TWI427474B - Circuit of on/off switch test for computer - Google Patents

Description

Computer switch test circuit

The invention relates to a test circuit, in particular to a computer switch test circuit.

After the computer products are produced, they must be tested for stability to ensure product quality. Testing computer switching performance is an essential part of the computer stability testing process. The traditional way to test the computer's power on/off function is to connect the computer to a power source and test its power-on or power-off performance by manually operating its power button. If it can't be turned on/off normally, or the on/off time is too long, you need to further test the performance of the computer to find out the cause of the abnormality for maintenance. However, this kind of manual operation is inefficient, especially when testing multiple computers, and it is a waste of time and labor when it is necessary to repeatedly test the on/off performance of the computer.

In view of the above, it is necessary to provide a computer switching machine test circuit with high test efficiency and stability.

A computer switch test circuit includes a switch module connected to a computer to be tested to control the state of the computer to be tested, the computer switch test circuit further comprising a switch module connected to control the a control chip of the opening and closing state of the switch module, wherein the control chip burns a test program and sends a periodic high/low level signal to the switch module to control the switch when the test program is running The module repeatedly switches the on/off state of the computer to be tested, and the test program sets the high / Low level signal switching frequency and hold time.

The test circuit of the computer switch machine of the invention uses a control chip programmed with a test program to test the performance of the computer's on/off switch, the circuit is stable and reliable, and the switch test can be automatically performed on the computer according to the test requirements, and the test efficiency is high.

10‧‧‧Control Module

102‧‧‧Microcontroller

104‧‧‧crystal oscillator circuit

106‧‧‧Connector

20‧‧‧Drive Module

30‧‧‧Display module

40‧‧‧Power Module

50‧‧‧Switch Module

1 is a block diagram showing the composition of a test circuit of a computer switch machine according to a preferred embodiment of the present invention.

2 is a circuit diagram of the control module, the drive module, and the display module of FIG.

3 is a circuit diagram of the power module and the switch module of FIG. 1.

Referring to FIG. 1 , a preferred embodiment of the computer switch test circuit of the present invention includes a control module 10 , a drive module 20 , a display module 30 , a power module 40 , and a switch module 50 . The control module 10 can periodically send an on/off signal to the switch module 50. The switch module 50 is connected to a switch pin of a computer to be tested, and can repeatedly switch the computer to be tested. The machine acts to verify whether the computer to be tested can pass the strict on-off test. The display module 30 can display test information such as test time and number of tests. The driving module 20 is configured to drive the display module 30. The power module 40 can provide power to the control module 10 and other modules that need to be powered.

Referring to FIG. 2, the control module 10 includes a single chip microcomputer 102 (which may also be other programmable control chips) and a crystal oscillator circuit 104 that provides a clock signal. The single chip microcomputer 102 burns programs such as a test program, a key scan program, and a drive display program. The single chip 102 sends a periodic high/low level signal to repeatedly switch the switch state of the computer to be tested when the test program is running, and the test program is based on The test demand sets the switching frequency and hold time of the high/low level signal. The crystal oscillator circuit 104 is composed of a quartz crystal Y and trimming capacitors C1 and C2. Since the single chip microcomputer 102 has a high gain inverting amplifier inside, when the crystal oscillator circuit 104 is externally connected, a self-excited oscillator is formed and oscillated. Clock pulse. The PB0 (timer/counter) pin of the single chip microcomputer 102 is connected to a button K1, the PB1 (timer/counter) pin is connected to a button K2, and the PB2 (analog signal input terminal) pin is connected to a button K3. The PB3 (analog signal input) pin is connected to a button K4. The button K1 is a start/stop button, and when the button scanning program detects that the K1 button is pressed, the test program can be started or stopped; the button K2 is a setting button, and when the button scanning program scans the K2 When the key is pressed, the type of the test parameter (such as the test time, the number of tests, and the like) can be switched and selected, so that the display module 30 displays the information such as the number of tests or the test time, and the button K3 is an addition key. The button scan program scans to increase the selected test parameter value when the K3 button is pressed, such as increasing the test time or the number of tests; the button K4 is a subtraction button, and when the button scan program scans the K4 button When pressed, the selected test parameter values can be reduced, such as reducing test time or number of tests. The MCU 102 is further connected to a connector 106. The connector 106 can be plugged into a programmer for programming the switch test program to the MCU 102. The PD7 pin of the single chip microcomputer 102 is connected with a work indicator D1, which is illuminated during the test and is extinguished when the test is stopped.

The driving module 20 includes four transistors Q1, Q2, Q3 and Q4, and the bases of the transistors Q1, Q2, Q3 and Q4 are respectively connected with PA4, PA5, PA6 and PA7 of the single chip 102, and the collector and the The driving pins 1-4 of the display module 30 are connected, and the emitters are all grounded.

The display module 30 includes four digital tubes LED1-LED4 arranged from right to left. The a-g pins of the digital tube LED1-LED4 are respectively connected to the PC0-PC6 pins of the single chip microcomputer 102, and the control pins 1-4 are respectively connected to the collectors of the transistors Q1-Q4 of the driving module 20. The state of the digital tube LED1-LED4 is controlled by the on/off state of the transistors Q1-Q4 and the state in which the PC0-PC6 pin of the microcontroller 102 signals. For example, if the display module 30 is required to display the number 10, the driving display program is operated to cause the pins PA6 and PA7 of the single chip 102 to emit a low level signal to turn off the transistors Q3 and Q4. The LEDs 3 and 4 are thus not driven, and are in an extinguished state; the pins PA5 and PA4 of the single chip 102 emit a high level signal to turn on the transistors Q2 and Q1, and the LEDs 3 and 4 are thus driven to display corresponding The pin PC1, PC2 of the single chip 102 sends a high level signal to the b and c pins of the LED2, so that the digital tube LED2 displays the number 1, and the pins PC0-PC5 of the single chip emit high The level signal is sent to the af pin of the digital tube LED1, so that the digital tube LED1 displays the number 0, and thus the display module 30 presents a number of 10.

The power module 40 includes a power line VCC, a ground line GND, and filter capacitors C3 and C4 connected between the power line VCC and the ground line GND. The VCC pin of the single chip 102 is connected to the power supply line VCC of the power module 40, and the GND pin is connected to the ground line GND of the power module 40.

The switch module 50 includes a diode D2, a transistor Q5 and a photocoupler B. The output of the photocoupler B can be connected to the switch of the computer to be tested for testing the switch. The light source of the photocoupler B is a light emitting diode, and the light receiver is a photo transistor. The anode of the diode D2 is connected to the PA3 pin of the single chip 102. When the PA3 pin of the single chip 102 sends a high level signal, the diode D2 and the transistor Q5 are both turned on. Coupler B's diode Also turned on, the impedance of the output end of the photocoupler B is small, equivalent to the switch "closed", the switch signal (PWRBT) of the computer to be tested can be grounded, thereby switching the state of the switch of the computer to be tested, When the PA3 pin of the single chip microcomputer 102 emits a low level signal, the diode D2 and the transistor Q5 are both turned on, the diode of the photocoupler B is also turned on, and the impedance of the output end of the photocoupler B is very high. Large, equivalent to the switch "disconnected", the state of the computer to be tested turned on or off remains unchanged.

During the test, the power is first turned on, the single-chip microcomputer 102 is powered on, and then the button K1 is pressed to start the test, and the PA3 pin of the single-chip microcomputer 102 can periodically perform the high/low level test according to the established test program. The signal is sent to the switch module 50, and the computer to be tested is tested by the switch. For example, a computer to be tested needs to pass a 58-hour test under the condition that the temperature and humidity are constantly changing. Each test cycle keeps the computer to be tested powered on for 8 minutes, and the shutdown state is 32 seconds. When the test is completed, the first test will be performed. The corresponding program is burned to the single chip microcomputer 102, and then the switch test circuit can be used to automatically test the test circuit, the test efficiency is high, and the test information can be displayed through the display module 30, which is convenient for monitoring test information.

In summary, the present invention is in accordance with the conditions of the invention patent application, and the patent application is filed according to law. The above is only the preferred embodiment of the present invention, and equivalent modifications or variations made by those skilled in the art to the spirit of the present invention should be included in the following claims.

10‧‧‧Control Module

20‧‧‧Drive Module

30‧‧‧Display module

40‧‧‧Power Module

50‧‧‧Switch Module

Claims (7)

A computer switch test circuit includes a switch module connected to a computer to be tested to control the state of the computer to be tested, and the improvement is that the computer switch test circuit further includes a switch module connected to the switch module a control chip for controlling an opening and closing state of the switch module, wherein the control chip burns a test program and emits a periodic high/low level signal to the switch module when the test program is running Controlling the switch module to repeatedly switch the on/off state of the computer to be tested, the test program sets a switching frequency and a hold time of the high/low level signal, and the control chip is connected with a first button, A button scanning program is also programmed in the control chip, and the button scanning program detects that the test program is turned on or ended when the first button is pressed. The computer switch test circuit of claim 1, wherein the switch module comprises a transistor connected to the control chip and a photocoupler, an input end of the photocoupler and the transistor Connected, the output end is connected to the switch pin of the computer to be tested, and when the control chip sends a high level signal to the transistor, the transistor and the photocoupler are both turned on to switch the computer to be tested. Switch state. The computer switch test circuit of claim 1, wherein the control chip further has a second button, and the button scanning program detects a type of the test parameter when the second button is pressed. The type of the test parameter includes two types of test time and test times. The computer switch test circuit of claim 3, wherein the control chip further has a third button and a fourth button, and the button scan program scans to increase when the third button is pressed. The value of the selected test parameter, the button scan program scans to decrease the value of the selected test parameter when the fourth button is pressed. The computer switch test circuit of claim 1, wherein the computer switch test circuit further includes a display module and a drive module for driving the display module, the drive module The display module is driven between the control chip and the display module and receiving a high level signal from the control chip. The computer switch test circuit of claim 5, wherein the drive module comprises a plurality of transistors connected to the control chip, and the transistor is turned on to drive when the control chip emits a high level signal. The display module. The computer switching machine test circuit of claim 6, wherein the display module comprises a plurality of digital tubes, the digital tubes are connected to the transistors of the driving module, and the control chip is further burned. There is a drive display program and outputs a signal to the transistor and the digital tube to drive the digital tube to display test information while the drive display program is running.