TWI410758B - A barrier removal fluid composition, and a method of removing the barrier layer - Google Patents

A barrier removal fluid composition, and a method of removing the barrier layer Download PDF

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TWI410758B
TWI410758B TW99138782A TW99138782A TWI410758B TW I410758 B TWI410758 B TW I410758B TW 99138782 A TW99138782 A TW 99138782A TW 99138782 A TW99138782 A TW 99138782A TW I410758 B TWI410758 B TW I410758B
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resist layer
liquid composition
resist
methyl
substituted
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TW99138782A
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TW201220005A (en
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Tzu Chun Yen
Kang Tai Peng
Shao Hua Chiu
Ying Hao Li
Chih Peng Lu
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Kanto Ppc Inc
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Abstract

The present invention provides a resist layer removal liquid composite, which comprises: (A) inorganic base, and the inorganic base content is 0.5 to 5 wt% on the basis of total weight of the resist layer removal liquid composite; (B) polar solvent, and the polar solvent content is 5 to 70 wt% on the basis of total weight of the resist layer removal liquid composite; and (C) substituted alcohol, and the substituted alcohol content is 25 to 94 wt% on the basis of total weight of the resist layer removal liquid composite. The composition and component ratio of the composite according to the present invention may effective remove the resist layer, and prevent the metal oxidation and the solution of polyimide. The present invention further provides a method of removing the resist layer using the above-mentioned composite.

Description

阻層移除液組成物以及移除阻層之方法Repellent layer removing liquid composition and method of removing resist layer

本發明係關於一種阻層移除液組成物及其移除阻層之方法;尤其是一種含無機鹼之阻層移除液組成物及其移除阻層之方法。The present invention relates to a resist layer removing liquid composition and a method for removing the resist layer thereof; in particular, an inorganic base-containing resist layer removing liquid composition and a method of removing the resist layer.

近來,晶片封裝技術的發展正朝以下趨勢發展:晶片面積與封裝面積之比值接近、適用頻率增加、耐熱性提升、導線數增多、導線間距縮小、重量減輕、可靠性提升,以及無鉛製程的採用。為因應上述趨勢,於封裝製程材料中使用聚醯亞胺(Polyimide,PI)作為介電層已成為主流。Recently, the development of chip packaging technology is progressing toward the following trends: the ratio of wafer area to package area is close, the applicable frequency is increased, the heat resistance is improved, the number of wires is increased, the wire pitch is reduced, the weight is reduced, the reliability is improved, and the lead-free process is adopted. . In order to cope with the above trend, the use of polyimide (PI) as a dielectric layer in packaging process materials has become mainstream.

微影技術乃是半導體製程或印刷電路板製程中常用之技術。在微影製程中,常使用光阻或乾膜定義電路圖形。微影製程後,尚需使用剝離液移除光阻或乾膜。Photolithography is a commonly used technique in semiconductor process or printed circuit board processes. In lithography processes, photoresist or dry film is often used to define circuit patterns. After the lithography process, it is necessary to use a stripper to remove the photoresist or dry film.

一般而言,常用的剝離液包含有機鹼,例如氫氧化四烷基銨(TMAH)水溶液。例如,第I275904號台灣專利即揭露一種含有機鹼之剝離液組成物。然而,含有機鹼的剝離液剝離阻層之能力不佳。此外,因為剝離液含有機鹼,需以水溶液形式存在,而水的存在易造成銅面氧化。再者,此類型的剝離液也容易溶解聚亞醯胺。In general, conventional strippers contain an organic base such as an aqueous solution of tetraalkylammonium hydroxide (TMAH). For example, Taiwan Patent No. I275904 discloses a composition of a stripping liquid containing organic alkali. However, the peeling liquid containing a caustic alkali has a poor ability to peel off the resist layer. In addition, since the stripping liquid contains organic alkali, it needs to exist in the form of an aqueous solution, and the presence of water tends to cause oxidation of the copper surface. Furthermore, this type of stripper also readily dissolves polyammonium.

因此,如何開發剝離能力佳、對金屬氧化能力低且對聚亞醯胺溶解力低之剝離液,實已成為目前亟欲解決之課題。Therefore, how to develop a stripping liquid which is excellent in peeling ability, low in metal oxidation ability, and low in dissolving power to polybenzamine has become a problem to be solved at present.

有鑑於此,本發明提供一種阻層移除液組成物,其包含:(A)無機鹼,以該阻層移除液組成物的總重量為基準,該無機鹼的含量為0.5至5 wt%;(B)極性溶劑,以該阻層移除液組成物的總重量為基準,該極性溶劑的含量為5至70 wt%;以及(C)經取代之醇,以該阻層移除液組成物的總重量為基準,該經取代之醇的含量為25至94 wt%。In view of the above, the present invention provides a resist layer removing liquid composition comprising: (A) an inorganic base having a content of 0.5 to 5 wt based on the total weight of the resist layer removing liquid composition (B) a polar solvent based on the total weight of the resist removal composition, the polar solvent being present in an amount of 5 to 70 wt%; and (C) a substituted alcohol removed by the barrier layer The substituted alcohol is present in an amount of from 25 to 94% by weight based on the total weight of the liquid composition.

此外,本發明亦提供一種移除阻層之方法,其包含步驟:提供形成有圖案化阻層之基板及如本發明之阻層移除液組成物;加熱該阻層移除液組成物;以及使該經加熱之阻層移除液組成物與該基板上之圖案化阻層接觸以移除該圖案化阻層。In addition, the present invention also provides a method for removing a resist layer, comprising the steps of: providing a substrate formed with a patterned resist layer and a resist removal liquid composition according to the present invention; heating the resist removal liquid composition; And contacting the heated resist layer removal fluid composition with the patterned resist layer on the substrate to remove the patterned resist layer.

本發明之阻層移除液組成物的剝離能力極佳,不會造成阻層殘留;尤其是本發明之阻層移除液組成物為含無機鹼的無水溶液,能防止金屬與水接觸而氧化,並能防止聚亞醯胺的溶解。The resist layer removing liquid composition of the present invention has excellent peeling ability and does not cause residual layer of the resist layer; in particular, the resist layer removing liquid composition of the present invention is an inorganic alkali-free aqueous solution capable of preventing metal from coming into contact with water. Oxidizes and prevents the dissolution of polyamidamine.

以下係藉由特定的具體實施例說明本發明之實施方式,熟習此技藝之人士可由本說明書所揭示之內容瞭解本發明之其他優點與功效。本發明也可藉由其他不同的具體實施例加以施行或應用,本說明書中的各項細節亦可基於不同觀點與應用,在不悖離本創作之精神下進行各種修飾與變更。The embodiments of the present invention are described by way of specific examples, and those skilled in the art can understand the advantages and advantages of the present invention as disclosed in the present disclosure. The present invention may be embodied or applied in various other specific embodiments. The details of the present invention can be variously modified and changed without departing from the spirit and scope of the invention.

為解決習知問題,本發明的發明人於進行各種實驗後發現一種阻層移除液組成物,其包含:(A)無機鹼;(B)極性溶劑;以及(C)經取代之醇。In order to solve the conventional problems, the inventors of the present invention have found a resist layer removing liquid composition comprising: (A) an inorganic base; (B) a polar solvent; and (C) a substituted alcohol after conducting various experiments.

本發明的阻層移除液組成物中,以該阻層移除液組成物的總重量為基準,無機鹼的含量為0.5至5 wt%,較佳為1至5 wt%,更佳為1至3 wt%。無機鹼的實例可為鹼金屬系氫氧化物或鹼土金屬系氫氧化物;於一實施態樣中,無機鹼為氫氧化鈉;於另一實施態樣中,無機鹼為氫氧化鉀。In the resist layer removing liquid composition of the present invention, the inorganic base is contained in an amount of 0.5 to 5 wt%, preferably 1 to 5 wt%, more preferably based on the total weight of the resist layer removing liquid composition. 1 to 3 wt%. An inorganic base may be an alkali metal hydroxide or an alkaline earth metal hydroxide; in one embodiment, the inorganic base is sodium hydroxide; in another embodiment, the inorganic base is potassium hydroxide.

本發明的阻層移除液組成物中,以該阻層移除液組成物的總重量為基準,極性溶劑的含量為5至70wt%,較佳為6至60 wt%,更佳為8至55 wt%。極性溶劑的實例可為二甲基亞碸、二乙二醇單丁醚、N,N-二甲基乙醯胺、N,N-二甲基甲醯胺、N-甲基-2-吡咯酮、γ-丁內酯及N,N-二甲基咪唑,且可選擇其所組成群組的一種或多種極性溶劑,例如,選擇二甲基亞碸、二乙二醇單丁醚及N,N-二甲基乙醯胺三種極性溶劑。於一實施態樣中,極性溶劑為N-甲基-2-吡咯酮;於另一實施態樣中,極性溶劑為N,N-二甲基甲醯胺。In the resist layer removing liquid composition of the present invention, the polar solvent is contained in an amount of 5 to 70% by weight, preferably 6 to 60% by weight, more preferably 8 based on the total mass of the resist layer removing liquid composition. Up to 55 wt%. Examples of the polar solvent may be dimethyl hydrazine, diethylene glycol monobutyl ether, N,N-dimethylacetamide, N,N-dimethylformamide, N-methyl-2-pyrrole a ketone, γ-butyrolactone, and N,N-dimethylimidazole, and may be selected from one or more polar solvents of the group, for example, dimethyl hydrazine, diethylene glycol monobutyl ether, and N are selected. , N-dimethylacetamide three polar solvents. In one embodiment, the polar solvent is N-methyl-2-pyrrolidone; in another embodiment, the polar solvent is N,N-dimethylformamide.

本發明的阻層移除液組成物中,以該阻層移除液組成物的總重量為基準,經取代之醇的含量為25至94 wt%,較佳為35至92 wt%,更佳為45至90 wt%。此外,經取代之醇可為經取代之C1 -C10 醇,亦即該C1 -C10 醇可進一步被取代基所取代。較佳為經取代之C2 -C8 醇,更佳為經取代之C2 -C6 醇。再者,經取代之醇的取代基可為甲基、乙基、甲氧基或乙氧基。同時,經取代之醇的實例可為1-甲氧基丙醇、2-甲氧基乙醇、2-乙氧基乙醇、3-甲氧基丁醇、3-甲氧基-3-甲基-1-丁醇、3-甲基-3-甲氧基-2-丁醇及3-甲基-3-甲氧基-4-丁醇,且可選擇其所組成群組的一種或多種經取代之醇,例如選擇之經取代之醇包括3-甲氧基-3-甲基-1-丁醇、3-甲基-3-甲氧基-2-丁醇及3-甲基-3-甲氧基-4-丁醇。於一實施態樣中,經取代之醇為3-甲氧基-3-甲基-1-丁醇;於另一實施態樣中,經取代之醇為2-甲氧基乙醇。In the resist layer removing liquid composition of the present invention, the substituted alcohol is contained in an amount of 25 to 94% by weight, preferably 35 to 92% by weight, based on the total weight of the resist layer removing liquid composition. Good for 45 to 90 wt%. Further, the substituted alcohol may be a substituted C 1 -C 10 alcohol, that is, the C 1 -C 10 alcohol may be further substituted with a substituent. Preferred is a substituted C 2 -C 8 alcohol, more preferably a substituted C 2 -C 6 alcohol. Further, the substituent of the substituted alcohol may be a methyl group, an ethyl group, a methoxy group or an ethoxy group. Meanwhile, examples of the substituted alcohol may be 1-methoxypropanol, 2-methoxyethanol, 2-ethoxyethanol, 3-methoxybutanol, 3-methoxy-3-methyl 1-butanol, 3-methyl-3-methoxy-2-butanol, and 3-methyl-3-methoxy-4-butanol, and one or more selected from the group consisting of Substituted alcohols, for example, selected substituted alcohols include 3-methoxy-3-methyl-1-butanol, 3-methyl-3-methoxy-2-butanol, and 3-methyl- 3-methoxy-4-butanol. In one embodiment, the substituted alcohol is 3-methoxy-3-methyl-1-butanol; in another embodiment, the substituted alcohol is 2-methoxyethanol.

此外,本發明的阻層移除液組成物係用於移除阻層,以材質而言,阻層可為高分子膜。就形態而言,於一實施態樣中,阻層係指光阻;於另一實施態樣中,阻層為乾膜。In addition, the resist layer removing liquid composition of the present invention is used for removing the resist layer, and in terms of material, the resist layer may be a polymer film. In terms of morphology, in one embodiment, the resist layer refers to the photoresist; in another embodiment, the resist layer is a dry film.

另一方面,本發明的移除阻層之方法中,移除圖案化阻層的步驟可以浸泡或噴灑方式使該阻層移除液組成物與該圖案化阻層接觸。於一實施態樣中,移除圖案化阻層的步驟係以浸泡方式進行。In another aspect, in the method of removing a resist layer of the present invention, the step of removing the patterned resist layer may be performed by soaking or spraying to bring the resist layer removing liquid composition into contact with the patterned resist layer. In one embodiment, the step of removing the patterned resist layer is performed in a immersion manner.

本發明的移除阻層之方法中,係加熱該阻層移除液組成物至40至110℃,較佳為60至100℃,更佳為80至97℃。In the method of removing the resist layer of the present invention, the resist layer removing liquid composition is heated to 40 to 110 ° C, preferably 60 to 100 ° C, more preferably 80 to 97 ° C.

以下係藉由特定之具體實施例進一步說明本發明之特點與功效,但非用於限制本發明之範疇。The features and effects of the present invention are further illustrated by the following specific examples, but are not intended to limit the scope of the invention.

實施例Example (阻層移除液組成物的配製)(Preparation of resist layer removal liquid composition)

根據表1及2所示之組成份及比例,均勻混合各種組成份後,得到21種阻層移除液組成物,其中,實施例1至18係根據本發明所配製之阻層移除液組成物,比較例1至3則係以有機鹼製備阻層移除液組成物。According to the components and ratios shown in Tables 1 and 2, after uniformly mixing the various components, 21 kinds of resist removal liquid compositions were obtained, wherein Examples 1 to 18 are the barrier removal liquids prepared according to the present invention. The composition, Comparative Examples 1 to 3, was prepared by using an organic base to form a resist removal liquid composition.

在實施例方面,所製備之阻層移除液組成物,主要含有(A) 0.5至5 wt%之無機鹼;(B) 5至70 wt%之極性溶劑;以及(C) 25至94 wt%之經取代之醇。In an embodiment, the resist layer removing liquid composition prepared mainly contains (A) 0.5 to 5 wt% of an inorganic base; (B) 5 to 70 wt% of a polar solvent; and (C) 25 to 94 wt% % of the substituted alcohol.

在比較例方面,所製備之阻層移除液組成物,主要含有(A) 1至2.7 wt%之有機鹼水溶液;以及(B) 92至99 wt%之極性溶劑,其中,該有機鹼之含量佔水重量的三分之一。In a comparative example, the resist layer removing liquid composition prepared mainly contains (A) an aqueous solution of 1 to 2.7 wt% of an organic alkali; and (B) 92 to 99 wt% of a polar solvent, wherein the organic base is The content is one-third of the weight of the water.

(測試例阻層移除能力、抗氧化能力及防止聚醯亞胺溶解能力之測試)(Test sample resist removal ability, antioxidant capacity and test for preventing polyimine solvency)

在表3所列的處理條件下,將尺寸為3cmx3cm之待測樣品(聚醯亞胺矽基板)浸泡於根據表1及表2所製備的阻層移除液組成物中,並將結果記錄於表3中。Under the treatment conditions listed in Table 3, the sample to be tested (polyimine substrate) having a size of 3 cm x 3 cm was immersed in the resist removal liquid composition prepared according to Tables 1 and 2, and the results were recorded. In Table 3.

表3所示的評估結果為阻層移除液的阻層移除能力、防止銅層屬氧化能力以及防止聚亞醯胺溶解能力,其評估的標準如下:The evaluation results shown in Table 3 are the barrier removal ability of the barrier removal solution, the ability to prevent the copper layer from oxidizing, and the ability to prevent the dissolution of polyamidamine. The evaluation criteria are as follows:

◎:良好;◎: good;

○:佳;○: Good;

△:尚可;△: OK;

╳:差╳: Poor

待測樣品於操作溫度下浸泡於各阻層移除液中,經過表3所列的浸泡時間後取出,用掃瞄式電子顯微鏡觀察實驗結果並加以評估。第1至4圖為觀察結果,其中,第1圖及第3圖分別為比較例樣品及實施例樣品的銅氧化程度觀察結果。第2圖及第4圖分別為比較例樣品及實施例樣品的聚亞醯胺溶解程度觀察結果。The sample to be tested is immersed in each resist removal liquid at the operating temperature, and taken out after the soaking time listed in Table 3, and the experimental results are observed by a scanning electron microscope and evaluated. Fig. 1 to Fig. 4 show the observation results, and Fig. 1 and Fig. 3 are observation results of copper oxidation degree of the comparative sample and the sample of the examples, respectively. Fig. 2 and Fig. 4 are observation results of the degree of dissolution of polyamines of the comparative sample and the sample of the examples, respectively.

從第1圖中可明顯看到圓點外部表面有黑色陰影帶存在,此即為銅氧化區域;第3圖卻無黑色陰影帶存在。因此,本發明之阻層移除液組成物防止金屬層氧化的能力較佳。It can be clearly seen from Fig. 1 that the outer surface of the dot has a black shadow band, which is the copper oxide region; the third image has no black shadow band. Therefore, the ability of the resist layer removing liquid composition of the present invention to prevent oxidation of the metal layer is preferred.

再者,第2圖中可明顯看到有圓點最外層有外暈存在,此外暈區域即為聚亞醯胺被溶解所造成;第4圖卻無外暈存在。本發明之阻層移除液組成物防止聚亞醯胺溶解的能力較佳。Furthermore, in Fig. 2, it is apparent that there is a halo in the outermost layer of the dot, and in addition, the halo region is caused by the dissolution of polyamine, and the fourth graph has no halo. The resist layer removing liquid composition of the present invention preferably has a better ability to prevent dissolution of polyamidamine.

由表3所示結果可知,相較於使用有機鹼之剝離液,本發明之阻層移液組成物使用無機鹼,對阻層的剝離能力、防止銅層屬氧化能力、防止聚亞醯胺溶解能力均有顯著提升。As is apparent from the results shown in Table 3, the barrier layer pipetting composition of the present invention uses an inorganic base, the peeling ability to the resist layer, the oxidation resistance of the copper layer, and the prevention of the polyamidamine compared to the stripping liquid using the organic base. The solvency has been significantly improved.

上述實施例僅例示性說明本發明之組成物與製備方法,而非用於限制本發明。任何熟習此項技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修飾與改變。因此,本發明之權利保護範圍,應如後述之申請專利範圍所載。The above examples are merely illustrative of the compositions and preparation methods of the present invention and are not intended to limit the invention. Modifications and variations of the above-described embodiments can be made by those skilled in the art without departing from the spirit and scope of the invention. Therefore, the scope of the claims of the present invention should be as set forth in the appended claims.

第1圖係使用比較例之阻層移除液組成物後之待測樣品的銅氧化程度觀察結果;Fig. 1 is a view showing the results of copper oxidation degree of a sample to be tested after using the resist layer removing liquid composition of the comparative example;

第2圖係使用比較例之阻層移除液組成物後之待測樣品的聚亞醯胺溶解程度觀察結果;Fig. 2 is a view showing the degree of dissolution of polyamines of the sample to be tested after using the composition of the resist layer removing liquid of the comparative example;

第3圖係使用本發明之阻層移除液組成物後之待測樣品的銅氧化程度觀察結果;Figure 3 is a graph showing the degree of copper oxidation of a sample to be tested after using the resist layer removing liquid composition of the present invention;

第4圖係使用本發明之阻層移除液組成物後之待測樣品的聚亞醯胺溶解程度觀察結果;Figure 4 is a view showing the degree of dissolution of polyamines of the sample to be tested after using the resist layer removing liquid composition of the present invention;

Claims (10)

一種阻層移除液組成物,包含:(A)無機鹼,以該阻層移除液組成物的總重量為基準,該無機鹼的含量為0.5至5 wt%,其中,該無機鹼為鹼金屬系氫氧化物;(B)極性溶劑,以該阻層移除液組成物的總重量為基準,該極性溶劑的含量為5至70 wt%;以及(C)經取代之醇,以該阻層移除液組成物的總重量為基準,該經取代之醇的含量為25至94 wt%,其中,該經取代之醇為經取代之C1 -C10 醇。A resist layer removing liquid composition comprising: (A) an inorganic base having a content of 0.5 to 5 wt% based on the total weight of the resist layer removing liquid composition, wherein the inorganic base is An alkali metal hydroxide; (B) a polar solvent having a content of the polar solvent of from 5 to 70% by weight based on the total weight of the resist removal composition; and (C) a substituted alcohol The substituted alcohol is present in an amount of from 25 to 94% by weight based on the total weight of the resist removal liquid composition, wherein the substituted alcohol is a substituted C 1 -C 10 alcohol. 如申請專利範圍第1項所述之阻層移除液組成物,該無機鹼為氫氧化鈉、氫氧化鉀或其混合物。 The resist layer removing liquid composition according to claim 1, wherein the inorganic base is sodium hydroxide, potassium hydroxide or a mixture thereof. 如申請專利範圍第1項所述之阻層移除液組成物,該極性溶劑係選自二甲基亞碸、二乙二醇單丁醚、N,N-二甲基乙醯胺、N,N-二甲基甲醯胺、N-甲基-2-吡咯酮、γ-丁內酯及N,N-二甲基咪唑所組成群組的一種或多種。 The resist removal liquid composition according to claim 1, wherein the polar solvent is selected from the group consisting of dimethyl hydrazine, diethylene glycol monobutyl ether, N, N-dimethyl acetamide, N One or more groups consisting of N-dimethylformamide, N-methyl-2-pyrrolidone, γ-butyrolactone, and N,N-dimethylimidazole. 如申請專利範圍第1項所述之阻層移除液組成物,該經取代之醇為經選自下列取代基取代之醇:甲基、乙基、甲氧基或乙氧基。 The resist removal liquid composition of claim 1, wherein the substituted alcohol is an alcohol substituted with a substituent selected from the group consisting of methyl, ethyl, methoxy or ethoxy. 如申請專利範圍第4項所述之阻層移除液組成物,該經取代之醇係選自1-甲氧基丙醇、2-甲氧基乙醇、2-乙氧基乙醇、3-甲氧基丁醇、3-甲氧基-3-甲基-1-丁醇、3-甲基-3-甲氧基-2-丁醇及3-甲基-3-甲氧基-4-丁醇所組成群組的一種或多種。 The resist removal liquid composition according to claim 4, wherein the substituted alcohol is selected from the group consisting of 1-methoxypropanol, 2-methoxyethanol, 2-ethoxyethanol, and 3- Methoxybutanol, 3-methoxy-3-methyl-1-butanol, 3-methyl-3-methoxy-2-butanol and 3-methyl-3-methoxy-4 One or more of the groups consisting of butanol. 如申請專利範圍第1項所述之阻層移除液組成物,該阻層為高分子膜。 The resist layer removing liquid composition according to claim 1, wherein the resist layer is a polymer film. 如申請專利範圍第1或6項所述之阻層移除液組成物,該阻層為光阻或乾膜。 The resist layer removing liquid composition according to claim 1 or 6, wherein the resist layer is a photoresist or a dry film. 一種移除阻層之方法,包含步驟:提供形成有圖案化阻層之基板及提供如申請專利範圍第1至7項任一項之阻層移除液組成物;加熱該阻層移除液組成物;以及使該經加熱之阻層移除液組成物與該圖案化阻層接觸以移除該圖案化阻層。 A method of removing a resist layer, comprising the steps of: providing a substrate on which a patterned resist layer is formed; and providing a resist removal liquid composition according to any one of claims 1 to 7; heating the resist removal liquid a composition; and contacting the heated resist layer removing liquid composition with the patterned resist layer to remove the patterned resist layer. 如申請專利範圍第8項所述移除阻層之方法,係以浸泡或噴灑方式使該阻層移除液組成物與該圖案化阻層接觸。 The method for removing the resist layer as described in claim 8 is to contact the patterned resist layer with a patterning resist layer by dipping or spraying. 如申請專利範圍第8項所述移除阻層之方法,係加熱該阻層移除液組成物至40至110℃。 The method of removing the resist layer as described in claim 8 of the patent application is to heat the resist layer removing liquid composition to 40 to 110 °C.
TW99138782A 2010-11-11 2010-11-11 A barrier removal fluid composition, and a method of removing the barrier layer TWI410758B (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6440647B1 (en) * 1998-02-26 2002-08-27 Alpha Metals, Inc. Resist stripping process
EP2196858A1 (en) * 2008-12-11 2010-06-16 Shin-Etsu Chemical Co., Ltd. Coated-type silicon-containing film stripping process
US20100183853A1 (en) * 2007-06-12 2010-07-22 Takashi Ihara Stripping agent for resist film on/above conductive polymer, method for stripping resist film, and substrate having patterned conductive polymer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6440647B1 (en) * 1998-02-26 2002-08-27 Alpha Metals, Inc. Resist stripping process
US20100183853A1 (en) * 2007-06-12 2010-07-22 Takashi Ihara Stripping agent for resist film on/above conductive polymer, method for stripping resist film, and substrate having patterned conductive polymer
EP2196858A1 (en) * 2008-12-11 2010-06-16 Shin-Etsu Chemical Co., Ltd. Coated-type silicon-containing film stripping process

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