TWI418831B - Durability testing apparatus - Google Patents

Description

Durability test device

The present invention relates to a durability testing device, and more particularly to a durability testing device for a luminaire.

Light-Emitting Diode is a semiconductor component, and the material of the light-emitting chip mainly uses a compound of a group III-V chemical element, such as gallium phosphide (GaP) or gallium arsenide (GaAs), and the principle of light emission is Convert electrical energy into light energy. In detail, the light-emitting diode releases excess energy in the form of light by applying a current to the compound semiconductor to transmit a combination of electrons and holes. Since the luminescence phenomenon of the illuminating diode does not illuminate by heating or discharging, the life of the illuminating diode is as long as 100,000 hours or more. In addition, the light-emitting diode has the advantages of fast response speed, small volume, power saving, low pollution, high reliability, and suitable for mass production, so the application field of the light-emitting diode is very wide, such as a large billboard, traffic light , light sources for mobile phones, scanners, fax machines, and light-emitting diode lamps.

In the case of a light-emitting diode luminaire, in order to ensure the quality of the luminaire, relevant tests of the luminaire are performed in the assembly process of the luminaire. For example, in order to ensure the life of the luminaire, after the luminaire is assembled, the corresponding durability test is carried out for its applicable voltage specification, also known as the burn in test. However, in the production line layout of existing lamps, the production line of finished or semi-finished products is carried out station by station, that is, both finished products and semi-finished products will flow into the next station after the completion of the previous station process. change In other words, when a batch of luminaires is assembled and moved to the test equipment to adjust the corresponding voltage for testing, but the test equipment is a single-input and single-out equipment, that is, after testing a batch of luminaires, take it out and proceed to the next Batch testing of lamps. In this way, when the production line completes a variety of lamps of different specifications, it is inevitable that a plurality of lamps will wait for testing outside the device, and thus the station will become a bottleneck in the efficiency of the production line. If the test equipment is to be added at this time, there will be a problem that the manufacturing cost increases.

The present invention provides a durability test apparatus capable of simultaneously testing a plurality of lamps.

The present invention provides a durability testing device for testing a plurality of luminaires. The durability testing device includes at least one conveying unit, at least one carrying unit, and a voltage testing unit. The transport unit has a pair of conveyor belts. The carrier unit carries the luminaire and is disposed on the conveyor belt to move with the conveyor belt. The voltage test unit is arranged between the conveyor belts. The voltage test unit includes a control module, a housing, and at least one roller. The housing has at least one opening. The roller is electrically connected to the control module and protrudes from the opening to the housing. The carrying unit passes over the roller and contacts the roller to transmit the voltage provided by the control module to the luminaire via the carrying unit.

In an embodiment of the invention, the carrying unit comprises a base and a plurality of connecting members. The base is placed on the conveyor belt to move with the conveyor belt. The connectors are arranged in an array on the base. The rollers contact the base to transmit the voltage of the control module to the connectors, and the lamps are adapted to be connected to the connectors, respectively.

In an embodiment of the invention, a bracket and a lifting unit are further included, and at least one conveying unit comprises a plurality of conveying units which are stacked on the bracket. The lifting unit is connected to the conveying unit, and the at least one carrying unit comprises a plurality of carrying units, and the lifting unit conveys the carrying units located in at least one of the conveying units to at least one of the conveying units.

In an embodiment of the invention, the control module includes a plurality of voltage sources respectively corresponding to the plurality of transport units and connected to the plurality of rollers on each transport unit.

In an embodiment of the invention, the control module further includes a controller and a sensor, and the controller is electrically connected to the lifting unit. The sensor is electrically connected to the controller. Each carrier unit has an identification component. The sensor senses the identification elements of each of the carrier units such that the controller drives the lifting unit to deliver the carrier unit to the corresponding delivery unit.

In an embodiment of the present invention, the plurality of conveying units include a first conveying unit and at least one second conveying unit, wherein the carrying unit disposed on the first conveying unit moves toward the lifting unit and is disposed in the second conveying The carrier unit on the unit moves away from the lifting unit.

Based on the above, in the above-described embodiment of the present invention, the durability testing device carries the luminaire on the carrying unit on the conveyor belt by the voltage testing unit disposed between the conveying unit and the conveyor belt disposed on the conveying unit. When the carrying unit passes over the roller of the testing unit, the carrying unit is electrically conductive by contacting the roller, so that the voltage provided by the control module is transmitted to the luminaire via the carrying unit for durability testing. This move makes the conventional bottleneck of the lighting production line on site, so as to effectively reduce the production efficiency of the luminaire.

The above described features and advantages of the present invention will be more apparent from the following description.

1 is a schematic view of a durability testing device in accordance with an embodiment of the present invention. Referring to FIG. 1 , in the embodiment, the durability testing device 100 is used to test a plurality of lamps 200 . Here, the lamp 200 is, for example, a light-emitting diode lamp, and the durability testing device 100 is a burning machine (burn in The device is used to provide a voltage for a period of time after the assembled luminaire 200 to confirm and verify the durability of the luminaire 200.

The durability testing device 100 includes a first conveying unit 110, a plurality of second conveying units 120 and 130, a plurality of carrying units 140, a voltage testing unit 150, and a bracket 160. The conveying units 110, 120 and 130 are stacked on the bracket 160, and each of the conveying units 110, 120 and 130 has a pair of conveyor belts 112, 122 and 132, which are respectively composed of a plurality of conveying rollers, respectively, but the present embodiment The version of the conveyor belts 112, 122 and 132 is not limited by way of example. The carrying units 140 are respectively disposed on the conveyor belts 112, 122 and 132 of the respective conveying units 110, 120 and 130 to move along with the conveyor belts 112, 122 and 132. The luminaire 200 is adapted to be disposed on the carrier unit 140.

2 is a block diagram showing electrical connections of the durability test apparatus of FIG. 1. 3 is a partial enlarged view of the durability testing device of FIG. 1, wherein FIG. 3 is described by taking only the second conveying unit 120 of one of the layers as a representative. Referring to FIG. 1 to FIG. 3 simultaneously, in the present embodiment, the voltage testing unit 150 is disposed between the conveyor belts 122, 132 of the second conveying units 120, 130. The voltage test unit 150 includes a control module 152, a housing 154, and a plurality of rollers 156. The control module 152 is used to provide the voltage required for the luminaire 200 to perform durability testing. The housing 154 has a plurality of openings 154a. The roller 156 is disposed on the housing 154, and is electrically connected to the control module 152 and protrudes from the corresponding opening 154a to the housing 154. The roller 156 is located on the carrying unit 140 by the conveyor belts 122, 132. On the path of the journey. In other words, when the carrying unit 140 is traveling over the roller 156, the roller 156 is in contact with the carrying unit 140, and the voltage provided by the control module 152 is transmitted to the luminaire 200 via the carrying unit 140, thereby being paired on the carrying unit 140. The upper luminaire 200 is tested for durability.

Based on the above, the present invention allows the luminaire 200 disposed on the carrying unit 140 to pass through the transport unit 120, 130 having the conveyor belts 122, 132 and the voltage test unit 150 disposed between the conveyor belts 122, 132. When the roller 156 of the voltage testing unit 150 is above, the roller 156 and the carrying unit 140 are brought into contact with each other, and the voltage of the control module 152 is transmitted to the luminaire 200 via the roller 156 and the carrying unit 140, thereby performing durability testing on the luminaire 200. This effectively utilizes the dynamic line configuration relationship between the transport units 120, 130 having the conveyor belts 122, 132 and the voltage test unit 150 disposed between the conveyor belts 122, 132, thereby enabling the luminaire 200 to be tested for durability. It is not necessary to wait in front of a fixed test equipment like the conventional technology, so that the problem of the production line bottleneck in the conventional technology can be effectively solved, and the production efficiency of the luminaire 200 can be improved.

4 is a partial enlarged view of the durability testing device of FIG. 1. Referring to FIG. 4, in the present embodiment, the first conveying unit 110 is used as a fitting line of the luminaire 200, and the bearing on the first conveying unit 110 The unit 140 includes a base 142 and a plurality of connectors 144 that are arrayed on the base 142. While the carrier unit 140 is transporting on the first transport unit 110, the operator can attach the assembled luminaire 200 to the connector 144 on the carrier unit 140. Furthermore, the durability testing device 100 further includes a lifting unit 170 that connects the first conveying unit 110, the second conveying unit 120, and the third conveying unit 130. In the present embodiment, the lifting unit 170 is configured to transfer the carrier unit 140 at the first conveying unit 110 to the corresponding second conveying unit 120 or the third conveying unit 130.

Referring again to FIG. 2, it is noted here that the control module 152 includes a plurality of voltage sources 152a, wherein the voltage sources 152a are correspondingly connected to the rollers of the second and third transport units 130, respectively. In other words, by arranging different voltage sources 152a, the second transport unit 120 and the third transport unit 130 become test lines having different voltage test specifications, so that a plurality of different simultaneously can be performed on the first transport unit 110. The luminaire 200 of the specification is assembled and transferred to the corresponding second conveying unit 120 or the third conveying unit 130 via the lifting unit 170 once it is assembled. This allows the durability test apparatus 100 to have diverse test conditions, thereby improving the problem of conventional production bottlenecks.

In addition, FIG. 5 is a partial enlarged view of the carrying unit in the durability testing device of FIG. 1. Referring to FIG. 2 and FIG. 5 simultaneously, in the embodiment, the control module 152 further includes a controller 152b and a sensor 152c. The controller 152b is electrically connected to the lifting unit 170 (shown in FIG. 1), and senses. The switch 152c is electrically connected to the controller 152b. More importantly, each of the carrying units 140 has an identifying component 146. In the present embodiment, the identifying component 146 is, for example, a multi-segment switch disposed on the carrying unit 140, on which various voltage values can be displayed. After the operator assembles the luminaire 200, the multi-stage switch is set to the voltage value corresponding to the luminaire 200 on the batch carrying unit 140, and when the carrying unit 140 passes the sensor 152c, the sensor 152c senses The address on the multi-segment switch causes the controller 152b to drive the lifting unit 170 to transport the carrying unit 140 to the corresponding second conveying unit 120 or the third conveying unit 130. However, this embodiment does not limit the mechanism for determining where the bearer unit 140 should be transmitted, and is described herein only in a preferred embodiment.

On the other hand, the present invention also does not limit the number of the first transport unit 110, the second transport unit 120, and the third transport unit 130, and their configuration, and the line layout adjuster can be flexibly adjusted according to their production requirements. For example, the delivery unit for durability testing is added to cope with a variety of lamp types, or two sets of durability testing devices are combined at the same time, so that the two first conveying units are combined with a second conveying unit and a third conveying unit. It is applicable to the present invention by sharing the second transport unit and the third transport unit to increase the yield of the luminaire.

In summary, in the above embodiment of the invention, the durability testing device carries the luminaire on the carrying unit on the conveyor belt by means of a voltage test unit arranged between the transport unit and the conveyor belt of the transport unit. When the carrying unit passes over the roller of the testing unit, the carrying unit is electrically conductive by contacting the roller, so that the voltage provided by the control module is transmitted to the luminaire via the carrying unit for durability testing. This allows the luminaire to be in the flow production line of the conveyor unit. It is known that the bottleneck of the lighting line of the luminaire is solved step by step, thus effectively increasing the production efficiency of the luminaire.

Although the present invention has been disclosed in the above embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art can make some modifications and refinements without departing from the spirit and scope of the invention. The scope of the invention is defined by the scope of the appended claims.

100. . . Durability test device

110. . . First conveying unit

112, 122, 132. . . conveyor

120, 130. . . Second conveying unit

140. . . Bearer unit

142. . . Base

144. . . Connector

146. . . Identification component

150. . . Voltage test unit

152. . . Control module

152a. . . power source

152b. . . Controller

152c‧‧‧ sensor

154‧‧‧Shell

154a‧‧‧ openings

156‧‧‧Roller

160‧‧‧ bracket

170‧‧‧ Lifting unit

200‧‧‧ lamps

1 is a schematic view of a durability testing device in accordance with an embodiment of the present invention.

2 is a block diagram showing electrical connections of the durability test apparatus of FIG. 1.

Fig. 3 is a partial enlarged view of the durability testing device of Fig. 1.

4 is a partial enlarged view of the durability testing device of FIG. 1.

Fig. 5 is a partial enlarged view of the carrying unit in the durability testing device of Fig. 1.

100. . . Durability test device

110. . . First conveying unit

112, 122, 132. . . conveyor

120, 130. . . Second conveying unit

140. . . Bearer unit

160. . . support

170. . . Lifting unit

200. . . Lamp

Claims (10)

A durability testing device for testing a plurality of lamps, the durability testing device comprising: at least one conveying unit having a pair of conveyor belts; at least one carrying unit carrying the lamps and disposed on the pair of conveyor belts for Moving on the pair of conveyor belts, wherein the carrying unit comprises: a base disposed on the pair of conveyor belts for moving along the pair of conveyor belts; a plurality of connecting members arranged in an array on the base; a voltage testing unit Between the pair of conveyor belts, the voltage testing unit includes: a control module for providing voltage; a housing having at least one opening; and at least one roller electrically connected to the control module An opening protrudes from the housing, the carrying unit passes over the roller and the base contacts the roller to transmit a voltage provided by the control module to the connector, and the lamps are adapted to be respectively connected to the connectors To accept the voltage. The durability testing device according to claim 1, further comprising: a bracket, wherein the at least one conveying unit comprises a plurality of conveying units stacked on the bracket; and a lifting unit connecting the conveying a unit, wherein the at least one carrying unit comprises a plurality of carrying units, and the lifting unit is located at the conveying units At least one of the carrying units is delivered to at least one of the plurality of conveying units. The durability testing device of claim 2, wherein the control module comprises: a plurality of voltage sources respectively corresponding to the conveying units and electrically connected to the rollers. The durability testing device of claim 2, wherein the control module further comprises: a controller; electrically connecting the lifting unit; and a sensor electrically connected to the controller, and each of the controllers The carrying unit has an identifying component, and the sensor senses the identifying component of each of the carrying units, so that the controller drives the lifting unit to transport the carrying units to the corresponding conveying unit. The durability testing device of claim 2, wherein the conveying units comprise: a first conveying unit, the carrying units disposed on the first conveying unit are moved toward the lifting unit; and at least one The second conveying unit moves the plurality of carrying units disposed on the second conveying unit away from the lifting unit. A durability testing device for testing a plurality of lamps, the durability testing device comprising: a plurality of conveying units, each of the conveying units having a pair of conveyor belts; and a plurality of carrying units carrying the lamps and configured to be transported in the pair Belted to move with the pair of conveyor belts; a voltage test unit is disposed between the pair of conveyor belts, the high voltage test unit includes: a control module for providing voltage; a casing having at least one opening; and at least one roller electrically connected to the control module And extending from the opening to the housing, the carrying units passing over the roller and contacting the roller, so that the voltage provided by the control module is transmitted to the lamps through the carrying units; a bracket, the conveying The unit is stacked on the bracket; and a lifting unit is connected to the conveying units, and the lifting unit transports the carrying units located in at least one of the conveying units to at least one of the conveying units another. The durability testing device of claim 1, wherein each of the carrying units comprises: a base disposed on the pair of conveyor belts to move with the pair of conveyor belts; and a plurality of connecting members arranged in an array On the base, the roller contacts the base to transmit the voltage provided by the control module to the connector, and the lamps are adapted to be respectively connected to the connectors. The durability testing device of claim 1, wherein the control module comprises: a plurality of voltage sources respectively corresponding to the conveying units and electrically connected to the rollers. The durability testing device according to claim 1, wherein The control module further includes: a controller; electrically connecting the lifting unit; and a sensor electrically connected to the controller, and each of the carrying units has an identifying component, and the sensor senses each The identification component of the carrying unit is such that the controller drives the lifting unit to transport the carrying units to the corresponding conveying unit. The durability testing device of claim 1, wherein the conveying units comprise: a first conveying unit, the carrying units disposed on the first conveying unit are moved toward the lifting unit; and at least one The second conveying unit moves the plurality of carrying units disposed on the second conveying unit away from the lifting unit.