TWI409610B - Temperature coefficient modulating circuit and temperature compensation circuit - Google Patents
Temperature coefficient modulating circuit and temperature compensation circuit Download PDFInfo
- Publication number
- TWI409610B TWI409610B TW98143486A TW98143486A TWI409610B TW I409610 B TWI409610 B TW I409610B TW 98143486 A TW98143486 A TW 98143486A TW 98143486 A TW98143486 A TW 98143486A TW I409610 B TWI409610 B TW I409610B
- Authority
- TW
- Taiwan
- Prior art keywords
- temperature coefficient
- current
- coefficient
- temperature
- circuit
- Prior art date
Links
Landscapes
- Amplifiers (AREA)
Abstract
Description
本發明係關於一溫度係數調整電路及溫度補償電路,尤指可提高溫度係數之溫度係數調整電路及溫度補償電路。The invention relates to a temperature coefficient adjusting circuit and a temperature compensating circuit, in particular to a temperature coefficient adjusting circuit and a temperature compensating circuit which can improve the temperature coefficient.
電子元件的特性會受到操作溫度的變化而有所不同。為了避免溫度的變化影響到電子元件的特性表現,一般會使用溫度補償的方式,以修正溫度變化所造成的影響。而溫度補償最常見的參考元件為熱敏電阻,利用熱敏電阻的電阻值隨溫度變化而變化的特性來修正電子元件的特性隨溫度的變化量,使電子元件的表現溫度、不隨溫度變化。The characteristics of electronic components vary depending on the operating temperature. In order to avoid temperature changes affecting the performance of electronic components, temperature compensation is generally used to correct the effects of temperature changes. The most common reference component for temperature compensation is the thermistor, which uses the characteristic that the resistance value of the thermistor changes with temperature to correct the variation of the characteristics of the electronic component with temperature, so that the performance temperature of the electronic component does not change with temperature. .
由於熱敏電阻本身可提供的溫度係數範圍有限,對於需要較大的溫度係數值作為溫度補償參考的應用環境就無法適用。針對這種需要較大溫度係數值以進行溫度補償的情況,習知技術使用如第一圖所示的溫度補償電路來提高較大的溫度係數值。第一圖所示的溫度補償電路包含了一電流源IDC、一熱敏電阻RNTC、一類比數位轉換器A/D以及一調整電流源IC。電流源IDC提供不隨溫定變化之穩定電流流經熱敏電阻RNTC,而熱敏電阻RNTC為具有負溫度係數電阻值之電阻。因此,當溫度上升時,熱敏電阻RNTC上的跨壓會下降。類比數位轉換器A/D偵測熱敏電阻RNTC上的跨壓變化,並轉換成數位的控制訊號以控制調整電流源IC的輸出電流IOUT_TC,使輸出電流IOUT_TC隨溫度而變化。透過類比數位轉換器A/D將熱敏電阻RNTC上的跨壓變化比例放大成調整電流源IC的輸出電流IOUT_TC的電流變化,因此可以得到較熱敏電阻本身的溫度係數值更大的溫度係數。Since the thermistor itself can provide a limited temperature coefficient range, it is not suitable for applications that require a large temperature coefficient value as a temperature compensation reference. In the case where such a large temperature coefficient value is required for temperature compensation, the conventional technique uses a temperature compensation circuit as shown in the first figure to increase a large temperature coefficient value. The temperature compensation circuit shown in the first figure comprises a current source IDC, a thermistor RNTC, an analog-to-digital converter A/D and an adjustment current source IC. The current source IDC provides a steady current that does not change with temperature and flows through the thermistor RNTC, and the thermistor RNTC is a resistor having a negative temperature coefficient resistance value. Therefore, when the temperature rises, the voltage across the thermistor RNTC drops. The analog-to-digital converter A/D detects the voltage change across the thermistor RNTC and converts it into a digital control signal to control the output current IOUT_TC of the current source IC so that the output current IOUT_TC changes with temperature. The ratio of the voltage across the thermistor RNTC is amplified by the analog digital converter A/D to adjust the current change of the output current IOUT_TC of the current source IC, so that a temperature coefficient larger than the temperature coefficient value of the thermistor itself can be obtained. .
然而,利用類比數位轉換器,不僅使電路的晶片面積增加而造成電路成本的上升,而且也增加的電路的複雜度,另外,溫度係數的精度也會受到A/D精度的影響。However, the use of an analog-to-digital converter not only increases the circuit area of the circuit, but also increases the circuit cost, and also increases the complexity of the circuit. In addition, the accuracy of the temperature coefficient is also affected by the A/D accuracy.
鑑於先前技術中的溫度補償電路的成本高且電路複雜,本發明使用一個或以上的係數調整電路來調高溫度係數補償值,使溫度係數可以隨應用環境放大,而且溫度係數調整電路可以由簡單的類比放大器來達成,因此電路的構造簡單、溫度係數精準且成本低。In view of the high cost and complicated circuit of the temperature compensation circuit in the prior art, the present invention uses one or more coefficient adjustment circuits to increase the temperature coefficient compensation value, so that the temperature coefficient can be amplified according to the application environment, and the temperature coefficient adjustment circuit can be simplified. The analog amplifier is achieved, so the circuit is simple in construction, accurate in temperature coefficient and low in cost.
為達上述目的,本發明提供了一種溫度係數調整電路,包含一第一係數調整電路、一電阻以及一第二係數調整電路。第一係數調整電路具有一第一溫度係數,第一係數調整電路接收一輸入訊號並根據輸入訊號及第一溫度係數輸出一第一電流。電阻具有一第一相反溫度係數且第一相反溫度係數與第一溫度係數為異號數,電阻耦接第一係數調整電路以根據第一電流以產生一第一電壓。第二係數調整電路具有一第二溫度係數元件且第二溫度係數元件具有一第二溫度係數,第二係數調整電路接收第一電壓並根據第一電壓及第二溫度係數輸出一第二電流,其中第一溫度係數與第二溫度係數為同號數。To achieve the above object, the present invention provides a temperature coefficient adjustment circuit including a first coefficient adjustment circuit, a resistor, and a second coefficient adjustment circuit. The first coefficient adjustment circuit has a first temperature coefficient, and the first coefficient adjustment circuit receives an input signal and outputs a first current according to the input signal and the first temperature coefficient. The resistor has a first opposite temperature coefficient and the first opposite temperature coefficient and the first temperature coefficient are different numbers, and the resistor is coupled to the first coefficient adjusting circuit to generate a first voltage according to the first current. The second coefficient adjustment circuit has a second temperature coefficient component and the second temperature coefficient component has a second temperature coefficient, and the second coefficient adjustment circuit receives the first voltage and outputs a second current according to the first voltage and the second temperature coefficient, The first temperature coefficient and the second temperature coefficient are the same number.
本發明也提供了一種溫度補償電路,包含一偵測電路、一電阻以及一係數調整電路。偵測電路具有一第一溫度係數,並耦接一待測單元以輸出一第一電流,其中待測單元之溫度係數與第一溫度係數為同號數。電阻具有一第一相反溫度係數且第一相反溫度係數與第一溫度係數為異號數,電阻耦接偵測電路以根據第一電流以產生一第一電壓。係數調整電路具有一第二溫度係數,係數調整電路接收第一電壓並根據第一電壓及第二溫度係數輸出一第二電流,其中第一溫度係數與第二溫度係數為同號數。The invention also provides a temperature compensation circuit comprising a detection circuit, a resistor and a coefficient adjustment circuit. The detecting circuit has a first temperature coefficient and is coupled to a unit to be tested to output a first current, wherein the temperature coefficient of the unit to be tested and the first temperature coefficient are the same number. The resistor has a first opposite temperature coefficient and the first opposite temperature coefficient and the first temperature coefficient are different numbers, and the resistor is coupled to the detecting circuit to generate a first voltage according to the first current. The coefficient adjustment circuit has a second temperature coefficient, and the coefficient adjustment circuit receives the first voltage and outputs a second current according to the first voltage and the second temperature coefficient, wherein the first temperature coefficient and the second temperature coefficient are the same number.
以上的概述與接下來的詳細說明皆為示範性質,是為了進一步說明本發明的申請專利範圍。而有關本發明的其他目的與優點,將在後續的說明與圖示加以闡述。The above summary and the following detailed description are exemplary in order to further illustrate the scope of the claims. Other objects and advantages of the present invention will be described in the following description and drawings.
請參見第二圖,為根據本發明之一第一實施例之溫度係數調整電路之電路示意圖。溫度係數調整電路包含係數調整電路TCB及電流鏡電路CM。係數調整電路TCB包含了一第一熱敏電阻RP、一放大器EA、一電晶體M以及一第二熱敏電阻RN,其中第一熱敏電阻RP具有一正溫度係數而第二熱敏電阻RN具有一負溫度係數。係數調整電路TCB接收一輸入訊號ITC,在本實施例為一電流訊號,經過第一熱敏電阻RP產生一跨壓並輸入放大器EA的非反相輸入端。電晶體M具有一第一端、一第二端以及一控制端,第一端提供放大電流ITC’,第二端與第二熱敏電阻RN連接以產生一訊號至放大器EA的反相輸入端。放大器EA的輸出端與 電晶體M的控制端連接。由於放大器EA與電晶體M構成一電壓隨耦器,故放大器EA的反相輸入端與非反相輸入端的電壓會相同,因此可以得到:Itc*Rp=Itc’*Rn;其中,Itc為輸入訊號ITC的電流大小、Itc’為放大電流ITC’的電流大小、Rp為第一熱敏電阻RP的電阻值以及Rn為第二熱敏電阻RN的電阻值。Referring to the second figure, there is shown a circuit diagram of a temperature coefficient adjusting circuit according to a first embodiment of the present invention. The temperature coefficient adjustment circuit includes a coefficient adjustment circuit TCB and a current mirror circuit CM. The coefficient adjustment circuit TCB includes a first thermistor RP, an amplifier EA, a transistor M, and a second thermistor RN, wherein the first thermistor RP has a positive temperature coefficient and the second thermistor RN Has a negative temperature coefficient. The coefficient adjustment circuit TCB receives an input signal ITC, which in this embodiment is a current signal, generates a voltage across the first thermistor RP and inputs the non-inverting input of the amplifier EA. The transistor M has a first end, a second end and a control end. The first end provides an amplification current ITC', and the second end is connected to the second thermistor RN to generate a signal to the inverting input of the amplifier EA. . The output of the amplifier EA The control terminal of the transistor M is connected. Since the amplifier EA and the transistor M form a voltage follower, the voltages of the inverting input and the non-inverting input of the amplifier EA are the same, so that: Itc*Rp=Itc'*Rn; where Itc is the input The current magnitude of the signal ITC, Itc' is the current magnitude of the amplification current ITC', Rp is the resistance value of the first thermistor RP, and Rn is the resistance value of the second thermistor RN.
上式可以改寫為:Itc’=Itc*(Rp/Rn)The above formula can be rewritten as: Itc’=Itc*(Rp/Rn)
因此,輸入訊號ITC的電流以(Rp/Rn)的比例放大成放大電流ITC’。在本實施例,第二熱敏電阻RN的電阻值Rn具有一負溫度係數(<1),因此會隨溫度上升而下降,而第一熱敏電阻RP的電阻值Rn具有一正溫度係數(>1),故(Rp/Rn)將比Rp的溫度係數為高而達到放大溫度係數之效果。Therefore, the current of the input signal ITC is amplified to the amplification current ITC' at the ratio of (Rp/Rn). In this embodiment, the resistance value Rn of the second thermistor RN has a negative temperature coefficient (<1), and thus decreases as the temperature rises, and the resistance value Rn of the first thermistor RP has a positive temperature coefficient ( >1), so (Rp/Rn) will have a higher temperature coefficient than Rp and achieve the effect of amplifying the temperature coefficient.
由於放大電流ITC’之電流方向為流入係數調整電路TCB,對於一些需要電流方向為流出的應用環境,可以如本實施例般連接電流鏡電路CM,以提供電流方向為流出之一輸出電流訊號IBPTC。構成電流鏡電路CM的兩個P型金氧半場效電晶體的通道寬長比為1:N,故可進一步調整提供的電流大小,以配合不同電流需求。Since the current direction of the amplification current ITC' is the inflow coefficient adjustment circuit TCB, for some applications requiring the current direction to flow out, the current mirror circuit CM can be connected as in the present embodiment to provide a current direction as an output current signal IBPTC. . The two P-type MOS field-effect transistors constituting the current mirror circuit CM have a channel width to length ratio of 1:N, so that the supplied current can be further adjusted to match different current demands.
輸入訊號ITC可以是一偵測訊號或一不隨溫度變化穩定的訊號。若為偵測訊號,則透過本發明之溫度係數調整電路,可以補償偵測訊號的溫度影響,使輸出電流訊號IBPTC可以代表不受溫度影響的偵測結果。若輸入訊號ITC為不隨溫度變化穩定的訊號,則輸出電流訊號IBPTC為隨溫度變化的訊號,可以提供其他電路對應溫度而變化的參考。這些應用可參考下述的其他實施例。The input signal ITC can be a detection signal or a signal that does not change with temperature. If it is a detection signal, the temperature coefficient adjustment circuit of the present invention can compensate for the temperature influence of the detection signal, so that the output current signal IBPTC can represent the detection result that is not affected by the temperature. If the input signal ITC is a signal that does not change with temperature, the output current signal IBPTC is a signal that changes with temperature, and can provide a reference for other circuits to change according to temperature. These applications can be referred to other embodiments described below.
請參見第三圖,為根據本發明之一第二實施例之溫度係數調整電路之電路示意圖。溫度係數調整電路包含一能隙電壓參考電路(Bandgap reference circuit)VBG、一係數調整電路TCB以及一電流鏡電路CM。本實施例與第二圖所示的實施例不同之處在於係數調整電路TCB。係數調整電路TCB包含一雙載子電晶體BJT以及一溫度係數元件Rtc。能隙電壓參考電路VBG提供一不隨溫度變化的穩定電壓訊號至雙載子電晶體BJT的基極。雙載子電晶體BJT的射極耦接至溫度係數元件Rtc。溫度係數元件Rtc可以是一負溫度係數之熱敏電阻。雙載子電晶體BJT的導通電壓Vbe具有負溫度係數,故溫度上升時,溫度係數元件Rtc的跨壓會上升,使流過溫度係數元件Rtc的電流隨溫度上升的斜率(即溫度係數)將比溫度係數元件Rtc單獨造成的斜率還大。因此,雙載子電晶體BJT提供的電流,即流過溫度係數元件Rtc的電流的溫度係數被放大了,再經過電流鏡電路CM後產生一輸出電流訊號IBPTC。Referring to the third figure, there is shown a circuit diagram of a temperature coefficient adjusting circuit according to a second embodiment of the present invention. The temperature coefficient adjustment circuit includes a bandgap reference circuit VBG, a coefficient adjustment circuit TCB, and a current mirror circuit CM. This embodiment differs from the embodiment shown in the second figure in the coefficient adjustment circuit TCB. The coefficient adjustment circuit TCB includes a dual carrier transistor BJT and a temperature coefficient element Rtc. The bandgap voltage reference circuit VBG provides a stable voltage signal that does not vary with temperature to the base of the bipolar transistor BJT. The emitter of the bipolar transistor BJT is coupled to the temperature coefficient element Rtc. The temperature coefficient element Rtc can be a negative temperature coefficient thermistor. The on-voltage Vbe of the bipolar transistor BJT has a negative temperature coefficient, so when the temperature rises, the voltage across the temperature coefficient element Rtc rises, so that the slope of the current flowing through the temperature coefficient element Rtc rises with temperature (ie, the temperature coefficient). The slope caused by the temperature coefficient element Rtc alone is also large. Therefore, the current supplied by the bipolar transistor BJT, that is, the temperature coefficient of the current flowing through the temperature coefficient element Rtc is amplified, and an output current signal IBPTC is generated after passing through the current mirror circuit CM.
接下來請參見第四圖,為根據本發明之一第三實施例之溫度係數調整電路之電路示意圖。溫度係數調整電路包含一第一係數調整電路TCB1、一電阻RP1、一第二係數調整電路TCB2、一第一電流鏡電路CM1以及一第二電流鏡電路CM2。第一係數調整電路TCB1具有一第一溫度係數元件,在本實施例由一第一負溫度係數熱敏電阻RN0及一第二負溫度係數熱敏電阻RN1串聯而成。第一係數調整電路TCB1包含了一由放大器及電晶體構成的電壓隨耦器,以接收由一能隙電壓參考電路VBG所產生的輸入訊號Vbg,使第一溫度係數元件上的跨壓等於輸入訊號Vbg的電壓,其中輸入訊號Vbg的電壓為不隨溫度變化之穩定電壓。關於電壓隨耦器的描述請參見第二圖的說明。因此,第一溫度係數元件及電晶體會流經一第一電流ITC1,其電流大小為第一溫度係數元件的跨壓除以第一溫度係數元件的電阻值,故第一電流ITC1具有一正溫度係數。Next, please refer to the fourth figure, which is a circuit diagram of a temperature coefficient adjusting circuit according to a third embodiment of the present invention. The temperature coefficient adjustment circuit includes a first coefficient adjustment circuit TCB1, a resistor RP1, a second coefficient adjustment circuit TCB2, a first current mirror circuit CM1, and a second current mirror circuit CM2. The first coefficient adjustment circuit TCB1 has a first temperature coefficient component. In this embodiment, a first negative temperature coefficient thermistor RN0 and a second negative temperature coefficient thermistor RN1 are connected in series. The first coefficient adjustment circuit TCB1 includes a voltage follower composed of an amplifier and a transistor to receive the input signal Vbg generated by a bandgap voltage reference circuit VBG, so that the voltage across the first temperature coefficient component is equal to the input. The voltage of the signal Vbg, wherein the voltage of the input signal Vbg is a stable voltage that does not change with temperature. See the description of the second figure for a description of the voltage follower. Therefore, the first temperature coefficient component and the transistor will flow through a first current ITC1, and the current magnitude is the voltage across the first temperature coefficient component divided by the resistance value of the first temperature coefficient component, so the first current ITC1 has a positive Temperature Coefficient.
第一電流鏡電路CM1耦接於第一係數調整電路TCB1及電阻RP1之間,以比例放大第一電流ITC1成為一放大電流ITC2以提供給電阻RP1。在本實施例中,電阻RP1的溫度係數與第一係數調整電路TCB1中的第一溫度係數元件的溫度係數互為異號數,也就是電阻RP1的溫度係數為正溫度係數時,第一溫度係數元件的溫度係數為負溫度係數,反則反之。在本實施例,電阻RP1具有正溫度係數。因此,放大電流ITC2流經電阻RP1所產生的電壓訊號,其溫度係數將進一步被提高。而第二係數調整電路TCB2的電路結構與第一係數調整電路TCB1相似,包含由放大器及電晶體構成的電壓隨耦器以及第二溫度係數元件RN2,在本實施例的第二溫度係數元件RN2為一負溫度係數之熱敏電阻,與第一溫度係數元件之為溫度係數為同號數。因此,電阻RP1產生的電壓訊號的溫度係數會被再度提升,並經第二電流鏡電路CM2的比例放大後輸出一輸出電流訊號IBPTC。The first current mirror circuit CM1 is coupled between the first coefficient adjustment circuit TCB1 and the resistor RP1 to proportionally amplify the first current ITC1 into an amplification current ITC2 to be supplied to the resistor RP1. In this embodiment, the temperature coefficient of the resistor RP1 and the temperature coefficient of the first temperature coefficient component in the first coefficient adjustment circuit TCB1 are different numbers, that is, when the temperature coefficient of the resistor RP1 is a positive temperature coefficient, the first temperature The temperature coefficient of the coefficient element is a negative temperature coefficient, and vice versa. In the present embodiment, the resistor RP1 has a positive temperature coefficient. Therefore, the temperature signal generated by the amplification current ITC2 flowing through the resistor RP1 will be further improved. The circuit structure of the second coefficient adjustment circuit TCB2 is similar to that of the first coefficient adjustment circuit TCB1, and includes a voltage follower composed of an amplifier and a transistor and a second temperature coefficient element RN2, and the second temperature coefficient element RN2 in this embodiment. The thermistor with a negative temperature coefficient has the same temperature coefficient as the temperature coefficient of the first temperature coefficient component. Therefore, the temperature coefficient of the voltage signal generated by the resistor RP1 is again increased, and is amplified by the second current mirror circuit CM2 to output an output current signal IBPTC.
相較於前述兩實施例,第四圖所示之實施例多了電阻RP1及第二係數調整電路TCB2進行溫度係數的提升,故本實施例溫度係數的提升效果更為明顯。Compared with the foregoing two embodiments, the embodiment shown in the fourth embodiment has more resistance RP1 and second coefficient adjustment circuit TCB2 to improve the temperature coefficient, so the temperature coefficient lifting effect of the embodiment is more obvious.
請參見第五圖,為根據本發明之一第四實施例之溫度係數調整電路之電路方塊圖。輸入訊號ITC0經過第一係數調整電路ITCB1、第一電阻Rt1、第二係數調整電路ITCB2、第二電阻Rt2、……、第n係數調整電路ITCBn、第n電阻Rtn的多階放大後成為輸出訊號ITCn。第一係數調整電路ITCB1、第二係數調整電路ITCB2、…、第n係數調整電路ITCBn可以為上述實施例中的係數調整電路,且每一係數調整電路的溫度係數調整量(即,所輸出的訊號/所接收的訊號)均為同號數。另外,第一電阻Rt1、第二電阻Rt2、…、第n電阻Rtn可視預計輸出訊號為電壓或電流或者後階的電路能處理的訊號種類而決定是否裝設。如第二圖到第四圖所示係數調整電路為輸入電壓訊號並輸出電流訊號,因此需透過上述電阻Rt1~Rtn的轉換,將輸出的電流訊號轉換成電壓訊號。Referring to FIG. 5, a circuit block diagram of a temperature coefficient adjusting circuit according to a fourth embodiment of the present invention. The input signal ITC0 is multiplied by the first coefficient adjustment circuit ITCB1, the first resistor Rt1, the second coefficient adjustment circuit ITCB2, the second resistor Rt2, ..., the nth coefficient adjustment circuit ITCBn, and the nth resistor Rtn to become an output signal. ITCn. The first coefficient adjustment circuit ITCB1, the second coefficient adjustment circuit ITCB2, ..., the nth coefficient adjustment circuit ITCBn may be the coefficient adjustment circuit in the above embodiment, and the temperature coefficient adjustment amount of each coefficient adjustment circuit (ie, the output The signal/received signal) are all the same number. In addition, the first resistor Rt1, the second resistor Rt2, ..., and the nth resistor Rtn may be determined whether the output signal is a voltage or a current or a signal type that can be processed by a circuit of a subsequent stage. As shown in the second to fourth figures, the coefficient adjustment circuit is an input voltage signal and outputs a current signal. Therefore, the output current signal is converted into a voltage signal through the conversion of the resistors Rt1 to Rtn.
再來請參見第六圖,為根據本發明之溫度補償電路之電路示意圖。溫度補償電路包含一偵測電路DET、一電阻Rtc2以及一係數調整電路TCB3。偵測電路DET具有一第一溫度係數元件Rtc1,且透過第一偵測端D1及第二偵測端D2耦接一待測單元DUT以輸出一第一電流IDE。在本實施例,第一偵測端D1及第二偵測端D2為偵測電路DET中的放大器的兩輸入端。由於為補償待測單元DUT隨溫度變化所造成的跨壓Vde變化,故第一溫度係數元件Rtc1之溫度係數與待測單元之溫度係數為同號數,而與電阻Rtc2的溫度係數為異號數。第一電流IDE經一第一電流鏡電路CM1放大成為放大電流ITCC1後輸入電阻Rtc2,以產生一電壓訊號輸入係數調整電路TCB3。係數調整電路TCB3具有一第三溫度係數元件Rtc3,其與第一溫度係數元件Rtc1為同號數的溫度係數,並根據電壓訊號及本身的溫度係數而輸出電流,並經一第二電流鏡電路CM2比例放大成放大電流ITCC2輸出。Referring again to the sixth figure, there is shown a circuit diagram of a temperature compensation circuit according to the present invention. The temperature compensation circuit includes a detection circuit DET, a resistor Rtc2, and a coefficient adjustment circuit TCB3. The detection circuit DET has a first temperature coefficient component Rtc1, and is coupled to a device under test DUT through the first detection terminal D1 and the second detection terminal D2 to output a first current IDE. In this embodiment, the first detecting end D1 and the second detecting end D2 are two input ends of the amplifier in the detecting circuit DET. The temperature coefficient of the first temperature coefficient component Rtc1 is the same as the temperature coefficient of the unit to be tested, and the temperature coefficient of the resistor Rtc2 is an opposite sign, in order to compensate for the change in the voltage Vde caused by the temperature change of the DUT to be tested. number. The first current IDE is amplified by a first current mirror circuit CM1 to be an amplification current ITCC1 and then input to a resistor Rtc2 to generate a voltage signal input coefficient adjustment circuit TCB3. The coefficient adjustment circuit TCB3 has a third temperature coefficient element Rtc3 which is a temperature coefficient of the same number as the first temperature coefficient element Rtc1, and outputs a current according to the voltage signal and its own temperature coefficient, and passes through a second current mirror circuit. The CM2 ratio is amplified to an amplified current ITCC2 output.
待測單元DUT可以是一偵測電阻(例如:使用於迴授控制的電路中的迴授偵測電阻)、一金氧半場效電晶體的導通電阻、一發光二極體或其他會隨溫度改變特性表現的電子元件甚至是電路。而本發明的溫度補償電路的等效溫度係數可以透過係數調整電路及熱敏電阻的溫度係數之調整而改變,使其恰為待測單元DUT的溫度係數之倒數,藉此補償後而得到與溫度無關的一訊號輸出。The DUT to be tested may be a detecting resistor (for example, a feedback detecting resistor used in a circuit for feedback control), an on-resistance of a MOS field-effect transistor, a light-emitting diode or the like. Electronic components that change the performance of a feature are even circuits. The equivalent temperature coefficient of the temperature compensating circuit of the present invention can be changed by adjusting the temperature coefficient of the coefficient adjusting circuit and the thermistor so as to be the reciprocal of the temperature coefficient of the DUT of the unit to be tested, thereby obtaining compensation and compensation. Temperature independent of a signal output.
由於本發明的溫度係數調整係透過如放大器、熱敏電阻及電晶體等簡單的類比電路及元件來達成,因此電路的構造相當簡單且成本相當低,而且可以隨應用環境的不同調整係數調整電路的個數或溫度係數而得到符合所需的溫度補償效果。Since the temperature coefficient adjustment of the present invention is achieved by simple analog circuits and components such as amplifiers, thermistors, and transistors, the circuit configuration is relatively simple and the cost is relatively low, and the adjustment coefficient adjustment circuit can be adjusted depending on the application environment. The number or temperature coefficient is obtained to meet the required temperature compensation effect.
如上所述,本發明完全符合專利三要件:新穎性、進步性和產業上的利用性。本發明在上文中已以較佳實施例揭露,然熟習本項技術者應理解的是,該實施例僅用於描繪本發明,而不應解讀為限制本發明之範圍。應注意的是,舉凡與該實施例等效之變化與置換,均應設為涵蓋於本發明之範疇內。因此,本發明之保護範圍當以下文之申請專利範圍所界定者為準。As described above, the present invention fully complies with the three requirements of the patent: novelty, advancement, and industrial applicability. The invention has been described above in terms of the preferred embodiments, and it should be understood by those skilled in the art that the present invention is not intended to limit the scope of the invention. It should be noted that variations and permutations equivalent to those of the embodiments are intended to be included within the scope of the present invention. Therefore, the scope of the invention is defined by the scope of the following claims.
先前技術:Prior art:
IDC‧‧‧電流源IDC‧‧‧current source
RNTC‧‧‧熱敏電阻RNTC‧‧‧Thermistor
A/D‧‧‧類比數位轉換器A/D‧‧‧ analog digital converter
IC‧‧‧調整電流源IC‧‧‧Adjust current source
IOUT_TC‧‧‧輸出電流IOUT_TC‧‧‧Output current
本發明:this invention:
RP、RN‧‧‧熱敏電阻RP, RN‧‧‧ thermistor
EA‧‧‧放大器EA‧‧Amplifier
M‧‧‧電晶體M‧‧‧O crystal
ITC、Vbg、ITC0‧‧‧輸入訊號ITC, Vbg, ITC0‧‧‧ input signals
ITC’、ITC2、ITCC1、ITCC2‧‧‧放大電流ITC’, ITC2, ITCC1, ITCC2‧‧‧Amplify current
IBPTC‧‧‧輸出電流訊號IBPTC‧‧‧ output current signal
VBG‧‧‧能隙電壓參考電路VBG‧‧‧gap voltage reference circuit
BJT‧‧‧雙載子電晶體BJT‧‧‧ double carrier transistor
Rtc、Rtc1、Rtc3‧‧‧溫度係數元件Rtc, Rtc1, Rtc3‧‧‧ temperature coefficient components
Vbe‧‧‧導通電壓Vbe‧‧‧ turn-on voltage
TCB、TCB1、TCB2、TCB3、ITCB1、ITCB2、ITCBn‧‧‧係數調整電路TCB, TCB1, TCB2, TCB3, ITCB1, ITCB2, ITCBn‧‧‧ coefficient adjustment circuit
RP1、Rtc2、Rt1、Rt2、Rtn‧‧‧電阻RP1, Rtc2, Rt1, Rt2, Rtn‧‧‧ resistor
CM、CM1、CM2‧‧‧電流鏡電路CM, CM1, CM2‧‧‧ current mirror circuit
RNO、RN1、RN2‧‧‧負溫度係數熱敏電阻RNO, RN1, RN2‧‧‧negative temperature coefficient thermistor
ITCn‧‧‧輸出訊號ITCn‧‧‧ output signal
DET‧‧‧偵測電路DET‧‧‧Detection Circuit
D1、D2‧‧‧偵測端D1, D2‧‧‧Detection
DUT‧‧‧待測單元DUT‧‧‧ unit to be tested
IDE‧‧‧電流IDE‧‧‧ Current
ITC1‧‧‧第一電流ITC1‧‧‧First current
Vde‧‧‧跨壓Vde‧‧‧cross pressure
Vbe‧‧‧導通電壓Vbe‧‧‧ turn-on voltage
第一圖為習知之溫度補償電路之電路示意圖。The first figure is a schematic circuit diagram of a conventional temperature compensation circuit.
第二圖為根據本發明之一第一實施例之溫度係數調整電路之電路示意圖。The second figure is a circuit diagram of a temperature coefficient adjustment circuit according to a first embodiment of the present invention.
第三圖為根據本發明之一第二實施例之溫度係數調整電路之電路示意圖。The third figure is a circuit diagram of a temperature coefficient adjustment circuit according to a second embodiment of the present invention.
第四圖為根據本發明之一第三實施例之溫度係數調整電路之電路示意圖。The fourth figure is a circuit diagram of a temperature coefficient adjusting circuit according to a third embodiment of the present invention.
第五圖為根據本發明之一第四實施例之溫度係數調整電路之電路方塊圖。Figure 5 is a circuit block diagram of a temperature coefficient adjustment circuit in accordance with a fourth embodiment of the present invention.
第六圖為根據本發明之溫度補償電路之電路示意圖。Figure 6 is a circuit diagram of a temperature compensation circuit in accordance with the present invention.
TCB1...第一係數調整電路TCB1. . . First coefficient adjustment circuit
RP1...電阻RP1. . . resistance
TCB2...第二係數調整電路TCB2. . . Second coefficient adjustment circuit
CM1...第一電流鏡電路CM1. . . First current mirror circuit
CM2...第二電流鏡電路CM2. . . Second current mirror circuit
RN0、RN1、RN2...負溫度係數熱敏電阻RN0, RN1, RN2. . . Negative temperature coefficient thermistor
VBG...能隙電壓參考電路VBG. . . Bandgap voltage reference circuit
Vbg...輸入訊號Vbg. . . Input signal
IBPTC...輸出電流訊號IBPTC. . . Output current signal
Claims (14)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW98143486A TWI409610B (en) | 2009-12-18 | 2009-12-18 | Temperature coefficient modulating circuit and temperature compensation circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW98143486A TWI409610B (en) | 2009-12-18 | 2009-12-18 | Temperature coefficient modulating circuit and temperature compensation circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201122756A TW201122756A (en) | 2011-07-01 |
TWI409610B true TWI409610B (en) | 2013-09-21 |
Family
ID=45046322
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW98143486A TWI409610B (en) | 2009-12-18 | 2009-12-18 | Temperature coefficient modulating circuit and temperature compensation circuit |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI409610B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI583125B (en) * | 2016-04-21 | 2017-05-11 | Relaxation oscillator |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI473402B (en) * | 2012-07-04 | 2015-02-11 | Excelliance Mos Corp | Power converting apparatus |
US9118249B2 (en) | 2012-07-27 | 2015-08-25 | Excelliance Mos Corporation | Power conversion apparatus |
TWI707221B (en) * | 2019-11-25 | 2020-10-11 | 瑞昱半導體股份有限公司 | Current generation circuit |
CN111522381B (en) * | 2020-04-15 | 2022-04-08 | 南京微盟电子有限公司 | Temperature coefficient adjustable current reference circuit and method |
TWI789671B (en) * | 2021-01-04 | 2023-01-11 | 紘康科技股份有限公司 | Reference circuit with temperature compensation |
CN114815950B (en) * | 2022-05-27 | 2024-03-12 | 浙江地芯引力科技有限公司 | Current generating circuit, chip and electronic equipment |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5646518A (en) * | 1994-11-18 | 1997-07-08 | Lucent Technologies Inc. | PTAT current source |
US6459326B2 (en) * | 2000-06-13 | 2002-10-01 | Em Microelectronic-Marin Sa | Method for generating a substantially temperature independent current and device allowing implementation of the same |
US6765372B2 (en) * | 2001-12-14 | 2004-07-20 | Intersil Americas Inc. | Programmable current-sensing circuit providing continuous temperature compensation for DC-DC Converter |
US7123081B2 (en) * | 2004-11-13 | 2006-10-17 | Agere Systems Inc. | Temperature compensated FET constant current source |
TW200913434A (en) * | 2007-09-03 | 2009-03-16 | Elite Micropower Inc | Constant-current, constant-voltage and constant-temperature current supply of a battery charger |
CN101599761A (en) * | 2008-06-06 | 2009-12-09 | 安华高科技Ecbuip(新加坡)私人有限公司 | Temperature-compensation circuit and method |
-
2009
- 2009-12-18 TW TW98143486A patent/TWI409610B/en not_active IP Right Cessation
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5646518A (en) * | 1994-11-18 | 1997-07-08 | Lucent Technologies Inc. | PTAT current source |
US6459326B2 (en) * | 2000-06-13 | 2002-10-01 | Em Microelectronic-Marin Sa | Method for generating a substantially temperature independent current and device allowing implementation of the same |
US6765372B2 (en) * | 2001-12-14 | 2004-07-20 | Intersil Americas Inc. | Programmable current-sensing circuit providing continuous temperature compensation for DC-DC Converter |
US7123081B2 (en) * | 2004-11-13 | 2006-10-17 | Agere Systems Inc. | Temperature compensated FET constant current source |
TW200913434A (en) * | 2007-09-03 | 2009-03-16 | Elite Micropower Inc | Constant-current, constant-voltage and constant-temperature current supply of a battery charger |
CN101599761A (en) * | 2008-06-06 | 2009-12-09 | 安华高科技Ecbuip(新加坡)私人有限公司 | Temperature-compensation circuit and method |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI583125B (en) * | 2016-04-21 | 2017-05-11 | Relaxation oscillator | |
US10432176B2 (en) | 2016-04-21 | 2019-10-01 | Syncmos Technologies International, Inc. | Relaxation oscillators with reduced errors or no errors in output frequencies caused by changes in temperatures and/or fabrication processes |
Also Published As
Publication number | Publication date |
---|---|
TW201122756A (en) | 2011-07-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI409610B (en) | Temperature coefficient modulating circuit and temperature compensation circuit | |
KR101829416B1 (en) | Compensated bandgap | |
US7439601B2 (en) | Linear integrated circuit temperature sensor apparatus with adjustable gain and offset | |
US10671109B2 (en) | Scalable low output impedance bandgap reference with current drive capability and high-order temperature curvature compensation | |
US20110109373A1 (en) | Temperature coefficient modulating circuit and temperature compensation circuit | |
US9104217B2 (en) | Electronic device and method for generating a curvature compensated bandgap reference voltage | |
JP2006221241A (en) | Reference voltage circuit | |
CN111384904B (en) | Power amplifying circuit and electronic device | |
US20130325391A1 (en) | Circuit and method for sensing temperature | |
Tian et al. | Silicon carbide fully differential amplifier characterized up to 500° C | |
US8446141B1 (en) | Bandgap curvature correction circuit for compensating temperature dependent bandgap reference signal | |
TWI721725B (en) | Flicker noise reduction in a temperature sensor arrangement | |
US7375576B2 (en) | Log circuit and highly linear differential-amplifier circuit | |
JP3222367B2 (en) | Temperature measurement circuit | |
US8556506B2 (en) | Temperature-current transducer | |
EP0915346A2 (en) | Current sensing circuit with high input impedance | |
US20080042740A1 (en) | Linear-in-decibel current generators | |
KR100617893B1 (en) | Band gap reference circuit | |
US20190277800A1 (en) | Conductance measurement circuit | |
JP2013036910A (en) | Temperature detection circuit | |
JP4842213B2 (en) | Semiconductor temperature sensor | |
JP2010277479A (en) | Power circuit | |
US20230139284A1 (en) | Bandgap reference circuit | |
JP2006059001A (en) | Reference voltage generation circuit | |
KR0169395B1 (en) | Reference voltage generator |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |