TWI410516B - Graphite protective film and manufacturing method thereof - Google Patents
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本發明係有關一種石墨保護膜及其製造方法,目的在改良並緩和石墨與碳化矽保護膜,因熱膨脹係數不整合在升降溫過程所產生的熱應力,導致碳化矽保護膜產生裂縫,或造成石墨基材本身碳質氧化或腐蝕等缺失。The invention relates to a graphite protective film and a manufacturing method thereof, the purpose of which is to improve and alleviate the graphite and the niobium carbide protective film, because the thermal expansion coefficient is not integrated in the thermal stress generated by the temperature rise and fall process, causing cracks in the niobium carbide protective film, or causing The graphite substrate itself is deficient in carbon oxidation or corrosion.
在半導體相關製造程序中,如用在磊晶成長(epitaxial growth)時的晶圓載盤(susceptor);又如C-Z法拉晶的製程中用以承載熔融矽的石墨坩鍋;以及單獨作為晶圓熱氧化處理的支撐架等必要的耗材,皆是以石墨(一般為等方性石墨)為基材另在其表面鍍上保護膜來製成。選用石墨為基材的理由,乃因為它具有易加工、優良的導電和導熱性以及化學穩定性等優點。In a semiconductor-related manufacturing process, such as a wafer carrier used in epitaxial growth; a graphite crucible for carrying molten germanium in a process such as C-Z method; and as a crystal alone The necessary consumables such as the support frame for thermal oxidation treatment are made of graphite (generally isotropic graphite) and a protective film on the surface. The reason why graphite is used as the substrate is because it has the advantages of easy processing, excellent electrical and thermal conductivity, and chemical stability.
一般工業用的石墨材質大都具有孔洞性,為了防止在高溫程序時石墨本身的碳素或是不純物揮發出來而影響元件製作完成的純度,必須在石墨的表面製作一層覆蓋膜。此一覆蓋膜必須要能夠緻密的覆蓋住石墨外,本身亦不能有孔洞。又隨著應用製程的不同,對於覆蓋膜/石墨的組合還必須有耐熱衝擊、抗氧化、抗腐蝕以及良好的熱穩定性等要求。在文獻中作為石墨覆蓋膜常見的材料有碳化矽(SiC)、氮化矽(Si3 N4 )、氮化硼(BN)、碳化鉭(TiC)、碳化硼(B4 C)等。其中作為覆蓋膜之材料首推碳化矽,推究原因除了碳化矽本身具有強固的機械強度、低密度(3.2g/cm3 ) 及極佳的抗氧化性之外,碳化矽與石墨同為含碳物質故相容性較高且彼此具有相近的熱膨脹係數(thermal expansion coefficient)。儘管如此兩者物性的差異性,如碳化矽比石墨材的熱膨脹係數略大(相差約10%),在實際製程中急速升溫、降溫的週期操作下,會因為熱膨脹係數的不整合(thermal expansion mismatch)進而造成碳化矽覆蓋膜殘留張性應力(residual tensile stress)。由相關的文獻報導指出,當殘留在碳化矽覆蓋膜應力過大時,會使得碳化矽覆蓋膜產生裂縫(cracks)。而裂縫的產生則會使得石墨材內的不純物藉由覆膜裂縫而擴散析出至磊晶製作的元件中,或者半導體製程中的氧化性氣體或腐蝕性氣體經由裂縫而進入,造成石墨材本身碳質氧化(oxidation)或腐蝕(corrosion)。另外碳化矽的熱傳導係數(thermal conductivity coefficient)比石墨小了許多,使得載盤在加熱時,碳化矽層與石墨材間因溫度梯度造成的熱應力(thermal stress),亦被認為是造成碳化矽覆蓋膜產生裂縫的原因之一。由以上的敘述可知,如何克服表面覆蓋膜產生裂縫的問題,便是技術要求的重點。Generally, graphite materials for industrial use are mostly porous. In order to prevent the carbon or impurities of graphite from volatilizing during the high temperature process and affecting the purity of the finished component, a coating film must be formed on the surface of the graphite. This cover film must be able to cover the graphite densely and not have holes in itself. According to the application process, the combination of the cover film/graphite must also have requirements of thermal shock resistance, oxidation resistance, corrosion resistance and good thermal stability. Common materials used as graphite coating films in the literature include niobium carbide (SiC), tantalum nitride (Si 3 N 4 ), boron nitride (BN), niobium carbide (TiC), and boron carbide (B 4 C). Among them, the material used as the cover film is the first to promote carbonized niobium. The reason is that in addition to the strong mechanical strength, low density (3.2g/cm 3 ) and excellent oxidation resistance of tantalum carbide, tantalum carbide and graphite are carbon-containing. The materials are therefore highly compatible and have similar thermal expansion coefficients to each other. Despite the difference in physical properties, such as the thermal expansion coefficient of tantalum carbide is slightly larger than that of graphite (approximately 10% difference), under the cyclical operation of rapid heating and cooling in the actual process, thermal expansion coefficient will be uncoordinated. Mismatch) in turn causes residual tensile stress of the tantalum carbide coating. It has been reported from relevant literatures that when the residual stress on the tantalum carbide coating film is too large, cracks are generated in the tantalum carbide coating film. The cracks are generated, so that the impurities in the graphite material are diffused and deposited into the epitaxial elements by the cracks of the film, or the oxidizing gas or corrosive gas in the semiconductor process enters through the cracks, causing the carbon of the graphite material itself. Oxidation or corrosion. In addition, the thermal conductivity coefficient of tantalum carbide is much smaller than that of graphite, so that the thermal stress caused by the temperature gradient between the tantalum carbide layer and the graphite material when the carrier is heated is also considered to cause tantalum carbide. One of the causes of cracks in the cover film. It can be seen from the above description that how to overcome the problem of cracks in the surface covering film is the focus of the technical requirements.
本發明之主要目的即在提供一種可改良並緩和石墨與碳化矽保護膜,因熱膨脹係數不整合在升降溫所產生的熱應力,導致碳化矽保護膜產生裂縫,或造成石墨材本身碳質氧化或腐蝕等缺失之石墨保護膜及其製造方法。The main object of the present invention is to provide an improved and tempered graphite and tantalum carbide protective film, because the thermal expansion coefficient is not integrated in the thermal stress generated by the temperature rise and fall, causing cracks in the tantalum carbide protective film, or causing carbonaceous oxidation of the graphite material itself. Or a graphite protective film that is missing, such as corrosion, and a method for producing the same.
為達上揭目的,本發明之石墨基材表面設有一碳化矽材料構成之保護膜;其中,該石墨基材與保護膜間係設有緩衝層以及多層傾斜層,該緩衝層則設於石墨基材與多層傾斜層之間,該緩衝層以及多層傾斜層係利用矽化合物複合膜以化學氣相滲透製程所成型,該複合膜可以為碳化矽/氮化矽之複合材料,並利用該緩衝層以及多層傾斜層來緩和石墨與碳化矽保護膜,因熱膨脹係數不整合在升降溫過程所產生的熱應力,以避免裂縫的產生。In order to achieve the above, the surface of the graphite substrate of the present invention is provided with a protective film made of a tantalum carbide material; wherein the graphite substrate and the protective film are provided with a buffer layer and a plurality of inclined layers, and the buffer layer is disposed on the graphite. Between the substrate and the multi-layer inclined layer, the buffer layer and the multi-layer inclined layer are formed by a chemical vapor infiltration process using a ruthenium compound composite film, and the composite film may be a composite of tantalum carbide/tantalum nitride, and the buffer is utilized. The layer and the multi-layered inclined layer to alleviate the graphite and the niobium carbide protective film, because the thermal expansion coefficient is not integrated in the thermal stress generated by the temperature rise and fall process to avoid cracks.
本發明之特點,可參閱本案圖式及實施例之詳細說明而獲得清楚地瞭解。The features of the present invention can be clearly understood by referring to the drawings and the detailed description of the embodiments.
本發明「石墨保護膜及其製造方法」,該石墨基材11表面設有一保護膜12,如第一圖所示,該保護膜12可以為碳化矽材料,若在該石墨基材11上直接沈積碳化矽之保護膜12,因其熱膨脹係數的差異(石墨:4.8×10-6 1/K,碳化矽:5.12×10-6 1/K),在急遽升降溫過程中會產生不小的應力,進而造成裂縫產生。裂縫一但產生,在高溫下石墨基材內的碳便會從裂縫中析出,而影響製程系統內薄膜沈積的品質。所以本發明乃在於如何製備出一緩衝層,來緩和碳化矽膜與石墨基材間在急遽升降溫過程中所產生的應力,避免裂縫的產生。In the present invention, a graphite protective film and a method for producing the same are provided. The surface of the graphite substrate 11 is provided with a protective film 12. As shown in the first figure, the protective film 12 may be a tantalum carbide material, if directly on the graphite substrate 11. The protective film 12 for depositing tantalum carbide has a large difference in thermal expansion coefficient (graphite: 4.8×10 -6 1/K, niobium carbide: 5.12×10 -6 1/K), which is not small in the process of rapid temperature rise and fall. Stress, which in turn causes cracks to occur. Once the cracks are generated, the carbon in the graphite substrate will precipitate from the cracks at high temperatures, which will affect the quality of the film deposition in the process system. Therefore, the present invention is to prepare a buffer layer to alleviate the stress generated during the rapid temperature rise and fall between the tantalum carbide film and the graphite substrate to avoid cracks.
本發明之重點在於:該石墨基材11與保護膜12間係設有緩衝層13以及多層傾斜層14,該緩衝層13則設於石 墨基材11與多層傾斜層14間間,該緩衝層13係利用矽化合物複合膜以化學氣相滲透製程所成型,而多層傾斜層14係利用矽化合物複合膜以化學氣相沈積製程所成型,該複合膜可以為碳化矽/氮化矽之複合材料。利用緩衝層13以及多層傾斜層14間具有不同碳化矽/氮化矽比例形成功能性傾斜材料(functionally gradient material,FGM)。所謂FGM顧名思義乃藉由一連串的中間夾層,其作用得以漸進地改變基材到覆膜的某一物性,本發明係藉由熱膨脹係數之漸進式改變,先使該緩衝層13之熱膨脹係數接近於石墨基材11之熱膨脹係數,再令各傾斜層14具有不同之熱膨脹係數,且該熱膨脹係數係由接近緩衝層13之熱膨脹係數遞增至接近保護膜12之熱膨脹係數,而達到緩和石墨與碳化矽保護膜,因熱膨脹係數不整合在升降溫過程所產生的熱應力。The focus of the present invention is that a buffer layer 13 and a plurality of inclined layers 14 are disposed between the graphite substrate 11 and the protective film 12, and the buffer layer 13 is disposed on the stone. Between the ink substrate 11 and the plurality of inclined layers 14, the buffer layer 13 is formed by a chemical vapor infiltration process using a ruthenium compound composite film, and the multilayer inclined layer 14 is formed by a chemical vapor deposition process using a ruthenium compound composite film. The composite film may be a composite of tantalum carbide/tantalum nitride. A functionally gradient material (FGM) is formed by using the buffer layer 13 and the plurality of inclined layers 14 having different niobium carbide/niobium nitride ratios. The so-called FGM, as the name suggests, is a series of intermediate interlayers whose function gradually changes the physical properties of the substrate to the film. The present invention makes the thermal expansion coefficient of the buffer layer 13 close to that by the progressive change of the thermal expansion coefficient. The thermal expansion coefficient of the graphite substrate 11 further causes the respective inclined layers 14 to have different thermal expansion coefficients, and the thermal expansion coefficient is increased from the thermal expansion coefficient close to the buffer layer 13 to the thermal expansion coefficient close to the protective film 12, thereby achieving the relaxation of graphite and tantalum carbide. The protective film is not integrated with the thermal stress generated by the temperature rise and fall process due to the thermal expansion coefficient.
而本發明石墨保護膜之製造方法中,係先準備有下列材料及設備: (1)四甲基矽烷 TMS(tetramethylsilane),純度99.99%,沸點26.5℃,可燃性氣體或液體,無毒性,其分子式為Si(CH3 )4 。In the method for manufacturing the graphite protective film of the present invention, the following materials and equipment are prepared: (1) tetramethylsilane, purity 99.99%, boiling point 26.5 ° C, flammable gas or liquid, non-toxic, The molecular formula is Si(CH 3 ) 4 .
(2)氬氣 Ar(argon),超高純度99.9995%,不可燃,無毒性,但具有窒息性。(2) Argon gas Ar (argon), ultra high purity 99.9995%, non-flammable, non-toxic, but suffocating.
(3)氨氣 NH3 (ammonia),純度99.9995%,具腐蝕性。(3) Ammonia NH 3 (ammonia), purity 99.9995%, corrosive.
(4)氮氣 N2 (nitrogen),純度99.9995%,不可燃,無毒性,窒息性氣體。(4) Nitrogen N 2 (nitrogen), purity 99.9995%, non-flammable, non-toxic, asphyxiating gas.
(5)氫氣 H2 (hydrogen),純度99.9995%,高度燃燒性氣體。(5) Hydrogen H 2 (hydrogen), purity 99.9995%, highly flammable gas.
(6)乙醇 (Ethanol,C2 H5 OH),純度99.8%。器材之清洗去脂等用途。易燃,應遠離火源。(6) Ethanol (C 2 H 5 OH), purity 99.8%. The equipment is used for cleaning and degreasing. Flammable, keep away from fire.
(7)丙酮 (Acetone,CH3 COCH3 ),純度99.5%,器材之清洗和基材之去油脂等用途。易燃,應遠離火源。(7) Acetone (CH 3 COCH 3 ), purity 99.5%, cleaning of equipment and degreasing of substrates. Flammable, keep away from fire.
(8)石墨 (graphite),型號CZ5-R6510,超高純度等方性石墨。(8) graphite (graphite), model CZ5-R6510, ultra-high purity isotropic graphite.
(9)垂直內熱式低壓化學氣相沈積(cold wall low pressure chemical vapor deposition,LPCVD)系統 包含氣體源部分、蒸發器、反應腔體和加熱系統及抽氣系統。(9) Vertical wall low pressure chemical vapor deposition (LPCVD) system It includes a gas source section, an evaporator, a reaction chamber and a heating system, and an extraction system.
而本發明石墨保護膜之製造方法,如第二圖所示,其至少包含有下列步驟:步驟A、提供石墨基材,該步驟A進一步包含有:步驟(A-1)之清洗步驟以及步驟(A-2)之預熱步驟,該清洗步驟係將該石墨基材先以砂紙雙面拋光,之後再將石墨基材置入丙酮中,以超音波震盪器震盪,以去除石墨基材在加 工時所殘餘的雜質,該預熱步驟係將清洗後的石墨基材放入一反應腔體內,該反應腔體抽真空至10-5 torr以下時,在溫度1000℃預熱石墨基材10分鐘後,再通入氫氣降溫15分鐘;步驟B、進行第一階段化學氣相滲透製程,係在一反應腔體中於氫氣氣氛下,以氬氣為載氣將四甲基矽烷帶入該反應腔體,並通入氨氣(NH3 ),以於該石墨基材表面形成由碳化矽/氮化矽之矽化合物複合膜構成之緩衝層,其中,請同時參閱第三圖所示,該石墨基材11係設有複數開放性孔洞111,為了可增加石墨基材11與其表面緩衝層13間之附著性以及熱穩定性,係控制步驟B之第一階段化學氣相滲透製程中各環境條件如下:1、於氫氣氣氛下添加氨氣與四甲基矽烷,而該四甲基矽烷對氨氣之分壓比可為3,且反應總壓可以為10torr。The method for manufacturing the graphite protective film of the present invention, as shown in the second figure, comprises at least the following steps: Step A, providing a graphite substrate, the step A further comprising: a washing step and a step of the step (A-1) (A-2) a preheating step of polishing the graphite substrate with both sides of the sandpaper, and then placing the graphite substrate in acetone and oscillating with an ultrasonic oscillator to remove the graphite substrate. The pre-heating step is to pre-heat the graphite substrate 10 at a temperature of 1000 ° C when the cleaned graphite substrate is placed in a reaction chamber, and the reaction chamber is evacuated to a temperature below 10 -5 torr. After a minute, the hydrogen is further cooled by hydrogen for 15 minutes; in step B, the first stage chemical vapor infiltration process is carried out by introducing tetramethyl decane into the reaction chamber under a hydrogen atmosphere with argon as a carrier gas. a reaction chamber is formed with ammonia gas (NH 3 ) to form a buffer layer composed of a tantalum carbide/rhenium nitride-based composite film on the surface of the graphite substrate, wherein, as shown in the third figure, The graphite substrate 11 is provided with a plurality of open holes 111. The adhesion between the graphite substrate 11 and the surface buffer layer 13 and the thermal stability thereof can be increased. The environmental conditions in the first stage chemical vapor infiltration process of the control step B are as follows: 1. Adding ammonia gas under a hydrogen atmosphere and Tetramethyl decane, and the partial pressure ratio of the tetramethyl decane to ammonia gas may be 3, and the total reaction pressure may be 10 torr.
2、較低的反應溫度,該反應溫度可以為700~1000℃。2. The lower reaction temperature, the reaction temperature can be 700~1000 °C.
3、反應時間可以為50~60分鐘,而較佳者可為55分鐘。3. The reaction time can be 50 to 60 minutes, and preferably 55 minutes.
而由上述環境條件下所形成之反應物,可滲透至各開放性孔洞111內而形成緩衝層13,並可控制反應間間,使該緩衝層13於該石墨基材11表面形成不連續之表面結構,以提升石墨基材11與緩衝層13以及緩衝層13與後續覆膜間之附著性,且藉由控制該四甲基矽烷對氨氣之分壓比,使該緩衝層13之熱膨脹係數接近於石墨基材11之熱膨脹係數,以提升石墨基材11與緩衝層13間之熱穩定性。The reactant formed under the above environmental conditions can penetrate into each open hole 111 to form the buffer layer 13, and can control the reaction space to make the buffer layer 13 form discontinuous on the surface of the graphite substrate 11. a surface structure for improving the adhesion between the graphite substrate 11 and the buffer layer 13 and the buffer layer 13 and the subsequent coating, and thermally expanding the buffer layer 13 by controlling the partial pressure ratio of the tetramethyl decane to the ammonia gas The coefficient is close to the thermal expansion coefficient of the graphite substrate 11 to improve the thermal stability between the graphite substrate 11 and the buffer layer 13.
步驟C、進行第二階段化學氣相沈積製程,係以四甲基矽烷、氨氣、氫氣為原料氣體進行化學氣相沈積製程,於該緩衝層表面形成由矽化合物複合膜構成之多層傾斜層,如第四圖所示之實施例中,該緩衝層13表面係依序設有第一、第二、第三、第四、第五傾斜層141、142、143、144、145,為了緩和保護膜與石墨基材間的熱應力,本步驟係藉由下列之環境條件,製備出熱膨脹係數能由4.8上升至5.12的多層傾斜層,其步驟C之第二階段化學氣相沈積製程的環境條件如下:1、於氫氣氣氛下添加氨氣與四甲基矽烷,而該四甲基矽烷對氨氣之分壓比可為3,且反應總壓可以為10torr。Step C: performing a second-stage chemical vapor deposition process, wherein a chemical vapor deposition process is performed using tetramethyl decane, ammonia gas, and hydrogen as a raw material gas, and a plurality of inclined layers composed of a ruthenium compound composite film are formed on the surface of the buffer layer. In the embodiment shown in the fourth figure, the first, second, third, fourth, and fifth inclined layers 141, 142, 143, 144, and 145 are sequentially disposed on the surface of the buffer layer 13 for mitigation. The thermal stress between the protective film and the graphite substrate, in this step, a multilayer inclined layer having a thermal expansion coefficient of 4.8 to 5.12 is prepared by the following environmental conditions, and the second stage chemical vapor deposition process of the step C is performed. The conditions are as follows: 1. Ammonia gas and tetramethyl decane are added under a hydrogen atmosphere, and the partial pressure ratio of the tetramethyl decane to ammonia gas may be 3, and the total reaction pressure may be 10 torr.
2、較高的反應溫度,其反應溫度係大於步驟B之反應溫度,該反應溫度係由1000℃上升至約1200℃。2. A higher reaction temperature, the reaction temperature being greater than the reaction temperature of step B, which rises from 1000 ° C to about 1200 ° C.
而由上述環境條件下所形成之反應物,由低溫(1000℃)上升至高溫(約1200℃)中係依序生成第一、第二、第三、第四、第五傾斜層141、142、143、144、145,且因反應溫度之不同,各傾斜層間具有不同之碳化矽/氮化矽比例,該碳化矽/氮化矽莫耳比例可以為2.3~3.7,且該碳化矽/氮化矽比例係由接近緩衝層13朝保護膜12遞增,亦即第一傾斜層141之碳化矽/氮化矽比例最小,而第五傾斜層145之碳化矽/氮化矽比例最大。The reactants formed under the above environmental conditions sequentially generate the first, second, third, fourth, and fifth inclined layers 141, 142 from a low temperature (1000 ° C) to a high temperature (about 1200 ° C). 143, 144, 145, and different ratios of niobium carbide/niobium nitride between the inclined layers due to different reaction temperatures, the niobium carbide/niobium nitride molar ratio may be 2.3 to 3.7, and the niobium carbide/nitrogen The ruthenium ratio is increased from the buffer layer 13 toward the protective film 12, that is, the first slanted layer 141 has the smallest proportion of niobium carbide/tantalum nitride, and the fifth inclined layer 145 has the largest proportion of niobium carbide/tantalum nitride.
步驟D、於多層傾斜層14上設置保護膜12,如第一圖所示,以完成成品,其中,該保護膜12及多層傾斜層14之厚度亦會影響熱應力,故該保護膜12之厚度可以控制為 2.5~10 μm(較佳者為5 μm),而該多層傾斜層14之厚度可以為2.5~2.85 μm(較佳者可為2.8 μm)。Step D: providing a protective film 12 on the multi-layer inclined layer 14, as shown in the first figure, to complete the finished product, wherein the thickness of the protective film 12 and the plurality of inclined layers 14 also affect thermal stress, so the protective film 12 Thickness can be controlled to 2.5 to 10 μm (preferably 5 μm), and the thickness of the multilayer inclined layer 14 may be 2.5 to 2.85 μm (preferably 2.8 μm).
藉由本發明製造方法所成型之石墨保護膜中,該石墨基材11表面所設置之緩衝層13係以低溫化學氣相滲透製程所成型,使該緩衝層13不僅可滲透至石墨基材之各開放性孔洞111內,亦形成有不連續之表面結構,以提升之後膜層的附著性,並且藉由控制該四甲基矽烷對氨氣之分壓比,使該緩衝層13之熱膨脹係數接近於石墨基材11之熱膨脹係數,以提升石墨基材11與緩衝層13間之熱穩定性;再者,於製作多層傾斜層時,隨著製備傾斜層反應溫度的上升,各層的熱膨脹係數會因為碳化矽/氮化矽比例的上升而由接近石墨基材11改變到接近保護膜12,形成一個漸進的緩衝層,以致於可以緩衝因熱膨脹係數不整合在升降溫時所造成的熱應力,並可避免碳化矽保護膜產生裂縫,或造成石墨基材本身碳質氧化或腐蝕等缺失。In the graphite protective film formed by the manufacturing method of the present invention, the buffer layer 13 provided on the surface of the graphite substrate 11 is formed by a low-temperature chemical vapor infiltration process, so that the buffer layer 13 can penetrate not only the graphite substrate but also the graphite substrate. In the open hole 111, a discontinuous surface structure is also formed to enhance the adhesion of the film layer, and the thermal expansion coefficient of the buffer layer 13 is made close by controlling the partial pressure ratio of the tetramethyl decane to the ammonia gas. The thermal expansion coefficient of the graphite substrate 11 is to improve the thermal stability between the graphite substrate 11 and the buffer layer 13; further, when the multilayer inclined layer is formed, the thermal expansion coefficient of each layer increases as the reaction temperature of the prepared inclined layer increases. Since the ratio of the niobium carbide/niobium nitride is changed to be close to the graphite substrate 11 to approach the protective film 12, a progressive buffer layer is formed, so that the thermal stress caused by the uncoupling of the thermal expansion coefficient at the temperature rise and fall can be buffered. It can also avoid the occurrence of cracks in the tantalum carbide protective film or the loss of carbonaceous oxidation or corrosion of the graphite substrate itself.
本發明之技術內容及技術特點已揭示如上,然而熟悉本項技術之人士仍可能基於本發明之揭示而作各種不背離本案發明精神之替換及修飾。因此,本發明之保護範圍應不限於實施例所揭示者,而應包括各種不背離本發明之替換及修飾,並為以下之申請專利範圍所涵蓋。The technical content and technical features of the present invention have been disclosed as above, but those skilled in the art can still make various substitutions and modifications without departing from the spirit and scope of the invention. Therefore, the scope of the present invention should be construed as being limited by the scope of the appended claims
石墨基材‧‧‧11Graphite substrate ‧‧11
開放性孔洞‧‧‧111Open hole ‧‧11111
保護膜‧‧‧12Protective film ‧‧12
緩衝層‧‧‧13Buffer layer ‧‧13
傾斜層‧‧‧14Inclined layer ‧‧14
第一圖係為本發明石墨保護膜之結構示意圖。The first figure is a schematic structural view of the graphite protective film of the present invention.
第二圖係為本發明石墨保護膜製造方法之流程示意圖。The second figure is a schematic flow chart of the method for manufacturing the graphite protective film of the present invention.
第三圖係為本發明石墨基材與緩衝層之結構示意圖。The third figure is a schematic structural view of the graphite substrate and the buffer layer of the present invention.
第四圖係為本發明石墨基材、緩衝層與多層傾斜層之結構示意圖。The fourth figure is a schematic structural view of the graphite substrate, the buffer layer and the multi-layer inclined layer of the present invention.
石墨基材‧‧‧11Graphite substrate ‧‧11
開放性孔洞‧‧‧111Open hole ‧‧11111
保護膜‧‧‧12Protective film ‧‧12
緩衝層‧‧‧13Buffer layer ‧‧13
傾斜層‧‧‧1Inclined layer ‧‧1
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JPS56117499A (en) * | 1980-02-20 | 1981-09-14 | Pilot Precision Co Ltd | Speaker diaphragm |
JPH03146672A (en) * | 1989-11-02 | 1991-06-21 | Denki Kagaku Kogyo Kk | Susceptor for cvd |
JPH08133877A (en) * | 1994-11-11 | 1996-05-28 | Laser Noshuku Gijutsu Kenkyu Kumiai | Method for coating graphite with ceramic |
JPH08295583A (en) * | 1995-04-25 | 1996-11-12 | Mitsubishi Heavy Ind Ltd | Carbonaceous material with oxidation resistant coating for use at high temperature |
JPH10167885A (en) * | 1996-12-13 | 1998-06-23 | Toyo Tanso Kk | Susceptor for vapor growth |
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JPS56117499A (en) * | 1980-02-20 | 1981-09-14 | Pilot Precision Co Ltd | Speaker diaphragm |
JPH03146672A (en) * | 1989-11-02 | 1991-06-21 | Denki Kagaku Kogyo Kk | Susceptor for cvd |
JPH08133877A (en) * | 1994-11-11 | 1996-05-28 | Laser Noshuku Gijutsu Kenkyu Kumiai | Method for coating graphite with ceramic |
JPH08295583A (en) * | 1995-04-25 | 1996-11-12 | Mitsubishi Heavy Ind Ltd | Carbonaceous material with oxidation resistant coating for use at high temperature |
JPH10167885A (en) * | 1996-12-13 | 1998-06-23 | Toyo Tanso Kk | Susceptor for vapor growth |
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