TWI412636B - Zno nanorods thin films and fabricated method - Google Patents

Zno nanorods thin films and fabricated method Download PDF

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TWI412636B
TWI412636B TW99101331A TW99101331A TWI412636B TW I412636 B TWI412636 B TW I412636B TW 99101331 A TW99101331 A TW 99101331A TW 99101331 A TW99101331 A TW 99101331A TW I412636 B TWI412636 B TW I412636B
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zinc oxide
zinc
growth
film
seed layer
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TW201126030A (en
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Chu Chi Ting
Chang Hung Li
Chih You Kuo
Hsiang Chen Wang
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Nat Univ Chung Cheng
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Abstract

The invention provides a method to fabricate compact and highly c-axis-oriented ZnO nanorods thin films on silica glass substrates by a simple solution-growth technique. The ZnO seed layer coated substrate is immersed in 0.001 to 0.1 M ZnO precursor solution at 50-100 DEG C /0.5-10 h to grow ZnO nanorods layer. Under the best fabricated parameters, ZnO nanorods thin film can be synthesized. The invention gives a simple solution-growth method for the fabrication of low-cost, low-temperature grown, high density and well optical characteristic ZnO nanorods thin films.

Description

氧化鋅奈米柱薄膜及其製備方法Zinc oxide nano column film and preparation method thereof

本案係關於一種氧化鋅奈米柱薄膜及其製備方法。This case relates to a zinc oxide nanocolumn film and a preparation method thereof.

氧化鋅(ZnO)是一種直接能隙的半導體,在室溫下能隙約為3.37eV,其有很大的激子束縛能(60meV)和很高的折射率(n=2.01對於550nm的光),因為良好的光電特性,其被廣泛應用在發光二極體和太陽能電池上。Zinc oxide (ZnO) is a direct-gap semiconductor with a band gap of about 3.37 eV at room temperature, which has a large exciton binding energy (60 meV) and a high refractive index (n=2.01 for 550 nm light). ), because of its good optoelectronic properties, it is widely used in light-emitting diodes and solar cells.

既有氧化鋅薄膜製備方法屬於製程複雜且高成本之技術方案,包括有化學氣相沉積法(Chemical vapor deposition,CVD)、雷射蝕刻法(laser ablation)、濺鍍法(sputtering)或溶凝膠旋鍍法(sol-gel spin coating)等;且化學氣相沉積法、雷射蝕刻法或濺鍍法等方法之製程須在真空或高溫的過程下進行,成本極高。因此,尋找非真空、低溫、低成本的簡單製程即成為非常重要之課題。近年來,諸如低溫溶液成長法(Vayssieres et al.,J. Phys. Chem. B 2001,105,3350)等既有氧化鋅奈米柱薄膜製備方法已被用以成長氧化鋅奈米柱薄膜。該氧化鋅奈米柱薄膜是由六角形奈米柱組成,晶柱間有很多未填滿的空孔。The existing zinc oxide film preparation method is a complicated and high-cost technical solution, including chemical vapor deposition (CVD), laser ablation, sputtering or coagulation. The method of sol-gel spin coating, etc.; and the processes of chemical vapor deposition, laser etching or sputtering are carried out under vacuum or high temperature, and the cost is extremely high. Therefore, finding a simple process that is not vacuum, low temperature, and low cost becomes a very important issue. In recent years, a method for preparing a zinc oxide nanocolumn film such as a low temperature solution growth method (Vayssieres et al., J. Phys. Chem. B 2001, 105, 3350) has been used to grow a zinc oxide nanocolumn film. The zinc oxide nanocolumn film is composed of hexagonal nano columns, and there are many unfilled holes between the crystal columns.

雖然先前技術已存在有前述諸如低溫溶液成長法等既有氧化鋅奈米柱薄膜製備方法,然而,從諸如學術研究(Tak et al.,J. Phys. Chem. B 2005,109,19263)揭露有關藉由該等既有氧化鋅奈米柱薄膜製備方法所製備氧化鋅奈米柱薄膜之物理特性可知,就本案申請前的先前技術而言,即使改變諸如成長溶液之pH值、成長溫度、晶種層、鋅離子濃度等成長條件會影響氧化鋅奈米柱薄膜之特性,但所製成之氧化鋅奈米柱薄膜仍不緻密,無法提供具有良好光學特性之高緻密化氧化鋅奈米柱薄膜。Although the prior art already has the aforementioned method for preparing a zinc oxide nanocolumn film such as a low temperature solution growth method, it is disclosed from, for example, academic research (Tak et al., J. Phys. Chem. B 2005, 109, 19263). With regard to the physical properties of the zinc oxide nano-pillar film prepared by the method for preparing the existing zinc oxide nano-pillar film, it is known that the prior art prior to the application of the present application changes the pH, growth temperature, and the like of the growth solution, Growth conditions such as seed layer and zinc ion concentration affect the characteristics of the zinc oxide nano-pillar film, but the prepared zinc oxide nano-pillar film is still not dense and cannot provide high-density zinc oxide nanocrystals with good optical properties. Column film.

另一方面,在美國專利公開第2007/0220713號公報(US 2007/0220713 A1)中亦揭露有奈米柱薄膜的製備方法,但此方法亦無法提供緻密的奈米柱薄膜。亦即先前技術文獻明確指出在先前技術中顯然存在有技術成見或技術障礙,導致該等既有氧化鋅奈米柱薄膜製備方法並不能提供具有良好光學特性之高緻密化氧化鋅奈米柱薄膜。On the other hand, a method for preparing a nano-pillar film is also disclosed in U.S. Patent Publication No. 2007/0220713 (US 2007/0220713 A1), but this method also fails to provide a dense nano-pillar film. That is, the prior art documents clearly indicate that there are obvious technical stereotypes or technical obstacles in the prior art, which results in the preparation of such existing zinc oxide nanocolumn thin films and does not provide a highly densified zinc oxide nanocolumn having good optical properties. film.

由上述可知,既有氧化鋅奈米柱薄膜製備方法之缺點在於:藉由既有氧化鋅奈米柱薄膜製備方法所成長出之氧化鋅奈米柱薄膜,其內部有很多空孔且不緻密,以致於不能提供具有良好光學特性之高緻密化氧化鋅奈米柱薄膜。It can be seen from the above that the disadvantages of the preparation method of the zinc oxide nano-pillar film are: the zinc oxide nano-pillar film which is formed by the method for preparing the zinc oxide nano-pillar film, has many pores inside and is not dense. Therefore, a highly densified zinc oxide nanocolumn film having good optical properties cannot be provided.

有鑒於既有氧化鋅奈米柱薄膜製備方法之缺點,本發明之目的在於提供一種克服先前技術的技術成見及技術障礙而能夠改善該缺點之氧化鋅奈米柱薄膜製備方法。本發明之氧化鋅奈米柱薄膜製備方法以低溫溶液法為基礎,採用簡單製程、低溫與低成本之方式製備出具有諸如高c軸優選性等良好光學特性之高緻密化氧化鋅奈米柱薄膜。In view of the shortcomings of the prior art zinc oxide nano-pillar film preparation method, it is an object of the present invention to provide a zinc oxide nano-pillar film preparation method which can overcome the disadvantages of the prior art and can overcome the disadvantages. The method for preparing a zinc oxide nano-pillar film of the invention is based on a low-temperature solution method, and a high-density zinc oxide nano column having good optical properties such as high c-axis preference is prepared by a simple process, low temperature and low cost. film.

為達到前述目的,本發明所採取之技術手段係令前述氧化鋅奈米柱薄膜製備方法包括有:在一基板上形成氧化鋅晶種層;於氧化鋅奈米柱薄膜成長溶液中於50~100℃之成長溫度及0.5~10小時之成長時間下,令前述氧化鋅晶種層上成長出一氧化鋅晶柱層,進而獲取一成長有晶柱層之氧化鋅奈米柱薄膜,其中該氧化鋅奈米柱薄膜成長溶液係鋅離子濃度在0.001~0.1M且含有六亞甲四胺之水溶液。In order to achieve the above object, the technical means adopted by the present invention is that the zinc oxide nano-pillar film preparation method comprises: forming a zinc oxide seed layer on a substrate; and growing in a zinc oxide nano-pillar film growth solution at 50 to a growth temperature of 100 ° C and a growth time of 0.5 to 10 hours, wherein a zinc oxide crystal column layer is grown on the zinc oxide seed layer to obtain a zinc oxide nano-pillar film having a crystal column layer, wherein The zinc oxide nanocolumn film growth solution is an aqueous solution containing hexamethylenetetramine having a zinc ion concentration of 0.001 to 0.1 M.

本發明之氧化鋅奈米柱薄膜製備方法具有上述技術特徵,其以低溫溶液成長法為基礎,藉由控制成長溫度、溶液濃度與成長時間製備成長得非常緻密且具有良好光學特性之氧化鋅奈米柱薄膜而確實能夠達到本發明之目的。The method for preparing a zinc oxide nanocolumn film of the invention has the above technical features, and based on the low temperature solution growth method, the zinc oxide naphthalene which grows very dense and has good optical properties is prepared by controlling the growth temperature, the solution concentration and the growth time. The rice column film can indeed achieve the object of the present invention.

又由於在實施本發明之氧化鋅奈米柱薄膜製備方法時,只要藉由簡單的化學藥品混合即可得到成長氧化鋅奈米柱所需的化學溶液,因此相較於採用諸如其他物理或化學薄膜成長法之既有氧化鋅奈米柱薄膜製備方法,本發明之氧化鋅奈米柱薄膜製備方法具有製程簡單、低溫與低成本之優點。Moreover, in the preparation of the zinc oxide nanocolumn film of the present invention, the chemical solution required for growing the zinc oxide nano column can be obtained by simple chemical mixing, and thus, for example, other physical or chemical processes are employed. The film growth method has the method for preparing a zinc oxide nano column film, and the method for preparing the zinc oxide nano column film of the invention has the advantages of simple process, low temperature and low cost.

此外,藉由前述氧化鋅奈米柱薄膜製備方法,本發明亦提供高緻密性且具有良好光學特性之氧化鋅奈米柱薄膜。In addition, the present invention also provides a zinc oxide nanocolumn film having high density and good optical properties by the aforementioned zinc oxide nanocolumn film preparation method.

本發明之氧化鋅奈米柱薄膜製備方法在Vayssieres等人之低溫溶液成長法之基礎上採用諸如濃度、溫度或時間等特定的製程參數,以合成出具有良好光學特性之高緻密化氧化鋅奈米柱薄膜。本發明之氧化鋅奈米柱薄膜除了空孔較少且六角晶柱相互融合而呈現出緻密化性質之外,並具有相當良好的光學特性(例如:成長6小時後所得到的氧化鋅奈米柱薄膜,厚度約為800nm、可見光穿透率可達85%、折射率為1.74、堆積密度為0.84)。The method for preparing a zinc oxide nanocolumn film of the present invention uses a specific process parameter such as concentration, temperature or time on the basis of the low temperature solution growth method of Vayssieres et al. to synthesize a highly densified zinc oxide naphthalene having good optical properties. Rice column film. The zinc oxide nanocolumn film of the present invention has relatively good optical properties (for example, zinc oxide nanoparticle obtained after 6 hours of growth), except that the pores are small and the hexagonal crystal columns are fused to each other to exhibit densification properties. The column film has a thickness of about 800 nm, a visible light transmittance of 85%, a refractive index of 1.74, and a bulk density of 0.84.

以下藉由實施例配合圖式進一步具體例示說明本發明。應注意的是該等實施例係用以說明本發明者,而非藉以在任何方面限制本發明之範圍。The invention will be further exemplified by the following examples in conjunction with the drawings. It is to be noted that the examples are intended to be illustrative of the invention and are not intended to limit the scope of the invention in any way.

本發明之氧化鋅奈米柱薄膜製備方法包括有晶種層製備步驟和晶柱層製備步驟。The method for preparing a zinc oxide nanocolumn film of the present invention comprises a seed layer preparation step and a crystal column layer preparation step.

【實施例1】[Example 1]

本實施例例示有關採用溶凝膠法(Sol-gel法)製備晶種層之實施態樣。This embodiment exemplifies an embodiment in which a seed layer is prepared by a sol-gel method (Sol-gel method).

1.製備氧化鋅晶種層溶凝膠溶液。首先,將乙二醇單甲醚(2-methoxyethanol,2-MOE,HOC2 H4 OCH3 )、單乙醇胺(monoethanolamine,MEA,HOC2 H4 NH2 )和醋酸鋅(zinc acetate,Zn(CH3 COO)2 ),以莫爾比例鋅離子(Zn2+ ):乙二醇單甲醚:單乙醇胺=1:10~40:1之比例混合成一混合溶液。接著將前述混合溶液攪拌十小時,以獲取一氧化鋅晶種層溶凝膠溶液。又除了前述醋酸鋅之外,亦可採用溴化鋅、氯化鋅、氟化鋅、碘化鋅、硫化鋅、硫酸鋅、或硝酸鋅等化合物來提供前述鋅離子(Zn2+ )。1. Preparation of a zinc oxide seed layer solution gel solution. First, ethylene glycol monomethyl ether (2-methoxyethanol, 2-MOE, HOC 2 H 4 OCH 3 ), monoethanolamine (MEA, HOC 2 H 4 NH 2 ), and zinc acetate (Zn (CH) 3 COO) 2 ), mixed into a mixed solution in a molar ratio of zinc ion (Zn 2+ ): ethylene glycol monomethyl ether: monoethanolamine = 1:10 to 40:1. Next, the above mixed solution was stirred for ten hours to obtain a zinc oxide seed layer-soluble gel solution. Further, in addition to the zinc acetate described above, the zinc ion (Zn 2+ ) may be provided by a compound such as zinc bromide, zinc chloride, zinc fluoride, zinc iodide, zinc sulfide, zinc sulfate or zinc nitrate.

2.製備氧化鋅晶種層。以旋轉塗佈方式將前述氧化鋅晶種層溶凝膠溶液塗佈到一基板上,該基板可為玻璃基板,在100℃之加熱板軟烤10分鐘後,以200℃燒結10分鐘,再放在200~800℃下退火,以形成一氧化鋅晶種層。又,除玻璃基板之外,亦可採用石英材質、單晶矽材質、多晶矽材質或藍寶石材質之基板,或是軟性材質的有機物基板,如:聚對苯二甲酸乙二醇酯(PET)、壓克力、聚醯亞胺(polyimide)。2. Preparation of a zinc oxide seed layer. Coating the zinc oxide seed layer sol gel solution onto a substrate by spin coating. The substrate may be a glass substrate, and after soft baking for 10 minutes on a hot plate at 100 ° C, sintering at 200 ° C for 10 minutes, and then Annealing at 200 to 800 ° C to form a zinc oxide seed layer. Further, in addition to the glass substrate, a substrate made of quartz material, single crystal germanium material, polycrystalline germanium material or sapphire material, or a soft organic material substrate such as polyethylene terephthalate (PET) may be used. Acrylic, polyimide.

前述藉由本實施例所例示之方法所形成氧化鋅晶種層之晶粒大小約5~100nm、厚度大約20~90nm。The zinc oxide seed layer formed by the method exemplified in the present embodiment has a crystal grain size of about 5 to 100 nm and a thickness of about 20 to 90 nm.

又,另一有關採用前述溶凝膠法製備晶種層之具體例示係令氧化鋅晶種層之退火溫度為400℃,以在前述基板上形成晶粒大小約為20nm之氧化鋅晶種層。Further, another specific example of preparing the seed layer by the aforementioned lyotropic method is to anneal the zinc oxide seed layer to 400 ° C to form a zinc oxide seed layer having a grain size of about 20 nm on the substrate. .

如第一圖(a)至第一圖(c)所示,欲成長緻密化氧化鋅奈米柱薄膜必須使用晶粒大小為1~100nm之表面平整的晶種層。若晶種層的晶粒太大,會使得晶種層表面不夠平整,將導致長出之氧化鋅奈米柱過於凌亂,而無法形成緻密化的氧化鋅奈米柱薄膜。如第一圖(d)所示,若以800℃退火之氧化鋅薄膜晶粒大小約100-150nm,長出之氧化鋅奈米柱非常凌亂,無法形成緻密化的氧化鋅奈米柱薄膜。As shown in the first (a) to the first (c), in order to grow the densified zinc oxide nano-pillar film, it is necessary to use a seed layer having a grain size of 1 to 100 nm. If the grain size of the seed layer is too large, the surface of the seed layer is not flat enough, which will cause the grown zinc oxide nano column to be too messy to form a densified zinc oxide nano-pillar film. As shown in the first diagram (d), if the grain size of the zinc oxide film annealed at 800 ° C is about 100-150 nm, the grown zinc oxide nano column is very messy, and a dense zinc oxide nano-pillar film cannot be formed.

【實施例2】[Example 2]

本實施例例示有關採用濺鍍法製備晶種層之實施態樣。藉由濺鍍法可於一基板上所形成晶粒大小約20~100nm之氧化鋅晶種層。This embodiment exemplifies an embodiment in which a seed layer is prepared by sputtering. A zinc oxide seed layer having a crystal grain size of about 20 to 100 nm can be formed on a substrate by sputtering.

由於濺鍍法屬於周知技術,其實施細節已為本發明所屬技術領域中具有通常知識者所習知,茲不贅述其常規細節,僅臚例其參數如下:基板材質諸如:硬性材質的無機物基板,如:玻璃、石英、單晶矽、多晶矽或藍寶石,或是諸如聚對苯二甲酸乙二醇酯(PET)、壓克力或聚醯亞胺(polyimide)等軟性材質的有機物基板。Since the sputtering method is well-known in the art, the details of the implementation are well known to those of ordinary skill in the art to which the present invention pertains, and the conventional details are not described herein. The parameters are as follows: substrate material such as: an inorganic substrate of a hard material. Such as: glass, quartz, single crystal germanium, polycrystalline germanium or sapphire, or an organic substrate such as polyethylene terephthalate (PET), acrylic or polyimide.

基板溫度:室溫-600℃。Substrate temperature: room temperature -600 °C.

1.氣體流量:氧氣(O2 )氣體流量為30sccm,氬氣(Ar)氣體流量為8sccm。1. Gas flow rate: oxygen (O 2 ) gas flow rate is 30 sccm, and argon (Ar) gas flow rate is 8 sccm.

2.背景壓力:5×10-6 torr。2. Background pressure: 5 × 10 -6 torr.

3.工作壓力:15mtorr。3. Working pressure: 15mtorr.

4.RF power:150W。4.RF power: 150W.

5.濺鍍時間:5分鐘。5. Sputtering time: 5 minutes.

6.基板溫度:室溫~600℃。6. Substrate temperature: room temperature to 600 °C.

如第一圖(e)所示,藉由本實施例所例示之方法於一基板上所形成氧化鋅晶種層之晶粒大小約5~50nm。As shown in the first diagram (e), the crystal grain size of the zinc oxide seed layer formed on a substrate by the method exemplified in the embodiment is about 5 to 50 nm.

又,另一有關採用前述濺鍍法製備晶種層之具體例示,係將實施前述濺鍍法中所使用的基板的溫度維持在室溫(room temperature,RT),以在該基板上形成晶粒大小約為20nm之氧化鋅晶種層。Further, another specific example of preparing the seed layer by the sputtering method is to maintain the temperature of the substrate used in the sputtering method at room temperature (RT) to form a crystal on the substrate. A zinc oxide seed layer having a particle size of about 20 nm.

如前所述欲成長緻密化氧化鋅奈米柱薄膜必須使用晶粒大小為1~100nm之表面平整的氧化鋅晶種層,若氧化鋅晶種層的晶粒太大,會使得氧化鋅晶種層表面不夠平整,將導致長出之氧化鋅奈米柱過於凌亂,而無法形成緻密化的氧化鋅奈米柱薄膜。As described above, in order to grow a dense zinc oxide nano-pillar film, it is necessary to use a zinc oxide seed layer having a grain size of 1 to 100 nm. If the crystal grains of the zinc oxide seed layer are too large, zinc oxide crystals are formed. The surface of the seed layer is not flat enough, which will cause the grown zinc oxide nano column to be too messy to form a densified zinc oxide nano-pillar film.

上述實施例所例示的旋轉塗佈法與本實施例所例示的濺鍍法已充分說明製得氧化鋅晶種層之可行方法。此外,其他如浸鍍法、噴塗法、有機金屬化學氣相沉積法(MOCVD),雷射剝鍍法等亦可被用以製造出晶粒大小為1~100nm之表面平整的氧化鋅晶種層。換言之,該等方法皆適用於製造本發明之氧化鋅晶種層。The spin coating method exemplified in the above embodiment and the sputtering method exemplified in the present embodiment have fully explained a feasible method for producing a zinc oxide seed layer. In addition, other methods such as immersion plating, spray coating, metalorganic chemical vapor deposition (MOCVD), laser stripping, etc. can also be used to produce a zinc oxide seed crystal having a grain size of 1 to 100 nm. Floor. In other words, the methods are all suitable for making the zinc oxide seed layer of the present invention.

【實施例3】[Example 3]

成長氧化鋅奈米柱薄膜時可採用多階段(multiple-stepwise)或單階段(one-step)兩種製程方式。本實施例例示有關採用多階段製程製備晶柱層之實施態樣。The growth of the zinc oxide nano-pillar film can be performed in a multiple-stepwise or one-step process. This embodiment exemplifies an embodiment in which a crystal column layer is prepared by a multi-stage process.

1.製備氧化鋅奈米柱薄膜成長溶液。奈米柱薄膜之成長溶液以硝酸鋅、六亞甲四胺(hexamethylenetetramine,HMT,C6 H12 N4 )和去離子水,以莫爾比例鋅離子(Zn2+ ):六亞甲四胺:去離子水=0.02~2:0.02~2:1000之比例製備鋅離子濃度在0.001~0.1M之氧化鋅奈米柱薄膜成長溶液。又除了前述硝酸鋅之外,亦可採用溴化鋅、氯化鋅、氟化鋅、碘化鋅、硫化鋅、硫酸鋅或醋酸鋅等化合物來提供前述鋅離子(Zn2+ )。1. Preparation of a zinc oxide nanocolumn film growth solution. The growth solution of the nano-pillar film is zinc nitrate, hexamethylenetetramine (HMT, C 6 H 12 N 4 ) and deionized water, molar ratio of zinc ion (Zn 2+ ): hexamethylenetetramine : A ratio of deionized water = 0.02 to 2: 0.02 to 2: 1000 to prepare a zinc oxide nano-pillar film growth solution having a zinc ion concentration of 0.001 to 0.1 M. Further, in addition to the zinc nitrate described above, a compound such as zinc bromide, zinc chloride, zinc fluoride, zinc iodide, zinc sulfide, zinc sulfate or zinc acetate may be used to provide the zinc ion (Zn 2+ ).

2.多階段製備氧化鋅晶柱層。成長溫度被控制在50~100℃,成長時間被控制在0.5~10小時。2. Preparation of a zinc oxide crystal column layer in multiple stages. The growth temperature is controlled at 50 to 100 ° C, and the growth time is controlled to 0.5 to 10 hours.

以75℃/6小時多階段製程為例,將形成有氧化鋅晶種層的基板放置在已經加熱到75℃之氧化鋅奈米柱薄膜成長溶液中成長1.5小時(亦即前述成長時間之四分之一)後,將基板取出再換到另一瓶新製備的氧化鋅奈米柱薄膜成長溶液中,同樣在75℃下成長1.5小時(亦即前述成長時間之四分之一),將前述放置基板於新製備氧化鋅奈米柱薄膜成長溶液中使之成長經過成長時間之四分之一之過程重複四次,亦即令前述基板分四次在四份新製備氧化鋅奈米柱薄膜成長溶液中經過全部成長時間後,完成奈米柱薄膜多階段製程成長,令前述氧化鋅晶種層成長出一氧化鋅晶柱層,進而獲取一成長有晶柱層之氧化鋅奈米柱薄膜。Taking a 75 ° C / 6 hour multi-stage process as an example, the substrate on which the zinc oxide seed layer is formed is placed in a zinc oxide nano-pillar film growth solution that has been heated to 75 ° C for 1.5 hours (that is, the aforementioned growth time of four) After one part, the substrate is taken out and transferred to another bottle of newly prepared zinc oxide nano-pillar film growth solution, and also grown at 75 ° C for 1.5 hours (that is, one quarter of the aforementioned growth time), The substrate is placed in a newly prepared zinc oxide nano-pillar film growth solution to grow it by four times of the growth time, that is, the substrate is divided into four portions to prepare a new zinc oxide nano-pillar film in four portions. After all the growth time in the growth solution, the multi-stage growth of the nano-pillar film is completed, and the zinc oxide seed layer is grown into a zinc oxide crystal column layer to obtain a zinc oxide nano-pillar film with a crystal column layer grown. .

在一個更具體的實施態樣中,係採用以前述溶凝膠法或濺鍍法所製備而形成晶粒大小約為20nm之氧化鋅晶種層上,採用鋅離子濃度為0.05M之氧化鋅奈米柱薄膜成長溶液、於75℃採用前述多階段製程成長6小時以獲取氧化鋅奈米柱薄膜。In a more specific embodiment, the zinc oxide seed layer having a grain size of about 20 nm is formed by the above-mentioned sol gel method or sputtering method, and zinc oxide having a zinc ion concentration of 0.05 M is used. The nanocolumn film growth solution was grown at 75 ° C for 6 hours using the above multi-stage process to obtain a zinc oxide nanocolumn film.

因為在成長奈米柱的過程中,鋅離子濃度會持續銷耗掉,若鋅離子的濃度太低,則奈米柱會趨向c軸成長,而不能成長為緻密化之奈米柱薄膜,故在本發明中使用多階段製程方法,其目的是在成長氧化鋅奈米柱時,一直保持固定的鋅離子濃度。Because in the process of growing the nano column, the zinc ion concentration will continue to be consumed. If the concentration of zinc ions is too low, the nano column will tend to grow toward the c-axis, and cannot grow into a densified nano-pillar film. In the present invention, a multi-stage process is used, the purpose of which is to maintain a constant zinc ion concentration while growing a zinc oxide nano column.

另一方面,除如前述使用多階段製程方法之外,亦得採用諸如可自動偵測鋅離子濃度變化而自動補充鋅離子濃度的機台,以在恆定鋅離子濃度中進行單階段製程者,同屬本發明之可行實施態樣。On the other hand, in addition to the multi-stage process as described above, it is also necessary to use a machine such as an auto-remediation of zinc ion concentration to automatically replenish the zinc ion concentration to perform a single-stage process in a constant zinc ion concentration. The same is true of the possible embodiments of the present invention.

【實施例4】[Embodiment 4]

本實施例例示有關採用單階段製程製備晶柱層之實施態樣。This embodiment illustrates an embodiment in which a crystal column layer is prepared by a single-stage process.

1.製備氧化鋅奈米柱薄膜成長溶液。奈米柱薄膜之成長溶液以醋酸鋅、六亞甲四胺(hexamethylenetetramine,HMT,C6 H12 N4 )和去離子水,以莫爾比例鋅離子(Zn2+ ):六亞甲四胺:去離子水=0.02~2:0.02~2:1000之比例製備鋅離子濃度在0.001~0.1M之氧化鋅奈米柱薄膜成長溶液。又除了前述醋酸鋅之外,亦可採用溴化鋅、氯化鋅、氟化鋅、碘化鋅、硫化鋅、硫酸鋅、或硝酸鋅等化合物來提供前述鋅離子(Zn2+ )。1. Preparation of a zinc oxide nanocolumn film growth solution. The growth solution of the nano-pillar film is zinc acetate, hexamethylenetetramine (HMT, C 6 H 12 N 4 ) and deionized water, molar ratio of zinc ion (Zn 2+ ): hexamethylenetetramine : A ratio of deionized water = 0.02 to 2: 0.02 to 2: 1000 to prepare a zinc oxide nano-pillar film growth solution having a zinc ion concentration of 0.001 to 0.1 M. Further, in addition to the zinc acetate described above, the zinc ion (Zn 2+ ) may be provided by a compound such as zinc bromide, zinc chloride, zinc fluoride, zinc iodide, zinc sulfide, zinc sulfate or zinc nitrate.

2.單階段製備氧化鋅晶柱層。成長溫度被控制在50~100℃,成長時間被控制在0.5~10小時。本實施例所例示單階段製程與前述多階段製程不同之處在於:本實施例所例示之單階段製程不更換氧化鋅奈米柱薄膜成長溶液,而直接在同一瓶氧化鋅奈米柱薄膜成長溶液中,讓形成有氧化鋅晶種層的基板成長到所設定的時間(例如:6小時)為止,亦即令前述基板在一份新製備氧化鋅奈米柱薄膜成長溶液中經過全部成長時間後,令前述氧化鋅晶種層成長出一氧化鋅晶柱層,進而獲取一成長有晶柱層之氧化鋅奈米柱薄膜。2. Preparation of a zinc oxide crystal column layer in a single stage. The growth temperature is controlled at 50 to 100 ° C, and the growth time is controlled to 0.5 to 10 hours. The single-stage process illustrated in this embodiment differs from the multi-stage process in that the single-stage process illustrated in this embodiment does not replace the zinc oxide nano-pillar film growth solution, but directly grows in the same bottle of zinc oxide nano-pillar film. In the solution, the substrate on which the zinc oxide seed layer is formed is grown for a set period of time (for example, 6 hours), that is, after the substrate is subjected to a full growth time in a newly prepared zinc oxide nano-pillar film growth solution. The zinc oxide seed layer is grown to form a zinc oxide crystal pillar layer, thereby obtaining a zinc oxide nanocolumn film having a crystal pillar layer.

在一個更具體的實施態樣中,係採用以前述溶凝膠法或濺鍍法所製備而形成晶粒大小約為20nm之氧化鋅晶種層上,採用鋅離子濃度為0.05M之氧化鋅奈米柱薄膜成長溶液、於75℃採用前述單階段製程成長6小時以獲取氧化鋅奈米柱薄膜。In a more specific embodiment, the zinc oxide seed layer having a grain size of about 20 nm is formed by the above-mentioned sol gel method or sputtering method, and zinc oxide having a zinc ion concentration of 0.05 M is used. The nanocolumn film growth solution was grown at 75 ° C for 6 hours using the aforementioned single-stage process to obtain a zinc oxide nanocolumn film.

【實施例5】[Embodiment 5]

實施例5例示有關量測確認本發明之氧化鋅奈米柱薄膜製備方法所製得氧化鋅奈米柱薄膜各種性質之實施態樣。藉此可實證本發明之氧化鋅奈米柱薄膜製備方法之特點及功效。Example 5 illustrates an embodiment in which various properties of the zinc oxide nano-pillar film produced by the method for preparing a zinc oxide nano-pillar film of the present invention are confirmed by measurement. Thereby, the characteristics and effects of the preparation method of the zinc oxide nanocolumn film of the present invention can be demonstrated.

如第二圖所示,以掃描式電子顯微鏡(SEM)觀察在鋅離子濃度0.05M、晶種層之晶粒大小約為20nm之條件下,藉由改變成長溫度、成長時間與成長方法所製備氧化鋅奈米柱薄膜可知採用本發明氧化鋅奈米柱薄膜製備方法所製備氧化鋅奈米柱薄膜之奈米柱非常緻密。例如第二圖(c)及第二圖(d)所示於75℃採用多階段製程成長6小時所獲取氧化鋅奈米柱薄膜即呈現極高之緻密程度。As shown in the second figure, the scanning electron microscope (SEM) was used to observe the growth temperature, growth time and growth method under the conditions of a zinc ion concentration of 0.05 M and a crystal grain size of about 20 nm. The zinc oxide nano column film shows that the nano column of the zinc oxide nano column film prepared by the method for preparing the zinc oxide nano column film of the invention is very dense. For example, as shown in the second figure (c) and the second figure (d), the zinc oxide nano-pillar film obtained by growing in a multi-stage process at 75 ° C for 6 hours exhibits an extremely high degree of density.

如第三圖所示,以掃描式電子顯微鏡觀察在以濺鍍法製作晶種層上成長氧化鋅奈米柱薄膜,再配合參照前述第二圖(c)及第二圖(d)可知以溶凝膠法所製備氧化鋅晶種層(晶粒大小約20nm)和以濺鍍法所製備氧化鋅晶種層(晶粒大小約20nm)後,於晶種層上成長氧化鋅奈米柱薄膜呈現出類似的緻密柱狀(column)晶粒。As shown in the third figure, the growth of the zinc oxide nano-pillar film on the seed layer by sputtering is observed by a scanning electron microscope, and it can be seen by referring to the second (c) and second (d) drawings. After the zinc oxide seed layer prepared by the sol-gel method (grain size is about 20 nm) and the zinc oxide seed layer (grain size about 20 nm) prepared by sputtering method, the zinc oxide nano column is grown on the seed layer. The film exhibits similar dense columnar grains.

如第二圖(c)、第二圖(d)及第三圖(a)、第三圖(b)所示,以溶凝膠法或濺鍍法所製備氧化鋅晶種層(晶粒大小約20nm),在成長條件為75℃、6小時和多階段製程下得到的奈米柱直徑最大、長度最小,此意味著晶柱橫向成長較活躍,堆積密度會隨著增加,較易達到「緻密化奈米柱薄膜」的需求。As shown in the second (c), second (d) and third (a) and third (b), zinc oxide seed layers (grains) are prepared by sol gel or sputtering. The size of the nanometer is about 20nm. The diameter of the nanocolumn is the largest and the length is the smallest under the growth conditions of 75 ° C, 6 hours and multi-stage process. This means that the lateral growth of the crystal column is more active, and the bulk density will increase with the increase. The demand for "densified nanopillar film".

如第四圖所示,單階段與多階段製程其成長時間與奈米柱直徑/長度的關係,單階段製程的奈米柱直徑與長度較多階段製程的較窄與較長。As shown in the fourth figure, the growth time of the single-stage and multi-stage processes is related to the diameter/length of the nano-pillar. The diameter and length of the nano-column of the single-stage process are narrower and longer.

如第五圖所示,XRD分析結果顯示本發明方法成長氧化鋅之奈米柱薄膜有很高的c軸優選性。As shown in the fifth figure, the results of XRD analysis show that the nano-pillar film of the zinc oxide grown by the method of the present invention has a high c-axis preference.

如第六圖所示,晶種層在鋅離子濃度0.05M、晶種層之晶粒大小約為20nm條件下成長之氧化鋅奈米柱薄膜具有良好之可見光穿透率,特別如第五圖(a)所示,在成長條件為75℃、6小時和多階段製程下得到的奈米柱薄膜,其平均可見光穿透率可達到85%。As shown in the sixth figure, the zinc oxide nano-pillar film grown in the seed layer at a zinc ion concentration of 0.05 M and a crystal grain size of about 20 nm has good visible light transmittance, especially as shown in the fifth figure. (a) shows that the nano-pillar film obtained under the growth conditions of 75 ° C, 6 hours and multi-stage process has an average visible light transmittance of 85%.

如第七圖所示,在成長條件在75℃下,3、4.5、6小時以多階段製程製備的奈米柱薄膜對550nm光之折射率分別為1.696、1.705、1.743,可知以此製程條件下成長6小時之薄膜其緻密性最高。As shown in the seventh figure, the refractive index of the nano-pillar film prepared by the multi-stage process at 3, 4.5, and 6 hours under growth conditions at 75 ° C is 159 nm, 1.705, 1.743, respectively, and the process conditions are known. The film grown for 6 hours has the highest density.

如第八圖所示,成長時間越長,堆積密度和折射率也會越大,經過六小時的成長,折射率達到1.743,而堆積密度可達到0.84。As shown in the eighth figure, the longer the growth time, the larger the bulk density and the refractive index. After six hours of growth, the refractive index reaches 1.743, and the bulk density can reach 0.84.

以本發明之方法所製備氧化鋅奈米柱薄膜經過上述各種儀器量測之後,確認其具有緻密薄膜之性質。最佳化之製程參數:晶種層之晶粒大小約為20nm、成長溶液鋅離子濃度0.05M、成長溫度75℃、成長時間6小時、多階段製程。所得到最緻密薄膜之特性:奈米柱膜厚度約800nm、晶種層之晶粒大小約200nm、平均可見光穿透率85%、折射率1.74、堆積密度0.84。本發明所需要的成長溫度和成長成本較低,不需要特殊環境,故製程十分簡單。The zinc oxide nanocolumn film prepared by the method of the present invention was confirmed to have the properties of a dense film after being measured by the above various instruments. Optimized process parameters: the seed layer has a grain size of about 20 nm, a growth solution zinc ion concentration of 0.05 M, a growth temperature of 75 ° C, a growth time of 6 hours, and a multi-stage process. The characteristics of the most dense film obtained were as follows: the thickness of the nano-column film was about 800 nm, the grain size of the seed layer was about 200 nm, the average visible light transmittance was 85%, the refractive index was 1.74, and the bulk density was 0.84. The growth temperature and growth cost required by the invention are low, and no special environment is required, so the process is very simple.

本發明之氧化鋅奈米柱薄膜製備方法具有上述技術特徵,其以低溫溶液成長法為基礎,藉由控制成長溫度、鋅離子濃度與成長時間製備成長得非常緻密且具有良好光學特性之氧化鋅奈米柱薄膜而確實能夠達到本發明之目的。The method for preparing a zinc oxide nanocolumn film of the invention has the above technical features, and based on the low temperature solution growth method, the zinc oxide which grows very dense and has good optical properties is prepared by controlling the growth temperature, the zinc ion concentration and the growth time. The nanocolumn film does indeed achieve the object of the present invention.

又由於在實施本發明之氧化鋅奈米柱薄膜製備方法時,只要藉由簡單的化學藥品混合即可得到成長氧化鋅奈米柱所需的化學溶液,因此相較於採用諸如其他物理或化學薄膜成長法之既有氧化鋅奈米柱薄膜製備方法,本發明之氧化鋅奈米柱薄膜製備方法具有製程簡單、低溫與低成本之優點。Moreover, in the preparation of the zinc oxide nanocolumn film of the present invention, the chemical solution required for growing the zinc oxide nano column can be obtained by simple chemical mixing, and thus, for example, other physical or chemical processes are employed. The film growth method has the method for preparing a zinc oxide nano column film, and the method for preparing the zinc oxide nano column film of the invention has the advantages of simple process, low temperature and low cost.

由上述可知,本發明確實能夠提供平均可見光穿透率大於85%且堆積密度大於0.84之氧化鋅奈米柱薄膜;具體而言,本發明確實能夠提供平均可見光穿透率大於85%、堆積密度大於0.84且折射率大於1.74之氧化鋅奈米柱薄膜。換言之,本發明的確可改善先前技術之缺點並達到發明之目的。From the above, it can be seen that the present invention can provide a zinc oxide nano-pillar film having an average visible light transmittance of more than 85% and a bulk density of more than 0.84; in particular, the present invention can provide an average visible light transmittance of more than 85% and bulk density. A zinc oxide nanopillar film having a refractive index greater than 1.74 and greater than 1.74. In other words, the present invention does improve the disadvantages of the prior art and achieves the object of the invention.

第一圖(a)係以溶凝膠法製備,以200℃燒結後得到的晶種層。The first figure (a) is a seed layer obtained by a sol gel method and sintered at 200 ° C.

第一圖(b)係以溶凝膠法製備,以400℃燒結後得到的晶種層。The first figure (b) is a seed layer obtained by a sol gel method and sintered at 400 ° C.

第一圖(c)係以溶凝膠法製備,以600℃燒結後得到的晶種層。The first figure (c) is a seed layer obtained by a sol gel method and sintered at 600 ° C.

第一圖(d)係以溶凝膠法製備,以800℃燒結後得到的晶種層。The first figure (d) is a seed layer obtained by a sol gel method and sintered at 800 ° C.

第一圖(e)係以濺鍍法製備之晶種層。The first figure (e) is a seed layer prepared by sputtering.

第二圖(a)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於75℃採用多階段製程成長1.5小時所獲取氧化鋅奈米柱薄膜之俯視掃描式電子顯微鏡照片。The second figure (a) is obtained by using a multi-stage process for 1.5 hours at 75 ° C under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05 M and the grain size of the seed layer is about 20 nm. A top view scanning electron micrograph of a zinc oxide nanopillar film.

第二圖(b)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於75℃採用多階段製程成長1.5小時所獲取氧化鋅奈米柱薄膜之側視掃描式電子顯微鏡照片。The second figure (b) is obtained by using a multi-stage process for 1.5 hours at 75 ° C under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05 M and the grain size of the seed layer is about 20 nm. Side-viewing scanning electron micrograph of a zinc oxide nanopillar film.

第二圖(c)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於75℃採用多階段製程成長6小時所獲取氧化鋅奈米柱薄膜之俯視掃描式電子顯微鏡照片。The second figure (c) is obtained by growing the multi-stage process at 75 ° C for 6 hours under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05 M and the grain size of the seed layer is about 20 nm. A top view scanning electron micrograph of a zinc oxide nanopillar film.

第二圖(d)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於75℃採用多階段製程成長6小時所獲取氧化鋅奈米柱薄膜之側視掃描式電子顯微鏡照片。The second figure (d) is obtained by growing the multi-stage process at 75 ° C for 6 hours under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05 M and the crystal grain size of the seed layer is about 20 nm. Side-viewing scanning electron micrograph of a zinc oxide nanopillar film.

第二圖(e)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於95℃採用多階段製程成長1.5小時所獲取氧化鋅奈米柱薄膜之俯視掃描式電子顯微鏡照片。The second figure (e) is obtained by using a multi-stage process for 1.5 hours at 95 ° C in a zinc oxide nano-pillar film growth solution having a zinc ion concentration of 0.05 M and a seed layer grain size of about 20 nm. A top view scanning electron micrograph of a zinc oxide nanopillar film.

第二圖(f)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於95℃採用多階段製程成長1.5小時所獲取氧化鋅奈米柱薄膜之側視掃描式電子顯微鏡照片。The second figure (f) is obtained by increasing the zinc ion concentration of the zinc oxide nano-pillar film growth solution to 0.05 M and the crystal grain size of the seed layer to about 20 nm at 95 ° C using a multi-stage process for 1.5 hours. Side-viewing scanning electron micrograph of a zinc oxide nanopillar film.

第二圖(g)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於75℃採用單階段製程成長4.5小時所獲取氧化鋅奈米柱薄膜之俯視掃描式電子顯微鏡照片。The second figure (g) is obtained by using a single-stage process for 4.5 hours at 75 ° C under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05 M and the grain size of the seed layer is about 20 nm. A top view scanning electron micrograph of a zinc oxide nanopillar film.

第二圖(h)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於75℃採用單階段製程成長4.5小時所獲取氧化鋅奈米柱薄膜之側視掃描式電子顯微鏡照片。The second figure (h) is obtained by using a single-stage process for 4.5 hours at 75 ° C under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05 M and the grain size of the seed layer is about 20 nm. Side-viewing scanning electron micrograph of a zinc oxide nanopillar film.

第二圖(i)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於75℃採用單階段製程成長6小時所獲取氧化鋅奈米柱薄膜之俯視掃描式電子顯微鏡照片。The second figure (i) is obtained by growing a single-stage process for 6 hours at 75 ° C in a zinc oxide nano-pillar film growth solution having a zinc ion concentration of 0.05 M and a seed layer grain size of about 20 nm. A top view scanning electron micrograph of a zinc oxide nanopillar film.

第二圖(j)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於75℃採用單階段製程成長6小時所獲取氧化鋅奈米柱薄膜之側視掃描式電子顯微鏡照片。The second figure (j) is obtained by using a single-stage process for 6 hours at 75 ° C under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05 M and the grain size of the seed layer is about 20 nm. Side-viewing scanning electron micrograph of a zinc oxide nanopillar film.

第二圖(k)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為100nm之條件下,於75℃採用單階段製程成長6小時所獲取的氧化鋅奈米柱薄膜之俯視掃描式電子顯微鏡照片。The second figure (k) is obtained by growing a single-stage process for 6 hours at 75 ° C in a zinc oxide nano-pillar film growth solution having a zinc ion concentration of 0.05 M and a seed layer grain size of about 100 nm. A top view scanning electron micrograph of a zinc oxide nanopillar film.

第二圖(1)在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為100nm之條件下,於75℃採用單階段製程成長6小時所獲取的氧化鋅奈米柱薄膜之側視掃描式電子顯微鏡照片。The second figure (1) is obtained by using a single-stage process for 6 hours at 75 ° C under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05 M and the grain size of the seed layer is about 100 nm. Side-viewing scanning electron micrograph of a zinc oxide nanopillar film.

第三圖(a)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、以濺鍍法所製作氧化鋅晶種層之晶粒大小約為20nm之條件下,於75℃採用多階段製程成長6小時所獲取氧化鋅奈米柱薄膜之俯視掃描式電子顯微鏡照片。The third figure (a) is used at 75 ° C under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05 M and the crystal size of the zinc oxide seed layer prepared by the sputtering method is about 20 nm. A top-view scanning electron micrograph of a zinc oxide nanopillar film obtained by multi-stage process growth for 6 hours.

第三圖(b)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、以濺鍍法所製作氧化鋅晶種層之晶粒大小約為20nm之條件下,於75℃採用多階段製程成長6小時所獲取氧化鋅奈米柱薄膜之側視掃描式電子顯微鏡照片。The third diagram (b) is based on the zinc ion concentration of the zinc oxide nano-pillar film growth solution of 0.05M, and the crystal size of the zinc oxide seed layer prepared by the sputtering method is about 20 nm, and is used at 75 ° C. A side-view scanning electron microscope photograph of a zinc oxide nanocolumn film obtained by multi-stage process growth for 6 hours.

第四圖係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,藉由改變成長溫度、成長時間與成長方法,成長後之氧化鋅奈米柱薄膜平均直徑和長度之圖表。The fourth figure shows the growth temperature, growth time and growth method under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05M and the crystal grain size of the seed layer is about 20 nm. A graph of the average diameter and length of a zinc oxide nanopillar film.

第五圖係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,藉由改變成長溫度、成長時間與成長方法,成長後之氧化鋅奈米柱薄膜之XRD分析圖表。The fifth figure shows the growth temperature, growth time and growth method under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05M and the crystal grain size of the seed layer is about 20 nm. XRD analysis chart of zinc oxide nanocolumn film.

第六圖(a)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於75℃採用多階段製程成長1.5~6小時所獲取氧化鋅奈米柱薄膜之不同成長時間之穿透光譜,其中縱軸為折射率百分比而橫軸為波長。Figure 6 (a) is a multi-stage process of growth of 1.5 to 6 hours at 75 ° C in a zinc oxide nano-pillar film growth solution having a zinc ion concentration of 0.05 M and a seed layer grain size of about 20 nm. The breakthrough spectrum of the different growth time of the obtained zinc oxide nanocolumn film, wherein the vertical axis is the refractive index percentage and the horizontal axis is the wavelength.

第六圖(b)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於75℃採用單階段製程成長1.5~6小時所獲取氧化鋅奈米柱薄膜之不同成長時間之穿透光譜,其中縱軸為折射率百分比而橫軸為波長。The sixth figure (b) is a 1.5- to 6-hour growth in a single-stage process at 75 ° C in a zinc oxide nano-pillar film growth solution having a zinc ion concentration of 0.05 M and a seed layer grain size of about 20 nm. The breakthrough spectrum of the different growth time of the obtained zinc oxide nanocolumn film, wherein the vertical axis is the refractive index percentage and the horizontal axis is the wavelength.

第六圖(c)係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,於95℃採用單階段製程成長1.5~6小時所獲取氧化鋅奈米柱薄膜之不同成長時間之穿透光譜,其中縱軸為折射率百分比而橫軸為波長。Figure 6 (c) is a single-stage process of 1.5 to 6 hours at 95 ° C in a zinc oxide nano-pillar film growth solution having a zinc ion concentration of 0.05 M and a seed layer grain size of about 20 nm. The breakthrough spectrum of the different growth time of the obtained zinc oxide nanocolumn film, wherein the vertical axis is the refractive index percentage and the horizontal axis is the wavelength.

第七圖係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm之條件下,採用多階段製程成長之氧化鋅奈米柱薄膜之不同成長時間之折射率對波長之圖表。The seventh figure shows the different growth of the zinc oxide nano-pillar film grown in a multi-stage process under the condition that the zinc ion concentration of the zinc oxide nano-pillar film growth solution is 0.05 M and the crystal grain size of the seed layer is about 20 nm. A graph of the refractive index of time versus wavelength.

第八圖係在氧化鋅奈米柱薄膜成長溶液之鋅離子濃度為0.05M、晶種層之晶粒大小約為20nm、成長溫度為75℃之條件下,使用多階段製程成長之氧化鋅奈米柱薄膜的堆積密度和折射率之圖表。The eighth figure shows the growth of zinc oxide naphthalene in a multi-stage process under the conditions of a zinc ion concentration of 0.05 M in a zinc oxide nano-pillar film growth solution, a grain size of the seed layer of about 20 nm, and a growth temperature of 75 ° C. A graph of the bulk density and refractive index of a rice column film.

Claims (11)

一種氧化鋅奈米柱薄膜製備方法,包括有:在一基板上形成氧化鋅晶種層,其包括有複數晶粒,前述晶粒大小為1~100nm;於氧化鋅奈米柱薄膜成長溶液中於50~100℃之成長溫度及0.5~10小時之成長時間下,令前述氧化鋅晶種層成長出一氧化鋅晶柱層,進而獲取一成長有晶柱層之氧化鋅奈米柱薄膜,其中該氧化鋅奈米柱薄膜成長溶液係鋅離子濃度在0.001~0.1 M且含有六亞甲四胺之水溶液;所述之氧化鋅奈米柱薄膜製備方法,係以一選自由以下(A)及(B)所組成之群組之方法在前述基板上形成前述氧化鋅晶種層:(A)所述之氧化鋅奈米柱薄膜製備方法,係藉由溶凝膠法在前述基板上形成前述氧化鋅晶種層,以令該氧化鋅晶種層之晶粒大小為5~100 nm;所述之氧化鋅奈米柱薄膜製備方法,其係以旋轉塗佈方式將氧化鋅晶種層溶凝膠溶液塗佈到前述基板上,在100℃軟烤10分鐘後,以200℃燒結10分鐘,再放在200~800℃下退火,以形成前述氧化鋅晶種層,其中該氧化鋅晶種層溶凝膠溶液係含有鋅離子、乙二醇單甲醚及單乙醇胺之溶液,且鋅離子、乙二醇單甲醚及單乙醇胺之莫爾比例係1:10~40:1;所述之氧化鋅奈米柱薄膜製備方法,係令氧化鋅晶種層之退火溫度為400℃,以於前述基板上形 成晶粒大小約為20 nm之氧化鋅晶種層;且於鋅離子濃度為0.005 M之氧化鋅奈米柱薄膜成長溶液中在75℃之成長溫度採用6小時之成長時間令前述氧化鋅晶種層成長出一氧化鋅晶柱層;(B)所述之氧化鋅奈米柱薄膜製備方法,係藉由濺鍍法在前述基板上形成前述氧化鋅晶種層,以令該氧化鋅晶種層之晶粒大小為20~100 nm;所述之氧化鋅奈米柱薄膜製備方法,其氧氣氣體流量為30 sccm、氬氣氣體流量為8 sccm、背景壓力為5×10-6 torr、工作壓力為15 mtorr、RF power為150 W、基板溫度為室溫且濺鍍時間為5分鐘。A method for preparing a zinc oxide nano-pillar film, comprising: forming a zinc oxide seed layer on a substrate, comprising a plurality of crystal grains, wherein the grain size is 1 to 100 nm; in a zinc oxide nano-pillar film growth solution At a growth temperature of 50 to 100 ° C and a growth time of 0.5 to 10 hours, the zinc oxide seed layer is grown to form a zinc oxide crystal column layer, thereby obtaining a zinc oxide nano column film having a crystal column layer grown thereon. The zinc oxide nano-pillar film growth solution is an aqueous solution having a zinc ion concentration of 0.001-0.1 M and containing hexamethylenetetramine; and the preparation method of the zinc oxide nano-pillar film is selected from the following (A) And the method of group (B) forming the zinc oxide seed layer on the substrate: the method for preparing a zinc oxide nano-pillar film according to (A), which is formed on the substrate by a sol gel method The zinc oxide seed layer is such that the crystal grain size of the zinc oxide seed layer is 5 to 100 nm; and the zinc oxide nano-pillar film preparation method is a spin coating method to form a zinc oxide seed layer The lysate solution is applied to the aforementioned substrate and soft baked at 100 ° C for 10 minutes. Thereafter, sintering at 200 ° C for 10 minutes, and then annealing at 200 to 800 ° C to form the aforementioned zinc oxide seed layer, wherein the zinc oxide seed layer solution gel solution contains zinc ions, ethylene glycol monomethyl ether And a solution of monoethanolamine, and the molar ratio of zinc ion, ethylene glycol monomethyl ether and monoethanolamine is 1:10-40:1; the preparation method of the zinc oxide nanocolumn film is to make zinc oxide seed crystal The annealing temperature of the layer is 400 ° C to form a zinc oxide seed layer having a grain size of about 20 nm on the substrate; and in a zinc oxide nanometer film growth solution having a zinc ion concentration of 0.005 M at 75 ° C The growth temperature is increased by a growth time of 6 hours to cause the zinc oxide seed layer to grow into a zinc oxide crystal column layer; (B) the zinc oxide nano-pillar film preparation method is formed on the substrate by sputtering. The zinc oxide seed layer is such that the crystal grain size of the zinc oxide seed layer is 20 to 100 nm; and the method for preparing the zinc oxide nano-pillar film has an oxygen gas flow rate of 30 sccm and an argon gas flow rate of 8 sccm, background pressure 5 × 10 -6 torr, working pressure 15 mtorr, RF power It is 150 W, the substrate temperature is room temperature and the sputtering time is 5 minutes. 如申請專利範圍第1項所述之氧化鋅奈米柱薄膜製備方法,前述氧化鋅奈米柱薄膜成長溶液之鋅離子、六亞甲四胺及水之莫爾比例是0.02~2:0.02~2:1000。 The method for preparing a zinc oxide nanocolumn film according to claim 1, wherein the proportion of zinc ion, hexamethylenetetramine and water in the zinc oxide nano-pillar film growth solution is 0.02 to 2: 0.02~ 2:1000. 如申請專利範圍第1項所述之氧化鋅奈米柱薄膜製備方法,係令前述基板分多次在多份新製備氧化鋅奈米柱薄膜成長溶液中分別經過一部分成長時間,各部分成長時間之總合等於前述成長時間。 The method for preparing a zinc oxide nano-pillar film according to claim 1 is characterized in that the substrate is divided into a plurality of newly prepared zinc oxide nano-pillar film growth solutions for a plurality of growth times, and each part is grown for a plurality of times. The sum total is equal to the aforementioned growth time. 如申請專利範圍第2項所述之氧化鋅奈米柱薄膜製備方法,係令前述基板分多次在多份新製備氧化鋅奈米柱薄膜成長溶液中分別經過一部分成長時間,各部分成長時間之總合等於前述成長時間。 The method for preparing a zinc oxide nano-pillar film according to claim 2, wherein the substrate is subjected to a plurality of times of growth time in each of the newly prepared zinc oxide nano-pillar film growth solutions, and each part is grown. The sum total is equal to the aforementioned growth time. 如申請專利範圍第1項所述之氧化鋅奈米柱薄膜製備方法,係令前述基板在一份新製備氧化鋅奈米柱薄膜成 長溶液中經過全部成長時間。 The method for preparing a zinc oxide nanocolumn film according to claim 1, wherein the substrate is formed in a newly prepared zinc oxide nanocolumn film. The total growth time in the long solution. 如申請專利範圍第2項所述之氧化鋅奈米柱薄膜製備方法,係令前述基板在一份新製備氧化鋅奈米柱薄膜成長溶液中經過全部成長時間。 The method for preparing a zinc oxide nanocolumn film according to claim 2, wherein the substrate is subjected to a full growth time in a freshly prepared zinc oxide nanocolumn film growth solution. 如申請專利範圍第1項所述之氧化鋅奈米柱薄膜製備方法,係令前述基板在一份鋅離子濃度恆定之氧化鋅奈米柱薄膜成長溶液中經過全部成長時間。 The method for preparing a zinc oxide nano-pillar film according to claim 1, wherein the substrate is subjected to a total growth time in a zinc oxide nano-pillar film growth solution having a constant zinc ion concentration. 如申請專利範圍第2項所述之氧化鋅奈米柱薄膜製備方法,係令前述基板在一份鋅離子濃度恆定之氧化鋅奈米柱薄膜成長溶液中經過全部成長時間。 The method for preparing a zinc oxide nano-pillar film according to claim 2, wherein the substrate is subjected to a total growth time in a zinc oxide nano-pillar film growth solution having a constant zinc ion concentration. 如申請專利範圍第1至8項中任一項所述之氧化鋅奈米柱薄膜製備方法,前述基板之材質係選自由玻璃、石英、單晶矽、多晶矽、藍寶石、聚對苯二甲酸乙二醇酯、壓克力和聚醯亞胺所構成之群組。 The method for preparing a zinc oxide nanocolumn film according to any one of claims 1 to 8, wherein the material of the substrate is selected from the group consisting of glass, quartz, single crystal germanium, polycrystalline germanium, sapphire, and polyethylene terephthalate. a group consisting of glycol esters, acryl and polyimine. 如申請專利範圍第1至8項中任一項所述之氧化鋅奈米柱薄膜製備方法,前述氧化鋅奈米柱薄膜成長溶液係藉由選取自由醋酸鋅、溴化鋅、氯化鋅、氟化鋅、碘化鋅、硫化鋅、硫酸鋅及硝酸鋅所構成之群組之化合物來提供前述鋅離子。 The method for preparing a zinc oxide nano-pillar film according to any one of claims 1 to 8, wherein the zinc oxide nano-pillar film growth solution is obtained by selecting free zinc acetate, zinc bromide, zinc chloride, A compound of the group consisting of zinc fluoride, zinc iodide, zinc sulfide, zinc sulfate, and zinc nitrate provides the aforementioned zinc ions. 如申請專利範圍第1至8項中任一項所述之氧化鋅奈米柱薄膜製備方法,其係藉由濺鍍法在前述基板上形成前述氧化鋅晶種層,以令該氧化鋅晶種層之晶粒大小為20~100 nm;其氧氣氣體流量為30 sccm、氬氣氣體流量為8 sccm、背景壓力為5×10-6 torr、工作壓力為15 mtorr、RF power為150 W、基板溫度為室溫且濺鍍時間為5分鐘; 且所述之氧化鋅奈米柱薄膜製備方法,係將前述基板之溫度維持在室溫,以於前述基板上形成晶粒大小為5~50 nm之氧化鋅晶種層;於鋅離子濃度為0.005 M之氧化鋅奈米柱薄膜成長溶液中在75℃之成長溫度採用6小時之成長時間令前述氧化鋅晶種層成長出一氧化鋅晶柱層。The method for preparing a zinc oxide nanocolumn film according to any one of claims 1 to 8, wherein the zinc oxide seed layer is formed on the substrate by sputtering to form the zinc oxide crystal. The grain size of the seed layer is 20~100 nm; the oxygen gas flow rate is 30 sccm, the argon gas flow rate is 8 sccm, the background pressure is 5×10 -6 torr, the working pressure is 15 mtorr, and the RF power is 150 W. The substrate temperature is room temperature and the sputtering time is 5 minutes; and the zinc oxide nano-pillar film is prepared by maintaining the temperature of the substrate at room temperature to form a grain size of 5 to 50 on the substrate. a zinc oxide seed layer of nm; growing in a zinc oxide seed layer at a growth temperature of 75 ° C in a zinc oxide ion concentration of 0.005 M in a growth solution of 75 ° C for a period of 6 hours Column layer.
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TWI813956B (en) * 2021-02-26 2023-09-01 崑山科技大學 Fabrication method of hydrogen sensor with zinc oxide nanopillars with nickel-doped shell structure

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Sunandan Bruah "Effect of seeded substrates on hydrothermally grown ZnO nanorods"J Sol-Gel Sci Technol(2009)50:456-464. *

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI813956B (en) * 2021-02-26 2023-09-01 崑山科技大學 Fabrication method of hydrogen sensor with zinc oxide nanopillars with nickel-doped shell structure

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