TWI439658B - Vision measuring device and assistant focusing apparatus thereof - Google Patents
Vision measuring device and assistant focusing apparatus thereof Download PDFInfo
- Publication number
- TWI439658B TWI439658B TW98109813A TW98109813A TWI439658B TW I439658 B TWI439658 B TW I439658B TW 98109813 A TW98109813 A TW 98109813A TW 98109813 A TW98109813 A TW 98109813A TW I439658 B TWI439658 B TW I439658B
- Authority
- TW
- Taiwan
- Prior art keywords
- pattern
- light source
- workpiece
- tested
- lens
- Prior art date
Links
Landscapes
- Eye Examination Apparatus (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Automatic Focus Adjustment (AREA)
Description
本發明涉及一種影像測量儀及其輔助對焦裝置。 The invention relates to an image measuring instrument and an auxiliary focusing device thereof.
影像測量儀是一種非接觸式三維測量設備,具有柔性好、快速高效之優點,其包括一圖像擷取裝置及一光學裝置,該光學裝置用於對被測工件進行光學成像,該圖像攫取裝置用來感應被測工件之影像。然,當該被測工件表面之光滑度非常高時,如一光滑之玻璃片,該光學裝置將很難對該被測工件進行光學成像,此時則無法對該被測工件進行測量。 The image measuring instrument is a non-contact three-dimensional measuring device, which has the advantages of good flexibility, fast and high efficiency, and includes an image capturing device and an optical device for optically imaging the workpiece to be tested. The capture device is used to sense the image of the workpiece being tested. However, when the smoothness of the surface of the workpiece to be tested is very high, such as a smooth glass sheet, the optical device will be difficult to optically image the workpiece to be tested, and the workpiece to be measured cannot be measured at this time.
鑒於以上內容,有必要提供一種影像測量儀,其可對表面光滑度高之被測工件進行對焦。還有必要提供一種輔助對焦裝置。 In view of the above, it is necessary to provide an image measuring instrument that can focus on a workpiece to be measured having a high surface smoothness. It is also necessary to provide an auxiliary focusing device.
一種影像測量儀,包括一光學裝置、一輔助對焦裝置、一影像攫取裝置及一光源,該光源用於照射一待測工件,該光學裝置包括一第一及一第二透鏡,用於對該待測工件進行光學成像,該影像攫取裝置用於感應該待測工件之像並將其轉換為電訊號以傳輸給一電腦系統進行處理,該輔助對焦裝置包括依次設置之一圖案光源及一其上具有圖案之圖案片,該光學裝置還於該第一及第二透鏡之間設置一與該第二透鏡不平行之半透半反射鏡,使得該圖案 光源所發射之光線依次透過該圖案片、半透半反射鏡及第二透鏡投射至該待測工件之表面,以在該待測工件之表面形成該圖案片上的圖案。 An image measuring instrument includes an optical device, an auxiliary focusing device, an image capturing device and a light source for illuminating a workpiece to be tested, the optical device comprising a first and a second lens for The workpiece to be tested is optically imaged, and the image capturing device is configured to sense an image of the workpiece to be tested and convert it into an electrical signal for transmission to a computer system for processing. The auxiliary focusing device includes sequentially setting a pattern light source and a plurality thereof a patterned pattern sheet, the optical device further disposed between the first and second lenses, a half mirror that is not parallel to the second lens, such that the pattern The light emitted by the light source is sequentially projected through the pattern sheet, the half mirror and the second lens onto the surface of the workpiece to be tested to form a pattern on the pattern sheet on the surface of the workpiece to be tested.
一種輔助對焦裝置,包括依次設置之一圖案光源及一其上具有圖案之圖案片,該圖案光源所發射之光線透過該圖案片投射於一待測工件之表面,以在該待測工件之表面形成該圖案片上的圖案。 An auxiliary focusing device includes a pattern light source and a pattern sheet having a pattern thereon, wherein light emitted by the pattern light source is projected through a pattern sheet onto a surface of a workpiece to be tested to be on a surface of the workpiece to be tested A pattern on the pattern sheet is formed.
前述影像測量儀包括該輔助對焦裝置,若該待測工件表面之光滑度較高,則利用該輔助對焦裝置將圖案片上的圖案投射到該待測工件之表面,以快速方便的對焦。 The image measuring instrument includes the auxiliary focusing device. If the surface of the workpiece to be tested has a high smoothness, the auxiliary focusing device is used to project the pattern on the pattern sheet onto the surface of the workpiece to be tested for quick and convenient focusing.
1‧‧‧影像測量儀 1‧‧‧Image measuring instrument
2‧‧‧工作臺 2‧‧‧Workbench
3‧‧‧龍門架 3‧‧‧ gantry
4‧‧‧頂罩 4‧‧‧ top cover
5‧‧‧光學裝置 5‧‧‧Optical device
50‧‧‧長筒形殼體 50‧‧‧Long cylindrical shell
51‧‧‧第一透鏡 51‧‧‧ first lens
52‧‧‧第二透鏡 52‧‧‧second lens
53‧‧‧半透半反射鏡 53‧‧‧Transflective mirror
6‧‧‧輔助對焦裝置 6‧‧‧Auxiliary focusing device
60‧‧‧殼體 60‧‧‧shell
61‧‧‧圖案光源 61‧‧‧pattern light source
62‧‧‧圖案片 62‧‧‧pattern film
63‧‧‧同軸光源 63‧‧‧ coaxial light source
64‧‧‧倍率放大器 64‧‧‧ rate amplifier
641‧‧‧第三透鏡 641‧‧‧ third lens
642‧‧‧第四透鏡 642‧‧‧4th lens
7‧‧‧影像攫取裝置 7‧‧‧Image capture device
8‧‧‧環形光源 8‧‧‧Circular light source
9‧‧‧待測工件 9‧‧‧Workpiece to be tested
圖1係本發明影像測量儀之較佳實施方式之立體圖。 1 is a perspective view of a preferred embodiment of the image measuring instrument of the present invention.
圖2係圖1中輔助對焦裝置之較佳實施方式之立體圖。 2 is a perspective view of a preferred embodiment of the auxiliary focusing device of FIG. 1.
圖3係圖2之剖面圖。 Figure 3 is a cross-sectional view of Figure 2.
圖4係圖1中圖案片之示意圖。 Figure 4 is a schematic view of the pattern sheet of Figure 1.
圖5係圖1中該光學裝置、輔助對焦裝置及影像攫取裝置之示意圖。 FIG. 5 is a schematic diagram of the optical device, the auxiliary focusing device, and the image capturing device of FIG. 1.
請一併參閱圖1至圖5,本發明影像測量儀1之較佳實施方式包括一與水平面平行之工作臺2、一跨設於該工作臺2之龍門架3、一固設于該龍門架3中部之頂罩4、一光學裝置5、一輔助對焦裝置6、一影像攫取裝置7及一光源,如一環形光源8。該影像測量儀1還設有一X軸傳動系統、一Y軸傳動系統及一Z軸傳動系統(圖未示)。該X軸傳動系統用以驅動該頂罩4沿如圖1所示之機械坐標 系之X軸移動,該Y軸傳動系統用以驅動該工作臺2沿該機械坐標系之Y軸移動。該X軸及Y軸分別平行於該工作臺2。該Z軸傳動系統用以驅動該光學裝置5、輔助對焦裝置6、影像擷取裝置7及環形光源8沿該機械座標之Z軸移動,用以使該光學裝置對一位於該工作臺2上之待測工件9對焦。 Referring to FIG. 1 to FIG. 5, a preferred embodiment of the image measuring apparatus 1 of the present invention comprises a worktable 2 parallel to a horizontal plane, a gantry 3 spanning the workbench 2, and a gantry fixed to the gantry. The top cover 4 of the middle portion of the rack 3, an optical device 5, an auxiliary focusing device 6, an image capturing device 7, and a light source, such as an annular light source 8. The image measuring instrument 1 is further provided with an X-axis transmission system, a Y-axis transmission system and a Z-axis transmission system (not shown). The X-axis transmission system is used to drive the top cover 4 along the machine coordinates as shown in FIG. The X-axis movement of the system is used to drive the table 2 to move along the Y-axis of the machine coordinate system. The X axis and the Y axis are parallel to the table 2, respectively. The Z-axis transmission system is configured to drive the optical device 5, the auxiliary focusing device 6, the image capturing device 7, and the ring light source 8 to move along the Z axis of the mechanical coordinate, so that the optical device is located on the working table 2 The workpiece to be tested 9 is in focus.
該光學裝置5設置於該影像攫取裝置7及環形光源8之間。該環形光源8用於照射該待測工件9,該光學裝置5用於對該待測工件9進行光學成像,該影像攫取裝置7用於攫取由該光學裝置5所形成之待測工件9之圖像。該影像攫取裝置7還與一監視設置,如一電腦系統(圖未示)相連用以顯示該影像擷取裝置7所擷取之圖像。該影像擷取裝置7可是一CCD(Charge Coupled Device,電荷耦合器件)攝像頭。 The optical device 5 is disposed between the image capturing device 7 and the annular light source 8. The annular light source 8 is used for illuminating the workpiece 9 to be tested, and the optical device 5 is used for optical imaging of the workpiece 9 to be tested, and the image capturing device 7 is used for capturing the workpiece 9 to be tested formed by the optical device 5. image. The image capturing device 7 is also coupled to a monitoring device, such as a computer system (not shown), for displaying images captured by the image capturing device 7. The image capturing device 7 can be a CCD (Charge Coupled Device) camera.
該光學裝置5包括一長筒形殼體50、兩透鏡51、52及一半透半反射鏡53,該兩透鏡51及52分別設置於該長筒形殼體50之兩端,以對該待測工件9進行光學成像,該半透半反射鏡53位於該兩透鏡51及52之間,且與該長筒形殼體50之軸成45度夾角。 The optical device 5 includes a long cylindrical housing 50, two lenses 51 and 52, and a half-transparent mirror 53. The two lenses 51 and 52 are respectively disposed at two ends of the long cylindrical housing 50 to The workpiece 9 is optically imaged, and the half mirror 53 is located between the two lenses 51 and 52 at an angle of 45 degrees to the axis of the elongated cylindrical casing 50.
該輔助對焦裝置6包括一殼體60、一裝設於殼體60前端之圖案光源61、一圖案片62、一同軸光源63及一倍率放大器64,該圖案光源61、圖案片62、同軸光源63及倍率放大器64依次設置於該殼體60內部。該圖案片62為一玻璃片,其上具有如圖4所示之複數透明與不透明之方形,且該等透明與不透明之方形交替排布。該倍率放大器64包括兩透鏡641及642,透過調整兩透鏡641及642之距離,可改變投射到該待測工件9之表面之特徵圖案之大小。於其他實施方式中,該圖案片62上之圖案亦可為其他圖案,如輪廓清 晰之動物像、人物像或者風景均可。 The auxiliary focusing device 6 includes a housing 60, a pattern light source 61 mounted on the front end of the housing 60, a pattern sheet 62, a coaxial light source 63, and a magnification amplifier 64. The pattern source 61, the pattern sheet 62, and the coaxial light source 63 and the magnification amplifier 64 are sequentially disposed inside the casing 60. The pattern sheet 62 is a glass sheet having a plurality of transparent and opaque squares as shown in FIG. 4, and the transparent and opaque squares are alternately arranged. The magnification amplifier 64 includes two lenses 641 and 642. By adjusting the distance between the two lenses 641 and 642, the size of the feature pattern projected onto the surface of the workpiece 9 to be tested can be changed. In other embodiments, the pattern on the pattern sheet 62 may also be other patterns, such as clear outlines. Clear animal images, portraits or landscapes.
當該待測工件9表面之光滑度較高時,開啟該圖案光源61及同軸光源63,該圖案光源61所發出之光線依次透過該圖案片62、兩透鏡641及642、半透半反射鏡53以及透鏡52將該圖案片62之圖形投射在該待測工件9之表面,且該同軸光源63所發出之光線依次透過該半透半反射鏡53及透鏡52照射到該待測工件9之表面。此時,該光學裝置5將對該待測工件9之表面進行成像。該影像攫取裝置7感應該待測工件9表面之像並將其轉換為電訊號以傳輸給該電腦系統,從而運算得到該待測工件9表面之像之清晰度及對比度。該電腦系統根據其清晰度及對比度即可判斷得到該待測工件9之焦點位置。 When the smoothness of the surface of the workpiece 9 to be tested is high, the pattern light source 61 and the coaxial light source 63 are turned on, and the light emitted by the pattern light source 61 sequentially passes through the pattern sheet 62, the two lenses 641 and 642, and the half mirror. 53 and the lens 52 project the pattern of the pattern sheet 62 on the surface of the workpiece 9 to be tested, and the light emitted by the coaxial light source 63 is sequentially transmitted through the half mirror 53 and the lens 52 to the workpiece 9 to be tested. surface. At this time, the optical device 5 will image the surface of the workpiece 9 to be tested. The image capturing device 7 senses the image of the surface of the workpiece 9 to be tested and converts it into an electrical signal for transmission to the computer system, thereby calculating the sharpness and contrast of the image of the surface of the workpiece 9 to be tested. The computer system can determine the focus position of the workpiece 9 to be tested according to its definition and contrast.
當該待測工件9表面之光滑度滿足對焦要求時,開啟該同軸光源61及環形光源8,該同軸光源61之光線依次經過該半透半反射鏡53及透鏡52照射到該待測工件9之表面,另,透過控制該環形光源8之照明區域照亮該待測工件9之指定區域,此時,該光學裝置5將對該待測工件9之表面進行成像。該影像攫取裝置7感應該待測工件9表面之像並將其轉換為電訊號以傳輸給該電腦系統,從而運算得到該待測工件9表面之像之清晰度及對比度。該電腦系統根據其清晰度及對比度即可判斷得到該待測工件9之焦點位置。 When the smoothness of the surface of the workpiece 9 to be tested satisfies the focusing requirement, the coaxial light source 61 and the annular light source 8 are turned on, and the light of the coaxial light source 61 is sequentially irradiated to the workpiece to be tested through the half mirror 53 and the lens 52. The surface of the workpiece 9 to be tested is illuminated by the illumination area of the annular light source 8. At this time, the optical device 5 images the surface of the workpiece 9 to be tested. The image capturing device 7 senses the image of the surface of the workpiece 9 to be tested and converts it into an electrical signal for transmission to the computer system, thereby calculating the sharpness and contrast of the image of the surface of the workpiece 9 to be tested. The computer system can determine the focus position of the workpiece 9 to be tested according to its definition and contrast.
前述影像測量儀1包括該輔助對焦裝置6,若該待測工件9表面之光滑度較高,則利用該輔助對焦裝置6將圖案片62之圖形投射到該待測工件9之表面,以方便對焦;若該待測工件9表面之光滑度較低,則直接透過該環形光源7及同軸光源63照亮該待測工件9即 可。 The image measuring instrument 1 includes the auxiliary focusing device 6. If the smoothness of the surface of the workpiece 9 to be tested is high, the auxiliary focusing device 6 is used to project the pattern of the pattern sheet 62 onto the surface of the workpiece 9 to be tested. If the smoothness of the surface of the workpiece 9 to be tested is low, the workpiece 9 to be tested is directly illuminated through the annular light source 7 and the coaxial light source 63. can.
綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。凡熟悉本案技藝之人士爰依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。 In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.
5‧‧‧光學裝置 5‧‧‧Optical device
50‧‧‧長筒形殼體 50‧‧‧Long cylindrical shell
51‧‧‧第一透鏡 51‧‧‧ first lens
52‧‧‧第二透鏡 52‧‧‧second lens
53‧‧‧半透半反射鏡 53‧‧‧Transflective mirror
60‧‧‧殼體 60‧‧‧shell
61‧‧‧圖案光源 61‧‧‧pattern light source
62‧‧‧圖案片 62‧‧‧pattern film
63‧‧‧同軸光源 63‧‧‧ coaxial light source
64‧‧‧倍率放大器 64‧‧‧ rate amplifier
641‧‧‧第三透鏡 641‧‧‧ third lens
642‧‧‧第四透鏡 642‧‧‧4th lens
8‧‧‧環形光源 8‧‧‧Circular light source
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW98109813A TWI439658B (en) | 2009-03-25 | 2009-03-25 | Vision measuring device and assistant focusing apparatus thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW98109813A TWI439658B (en) | 2009-03-25 | 2009-03-25 | Vision measuring device and assistant focusing apparatus thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201035515A TW201035515A (en) | 2010-10-01 |
TWI439658B true TWI439658B (en) | 2014-06-01 |
Family
ID=44855857
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW98109813A TWI439658B (en) | 2009-03-25 | 2009-03-25 | Vision measuring device and assistant focusing apparatus thereof |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI439658B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113188474B (en) * | 2021-05-06 | 2022-09-23 | 山西大学 | Image sequence acquisition system for imaging of high-light-reflection material complex object and three-dimensional shape reconstruction method thereof |
-
2009
- 2009-03-25 TW TW98109813A patent/TWI439658B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TW201035515A (en) | 2010-10-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6068593B2 (en) | System and method for calibrating a vision system to a touch probe | |
CN104111524B (en) | The method of workflow in digit microscope and optimization digit microscope | |
CN104439695B (en) | A kind of vision inspection apparatus of laser-processing system | |
TW488145B (en) | Three-dimensional profile scanning system | |
US8823930B2 (en) | Apparatus and method for inspecting an object | |
CN110455221B (en) | Optical path structure and equipment for rapidly measuring curvature radius of optical lens | |
JP2008203093A (en) | Illumination device and image measurement apparatus | |
CN116678324A (en) | Battery detection mechanism and battery detection method | |
CN107764204A (en) | Based on the microscopical three-dimensional surface topography instrument of mating plate and 3-D view joining method | |
TWI439658B (en) | Vision measuring device and assistant focusing apparatus thereof | |
JP2001311919A5 (en) | ||
TWI589858B (en) | Sphere surface inspection apparatus | |
CN101825430A (en) | Image admeasuring apparatus and pattern lighting device thereof | |
TWI515408B (en) | Optical equipment and charge coupled device using same | |
JP6710814B1 (en) | Lens mount and lens checker | |
TWI444594B (en) | Image measuring device and focusing apparatus thereof | |
CN207816206U (en) | Based on the microscopical three-dimensional surface topography instrument of mating plate | |
JP4929504B2 (en) | Observation device | |
CN219776639U (en) | Battery detection mechanism | |
JP6653048B1 (en) | Lens shape measuring device, lens shape measuring method, lens optical characteristic measuring device, program, and recording medium | |
CN215003571U (en) | Telecentric parallel profile lighting device special for optical large-visual-field rapid image measuring instrument | |
Hinz et al. | Improved defect segmentation by combining fiber optic fringe projection profilometry with directional variable brightfield illumination | |
JP2005024438A (en) | Method of inspecting mirror surface precision for curved surface mirror, inspection device for mirror surface precision for for curved surface mirror, preparation method for mirror surface precision inspecting pattern for curved surface mirror, and mirror surface precision inspecting pattern for curved surface mirror | |
TWI480504B (en) | Image measuring device and coaxial light focusing apparatus thereof | |
JPH0738807Y2 (en) | Projection inspection machine |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |