TWI439658B - Vision measuring device and assistant focusing apparatus thereof - Google Patents

Description

Image measuring instrument and its auxiliary focusing device

The invention relates to an image measuring instrument and an auxiliary focusing device thereof.

The image measuring instrument is a non-contact three-dimensional measuring device, which has the advantages of good flexibility, fast and high efficiency, and includes an image capturing device and an optical device for optically imaging the workpiece to be tested. The capture device is used to sense the image of the workpiece being tested. However, when the smoothness of the surface of the workpiece to be tested is very high, such as a smooth glass sheet, the optical device will be difficult to optically image the workpiece to be tested, and the workpiece to be measured cannot be measured at this time.

In view of the above, it is necessary to provide an image measuring instrument that can focus on a workpiece to be measured having a high surface smoothness. It is also necessary to provide an auxiliary focusing device.

An image measuring instrument includes an optical device, an auxiliary focusing device, an image capturing device and a light source for illuminating a workpiece to be tested, the optical device comprising a first and a second lens for The workpiece to be tested is optically imaged, and the image capturing device is configured to sense an image of the workpiece to be tested and convert it into an electrical signal for transmission to a computer system for processing. The auxiliary focusing device includes sequentially setting a pattern light source and a plurality thereof a patterned pattern sheet, the optical device further disposed between the first and second lenses, a half mirror that is not parallel to the second lens, such that the pattern The light emitted by the light source is sequentially projected through the pattern sheet, the half mirror and the second lens onto the surface of the workpiece to be tested to form a pattern on the pattern sheet on the surface of the workpiece to be tested.

An auxiliary focusing device includes a pattern light source and a pattern sheet having a pattern thereon, wherein light emitted by the pattern light source is projected through a pattern sheet onto a surface of a workpiece to be tested to be on a surface of the workpiece to be tested A pattern on the pattern sheet is formed.

The image measuring instrument includes the auxiliary focusing device. If the surface of the workpiece to be tested has a high smoothness, the auxiliary focusing device is used to project the pattern on the pattern sheet onto the surface of the workpiece to be tested for quick and convenient focusing.

1‧‧‧Image measuring instrument

2‧‧‧Workbench

3‧‧‧ gantry

4‧‧‧ top cover

5‧‧‧Optical device

50‧‧‧Long cylindrical shell

51‧‧‧ first lens

52‧‧‧second lens

53‧‧‧Transflective mirror

6‧‧‧Auxiliary focusing device

60‧‧‧shell

61‧‧‧pattern light source

62‧‧‧pattern film

63‧‧‧ coaxial light source

64‧‧‧ rate amplifier

641‧‧‧ third lens

642‧‧‧4th lens

7‧‧‧Image capture device

8‧‧‧Circular light source

9‧‧‧Workpiece to be tested

1 is a perspective view of a preferred embodiment of the image measuring instrument of the present invention.

2 is a perspective view of a preferred embodiment of the auxiliary focusing device of FIG. 1.

Figure 3 is a cross-sectional view of Figure 2.

Figure 4 is a schematic view of the pattern sheet of Figure 1.

FIG. 5 is a schematic diagram of the optical device, the auxiliary focusing device, and the image capturing device of FIG. 1.

Referring to FIG. 1 to FIG. 5, a preferred embodiment of the image measuring apparatus 1 of the present invention comprises a worktable 2 parallel to a horizontal plane, a gantry 3 spanning the workbench 2, and a gantry fixed to the gantry. The top cover 4 of the middle portion of the rack 3, an optical device 5, an auxiliary focusing device 6, an image capturing device 7, and a light source, such as an annular light source 8. The image measuring instrument 1 is further provided with an X-axis transmission system, a Y-axis transmission system and a Z-axis transmission system (not shown). The X-axis transmission system is used to drive the top cover 4 along the machine coordinates as shown in FIG. The X-axis movement of the system is used to drive the table 2 to move along the Y-axis of the machine coordinate system. The X axis and the Y axis are parallel to the table 2, respectively. The Z-axis transmission system is configured to drive the optical device 5, the auxiliary focusing device 6, the image capturing device 7, and the ring light source 8 to move along the Z axis of the mechanical coordinate, so that the optical device is located on the working table 2 The workpiece to be tested 9 is in focus.

The optical device 5 is disposed between the image capturing device 7 and the annular light source 8. The annular light source 8 is used for illuminating the workpiece 9 to be tested, and the optical device 5 is used for optical imaging of the workpiece 9 to be tested, and the image capturing device 7 is used for capturing the workpiece 9 to be tested formed by the optical device 5. image. The image capturing device 7 is also coupled to a monitoring device, such as a computer system (not shown), for displaying images captured by the image capturing device 7. The image capturing device 7 can be a CCD (Charge Coupled Device) camera.

The optical device 5 includes a long cylindrical housing 50, two lenses 51 and 52, and a half-transparent mirror 53. The two lenses 51 and 52 are respectively disposed at two ends of the long cylindrical housing 50 to The workpiece 9 is optically imaged, and the half mirror 53 is located between the two lenses 51 and 52 at an angle of 45 degrees to the axis of the elongated cylindrical casing 50.

The auxiliary focusing device 6 includes a housing 60, a pattern light source 61 mounted on the front end of the housing 60, a pattern sheet 62, a coaxial light source 63, and a magnification amplifier 64. The pattern source 61, the pattern sheet 62, and the coaxial light source 63 and the magnification amplifier 64 are sequentially disposed inside the casing 60. The pattern sheet 62 is a glass sheet having a plurality of transparent and opaque squares as shown in FIG. 4, and the transparent and opaque squares are alternately arranged. The magnification amplifier 64 includes two lenses 641 and 642. By adjusting the distance between the two lenses 641 and 642, the size of the feature pattern projected onto the surface of the workpiece 9 to be tested can be changed. In other embodiments, the pattern on the pattern sheet 62 may also be other patterns, such as clear outlines. Clear animal images, portraits or landscapes.

When the smoothness of the surface of the workpiece 9 to be tested is high, the pattern light source 61 and the coaxial light source 63 are turned on, and the light emitted by the pattern light source 61 sequentially passes through the pattern sheet 62, the two lenses 641 and 642, and the half mirror. 53 and the lens 52 project the pattern of the pattern sheet 62 on the surface of the workpiece 9 to be tested, and the light emitted by the coaxial light source 63 is sequentially transmitted through the half mirror 53 and the lens 52 to the workpiece 9 to be tested. surface. At this time, the optical device 5 will image the surface of the workpiece 9 to be tested. The image capturing device 7 senses the image of the surface of the workpiece 9 to be tested and converts it into an electrical signal for transmission to the computer system, thereby calculating the sharpness and contrast of the image of the surface of the workpiece 9 to be tested. The computer system can determine the focus position of the workpiece 9 to be tested according to its definition and contrast.

When the smoothness of the surface of the workpiece 9 to be tested satisfies the focusing requirement, the coaxial light source 61 and the annular light source 8 are turned on, and the light of the coaxial light source 61 is sequentially irradiated to the workpiece to be tested through the half mirror 53 and the lens 52. The surface of the workpiece 9 to be tested is illuminated by the illumination area of the annular light source 8. At this time, the optical device 5 images the surface of the workpiece 9 to be tested. The image capturing device 7 senses the image of the surface of the workpiece 9 to be tested and converts it into an electrical signal for transmission to the computer system, thereby calculating the sharpness and contrast of the image of the surface of the workpiece 9 to be tested. The computer system can determine the focus position of the workpiece 9 to be tested according to its definition and contrast.

The image measuring instrument 1 includes the auxiliary focusing device 6. If the smoothness of the surface of the workpiece 9 to be tested is high, the auxiliary focusing device 6 is used to project the pattern of the pattern sheet 62 onto the surface of the workpiece 9 to be tested. If the smoothness of the surface of the workpiece 9 to be tested is low, the workpiece 9 to be tested is directly illuminated through the annular light source 7 and the coaxial light source 63. can.

In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

5‧‧‧Optical device

50‧‧‧Long cylindrical shell

51‧‧‧ first lens

52‧‧‧second lens

53‧‧‧Transflective mirror

60‧‧‧shell

61‧‧‧pattern light source

62‧‧‧pattern film

63‧‧‧ coaxial light source

64‧‧‧ rate amplifier

641‧‧‧ third lens

642‧‧‧4th lens

8‧‧‧Circular light source

Claims (8)

An image measuring instrument includes an optical device, an image capturing device and a light source for illuminating a workpiece to be tested, the optical device comprising a first and a second lens for optically measuring the workpiece to be tested Imaging, the image capturing device is configured to sense an image of the workpiece to be tested and convert it into an electrical signal for transmission to a computer system for processing, and further comprising an auxiliary focusing device, the auxiliary focusing device comprising one of the pattern light sources And a pattern sheet having a pattern thereon, the optical device further disposed between the first and second lenses, a half mirror that is not parallel with the second lens, so that the light emitted by the pattern light source is sequentially transmitted. The pattern sheet, the half mirror and the second lens are projected onto the surface of the workpiece to be tested to form a pattern on the pattern sheet on the surface of the workpiece to be tested. The image measuring instrument of claim 1, wherein the auxiliary focusing device further comprises a coaxial light source disposed adjacent to one side of the pattern sheet and the pattern light source, the light emitted by the coaxial light source The semi-transparent mirror and the second lens are sequentially irradiated to the surface of the workpiece to be tested. The image measuring instrument of claim 2, wherein the auxiliary focusing device further comprises a magnification amplifier, the magnification amplifier is disposed adjacent to a side of the coaxial light source and the pattern sheet, the magnification amplifier includes a third And a fourth lens. The image measuring instrument of claim 1, wherein the auxiliary focusing device further comprises a magnification amplifier disposed adjacent to one side of the pattern sheet and the pattern light source, the magnification amplifier comprising a third And a fourth lens. The image measuring instrument according to any one of claims 1-4, wherein the pattern on the pattern sheet is a plurality of transparent and opaque squares, and the transparent and opaque squares are alternately arranged. An auxiliary focusing device includes a pattern light source and a patterned pattern sheet, wherein light emitted by the pattern light source is projected through a pattern sheet onto a surface of a workpiece to be tested to form the surface of the workpiece to be tested. The auxiliary focusing device further includes a coaxial light source, wherein the coaxial light source is disposed adjacent to one side of the pattern sheet and the pattern light source. The auxiliary focusing device of claim 6, further comprising a magnification amplifier, wherein the magnification amplifier is disposed adjacent to a side of the coaxial light source and the pattern sheet, the magnification amplifier includes a third and fourth lens . The auxiliary focusing device according to any one of claims 6-7, wherein the pattern on the pattern sheet is a plurality of transparent and opaque squares, and the transparent and opaque squares are alternately arranged.