TWI425654B - Methodology and system for predicting specification of solid state light emitting element - Google Patents

Description

Method and system for estimating solid-state light-emitting element module specifications

The present invention relates to a method and system for estimating a specification, and more particularly to a method and system for estimating a specification of a solid state light emitting device module.

With the advancement of the technology of solid state light emitting devices, more and more products use light emitting diodes (LEDs) or laser diodes (LDs). ). Solid-state light-emitting elements have longer lifetimes, lower energy consumption, lower thermal energy generation, less infrared light spectrum generation, and component compactness than conventional light bulbs.

The lifetime of the solid-state light-emitting device described above generally refers to the lifetime of the solid-state light-emitting device wafer or the percentage of the luminance of the light-emitting. The survival rate is a luminescence test for a plurality of solid state light-emitting device wafers, which is a percentage of wafer luminescence popularity over a period of time. For example, 90% survival means that after 100 luminescence tests of 100 solid-state light-emitting device wafers, 90 wafers can continue to function. In addition, the luminance luminance percentage refers to a percentage of the luminance of the solid-state light-emitting device wafer after the power is maintained for a period of time, and the original luminance. For example, 70% of the luminous brightness percentage refers to the brightness and the original after a period of power is maintained by a solid state light emitting device chip. The percentage of brightness is 70%.

Although solid-state light-emitting components have a lifetime of tens of thousands of hours, their external package structure and phosphor powder are generally shorter than those of solid-state light-emitting components. Because of the heat generated by the solid state light-emitting elements, not only the rise in temperature but also the denaturation of the phosphor powder or the deterioration of the package structure. Therefore, the life of a light source of a solid state light emitting element is usually determined by the temperature it produces.

A prior art technique for estimating the lifetime of solid state light emitting devices, Eugen Hong and Nadarajah Narendran et al. proposed a method for estimating the departure using the relationship between the wavelength shift of square wave and the junction temperature. Light diode life value. As shown in the first figure, please refer to "(A method for projecting useful life of LED lighting systems.) Third International Conference on Solid State Lighting, Proceedings of SPIE 5187: 93-99 (2004)". The method uses current to introduce the light-emitting diode crystal grains, and simultaneously measures the change amount of the connection surface temperature, wherein the current is a type of square wave, which changes the current wavelength by using the change of the potential energy. Finally, the mathematical equation is used to derive the linear relationship between the amount of wavelength change and the junction surface temperature. This research method is for AlGaInP LED chips with 5mm epoxy resin package, and different instruments are used for wavelength and temperature measurement during the measurement process. The above estimation formula uses a large amount of recorded data and time calculation to estimate the predicted value. Therefore, the above-mentioned equation requires long-term experimental data to make the assumed predicted value closer to the true life.

Another prior art is disclosed in U.S. Patent No. 7,138,970 B2, the disclosure of which is incorporated herein incorporated by reference. The method of estimating the life of a polar body light source. The method is to maintain the high gain control level of the light emitting diode light source while lowering the duty cycle, that is, reducing the output of the light emitting diode light source and prolonging the life of the light emitting diode. As shown in the second figure, when the brightness of the light-emitting diode source begins to decrease, the load ratio will also start to increase until the maximum value. At this time, the sensor gain percentage (SGP) will also start to increase until the maximum. The value is up. When the percentage of sensing gains reaches the maximum at the beginning of the lift, the percentage of gain and the time of operation are maintained in a positive linear relationship. Using this linear relationship, the percentage of sensing gain (SGE) can be estimated and the lifetime of the light-emitting diode source can be estimated.

In addition, in the Lumileds Lighting Company technology, this prior art utilizes the operation of different currents to conduct the LED chip, measure the junction surface temperature in the LED chip and record the lifetime of the LED. The above life is defined by the 90% survival rate of the LED wafer and the percentage of the remaining luminance by 70%. The lifetime of the LED is predicted using the Weibull distribution function as shown below.

The junction surface temperature, the recorded lifetime of the LED, and the operating current are substituted into the equation, and the relationship between the junction surface temperature, the induced current intensity, and the lifetime of the LED is used to establish an equation for the lifetime prediction of the LED.

The prior art described above utilizes a large amount of recorded data and time calculations to estimate predicted values. Therefore, the establishment of the early stage of the equation requires long-term record of experimental data to make the hypothesis The predicted value is closer to the true lifetime. In addition, the above research and invention are to investigate the relationship between the temperature and the lifetime value of the solid state light-emitting element, and the relationship between the lifetime value of the solid-state light-emitting element can be estimated by using this relationship. The temperature of the solid state light-emitting element is usually represented by the temperature of the positive-negative junction (P-N junction), that is, the junction temperature. However, the connection face is located inside the wafer of the light-emitting element, and the measurement of the junction surface temperature is difficult according to the prior art.

In addition, some of the test wafers used in the prior art are light-emitting diode wafers of a phosphorus compound, and the wafers have higher luminous efficiency than the nitride light-emitting diode wafers. Therefore, the temperature of the connection surface generated by the aforementioned wafer is low, and the life of the light-emitting diode is long. Therefore, the above test results and equations can not be applied to the nitride diode chip. In addition, the previous life is for the LED terminal, but the life of the system may not be as good as the component end. Therefore, the current component end life test method does not guarantee the life of the system end, and a new technology is needed to estimate the life and performance of the solid state light emitting device.

In view of the above background of the invention, it is an object of the present invention to provide a method and system for estimating the lifetime of a solid state light emitting device that can be used for solid state light emitting device applications with simple and fast life prediction.

The invention discloses a method for estimating the specification of a solid-state light-emitting device module, comprising providing a database with a single solid-state light-emitting device lifetime, measuring the temperature of one of the solid-state light-emitting elements that is the least heat-dissipating of the solid-state light-emitting device system, and the solid-state light-emitting device from the above The system required life and measured temperature determine the operating current of each solid state light emitting element of the solid state light emitting device system according to the above database; or the operating current and measured temperature of each solid state light emitting device from the solid state light emitting device system, According to the above capital The library determines the lifetime of the solid state light emitting device system, wherein the database of the lifetime of the single solid state light emitting device is measured by measuring the temperature of the single solid state light emitting device at different operating currents and different ambient temperatures for different times. The data of the output power is established, and a life estimation model of a single solid state light emitting element is established.

The invention further discloses a system for estimating the specification of a solid state light emitting device module, comprising a database for storing a life distribution of a solid state light emitting device system, wherein the database is measured by measuring the single solid state light emitting device in different The operating current is established with output power data at different times at different ambient temperatures, and a lifetime estimation model for a single solid state lighting element is established. Also included are a plurality of solid state light emitting elements having a solid state light emitting element that is least susceptible to heat dissipation. And including means for determining the specification of the solid state light emitting device system, wherein the system specification may be a control temperature, an operating current or a life, wherein the control temperature is determined by the life and operating current required in the above database; It is determined by the life and measurement temperatures required in the above database; and the above life is determined by the operating current and the measured temperature in the above database.

The above-described measured solid-state light-emitting device system is the most difficult to dissipate the temperature of one of the solid-state light-emitting elements by measuring the stitch temperature of the solid-state light-emitting element which is the least heat-dissipating in the solid-state light-emitting element system.

The invention further discloses a method for estimating the specification of a solid state light emitting device module, comprising a database for providing the life of a single solid state light emitting device, measuring the temperature of one of the solid state light emitting elements in the center of the solid state light emitting device system, and the solid state light emitting device system. The required life and the measured temperature determine the operating current of each solid-state light-emitting element of the solid-state light-emitting element system according to the above-mentioned database; or the operating current and the measured temperature of each of the solid-state light-emitting elements of the solid-state light-emitting element system, according to the above Database The lifetime of the solid state light emitting device system, wherein the database of the lifetime of the single solid state light emitting device is measured by measuring the output power of the single solid state light emitting device at different operating currents and different ambient temperatures at different times. The data is established and a lifetime estimation model for a single solid state light emitting element is established.

The invention further discloses a system for estimating the specification of a solid state light emitting device module, comprising a database for storing a life distribution of a solid state light emitting device system, wherein the database is measured by measuring the single solid state light emitting device in different The operating current is established with output power data at different times at different ambient temperatures, and a lifetime estimation model for a single solid state lighting element is established. Also included is a plurality of solid state light emitting elements having a solid state light emitting element at a central location. And including means for determining the specification of the solid state light emitting device system, wherein the system specification may be a control temperature, an operating current or a life, and the above controlled temperature is determined by the life and operating current required in the above database, and the operating current system described above Determined by the life and measurement temperatures required in the above database, and the above-mentioned life is determined by the operating current and the measured temperature in the above database.

The temperature of the solid state light emitting device, which is one of the center positions of the solid state light emitting device system, is measured by measuring the temperature of the stitch in the solid state light emitting device at the center of the solid state light emitting device system.

The invention further discloses a method for estimating the specification of a solid-state light-emitting device module, comprising a database for providing the life of a single solid-state light-emitting device, and an operating current required for the life and measurement of the solid-state light-emitting device system, and determining the solid-state light according to the above-mentioned database. The control temperature of each solid state light emitting element of the component system, wherein the database of the lifetime of the single solid state light emitting component is different by measuring the single solid state light emitting device at different operating currents and different ambient temperatures Time output power data Established, and based on this, establish a life estimation model for a single solid state light-emitting element.

The method disclosed by the present invention does not require a large amount of time and money to establish a relevant model, and a solid state light emitting element life estimating system can be established by using only a small amount of test data.

In addition, in the application of solid-state light-emitting elements, in accordance with current industry specifications, it is necessary to measure the junction surface temperature for each solid-state light-emitting element. This is disadvantageous in mass production of the cycle time of a solid state light emitting device application product.

Therefore, another object of the present invention is to provide a method and system for estimating the life of a solid-state light-emitting device application product, which can reduce the manufacturing time of the solid-state light-emitting device by measuring the temperature of the stitch.

1, 101‧‧‧ solid state light-emitting device life measurement data

2, 201‧‧‧ Establishing a solid-state light-emitting device life model

3. 301‧‧‧A database for establishing the lifetime of a single solid-state light-emitting element

4‧‧‧The pin temperature of a single solid-state light-emitting component of the measurement system

5, 501 ‧ ‧ determine the control temperature of the system

6, 601‧‧‧Determining the operating current of the system

7, 701 ‧ ‧ determine the life of the system

8‧‧‧Solid light-emitting elements

9, 20‧‧‧ Solid State Light Element System

10‧‧‧The most difficult to dissipate solid-state light-emitting elements

11‧‧‧Solid crystal stitches

12‧‧‧ Connection surface

21‧‧‧Database

22‧‧‧System Specifications

23, 212‧‧‧ life

24, 211‧‧‧ operating current

25‧‧‧System temperature

41, 51‧‧‧ Estimated specifications

202‧‧‧Measure temperature

401‧‧‧ Pin system temperature for the components that are the least susceptible to heat dissipation

The first figure shows a prior art solid state light emitting element life estimation equation; the second figure shows a prior art solid state light emitting element life estimation schematic; the third figure shows the solid state light emitting element brightness versus time; the fourth figure shows the solid state of the present invention; A schematic diagram of a method for estimating a specification of a light-emitting element module; a fifth diagram showing a flow chart of a method for estimating a specification of the solid-state light-emitting element module of the present invention; a sixth diagram showing a schematic diagram of a solid-state light-emitting element module; and a sixth diagram showing a solid state A schematic diagram of a light-emitting element module; a seventh diagram showing a schematic diagram of a solid-state light-emitting element; and an eighth embodiment showing a flow chart of a method for estimating a solid-state light-emitting element module of the present invention 9 is a schematic view showing a solid-state light-emitting device module of the present invention; FIG. 11 is a flow chart showing a method for estimating a specification of the solid-state light-emitting device module of the present invention; and FIG. 11 is a view showing a solid-state light-emitting device module of the present invention; A schematic diagram of the system for estimating the specifications; and a twelfth diagram showing a system diagram for estimating the specifications of the solid state light emitting device module of the present invention.

The present invention provides a method and system for estimating the life of a solid state light emitting device application product. In order to thoroughly understand the present invention, detailed steps will be set forth in the following description. Obviously, the practice of the present invention is not limited to the specific details familiar to those skilled in the art of light-emitting diodes. On the other hand, well-known steps are not described in detail to avoid unnecessarily limiting the invention. The preferred embodiments of the present invention are described in detail below, but the present invention may be widely practiced in other embodiments, and the scope of the present invention is not limited by the scope of the following patents. .

The invention discloses a method for estimating the specification of a solid state light emitting device module, comprising a database for providing the life of a single solid state light emitting device, measuring the temperature of the solid state light emitting device which is the least heat dissipation of the solid state light emitting device system, and the solid state light emitting device system. The required life and the measured temperature determine the operating current of each solid-state light-emitting element of the solid-state light-emitting element system according to the above-mentioned database, or the operating current and the measured temperature of each solid-state light-emitting element of the solid-state light-emitting element system, according to The above database The life of a solid state light emitting device system.

The above-mentioned database of the lifetime of a single solid-state light-emitting element is established by measuring data of output power of a single solid-state light-emitting element at different operating currents and different ambient temperatures at different times, and based on establishing a single solid state A life estimation model for a light-emitting element.

The above-described measured solid-state light-emitting device system is the most difficult to dissipate the temperature of one of the solid-state light-emitting elements by measuring the stitch temperature in the solid-state light-emitting element in which the solid-state light-emitting element system is least likely to dissipate heat. Each of the above solid state light emitting elements may be a light emitting diode element. And the above-mentioned stitches refer to the pins of the light-emitting diode die.

The invention further discloses a method for estimating the specification of a solid state light emitting device module, comprising a database for providing the life of a single solid state light emitting device, measuring the temperature of one of the solid state light emitting elements in the center of the solid state light emitting device system, and the solid state light emitting device system. The required life and the measured temperature determine the operating current of each solid-state light-emitting element of the solid-state light-emitting element system according to the above-mentioned database, or the operating current and the measured temperature of each solid-state light-emitting element of the solid-state light-emitting element system, according to The above database determines the life of a solid state light emitting device system.

The above-mentioned database of the lifetime of a single solid-state light-emitting element is established by measuring data of output power of a single solid-state light-emitting element at different operating currents and different ambient temperatures at different times, and establishing a single solid-state light. The life estimation model of the component.

The temperature of the solid state light emitting device, which is one of the center positions of the solid state light emitting device system, is measured by measuring the temperature of the stitch in the solid state light emitting device at the center of the solid state light emitting device system. And each solid state light emitting element can be a light emitting diode element, wherein The pin is a pin that is fixed by a light-emitting diode.

The invention further discloses a method for estimating the specification of a solid state light emitting device module, comprising a database for providing the life of a single solid state light emitting device, and an operating current required from the solid state light emitting device system to determine the solid state according to the above database. The temperature at which each solid state light emitting element of the light emitting element system is controlled.

The above-mentioned database of the lifetime of a single solid-state light-emitting element is established by measuring data of output power of a single solid-state light-emitting element at different operating currents and different ambient temperatures at different times, and based on establishing a single solid state A life estimation model for a light-emitting element. And each solid state light emitting element can be a light emitting diode element.

The invention further discloses a system for estimating the specification of a solid state light emitting device module, comprising a database for storing the life distribution of the solid state light emitting device system. Also included is a plurality of solid state light emitting elements having a solid state light emitting element that is least susceptible to heat dissipation. And a means for determining a specification of the solid state light emitting device system, wherein the system specification may be a control temperature, an operating current, or a lifetime, wherein the control temperature is determined by a life and an operating current required in the database, and the operating current system is Determined by the life and measurement temperatures required in the above-mentioned database, and the above-mentioned life is determined by the operating current and the measured temperature in the above-mentioned database.

The above-mentioned database is established by measuring the output power data of a single solid-state light-emitting element at different operating currents and different ambient temperatures at different times, and based on establishing a single solid-state illuminating element for life estimation model.

The above measured temperature is measured by the temperature of the stitch in the solid-state light-emitting element in which the solid-state light-emitting element system is the least likely to dissipate heat. And each of the solid-state light-emitting elements may be an element of a light-emitting diode, wherein the above-mentioned stitches refer to the pins of the light-emitting diode die .

The invention further discloses a system for estimating the specification of a solid state light emitting device module, comprising a database for storing the life distribution of the solid state light emitting device system. Also included is a plurality of solid state light emitting elements having a solid state light emitting element at a central location. And including means for determining the specification of the solid state light emitting device system, wherein the system specification may be a control temperature, an operating current or a lifetime, wherein the control temperature is determined by the life and operating current required in the above database, and the operating current It is determined by the life and measurement temperatures required in the above-mentioned database, and the above-mentioned life is determined by the operating current and the measured temperature in the above-mentioned database.

The above-mentioned database is established by measuring the output power data of a single solid-state light-emitting element at different operating currents and different ambient temperatures at different times, and based on establishing a lifetime estimation model of a single solid-state light-emitting element.

The above measured temperature is measured by the temperature of the stitch in the solid state light emitting element at the center of the solid state light emitting device system. And each solid-state light-emitting element may be an element of a light-emitting diode, wherein the above-mentioned stitch refers to a pin of the light-emitting diode die.

The technical contents and various embodiments of the present invention will be described in detail below with reference to the drawings and examples.

Referring to the third figure, the horizontal axis is the illuminating time, and the vertical axis is the percentage of the illuminating brightness. When the solid-state light-emitting element maintains the light-emitting power for a certain period of time, the brightness decreases with time, and its brightness versus time is a one-to-one relationship. The reason is that in the structure of the solid-state light-emitting element, the package structure or the phosphor powder may deteriorate the phosphor powder or the deterioration of the package structure as the temperature rises, or the life of the light source itself has reached a critical point.

Therefore, the lifetime definition of a solid state light-emitting element system is generally determined by the brightness of the solid-state light-emitting element. For example, the lifetime of a solid-state light-emitting element system is usually based on the survival rate of the solid-state light-emitting element chip or the percentage change in brightness of the solid-state light-emitting element. In view of the above, the method and system for estimating the specification of the solid state light emitting device module disclosed by the present invention, the lifetime of the single solid state light emitting device is defined by maintaining the percentage of the luminance of the single solid state light emitting device.

The measurement of the luminance of the single solid-state light-emitting element described above can be measured by an integrating sphere, and the light output area is measured by reflecting and diffusing the light inside the integrating sphere by the light of the light source. The intensity of the light source is then calculated using the ratio of the light output area to the internal surface area.

Referring to the fourth figure, the method for estimating the specification of the solid state light emitting device module disclosed in the present invention firstly establishes a database 3 for the lifetime of a single solid state light emitting device. Referring to FIG. 5, the above-mentioned database 3 for establishing the lifetime of a single solid-state light-emitting element is constituted by the solid-state light-emitting element lifetime measurement data 1 and the step of establishing the solid-state light-emitting element life model 2. That is, the lifetime distribution of a single solid state light emitting device at different operating currents and different ambient temperatures in a solid state light emitting device system is measured and simultaneously recorded. The lifetime relationship of the solid state light-emitting elements is then established using the recorded lifetime distribution.

Next, the next step is to measure the pin temperature of the solid-state light-emitting element of the solid-state light-emitting element system that is the least heat-dissipating. Referring to FIGS. 6A and 6B, the solid-state light-emitting element system 9 described above is composed of a plurality of solid-state light-emitting elements 8 which may be rectangular, circular or other polygonal structures. Since the solid-state light-emitting element system 9 generates a light-emitting power, a phenomenon in which a plurality of solid-state light-emitting elements 8 simultaneously generate thermal energy, the solid-state light-emitting element system 9 has a single one. The solid-state light-emitting element 8 having the highest temperature and the solid-state light-emitting element 8 having the highest temperature are the solid-state light-emitting elements 10 which are the least heat-dissipating in the solid-state light-emitting element system 9.

In addition, the present invention provides an embodiment in which the above-mentioned solid-state light-emitting element 10 which is the least heat-dissipating is also likely to be the solid-state light-emitting element 8 at the most central position of the solid-state light-emitting element system 9. In view of the above, the number of solid-state light-emitting elements 8 surrounded by the solid-state light-emitting element 8 at the most central position is the most uniform and the most. Therefore, the heat dissipation of the solid-state light-emitting element 8 at the most central position is the most difficult, so that the solid-state light-emitting element 8 at the most central position is also the most difficult to dissipate the solid-state light-emitting element 10.

In view of the above, the temperature of the stitches measures the temperature of the die-bonding pin 11 of the solid-state light-emitting element 10 which is the least heat-dissipating. Referring to the seventh figure, the temperature of the pin 11 of the solid crystal is the thermal energy generated from the connecting surface 12 of the light-emitting element, and is transmitted to the position of the pin 11 of the solid crystal by heat. Therefore, the temperature of the connection surface 12 of the light-emitting element is measured through the pin 11 of the solid crystal, and the process of thermal energy conduction is direct and the thermal impedance is the lowest.

Finally, a library of lifetimes of the single solid state light emitting elements described above is utilized to determine the estimated specifications of the solid state light emitting device module; that is, to determine the system's control temperature, determine the operating current of the system, or determine the life of the system. Referring to FIG. 8 , the present invention proposes an estimated specification 41 of a solid state light emitting device module, which substitutes the stitch temperature 401 of the component that is the least heat dissipating component of the measured solid state light emitting device system into the lifetime of the established single solid state light emitting device. The database 301 is used to determine the operating current 601 of the solid state lighting element system or to determine the life 701 of the system.

Based on the above estimated specifications 41, the present invention provides an example in which the lifetime value is defined by a percentage of the luminance of the light emitted by 50%, and the steps are as follows:

1. Record the life measurement data of a single solid state light emitting device. First, when the ambient temperature is maintained at 45 ° C, the operating currents of 15 mA, 20 mA, and 30 mA are respectively passed through a solid state light emitting device system, resulting in the solid state light emitting elements in the solid state light emitting device system generating luminous power. At this time, the life of a solid-state light-emitting element at its output power at different times is recorded, and the recorded time can be 10,000 hours. With the above steps, when the ambient temperature is maintained at 60 ° C, the same type of solid-state light-emitting element system is passed through the operating currents of 15 mA, 20 mA, and 30 mA, respectively, resulting in the solid-state light-emitting elements in the solid-state light-emitting element system generating luminous power. At this time, the life of the output power of a solid-state light-emitting element at different times is recorded, and the recorded time can be 10,000 hours. With the above steps, when the ambient temperature is maintained at 85 ° C, the operating currents of 15 mA, 20 mA, and 30 mA are respectively passed through the same type of solid-state light-emitting element system, resulting in the solid-state light-emitting elements in the solid-state light-emitting element system generating luminous power. At this time, the life of the output power of a solid-state light-emitting element at different times is recorded, and the recorded time can be 10,000 hours.

2. Establish a solid-state light-emitting device life model, first calculate the mathematical relationship using the algebraic relationship of the solid-state light-emitting device lifetime measurement data of step 1, and estimate the lifetime information of a single solid-state light-emitting component after 10,000 hours of actual measurement. Library. For example, when a single solid-state light-emitting element has an ambient temperature of 45 ° C, 60 ° C, and 85 ° C under an operating current of 15 mA, the life estimation results are up to 48,000 hours, 23,000 hours, and 15,000, respectively. hour. Therefore, the logarithmic relationship of the lifetime of a single solid state light emitting element can be calculated using the life estimation results described above. With the above steps, when the ambient temperature of a single solid-state light-emitting element is 45 ° C, 60 ° C and 85 ° C under an operating current of 20 mA, the life estimation results are up to 40,000 hours, 20,000 hours, and 12,000 thousand, respectively. hour. Therefore, the logarithmic relationship of the lifetime of a single solid state light emitting element can be calculated using the life estimation results described above. With the above steps, the ambient temperature of a single solid-state light-emitting element at an operating current of 30 mA is 45 ° C, 60 ° C and 85 ° C, respectively. At the time, the life expectancy results were up to 21,000 hours, 20,000 hours, and 12,000 hours, respectively. Therefore, the logarithmic relationship of the lifetime of a single solid state light emitting element can be calculated using the life estimation results described above.

3. The three logarithmic relationship estimated in step 2 establishes a database of the lifetime of a single solid state light emitting element, as shown in the ninth figure.

4. Measuring the stitch temperature of the single solid-state light-emitting component that is least likely to dissipate heat, and determining the operating current of the solid-state light-emitting component or the lifetime of the solid-state light-emitting component by the database of the lifetime of the single solid-state light-emitting component established in step 3. For example, the measuring system is the most difficult to dissipate components with a pin temperature of 50 ° C and an operating current of 20 mA. The lifetime of the system can be determined to be 33,000 hours based on the database that establishes the lifetime of a single solid-state lighting element; or the measurement system is the most The temperature of the component that is not easy to dissipate is 30 ° C, and the determined lifetime is 65,000 hours. According to the database that establishes the lifetime of a single solid-state light-emitting component, the operating current of the system can be determined to be 20 mA.

Referring to FIG. 10, the present invention further provides an estimated specification 51 of a solid state light emitting device module, which is constructed by solid state light emitting device lifetime measurement data 101 and a step of establishing a solid state light emitting device lifetime model 201 to form a single solid state light emitting device. The lifetime database 301 determines the control temperature 501 of the system by the required life and operating current.

Based on the above estimated specification 51, the present invention provides an example in which the lifetime value is defined by a luminance percentage of 50% as follows:

1. Record the life measurement data of a single solid-state light-emitting device. First, when the ambient temperature is maintained at 45 ° C, the operating currents of 15 mA, 20 mA, and 30 mA are respectively passed through a solid-state light-emitting element system, resulting in the solid-state light-emitting elements in the solid-state light-emitting element system emitting light. power. At this time, record the life of a solid-state light-emitting component at its output power at different times. Life, which can record 10,000 hours. With the above steps, when the ambient temperature is maintained at 60 ° C, the same type of solid-state light-emitting element system is passed through the operating currents of 15 mA, 20 mA, and 30 mA, respectively, resulting in the solid-state light-emitting elements in the solid-state light-emitting element system generating luminous power. At this time, the life of the output power of a solid-state light-emitting element at different times is recorded, and the recorded time can be 10,000 hours. With the above steps, when the ambient temperature is maintained at 85 ° C, the same type of solid-state light-emitting element system is passed through the operating currents of 15 mA, 20 mA, and 30 mA, respectively, resulting in the solid-state light-emitting elements in the solid-state light-emitting element system generating luminous power. At this time, the life of the output power of a solid-state light-emitting element at different times is recorded, and the recorded time can be 10,000 hours.

2. Establish a solid-state light-emitting device life model, first calculate the mathematical relationship using the algebraic relationship of the solid-state light-emitting device lifetime measurement data of step 1, and estimate the lifetime information of a single solid-state light-emitting component after 10,000 hours of actual measurement. Library. For example, when a single solid-state light-emitting element has an ambient temperature of 45 ° C, 60 ° C, and 85 ° C under an operating current of 15 mA, the life estimation results are up to 48,000 hours, 23,000 hours, and 15,000, respectively. hour. Therefore, the logarithmic relationship of the lifetime of a single solid state light emitting element can be calculated using the life estimation results described above. With the above steps, when the ambient temperature of a single solid-state light-emitting element is 45 ° C, 60 ° C and 85 ° C under an operating current of 20 mA, the life estimation results are up to 40,000 hours, 20,000 hours, and 12,000 thousand, respectively. hour. Therefore, the logarithmic relationship of the lifetime of a single solid state light emitting element can be calculated using the life estimation results described above. With the above steps, when the ambient temperature of a single solid-state light-emitting element is 45 ° C, 60 ° C and 85 ° C under an operating current of 30 mA, the life estimation results are up to 21,000 hours, 20,000 hours, and 120,000 respectively. Thousand hours. Therefore, the logarithmic relationship of the lifetime of a single solid state light emitting element can be calculated using the life estimation results described above.

3. The three logarithmic relationship estimated in step 2 establishes a database of the lifetime of a single solid state light emitting element, as shown in the ninth figure.

4. Determine the control temperature of the solid state light emitting device system by the required lifetime and operating current. For example, the life of the solid state light emitting device system is 48,000 hours, and the operating current is 20 mA, according to the lifetime of establishing a single solid state light emitting device. The database can determine the system's control temperature is 40 °C.

Referring to FIG. 11 , the present invention also provides a system for estimating the size of a solid state light emitting device module, which mainly includes a solid state light emitting device system 20 , a library of single solid state light emitting device lifetimes 21 , and a system specification 22 . The above-described database of the lifetime of a single solid-state light-emitting element is measured and recorded by a single solid-state light-emitting element at different operating currents and at different ambient temperatures.

The measurement temperature 202 measures the pin temperature of a single solid-state light-emitting diode that is the least heat-dissipating in the solid-state light-emitting element system 20 or the pin of a single solid-state light-emitting diode that measures the most central position in the solid-state light-emitting element system 20. temperature.

Using the above-described database of single solid state light emitting device lifetimes, in conjunction with the pin temperature of a single solid state light emitting diode in the solid state light emitting device system 20 that is least susceptible to heat dissipation or central position, system specification 22 can estimate system life 23 , operating current 24, or system temperature 25. System specification 22 includes means for estimating system life 23, operating current 24, and controlling system temperature 25. The life 23 described above is determined by the operating current 211 and the measured temperature 202 in the database 21 of the lifetime of a single solid state light emitting device. The operating current 24 is determined by the life 212 and the measured temperature 202 required in the database 21 of the lifetime of a single solid state light emitting device. As shown in Fig. 12, the system temperature 25 is determined by the life 212 and operating current 211 required in the database 21 of the lifetime of a single solid state light emitting device.

In addition, in solid-state light-emitting element systems, the density of the solid-state light-emitting element alone is important. For example, the greater the number of solid-state light-emitting elements per unit area of a solid-state light-emitting element system, the more heat energy is generated. Therefore, when the solid-state light-emitting element performs the light-emitting power, the temperature generation of the solid-state light-emitting element system is also high, and at the same time, the solid-state light-emitting element system has a faster rate of decline in its life. Therefore, in addition to reducing the operating current, the manner of increasing the life of the solid state light emitting device further includes reducing the density of the light emitting element in the solid state light emitting device.

The advantages of using the method and system of the present invention to estimate specifications are:

1. When establishing a database of solid-state light-emitting components, the operating temperature of the solid-state light-emitting component is ambient temperature, so the database can be used to estimate the life of the solid-state light-emitting component that is the least heat-dissipating in the entire solid-state light-emitting component system; or when the system The specification requires that the amount of current required to be supplied be estimated when a certain lifetime is reached.

2. The junction temperature is indeed an important parameter of the solid-state light-emitting element, but the temperature of the fixed-crystal stitch should exhibit a positive correlation when the solid-state light-emitting element reaches thermal equilibrium after a period of operation. That is, the junction surface temperature is high and the temperature of the solid crystal stitches also rises. This is because the heat transfer from the junction surface temperature to the die bond pins is direct and the heat transfer path impedance is lowest. An advantage of the present invention is that the specifications of the solid state light emitting device system can be estimated without actually measuring the junction surface temperature.

The system for estimating the size of the solid-state light-emitting device module disclosed in the present invention estimates the life or operating current of the solid-state light-emitting device system by the stitch temperature, and thus the estimated value varies depending on the type and material of the solid-state light-emitting device. In addition, the method disclosed by the present invention does not require a large amount of time and money to establish a correlation model, and a solid state light emitting element life estimating system can be established by using only a small amount of test data.

In addition, in the application of solid-state light-emitting elements, in accordance with current industry specifications, it is necessary to measure the junction surface temperature for each solid-state light-emitting element. This is disadvantageous in the mass production of the production time of the solid-state light-emitting device application product. The present invention provides a method and system for estimating the life of a solid-state light-emitting device application product. Therefore, the measurement of the stitch temperature can reduce the fabrication time of the solid-state light-emitting device.

Obviously, many modifications and differences may be made to the invention in light of the above description. It is therefore to be understood that within the scope of the appended claims, the invention may be The above are only the preferred embodiments of the present invention, and are not intended to limit the scope of the claims of the present invention; all other equivalent changes or modifications which are not departing from the spirit of the present invention should be included in the following claims. Within the scope.

In summary, the present invention complies with the requirements of the invention patent and submits a patent application according to law. The above description is only the preferred embodiment of the present invention, and equivalent modifications or variations made by those skilled in the art will be included in the following claims.

1‧‧‧Database for establishing the lifetime of a single solid-state light-emitting element

2‧‧‧The pin temperature of a single solid-state light-emitting component of the measurement system

3‧‧‧Determining the control temperature of the system

4‧‧‧Determining the operating current of the system

5‧‧‧Determining the life of the system

Claims (18)

A method for estimating a specification of a solid state light emitting device system, comprising: a database providing a lifetime of a single solid state light emitting device, wherein the database of lifetimes of the single solid state light emitting device is measured by measuring the single solid state light emitting device Data of output power at different times under different operating currents and different ambient temperatures are established, and a life estimating model of a single solid-state light-emitting element is established according to the method; measuring the solid-state light-emitting element system is one of the most difficult to dissipate heat The temperature of the component; and the lifetime and measured temperature required from the solid state light emitting device system, the operating current of each solid state light emitting component of the solid state light emitting device system is determined according to the database, or from each solid state of the solid state light emitting device system The operating current of the illuminating element and the measured temperature determine the lifetime of the solid state illuminating element system in accordance with the database. The method for estimating the specification of the solid state light emitting device system according to the first aspect of the invention, wherein measuring the temperature of the solid state light emitting device which is the least heat dissipation of the solid state light emitting device system is the most difficult to measure by the solid state light emitting device system. The temperature of the stitch in the solid-state light-emitting element that dissipates heat. The method of estimating the specification of the solid state light emitting device system of claim 2, wherein each of the solid state light emitting elements may be a light emitting diode element. The method for estimating the specification of the solid-state light-emitting device system according to claim 3, wherein the stitches are the pins of the light-emitting diode die. A method for estimating a specification of a solid state light emitting device system, comprising: a database providing a lifetime of a single solid state light emitting device, wherein the database of lifetimes of the single solid state light emitting device is measured by measuring the single solid state light emitting device Establishing data of output power at different times under different operating currents and different ambient temperatures, and establishing a life estimation model for a single solid state light emitting element; Measureing the temperature of one of the solid state light emitting elements in the center of the solid state light emitting device system; and determining the operation of each solid state light emitting element of the solid state light emitting device system in accordance with the library from the life and measured temperature required by the solid state light emitting device system The current, or the operating current and the measured temperature from each of the solid state light emitting elements of the solid state light emitting device system, determines the lifetime of the solid state light emitting device system in accordance with the database. A method for estimating a specification of a solid-state light-emitting device system according to claim 5, wherein measuring a temperature of one of the solid-state light-emitting elements at a center position of the solid-state light-emitting device system is performed by measuring a center position of the solid-state light-emitting device system The pin temperature in the solid state light emitting element. The method of estimating the specification of the solid state light emitting device system of claim 6, wherein each of the solid state light emitting elements may be a light emitting diode element. The method for estimating the specification of the solid-state light-emitting device system according to claim 7, wherein the stitches refer to the pins of the light-emitting diode die. A method for estimating a specification of a solid state light emitting device system, comprising: a database providing a lifetime of a single solid state light emitting device, wherein the database of lifetimes of the single solid state light emitting device is measured by measuring the single solid state light emitting device The output power data of different time at different operating currents and different ambient temperatures is established, and the life estimation model of the single solid state light emitting component is established; and the life and measurement required from the solid state light emitting device system are The operating current determines the control temperature of each solid state lighting element of the solid state lighting element system in accordance with the database. A method of estimating a specification of a solid state light emitting device system according to claim 9, wherein each of the solid state light emitting elements may be a light emitting diode element. A system for estimating a specification of a solid state light emitting device system, comprising: a database for storing a life distribution of a solid state light emitting device system, wherein the database is determined by measuring the single solid state light emitting device The operating current is established with different output power data at different ambient temperatures, and a single a life estimating model of a solid-state light-emitting element; a plurality of solid-state light-emitting elements, the plurality of solid-state light-emitting elements having a solid-state light-emitting element that is the least heat-dissipating; and a means for determining a system specification of the solid-state light-emitting element, wherein the system specification is a temperature control and an operating current Or the lifetime, wherein the above controlled temperature is determined by the life and operating current required in the database, and the operating current is determined by the required life and measurement temperature in the database, or the lifetime is determined by the data. The operating current and the measured temperature in the library are determined. A system for estimating the size of a solid state light emitting device system according to claim 11, wherein the measured temperature is measured by measuring a stitch temperature in the solid state light emitting device in which the solid state light emitting device system is least likely to dissipate heat. A system for estimating the size of a solid state light emitting device system according to claim 12, wherein each of the solid state light emitting elements can be an element of a light emitting diode. A system for estimating the specification of a solid state light emitting device system according to claim 13, wherein the stitches are the pins of the light emitting diode die. A system for estimating a specification of a solid state light emitting device system, comprising: a database for storing a life distribution of a solid state light emitting device system, wherein the database is determined by measuring the single solid state light emitting device The operating current is established with different output power data at different ambient temperatures, and a lifetime estimation model of the single solid state light emitting device is established; a plurality of solid state light emitting elements having a solid state at a central position Light-emitting element; means for determining the specification of the solid-state light-emitting element system, wherein the system specification may be control temperature, operating current, or lifetime, wherein the control temperature is determined by the required life and operating current in the database, The operating current is determined by the required life and measured temperature in the database, or the lifetime is determined by the operating current and the measured temperature in the library. A system for estimating the size of a solid state light emitting device system according to claim 15, wherein the measured temperature is measured by a pin temperature in a solid state light emitting device at a central position of the solid state light emitting device system. A system for estimating a specification of a solid state light emitting device system according to claim 16, wherein each of the solid state light emitting elements may be an element of a light emitting diode. A system for estimating the specification of a solid state light emitting device system according to claim 17, wherein the stitches are the pins of the light emitting diode die.