TWI398838B - Shift register unit, scan driving circuit, display apparatus and control method of shift register unit - Google Patents

Shift register unit, scan driving circuit, display apparatus and control method of shift register unit Download PDF

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TWI398838B
TWI398838B TW097151817A TW97151817A TWI398838B TW I398838 B TWI398838 B TW I398838B TW 097151817 A TW097151817 A TW 097151817A TW 97151817 A TW97151817 A TW 97151817A TW I398838 B TWI398838 B TW I398838B
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level
transistor
signal
boosting
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TW201025236A (en
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Yi Cheng Tsai
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Innolux Corp
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移位暫存單元、掃描驅動電路、顯示裝置及移位暫存 單元之控制方法Shift register unit, scan drive circuit, display device and shift register Unit control method

本發明係關於一種移位暫存單元、掃描驅動電路、顯示裝置及移位暫存單元之控制方法。The invention relates to a shift temporary storage unit, a scan driving circuit, a display device and a control method of a shift temporary storage unit.

顯示裝置由早期的陰極射線管(cathode ray tube,CRT)顯示裝置發展至現今的液晶顯示(liquid crystal display,LCD)裝置、有機發光二極體(organic light emitting diode,OLED)顯示裝置及電子紙(E-Paper)顯示裝置,並廣泛應用於通訊、資訊及消費性電子等產品上。The display device has been developed from an early cathode ray tube (CRT) display device to today's liquid crystal display (LCD) devices, organic light emitting diode (OLED) display devices, and electronic paper. (E-Paper) display device, and is widely used in communications, information and consumer electronics.

以液晶顯示裝置而言,其係包含一掃描驅動電路。掃描驅動電路具有一移位暫存單元,其係用以傳輸驅動訊號,以依序驅動與移位暫存單元電性連接的複數掃描線。請參照圖1所示,習知移位暫存單元1係包含複數移位暫存器11~13。其中,移位暫存器11係與掃描線S11 電性連接,移位暫存器12係與移位暫存器11以及掃描線S12 電性連接,移位暫存器13係與移位暫存器12以及掃描線S13 電性連接。In the case of a liquid crystal display device, it includes a scan driving circuit. The scan driving circuit has a shift register unit for transmitting a driving signal to sequentially drive the plurality of scan lines electrically connected to the shift register unit. Referring to FIG. 1 , the conventional shift register unit 1 includes a plurality of shift registers 11 to 13. The shift register 11 is electrically connected to the scan line S 11 , and the shift register 12 is electrically connected to the shift register 11 and the scan line S 12 , and the shift register 13 is shifted. The bit register 12 and the scan line S 13 are electrically connected.

於習知技術中,第一級移位暫存器的輸出係作為下一級移位暫存器起始訊號。於此,移位暫存器11之輸出除了傳送至掃描線S11 之外,更作為移位暫存器12的起始訊號。In the prior art, the output of the first stage shift register is used as the start signal of the next stage shift register. Thereto, the output of the shift register 11 transmits in addition to the scan lines S 11, and more as a starting signal of shift register 12.

然而,移位暫存器11~13因有電性連接於負載(例 如掃描線及薄膜電晶體等),而使得越後級的移位暫存器之輸出波形會產生越嚴重的時問延遲(RC delay)效應。當於驅動大尺寸、高解析度的顯示裝置時,其所需的移位暫存器個數將會增加。如此一來,越後級的移位暫存器將可能發生誤動作的情況。However, the shift registers 11 to 13 are electrically connected to the load (for example) Such as scan lines and thin film transistors, etc., so that the output waveform of the shift register of the later stage will produce a more serious RC delay effect. When driving a large-sized, high-resolution display device, the number of shift registers required will increase. As a result, the shift register of the later stage may be in a malfunction.

另外,在大尺寸、高解析度的顯示裝置中,每一條掃描線所傳送的訊號將需要驅動更多數量的薄膜電晶體,因此現行的移位暫存器的輸出功率將不足以負荷。In addition, in a large-sized, high-resolution display device, the signal transmitted by each scan line will need to drive a larger number of thin film transistors, so the output power of the current shift register will be insufficient.

因此,如何提供一種避免移位暫存器誤動作,且能夠增加其輸出功率的移位暫存單元、掃描驅動電路、顯示裝置及移位暫存單元之控制方法,實為當前的重要課題之一。Therefore, how to provide a shift temporary storage unit, a scan driving circuit, a display device, and a shift register unit control method capable of avoiding a malfunction of the shift register and increasing its output power is one of the current important topics. .

有鑑於上述課題,本發明之目的為提供一種能夠避免移位暫存器誤動作,且能夠增加其輸出功率的移位暫存單元、掃描驅動電路、顯示裝置及移位暫存單元之控制方法。In view of the above problems, an object of the present invention is to provide a shift register unit, a scan drive circuit, a display device, and a shift register unit control method capable of avoiding a malfunction of a shift register and increasing its output power.

為達上述目的,本發明提供一種移位暫存單元,其係與一第一掃描線配合應用。移位暫存單元包含一第一預升壓元件以及一第一升壓元件。第一預升壓元件依據一第一位移控制訊號輸出一第二位移控制訊號,並產生具有一第一準位之升壓訊號。第一預升壓元件依據一第一時脈訊號以及第一準位之升壓訊號輸出具有一第二準位之升壓訊號。第一升壓元件與第一預升壓元件以及第一掃描線電性 連接,依據一第二時脈訊號以及第二準位之升壓訊號產生具有一第三準位之升壓訊號。第一升壓元件依據第二時脈訊號以及第三準位之升壓訊號,俾使第一掃描線傳送一第一掃描訊號。To achieve the above object, the present invention provides a shift temporary storage unit that is used in conjunction with a first scan line. The shift register unit includes a first pre-boost element and a first boost element. The first pre-boosting component outputs a second displacement control signal according to a first displacement control signal, and generates a boosting signal having a first level. The first pre-boosting component outputs a boosting signal having a second level according to a first clock signal and a first level of the boosting signal. First boosting element and first pre-boosting element and first scan line electrical The connection generates a boost signal having a third level according to a second clock signal and a second level boost signal. The first boosting component causes the first scan line to transmit a first scan signal according to the second clock signal and the third level boost signal.

為達上述目的,本發明提供一種移位暫存單元之控制方法,其係與一第一掃描線配合應用。移位暫存單元具有一第一預升壓元件以及一第一升壓元件,第一升壓元件與第一預升壓元件以及第一掃描線電性連接。移位暫存單元之控制方法包含以下步驟:由第一預升壓元件依據一第一位移控制訊號輸出一第二位移控制訊號,並產生具有一第一準位之升壓訊號;由第一預升壓元件依據一第一時脈訊號以及第一準位之升壓訊號,俾使第一預升壓元件輸出具有一第二準位之升壓訊號;由第一升壓元件依據一第二時脈訊號以及第二準位之升壓訊號產生具有一第三準位之升壓訊號;以及由第一升壓元件依據第二時脈訊號以及第三準位之升壓訊號,俾使第一掃描線傳送一第一掃描訊號。To achieve the above object, the present invention provides a method for controlling a shift register unit, which is applied in conjunction with a first scan line. The shift register unit has a first pre-boosting component and a first boosting component, and the first boosting component is electrically connected to the first pre-boosting component and the first scan line. The control method of the shift register unit includes the following steps: outputting, by the first pre-boosting component, a second displacement control signal according to a first displacement control signal, and generating a boost signal having a first level; The pre-boosting component causes the first pre-boosting component to output a boosting signal having a second level according to a first clock signal and a first level of the boosting signal; The second clock signal and the second level boost signal generate a boost signal having a third level; and the first boosting element is based on the second clock signal and the third level boost signal, The first scan line transmits a first scan signal.

為達上述目的,本發明提供一種移位暫存單元之控制方法,其係與一第一掃描線配合應用。移位暫存單元具有一第一預升壓元件以及一第一升壓元件。第一預升壓元件具有一第一電晶體、一第二電晶體、一第三電晶體以及一第四電晶體。其中,第一電晶體之一汲極或一源極係與其一閘極電性連接,第二第晶體與第一電晶體電性連接,第三第晶體與第一電晶體以及第二電晶體電性連接,第四第 晶體與第一電晶體、第二電晶體以及第一升壓元件電性連接,而其一汲極或一源極係與其一閘極電性連接。第一升壓元件具有一與第四電晶體電性連接之第五電晶體。移位暫存單元之控制方法包含以下步驟:於一第一時間,輸入一高電壓準位之第一位移控制訊號導通第一電晶體以及第三電晶體,而使第一預升壓元件輸出一第二位移控制訊號,並產生具有一第一準位之升壓訊號至第五電晶體之一閘極;於一第二時間,輸入一高電壓準位之一第一時脈訊號,由第一預升壓元件輸出具有一第二準位之升壓訊號至第五電晶體之閘極;以及於一第三時間,輸入一高電壓準位之一第二時脈訊號,由第一預升壓元件輸出具有一第三準位之升壓訊號至第五電晶體之閘極。To achieve the above object, the present invention provides a method for controlling a shift register unit, which is applied in conjunction with a first scan line. The shift register unit has a first pre-boost element and a first boost element. The first pre-boosting element has a first transistor, a second transistor, a third transistor, and a fourth transistor. Wherein one of the first transistor has a drain or a source electrically connected to a gate thereof, the second crystal is electrically connected to the first transistor, the third crystal and the first transistor and the second transistor Electrical connection, fourth The crystal is electrically connected to the first transistor, the second transistor, and the first boosting element, and a drain or a source thereof is electrically connected to a gate thereof. The first boosting element has a fifth transistor electrically connected to the fourth transistor. The control method of the shift register unit includes the steps of: inputting a first voltage control signal of a high voltage level to turn on the first transistor and the third transistor at a first time, and outputting the first pre-boost component a second displacement control signal, and generating a boost signal having a first level to one of the gates of the fifth transistor; and at a second time, inputting a first clock signal of a high voltage level, The first pre-boosting component outputs a boost signal having a second level to a gate of the fifth transistor; and at a third time, inputting a second clock signal of a high voltage level, by the first The pre-boost element outputs a boost signal having a third level to the gate of the fifth transistor.

為達上述目的,本發明提供一種掃描驅動電路,其係與一第一掃描線配合應用,掃描驅動電路包含一移位暫存單元。移位暫存單元與第一掃描線電性連接,並具有一第一預升壓元件以及一第一升壓元件。第一預升壓元件依據一第一位移控制訊號輸出一第二位移控制訊號,並產生具有一第一準位之升壓訊號。第一預升壓元件依據第一時脈訊號以及第一準位之升壓訊號輸出具有一第二準位之升壓訊號。第一升壓元件與第一預升壓元件以及第一掃描線電性連接,依據一第二時脈訊號以及第二準位之升壓訊號產生具有一第三準位之升壓訊號。第一升壓元件依據第二時脈訊號以及第三準位之升壓訊號,俾使第一掃描線輸出一第一掃描訊號。To achieve the above object, the present invention provides a scan driving circuit that is used in conjunction with a first scan line, the scan drive circuit including a shift register unit. The shift register unit is electrically connected to the first scan line and has a first pre-boosting component and a first boosting component. The first pre-boosting component outputs a second displacement control signal according to a first displacement control signal, and generates a boosting signal having a first level. The first pre-boosting component outputs a boosting signal having a second level according to the first clock signal and the first level of the boosting signal. The first boosting component is electrically connected to the first pre-boosting component and the first scan line, and generates a boost signal having a third level according to a second clock signal and a boost signal of the second level. The first boosting component causes the first scan line to output a first scan signal according to the second clock signal and the third level boost signal.

為達上述目的,本發明提供一種顯示裝置,其係包含一顯示面板、一資料驅動電路以及一掃描驅動電路。資料驅動電路藉由複數資料線與顯示面板電性連接。掃描驅動電路藉由至少一第一掃描線與顯示面板電性連接,並具有移位暫存單元。移位暫存單元具有一第一預升壓元件以及一第一升壓元件。第一預升壓元件依據一第一位移控制訊號輸出一第二位移控制訊號,並產生具有一第一準位之升壓訊號。第一預升壓元件依據第一時脈訊號以及第一準位之升壓訊號輸出具有一第二準位之升壓訊號。第一升壓元件與第一預升壓元件以及第一掃描線電性連接,依據一第二時脈訊號以及第二準位之升壓訊號產生具有一第三準位之升壓訊號。第一升壓元件依據第二時脈訊號以及第三準位之升壓訊號,俾使第一掃描線傳送一第一掃描訊號。To achieve the above object, the present invention provides a display device including a display panel, a data driving circuit, and a scan driving circuit. The data driving circuit is electrically connected to the display panel by a plurality of data lines. The scan driving circuit is electrically connected to the display panel by at least one first scan line, and has a shift register unit. The shift register unit has a first pre-boost element and a first boost element. The first pre-boosting component outputs a second displacement control signal according to a first displacement control signal, and generates a boosting signal having a first level. The first pre-boosting component outputs a boosting signal having a second level according to the first clock signal and the first level of the boosting signal. The first boosting component is electrically connected to the first pre-boosting component and the first scan line, and generates a boost signal having a third level according to a second clock signal and a boost signal of the second level. The first boosting component causes the first scan line to transmit a first scan signal according to the second clock signal and the third level boost signal.

承上所述,依據本發明之移位暫存單元、掃描驅動電路、顯示裝置及移位暫存單元之控制方法,其係藉由預升壓元件輸出之第一位移控制訊號作為下一級預升壓元件的起始訊號。與習知技術相較,本實施例之第一位移控制訊號係直接傳送至下一級預升壓元件,因此,第一位移控制訊號不會產生時間延遲效應,而使得各級預升壓元件輸出之第二位移控制訊號可正常啟動相對應之升壓元件。另外,與掃描線電性連接之移位暫存單元的電晶體,其一閘極端之電壓準位係經由本發明之移位暫存單元之控制方法,由第一準位提升至第三準位,以提高升壓元件輸出功率,進而驅動更大的負載。According to the present invention, the shift temporary storage unit, the scan driving circuit, the display device and the shift temporary storage unit control method are the first displacement control signals output by the pre-boosting component as the next-level pre-control The start signal of the boost component. Compared with the prior art, the first displacement control signal of the embodiment is directly transmitted to the next-stage pre-boosting component. Therefore, the first displacement control signal does not generate a time delay effect, and the pre-boost components of each stage are output. The second displacement control signal can normally activate the corresponding boosting component. In addition, the voltage level of a gate terminal of the transistor of the shift register unit electrically connected to the scan line is raised from the first level to the third level by the control method of the shift register unit of the present invention. Bit to increase the boost component output power, which in turn drives a larger load.

以下將參照相關圖式,說明依本發明複數實施例之移位暫存單元、掃描驅動電路、顯示裝置及移位暫存單元之控制方法。Hereinafter, a method of controlling a shift register unit, a scan driving circuit, a display device, and a shift register unit according to a plurality of embodiments of the present invention will be described with reference to the related drawings.

請參照圖2所示,本發明較佳實施例之顯示裝置2係包含一顯示面板3、一資料驅動電路4以及一掃描驅動電路5。其中,掃描驅動電路5係藉由複數掃描線S21 ~S2m 與顯示面板3電性連接,資料驅動電路4係藉由複數資料線D21 ~D2n 與顯示面板3電性連接。Referring to FIG. 2, the display device 2 of the preferred embodiment of the present invention includes a display panel 3, a data driving circuit 4, and a scan driving circuit 5. The scan driving circuit 5 is electrically connected to the display panel 3 by the plurality of scanning lines S 21 to S 2m , and the data driving circuit 4 is electrically connected to the display panel 3 by the plurality of data lines D 21 to D 2n .

請參照圖3所示,本實施例之掃描驅動電路5係包含一移位暫存單元51,其係與掃描線S21 ~S2m 之至少其中之一配合應用。移位暫存單元51具有一第一預升壓元件511以及一第一升壓元件512。本實施例之移位暫存單元51更包含一第二預升壓元件513、一第二升壓元件514、一第三預升壓元件515、一第三升壓元件516、一第四預升壓元件517以及一第四升壓元件518。其中,第一升壓元件512與第一預升壓元件511以及掃描線S21 電性連接,第二預升壓元件513與第一預升壓元件511電性連接,第二升壓元件514與第一預升壓元件511、第二預升壓元件513、第一升壓元件512以及掃描線S22 電性連接。第三預升壓元件515與第二預升壓元件513電性連接,第三升壓元件516與第二預升壓元件513、第三預升壓元件515、第二升壓元件514以及掃描線S23 電性連接。第四預升壓元件517與第三預升壓元件515電性連接,第四升壓元件518與第 三預升壓元件515、第四預升壓元件517、第三升壓元件516以及掃描線S24 電性連接。熟知此一技藝者,當可依據其需求而增加預升壓元件以及升壓元件的個數。Referring to FIG. 3, the scan driving circuit 5 of the present embodiment includes a shift register unit 51, which is used in combination with at least one of the scan lines S 21 to S 2m . The shift register unit 51 has a first pre-boosting element 511 and a first boosting element 512. The shift register unit 51 of the embodiment further includes a second pre-boosting component 513, a second boosting component 514, a third pre-boosting component 515, a third boosting component 516, and a fourth pre- A boosting element 517 and a fourth boosting element 518. The first boosting component 512 is electrically connected to the first pre-boosting component 511 and the scan line S 21 , the second pre-boosting component 513 is electrically connected to the first pre-boosting component 511 , and the second boosting component 514 is electrically connected to the first boosting component 511 . the first pre-boosting element 511, a second pre-boosting element 513, element 512 and first booster 22 is electrically connected to the scan line S. The third pre-boosting component 515 is electrically connected to the second pre-boosting component 513, and the third boosting component 516 and the second pre-boosting component 513, the third pre-boosting component 515, the second boosting component 514, and the scan. Line S 23 is electrically connected. The fourth pre-boosting component 517 is electrically connected to the third pre-boosting component 515, and the fourth boosting component 518 and the third pre-boosting component 515, the fourth pre-boosting component 517, the third boosting component 516, and the scan. Line S 24 is electrically connected. It is well known to those skilled in the art that the number of pre-boost elements and boost elements can be increased depending on their needs.

於本實施例中,移位暫存單元51係可與四個時脈配合應用。於此,第一預升壓元件511以及第四升壓元件518與第一時脈訊號CK21 配合應用,第一升壓元件512以及第二預升壓元件513與第二時脈訊號CK22 配合應用,第二升壓元件514以及第三預升壓元件515與第三時脈訊號CK23 配合應用,第三升壓元件516以及第四預升壓元件517與第四時脈訊號CK24 配合應用。In this embodiment, the shift register unit 51 can be applied in conjunction with four clocks. The first pre-boosting component 511 and the fourth boosting component 518 are applied together with the first clock signal CK 21 , and the first boosting component 512 and the second pre-boosting component 513 and the second clock signal CK 22 . The second boosting component 514 and the third pre-boosting component 515 are used in conjunction with the third clock signal CK 23 , and the third boosting component 516 and the fourth pre-boosting component 517 and the fourth clock signal CK 24 . With the application.

另外,第二預升壓元件513、第三預升壓元件515以及第四預升壓元件517係可與第一預升壓元件511具有相同之電路,第二升壓元件514、第三升壓元件516以及第四升壓元件518係可與第一升壓元件512具有相同之電路。為簡化說明,以下將以第一預升壓元件511以及第一升壓元件512為例說明其內部電路架構。In addition, the second pre-boosting component 513, the third pre-boosting component 515, and the fourth pre-boosting component 517 can have the same circuit as the first pre-boosting component 511, and the second boosting component 514, the third booster The voltage element 516 and the fourth boost element 518 can have the same circuitry as the first boost element 512. To simplify the description, the internal circuit architecture will be described below by taking the first pre-boosting component 511 and the first boosting component 512 as an example.

第一實施例First embodiment

請參照圖4所示,其係為本發明第一實施例之移位暫存單元51,第一預升壓元件511包含一電晶體T101 、一電晶體T102 、一電晶體T103 以及一電晶體T104 。其中,電晶體T101 之一汲極或一源極係與其一閘極電性連接,電晶體T103 與電晶體T101 、電晶體T102 以及電晶體T104 電性連接,電晶體T104 之一汲極或一源極係與其一閘極電性連接。本實施例之第一預升壓元件511更包含一電晶體T105 ,其係 與電晶體T103 電性連接。Referring to FIG. 4, it is a shift temporary storage unit 51 according to the first embodiment of the present invention. The first pre-boosting element 511 includes a transistor T 101 , a transistor T 102 , a transistor T 103 , and A transistor T 104 . Wherein, one of the gates or the source of the transistor T 101 is electrically connected to a gate thereof, and the transistor T 103 is electrically connected to the transistor T 101 , the transistor T 102 and the transistor T 104 , and the transistor T 104 One of the drains or one source is electrically connected to its gate. The first pre-boosting element 511 of this embodiment further includes a transistor T 105 electrically connected to the transistor T 103 .

第一升壓元件512包含一電晶體T106 ,於本實施例中,第一升壓元件512更包含一電晶體T107 、一電晶體T108 、一電晶體T109 、一電晶體T110 以及一電晶體T111 。其中,電晶體T106 與電晶體T104 、電晶體T108 、電晶體T109 、電晶體T110 以及電晶體T111 電性連接,電晶體T107 與電晶體T108 電性連接。The first boosting component 512 includes a transistor T 106. In the embodiment, the first boosting component 512 further includes a transistor T 107 , a transistor T 108 , a transistor T 109 , and a transistor T 110 . And a transistor T 111 . The transistor T 106 is electrically connected to the transistor T 104 , the transistor T 108 , the transistor T 109 , the transistor T 110 , and the transistor T 111 , and the transistor T 107 is electrically connected to the transistor T 108 .

請參照圖5所示,於一第一時間t11 內,一第一位移控制訊號A11 輸出一高電壓準位,第二掃描線S22 傳送一低電壓準位之第二掃描訊號B12 ,一第二時脈訊號CK22 輸出一低電壓準位。此時,電晶體T102 、電晶體T105 以及電晶體T110 為截止狀態,電晶體T101 、電晶體T103 以及電晶體T104 為導通狀態。節點Pa 之節點電壓VPa 及節點Pb 之節點電壓VPb 分別如下所示:VPa =VDD -Vth ,VPb =VDD -2×VthReferring to Figure, t 11, a first displacement control signal output 5 A 11 at a first time a high voltage level, the second scan line S 22 transmits a low voltage level of the second scan signal B 12 A second clock signal CK 22 outputs a low voltage level. At this time, the transistor T 102 , the transistor T 105 , and the transistor T 110 are in an off state, and the transistor T 101 , the transistor T 103 , and the transistor T 104 are in an on state. P a node of the node and the node voltage V Pa P b of the node voltage V Pb are as follows: V Pa = V DD -V th , V Pb = V DD -2 × V th.

其中,第一位移控制訊號A11 之高電壓準位與低電壓準位之間的電壓差為VDD ,電晶體T101 以及電晶體T104 的臨限電壓(threshold voltage)分別為Vth ,節點Pa 之節點電壓VPa 為電晶體T103 之閘極端的電壓,節點Pb 之節點電壓VPb 為電晶體T106 之閘極端的電壓。於本實施例中,第一位移控制訊號A11 係可為一起始訊號。於此,電晶體T106 之閘極端具有一第一準位L1 之節點電壓VPb ,此時,第一準位L1 之電壓準位如下所示: L1 =VPb =VPb =VDD -2×VthThe voltage difference between the high voltage level and the low voltage level of the first displacement control signal A 11 is V DD , and the threshold voltage of the transistor T 101 and the transistor T 104 is V th , respectively. The node voltage V Pa of the node P a is the voltage of the gate terminal of the transistor T 103 , and the node voltage V Pb of the node P b is the voltage of the gate terminal of the transistor T 106 . In this embodiment, the first displacement control signal A 11 can be a start signal. Thereto, transistor T having a gate terminal 106 of the first level L 1 of the node voltage V Pb, In this case, the first level of the voltage level L 1 are as follows: L 1 = V Pb = V Pb = V DD -2 × V th .

同時,移位暫存單元51輸出一掃描訊號B11 ,於此,其係為第二時脈訊號CK22 ,因此,掃描訊號B11 為低電壓準位。At the same time, the shift register unit 51 outputs a scan signal B 11 , which is the second clock signal CK 22 , and therefore, the scan signal B 11 is at a low voltage level.

另外,經由電晶體T103 輸出一低電壓準位之第二位移控制訊號A12 ,並將其傳送至第二預升壓元件513。於本實施例中,第一時脈訊號CK21 即為第二位移控制訊號A12In addition, a second displacement control signal A 12 of a low voltage level is output via the transistor T 103 and transmitted to the second pre-boosting element 513. In this embodiment, the first clock signal CK 21 is the second displacement control signal A 12 .

於一第二時間t12 內,第一位移控制訊號A11 輸出一低電壓準位,第二掃描線S22 傳送一低電壓準位之第二掃描訊號B12 ,第一時脈訊號CK21 輸出高電壓準位,第二時脈訊號CK22 輸出低電壓準位。此時,電晶體T102 、電晶體T105 以及電晶體T110 為截止狀態,電晶體T101 、電晶體T103 以及電晶體T104 為導通狀態。節點Pa 之節點電壓VPa 為VDD -Vth ,電容C11 與電晶體T103 以及電晶體T105 電性連接之一端,其節點電壓之電壓準位提升△Vpa ,此時,節點Pa 之節點電壓VPa 及節點Pb 之節點電壓VPb 分別如下所示:VPa =VDD -Vth ,VPb =VDD -2×Vth +△VPaDuring a second time t 12 , the first displacement control signal A 11 outputs a low voltage level, and the second scan line S 22 transmits a low voltage level second scan signal B 12 , the first clock signal CK 21 The high voltage level is output, and the second clock signal CK 22 outputs a low voltage level. At this time, the transistor T 102 , the transistor T 105 , and the transistor T 110 are in an off state, and the transistor T 101 , the transistor T 103 , and the transistor T 104 are in an on state. The node voltage V Pa of the node P a is V DD -V th , and the capacitor C 11 is electrically connected to the transistor T 103 and the transistor T 105 , and the voltage level of the node voltage is raised by ΔV pa , at this time, the node The node voltage V Pa of P a and the node voltage V Pb of the node P b are as follows: V Pa = V DD - V th , V Pb = V DD - 2 × V th + ΔV Pa .

其中,△Vpa 為第一時脈訊號CK21 之高電壓準位與低電壓準位之間的電壓差。於此,電晶體T106 之閘極端具有一第二準位L2 之節點電壓VPb ,此時,第二準位L2 之節點電壓VPb 如下所示:VPb =VDD -2×Vth +△VPaWhere ΔV pa is the voltage difference between the high voltage level and the low voltage level of the first clock signal CK 21 . Thereto, transistor T having a gate terminal 106 of a second level L 2 of the node voltage V Pb, In this case, second level L 2 of the node voltage V Pb as follows: V Pb = V DD -2 × V th +ΔV Pa .

同時,移位暫存單元51輸出一掃描訊號B11 ,於此, 其係為第二時脈訊號CK22 ,因此,掃描訊號B11 為低電壓準位。At the same time, the shift register unit 51 outputs a scan signal B 11 , which is the second clock signal CK 22 , and therefore, the scan signal B 11 is at a low voltage level.

另外,經由電晶體T103 輸出一高電壓準位之第二位移控制訊號A12 ,並將其傳送至第二預升壓元件513。In addition, a second displacement control signal A 12 of a high voltage level is output via the transistor T 103 and transmitted to the second pre-boosting element 513.

於一第三時間t13 內,第一位移控制訊號A11 輸出一低電壓準位,第二掃描線S22 傳送一低電壓準位之第二掃描訊號B12 ,第一時脈訊號CK21 輸出低電壓準位,第二時脈訊號CK22 輸出高電壓準位。此時,電晶體T102 、電晶體T105 以及電晶體T110 為截止狀態,電晶體T101 、電晶體T103 以及電晶體T104 為導通狀態。此時,節點Pa 之節點電壓VPa 及節點Pb 之節點電壓VPb 分別如下所示:VPa =VDD -Vth +△VPa ,VPb =VDD -2×Vth +△VPaDuring a third time t 13 , the first displacement control signal A 11 outputs a low voltage level, and the second scan line S 22 transmits a low voltage level second scan signal B 12 , the first clock signal CK 21 The low voltage level is output, and the second clock signal CK 22 outputs a high voltage level. At this time, the transistor T 102 , the transistor T 105 , and the transistor T 110 are in an off state, and the transistor T 101 , the transistor T 103 , and the transistor T 104 are in an on state. In this case, the node P a node and the node voltage V Pa P b of the node voltage V Pb are as follows: V Pa = V DD -V th + △ V Pa, V Pb = V DD -2 × V th + △ V Pa .

又,電容C12 之一端與電晶體T106 以及電晶體T110 電性連接,其節點電壓之電壓準位提升△VPb ,此時,節點Pb 之節點電壓VPb 如下所示:VPb =VDD -2×Vth +△VPa +△VPbMoreover, one end of the capacitor C 12 is electrically connected to the transistor T 106 and the transistor T 110 , and the voltage level of the node voltage is increased by ΔV Pb . At this time, the node voltage V Pb of the node P b is as follows: V Pb =V DD -2 × V th +ΔV Pa +ΔV Pb .

其中,△VPb 為第二時脈訊號CK22 之高電壓準位與低電壓準位之間的電壓差。於此,電晶體T106 之閘極端具有一第三準位L3 之節點電壓VPb ,此時,第三準位L3 之節點電壓VPb 如下所示:VPb =VDD -2×Vth +△Vpa +△VpbWhere ΔV Pb is the voltage difference between the high voltage level and the low voltage level of the second clock signal CK 22 . Thereto, transistor T having a gate terminal 106 of the third level L 3 of the node voltage V Pb, In this case, the node L 3 third level of voltage V Pb as follows: V Pb = V DD -2 × V th +ΔV pa +ΔV pb .

同時,移位暫存單元51輸出一掃描訊號B11 ,於此,其係為第二時脈訊號CK22 ,因此,掃描訊號B11 為高電壓 準位。At the same time, the shift register unit 51 outputs a scan signal B 11 , which is the second clock signal CK 22 , and therefore, the scan signal B 11 is at a high voltage level.

另外,經由電晶體T103 輸出一低電壓準位之第二位移控制訊號A12 ,並將其傳送至第二預升壓元件513。In addition, a second displacement control signal A 12 of a low voltage level is output via the transistor T 103 and transmitted to the second pre-boosting element 513.

於一第四時間t14 內,第一位移控制訊號A11 輸出低電壓準位,第二掃描線S22 傳送高電壓準位之第二掃描訊號B12 ,第一時脈訊號CK21 輸出低電壓準位,第二時脈訊號CK22 輸出低電壓準位。此時,電晶體T102 、電晶體T105 、電晶體T109 以及電晶體T110 為導通狀態。此時,節點Pa 經由電晶體T102 放電,使得其節點電壓為接地電壓VSS 。節點Pb 經由電晶體T109 以及電晶體T108 放電,使得其節點電壓為接地電壓VSS 之節點電壓VPb 為接地電壓VSSDuring a fourth time t 14 , the first displacement control signal A 11 outputs a low voltage level, and the second scan line S 22 transmits a second scan signal B 12 of a high voltage level, and the first clock signal CK 21 outputs a low output. At the voltage level, the second clock signal CK 22 outputs a low voltage level. At this time, the transistor T 102 , the transistor T 105 , the transistor T 109 , and the transistor T 110 are in an on state. At this time, the node P a is discharged via the transistor T 102 such that its node voltage is the ground voltage V SS . Node P b via the transistor T 109 T 108 and discharge transistor, such that the node voltage is the ground voltage V SS node voltage VP b of the ground voltage V SS.

與習知技術相較,本實施例之第一預升壓元件511依據第一位移控制訊號A11 輸出第二位移控制訊號A12 ,並將其傳送至第二預升壓元件513。Compared with the prior art, the first pre-boosting component 511 of the present embodiment outputs the second displacement control signal A 12 according to the first displacement control signal A 11 and transmits it to the second pre-boosting component 513.

承上所述,本實施例之預升壓元件輸出之第一位移控制訊號作為下一級預升壓元件的起始訊號。與習知技術相較,本實施例之第一位移控制訊號係直接傳送至下一級預升壓元件,因此,第一位移控制訊號不會產生時間延遲效應,而使得各級預升壓元件輸出之第二位移控制訊號可正常啟動相對應之升壓元件。As described above, the first displacement control signal outputted by the pre-boosting component of the embodiment is used as the start signal of the next-stage pre-boosting component. Compared with the prior art, the first displacement control signal of the embodiment is directly transmitted to the next-stage pre-boosting component. Therefore, the first displacement control signal does not generate a time delay effect, and the pre-boost components of each stage are output. The second displacement control signal can normally activate the corresponding boosting component.

另外,電晶體T106 之閘極端之電壓準位係由第一準位提升至第三準位,因此,本實施例之移位暫存單元51係藉由提高升壓元件輸出功率,以驅動更大的負載。In addition, the voltage level of the gate terminal of the transistor T 106 is raised from the first level to the third level. Therefore, the shift register unit 51 of the embodiment is driven by increasing the output power of the boosting element. Larger load.

請參照圖6所示,其係為本發明第一實施例之移位暫 存單元的控制方法,其係包含步驟W11至步驟W14。Please refer to FIG. 6 , which is a shifting temporary embodiment of the first embodiment of the present invention. The control method of the storage unit includes steps W11 to W14.

步驟W11,係由第一預升壓元件依據一第一位移控制訊號輸出一第二位移控制訊號,並產生具有一第一準位之電壓訊號。In step W11, the first pre-boosting component outputs a second displacement control signal according to a first displacement control signal, and generates a voltage signal having a first level.

步驟W12,係由第一預升壓元件依據一第一時脈訊號及第一準位之電壓訊號,俾使第一預升壓元件輸出具有一第二準位之電壓訊號。In step W12, the first pre-boosting component outputs a voltage signal having a second level according to a voltage signal of the first clock signal and the first level.

步驟W13,係由第一升壓元件依據一第二時脈訊號及第二準位之電壓訊號產生具有一第三準位之電壓訊號。In step W13, the first boosting component generates a voltage signal having a third level according to a voltage signal of the second clock signal and the second level.

步驟W14,係由第一升壓元件依據第二時脈訊號及第三準位之電壓訊號,俾使第一掃描線輸出一第一掃描訊號。In step W14, the first boosting component outputs a first scan signal according to the voltage signals of the second clock signal and the third level.

其中詳細的控制方式,於上述實施例中已一併詳述,故於此不再加以贅述。The detailed control method has been described in detail in the above embodiments, and thus will not be further described herein.

請參照圖7所示,其係為本發明第一實施例之移位暫存單元的控制方法,其係包含步驟W21至步驟W23。移位暫存單元係與一第一掃描線配合應用,並具有一第一預升壓元件以及一第一升壓元件。第一預升壓元件具有一第一電晶體、一第二電晶體、一第三電晶體以及一第四電晶體。第一電晶體之一汲極或一源極係與其一閘極電性連接,第二第晶體與第一電晶體電性連接,第三第晶體與第一電晶體及第二電晶體電性連接。第四第晶體與第一電晶體、第二電晶體以及第一升壓元件電性連接,而其一汲極或一源極係與其一閘`電性連接。第一升壓元件具有一與 第四電晶體電性連接之第五電晶體。移位暫存單元的控制方法控制方法包含步驟W21至步驟W23。Referring to FIG. 7, it is a control method of the shift temporary storage unit according to the first embodiment of the present invention, which includes steps W21 to W23. The shift register unit is coupled to a first scan line and has a first pre-boost element and a first boost element. The first pre-boosting element has a first transistor, a second transistor, a third transistor, and a fourth transistor. One of the first transistor has a drain or a source electrically connected to a gate thereof, the second crystal is electrically connected to the first transistor, and the third crystal and the first transistor and the second transistor are electrically connected connection. The fourth crystal is electrically connected to the first transistor, the second transistor and the first boosting element, and a drain or a source thereof is electrically connected to the gate. The first boosting element has a The fourth transistor is electrically connected to the fifth transistor. The control method control method of the shift register unit includes steps W21 to W23.

步驟W21,係於一第一時間,輸入一高電壓準位之第一位移控制訊號導通第一電晶體以及第三電晶體,而使第一預升壓元件輸出一第二位移控制訊號,並產生具有一第一準位之電壓訊號至第五電晶體之一閘極。Step W21, in a first time, inputting a first voltage control signal of a high voltage level to turn on the first transistor and the third transistor, and causing the first pre-boosting component to output a second displacement control signal, and A voltage signal having a first level is generated to one of the gates of the fifth transistor.

步驟W22,係於一第二時間,輸入一高電壓準位之一第一時脈訊號,由第一預升壓元件輸出具有一第二準位之電壓訊號至第五電晶體之閘極。Step W22, in a second time, inputting a first clock signal of a high voltage level, and outputting, by the first pre-boosting component, a voltage signal having a second level to a gate of the fifth transistor.

步驟W23,係於一第三時間,輸入一高電壓準位之一第二時脈訊號,由第一預升壓元件輸出具有一第三準位之電壓訊號至第五電晶體。Step W23, in a third time, inputting a second clock signal of a high voltage level, and outputting, by the first pre-boosting component, a voltage signal having a third level to the fifth transistor.

其中詳細的控制方式,於上述實施例中已一併詳述,故於此不再加以贅述。The detailed control method has been described in detail in the above embodiments, and thus will not be further described herein.

第二實施例Second embodiment

請參照圖8所示,本發明第二實施例之移位暫存單元51a係包含一第一預升壓元件511a以及一第一升壓元件512a。第一預升壓元件511a係包含一電晶體T201 、一電晶體T202 以及一電晶體T203 。第一升壓元件512a包含一電晶體T206 、一電晶體T209 以及一電晶體T210Referring to FIG. 8, the shift register unit 51a of the second embodiment of the present invention includes a first pre-boosting element 511a and a first boosting element 512a. The first pre-boosting element 511a includes a transistor T 201 , a transistor T 202 , and a transistor T 203 . The first boosting element 512a includes a transistor T 206 , a transistor T 209 , and a transistor T 210 .

此外,移位暫存單元51a之第一預升壓元件511a以及第一升壓元件512a與第一實施例中之第一預升壓元件511以及第一升壓元件512具有相同的技術特徵及功能,故於此不再加以贅述。第一預升壓元件511a之電晶體T201 、電 晶體T202 以及電晶體T203 與第一實施例中之電晶體T101 、電晶體T102 以及電晶體T103 具有相同的技術特徵及功能,故於此不再加以贅述。第一升壓元件512a之電晶體T206 、電晶體T209 以及電晶體T210 與第一實施例中之電晶體T106 、電晶體T109 以及電晶體T11o 具有相同的技術特徵及功能,故於此不再加以贅述。In addition, the first pre-boosting element 511a and the first boosting element 512a of the shift register unit 51a have the same technical features as the first pre-boosting element 511 and the first boosting element 512 in the first embodiment. Function, so it will not be repeated here. The transistor T 201 , the transistor T 202 , and the transistor T 203 of the first pre-boosting element 511a have the same technical features and functions as the transistor T 101 , the transistor T 102 , and the transistor T 103 in the first embodiment. Therefore, it will not be repeated here. The transistor T 206 , the transistor T 209 , and the transistor T 210 of the first boosting element 512a have the same technical features and functions as the transistor T 106 , the transistor T 109 , and the transistor T 11o in the first embodiment. Therefore, it will not be repeated here.

本實施例之移位暫存單元51a包含一電容C23 ,其係與電晶體T206 電性連接。另外,熟知此一技藝者,當可經由第一實施例之說明,推得本實施例之移位暫存單元51a之作動情形,於此不再贅述。Shift register unit 51a of the present embodiment comprises a capacitor C 23, which system and the transistor T 206 is electrically connected. In addition, it is well known to those skilled in the art that the operation of the shift register unit 51a of the present embodiment can be deduced by the description of the first embodiment, and details are not described herein again.

第三實施例Third embodiment

於本實施例中,並非限定移位暫存單元需與四個時脈訊號配合應用,請參照圖9所示,本實施例之移位暫存單元61係可與三個時脈CK31 ~CK33 配合應用。移位暫存單元61具有一第一預升壓元件611以及一第一升壓元件612。本實施例之移位暫存單元61更包含一第二預升壓元件613、一第二升壓元件614、一第三預升壓元件615以及一第三升壓元件616。In this embodiment, the shift register unit is not limited to be applied to the four clock signals. Referring to FIG. 9, the shift register unit 61 of the present embodiment can be combined with three clocks CK 31 ~ CK 33 works with the application. The shift register unit 61 has a first pre-boosting element 611 and a first boosting element 612. The shift register unit 61 of the embodiment further includes a second pre-boosting component 613, a second boosting component 614, a third pre-boosting component 615, and a third boosting component 616.

移位暫存單元61之第一預升壓元件611、第一升壓元件612、第二預升壓元件613、第二升壓元件614、第三預升壓元件615以及一第三升壓元件616與上述實施例中之第一預升壓元件511、第一升壓元件512、第二預升壓元件513、第二升壓元件514、第三預升壓元件515以及一第三升壓元件516具有相同的技術特徵及功能,故於此不 再加以贅述。The first pre-boosting component 611, the first boosting component 612, the second pre-boosting component 613, the second boosting component 614, the third pre-boosting component 615, and a third boosting device of the shift register unit 61 The component 616 and the first pre-boosting component 511, the first boosting component 512, the second pre-boosting component 513, the second boosting component 514, the third pre-boosting component 515, and a third liter in the above embodiment The pressure element 516 has the same technical features and functions, so it is not Let me repeat them.

請參照圖10所示,第一預升壓元件611係包含一電晶體T301 、一電晶體T302 、一電晶體T303 、一電晶體T304 以及一電晶體T305 。第一升壓元件612包含一電晶體T306 、一電晶體T307 、一電晶體T308 、一電晶體T309 、一電晶體T310 以及一電晶體T311Referring to FIG. 10, the first pre-boosting element 611 includes a transistor T 301 , a transistor T 302 , a transistor T 303 , a transistor T 304 , and a transistor T 305 . The first boosting element 612 includes a transistor T 306 , a transistor T 307 , a transistor T 308 , a transistor T 309 , a transistor T 310 , and a transistor T 311 .

此外,移位暫存單元61之第一預升壓元件611以及第一升壓元件612與第一實施例中之第一預升壓元件511以及第一升壓元件512具有相同的技術特徵及功能,故於此不再加以贅述。第一預升壓元件611之電晶體T301 、電晶體T302 、電晶體T303 、電晶體T304 以及電晶體T305 與第一實施例中之電晶體T101 、電晶體T102 、電晶體T103 、電晶體T104 以及電晶體T105 具有相同的技術特徵及功能,故於此不再加以贅述。第一升壓元件612之電晶體T306 、電晶體T307 、電晶體T308 、電晶體T309 、電晶體T310 以及電晶體T311 與第一實施例中之電晶體T106 、電晶體T107 、電晶體T108 、電晶體T109 、電晶體T110 以及電晶體T111 具有相同的技術特徵及功能,故於此不再加以贅述。In addition, the first pre-boosting component 611 and the first boosting component 612 of the shift register unit 61 have the same technical features as the first pre-boosting component 511 and the first boosting component 512 in the first embodiment. Function, so it will not be repeated here. The transistor T 301 , the transistor T 302 , the transistor T 303 , the transistor T 304 , and the transistor T 305 of the first pre-boosting element 611 are different from the transistor T 101 , the transistor T 102 , and the electric in the first embodiment. The crystal T 103 , the transistor T 104 , and the transistor T 105 have the same technical features and functions, and thus will not be further described herein. The transistor T 306 of the first boosting element 612, the transistor T 307 , the transistor T 308 , the transistor T 309 , the transistor T 310 , and the transistor T 311 are the same as the transistor T 106 and the transistor in the first embodiment. T 107 , transistor T 108 , transistor T 109 , transistor T 110 , and transistor T 111 have the same technical features and functions, and thus will not be further described herein.

本實施例之移位暫存單元61更包含一電晶體T312 以及電晶體T313 ,電晶體T312 係與電晶體T306 電性連接,並依據第三時脈訊號CK33 控制其為導通或截止。電晶體T313 係與電晶體T306 電性連接,並依據第一時脈訊號CK31 控制其為導通或截止。另外,熟知此一技藝者,當可經由上述實施例之說明,推得本實施例之移位暫存單元61之作 動情形,於此不再贅述。The shift register unit 61 of the present embodiment further includes a transistor T 312 and a transistor T 313. The transistor T 312 is electrically connected to the transistor T 306 and is controlled to be turned on according to the third clock signal CK 33 . Or deadline. The transistor T 313 is electrically connected to the transistor T 306 and is controlled to be turned on or off according to the first clock signal CK 31 . In addition, it is well known to those skilled in the art that the operation of the shift register unit 61 of the present embodiment can be derived through the description of the above embodiments, and details are not described herein again.

第四實施例Fourth embodiment

請參照圖11所示,本實施例之移位暫存單元61a係可與三個時脈CK31 ~CK33 配合應用。移位暫存單元61a具有一第一預升壓元件611a以及一第一升壓元件612a。Referring to FIG. 11, the shift register unit 61a of the present embodiment can be applied in combination with three clocks CK 31 CK CK 33 . The shift register unit 61a has a first pre-boosting element 611a and a first boosting element 612a.

第一預升壓元件611a係包含一電晶體T401 、一電晶體T402 、一電晶體T403 、一電晶體T404 以及一電晶體T405 。第一升壓元件612a包含一電晶體T406 、一電晶體T407 、一電晶體T408 、一電晶體T409 、一電晶體T410 以及一電晶體T411The first pre-boosting element 611a includes a transistor T 401 , a transistor T 402 , a transistor T 403 , a transistor T 404 , and a transistor T 405 . The first boosting element 612a includes a transistor T 406 , a transistor T 407 , a transistor T 408 , a transistor T 409 , a transistor T 410 , and a transistor T 411 .

此外,移位暫存單元61a之第一預升壓元件611a以及第一升壓元件612a與上述實施例中之第一預升壓元件611以及第一升壓元件612具有相同的技術特徵及功能,故於此不再加以贅述。第一預升壓元件611a之電晶體T401 、電晶體T402 、電晶體T403 、電晶體T404 以及電晶體T405 與第一實施例中之電晶體T101 、電晶體T102 、電晶體T103 、電晶體T104 以及電晶體T105 具有相同的技術特徵及功能,故於此不再加以贅述。第一升壓元件612a之電晶體T406 、電晶體T407 、電晶體T408 、電晶體T409 、電晶體T410 以及電晶體T411 與第一實施例中之電晶體T106 、電晶體T107 、電晶體T108 、電晶體T109 、電晶體T110 以及電晶體T111 具有相同的技術特徵及功能,故於此不再加以贅述。In addition, the first pre-boosting element 611a and the first boosting element 612a of the shift register unit 61a have the same technical features and functions as the first pre-boosting element 611 and the first boosting element 612 in the above embodiment. Therefore, it will not be repeated here. The transistor T 401 of the first pre-boosting element 611a, the transistor T 402 , the transistor T 403 , the transistor T 404 and the transistor T 405 are the same as the transistor T 101 , the transistor T 102 , and the electric in the first embodiment. The crystal T 103 , the transistor T 104 , and the transistor T 105 have the same technical features and functions, and thus will not be further described herein. The transistor T 406 of the first boosting element 612a, the transistor T 407 , the transistor T 408 , the transistor T 409 , the transistor T 410 , and the transistor T 411 are the same as the transistor T 106 and the transistor in the first embodiment. T 107 , transistor T 108 , transistor T 109 , transistor T 110 , and transistor T 111 have the same technical features and functions, and thus will not be further described herein.

另外,熟知此一技藝者,當可經由上述實施例之說明,推得本實施例之移位暫存單元61之作動情形,於此 不再贅述。In addition, it is well known to those skilled in the art that the operation of the shift register unit 61 of the present embodiment can be derived from the description of the above embodiments. No longer.

另外,為改善習知的問題,本發明提供另一種移位暫存單元71。請參照圖12所示,本實施例之移位暫存單元71係與時脈訊號CK41 ~CK42 配合應用,移位暫存單元71包含一電晶體T501 、一電晶體T502 、一電晶體T503 、一電晶體T504 、一電晶體T505 、一電晶體T506 、一電晶體T507 以及一電晶體T508In addition, in order to improve the conventional problems, the present invention provides another shift register unit 71. Referring to FIG. 12, the shift register unit 71 of the present embodiment is used in conjunction with the clock signals CK 41 CK CK 42 . The shift register unit 71 includes a transistor T 501 , a transistor T 502 , and a The transistor T 503 , a transistor T 504 , a transistor T 505 , a transistor T 506 , a transistor T 507 , and a transistor T 508 .

電晶體T501 之一汲極或一源極係與其一閘極電性連接,電晶體T503 與電晶體T501 、電晶體T502 、電晶體T504 、電晶體T5o5 以及一電容C53 電性連接。其中,掃描訊號B12 係控制電晶體T502 以及電晶體T504 導通或截止。電晶體T505 之一汲極或一源極係與其一閘極電性連接,電晶體T507 與電晶體T505 、電晶體T506 、電晶體T507 、電晶體T508 以及一電容C53 電性連接。其中,掃描訊號B13 係控制電晶體T506 以及電晶體T508 導通或截止。一電容C51 以及一電容C52 係分別為電晶體T503 以及電晶體T507 之寄生電容。One of the gates or a source of the transistor T 501 is electrically connected to a gate thereof, the transistor T 503 and the transistor T 501 , the transistor T 502 , the transistor T 504 , the transistor T 5o5 , and a capacitor C 53 . Electrical connection. The scan signal B 12 controls the transistor T 502 and the transistor T 504 to be turned on or off. One of the gates or a source of the transistor T 505 is electrically connected to a gate thereof, and the transistor T 507 and the transistor T 505 , the transistor T 506 , the transistor T 507 , the transistor T 508 , and a capacitor C 53 Electrical connection. The scan signal B 13 controls the transistor T 506 and the transistor T 508 to be turned on or off. A capacitor C 51 and a capacitor C 52 are parasitic capacitances of the transistor T 503 and the transistor T 507 , respectively.

綜上所述,依據本發明之移位暫存單元、掃描驅動電路、顯示裝置及移位暫存單元之控制方法,其係由預升壓元件輸出之第一位移控制訊號作為下一級預升壓元件的起始訊號。與習知技術相較,本實施例之第一位移控制訊號係直接傳送至下一級預升壓元件,因此,第一位移控制訊號不會產生時間延遲效應,而使得各級預升壓元件輸出之第二位移控制訊號可正常啟動相對應之升壓元件。另外,與掃描線電性連接之移位暫存單元的電晶體,其一閘 極端之電壓準位係經由本發明之移位暫存單元之控制方法,由第一準位提升至第三準位,以提高升壓元件輸出功率,進而驅動更大的負載。In summary, the shift temporary storage unit, the scan driving circuit, the display device, and the shift register unit control method according to the present invention are the first displacement control signals output by the pre-boosting component as the next-stage pre-elevation The starting signal of the pressure element. Compared with the prior art, the first displacement control signal of the embodiment is directly transmitted to the next-stage pre-boosting component. Therefore, the first displacement control signal does not generate a time delay effect, and the pre-boost components of each stage are output. The second displacement control signal can normally activate the corresponding boosting component. In addition, the transistor of the shift register unit electrically connected to the scan line has a gate The extreme voltage level is raised from the first level to the third level by the control method of the shift register unit of the present invention to increase the output power of the boosting element, thereby driving a larger load.

以上所述僅為舉例性,而非為限制性者。任何未脫離本發明之精神與範疇,而對其進行之等效修改或變更,均應包含於後附之申請專利範圍中。The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of the invention are intended to be included in the scope of the appended claims.

1、51、51a、61、61a、71‧‧‧移位暫存單元1, 51, 51a, 61, 61a, 71‧‧ ‧ shift temporary storage unit

11、12、13‧‧‧移位暫存器11, 12, 13‧‧‧ shift register

2‧‧‧顯示裝置2‧‧‧Display device

3‧‧‧顯示面板3‧‧‧ display panel

4‧‧‧資料驅動電路4‧‧‧Data Drive Circuit

5‧‧‧掃描驅動電路5‧‧‧Scan drive circuit

511、511a、611、611a‧‧‧第一預升壓元件511, 511a, 611, 611a‧‧‧ first pre-boost components

512、512a、612、612a‧‧‧第一升壓元件512, 512a, 612, 612a‧‧‧ first boosting components

513、613‧‧‧第二預升壓元件513, 613‧‧‧second pre-boosting components

514、614‧‧‧第二升壓元件514, 614‧‧‧ second boosting element

515、615‧‧‧第三預升壓元件515, 615‧‧‧ third pre-boosting components

516、616‧‧‧第三升壓元件516, 616‧‧‧ third boosting element

517‧‧‧第四預升壓元件517‧‧‧fourth pre-boosting component

518‧‧‧第四升壓元件518‧‧‧4th boosting element

A11 、A12 ‧‧‧位移控制訊號A 11 , A 12 ‧‧‧ Displacement control signals

B11 、B12 、B13 ‧‧‧掃描訊號B 11 , B 12 , B 13 ‧ ‧ scan signals

CK21 ~CK24 、CK31 ~CK33 ‧‧‧時脈訊號CK 21 ~ CK 24 , CK 31 ~ CK 33 ‧‧‧ clock signal

D21 ~D2n ‧‧‧資料線D 21 ~D 2n ‧‧‧ data line

S11 ~S13 、S21 ~S2m ‧‧‧掃描線S 11 ~S 13 , S 21 ~S 2m ‧‧‧ scan line

T101 ~T508 ‧‧‧電晶體T 101 ~T 508 ‧‧‧O crystal

VPb ‧‧‧節點電壓VP b ‧‧‧ node voltage

VSS ‧‧‧接地電壓V SS ‧‧‧ Grounding voltage

W11~W14、W21~W23‧‧‧步驟W11~W14, W21~W23‧‧‧ steps

圖1為習知移位暫存單元的示意圖;圖2為本發明較佳實施例之顯示裝置的示意圖;圖3為本發明較佳實施例之移位暫存單元的示意圖;圖4為本發明第一實施例之移位暫存單元的示意圖;圖5為本發明第一實施例之移位暫存單元的時序控制圖;圖6為本發明第一實施例之移位暫存單元的控制步驟流程圖;圖7為本發明第一實施例之移位暫存單元另一控制步驟流程圖;圖8為本發明第二實施例之移位暫存單元的示意圖;圖9至圖10為本發明第三實施例之移位暫存單元的示意圖;圖11為本發明第四實施例之移位暫存單元的示意圖;以及圖12為本發明較佳實施例之移位暫存單元的示意圖。1 is a schematic diagram of a conventional shift register unit; FIG. 2 is a schematic diagram of a display device according to a preferred embodiment of the present invention; FIG. 3 is a schematic diagram of a shift register unit according to a preferred embodiment of the present invention; FIG. 5 is a timing diagram of a shift temporary storage unit according to a first embodiment of the present invention; FIG. 6 is a timing shifting diagram of a shift temporary storage unit according to a first embodiment of the present invention; FIG. 7 is a flowchart of another control step of the shift temporary storage unit according to the first embodiment of the present invention; FIG. 8 is a schematic diagram of the shift temporary storage unit according to the second embodiment of the present invention; FIG. 9 to FIG. FIG. 11 is a schematic diagram of a shift temporary storage unit according to a fourth embodiment of the present invention; and FIG. 12 is a shift temporary storage unit according to a preferred embodiment of the present invention; Schematic diagram.

51‧‧‧移位暫存單元51‧‧‧Shift register unit

511‧‧‧第一預升壓元件511‧‧‧First pre-boosting element

512‧‧‧第一升壓元件512‧‧‧First boosting element

513‧‧‧第二預升壓元件513‧‧‧Second pre-boosting element

514‧‧‧第二升壓元件514‧‧‧Second boosting element

515‧‧‧第三預升壓元件515‧‧‧ Third pre-boosting element

516‧‧‧第三升壓元件516‧‧‧ Third boosting element

517‧‧‧第四預升壓元件517‧‧‧fourth pre-boosting component

518‧‧‧第四升壓元件518‧‧‧4th boosting element

S21 、S22 、S23 、S24 ‧‧‧掃描線S 21 , S 22 , S 23 , S 24 ‧‧‧ scan lines

CK21 、CK22 、CK23 、CK24 ‧‧‧時脈訊號CK 21 , CK 22 , CK 23 , CK 24 ‧ ‧ clock signal

Claims (24)

一種移位暫存單元,與一第一掃描線配合應用,該移位暫存單元包含:一第一預升壓元件,依據一第一位移控制訊號輸出一第二位移控制訊號,並產生具有一第一準位之電壓訊號,該第一預升壓元件依據一第一時脈訊號及該第一準位之電壓訊號輸出具有一第二準位之電壓訊號;以及一第一升壓元件,與該第一預升壓元件及該第一掃描線電性連接,依據一第二時脈訊號及該第二準位之電壓訊號產生具有一第三準位之電壓訊號,該第一升壓元件依據該第二時脈訊號及該第三準位之電壓訊號,俾使該第一掃描線傳送一第一掃描訊號。A shift temporary storage unit is configured to cooperate with a first scan line, the shift temporary storage unit includes: a first pre-boost component, and outputs a second displacement control signal according to a first displacement control signal, and generates a voltage signal of the first level, the first pre-boosting component outputs a voltage signal having a second level according to a first clock signal and the voltage signal of the first level; and a first boosting component And electrically connecting to the first pre-boosting component and the first scan line, generating a voltage signal having a third level according to a voltage signal of the second clock signal and the second level, the first liter The voltage component transmits the first scan signal to the first scan line according to the voltage signals of the second clock signal and the third level. 如申請專利範圍第1項所述之移位暫存單元,其中該第一位移控制訊號係為一起始訊號。The shift register unit of claim 1, wherein the first displacement control signal is a start signal. 如申請專利範圍第1項所述之移位暫存單元,更包含:一第二預升壓元件,與該第一預升壓元件電性連接,依據該第二位移控制訊號輸出一第三位移控制訊號,並產生具有該第一準位之電壓訊號,該第二預升壓元件依據該第二時脈訊號及該第一準位之電壓訊號輸出具有該第二準位之電壓訊號;以及一第二升壓元件,與該第一預升壓元件、該第二預升壓元件、該第一升壓元件及一第二掃描線電性連接,依據一第三時脈訊號及該第二準位之電壓訊號 產生具有該第三準位之電壓訊號,該第二升壓元件依據該第三時脈訊號及該第三準位之電壓訊號,俾使該第二掃描線傳送一第二掃描訊號。The shift temporary storage unit of claim 1, further comprising: a second pre-boosting component electrically connected to the first pre-boosting component, and outputting a third according to the second displacement control signal Displacement control signal, and generating a voltage signal having the first level, the second pre-boosting component outputting a voltage signal having the second level according to the second clock signal and the voltage signal of the first level; And a second boosting component electrically coupled to the first pre-boosting component, the second pre-boosting component, the first boosting component, and a second scan line, according to a third clock signal and the Second level voltage signal A voltage signal having the third level is generated, and the second boosting component causes the second scan line to transmit a second scan signal according to the voltage signals of the third clock signal and the third level. 如申請專利範圍第3項所述之移位暫存單元,其中該第一預升壓元件包含:一第一電晶體,其一汲極或一源極係與其一閘極電性連接;一第二第晶體,與該第一電晶體電性連接,其中該第二掃描訊號控制該第二第晶體導通或截止;一第三第晶體,與該第一電晶體及該第二電晶體電性連接;以及一第四第晶體,與該第一電晶體、該第二電晶體及該第一升壓元件電性連接,而其一汲極或一源極係與其一閘極電性連接。The shifting temporary storage unit of claim 3, wherein the first pre-boosting element comprises: a first transistor, wherein a drain or a source is electrically connected to a gate thereof; The second crystal is electrically connected to the first transistor, wherein the second scan signal controls the second crystal to be turned on or off; and a third crystal is electrically connected to the first transistor and the second transistor And a fourth crystal, electrically connected to the first transistor, the second transistor and the first boosting component, and one of the drains or the source is electrically connected to a gate thereof . 如申請專利範圍第4項所述之移位暫存單元,其中該第一升壓元件包含:一第五第晶體,與該第四第晶體電性連接,依據該第二時脈訊號及該第三準位之電壓訊號,經由該第五第晶體輸出該第一掃描訊號。The shift register unit of claim 4, wherein the first boosting element comprises: a fifth crystal, electrically connected to the fourth crystal, according to the second clock signal and the The third level voltage signal outputs the first scan signal via the fifth crystal. 如申請專利範圍第1項所述之移位暫存單元,其中該第二準位介於該第一準位與該第三準位之間。The shift register unit of claim 1, wherein the second level is between the first level and the third level. 一種掃描驅動電路,與一第一掃描線配合應用,該掃描驅動電路包含:一移位暫存單元,與該第一掃描線電性連接,具有: 一第一預升壓元件,依據一第一位移控制訊號輸出一第二位移控制訊號,並產生具有一第一準位之電壓訊號,該第一預升壓元件依據該第一時脈訊號及該第一準位之電壓訊號輸出具有一第二準位之電壓訊號;及一第一升壓元件,與該第一預升壓元件及該第一掃描線電性連接,依據一第二時脈訊號及該第二準位之電壓訊號產生具有一第三準位之電壓訊號,該第一升壓元件依據該第二時脈訊號及該第三準位之電壓訊號,俾使該第一掃描線傳送一第一掃描訊號。A scan driving circuit is used in conjunction with a first scan line. The scan driving circuit includes: a shift register unit electrically connected to the first scan line, and having: a first pre-boosting component outputs a second displacement control signal according to a first displacement control signal, and generates a voltage signal having a first level, the first pre-boosting component is based on the first clock signal and The voltage signal of the first level outputs a voltage signal having a second level; and a first boosting element is electrically connected to the first pre-boosting element and the first scanning line, according to a second time The voltage signal and the voltage signal of the second level generate a voltage signal having a third level, and the first boosting component causes the first signal according to the voltage signal of the second clock signal and the third level The scan line transmits a first scan signal. 如申請專利範圍第7項所述之掃描驅動電路,其中該第一位移控制訊號係為一起始訊號。The scan driving circuit of claim 7, wherein the first displacement control signal is a start signal. 如申請專利範圍第7項所述之掃描驅動電路,其中該移位暫存單元更包含:一第二預升壓元件,與該第一預升壓元件電性連接,依據該第二位移控制訊號輸出一第三位移控制訊號,並產生具有該第一準位之電壓訊號,該第二預升壓元件依據該第二時脈訊號及該第一準位之電壓訊號輸出具有該第二準位之電壓訊號;以及一第二升壓元件,與該第一預升壓元件、該第二預升壓元件、該第一升壓元件及一第二掃描線電性連接,依據一第三時脈訊號及該第二準位之電壓訊號產生具有該第三準位之電壓訊號,該第二升壓元件 依據該第三時脈訊號及該第三準位之電壓訊號,俾使該第二掃描線傳送一第二掃描訊號。The scan driving circuit of claim 7, wherein the shift register unit further comprises: a second pre-boosting component electrically connected to the first pre-boosting component, according to the second displacement control The signal outputs a third displacement control signal, and generates a voltage signal having the first level. The second pre-boosting component has the second standard according to the second clock signal and the voltage signal output of the first level. a voltage signal of the bit; and a second boosting component electrically connected to the first pre-boosting component, the second pre-boosting component, the first boosting component, and a second scan line, according to a third The clock signal and the voltage signal of the second level generate a voltage signal having the third level, and the second boosting element And transmitting, according to the third clock signal and the voltage signal of the third level, the second scan line to transmit a second scan signal. 如申請專利範圍第9項所述之掃描驅動電路,其中該第一預升壓元件包含:一第一電晶體,其一汲極或一源極係與其一閘極電性連接;一第二第晶體,與該第一電晶體電性連接,其中該第二掃描訊號控制該第二第晶體導通或截止;一第三第晶體,與該第一電晶體及該第二電晶體電性連接;以及一第四第晶體,與該第一電晶體、該第二電晶體及該第一升壓元件電性連接,而其一汲極或一源極係與其一閘極電性連接。The scan driving circuit of claim 9, wherein the first pre-boosting element comprises: a first transistor, wherein a drain or a source is electrically connected to a gate thereof; a first crystal electrically connected to the first transistor, wherein the second scan signal controls the second crystal to be turned on or off; and a third crystal is electrically connected to the first transistor and the second transistor And a fourth crystal, electrically connected to the first transistor, the second transistor, and the first boosting element, and a drain or a source thereof is electrically connected to a gate thereof. 如申請專利範圍第10項所述之掃描驅動電路,其中該第一升壓元件包含:一第五第晶體,與該第四第晶體電性連接,依據該第二時脈訊號及該第三準位之電壓訊號,經由該第五第晶體輸出該第一掃描訊號。The scan driving circuit of claim 10, wherein the first boosting element comprises: a fifth crystal, electrically connected to the fourth crystal, according to the second clock signal and the third The voltage signal of the level outputs the first scan signal via the fifth crystal. 如申請專利範圍第7項所述之掃描驅動電路,其中該第二準位介於該第一準位與該第三準位之間。The scan driving circuit of claim 7, wherein the second level is between the first level and the third level. 一種顯示裝置,該顯示裝置包含:一顯示面板;一資料驅動電路,藉由複數資料線與該顯示面板電性連接;以及 一掃描驅動電路,藉由至少一第一掃描線與該顯示面板電性連接,具有:一移位暫存單元,具有:一第一預升壓元件,依據一第一位移控制訊號輸出一第二位移控制訊號,並產生具有一第一準位之電壓訊號,該第一預升壓元件依據該第一時脈訊號及該第一準位之電壓訊號輸出具有一第二準位之電壓訊號;及一第一升壓元件,與該第一預升壓元件及該第一掃描線電性連接,依據一第二時脈訊號及該第二準位之電壓訊號產生具有一第三準位之電壓訊號,該第一升壓元件依據該第二時脈訊號及該第三準位之電壓訊號,俾使該第一掃描線傳送一第一掃描訊號。A display device comprising: a display panel; a data driving circuit electrically connected to the display panel by a plurality of data lines; a scan driving circuit is electrically connected to the display panel by at least one first scan line, and has: a shift temporary storage unit having: a first pre-boosting component, and outputting a signal according to a first displacement control signal The second displacement control signal generates a voltage signal having a first level, and the first pre-boosting component outputs a voltage signal having a second level according to the first clock signal and the voltage signal of the first level And a first boosting component electrically connected to the first pre-boosting component and the first scan line, and generating a third level according to a voltage signal of the second clock signal and the second level The first boosting component transmits the first scan signal to the first scan line according to the voltage signals of the second clock signal and the third level. 如申請專利範圍第13項所述之顯示裝置,其中該第一位移控制訊號係為一起始訊號。The display device of claim 13, wherein the first displacement control signal is a start signal. 如申請專利範圍第13項所述之顯示裝置,其中該移位暫存單元更包含:一第二預升壓元件,與該第一預升壓元件電性連接,依據該第二位移控制訊號輸出一第三位移控制訊號,並產生具有該第一準位之電壓訊號,該第二預升壓元件依據該第二時脈訊號及該第一準位之電壓訊號輸出具有該第二準位之電壓訊號;以及一第二升壓元件,與該第一預升壓元件、該第二預升 壓元件、該第一升壓元件及一第二掃描線電性連接,依據一第三時脈訊號及該第二準位之電壓訊號產生具有該第三準位之電壓訊號,該第二升壓元件依據該第三時脈訊號及該第三準位之電壓訊號,俾使該第二掃描線傳送一第二掃描訊號。The display device of claim 13, wherein the shift register unit further comprises: a second pre-boosting component electrically connected to the first pre-boosting component, according to the second displacement control signal And outputting a third displacement control signal, and generating a voltage signal having the first level, the second pre-boosting component having the second level according to the second clock signal and the voltage signal output of the first level a voltage signal; and a second boosting component, the first pre-boosting component, the second pre-elevating component The voltage component, the first boosting component and the second scan line are electrically connected to generate a voltage signal having the third level according to a third clock signal and the voltage signal of the second level, the second liter The voltage component transmits the second scan signal according to the voltage signal of the third clock signal and the third level. 如申請專利範圍第15項所述之顯示裝置,其中該第一預升壓元件包含:一第一電晶體,其一汲極或一源極係與其一閘極電性連接;一第二第晶體,與該第一電晶體電性連接,其中該第二掃描訊號控制該第二第晶體導通或截止;一第三第晶體,與該第一電晶體及該第二電晶體電性連接;以及一第四第晶體,與該第一電晶體、該第二電晶體及該第一升壓元件電性連接,而其一汲極或一源極係與其一閘極電性連接。The display device of claim 15, wherein the first pre-boosting element comprises: a first transistor, wherein a drain or a source is electrically connected to a gate thereof; The second transistor is electrically connected to the first transistor, and the second transistor is electrically connected to the first transistor and the second transistor; And a fourth crystal, electrically connected to the first transistor, the second transistor and the first boosting element, and a drain or a source thereof is electrically connected to a gate thereof. 如申請專利範圍第16項所述之顯示裝置,其中該第一升壓元件包含:一第五第晶體,與該第四第晶體電性連接,依據該第二時脈訊號及該第三準位之電壓訊號,經由該第五第晶體輸出該第一掃描訊號。The display device of claim 16, wherein the first boosting element comprises: a fifth crystal, electrically connected to the fourth crystal, according to the second clock signal and the third standard The voltage signal of the bit outputs the first scan signal via the fifth crystal. 如申請專利範圍第13項所述之顯示裝置,其中該第二準位介於該第一準位與該第三準位之間。The display device of claim 13, wherein the second level is between the first level and the third level. 一種移位暫存單元之控制方法,與一第一掃描線配合 應用,該移位暫存單元具有一第一預升壓元件及一第一升壓元件,該第一升壓元件與該第一預升壓元件及該第一掃描線電性連接,該控制方法包含以下步驟:由該第一預升壓元件依據一第一位移控制訊號輸出一第二位移控制訊號,並產生具有一第一準位之電壓訊號;由該第一預升壓元件依據一第一時脈訊號及該第一準位之電壓訊號,俾使該第一預升壓元件輸出具有一第二準位之電壓訊號;由該第一升壓元件依據一第二時脈訊號及該第二準位之電壓訊號產生具有一第三準位之電壓訊號;以及由該第一升壓元件依據該第二時脈訊號及該第三準位之電壓訊號,俾使該第一掃描線傳送一第一掃描訊號。A control method for shifting temporary storage unit, matched with a first scan line The first temporary boosting component is electrically connected to the first pre-boosting component and the first scan line, and the first boosting component is electrically connected to the first pre-boosting component. The method includes the following steps: the first pre-boosting component outputs a second displacement control signal according to a first displacement control signal, and generates a voltage signal having a first level; and the first pre-boosting component is based on the first pre-boosting component a first clock signal and a voltage signal of the first level, wherein the first pre-boosting component outputs a voltage signal having a second level; and the first boosting component is based on a second clock signal and The voltage signal of the second level generates a voltage signal having a third level; and the first boosting element causes the first scan according to the voltage signals of the second clock signal and the third level The line transmits a first scan signal. 如申請專利範圍第19項所述之控制方法,更包含:由一第二預升壓元件依據該第二位移控制訊號輸出一第三位移控制訊號,並產生具有該第一準位之電壓訊號;由該第二預升壓元件依據該第二時脈訊號及該第一準位之電壓訊號,俾使該第二預升壓元件輸出具有該第二準位之電壓訊號;由一第二升壓元件依據一第三時脈訊號及該第二準位之電壓訊號產生具有該第三準位之電壓訊號;以 及由該第二升壓元件依據該第三時脈訊號及該第三準位之電壓訊號,俾使該第二掃描線傳送一第二掃描訊號。The control method of claim 19, further comprising: outputting, by a second pre-boosting component, a third displacement control signal according to the second displacement control signal, and generating a voltage signal having the first level The second pre-boosting component outputs a voltage signal having the second level according to the voltage signal of the second clock signal and the first level, and the second pre-boosting component outputs a voltage signal having the second level; The boosting component generates a voltage signal having the third level according to a third clock signal and a voltage signal of the second level; And causing, by the second boosting component, the second scan line to transmit a second scan signal according to the voltage signals of the third clock signal and the third level. 如申請專利範圍第19項所述之控制方法,其中該第二準位介於該第一準位與該第三準位之間。The control method of claim 19, wherein the second level is between the first level and the third level. 一種移位暫存單元之控制方法,與一第一掃描線配合應用,該移位暫存單元具有一第一預升壓元件及一第一升壓元件,該第一預升壓元件具有一第一電晶體、一第二電晶體、一第三電晶體及一第四電晶體,該第一電晶體之一汲極或一源極係與其一閘極電性連接,該第二第晶體與該第一電晶體電性連接,該第三第晶體與該第一電晶體及該第二電晶體電性連接,該第四第晶體與該第一電晶體、該第二電晶體及該第一升壓元件電性連接,而其一汲極或一源極係與其一閘極電性連接,該第一升壓元件具有一與該第四電晶體電性連接之第五電晶體,該控制方法包含以下步驟:於一第一時間,輸入一高電壓準位之該第一位移控制訊號導通該第一電晶體及該第三電晶體,而使該第一預升壓元件輸出一第二位移控制訊號,並產生具有一第一準位之電壓訊號至該第五電晶體之一閘極;於一第二時間,輸入一高電壓準位之一第一時脈訊號,由該第一預升壓元件輸出具有一第二準位之電 壓訊號至該第五電晶體之該閘極;以及於一第三時間,輸入一高電壓準位之一第二時脈訊號,由該第一預升壓元件輸出具有一第三準位之電壓訊號至該第五電晶體之該閘極。A control method for shifting a temporary storage unit, which is matched with a first scan line, the shift register unit has a first pre-boosting component and a first boosting component, and the first pre-boosting component has a a first transistor, a second transistor, a third transistor, and a fourth transistor, wherein one of the first transistor has a drain or a source electrically connected to a gate thereof, the second transistor Electrically connecting with the first transistor, the third crystal is electrically connected to the first transistor and the second transistor, the fourth crystal and the first transistor, the second transistor, and the The first boosting element is electrically connected, and a drain or a source thereof is electrically connected to a gate thereof. The first boosting element has a fifth transistor electrically connected to the fourth transistor. The control method includes the following steps: at a first time, the first displacement control signal inputting a high voltage level turns on the first transistor and the third transistor, and the first pre-boost component outputs a Second shifting the control signal and generating a voltage signal having a first level to the fifth One transistor gate; at a second time, a high level input voltage is one of a first clock signal having a second power level of the output element of the first pre-boost Pressing a signal to the gate of the fifth transistor; and, at a third time, inputting a second clock signal of a high voltage level, the first pre-boost component output having a third level The voltage signal is to the gate of the fifth transistor. 如申請專利範圍第22項所述之控制方法,更包含:於一第四時間,提供該第五電晶體之該閘極一放電路徑。The control method of claim 22, further comprising: providing the gate-discharge path of the fifth transistor at a fourth time. 如申請專利範圍第22項所述之控制方法,其中該第二準位介於該第一準位與該第三準位之間。The control method of claim 22, wherein the second level is between the first level and the third level.
TW097151817A 2008-12-31 2008-12-31 Shift register unit, scan driving circuit, display apparatus and control method of shift register unit TWI398838B (en)

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US20030231734A1 (en) * 2002-04-16 2003-12-18 Seiko Epson Corporation Shift register, data-line driving circuit, and scan-line driving circuit
TW200614128A (en) * 2004-10-28 2006-05-01 Alps Electric Co Ltd Shift register and liquid crystal driver
TW200733033A (en) * 2006-02-23 2007-09-01 Mitsubishi Electric Corp Shift register circuit and image display apparatus containing the same

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Publication number Priority date Publication date Assignee Title
US20030231734A1 (en) * 2002-04-16 2003-12-18 Seiko Epson Corporation Shift register, data-line driving circuit, and scan-line driving circuit
TW200614128A (en) * 2004-10-28 2006-05-01 Alps Electric Co Ltd Shift register and liquid crystal driver
TW200733033A (en) * 2006-02-23 2007-09-01 Mitsubishi Electric Corp Shift register circuit and image display apparatus containing the same

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