first and second images including half of the material and about half of the segment 12 area being imaged. The sheet 10 is then marked so that the segments 12 and 13 are in the viewing zone 90, the segment 12 is in the left half, and the segment 13 is in the right half. Set 80 to get the third image. At this point, the entire area of section 12 has been imaged, each of the second and third images includes half of the data, and about half of the section 13 is imaged. This series of visualization and labeling processes are continued until segment 14 is in the left half of viewing zone 90, and a fifth image is taken. The first through fifth images are then joined together using techniques known in the art to obtain a complete sheet measurement of the features caused by the processing. If the width of a particular sheet is not an even multiple of half the width of 92, the sheet can be divided into equal half-width segments, with the remainder being in one or more sections of either end of the sheet width 16.

藉由在支撐結構30的大小、觀察區90、片狀物10、可影像區98,和阻塞區96之間選擇適當的平衡,可最小化取得完整片狀物量測所需的時間。By selecting an appropriate balance between the size of the support structure 30, the viewing zone 90, the flap 10, the imageable zone 98, and the obstruction zone 96, the time required to obtain a complete flap measurement can be minimized.

例如,在大尺度下,相對於對應的片狀物10寬16和/或高18的觀察區寬92和(或)高94越大,那麼所需的重疊影像個數越少,因此處理的時間越短。For example, at a large scale, the width of the viewing area width 92 and/or the height 94 relative to the corresponding sheet 10 being 16 and/or 18 is greater, so the number of overlapping images required is less, so the processed The shorter the time.

以較詳細的水準,因為完整片狀物的視野可由儘可能少的影像構成,可影像區98的寬99大於阻塞區96的寬97可增進較短的處理時間。然而,假使寬99(寬52)變的太過大於寬97(寬44),那麼片狀物10可能就沒有適當的支撐,以進行準確的量測。也就是說,在這種情況下,支撐結構30不足以穩穩地固定薄片狀物,在連續/固定的平面進行量測。寬44和52(如以上所述,和光軸82的角度θ值建造X-Y平面和厚度42)會影響寬97,99。據此,為了方便說明起見,可交換使用寬44和96,而且也可交換使用寬52和99,只要瞭解這不一定要是嚴格的情況。At a more detailed level, because the field of view of the complete sheet can be composed of as few images as possible, the width 99 of the imageable region 98 is greater than the width 97 of the blocked region 96 to enhance shorter processing times. However, if the width 99 (width 52) becomes too much greater than the width 97 (width 44), the sheet 10 may not be properly supported for accurate measurement. That is to say, in this case, the support structure 30 is insufficient to stably fix the sheet and measure in a continuous/fixed plane. Widths 44 and 52 (as described above, and the angle θ of the optical axis 82 builds the X-Y plane and thickness 42) affect the width 97,99. Accordingly, for convenience of explanation, the widths 44 and 96 can be exchanged, and the widths 52 and 99 can be exchanged as long as it is not necessarily a strict case.

換句話說,相對的寬44和52會影響支撐的/阻塞區96和未支撐的/可影像區98的比例中,因此也影響片狀物需要影像化的次數,以提供完整片狀物量測。為了方便將影像接合在一起,以提供玻璃片狀物量測,最好在要接合的影像之間有一些重疊處。此外,最好只以兩個影像來影像化片狀物完整的區段以加速處理時間。據此,最好寬44小於或等於寬52(同樣地,寬97小於或等於寬99)。雖然所有的寬44都顯示成一樣的,但不一定是必要的。同樣地,雖然所有的寬52都顯示成一樣的,但不一定是必要的;雖然所有的寬97都顯示成一樣的,但不一定是必要的;以及雖然所有的寬99都顯示成一樣的,但不一定是必要的。In other words, the relative widths 44 and 52 affect the ratio of the supported/obstructed area 96 to the unsupported/imageable area 98, thus also affecting the number of times the sheet needs to be imaged to provide a full sheet amount. Measurement. In order to facilitate the joining of the images together to provide a measurement of the glass sheets, it is preferred to have some overlap between the images to be joined. In addition, it is preferable to image the complete section of the sheet with only two images to speed up processing time. Accordingly, it is preferred that the width 44 is less than or equal to the width 52 (again, the width 97 is less than or equal to the width 99). Although all widths 44 are shown to be the same, they are not necessarily necessary. Similarly, although all widths 52 are shown to be the same, they are not necessarily necessary; although all widths 97 are shown to be the same, they are not necessarily necessary; and although all widths 99 are shown to be the same But not necessarily necessary.

在此強調以上所述本發明之實施例(特別是任何”偏好”的實施例)僅僅是實施例中可能的實例,僅用來說明本發明的原理。在實質上不背離本發明之精神與原理下,可就以上所述發明之實施例做諸多變化與修改。全部這些修改與變化以用來包含在本發明揭示之範圍內,並由下述專利申請範圍保護。It is emphasized herein that the embodiments of the invention described above, particularly any of the "preferential" embodiments, are merely possible examples of the embodiments, and are merely illustrative of the principles of the invention. Many changes and modifications may be made to the embodiments of the invention described above without departing from the spirit and scope of the invention. All such modifications and variations are intended to be included within the scope of the present disclosure and are protected by the scope of the following patent application.

例如,即使支撐30只圖示在透明片10之一側(如圖2),但支撐30是設置在該片狀物10的兩側。For example, even if the support 30 is illustrated on one side of the transparent sheet 10 (as shown in FIG. 2), the support 30 is disposed on both sides of the sheet 10.

2‧‧‧裝置2‧‧‧ device

10‧‧‧片狀物10‧‧‧Flakes

16‧‧‧寬16‧‧ ‧ wide

18‧‧‧高18‧‧‧High

20‧‧‧邊緣20‧‧‧ edge

22‧‧‧軸22‧‧‧Axis

24‧‧‧軸24‧‧‧Axis

26‧‧‧厚度26‧‧‧ thickness

30‧‧‧支撐結構30‧‧‧Support structure

40‧‧‧條狀物40‧‧‧ strips

50‧‧‧間隔50‧‧‧ interval

60‧‧‧充氣風管60‧‧‧Inflatable duct

62‧‧‧壓力/真空來源62‧‧‧ Pressure/vacuum source

64‧‧‧導管64‧‧‧ catheter

80‧‧‧影像裝置80‧‧‧Image installation

81‧‧‧影像擷取單元81‧‧‧Image capture unit

82‧‧‧光軸82‧‧‧ optical axis

90‧‧‧觀察區90‧‧‧ observation area

92‧‧‧寬92‧‧ ‧ wide

94‧‧‧高94‧‧‧High

96‧‧‧阻塞區96‧‧‧blocking area

Claims (7)

一種用於量測一透明片處理過程引起的特徵之裝置,該裝置包括:一光源;一影像裝置;及一透明片支撐結構,該透明片支撐結構配置於該光源和該影像裝置之間,其中該支撐結構被設置並安置來支撐一透明片,使得該支撐結構引起的量測誤差被該影像裝置看成沿著或平行於一第一軸延伸,該第一軸傾斜於一第二軸,當該處理過程引起的特徵由該影像裝置所見時,該透明片中的該處理過程引起的特徵沿著或平行於該第二軸延伸。 A device for measuring a feature caused by a transparent film processing process, the device comprising: a light source; an image device; and a transparent sheet supporting structure disposed between the light source and the image device Wherein the support structure is disposed and disposed to support a transparent sheet such that a measurement error caused by the support structure is viewed by the imaging device as extending along or parallel to a first axis, the first axis being inclined to a second axis The features caused by the processing in the transparent sheet extend along or parallel to the second axis when the features caused by the processing are as seen by the imaging device. 如請求項第1項之裝置,其中該支撐結構包含沿著傾斜於該第二軸的複數個軸延伸之條狀物。 The device of claim 1, wherein the support structure comprises a strip extending along a plurality of axes that are oblique to the second axis. 一種量測一透明片處理過程引起的特徵之方法,所述方法包括如下步驟:在一光源和一影像裝置之間的一支撐結構上設置一透明片;支撐該透明片,使得該支撐結構引起的量測誤差被該影像裝置看成沿著或平行於第一軸延伸,該第一軸傾斜一第二軸,而當該處理過程引起的特徵由該影像裝置所見時,該透明片中的該處理過程引起的特徵沿著或平行於該第二軸延伸;擷取該透明片的一第一區段的一第一影像; 移動該透明片並接著擷取一該透明片的第一區段的一第二影像;及結合該第一和第二影像以形成該透明片的該第一區段中的該處理過程引起特徵的一影像。 A method for measuring a feature caused by a transparent sheet processing process, the method comprising the steps of: providing a transparent sheet on a support structure between a light source and an image device; supporting the transparent sheet to cause the support structure to cause The measurement error is viewed by the imaging device as extending along or parallel to the first axis, the first axis being tilted by a second axis, and when the feature caused by the processing is seen by the imaging device, the transparent sheet The feature caused by the process extends along or parallel to the second axis; capturing a first image of a first segment of the transparent sheet; Moving the transparent sheet and then capturing a second image of the first segment of the transparent sheet; and combining the first and second images to form the first segment of the transparent sheet to cause a feature in the processing An image of one. 如請求項第3項所述之方法,進一步包括在該移動步驟中,該透明片與一運送裝置接觸,但是在擷取該第一及第二影像的該步驟中,該透明片不與運送裝置接觸。 The method of claim 3, further comprising: in the moving step, the transparent sheet is in contact with a transport device, but in the step of capturing the first and second images, the transparent sheet is not transported Device contact. 如請求項第3項所述之方法,進一步包括在擷取該第一及第二影像的該步驟之前將該透明片平坦化,並在擷取該第一及第二影像的該步驟時維持該透明片的平坦狀態。 The method of claim 3, further comprising planarizing the transparent sheet prior to the step of capturing the first and second images, and maintaining the step of capturing the first and second images The flat state of the transparent sheet. 如請求項第3項所述之方法,其中該透明片以平行或垂直於該第二軸的一方向移動。 The method of claim 3, wherein the transparent sheet moves in a direction parallel or perpendicular to the second axis. 如請求項第3項所述之方法,其中該處理過程引起之特徵包含應力。 The method of claim 3, wherein the feature caused by the process comprises stress.
TW99135660A 2011-03-09 2011-03-09 Off-axis sheet-handling apparatus and technique for transmission-mode measurements TWI443330B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW99135660A TWI443330B (en) 2011-03-09 2011-03-09 Off-axis sheet-handling apparatus and technique for transmission-mode measurements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99135660A TWI443330B (en) 2011-03-09 2011-03-09 Off-axis sheet-handling apparatus and technique for transmission-mode measurements

Publications (2)

Publication Number Publication Date
TW201237397A TW201237397A (en) 2012-09-16
TWI443330B true TWI443330B (en) 2014-07-01

Family

ID=47223116

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99135660A TWI443330B (en) 2011-03-09 2011-03-09 Off-axis sheet-handling apparatus and technique for transmission-mode measurements

Country Status (1)

Country Link
TW (1) TWI443330B (en)

Also Published As

Publication number Publication date
TW201237397A (en) 2012-09-16

Similar Documents

Publication Publication Date Title
JP4157037B2 (en) Defect inspection equipment
CN100339700C (en) Method and device for investigating polarization film
JP5089958B2 (en) Inspection device and inspection method for tape products
JP2009014617A (en) Substrate visual inspection apparatus
JP2006266722A (en) System and method for inspecting substrate
JP2012094770A (en) Inspection device and substrate positioning method
TW201640089A (en) Edge strength testing methods and apparatuses
JP2003344301A (en) Method and equipment for inspecting polarization film
KR101613738B1 (en) Off-axis sheet-handling apparatus and technique for transmission-mode measurements
KR100975645B1 (en) Appartus for inspecting substrate and method using the same
TWI443330B (en) Off-axis sheet-handling apparatus and technique for transmission-mode measurements
JP2016061778A (en) Ceramic member and defect inspection system
WO2020231681A1 (en) System and method for edge strength testing with real-time stress visualization in ultra-thin glass panels
JP2008076079A (en) Substrate inspection device
JP2004238133A (en) Thin plate gripping device, thin plate conveying device, and thin plate inspecting device
JP2010156685A (en) Array testing device and method of measuring substrate one location position of the array testing device
KR20160066741A (en) apparatus for examining edge of flat panel display panel and method of using the same
TW201140041A (en) Apparatus for inspecting substrate and method using the same
JP6330284B2 (en) Deposition mask inspection method and deposition mask inspection jig
KR20130013286A (en) Testing apparatus of flexibe printed circuit board
JP5556349B2 (en) Defect inspection apparatus for transparent substrate and defect inspection method for transparent substrate
JP5618209B2 (en) Glass plate end face imaging device and imaging method thereof
JP2013011522A (en) Inspection method and inspection device for glass substrate
KR20080081574A (en) The sheet inspection machine
KR102147128B1 (en) Apparatus for inspecting substrate

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees